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Technical Seminar Metrology Center Open House April 9-10, 2008 Dave MacKenzie
Fundamentals of Surface Measurement April 9-10, 2008 D.F. MacKenzie, Mahr Federal Inc. Slide 1
Presentation Scope
Examples of Why We Measure Surface Texture Stylus Based Instruments Stylus Tracing Methods Filters and Cutoff Basic Parameters Best Practices Correlation Checklist Review and Recommendations References
Fundamentals of Surface Measurement April 9-10, 2008 D.F. MacKenzie, Mahr Federal Inc. Slide 2
Fundamentals of Surface Measurement April 9-10, 2008 D.F. MacKenzie, Mahr Federal Inc. Slide 3
Fundamentals of Surface Measurement April 9-10, 2008 D.F. MacKenzie, Mahr Federal Inc. Slide 4
Examples of Why We Measure for Size Control Roughness peak to valley can be >4 times Ra Surface texture specification should be in appropriate for diameter tolerance
Uncertainty
Fundamentals of Surface Measurement April 9-10, 2008 D.F. MacKenzie, Mahr Federal Inc. Slide 6
Fundamentals of Surface Measurement April 9-10, 2008 D.F. MacKenzie, Mahr Federal Inc. Slide 7
Capacitance
Ultrasonic
Inductive
Laser
Focus Detection
Interferometry
Projected Light
Electron Microscopy
Intensity Detection
Differential Detection
Phase Shift
SEM
STM
Critical Angle
Astigmatic Method
Scanning Differential
AFM
Foucault Method
Confocal Method
Fundamentals of Surface Measurement April 9-10, 2008 D.F. MacKenzie, Mahr Federal Inc. Slide 8
Fundamentals of Surface Measurement April 9-10, 2008 D.F. MacKenzie, Mahr Federal Inc. Slide 9
Fundamentals of Surface Measurement April 9-10, 2008 D.F. MacKenzie, Mahr Federal Inc. Slide 10
Portable Instruments
Battery Operated Inductive, skidded pick-up Integral or Separate Drive LCD Display Printer and Output Available
Fundamentals of Surface Measurement April 9-10, 2008 D.F. MacKenzie, Mahr Federal Inc. Slide 11
PC-Based Instrument
XR 20
Fundamentals of Surface Measurement April 9-10, 2008 D.F. MacKenzie, Mahr Federal Inc. Slide 12
Tracing Direction
Part To Be Measured
Fundamentals of Surface Measurement April 9-10, 2008 D.F. MacKenzie, Mahr Federal Inc. Slide 13
90
Tracing Direction
Traces are typically done 90 to lay, with a conical diamond stylus To separate surface wavelengths, a filter is applied to the profile data
Fundamentals of Surface Measurement April 9-10, 2008 D.F. MacKenzie, Mahr Federal Inc. Slide 15
Surface Irregularities
Mean Line
Fundamentals of Surface Measurement April 9-10, 2008 D.F. MacKenzie, Mahr Federal Inc. Slide 16
Skidded Measurement
Surface Drive
Tracing Direction
Skid
Part To Be Measured
The skid and the diamond are independent, and are in contact with the surface. The skid and diamond follow the surface during measurement. The surface deviations are measured by the change in the diamond position relative to the plane of the skid.
Fundamentals of Surface Measurement April 9-10, 2008 D.F. MacKenzie, Mahr Federal Inc. Slide 17
Skidded Measurement
Skid
Part To Be Measured
Skidded instruments measure only Roughness parameters (R) Waviness is filtered out by the skid following the surface. Most portable instruments are skidded.
