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DL135/D

Rev. 7, Apr-2001

Power MOSFETs
Power MOSFETs

DL135/D
Rev. 7, Apr–2001

 SCILLC, 2001
Previous Edition  1996
“All Rights Reserved”
EZFET, MiniMOS & SMARTDISCRETES are trademarks of Semiconductor Components Industries, LLC (SCILLC).
ChipFET is a trademark of Vishay Siliconix.
FETKY is a trademark of International Rectifier Corporation.
Micro8 is a trademark of International Rectifier.

ON Semiconductor and are trademarks of Semiconductor Components Industries, LLC (SCILLC). SCILLC reserves the right to make changes
without further notice to any products herein. SCILLC makes no warranty, representation or guarantee regarding the suitability of its products for any particular
purpose, nor does SCILLC assume any liability arising out of the application or use of any product or circuit, and specifically disclaims any and all liability,
including without limitation special, consequential or incidental damages. “Typical” parameters which may be provided in SCILLC data sheets and/or
specifications can and do vary in different applications and actual performance may vary over time. All operating parameters, including “Typicals” must be
validated for each customer application by customer’s technical experts. SCILLC does not convey any license under its patent rights nor the rights of others.
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Table of Contents

Power MOSFET Numeric Data Sheet


Listing and Selector Guide Chapter 1: Power MOSFETs
Page Page
Numeric Data Sheet Listing . . . . . . . . . . . . . . . . . . . . . . . . . 5 Data Sheets . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19
Selector Guide . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9
ChipFET . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9
SO–8 MiniMOS . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9 Chapter 2: Abstracts
SO–8 FETKY . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10 Application Note Abstracts . . . . . . . . . . . . . . . . . . . . . . . 1399
EZFET SO–8 Power MOSFETs . . . . . . . . . . . . . . . . 10
Micro8 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11
SOT–223 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11 Chapter 3: Case Outlines and Package
TSOP–6 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11
Dimensions
TSSOP–8 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12
SOT–23 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12 Case Outlines and Package Dimensions . . . . . . . . . . 1405
SC–70/SOT–323 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12
SC–88/SOT–363 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12
DPAK . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13 Chapter 4: Index
D2PAK . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14 Alphanumeric Index . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1415
TO–220AB . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15
TO–247 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16
TO–264 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16
SMARTDISCRETES . . . . . . . . . . . . . . . . . . . . . . . . . . 16
TO–92 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17
IGBTs – Insulated Gate Bipolar Transistors . . . . . . . . 17

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Power MOSFET Numeric Data Sheet Listing

Chapter 1: Power MOSFET Data Sheets


Device Function Page
NGD15N41CL . . . . . . . . . . . . . . . Ignition IGBT 15 Amps, 410 Volts N–Channel DPAK . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21
NIB6404–5L . . . . . . . . . . . . . . . . . SMARTDISCRETESt 52 Amps, 40 Volts
Self Protected with Temperature Sense N–Channel D2PAK . . . . . . . . . . . . . . . . . . . . . . . . 23
NIMD6302R2 . . . . . . . . . . . . . . . . SMARTDISCRETESt 5 Amps, 30 Volts
Self Protected with Current Sense N–Channel SO–8, Dual . . . . . . . . . . . . . . . . . . . . . . . . 27
NTD20N03L27 . . . . . . . . . . . . . . . Power MOSFET 20 Amps, 30 Volts N–Channel DPAK . . . . . . . . . . . . . . . . . . . . . . . . . . . . 29
NTD20N06 . . . . . . . . . . . . . . . . . . Power MOSFET 20 Amps, 60 Volts N–Channel DPAK . . . . . . . . . . . . . . . . . . . . . . . . . . . . 33
NTD3055–094 . . . . . . . . . . . . . . . Power MOSFET 12 Amps, 60 Volts N–Channel DPAK . . . . . . . . . . . . . . . . . . . . . . . . . . . . 35
NTD3055L104 . . . . . . . . . . . . . . . Power MOSFET 12 Amps, 60 Volts, Logic Level N–Channel DPAK . . . . . . . . . . . . . . . . . 37
NTD32N06 . . . . . . . . . . . . . . . . . . Power MOSFET 32 Amps, 60 Volts N–Channel DPAK . . . . . . . . . . . . . . . . . . . . . . . . . . . . 39
NTD32N06L . . . . . . . . . . . . . . . . . Power MOSFET 32 Amps, 60 Volts, Logic Level N–Channel DPAK . . . . . . . . . . . . . . . . . 44
NTD4302 . . . . . . . . . . . . . . . . . . . . Power MOSFET 20 Amps, 30 Volts N–Channel DPAK . . . . . . . . . . . . . . . . . . . . . . . . . . . . 49
NTGS3433T1 . . . . . . . . . . . . . . . . MOSFET –3.3 Amps, –12 Volts P–Channel TSOP–6 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 57
NTGS3441T1 . . . . . . . . . . . . . . . . Power MOSFET 1 Amp, 20 Volts P–Channel TSOP–6 . . . . . . . . . . . . . . . . . . . . . . . . . . . . 61
NTGS3443T1 . . . . . . . . . . . . . . . . Power MOSFET 2 Amps, 20 Volts P–Channel TSOP–6 . . . . . . . . . . . . . . . . . . . . . . . . . . . 67
NTGS3446 . . . . . . . . . . . . . . . . . . Power MOSFET 5 Amps, 20 Volts N–Channel TSOP–6 . . . . . . . . . . . . . . . . . . . . . . . . . . . 73
NTGS3455T1 . . . . . . . . . . . . . . . . MOSFET –3.5 Amps, –30 Volts P–Channel TSOP–6 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 76
NTHD5902T1 . . . . . . . . . . . . . . . . Dual N–Channel 30 V (D–S) MOSFET . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 80
NTHD5903T1 . . . . . . . . . . . . . . . . Dual P–Channel 2.5 V (G–S) MOSFET . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 85
NTHD5904T1 . . . . . . . . . . . . . . . . Dual N–Channel 2.5 V (G–S) MOSFET . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 90
NTHD5905T1 . . . . . . . . . . . . . . . . Dual P–Channel 1.8 V (G–S) MOSFET . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 95
NTHS5402T1 . . . . . . . . . . . . . . . . N–Channel 30 V (D–S) MOSFET . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 95
NTHS5404T1 . . . . . . . . . . . . . . . . N–Channel 2.5 V (G–S) MOSFET . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 106
NTHS5441T1 . . . . . . . . . . . . . . . . P–Channel 2.5 V (G–S) MOSFET . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 109
NTHS5443T1 . . . . . . . . . . . . . . . . P–Channel 2.5 V (G–S) MOSFET . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 112
NTHS5445T1 . . . . . . . . . . . . . . . . P–Channel 1.8 V (G–S) MOSFET . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 114
NTMD3P03R2 . . . . . . . . . . . . . . . Power MOSFET –3.05 Amps, –30 Volts Dual P–Channel SO–8 . . . . . . . . . . . . . . . . . . . 120
NTMD6N02R2 . . . . . . . . . . . . . . . Power MOSFET 6.0 Amps, 20 Volts N–Channel Enhancement Mode
Dual SO–8 Package . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 127
NTMD6P02R2 . . . . . . . . . . . . . . . Power MOSFET 6 Amps, 20 Volts P–Channel SO–8, Dual . . . . . . . . . . . . . . . . . . . . . . . 120
NTMD7C02 . . . . . . . . . . . . . . . . . . Power MOSFET 9.5 Amps, 20 Volts (N–Ch)
4 Amps, 20 Volts (P–Ch) Complementary SO–8 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 141
NTMS10P02R2 . . . . . . . . . . . . . . Power MOSFET –10 Amps, –20 Volts P–Channel Enhancement–Mode
Single SO–8 Package . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 143
NTMS3P03R2 . . . . . . . . . . . . . . . Power MOSFET –3.05 Amps, –30 Volts P–Channel SO–8 . . . . . . . . . . . . . . . . . . . . . . . . 150
NTMS4N01R2 . . . . . . . . . . . . . . . Power MOSFET 4.2 Amps, 20 Volts N–Channel Enhancement–Mode
Single SO–8 Package . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 157
NTMS4P01R2 . . . . . . . . . . . . . . . Power MOSFET –4.5 Amps, –12 Volts P–Channel Enhancement–Mode
Single SO–8 Package . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 164
NTMS5P02R2 . . . . . . . . . . . . . . . Power MOSFET –5.4 Amps, –20 Volts P–Channel Enhancement–Mode
Single SO–8 Package . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 171
NTMSD2P102LR2 . . . . . . . . . . . . FETKYt Power MOSFET and Schottky Diode Dual SO–8 Package . . . . . . . . . . . . . . . 178
NTMSD3P102R2 . . . . . . . . . . . . . FETKYt P–Channel Enhancement–Mode
Power MOSFET and Schottky Diode Dual SO–8 Package . . . . . . . . . . . . . . . . . . . . . . . . 188
NTMSD3P303R2 . . . . . . . . . . . . . FETKYt P–Channel Enhancement–Mode
Power MOSFET and Schottky Diode Dual SO–8 Package . . . . . . . . . . . . . . . . . . . . . . . . 198
NTP27N06 . . . . . . . . . . . . . . . . . . Power MOSFET 27 Amps, 60 Volts N–Channel TO–220 . . . . . . . . . . . . . . . . . . . . . . . . . 208
NTP45N06 . . . . . . . . . . . . . . . . . . Power MOSFET 45 Amps, 60 Volts N–Channel TO–220 . . . . . . . . . . . . . . . . . . . . . . . . . 210
NTP45N06L . . . . . . . . . . . . . . . . . Power MOSFET 45 Amps, 60 Volts, Logic Level N–Channel TO–220 . . . . . . . . . . . . . . 215
NTP75N03–06 . . . . . . . . . . . . . . . Power MOSFET 75 Amps, 30 Volts N–Channel TO–220 and D2PAK . . . . . . . . . . . . . . 220
NTP75N03L09 . . . . . . . . . . . . . . . Power MOSFET 75 Amps, 30 Volts N–Channel TO–220 and D2PAK . . . . . . . . . . . . . . 225

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Power MOSFET Numeric Data Sheet Listing (continued)

Device Function Page


NTQD6866 . . . . . . . . . . . . . . . . . . Power MOSFET 5.8 Amps, 20 Volts N–Channel TSSOP–8 . . . . . . . . . . . . . . . . . . . . . . . 230
NTTD1P02R2 . . . . . . . . . . . . . . . . Power MOSFET –1.45 Amps, –20 Volts P–Channel Enhancement Mode
Dual Micro8 Package . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 234
NTTD2P02R2 . . . . . . . . . . . . . . . . Power MOSFET –2.4 Amps, –20 Volts Dual P–Channel Micro8t . . . . . . . . . . . . . . . . . 241
NTTS2P02R2 . . . . . . . . . . . . . . . . Power MOSFET –2.4 Amps, –20 Volts Single P–Channel Micro8t . . . . . . . . . . . . . . . . 248
NTTS2P03R2 . . . . . . . . . . . . . . . . Power MOSFET –2.48 Amps, –30 Volts P–Channel Enhancement Mode
Single Micro8 Package . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 255
NTUD01N02 . . . . . . . . . . . . . . . . . Power MOSFET 100 mAmps, 20 Volts Dual N–Channel SC–88 . . . . . . . . . . . . . . . . . . . 262
2N7000 . . . . . . . . . . . . . . . . . . . . . Small Signal MOSFET 200 mAmps, 60 Volts N–Channel TO–92 . . . . . . . . . . . . . . . . . . 264
2N7002LT1 . . . . . . . . . . . . . . . . . . Power MOSFET 115 mAmps, 60 Volts N–Channel SOT–23 . . . . . . . . . . . . . . . . . . . . . . 267
BS107 . . . . . . . . . . . . . . . . . . . . . . Small Signal MOSFET 250 mAmps, 200 Volts N–Channel TO–92 . . . . . . . . . . . . . . . . . 271
BS108 . . . . . . . . . . . . . . . . . . . . . . Small Signal MOSFET 250 mAmps, 200 Volts, Logic Level N–Channel TO–92 . . . . . . 275
BS170 . . . . . . . . . . . . . . . . . . . . . . Small Signal MOSFET 500 mAmps, 60 Volts N–Channel TO–92 . . . . . . . . . . . . . . . . . . 277
BSS123LT1 . . . . . . . . . . . . . . . . . Power MOSFET 170 mAmps, 100 Volts N–Channel SOT–23 . . . . . . . . . . . . . . . . . . . . . 280
BSS138LT1 . . . . . . . . . . . . . . . . . Power MOSFET 200 mAmps, 50 Volts N–Channel SOT–23 . . . . . . . . . . . . . . . . . . . . . . 284
BSS84LT1 . . . . . . . . . . . . . . . . . . . Power MOSFET 130 mAmps, 50 Volts P–Channel SOT–23 . . . . . . . . . . . . . . . . . . . . . . 289
MGP15N35CL . . . . . . . . . . . . . . . Ignition IGBT 15 Amps, 350 Volts N–Channel TO–220 and D2PAK . . . . . . . . . . . . . . . . 293
MGP15N40CL . . . . . . . . . . . . . . . Ignition IGBT 15 Amps, 410 Volts N–Channel TO–220 and D2PAK . . . . . . . . . . . . . . . . 301
MGP19N35CL . . . . . . . . . . . . . . . Ignition IGBT 19 Amps, 350 Volts N–Channel TO–220 and D2PAK . . . . . . . . . . . . . . . . 309
MGSF1N02ELT1 . . . . . . . . . . . . . Power MOSFET 750 mAmps, 20 Volts N–Channel SOT–23 . . . . . . . . . . . . . . . . . . . . . . 316
MGSF1N02LT1 . . . . . . . . . . . . . . Power MOSFET 750 mAmps, 20 Volts N–Channel SOT–23 . . . . . . . . . . . . . . . . . . . . . . 320
MGSF1N03LT1 . . . . . . . . . . . . . . Power MOSFET 750 mAmps, 30 Volts N–Channel SOT–23 . . . . . . . . . . . . . . . . . . . . . . 324
MGSF1P02ELT1 . . . . . . . . . . . . . Power MOSFET 750 mAmps, 20 Volts P–Channel SOT–23 . . . . . . . . . . . . . . . . . . . . . . 328
MGSF1P02LT1 . . . . . . . . . . . . . . Power MOSFET 750 mAmps, 20 Volts P–Channel SOT–23 . . . . . . . . . . . . . . . . . . . . . . 332
MGSF2P02HD . . . . . . . . . . . . . . . Power MOSFET 2 Amps, 20 Volts P–Channel TSOP–6 . . . . . . . . . . . . . . . . . . . . . . . . . . 336
MGSF3442VT1 . . . . . . . . . . . . . . Power MOSFET 4 Amps, 20 Volts N–Channel TSOP–6 . . . . . . . . . . . . . . . . . . . . . . . . . . 344
MGSF3454VT1 . . . . . . . . . . . . . . Power MOSFET 4 Amps, 30 Volts N–Channel TSOP–6 . . . . . . . . . . . . . . . . . . . . . . . . . . 349
MLD1N06CL . . . . . . . . . . . . . . . . . SMARTDISCRETES MOSFET 1 Amp, 62 Volts, Logic Level N–Channel DPAK . . . . . 354
MLP1N06CL . . . . . . . . . . . . . . . . . SMARTDISCRETES MOSFET 1 Amp, 62 Volts, Logic Level N–Channel TO–220 . . . 360
MLP2N06CL . . . . . . . . . . . . . . . . . SMARTDISCRETES MOSFET 2 Amps, 62 Volts, Logic Level N–Channel TO–220 . . 366
MMBF0201NLT1 . . . . . . . . . . . . . Power MOSFET 300 mAmps, 20 Volts N–Channel SOT–23 . . . . . . . . . . . . . . . . . . . . . . 372
MMBF0202PLT1 . . . . . . . . . . . . . Power MOSFET 300 mAmps, 20 Volts P–Channel SOT–23 . . . . . . . . . . . . . . . . . . . . . . 377
MMBF1374T1 . . . . . . . . . . . . . . . Small Signal MOSFET 50 mAmps, 30 Volts N–Channel SC–70/SOT–323 . . . . . . . . . . 382
MMBF170LT1 . . . . . . . . . . . . . . . . Power MOSFET 500 mAmps, 60 Volts N–Channel SOT–23 . . . . . . . . . . . . . . . . . . . . . . 384
MMBF2201NT1 . . . . . . . . . . . . . . Power MOSFET 300 mAmps, 20 Volts N–Channel SC–70/SOT–323 . . . . . . . . . . . . . . 388
MMBF2202PT1 . . . . . . . . . . . . . . Power MOSFET 300 mAmps, 20 Volts P–Channel SC–70/SOT–323 . . . . . . . . . . . . . . . 392
MMDF1300 . . . . . . . . . . . . . . . . . . Power MOSFET 2 Amps, 25 Volts Complementary SO–8, Dual . . . . . . . . . . . . . . . . . . . 396
MMDF1N05E . . . . . . . . . . . . . . . . Power MOSFET 1 Amp, 50 Volts N–Channel SO–8, Dual . . . . . . . . . . . . . . . . . . . . . . . . 399
MMDF2C01HD . . . . . . . . . . . . . . Power MOSFET 2 Amps, 12 Volts Complementary SO–8, Dual . . . . . . . . . . . . . . . . . . . 404
MMDF2C02E . . . . . . . . . . . . . . . . Power MOSFET 2.5 Amps, 25 Volts Complementary, SO–8, Dual . . . . . . . . . . . . . . . . . 416
MMDF2C02HD . . . . . . . . . . . . . . Power MOSFET 2 Amps, 20 Volts Complementary SO–8, Dual . . . . . . . . . . . . . . . . . . . 427
MMDF2C03HD . . . . . . . . . . . . . . Power MOSFET 2 Amps, 30 Volts Complementary SO–8, Dual . . . . . . . . . . . . . . . . . . . 439
MMDF2N02E . . . . . . . . . . . . . . . . Power MOSFET 2 Amps, 25 Volts N–Channel SO–8, Dual . . . . . . . . . . . . . . . . . . . . . . . 451
MMDF2N05ZR2 . . . . . . . . . . . . . . Power MOSFET 2 Amps, 50 Volts N–Channel SO–8, Dual . . . . . . . . . . . . . . . . . . . . . . . 459
MMDF2P01HD . . . . . . . . . . . . . . . Power MOSFET 2 Amps, 12 Volts P–Channel SO–8, Dual . . . . . . . . . . . . . . . . . . . . . . . 468
MMDF2P02E . . . . . . . . . . . . . . . . Power MOSFET 2 Amps, 25 Volts P–Channel SO–8, Dual . . . . . . . . . . . . . . . . . . . . . . . 477
MMDF2P02HD . . . . . . . . . . . . . . . Power MOSFET 2 Amps, 20 Volts P–Channel SO–8, Dual . . . . . . . . . . . . . . . . . . . . . . . 485
MMDF2P03HD . . . . . . . . . . . . . . . Power MOSFET 2 Amps, 30 Volts P–Channel SO–8, Dual . . . . . . . . . . . . . . . . . . . . . . . 494
MMDF3N02HD . . . . . . . . . . . . . . Power MOSFET 3 Amps, 20 Volts N–Channel SO–8, Dual . . . . . . . . . . . . . . . . . . . . . . . 503
MMDF3N03HD . . . . . . . . . . . . . . Power MOSFET 3 Amps, 30 Volts N–Channel SO–8, Dual . . . . . . . . . . . . . . . . . . . . . . . 512
MMDF3N04HD . . . . . . . . . . . . . . Power MOSFET 3 Amps, 40 Volts N–Channel SO–8, Dual . . . . . . . . . . . . . . . . . . . . . . . 521
MMDF3N06HD . . . . . . . . . . . . . . Power MOSFET 3 Amps, 60 Volts N–Channel SO–8, Dual . . . . . . . . . . . . . . . . . . . . . . . 531
MMDF3N06VL . . . . . . . . . . . . . . . Power MOSFET 3 Amps, 60 Volts N–Channel SO–8, Dual . . . . . . . . . . . . . . . . . . . . . . . 540
MMDF4N01HD . . . . . . . . . . . . . . Power MOSFET 4 Amps, 20 Volts N–Channel SO–8, Dual . . . . . . . . . . . . . . . . . . . . . . . 542

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6
Power MOSFET Numeric Data Sheet Listing (continued)

Device Function Page


MMDF5N02Z . . . . . . . . . . . . . . . . Power MOSFET 5 Amps, 20 Volts N–Channel SO–8, Dual . . . . . . . . . . . . . . . . . . . . . . . 551
MMDF6N03HD . . . . . . . . . . . . . . Power MOSFET 6 Amps, 30 Volts N–Channel SO–8, Dual . . . . . . . . . . . . . . . . . . . . . . . 560
MMDF7N02Z . . . . . . . . . . . . . . . . Power MOSFET 7 Amps, 20 Volts N–Channel SO–8, Dual . . . . . . . . . . . . . . . . . . . . . . . 569
MMDFS2P102 . . . . . . . . . . . . . . . Power MOSFET 2 Amps, 20 Volts P–Channel SO–8, FETKYt . . . . . . . . . . . . . . . . . . . 579
MMDFS6N303 . . . . . . . . . . . . . . . Power MOSFET 6 Amps, 30 Volts N–Channel SO–8, FETKYt . . . . . . . . . . . . . . . . . . . 589
MMFT2406T1 . . . . . . . . . . . . . . . . Power MOSFET 700 mAmps, 240 Volts N–Channel SOT–223 . . . . . . . . . . . . . . . . . . . . 605
MMFT2955E . . . . . . . . . . . . . . . . . Power MOSFET 1 Amp, 60 Volts P–Channel SOT–223 . . . . . . . . . . . . . . . . . . . . . . . . . . 610
MMFT2N02EL . . . . . . . . . . . . . . . Power MOSFET 2 Amps, 20 Volts N–Channel SOT–223 . . . . . . . . . . . . . . . . . . . . . . . . . 619
MMFT3055V . . . . . . . . . . . . . . . . . Power MOSFET 1 Amp, 60 Volts N–Channel SOT–223 . . . . . . . . . . . . . . . . . . . . . . . . . . 628
MMFT3055VL . . . . . . . . . . . . . . . Power MOSFET 1 Amp, 60 Volts N–Channel SOT–223 . . . . . . . . . . . . . . . . . . . . . . . . . . 637
MMFT5P03HD . . . . . . . . . . . . . . . Power MOSFET 5 Amps, 30 Volts P–Channel SOT–223 . . . . . . . . . . . . . . . . . . . . . . . . . 646
MMFT960T1 . . . . . . . . . . . . . . . . . Power MOSFET 300 mAmps, 60 Volts N–Channel SOT–223 . . . . . . . . . . . . . . . . . . . . . 656
MMSF10N02Z . . . . . . . . . . . . . . . Power MOSFET 10 Amps, 20 Volts N–Channel SO–8 . . . . . . . . . . . . . . . . . . . . . . . . . . . 662
MMSF10N03Z . . . . . . . . . . . . . . . Power MOSFET 10 Amps, 30 Volts N–Channel SO–8 . . . . . . . . . . . . . . . . . . . . . . . . . . . 671
MMSF1308 . . . . . . . . . . . . . . . . . . Power MOSFET 7 Amps, 30 Volts N–Channel SO–8 . . . . . . . . . . . . . . . . . . . . . . . . . . . . 681
MMSF1310 . . . . . . . . . . . . . . . . . . Power MOSFET 10 Amps, 30 Volts N–Channel SO–8 . . . . . . . . . . . . . . . . . . . . . . . . . . . 689
MMSF2P02E . . . . . . . . . . . . . . . . Power MOSFET 2 Amps, 20 Volts P–Channel SO–8 . . . . . . . . . . . . . . . . . . . . . . . . . . . . 697
MMSF3300 . . . . . . . . . . . . . . . . . . Power MOSFET 11.5 Amps, 30 Volts N–Channel SO–8 . . . . . . . . . . . . . . . . . . . . . . . . . . 705
MMSF3P02HD . . . . . . . . . . . . . . . Power MOSFET 3 Amps, 20 Volts P–Channel SO–8 . . . . . . . . . . . . . . . . . . . . . . . . . . . . 715
MMSF5N02HD . . . . . . . . . . . . . . . Power MOSFET 5 Amps, 20 Volts N–Channel SO–8 . . . . . . . . . . . . . . . . . . . . . . . . . . . . 724
MMSF5N03HD . . . . . . . . . . . . . . . Power MOSFET 5 Amps, 30 Volts N–Channel SO–8 . . . . . . . . . . . . . . . . . . . . . . . . . . . . 733
MMSF7N03HD . . . . . . . . . . . . . . . Power MOSFET 7 Amps, 30 Volts N–Channel SO–8 . . . . . . . . . . . . . . . . . . . . . . . . . . . . 742
MMSF7N03Z . . . . . . . . . . . . . . . . Power MOSFET 7 Amps, 30 Volts N–Channel SO–8 . . . . . . . . . . . . . . . . . . . . . . . . . . . . 751
MPF930 . . . . . . . . . . . . . . . . . . . . . Small Signal MOSFET 2 Amps, 35, 60, 90 Volts N–Channel TO–92 . . . . . . . . . . . . . . . 761
MTB1306 . . . . . . . . . . . . . . . . . . . Power MOSFET 75 Amps, 30 Volts, Logic Level N–Channel D2PAK . . . . . . . . . . . . . . . 765
MTB20N20E . . . . . . . . . . . . . . . . . Power MOSFET 20 Amps, 200 Volts N–Channel D2PAK . . . . . . . . . . . . . . . . . . . . . . . . . 772
MTB23P06V . . . . . . . . . . . . . . . . . Power MOSFET 23 Amps, 60 Volts P–Channel D2PAK . . . . . . . . . . . . . . . . . . . . . . . . . . 781
MTB29N15E . . . . . . . . . . . . . . . . . Power MOSFET 29 Amps, 150 Volts N–Channel D2PAK . . . . . . . . . . . . . . . . . . . . . . . . . 790
MTB30N06VL . . . . . . . . . . . . . . . . Power MOSFET 30 Amps, 60 Volts, Logic Level N–Channel D2PAK . . . . . . . . . . . . . . . 798
MTB30P06V . . . . . . . . . . . . . . . . . Power MOSFET 30 Amps, 60 Volts P–Channel D2PAK . . . . . . . . . . . . . . . . . . . . . . . . . . 807
MTB36N06V . . . . . . . . . . . . . . . . . Power MOSFET 32 Amps, 60 Volts N–Channel D2PAK . . . . . . . . . . . . . . . . . . . . . . . . . . 816
MTB40N10E . . . . . . . . . . . . . . . . . Power MOSFET 40 Amps, 100 Volts N–Channel D2PAK . . . . . . . . . . . . . . . . . . . . . . . . . 825
MTB50N06V . . . . . . . . . . . . . . . . . Power MOSFET 42 Amps, 60 Volts N–Channel D2PAK . . . . . . . . . . . . . . . . . . . . . . . . . . 834
MTB50N06VL . . . . . . . . . . . . . . . . Power MOSFET 42 Amps, 60 Volts, Logic Level N–Channel D2PAK . . . . . . . . . . . . . . . 843
MTB50P03HDL . . . . . . . . . . . . . . Power MOSFET 50 Amps, 30 Volts, Logic Level P–Channel D2PAK . . . . . . . . . . . . . . . 852
MTB52N06V . . . . . . . . . . . . . . . . . Power MOSFET 52 Amps, 60 Volts N–Channel D2PAK . . . . . . . . . . . . . . . . . . . . . . . . . . 862
MTB52N06VL . . . . . . . . . . . . . . . . Power MOSFET 52 Amps, 60 Volts, Logic Level N–Channel D2PAK . . . . . . . . . . . . . . . 871
MTB55N06Z . . . . . . . . . . . . . . . . . Power MOSFET 55 Amps, 60 Volts N–Channel D2PAK . . . . . . . . . . . . . . . . . . . . . . . . . . 880
MTB60N05HDL . . . . . . . . . . . . . . Power MOSFET 60 Amps, 50 Volts, Logic Level N–Channel D2PAK . . . . . . . . . . . . . . . 885
MTB60N06HD . . . . . . . . . . . . . . . Power MOSFET 60 Amps, 60 Volts N–Channel D2PAK . . . . . . . . . . . . . . . . . . . . . . . . . . 895
MTB75N03HDL . . . . . . . . . . . . . . Power MOSFET 75 Amps, 25 Volts, Logic Level N–Channel D2PAK . . . . . . . . . . . . . . . 905
MTB75N05HD . . . . . . . . . . . . . . . Power MOSFET 75 Amps, 50 Volts N–Channel D2PAK . . . . . . . . . . . . . . . . . . . . . . . . . . 915
MTB75N06HD . . . . . . . . . . . . . . . Power MOSFET 75 Amps, 60 Volts N–Channel D2PAK . . . . . . . . . . . . . . . . . . . . . . . . . . 922
MTD1302 . . . . . . . . . . . . . . . . . . . Power MOSFET 20 Amps, 30 Volts N–Channel DPAK . . . . . . . . . . . . . . . . . . . . . . . . . . . 932
MTD15N06V . . . . . . . . . . . . . . . . . Power MOSFET 15 Amps, 60 Volts N–Channel DPAK . . . . . . . . . . . . . . . . . . . . . . . . . . . 942
MTD15N06VL . . . . . . . . . . . . . . . Power MOSFET 15 Amps, 60 Volts N–Channel DPAK . . . . . . . . . . . . . . . . . . . . . . . . . . . 951
MTD20N03HDL . . . . . . . . . . . . . . Power MOSFET 20 Amps, 30 Volts, Logic Level N–Channel DPAK . . . . . . . . . . . . . . . . 960
MTD20N06HD . . . . . . . . . . . . . . . Power MOSFET 20 Amps, 60 Volts N–Channel DPAK . . . . . . . . . . . . . . . . . . . . . . . . . . . 970
MTD20N06HDL . . . . . . . . . . . . . . Power MOSFET 20 Amps, 60 Volts, Logic Level N–Channel DPAK . . . . . . . . . . . . . . . . 980
MTD20P03HDL . . . . . . . . . . . . . . Power MOSFET 20 Amps, 30 Volts, Logic Level P–Channel DPAK . . . . . . . . . . . . . . . . 990
MTD20P06HDL . . . . . . . . . . . . . . Power MOSFET 20 Amps, 60 Volts, Logic Level P–Channel DPAK . . . . . . . . . . . . . . . 1000
MTD2955V . . . . . . . . . . . . . . . . . . Power MOSFET 12 Amps, 60 Volts P–Channel DPAK . . . . . . . . . . . . . . . . . . . . . . . . . . 1010
MTD3055V . . . . . . . . . . . . . . . . . . Power MOSFET 12 Amps, 60 Volts N–Channel DPAK . . . . . . . . . . . . . . . . . . . . . . . . . . 1019
MTD3055VL . . . . . . . . . . . . . . . . . Power MOSFET 12 Amps, 60 Volts N–Channel DPAK . . . . . . . . . . . . . . . . . . . . . . . . . . 1028

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7
Power MOSFET Numeric Data Sheet Listing (continued)

Device Function Page


MTD3302 . . . . . . . . . . . . . . . . . . . Power MOSFET 18 Amps, 30 Volts N–Channel DPAK . . . . . . . . . . . . . . . . . . . . . . . . . . 1037
MTD4N20E . . . . . . . . . . . . . . . . . . Power MOSFET 4 Amps, 200 Volts N–Channel DPAK . . . . . . . . . . . . . . . . . . . . . . . . . . 1048
MTD5P06V . . . . . . . . . . . . . . . . . . Power MOSFET 5 Amps, 60 Volts P–Channel DPAK . . . . . . . . . . . . . . . . . . . . . . . . . . . 1057
MTD6N20E . . . . . . . . . . . . . . . . . . Power MOSFET 6 Amps, 200 Volts N–Channel DPAK . . . . . . . . . . . . . . . . . . . . . . . . . . 1066
MTD6P10E . . . . . . . . . . . . . . . . . . Power MOSFET 6 Amps, 100 Volts P–Channel DPAK . . . . . . . . . . . . . . . . . . . . . . . . . . 1075
MTD9N10E . . . . . . . . . . . . . . . . . . Power MOSFET 9 Amps, 100 Volts N–Channel DPAK . . . . . . . . . . . . . . . . . . . . . . . . . . 1084
MTDF1N02HD . . . . . . . . . . . . . . . Power MOSFET 1 Amp, 20 Volts N–Channel Micro8t, Dual . . . . . . . . . . . . . . . . . . . . . 1093
MTDF1N03HD . . . . . . . . . . . . . . . Power MOSFET 1 Amp, 30 Volts N–Channel Micro8t, Dual . . . . . . . . . . . . . . . . . . . . . 1104
MTDF2N06HD . . . . . . . . . . . . . . . Power MOSFET 2 Amps, 60 Volts N–Channel Micro8t, Dual . . . . . . . . . . . . . . . . . . . . 1115
MTP10N10E . . . . . . . . . . . . . . . . . Power MOSFET 10 Amps, 100 Volts N–Channel TO–220 . . . . . . . . . . . . . . . . . . . . . . . 1123
MTP10N10EL . . . . . . . . . . . . . . . . Power MOSFET 10 Amps, 100 Volts, Logic Level N–Channel TO–220 . . . . . . . . . . . . 1130
MTP12P10 . . . . . . . . . . . . . . . . . . Power MOSFET 12 Amps, 100 Volts P–Channel TO–220 . . . . . . . . . . . . . . . . . . . . . . . 1136
MTP1302 . . . . . . . . . . . . . . . . . . . Power MOSFET 42 Amps, 30 Volts N–Channel TO–220 . . . . . . . . . . . . . . . . . . . . . . . . 1141
MTP1306 . . . . . . . . . . . . . . . . . . . Power MOSFET 75 Amps, 30 Volts N–Channel TO–220 . . . . . . . . . . . . . . . . . . . . . . . . 1148
MTP15N06V . . . . . . . . . . . . . . . . . Power MOSFET 15 Amps, 60 Volts N–Channel TO–220 . . . . . . . . . . . . . . . . . . . . . . . . 1155
MTP15N06VL . . . . . . . . . . . . . . . . Power MOSFET 15 Amps, 60 Volts, Logic Level N–Channel TO–220 . . . . . . . . . . . . . 1161
MTP20N06V . . . . . . . . . . . . . . . . . Power MOSFET 20 Amps, 60 Volts N–Channel TO–220 . . . . . . . . . . . . . . . . . . . . . . . . 1167
MTP20N15E . . . . . . . . . . . . . . . . . Power MOSFET 20 Amps, 150 Volts N–Channel TO–220 . . . . . . . . . . . . . . . . . . . . . . . 1173
MTP20N20E . . . . . . . . . . . . . . . . . Power MOSFET 20 Amps, 200 Volts N–Channel TO–220 . . . . . . . . . . . . . . . . . . . . . . . 1175
MTP23P06V . . . . . . . . . . . . . . . . . Power MOSFET 23 Amps, 60 Volts P–Channel TO–220 . . . . . . . . . . . . . . . . . . . . . . . . 1181
MTP27N10E . . . . . . . . . . . . . . . . . Power MOSFET 27 Amps, 100 Volts N–Channel TO–220 . . . . . . . . . . . . . . . . . . . . . . . 1187
MTP2955V . . . . . . . . . . . . . . . . . . Power MOSFET 12 Amps, 60 Volts P–Channel TO–220 . . . . . . . . . . . . . . . . . . . . . . . . 1193
MTP29N15E . . . . . . . . . . . . . . . . . Power MOSFET 29 Amps, 150 Volts N–Channel TO–220 . . . . . . . . . . . . . . . . . . . . . . . 1199
MTP3055V . . . . . . . . . . . . . . . . . . Power MOSFET 12 Amps, 60 Volts N–Channel TO–220 . . . . . . . . . . . . . . . . . . . . . . . . 1213
MTP3055VL . . . . . . . . . . . . . . . . . Power MOSFET 12 Amps, 60 Volts, Logic Level N–Channel TO–220 . . . . . . . . . . . . . 1219
MTP30N06VL . . . . . . . . . . . . . . . . Power MOSFET 30 Amps, 60 Volts, Logic Level N–Channel TO–220 . . . . . . . . . . . . . 1225
MTP30P06V . . . . . . . . . . . . . . . . . Power MOSFET 30 Amps, 60 Volts P–Channel TO–220 . . . . . . . . . . . . . . . . . . . . . . . . 1231
MTP36N06V . . . . . . . . . . . . . . . . . Power MOSFET 32 Amps, 60 Volts N–Channel TO–220 . . . . . . . . . . . . . . . . . . . . . . . . 1237
MTP40N10E . . . . . . . . . . . . . . . . . Power MOSFET 40 Amps, 100 Volts N–Channel TO–220 . . . . . . . . . . . . . . . . . . . . . . . 1243
MTP50N06V . . . . . . . . . . . . . . . . . Power MOSFET 42 Amps, 60 Volts N–Channel TO–220 . . . . . . . . . . . . . . . . . . . . . . . . 1249
MTP50N06VL . . . . . . . . . . . . . . . . Power MOSFET 42 Amps, 60 Volts, Logic Level N–Channel TO–220 . . . . . . . . . . . . . 1255
MTP50P03HDL . . . . . . . . . . . . . . Power MOSFET 50 Amps, 30 Volts, Logic Level P–Channel TO–220 . . . . . . . . . . . . . 1261
MTP52N06V . . . . . . . . . . . . . . . . . Power MOSFET 52 Amps, 60 Volts N–Channel TO–220 . . . . . . . . . . . . . . . . . . . . . . . . 1268
MTP52N06VL . . . . . . . . . . . . . . . . Power MOSFET 52 Amps, 60 Volts, Logic Level N–Channel TO–220 . . . . . . . . . . . . . 1274
MTP5P06V . . . . . . . . . . . . . . . . . . Power MOSFET 5 Amps, 60 Volts P–Channel TO–220 . . . . . . . . . . . . . . . . . . . . . . . . . 1280
MTP60N06HD . . . . . . . . . . . . . . . Power MOSFET 60 Amps, 60 Volts N–Channel TO–220 . . . . . . . . . . . . . . . . . . . . . . . . 1286
MTP6P20E . . . . . . . . . . . . . . . . . . Power MOSFET 6 Amps, 200 Volts P–Channel TO–220 . . . . . . . . . . . . . . . . . . . . . . . . 1293
MTP75N03HDL . . . . . . . . . . . . . . Power MOSFET 75 Amps, 25 Volts, Logic Level N–Channel TO–220 . . . . . . . . . . . . . 1299
MTP75N05HD . . . . . . . . . . . . . . . Power MOSFET 75 Amps, 50 Volts N–Channel TO–220 . . . . . . . . . . . . . . . . . . . . . . . . 1306
MTP75N06HD . . . . . . . . . . . . . . . Power MOSFET 75 Amps, 60 Volts N–Channel TO–220 . . . . . . . . . . . . . . . . . . . . . . . . 1313
MTP7N20E . . . . . . . . . . . . . . . . . . Power MOSFET 7 Amps, 200 Volts N–Channel TO–220 . . . . . . . . . . . . . . . . . . . . . . . . 1320
MTSF1P02HD . . . . . . . . . . . . . . . Power MOSFET 1 Amp, 20 Volts P–Channel Micro8t . . . . . . . . . . . . . . . . . . . . . . . . . . 1326
MTSF3N02HD . . . . . . . . . . . . . . . Power MOSFET 3 Amps, 20 Volts N–Channel Micro8t . . . . . . . . . . . . . . . . . . . . . . . . . 1337
MTSF3N03HD . . . . . . . . . . . . . . . Power MOSFET 3 Amps, 30 Volts N–Channel Micro8t . . . . . . . . . . . . . . . . . . . . . . . . . 1348
MTW32N20E . . . . . . . . . . . . . . . . Power MOSFET 32 Amps, 200 Volts N–Channel TO–247 . . . . . . . . . . . . . . . . . . . . . . . 1359
MTW32N25E . . . . . . . . . . . . . . . . Power MOSFET 32 Amps, 250 Volts N–Channel TO–247 . . . . . . . . . . . . . . . . . . . . . . . 1365
MTW35N15E . . . . . . . . . . . . . . . . Power MOSFET 35 Amps, 150 Volts N–Channel TO–247 . . . . . . . . . . . . . . . . . . . . . . . 1371
MTW45N10E . . . . . . . . . . . . . . . . Power MOSFET 45 Amps, 100 Volts N–Channel TO–247 . . . . . . . . . . . . . . . . . . . . . . . 1377
MTY55N20E . . . . . . . . . . . . . . . . . Power MOSFET 55 Amps, 200 Volts N–Channel TO–264 . . . . . . . . . . . . . . . . . . . . . . . 1383
VN0300L . . . . . . . . . . . . . . . . . . . . Small Signal MOSFET 200 mAmps, 60 Volts N–Channel TO–92 . . . . . . . . . . . . . . . . . 1389
VN2222LL . . . . . . . . . . . . . . . . . . . Small Signal MOSFET 150 mAmps, 60 Volts N–Channel TO–92 . . . . . . . . . . . . . . . . . 1391
VN2406L . . . . . . . . . . . . . . . . . . . . Small Signal MOSFET 200 mAmps, 240 Volts N–Channel TO–92 . . . . . . . . . . . . . . . . 1394
VN2410L . . . . . . . . . . . . . . . . . . . . Small Signal MOSFET 200 mAmps, 240 Volts N–Channel TO–92 . . . . . . . . . . . . . . . . 1396

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8
Power MOSFET Selector Guide

Table 1. ChipFET – Case 1206A


V(BR)DSS Max RDS(on) @ VGS ID (cont) PD
(Volts) 10 V 4.5 V 2.5 V 1.8 V Amps Device (Notes 1. & 2.) Page
Min (Ω) (Ω) (Ω) (Ω) (Note 8.) (Note 3.) (Watts) Max Configuration No.
30 0.035 0.055 – – 6.7 NTHS5402T1 1.3 Single N–Channel 95
0.085 0.143 – – 3.9 NTHD5902T1 1.1 Dual N–Channel 80
20 – 0.03 0.045 – 7.2 NTHS5404T1 1.3 Single N–Channel 106
– 0.075 0.0134 – 4.2 NTHD5904T1 1.1 Dual N–Channel 90
– 0.060 0.083 – 5.3 NTHS5441T1 1.3 Single P–Channel 109
(Note 7.)
– 0.065 0.110 – 4.7 NTHS5443T1 1.3 Single P–Channel 112
– 0.155 0.260 – 2.9 NTHD5903T1 1.1 Dual P–Channel 85
8 – 0.035 0.047 0.062 7.1 NTHS5445T1 1.3 Single P–Channel 114
0.09 0.13 0.18 4.1 NTHD5905T1 1.1 Dual P–Channel 95

Table 2. SO-8 (MiniMOS) – Case 751–06


V(BR)DSS Max RDS(on) @ VGS ID PD
(Volts) 10 V 4.5 V 2.7 V 2.5 V (cont) Device (Notes 1. & 2.) Configuration Page
Min (Ω) (Ω) (Ω) (Ω) Amps (Note 4.) (Watts) Max (Note 6.) No.
60 – 0.130 (Note 5.) – – 3.3 MMDF3N06VLR2 2.0 Dual N–Channel 540
0.100 0.200 – – 3.3 MMDF3N06HDR2 2.0 Dual N–Channel 531
50 0.300 0.500 – – 1.5 MMDF1N05ER2 2.0 Dual N–Channel 399
40 0.080 0.100 – – 3.4 MMDF3N04HDR2 2.0 Dual N–Channel 521
30 0.030 0.039 – – 7.0 MMSF1308R2 2.5 Single N–Channel 681
0.015 0.019 – – 10.0 MMSF1310R2 2.5 Single N–Channel 689
0.0125 0.020 – – 11.5 MMSF3300R2 2.5 Single N–Channel 705
0.040 0.050 – – 6.5 MMSF5N03HDR2 2.5 Single N–Channel 733
0.028 0.040 – – 8.2 MMSF7N03HDR2 2.5 Single N–Channel 742
0.085 0.115 – – 3.05 NTMS3P03R2 2.5 Single P–Channel 150
0.070 0.075 – – 4.1 MMDF3N03HDR2 2.0 Dual N–Channel 512
0.035 0.050 – – 6.0 MMDF6N03HDR2 2.0 Dual N–Channel 560
0.085 0.125 – – 3.05 NTMD3P03R2 2.0 Dual P–Channel 120
0.070/0.200 0.075/0.300 – – 4.1 MMDF2C03HDR2 2.0 Complementary 439
25 0.100/0.210 0.160/0.375 – – 3.0/2.0 MMDF1300R2 1.8 Complementary 396
20 0.025 0.040 – – 8.2 MMSF5N02HDR2 2.5 Single N–Channel 724
– 0.045 0.055 – 4.0 NTMS4N01R2 2.5 Single N–Channel 157
0.250 0.400 – – 2.5 MMSF2P02ER2 2.5 Single P–Channel 697
0.075 0.095 – – 5.6 MMSF3P02HDR2 2.5 Single P–Channel 715
– 0.033 – 0.048 5.4 NTMS5P02R2 2.5 Single P–Channel 171
– 0.014 – 0.020 10.0 NTMS10P02R2 2.5 Single P–Channel 143

1. TC = 25°C
2. See Data Sheet for Applicable Mounting Configuration.
3. Available in Tape and Reel only. T1 suffix = 3000 per reel.
4. Available in Tape and Reel only. R2 suffix = 2500 per reel.
5. VGS = 5.0 V
6. Data for all Complementary Devices listed as Nch/Pch.
7. VGS = 3.6 V
8. t ≤ 5 sec

Devices listed in bold, italic are ON Semiconductor preferred devices.

