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FLEX testing
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FLEX connector
• Glenair (UK) was contacted to customize a connector for the FLEX and the peripheral electronics.
• Number of signals/pins per module
Signal type Signal name No. of wires Comments
HV 1 kV max. 2 Clearance
POWER 1x Vdda, 1x Vddd 2 Minimise voltage drop
GROUND Analog, Digital 1 plane Dedicated layer
Slow control Data, Ck (opt. +rst, error) 2 to 4 I2C link
Input clocks 320 MHz, Fast command e-link 4 or 8 CLPS
(opt. 40 MHz(L1))
Data out lines Readout data (TOT, TOA, Lumi) 4 pairs 4 e-links differential CLPS
ASIC reset ASIC_rst 1 Digital
Monitoring Temperature, Vdda, Vddd 1 or 3 DC voltage
Peripheral board
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Backup slides
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Test implementation
• Post layout simulations with Cadence “Sigrity” and “PowerSI” (signal integrity
and power distribution over long lines).
• Test plan with Kintex KC705. An adapter board is under development as plug-
in for the FMC High-Speed connector on the KC705.
• The FPGA is programmed to inject test patterns at 1.25Gbps and check the
response with the IBERT. SMA connectors on the adapter board route the
signals to the oscilloscope for classical eye-diagram analysis.
• The I/O drivers in the KC705 are compatible with the VC707 used by the
LpGBT designers. Test conditions close to the on-field operation.
• The insulation of the FLEX materials is checked up to 1 kV by the insulation
tester Megger MIT430. The IBERT will be tested w/wo HV in order to test the
feasibility of keeping the HV line in the FLEX.
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Schematic drawing of two adjacent modules on the top side and one on the
bottom side of the cooling plate; the modules are mounted on thin support plates