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Surbhi Mital
#l
, Ji Zhang
#2
, Dr. David Pommerenke
#3
, Dr. James . Drewniak
#4
, Kuifeng HU
*
l
, Xiaopeng Dong
&l
EMC lab, Electrical and Comuter Engineering, Mssouri University of Science and Technology
Rolla, MO 65+0 USA
3davidjp@mst.edu
*
Ailent Technologies 100Garden of Gods Road Mail Stop 1?JColorado Springs, CO 80?0, USA
lKuifeng.Hu@agilent.com

?111^?5
|
Ave, Intel Corporation, Hillsboro, OR 71?+, USA
lxiaopeng.dong@intel.com
Astact- This paper presents an approach to obtain a fat
fequency response fom the frst order derivative behavior of
an electrically small lop and electrically short electric feld
probe by using them in combination with active oscilloscope
probes. P H-feld probe made in flex circuit technology was
desiged to operate up to about b GHz. These probes have loop
dimensions as small as 3x3 mil and trace widths in the order of
.!b mils. The H-fi eld probe terminals are connected to the
differential amplifi er of the active oscilloscope probe which
fnctions as an integrator to achieve a fat fequency response.
The integator behavior compensates for the frst order
derivative response of the fex circuit probes. The E-feld
probe utilizes the high input impedance of the browser
attached to the active probe for achieving a fat fequency
response.
Kyrd-E-dot sensor, H-dot snsor itegator derivtv, fat
Jeuency respnse
INTRODUCTION
EM-field mapping has proved beneficial not only to
optimize and adjust RF circuits but also to predict
complicated EMIIEMC problems. Self interference within
systems, digital ICs or switched power supplies disturbing
RF receivers is clearly a problem of growing concer.
Various kinds of 8-dot/H-dot sensors are commercially
available and numerous articles have covered probes [1 ]-[8].
The 8-dot and D-dot sensors show a first order derivative
frequency response. To recover the EM field waveform
from data captured by these sensors analog or numerical
integration is required. This is dificult to achieve over
many decade bandwidth because of the limitations of the
dynamic range of the data captured by the oscilloscope. To
overcome this several non-differentiating sensors were
developed based on TEM hom, resistively loaded dipoles or
dipoles with curved arms [3] but they suffered fom large
97-1-4Z44-4Zb7-b/09/$Z.00CZ009 |LLL 1Z
physical dimensions. A non-differentiating free space sensor
was designed based on shielded loop antenna with a
reasonably flat frequency response reported in [4].
This paper introduces a different approach to obtain a flat
frequency response from B-dot and D-dot field probes by
attaching them to active oscilloscope probes as those are
available in most labs. Active probe amplifiers can be used
as both E and H-field probes to achieve a reasonably wide
band fat frequency response.
This paper also introduces first order derivative H-field
probes based on flex circuit technology which can operate
upto a few GHz and have a high spatial resolution. This
probe has a trace width as small as 1.75 mils and loop
dimensions as small as 3x3 mil. The self resonance
fequency of these probes is of the order of ten's of GHz.
Figure I:Basic Design of Flex Circuit Probe
The flex circuit probes are differential H-field probes.
Figure 1 shows the basic design of the loop portion of the
flex circuit probe. This probe has loop dimensions of
'5x5 mil'. The probe is electrically shielded on all sides and
has two plated slots at the tip of the loop. It has GND vias
located on all of its boundaries ensuring good electrical
shielding. A variety of via sizes were used with the smallest
being 2 mils in diameter. The remaining electric field
coupling from the trace directly into the probe is through the
2 mils gap between the two slots as shown in Figure 1. This
coupling is negligible given the width of the gap.
The flex circuit technology allows designing probes of
smaller dimensions than probes in PCB technology without
giving up on simple methods to connect to connectors. Thin
film technology allows even finer probes, at the
disadvantage of more complex transitions to coaxial
connectors.
An E-field probe designed by extending the application of
the active probe is also discussed later in this paper.
MOTIVATION
Flat frequency response is desirable for two main reasons.
One being to fully utilize the AID converter for the
following reason: Many time domain impulsive processes
have strong high frequency components, e.g., a fast rise and
slow decay. A probe that follows the derivative will show a
narrow pulse of high amplitude at its output. The A/D
converter settings (V/div) will need to be set to allow the
peak value to be captured. However, the de-convolution is
an integration process for B-dot and D-dot sensors, thus, at
lower frequencies small signals (small with respect to the
AID converter full scale) would be amplified by the de
convolution reducing the results accuracy. The other reason
is to reduce complexity in the calculations used for
obtaining the signal on a high speed digital circuit/PCB. In
case of fat frequency response the system function reduces
down to a constant instead of a 20 dB/decade rise function.
The signal in frequency domain on the PCB circuit or the
device under test can be obtained fom (1).
S(m)
Om)