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Power MOSFET Selector Guide (continued)

Table 2. SO-8 (MiniMOS) – Case 751–06 (continued)


V(BR)DSS Max RDS(on) @ VGS ID PD
(Volts) 10 V 4.5 V 2.7 V 2.5 V (cont) Device (Notes 9. & 10.) Configuration Page
Min (Ω) (Ω) (Ω) (Ω) Amps (Note 11.) (Watts) Max (Note 12.) No.
20 0.100 0.200 – – 3.6 MMDF2N02ER2 2.0 Dual N–Channel 451
– 0.035 0.048 0.049 6.5 NTMD6N02R2 2.0 Dual N–Channel 127
0.090 0.100 – – 3.8 MMDF3N02HDR2 2.0 Dual N–Channel 503
0.250 0.400 – – 2.5 MMDF2P02ER2 2.0 Dual P–Channel 477
0.160 0.180 – – 3.3 MMDF2P02HDR2 2.0 Dual P–Channel 485
– 0.033 – 0.050 7.8 NTMD6P02R2 2.0 Dual P–Channel 120
0.100/0.250 0.200/0.400 – – 3.6 MMDF2C02ER2 2.0 Complementary 416
0.090/0.160 0.100/0.180 – – 3.8 MMDF2C02HDR2 2.0 Complementary 427
– 0.024/0.074 – – 7.0 NTMD7C02R2 2.0 Complementary 141
12 – 0.045 0.055 – 5.1 NTMS4P01R2 2.5 Single P–Channel 164
– 0.180 0.220 – 3.4 MMDF2P01HDR2 2.0 Dual P–Channel 468
– 0.045/0.180 – – 5.2 MMDF2C01HDR2 2.0 Complementary 404

Table 3. SO–8 FETKY –– Case 751–06


V(BR)DSS Max RDS(on) @ VGS ID PD
(Volts) 10 V 4.5 V 2.7 V 2.5 V (cont) Device (Notes 9. & 10.) Page
Min (Ω) (Ω) (Ω) (Ω) Amps (Note 11.) (Watts) Max Configuration No.
30 0.035 0.050 – – 6.0 MMDFS6N303R2 2.0 Dual N–Channel/ 589
Schottky
0.085 0.125 – – 3.05 NTMSD3P303R2 2.0 Dual P–Channel/ 198
Schottky
20 0.160 0.180 – – 3.3 MMDFS2P102R2 2.0 Dual P–Channel/ 579
Schottky
– 0.090 0.130 0.15 2.4 NTMSD2P102LR2 2.0 Dual P–Channel/ 178
Schottky
0.085 0.125 – – 3.0 NTMSD3P102R2 2.0 Dual P–Channel/ 188
Schottky

Table 4. EZFET – SO–8 Power MOSFETs with Zener Gate Protection – Case 751–06
V(BR)DSS Max RDS(on) @ VGS ID PD
(Volts) 10 V 4.5 V 2.7 V 2.5 V (cont) Device (Notes 9. & 10.) Page
Min (Ω) (Ω) (Ω) (Ω) Amps (Note 11.) (Watts) Max Configuration No.
50 0.3 – – – 2.0 MMDF2N05ZR2 2.0 Dual N–Channel 459
30 0.03 0.04 – – 7.5 MMSF7N03ZR2 2.5 Single N–Channel 751
0.013 0.018 – – 10 MMSF10N03ZR2 1.6 Single N–Channel 671
20 – 0.015 0.019 – 10 MMSF10N02ZR2 2.5 Single N–Channel 662
– 0.04 0.05 – 5.0 MMDF5N02ZR2 2.0 Dual N–Channel 551
– 0.027 – 0.035 7.0 MMDF7N02ZR2 2.0 Dual N–Channel 569

9. TC = 25°C
10. See Data Sheet for Applicable Mounting Configuration.
11. Available in Tape and Reel only. R2 suffix = 2500 per reel.
12. Data for all Complementary Devices listed as Nch/Pch.

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Power MOSFET Selector Guide (continued)

Table 5. Micro8 – Case 846A–02


V(BR)DSS Max RDS(on) @ VGS ID PD
(Volts) 10 V 4.5 V 2.7 V 2.5 V (cont) Device (Notes 13. & 14.) Page
Min (Ω) (Ω) (Ω) (Ω) Amps (Note 15.) (Watts) Max Configuration No.
60 0.22 0.26 – – 1.5 MTDF2N06HDR2 1.25 Dual N–Channel 1115
30 0.04 0.06 – – 5.7 MTSF3N03HDR2 1.79 Single N–Channel 1348
0.085 0.135 – – 2.5 NTTS2P03R2 1.79 Single P–Channel 255
0.12 0.16 – – 2.0 MTDF1N03HDR2 1.25 Dual N–Channel 1104
20 – 0.04 0.05 – 6.1 MTSF3N02HDR2 1.79 Single N–Channel 1337
– 0.16 0.19 – 1.8 MTSF1P02HDR2 1.8 Single P–Channel 1326
– 0.09 0.13 – 2.4 NTTS2P02R2R2 0.78 Single P–Channel 248
– 0.12 0.16 – 2.8 MTDF1N02HDR2 1.25 Dual N–Channel 1093
– 0.16 0.25 – 1.45 NTTD1P02R2 1.25 Dual P–Channel 234
– 0.090 0.130 – 2.4 NTTD2P02R2 1.25 Dual P–Channel 241

Table 6. SOT-223 – Case 318E–04


V(BR)DSS Max RDS(on) @ VGS ID PD
(Volts) 10 V 5.0 V 2.7 V 2.5 V (cont) Device (Notes 13. & 14.) Page
Min (Ω) (Ω) (Ω) (Ω) Amps (Note 16.) (Watts) Max No.
N–Channel
240 6.0 – – 10 0.7 MMFT2406T1/T3 1.5 605
200 14 – – – 0.25 MMFT107T1/T3 0.8 599
60 0.13 – – – 1.7 MMFT3055VT1/T3 2.0 628
– 0.14 – – 1.5 MMFT3055VLT1/T3 2.0 637
1.7 – – – 0.3 MMFT960T1 0.8 656
20 – 0.15 – – 1.6 MMFT2N02ELT1 0.8 619
P–Channel
60 0.3 – – – 1.2 MMFT2955ET1/T3 0.8 610
30 0.1 – – – 5.2 MMFT5P03HDT3 3.13 646

Table 7. TSOP–6 – Case 318G–02


V(BR)DSS Max RDS(on) @ VGS ID PD
(Volts) 10 V 4.5 V 2.7 V 2.5 V (cont) Device (Notes 13. & 14.) Page
Min (Ω) (Ω) (Ω) (Ω) Amps (Note 17.) (Watts) Max No.
N–Channel
30 0.065 0.095 – – 4.2 MGSF3454VT1 2.0 349
20 – 0.07 – 0.095 4.0 MGSF3442VT1 2.0 344
– 0.045 – 0.055 5.8 NTGS3446T1 1.6 73
P–Channel
30 0.100 0.170 – – 3.5 NTGS3455T1 2.0 76
20 – 0.09 – 0.135 3.3 NTGS3441T1 2.0 61
– 0.065 0.090 0.100 4.4 NTGS3443T1 2.0 67
0.175 0.28 – – 1.3 MGSF2P02HDT1 2.0 336
12 – .075 .095 – 3.3 NTGS3433T1 2.0 57

13. TC = 25°C
14. See Data Sheet for Applicable Mounting Configuration.
15. Available in Tape and Reel only. R2 suffix = 4000 per reel.
16. Available in Tape and Reel only. T1 suffix = 1000 per reel, T3 suffix = 4000 per reel.
17. Available in Tape and Reel only. T1 suffix = 3000 per reel.

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Power MOSFET Selector Guide (continued)

Table 8. TSSOP–8 – Case 318G–02


V(BR)DSS Max RDS(on) @ VGS ID PD
(Volts) 10 V 4.5 V 2.7 V 2.5 V (cont) Device (Notes 18. & 19.) Page
Min (Ω) (Ω) (Ω) (Ω) Amps (Note 20.) (Watts) Max Configuration No.
20 – 0.03 – 0.04 5.8 NTQD6866R2 1.6 Dual N–Channel 230
(Note 23.)
– 0.020 0.027 – 6.2 NTQS6463R2 1.05 Single P–Channel 232

Table 9. SOT–23 – Case 318–08


V(BR)DSS Max RDS(on) @ VGS ID PD
(Volts) 10 V 4.5 V 2.5 V (cont) Device (Notes 18. & 19.) Page
Min (Ω) (Ω) (Ω) Amps (Note 21.) (Watts) Max No.
N–Channel
100 6.0 – – 0.17 BSS123LT1/T3 0.225 280
60 5.0 – – 0.50 MMBF170LT1/T3 0.225 384
7.5 – – 0.115 2N7002LT1/T3 0.225 267
50 – 3.5 @ 5.0 V 7.0 @ 2.75 0.20 BSS138LT1/T3 0.225 284
30 0.1 0.145 – 0.75 MGSF1N03LT1 0.4 324
20 0.09 0.13 – 0.75 MGSF1N02LT1 0.4 320
1.0 1.4 – 0.3 MMBF0201NLT1 0.225 372
– 0.085 0.115 0.75 MGSF1N02ELT1 0.4 316
P–Channel
50 – 10 @ 5.0 V – 0.13 BSS84LT1 0.225 289
20 – 0.26 0.5 0.75 MGSF1P02ELT1 0.4 328
0.35 0.5 – 0.75 MGSF1P02LT1 0.4 332
1.4 3.5 – 0.3 MMBF0202PLT1 0.225 377

Table 10. SC–70 / SOT–323 – Case 419–02


V(BR)DSS Max RDS(on) @ VGS ID PD
(Volts) 10 V 4.5 V 2.7 V (cont) Device (Notes 18. & 19.) VGS Page
Min (Ω) (Ω) (Ω) Amps (Note 22.) (Watts) Max (Volts) Min No.
N–Channel
30 – 50 – 0.10 MMBF1374T1 0.10 1.0 382
20 1.0 1.4 – 0.30 MMBF2201NT1 0.15 1.0 388
P–Channel
20 2.2 3.5 – 0.30 MMBF2202PT1 0.15 1.0 392

Table 11. SC–88 / SOT–363 – Case 419B–01


V(BR)DSS Max RDS(on) @ VGS ID PD
(Volts) 10 V 4.5 V 2.7 V (cont) Device (Notes 18. & 19.) VGS Page
Min (Ω) (Ω) (Ω) Amps (Note 22.) (Watts) Max (Volts) Min No.
N–Channel
20 10 – – 0.1 NTUD01N02 0.15 0.5 262

18. TC = 25°C
19. See Data Sheet for Applicable Mounting Configuration.
20. Available in Tape and Reel only. R2 suffix = 4000 per reel.
21. Available in Tape and Reel only. T1 suffix = 3000 per reel, T3 suffix = 10,000 per reel.
22. Available in Tape and Reel only. T1 suffix = 3000 per reel.
23. VGS = 4.0 V

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Power MOSFET Selector Guide (continued)

Table 12. DPAK – Case 369A–13 (TO–252)


V(BR)DSS Max RDS(on) @ VGS ID PD
(Volts) 10 V 5.0 V 2.7 V (cont) Device (Notes 24. & 25.) Page
Min (Ω) (Ω) (Ω) Amps (Note 26.) (Watts) Max No.
N-Channel
200 1.2 – – 4.0 MTD4N20E 40 1048
0.07 – 6.0 MTD6N20E 50 1066
100 0.25 – – 9.0 MTD9N10E 40 1084
60 0.094 – – 12 NTD3055–094 36 35
– 0.104 – 12 NTD3055L104 36 37
0.15 – – 12 MTD3055V 48 1019
– 0.18 – 12 MTD3055VL 48 1028
0.12 – – 15 MTD15N06V 55 942
– 0.085 – 15 MTD15N06VL 60 951
0.045 – – 20 MTD20N06HD 40 970
– 0.045 – 20 MTD20N06HDL 40 980
0.046 – – 20 NTD20N06 60 33
0.026 – – 32 NTD32N06 60 39
– 0.028 – 32 NTD32N06L 60 44
30 – 0.035 – 20 MTD20N03HDL 74 960
0.022 – – 20 MTD1302 74 932
– 0.027 – 20 NTD20N03L27 74 29
0.010 0.013 – 20 NTD4302 62 49
0.010 – – 30 MTD3302 96 1037
P-Channel
100 0.66 – – 6.0 MTD6P10E 50 1075
60 0.45 – – 5.0 MTD5P06V 40 1057
0.20 – – 12 MTD2955V 60 1010
– 0.175 – 15 MTD20P06HDL 72 1000
30 – 0.099 – 19 MTD20P03HDL 75 990

24. TC = 25°C
25. See Data Sheet for Applicable Mounting Configuration.
26. Also available in Tape and Reel. T4 suffix = 2500 per reel.

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Power MOSFET Selector Guide (continued)

Table 13. D2PAK – Case 418B–03 (TO–264)


V(BR)DSS Max RDS(on) @ VGS ID PD
(Volts) 10 V 5.0 V 2.7 V (cont) Device (Notes 27. & 28.) Page
Min (Ω) (Ω) (Ω) Amps (Note 29.) (Watts) Max No.
N-Channel
200 0.16 – – 20 MTB20N20E 125 772
150 0.07 – – 29 MTB29N15E 125 790
100 0.04 – – 40 MTB40N10E 169 825
60 0.04 – – 32 MTB36N06V 90 816
– 0.05 – 30 MTB30N06VL 90 798
0.026 – – 45 NTB45N06 120 210
– 0.028 – 45 NTB45N06L 120 215
0.028 – – 42 MTB50N06V 125 834
– 0.032 – 42 MTB50N06VL 125 843
0.022 – – 52 MTB52N06V 165 862
– 0.025 – 52 MTB52N06VL 188 871
0.016 – – 55 MTB55N06Z 136 880
0.014 – – 60 MTB60N06HD 125 895
0.010 – – 75 MTB75N06HD 125 922
50 0.0095 – – 75 MTB75N05HD 125 915
– 0.014 – 60 MTB60N05HDL 150 885
30 0.0065 – – 75 MTB1306 150 765
0.0065 – – 75 NTB75N03–06 150 220
– 0.009 – 75 NTB75N03L09 150 225
25 – 0.009 – 75 MTB75N03HDL 125 905
P-Channel
60 0.12 – – 23 MTB23P06V 90 781
0.08 – – 30 MTB30P06V 125 807
30 – 0.025 – 50 MTB50P03HDL 125 852

27. TC = 25°C
28. See Data Sheet for Applicable Mounting Configuration.
29. Also available in Tape and Reel. T4 suffix = 800 per reel.

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Power MOSFET Selector Guide (continued)

Table 14. TO-220AB – Case 221A–09


V(BR)DSS Max RDS(on) @ VGS ID PD
(Volts) 10 V 5.0 V 2.7 V (cont) (Note NO TAG) Page
Min (Ω) (Ω) (Ω) Amps Device (Watts) Max No.
N-Channel
200 0.70 – – 7.0 MTP7N20E 50 1320
0.16 – – 20 MTP20N20E 125 1175
150 0.07 – – 29 MTP29N15E 125 1199
0.13 – – 20 MTP20N15E 112 1173
100 0.25 – – 10 MTP10N10E 75 1123
0.07 – – 27 MTP27N10E 104 1187
0.04 – – 40 MTP40N10E 169 1243
– 0.22 – 10 MTP10N10EL 40 1130
60 0.150 – – 12 MTP3055V 48 1213
– 0.18 – 12 MTP3055VL 48 1219
0.12 – – 15 MTP15N06V 55 1155
– 0.085 – 15 MTP15N06VL 60 1161
0.085 – – 20 MTP20N06V 60 1167
0.046 – – 27 NTP27N06 74 208
0.04 – – 32 MTP36N06V 90 1237
– 0.05 – 30 MTP30N06VL 90 1225
0.026 – – 45 NTP45N06 120 210
– 0.028 – 45 NTP45N06L 120 215
0.028 – – 42 MTP50N06V 125 1249
– 0.032 – 42 MTP50N06VL 125 1255
0.022 – – 52 MTP52N06V 165 1268
– 0.025 – 52 MTP52N06VL 165 1274
0.014 – – 60 MTP60N06HD 150 1286
0.01 – – 75 MTP75N06HD 150 1313
50 0.0095 – – 75 MTP75N05HD 150 1306
30 0.022 0.029 – 42 MTP1302 74 1141
0.0065 0.0085 – 75 MTP1306 150 1148
0.0065 – – 75 NTP75N03–06 150 220
– 0.009 – 75 NTP75N03L09 150 225
25 – 0.009 – 75 MTP75N03HDL 150 1299

P-Channel
500 6.0 – – 2.0 MTP2P50E 75 1207
200 1.0 – – 6.0 MTP6P20E 75 1293
100 0.30 – – 12 MTP12P10 75 1136
60 0.45 – – 5.0 MTP5P06V 40 1280
0.20 – – 12 MTP2955V 60 1193
0.12 – – 23 MTP23P06V 90 1181
0.08 – – 30 MTP30P06V 125 1231
30 – 0.025 – 50 MTP50P03HDL 125 1261

30. TC = 25°C

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Power MOSFET Selector Guide (continued)

Table 15. TO-247 (Isolated Mounting Hole) – Case 340K–01


V(BR)DSS Max RDS(on) @ VGS ID PD
(Volts) 10 V 4.5 V 2.7 V (cont) (Note 31.) Page
Min (Ω) (Ω) (Ω) Amps Device (Watts) Max No.
N-Channel
250 0.08 – – 32 MTW32N25E 250 1365
200 0.075 – – 32 MTW32N20E 180 1359
150 0.05 – – 35 MTW35N15E 180 1371
100 0.035 – – 45 MTW45N10E 180 1377

Table 16. TO-264 – Case 340G–02


V(BR)DSS Max RDS(on) @ VGS ID PD
(Volts) 10 V 4.5 V 2.7 V (cont) (Note 31.) Page
Min (Ω) (Ω) (Ω) Amps Device (Watts) Max No.
N-Channel
200 0.028 – – 55 MTY55N20E 300 1383

Table 17. SMARTDISCRETES


V(BR)DSS Max RDS(on) @ VGS PD
(Volts) 10 V 5.0 V 2.7 V (Notes 31. & 32.) Page
Min (Ω) (Ω) (Ω) Function Device (Watts) Max No.
TO-220AB
62 (Clamped) – 0.75 – Current Limit, ESD MLP1N06CL 40 360
– 0.40 – Current Limit, ESD MLP2N06CL 40 366
DPAK
62 (Clamped) – 0.75 – Current Limit, ESD MLD1N06CLT4 40 354
(Note 33.)
D2PAK – 5 Lead
40 V – 0.02 – Temp Sense, ESD, NIB6404–5L 115 23
Overvoltage Protect
SO–8
30 V 0.05 – – Current Mirror, NIMD6302R2 20 27
ESD Protect (Note 34.)

31. TC = 25°C
32. See Data Sheet for Applicable Mounting Configuration.
33. Available in Tape and Reel only. T4 suffix = 2500 per reel.
34. Available in Tape and Reel only. R2 suffix = 2500 per reel.

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Power MOSFET Selector Guide (continued)

Table 18. TO-92


V(BR)DSS Max RDS(on) @ VGS ID PD
(Volts) 10 V 4.5 V 2.7 V (cont) (Note 35.) Page
Min (Ω) (Ω) (Ω) Amps Device (Watts) Max No.
N-Channel
240 10 – 10 @ 2.5 V 0.2 VN2410L 0.35 1396
6.0 – 10 @ 2.5 V 0.2 VN2406L 0.35 1394
200 – 8.0 @ 2.8 V 10 @ 2.5 V 0.25 BS108 0.35 275
14 – 28 @ 2.6 V 0.25 BS107 0.35 271
6.0 – – 0.25 BS107A 0.35 271
90 2.0 – – 2.0 MPF990 1.0 761
60 7.5 – – 0.15 VN2222LL 0.4 1391
5.0 – – 0.5 BS170 0.35 277
5.0 6.0 – 0.2 2N7000 0.35 264
1.7 – – 2.0 MPF960 1.0 761
1.2 3.3 @ 5 V – 0.2 VN0300L 0.35 1389
35 1.4 – – 2.0 MPF930 1.0 761
1.4 – – 2.0 MPF930A 1.0 761

Table 19. Ignition IGBTs – Insulated Gate Bipolar Transistors


V(BR)CES Max VCE(on) @ VGE IC IC PD
(Volts) 4.0 V 4.5 V (pulse) (cont) (Notes 35. & 36.) Page
Min IC = 6.0 A IC = 10 A Amps Amps Device (Watts) Max No.
TO-220AB
400 V (Clamped) 1.6 1.9 50 15 MGP15N40CL 150 301
350 V (Clamped) 1.6 1.9 50 15 MGP15N35CL 150 293
1.6 1.8 50 19 MGP19N35CL 166 309

D2PAK
400 V (Clamped) 1.6 1.9 50 15 MGB15N40CLT4 150 301
(Note 37.)
350 V (Clamped) 1.6 1.9 50 15 MGB15N35CLT4 150 293
(Note 37.)
1.6 1.8 50 19 MGB19N35CLT4 166 309
(Note 37.)
DPAK
410 V (Clamped) 1.7 2.1 50 15 NGD15N41CLT4 96 21
(Note 38.)

35. TC = 25°C
36. See Data Sheet for Applicable Mounting Configuration.
37. Available in Tape and Reel only. T4 suffix = 800 per reel.
38. Available in Tape and Reel only. T4 suffix = 2500 per reel.

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CHAPTER 1
MOSFET Data Sheets

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20


 


 
    
N–Channel DPAK
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This Logic Level Insulated Gate Bipolar Transistor (IGBT) features
monolithic circuitry integrating ESD and Over–Voltage clamped
protection for use in inductive coil drivers applications. Primary uses 15 AMPS
include Ignition, Direct Fuel Injection, or wherever high voltage and
410 VOLTS
high current switching is required.
• Ideal for Coil–on–Plug Applications VCE(on) @ 10 A = 2.1 V MAX
• DPAK Package Offers Smaller Footprint and Increased Board Space
• Gate–Emitter ESD Protection C
• Temperature Compensated Gate–Collector Voltage Clamp Limits
Stress Applied to Load
• Integrated ESD Diode Protection RG
G
• New Cell Design Increases Unclamped Inductive Switching (UIS)
Energy Per Area RGE
• Short–Circuit Withstand Capability
• Low Threshold Voltage to Interface Power Loads to Logic or
E
Microprocessor Devices
• Low Saturation Voltage
• High Pulsed Current Capability
MARKING
• Optional Gate Resistor (RG) and Gate–Emitter Resistor (RGE) DIAGRAM

MAXIMUM RATINGS (–55°C ≤ TJ ≤ 175°C unless otherwise noted)


DPAK
Rating Symbol Value Unit CASE 369A TBD
STYLE 2
Collector–Emitter Voltage VCES 440 VDC
Collector–Gate Voltage VCER 440 VDC
Gate–Emitter Voltage VGE 15 VDC TBD = Specific Device Code
Collector Current–Continuous IC 15 ADC
@ TC = 25°C
ORDERING INFORMATION
Operating and Storage Temperature TJ, Tstg –55 to °C
Range 175 Device Package Shipping
NGD15N41CL DPAK 75 Units/Rail

NGD15N41CLT4 DPAK 2500/Tape & Reel

This document contains information on a product under development. ON Semiconductor


reserves the right to change or discontinue this product without notice.

 Semiconductor Components Industries, LLC, 2001 21 Publication Order Number:


March, 2001 – Rev. 2 NGD15N41CL/D
NGD15N41CL

UNCLAMPED COLLECTOR–TO–EMITTER AVALANCHE CHARACTERISTICS (–55°C ≤ TJ ≤ 175°C)


Characteristic Symbol Value Unit
Single Pulse Collector–to–Emitter Avalanche Energy EAS mJ
VCC = 50 V, VGE = 5 V, Pk IL = 16 A, L = 1.8 mH, Starting TJ = 25°C 225
VCC = 50 V, VGE = 5 V, Pk IL = 15 A, L = 1.8 mH, Starting TJ = 150°C 200
THERMAL CHARACTERISTICS
Thermal Resistance, Junction to Ambient DPAK RθJA 100 °C/W
Maximum Lead Temperature for Soldering Purposes, 1/8″ from case for 5 seconds TL 275 °C

ELECTRICAL CHARACTERISTICS (TC = 25°C unless otherwise noted)


Characteristic Symbol Test Conditions Min Typ Max Unit
OFF CHARACTERISTICS
Collector–Emitter Clamp Voltage BVCES IC = 2 mA 380 410 440 VDC
TJ = –40°C to 175°C

Zero Gate Voltage Collector Current ICES VCE = 300 V, – – 40 µADC


VGE = 0, TJ = 25°C
VCE = 300 V, – – 200
VGE = 0, TJ = 150°C
Reverse Collector–Emitter Leakage Current IECS VCE = –24 V – – 1.0 mA
Gate–Emitter Clamp Voltage BVGES IG = 5 mA 10 – 16 VDC
Gate Resistor (Optional) RG – – 70 – Ω
Gate Emitter Resistor (Optional) RGE – 10 – 26 kΩ
ON CHARACTERISTICS*
Gate Threshold Voltage VGE(th) IC = 1 mA 1.0 1.4 2.1 VDC
VGE = VCE
Threshold Temperature Coefficient (Negative) – – – 4.4 – mV/°C
Collector–to–Emitter On–Voltage VCE(on) IC = 6 A, VGE = 4 V – – 1.8 VDC
Collector–to–Emitter On–Voltage VCE(on) IC = 10 A, – – 2.1 VDC
VGE = 4.5 V,
TJ = 150°C
DYNAMIC CHARACTERISTICS
Input Capacitance CISS VCC = 15 V – 700 – pF
Output Capacitance COSS VGE = 0 V – 60 –
Transfer Capacitance CRSS f = 1 MHz – 6.0 –
SWITCHING CHARACTERISTICS*
Turn–Off Delay Time td(off) VCC = 300 V, – 4.0 – µSec
IC = 10 A
Fall Time tf RG = 1 kΩ, – 10 –
L = 300 µH
Turn–On Delay Time td(on) VCC = 10 V, – 1.0 – µSec
IC = 6.5 A
Rise Time tr RG = 1 kΩ, – 4.0 –
RL = 1 Ω
*Pulse Test: Pulse Width v 300 µS, Duty Cycle v 2%.

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22
 
Preferred Device

 

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Self Protected with Temperature Sense
N–Channel D2PAK http://onsemi.com

SMARTDISCRETES devices are an advanced series of Power 52 AMPERES


MOSFETs which utilize ON Semiconductor’s latest MOSFET
technology process to achieve the lowest possible on–resistance per 40 VOLTS
silicon area while incorporating additional features such as clamp RDS(on) = 20 mΩ
diodes. They are capable of withstanding high energy in the avalanche
and commutation modes. The avalanche energy is specified to

eliminate guesswork in designs where inductive loads are switched
T2
and offer additional safety margin against unexpected voltage
transients.
This new SMARTDISCRETES device features integrated

Gate–to–Source diodes for ESD protection, and Gate–to–Drain clamp
for overvoltage protection. Also, this device integrates a sense diode T1
for temperature monitoring. 
• Ultra Low RDS(on) Provides Higher Efficiency
• IDSS Specified at Elevated Temperature
MARKING
• Avalanche Energy Specified DIAGRAM
• Overvoltage Protection
• Temperature Sense Diode
• ESD Human Body Model Discharge Sensitivity Class 3
TBD
D2PAK
CASE 936D
MAXIMUM RATINGS (TJ = 25°C unless otherwise noted) PLASTIC
Rating Symbol Value Unit
TBD = Specific Device Code
Drain–to–Source Voltage VDSS 40 Vdc
Drain–to–Gate Voltage VDGR 40 Vdc
Gate–to–Source Voltage VGS "10 Vdc
Operating and Storage TJ, Tstg –55 to °C ORDERING INFORMATION
Temperature Range +175
Device Package Shipping
Single Pulse Drain–to–Source Avalanche EAS 450 mJ
Energy – Starting TJ = 25°C (Note 1.)
(VDD = 25 Vdc, VGS = 5.0 Vdc, NIB6404–5L D2PAK TBD
IL(pk) = 25 A, L = 1.4 mH, RG = 10 kΩ)
Drain Current Adc Preferred devices are recommended choices for future use
– Continuous @ TA = 25°C ID 52 and best overall value.
– Continuous @ TA = 140°C ID 25
– Single Pulse (tpv10 µs) IDM 200
Total Power Dissipation (t ≤ 10 seconds) PD @ TA 115 W
Linear Derating Factor = 25°C 0.76 W/°C
Thermal Resistance °C/W
– Junction–to–Case RθJC 1.3
– Junction–to–Ambient (Note 1.) RθJA 80
1. Measured while surface mounted to an FR4 board using the minimum
recommended pad size. Typical value is 64°C/W.
This document contains information on a product under development. ON Semiconductor
reserves the right to change or discontinue this product without notice.

 Semiconductor Components Industries, LLC, 2001 23 Publication Order Number:


February, 2001 – Rev. 1 NIB6404–5L/D
NIB6404–5L

ELECTRICAL CHARACTERISTICS (TJ = 25°C unless otherwise noted)


Characteristic Symbol Min Typ Max Unit
OFF CHARACTERISTICS
Drain–to–Source Breakdown Voltage (Note 2.) V(BR)DSS Vdc
(VGS = 0 Vdc, ID = 250 µAdc, –55°C < TJ < 175°C) 40 51 55
Temperature Coefficient (Negative) – 7.0 – mV/°C
Gate–to–Source Clamp Voltage (Note 2.) V(BR)GSS 10 13 20 Vdc
(VGS = 0 Vdc, IG = 20 µAdc)

Zero Gate Voltage Drain Current IDSS µAdc


(VDS = 35 Vdc, VGS = 0 Vdc) – 1.1 100
(VDS = 15 Vdc, VGS = 0 Vdc) – 0.2 2.0
(VDS = 35 Vdc, VGS = 0 Vdc, TJ = 125°C) – 4.0 20
Gate–Body Leakage Current (VGS = 5.0 Vdc, VDS = 0 Vdc) IGSS – 0.02 1.0 µAdc
ON CHARACTERISTICS (Note 2.)
Gate Threshold Voltage (Note 2.) VGS(th) Vdc
(VDS = VGS, ID = 1.0 mAdc) 1.0 1.7 2.0
Threshold Temperature Coefficient (Negative) – 4.5 – mV/°C
Static Drain–to–Source On–Resistance (Note 2.) RDS(on) – 18 20 mΩ
(VGS = 5.0 Vdc, ID = 20 Adc)

Forward Transconductance (VDS = 15 Vdc, ID = 10 Adc) (Note 2.) gFS TBD 34 – mhos
DYNAMIC CHARACTERISTICS
Input Capacitance Ciss – 1720 – pF
Output Capacitance (VDS = 25 Vd
Vdc, VGS = 0 Vd
Vdc,
Coss – 525 –
f = 1.0 MHz)
Transfer Capacitance Crss – 120 –
SWITCHING CHARACTERISTICS (Note 3.)
Turn–On Delay Time td(on) – 16 – ns
Rise Time (VDD = 32 Vdc, ID = 25 Adc, tr – 263 –
VGS = 55.0
0 Vdc
Vdc,
Turn–Off Delay Time RG = 10 Ω) (Note 2.) td(off) – 149 –
Fall Time tf – 345 –
Gate Charge QT – 29 – nC

(VDS = 32 Vdc, ID = 25 Adc, Q1 – 6.0 –


VGS = 5.0 Vdc) (Note 2.) Q2 – 16 –
Q3 – 2.0 –

SOURCE–DRAIN DIODE CHARACTERISTICS


Forward On–Voltage (IS = 20 Adc, VGS = 0 Vdc) (Note 2.) VSD – 0.876 1.2 Vdc
(IS = 20 Adc, VGS = 0 Vdc, TJ = 125°C) – 0.746 –
Reverse Recovery Time trr – 60 – ns

(IS = 25 Adc, VGS = 0 Vdc, ta – 29 –


dIS/dt = 100 A/µs) (Note 2.) tb – 32 –
Reverse Recovery Stored Charge QRR – 80 – pC

TEMPERATURE SENSE DIODE CHARACTERISTICS


Forward (Reverse) On–Voltage (IF(R) = 250 µAdc) (Note 2.) VAC(ACR) 715 743 775 mVdc
(IF(R) = 250 µAdc, TJ = 125°C) – 570 –

Temperature Coefficient IF(R) = 250 µAdc, VFTC 1.57 1.71 1.85 mV/°C
(Negative) TJ = 160°C

Forward Voltage Hysteresis IF(R) = 125 µAdc to 250 µAdc Vhys 25 37 50 mVdc
2. Pulse Test: Pulse Width ≤ 300 µs, Duty Cycle ≤ 2%.
3. Switching characteristics are independent of operating junction temperatures.

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24
NIB6404–5L

TYPICAL ELECTRICAL CHARACTERISTICS

50 40
5.0 V 4.0 V
45
I D, DRAIN CURRENT (AMPS)

I D, DRAIN CURRENT (AMPS)


4.5 V 35
3.5 V
40
30
35
30 TJ = 25°C 25

25 20
TJ = 175°C
20 3.0 V 15
15 25°C
10
10 –55°C
5.0 VGS = 2.5 V 5.0

0 0
0 0.5 1.0 1.5 2.0 2.5 3.0 3.5 4.0 4.5 5.0 0 0.5 1.0 1.5 2.0 2.5 3.0 3.5
VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS) VGS, GATE–TO–SOURCE VOLTAGE (VOLTS)

Figure 1. On–Region Characteristics Figure 2. Transfer Characteristics


RDS(on), DRAIN–TO–SOURCE RESISTANCE (mW)

RDS(on), DRAIN–TO–SOURCE RESISTANCE (mW)


50 50
45 45
40 TJ = 175°C 40
VGS = 3.0 V 3.5 V
35 35
30 30
25 25 4.0 V
25°C
20 20 5.0 V

15 15
10 V
10 10
–55°C
5.0 5.0 TJ = 25°C
0 0
0 10 20 30 40 50 0 10 20 30 40 50
ID, DRAIN CURRENT (AMPS) ID, DRAIN CURRENT (AMPS)

Figure 3. On–Resistance versus Drain Current Figure 4. On–Resistance versus Drain Current
and Temperature and Gate Voltage
RDS(on), DRAIN–TO–SOURCE RESISTANCE

2.2 4500
VGS = 5.0 V VGS = 0 V
2.0 4000 TJ = 25°C
ID = 20 A f = 1.0 MHz
3500
C, CAPACITANCE (pF)

1.8
3000
(NORMALIZED)

1.6
2500
1.4
2000 Ciss
1.2
1500
1.0 1000
Coss
0.8 500
Crss
0.6 0
–50 0 50 100 150 200 0 5.0 10 15 20 25 30
TJ, JUNCTION TEMPERATURE (°C) VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS)

Figure 5. On–Resistance Variation with Figure 6. Capacitance Variation


Temperature

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25
NIB6404–5L

TYPICAL ELECTRICAL CHARACTERISTICS

5000 20
Ciss
4500 18

IS, SOURCE CURRENT (A)


4000 16
C, CAPACITANCE (pF)

3500 14
3000 Coss 12
2500 10
2000 8.0
1500 6.0
TJ = 175°C
1000 TJ = 25°C 4.0
VDS = 0 V 25°C
500 f = 1 MHz 2.0
0 0
0 2.0 4.0 6.0 8.0 10 0 0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9 1.0
VGS, GATE–TO–SOURCE VOLTAGE (VOLTS) VSD, SOURCE–TO–DRAIN VOLTAGE (VOLTS)

Figure 7. Capacitance Variation Figure 8. Diode Forward Voltage


versus Current

VFTC, TEMPERATURE COEFFICIENT (mV/°C)


1.0 –1.3

0.9 –1.4
VF, FORWARD VOLTAGE (V)

IF(R) = 500 mA
0.8 –1.5
250 mA –1.6
0.7 IF(R) = 250 mA
125 mA –1.7
0.6
–1.8
0.5
–1.9
50 mA
0.4 –2.0
25 mA
0.3 –2.1
–100 –50 0 50 100 150 200 –50 0 50 100 150
TJ, JUNCTION TEMPERATURE (°C) TJ, JUNCTION TEMPERATURE (°C)

Figure 9. Sense Diode Forward Voltage Figure 10. Sense Diode Temperature
Variation with Temperature Coefficient Variation with Temperature

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26
 ! 

 

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  !  
Self Protected with Current Sense
http://onsemi.com
N–Channel SO–8, Dual
SMARTDISCRETES devices are an advanced series of Power 5.0 AMPERES
MOSFETs which utilize ON Semiconductor’s latest MOSFET
technology process to achieve the lowest possible on–resistance per 30 VOLTS
silicon area while incorporating smart features. They are capable of RDS(on) = 50 mΩ
withstanding high energy in the avalanche and commutation modes.
The avalanche energy is specified to eliminate guesswork in designs Drain
where inductive loads are switched and offer additional safety margin
against unexpected voltage transients.
This new SMARTDISCRETES device features an integrated Gate
Gate–to–Source clamp for ESD protection. Also, this device features a Sense Main FET
sense FET for current monitoring.
• Ultra Low RDS(on) Provides Higher Efficiency and Extends Battery
Life
• IDSS Specified at Elevated Temperature Source Source
• Avalanche Energy Specified Sense Main
• Current Sense FET
• ESD Protected, Main FET and SENSEFET
ABSOLUTE MAXIMUM RATINGS
SOIC–8
Stresses beyond those listed may cause permanent damage to the device. CASE 751
These are stress ratings only and functional operation of the device at these STYLE 19
or any other conditions beyond those indicated in this specification is not
implied. Exposure to absolute maximum rated conditions for extended peri-
ods may affect device reliability.
MARKING DIAGRAM
MAIN MOSFET MAXIMUM RATINGS (TJ = 25°C unless otherwise noted) 1 8
Source 1 Mirror 1
Rating Symbol Value Unit 2 7
Gate 1 Drain 1
Drain–to–Source Voltage VDSS 30 Vdc 3 TBD 6
Source 2 Mirror 2
Drain–to–Gate Voltage VDGR 30 Vdc 4 5
(RGS = 1.0 MW) Gate 2 Drain 2
Gate–to–Source Voltage VGS "16 Vdc (Top View)
Single Pulse Drain–to–Source EAS 250 mJ
Avalanche Energy (Note 1.) TBD = Specific Device Code
(VDD = 25 Vdc, VGS = 10 Vdc,
VDS = 20 Vdc, IL = 15 Apk,
L = 10 mH, RG = 25 Ω)
Drain Current ORDERING INFORMATION
– Continuous @ TA = 25°C ID 6.5 Adc
– Continuous @ TA = 100°C (Note 1.) ID 4.4 Adc Device Package Shipping
– Single Pulse (tpv10 µs) IDM 33 Apk
NIMD6302R2 SOIC–8 TBD
Maximum Power Dissipation (TA = 25°C) PD TBD W
1. Switching characteristics are independent of operating junction temperatures
This document contains information on a product under development. ON Semiconductor
reserves the right to change or discontinue this product without notice.

 Semiconductor Components Industries, LLC, 2001 27 Publication Order Number:


February, 2001 – Rev. 1 NIMD6302R2/D
NIMD6302R2

MAIN MOSFET ELECTRICAL CHARACTERISTICS (TJ = 25°C unless otherwise noted)


Characteristic Symbol Min Typ Max Unit
OFF CHARACTERISTICS
Drain–to–Source Breakdown Voltage V(BR)DSS
(VGS = 0 Vdc, ID = 250 µAdc) 30 35 – Vdc
Temperature Coefficient (Positive) – 30 – mV/°C
Zero Gate Voltage Drain Current IDSS µAdc
(VDS = 30 Vdc, VGS = 0 Vdc) – – 10
(VDS = 30 Vdc, VGS = 0 Vdc, TJ = 125°C) – – 100
Gate–Body Leakage Current (VGS = 12 Vdc, VDS = 0 Vdc) IGSS – 22 32 µAdc
ON CHARACTERISTICS
Gate Threshold Voltage (VDS = VGS, ID = 250 mAdc) VGS(th) 1.0 – 2.0 Vdc
Threshold Temperature Coefficient (Negative) – 5.0 – mV/°C

Static Drain–to–Source On–Resistance (Note 2.) RDS(on) mΩ


(VGS = 10 Vdc, ID = 3.0 Adc, TJ @ 25°C) – – 50
(VGS = 10 Vdc, ID = 3.0 Adc, TJ @ 125°C) – – TBD
Forward Transconductance (Note 2.) gFS mhos
(VDS = 6.0 Vdc, ID = 15 Adc) – 7.4 –
(VDS = 15 Vdc, ID = 15 Adc) – 5.5 –

DYNAMIC CHARACTERISTICS (Note 3.)