Fundamentals of Surface Measurement April 9-10, 2008 D.F. MacKenzie, Mahr Federal Inc. Slide 18
Skidless Measurement
Surface Drive
Tracing Direction
Part To Be Measured
The diamond alone follows the surface during the measurement Deviations are measured by the change in the diamond position relative to the plane of the drive datum guide. Skidless instruments are more expensive than skidded instruments, due to the required straight datum guide
Fundamentals of Surface Measurement April 9-10, 2008 D.F. MacKenzie, Mahr Federal Inc. Slide 19
Skidless Measurement
Part To Be Measured
Skidless instruments measure Roughness, Waviness and Profile Skidless measurements are more accurate than measurements done with a skid
Fundamentals of Surface Measurement April 9-10, 2008 D.F. MacKenzie, Mahr Federal Inc. Slide 20
Conical Diamond
60 or 90 degrees
Radius 2, 5, 10m
Fundamentals of Surface Measurement April 9-10, 2008 D.F. MacKenzie, Mahr Federal Inc. Slide 21
Fundamentals of Surface Measurement April 9-10, 2008 D.F. MacKenzie, Mahr Federal Inc. Slide 22
Measurement Lengths
c1 c2
c3
c4
c5
Mean Line
Roughness Filters
A filter is used to isolate the roughness wavelength band Filters are Mechanical and Digital
Mechanical filters
Diamond Radius (valley suppression by diamond radius) Skid (greater or lesser skid bridging effect of skid on surface valleys, dependent on skid geometry), also filters out waviness
Digital Filters
RC (Simulated old analog electrical resistor capacitor) Gaussian
The user selects the Cutoff setting used by the filter to isolate the roughness wavelength band Filters typically have transmission curves Filtered data is centered around a mean line
Fundamentals of Surface Measurement April 9-10, 2008 D.F. MacKenzie, Mahr Federal Inc. Slide 24
Cutoff functions in a method similar to this screening machine sorting mixed material via screens, into size categories
Fundamentals of Surface Measurement April 9-10, 2008 D.F. MacKenzie, Mahr Federal Inc.
The cutoff selected must be short enough to exclude long wavelengths (waviness) The cutoff selected must be long enough for a valid sample (at least 10 toolmarks per cutoff) Lengths are defined in ASME and ISO standards Cutoff default formerly was .8 mm, now must be defined on the drawing (ASME)
Slide 26
Fundamentals of Surface Measurement April 9-10, 2008 D.F. MacKenzie, Mahr Federal Inc.
s short wavelength cutoff for roughness c long wavelength cutoff for roughness sw short wavelength cutoff for waviness cw long wavelength cutoff for waviness
Fundamentals of Surface Measurement April 9-10, 2008 D.F. MacKenzie, Mahr Federal Inc. Slide 27
c .80 mm
Roughness
Ra = .560 m
Waviness
Ra = 1.149 m
Waviness
W a = .827 m W t = 4.592 m
Fundamentals of Surface Measurement April 9-10, 2008 D.F. MacKenzie, Mahr Federal Inc.
W a = .229 m W t = 1.187 m
Slide 28
c .80 mm
Roughness
Ra = .560 m Rt = 5.555 m
Waviness
Ra = 1.149 m Rt = 6.294 m
Waviness
W a = .827 m W t = 4.592 m
Fundamentals of Surface Measurement April 9-10, 2008 D.F. MacKenzie, Mahr Federal Inc.
W a = .229 m W t = 1.187 m
Slide 29
Fundamentals of Surface Measurement April 9-10, 2008 D.F. MacKenzie, Mahr Federal Inc. Slide 30
Fundamentals of Surface Measurement April 9-10, 2008 D.F. MacKenzie, Mahr Federal Inc. Slide 31
Ra is the most
commonly specified parameter in USA Roughness average (Ra) is the arithmetic average of the absolute values of the roughness profile ordinates.
Fundamentals of Surface Measurement April 9-10, 2008 D.F. MacKenzie, Mahr Federal Inc. Slide 32
Step 1: Calculation of Ra
L
10
Mean Line
Step 2: Calculation of Ra
Mean Line
Step 3: Calculation of Ra
Mean Line
Z2 Z1
Fundamentals of Surface Measurement April 9-10, 2008 D.F. MacKenzie, Mahr Federal Inc. Slide 35
Ra (Z1 + Z2 + + Zn ) n
Shaft
Surface performance is different due to bearing contact Ra is often specified and is valuable for monitoring process stability, other parameters may be needed to monitor for surface function
Fundamentals of Surface Measurement April 9-10, 2008 D.F. MacKenzie, Mahr Federal Inc. Slide 36
Step 1: Calculation of Rq
L
10
Mean Line
Step 2: Calculation of Rq
L
Mean Line
Z2 Z1
Fundamentals of Surface Measurement April 9-10, 2008 D.F. MacKenzie, Mahr Federal Inc. Slide 38
Rq
Mean Line
Rz1
Rz2
Rz3
Rz4 Rz5
Rz = (Rz1 + Rz2 + )
Fundamentals of Surface Measurement April 9-10, 2008 D.F. MacKenzie, Mahr Federal Inc.