(I)
F(m)
Where q is the fequency domain output fom the
system, S( pis the frequency domain signal on the DUT
1p) is the frequency response of the probe which
corresponds to the system fnction
FLAT FREQUENCY RESPONSE
Typically an active oscilloscope probe has a flat
frequency response when used with its browser. But it was
found that the amplifier part alone of the active probe used
here [9] has a fequency domain response as shown in
Figure 2. A low fequency gain of 43.5 dB until 31.8 MHz
13
and then a 20 dB/decade fall was observed. The frequency
response of the active probe is like an integrator which
compensates for the first order derivative response of flex
probe thereby giving a flat frequency response when
combined with it.
bZJ response of JJb9P
b0

JJb9PGain
40

0
`
m Z0

`
O
J0

-J0
-Z0

0.0J 0.0b0.J 0.b b
Frequency (GHz)
Figure 2: Gain of the 1169A active probe
MEASUREMENT RESULTS AND DISCUSSION
Figure 3 shows the frequency domain response of flex
circuit probes coupled to a PCB trace. It was expected to
observe a first order 20 dB/decade rise. Measurement results
agree very well with the expectations from 0. 1 GHz to
3 GHz. Deviations at higher frequencies are due to
discontinuities/losses in the fex probe which were not taken
into account in the calibration. Noise at lower fequencies is
minimized by decreasing the IF bandwidth.
-40
-b0
-b0
m

-10
O

-0
-90
-J00
Frequency response: 1xb mil Probe over Trace
Lcw
Frequency
NcIse
l

M
..

0.J

l
'
M
20dB/decade
l
'
Regicn
| .
High
Frequency
Devaticns

l
.

Measurement
PSPICE Simulation
]
J
Frequency (GHz)
J0
Figure 3: Frequency domain coupling response of 7x5 mil fex probe_
Measured and PSPICE results
The setup for the trace coupling fequency domain
response measurement of the flex probes attached to active
probe's amplifier is shown in Figure 4. The PCB trace is
co=ected to port 1 of the Network Analyzer. The two
terminals of the active probe are atached to the differential
ends of the fex circuit probe by SMA co=ection. It is
powered using the oscilloscope and connected to port 2 of
the NWA.
NWA(8.SGH)
1ex 1robe
Trace
Oscilloscope
(usedaspower
supplytorthe
amplier)
matched
termination
Figure 4: Setup for the measurement of the frequency response for the
probe coupling to a trace
Figure 5 shows the frequency domain trace coupling
response of the 7x5 mil flex circuit H -field probe attached to
the active probe amplifier. Figure 2 and Figure 3 show the
frequency domain response of the 1169A active probe
amplifier and the 7x5 mil flex circuit probe over the trace
respectively. From Figure 5 it is observed that above
60 MHz the frequency response of the 7x5 mil probe
attached to active probe amplifier tends to get flat. The S21
of the 7x5 mil flex probe alone over the trace i s roughly -
83 dB at 0. 1 GHz and -63 dB at 1 GHz. The active probe
S21 is around 33 dB and 14 dB at 0. 1 GHz and 1 GHz
respectively. Their combination should result in a linear flat
response of -50 dB from 31.8 MHz onwards because the
active probe response starts to fall afer that fequency. The
measurement results were found to be higher than expected
as shown in Figure 5. The reason for this could be that the
probe itself was evaluated single ended, but if attached to
the active probe's amplifier the difference is amplified, each
channel by 43 dB at lower frequencies, leading to a 3 dB
increased signal. In this measurement the flex probe was
held very close to the PCB trace but not in contact with it.
The absolute value of S21 is a function of distance between
the fex probe and the PCB trace beneath it. The same
measurement was done for the 3x3 mil and 8x8 mil probes,
the smallest and largest loop sizes of flex circuit probes
available.
14
Frequency response: Probe over Trace
.s
.smil probe * ::ssamplifier
.ss
Flt Frequency Region

..

..s

Denvattve
- RegIn -
|
|

.s

High
'

Frequency
.ss
Deviations.
.s

.ss
: s : s :
Frequency (GHz)
s
Figure S: S21 over trace of the 7xS mil tex probe attached to active
probe's amplifier

Figure 3 and Figure 6 show the fequency response of the

7x5 mil and 8x8 mil flex probes coupled to the PCB trace.
The red curve is the PSPICE simulation result and it can be
seen that the measured and simulated fequency domain
responses of the flex circuit probe over the PCB trace agree
pretty well in both cases. The high frequency deviations
above 3 GHz in Figure 3 can be explained by parasitics. The
mounting of the mini-SMP connector and the SMA
co=ector attachment to the cables are not perfect. A TOR
was used to determine these parasitic elements for the
PSPICE simulation.
s
Frequency response: s.smil Probe over Trace
.
s
m
s
+
O
0
Low
Frequency
Noise

