Ebook308 pages11 hours
Acoustic, Thermal Wave and Optical Characterization of Materials
Rating: 0 out of 5 stars
()
About this ebook
This volume focuses on a variety of novel non-destructive techniques for the characterization of materials, processes and devices. Emphasis is placed on probe-specimen interactions, in-situ diagnosis, instrumentation developments and future trends. This was the first time a symposium on this topic had been held, making the response particularly gratifying. The high quality of the contributions are a clear indication that non-destructive materials characterization is becoming a dynamic research area in Europe at the present time.
A selection of contents: The role of acoustic properties in designs of acoustic and optical fibers (C.K. Jen). Observation of stable crack growth in Al2O3 ceramics using a scanning acoustic microscope (A. Quinten, W. Arnold). Mechanical characterization by acoustic techniques of SIC chemical vapour deposited thin films (J.M. Saurel et al.). Efficient generation of acoustic pressure waves by short laser pulses (S. Fassbender et al.). Use of scanning electron acoustic microscopy for the analysis of III-V compound devices (J.F. Bresse). Waves and vibrations in periodic piezoelectric composite materials (B.A. Auld). Precision ultrasonic velocity measurements for the study of the low temperature acoustic properties in defective materials (A. Vanelstraete, C. Laermans). Thermally induced concentration wave imaging (P. Korpiun et al.). Interferometric measurement of thermal expansion (V. Kurzmann et al.). Quantitative analyses of power loss mechanisms in semiconductor devices by thermal wave calorimetry (B. Büchner et al.). Thermal wave probing of the optical electronic and thermal properties of semiconductors (D. Fournier, A. Boccara). Thermal wave measurements in ion-implanted silicon (G. Queirola et al.). Optical-thermal non-destructive examination of surface coatings (R.E. Imhof et al.). Bonding analysis of layered materials by photothermal radiometry (M. Heuret et al.). Thermal non-linearities of semiconductor-doped glasses in the near-IR region (M. Bertolotti et al.). Theory of picosecond transient reflectance measurement of thermal and eisatic properties of thin metal films (Z. Bozóki et al.). The theory and application of contactless microwave lifetime measurement (T. Otaredian et al.). Ballistic phonon signal for imaging crystal properties (R.P. Huebener et al.). Determination of the elastic constants of a polymeric Langmuir-Blodgett film by Briliouin spectroscopy (F. Nizzoli et al.). Quantum interference effects in the optical second-harmonic response tensor of a metal surface (O. Keller). Study of bulk and surface phonons and plasmons in GaAs/A1As superlattices by far-IR and Raman spectroscopy (T. Dumslow et al.). Far-IR spectroscopy of bulk and surface phonon-polaritons on epitaxial layers of CdTe deposited by plasma MOCVD on GaAs substrates (T. Dumelow et al.). In-situ characterization by reflectance difference spectroscopy of III-V materials and heterojunctions grown by low pressure metal organic chemical vapour deposition (O. Acher et al.). Optical evidence of precipitates in arsenic-implanted silicon (A. Borghesi et al.). Polarized IR reflectivity of CdGeAs2 (L. Artús et al.). Raman and IR spectroscopies: a useful combination to study semiconductor interfaces (D.R.T. Zahn et al.). Silicon implantation of GaAs at low and medium doses: Raman assessment of the dopant activation (S. Zakang et al.). Ellipsometric characterization of thin films and superlattices (J. Bremer et al.). Ellipsometric characterization of multilayer transistor structures (J.A. Woollam et al.). Quality of molecular-beam-epitaxy-grown GaAs on Si(100) studied by ellipsometry (U. Rossow et al.). An ellipsometric and RBS study of TiSi2