Input Capacitance Ciss – 380 600 pF
Output Capacitance (VDS = 6.0
6 0 Vdc,
Vd VGS = 0 Vdc,
Vd
Coss – 272 350
f = 1.0 MHz)
Transfer Capacitance Crss – 93 200

SWITCHING CHARACTERISTICS (Note 3.)


Turn–On Delay Time td(on) – 8.4 – ns
Rise Time (VDD = 6.0 Vdc, ID = 3.0 Adc, tr – 24 –
Turn–Off Delay Time VGS = 10 Vdc, RG = 4.7 Ω) td(off) – 18 –
Fall Time tf – 5.0 –
Gate Charge QT – 11.3 – nC

(VDS = 6.0 Vdc, ID = 3.0 Adc, Q1 – 2.8 –


VGS = 10 Vdc) Q2 – 1.9 –
Q3 – 2.2 –
SOURCE–DRAIN DIODE CHARACTERISTICS
Forward On–Voltage (Note 2.) (IS = 3.0 Adc, VGS = 0 Vdc) VSD
S – 0.76 – Vdc
Forward On–Voltage (Notes 2., 3.) (IS = 3.0 Adc, VGS = 0 Vdc, TJ = 125°C) – 0.62 –
Reverse Recovery Time (Note 3.) trr – 24.7 – ns
ta – 13 –
(IS = 3.0
3 0 Adc,
Adc VGS = 0 Vdc,
Vdc
dIS/dt = 100 A/µs) tb – 12 –
Reverse Recovery Stored Charge QRR – 0.018 – mC
(Note 3.)

MIRROR MOSFET CHARACTERISTICS (TJ = 25°C unless otherwise noted)


Main/Mirror MOSFET (VDS = 6.0 Vdc, IDmain = 25 mA) IRAT 192 200 208 –
Current Ratio (VDS = 6.0 Vdc, IDmain = 25 mA, 192 200 208
TA = 125°C)
Main/Mirror Current Ratio IDRAT –7.5 ±3.0 +7.5 %
(VDS = 6.0 Vdc, IDmain = 25 mA,
Variation versus Current
TA = 25 to 125°C)
and Temperature
Gate–Body Leakage Current VDS = 0 Vdc, VGS = 3.0 Vdc IGSS – – 100 nAdc
2. Pulse Test: Pulse Width = 300 µs, Duty Cycle = 2%.
3. Switching characteristics are independent of operating junction temperatures.

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28
 ! "

#$%& '(
  !  
N–Channel DPAK
This logic level vertical power MOSFET is a general purpose part
that provides the “best of design” available today in a low cost power
package. Avalanche energy issues make this part an ideal design in. http://onsemi.com
The drain–to–source diode has a ideal fast but soft recovery.
Features 20 AMPERES
• Ultra–Low RDS(on), single base, advanced technology 30 VOLTS
• SPICE parameters available
RDS(on) = 27 mΩ
• Diode is characterized for use in bridge circuits
• IDSS and VDS(on) specified at elevated temperatures
N–Channel
• High Avalanche Energy Specified
• ESD JEDAC rated HBM Class 1, MM Class A, CDM Class 0
D

Typical Applications
• Power Supplies
• Inductive Loads G
• PWM Motor Controls
• Replaces MTD20N03L in many applications S

MAXIMUM RATINGS (TC = 25°C unless otherwise noted) MARKING


DIAGRAM
Rating Symbol Value Unit
Drain–to–Source Voltage VDSS 30 Vdc
4
Drain–to–Gate Voltage (RGS = 1.0 MΩ) VDGR 30 Vdc CASE 369A YWW
Gate–to–Source Voltage Vdc DPAK 20N3L
1 2 STYLE 2
– Continuous VGS "20 3
– Non–Repetitive (tpv10 ms) VGS "24
Drain Current 20N3L = Device Code
– Continuous @ TA = 25_C ID 20 Adc Y = Year
– Continuous @ TA = 100_C ID 16 WW = Work Week
– Single Pulse (tpv10 µs) IDM 60 Apk
Total Power Dissipation @ TA = 25_C PD 74 Watts PIN ASSIGNMENT
Derate above 25°C 0.6 W/°C 4
Total Power Dissipation @ TC = 25°C 1.75 W Drain
(Note 1.)
Operating and Storage Temperature TJ, Tstg –55 to °C
Range 150
Single Pulse Drain–to–Source Avalanche EAS 288 mJ
Energy – Starting TJ = 25°C
(VDD = 30 Vdc, VGS = 5 Vdc, L =
1.0 mH, IL(pk) = 24 A, VDS = 34 Vdc) 1 2 3
Gate Drain Source
Thermal Resistance °C/W
– Junction–to–Case RθJC 1.67
– Junction–to–Ambient ORDERING INFORMATION
RθJA 100
– Junction–to–Ambient (Note 1.) RθJA 71.4 Device Package Shipping
Maximum Lead Temperature for Soldering TL 260 °C
Purposes, 1/8″ from case for 10 seconds NTD20N03L27 DPAK 75 Units/Rail
1. When surface mounted to an FR4 board using the minimum recommended
NTD20N03L27–1 DPAK 75 Units/Rail
pad size and repetitive rating; pulse width limited by maximum junction
temperature. NTD20N03L27T4 DPAK 2500 Tape & Reel

 Semiconductor Components Industries, LLC, 2001 29 Publication Order Number:


January, 2001 – Rev. 0 NTD20N03L27/D
NTD20N03L27

ELECTRICAL CHARACTERISTICS (TC = 25°C unless otherwise noted)


Characteristic Symbol Min Typ Max Unit
OFF CHARACTERISTICS
Drain–to–Source Breakdown Voltage (Note 2.) V(BR)DSS Vdc
(VGS = 0 Vdc, ID = 250 µAdc) 30 – –
Temperature Coefficient (Positive) – 43 – mV/°C
Zero Gate Voltage Drain Current IDSS µAdc
(VDS = 30 Vdc, VGS = 0 Vdc) – – 10
(VDS = 30 Vdc, VGS = 0 Vdc, TJ =150°C) – – 100
Gate–Body Leakage Current (VGS = ±20 Vdc, VDS = 0 Vdc) IGSS – – ±100 nAdc
ON CHARACTERISTICS (Note 2.)
Gate Threshold Voltage (Note 2.) VGS(th) Vdc
(VDS = VGS, ID = 250 µAdc) 1.0 1.6 2.0
Threshold Temperature Coefficient (Negative) – 5.0 – mV/°C
Static Drain–to–Source On–Resistance (Note 2.) RDS(on) mΩ
(VGS = 4.0 Vdc, ID = 10 Adc) – 28 31
(VGS = 5.0 Vdc, ID = 10 Adc) – 23 27
Static Drain–to–Source On–Resistance (Note 2.) VDS(on) Vdc
(VGS = 5.0 Vdc, ID = 20 Adc) – 0.48 0.54
(VGS = 5.0 Vdc, ID = 10 Adc, TJ = 150°C) – 0.40 –
Forward Transconductance (Note 2.) (VDS = 5.0 Vdc, ID = 10 Adc) gFS – 21 – mhos
DYNAMIC CHARACTERISTICS
Input Capacitance Ciss – 1005 1260 pF
Output Capacitance (VDS = 25 Vd
Vdc, VGS = 0 Vd
Vdc,
Coss – 271 420
f = 1.0 MHz)
Transfer Capacitance Crss – 87 112

SWITCHING CHARACTERISTICS (Note 3.)


Turn–On Delay Time td(on) – 17 25 ns
Rise Time (VDD = 20 Vdc, ID = 20 Adc, tr – 137 160
VGS = 55.0
0 Vdc
Vdc,
Turn–Off Delay Time RG = 9.1 Ω) (Note 2.) td(off) – 38 45
Fall Time tf – 31 40
Gate Charge QT – 13.8 18.9 nC
(VDS = 48 Vd
Vdc, ID = 15 Adc,
Ad
Q1 – 2.8 –
VGS = 10 Vdc) (Note 2.)
Q2 – 6.6 –
SOURCE–DRAIN DIODE CHARACTERISTICS
Forward On–Voltage VSD Vdc
(IS = 20 Adc, VGS = 0 Vdc) (Note 2.) – 1.0 1.15
(IS = 20 Adc, VGS = 0 Vdc, TJ = 125°C) – 0.9 –
Reverse Recovery Time trr – 23 – ns
ta – 13 –
(IS =15
15 Adc,
Adc VGS = 0 Vdc,
Vdc
dlS/dt = 100 A/µs) (Note 2.) tb – 10 –
Reverse Recovery Stored QRR – 0.017 – µC
Charge
2. Pulse Test: Pulse Width ≤ 300 µs, Duty Cycle ≤ 2%.
3. Switching characteristics are independent of operating junction temperature.

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30
NTD20N03L27

40 40
VGS = 10 V VDS > = 10 V
35 36
–ID, DRAIN CURRENT (AMPS)

VGS = 4 V

ID, DRAIN CURRENT (AMPS)


VGS = 8 V 32
30 VGS = 4.5 V
28
25 VGS = 5 V
24
VGS = 3.5 V TJ = 100°C
20 20
VGS = 6 V
16 TJ = 25°C
15 TJ = –55°C
VGS = 3 V 12
10
TJ = 25°C 8
5 VGS = 2.5 V 4
0 0
0 0.2 0.4 0.6 0.8 1 1.2 1.4 1.6 1.8 2 0.5 1 1.5 2 2.5 3 3.5 4 4.5 5
–VDS, DRAIN–TO–SOURCE VOLTAGE (V) –VGS, GATE–TO–SOURCE VOLTAGE (V)

Figure 1. On–Region Characteristics Figure 2. Transfer Characteristics


RDS(on), DRAIN–TO–SOURCE RESISTANCE (Ω)

RDS(on), DRAIN–TO–SOURCE RESISTANCE (Ω)


0.04 0.03
VGS = 5 V TJ = 25°C
0.035 TJ = 100°C
0.03 0.025 VGS = 5 V
TJ = 25°C
0.025

0.02 TJ = –55°C 0.02

0.015 VGS = 10 V

0.01 0.015

0.005

0 0.01
2 5 8 12 15 18 22 25 28 32 35 38 0 4 8 12 16 20 24 28 32 36 40
ID, DRAIN CURRENT (AMPS) ID, DRAIN CURRENT (AMPS)

Figure 3. On–Resistance vs. Drain Current and Figure 4. On–Resistance vs. Drain Current and
RDS(on), DRAIN–TO–SOURCE RESISTANCE (NORMALIZED)

Temperature Gate Voltage

1.6 1000
ID = 10 A VGS = 0 V
VGS = 5 V
1.4
TJ = 125°C
–IDSS, LEAKAGE (nA)

100
1.2

TJ = 100°C
1
10

0.8

0.6 1
–50 –25 0 25 50 75 100 125 150 0 3 6 9 12 15 18 21 24 27 30
TJ, JUNCTION TEMPERATURE (°C) –VDS, DRAIN–TO–SOURCE VOLTAGE (V)

Figure 5. On–Resistance Variation with Figure 6. Drain–to–Source Leakage Current


Temperature vs. Voltage

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31
NTD20N03L27

2500 12

VGS, GATE–TO–SOURCE VOLTAGE (V)


VGS – VDS
Q
10
200
C, CAPACITANCE (pF)

8
1500 VGS
Ciss 6
1000
Q1 Q2
4

500 Coss
Crss 2 ID = 20 A
TJ = 25°C
0 0
10 8 6 4 2 0 2 4 6 8 10 12 14 16 18 20 23 25 0 2 4 6 8 10 12 14
GATE–TO–SOURCE OR DRAIN–TO–SOURCE VOLTAGE (V) Qg, TOTAL GATE CHARGE (nC)

Figure 7. Capacitance Variation Figure 8. Gate–to–Source and


Drain–to–Source Voltage vs. Total Charge

1000 20
VGS = 0 V
18
IS, SOURCE CURRENT (AMPS)
TJ = 25°C
16
tr 14
100
t, TIME (ns)

tf 12

td(off) 10
8
10 td(on) 6
VDS = 20 V
ID = 20 A 4
VGS = 5.0 V 2
TJ = 25°C
1 0
1 10 100 0.0 0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9 1.0
RG, GATE RESISTANCE (Ω) VSD, SOURCE–TO–DRAIN VOLTAGE (V)

Figure 9. Resistive Switching Time Variation Figure 10. Diode Forward Voltage vs. Current
vs. Gate Resistance
EAS, SINGLE PULSE DRAIN–TO–SOURCE

350
ID = 24 A
300
AVALANCHE ENERGY (mJ)

250

200

150

100

50

0
25 50 75 100 125 150
TJ, STARTING JUNCTION TEMPERATURE (°C)

Figure 11. Maximum Avalanche Energy vs.


Starting Junction Temperature

http://onsemi.com
32
 

  
#$%& '(
    
N–Channel DPAK
Designed for low voltage, high speed switching applications in
power supplies, converters and power motor controls and bridge
http://onsemi.com
circuits.
Features 20 AMPERES
• Lower RDS(on) 60 VOLTS
• Lower VDS(on) RDS(on) = 46 mΩ
• Lower Capacitances
• Lower Total Gate Charge N–Channel

• Lower and Tighter VSD D

• Lower Diode Reverse Recovery Time


• Lower Reverse Recovery Stored Charge
Typical Applications
G
• Power Supplies
• Converters 4

S
Power Motor Controls
• Bridge Circuits
4

MAXIMUM RATINGS (TJ = 25°C unless otherwise noted) 1 2 1


3 2
Rating Symbol Value Unit 3
CASE 369A CASE 369
Drain–to–Source Voltage VDSS 60 Vdc
DPAK DPAK
Drain–to–Gate Voltage (RGS = 10 MΩ) VDGR 60 Vdc (Bent Lead) (Straight Lead)
Gate–to–Source Voltage Vdc STYLE 2 STYLE 2
– Continuous VGS "20
– Non–repetitive (tpv10 ms) VGS "30 NTD20N06 = Device Code
Y = Year
Drain Current Adc
WW = Work Week
– Continuous @ TA = 25°C ID 20
– Continuous @ TA = 100°C ID 10
MARKING DIAGRAMS
– Single Pulse (tpv10 µs) IDM 60 Apk
& PIN ASSIGNMENTS
Total Power Dissipation @ TA = 25°C PD 60 W
4
Derate above 25°C 0.40 W/°C
Drain
Total Power Dissipation @ TA = 25°C (Note 1.) 1.88 W
Total Power Dissipation @ TA = 25°C (Note 2.) 1.36 W 4
Drain YWW
Operating and Storage Temperature Range TJ, Tstg –55 to °C
NTD
175
YWW 20N06
Single Pulse Drain–to–Source Avalanche EAS 170 mJ
NTD
Energy – Starting TJ = 25°C 20N06
(VDD = 25 Vdc, VGS = 10 Vdc,
L = 1.0 mH, IL(pk) = 18.4 A, VDS = 60 Vdc)
1 2 3
1 3
Thermal Resistance °C/W Gate Drain Source
Gate Source
– Junction–to–Case RθJC 2.5
2
– Junction–to–Ambient (Note 1.) RθJA 80
Drain
– Junction–to–Ambient (Note 2.) RθJA 110
Maximum Lead Temperature for Soldering TL 260 °C
ORDERING INFORMATION
Purposes, 1/8″ from case for 10 seconds
Device Package Shipping
1. When surface mounted to an FR4 board using 1″ pad size,
NTD20N06 DPAK 75 Units/Rail
(Cu Area 1.127 in2).
2. When surface mounted to an FR4 board using the minimum recommended DPAK
NTD20N06–1 75 Units/Rail
pad size, (Cu Area 0.412 in2). Straight Lead
This document contains information on a new product. Specifications and information
herein are subject to change without notice. NTD20N06T4 DPAK 2500 Tape & Reel

 Semiconductor Components Industries, LLC, 2001 33 Publication Order Number:


March, 2001 – Rev. 3 NTD20N06/D
NTD20N06

ELECTRICAL CHARACTERISTICS (TJ = 25°C unless otherwise noted)


Characteristic Symbol Min Typ Max Unit
OFF CHARACTERISTICS
Drain–to–Source Breakdown Voltage (Note 3.) V(BR)DSS Vdc
(VGS = 0 Vdc, ID = 250 µAdc) 60 71.7 –
Temperature Coefficient (Positive) – 79.4 – mV/°C
Zero Gate Voltage Drain Current IDSS µAdc
(VDS = 60 Vdc, VGS = 0 Vdc) – – 1.0
(VDS = 60 Vdc, VGS = 0 Vdc, TJ = 150°C) – – 10
Gate–Body Leakage Current (VGS = ±20 Vdc, VDS = 0 Vdc) IGSS – – ±100 nAdc
ON CHARACTERISTICS (Note 3.)
Gate Threshold Voltage (Note 3.) VGS(th) Vdc
(VDS = VGS, ID = 250 µAdc) 2.0 2.91 4.0
Threshold Temperature Coefficient (Negative) – 6.9 – mV/°C
Static Drain–to–Source On–Resistance (Note 3.) RDS(on) mΩ
(VGS = 10 Vdc, ID = 10 Adc) – 37.5 46

Static Drain–to–Source On–Voltage (Note 3.) VDS(on) Vdc


(VGS = 10 Vdc, ID = 20 Adc) – 0.78 1.10
(VGS = 10 Vdc, ID = 10 Adc, TJ = 150°C) – 1.57 –
Forward Transconductance (Note 3.) (VDS = 7.0 Vdc, ID = 6.0 Adc) gFS – 13.2 – mhos
DYNAMIC CHARACTERISTICS
Input Capacitance Ciss – 725 1015 pF
Output Capacitance (VDS = 25 Vd
Vdc, VGS = 0 Vd
Vdc,
Coss – 213 300
f = 1.0 MHz)
Transfer Capacitance Crss – 58 120

SWITCHING CHARACTERISTICS (Note 4.)


Turn–On Delay Time td(on) – 9.5 20 ns
Rise Time (VDD = 30 Vdc, ID = 20 Adc, tr – 60.5 120
VGS = 10 Vdc
Vdc,
Turn–Off Delay Time RG = 9.1 Ω) (Note 3.) td(off) – 27.1 60
Fall Time tf – 37.1 80
Gate Charge QT – 21.2 30 nC
(VDS = 48 Vd
Vdc, ID = 20 Adc,
Ad
Q1 – 5.6 –
VGS = 10 Vdc) (Note 3.)
Q2 – 7.3 –
SOURCE–DRAIN DIODE CHARACTERISTICS
Forward On–Voltage (IS = 20 Adc, VGS = 0 Vdc) (Note 3.) VSD – 1.0 1.2 Vdc
(IS = 20 Adc, VGS = 0 Vdc, TJ = 150°C) – 0.87 –
Reverse Recovery Time trr – 42.9 – ns
(IS = 20 Ad
Adc, VGS = 0 Vd
Vdc,
ta – 33 –
dIS/dt = 100 A/µs) (Note 3.)
tb – 9.9 –
Reverse Recovery Stored Charge QRR – 0.084 – µC
3. Pulse Test: Pulse Width ≤ 300 µs, Duty Cycle ≤ 2%.
4. Switching characteristics are independent of operating junction temperatures.

http://onsemi.com
34
!)


  
#$%& '(
    
N–Channel DPAK
Designed for low voltage, high speed switching applications in http://onsemi.com
power supplies, converters and power motor controls and bridge
circuits. 12 AMPERES
Features 60 VOLTS
• Lower RDS(on) RDS(on) = 94 mΩ
• Lower VDS(on)
• Lower and Tighter VSD N–Channel

• Lower Diode Reverse Recovery Time D

• Lower Reverse Recovery Stored Charge


Typical Applications
• Power Supplies G
• Converters
• Power Motor Controls S 4
• Bridge Circuits 4

MAXIMUM RATINGS (TJ = 25°C unless otherwise noted)


1 2 1
Rating Symbol Value Unit 3 2
3
Drain–to–Source Voltage VDSS 60 Vdc CASE 369A CASE 369
Drain–to–Gate Voltage (RGS = 10 MΩ) VDGR 60 Vdc DPAK DPAK
(Bent Lead) (Straight Lead)
Gate–to–Source Voltage Vdc
STYLE 2 STYLE 2
– Continuous VGS "20
– Non–Repetitive (tpv10 ms) VGS "30 NTD3055–094 = Device Code
Drain Current Y = Year
– Continuous @ TA = 25°C ID 12 Adc WW = Work Week
– Continuous @ TA = 100°C ID 10
– Single Pulse (tpv10 µs) IDM 45 Apk MARKING DIAGRAMS
Total Power Dissipation @ TA = 25°C PD 48 W & PIN ASSIGNMENTS
Derate above 25°C 0.32 W/°C 4
Total Power Dissipation @ TA = 25°C (Note 1.) 2.1 W Drain
Total Power Dissipation @ TA = 25°C (Note 2.) 1.5 W 4
Operating and Storage Temperature Range TJ, Tstg –55 to °C Drain YWW
+175 NTD
YWW 3055–094
Single Pulse Drain–to–Source Avalanche EAS 61 mJ
Energy – Starting TJ = 25°C NTD
(VDD = 25 Vdc, VGS = 10 Vdc, L = 1.0 mH 3055–094
IL(pk) = 11 A, VDS = 60 Vdc)
1 2 3
Thermal Resistance 1 3
Gate Drain Source
– Junction–to–Case RθJC 3.13 °C/W Gate Source
– Junction–to–Ambient (Note 1.) RθJA 71.4 2
– Junction–to–Ambient (Note 2.) RθJA 100 Drain

Maximum Lead Temperature for Soldering TL 260 °C ORDERING INFORMATION


Purposes, 1/8″ from case for 10 seconds
Device Package Shipping
1. When surface mounted to an FR4 board using 1″ pad size,
(Cu Area 1.127 in2). NTD3055–094 DPAK 75 Units/Rail
2. When surface mounted to an FR4 board using the minimum recommended DPAK
pad size, (Cu Area 0.412 in2). NTD3055–094–1
Straight Lead
75 Units/Rail
This document contains information on a new product. Specifications and information
herein are subject to change without notice.
NTD3055–094T4 DPAK 2500 Tape & Reel

 Semiconductor Components Industries, LLC, 2001 35 Publication Order Number:


March, 2001 – Rev. 1 NTD3055–094/D
NTD3055–094

ELECTRICAL CHARACTERISTICS (TJ = 25°C unless otherwise noted)


Characteristic Symbol Min Typ Max Unit
OFF CHARACTERISTICS
Drain–to–Source Breakdown Voltage (Note 3.) V(BR)DSS Vdc
(VGS = 0 Vdc, ID = 250 µAdc) 60 68 –
Temperature Coefficient (Positive) – 54.4 – mV/°C
Zero Gate Voltage Drain Current IDSS µAdc
(VDS = 60 Vdc, VGS = 0 Vdc) – – 1.0
(VDS = 60 Vdc, VGS = 0 Vdc, TJ = 150°C) – – 10
Gate–Body Leakage Current (VGS = ±20 Vdc, VDS = 0 Vdc) IGSS – – ±100 nAdc
ON CHARACTERISTICS (Note 3.)
Gate Threshold Voltage (Note 3.) VGS(th) Vdc
(VDS = VGS, ID = 250 µAdc) 2.0 2.9 4.0
Threshold Temperature Coefficient (Negative) – 6.3 – mV/°C
Static Drain–to–Source On–Resistance (Note 3.) RDS(on) mOhm
(VGS = 10 Vdc, ID = 6.0 Adc) – 84 94

Static Drain–to–Source On–Voltage (Note 3.) VDS(on) Vdc


(VGS = 10 Vdc, ID = 12 Adc) – 0.85 1.35
(VGS = 10 Vdc, ID = 6.0 Adc, TJ = 150°C) – 0.77 –
Forward Transconductance (Note 3.) (VDS = 7.0 Vdc, ID = 6.0 Adc) gFS – 6.7 – mhos
DYNAMIC CHARACTERISTICS
Input Capacitance Ciss – 323 450 pF
Output Capacitance (VDS = 25 Vd
Vdc, VGS = 0 Vd
Vdc,
Coss – 107 150
f = 1.0 MHz)
Transfer Capacitance Crss – 34 70

SWITCHING CHARACTERISTICS (Note 4.)


Turn–On Delay Time td(on) – 7.7 15 ns
Rise Time (VDD = 48 Vdc, ID = 12 Adc, tr – 32.3 70
Turn–Off Delay Time VGS = 10 Vdc, RG = 9.1 Ω) (Note 3.) td(off) – 25.2 50
Fall Time tf – 23.9 50
Gate Charge QT – 10.9 20 nC
(VDS = 48 Vd
Vdc, ID = 12 Adc,
Ad
Q1 – 3.1 –
VGS = 10 Vdc) (Note 3.)
Q2 – 4.2 –
SOURCE–DRAIN DIODE CHARACTERISTICS
Forward On–Voltage (IS = 12 Adc, VGS = 0 Vdc) (Note 3.) VSD – 0.94 1.15 Vdc
(IS = 12 Adc, VGS = 0 Vdc, TJ = 150°C) – 0.82 –
Reverse Recovery Time trr – 33.1 – ns
(IS = 12 Ad
Adc, VGS = 0 Vd
Vdc,
ta – 24 –
dIS/dt = 100 A/µs) (Note 3.)
tb – 8.9 –
Reverse Recovery Stored Charge QRR – 0.047 – µC
3. Pulse Test: Pulse Width ≤ 300 µs, Duty Cycle ≤ 2%.
4. Switching characteristics are independent of operating junction temperatures.

http://onsemi.com
36
!


  
#$%& '(
     
* %+%
N–Channel DPAK
Designed for low voltage, high speed switching applications in http://onsemi.com
power supplies, converters and power motor controls and bridge
circuits. 12 AMPERES
Features 60 VOLTS
• Lower RDS(on) RDS(on) = 104 mΩ
• Lower VDS(on)
• Tighter VSD Specification N–Channel

• Lower Diode Reverse Recovery Time D

• Lower Reverse Recovery Stored Charge


Typical Applications
• Power Supplies G
• Converters
• Power Motor Controls S 4
• Bridge Circuits 4

MAXIMUM RATINGS (TJ = 25°C unless otherwise noted)


1 2 1
Rating Symbol Value Unit 3 2
3
Drain–to–Source Voltage VDSS 60 Vdc CASE 369A CASE 369
Drain–to–Gate Voltage (RGS = 10 MΩ) VDGR 60 Vdc DPAK DPAK
(Bent Lead) (Straight Lead)
Gate–to–Source Voltage Vdc
STYLE 2 STYLE 2
– Continuous VGS "15
– Non–Repetitive (tpv10 ms) VGS "20 NTD3055L104 = Device Code
Drain Current Y = Year
– Continuous @ TA = 25°C ID 12 Adc WW = Work Week
– Continuous @ TA = 100°C ID 10
– Single Pulse (tpv10 µs) IDM 45 Apk MARKING DIAGRAMS
Total Power Dissipation @ TA = 25°C PD 48 W & PIN ASSIGNMENTS
Derate above 25°C 0.32 W/°C 4
Total Power Dissipation @ TA = 25°C (Note 1.) 2.1 W Drain
Total Power Dissipation @ TA = 25°C (Note 2.) 1.5 W 4
Operating and Storage Temperature Range TJ, Tstg –55 to °C Drain YWW
+175 NTD
YWW 3055L104
Single Pulse Drain–to–Source Avalanche EAS 61 mJ
Energy – Starting TJ = 25°C NTD
(VDD = 25 Vdc, VGS = 5.0 Vdc, L = 1.0 mH 3055L104
IL(pk) = 11 A, VDS = 60 Vdc)
1 2 3
Thermal Resistance 1 3
Gate Drain Source
– Junction–to–Case RθJC 3.13 °C/W Gate Source
– Junction–to–Ambient (Note 1.) RθJA 71.4 2
– Junction–to–Ambient (Note 2.) RθJA 100 Drain

Maximum Lead Temperature for Soldering TL 260 °C ORDERING INFORMATION


Purposes, 1/8″ from case for 10 seconds
Device Package Shipping
1. When surface mounted to an FR4 board using 1″ pad size,
(Cu Area 1.127 in2). NTD3055L104 DPAK 75 Units/Rail
2. When surface mounted to an FR4 board using the minimum recommended DPAK
pad size, (Cu Area 0.412 in2). NTD3055L104–1
Straight Lead
75 Units/Rail
This document contains information on a new product. Specifications and information
herein are subject to change without notice.
NTD3055L104T4 DPAK 2500 Tape & Reel

 Semiconductor Components Industries, LLC, 2001 37 Publication Order Number:


March, 2001 – Rev. 1 NTD3055L104/D
NTD3055L104

ELECTRICAL CHARACTERISTICS (TJ = 25°C unless otherwise noted)


Characteristic Symbol Min Typ Max Unit
OFF CHARACTERISTICS
Drain–to–Source Breakdown Voltage (Note 3.) V(BR)DSS Vdc
(VGS = 0 Vdc, ID = 250 µAdc) 60 70 –
Temperature Coefficient (Positive) – 62.9 – mV/°C
Zero Gate Voltage Drain Current IDSS µAdc
(VDS = 60 Vdc, VGS = 0 Vdc) – – 1.0
(VDS = 60 Vdc, VGS = 0 Vdc, TJ = 150°C) – – 10
Gate–Body Leakage Current (VGS = ±15 Vdc, VDS = 0 Vdc) IGSS – – ±100 nAdc
ON CHARACTERISTICS (Note 3.)
Gate Threshold Voltage (Note 3.) VGS(th) Vdc
(VDS = VGS, ID = 250 µAdc) 1.0 1.6 2.0
Threshold Temperature Coefficient (Negative) – 4.2 – mV/°C
Static Drain–to–Source On–Resistance (Note 3.) RDS(on) mOhm
(VGS = 5.0 Vdc, ID = 6.0 Adc) – 89 104

Static Drain–to–Source On–Voltage (Note 3.) VDS(on) Vdc


(VGS = 5.0 Vdc, ID = 12 Adc) – 0.98 1.50
(VGS = 5.0 Vdc, ID = 6.0 Adc, TJ = 150°C) – 0.86 –
Forward Transconductance (Note 3.) (VDS = 8.0 Vdc, ID = 6.0 Adc) gFS – 9.1 – mhos
DYNAMIC CHARACTERISTICS
Input Capacitance Ciss – 316 440 pF
Output Capacitance (VDS = 25 Vd
Vdc, VGS = 0 Vd
Vdc,
Coss – 105 150
f = 1.0 MHz)
Transfer Capacitance Crss – 35 70

SWITCHING CHARACTERISTICS (Note 4.)


Turn–On Delay Time td(on) – 9.2 20 ns
Rise Time (VDD = 30 Vdc, ID = 12 Adc, tr – 104 210
Turn–Off Delay Time VGS = 5.0 Vdc, RG = 9.1 Ω) (Note 3.) td(off) – 19 40
Fall Time tf – 40.5 80
Gate Charge QT – 7.4 20 nC
(VDS = 48 Vd
Vdc, ID = 12 Adc,
Ad
Q1 – 2.0 –
VGS = 5.0 Vdc) (Note 3.)
Q2 – 4.0 –
SOURCE–DRAIN DIODE CHARACTERISTICS
Forward On–Voltage (IS = 12 Adc, VGS = 0 Vdc) (Note 3.) VSD – 0.95 1.2 Vdc
(IS = 12 Adc, VGS = 0 Vdc, TJ = 150°C) – 0.82 –
Reverse Recovery Time trr – 35 – ns
(IS = 12 Ad
Adc, VGS = 0 Vd
Vdc,
ta – 21 –
dIS/dt = 100 A/µs) (Note 3.)
tb – 14 –
Reverse Recovery Stored Charge QRR – 0.04 – µC
3. Pulse Test: Pulse Width ≤ 300 µs, Duty Cycle ≤ 2%.
4. Switching characteristics are independent of operating junction temperatures.

http://onsemi.com
38
! 

#$%& '(
!    
N–Channel DPAK
Designed for low voltage, high speed switching applications in
power supplies, converters and power motor controls and bridge
circuits. http://onsemi.com
Features 32 AMPERES
• Smaller Package than MTB36N06V
60 VOLTS
• Lower RDS(on)
• Lower VDS(on) RDS(on) = 26 mΩ
• Lower Total Gate Charge N–Channel
• Lower and Tighter VSD D
• Lower Diode Reverse Recovery Time
• Lower Reverse Recovery Stored Charge
Typical Applications G
• Power Supplies

4
Converters
S
• Power Motor Controls 4
• Bridge Circuits
1 2 1
3 2 3
MAXIMUM RATINGS (TJ = 25°C unless otherwise noted)
CASE 369A CASE 369
Rating Symbol Value Unit DPAK DPAK
Drain–to–Source Voltage VDSS 60 Vdc (Bent Lead) (Straight Lead)
Drain–to–Gate Voltage (RGS = 10 MΩ) VDGR 60 Vdc STYLE 2 STYLE 2
Gate–to–Source Voltage Vdc NTD32N06 = Device Code
– Continuous VGS "20 Y = Year
– Non–Repetitive (tpv10 ms) VGS "30 WW = Work Week
Drain Current T = MOSFET
– Continuous @ TA = 25°C ID 32 Adc
– Continuous @ TA = 100°C ID 22
MARKING DIAGRAMS
– Single Pulse (tpv10 µs) IDM 90 Apk & PIN ASSIGNMENTS
Total Power Dissipation @ TA = 25°C PD 93.75 W 4
Derate above 25°C 0.625 W/°C Drain
Total Power Dissipation @ TA = 25°C (Note 1.) 2.88 W 4
Total Power Dissipation @ TA = 25°C (Note 2.) 1.5 W Drain YWW
Operating and Storage Temperature Range TJ, Tstg –55 to °C NTD
+175 YWW 32N06
NTD
Single Pulse Drain–to–Source Avalanche EAS 313 mJ
32N06
Energy – Starting TJ = 25°C (Note 3.)
(VDD = 50 Vdc, VGS = 10 Vdc, L = 1.0 mH,
IL(pk) = 25 A, VDS = 60 Vdc, RG = 25 Ω) 1 2 3
1 3
Gate Drain Source
Gate Source
Thermal Resistance °C/W
2
– Junction–to–Case RθJC 1.6
Drain
– Junction–to–Ambient (Note 1.) RθJA 52
– Junction–to–Ambient (Note 2.) RθJA 100 ORDERING INFORMATION
Maximum Lead Temperature for Soldering TL 260 °C
Device Package Shipping
Purposes, 1/8″ from case for 10 seconds
NTD32N06 DPAK 75 Units/Rail
1. When surface mounted to an FR4 board using 1″ pad size,
(Cu Area 1.127 in2). DPAK
NTD32N06–1 75 Units/Rail
2. When surface mounted to an FR4 board using minimum recommended pad Straight Lead
size, (Cu Area 0.412 in2).
NTD32N06T4 DPAK 2500 Tape & Reel
3. Repetitive rating; pulse width limited by maximum junction temperature.

 Semiconductor Components Industries, LLC, 2001 39 Publication Order Number:


March, 2001 – Rev. 1 NTD32N06/D
NTD32N06

ELECTRICAL CHARACTERISTICS (TJ = 25°C unless otherwise noted)


Characteristic Symbol Min Typ Max Unit
OFF CHARACTERISTICS
Drain–to–Source Breakdown Voltage (Note 4.) V(BR)DSS Vdc
(VGS = 0 Vdc, ID = 250 µAdc) 60 70 –
Temperature Coefficient (Positive) – 41.6 – mV/°C
Zero Gate Voltage Drain Current IDSS µAdc
(VDS = 60 Vdc, VGS = 0 Vdc) – – 1.0
(VDS = 60 Vdc, VGS = 0 Vdc, TJ = 150°C) – – 10
Gate–Body Leakage Current (VGS = ±20 Vdc, VDS = 0 Vdc) IGSS – – ±100 nAdc
ON CHARACTERISTICS (Note 4.)
Gate Threshold Voltage (Note 4.) VGS(th) Vdc
(VDS = VGS, ID = 250 µAdc) 2.0 2.8 4.0
Threshold Temperature Coefficient (Negative) – 7.0 – mV/°C
Static Drain–to–Source On–Resistance (Note 4.) RDS(on) mOhm
(VGS = 10 Vdc, ID = 16 Adc) – 21 26

Static Drain–to–Source On–Voltage (Note 4.) VDS(on) Vdc


(VGS = 10 Vdc, ID = 20 Adc) – 0.417 0.62
(VGS = 10 Vdc, ID = 32 Adc) – 0.680 –
(VGS = 10 Vdc, ID = 16 Adc, TJ = 150°C) – 0.633 –
Forward Transconductance (Note 4.) (VDS = 6 Vdc, ID = 16 Adc) gFS – 21.1 – mhos
DYNAMIC CHARACTERISTICS
Input Capacitance Ciss – 1231 1725 pF
Output Capacitance (VDS = 25 Vd
Vdc, VGS = 0 Vd
Vdc,
Coss – 346 485
f = 1.0 MHz)
Transfer Capacitance Crss – 77 160
SWITCHING CHARACTERISTICS (Note 5.)
Turn–On Delay Time td(on) – 10 25 ns
Rise Time (VDD = 30 Vdc, ID = 32 Adc, tr – 84 180
VGS = 10 Vdc
Vdc,
Turn–Off Delay Time RG = 9.1 Ω) (Note 4.) td(off) – 31 70
Fall Time tf – 93 200
Gate Charge QT – 33 60 nC
(VDS = 48 Vd
Vdc, ID = 32 Adc,
Ad
Q1 – 6.0 –
VGS = 10 Vdc) (Note 4.)
Q2 – 15 –

SOURCE–DRAIN DIODE CHARACTERISTICS


Forward On–Voltage (IS = 20 Adc, VGS = 0 Vdc) (Note 4.) VSD – 0.89 1.0 Vdc
(IS = 32 Adc, VGS = 0 Vdc) (Note 4.) – 0.96 –
(IS = 20 Adc, VGS = 0 Vdc, TJ = 150°C) – 0.75 –
Reverse Recovery Time trr – 52 – ns
(IS = 32 Ad
Adc, VGS = 0 Vd
Vdc,
ta – 37 –
dIS/dt = 100 A/µs) (Note 4.)
tb – 14.3 –
Reverse Recovery Stored Charge QRR – 0.095 – µC
4. Pulse Test: Pulse Width ≤ 300 µs, Duty Cycle ≤ 2%.
5. Switching characteristics are independent of operating junction temperatures.

http://onsemi.com
40
NTD32N06

60 60
VGS = 10 V VDS > = 10 V
VGS = 6 V
ID, DRAIN CURRENT (AMPS)

ID, DRAIN CURRENT (AMPS)


50 50
VGS = 6.5 V
40 40
VGS = 7 V VGS = 5.5 V

30 VGS = 8 V 30
VGS = 5 V
20 20 TJ = 25°C

VGS = 4.5 V
10 10 TJ = 100°C
VGS = 4 V TJ = –55°C
0 0
0 1 2 3 4 3 3.4 3.8 4.2 4.6 5 5.4 5.8 6.2 6.6 7
VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS) VGS, GATE–TO–SOURCE VOLTAGE (VOLTS)

Figure 1. On–Region Characteristics Figure 2. Transfer Characteristics


RDS(on), DRAIN–TO–SOURCE RESISTANCE (Ω)

RDS(on), DRAIN–TO–SOURCE RESISTANCE (Ω)


0.038 0.024
VGS = 10 V
0.034
TJ = 100°C 0.023

0.03
0.022
VGS = 10 V
0.026
0.021
TJ = 25°C
0.022
0.02
0.018 VGS = 15 V
TJ = –55°C
0.014 0.019

0.01 0.018
0 10 20 30 40 50 60 0 10 20 30 40 50 60
ID, DRAIN CURRENT (AMPS) ID, DRAIN CURRENT (AMPS)
Figure 3. On–Resistance vs. Gate–to–Source Figure 4. On–Resistance vs. Drain Current and
Voltage Gate Voltage
RDS(on), DRAIN–TO–SOURCE RESISTANCE

1.8 10000
ID = 16 A VGS = 0 V
VGS = 10 V
1.6
IDSS, LEAKAGE (nA)

TJ = 150°C
1.4 1000
(NORMALIZED)

1.2 TJ = 125°C

1 100

0.8 TJ = 100°C

0.6 10
–50 –25 0 25 50 75 100 125 150 175 0 10 20 30 40 50 60
TJ, JUNCTION TEMPERATURE (°C) VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS)

Figure 5. On–Resistance Variation with Figure 6. Drain–to–Source Leakage Current


Temperature vs. Voltage

http://onsemi.com
41
NTD32N06

VGS, GATE–TO–SOURCE VOLTAGE (VOLTS)


3200 12
VDS = 0 V VGS = 0 V TJ = 25°C
2800 QT
10 VGS
Ciss
C, CAPACITANCE (pF)

2400
8
2000 Q1
Crss
Q2
1600 Ciss 6

1200
4
800 Coss
2 ID = 32 A
400 Crss TJ = 25°C
0 0
10 5 VGS 0 VDS 5 10 15 20 25 0 4 8 12 16 20 24 28 32 36
GATE–TO–SOURCE OR DRAIN–TO–SOURCE VOLTAGE Qg, TOTAL GATE CHARGE (nC)
(VOLTS)
Figure 7. Capacitance Variation Figure 8. Gate–to–Source and
Drain–to–Source Voltage vs. Total Charge
1000 32
VDS = 30 V VGS = 0 V

IS, SOURCE CURRENT (AMPS)


ID = 32 A 28 TJ = 25°C
VGS = 10 V
24
t, TIME (ns)

20

100 tr 16

tf 12

td(off) 8

4
td(on)
10 0
1 10 100 0.6 0.64 0.68 0.72 0.76 0.8 0.84 0.88 0.92 0.96
RG, GATE RESISTANCE (Ω) VSD, SOURCE–TO–DRAIN VOLTAGE (VOLTS)

Figure 9. Resistive Switching Time Variation Figure 10. Diode Forward Voltage vs. Current
vs. Gate Resistance
EAS, SINGLE PULSE DRAIN–TO–SOURCE

1000 350
VGS = 20 V RDS(on) Limit ID = 32 A
SINGLE PULSE Thermal Limit
ID, DRAIN CURRENT (AMPS)

300
AVALANCHE ENERGY (mJ)

TC = 25°C Package Limit


100
250

dc 200
10
10 ms 150
1 ms
100 µs 100
1
Mounted on 3″ sq. FR4 board (1″ sq.
2 oz. Cu 0.06″ thick single sided) 50
with one die operating,10 s max
0.1 0
0.1 1 10 100 25 50 75 100 125 150 175
VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS) TJ, STARTING JUNCTION TEMPERATURE (°C)

Figure 11. Maximum Rated Forward Biased Figure 12. Maximum Avalanche Energy vs.
Safe Operating Area Starting Junction Temperature

http://onsemi.com
42
NTD32N06

10
r(t), EFFECTIVE TRANSIENT THERMAL RESISTANCE
Normalized to RθJC at Steady State

1
(NORMALIZED)

0.1

0.01
0.00001 0.0001 0.001 0.01 0.1 1 10
t, TIME (s)

Figure 13. Thermal Response

10
Normalized to RθJA at Steady State,
r(t), EFFECTIVE TRANSIENT THERMAL RESPONSE

1″ square Cu Pad, Cu Area 1.127 in2,


3 x 3 inch FR4 board

1
(NORMALIZED)

0.1

0.01
0.00001 0.0001 0.001 0.01 0.1 1 10 100 1000
t, TIME (s)

Figure 14. Thermal Response

http://onsemi.com
43
! 

