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MOHAMMAD A MAKTOOMI
M.TECH (CSD: 2011-2013)
ELED,AMU
Noise: Definition & Classification
EXTERNAL noise: Outside Interference
- Even between different part of circuit
(Electric & Magnetic interaction through
parasitic capacitor/ inductor)
Everything except the desirable ones !
Contd
External noise: periodic, intermittent, or
random
- Present, even if we could manage to remove all
external noise !
- Always random- due to random phenomena like
thermal agitation of electrons in resistors/ random
EHP generation/recombination in semiconductors.
INTERNAL noise: INHERENT NOISE
It limits minimum signal that can be
processed/detected
The noise level of a circuit directly trades
with power dissipation and speed
In most circuits, low noise dictates the use
of large capacitors and/or large g
m
which
means high power dissipation
But, Why do we care???
Contd
The noise has become increasingly
important in modern technologies with
reduced supply voltages
Designing a low power precision circuit
requires good understanding of
electronic noise!
BASIC CONCEPTS
RMS value:
T is some suitable averaging interval.
is mean-square value= average power
dissipated by x
n
(t) in 1 resistor.
NOISE SUMMATION: if the noise are
uncorrelated then superposition holds for
power -
1/ 2
2
0
1
( )
T
n n
X x t dt
T
| |
=
|
\ .
2
n
X
2 2 2 2
1 2 1 2
0
1
[ ( ) ( )]
T
n n n n n
X x t x t dt X X
T
| |
= + = +
|
\ .
SPECTRAL DENSITY
Power spectral density (PSD) shows how
much power signal caries at a particular
frequency.
Expressed as or !
Total (mean) power is, then
2
/ V Hz
/ V Hz
Noise Type: A brief description
THERMAL NOISE
Result of random motion of electrons in
conductor due to thermal effects
White spectral density
Proportional to absolute temperature
Also known as Johnson or Nyquist noise
THERMAL NOISE
r
+
3.88 9
V
E
Hz
Mean-power:
RMS output noise = 122.67nV
Input referred noise= 122.67nV/
=1.35uV
1
2 2 2
0
( ) (3.88 9 ) .1
k
out out
V
V V f df E kHz
Hz
= =
1
( )
1 10
k
k k +
SPICE SIMULATION
NOISE in DIODES
SHORT noise is major source
Model: A current source in parallel to
incremental resistance
PSD:
2
( ) 2
d d
I f qI =
d
d
KT
r
qI
=
2
/ A Hz
NOISE IN BJTs
Due to Shot noise of Base and collector
current
Flicker noise of base current
Thermal noise of base resistance
Common practice is to model all noise by
two equivalent sources at the base:
2
1
( ) 4 ( )
2
i b
m
V f KT r
g
= +
2
2
( ) 2 (
( )
C B
i B
I KI
I f q I
f
f |
= + +
NOISE IN MOSFET
Dominant source is Flicker and Shot noise
Flicker Noise Modeled by a voltage source in series
with gate:
K is device dependent parameter (lower for PMOS
than NMOS as their majority carrier is less likely
to be trapped)
Large area device has low flicker noise !
Thermal noise due to resistive channel
In saturation, modeled by a drain to source current
of
2
( )
g
ox
K
V f
WLC f
=
2
2
( ) 4 ( )
3
d m
I f KT g =
Models could be simplified by
Dividing current by in referring
Back to input as voltage source
Or vice versa. [ ]
2
m
g
d m gs
i g v =
Opamp Model
Modeled by three uncorrelated
Noise sources as shown.
In CMOS opamp, Current sources
may be ignored, at low frequencies
SUMMARY of Noise
Models
EXAMPLE-1
An opamp Circuit
Integrate, and add.
EXAMPLE-2
Common-source stage
2 2 2
,
2 4
(4 . )
3
n out m m D
ox D
K KT
V KT g g R
C WLf R
= + +
2
V
Hz
Resistors thermal noise
MOS thermal & flicker noise
EXAMPLE-3
Common-emitter
Evaluate optimum
I
C
, to minimize
Equivalent input
Noise
Assume:
Collector shot noise dominate input noise voltage
Base current shot noise dominates input noise current
Given assumptions mean
Differentiate and equate to zero to obtain,
Conclusion
Discussed various terminology
Discussed Various noise mechanism
Discussed noise models of various
elements
Some examples were discussed
SPICE simulation discussed
References
John and Martin, Analog Integrated Circuit Design
John Wiley & Sons, India, 1997
Baker, R J, CMOS Circuit design, layout and
simulation, John Wiley & sons, India, 2005
Razavi, B, Design of Analog CMOS Integrated
Circuits, TMH, India, 2002
Voss, 1/f(flicker noise): A brief review,
33rd Annual Symposium on Frequency Control.
1979, pn,40-46