' f

'

s
s
.:

N
20 dB/decade


Region

High
Frequency
f Deviations

Measurement
PPICE
:
Frequency (GHz)
Figure 6: S2l of the 8x8 mil t1ex probe over the PCB trace; Measured and
PSPICE results
Frequency Response: Probe over Trace
-30
s.smil +
-35+
-55+
-60+
0.05 0.1 0.5
Frequency (GHz)
5
Figure 7: S21 over trace of the 8x8 mil flex probe attached to active
probe's amplifier
To ensure correct impedance measurements the power of
the input signal needs to be limited. As shown in Figure 8, if
the driving signal is small enough (i.e. the power is smaller
than -40 dBm), the input impedance of each terminal of the
1169A active probe is 50 0; otherwise, the amplifier is
overloaded causing a mismatch of impedance.
Z33 ottheaotiveptobe33b8 (potiveinputohannet|
10
60
0 _
10

10

10

10

10

requenoy (oHz)
Figure 8: Input impedance of l l69A active probe (looking into the positive
terminal of 1169 A)
SENSITIVITY OF ELECTRIC FIELD PROBE MADE
FROM THE ACTIVE PROBE
Figue 9 shows the frequency domain measurement result
of the E-field probe built using the active probe. The tips of
the browser of the active probe are attached to a bow tie
antenna. The two triangular shaped PCB's are soldered to
the tips of the browser of the active probe as shown in
1
Figure 10. The integration of achieved by the high
impedance loading of the active probe's browser. This probe
is then placed in the open strip line cell which is functional
upto 2 GHz. TEM waves propagate in this structure, due to
its open nature, it does not exhibit strong higher order
modes. One end of this cell is connected to the NW A with
20 dB attenuation to avoid ESD damage due to back
coupling to NW A and the E-field probe is connected to the
other port of the NW A. The ripples beyond 1 GHz are most
likely not a result of the E-field probe, but a consequence of
refections within the TEM Cell. The fields inside the TEM
Cell are not perfectly homogenous and there are strong
reflections at the launch (50-1000hm) but only very weak
reflections at the 100 Ohm termination of the open strip line
cell.
Sensitivity of electric field probe-extension of active probe
-30
-35
-40
-45
-50

-55
U
-60

'

'
-

6cm
-65

-70

-75
0.0001 0.01 0.050.1
Frequency (GHz)
8.5cm

10 cm
.
0.5 1
Figure 9: Open strip line cell sensitivity measurement of the electric field
probe based on the active probe at different heights in the strip line
-L-:1
__,_'
Z, / \
\
_
1'
(2)
(
3)
')
'
)
Figure 10: E-field probe bow-tie antenna design made using the active
probe, mounted on Plexiglass
The open strip line structure used has a characteristic
impedance of 100 Q and is terminated on one side in 100 Q.
The setup for the fequency response of E-field probe inside
the open strip line cell is shown in Figure 11. The refection
coefficient at the launch point is 1/3 because of the
characteristic impedance of TEM Cell being 100 Q. The
forward voltage is the voltage inside the strip line cell. The
power input from the NW A is 0 dBm which is attenuated by
20 dB before appearing at the terminal of cell. The voltage
that appears at the terminals of the open strip line cell can be
calculated using (4) and (5). Thus, at the interface between
the cell line and the attenuator, looking into the attenuator, a
voltage source with an open voltage of 22.4x2=44.8 mV (-
20 dBm=22.4 mV
rms
) and a 50 Q resistor is observed.
Z0llcnuBl0t
hlg nc
`

...

8.b1Mz
Figure 11: Setup for frequency response in an open strip line of E-field
probe built based on bow tie antenna design
Thus the voltage in the cell is 30 mY. The electric field
inside the cell at a particular height can be estimated using
(2). The electric field at the position of the probe where the
height of cell is 10 cm is 300 mV/m. Now the output
voltage of the probe at the port of NWA is found using (3).
The measured S21 was -47 dBm if the probe is placed at a
position at which the strip line is 10 cm high. This is
equivalent to 1 mVr as can be seen fom Figure 9. The
output voltage of the probe is calculated to be 0.0707 V.
The sensitivity of the electric field probe is defined by (6).
^
l l
_
''Vl!,:,j
DS111_
_
0./Ju!|/mbr
(6)
1b
The sensitivity is calculated to be 3.3 mV/(V/m).
SENSITIVITY OF FLEX CIRCUIT H-FIELD PROBE
ATTACHED TO ACTIVE PROBE AMPLIFIER
5onsitivityof||oxcircuitM-fio|dprobosanachodtoactvoprobo
-|c
-sc,
-sc,