#$%& '(
!     
* %+%
N–Channel DPAK
Designed for low voltage, high speed switching applications in
power supplies, converters and power motor controls and bridge
circuits. http://onsemi.com
Features
• Smaller Package than MTB30N06VL 32 AMPERES
• Lower RDS(on) 60 VOLTS
• Lower VDS(on) RDS(on) = 28 mΩ
• Lower Total Gate Charge
• Lower and Tighter VSD N–Channel
• Lower Diode Reverse Recovery Time D
• Lower Reverse Recovery Stored Charge
Typical Applications
• Power Supplies
• Converters
G

• Power Motor Controls


• Bridge Circuits S

MARKING
MAXIMUM RATINGS (TJ = 25°C unless otherwise noted) DIAGRAM
Rating Symbol Value Unit
Drain–to–Source Voltage VDSS 60 Vdc 4 YWW
CASE 369A
Drain–to–Gate Voltage (RGS = 10 MΩ) VDGR 60 Vdc NTD
DPAK
Gate–to–Source Voltage Vdc 1 2 32N06L
STYLE 2
– Continuous VGS "15 3
– Non–Repetitive (tpv10 ms) VGS "20
Drain Current NTD32N06L = Device Code
– Continuous @ TA = 25°C ID 32 Adc Y = Year
– Continuous @ TA = 100°C ID 22 WW = Work Week
– Single Pulse (tpv10 µs) IDM 90 Apk T = MOSFET
Total Power Dissipation @ TA = 25°C PD 93.75 W
Derate above 25°C 0.625 W/°C PIN ASSIGNMENT
Total Power Dissipation @ TA = 25°C (Note 1.) 2.88 W
Total Power Dissipation @ TA = 25°C (Note 2.) 1.5 W 4
Drain
Operating and Storage Temperature Range TJ, Tstg –55 to °C
+175
Single Pulse Drain–to–Source Avalanche EAS 313 mJ
Energy – Starting TJ = 25°C (Note 3.)
(VDD = 50 Vdc, VGS = 5 Vdc, L = 1.0 mH,
IL(pk) = 25 A, VDS = 60 Vdc, RG = 25 Ω) 1 3
2
Gate Source
Thermal Resistance °C/W Drain
– Junction–to–Case RθJC 1.6
– Junction–to–Ambient (Note 1.) RθJA 52 ORDERING INFORMATION
– Junction–to–Ambient (Note 2.) RθJA 100
Device Package Shipping
Maximum Lead Temperature for Soldering TL 260 °C
Purposes, 1/8″ from case for 10 seconds NTD32N06L DPAK 75 Units/Rail
1. When surface mounted to an FR4 board using 1″ pad size,
NTD32N06L–1 DPAK 75 Units/Rail
(Cu Area 1.127 in2).
2. When surface mounted to an FR4 board using minimum recommended pad NTD32N06LT4 DPAK 2500 Tape & Reel
size, (Cu Area 0.412 in2).
3. Repetitive rating; pulse width limited by maximum junction temperature.

 Semiconductor Components Industries, LLC, 2001 44 Publication Order Number:


March, 2001 – Rev. 0 NTD32N06L/D
NTD32N06L

ELECTRICAL CHARACTERISTICS (TJ = 25°C unless otherwise noted)


Characteristic Symbol Min Typ Max Unit
OFF CHARACTERISTICS
Drain–to–Source Breakdown Voltage (Note 4.) V(BR)DSS Vdc
(VGS = 0 Vdc, ID = 250 µAdc) 60 70 –
Temperature Coefficient (Positive) – 62 – mV/°C
Zero Gate Voltage Drain Current IDSS µAdc
(VDS = 60 Vdc, VGS = 0 Vdc) – – 1.0
(VDS = 60 Vdc, VGS = 0 Vdc, TJ = 150°C) – – 10
Gate–Body Leakage Current (VGS = ±15 Vdc, VDS = 0 Vdc) IGSS – – ±100 nAdc
ON CHARACTERISTICS (Note 4.)
Gate Threshold Voltage (Note 4.) VGS(th) Vdc
(VDS = VGS, ID = 250 µAdc) 1.0 1.7 2.0
Threshold Temperature Coefficient (Negative) – 4.8 – mV/°C
Static Drain–to–Source On–Resistance (Note 4.) RDS(on) mOhm
(VGS = 5 Vdc, ID = 16 Adc) – 23.7 28

Static Drain–to–Source On–Resistance (Note 4.) VDS(on) Vdc


(VGS = 5 Vdc, ID = 20 Adc) – 0.48 0.67
(VGS = 5 Vdc, ID = 32 Adc) – 0.78 –
(VGS = 5 Vdc, ID = 16 Adc, TJ = 150°C) – 0.61 –
Forward Transconductance (Note 4.) (VDS = 6 Vdc, ID = 16 Adc) gFS – 27 – mhos
DYNAMIC CHARACTERISTICS
Input Capacitance Ciss – 1214 1700 pF
Output Capacitance (VDS = 25 Vd
Vdc, VGS = 0 Vd
Vdc,
Coss – 343 480
f = 1.0 MHz)
Transfer Capacitance Crss – 87 180
SWITCHING CHARACTERISTICS (Note 5.)
Turn–On Delay Time td(on) – 12.8 30 ns
Rise Time (VDD = 30 Vdc, ID = 32 Adc, tr – 221 450
VGS = 5 Vdc,
Vdc
Turn–Off Delay Time RG = 9.1 Ω) (Note 4.) td(off) – 37 80
Fall Time tf – 128 260
Gate Charge QT – 23 50 nC
(VDS = 48 Vd
Vdc, ID = 32 Adc,
Ad
Q1 – 4.5 –
VGS = 5 Vdc) (Note 4.)
Q2 – 14 –

SOURCE–DRAIN DIODE CHARACTERISTICS


Forward On–Voltage (IS = 20 Adc, VGS = 0 Vdc) (Note 4.) VSD – 0.89 1.0 Vdc
(IS = 32 Adc, VGS = 0 Vdc) (Note 4.) – 0.95 –
(IS = 20 Adc, VGS = 0 Vdc, TJ = 150°C) – 0.74 –
Reverse Recovery Time trr – 56 – ns
(IS = 32 Ad
Adc, VGS = 0 Vd
Vdc,
ta – 31 –
dIS/dt = 100 A/µs) (Note 4.)
tb – 25 –
Reverse Recovery Stored Charge QRR – 0.093 – µC
4. Pulse Test: Pulse Width ≤ 300 µs, Duty Cycle ≤ 2%.
5. Switching characteristics are independent of operating junction temperatures.

http://onsemi.com
45
NTD32N06L

60 60
VGS = 10 V VDS > = 10 V
VGS = 4.5 V
ID, DRAIN CURRENT (AMPS)

ID, DRAIN CURRENT (AMPS)


50 50
VGS = 5 V

40 VGS = 4 V 40

30 VGS = 6 V 30

VGS = 3.5 V
20 20
VGS = 8 V TJ = 25°C
10 VGS = 3 V 10
TJ = 100°C TJ = –55°C
0 0
0 1 2 3 4 1.8 2.2 2.6 3 3.4 3.8 4.2 4.6 5
VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS) VGS, GATE–TO–SOURCE VOLTAGE (VOLTS)

Figure 1. On–Region Characteristics Figure 2. Transfer Characteristics

RDS(on), DRAIN–TO–SOURCE RESISTANCE (Ω)


RDS(on), DRAIN–TO–SOURCE RESISTANCE (Ω)

0.042 0.042
VGS = 5 V VGS = 10 V
0.038 0.038

0.034 TJ = 100°C 0.034

0.03 0.03
TJ = 25°C
0.026 0.026 TJ = 100°C

0.022 0.022 TJ = 25°C


TJ = –55°C
0.018 0.018
TJ = –55°C
0.014 0.014

0.01 0.01
0 10 20 30 40 50 60 0 10 20 30 40 50 60
ID, DRAIN CURRENT (AMPS) ID, DRAIN CURRENT (AMPS)
Figure 3. On–Resistance vs. Gate–to–Source Figure 4. On–Resistance vs. Drain Current and
Voltage Gate Voltage
RDS(on), DRAIN–TO–SOURCE RESISTANCE

1.8 10000
ID = 16 A VGS = 0 V
VGS = 5 V TJ = 150°C
1.6
IDSS, LEAKAGE (nA)

1000
(NORMALIZED)

1.4
TJ = 125°C
1.2

1 100
TJ = 100°C
0.8

0.6 10
–50 –25 0 25 50 75 100 125 150 175 0 10 20 30 40 50 60
TJ, JUNCTION TEMPERATURE (°C) VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS)

Figure 5. On–Resistance Variation with Figure 6. Drain–to–Source Leakage Current


Temperature vs. Voltage

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46
NTD32N06L

VGS, GATE–TO–SOURCE VOLTAGE (VOLTS)


4000 6
VDS = 0 V VGS = 0 V TJ = 25°C
3600 QT
5
3200 VGS
C, CAPACITANCE (pF)

Ciss
2800 Q1 Q2
4
2400 Crss
2000 3
1600 Ciss
2
1200
800 Coss
1 ID = 32 A
400 Crss TJ = 25°C
0 0
10 5 VGS 0 VDS 5 10 15 20 25 0 4 8 12 16 20 24
GATE–TO–SOURCE OR DRAIN–TO–SOURCE VOLTAGE Qg, TOTAL GATE CHARGE (nC)
(VOLTS)
Figure 7. Capacitance Variation Figure 8. Gate–to–Source and
Drain–to–Source Voltage vs. Total Charge
1000 32
VDS = 30 V VGS = 0 V

IS, SOURCE CURRENT (AMPS)


ID = 32 A 28 TJ = 25°C
VGS = 5 V
24
tr
t, TIME (ns)

20
tf
100 16

12
td(off)
8

4
td(on)
10 0
1 10 100 0.6 0.64 0.68 0.72 0.76 0.8 0.84 0.88 0.92 0.96
RG, GATE RESISTANCE (Ω) VSD, SOURCE–TO–DRAIN VOLTAGE (VOLTS)

Figure 9. Resistive Switching Time Variation Figure 10. Diode Forward Voltage vs. Current
vs. Gate Resistance
EAS, SINGLE PULSE DRAIN–TO–SOURCE

1000 350
VGS = 20 V RDS(on) Limit ID = 32 A
SINGLE PULSE Thermal Limit
ID, DRAIN CURRENT (AMPS)

300
AVALANCHE ENERGY (mJ)

TC = 25°C Package Limit


100
250

dc 200
10 10 ms
1 ms 150
100 µs
100
1
Mounted on 3″ sq. FR4 board (1″ sq. 50
2 oz. Cu 0.06″ thick single sided)
with one die operating,10 s max
0.1 0
0.1 1 10 100 25 50 75 100 125 150 175
VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS) TJ, STARTING JUNCTION TEMPERATURE (°C)

Figure 11. Maximum Rated Forward Biased Figure 12. Maximum Avalanche Energy vs.
Safe Operating Area Starting Junction Temperature

http://onsemi.com
47
NTD32N06L

10
r(t), EFFECTIVE TRANSIENT THERMAL RESISTANCE
Normalized to RθJC at Steady State

1
(NORMALIZED)

0.1

0.01
0.00001 0.0001 0.001 0.01 0.1 1 10
t, TIME (s)

Figure 13. Thermal Response

10
Normalized to RθJA at Steady State,
r(t), EFFECTIVE TRANSIENT THERMAL RESPONSE

1″ square Cu Pad, Cu Area 1.127 in2,


3 x 3 inch FR4 board

1
(NORMALIZED)

0.1

0.01
0.00001 0.0001 0.001 0.01 0.1 1 10 100 1000
t, TIME (s)

Figure 14. Thermal Response

http://onsemi.com
48
!

#$%& '(
,-  !  
N–Channel DPAK
Features
• Ultra Low RDS(on) http://onsemi.com
• Higher Efficiency Extending Battery Life
• Logic Level Gate Drive 18.5 AMPERES
• Diode Exhibits High Speed, Soft Recovery 30 VOLTS
• Avalanche Energy Specified 10 mΩ @ VGS = 10 V
• IDSS Specified at Elevated Temperature N–Channel
• SO–8 Mounting Information Provided D

Applications
• DC–DC Converters G
• Low Voltage Motor Control
• Power Management in Portable and Battery Powered Products: S
4
4
i.e., Computers, Printers, Cellular and Cordless Telephones, and
PCMCIA Cards
1 2
3 12
CASE 369A 3
DPAK CASE 369
(Bend Lead) DPAK
STYLE 2 (Straight Lead)
STYLE 2
MARKING DIAGRAMS
& PIN ASSIGNMENTS
4
Drain
4
Drain
YWW
T
YWW 4302
T
4302

1 2 3
1 3
Gate Drain Source
Gate 2 Source
Drain
4302 = Device Code
Y = Year
WW = Work Week
T = MOSFET
ORDERING INFORMATION

Device Package Shipping

NTD4302 DPAK 75 Units/Rail

DPAK
NTD4302–1 75 Units/Rail
Straight Lead

NTD4302T4 DPAK 2500 Tape & Reel

 Semiconductor Components Industries, LLC, 2001 49 Publication Order Number:


March, 2001 – Rev. 1 NTD4302/D
NTD4302

MAXIMUM RATINGS (TC = 25°C unless otherwise noted)


Rating Symbol Value Unit
Drain–to–Source Voltage VDSS 30 Vdc
Gate–to–Source Voltage – Continuous VGS ±20 Vdc
Thermal Resistance
– Junction–to–Ambient (Note 1.) RθJA 1.3 °C/W
Total Power Dissipation @ TA = 25°C PD 96 Watts
Continuous Drain Current @ TA = 25°C ID 30 Amps
Pulsed Drain Current (Note 5.) IDM 90 Amps
Thermal Resistance
– Junction–to–Ambient (Note 2.) RθJA 25 °C/W
Total Power Dissipation @ TA = 25°C PD 5.0 Watts
Continuous Drain Current @ TA = 25°C ID 18.5 Amps
Continuous Drain Current @ TA = 100°C ID 11.5 Amps
Pulsed Drain Current (Note 5.) IDM 60 Amps
Thermal Resistance
– Junction–to–Ambient (Note 3.) RθJA 67 °C/W
Total Power Dissipation @ TA = 25°C PD 1.87 Watts
Continuous Drain Current @ TA = 25°C ID 11.3 Amps
Continuous Drain Current @ TA = 100°C ID 7.1 Amps
Pulsed Drain Current (Note 5.) IDM 36 Amps
Thermal Resistance
– Junction–to–Ambient (Note 4.) RθJA 120 °C/W
Total Power Dissipation @ TA = 25°C PD 1.04 Watts
Continuous Drain Current @ TA = 25°C ID 8.4 Amps
Continuous Drain Current @ TA = 100°C ID 5.3 Amps
Pulsed Drain Current (Note 5.) IDM 28 Amps
Operating and Storage Temperature Range TJ, Tstg –55 to 150 °C
Single Pulse Drain–to–Source Avalanche Energy – Starting TJ = 25°C EAS 722 mJ
(VDD = 30 Vdc, VGS = 10 Vdc, Peak IL = 17 Apk, L = 5.0 mH, RG = 25 Ω)
Maximum Lead Temperature for Soldering Purposes, 1/8″ from case for 10 seconds TL 260 °C
1. Mounted on Heat Sink, Steady State.
2. Mounted on 2″ square FR–4 Board (1″ sq. 2 oz. Cu 0.06″ thick single sided), Time ≤ 10 seconds.
3. Mounted on 2″ square FR–4 Board (1″ sq. 2 oz. Cu 0.06″ thick single sided), Steady State.
4. Minimum FR–4 or G–10 PCB, Steady State.
5. Pulse Test: Pulse Width = 300 µs, Duty Cycle = 2%.

http://onsemi.com
50
NTD4302

ELECTRICAL CHARACTERISTICS (TJ = 25°C unless otherwise noted)


Characteristic Symbol Min Typ Max Unit
OFF CHARACTERISTICS
Drain–Source Breakdown Voltage V(BR)DSS Vdc
(VGS = 0 Vdc, ID = 250 µA) 30 – –
Positive Temperature Coefficient – 25 – mV/°C
Zero Gate Voltage Drain Current IDSS µAdc
(VGS = 0 Vdc, VDS = 30 Vdc, TJ = 25°C) – – 1.0
(VGS = 0 Vdc, VDS = 30 Vdc, TJ = 125°C) – – 10
Gate–Body Leakage Current (VGS = ±20 Vdc, VDS = 0 Vdc) IGSS – – ±100 nAdc
ON CHARACTERISTICS
Gate Threshold Voltage VGS(th) Vdc
(VDS = VGS, ID = 250 µAdc) 1.0 1.9 3.0
Negative Temperature Coefficient – –3.8 –
Static Drain–Source On–State Resistance RDS(on) Ω
(VGS = 10 Vdc, ID = 18.5 Adc) – 0.0078 0.010
(VGS = 10 Vdc, ID = 10 Adc) – 0.0078 0.010
(VGS = 4.5 Vdc, ID = 5.0 Adc) – 0.010 0.013
Forward Transconductance (VDS = 15 Vdc, ID = 10 Adc) gFS – 20 – Mhos
DYNAMIC CHARACTERISTICS
Input Capacitance Ciss – 2050 2400 pF
Output Capacitance (VDS = 24 Vd
Vdc, VGS = 0 Vd
Vdc,
Coss – 640 800
f = 1.0
1 0 MHz)
Reverse Transfer Capacitance Crss – 225 310
SWITCHING CHARACTERISTICS (Note 7.)
Turn–On Delay Time td(on) – 11 20 ns
Rise Time (VDD = 25 Vdc, ID = 1.0 Adc, tr – 15 25
VGS = 10 Vdc,
Vdc
Turn–Off Delay Time RG = 6.0 Ω) td(off) – 85 130
Fall Time tf – 55 90
Turn–On Delay Time td(on) – 11 20 ns
Rise Time (VDD = 25 Vdc, ID = 1.0 Adc, tr – 13 20
VGS = 10 Vdc,
Vdc
Turn–Off Delay Time RG = 2.5 Ω) td(off) – 55 90
Fall Time tf – 40 75
Turn–On Delay Time td(on) – 15 – ns
Rise Time (VDD = 24 Vdc, ID = 18.5 Adc, tr – 25 –
VGS = 10 Vdc,
Vdc
Turn–Off Delay Time RG = 2.5 Ω) td(off) – 40 –
Fall Time tf – 58 –
Gate Charge
g QT – 55 80 nC
(VDS = 24 Vd
Vdc, ID = 2.0
2 0 Ad
Adc,
Qgs (Q1) – 5.5 –
VGS = 10 Vdc)
Qgd (Q2) – 15 –
BODY–DRAIN DIODE RATINGS (Note 6.)
Diode Forward On–Voltage VSD Vdc
(IS = 2.3 Adc, VGS = 0 Vdc) – 0.75 1.0
(IS = 18.5 Adc, VGS = 0 Vdc) – 0.88 –
(IS = 2.3 Adc, VGS = 0 Vdc, TJ = 125°C) – 0.65 –
Reverse Recovery y Time trr – 39 65 ns
(IS = 2.3
2 3 Adc,
Ad VGS = 0 Vdc,
Vd
ta – 20 –
dIS/dt = 100 A/µs)
tb – 19 –
Reverse Recovery Stored Charge Qrr – 0.043 – µC
6. Indicates Pulse Test: Pulse Width = 300 µsec max, Duty Cycle ≤ 2%.
7. Switching characteristics are independent of operating junction temperature.

http://onsemi.com
51
NTD4302

50 60
VGS = 4 V TJ = 25°C
VDS > = 10 V
ID, DRAIN CURRENT (AMPS)

ID, DRAIN CURRENT (AMPS)


VGS = 3.8 V 50
40
VGS = 4.4 V
VGS = 4.6 V 40
30
VGS = 5 V
30 TJ = 25°C
VGS = 7 V VGS = 3.4 V
20
20 TJ = 100°C
VGS = 10 V VGS = 3.2 V
10 TJ = –55°C
VGS = 2.8 V VGS = 3.0 V 10

0 0
0 0.5 1 1.5 2 2.5 3 2 3 4 5 6
VDS, DRAIN–TO–SOURCE VOLTAGE (V) VGS, GATE–TO–SOURCE VOLTAGE (V)

Figure 1. On–Region Characteristics Figure 2. Transfer Characteristics


RDS(on), DRAIN–TO–SOURCE RESISTANCE (Ω)

RDS(on), DRAIN–TO–SOURCE RESISTANCE (Ω)


0.1 0.015
ID = 10 A TJ = 25°C
TJ = 25°C

0.075 VGS = 4.5 V


0.01

0.05
VGS = 10 V
0.005
0.025

0 0
0 2 4 6 8 10 0.00E+00 1.00E+01 2.00E+01 3.00E+01 4.00E+01 5.00E+01 6.00E+01

VGS, GATE–TO–SOURCE VOLTAGE (V) ID, DRAIN CURRENT (AMPS)

Figure 3. On–Resistance vs. Figure 4. On–Resistance vs. Drain Current


Gate–To–Source Voltage and Gate Voltage
RDS(on), DRAIN–TO–SOURCE RESISTANCE

1.6 10000
ID = 18.5 A VGS = 0 V
VGS = 10 V
TJ = 150°C
1.4
1000
IDSS, LEAKAGE (nA)
(NORMALIZED)

1.2
100
TJ = 100°C
1

10
0.8

0.6 1
–50 –25 0 25 50 75 100 125 150 5 10 15 20 25 30
TJ, JUNCTION TEMPERATURE (°C) VDS, DRAIN–TO–SOURCE VOLTAGE (V)

Figure 5. On–Resistance Variation with Figure 6. Drain–To–Source Leakage


Temperature Current vs. Voltage

http://onsemi.com
52
NTD4302

VDS, DRAIN–TO–SOURCE– VOLTAGE (V)


VGS, GATE–TO–SOURCE– VOLTAGE (V)
60 12.5 30
VDS = 0 V VGS = 0 V TJ = 25°C
50 QT
10 25
C, CAPACITANCE (pF)

Ciss VD
40
7.5 20
30 VGS
Crss Ciss
5 15
20 Q1 Q2

Coss 2.5 10
10 Crss
ID = 2 A
TJ = 25°C
0 0 0
10 VGS 0 VDS 10 20 30 0 10 20 30 40 50 60
GATE–TO–SOURCE OR DRAIN–TO–SOURCE VOLTAGE (V) Qg, TOTAL GATE CHARGE (nC)

Figure 7. Capacitance Variation Figure 8. Gate–to–Source and


Drain–to–Source Voltage vs. Total Charge

1000 25
VGS = 0 V
VDD = 24 V
IS, SOURCE CURRENT (AMPS)
TJ = 25°C
ID = 18.5 A
VGS = 10 V 20
t, TIME (ns)

15
100
tf
10
td(off)
tr
5

td(on)
10 0
1 10 100 0.5 0.6 0.7 0.8 0.9 1
RG, GATE RESISTANCE (Ω) VSD, SOURCE–TO–DRAIN VOLTAGE (V)

Figure 9. Resistive Switching Time Variation Figure 10. Diode Forward Voltage vs. Current
vs. Gate Resistance

http://onsemi.com
53
NTD4302



 m!
 


  

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'((
   
 " #$° ') '+
 !  
 '* #$ 

   

    
      

   
 

   

Figure 11. Maximum Rated Forward Biased Figure 12. Diode Reverse Recovery Waveform
Safe Operating Area


    
  .

- -

'23)' .. 


  

  " $



 
  

#
 
$
#
 

θ, ' " ('
θ,
*0
 
 - .
/

'  
/

     '
'#
   - -  " '&'# ,*0   " *0
θ, '

$ 6 4 #  5 5 5# 54
'   !1!

Figure 13. Thermal Response – Various Duty Cycles

http://onsemi.com
54
NTD4302

INFORMATION FOR USING THE DPAK SURFACE MOUNT PACKAGE

RECOMMENDED FOOTPRINT FOR SURFACE MOUNTED APPLICATIONS


Surface mount board layout is a critical portion of the interface between the board and the package. With the
total design. The footprint for the semiconductor packages correct pad geometry, the packages will self align when
must be the correct size to ensure proper solder connection subjected to a solder reflow process.

9$ 8
67 4

#$6
94
9
7 #64
68#9 9:#

inches
mm

SOLDER STENCIL GUIDELINES


Prior to placing surface mount components onto a printed pattern of the opening in the stencil for the drain pad is not
circuit board, solder paste must be applied to the pads. critical as long as it allows approximately 50% of the pad to
Solder stencils are used to screen the optimum amount. be covered with paste.
These stencils are typically 0.008 inches thick and may be

ÇÇ ÇÇÇ
ÇÇÇÇÇÇ
ÇÇÇ ÇÇ
made of brass or stainless steel. For packages such as the
SC–59, SC–70/SOT–323, SOD–123, SOT–23, SOT–143,
SOT–223, SO–8, SO–14, SO–16, and SMB/SMC diode
ÇÇ ÇÇ 
 

ÇÇ ÇÇÇÇÇÇ
packages, the stencil opening should be the same as the pad  

ÇÇ ÇÇÇÇÇÇ
size or a 1:1 registration. This is not the case with the DPAK
and D2PAK packages. If one uses a 1:1 opening to screen

ÇÇ ÇÇÇ
  
solder onto the drain pad, misalignment and/or
“tombstoning” may occur due to an excess of solder. For
these two packages, the opening in the stencil for the paste
Figure 14. Typical Stencil for DPAK and
should be approximately 50% of the tab area. The opening D2PAK Packages
for the leads is still a 1:1 registration. Figure 14 shows a
typical stencil for the DPAK and D2PAK packages. The

SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • When shifting from preheating to soldering, the
temperature of the device. When the entire device is heated maximum temperature gradient shall be 5°C or less.
to a high temperature, failure to complete soldering within • After soldering has been completed, the device should
a short time could result in device failure. Therefore, the be allowed to cool naturally for at least three minutes.
following items should always be observed in order to Gradual cooling should be used as the use of forced
minimize the thermal stress to which the devices are cooling will increase the temperature gradient and
subjected. result in latent failure due to mechanical stress.
• Always preheat the device. • Mechanical stress or shock should not be applied
• The delta temperature between the preheat and during cooling.
soldering should be 100°C or less.*
• When preheating and soldering, the temperature of the * Soldering a device without preheating can cause
leads and the case must not exceed the maximum excessive thermal shock and stress which can result in
temperature ratings as shown on the data sheet. When damage to the device.
using infrared heating with the reflow soldering
method, the difference shall be a maximum of 10°C. * Due to shadowing and the inability to set the wave height
• The soldering temperature and time shall not exceed to incorporate other surface mount components, the D2PAK
260°C for more than 10 seconds. is not recommended for wave soldering.

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55
NTD4302

TYPICAL SOLDER HEATING PROFILE


For any given circuit board, there will be a group of temperature versus time. The line on the graph shows the
control settings that will give the desired heat pattern. The actual temperature that might be experienced on the surface
operator must set temperatures for several heating zones of a test board at or near a central solder joint. The two
and a figure for belt speed. Taken together, these control profiles are based on a high density and a low density
settings make up a heating “profile” for that particular board. The Vitronics SMD310 convection/infrared reflow
circuit board. On machines controlled by a computer, the soldering system was used to generate this profile. The type
computer remembers these profiles from one operating of solder used was 62/36/2 Tin Lead Silver with a melting
session to the next. Figure 15 shows a typical heating point between 177–189°C. When this type of furnace is
profile for use when soldering a surface mount device to a used for solder reflow work, the circuit boards and solder
printed circuit board. This profile will vary among joints tend to heat first. The components on the board are
soldering systems, but it is a good starting point. Factors then heated by conduction. The circuit board, because it has
that can affect the profile include the type of soldering a large surface area, absorbs the thermal energy more
system in use, density and types of components on the efficiently, then distributes this energy to the components.
board, type of solder used, and the type of board or Because of this effect, the main body of a component may
substrate material being used. This profile shows be up to 30 degrees cooler than the adjacent solder joints.

STEP 1 STEP 2 STEP 3 STEP 4 STEP 5 STEP 6 STEP 7


PREHEAT VENT HEATING HEATING HEATING VENT COOLING
ZONE 1 “SOAK” ZONES 2 & 5 ZONES 3 & 6 ZONES 4 & 7
“RAMP” “RAMP” “SOAK” “SPIKE” 205° TO 219°C
PEAK AT
200°C DESIRED CURVE FOR HIGH 170°C SOLDER
MASS ASSEMBLIES JOINT
160°C
150°C

150°C
SOLDER IS LIQUID FOR
40 TO 80 SECONDS
100°C 140°C (DEPENDING ON
MASS OF ASSEMBLY)
100°C

DESIRED CURVE FOR LOW


MASS ASSEMBLIES
5°C

TIME (3 TO 7 MINUTES TOTAL) TMAX


Figure 15. Typical Solder Heating Profile

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56
!!!

 

'(
!-!    
P–Channel TSOP–6
Features http://onsemi.com
• Ultra Low RDS(on)
• Higher Efficiency Extending Battery Life –3.3 AMPERES
• Miniature TSOP–6 Surface Mount Package
–12 VOLTS
Applications
75 m @ VGS = –4.5 V
• Power Management in Portable and Battery–Powered Products, i.e.:
Cellular and Cordless Telephones, and PCMCIA Cards
P–Channel

MAXIMUM RATINGS (TJ = 25°C unless otherwise noted.) 1 2 5 6


DRAIN
Rating Symbol Value Unit
Drain–to–Source Voltage VDSS –12 Volts
Gate–to–Source Voltage – Continuous VGS "8.0 Volts
3
Thermal Resistance GATE
Junction–to–Ambient (Note 1.) RθJA 62.5 °C/W
Total Power Dissipation @ TA = 25°C Pd 2.0 Watts
Drain Current –3.3 Amps 4
– Continuous @ TA = 25°C ID SOURCE
– Pulsed Drain Current (Tp t 10 µS) IDM –20 Amps
Maximum Operating Power Dissipation Pd 1.0 Watts
Maximum Operating Drain Current ID –2.35 Amps
MARKING
DIAGRAM
Thermal Resistance
Junction–to–Ambient (Note 2.) RθJA 128 °C/W
3
Total Power Dissipation @ TA = 25°C Pd 1.0 Watts 2
1 TSOP–6 433
Drain Current
– Continuous @ TA = 25°C ID –2.35 Amps CASE 318G x
– Pulsed Drain Current (Tp t 10 µS) IDM –14 Amps 4 STYLE 1
Maximum Operating Power Dissipation Pd 0.5 Watts 5
6
Maximum Operating Drain Current ID –1.65 Amps
Operating and Storage Temperature Range TJ, Tstg –55 to °C 433 = Device Code
150 x = Date Code
Maximum Lead Temperature for Soldering TL 260 °C
Purposes for 10 Seconds
PIN ASSIGNMENT
1. Mounted onto a 2″ square FR–4 board (1″ sq. 2 oz. cu. 0.06″ thick single
sided), t t 5.0 seconds. Drain Drain ;(1
2. Mounted onto a 2″ square FR–4 board (1″ sq. 2 oz. cu. 0.06″ thick single 6 5 4
sided), operating to steady state.

1 2 3
Drain Drain Gate

ORDERING INFORMATION

Device Package Shipping

NTGS3433T1 TSOP–6 3000 Tape & Reel


This document contains information on a product under development. ON Semiconductor
reserves the right to change or discontinue this product without notice.

 Semiconductor Components Industries, LLC, 2000 57 Publication Order Number:


December, 2000 – Rev. 0 NTGS3433T1/D
NTGS3433T1

ELECTRICAL CHARACTERISTICS (TA = 25°C unless otherwise noted) (Notes 3. & 4.)
Characteristic Symbol Min Typ Max Unit
OFF CHARACTERISTICS
Drain–Source Breakdown Voltage V(BR)DSS Vdc
(VGS = 0 Vdc, ID = –10 µA) –12 – –

Zero Gate Voltage Drain Current IDSS µAdc


(VGS = 0 Vdc, VDS = –8 Vdc, TJ = 25°C) – – –1.0
(VGS = 0 Vdc, VDS = –8 Vdc, TJ = 70°C) – – –5.0
Gate–Body Leakage Current IGSS nAdc
(VGS = –8.0 Vdc, VDS = 0 Vdc) – – –100

Gate–Body Leakage Current IGSS nAdc


(VGS = +8.0 Vdc, VDS = 0 Vdc) – – 100

ON CHARACTERISTICS
Gate Threshold Voltage VGS(th) Vdc
(VDS = VGS, ID = –250 µAdc) –0.50 –0.70 –1.50

Static Drain–Source On–State Resistance RDS(on) W


(VGS = –4.5 Vdc, ID = –3.3 Adc) – 0.055 0.075
(VGS = –2.5 Vdc, ID = –2.9 Adc) – 0.075 0.095
Forward Transconductance gFS mhos
(VDS = –10 Vdc, ID = –3.3 Adc) – 7.0 –

DYNAMIC CHARACTERISTICS
Total Gate Charge Qtot – 7.0 15 nC
(VDS = –10
10 Vdc,
Vd VGS = –4.54 5 Vdc,
Vd
Gate–Source Charge Qgs – 2.0 –
ID = –3.3 Adc)
Gate–Drain Charge Qgd – 3.5 –
Input Capacitance Ciss – 550 – pF
(VDS = –5.0
5 0 Vdc,
Vd VGS = 0 Vdc,
Vd
Output Capacitance Coss – 450 –
f = 1.0 MHz)
Reverse Transfer Capacitance Crss – 200 –
SWITCHING CHARACTERISTICS
Turn–On Delay Time td(on) – 20 30 ns
Rise Time (VDD = –10
10 Vdc, ID = –1.0
1.0 Adc, tr – 20 30
Turn–Off Delay Time VGS = –4.5 Vdc, Rg = 6.0 W) td(off) – 110 120
Fall Time tf – 100 115
Reverse Recovery Time (IS = –1.7 Adc, dlS/dt = 100 A/µs) trr – 30 – ns
BODY–DRAIN DIODE RATINGS
Diode Forward On–Voltage (IS = –1.7 Adc, VGS = 0 Vdc) VSD – –0.80 –1.5 Vdc
Diode Forward On–Voltage (IS = –3.3 Adc, VGS = 0 Vdc) VSD – –0.90 – Vdc
3. Indicates Pulse Test: P.W. = 300 µsec max, Duty Cycle = 2%.
4. Class 1 ESD rated – Handling precautions to protect against electrostatic discharge is mandatory.

http://onsemi.com
58
NTGS3433T1

12 20
VGS = –5 V VGS = –2.5 V VDS ≥ –10 V
18
–ID, DRAIN CURRENT (AMPS)

–ID, DRAIN CURRENT (AMPS)


10 VGS = –3 V 16 TJ = –55°C
VGS = –3.5 V
14 TJ = 25°C
8 VGS = –4 V
VGS = –4.5 V 12
6 10
VGS = –2 V TJ = 125°C
8
4
6
TJ = 25°C
4
2
VGS = –1.5 V 2
0 0
0 0.25 0.5 0.75 1 1.25 1.5 1.75 0.5 1 1.5 2 2.5 3 3.5 4
–VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS) –VGS, GATE–TO–SOURCE VOLTAGE (VOLTS)
Figure 1. On–Region Characteristics Figure 2. Transfer Characteristics
RDS(on), DRAIN–TO–SOURCE RESISTANCE (Ω)

RDS(on), DRAIN–TO–SOURCE RESISTANCE (Ω)


0.4 0.3
ID = –3.3 A TJ = 25°C
0.35
TJ = 25°C 0.25
0.3
0.2
0.25

0.2 0.15 VGS = –2.5 V

0.15
0.1
0.1 VGS = –4.5 V
0.05
0.05

0 0
0 2 4 6 8 0 2 4 6 8 10 12 14 16 18 20
–VGS, GATE–TO–SOURCE VOLTAGE (VOLTS) –ID, DRAIN CURRENT (AMPS)

Figure 3. On–Resistance vs. Gate–to–Source Figure 4. On–Resistance vs. Drain Current and
Voltage Gate Voltage
RDS(on), DRAIN–TO–SOURCE RESISTANCE (NORMALIZED)

1.6 1200
ID = –3.3 A VGS = 0 V
VGS = –4.5 V 1000 TJ = 25°C
1.4
C, CAPACITANCE (pF)

800
1.2
600 Ciss

1
400 Coss

0.8 200 Crss

0.6 0
–50 –25 0 25 50 75 100 125 150 0 2.5 5 7.5 10 12.5 15 17.5 20
TJ, JUNCTION TEMPERATURE (°C) –VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS)

Figure 5. On–Resistance Variation with Figure 6. Capacitance Variation


Temperature

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59
NTGS3433T1

6 10
–VGS, GATE–TO–SOURCE VOLTAGE

–IS, SOURCE CURRENT (AMPS)


9 VGS = 0 V
5
QT 8

4 7
6 TJ = 150°C
(VOLTS)

3 5
Qgs
Qgd 4
2
3 TJ = 25°C
TJ = 25°C 2
1
ID = –3.3 A
1
0 0
0 2 4 6 8 10 0 0.2 0.4 0.6 0.8 1 1.2
Qg, TOTAL GATE CHARGE (nC) –VSD, SOURCE–TO–DRAIN VOLTAGE (VOLTS)

Figure 7. Gate–to–Source and Figure 8. Diode Forward Voltage vs. Current


Drain–to–Source Voltage vs. Total Charge

1
NORMALIZED EFFECTIVE TRANSIENT

Duty Cycle = 0.5


THERMAL IMPEDANCE

0.2

0.1
0.1
0.05

0.02

0.01 Single Pulse


0.1
1E–04 1E–03 1E–02 1E–01 1E+00 1E+01 1E+02 1E+03
SQUARE WAVE PULSE DURATION (sec)
Figure 9. Normalized Thermal Transient Impedance, Junction–to–Ambient

20

16
POWER (W)

12

0
0.01 0.10 1.00 10.00 100.00
TIME (sec)

Figure 10. Single Pulse Power

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60
!

#$%& '(
    
P–Channel TSOP–6
Features
• Ultra Low RDS(on)
• Higher Efficiency Extending Battery Life http://onsemi.com
• Miniature TSOP–6 Surface Mount Package
1 AMPERE
Applications
• Power Management in Portable and Battery–Powered Products, i.e.: 20 VOLTS
Cellular and Cordless Telephones, and PCMCIA Cards RDS(on) = 90 m
MAXIMUM RATINGS (TJ = 25°C unless otherwise noted) P–Channel
Rating Symbol Value Unit
 # $ 9
Drain–to–Source Voltage VDSS –20 Volts
Gate–to–Source Voltage – Continuous VGS "8.0 Volts
Thermal Resistance
Junction–to–Ambient (Note 1.) RθJA 244 °C/W 4
Total Power Dissipation @ TA = 25°C Pd 0.5 Watts
Drain Current – Continuous @ TA = 25°C ID –1.65 Amps
– Pulsed Drain Current (Tp t 10 µS) IDM –10 Amps
Thermal Resistance 6
Junction–to–Ambient (Note 2.) RθJA 128 °C/W
Total Power Dissipation @ TA = 25°C Pd 1.0 Watts
Drain Current – Continuous @ TA = 25°C ID –2.35 Amps MARKING
– Pulsed Drain Current (Tp t 10 µS) IDM –14 Amps
DIAGRAM
Thermal Resistance
Junction–to–Ambient (Note 3.) RθJA 62.5 °C/W 3
Total Power Dissipation @ TA = 25°C Pd 2.0 Watts 2
1 TSOP–6 441
Drain Current – Continuous @ TA = 25°C ID –3.3 Amps
CASE 318G W
– Pulsed Drain Current (Tp t 10 µS) IDM –20 Amps
4 STYLE 1
Operating and Storage Temperature Range TJ, Tstg –55 to °C 5
150 6

Maximum Lead Temperature for Soldering TL 260 °C


Purposes for 10 Seconds 441 = Device Code
W = Work Week
1. Minimum FR–4 or G–10PCB, operating to steady state.
2. Mounted onto a 2″ square FR–4 board (1″ sq. 2 oz. cu. 0.06″ thick single
sided), operating to steady state. PIN ASSIGNMENT
3. Mounted onto a 2″ square FR–4 board (1″ sq. 2 oz. cu. 0.06″ thick single
sided), t t 5.0 seconds. ()% ()% ;(1
6 5 4

1 2 3
()% ()% )'1

ORDERING INFORMATION

Device Package Shipping

NTGS3441T1 TSOP–6 3000 Tape & Reel

 Semiconductor Components Industries, LLC, 2000 61 Publication Order Number:


November, 2000 – Rev. 1 NTGS3441T1/D
NTGS3441T1

ELECTRICAL CHARACTERISTICS (TA = 25°C unless otherwise noted) (Notes 4. & 5.)
Characteristic Symbol Min Typ Max Unit
OFF CHARACTERISTICS
Drain–Source Breakdown Voltage V(BR)DSS Vdc
(VGS = 0 Vdc, ID = –10 µA) –20 – –

Zero Gate Voltage Drain Current IDSS µAdc


(VGS = 0 Vdc, VDS = –20 Vdc, TJ = 25°C) – – –1.0
(VGS = 0 Vdc, VDS = –20 Vdc, TJ = 70°C) – – –5.0
Gate–Body Leakage Current IGSS nAdc
(VGS = –8.0 Vdc, VDS = 0 Vdc) – – –100

Gate–Body Leakage Current IGSS nAdc


(VGS = +8.0 Vdc, VDS = 0 Vdc) – – 100

ON CHARACTERISTICS
Gate Threshold Voltage VGS(th) Vdc
(VDS = VGS, ID = –250 µAdc) –0.45 –1.05 –1.50

Static Drain–Source On–State Resistance RDS(on) W


(VGS = –4.5 Vdc, ID = –3.3 Adc) – 0.069 0.090
(VGS = –2.5 Vdc, ID = –2.9 Adc) – 0.117 0.135
Forward Transconductance gFS mhos
(VDS = –10 Vdc, ID = –3.3 Adc) – 6.8 –

DYNAMIC CHARACTERISTICS
Input Capacitance Ciss – 480 – pF
(VDS = –5.0
5 0 Vdc,
Vd VGS = 0 Vdc,
Vd
Output Capacitance Coss – 265 – pF
f = 1.0 MHz)
Reverse Transfer Capacitance Crss – 100 – pF

SWITCHING CHARACTERISTICS
Turn–On Delay Time td(on) – 13 25 ns
Rise Time (VDD = –20
20 Vdc, ID = –1.6
1.6 Adc, tr – 23.5 45 ns
Turn–Off Delay Time VGS = –4.5 Vdc, Rg = 6.0 W) td(off) – 27 50 ns
Fall Time tf – 24 45 ns
Total Gate Charge Qtot – 6.2 14 nC
(VDS = –10
10 Vdc,
Vd VGS = –4.54 5 Vdc,
Vd
Gate–Source Charge Qgs – 1.3 – nC
ID = –3.3 Adc)
Gate–Drain Charge Qgd – 2.5 – nC

BODY–DRAIN DIODE RATINGS


Diode Forward On–Voltage (IS = –1.6 Adc, VGS = 0 Vdc) VSD – –0.88 –1.2 Vdc
Diode Forward On–Voltage (IS = –3.3 Adc, VGS = 0 Vdc) VSD – –0.98 – Vdc
Reverse Recovery Time (IS = –1.6 Adc, dIS/dt = 100 A/µs) trr – 30 60 ns
4. Indicates Pulse Test: P.W. = 300 µsec max, Duty Cycle = 2%.
5. Handling precautions to protect against electrostatic discharge is mandatory.