A selection of contents: The role of acoustic properties in designs of acoustic and optical fibers (C.K. Jen). Observation of stable crack growth in Al2O3 ceramics using a scanning acoustic microscope (A. Quinten, W. Arnold). Mechanical characterization by acoustic techniques of SIC chemical vapour deposited thin films (J.M. Saurel et al.). Efficient generation of acoustic pressure waves by short laser pulses (S. Fassbender et al.). Use of scanning electron acoustic microscopy for the analysis of III-V compound devices (J.F. Bresse). Waves and vibrations in periodic piezoelectric composite materials (B.A. Auld). Precision ultrasonic velocity measurements for the study of the low temperature acoustic properties in defective materials (A. Vanelstraete, C. Laermans). Thermally induced concentration wave imaging (P. Korpiun et al.). Interferometric measurement of thermal expansion (V. Kurzmann et al.). Quantitative analyses of power loss mechanisms in semiconductor devices by thermal wave calorimetry (B. Büchner et al.). Thermal wave probing of the optical electronic and thermal properties of semiconductors (D. Fournier, A. Boccara). Thermal wave measurements in ion-implanted silicon (G. Queirola et al.). Optical-thermal non-destructive examination of surface coatings (R.E. Imhof et al.). Bonding analysis of layered materials by photothermal radiometry (M. Heuret et al.). Thermal non-linearities of semiconductor-doped glasses in the near-IR region (M. Bertolotti et al.). Theory of picosecond transient reflectance measurement of thermal and eisatic properties of thin metal films (Z. Bozóki et al.). The theory and application of contactless microwave lifetime measurement (T. Otaredian et al.). Ballistic phonon signal for imaging crystal properties (R.P. Huebener et al.). Determination of the elastic constants of a polymeric Langmuir-Blodgett film by Briliouin spectroscopy (F. Nizzoli et al.). Quantum interference effects in the optical second-harmonic response tensor of a metal surface (O. Keller). Study of bulk and surface phonons and plasmons in GaAs/A1As superlattices by far-IR and Raman spectroscopy (T. Dumslow et al.). Far-IR spectroscopy of bulk and surface phonon-polaritons on epitaxial layers of CdTe deposited by plasma MOCVD on GaAs substrates (T. Dumelow et al.). In-situ characterization by reflectance difference spectroscopy of III-V materials and heterojunctions grown by low pressure metal organic chemical vapour deposition (O. Acher et al.). Optical evidence of precipitates in arsenic-implanted silicon (A. Borghesi et al.). Polarized IR reflectivity of CdGeAs2 (L. Artús et al.). Raman and IR spectroscopies: a useful combination to study semiconductor interfaces (D.R.T. Zahn et al.). Silicon implantation of GaAs at low and medium doses: Raman assessment of the dopant activation (S. Zakang et al.). Ellipsometric characterization of thin films and superlattices (J. Bremer et al.). Ellipsometric characterization of multilayer transistor structures (J.A. Woollam et al.). Quality of molecular-beam-epitaxy-grown GaAs on Si(100) studied by ellipsometry (U. Rossow et al.). An ellipsometric and RBS study of TiSi2
Related to Acoustic, Thermal Wave and Optical Characterization of Materials
Titles in the series (33)
