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IEEE AEROSPACE AND ELECTRONIC SYSTEMS SOCIETY

2011 Aerospace & Defence Symposium

Focus where it counts
Agilent Technologies is pleased to invite you to attend complimentary, full-day Aerospace & Defence symposium consisting of technical presentations and hands-on demonstrations. This symposium will show how to combine design and verification tools with Agilent's cutting-edge test solutions to develop your products right the first time. Focus areas covered; Radar/EW, Satellite, SDR/MilCom and General RF and Microwave.

WHEN & WHERE

June 27, 2011 June 29, 2011 July 1, 2011 Hotel Vivanta by Taj, MG Road, Bangalore Hotel Taj Deccan, Banjara Hills, Hyderabad Hotel Le Meridien, Janpath, New Delhi

Symposium Schedule (tentative)

TIME 08:30 09:30 09:30 09:45 09:45 10:15 10:15 -- 10:45 10:45 11:00 11:00 11:45 11:45 12:30 12:30 13:15 13:15 14:00 14:00 14:45 14:45 15:00 15:00 15:30 15:30 16:00 16:00 - 16:30 16:30 17:00 PAPERS Sign-in/Product fair Welcome and Overview Keynote Presentation Addressing the Challenges of Wideband Radar and SatCom Measurements Break Optimizing Spurious Measurements for Speed and Accuracy System Performance Evaluation of Advanced Radar Systems through Simulation and Test Lunch/Product Fair Two Different Ways of Looking at Noise Figure Agilent Modular products provide the building blocks for creating wideband measurement solutions Break Optimizing Automated Power Meter Measurement Speed MIL-STD 461 and DO160 testing using the new Agilent Technologies EMI receiver Reducing Phase Noise at Microwave and RF Frequencies Wrap Up/Lucky Draw

Addressing the Challenges of Wideband Radar and SatCom Measurements

This presentation will show that external down conversion hardware can introduce impairments into the test signal and may make it difficult to determine if the measurement results are from the transmitter, downconverter, or a combination of both. Wide bandwidth oscilloscopes can help to address this by enabling Radar and SatCom transmitter outputs to be directly measured up to 32 GHz, without requiring external down conversion hardware.

PAPER

PAPER

Optimizing Spurious Measurements for Speed and Accuracy

This paper summarizes the main factors for efficient spur search, plus how to take maximum advantage of the capabilities of modern signal analyzers. It also discusses optimizing the measurement tradeoffs between speed, dynamic range, and accuracy.

PAPER

System Performance Evaluation of Advanced Radar Systems through Simulation and Test
IModern radar systems require precise and robust electronic design in order to perform confidently within its intended mission. These systems have to perform in environments that are unpredictable, with interference, jamming, and other real world performance limitations. Understanding how actual HW will perform in such environments is difficult if not impossible during the design and validation phases of new systems development, without costly facilities and complex measurement systems. This paper will explore and demonstrate solutions from Agilent Technologies that are built around a simulation core for the modeling of complex RADAR clutter environments, generation of actual real world waveforms that include potential design and environmental impairments, and analysis of systems performance with actual statistical metrics for sensitivity, selectivity, dynamic range, false alarm rate, detection rate, and estimation of range, velocity and angles. An example in the presentation will be digital array radar (DAR) systems with Beamforming. The methodology for system performance evaluation also can be extended to Pulse Doppler, FMCW and wideband radar systems.

PAPER

Two Different Ways of Looking at Noise Figure

This paper looks at the differences between the two techniques of measuring Noise Figure, cold source and Yfactor, providing insight as to the best one to use for various applications.

Agilent Modular products provide the building blocks for creating wideband measurement solutions
In this paper we will discuss some of the modular hardware available today that can be used to create solutions which are uniquely able to provide cost effective wideband RF solutions for vector analysis and radar test.

PAPER

Optimizing Automated Power Meter Measurement Speed

Optimizing RF/MW power measurement speed on power meter and sensor is often a subject of concern especially in manufacturing environment. A more detailed understanding of some SCPI commands and settings of the Agilent Power Meter / Sensor will help. This paper features tips to optimize power measurement speed.

PAPER

MIL-STD 461 and DO160 testing using the new Agilent Technologies EMI receiver
Testing radiated and conducted emissions to the latest MIL-STD 461 and DO160 poses many challenges. Interpretation of the standards to setting up the receiver can be a formidable task. This paper will outline processes that can be used with the new MXE EMI receiver from Agilent Technologies to measure radiated and conducted emissions.

PAPER

Reducing Phase Noise at Microwave and RF Frequencies

This paper explores the sources of phase noise in commercial RF and microwave signal generators and how it affects the performance of radar and communication systems. It then looks at methods used to reduce phase noise in the signal generator and how these improvements translate into value for system and component development and verification.

PAPER

Registration
Seating is limited for this complimentary event. Early enrollment is advised. We look forward to your participation in our Complimentary Symposium! To enroll Call 1800 11 2929 (Toll free) or 0124 229 2009 Visit : www.agilent.com/find/inevents Email : tm_india@agilent.com

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