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62
NTGS3441T1

TYPICAL ELECTRICAL CHARACTERISTICS

10 20
TJ = 25°C VGS = –2.7 V VDS> = –10 V

–ID, DRAIN CURRENT (AMPS)


–ID, DRAIN CURRENT (AMPS)

TJ = 25°C
8 16
VGS = –2.5 V
TJ = –55°C
6 VGS = –3 V 12
TJ = 100°C
VGS = –3.5 V
VGS = –4 V
4 VGS = –4.5 V 8
VGS = –6 V VGS = –2 V
2 4
VGS = –10 V VGS = –1.5 V
0 0
0 0.4 0.8 1.2 1.6 2 0.4 0.8 1.2 1.6 2 2.4 2.8 3.2 3.6 4
–VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS) –VGS, GATE–TO–SOURCE VOLTAGE (VOLTS)

Figure 1. On–Region Characteristics Figure 2. Transfer Characteristics

0.4 0.28

RDS(on), DRAIN–TO–SOURCE RESISTANCE (Ω)


ID = –3.3 A TJ = 25°C
RDS(on), DRAIN–TO–SOURCE

TJ = 25°C 0.24

0.3 0.2 VGS = –2.5 V


RESISTANCE (Ω)

0.16
0.2
0.12
VGS = –4.5 V
0.08
0.1
0.04

0 0
2 3 4 5 6 7 8 0 4 8 12 16 20
–VGS, GATE–TO–SOURCE VOLTAGE (VOLTS) –ID, DRAIN CURRENT (AMPS)

Figure 3. On–Resistance vs. Gate–to–Source Figure 4. On–Resistance vs. Drain Current and
Voltage Gate Voltage

100
VGS = 0 V
ID = –3.3 A
1.4
RDS(on), DRAIN–TO–SOURCE

VGS = –4.5 V
RESISTANCE (NORMALIZED)

TJ = 125°C
–IDSS, LEAKAGE (nA)

1.2 10
TJ = 100°C

1
1 TJ = 25°C
0.8

0.6 0.1
–50 –25 0 25 50 75 100 125 150 0 4 8 12 16 20
TJ, JUNCTION TEMPERATURE (°C) –VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS)

Figure 5. On–Resistance Variation with Figure 6. Drain–to–Source Leakage Current


Temperature vs. Voltage

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63
NTGS3441T1

TYPICAL ELECTRICAL CHARACTERISTICS

1200 8
VDS = 0 V VGS = 0 V TJ = 25°C

–VGS, GATE–TO–SOURCE VOLTAGE


Ciss
C, CAPACITANCE (pF)

900 6

QT

(VOLTS)
Crss
600 4
Ciss Qgs Qgd
VDD = –20 V
300 2 ID = –3.3 A
Coss TJ = 25°C
Crss
0 0
8 4 0 4 8 12 16 20 0 2 4 6 8
–VGS –VDS Qg, TOTAL GATE CHARGE (nC)
GATE–TO–SOURCE OR DRAIN–TO–SOURCE
VOLTAGE (VOLTS) Figure 8. Gate–to–Source and
Figure 7. Capacitance Variation Drain–to–Source Voltage vs. Total Charge

1.3 10
VGS(th), GATE THRESHOLD VOLTAGE

–IS, SOURCE CURRENT (AMPS) VGS = 0 V


1.2 ID = –250 µA TJ = 25°C
8
1.1
(NORMALIZED)

6
1

0.9 4

0.8
2
0.7

0.6 0
–50 –25 0 25 50 75 100 125 150 0.5 0.6 0.7 0.8 0.9 1 1.1 1.2 1.3 1.4
TJ, JUNCTION TEMPERATURE (°C) –VSD, SOURCE–TO–DRAIN VOLTAGE (VOLTS)
Figure 9. Gate Threshold Voltage Variation Figure 10. Diode Forward Voltage vs. Current
with Temperature

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64
NTGS3441T1

TYPICAL ELECTRICAL CHARACTERISTICS

20

16

POWER (W)
12

0
0.01 0.10 1.00 10.00 100.00
TIME (sec)
Figure 11. Single Pulse Power

1
NORMALIZED EFFECTIVE TRANSIENT

Duty Cycle = 0.5


THERMAL IMPEDANCE

0.2

0.1
0.1
0.05

0.02

0.01 Single Pulse


0.01
1E–04 1E–03 1E–02 1E–01 1E+00 1E+01 1E+02 1E+03
SQUARE WAVE PULSE DURATION (sec)

Figure 12. Normalized Thermal Transient Impedance, Junction–to–Ambient

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65
NTGS3441T1

INFORMATION FOR USING THE TSOP–6 SURFACE MOUNT PACKAGE

MINIMUM RECOMMENDED FOOTPRINT FOR SURFACE MOUNTED APPLICATIONS


Surface mount board layout is a critical portion of the interface between the board and the package. With the
total design. The footprint for the semiconductor packages correct pad geometry, the packages will self align when
must be the correct size to insure proper solder connection subjected to a solder reflow process.
76
#6

4:
7$
:6
7
4:
7$
#8
:

47 %21!


SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • The soldering temperature and time shall not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within • When shifting from preheating to soldering, the
a short time could result in device failure. Therefore, the maximum temperature gradient shall be 5°C or less.
following items should always be observed in order to • After soldering has been completed, the device should
minimize the thermal stress to which the devices are be allowed to cool naturally for at least three minutes.
subjected. Gradual cooling should be used as the use of forced
• Always preheat the device. cooling will increase the temperature gradient and
• The delta temperature between the preheat and result in latent failure due to mechanical stress.
soldering should be 100°C or less.* • Mechanical stress or shock should not be applied
• When preheating and soldering, the temperature of the during cooling.
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When * Soldering a device without preheating can cause
using infrared heating with the reflow soldering excessive thermal shock and stress which can result in
method, the difference shall be a maximum of 10°C. damage to the device.

http://onsemi.com
66
!!

#$%& '(
   
P–Channel TSOP–6
Features
• Ultra Low RDS(on)
• Higher Efficiency Extending Battery Life http://onsemi.com
• Miniature TSOP6 Surface Mount Package
2 AMPERES
Applications
• Power Management in Portable and Battery–Powered Products, i.e.: 20 VOLTS
Cellular and Cordless Telephones, and PCMCIA Cards RDS(on) = 65 m
MAXIMUM RATINGS (TJ = 25°C unless otherwise noted) P–Channel
Rating Symbol Value Unit
 # $ 9
Drain–to–Source Voltage VDSS –20 Volts
Gate–to–Source Voltage – Continuous VGS "12 Volts
Thermal Resistance
Junction–to–Ambient (Note 1.) RθJA 244 °C/W 4
Total Power Dissipation @ TA = 25°C Pd 0.5 Watts
Drain Current – Continuous @ TA = 25°C ID –2.2 Amps
– Pulsed Drain Current (Tp t 10 µS) IDM –10 Amps
Thermal Resistance 6
Junction–to–Ambient (Note 2.) RθJA 128 °C/W
Total Power Dissipation @ TA = 25°C Pd 1.0 Watts
Drain Current – Continuous @ TA = 25°C ID –3.1 Amps MARKING
– Pulsed Drain Current (Tp t 10 µS) IDM –14 Amps
DIAGRAM
Thermal Resistance
Junction–to–Ambient (Note 3.) RθJA 62.5 °C/W 3
Total Power Dissipation @ TA = 25°C Pd 2.0 Watts 2
1 TSOP–6 443
Drain Current – Continuous @ TA = 25°C ID –4.4 Amps
CASE 318G W
– Pulsed Drain Current (Tp t 10 µS) IDM –20 Amps
4 STYLE 1
Operating and Storage Temperature Range TJ, Tstg –55 to °C 5
150 6

Maximum Lead Temperature for Soldering TL 260 °C


Purposes for 10 Seconds 443 = Device Code
W = Work Week
1. Minimum FR–4 or G–10PCB, operating to steady state.
2. Mounted onto a 2″ square FR–4 board (1″ sq. 2 oz. cu. 0.06″ thick single
sided), operating to steady state. PIN ASSIGNMENT
3. Mounted onto a 2″ square FR–4 board (1″ sq. 2 oz. cu. 0.06″ thick single
sided), t t 5.0 seconds. ()% ()% ;(1
6 5 4

1 2 3
()% ()% )'1

ORDERING INFORMATION

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NTGS3443T1 TSOP–6 3000 Tape & Reel

 Semiconductor Components Industries, LLC, 2000 67 Publication Order Number:


November, 2000 – Rev. 1 NTGS3443T1/D
NTGS3443T1

ELECTRICAL CHARACTERISTICS (TA = 25°C unless otherwise noted) (Notes 4. & 5.)
Characteristic Symbol Min Typ Max Unit
OFF CHARACTERISTICS
Drain–Source Breakdown Voltage V(BR)DSS Vdc
(VGS = 0 Vdc, ID = –10 µA) –20 – –

Zero Gate Voltage Drain Current IDSS µAdc


(VGS = 0 Vdc, VDS = –20 Vdc, TJ = 25°C) – – –1.0
(VGS = 0 Vdc, VDS = –20 Vdc, TJ = 70°C) – – –5.0
Gate–Body Leakage Current IGSS nAdc
(VGS = –12 Vdc, VDS = 0 Vdc) – – –100

Gate–Body Leakage Current IGSS nAdc


(VGS = +12 Vdc, VDS = 0 Vdc) – – 100

ON CHARACTERISTICS
Gate Threshold Voltage VGS(th) Vdc
(VDS = VGS, ID = –250 µAdc) –0.60 –0.95 –1.50

Static Drain–Source On–State Resistance RDS(on) W


(VGS = –4.5 Vdc, ID = –4.4 Adc) – 0.058 0.065
(VGS = –2.7 Vdc, ID = –3.7 Adc) – 0.082 0.090
(VGS = –2.5 Vdc, ID = –3.5 Adc) – 0.092 0.100
Forward Transconductance gFS mhos
(VDS = –10 Vdc, ID = –4.4 Adc) – 8.8 –

DYNAMIC CHARACTERISTICS
Input Capacitance Ciss – 565 – pF
(VDS = –5.0
5 0 Vdc,
Vd VGS = 0 Vdc,
Vd
Output Capacitance Coss – 320 – pF
f = 1.0 MHz)
Reverse Transfer Capacitance Crss – 120 – pF
SWITCHING CHARACTERISTICS
Turn–On Delay Time td(on) – 10 25 ns
Rise Time (VDD = –20
20 Vdc, ID = –1.0
1.0 Adc, tr – 18 45 ns
Turn–Off Delay Time VGS = –4.5 Vdc, Rg = 6.0 W) td(off) – 30 50 ns
Fall Time tf – 31 50 ns
Total Gate Charge Qtot – 7.5 15 nC
(VDS = –10
10 Vdc,
Vd VGS = –4.54 5 Vdc,
Vd
Gate–Source Charge Qgs – 1.4 – nC
ID = –4.4 Adc)
Gate–Drain Charge Qgd – 2.9 – nC

BODY–DRAIN DIODE RATINGS


Diode Forward On–Voltage (IS = –1.7 Adc, VGS = 0 Vdc) VSD – –0.83 –1.2 Vdc
Reverse Recovery Time (IS = –1.7 Adc, dIS/dt = 100 A/µs) trr – 30 – ns
4. Indicates Pulse Test: P.W. = 300 µsec max, Duty Cycle = 2%.
5. Handling precautions to protect against electrostatic discharge is mandatory.

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NTGS3443T1

TYPICAL ELECTRICAL CHARACTERISTICS

8 8
VGS = –5 V VGS = –2.5 V VDS≥ = –10 V
–ID, DRAIN CURRENT (AMPS)

–ID, DRAIN CURRENT (AMPS)


TJ = 25°C
6 VGS = –3 V 6
VGS = –4.5 V
VGS = –4 V
4 VGS = –3.5 V 4
VGS = –2 V
TJ = 25°C

2 2
TJ = 125°C
VGS = –1.5 V TJ = –55°C

0 0
0 0.4 0.8 1.2 1.6 2 0.6 1 1.4 1.8 2.2 2.6 3
–VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS) –VGS, GATE–TO–SOURCE VOLTAGE (VOLTS)
Figure 1. On–Region Characteristics Figure 2. Transfer Characteristics
RDS(on), DRAIN–TO–SOURCE RESISTANCE (OHMS)

RDS(on), DRAIN–TO–SOURCE RESISTANCE (OHMS)


0.4 0.16
ID = –4.4 A TJ = 25°C
0.35
TJ = 25°C 0.14
0.3
0.12 VGS = –2.5 V
0.25

0.2 VGS = –2.7 V


0.1
0.15
0.08
0.1 VGS = –4.5 V
0.06
0.05

0 0.04
1.5 2 2.5 3 3.5 4 4.5 5 0 1 2 3 4 5 6 7 8
–VGS, GATE–TO–SOURCE VOLTAGE (VOLTS) –ID, DRAIN CURRENT (AMPS)

Figure 3. On–Resistance vs. Gate–to–Source Figure 4. On–Resistance vs. Drain Current and
Voltage Gate Voltage
RDS(on), DRAIN–TO–SOURCE RESISTANCE (NORMALIZED)

1.5 100
TJ = 125°C
ID = –4.4 A
1.4
VGS = –4.5 V TJ = 100°C
–IDSS, LEAKAGE (nA)

1.3 10

1.2
1.1 1
TJ = 25°C
1

0.9 0.1

0.8 VGS = 0 V
0.7 0.01
–50 –25 0 25 50 75 100 125 150 0 4 8 12 16 20
TJ, JUNCTION TEMPERATURE (°C) –VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS)

Figure 5. On–Resistance Variation with Figure 6. Drain–to–Source Leakage Current


Temperature vs. Voltage

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NTGS3443T1

TYPICAL ELECTRICAL CHARACTERISTICS

1200 5
QT
TJ = 25°C
1000 VGS = 0 V

–VGS, GATE–TO–SOURCE
4 VGS
C, CAPACITANCE (pF)

VOLTAGE (VOLTS)
800
3 Q1 Q2
600 Ciss
2
400
Coss
200 1 TJ = 25°C
Crss ID = –4.4 A

0 0
0 2 4 6 8 10 12 14 16 18 20 0 1 2 3 4 5 6 7 8
–VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS) Qg, TOTAL GATE CHARGE (nC)

Figure 7. Capacitance Variation Figure 8. Gate–to–Source and


Drain–to–Source Voltage vs. Total Charge

1.3 4
VGS(th), GATE THRESHOLD VOLTAGE

VGS = 0 V
–IS, SOURCE CURRENT (AMPS)
1.2 ID = –250 µA

1.1 3
TJ = 150°C
(NORMALIZED)

1
2
0.9 TJ = 25°C

0.8
1
0.7

0.6 0
–50 –25 0 25 50 75 100 125 150 0.3 0.4 0.5 0.6 0.7 0.8 0.9 1
TJ, JUNCTION TEMPERATURE (°C) –VSD, SOURCE–TO–DRAIN VOLTAGE (VOLTS)
Figure 9. Gate Threshold Voltage Variation Figure 10. Diode Forward Voltage vs. Current
with Temperature

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NTGS3443T1

TYPICAL ELECTRICAL CHARACTERISTICS

20

16

POWER (W)
12

0
0.01 0.10 1.00 10.00 100.00
TIME (sec)
Figure 11. Single Pulse Power

1
NORMALIZED EFFECTIVE TRANSIENT

Duty Cycle = 0.5


THERMAL IMPEDANCE

0.2

0.1
0.1
0.05

0.02

0.01 Single Pulse


0.01
1E–04 1E–03 1E–02 1E–01 1E+00 1E+01 1E+02 1E+03
SQUARE WAVE PULSE DURATION (sec)

Figure 12. Normalized Thermal Transient Impedance, Junction–to–Ambient

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NTGS3443T1

INFORMATION FOR USING THE TSOP–6 SURFACE MOUNT PACKAGE


MINIMUM RECOMMENDED FOOTPRINT FOR SURFACE MOUNTED APPLICATIONS
Surface mount board layout is a critical portion of the interface between the board and the package. With the
total design. The footprint for the semiconductor packages correct pad geometry, the packages will self align when
must be the correct size to insure proper solder connection subjected to a solder reflow process.
76
#6

4:
7$
:6
7
4:
7$
#8
:

47 %21!


SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • The soldering temperature and time shall not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within • When shifting from preheating to soldering, the
a short time could result in device failure. Therefore, the maximum temperature gradient shall be 5°C or less.
following items should always be observed in order to • After soldering has been completed, the device should
minimize the thermal stress to which the devices are be allowed to cool naturally for at least three minutes.
subjected. Gradual cooling should be used as the use of forced
• Always preheat the device. cooling will increase the temperature gradient and
• The delta temperature between the preheat and result in latent failure due to mechanical stress.
soldering should be 100°C or less.* • Mechanical stress or shock should not be applied
• When preheating and soldering, the temperature of the during cooling.
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When * Soldering a device without preheating can cause
using infrared heating with the reflow soldering excessive thermal shock and stress which can result in
method, the difference shall be a maximum of 10°C. damage to the device.

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!

#$%& '(
-!    
N–Channel TSOP–6
Features
• Ultra Low RDS(on)
• Higher Efficiency Extending Battery Life http://onsemi.com
• Logic Level Gate Drive
• Diode Exhibits High Speed, Soft Recovery 5.3 AMPERES
• Avalanche Energy Specified 20 VOLTS
• IDSS Specified at Elevated Temperature RDS(on) = 45 m
Applications
• Power Management in portable and battery–powered products, i.e. N–Channel
computers, printers, PCMCIA cards, cellular and cordless
Drain 1 2 5 6
• Lithium Ion Battery Applications
• Notebook PC

MAXIMUM RATINGS (TC = 25°C unless otherwise noted)


Rating Symbol Value Unit Gate 3

Drain–to–Source Voltage VDSS 20 Vdc


Gate–Source Voltage – Continuous VGS 12 Vdc
Source 4
Thermal Resistance
Junction–to–Ambient (Note 1.) RθJA 62.5 °C/W
Total Power Dissipation @ TA = 25°C Pd 2.0 Watts MARKING
Drain Current
DIAGRAM
– Continuous @ TA = 25°C ID 5.3 Amps
– Pulsed Drain Current (tp t 10 µs) IDM 25 Amps 3
Thermal Resistance 2
1 TSOP–6 446
Junction–to–Ambient (Note 2.) RθJA 128 °C/W
CASE 318G W
Total Power Dissipation @ TA = 25°C Pd 1.0 Watts
4 STYLE 1
Drain Current 5
– Continuous @ TA = 25°C ID 3.7 Amps 6
– Pulsed Drain Current (tp t 10 µs) IDM 20 Amps 446 = Device Code
Operating and Storage Temperature Range TJ, Tstg –55 to °C W = Work Week
150
Maximum Lead Temperature for Soldering TL 260 °C PIN ASSIGNMENT
Purposes for 10 seconds
Drain Drain Source
1. Mounted onto a 2″ square FR–4 board (1″ sq. 2 oz. cu. 0.06″ thick single
6 5 4
sided), t t 5.0 seconds.
2. Mounted onto a 2″ square FR–4 board (1″ sq. 2 oz. cu. 0.06″ thick single
sided), operating to steady state.

1 2 3
Drain Drain Gate

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NTGS3446T1 TSOP–6 3000 Tape & Reel

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March, 2001 – Rev. 2 NTGS3446/D
NTGS3446T1

ELECTRICAL CHARACTERISTICS (TC = 25°C unless otherwise noted)


Characteristic Symbol Min Typ Max Unit
OFF CHARACTERISTICS
Drain–to–Source Breakdown Voltage V(BR)DSS Vdc
(VGS = 0 Vdc, ID = 0.25 mAdc) 20 – –
Temperature Coefficient (Positive) – 22 – mV/°C
Zero Gate Voltage Collector Current IDSS µAdc
(VDS = 20 Vdc, VGS = 0 Vdc) – – 1.0
(VDS = 20 Vdc, VGS = 0 Vdc, TJ = 85°C) – – 25
Gate–Body Leakage Current (VGS = ±12 Vdc, VDS = 0) IGSS(f) – – 100 nAdc
IGSS(r) – – –100

ON CHARACTERISTICS (Note 3.)


Gate Threshold Voltage VGS(th) Vdc
ID = 0.25 mA, VDS = VGS 0.6 0.85 1.2
Temperature Coefficient (Negative) – –2.5 – mV/°C
Static Drain–to–Source On–Resistance RDS(on) mW
(VGS = 4.5 Vdc, ID = 5.3 Adc) – 36 45
(VGS = 2.5 Vdc, ID = 4.4 Adc) – 44 55
Forward Transconductance (VDS = 10 Vdc, ID = 5.3 Adc) gFS – 12 – mhos
DYNAMIC CHARACTERISTICS
Input Capacitance Ciss – 510 750 pF
Output Capacitance (VDS = 10 Vd
Vdc, VGS = 0 Vd
Vdc,
Coss – 200 350
f = 1.0 MHz)
Transfer Capacitance Crss – 60 100
SWITCHING CHARACTERISTICS (Note 4.)
Turn–On Delay Time td(on) – 9.0 16 ns
Rise Time (VDD = 10 Vdc, ID = 1.0 Adc, tr – 12 20
Turn–Off Delay Time VGS = 4.5 Vdc, RG = 6.0 Ω) td(off) – 35 60
Fall Time tf – 20 35
Gate Charge QT – 8.0 15 nC
(VDS = 10 Vd
Vdc, ID = 5.3
5 3 Ad
Adc,
Qgs – 2.0 –
VGS = 4.5 Vdc)
Qgd – 2.0 –

SOURCE–DRAIN DIODE CHARACTERISTICS


Forward On–Voltage (Note 3.) VSD Vdc
(IS = 1.7 Adc, VGS = 0 Vdc) – 0.74 1.1
(IS = 1.7 Adc, VGS = 0 Vdc, TJ = 85°C) – 0.66 –
Reverse Recovery Time trr – 20 – ns
ta – 11 –
(IS = 1.7
1 7 Adc,
Adc VGS = 0 Vdc,
Vdc
diS/dt = 100 A/µs) tb – 9.0 –
Reverse Recovery Stored QRR – 0.01 – µC
Charge
3. Pulse Test: Pulse Width ≤ 300 µs, Duty Cycle ≤ 2%.
4. Switching characteristics are independent of operating junction temperature.

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NTGS3446T1

RDS(on), DRAIN–TO–SOURCE RESISTANCE 1.8 100


ID = 5.3 A
1.6 VGS = 4.5 V tf

1.4 td(off)
(NORMALIZED)

t, TIME (ns)
tr
1.2
10
1 td(on)

0.8
VDD = 10 V
0.6 ID = 1.0 A
VGS = 4.5 V
0.4 1
–50 –25 0 25 50 75 100 125 150 1 10 100
TJ, JUNCTION TEMPERATURE (°C) RG, GATE RESISTANCE (Ω)

Figure 1. On–Resistance Variation with Figure 2. Resistive Switching Time Variation


Temperature vs. Gate Resistance

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!

 

'(
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P–Channel TSOP–6
Features http://onsemi.com
• Ultra Low RDS(on)
• Higher Efficiency Extending Battery Life –3.5 AMPERES
• Miniature TSOP–6 Surface Mount Package
–30 VOLTS
Applications
100 m @ VGS = –10 V
• Power Management in Portable and Battery–Powered Products, i.e.:
Cellular and Cordless Telephones, and PCMCIA Cards
P–Channel

MAXIMUM RATINGS (TJ = 25°C unless otherwise noted.) 1 2 5 6


DRAIN
Rating Symbol Value Unit
Drain–to–Source Voltage VDSS –30 Volts
Gate–to–Source Voltage – Continuous VGS "20.0 Volts
3
Thermal Resistance GATE
Junction–to–Ambient (Note 1.) RθJA 62.5 °C/W
Total Power Dissipation @ TA = 25°C Pd 2.0 Watts
Drain Current –3.5 Amps 4
– Continuous @ TA = 25°C ID SOURCE
– Pulsed Drain Current (Tp t 10 µS) IDM –20 Amps
Maximum Operating Power Dissipation Pd 1.0 Watts
Maximum Operating Drain Current ID –2.5 Amps
MARKING
DIAGRAM
Thermal Resistance
Junction–to–Ambient (Note 2.) RθJA 128 °C/W
3
Total Power Dissipation @ TA = 25°C Pd 1.0 Watts 2
1 TSOP–6
Drain Current 455
– Continuous @ TA = 25°C ID –2.5 Amps CASE 318G x
– Pulsed Drain Current (Tp t 10 µS) IDM –14 Amps 4 STYLE 1
Maximum Operating Power Dissipation Pd 0.5 Watts 5
6
Maximum Operating Drain Current ID –1.75 Amps
Operating and Storage Temperature Range TJ, Tstg –55 to °C 455 = Device Code
150 x = Date Code
Maximum Lead Temperature for Soldering TL 260 °C
Purposes for 10 Seconds
PIN ASSIGNMENT
1. Mounted onto a 2″ square FR–4 board (1″ sq. 2 oz. cu. 0.06″ thick single
sided), t t 5.0 seconds. Drain Drain ;(1
2. Mounted onto a 2″ square FR–4 board (1″ sq. 2 oz. cu. 0.06″ thick single 6 5 4
sided), operating to steady state.

1 2 3
Drain Drain Gate

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Device Package Shipping

NTGS3455T1 TSOP–6 3000 Tape & Reel


This document contains information on a product under development. ON Semiconductor
reserves the right to change or discontinue this product without notice.

 Semiconductor Components Industries, LLC, 2000 76 Publication Order Number:


December, 2000 – Rev. 0 NTGS3455T1/D
NTGS3455T1

ELECTRICAL CHARACTERISTICS (TA = 25°C unless otherwise noted) (Notes 3. & 4.)
Characteristic Symbol Min Typ Max Unit
OFF CHARACTERISTICS
Drain–Source Breakdown Voltage V(BR)DSS Vdc
(VGS = 0 Vdc, ID = –10 µA) –30 – –

Zero Gate Voltage Drain Current IDSS µAdc


(VGS = 0 Vdc, VDS = –30 Vdc, TJ = 25°C) – – –1.0
(VGS = 0 Vdc, VDS = –30 Vdc, TJ = 70°C) – – –5.0
Gate–Body Leakage Current IGSS nAdc
(VGS = –20.0 Vdc, VDS = 0 Vdc) – – –100

Gate–Body Leakage Current IGSS nAdc


(VGS = +20.0 Vdc, VDS = 0 Vdc) – – 100

ON CHARACTERISTICS
Gate Threshold Voltage VGS(th) Vdc
(VDS = VGS, ID = –250 µAdc) –1.0 –1.87 –3.0

Static Drain–Source On–State Resistance RDS(on) W


(VGS = –10 Vdc, ID = –3.5 Adc) – 0.094 0.100
(VGS = –4.5 Vdc, ID = –2.7 Adc) – 0.144 0.170
Forward Transconductance gFS mhos
(VDS = –15 Vdc, ID = –3.5 Adc) – 6.0 –

DYNAMIC CHARACTERISTICS
Total Gate Charge Qtot – 9.0 13 nC
(VDS = –15
15 Vdc,
Vd VGS = –1010 Vdc,
Vd
Gate–Source Charge Qgs – 2.5 –
ID = –3.5 Adc)
Gate–Drain Charge Qgd – 2.0 –
Input Capacitance Ciss – 480 – pF
(VDS = –5.0
5 0 Vdc,
Vd VGS = 0 Vdc,
Vd
Output Capacitance Coss – 220 –
f = 1.0 MHz)
Reverse Transfer Capacitance Crss – 60 –
SWITCHING CHARACTERISTICS
Turn–On Delay Time td(on) – 10 20 ns
Rise Time (VDD = –20
20 Vdc, ID = –1.0
1.0 Adc, tr – 15 30
Turn–Off Delay Time VGS = –10 Vdc, Rg = 6.0 W) td(off) – 20 35
Fall Time tf – 10 20
Reverse Recovery Time (IS = –1.7 Adc, dlS/dt = 100 A/µs) trr – 30 – ns
BODY–DRAIN DIODE RATINGS
Diode Forward On–Voltage (IS = –1.7 Adc, VGS = 0 Vdc) VSD – –0.90 –1.2 Vdc
Diode Forward On–Voltage (IS = –3.5 Adc, VGS = 0 Vdc) VSD – –1.0 – Vdc
3. Indicates Pulse Test: P.W. = 300 µsec max, Duty Cycle = 2%.
4. Class 1 ESD rated – Handling precautions to protect against electrostatic discharge is mandatory.

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NTGS3455T1

20 20
VGS = –10 V
18 TJ = –55°C
–ID, DRAIN CURRENT (AMPS)

–ID, DRAIN CURRENT (AMPS)


VGS = –9 V
16 VGS = –6 V 16
VGS = –8 V
14 TJ = 25°C
VGS = –7 V
12 VGS = –5 V 12 TJ = 125°C
10
8 VGS = –4 V 8
6
4 4
TJ = 25°C VGS = –3 V 2
0 0
0 0.5 1 1.5 2 2.5 3 3.5 4 0 1 2 3 4 5 6 7
–VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS) –VGS, GATE–TO–SOURCE VOLTAGE (VOLTS)
Figure 1. On–Region Characteristics Figure 2. Transfer Characteristics
RDS(on), DRAIN–TO–SOURCE RESISTANCE (Ω)

RDS(on), DRAIN–TO–SOURCE RESISTANCE (Ω)


0.3 0.3
TJ = 25°C
ID = –3.5 A
0.25 0.25
TJ = 25°C

0.2 0.2 VGS = –4.5 V

0.15 0.15
VGS = –10 V
0.1 0.1

0.05 0.05

0 0
2 3 4 5 6 7 8 9 10 0 2 4 6 8 10 12 14 16 18 20
–VGS, GATE–TO–SOURCE VOLTAGE (VOLTS) –ID, DRAIN CURRENT (AMPS)

Figure 3. On–Resistance vs. Gate–to–Source Figure 4. On–Resistance vs. Drain Current and
Voltage Gate Voltage
RDS(on), DRAIN–TO–SOURCE RESISTANCE (NORMALIZED)

1.6 700
ID = –3.5 A VGS = 0 V
VGS = –10 V TJ = 25°C
1.4
C, CAPACITANCE (pF)

500
Ciss
1.2
300
1 Coss

100
0.8
Crss

0.6 –100
–50 –25 0 25 50 75 100 125 150 0 5 10 15 20 25 30
TJ, JUNCTION TEMPERATURE (°C) –VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS)

Figure 5. On–Resistance Variation with Figure 6. Capacitance Variation


Temperature

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NTGS3455T1

12 10
–VGS, GATE–TO–SOURCE VOLTAGE
11

–IS, SOURCE CURRENT (AMPS)


VGS = 0 V
10 QT
8
9
8
6 TJ = 150°C
(VOLTS)

7
6
Qgs
5 4
Qgd
4
TJ = 25°C
3
TJ = 25°C 2
2
ID = –3.5 A
1
0 0
0 2 4 6 8 10 12 0 0.2 0.4 0.6 0.8 1 1.2 1.4
Qg, TOTAL GATE CHARGE (nC) –VSD, SOURCE–TO–DRAIN VOLTAGE (VOLTS)

Figure 7. Gate–to–Source and Figure 8. Diode Forward Voltage vs. Current


Drain–to–Source Voltage vs. Total Charge

1
NORMALIZED EFFECTIVE TRANSIENT

Duty Cycle = 0.5


THERMAL IMPEDANCE

0.2

0.1
0.1
0.05

0.02

0.01 Single Pulse


0.1
1E–04 1E–03 1E–02 1E–01 1E+00 1E+01 1E+02 1E+03
SQUARE WAVE PULSE DURATION (sec)
Figure 9. Normalized Thermal Transient Impedance, Junction–to–Ambient

20

16
POWER (W)

12

0
0.01 0.10 1.00 10.00 100.00
TIME (sec)

Figure 10. Single Pulse Power

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.) 

 

/0 10 % !  23
'(
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D1 D2

G1 G2

PRODUCT SUMMARY S1 S2
VDS (V) rDS(on) (Ω) ID (A)
0.085 @ VGS = 10 V "3.9 N–Channel MOSFET N–Channel MOSFET
30
0.143 @ VGS = 4.5 V "3.0

MAXIMUM RATINGS (TA = 25°C unless otherwise noted)


Steady
Rating Symbol 5 secs State Unit ChipFET
Drain–Source Voltage VDS 30 V CASE 1206A
STYLE 2
Gate–Source Voltage VGS "20 V
Continuous Drain Current ID A
(TJ = 150°C) (Note 1.) PIN CONNECTIONS
TA = 25°C "3.9 "2.9
TA = 85°C "2.8 "2.1
D1 8 1 S1
Pulsed Drain Current IDM "10 A
D1 7 2 G1
Continuous Source Current IS 1.8 0.9 A
(Diode Conduction) (Note 1.) D2 6 3 S2
Maximum Power Dissipation PD W
D2 5 4 G2
(Note 1.)
TA = 25°C 2.1 1.1
TA = 85°C 1.1 0.6
Operating Junction and Storage TJ, Tstg –55 to +150 °C MARKING DIAGRAM
Temperature Range
1. Surface Mounted on 1″ x 1″ FR4 Board.
A6

A6 = Specific Device Code

ORDERING INFORMATION

Device Package Shipping


This document contains information on a product under development. ON Semiconductor NTHD5902T1 ChipFET 3000/Tape & Reel
reserves the right to change or discontinue this product without notice.

 Semiconductor Components Industries, LLC, 2000 80 Publication Order Number:


December, 2000 – Rev. 0 NTHD5902T1/D
NTHD5902T1

THERMAL CHARACTERISTICS
Characteristic Symbol Typ Max Unit
Maximum Junction–to–Ambient (Note 2.) RthJA °C/W
t v 5 sec 50 60
Steady State 90 110
Maximum Junction–to–Foot RthJF 30 40 °C/W
Steady State

ELECTRICAL CHARACTERISTICS (TJ = 25°C unless otherwise noted)


Characteristic Symbol Test Condition Min Typ Max Unit
Static
Gate Threshold Voltage VGS(th) VDS = VGS, ID = 250 µA 1.0 – – V
Gate–Body Leakage IGSS VDS = 0 V, VGS = "20 V – – "100 nA
Zero Gate Voltage Drain Current IDSS
SS VDS = 24 V, VGS = 0 V – – 1.0 µA
VDS = 24 V, VGS = 0 V, – – 5.0
TJ = 85°C

On–State Drain Current (Note 3.) ID(on) VDS w 5.0 V, VGS = 10 V 10 – – A


Drain–Source On–State Resistance (Note 3.) rDS(on)
S( ) VGS = 10 V, ID = 2.9 A – 0.072 0.085 Ω
VGS = 4.5 V, ID = 2.2 A – 0.120 0.143
Forward Transconductance (Note 3.) gfs VDS = 15 V, ID = 2.9 A – 20 – S
Diode Forward Voltage (Note 3.) VSD IS = 0.9 A, VGS = 0 V – 0.8 1.2 V
Dynamic (Note 4.)
Total Gate Charge Qg – 5.0 7.5 nC
VDS = 15 V
V, VGS = 10 V
V,
Gate–Source Charge Qgs – 0.8 –
ID = 2.9 A
Gate–Drain Charge Qgd – 1.0 –
Turn–On Delay Time td(on) – 7.0 11 ns
Rise Time tr VDD = 15 V, RL = 15 Ω – 12 18
ID ^ 1.0
1 0 A,
A VGEN = 10 V,V
Turn–Off Delay Time td(off) RG = 6 Ω – 12 18
Fall Time tf – 7.0 11
Source–Drain Reverse Recovery Time trr IF = 0.9 A, di/dt = 100 A/µs – 40 80
2. Surface Mounted on 1″ x 1″ FR4 Board.
3. Pulse Test: Pulse Width v 300 µs, Duty Cycle v 2%.
4. Guaranteed by design, not subject to production testing.

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NTHD5902T1

TYPICAL ELECTRICAL CHARACTERISTICS

10 10
VGS = 10
thru 5 V
8 8

ID,Drain Current (A)


ID,Drain Current (A)

6 4V 6

4 4
125°C
2 2 25°C
3V
TC = –55°C

0 0
0 0.5 1.0 1.5 2.0 2.5 3.0 0 1 2 3 4 5
VDS, Drain–to–Source Voltage (V) VGS, Gate–to–Source Voltage (V)
Figure 1. Output Characteristics Figure 2. Transfer Characteristics

0.20 400
r DS(on),On–Resistance ( Ω )

300
Ciss
0.15
C, Capacitance (pF)

VGS = 4.5 V

0.10 200
VGS = 10 V
Coss
0.05
100 Crss

0 0
0 2 4 6 8 10 0 4 8 12 16 20
ID, Drain Current (A) VDS, Drain–to–Source Voltage (V)
Figure 3. On–Resistance vs. Drain Current Figure 4. Capacitance

10 1.8

VGS = 10 V
VGS,Gate–to–Source Voltage (V)

r DS(on),On–Resistance ( Ω )

VDS = 15 V 1.6
8 ID = 2.9 A
ID = 2.9 A
(Normalized)

1.4
6
1.2

4
1.0

2 0.8

0 0.6
0 1 2 3 4 5 –50 –25 0 25 50 75 100 125 150
Qg, Total Gate Charge (nC) TJ, Junction Temperature (°C)
Figure 5. Gate Charge Figure 6. On–Resistance vs.
Junction Temperature

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TYPICAL ELECTRICAL CHARACTERISTICS

10 0.20

rDS(on),On–Resistance ( Ω )
I S,Source Current (A)

0.15

ID = 2.9 A
TJ = 150°C
0.10

TJ = 25°C
0.05

1 0
0 0.2 0.4 0.6 0.8 1.0 1.2 0 2 4 6 8 10
VDS, Drain–to–Source Voltage (V) VGS, Gate–to–Source Voltage (V)
Figure 7. Source–Drain Diode Forward Voltage Figure 8. On–Resistance vs. Gate–to–Source
Voltage

0.4 50

0.2 40
ID = 250 µA
V GS (th),Varience (V)

–0.0
Power (W)

30
–0.2
20
–0.4

10
–0.6

–0.8 0
–50 –25 0 25 50 75 100 125 150 10–4 10–3 10–2 10 –1 1 10 100 600
TJ, Temperature (°C) Time (sec)
Figure 9. Threshold Voltage Figure 10. Single Pulse Power

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NTHD5902T1

TYPICAL ELECTRICAL CHARACTERISTICS


2

1
Normalized Effective Transient

Duty Cycle = 0.5


Thermal Impedance

Notes:
PDM
0.2
t1
0.1 t2
0.1
0.05 t1
1. Duty Cycle, D = t
0.02 2
2. Per Unit Base = RthJA = 90°C/W
3. TJM – TA = PDMZthJA(t)
Single Pulse 4. Surface Mounted
0.01
10–4 10–3 10–2 10 –1 1 10 100 600
Square Wave Pulse Duration (sec)
Figure 11. Normalized Thermal Transient Impedance, Junction–to–Ambient

2
Normalized Effective Transient

1
Duty Cycle = 0.5
Thermal Impedance

0.2
0.1
0.1
0.05
0.02

Single Pulse
0.01
10–4 10–3 10–2 10 –1 1 10
Square Wave Pulse Duration (sec)
Figure 12. Normalized Thermal Transient Impedance, Junction–to–Foot

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S1 S2

G1 G2

PRODUCT SUMMARY D1 D2
VDS (V) rDS(on) (Ω) ID (A)
P–Channel MOSFET P–Channel MOSFET
0.155 @ VGS = –4.5 V "2.9

–20 0.180 @ VGS = –3.6 V "2.7


0.260 @ VGS = –2.5 V "2.2

MAXIMUM RATINGS (TA = 25°C unless otherwise noted)


ChipFET
Steady CASE 1206A
Rating Symbol 5 secs State Unit STYLE 2
Drain–Source Voltage VDS –20 V
Gate–Source Voltage VGS "12 V PIN CONNECTIONS
Continuous Drain Current ID A
(TJ = 150°C) (Note 1.)
TA = 25°C "2.9 "2.1 D1 8 1 S1
TA = 85°C "2.1 "1.5
D1 7 2 G1
Pulsed Drain Current IDM "10 A
D2 6 3 S2
Continuous Source Current IS –1.8 –0.9 A
(Diode Conduction) (Note 1.) D2 5 4 G2
Maximum Power Dissipation PD W
(Note 1.)
TA = 25°C 2.1 1.1
TA = 85°C 1.1 0.6 MARKING DIAGRAM
Operating Junction and Storage TJ, Tstg –55 to +150 °C
Temperature Range
A7
1. Surface Mounted on 1″ x 1″ FR4 Board.

A7 = Specific Device Code

ORDERING INFORMATION

Device Package Shipping

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December, 2000 – Rev. 0 NTHD5903T1/D
NTHD5903T1

THERMAL CHARACTERISTICS
Characteristic Symbol Typ Max Unit
Maximum Junction–to–Ambient (Note 2.) RthJA °C/W
t v 5 sec 50 60
Steady State 90 110
Maximum Junction–to–Foot (Drain) RthJF 30 40 °C/W
Steady State

ELECTRICAL CHARACTERISTICS (TJ = 25°C unless otherwise noted)


Characteristic Symbol Test Condition Min Typ Max Unit
Static
Gate Threshold Voltage VGS(th) VDS = VGS, ID = –250 µA –0.6 – – V
Gate–Body Leakage IGSS VDS = 0 V, VGS = "12 V – – "100 nA
Zero Gate Voltage Drain Current IDSS
SS VDS = –16 V, VGS = 0 V – – –1.0 µA
VDS = –16 V, VGS = 0 V, – – –5.0
TJ = 85°C

On–State Drain Current (Note 3.) ID(on) VDS v –5.0 V, VGS = –4.5 V –10 – – A
Drain–Source On–State Resistance (Note 3.) rDS(on)
S( ) VGS = –4.5 V, ID = –2.1 A – 0.130 0.155 Ω
VGS = –3.6 V, ID = –2.0 A – 0.150 0.180
VGS = –2.5 V, ID = –1.7 A – 0.215 0.260
Forward Transconductance (Note 3.) gfs VDS = –10 V, ID = –2.1 A – 5.0 – S
Diode Forward Voltage (Note 3.) VSD IS = –0.9 A, VGS = 0 V – –0.8 –1.2 V
Dynamic (Note 4.)
Total Gate Charge Qg – 3.0 6.0 nC
10 V
VDS = –10 V, VGS = –4.5
45V V,
Gate–Source Charge Qgs – 0.9 –
ID = –2.1 A
Gate–Drain Charge Qgd – 0.6 –
Turn–On Delay Time td(on) – 13 20 ns
Rise Time tr VDD = –10 V, RL = 10 Ω – 35 55
ID ^ –1.0
–1 0 A
A, VGEN = –4
–4.5
5VV,
Turn–Off Delay Time td(off) RG = 6 Ω – 25 40
Fall Time tf – 25 40
Source–Drain Reverse Recovery Time trr IF = –0.9 A, di/dt = 100 A/µs – 40 80
2. Surface Mounted on 1″ x 1″ FR4 Board.
3. Pulse Test: Pulse Width v 300 µs, Duty Cycle v 2%.
4. Guaranteed by design, not subject to production testing.