Photon, Beam and Plasma Assisted Processing: Fundamentals and Device Technology Rating: 0 out of 5 stars0 ratingsMetastable Alloys: Preparation and Properties Rating: 0 out of 5 stars0 ratingsRare-Earth Permanent Magnets Rating: 0 out of 5 stars0 ratingsSuperconducting and Low-Temperature Particle Detectors Rating: 0 out of 5 stars0 ratingsHigh T<INF>c</INF> Superconductors: Preparation and Application Rating: 0 out of 5 stars0 ratingsDeep Implants: Fundamentals and Applications Rating: 0 out of 5 stars0 ratingsCeramic Materials Research Rating: 4 out of 5 stars4/5Solid State Ionics Rating: 0 out of 5 stars0 ratingsBeam Processing and Laser Chemistry Rating: 0 out of 5 stars0 ratingsInterfaces in Biomaterials Sciences Rating: 0 out of 5 stars0 ratingsScience and Technology of Defects in Silicon Rating: 0 out of 5 stars0 ratingsAcoustic, Thermal Wave and Optical Characterization of Materials Rating: 0 out of 5 stars0 ratingsSilicon Molecular Beam Epitaxy Rating: 0 out of 5 stars0 ratingsMetal Matrix Composites Rating: 0 out of 5 stars0 ratingsLaser Surface Processing and Characterization Rating: 0 out of 5 stars0 ratingsHigh T<INF>c</INF> Superconductor Materials Rating: 0 out of 5 stars0 ratingsMetallurgical Coatings and Materials Surface Modifications Rating: 0 out of 5 stars0 ratingsSurface Processing and Laser Assisted Chemistry Rating: 0 out of 5 stars0 ratingsNuclear Materials for Fission Reactors Rating: 0 out of 5 stars0 ratingsMagnetic Thin Films, Multilayers and Superlattices Rating: 0 out of 5 stars0 ratingsSiC, Natural and Synthetic Diamond and Related Materials Rating: 0 out of 5 stars0 ratingsHigh Energy and High Dose Ion Implantation Rating: 0 out of 5 stars0 ratingsNuclear Methods in Semiconductor Physics Rating: 0 out of 5 stars0 ratingsAnalytical Techniques for the Characterization of Compound Semiconductors Rating: 3 out of 5 stars3/5SiGe Based Technologies Rating: 0 out of 5 stars0 ratingsSemiconductor Materials Analysis and Fabrication Process Control Rating: 0 out of 5 stars0 ratingsPolyconjugated Materials Rating: 0 out of 5 stars0 ratingsClays and Hydrosilicate Gels in Nuclear Fields Rating: 0 out of 5 stars0 ratingsModifications Induced by Irradiation in Glasses Rating: 0 out of 5 stars0 ratingsHigh T<INF>c</INF> Superconductors Rating: 0 out of 5 stars0 ratings
Related ebooks
Solid State Ionics Rating: 0 out of 5 stars0 ratingsThin Film Micro-Optics: New Frontiers of Spatio-Temporal Beam Shaping Rating: 0 out of 5 stars0 ratingsHigh Tc Superconductors: Electronic Structure Rating: 0 out of 5 stars0 ratingsLaser Microfabrication: Thin Film Processes and Lithography Rating: 0 out of 5 stars0 ratingsLaser Heating Applications: Analytical Modelling Rating: 0 out of 5 stars0 ratingsChemical and Biochemical Applications of Lasers V2 Rating: 0 out of 5 stars0 ratingsNanomaterials-Based Charge Trapping Memory Devices Rating: 0 out of 5 stars0 ratingsImpedance Spectroscopy: Applications to Electrochemical and Dielectric Phenomena Rating: 5 out of 5 stars5/5Fundamentals of Electronics 2: Continuous-time Signals and Systems Rating: 0 out of 5 stars0 ratingsChemical Sensor Technology Rating: 0 out of 5 stars0 ratingsNonlinear Optics: Fundamentals, Materials and Devices Rating: 0 out of 5 stars0 ratingsElectrical Properties of Polymers Rating: 0 out of 5 stars0 ratingsPolymer Micro- and Nanografting Rating: 0 out of 5 stars0 ratingsAntennas in Inhomogeneous Media: International Series of Monographs in Electromagnetic Waves Rating: 0 out of 5 stars0 ratingsPower Generation Technologies: Foundations, Design and Advances Rating: 0 out of 5 stars0 ratingsDye Laser Principles: With Applications Rating: 0 out of 5 stars0 ratingsApplications of Nonlinear Fiber