-+ccM

++c
(.. . . .. . . .
c.c+ c.cs c.+ c.s s
|roquoncy(CHz)
Figure 12: TEM Cell sensitivity measurement of flex circuit H-field probes
attached to the active probe amplifier in the Crawford TEM Cell
For this measurement a Crawford cell was used. It does
not show higher order modes below 1 GHz. Figure 12
shows the frequency response of the fex circuit H-field
probes attached to the active probe amplifier measured
using the Crawford TEM Cell. A narrow slot is milled into a
10 cm by 10 cm PCB board. This PCB is placed onto the
TEM cell. Port 1 of the Network analyzer is co=ected to
one of the terminals of the TEM cell. The fex circuit H
field probe attached to the active probe amplifier is held in
the slot on the PCB. The active probe is connected to the
port 2 of the network analyzer. As expected the magnitude
of S21 is higher for the 8x8 mil fex circuit H -field probe as
compared to the 7x5 mil probe based on the loop areas of
the two probes. The sensitivity of the probe is defined by

l 1
iIiIu1]IuDc
S1I1j _
1
D./JuAsm.:
(7)
The effective loop area of the 7x5 mil probe is calculated
to be 54.5 mi
e
which is about 1.5 times greater than the
actual loop size. The effective loop area of the 8x8 mil
probe is 1.65 times greater than its actual loop area. These
measurements were done using the Crawford TEM Cell in
the same way described above but for the flex circuit H
field probes alone.
The TEM cell used for this purose has a characteristic
impedance of 50 Q and it is terminated in 50 Q. The input
power at port 1 of NW A is 0 dBm. Hence the emf voltage is
446 mV. The voltage that appears at the terminal of the
TEM Cell is 223 mV. The septum height of the Crawford
cell at the position where the flex circuit H-field probe is
held is roughly 4.S cm. The E-field is calculated to be
4.88 Vim using (8). The H-field is 0.013 A/m using (9). The
magnitude of S2l in the case of the 7xS mil probe is roughly
-79 dB as shown in Figure 12. The power at port 2 is
therefore -79 dBm which is equivalent to 2S I1V. Using (7)
the sensitivity of the 7xS mil flex circuit H -field probe is
l .9 mV/(Alm).
7
(8)
'
(9)
CONCLUSION
Active oscilloscope probes can be found in many labs.
They can be extended to be used as field probes achieving a
flat frequency response for the E-field, independent of the
manufacturer of the active probe and a flat fequency
response of for the H-field probe above approximately
SO MHz if a specific probe is used. The article also shows
the implementation and measued results of small H-field
probes, manufactured in fex circuit technology having loop
dimensions as small as 3x3 mil.
17
ACKNOWLEDGMENT
We want to thank Johannes Edenhofer who suggested the
use of the active probe as an E-field probe to us.
REFERENCES
[I] William O. Cobur, Calvin Le, David J. De Troye, Gordon E. Blair
and Warren Williams, "Electromagnetic Field Measurements Near a
Railgun," IEEE transactions on magnetics, Vol 31. No. 1. January
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[2] Farr. E., and Bowen, ! "A time-domain antenna range - sensors,
calibration and signal processing". Book of Abstracts, EURO
Electromagnetics' 2000, Edinburg, 30 May - 2 June 2000, p.65
[3] Tyo, S., and Buchenauer, 1, "Compact sensors for time-domain
measurements". Book of Abstracts, Euro Electromagnetics '2000,
Edinburg, 30 May-2 June 2000, pp.66
4j A Yarovoy, R. de Jongh and L. Ligthart, "Ultra-wideband sensor for
electromagnetic field measurements in time domain," IEEE Electronic
Letters, Vol.36, No.20
j John P.Casey, "Analysis and Optimization of an Electrically Small
Receiving Antenna," IEEE Transactions on EMC, Vol. 33, No. 3, 8/91
[6] Maria A Stuchly, "Active Magnetic Field Sensor for Measurement of
Transients," IEEE Transactions on EMC, Vol.33, No 4, 11191
Tj Masugi, M., Murakawa, K. Kuwabara, N., Ameniya, F., 'Measurement
and Analysis of Electromagnetic Pulses caused by Electrostatic
Discharge', IEEE In!. Symp. on EMC, 1992, p.361-365
[8] Carl E. Baum, Edward ! Breen, Joseph C. Giles, John O'Neill, and
Gary D. Sower, "Sensors for Electromagnetic Pulse Measurements
Both Inside and Away trom Nuclear Source Regions," EMC 1LLL
ltanac0n., Vol. EMC-20, pp. 22-35, Feb. 1978.
[9] "5968-714IEN data sheet,"1169A 12 GHz IntiniiMax II Series Probe
Amplifier, Agilent, USA