5
Slide 39
Calculation of Rmax
c1 c2 c3 c4 c5
Mean Line
Rz1
Rz2
Rz3
Rz4 Rz5
Rmax = Rz5
Fundamentals of Surface Measurement April 9-10, 2008 D.F. MacKenzie, Mahr Federal Inc.
Slide 40
Calculation of Rp
Rp
c1 c2 c3 c4 c5
Mean Line
Fundamentals of Surface Measurement April 9-10, 2008 D.F. MacKenzie, Mahr Federal Inc. Slide 41
Calculation of Rpm
c1 c2 c3 c4 c5
Mean Line
Rp1
Rp2
Rp3
Rp4
Rp5
5
Slide 42
Calculation of Rv
c1 c2 c3 c4 c5
Mean Line
Rv
Fundamentals of Surface Measurement April 9-10, 2008 D.F. MacKenzie, Mahr Federal Inc. Slide 43
Calculation of Rt
c1 c2 c3 c4 c5
Mean Line
Rt
Fundamentals of Surface Measurement April 9-10, 2008 D.F. MacKenzie, Mahr Federal Inc. Slide 44
Generally, a maximum peak-to-valley measurement of waviness (roughness has been filtered out)
Fundamentals of Surface Measurement April 9-10, 2008 D.F. MacKenzie, Mahr Federal Inc. Slide 45
Fundamentals of Surface Measurement April 9-10, 2008 D.F. MacKenzie, Mahr Federal Inc. Slide 46
Correct
Incorrect
Fundamentals of Surface Measurement April 9-10, 2008 D.F. MacKenzie, Mahr Federal Inc. Slide 48
Correct
Incorrect
Fundamentals of Surface Measurement April 9-10, 2008 D.F. MacKenzie, Mahr Federal Inc. Slide 49
Diamond Condition
Diamond radius is gone, now a crater
Fundamentals of Surface Measurement April 9-10, 2008 D.F. MacKenzie, Mahr Federal Inc. Slide 50
Correlation Checklist
If you have a correlation problem on surface finish measurement here are some things to check:
Instrument calibration to manufacturers method Parameter (Ra) and Standard (ISO, JIS, ASME) Filter (Gaussian, RC) Cutoff Diamond Radius and included angle Diamond condition Stylus force Skidded or Skidless Part alignment/stability Ambient vibration Data density (X and Z) Measurement location and orientation to lay
Fundamentals of Surface Measurement April 9-10, 2008 D.F. MacKenzie, Mahr Federal Inc. Slide 51
April 9-10, 2008
Fundamentals of Surface Measurement April 9-10, 2008 D.F. MacKenzie, Mahr Federal Inc. Slide 53
References
1. 2. 3. 4. 5. 6. 7. 8. Tabenkin, A., : Surface Finish: A Machinist's Tool, A Design Necessity, Modern Machine Shop. April 1996 Tabenkin, A., : Surface Finish Measurement Basics, Quality Magazine. September 2004 Tabenkin, A., : Where do we go wrong in surface finish gaging?, Quality in Manufacturing. November/December 1998. Sander, M.: A Practical Guide to the Assessment of Surface Texture, Feinpruf GmbH, Goettingen 1989 ANSI/ASME B46.1 - 2002 Surface Texture, Surface Roughness, Waviness and Lay, American Society of Mechanical Engineers , 2002 ANSI/ASME Y14.36M-1996(R2002) Surface Texture Symbols - Metric version, American Society of Mechanical Engineers, 1996 Nugent, P., MacKenzie D., Developments in Surface (and Form) Measurement Technology (Presentation for Caterpillar), October 2006. Vorburger, T., Raja, J., Surface Finish Metrology Tutorial (NISTIR 89-4088), U.S. Department of Commerce, National Institute of Standards and Technology, June 1990.
Note: Parameter calculations in this presentation are shown for discussion and purposes of illustration only. Refer to the ANSI/ASME B46.1 - 2002 Surface Texture, Surface Roughness, Waviness and Lay for actual calculations and methods of evaluation
Fundamentals of Surface Measurement April 9-10, 2008 D.F. MacKenzie, Mahr Federal Inc. Slide 54