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To evaluate the reliability of an electronic system, reliability information on the components used in that system is important. Failure rates are often used as an index for reliability. A failure rate indicates how often a failure occurs per unit time, and failure-rate values generally change over time as shown in the graph:
BIR (Built In Reliability), DfR (Design for Reliability), DfT (Design for Testability)
(Packaging related DfR is not in this discussion).
1. BIR (Built In Reliability) methods designed and used during wafer fabrication technology process development and on-going reliability monitoring. Reliability metrics: for each process module (can be 14-34) vertically integrated, as: - ion implantation - oxide growth - photo lithography, etching - metal processes, etc. Special wafer level rel. stress-test structures being used to test module reliability, as: - gate oxide capacitors (large area) - poly silicon resistors - metal traces - interlayer dielectric capacitors (large area) - contact-and via chains - stand-alone minimum size transistors, etc. WLR (Wafer Level Reliability) testing: utilizes the special test structures (on product wafers or on special test wafers within the production wafer lot). WLR aids process design/development and on-going process reliability monitoring of critical process modules, as: - oxide reliability (TDDB), - hot carrier injection damage - metal electro migration: SWEAT (Standard Wafer-level Electro migration Acceleration Test) - ionic contamination, etc. Maintaining tight distribution of reliability metrics is crucial for IC reliability.
utilize the on-the-chip designed-in BIST (Built In Self Test) feature for embedded memories in ASICs (if available) during the Dynamic Life Test (ALT) to stimulate/exercise all transistors of the embedded memories.
* Board Level Solder Joint Reliability Modeling (second level reliability): package-circuit board interaction. Critical issue for QFP, TFBG, QFN packages. The model is correlated to temperature cycling results . The solder joint faigue life calculated using this model.