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Fig. 4. Faulted branch current and SE voltage for a circuit with double supply.
V. CONCLUSION
The new scenario changes the well-known protection con-
cepts. A simple methodology has been presented, and its funda-
mentals and difficulties are explained. The analysis is simpler
when fuses are used as protective devices than when using more
sophisticated equipment having variable TCC. The methodology
has been specifically explained when applied to circuits having
Fig. 8. Plots of Fig. 7 with source impedance modified. distributed generation, which produces a sharp impedance
change. The information needed to carry out the proper coordina-
tion studies under the new situation is readily available.
REFERENCES
[1] “Primen says distributed energy market has softened, but small, niche
market still exists,” in Transmission and Distribution World. Palo Alto,
CA: Elect. Power Res. Inst. (EPRI), 2003.
[2] R. C. Dugan and T. E. McDermott, “Distributed generation and power
quality,” in Proc. Power Quality Assoc. (PQA) North America, Memphis,
TN, 2000, pp. 343–357.
[3] IEEE Guide for Interfacing Dispersed Storage and Generation Facilities
with Electric Utility Systems, ANSI/IEEE Std. 1001, 1988.
[4] G. T. Heydt, “Electric power quality,” in Stars in a Circle, Scottsdale,
AZ, 1991.
[5] J. C. Gómez and M. M. Morcos, “Coordinating overcurrent protection
and voltage sag in distributed generation systems,” IEEE Power Eng.
Rev., vol. 22, no. 2, pp. 16–19, Feb. 2002.
[6] M. H. J. Bollen, “Understanding power quality problems,” in Voltage
Sags and Interruptions. Piscataway, NJ: IEEE Press, 2000.
[7] “Electrical Distribution System Protection,” Cooper Power Systems,
Waukesha, WI, Bulletin 90 020, 1990.
Fig. 9. Coordination of CBEMA and modern PD curves. [8] A. Girgis and S. Brahma, “Effect of distributed generation on protective
device coordination in distribution system,” in Proc. Large Eng. Syst.
Conf. Power Engineering, 2001, pp. 115–119.
[9] J. C. Gómez and M. M. Morcos, “Voltage sag and recovery time in repet-
When the conditions are changed; for instance, the new fuse itive events,” IEEE Trans. Power Del., vol. 17, no. 4, pp. 1037–1043,
characteristic has moved to the right and down, as shown in Oct. 2002.
Fig. 8, the point corresponding to one cycle would be withstood [10] IEEE Recommended Practice for Emergency and Standby Power, IEEE
Std. 446, 1995.
by the SE, but as some crossing points are shown, some voltage [11] IEEE Recommended Practice for Evaluating Electric Power System
sag events would cause the SE dropout. Compatibility with Electronic Process Equipment, IEEE Std. 1346,
Following the same analysis, when DG is used, the SE and 1998.
the faulted branch have two energy sources–the mains and the
DG. When the fault starts, the PD of both sources would detect J. Carlos Gómez (M’84–SM’01) received the Ph.D. degree in electrical engi-
the overcurrent and one of the devices would be open at first, neering from Sheffield Hallam University, Sheffield, U.K., in 1994.
producing a sharp change in the source impedance. The pro- Currently, he is a Professor of electrical engineering and Director of the
Electric Power System Protection Institute at Río Cuarto National University
posed methodology would allow the SE ridethrough analysis to (RCNU), Río Cuarto, Argentina. After working for four years at the National
be carried out, as the device opening produces a change in the University of Cuyo, Argentina, he joined RCNU, where he has been since
source impedance as described above. For instance, if a short 1980. His research interests are power quality and distribution protection.
circuit takes place, the voltage sag detected by the SE would
be 80%. If, after one cycle, the source impedance is changed, Medhat M. Morcos (M’78–SM’86) received the Ph.D. degree in electrical en-
the voltage would fall to 40%. As the fuse curve still is to the gineering from the University of Waterloo, Waterloo, ON, Canada, in 1984.
Currently, he is a Professor of electrical and computer engineering and the
left of the immunity curve, the protective device would clear the
Distinguished Teaching Scholar at Kansas State University (KSU), Manhattan.
fault, avoiding SE dropout. If the circuit modification produces His research includes artificial intelligence applications in power quality and
a slightly lower curve, the SE would not be able to withstand the power systems protection, power electronics, electrical machines, and high-
voltage sag due to the intersection of the two curves (Fig. 8). voltage engineering.
Dr. Morcos is a member of Eta Kappa Nu, Tau Beta Pi, Sigma Xi, and Phi
In case of using more sophisticated PD, data management is Kappa Phi. He is also a member of the American Society for Engineering Edu-
not so easy as with fuses due to the possible time/current char- cation.