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Let H denote the event that the wafer contains high levels of
contamination. Let C denote the event that the wafer is in the center of a
sputtering tool. What is the probability of a wafer is from the center of the
sputtering tool or contains high levels of contamination (or both)?
Mutually Exclusive Events
What is the addition rule for three or more events which are not
mutually exclusive?
Example
Calculate the P(F), P(D), P(D|F), P(F|D), and P(DF) and confirm your
conclusions.
Example