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Precise Accurate Well known Non-destructive Analytical technique It is used for a variety of measurements: Thickness of films. Optical properties Dielectrics Refractive index Organics Crystallinity Semiconductors Uniformity Metal layers Modeling of surface Thickness Measurement Range roughness
Metals 0.1 nm 50 nm Non-Metals 0.1 nm 0.01 mm
http://www.jawoollam.com/tutorial_1.html
1. Light Source
2. Linear Polarizer
4. Analyzer
3. Compensator
Sample
Light Source
1. The light source consists of wavelengths in the
following regions
Ultraviolet
185nm 260nm
Visible
0.4nm 0.7nm
Infrared
0.7nm 1.1m
http://www.flame-detection.net/flame_detector/flame_detection_school/flame_spectrum.htm
polarization at the output 3. Compensator - used to shift the phase of one component of the incident light
http://www.nanofilm.de/fileadmin/cnt_pdf/technology/Ellipsometry_principle__150dpi_s.pdf
SE Advantages
No contact with the films is required for the analysis
of films
Technique does not require a reference or standards Analysis is less sensitive to the fluctuations of light
intensity
Thickness measurement speed 1 300 sec/Location
https://www.filmetrics.com/metals
632.8 nm
Advantages:
Laser can focus on a specific spot Lasers have a higher power than broad band light sources
http://www.eas.asu.edu/nanofab/capabilities/metrology.html
1. Light Source
2. Linear Polarizer
4. Analyzer
3. Compensator
Sample
Imaging Ellipsometry
Combines SWE with Microscopy High Lateral Resolution
Advantages: Provides film thickness and refractive index Provides a real time contrast image of the sample Ability to restrict ellipsometric analysis to a particular region of interest within the field-of-view The signal provided is spatially resolved to show the details of the sample
http://www.soem.ecu.edu.au/physics/physics_facilities.htm
Linearly Polarized Light Laser Light Source Linear Polarizer Compensator Analyzer
Objective
Sample
Elliptically Polarized Light
Thanks