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Mass/Unit cell
Volume/Unit cell
=
a=
2
4R
=
2
1278 . 0 4 nm
= 0.361 nm
Volume of unit cell = V= a
3
= (0.361nm)
3
= 4.7 x 10
-29
m
3
v
\
|
g
Mg
mol atoms
mol g atoms
6
23
10
/ 10 022 . 6
) / 54 . 63 )( 4 (
= 4.22 x 10
-28
Mg
3 3 3 29
28
98 . 8 98 . 8
10 7 . 4
10 22 . 4
cm
g
m
Mg
m
Mg
V
m
= =
= =
12
Planar Atomic Density
Planar atomic
density =
Example:- In Iron (BCC, a=0.287), The (100) plane
intersects center of 5 atoms (Four and 1 full atom).
Equivalent number of atoms = (4 x ) + 1 = 2 atoms
Area of 110 plane =
Equivalent number of atoms whose
centers are intersected by selected area
p
=
Selected area
2
2 2 a a a =
p
( )
2
287 . 0 2
2
=
2
13
2
10 72 . 1 2 . 17
mm nm
atoms
= =
Figure 3.22 a&b
13
Linear Atomic Density
Linear atomic density =
Example:- For a FCC copper crystal (a=0.361), the
[110] direction intersects 2 half diameters and 1 full
diameter.
Therefore, it intersects + + 1 = 2 atomic
diameters.
Length of line =
l
=
Number of atomic diameters
intersected by selected length
of line in direction of interest
Selected length of line
mm
atoms
nm
atoms
nm
atoms
6
10 92 . 3 92 . 3
361 . 0 2
2
= =
=
l
nm 361 . 0 2
Figure 3.23
14
Interplanar Spacing
Interplanar spacing
in cubic crystal structures
between two closest parallel
planes with the same
Miller indices
is designated dhkl,
where h, k, and l are
the Miller indices
of the planes.
This spacing represents
the distance from a
selected origin containing one
plane and another parallel plane
with the same indices
that is closest to it.
15
Where :
d
hkl
= interplanar spacing between
parallel closest planes with
Miller indices h, k, l.
a = Lattice constant
h, k, l = Miller indices of cubic planes
being considered.
2 2 2
l k h
a
d
hkl
+ +
=
16
X-Ray Diffraction (XRD)
X-Ray Diffraction (XRD) is a method used
to determine the crystal structures, atomic
radii and interplanar distance (distance
from one plane to the next adjacent
plane). X-ray is directed toward a flat
sample at an angle u and a certain
wavelength, . Planes of atoms/ions within
the crystal will reflect back the x-ray.
17
X-Ray Diffraction and Braggs
Law
X- rays are a form of electromagnetic radiation
that have high energies and short wavelengths-
wavelengths on the order of the atomic spacings
for solids.
When a beam of x-rays impinges on a solid
material, portion of this beam will be scattered in
all directions by the electrons associated with
each atom or ion that lies within the beams
path. (i.e the interaction of photon of the
radiation with the orbital electrons in the atom)
18
Crystal planes of target metal
act as mirrors
reflecting X-ray beam.
If rays leaving a set of planes
are out of phase (as in case
of arbitrary angle of incidence)
no reinforced beam is
produced.
If rays leaving are in phase,
reinforced beams are
produced.
19
Derivation of Braggs Law
20
For rays reflected from different planes
to be in phase,the extra distance traveled
by a ray should be a integral multiple of wave
length .
n = MP + PN (n = 1,2)
n is order of diffraction
If d
hkl
is interplanar distance,
Then MP = PN = d
hkl
.Sin
Therefore, = 2 d
hkl
.Sin
Figure 3.28
21
2
2 2 2 2
2
2 2 2
2 2 2
4
2
2
a
l k h
Sin
l k h
aSin
dSin
l k h
a
d
hkl
+ +
=
+ +
=
=
+ +
=
u
u
u
Note that the wavelength and lattice constant a are the same
for both incoming and outgoing radiation.
Since
Substituting for d,
Therefore
Square power
22
Scanning Electron Microscope
(SEM)
An important tool in
materials science.
Electron source
generates electrons.
Electrons hit the
surface and secondary
electrons are produced.
The secondary
electrons are collected
to produce the signal.
The signal is used to
produce the image.
23
How does SEM works?
The SEM is an instrument that produces a large magnified
image by using electrons instead of light to form an
image.
A beam of electrons is produced at the top of the
microscope by an electron gun.
The electron beam follows a vertical path through the
microscope, which is held within a vacuum.
The beam travels through electromagnetic fields and
lenses, which focus the beam down toward the sample.
Once the beam hits the sample, electrons and X-rays are
ejected from the sample.
Detectors collect these X-rays, backscattered electrons,
and secondary electrons and convert them into a signal
that is sent to a screen similar to a television
screen. This produces the final image
24
A typical SEM instrument, showing the electron column,
sample chamber, EDS detector, electronics console, and
visual display monitors.
25
26
SEM image of gypsum and/or anhydrite crystals
27
Anthophyllite asbestos, Georgia
SEM of intergranular corrosion fracture near a
circumferential weld in a thick wall tube made of
304SS
28
SEM in material analysis
Used to examine fractured surfaces of
metals.
Samples to be analyzed is normally
coated with gold or other heavy metals to
achieve better resolution.
Limitation: Sample must fit chamber size.
29
Transmission Electron Microscopy (TEM)
Electron produced by
heated tungsten
filament.
Accelerated by high
voltage (75 - 120 KV)
Electron beam passes
through very thin
specimen.
Difference in atomic
arrangement change
directions of electrons.
Beam is enlarged and
focused on fluorescent
screen.
30
TEM
TEM is used to study defects in materials
in nanometer range.
Sample preparation is more complex than
using SEM.
Sample must be very small (thickness
several hundred nanometers), thin, flat
surface.
Requires highly specialized equipment to
thin a sample.
31