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NTHD5903T1

TYPICAL ELECTRICAL CHARACTERISTICS

10 10
3.5 V
VGS = 5 thru 4 V TC = –55°C
8 8
3V

I D,Drain Current (A)


25°C
ID,Drain Current (A)

6 6 125°C

2.5 V
4 4

2V
2 2

1.5 V
0 0
0 0.5 1.0 1.5 2.0 2.5 3.0 0 0.5 1.0 1.5 2.0 2.5 3.0 3.5 4.0
VDS, Drain–to–Source Voltage (V) VGS, Gate–to–Source Voltage (V)
Figure 1. Output Characteristics Figure 2. Transfer Characteristics

0.4 600
r DS(on),On–Resistance ( Ω )

500
0.3 VGS = 2.5 V
C, Capacitance (pF)

Ciss
400

0.2 VGS = 3.6 V 300

VGS = 4.5 V 200


0.1
Coss
100
Crss
0 0
0 2 4 6 8 10 0 4 8 12 16 20
ID, Drain Current (A) VDS, Drain–to–Source Voltage (V)
Figure 3. On–Resistance vs. Drain Current Figure 4. Capacitance

5 1.6
VGS,Gate–to–Source Voltage (V)

r DS(on),On–Resistance ( Ω )

VDS = 10 V VGS = 4.5 V


4 ID = 2.1 A 1.4
ID = 2.1 A
(Normalized)

3 1.2

2 1.0

1 0.8

0 0.6
0 0.5 1.0 1.5 2.0 2.5 3.0 –50 –25 0 25 50 75 100 125 150
Qg, Total Gate Charge (nC) TJ, Junction Temperature (°C)

Figure 5. Gate Charge Figure 6. On–Resistance vs.


Junction Temperature

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TYPICAL ELECTRICAL CHARACTERISTICS

10 0.40

0.35

rDS(on),On–Resistance ( Ω )
ID = 2.1 A
I S,Source Current (A)

0.30

0.25
TJ = 150°C 0.20

0.15
TJ = 25°C
0.10

0.05

1 0
0 0.2 0.4 0.6 0.8 1.0 1.2 1.4 0 1 2 3 4 5
VDS, Drain–to–Source Voltage (V) VGS, Gate–to–Source Voltage (V)
Figure 7. Source–Drain Diode Forward Voltage Figure 8. On–Resistance vs. Gate–to–Source
Voltage

0.4 50

0.3
40
ID = 250 µA
V GS (th),Varience (V)

0.2
Power (W)

30
0.1
20
0.0

10
–0.1

–0.2 0
–50 –25 0 25 50 75 100 125 150 10–4 10–3 10–2 10 –1 1 10 100 600
TJ, Temperature (°C) Time (sec)
Figure 9. Threshold Voltage Figure 10. Single Pulse Power

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NTHD5903T1

TYPICAL ELECTRICAL CHARACTERISTICS


2

1
Normalized Effective Transient

Duty Cycle = 0.5


Thermal Impedance

Notes:
PDM
0.2
t1
0.1 t2
0.1
0.05 t1
1. Duty Cycle, D = t
0.02 2
2. Per Unit Base = RthJA = 90°C/W
3. TJM – TA = PDMZthJA(t)
Single Pulse 4. Surface Mounted
0.01
10–4 10–3 10–2 10 –1 1 10 100 600
Square Wave Pulse Duration (sec)
Figure 11. Normalized Thermal Transient Impedance, Junction–to–Ambient

2
Normalized Effective Transient

1
Duty Cycle = 0.5
Thermal Impedance

0.2
0.1
0.1
0.05
0.02

Single Pulse
0.01
10–4 10–3 10–2 10 –1 1 10
Square Wave Pulse Duration (sec)

Figure 12. Normalized Thermal Transient Impedance, Junction–to–Foot

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D1 D2

G1 G2

PRODUCT SUMMARY S1 S2

VDS (V) rDS(on) (Ω) ID (A)


N–Channel MOSFET N–Channel MOSFET
0.075 @ VGS = 4.5 V "4.2
20
0.134 @ VGS = 2.5 V "3.1

MAXIMUM RATINGS (TA = 25°C unless otherwise noted)


Steady
ChipFET
Rating Symbol 5 secs State Unit
CASE 1206A
Drain–Source Voltage VDS 20 V STYLE 2
Gate–Source Voltage VGS "12 V
Continuous Drain Current ID A PIN CONNECTIONS
(TJ = 150°C) (Note 1.)
TA = 25°C "4.2 "3.1
TA = 85°C "3.0 "2.2 D1 8 1 S1

Pulsed Drain Current IDM "10 A D1 7 2 G1


Continuous Source Current IS 1.8 0.9 A D2 6 3 S2
(Diode Conduction) (Note 1.)
D2 5 4 G2
Maximum Power Dissipation PD W
(Note 1.)
TA = 25°C 2.1 1.1
TA = 85°C 1.1 0.6 MARKING DIAGRAM
Operating Junction and Storage TJ, Tstg –55 to +150 °C
Temperature Range
1. Surface Mounted on 1″ x 1″ FR4 Board. A2

A2 = Specific Device Code

ORDERING INFORMATION

Device Package Shipping

This document contains information on a product under development. ON Semiconductor NTHD5904T1 ChipFET 3000/Tape & Reel
reserves the right to change or discontinue this product without notice.

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December, 2000 – Rev. 0 NTHD5904T1/D
NTHD5904T1

THERMAL CHARACTERISTICS
Characteristic Symbol Typ Max Unit
Maximum Junction–to–Ambient (Note 2.) RthJA °C/W
t v 5 sec 50 60
Steady State 90 110
Maximum Junction–to–Foot (Drain) RthJF 30 40 °C/W
Steady State

ELECTRICAL CHARACTERISTICS (TJ = 25°C unless otherwise noted)


Characteristic Symbol Test Condition Min Typ Max Unit
Static
Gate Threshold Voltage VGS(th) VDS = VGS, ID = 250 µA 0.6 – – V
Gate–Body Leakage IGSS VDS = 0 V, VGS = "12 V – – "100 nA
Zero Gate Voltage Drain Current IDSS
SS VDS = 16 V, VGS = 0 V – – 1.0 µA
VDS = 16 V, VGS = 0 V, – – 5.0
TJ = 85°C

On–State Drain Current (Note 3.) ID(on) VDS w 5.0 V, VGS = 4.5 V 10 – – A
Drain–Source On–State Resistance (Note 3.) rDS(on)
S( ) VGS = 4.5 V, ID = 3.1 A – 0.065 0.075 Ω
VGS = 2.5 V, ID = 2.3 A – 0.115 0.143
Forward Transconductance (Note 3.) gfs VDS = 10 V, ID = 3.1 A – 8.0 – S
Diode Forward Voltage (Note 3.) VSD IS = 0.9 A, VGS = 0 V – 0.8 1.2 V
Dynamic (Note 4.)
Total Gate Charge Qg – 4.0 6.0 nC
VDS = 10 V
V, VGS = 4.5
4 5 V,
V
Gate–Source Charge Qgs – 0.6 –
ID = 3.1 A
Gate–Drain Charge Qgd – 1.3 –
Turn–On Delay Time td(on) – 12 18 ns
Rise Time tr VDD = 10 V, RL = 10 Ω – 35 55
ID ^ 1.0
1 0 A,
A VGEN = 4.5
4 5 V,
V
Turn–Off Delay Time td(off) RG = 6 Ω – 19 30
Fall Time tf – 9.0 15
Source–Drain Reverse Recovery Time trr IF = 0.9 A, di/dt = 100 A/µs – 40 80
2. Surface Mounted on 1″ x 1″ FR4 Board.
3. Pulse Test: Pulse Width v 300 µs, Duty Cycle v 2%.
4. Guaranteed by design, not subject to production testing.

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NTHD5904T1

TYPICAL ELECTRICAL CHARACTERISTICS

10 10
TC = –55°C
VGS = 5 thru 3 V
8 8 25°C

D,Drain Current (A)


ID,Drain Current (A)

2.5 V 125°C
6 6

4 4

I
2V
2 2

1.5 V
0 0
0 0.5 1.0 1.5 2.0 2.5 3.0 0 0.5 1.0 1.5 2.0 2.5 3.0 3.5
VDS, Drain–to–Source Voltage (V) VGS, Gate–to–Source Voltage (V)
Figure 1. Output Characteristics Figure 2. Transfer Characteristics

0.30 600
r DS(on),On–Resistance ( Ω )

0.25 500
Ciss
C, Capacitance (pF)

0.20 400

0.15 VGS = 2.5 V 300

0.10 200 Coss


VGS = 4.5 V

0.05 100 Crss

0 0
0 2 4 6 8 10 0 4 8 12 16 20
ID, Drain Current (A) VDS, Drain–to–Source Voltage (V)
Figure 3. On–Resistance vs. Drain Current Figure 4. Capacitance

5 1.6
VGS,Gate–to–Source Voltage (V)

VGS = 4.5 V
r DS(on),On–Resistance ( Ω )

VDS = 10 V
4 ID = 3.1 A 1.4 ID = 3.1 A
(Normalized)

3 1.2

2 1.0

1 0.8

0 0.6
0 1 2 3 4 –50 –25 0 25 50 75 100 125 150
Qg, Total Gate Charge (nC) TJ, Junction Temperature (°C)
Figure 5. Gate Charge Figure 6. On–Resistance vs.
Junction Temperature

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TYPICAL ELECTRICAL CHARACTERISTICS

10 0.20

rDS(on),On–Resistance ( Ω )
I S,Source Current (A)

0.15

ID = 3.1 A
TJ = 150°C
0.10

TJ = 25°C
0.05

1 0
0 0.2 0.4 0.6 0.8 1.0 1.2 0 1 2 3 4 5
VDS, Drain–to–Source Voltage (V) VGS, Gate–to–Source Voltage (V)
Figure 7. Source–Drain Diode Forward Voltage Figure 8. On–Resistance vs. Gate–to–Source
Voltage

0.4 50

0.2
40
V GS (th),Varience (V)

–0.0 ID = 250 µA
Power (W)

30
–0.2
20
–0.4

10
–0.6

–0.8 0
–50 –25 0 25 50 75 100 125 150 10–4 10–3 10–2 10 –1 1 10 100 600
TJ, Temperature (°C) Time (sec)
Figure 9. Threshold Voltage Figure 10. Single Pulse Power

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NTHD5904T1

TYPICAL ELECTRICAL CHARACTERISTICS


2

1
Normalized Effective Transient

Duty Cycle = 0.5


Thermal Impedance

Notes:
PDM
0.2
t1
0.1 t2
0.1
0.05 t1
1. Duty Cycle, D = t
0.02 2
2. Per Unit Base = RthJA = 90°C/W
3. TJM – TA = PDMZthJA(t)
Single Pulse 4. Surface Mounted
0.01
10–4 10–3 10–2 10 –1 1 10 100 600
Square Wave Pulse Duration (sec)
Figure 11. Normalized Thermal Transient Impedance, Junction–to–Ambient

2
Normalized Effective Transient

1
Duty Cycle = 0.5
Thermal Impedance

0.2
0.1
0.1
0.05
0.02

Single Pulse
0.01
10–4 10–3 10–2 10 –1 1 10
Square Wave Pulse Duration (sec)

Figure 12. Normalized Thermal Transient Impedance, Junction–to–Foot

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S1 S2

G1 G2

PRODUCT SUMMARY D1 D2

VDS (V) rDS(on) (Ω) ID (A)


P–Channel MOSFET P–Channel MOSFET
0.090 @ VGS = –4.5 V "4.1

–8.0 0.130 @ VGS = –2.5 V "3.4


0.180 @ VGS = –1.8 V "2.9

MAXIMUM RATINGS (TA = 25°C unless otherwise noted)


ChipFET
Steady CASE 1206A
Rating Symbol 5 secs State Unit STYLE 2
Drain–Source Voltage VDS –8.0 V
Gate–Source Voltage VGS "8.0 V
PIN CONNECTIONS
Continuous Drain Current ID A
(TJ = 150°C) (Note 1.)
TA = 25°C "4.1 "3.0 D1 8 1 S1
TA = 85°C "2.9 "2.2
D1 7 2 G1
Pulsed Drain Current IDM "10 A
Continuous Source Current IS –1.8 –0.9 A D2 6 3 S2
(Diode Conduction) (Note 1.)
D2 5 4 G2
Maximum Power Dissipation PD W
(Note 1.)
TA = 25°C 2.1 1.1
TA = 85°C 1.1 0.6 MARKING DIAGRAM
Operating Junction and Storage TJ, Tstg –55 to +150 °C
Temperature Range
A9
1. Surface Mounted on 1″ x 1″ FR4 Board.

A9 = Specific Device Code

ORDERING INFORMATION

Device Package Shipping

This document contains information on a product under development. ON Semiconductor NTHD5905T1 ChipFET 3000/Tape & Reel
reserves the right to change or discontinue this product without notice.

 Semiconductor Components Industries, LLC, 2000 95 Publication Order Number:


December, 2000 – Rev. 0 NTHD5905T1/D
NTHD5905T1

THERMAL CHARACTERISTICS
Characteristic Symbol Typ Max Unit
Maximum Junction–to–Ambient (Note 2.) RthJA °C/W
t v 5 sec 50 60
Steady State 90 110
Maximum Junction–to–Foot (Drain) RthJF 30 40 °C/W
Steady State

ELECTRICAL CHARACTERISTICS (TJ = 25°C unless otherwise noted)


Characteristic Symbol Test Condition Min Typ Max Unit
Static
Gate Threshold Voltage VGS(th) VDS = VGS, ID = –250 µA –0.45 – – V
Gate–Body Leakage IGSS VDS = 0 V, VGS = "8.0 V – – "100 nA
Zero Gate Voltage Drain Current IDSS
SS VDS = –6.4 V, VGS = 0 V – – –1.0 µA
VDS = –6.4 V, VGS = 0 V, – – –5.0
TJ = 85°C

On–State Drain Current (Note 3.) ID(on) VDS v –5.0 V, VGS = –4.5 V –10 – – A
Drain–Source On–State Resistance (Note 3.) rDS(on)
S( ) VGS = –4.5 V, ID = –3.0 A – 0.075 0.090 Ω
VGS = –2.5 V, ID = –2.5 A – 0.110 0.130
VGS = –1.8 V, ID = –1.0 A – 0.150 0.180
Forward Transconductance (Note 3.) gfs VDS = –5.0 V, ID = –3.0 A – 7.0 – S
Diode Forward Voltage (Note 3.) VSD IS = –0.9 A, VGS = 0 V – –0.8 –1.2 V
Dynamic (Note 4.)
Total Gate Charge Qg – 5.5 9.0 nC
40V
VDS = –4.0 V, VGS = –4.5
45V V,
Gate–Source Charge Qgs – 0.5 –
ID = –3.0 A
Gate–Drain Charge Qgd – 1.5 –
Turn–On Delay Time td(on) – 10 15 ns
Rise Time tr VDD = –4.0 V, RL = 4 Ω – 45 70
ID ^ –1.0
–1 0 A
A, VGEN = –4
–4.5
5VV,
Turn–Off Delay Time td(off) RG = 6 Ω – 30 45
Fall Time tf – 10 15
Source–Drain Reverse Recovery Time trr IF = –0.9 A, di/dt = 100 A/µs – 30 60
2. Surface Mounted on 1″ x 1″ FR4 Board.
3. Pulse Test: Pulse Width v 300 µs, Duty Cycle v 2%.
4. Guaranteed by design, not subject to production testing.

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NTHD5905T1

TYPICAL ELECTRICAL CHARACTERISTICS

10 10
VGS = 5 2.5 V TC = –55°C
thru 3 V
8 8 25°C

D,Drain Current (A)


ID,Drain Current (A)

2V 125°C
6 6

4 4

1.5 V
2 2

1V
0 0
0 0.5 1.0 1.5 2.0 2.5 3.0 0 0.5 1.0 1.5 2.0 2.5 3.0
VDS, Drain–to–Source Voltage (V) VGS, Gate–to–Source Voltage (V)
Figure 1. Output Characteristics Figure 2. Transfer Characteristics

0.30 1000
r DS(on),On–Resistance ( Ω )

0.25
800
VGS = 1.8 V Ciss
C, Capacitance (pF)

0.20
600
0.15 VGS = 2.5 V
400
VGS = 4.5 V
0.10
Coss
200
0.05
Crss

0 0
0 2 4 6 8 10 0 4 8 12 16 20
ID, Drain Current (A) VDS, Drain–to–Source Voltage (V)
Figure 3. On–Resistance vs. Drain Current Figure 4. Capacitance

5 1.6
VGS,Gate–to–Source Voltage (V)

VGS = 4.5 V
r DS(on),On–Resistance ( Ω )

4 1.4 ID = 3 A
(Normalized)

3 1.2

2 1.0

1 0.8

0 0.6
0 1 2 3 4 5 6 –50 –25 0 25 50 75 100 125 150
Qg, Total Gate Charge (nC) TJ, Junction Temperature (°C)

Figure 5. Gate Charge Figure 6. On–Resistance vs.


Junction Temperature

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NTHD5905T1

TYPICAL ELECTRICAL CHARACTERISTICS

10 0.25

rDS(on),On–Resistance ( Ω )
0.20 ID = 3 A
I S,Source Current (A)

0.15
TJ = 150°C

0.10

0.05
TJ = 25°C

1 0
0 0.2 0.4 0.6 0.8 1.0 1.2 1.4 0 1 2 3 4 5
VDS, Drain–to–Source Voltage (V) VGS, Gate–to–Source Voltage (V)

Figure 7. Source Diode Forward Voltage Figure 8. On–Resistance vs. Gate–to–Source


Voltage

0.4 50

0.3
40
V GS (th),Varience (V)

0.2 ID = 250 µA
Power (W)

30
0.1
20
0.0

10
–0.1

–0.2 0
–50 –25 0 25 50 75 100 125 150 10–4 10–3 10–2 10 –1 1 10 100 600
TJ, Temperature (°C) Time (sec)

Figure 9. Threshold Voltage Figure 10. Single Pulse Power

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98
NTHD5905T1

TYPICAL ELECTRICAL CHARACTERISTICS

1
Normalized Effective Transient

Duty Cycle = 0.5


Thermal Impedance

Notes:
PDM
0.2
t1
0.1 t2
0.1
0.05 t1
1. Duty Cycle, D = t
0.02 2
2. Per Unit Base = RthJA = 90°C/W
3. TJM – TA = PDMZthJA(t)
Single Pulse 4. Surface Mounted
0.01
10–4 10–3 10–2 10 –1 1 10 100 600
Square Wave Pulse Duration (sec)
Figure 11. Normalized Thermal Transient Impedance, Junction–to–Ambient

2
Normalized Effective Transient

1
Duty Cycle = 0.5
Thermal Impedance

0.2

0.1
0.1
0.05
0.02

Single Pulse
0.01
10–4 10–3 10–2 10 –1 1 10
Square Wave Pulse Duration (sec)
Figure 12. Normalized Thermal Transient Impedance, Junction–to–Foot

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PRODUCT SUMMARY S

VDS (V) rDS(on) (Ω) ID (A) N–Channel MOSFET


0.035 @ VGS = 10 V "6.7
30
0.055 @ VGS = 4.5 V "5.3

MAXIMUM RATINGS (TA = 25°C unless otherwise noted)


ChipFET
Steady
CASE 1206A
Rating Symbol 5 secs State Unit
STYLE 1
Drain–Source Voltage VDS 30 V
Gate–Source Voltage VGS "20 V
PIN CONNECTIONS
Continuous Drain Current ID A
(TJ = 150°C) (Note 1.)
TA = 25°C "6.7 "4.9 D 8 1 D
TA = 85°C "4.8 "3.5
Pulsed Drain Current IDM "20 A D 7 2 D

Continuous Source Current IS 2.1 1.1 A D 6 3 D


(Diode Conduction) (Note 1.)
S 5 4 G
Maximum Power Dissipation PD W
(Note 1.)
TA = 25°C 2.5 1.3
TA = 85°C 1.3 0.7
MARKING DIAGRAM
Operating Junction and Storage TJ, Tstg –55 to +150 °C
Temperature Range
1. Surface Mounted on 1″ x 1″ FR4 Board. A6

A6 = Specific Device Code

ORDERING INFORMATION
This document contains information on a product under development. ON Semiconductor
Device Package Shipping
reserves the right to change or discontinue this product without notice.
NTHS5402T1 ChipFET 3000/Tape & Reel

 Semiconductor Components Industries, LLC, 2000 100 Publication Order Number:


December, 2000 – Rev. 0 NTHS5402T1/D
NTHS5402T1

THERMAL CHARACTERISTICS
Characteristic Symbol Typ Max Unit
Maximum Junction–to–Ambient (Note 2.) RthJA °C/W
t v 5 sec 40 50
Steady State 80 95
Maximum Junction–to–Foot (Drain) RthJF 15 20 °C/W
Steady State

ELECTRICAL CHARACTERISTICS (TJ = 25°C unless otherwise noted)


Characteristic Symbol Test Condition Min Typ Max Unit
Static
Gate Threshold Voltage VGS(th) VDS = VGS, ID = 250 µA 1.0 – – V
Gate–Body Leakage IGSS VDS = 0 V, VGS = "20 V – – "100 nA
Zero Gate Voltage Drain Current IDSS
SS VDS = 24 V, VGS = 0 V – – 1.0 µA
VDS = 24 V, VGS = 0 V, – – 5.0
TJ = 85°C

On–State Drain Current (Note 3.) ID(on) VDS w 5.0 V, VGS = 10 V 20 – – A


Drain–Source On–State Resistance (Note 3.) rDS(on)
S( ) VGS = 10 V, ID = 4.9 A – 0.030 0.035 Ω
VGS = 4.5 V, ID = 3.9 A – 0.045 0.055
Forward Transconductance (Note 3.) gfs VDS = 10 V, ID = 4.9 A – 15 – S
Diode Forward Voltage (Note 3.) VSD IS = 1.1 A, VGS = 0 V – 0.8 1.2 V
Dynamic (Note 4.)
Total Gate Charge Qg – 13 20 nC
VDS = 15 V
V, VGS = 10 V
V,
Gate–Source Charge Qgs – 1.3 –
ID = 4.9 A
Gate–Drain Charge Qgd – 3.1 –
Turn–On Delay Time td(on) – 10 15 ns
Rise Time tr VDD = 15 V, RL = 15 Ω – 10 15
ID ^ 1.0
1 0 A,
A VGEN = 10 V,V
Turn–Off Delay Time td(off) RG = 6 Ω – 25 40
Fall Time tf – 10 15
Source–Drain Reverse Recovery Time trr IF = 1.1 A, di/dt = 100 A/µs – 30 60
2. Surface Mounted on 1″ x 1″ FR4 Board.
3. Pulse Test: Pulse Width v 300 µs, Duty Cycle v 2%.
4. Guaranteed by design, not subject to production testing.

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NTHS5402T1

TYPICAL CHARACTERISTICS

20 20
VGS = 10 thru 5 V
4V
16 16

ID,Drain Current (A)


ID,Drain Current (A)

12 12

8 8

3V TC125°C
4 4 25°C
TC = –55°C
0 0
0 0.5 1.0 1.5 2.0 2.5 3.0 0 0.5 1.0 1.5 2.0 2.5 3.0 3.5 4.0
VDS, Drain–to–Source Voltage (V) VGS, Gate–to–Source Voltage (V)

Figure 1. Output Characteristics Figure 2. Transfer Characteristics

0.10 1200
r DS(on),On–Resistance ( Ω )

1000
0.08 Ciss
C, Capacitance (pF)

800
0.06
VGS = 4.5 V
600
0.04 VGS = 10 V
400

0.02 Coss
200
Crss
0 0
0 4 8 12 16 20 0 6 12 18 24 30
ID, Drain Current (A) VDS, Drain–to–Source Voltage (V)

Figure 3. On–Resistance vs. Drain Current Figure 4. Capacitance

10 1.6
VGS,Gate–to–Source Voltage (V)

r DS(on),On–Resistance ( Ω )

VDS = 15 V VGS = 10 V
8 ID = 4.9 A 1.4
ID = 4.9 A
(Normalized)

6 1.2

4 1.0

2 0.8

0 0.6
0 3 6 9 12 15 –50 –25 0 25 50 75 100 125 150
Qg, Total Gate Charge (nC) TJ, Junction Temperature (°C)

Figure 5. Gate Charge Figure 6. On–Resistance vs.


Junction Temperature

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NTHS5402T1

TYPICAL CHARACTERISTICS

20 0.10
TJ = 150°C

rDS(on),On–Resistance ( Ω )
10 0.08
I S,Source Current (A)

ID = 4.9 A
0.06

0.04
TJ = 25°C
0.02

1 0
0 0.2 0.4 0.6 0.8 1.0 1.2 0 2 4 6 8 10
VSD, Source–to–Drain Voltage (V) VGS, Gate–to–Source Voltage (V)

Figure 7. Source–Drain Diode Forward Voltage Figure 8. On–Resistance vs. Gate–to–Source


Voltage

0.4 50

0.2
40
ID = 250 µA
V GS (th),Varience (V)

–0.0
Power (W)

30
–0.2
20
–0.4

10
–0.6

–0.8 0
–50 –25 0 25 50 75 100 125 150 10–3 10–2 10 –1 1 10 100 600
TJ, Temperature (°C) Time (sec)

Figure 9. Threshold Voltage Figure 10. Single Pulse Power

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NTHS5402T1

TYPICAL CHARACTERISTICS

1
Normalized Effective Transient

Duty Cycle = 0.5


Thermal Impedance

Notes:
PDM
0.2
t1
0.1 t2
0.1
0.05 t1
1. Duty Cycle, D = t
2
0.02 2. Per Unit Base = RthJA = 80°C/W
3. TJM – TA = PDMZthJA(t)
Single Pulse 4. Surface Mounted
0.01
10–4 10–3 10–2 10 –1 1 10 100 600
Square Wave Pulse Duration (sec)

Figure 11. Normalized Thermal Transient Impedance, Junction–to–Ambient

2
Normalized Effective Transient

1
Duty Cycle = 0.5
Thermal Impedance

0.2

0.1
0.1
0.05

0.02

Single Pulse
0.01
10–4 10–3 10–2 10 –1 1 10
Square Wave Pulse Duration (sec)
Figure 12. Normalized Thermal Transient Impedance, Junction–to–Foot

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NTHS5402T1

80 mm 80 mm

18 mm
25 mm
68 mm

28 mm 28 mm
26 mm 26 mm

Figure 13. Figure 14.

BASIC PAD PATTERNS


The basic pad layout with dimensions is shown in confines of the basic footprint. The drain copper area is
Figure 13. This is sufficient for low power dissipation 0.0054 sq. in. (or 3.51 sq. mm). This will assist the power
MOSFET applications, but power semiconductor dissipation path away from the device (through the copper
performance requires a greater copper pad area, leadframe) and into the board and exterior chassis (if
particularly for the drain leads. applicable) for the single device. The addition of a further
The minimum recommended pad pattern shown in copper area and/or the addition of vias to other board layers
Figure 14 improves the thermal area of the drain will enhance the performance still further.
connections (pins 1, 2, 3, 6, 7, 8) while remaining within the

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PRODUCT SUMMARY S

VDS (V) rDS(on) (Ω) ID (A) N–Channel MOSFET

0.030 @ VGS = 4.5 V "7.2


20
0.045 @ VGS = 2.5 V "5.9

MAXIMUM RATINGS (TA = 25°C unless otherwise noted) ChipFET


Steady CASE 1206A
Rating Symbol 5 secs State Unit STYLE 1

Drain–Source Voltage VDS 20 V


Gate–Source Voltage VGS "12 V PIN CONNECTIONS
Continuous Drain Current ID A
(TJ = 150°C) (Note 1.)
TA = 25°C "7.2 "5.2 D 8 1 D
TA = 85°C "5.2 "3.8
D 7 2 D
Pulsed Drain Current IDM "20 A
D 6 3 D
Continuous Source Current IS 2.1 1.1 A
(Diode Conduction) (Note 1.) S 5 4 G
Maximum Power Dissipation PD W
(Note 1.)
TA = 25°C 2.5 1.3
TA = 85°C 1.3 0.7 MARKING DIAGRAM
Operating Junction and Storage TJ, Tstg –55 to +150 °C
Temperature Range
1. Surface Mounted on 1″ x 1″ FR4 Board. A2

A2 = Specific Device Code

ORDERING INFORMATION

Device Package Shipping

This document contains information on a product under development. ON Semiconductor


NTHS5404T1 ChipFET 3000/Tape & Reel
reserves the right to change or discontinue this product without notice.

 Semiconductor Components Industries, LLC, 2000 106 Publication Order Number:


December, 2000 – Rev. 0 NTHS5404T1/D
NTHS5404T1

THERMAL CHARACTERISTICS
Characteristic Symbol Typ Max Unit
Maximum Junction–to–Ambient (Note 2.) RthJA °C/W
t v 5 sec 40 50
Steady State 80 95
Maximum Junction–to–Foot (Drain) RthJF 15 20 °C/W
Steady State

ELECTRICAL CHARACTERISTICS (TJ = 25°C unless otherwise noted)


Characteristic Symbol Test Condition Min Typ Max Unit
Static
Gate Threshold Voltage VGS(th) VDS = VGS, ID = 250 µA 0.6 – – V
Gate–Body Leakage IGSS VDS = 0 V, VGS = "12 V – – "100 nA
Zero Gate Voltage Drain Current IDSS
SS VDS = 16 V, VGS = 0 V – – 1.0 µA
VDS = 16 V, VGS = 0 V, – – 5.0
TJ = 85°C

On–State Drain Current (Note 3.) ID(on) VDS w 5.0 V, VGS = 4.5 V 20 – – A
Drain–Source On–State Resistance (Note 3.) rDS(on)
S( ) VGS = 4.5 V, ID = 5.2 A – 0.025 0.030 Ω
VGS = 2.5 V, ID = 4.3 A – 0.038 0.045
Forward Transconductance (Note 3.) gfs VDS = 10 V, ID = 5.2 A – 20 – S
Diode Forward Voltage (Note 3.) VSD IS = 1.1 A, VGS = 0 V – 0.8 1.2 V
Dynamic (Note 4.)
Total Gate Charge Qg – 12 18 nC
VDS = 10 V
V, VGS = 4.5
4 5 V,
V
Gate–Source Charge Qgs – 2.4 –
ID = 5.2 A
Gate–Drain Charge Qgd – 3.2 –
Turn–On Delay Time td(on) – 20 30 ns
Rise Time tr VDD = 10 V, RL = 10 Ω – 40 60
ID ^ 1.0
1 0 A,
A VGEN = 4.5
4 5 V,
V
Turn–Off Delay Time td(off) RG = 6 Ω – 40 60
Fall Time tf – 15 23
Source–Drain Reverse Recovery Time trr IF = 1.1 A, di/dt = 100 A/µs – 30 60
2. Surface Mounted on 1″ x 1″ FR4 Board.
3. Pulse Test: Pulse Width v 300 µs, Duty Cycle v 2%.
4. Guaranteed by design, not subject to production testing.

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107
NTHS5404T1

80 mm 80 mm

18 mm
25 mm
68 mm

28 mm 28 mm
26 mm 26 mm

Figure 1. Figure 2.

BASIC PAD PATTERNS


The basic pad layout with dimensions is shown in the basic footprint. The drain copper area is 0.0054 sq. in.
Figure 1. This is sufficient for low power dissipation (or 3.51 sq. mm). This will assist the power dissipation path
MOSFET applications, but power semiconductor away from the device (through the copper leadframe) and
performance requires a greater copper pad area, into the board and exterior chassis (if applicable) for the
particularly for the drain leads. single device. The addition of a further copper area and/or
The minimum recommended pad pattern shown in the addition of vias to other board layers will enhance the
Figure 2 improves the thermal area of the drain connections performance still further.
(pins 1, 2, 3, 6, 7, 8) while remaining within the confines of

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PRODUCT SUMMARY
VDS (V) rDS(on) (Ω) ID (A) P–Channel MOSFET

0.055 @ VGS = –4.5 V "5.3

–20 0.06 @ VGS = –3.6 V "5.1


0.083 @ VGS = –2.5 V "4.3

ChipFET
MAXIMUM RATINGS (TA = 25°C unless otherwise noted) CASE 1206A
Steady STYLE 1
Rating Symbol 5 secs State Unit
Drain–Source Voltage VDS –20 V
Gate–Source Voltage VGS "12 V PIN CONNECTIONS
Continuous Drain Current ID A
(TJ = 150°C) (Note 1.)
D 8 1 D
TA = 25°C "5.3 "3.9
TA = 85°C "3.8 "2.8
D 7 2 D
Pulsed Drain Current IDM "20 A
D 6 3 D
Continuous Source Current IS –2.1 –1.1 A
(Note 1.) S 5 4 G
Maximum Power Dissipation PD W
(Note 1.)
TA = 25°C 2.5 1.3
MARKING DIAGRAM
TA = 85°C 1.3 0.7
Operating Junction and Storage TJ, Tstg –55 to +150 °C
Temperature Range
A3
1. Surface Mounted on 1″ x 1″ FR4 Board.

A3 = Specific Device Code

ORDERING INFORMATION

Device Package Shipping

This document contains information on a product under development. ON Semiconductor NTHS5441T1 ChipFET 3000/Tape & Reel
reserves the right to change or discontinue this product without notice.

 Semiconductor Components Industries, LLC, 2000 109 Publication Order Number:


December, 2000 – Rev. 0 NTHS5441T1/D
NTHS5441T1

THERMAL CHARACTERISTICS
Characteristic Symbol Typ Max Unit
Maximum Junction–to–Ambient (Note 2.) RthJA °C/W
t v 5 sec 40 50
Steady State 80 95
Maximum Junction–to–Foot (Drain) RthJF 15 20 °C/W
Steady State

ELECTRICAL CHARACTERISTICS (TJ = 25°C unless otherwise noted)


Characteristic Symbol Test Condition Min Typ Max Unit
Static
Gate Threshold Voltage VGS(th) VDS = VGS, ID = –250 µA –0.6 – – V
Gate–Body Leakage IGSS VDS = 0 V, VGS = "12 V – – "100 nA
Zero Gate Voltage Drain Current IDSS
SS VDS = –16 V, VGS = 0 V – – –1.0 µA
VDS = –16 V, VGS = 0 V, – – –5.0
TJ = 85°C

On–State Drain Current (Note 3.) ID(on) VDS v –5.0 V, VGS = –4.5 V –20 – – A
Drain–Source On–State Resistance (Note 3.) rDS(on)
S( ) VGS = –3.6 V, ID = –3.7 A – 0.050 0.06 Ω
VGS = –2.5 V, ID = –3.1 A – 0.070 0.083
Forward Transconductance (Note 3.) gfs VDS = –10 V, ID = –3.9 A – 12 – S
Diode Forward Voltage (Note 3.) VSD IS = –1.1 A, VGS = 0 V – –0.8 –1.2 V
Dynamic (Note 4.)
Total Gate Charge Qg – 11 22 nC
VDS = –10
10 V
V, VGS = –4.5
45V V,
Gate–Source Charge Qgs – 3.0 –
ID = –3.9 A
Gate–Drain Charge Qgd – 2.5 –
Turn–On Delay Time td(on) – 20 30 ns
Rise Time tr VDD = –10 V, RL = 10 Ω – 35 55
ID ^ –1.0
–1 0 A
A, VGEN = –4
–4.5
5VV,
Turn–Off Delay Time td(off) RG = 6 Ω – 65 100
Fall Time tf – 45 70
Source–Drain Reverse Recovery Time trr IF = –1.1 A, di/dt = 100 A/µs – 30 60
2. Surface Mounted on 1″ x 1″ FR4 Board.
3. Pulse Test: Pulse Width v 300 µs, Duty Cycle v 2%.
4. Guaranteed by design, not subject to production testing.

http://onsemi.com
110
NTHS5441T1

80 mm 80 mm

18 mm
25 mm
68 mm

28 mm 28 mm
26 mm 26 mm

Figure 1. Figure 2.

BASIC PAD PATTERNS


The basic pad layout with dimensions is shown in the basic footprint. The drain copper area is 0.0054 sq. in.
Figure 1. This is sufficient for low power dissipation (or 3.51 sq. mm). This will assist the power dissipation path
MOSFET applications, but power semiconductor away from the device (through the copper leadframe) and
performance requires a greater copper pad area, into the board and exterior chassis (if applicable) for the
particularly for the drain leads. single device. The addition of a further copper area and/or
The minimum recommended pad pattern shown in the addition of vias to other board layers will enhance the
Figure 2 improves the thermal area of the drain connections performance still further.
(pins 1, 2, 3, 6, 7, 8) while remaining within the confines of

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D
PRODUCT SUMMARY
VDS (V) RDS(on) (Ω) ID (A) P–Channel MOSFET

0.065 @ VGS = –4.5 V "4.9

–20 0.074 @ VGS = –3.6 V "4.6


0.110 @ VGS = –2.5 V "3.8

ChipFET
MAXIMUM RATINGS (TA = 25°C unless otherwise noted) CASE 1206A
STYLE 1
Steady
Rating Symbol 5 secs State Unit
Drain–Source Voltage VDS –20 V
PIN CONNECTIONS
Gate–Source Voltage VGS "12 V
Continuous Drain Current ID A
(TJ = 150°C) (Note 1.) D 8 1 D
TA = 25°C "4.9 "3.6
TA = 85°C "3.5 "2.6 D 7 2 D

Pulsed Drain Current IDM "15 A D 6 3 D


Continuous Source Current IAS –2.1 –1.1 A S 5 4 G
(Note 1.)
Maximum Power Dissipation PD W
(Note 1.)
TA = 25°C 2.5 1.3 MARKING DIAGRAM
TA = 85°C 1.3 0.7
Operating Junction and Storage TJ, Tstg –55 to +150 °C
Temperature Range A4
1. Surface Mounted on 1″ x 1″ FR4 Board.

A4 = Specific Device Code

ORDERING INFORMATION

Device Package Shipping

This document contains information on a product under development. ON Semiconductor NTHS5443T1 ChipFET 3000/Tape & Reel
reserves the right to change or discontinue this product without notice.

 Semiconductor Components Industries, LLC, 2001 112 Publication Order Number:


January, 2001 – Rev. 1 NTHS5443T1/D
NTHS5443T1

THERMAL CHARACTERISTICS
Characteristic Symbol Typ Max Unit
Maximum Junction–to–Ambient (Note 2.) RthJA °C/W
t v 5 sec 40 50
Steady State 80 95
Maximum Junction–to–Foot (Drain) RthJF 15 20 °C/W
Steady State

ELECTRICAL CHARACTERISTICS (TJ = 25°C unless otherwise noted)


Characteristic Symbol Test Condition Min Typ Max Unit
Static
Gate Threshold Voltage VGS(th) VDS = VGS, ID = –250 µA –0.6 – – V
Gate–Body Leakage IGSS VDS = 0 V, VGS = "12 V – – "100 nA
Zero Gate Voltage Drain Current IDSS
SS VDS = –16 V, VGS = 0 V – – –1.0 µA
VDS = –16 V, VGS = 0 V, – – –5.0
TJ = 85°C

On–State Drain Current (Note 3.) ID(on) VDS v –5.0 V, VGS = –4.5 V –15 – – A
Drain–Source On–State Resistance rDS(on)
S( ) VGS = –4.5 V, ID = –3.6 A – 0.056 0.065 Ω
(N t 3
(Note 3.))
VGS = –3.6 V, ID = –3.3 A – 0.065 0.074
VGS = –2.5 V, ID = –2.7 A – 0.095 0.110
Forward Transconductance (Note 3.) gfs VDS = –10 V, ID = –3.6 A – 10 – S
Diode Forward Voltage (Note 3.) VSD IS = –1.1 A, VGS = 0 V – –0.8 –1.2 V
Dynamic (Note 4.)
Total Gate Charge Qg – 9.0 14 nC
10 V
VDS = –10 V, VGS = –4.5
45V V,
Gate–Source Charge Qgs – 2.2 –
ID = –3.6 A
Gate–Drain Charge Qgd – 2.2 –
Turn–On Delay Time td(on) – 15 25 µs
Rise Time tr VDD = –10 V, RL = 10 Ω – 30 45
ID ^ –1.0
–1 0 A
A, VGEN = –4
–4.5
5VV,
Turn–Off Delay Time td(off) RG = 6 Ω – 50 75
Fall Time tf – 35 50
Source–Drain Reverse Recovery Time trr IF = –1.1 A, di/dt = 100 A/µs – 30 60 ns
2. Surface Mounted on 1″ x 1″ FR4 Board.
3. Pulse Test: Pulse Width v 300 µs, Duty Cycle v 2%.
4. Guaranteed by design, not subject to production testing.

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PRODUCT SUMMARY D

VDS (V) rDS(on) (Ω) ID (A) P–Channel MOSFET


0.035 @ VGS = –4.5 V "7.1

–8.0 0.047 @ VGS = –2.5 V "6.2


0.062 @ VGS = –1.8 V "5.7

MAXIMUM RATINGS (TA = 25°C unless otherwise noted) ChipFET


Steady CASE 1206A
Rating Symbol 5 secs State Unit STYLE 1

Drain–Source Voltage VDS –8.0 V


Gate–Source Voltage VGS "8.0 V
PIN CONNECTIONS
Continuous Drain Current ID A
(TJ = 150°C) (Note 1.)
TA = 25°C "7.1 "5.2 D 8 1 D
TA = 85°C "5.2 "3.7
D 7 2 D
Pulsed Drain Current IDM "20 A
Continuous Source Current IS –2.1 –1.1 A D 6 3 D
(Note 1.)
S 5 4 G
Maximum Power Dissipation PD W
(Note 1.)
TA = 25°C 2.5 1.3
TA = 85°C 1.3 0.7 MARKING DIAGRAM
Operating Junction and Storage TJ, Tstg –55 to +150 °C
Temperature Range
A5
1. Surface Mounted on 1″ x 1″ FR4 Board.

A5 = Specific Device Code

ORDERING INFORMATION

Device Package Shipping


This document contains information on a product under development. ON Semiconductor NTHS5445T1 ChipFET 3000/Tape & Reel
reserves the right to change or discontinue this product without notice.