Optics Rating: 0 out of 5 stars0 ratingsDielectric Properties of Binary Solutions: A Data Handbook Rating: 0 out of 5 stars0 ratingsMicroelectronic Systems 3 Checkbook Rating: 0 out of 5 stars0 ratingsFundamentals of Contemporary Mass Spectrometry Rating: 0 out of 5 stars0 ratingsVCSELs for Cesium-Based Miniaturized Atomic Clocks Rating: 0 out of 5 stars0 ratingsImpurity Doping Processes in Silicon Rating: 0 out of 5 stars0 ratingsTunable Lasers Handbook Rating: 3 out of 5 stars3/5Micro-nanoelectronics Devices: Modeling of Diffusion and Operation Processes Rating: 0 out of 5 stars0 ratingsAnalysis of Electric Machinery and Drive Systems Rating: 0 out of 5 stars0 ratingsSemiconductor Devices The Ultimate Step-By-Step Guide Rating: 0 out of 5 stars0 ratingsMetal – Semiconductor Contacts and Devices Rating: 0 out of 5 stars0 ratingsNanoelectronics: Devices, Circuits and Systems Rating: 0 out of 5 stars0 ratingsEffects of High-Power Laser Radiation Rating: 0 out of 5 stars0 ratings
Materials Science For You
Piping Materials Guide Rating: 4 out of 5 stars4/5Electric Vehicle Battery Systems Rating: 0 out of 5 stars0 ratingsThe Acoustic Bubble Rating: 0 out of 5 stars0 ratingsAn Introduction to Metallurgical Laboratory Techniques: Pergamon Series of Monographs in Laboratory Techniques Rating: 0 out of 5 stars0 ratingsStrength of Materials: A Course for Students Rating: 5 out of 5 stars5/5Bioimpedance and Bioelectricity Basics Rating: 5 out of 5 stars5/5Atomic Layer Deposition: Principles, Characteristics, and Nanotechnology Applications Rating: 0 out of 5 stars0 ratingsThe Art of Welding: Featuring Ryan Friedlinghaus of West Coast Customs Rating: 0 out of 5 stars0 ratingsPolymer Characterization: Laboratory Techniques and Analysis Rating: 0 out of 5 stars0 ratingsEssential Rubber Formulary: Formulas for Practitioners Rating: 3 out of 5 stars3/5Handmade: A Scientist’s Search for Meaning through Making Rating: 1 out of 5 stars1/5Generalized Continuum Mechanics and Engineering Applications Rating: 0 out of 5 stars0 ratingsNon-Destructive Testing Rating: 4 out of 5 stars4/5Demystifying Explosives: Concepts in High Energy Materials Rating: 0 out of 5 stars0 ratingsSurface Preparation Techniques for Adhesive Bonding Rating: 0 out of 5 stars0 ratingsHandbook of Adhesion Rating: 0 out of 5 stars0 ratingsWelding Metallurgy Rating: 0 out of 5 stars0 ratingsThe Dynamics of Nazism: Leadership, Ideology, and the Holocaust Rating: 0 out of 5 stars0 ratingsWelding of Metallic Materials: Methods, Metallurgy, and Performance Rating: 0 out of 5 stars0 ratingsApplications of Graphene and Graphene-Oxide based Nanomaterials Rating: 2 out of 5 stars2/5Experiment and Calculation of Reinforced Concrete at Elevated Temperatures Rating: 5 out of 5 stars5/5The Electrical Properties of Metals and Alloys Rating: 0 out of 5 stars0 ratingsCrack Analysis in Structural Concrete: Theory and Applications Rating: 0 out of 5 stars0 ratingsSimulation of Battery Systems: Fundamentals and Applications Rating: 0 out of 5 stars0 ratingsPost Weld Heat Treatment PWHT: Standards, Procedures, Applications, and Interview Q&A Rating: 0 out of 5 stars0 ratingsChoosing & Using the Right Metal Shop Lathe Rating: 0 out of 5 stars0 ratingsSkilletheads: <b>A Guide to Collecting and Restoring Cast-Iron Cookware</b> Rating: 0 out of 5 stars0 ratings
Reviews for Acoustic, Thermal Wave and Optical Characterization of Materials
Rating: 0 out of 5 stars
0 ratings
0 ratings0 reviews
Book preview
Acoustic, Thermal Wave and Optical Characterization of Materials - Elsevier Science
Enjoying the preview?
Page 1 of 1