Presented by Reeta Sharma Moderated by Dr.

Amar Ranjan

Electron microscope is an instrument that used to see the small minute objects which can not be seen with Light microscope

Uses the beam of electron instead of light rays

Since wave properties were associated with beam of electron In 1924 Busch demonstrated that beam of electron could be focused by magnetic field Surrounding the beam These two characteristics of electron beam enabled

Ruska& knoll to construct the first

Transmission electron microscope in 1931

Instrument that uses beam of electrons which are deflected by electromagnetic lenses to form magnified image Gives much better resolution Having magnification power up to 10 lacks

High velocity homogenous beam of electrons passes through the specimen the emergent beam of electron is refracted by electromagnetic system to form magnified image

Numerical aperture of Electron microscope is 0.01

Resolution is smallest distance between two close points resolved by an instrument

In optical terms

R = Wavelength of electron / 2 N.A.

R = Resolution of microscope N.A. = Numerical aperture of objective lens

Magnification power of the microscope is power to produce highly magnified image of small minute objects MAGNIFICATION= EYE PIECE X OBJECTIVE

Electron gun Electromagnetic lenses Microscope column Electrical system Vacuum system chiller

Electron gun is Responsible for generation of electrons

PARTS OF ELECTRON GUN

FILAMENT May be of Tungsten & lanthanum hexabromide

v shaped in structure

WehnAlt shield apertured electrode

covering filament

- carries higher negative voltage

ANODE Aperture disk positioned as

short distance away from shield

Arranged in column of Electron microscope Surrounded by cooling piles

Consist of evacuated metal tube in which electron aligned over one another

Tungsten filament enclosed between anode & cathode plates , electromagnetic lenses, viewing screen in which image formed

Electrical system comprises of

High tension power supply Stabilize dc supply for lenses SMP supply for computer system

Vacuum system is necessary for the reasons(i) Electrons travel few micrometer in air before they stopped by collision with gas molecule

- As the distance between electron gun &image translating system is 1m ,EM -4 will operate with vacuum of 1.3 10 Pa

(ii) In absence or low vacuum, the life of filament is reduced due to oxidation , so EM column should be evacuated (iii) Gas molecule present in between the filament and anode will convert negatively charged particle into positively charged ions - bombardment with electrons Result the production of continuous discharge

Chiller is responsible for maintaining low temperature around

Electromagnetic lenses

Deflection coils
High voltage generator

Transmission electron microscope {TEM} Scanning electron microscope {SEM}

Transmission electron microscope - most common type of electron microscope - Having high resolution power

- Form two dimensional image

- Uses Tungsten bulb as light source

TRANSMISSION ELECTRON MICROSCOPE

Scanning electron microscope

PRINCIPLE
- Beam of electron scans the specimen - Secondary electron reflected is collected by secondary electron detector - then passed through photomultiplier to CRT where picture is displayed

SCANNING ELECTRON MICROSCOPE

3D image is formed

Thin and thick both sections can be used

Light source : Lanthanum hexabromide

THANK YOU