 Semiconductor Components Industries, LLC, 2001 114 Publication Order Number:


January, 2001 – Rev. 1 NTHS5445T1/D
NTHS5445T1

THERMAL CHARACTERISTICS
Characteristic Symbol Typ Max Unit
Maximum Junction–to–Ambient (Note 2.) RthJA °C/W
t v 5 sec 40 50
Steady State 80 95
Maximum Junction–to–Foot (Drain) RthJF 15 20 °C/W
Steady State

ELECTRICAL CHARACTERISTICS (TJ = 25°C unless otherwise noted)


Characteristic Symbol Test Condition Min Typ Max Unit
Static
Gate Threshold Voltage VGS(th) VDS = VGS, ID = –250 µA –0.45 – – V
Gate–Body Leakage IGSS VDS = 0 V, VGS = "8.0 V – – "100 nA
Zero Gate Voltage Drain Current IDSS
SS VDS = –6.4 V, VGS = 0 V – – –1.0 µA
VDS = –6.4 V, VGS = 0 V, – – –5.0
TJ = 85°C

On–State Drain Current (Note 3.) ID(on) VDS v –5.0 V, VGS = –4.5 V –20 – – A
Drain–Source On–State Resistance (Note 3.) rDS(on)
S( ) VGS = –4.5 V, ID = –5.2 A – 0.030 0.035 Ω
VGS = –2.5 V, ID = –4.5 A – 0.040 0.047
VGS = –1.8 V, ID = –2.0 A – 0.052 0.062
Forward Transconductance (Note 3.) gfs VDS = –5.0 V, ID = –5.2 A – 18 – S
Diode Forward Voltage (Note 3.) VSD IS = –1.1 A, VGS = 0 V – –0.8 –1.2 V
Dynamic (Note 4.)
Total Gate Charge Qg – 17 26 nC
40V
VDS = –4.0 V, VGS = –4.5
45V V,
Gate–Source Charge Qgs – 2.8 –
ID = –5.2 A
Gate–Drain Charge Qgd – 2.6 –
Turn–On Delay Time td(on) – 15 25 ns
Rise Time tr VDD = –4.0 V, RL = 4 Ω – 45 70
ID ^ –1.0
–1 0 A
A, VGEN = –4
–4.5
5VV,
Turn–Off Delay Time td(off) RG = 6 Ω – 110 165
Fall Time tf – 65 100
Source–Drain Reverse Recovery Time trr IF = –1.1 A, di/dt = 100 A/µs – 30 60
2. Surface Mounted on 1″ x 1″ FR4 Board.
3. Pulse Test: Pulse Width v 300 µs, Duty Cycle v 2%.
4. Guaranteed by design, not subject to production testing.

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NTHS5445T1

TYPICAL ELECTRICAL CHARACTERISTICS

20 20
VGS = 5 thru 2.5 V TC = –55°C

16 2V 16 25°C

ID,Drain Current (A)


ID,Drain Current (A)

12 12 125°C

8 8
1.5 V
4 4

1V
0 0
0 0.5 1.0 1.5 2.0 2.5 3.0 0 0.5 1.0 1.5 2.0 2.5
VDS, Drain–to–Source Voltage (V) VGS, Gate–to–Source Voltage (V)
Figure 1. Output Characteristics Figure 2. Transfer Characteristics

0.10 3000
r DS(on),On–Resistance ( Ω )

2500
0.08 VGS = 1.8 V Ciss
C, Capacitance (pF)

2000
0.06
VGS = 2.5 V 1500
0.04 VGS = 4.5 V Coss
1000

0.02
500
Crss

0 0
0 4 8 12 16 20 0 2 4 6 8
ID, Drain Current (A) VDS, Drain–to–Source Voltage (V)
Figure 3. On–Resistance vs. Drain Current Figure 4. Capacitance

5 1.6
VGS,Gate–to–Source Voltage (V)

r DS(on),On–Resistance ( Ω )

VDS = 4 V VGS = 4.5 V


4 ID = 5.2 A 1.4
ID = 5.2 A
(Normalized)

3 1.2

2 1.0

1 0.8

0 0.6
0 4 8 12 16 20 –50 –25 0 25 50 75 100 125 150
Qg, Total Gate Charge (nC) TJ, Junction Temperature (°C)
Figure 5. Gate Charge Figure 6. On–Resistance vs. Junction
Temperature

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NTHS5445T1

TYPICAL ELECTRICAL CHARACTERISTICS

20 0.10

rDS(on),On–Resistance ( Ω )
TJ = 150°C
10 0.08
I S,Source Current (A)

0.06 ID = 5.2 A

0.04
TJ = 25°C
0.02

1 0
0 0.2 0.4 0.6 0.8 1.0 1.2 0 1 2 3 4 5
VDS, Drain–to–Source Voltage (V) VGS, Gate–to–Source Voltage (V)

Figure 7. Source–Drain Diode Forward Voltage Figure 8. On–Resistance vs. Gate–to–Source


Voltage

0.4 50

0.3
40
ID = 250 µA
V GS (th),Varience (V)

0.2
Power (W)

30
0.1
20
0.0

10
–0.1

–0.2 0
–50 –25 0 25 50 75 100 125 150 10–3 10–2 10 –1 1 10 100 600
TJ, Temperature (°C) Time (sec)
Figure 9. Threshold Voltage Figure 10. Single Pulse Power

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NTHS5445T1

TYPICAL ELECTRICAL CHARACTERISTICS


2

1
Normalized Effective Transient

Duty Cycle = 0.5


Thermal Impedance

Notes:
PDM
0.2
t1
0.1 t2
0.1
0.05 t1
1. Duty Cycle, D = t
2
0.02 2. Per Unit Base = RthJA = 80°C/W
3. TJM – TA = PDMZthJA(t)
Single Pulse 4. Surface Mounted
0.01
10–4 10–3 10–2 10 –1 1 10 100 600
Square Wave Pulse Duration (sec)

Figure 11. Normalized Thermal Transient Impedance, Junction–to–Ambient

2
Normalized Effective Transient

1
Duty Cycle = 0.5
Thermal Impedance

0.2

0.1
0.1
0.05

0.02

Single Pulse
0.01
10–4 10–3 10–2 10 –1 1 10
Square Wave Pulse Duration (sec)
Figure 12. Normalized Thermal Transient Impedance, Junction–to–Foot

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NTHS5445T1

80 mm 80 mm

18 mm
25 mm
68 mm

28 mm 28 mm
26 mm 26 mm

Figure 13. Figure 14.

BASIC PAD PATTERNS


The basic pad layout with dimensions is shown in confines of the basic footprint. The drain copper area is
Figure 13. This is sufficient for low power dissipation 0.0054 sq. in. (or 3.51 sq. mm). This will assist the power
MOSFET applications, but power semiconductor dissipation path away from the device (through the copper
performance requires a greater copper pad area, leadframe) and into the board and exterior chassis (if
particularly for the drain leads. applicable) for the single device. The addition of a further
The minimum recommended pad pattern shown in copper area and/or the addition of vias to other board layers
Figure 14 improves the thermal area of the drain will enhance the performance still further.
connections (pins 1, 2, 3, 6, 7, 8) while remaining within the

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!#!

 

#$%& '(
!-  !  
Dual P–Channel SO–8
Features
http://onsemi.com
• High Efficiency Components in a Dual SO–8 Package
• High Density Power MOSFET with Low RDS(on)
• Miniature SO–8 Surface Mount Package – Saves Board Space –3.05 AMPERES
• Diode Exhibits High Speed with Soft Recovery –30 VOLTS
• IDSS Specified at Elevated Temperature
• Avalanche Energy Specified
0.085 W @ VGS = –10 V
• Mounting Information for the SO–8 Package is Provided
P–Channel
Applications
• DC–DC Converters D
• Low Voltage Motor Control
• Power Management in Portable and Battery–Powered Products, i.e.:
Computers, Printers, PCMCIA Cards, Cellular & Cordless Telephones
G
MOSFET MAXIMUM RATINGS (TJ = 25°C unless otherwise noted)
Rating Symbol Value Unit S
Drain–to–Source Voltage VDSS –30 V
Gate–to–Source Voltage – Continuous VGS ±20 V MARKING
DIAGRAM
Thermal Resistance –
Junction–to–Ambient (Note 1.) RθJA 171 °C/W
Total Power Dissipation @ TA = 25°C PD 0.73 W
SO–8 ED3P03
Continuous Drain Current @ 25°C ID –2.34 A
CASE 751 LYWW
Continuous Drain Current @ 70°C ID –1.87 A 8
STYLE 11
Pulsed Drain Current (Note 4.) IDM –8.0 A
Thermal Resistance – 1
Junction–to–Ambient (Note 2.) RθJA 100 °C/W
Total Power Dissipation @ TA = 25°C PD 1.25 W ED3P03 = Device Code
Continuous Drain Current @ 25°C ID –3.05 A L = Assembly Location
Continuous Drain Current @ 70°C ID –2.44 A Y = Year
Pulsed Drain Current (Note 4.) IDM –12 A WW = Work Week
Thermal Resistance –
Junction–to–Ambient (Note 3.) RθJA 62.5 °C/W PIN ASSIGNMENT
Total Power Dissipation @ TA = 25°C PD 2.0 W
Continuous Drain Current @ 25°C ID –3.86 A
Source–1 1 8 Drain–1
Continuous Drain Current @ 70°C ID –3.1 A
Pulsed Drain Current (Note 4.) IDM –15 A Gate–1 2 7 Drain–1
Operating and Storage TJ, Tstg –55 to °C Source–2 3 6 Drain–2
Temperature Range +150
Gate–2 4 5 Drain–2
Single Pulse Drain–to–Source Avalanche EAS 140 mJ
Energy – Starting TJ = 25°C Top View
(VDD = –30 Vdc, VGS = –4.5 Vdc, Peak
IL = –7.5 Apk, L = 5 mH, RG = 25 Ω) ORDERING INFORMATION
Maximum Lead Temperature for Soldering TL 260 °C
Purposes, 1/8″ from case for 10 seconds Device Package Shipping
1. Minimum FR–4 or G–10 PCB, t = Steady State.
NTMD3P03R2 SO–8 2500/Tape & Reel
2. Mounted onto a 2″ square FR–4 Board (1″ sq. 2 oz Cu 0.06″ thick single
sided), t = steady state.
3. Mounted onto a 2″ square FR–4 Board (1″ sq. 2 oz Cu 0.06″ thick single This document contains information on a product under
sided), t ≤ 10 seconds. development. ON Semiconductor reserves the right to
4. Pulse Test: Pulse Width = 300 ms, Duty Cycle = 2%. change or discontinue this product without notice.

 Semiconductor Components Industries, LLC, 2001 120 Publication Order Number:


January, 2001 – Rev. 0 NTMD3P03R2/D
NTMD3P03R2

ELECTRICAL CHARACTERISTICS (TJ = 25°C unless otherwise noted) (Note 5.)


Characteristic Symbol Min Typ Max Unit
OFF CHARACTERISTICS
Drain–to–Source Breakdown Voltage V(BR)DSS Vdc
(VGS = 0 Vdc, ID = –250 µAdc) –30 – –
Temperature Coefficient (Positive) – –30 – mV/°C
Zero Gate Voltage Drain Current IDSS µAdc
(VDS = –24 Vdc, VGS = 0 Vdc, TJ = 25°C) – – –1.0
(VDS = –24 Vdc, VGS = 0 Vdc, TJ = 125°C) – – –20
(VDS = –30 Vdc, VGS = 0 Vdc, TJ = 25°C) – – –2.0
Gate–Body Leakage Current IGSS nAdc
(VGS = –20 Vdc, VDS = 0 Vdc) – – –100
Gate–Body Leakage Current IGSS nAdc
(VGS = +20 Vdc, VDS = 0 Vdc) – – 100

ON CHARACTERISTICS
Gate Threshold Voltage VGS(th) Vdc
(VDS = VGS, ID = –250 µAdc) –1.0 –1.7 –2.5
Temperature Coefficient (Negative) – 3.6 –
Static Drain–to–Source On–State Resistance RDS(on) Ω
(VGS = –10 Vdc, ID = –3.05 Adc) – 0.063 0.085
(VGS = –4.5 Vdc, ID = –1.5 Adc) – 0.090 0.125
Forward Transconductance (VDS = –15 Vdc, ID = –3.05 Adc) gFS – 5.0 – Mhos
DYNAMIC CHARACTERISTICS
Input Capacitance Ciss – 520 750 pF
Output Capacitance (VDS = –24
24 Vdc,
Vd VGS = 0 Vdc,
Vd
Coss – 170 325
f = 1.0 MHz)
Reverse Transfer Capacitance Crss – 70 135
SWITCHING CHARACTERISTICS (Notes 6. and 7.)
Turn–On Delay Time td(on) – 12 22 ns
Rise Time (VDD = –24 Vdc, ID = –3.05 Adc, tr – 16 30
VGS = –10
10 Vdc
Vdc,
Turn–Off Delay Time RG = 6.0 Ω) td(off) – 45 80
Fall Time tf – 45 80
Turn–On Delay Time td(on) – 16 – ns
Rise Time (VDD = –24 Vdc, ID = –1.5 Adc, tr – 42 –
VGS = –4.5
4 5 Vdc,
Vdc
Turn–Off Delay Time RG = 6.0 Ω) td(off) – 32 –
Fall Time tf – 35 –
Total Gate Charge Qtot – 16 25 nC
(VDS = –24 Vdc,
Gate–Source Charge VGS = –10 Vdc, Qgs – 2.0 –
ID = –3.05
3 05 Adc)
Ad )
Gate–Drain Charge Qgd – 4.5 –

BODY–DRAIN DIODE RATINGS (Note 6.)


Diode Forward On–Voltage (IS = –3.05 Adc, VGS = 0 V) VSD – –0.96 –1.25 Vdc
(IS = –3.05 Adc, VGS = 0 V, TJ = 125°C) – –0.78 –
Reverse Recovery Time trr – 34 – ns
(IS = –3.05
3 05 Adc,
Ad VGS = 0 Vdc,
Vd
ta – 18 –
dIS/dt = 100 A/µs)
tb – 16 –
Reverse Recovery Stored Charge QRR – 0.03 – µC
5. Handling precautions to protect against electrostatic discharge is mandatory.
6. Indicates Pulse Test: Pulse Width = 300 µs max, Duty Cycle = 2%.
7. Switching characteristics are independent of operating junction temperature.

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NTMD3P03R2

TYPICAL ELECTRICAL CHARACTERISTICS

6 6
VGS = –10 V
VGS = –4.4 V VDS > = –10 V
–ID, DRAIN CURRENT (AMPS)

–ID, DRAIN CURRENT (AMPS)


5 VGS = –8 V 5
VGS = –4 V
VGS = –6 V
VGS = –4.6 V
4 4
TJ = 25°C VGS = –4.8 V TJ = 100°C
3 VGS = –3.6 V 3
VGS = –2.8 V
VGS = –3.2 V TJ = 25°C
2 VGS = –5 V 2
VGS = –3 V TJ = –55°C
VGS = –2.6 V
1 1

0 0
0 0.25 0.5 0.75 1 1.25 1.5 1.75 2 1 2 3 4 5
–VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS) –VGS, GATE–TO–SOURCE VOLTAGE (VOLTS)

Figure 1. On–Region Characteristics Figure 2. Transfer Characteristics


RDS(on), DRAIN–TO–SOURCE RESISTANCE (Ω)

RDS(on), DRAIN–TO–SOURCE RESISTANCE (Ω)


0.7 0.7
ID = –3.05 A ID = –1.5 A
0.6 TJ = 25°C 0.6 TJ = 25°C

0.5 0.5

0.4 0.4

0.3 0.3

0.2 0.2

0.1 0.1

0 0
3 4 5 6 7 8 2 3 4 5 6 7
–VGS, GATE–TO–SOURCE VOLTAGE (VOLTS) –VGS, GATE–TO–SOURCE VOLTAGE (VOLTS)
Figure 3. On–Resistance vs. Gate–to–Source Figure 4. On–Resistance vs. Gate–to–Source
Voltage Voltage
RDS(on), DRAIN–TO–SOURCE RESISTANCE (Ω)

RDS(on), DRAIN–TO–SOURCE RESISTANCE

0.25 1.6
ID = –3.05 A
TJ = 25°C VGS = –10 V
1.4
0.2 VGS = –4.5 V
(NORMALIZED)

1.2
0.15
1
VGS = –10 V

0.1
0.8

0.05 0.6
1 2 3 4 5 6 –50 –25 0 25 50 75 100 125 150
–ID, DRAIN CURRENT (AMPS) TJ, JUNCTION TEMPERATURE (°C)

Figure 5. On–Resistance vs. Drain Current and Figure 6. On Resistance Variation with
Gate Voltage Temperature

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NTMD3P03R2

10000
VGS = 0 V VDS = 0 V VGS = 0 V
1200
Ciss

C, CAPACITANCE (pF)
TJ = 150°C 1000
IDSS, LEAKAGE (nA)

1000
800

Ciss
TJ = 125°C 600 Crss

100 400
Coss
200
Crss
TJ = 25°C
10 0
6 10 14 18 22 26 30 10 5 0 5 10 15 20 25 30
–VGS –VDS
–VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS) GATE–TO–SOURCE OR DRAIN–TO–SOURCE
VOLTAGE (VOLTS)
Figure 7. Drain–to–Source Leakage Current Figure 8. Capacitance Variation
vs. Voltage
–VGS, GATE–TO–SOURCE VOLTAGE (VOLTS)

12 30 1000
VDS = –24 V
QT ID = –3.05 A
10 25
VGS = –10 V
VDS
8 20 100
t, TIME (ns)

VGS td(off)

6 15 tf
Q1 tr
4 Q2 10 10
td(on)
2 5
ID = –3.05 A
TJ = 25°C
0 0 1
0 2 4 6 8 10 12 14 16 1 10 100
Qg, TOTAL GATE CHARGE (nC) RG, GATE RESISTANCE (Ω)

Figure 9. Gate–to–Source and Figure 10. Resistive Switching Time Variation


Drain–to–Source Voltage vs. Total Charge vs. Gate Resistance

1000 3
VDS = –24 V VGS = 0 V
IS, SOURCE CURRENT (AMPS)

ID = –1.5 A TJ = 25°C
2.5
VGS = –4.5 V

2
t, TIME (ns)

100 1.5
tr
td(off)
tf 1
td(on)

0.5

10 0
1 10 100 0.2 0.4 0.6 0.8 1 1.2
RG, GATE RESISTANCE (Ω) –VSD, DRAIN–TO–SOURCE VOLTAGE (VOLTS)

Figure 11. Resistive Switching Time Variation Figure 12. Diode Forward Voltage vs. Current
vs. Gate Resistance

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NTMD3P03R2

100
VGS = 12 V
SINGLE PULSE
–ID, DRAIN CURRENT (AMPS)

1.0 ms
TC = 25°C
10

10 ms di/dt
IS
1.0 dc
trr
ta tb
0.1 TIME
RDS(on) LIMIT
THERMAL LIMIT tp 0.25 IS
PACKAGE LIMIT
0.01 IS
1 1.0 10 100
–VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS)

Figure 13. Maximum Rated Forward Biased Figure 14. Diode Reverse Recovery Waveform
Safe Operating Area

1.0
D = 0.5
Rthja(t), EFFECTIVE TRANSIENT
THERMAL RESPONSE

0.2

0.1
0.1
0.05 Chip Normalized to RθJA at Steady State (1″ pad)
Junction 2.32 Ω 18.5 Ω 50.9 Ω 37.1 Ω 56.8 Ω 24.4 Ω
0.02

0.01 0.0014 F 0.0073 F 0.022 F 0.105 F 0.484 F 3.68 F


Single Pulse Ambient
0.01
1E–03 1E–02 1E–01 1E+00 1E+01 1E+02 1E+03
t, TIME (s)

Figure 15. FET Thermal Response

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NTMD3P03R2

INFORMATION FOR USING THE SO–8 SURFACE MOUNT PACKAGE

MINIMUM RECOMMENDED FOOTPRINT FOR SURFACE MOUNTED APPLICATIONS


Surface mount board layout is a critical portion of the total interface between the board and the package. With the
design. The footprint for the semiconductor packages must correct pad geometry, the packages will self–align when
be the correct size to ensure proper solder connection subjected to a solder reflow process.

9
$#

#:$ $$
: 6

#6 $
9 #:
inches
mm

SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • The soldering temperature and time shall not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within • When shifting from preheating to soldering, the
a short time could result in device failure. Therefore, the maximum temperature gradient shall be 5°C or less.
following items should always be observed in order to • After soldering has been completed, the device should
minimize the thermal stress to which the devices are be allowed to cool naturally for at least three minutes.
subjected. Gradual cooling should be used as the use of forced
• Always preheat the device. cooling will increase the temperature gradient and
• The delta temperature between the preheat and result in latent failure due to mechanical stress.
soldering should be 100°C or less.* • Mechanical stress or shock should not be applied
• When preheating and soldering, the temperature of the during cooling.
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When * Soldering a device without preheating can cause
using infrared heating with the reflow soldering excessive thermal shock and stress which can result in
method, the difference shall be a maximum of 10°C. damage to the device.

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NTMD3P03R2

TYPICAL SOLDER HEATING PROFILE


For any given circuit board, there will be a group of temperature versus time. The line on the graph shows the
control settings that will give the desired heat pattern. The actual temperature that might be experienced on the surface
operator must set temperatures for several heating zones of a test board at or near a central solder joint. The two
and a figure for belt speed. Taken together, these control profiles are based on a high density and a low density
settings make up a heating “profile” for that particular board. The Vitronics SMD310 convection/infrared reflow
circuit board. On machines controlled by a computer, the soldering system was used to generate this profile. The type
computer remembers these profiles from one operating of solder used was 62/36/2 Tin Lead Silver with a melting
session to the next. Figure 16 shows a typical heating point between 177–189°C. When this type of furnace is
profile for use when soldering a surface mount device to a used for solder reflow work, the circuit boards and solder
printed circuit board. This profile will vary among joints tend to heat first. The components on the board are
soldering systems, but it is a good starting point. Factors then heated by conduction. The circuit board, because it has
that can affect the profile include the type of soldering a large surface area, absorbs the thermal energy more
system in use, density and types of components on the efficiently, then distributes this energy to the components.
board, type of solder used, and the type of board or Because of this effect, the main body of a component may
substrate material being used. This profile shows be up to 30 degrees cooler than the adjacent solder joints.

STEP 1 STEP 2 STEP 3 STEP 4 STEP 5 STEP 6 STEP 7


PREHEAT VENT HEATING HEATING HEATING VENT COOLING
ZONE 1 “SOAK” ZONES 2 & 5 ZONES 3 & 6 ZONES 4 & 7
“RAMP” “RAMP” “SOAK” “SPIKE” 205° TO 219°C
PEAK AT
200°C DESIRED CURVE FOR HIGH 170°C SOLDER
MASS ASSEMBLIES JOINT
160°C
150°C

150°C
SOLDER IS LIQUID FOR
40 TO 80 SECONDS
100°C 140°C (DEPENDING ON
MASS OF ASSEMBLY)
100°C

DESIRED CURVE FOR LOW


MASS ASSEMBLIES
5°C

TIME (3 TO 7 MINUTES TOTAL) TMAX


Figure 16. Typical Solder Heating Profile

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126
 

 

#$%& '(
-    
N–Channel Enhancement Mode
Dual SO–8 Package http://onsemi.com
Features
• Ultra Low RDS(on)
• Higher Efficiency Extending Battery Life 6.0 AMPERES
• Logic Level Gate Drive 20 VOLTS
• Miniature Dual SO–8 Surface Mount Package
• Diode Exhibits High Speed, Soft Recovery
35 mW @ VGS = 4.5 V
• Avalanche Energy Specified
• SO–8 Mounting Information Provided N–Channel
Applications D
• DC–DC Converters
• Low Voltage Motor Control
• Power Management in Portable and Battery–Powered Products, i.e.:
Computers, Printers, Cellular and Cordless Telephones and PCMCIA G
Cards
MAXIMUM RATINGS (TJ = 25°C unless otherwise noted) S
Rating Symbol Value Unit
Drain–to–Source Voltage VDSS 20 V
Drain–to–Gate Voltage (RGS = 1.0 MW) VDGR 20 V 8
Gate–to–Source Voltage – Continuous VGS "12 V
1
Thermal Resistance –
Junction–to–Ambient (Note 1.) RθJA 62.5 °C/W SO–8
Total Power Dissipation @ TA = 25°C PD 2.0 W CASE 751
Continuous Drain Current @ TA = 25°C ID 6.5 A STYLE 11
Continuous Drain Current @ TA = 70°C ID 5.5 A
Pulsed Drain Current (Note 4.) IDM 20 A
MARKING DIAGRAM
Thermal Resistance – & PIN ASSIGNMENT
Junction–to–Ambient (Note 2.) RθJA 102 °C/W
1 8
Total Power Dissipation @ TA = 25°C PD 1.22 W Source 1 Drain 1
Continuous Drain Current @ TA = 25°C ID 5.07 A 2 7
Gate 1 E6N02 Drain 1
Continuous Drain Current @ TA = 70°C ID 4.07 A 3 6
Pulsed Drain Current (Note 4.) IDM 16 A Source 2 LYWW Drain 2
4 5
Gate 2 Drain 2
Thermal Resistance –
Junction–to–Ambient (Note 3.) RθJA 172 °C/W (Top View)
Total Power Dissipation @ TA = 25°C PD 0.73 W
Continuous Drain Current @ TA = 25°C ID 3.92 A
E6N02 = Device Code
Continuous Drain Current @ TA = 70°C ID 3.14 A
L = Assembly Location
Pulsed Drain Current (Note 4.) IDM 12 A
Y = Year
1. Mounted onto a 2″ square FR–4 Board (1″ sq. 2 oz. Cu 0.06″ thick single WW = Work Week
sided), t < 10 seconds.
2. Mounted onto a 2″ square FR–4 Board (1″ sq. 2 oz. Cu 0.06″ thick single
sided), t = steady state. ORDERING INFORMATION
3. Minimum FR–4 or G–10 PCB, t = steady state.
4. Pulse Test: Pulse Width = 300 ms, Duty Cycle = 2%. Device Package Shipping
This document contains information on a product under development. ON Semiconductor
NTMD6N02R2 SO–8 2500/Tape & Reel
reserves the right to change or discontinue this product without notice.

 Semiconductor Components Industries, LLC, 2000 127 Publication Order Number:


November, 2000 – Rev. 0 NTMD6N02R2/D
NTMD6N02R2

MAXIMUM RATINGS (TJ = 25°C unless otherwise noted) (continued)


Rating Symbol Value Unit
Operating and Storage Temperature Range TJ, Tstg –55 to +150 °C
Single Pulse Drain–to–Source Avalanche Energy – Starting TJ = 25°C EAS 360 mJ
(VDD = 20 Vdc, VGS = 5.0 Vdc, Peak IL = 6.0 Apk, L = 20 mH, RG = 25 Ω)
Maximum Lead Temperature for Soldering Purposes for 10 seconds TL 260 °C
ELECTRICAL CHARACTERISTICS (TC = 25°C unless otherwise noted) (Note 5.)
Characteristic Symbol Min Typ Max Unit
OFF CHARACTERISTICS
Drain–to–Source Breakdown Voltage V(BR)DSS Vdc
(VGS = 0 Vdc, ID = 250 µAdc) 20 – –
Temperature Coefficient (Positive) – 19.2 – mV/°C
Zero Gate Voltage Drain Current IDSS µAdc
(VDS = 20 Vdc, VGS = 0 Vdc, TJ = 25°C) – – 1.0
(VDS = 20 Vdc, VGS = 0 Vdc, TJ = 125°C) – – 10
Gate–Body Leakage Current (VGS = +12 Vdc, VDS = 0 Vdc) IGSS – – 100 nAdc
Gate–Body Leakage Current (VGS = –12 Vdc, VDS = 0 Vdc) IGSS – – –100 nAdc
ON CHARACTERISTICS
Gate Threshold Voltage VGS(th) Vdc
(VDS = VGS, ID = –250 µAdc) 0.6 0.9 1.2
Temperature Coefficient (Negative) – –3.0 – mV/°C
Static Drain–to–Source On–State Resistance RDS(on) Ω
(VGS = 4.5 Vdc, ID = 6.0 Adc) – 0.028 0.035
(VGS = 4.5 Vdc, ID = 4.0 Adc) – 0.028 0.043
(VGS = 2.7 Vdc, ID = 2.0 Adc) – 0.033 0.048
(VGS = 2.5 Vdc, ID = 3.0 Adc) – 0.035 0.049
Forward Transconductance (VDS = 12 Vdc, ID = 3.0 Adc) gFS – 10 – Mhos
DYNAMIC CHARACTERISTICS
Input Capacitance Ciss – 785 1100 pF
Output Capacitance (VDS = 16 Vd
Vdc, VGS = 0 Vd
Vdc,
Coss – 260 450
f = 1.0 MHz)
Reverse Transfer Capacitance Crss – 75 180

SWITCHING CHARACTERISTICS (Notes 6. and 7.)


Turn–On Delay Time td(on) – 12 20 ns
Rise Time (VDD = 16 Vdc, ID = 6.0 Adc, tr – 50 90
VGS = 4
4.55 Vdc
Vdc,
Turn–Off Delay Time RG = 6.0 Ω) td(off) – 45 75
Fall Time tf – 80 130
Turn–On Delay Time td(on) – 11 18 ns
Rise Time (VDD = 16 Vdc, ID = 4.0 Adc, tr – 35 65
VGS = 4
4.55 Vdc
Vdc,
Turn–Off Delay Time RG = 6.0 Ω) td(off) – 45 75
Fall Time tf – 60 110
Total Gate Charge Qtot – 12 20 nC
(VDS = 16 Vdc,
Gate–Source Charge VGS = 4.5 Vdc, Qgs – 1.5 –
ID = 6.0
6 0 Ad
Adc))
Gate–Drain Charge Qgd – 4.0 –
5. Handling precautions to protect against electrostatic discharge is mandatory
6. Indicates Pulse Test: Pulse Width = 300 µs max, Duty Cycle = 2%.
7. Switching characteristics are independent of operating junction temperature.

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128
NTMD6N02R2

ELECTRICAL CHARACTERISTICS (TC = 25°C unless otherwise noted) (continued) (Note 8.)
Characteristic Symbol Min Typ Max Unit
BODY–DRAIN DIODE RATINGS (Note 9.)
Diode Forward On–Voltage (IS = 4.0 Adc, VGS = 0 Vdc) VSD – 0.83 1.1 Vdc
(IS = 6.0 Adc, VGS = 0 Vdc) – 0.88 1.2
(IS = 6.0 Adc, VGS = 0 Vdc, TJ = 125°C) – 0.75 –
Reverse Recovery Time trr – 30 – ns
(IS = 6.0
6 0 Adc,
Ad VGS = 0 Vdc,
Vd
ta – 15 –
dIS/dt = 100 A/µs)
tb – 15 –
Reverse Recovery Stored Charge QRR – 0.02 – µC
8. Handling precautions to protect against electrostatic discharge is mandatory.
9. Indicates Pulse Test: Pulse Width = 300 µs max, Duty Cycle = 2%.

12 12
10 V 2.5 V 2.0 V
VDS ≥ 10 V
I D, DRAIN CURRENT (AMPS)

ID, DRAIN CURRENT (AMPS)


10 4.5 V 10
TJ = 25°C
3.2 V
8 8
1.8 V
6 6

4 25°C
4 100°C

2 VGS = 1.5 V 2 TJ = –55°C

0 0
0 0.25 0.5 0.75 1 1.25 1.5 1.75 0.5 1 1.5 2 2.5
VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS) VGS, GATE–TO–SOURCE VOLTAGE (VOLTS)

Figure 1. On–Region Characteristics Figure 2. Transfer Characteristics


R DS(on) , DRAIN–TO–SOURCE RESISTANCE (OHMS)

R DS(on) , DRAIN–TO–SOURCE RESISTANCE (OHMS)

0.07 0.05
ID = 6.0 A TJ = 25°C
0.06
TJ = 25°C
0.04
0.05
VGS = 2.5 V
0.04
0.03 4.5 V
0.03

0.02
0.02
0.01

0 0.01
0 2 4 6 8 10 1 3 5 7 9 11 13
VGS, GATE–TO–SOURCE VOLTAGE (VOLTS) ID, DRAIN CURRENT (AMPS)

Figure 3. On–Resistance versus Figure 4. On-Resistance versus Drain Current


Gate–To–Source Voltage and Gate Voltage

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129
NTMD6N02R2

RDS(on) , DRAIN–TO–SOURCE RESISTANCE


1.6 1000
VGS = 0 V
ID = 6.0 A TJ = 125°C
1.4 VGS = 4.5 V 100

I DSS , LEAKAGE (nA)


100°C
1.2 10
(NORMALIZED)

1 1 25°C

0.8 0.1

0.6 0.01
–50 –25 0 25 50 75 100 125 150 4 8 12 16 20
TJ, JUNCTION TEMPERATURE (°C) VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS)

Figure 5. On–Resistance Variation with Figure 6. Drain–To–Source Leakage Current


Temperature versus Voltage

VGS , GATE–TO–SOURCE VOLTAGE (VOLTS)


2500 5 20

V DS, DRAIN–TO–SOURCE VOLTAGE (VOLTS)


VDS = 0 V VGS = 0 V QT
TJ = 25°C
2000 Ciss 4 16
C, CAPACITANCE (pF)

VDS
VGS
1500 3 12
Crss
ID = 6 A
1000 Q1 Q2 VDS = 16 V
2 8
Ciss VGS = 4.5 V
TJ = 25°C
500 1 4
Coss
Crss
0 0 0
10 5 0 5 10 15 20 0 4 8 12 16
VGS VDS Qg, TOTAL GATE CHARGE (nC)

GATE–TO–SOURCE OR DRAIN–TO–SOURCE VOLTAGE (VOLTS)


Figure 7. Capacitance Variation Figure 8. Gate–To–Source and Drain–To–Source
Voltage versus Total Charge

1000
VDS = 16 V
ID = 6.0 A
VGS = 4.5 V
t, TIME (ns)

100
tf
tr
td(off)

td(on)
10
1 10 100
RG, GATE RESISTANCE (OHMS)
Figure 9. Resistive Switching Time Variation
versus Gate Resistance

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130
NTMD6N02R2

DRAIN–TO–SOURCE DIODE CHARACTERISTICS

5 100
VGS = 12 V
I S, SOURCE CURRENT (AMPS)

VGS = 0 V

I D , DRAIN CURRENT (AMPS)


SINGLE PULSE
1 ms
4 TJ = 25°C TC = 25°C

10
3
10 ms
2
1

1 RDS(on) LIMIT
THERMAL LIMIT
PACKAGE LIMIT dc
0 0.1
0 0.2 0.4 0.6 0.8 1.0 1.2 0.1 1 10 100
VSD, SOURCE–TO–DRAIN VOLTAGE (VOLTS) VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS)

Figure 10. Diode Forward Voltage versus Current Figure 11. Maximum Rated Forward Biased
Safe Operating Area

di/dt
IS
trr
ta tb
TIME

tp 0.25 IS

IS

Figure 12. Diode Reverse Recovery Waveform

TYPICAL ELECTRICAL CHARACTERISTICS

1
Rthja(t), EFFECTIVE TRANSIENT

D = 0.5
0.2
THERMAL RESISTANCE

0.1
0.1
0.05
0.02 *0

θ,' " ('
θ,
0.01  
 - .
/

0.01
 
/
'
     '
'# ,*0   " *0
θ,'
SINGLE PULSE - -  " '&'#
0.001
1.0E–05 1.0E–04 1.0E–03 1.0E–02 1.0E–01 1.0E+00 1.0E+01 1.0E+02 1.0E+03
t, TIME (s)

Figure 13. Thermal Response

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131
NTMD6N02R2

INFORMATION FOR USING THE SO–8 SURFACE MOUNT PACKAGE

MINIMUM RECOMMENDED FOOTPRINT FOR SURFACE MOUNTED APPLICATIONS


Surface mount board layout is a critical portion of the total interface between the board and the package. With the
design. The footprint for the semiconductor packages must correct pad geometry, the packages will self–align when
be the correct size to ensure proper solder connection subjected to a solder reflow process.

9
$#

#:$ $$
: 6

#6 $
9 #:
inches
mm

SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • The soldering temperature and time shall not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within • When shifting from preheating to soldering, the
a short time could result in device failure. Therefore, the maximum temperature gradient shall be 5°C or less.
following items should always be observed in order to • After soldering has been completed, the device should
minimize the thermal stress to which the devices are be allowed to cool naturally for at least three minutes.
subjected. Gradual cooling should be used as the use of forced
• Always preheat the device. cooling will increase the temperature gradient and
• The delta temperature between the preheat and result in latent failure due to mechanical stress.
soldering should be 100°C or less.* • Mechanical stress or shock should not be applied
• When preheating and soldering, the temperature of the during cooling.
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When * Soldering a device without preheating can cause
using infrared heating with the reflow soldering excessive thermal shock and stress which can result in
method, the difference shall be a maximum of 10°C. damage to the device.

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132
NTMD6N02R2

TYPICAL SOLDER HEATING PROFILE


For any given circuit board, there will be a group of temperature versus time. The line on the graph shows the
control settings that will give the desired heat pattern. The actual temperature that might be experienced on the surface
operator must set temperatures for several heating zones of a test board at or near a central solder joint. The two
and a figure for belt speed. Taken together, these control profiles are based on a high density and a low density
settings make up a heating “profile” for that particular board. The Vitronics SMD310 convection/infrared reflow
circuit board. On machines controlled by a computer, the soldering system was used to generate this profile. The type
computer remembers these profiles from one operating of solder used was 62/36/2 Tin Lead Silver with a melting
session to the next. Figure 14 shows a typical heating point between 177–189°C. When this type of furnace is
profile for use when soldering a surface mount device to a used for solder reflow work, the circuit boards and solder
printed circuit board. This profile will vary among joints tend to heat first. The components on the board are
soldering systems, but it is a good starting point. Factors then heated by conduction. The circuit board, because it has
that can affect the profile include the type of soldering a large surface area, absorbs the thermal energy more
system in use, density and types of components on the efficiently, then distributes this energy to the components.
board, type of solder used, and the type of board or Because of this effect, the main body of a component may
substrate material being used. This profile shows be up to 30 degrees cooler than the adjacent solder joints.

STEP 1 STEP 2 STEP 3 STEP 4 STEP 5 STEP 6 STEP 7


PREHEAT VENT HEATING HEATING HEATING VENT COOLING
ZONE 1 “SOAK” ZONES 2 & 5 ZONES 3 & 6 ZONES 4 & 7
“RAMP” “RAMP” “SOAK” “SPIKE” 205° TO 219°C
PEAK AT
200°C DESIRED CURVE FOR HIGH 170°C SOLDER
MASS ASSEMBLIES JOINT
160°C
150°C

150°C
SOLDER IS LIQUID FOR
40 TO 80 SECONDS
100°C 140°C (DEPENDING ON
MASS OF ASSEMBLY)
100°C

DESIRED CURVE FOR LOW


MASS ASSEMBLIES
5°C

TIME (3 TO 7 MINUTES TOTAL) TMAX

Figure 14. Typical Solder Heating Profile

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133
# 
Preferred Device

#$%& '(
    
P–Channel SO–8, Dual
Features
• Ultra Low RDS(on)
• Higher Efficiency Extending Battery Life http://onsemi.com
• Logic Level Gate Drive
• Miniature Dual SO–8 Surface Mount Package 6 AMPERES
• Diode Exhibits High Speed, Soft Recovery
20 VOLTS
• Avalanche Energy Specified
• SO–8 Mounting Information Provided RDS(on) = 33 mW
Applications
• Power Management in Portable and Battery–Powered Products, i.e.: P–Channel
Cellular and Cordless Telephones and PCMCIA Cards
D
MAXIMUM RATINGS (TJ = 25°C unless otherwise noted)
Rating Symbol Value Unit
Drain–to–Source Voltage VDSS –20 V
G
Gate–to–Source Voltage – Continuous VGS "12 V
Thermal Resistance – S
Junction–to–Ambient (Note 1.) RθJA 62.5 °C/W
Total Power Dissipation @ TA = 25°C PD 2.0 W
Continuous Drain Current @ TA = 25°C ID –7.8 A MARKING
Continuous Drain Current @ TA = 70°C ID –5.7 A DIAGRAM
Maximum Operating Power Dissipation PD 0.5 W
Maximum Operating Drain Current ID –3.89 A
Pulsed Drain Current (Note 4.) IDM –40 A
SO–8, Dual
CASE 751 E6P02
Thermal Resistance – 8
Junction–to–Ambient (Note 2.) RθJA 98 °C/W STYLE 11 LYWW
Total Power Dissipation @ TA = 25°C PD 1.28 W
1
Continuous Drain Current @ TA = 25°C ID –6.2 A
Continuous Drain Current @ TA = 70°C ID –4.6 A
E6P02 = Device Code
Maximum Operating Power Dissipation PD 0.3 W
L = Location Code
Maximum Operating Drain Current ID –3.01 A
Y = Year
Pulsed Drain Current (Note 4.) IDM –35 A
WW = Work Week
Thermal Resistance –
Junction–to–Ambient (Note 3.) RθJA 166 °C/W
Total Power Dissipation @ TA = 25°C PD 0.75 W PIN ASSIGNMENT
Continuous Drain Current @ TA = 25°C ID –4.8 A
Continuous Drain Current @ TA = 70°C ID –3.5 A Source–1 1 8 Drain–1
Maximum Operating Power Dissipation PD 0.2 W Gate–1 2 7 Drain–1
Maximum Operating Drain Current ID –2.48 A
Pulsed Drain Current (Note 4.) IDM –30 A Source–2 3 6 Drain–2

1. Mounted onto a 2″ square FR–4 Board (1″ sq. 2 oz. Cu 0.06″ thick single Gate–2 4 5 Drain–2
sided), t = 10 seconds. Top View
2. Mounted onto a 2″ square FR–4 Board (1″ sq. 2 oz. Cu 0.06″ thick single
sided), t = steady state.
3. Minimum FR–4 or G–10 PCB, t = steady state. ORDERING INFORMATION
4. Pulse Test: Pulse Width = 300 ms, Duty Cycle = 2%.
Device Package Shipping

NTMD6P02R2 SO–8 2500 Tape & Reel

Preferred devices are recommended choices for future use


and best overall value.

