- DocumentoDigital Worldcaricato daOka Kurniawan
- DocumentoIntegrated System-Level Electronic Design Automation (EDA) for Designing Plasmonic nanoCircuitscaricato daOka Kurniawan
- DocumentoFourier-Transform K•P Method For Modeling Electronic Structures And Optical Properties Of Low Dimensional Heterostructurescaricato daOka Kurniawan
- DocumentoImproved Calculation of Charge Collection Probability From Within the Junction Wellcaricato daOka Kurniawan
- DocumentoAnalysis of Wetting Layer Effect on Electronic Structures of Truncated-pyramid Quantum Dotscaricato daOka Kurniawan
- DocumentoGeneration of Surface Plasmoncaricato daOka Kurniawan
- DocumentoVocation to Married Lifecaricato daOka Kurniawan
- DocumentoScientific Methodcaricato daOka Kurniawan
- DocumentoFactors affecting the extraction efficiency of surface plasmon polariton from an elliptical microdiskcaricato daOka Kurniawan
- DocumentoSurface Plasmon Hybridization of Whispering Gallery Mode Microdisk Laser-Slidescaricato daOka Kurniawan
- DocumentoSurface Plasmon Hybridization of Whispering Gallery Mode Microdisk Laser - full papercaricato daOka Kurniawan
- DocumentoSurface Plasmon Hybridization of Whispering Gallery Mode Microdisk Laser - Abstractcaricato daOka Kurniawan
- DocumentoModeling and Simulation of Active Plasmonics with the FDTD method by using Solid State and Lorentz-Drude Dispersive Modelcaricato daOka Kurniawan
- Documentofree space optics for antenna beamformingcaricato daOka Kurniawan
- Documentofreefallballcaricato daOka Kurniawan
- Documentoscientificmethodcaricato daOka Kurniawan
- Documentovisionofccr_6sept2008_theemmauscaricato daOka Kurniawan
- DocumentoMarriage and Familycaricato daOka Kurniawan
- DocumentoA Direct Method for Charge Collection Probability Computation Using the Reciprocity Theoremcaricato daOka Kurniawan
- DocumentoErrata to "Charge Collection from Within a Collecting Junction Well," IEEE Transactions on Electron Devices, vol. 55, no. 5, pp. 1220, 2008.caricato daOka Kurniawan
- DocumentoPentecost Todaycaricato daOka Kurniawan
- DocumentoSchrodinger and Maxwell Equationscaricato daOka Kurniawan
- DocumentoPraise and Worship in a Catholic Settingcaricato daOka Kurniawan
- DocumentoCharisms, Signs, and Gifts of a Teacher (of the faith)caricato daOka Kurniawan
- DocumentoIntegration of Plasmonics Into Nanoelectronic Circuitscaricato daOka Kurniawan
- DocumentoSimplified Model for Ballistic Current-Voltage Characteristic in Cylindrical Nanowirescaricato daOka Kurniawan
- DocumentoPoster for Computation of Charge Collection Probability for Any Collecting Junction Shapecaricato daOka Kurniawan
- DocumentoComputation of Charge Collection Probability for Any Collecting Junction Shapecaricato daOka Kurniawan
- DocumentoPresentation slides for Study of a Single Coaxial Silicon Nanowire for On-Chip Integrated Photovoltaic Applicationcaricato daOka Kurniawan
- DocumentoStudy of a Single Coaxial Silicon Nanowire for On-Chip Integrated Photovoltaic Applicationcaricato daOka Kurniawan
- DocumentoHenrickson’s Derivation for Electron-Photon Self-Energycaricato daOka Kurniawan
- DocumentoNon-equilibrium Green's Function Calculation of Optical Absorption in Nano Optoelectronic Devicescaricato daOka Kurniawan
- DocumentoNon-equilibrium Green's Function Calculation of Optical Absorption in Nano Optoelectronic Devicescaricato daOka Kurniawan
- DocumentoChoice of Generation Volume Models for Electron Beam Induced Current Computationcaricato daOka Kurniawan
- DocumentoBallistic Calculation of Non Equilibrium Green's Function in Nanoscale Devices Using Finite Element Methodcaricato daOka Kurniawan
- DocumentoAn Analysis on the Alpha Parameter Used for Extracting Surface Re Combination Velocity in EBIC Measurement-Draft3.2caricato daOka Kurniawan
- DocumentoAn Analysis of the Factors Affectingcaricato daOka Kurniawan
- Documentoangerandreconciliation2008caricato daOka Kurniawan
- DocumentoDevice Parameters Characterization with the use of EBICcaricato daOka Kurniawan
- Documentoinvestigation of range-energy relationships for low-energy electron beams in silicon and gallium nitridecaricato daOka Kurniawan
- DocumentoListening to the voice of Godcaricato daOka Kurniawan
- DocumentoThe Science of Scientific Writingcaricato daOka Kurniawan
- DocumentoA method of accurately determining the positions of the edges of depletion regions in semiconductor junctionscaricato daOka Kurniawan
- DocumentoCarbon nanotube Schottky diodecaricato daOka Kurniawan
- DocumentoCharge Collection From Within a Collecting Junction Wellcaricato daOka Kurniawan
- DocumentoDetermination of diffusion lengths with the use of EBIC from a diffused junction with any values of junction depthscaricato daOka Kurniawan