A NEW SCANNING METHOD FOR FAST ATOMIC FORCE MICROSCOPY

Guided By Mrs.SOUMYA.D.S Asst.Professor Dept.of ECE YCET

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Submitted By NINU.J.S S1, AEI YCET

OVERVIEW
Introduction AFM working Spiral scan Comparison System description & Identification Advantage & Disadvantage Future Enhancement Conclusion Bibliography
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INTRODUCTION
Atomic Force microscope (AFM) has an important tool in nanotechnology. It was first conceived to generate 3-D images of

conducting as well as non conducting surfaces.

It is also used for the manipulation of material surface at

nanoscale.
Introduce a new scanning method to AFM.
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 Sample is scanned in the spiral pattern.

Spiral scan have 2 modes

Constant angular velocity spiral(CAV)

Constant linear velocity spiral(CLV)

These scan method can be incorporated into the AFM

with minimal effort. Spiral scan produce high quality images.

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AFM

Fig.1. Basic AFM schematic with feedback controllers.

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 AFM have 2 modes of operation Contact mode Non contact mode A raster scan is attained by applying triangular waveform to the x-axis & ramp signal to the y-axis. High speed raster scan need high frequency triangular waveform.
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 Fast triangular waveform results the distorted AFM image.

Accuracy of the AFM image also affected by the

nonlinear properties.

Feed back control technique is used to avoid these

complications. Spiral scan can be produce by applying the sinusoidal signal as the inputs.
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SPIRAL SCAN
The pattern is known as Archimedean spiral. A property of the spiral is that its pitch P.

Fig.2. spiral scan

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CAV SPIRAL
The differential equation that generate the CAV Spiral is

where

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 Total scanning time associated with the CAV Spiral is

The input signal applied to the scanner in the x & y axis is

Fig.3. Input signal to be applied in x-axis

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Fig.4. Input signal to be applied in y-axis

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There is a phase errors between the input & output signals.

These phase errors can be eliminated by introducing the phase constants in the input signals.

The single frequency sinusoidal signals can be used to track the CAV Spiral.

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CLV SPIRAL
The differential equation that generate the CLV Spiral is

From these

Total scanning time of CLV Spiral is

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The input signals that generate the CLV Spiral is

Fig.5. Input signal to be applied in x-axis

Fig.6. Input signal to be applied in y-axis

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TOTAL SCAN TIME : SPIRAL VERSUS RASTER

For the equal area & pitch ,the total scanning time for both raster & spiral scan is

The number of lines in the raster scanned image is

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Total scan time for the raster scanned image is

Total scanning time to generate the CAV Spiral is

Linear velocity of the raster scan is,

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TOTAL TRAJECTORY DISTANCE : SPIRAL VERSUS RASTER SCAN

Total trajectory distance of spiral scan is

Total trajectory distance of raster scan is

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MAPPING SPIRAL POINTS TO RASTER POINTS

Spiral scanned images are plotted by mapping spiral points to raster points

Fig.7. Mapping in CAV Spiral

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Fig.8. Mapping in CLV Spiral

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SYSTEM DESCRIPTION
SPM was configured to operate as an AFM The voltage amplifiers were replaced with the charge amplifiers.

DSPACE system was used to implement the feedback

controllers.

Amplifiers & SPM were interfaced with the DSPACE

using a signal access module.
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 Piezoelectric tube is platted with inner & outer electrodes. Outer electrodes are segmented into 4 parts. Bridge configuration of these electrode will halves the input voltage requirement.

Fig.9. Bridge configuration of electrodes

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SYSTEM IDENTIFICATION

Fig.10. Block diagram of the experimental setup used for system identification
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CONTROLLER DESIGN
Controller achieve good damping ratio & higher tracking.

PPF increase the overall damping.

High gain integral controller provide tracking.

Fig.11. Structure of x-axis feedback controller

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ADVANTAGES
Good quality images are produced. Scanning time is low compared to raster scanning. Less wear on the AFM tip.

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DISADVANTAGES
CLV mode spiral scanning requires high bandwidth controller. Scanning time gain will produce small distortion at the centre of the image. On the spiral image plotting ,computational time will increases in CAV mode.
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FUTURE ENHANCEMENT
Spiral scanning will be also used in the scanning tunneling microscopy(STM).

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CONCLUSION
A new scanning method can be incorporated in AFM. The spiral scan have 2 modes CAV &CLV modes. Spiral scanned images have great accuracy than raster scan.

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BIBLIOGRAPHY
[1] Y. K. Yong, S. Aphale, and S. O. R. Moheimani, Design, identication,and control of a exure-based xy stage for fast nanoscale positioning,IEEE Trans. Nanotechnol., vol. 8, no. 1, pp. 4654, Jan. 2009. [2] S. Devasia, E. Eleftheriou, and S.Moheimani, A survey of control issues in nanopositioning, IEEE Trans. Control Syst. Technol., vol. 15, no. 5,pp. 802823, Sep. 2007. [3] N. Tamer and M. Dahleh, Feedback control of piezoelectric tube scan-ners, in Proc. 33rd IEEE Conf. Decision Control, Dec. 1994, vol. 2,pp. 18261831. [4] G. Binnig, C. F. Quate, and C. Gerber, Atomic force microscope, Phys.Rev. Lett., vol. 56, no. 9, pp. 930933, Mar. 1986.
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THANK YOU........

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