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Contents 1
Measurement object x1
y
Ratio
measuring system
Reference xr
Measurement object x1
xe xe y
Ratio
Exciter
measuring system
Reference xr
2. MEASUREMENT OF PHYSICAL QUANTITIES. 2.1. Acquisition of information 3
AC magnetic field
R Measurement
v model
Instrumentation
Reference
d[B cos(2pf t) A]
v=-
dt
2. MEASUREMENT OF PHYSICAL QUANTITIES. 2.1. Acquisition of information 4
DC magnetic field
Exciter Reference
d[B cos(2pf t) A]
v=-
dt
2. MEASUREMENT OF PHYSICAL QUANTITIES. 2.1. Acquisition of information 5
Exciter
I
Ratio
Ratio R
R VR measuring system
measuring system
Ratio R
T0ºK R vn
measuring system
2. MEASUREMENT OF PHYSICAL QUANTITIES. 2.2. Units, systems of units, standards. 2.2.1. Units 6
Reference: [1]
2. MEASUREMENT OF PHYSICAL QUANTITIES. 2.2. Units, systems of units, standards. 2.2.2. Systems of units 7
If
Reference: [1]
2. MEASUREMENT OF PHYSICAL QUANTITIES. 2.2. Units, systems of units, standards. 2.2.2. Systems of units 8
2.2.3. Standards
The terms unit and physical quantity are both abstract
concepts. In order to use a unit as a measure, there must be
a realization of the unit available: a physical standard.
Reference: [1]
2. MEASUREMENT OF PHYSICAL QUANTITIES. 2.2. Units, systems of units, standards. 2.2.2. Standards 12
Reference: [1]
2. MEASUREMENT OF PHYSICAL QUANTITIES. 2.2. Units, systems of units, standards. 2.2.2. Standards 13
Primary
standard
Secondary
standard
Absolute Relative
accuracy accuracy
Measuring
instrument
Device
under test
2. MEASUREMENT OF PHYSICAL QUANTITIES. 2.2. Units, systems of units, standards. 2.2.2. Standards 14
Standards users
Defacto
National International Industry
international
standards standards standards
standards
International International
Organization for Electrotechnical
Standards (ISO) Commission (IEC)
American Institute of
American
Society for Electrical and
Society for Other member
Testing and Electronic
Quality societies
Materials Engineers
(ASQ)
(ASTM) (IEEE)
2. MEASUREMENT OF PHYSICAL QUANTITIES. 2.2. Units, systems of units, standards. 2.2.2. Standards 15
DE
e f 0= DE/h
The atoms of Cesium-133 are selected with electrons
jumping to a lower energy level and emitting photons at f 0=
9.19263177160 GHz. The unit of time, 1 s, is defined as the
duration of exactly f0 cycles. A crystal oscillator in the
feedback loop of the exciter is used to adjust the frequency
of the standard to that frequency at which most transactions
occur. (The quality factor of so tuned standard Q=2107.)
http://en.wikipedia.org/wiki/Michelson-Morley_experiment http://eosweb.larc.nasa.gov/EDDOCS/Wavelengths_for_Colors.html
2. MEASUREMENT OF PHYSICAL QUANTITIES. 2.3. Primary standards. 2.3.1. Primary voltage standards 19
h
V = f0
2q
A Josephson junction at ~4 K
h
V = f0
2q
I
V
dF dF
mg = - I V I = mgv V=-v
dz dz
Thin semiconductor
at ~1.5 K
h
R=
q2
www.lne.fr/en/r_and_d/electrical_metrology/josephson_effect_ej.shtml http://www.warwick.ac.uk/%7Ephsbm/qhe.htm
2. MEASUREMENT OF PHYSICAL QUANTITIES. 2.3. Primary standards. 2.3.3. Primary resistance standards 24
C1 C2
ln 2
C = e0 L L 1.9 pF/m
p
Reference: [1]
2. MEASUREMENT OF PHYSICAL QUANTITIES. 2.3. Primary standards. 2.3.5. Primary inductance standards 28
Z1 Z3 Z5
Z=
Z2 Z4 Z1
Z2
Z3
Z4
Z5
Reference: [1]
2. MEASUREMENT OF PHYSICAL QUANTITIES. 2.3. Primary standards. 2.3.5. Primary inductance standards 29
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