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Notazioni Statistiche
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Arthur, B. W., 1993, Why Do Things Become More Complex?, Scientific American, May edition, p.143.
Strutture complesse
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Strutture complesse
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Notazioni Statistiche
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Notazioni Statistiche
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Notazioni Statistiche
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Number of Variables
Exp. Num
Variables X1 1
1 2 2
X2 1
2 1 2
X3 1
2 2 1
L4(23)
Number of Experiments
1
2 3 4
4
5 6 7
2
2 2 3
1
2 3 1
2
3 1 3
3
1 2 2
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9
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1
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Example
With all these things said, lets get into an example
We are interested in determining the effect of 4 process parameters on the formation of certain surface defects in a chemical vapor deposition (CVD) process. The 4 parameters (factors) are: A) Temperature C) Settling Time B) Pressure D) Cleaning Method
Fondamenti e Metodi della Progettazione Industriale 111
Example
1 2 3 4 5 6 7 8 9 A B C 1 1 1 1 2 2 1 3 3 2 1 2 2 2 3 2 3 1 3 1 3 3 2 1 3 Fondamenti3 Metodi della2 e
Progettazione Industriale
D 1 2 3 3 1 2 2 3 1
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Example
Each of our factors will have 3 levels as shown in the following table: Factor A: Temp B: Press C: Set Time D: Clean
Levels 1 2 3 T0-25 T0 T0+25 P0-200 P0 P0+200 to to+8 to+16 None CM2 CM3
Fondamenti e Metodi della Progettazione Industriale 113
Example
So for a problem with 4 factors at 3 levels each, we need an L (34) array. We see from our handout, that such an array does exist and that it is the L9 array (shown in part below).
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Example
1 2 3 4 5 6 7 8 9 A B C T0-25 P0-200 to T0-25 P0 to+8 T0-25 P0+200 to+16 T0 P0-200 to+8 T0 P0 to+16 T0 P0+200 to T0+25 P0-200 to+16 T0+25 P0 to T0+25 Fondamenti e Metodi della to+8 P0+200
Progettazione Industriale
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Example
So we can see that each row of the matrix defines an entire configuration of our product or process. Now, we want to use this matrix experiment in some way to determine the best setting for each parameter such that our surface defects are minimized.
The first thing we need to do is determine how we will compute our observation value (this is akin to determination of our fitness in a GA).
Fondamenti e Metodi della Progettazione Industriale 116
Example
In our example, we are concerned with defects on the surface of a silicon wafer. So in order to determine the relative performance of each of our configurations, we will do the following.
Set up the CVD equipment according to the parameters Create a bunch of chips Count the defects in 3 areas on each of 3 of our produced chips for a total of 9 counts per experiment.
Fondamenti e Metodi della Progettazione Industriale 117
Example
We can then define a summary statistic, i, that is computed as follows (for experiment i): i = -10 log10 (mean square defect counti)
The mean square defect count is the average of the squared-counts in each of the 9 areas for each experiment. We will then call eta our observation value. Does anyone recognize this formulation? It is the signal to noise (S/N) ratio.
Fondamenti e Metodi della Progettazione Industriale 118
Example
We can then define a summary statistic, i, that is computed as follows (for experiment i): i = -10 log10 (mean square defect counti)
The mean square defect count is the average of the squared-counts in each of the 9 areas for each experiment. We will then call eta our observation value. Does anyone recognize this formulation? It is the signal to noise (S/N) ratio.
Fondamenti e Metodi della Progettazione Industriale 119
Example
We can calculate for this experiment as follows:
Mean squared defect count: ( 22 + 22 + 22 + 12 + 12 + 12 + 22 + 22 + 12) / 9 = 3.11
Clearly, minimizing our surface defects becomes a job of maximizing our observation value.
Fondamenti e Metodi della Progettazione Industriale 120
Example
1 2 3 4 5 6 7 8 9 A T0-25 T0-25 T0-25 T0 T0 T0 T0+25 T0+25 T0+25 B C P0-200 to P0 to+8 P0+200 to+16 P0-200 to+8 P0 to+16 P0+200 to P0-200 to+16 P0 to P0+200 e Metodi della to+8 Fondamenti
Progettazione Industriale
Example
Clearly we are not done, simply conducting the experiments and selecting the best one would make this a somewhat trivial approach.
What we have to do now is attempt to determine the effect that each factor has on the observation value based on what we observed in our matrix experiment.
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Example
The first step will be to find the overall mean of the observation values m.
1 9 m i 41.67 9 i 1
Since each of our factor levels was represented evenly in our matrix experiment, m in this case is referred to as a balanced overall mean.
Fondamenti e Metodi della Progettazione Industriale 123
Example
The effect of a factor level is defined as the deviation it causes from the overall mean. For example, we may wish to evaluate what effect temperature at level 3 has on the process.
To do this, we must calculate mean of the observation values in which temperature was at level 3. Note that there were 3 such experiments in our matrix experiment.
Fondamenti e Metodi della Progettazione Industriale 124
Example
The 3 experiments containing temperature at level 3 were #s 7, 8, and 9. So: mA3 = 1/3 (7 + 8 + 9) = -60 So the deviation from the overall mean caused by temperature at level 3 is: (mA3 m) = -60 (-41.67) = -18.3
Fondamenti e Metodi della Progettazione Industriale 125
Example
Notice that in each of experiments 7, 8, and 9, pressure, settling time, and cleaning method all take on levels of 1, 2, and 3 (in different orders).
Therefore, mA3 represents an average when the temperature is at level 3 where the averaging is done in a balanced manner over all levels of each of the other 3 factors.
The remaining factor level effects can be computed in the exact same fashion.
Fondamenti e Metodi della Progettazione Industriale 126
Robust Design
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FINE
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