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BSide ESR02 Pro Manuale

Manuale di un apparato ESR per la misura di componenti elettronici

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Filippo Calo
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© © All Rights Reserved
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Il 0% ha trovato utile questo documento (0 voti)
781 visualizzazioni3 pagine

BSide ESR02 Pro Manuale

Manuale di un apparato ESR per la misura di componenti elettronici

Caricato da

Filippo Calo
Copyright
© © All Rights Reserved
Per noi i diritti sui contenuti sono una cosa seria. Se sospetti che questo contenuto sia tuo, rivendicalo qui.
Formati disponibili
Scarica in formato PDF o leggi online su Scribd
Transistor Tester User Manual POWER/TEST SMD Socket. Capacitor Discharge Resistor Probe Socket, 1. Product Description This Tester is a small tool design for Engineer, Electronic Maintenance and Fac- tory. It's very easy to test plug-in and SMD devices, also can test different kinds of Diodes, Triodes, Thyristors, MOSFET; able to analysis the device type, the polarity of the pin, the output HFE, the valve voltage, the junction capacitance of the FET. 2. Attention * Always be sure to discharge capacitors before connecting them to the Tester! © Power down the equipment if test components mounted in a circuit. © If using DC supply, please choose DC 9V-12V adapter(including 9V and 12V). © When the battery power is under 6V, please replace a new one. 3. Measuring Parameters Resistor: 09-50MQ Resolution: 0.010 Capacitor: 25pF-100mF Resolution: 1pF Inductor: 0.01mH-20H Resolution: 0.01mH Capacitor ESR: 2uF-SO0mF Resolution: 0.012 (ESR: Equivalent Series Resistance) 4. Use Introduction a. Power ON: Press “POWERITEST” button before to use, this meter design 2 “POWERITEST” button, the function is the same. Easy for both left and right hand habit people to use. b. Test: Press “POWER/TEST” button to start a test. Regardless of the pin seq- uence, this meter will recognizes the pin’s function and layout on the screen. c. Power OFF: Automatically power down if no button operation in 20 seconds. 4d. Test Socket: With 3 test sockets, SMD Socket, Plug-in Devices Socket and @ Probe Socket. The port 1, 2, 3 of each socket are the same, they are conne- cted internal. e. SMD Device Test: Test via SMD socket or Probe. While using SMD socket, put some pressure on device for better connection. ‘SMD Device Test Reference f. Electrolytic Capacitor Discharge: Support max 2000uF/50V capacitor disch- arge with the internal 1K/1W resistor, and discharge for 2 seconds at least. Use external discharger while the capacity is higher. Discharge is stand alone function, no need to power on or press button External Discharge g. Selection Menu: A ong button press(>0.5s) will enter the selection menu for additional functions. Short button press to switch different functions, and long button(>0.5s) to enter submenu. © Switch off: Long button press to Power Off immediately. © Transistor: Exit Selection Menu, return to transistor test. © Frequency: Reserved. © f-Generator: With the button press can select different frequenci- es output from T2(Test Port 2), and T1,T3 will be the reference gr- ound. Frequencies selectable from 1 Hz to 2 MHz, amplitude is 5V. 10-bit PWM: Generates a 7.8KHz frequency with selectable pulse width at the pin T2. With a short button press (<0.5s) the pulse w- idth is increased by 1%, with a longer button press (>0.5s, <1.3s) the pulse width is increased by 10%. © C+ESR@TP: [t's a stand-alone capacity measurement with ESR. measurement at the test pins T1 and T3, © rotary encoder: Reserved. © Selftest: Full selftest with calibration. @ ¢ Contrast: Contrast value for a graphic display, selectable from 33 to 55. Note: In Selection mode, the Tester will auto power off after 8 minutes without any button press. . Function Description Automatic detection of NPN and PNP bipolar transistors, N- and P- Channel MOSFETs, JFETs, diodes, double diodes, Thyristors and Triacs. Measuring of current amplification factor and Base-Emitter threshold v- oltage of bipolar transistors. © Detection of the protection diode of bipolar transistors and MOSFETs. © Measuring of the Gate threshold voltage and Gate capacity value of M- OSFETs. The inductance measuring range is from 0.01mH to 20H, out of range or if the resistor higher than 2.1KQ will be shown at resistor. Testing time is about two seconds, only capacity or inductance measurement can cause longer period. © Small Devices Container is design for placing the small size components. © The Probe socket support different kinds of probes. © With a Typical ESR Value of Electrolytic Capacitor table on the cover, e- asy for user to judgment the detected capacitor’s quality. The ESR table is for reference only, use the manufacturer's data as standard. 6. Calibration © Short T1,12,T3 to one, then press button ‘ When LCD shows “Selftest mode.. ?", press button within 2 seconds to enter calibration mode, otherwise will come into transistor test mode. (Selftest mode...) (Selftest mode RO=.14 .15 .190 Tester automatic calibrating until LCD shows “isolate Probes!”, then separate T1,T2 and T3. (Selftest mode (Elke 2007F isolate Probes! 10.35uF When LCD shows "1-||-3 >100nF” , connect a capacitor with a value between 4100nF and 20uF to T1 and T3. (Version 1.11K Wait a few seconds until LCD Test End shows “Test End’,

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