 Semiconductor Components Industries, LLC, 2000 134 Publication Order Number:


November, 2000 – Rev. 1 NTMD6P02R2/D
NTMD6P02R2

MAXIMUM RATINGS (TJ = 25°C unless otherwise noted) (continued)


Rating Symbol Value Unit
Operating and Storage Temperature Range TJ, Tstg –55 to +150 °C
Single Pulse Drain–to–Source Avalanche Energy – Starting TJ = 25°C EAS 500 mJ
(VDD = –20 Vdc, VGS = –5.0 Vdc, Peak IL = –5.0 Apk, L = 40 mH, RG = 25 Ω)
Maximum Lead Temperature for Soldering Purposes for 10 seconds TL 260 °C
ELECTRICAL CHARACTERISTICS (TC = 25°C unless otherwise noted) (Note 5.)
Characteristic Symbol Min Typ Max Unit
OFF CHARACTERISTICS
Drain–to–Source Breakdown Voltage V(BR)DSS Vdc
(VGS = 0 Vdc, ID = –250 µAdc) –20 – –
Temperature Coefficient (Positive) – –11.6 – mV/°C
Zero Gate Voltage Drain Current IDSS µAdc
(VDS = –20 Vdc, VGS = 0 Vdc, TJ = 25°C) – – –1.0
(VDS = –20 Vdc, VGS = 0 Vdc, TJ = 70°C) – – –5.0
Gate–Body Leakage Current IGSS nAdc
(VGS = –12 Vdc, VDS = 0 Vdc) – – –100
Gate–Body Leakage Current IGSS nAdc
(VGS = +12 Vdc, VDS = 0 Vdc) – – 100

ON CHARACTERISTICS
Gate Threshold Voltage VGS(th) Vdc
(VDS = VGS, ID = –250 µAdc) –0.6 –0.88 –1.20
Temperature Coefficient (Negative) – 2.6 – mV/°C
Static Drain–to–Source On–State Resistance RDS(on) Ω
(VGS = –4.5 Vdc, ID = –6.2 Adc) – 0.027 0.033
(VGS = –2.5 Vdc, ID = –5.0 Adc) – 0.038 0.050
(VGS = –2.5 Vdc, ID = –3.1 Adc) – 0.038 –
Forward Transconductance (VDS = –10 Vdc, ID = –6.2 Adc) gFS – 15 – Mhos
DYNAMIC CHARACTERISTICS
Input Capacitance Ciss – 1380 1700 pF
Output Capacitance 16 Vdc,
(VDS = –16 Vd VGS = 0 Vdc,
Vd
Coss – 515 775
f = 1.0 MHz)
Reverse Transfer Capacitance Crss – 250 450
SWITCHING CHARACTERISTICS (Notes 6. and 7.)
Turn–On Delay Time td(on) – 15 25 ns
Rise Time (VDD = –10 Vdc, ID = –1.0 Adc, tr – 20 50
10 Vdc,
VGS = –10 Vdc
Turn–Off Delay Time RG = 6.0 Ω) td(off) – 85 125
Fall Time tf – 50 110
Turn–On Delay Time td(on) – 17 – ns
Rise Time (VDD = –16 Vdc, ID = –6.2 Adc, tr – 65 –
VGS = –4.5
4 5 Vdc,
Vdc
Turn–Off Delay Time RG = 6.0 Ω) td(off) – 50 –
Fall Time tf – 80 –
Total Gate Charge Qtot – 20 35 nC
(VDS = –16 Vdc,
Gate–Source Charge VGS = –4.5 Vdc, Qgs – 4.0 –
ID = –6.2
6 2 Ad
Adc))
Gate–Drain Charge Qgd – 8.0 –
5. Handling precautions to protect against electrostatic discharge is mandatory.
6. Indicates Pulse Test: Pulse Width = 300 µs max, Duty Cycle = 2%.
7. Switching characteristics are independent of operating junction temperature.

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NTMD6P02R2

ELECTRICAL CHARACTERISTICS (TC = 25°C unless otherwise noted) (continued) (Note 8.)
Characteristic Symbol Min Typ Max Unit
BODY–DRAIN DIODE RATINGS (Note 9..)
Diode Forward On–Voltage (IS = –1.7 Adc, VGS = 0 Vdc) VSD – –0.80 –1.2 Vdc
(IS = –1.7 Adc, VGS = 0 Vdc, TJ = 125°C) – –0.65 –
Diode Forward On–Voltage (IS = –6.2 Adc, VGS = 0 Vdc) VSD – –0.95 – Vdc
(IS = –6.2 Adc, VGS = 0 Vdc, TJ = 125°C) – –0.80 –
Reverse Recovery Time trr – 50 80 ns
(IS = –1.7
1 7 Adc,
Ad VGS = 0 Vdc,
Vd
ta – 20 –
dIS/dt = 100 A/µs)
tr – 30 –
Reverse Recovery Stored Charge QRR – 0.04 – µC
8. Handling precautions to protect against electrostatic discharge is mandatory.
9. Indicates Pulse Test: Pulse Width = 300 µs max, Duty Cycle = 2%.

12 10
–10 V –4.5 V –2.1 V
VDS ≥ –10 V
–ID, DRAIN CURRENT (AMPS)

–ID, DRAIN CURRENT (AMPS)


–3.8 V
10
8.0
TJ = 25°C
8.0
–3.1 V 6.0
6.0 –2.5 V
–1.8 V 25°C
4.0
4.0
100°C
TJ = –55°C
2.0
2.0 –1.5 V
VGS = –1.3 V
0 0
0 0.25 0.50 0.75 1.00 1.25 1.50 1.75 0 1.0 1.5 2.0 2.5
–VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS) –VGS, GATE–TO–SOURCE VOLTAGE (VOLTS)

Figure 1. On–Region Characteristics Figure 2. Transfer Characteristics


RDS(on), DRAIN–TO–SOURCE RESISTANCE (W)

RDS(on), DRAIN–TO–SOURCE RESISTANCE (W)

0.05 0.05
ID = –6.2 A TJ = 25°C
0.04 TJ = 25°C
0.04 VGS = –2.5 V

–2.7 V
0.03
0.03 –4.5 V
0.02

0.02
0.01

0 0.01
0 2.0 4.0 6.0 8.0 10 0 2.0 4.0 6.0 8.0 10 12 14
–VGS, GATE–TO–SOURCE VOLTAGE (VOLTS) –ID, DRAIN CURRENT (AMPS)

Figure 3. On–Resistance versus Figure 4. On-Resistance versus Drain Current


Gate–To–Source Voltage and Gate Voltage

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136
NTMD6P02R2

RDS(on), DRAIN–TO–SOURCE RESISTANCE


1.6 1000
VGS = 0 V
TJ = 125°C
ID = –6.2 A
1.4 VGS = –4.5 V 100

–I DSS , LEAKAGE (nA)


100°C
(NORMALIZED)

1.2 10

1 1
25°C

0.8 0.1

0.6 0.01
–50 –25 0 25 50 75 100 125 150 4 8 12 16 20
TJ, JUNCTION TEMPERATURE (°C) –VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS)

Figure 5. On–Resistance Variation with Figure 6. Drain–To–Source Leakage Current


Temperature versus Voltage

VGS , GATE–TO–SOURCE VOLTAGE (VOLTS)

V DS, DRAIN–TO–SOURCE VOLTAGE (VOLTS)


5000 5 20
VDS = 0 V VGS = 0 V QT
4500 TJ = 25°C
4000 Ciss 4 16
C, CAPACITANCE (pF)

VDS
3500 VGS
3000 3 Q1 Q2 12
2500 Crss
2000 2 8
1500 Ciss ID = –6.2 A
VDS = –16 V
1000 1 VGS = –4.5 V 4
Coss
500 Crss TJ = 25°C
0 0 0
10 5.0 0 5.0 10 15 20 0 5.0 10 15 20 25
–VGS –VDS Qg, TOTAL GATE CHARGE (nC)

Figure 8. Gate–To–Source and Drain–To–Source


GATE–TO–SOURCE OR DRAIN–TO–SOURCE VOLTAGE (VOLTS)
Voltage versus Total Charge
Figure 7. Capacitance Variation

1000 1000
VDD = –16 V VDD = –16 V
ID = –1.0 A ID = –6.2 A
VGS = –10 V td(off) VGS = –4.5 V
tf
t, TIME (ns)

t, TIME (ns)

100 100
tf
tr tr
td(off)

td(on)
td(on)
10 10
1 10 100 1 10 100
RG, GATE RESISTANCE (OHMS) RG, GATE RESISTANCE (OHMS)

Figure 9. Resistive Switching Time Variation Figure 10. Resistive Switching Time Variation
versus Gate Resistance versus Gate Resistance

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137
NTMD6P02R2

DRAIN–TO–SOURCE DIODE CHARACTERISTICS

5 100
VGS = 2.5 V
–IS, SOURCE CURRENT (AMPS)

VGS = 0 V SINGLE PULSE

–ID , DRAIN CURRENT (AMPS)


TC = 25°C 1.0 ms
4 TJ = 25°C

10
3
10 ms
2
1

1 RDS(on) LIMIT
THERMAL LIMIT
PACKAGE LIMIT dc
0 0.1
0 0.2 0.4 0.6 0.8 1.0 1.2 0.1 1 10 100
–VSD, SOURCE–TO–DRAIN VOLTAGE (VOLTS) –VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS)

Figure 11. Diode Forward Voltage versus Current Figure 12. Maximum Rated Forward Biased
Safe Operating Area

di/dt
IS
trr
ta tb
TIME

tp 0.25 IS

IS

Figure 13. Diode Reverse Recovery Waveform

TYPICAL ELECTRICAL CHARACTERISTICS

10
, EFFECTIVE TRANSIENT
THERMAL RESISTANCE

1 D = 0.5
0.2
0.1
0.1
0.05 
 θ   
0.02 2%* :$ Ω : Ω #:9 Ω $::9 Ω :89 Ω
0.01
Rthja(t)

0.01
$6 . 8$6 . 4:6 . :87 . :$$ .
SINGLE PULSE +%1'
0.001
1.0E–05 1.0E–04 1.0E–03 1.0E–02 1.0E–01 1.0E+00 1.0E+01 1.0E+02 1.0E+03
t, TIME (s)

Figure 14. Thermal Response

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138
NTMD6P02R2

INFORMATION FOR USING THE SO–8 SURFACE MOUNT PACKAGE

MINIMUM RECOMMENDED FOOTPRINT FOR SURFACE MOUNTED APPLICATIONS


Surface mount board layout is a critical portion of the total interface between the board and the package. With the
design. The footprint for the semiconductor packages must correct pad geometry, the packages will self–align when
be the correct size to ensure proper solder connection subjected to a solder reflow process.

9
$#

#:$ $$
: 6

#6 $
9 #:
inches
mm

SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • The soldering temperature and time shall not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within • When shifting from preheating to soldering, the
a short time could result in device failure. Therefore, the maximum temperature gradient shall be 5°C or less.
following items should always be observed in order to • After soldering has been completed, the device should
minimize the thermal stress to which the devices are be allowed to cool naturally for at least three minutes.
subjected. Gradual cooling should be used as the use of forced
• Always preheat the device. cooling will increase the temperature gradient and
• The delta temperature between the preheat and result in latent failure due to mechanical stress.
soldering should be 100°C or less.* • Mechanical stress or shock should not be applied
• When preheating and soldering, the temperature of the during cooling.
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When * Soldering a device without preheating can cause
using infrared heating with the reflow soldering excessive thermal shock and stress which can result in
method, the difference shall be a maximum of 10°C. damage to the device.

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139
NTMD6P02R2

TYPICAL SOLDER HEATING PROFILE


For any given circuit board, there will be a group of temperature versus time. The line on the graph shows the
control settings that will give the desired heat pattern. The actual temperature that might be experienced on the surface
operator must set temperatures for several heating zones of a test board at or near a central solder joint. The two
and a figure for belt speed. Taken together, these control profiles are based on a high density and a low density
settings make up a heating “profile” for that particular board. The Vitronics SMD310 convection/infrared reflow
circuit board. On machines controlled by a computer, the soldering system was used to generate this profile. The type
computer remembers these profiles from one operating of solder used was 62/36/2 Tin Lead Silver with a melting
session to the next. Figure 15 shows a typical heating point between 177–189°C. When this type of furnace is
profile for use when soldering a surface mount device to a used for solder reflow work, the circuit boards and solder
printed circuit board. This profile will vary among joints tend to heat first. The components on the board are
soldering systems, but it is a good starting point. Factors then heated by conduction. The circuit board, because it has
that can affect the profile include the type of soldering a large surface area, absorbs the thermal energy more
system in use, density and types of components on the efficiently, then distributes this energy to the components.
board, type of solder used, and the type of board or Because of this effect, the main body of a component may
substrate material being used. This profile shows be up to 30 degrees cooler than the adjacent solder joints.

STEP 1 STEP 2 STEP 3 STEP 4 STEP 5 STEP 6 STEP 7


PREHEAT VENT HEATING HEATING HEATING VENT COOLING
ZONE 1 “SOAK” ZONES 2 & 5 ZONES 3 & 6 ZONES 4 & 7
“RAMP” “RAMP” “SOAK” “SPIKE” 205° TO 219°C
PEAK AT
200°C DESIRED CURVE FOR HIGH 170°C SOLDER
MASS ASSEMBLIES JOINT
160°C
150°C

150°C
SOLDER IS LIQUID FOR
40 TO 80 SECONDS
100°C 140°C (DEPENDING ON
MASS OF ASSEMBLY)
100°C

DESIRED CURVE FOR LOW


MASS ASSEMBLIES
5°C

TIME (3 TO 7 MINUTES TOTAL) TMAX

Figure 15. Typical Solder Heating Profile

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     2#13
Complementary SO–8
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MAXIMUM RATINGS (TC = 25°C unless otherwise noted)
Rating Symbol N P Unit 9.5 AMPERES, 20 VOLTS
Drain–to–Source Voltage VDSS 20 –20 Vdc RDS(on) = 24 mW (N–Channel)
Gate–to–Source Voltage VGS ±20 ±12 Vdc 4 AMPERES, 20 VOLTS
Drain Current – Continuous ID 7.0 4.5 A RDS(on) = 108 mW (P–Channel)
(Note 1.)
Operating and Storage TJ, Tstg –55 to +150 °C N–Channel P–Channel
Temperature Range
D D
Thermal Resistance (Note 2.) °C/W
– Junction–to–Ambient RθJA 50 50
1. Mounted on 1″ square FR–4 board.
2. Mounted on 1″ square FR–4 board, t ≤ 10 seconds.
G G

S S

MARKING
DIAGRAM

SO–8
NTMDC02
8 CASE 751 YWW
STYLE 20
1

NTMDC02 = Device Code


Y = Year
WW = Work Week

PIN ASSIGNMENT

Source (N) 1 8 Drain


Gate (N) 2 7 Drain
Source (P) 3 6 Drain
Gate (P) 4 5 Drain
Top View

ORDERING INFORMATION

Device Package Shipping

NTMD7C02R2 SO–8 2500 Units/Rail

 Semiconductor Components Industries, LLC, 2001 141 Publication Order Number:


January, 2001 – Rev. 0 NTMD7C02/D
NTMD7C02

ELECTRICAL CHARACTERISTICS (TA = 25°C unless otherwise noted)


Characteristic Symbol Polarity Min Typ Max Unit
OFF CHARACTERISTICS
Zero Gate Voltage Drain Current IDSS µAdc
(VDS = 20 Vdc, VGS = 0 Vdc) (N) – – 1.0
(VDS = 20 Vdc, VGS = 0 Vdc) (P) – – 1.0
Gate–Body Leakage Current IGSS nAdc
(VGS = 20 Vdc, VDS = 0 Vdc) (N) – – 100
(VGS = 12 Vdc, VDS = 0 Vdc) (P) – – 100
ON CHARACTERISTICS (Note 3.)
Gate Threshold Voltage VGS(th) Vdc
(VDS = VGS, ID = 250 µAdc) (N) 1.0 – –
(VDS = VGS, ID = 250 µAdc) (P) 0.6 – –
Static Drain–to–Source On–State Resistance RDS(on) mOhms
(VGS = 4.5 Vdc, ID = 7.0 Adc) (N) – 19 24
(VGS = 4.5 Vdc, ID = 4.5 Adc) (P) – 63 74
(VGS = 2.5 Vdc, ID = 3.5 Adc) (P) – 94 108
DYNAMIC CHARACTERISTICS
Input Capacitance Ciss (N) – 1470 1750 pF
(P) – 500 570
Output Capacitance (VDS = 16 Vd
Vdc,
Coss (N) – 660 770
VGS = 0 Vdc,
(P) – 190 220
f = 1.0 MHz)
Transfer Capacitance Crss (N) – 189 260
(P) – 58 80
SWITCHING CHARACTERISTICS
Turn–On Delay Time td(on) (N) – 22 30 ns
(P) – 12 20
Rise Time (VDD = 10 Vdc, tr (N) – 38 50
ID = 1.0 Adc, (P) – 22 30
Turn–Off Delay Time VGS = 4.5 Vdc, td(off) (N) – 38 50
RG = 6.0 Ω) (P) – 36 50
Fall Time tf (N) – 31 45
(P) – 24 35
Gate Charge QT (N) – 16 20 nC
(P) – 7.0 9.0
(VDS = 10 Vd
Vdc,
Qgs (N) – 4.5 6.0
ID = 4.5 Adc,
(P) – 0.6 1.0
VGS = 4.5 Vdc)
Qgd (N) – 7.0 9.0
(P) – 1.7 2.5
SOURCE–DRAIN DIODE CHARACTERISTICS
Forward On–Voltage (IS = 1.7 Adc, VGS = 0 Vdc, VSD (N) – 730 760 Vdc
(Note 3.) TJ = 25_C) (P) – 840 870
Reverse Recovery Time trr (N) – 104 160 ns
(P) – 24 36
ta (N) – 18 28
(IF = 1.7 Adc, VGS = 0 Vdc, (P) – 13.5 22
di/dt = 100 Aµs) tb (N) – 85 140
(P) – 11 20
Reverse Recovery Stored Qrr (N) – 0.082 0.12 µC
Charge (P) – 0.018 0.028
3. Pulse Test: Pulse Width = 300 µs, Duty Cycle= 2%.

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P–Channel Enhancement–Mode
Single SO–8 Package http://onsemi.com
Features
• Ultra Low RDS(on) –10 AMPERES
• Higher Efficiency Extending Battery Life
• Logic Level Gate Drive –20 VOLTS
• Miniature SO–8 Surface Mount Package 14 mW @ VGS = –4.5 V
• Diode Exhibits High Speed, Soft Recovery
• Avalanche Energy Specified
• SO–8 Mounting Information Provided P–Channel

Applications D
• Power Management in Portable and Battery–Powered Products, i.e.:
Cellular and Cordless Telephones and PCMCIA Cards
MAXIMUM RATINGS (TJ = 25°C unless otherwise noted) G
Rating Symbol Value Unit
Drain–to–Source Voltage VDSS –20 Vdc S
Gate–to–Source Voltage – Continuous VGS "12 Vdc
Thermal Resistance –
Junction–to–Ambient (Note 1.) RθJA 50 °C/W
Total Power Dissipation @ TA = 25°C PD 2.5 W
Continuous Drain Current @ 25°C ID –10 A 8
Continuous Drain Current @ 70°C ID –8.0 A
Maximum Operating Power Dissipation PD 0.6 W 1
Maximum Operating Drain Current ID –5.5 A
Pulsed Drain Current (Note 3.) IDM –50 A SO–8
Thermal Resistance – CASE 751
Junction–to–Ambient (Note 2.) RθJA 80 °C/W STYLE 12
Total Power Dissipation @ TA = 25°C PD 1.6 W
Continuous Drain Current @ 25°C ID –8.8 A MARKING DIAGRAM
Continuous Drain Current @ 70°C ID –6.4 A & PIN ASSIGNMENT
Maximum Operating Power Dissipation PD 0.4 W
Maximum Operating Drain Current ID –4.5 A 1 8
Source Drain
Pulsed Drain Current (Note 3.) IDM –44 A 2 7
Operating and Storage TJ, Tstg –55 to °C Source E10P02 Drain
3 LYWW 6
Temperature Range +150 Source Drain
4 5
Single Pulse Drain–to–Source Avalanche EAS 500 mJ Gate Drain
Energy – Starting TJ = 25°C
(VDD = –20 Vdc, VGS = –4.5 Vdc, Top View
Peak IL = 5.0 Apk, L = 40 mH,
RG = 25 Ω) E10P02 = Device Code
L = Assembly Location
Maximum Lead Temperature for Soldering TL 260 °C Y = Year
Purposes, 1/8″ from case for 10 seconds WW = Work Week
1. Mounted onto a 2″ square FR–4 Board (1″ sq. Cu 0.06″ thick single sided),
t = 10 seconds.
2. Mounted onto a 2″ square FR–4 Board (1″ sq. Cu 0.06″ thick single sided),
ORDERING INFORMATION
t = steady state.
3. Pulse Test: Pulse Width < 300 ms, Duty Cycle < 2%. Device Package Shipping
This document contains information on a product under development. ON Semiconductor
reserves the right to change or discontinue this product without notice. NTMS10P02R2 SO–8 2500/Tape & Reel

 Semiconductor Components Industries, LLC, 2000 143 Publication Order Number:


December, 2000 – Rev. 2 NTMS10P02R2/D
NTMS10P02R2

ELECTRICAL CHARACTERISTICS (TC = 25°C unless otherwise noted) (Note 4.)


Characteristic Symbol Min Typ Max Unit
OFF CHARACTERISTICS
Drain–to–Source Breakdown Voltage V(BR)DSS Vdc
(VGS = 0 Vdc, ID = –250 µAdc) –20 – –
Temperature Coefficient (Positive) – –12.1 – mV/°C
Zero Gate Voltage Drain Current IDSS µAdc
(VDS = –20 Vdc, VGS = 0 Vdc, TJ = 25°C) – – –1.0
(VDS = –20 Vdc, VGS = 0 Vdc, TJ = 70°C) – – –5.0
Gate–Body Leakage Current IGSS nAdc
(VGS = –12 Vdc, VDS = 0 Vdc) – – –100
Gate–Body Leakage Current IGSS nAdc
(VGS = +12 Vdc, VDS = 0 Vdc) – – 100

ON CHARACTERISTICS
Gate Threshold Voltage VGS(th) Vdc
(VDS = VGS, ID = –250 µAdc) –0.6 –0.88 –1.20
Temperature Coefficient (Negative) – 2.8 – mV/°C
Static Drain–to–Source On–State Resistance RDS(on) Ω
(VGS = –4.5 Vdc, ID = –10 Adc) – 0.012 0.014
(VGS = –2.5 Vdc, ID = –8.8 Adc) – 0.017 0.020
Forward Transconductance (VDS = –10 Vdc, ID = –10 Adc) gFS – 30 – Mhos
DYNAMIC CHARACTERISTICS
Input Capacitance Ciss – 3100 3640 pF
Output Capacitance (VDS = –16
16 Vdc,
Vd VGS = 0 Vdc,
Vd
Coss – 1100 1670
f = 1.0 MHz)
Reverse Transfer Capacitance Crss – 475 1010

SWITCHING CHARACTERISTICS (Notes 5. & 6.)


Turn–On Delay Time td(on) – 25 35 ns
Rise Time (VDD = –10 Vdc, ID = –1.0 Adc, tr – 40 65
VGS = –4.5
4 5 Vdc,
Vdc
Turn–Off Delay Time RG = 6.0 Ω) td(off) – 110 190
Fall Time tf – 110 190
Turn–On Delay Time td(on) – 25 – ns
Rise Time (VDD = –10 Vdc, ID = –10 Adc, tr – 100 –
4 5 Vdc,
VGS = –4.5 Vdc
Turn–Off Delay Time RG = 6.0 Ω) td(off) – 100 –
Fall Time tf – 125 –
Total Gate Charge Qtot – 48 70 nC
(VDS = –10 Vdc,
Gate–Source Charge VGS = –4.5 Vdc, Qgs – 6.5 –
ID = –10
10 Ad
Adc))
Gate–Drain Charge Qgd – 17 –
BODY–DRAIN DIODE RATINGS (Note 5.)
Diode Forward On–Voltage (IS = –2.1 Adc, VGS = 0 Vdc) VSD – –0.72 –1.2 Vdc
(IS = –2.1 Adc, VGS = 0 Vdc, TJ = 125°C) – –0.60 –
Diode Forward On–Voltage (IS = –10 Adc, VGS = 0 Vdc) VSD – –0.90 – Vdc
(IS = –10 Adc, VGS = 0 Vdc, TJ = 125°C) – –0.75 –
Reverse Recovery Time trr – 65 100 ns
(IS = –2.1
2 1 Adc,
Ad VGS = 0 Vdc,
Vd
ta – 25 –
dIS/dt = 100 A/µs)
tb – 40 –
Reverse Recovery Stored Charge QRR – 0.075 – µC
4. Handling precautions to protect against electrostatic discharge is mandatory.
5. Indicates Pulse Test: Pulse Width = 300 µs max, Duty Cycle = 2%.
6. Switching characteristics are independent of operating junction temperature.

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NTMS10P02R2

20 10
–2.3 V –2.1 V
VDS ≥ –10 V
8.0
  


  

  


  
15 TJ = 25°C
–10 V

–3.1 V 6.0
–1.9 V
10
25°C
4.0

5.0 VGS = –1.7 V


100°C TJ = –55°C
2.0

0 0
0 0.25 0.50 0.75 1.00 1.25 1.50 1.75 2.00 0 0.5 1.0 1.5 2.0 2.5
–VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS) –VGS, GATE–TO–SOURCE VOLTAGE (VOLTS)

Figure 1. On–Region Characteristics Figure 2. Transfer Characteristics

 


  


 


  
0.100 0.020
TJ = 25°C VGS = –2.5 V
ID = –10 A
TJ = 25°C
0.075
0.016

0.050
VGS = –4.5 V
0.012
0.025

0 0.008
0 2.0 4.0 6.0 8.0 10 6.0 10 14 18
–VGS, GATE–TO–SOURCE VOLTAGE (VOLTS) –ID, DRAIN CURRENT (AMPS)

Figure 3. On–Resistance versus Figure 4. On-Resistance versus Drain Current


Gate–To–Source Voltage and Gate Voltage

 


   
  <

1.6 10,000
VGS = 0 V
ID = –10 A
1.4 VGS = –4.5 V
     

1000 TJ = 125°C
1.2

1.0 TJ = 100°C
100

0.8

0.6 10
–50 –25 0 25 50 75 100 125 150 2.0 6.0 10 14 18
TJ, JUNCTION TEMPERATURE (°C) –VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS)

Figure 5. On–Resistance Variation with Figure 6. Drain–To–Source Leakage Current


Temperature versus Voltage

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145
NTMS10P02R2

10,000
VGS = 0 V VDS = 0 V
TJ = 25°C
8000 Ciss

C, CAPACITANCE (pF)
6000
Crss
4000
Ciss

2000
Coss
Crss

0
10 5.0 0 5.0 10 15 20
–VGS –VDS

GATE–TO–SOURCE OR DRAIN–TO–SOURCE VOLTAGE (VOLTS)

Figure 7. Capacitance Variation


–VGS , GATE–TO–SOURCE VOLTAGE (VOLTS)

–VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS)


5.0 10
QT

4.0 VGS 8.0


VDS

3.0 6.0
Q1 Q2
2.0 4.0

ID = –10 A
1.0 TJ = 25°C 2.0
Q3

0 0
0 10 20 30 40 50
Qg, TOTAL GATE CHARGE (nC)
Figure 8. Gate–To–Source and Drain–To–Source
Voltage versus Total Charge

1000 1000
VDD = –10 V td(off) VDD = –10 V
td(off)
ID = –1.0 A tf ID = –10 A
VGS = –4.5 V VGS = –4.5 V
tr
t, TIME (ns)

t, TIME (ns)

tr tf
100 100
td(on)
td(on)

10 10
1.0 10 100 1.0 10 100
RG, GATE RESISTANCE (OHMS) RG, GATE RESISTANCE (OHMS)
Figure 9. Resistive Switching Time Variation Figure 10. Resistive Switching Time Variation
versus Gate Resistance versus Gate Resistance

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NTMS10P02R2

DRAIN–TO–SOURCE DIODE CHARACTERISTICS

100
2.0
–IS, SOURCE CURRENT (AMPS)

VGS = 0 V

–ID , DRAIN CURRENT (AMPS)


TJ = 25°C 100 ms
1.6
10 1.0 ms

1.2
VGS = 2.5 V 10 ms
SINGLE PULSE
0.8 1.0 TC = 25°C

0.4 RDS(on) LIMIT


THERMAL LIMIT
PACKAGE LIMIT dc
0 0.1
0.50 0.55 0.60 0.65 0.70 0.1 1.0 10 100
–VSD, SOURCE–TO–DRAIN VOLTAGE (VOLTS) –VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS)

Figure 11. Diode Forward Voltage versus Current Figure 12. Maximum Rated Forward Biased
Safe Operating Area

di/dt
IS
trr
ta tb
TIME

tp 0.25 IS

IS

Figure 13. Diode Reverse Recovery Waveform

TYPICAL ELECTRICAL CHARACTERISTICS

10
, EFFECTIVE TRANSIENT
THERMAL RESISTANCE

1.0 D = 0.5
0.2
0.1
0.1
0.05 
 θ   
0.02 2%* 94 Ω 9$# Ω 788 Ω 96 Ω 7$# Ω
0.01
Rthja(t)

0.01
4: . 998 . $$6 . 764: . :#69 .
+%1'
SINGLE PULSE
0.001
1.0E–05 1.0E–04 1.0E–03 1.0E–02 1.0E–01 1.0E+00 1.0E+01 1.0E+02 1.0E+03
t, TIME (s)

Figure 14. Thermal Response

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NTMS10P02R2

INFORMATION FOR USING THE SO–8 SURFACE MOUNT PACKAGE

MINIMUM RECOMMENDED FOOTPRINT FOR SURFACE MOUNTED APPLICATIONS


Surface mount board layout is a critical portion of the total interface between the board and the package. With the
design. The footprint for the semiconductor packages must correct pad geometry, the packages will self–align when
be the correct size to ensure proper solder connection subjected to a solder reflow process.

9
$#

#:$ $$
: 6

#6 $
9 #:
inches
mm

SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • The soldering temperature and time shall not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within • When shifting from preheating to soldering, the
a short time could result in device failure. Therefore, the maximum temperature gradient shall be 5°C or less.
following items should always be observed in order to • After soldering has been completed, the device should
minimize the thermal stress to which the devices are be allowed to cool naturally for at least three minutes.
subjected. Gradual cooling should be used as the use of forced
• Always preheat the device. cooling will increase the temperature gradient and
• The delta temperature between the preheat and result in latent failure due to mechanical stress.
soldering should be 100°C or less.* • Mechanical stress or shock should not be applied
• When preheating and soldering, the temperature of the during cooling.
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When * Soldering a device without preheating can cause
using infrared heating with the reflow soldering excessive thermal shock and stress which can result in
method, the difference shall be a maximum of 10°C. damage to the device.

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NTMS10P02R2

TYPICAL SOLDER HEATING PROFILE


For any given circuit board, there will be a group of temperature versus time. The line on the graph shows the
control settings that will give the desired heat pattern. The actual temperature that might be experienced on the surface
operator must set temperatures for several heating zones of a test board at or near a central solder joint. The two
and a figure for belt speed. Taken together, these control profiles are based on a high density and a low density
settings make up a heating “profile” for that particular board. The Vitronics SMD310 convection/infrared reflow
circuit board. On machines controlled by a computer, the soldering system was used to generate this profile. The type
computer remembers these profiles from one operating of solder used was 62/36/2 Tin Lead Silver with a melting
session to the next. Figure 15 shows a typical heating point between 177–189°C. When this type of furnace is
profile for use when soldering a surface mount device to a used for solder reflow work, the circuit boards and solder
printed circuit board. This profile will vary among joints tend to heat first. The components on the board are
soldering systems, but it is a good starting point. Factors then heated by conduction. The circuit board, because it has
that can affect the profile include the type of soldering a large surface area, absorbs the thermal energy more
system in use, density and types of components on the efficiently, then distributes this energy to the components.
board, type of solder used, and the type of board or Because of this effect, the main body of a component may
substrate material being used. This profile shows be up to 30 degrees cooler than the adjacent solder joints.

STEP 1 STEP 2 STEP 3 STEP 4 STEP 5 STEP 6 STEP 7


PREHEAT VENT HEATING HEATING HEATING VENT COOLING
ZONE 1 “SOAK” ZONES 2 & 5 ZONES 3 & 6 ZONES 4 & 7
“RAMP” “RAMP” “SOAK” “SPIKE” 205° TO 219°C
PEAK AT
200°C DESIRED CURVE FOR HIGH 170°C SOLDER
MASS ASSEMBLIES JOINT
160°C
150°C

150°C
SOLDER IS LIQUID FOR
40 TO 80 SECONDS
100°C 140°C (DEPENDING ON
MASS OF ASSEMBLY)
100°C

DESIRED CURVE FOR LOW


MASS ASSEMBLIES
5°C

TIME (3 TO 7 MINUTES TOTAL) TMAX


Figure 15. Typical Solder Heating Profile

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P–Channel SO–8
Features
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• High Efficiency Components in a Single SO–8 Package
• High Density Power MOSFET with Low RDS(on)
• Miniature SO–8 Surface Mount Package – Saves Board Space –3.05 AMPERES
• Diode Exhibits High Speed with Soft Recovery –30 VOLTS
• IDSS Specified at Elevated Temperature
• Avalanche Energy Specified
0.085 W @ VGS = –10 V
• Mounting Information for the SO–8 Package is Provided
P–Channel
Applications
• DC–DC Converters D
• Low Voltage Motor Control
• Power Management in Portable and Battery–Powered Products, i.e.:
Computers, Printers, PCMCIA Cards, Cellular & Cordless Telephones
G
MOSFET MAXIMUM RATINGS (TJ = 25°C unless otherwise noted)
Rating Symbol Value Unit S
Drain–to–Source Voltage VDSS –30 V
Gate–to–Source Voltage – Continuous VGS ±20 V MARKING
DIAGRAM
Thermal Resistance –
Junction–to–Ambient (Note 1.) RθJA 171 °C/W
Total Power Dissipation @ TA = 25°C PD 0.73 W
SO–8 E3P03
Continuous Drain Current @ 25°C ID –2.34 A
CASE 751 LYWW
Continuous Drain Current @ 70°C ID –1.87 A 8
STYLE 13
Pulsed Drain Current (Note 4.) IDM –8.0 A
Thermal Resistance – 1
Junction–to–Ambient (Note 2.) RθJA 100 °C/W
Total Power Dissipation @ TA = 25°C PD 1.25 W E3P03 = Device Code
Continuous Drain Current @ 25°C ID –3.05 A L = Assembly Location
Continuous Drain Current @ 70°C ID –2.44 A Y = Year
Pulsed Drain Current (Note 4.) IDM –12 A WW = Work Week
Thermal Resistance –
Junction–to–Ambient (Note 3.) RθJA 62.5 °C/W
Total Power Dissipation @ TA = 25°C PD 2.0 W
PIN ASSIGNMENT
Continuous Drain Current @ 25°C ID –3.86 A
N.C. 1 8 Drain
Continuous Drain Current @ 70°C ID –3.1 A
Pulsed Drain Current (Note 4.) IDM –15 A Source 2 7 Drain
Operating and Storage TJ, Tstg –55 to °C Source 3 6 Drain
Temperature Range +150 4 5
Gate Drain
Single Pulse Drain–to–Source Avalanche EAS 140 mJ
Energy – Starting TJ = 25°C Top View
(VDD = –30 Vdc, VGS = –4.5 Vdc, Peak
IL = –7.5 Apk, L = 5 mH, RG = 25 Ω) ORDERING INFORMATION
Maximum Lead Temperature for Soldering TL 260 °C
Purposes, 1/8″ from case for 10 seconds Device Package Shipping
1. Minimum FR–4 or G–10 PCB, t = Steady State. NTMS3P03R2 SO–8 2500/Tape & Reel
2. Mounted onto a 2″ square FR–4 Board (1″ sq. 2 oz Cu 0.06″ thick single
sided), t = steady state.
3. Mounted onto a 2″ square FR–4 Board (1″ sq. 2 oz Cu 0.06″ thick single This document contains information on a product under
sided), t ≤ 10 seconds. development. ON Semiconductor reserves the right to
4. Pulse Test: Pulse Width = 300 ms, Duty Cycle = 2%. change or discontinue this product without notice.

 Semiconductor Components Industries, LLC, 2001 150 Publication Order Number:


January, 2001 – Rev. 0 NTMS3P03R2/D
NTMS3P03R2

ELECTRICAL CHARACTERISTICS (TJ = 25°C unless otherwise noted) (Note 5.)


Characteristic Symbol Min Typ Max Unit
OFF CHARACTERISTICS
Drain–to–Source Breakdown Voltage V(BR)DSS Vdc
(VGS = 0 Vdc, ID = –250 µAdc) –30 – –
Temperature Coefficient (Positive) – –30 – mV/°C
Zero Gate Voltage Drain Current IDSS µAdc
(VDS = –30 Vdc, VGS = 0 Vdc, TJ = 25°C) – – –1.0
(VDS = –30 Vdc, VGS = 0 Vdc, TJ = 125°C) – – –10
Gate–Body Leakage Current IGSS nAdc
(VGS = –20 Vdc, VDS = 0 Vdc) – – –100
Gate–Body Leakage Current IGSS nAdc
(VGS = +20 Vdc, VDS = 0 Vdc) – – 100

ON CHARACTERISTICS
Gate Threshold Voltage VGS(th) Vdc
(VDS = VGS, ID = –250 µAdc) –1.0 –1.7 –2.5
Temperature Coefficient (Negative) – 3.6 –
Static Drain–to–Source On–State Resistance RDS(on) Ω
(VGS = –10 Vdc, ID = –3.05 Adc) – 0.063 0.085
(VGS = –4.5 Vdc, ID = –1.5 Adc) – 0.090 0.115
Forward Transconductance (VDS = –15 Vdc, ID = –3.05 Adc) gFS – 5.0 – Mhos
DYNAMIC CHARACTERISTICS
Input Capacitance Ciss – 520 750 pF
Output Capacitance (VDS = –24
24 Vdc,
Vd VGS = 0 Vdc,
Vd
Coss – 170 325
f = 1.0 MHz)
Reverse Transfer Capacitance Crss – 70 135

SWITCHING CHARACTERISTICS (Notes 6. & 7.)


Turn–On Delay Time td(on) – 12 22 ns
Rise Time (VDD = –24 Vdc, ID = –3.05 Adc, tr – 16 30
VGS = –10
10 Vdc
Vdc,
Turn–Off Delay Time RG = 6.0 Ω) td(off) – 45 80
Fall Time tf – 45 80
Turn–On Delay Time td(on) – 16 – ns
Rise Time (VDD = –24 Vdc, ID = –1.5 Adc, tr – 42 –
4 5 Vdc,
VGS = –4.5 Vdc
Turn–Off Delay Time RG = 6.0 Ω) td(off) – 32 –
Fall Time tf – 35 –
Total Gate Charge Qtot – 16 25 nC
(VDS = –24 Vdc,
Gate–Source Charge VGS = –10 Vdc, Qgs – 2.0 –
ID = –3.05
3 05 Adc)
Ad )
Gate–Drain Charge Qgd – 4.5 –
BODY–DRAIN DIODE RATINGS (Note 6.)
Diode Forward On–Voltage (IS = –3.05 Adc, VGS = 0 V) VSD – –0.96 –1.25 Vdc
(IS = –3.05 Adc, VGS = 0 V, TJ = 125°C) – –0.78 –
Reverse Recovery Time trr – 34 – ns
(IS = –3.05
3 05 Adc,
Ad VGS = 0 Vdc,
Vd
ta – 18 –
dIS/dt = 100 A/µs)
tb – 16 –
Reverse Recovery Stored Charge QRR – 0.03 – µC
5. Handling precautions to protect against electrostatic discharge is mandatory.
6. Indicates Pulse Test: Pulse Width = 300 µs max, Duty Cycle = 2%.
7. Switching characteristics are independent of operating junction temperature.

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151
NTMS3P03R2

TYPICAL ELECTRICAL CHARACTERISTICS

6 6
VGS = –10 V
VGS = –4.4 V VDS > = –10 V
–ID, DRAIN CURRENT (AMPS)

–ID, DRAIN CURRENT (AMPS)


5 VGS = –8 V 5
VGS = –4 V
VGS = –6 V
VGS = –4.6 V
4 4
TJ = 25°C VGS = –4.8 V TJ = 100°C
3 VGS = –3.6 V 3
VGS = –2.8 V
VGS = –3.2 V TJ = 25°C
2 VGS = –5 V 2
VGS = –3 V TJ = –55°C
VGS = –2.6 V
1 1

0 0
0 0.25 0.5 0.75 1 1.25 1.5 1.75 2 1 2 3 4 5
–VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS) –VGS, GATE–TO–SOURCE VOLTAGE (VOLTS)

Figure 1. On–Region Characteristics Figure 2. Transfer Characteristics


RDS(on), DRAIN–TO–SOURCE RESISTANCE (Ω)

RDS(on), DRAIN–TO–SOURCE RESISTANCE (Ω)


0.7 0.7
ID = –3.05 A ID = –1.5 A
0.6 TJ = 25°C 0.6 TJ = 25°C

0.5 0.5

0.4 0.4

0.3 0.3

0.2 0.2

0.1 0.1

0 0
3 4 5 6 7 8 2 3 4 5 6 7
–VGS, GATE–TO–SOURCE VOLTAGE (VOLTS) –VGS, GATE–TO–SOURCE VOLTAGE (VOLTS)
Figure 3. On–Resistance vs. Gate–to–Source Figure 4. On–Resistance vs. Gate–to–Source
Voltage Voltage
RDS(on), DRAIN–TO–SOURCE RESISTANCE (Ω)

RDS(on), DRAIN–TO–SOURCE RESISTANCE

0.25 1.6
ID = –3.05 A
TJ = 25°C VGS = –10 V
1.4
0.2 VGS = –4.5 V
(NORMALIZED)

1.2
0.15
1
VGS = –10 V

0.1
0.8

0.05 0.6
1 2 3 4 5 6 –50 –25 0 25 50 75 100 125 150
–ID, DRAIN CURRENT (AMPS) TJ, JUNCTION TEMPERATURE (°C)

Figure 5. On–Resistance vs. Drain Current and Figure 6. On Resistance Variation with
Gate Voltage Temperature

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NTMS3P03R2

10000
VGS = 0 V VDS = 0 V VGS = 0 V
1200

Ciss

C, CAPACITANCE (pF)
TJ = 150°C 1000
IDSS, LEAKAGE (nA)

1000
800

600 Crss Ciss


TJ = 125°C

100 400
Coss
200
Crss
TJ = 25°C
10 0
6 10 14 18 22 26 30 10 5 0 5 10 15 20 25 30
–VGS –VDS
–VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS) GATE–TO–SOURCE OR DRAIN–TO–SOURCE
VOLTAGE (VOLTS)
Figure 7. Drain–to–Source Leakage Current Figure 8. Capacitance Variation
vs. Voltage
–VGS, GATE–TO–SOURCE VOLTAGE (VOLTS)

12 30 1000
VDS = –24 V
QT ID = –3.05 A
10 25
VGS = –10 V
VDS
8 20 100
td(off)
t, TIME (ns)

VGS
6 15 tf
Q1 tr
4 Q2 10 10
td(on)
2 5
ID = –3.05 A
TJ = 25°C
0 0 1
0 2 4 6 8 10 12 14 16 1 10 100
Qg, TOTAL GATE CHARGE (nC) RG, GATE RESISTANCE (Ω)

Figure 9. Gate–to–Source and Figure 10. Resistive Switching Time Variation


Drain–to–Source Voltage vs. Total Charge vs. Gate Resistance

1000 3
VDS = –24 V VGS = 0 V
IS, SOURCE CURRENT (AMPS)

ID = –1.5 A TJ = 25°C
2.5
VGS = –4.5 V

2
t, TIME (ns)

100 1.5
tr
td(off)
tf 1
td(on)

0.5

10 0
1 10 100 0.2 0.4 0.6 0.8 1 1.2
RG, GATE RESISTANCE (Ω) –VSD, SOURCE–TO–DRAIN VOLTAGE (VOLTS)

Figure 11. Resistive Switching Time Variation Figure 12. Diode Forward Voltage vs. Current
vs. Gate Resistance

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NTMS3P03R2

100
VGS = 12 V
SINGLE PULSE
–ID, DRAIN CURRENT (AMPS)

1.0 ms
TA = 25°C
10

10 ms di/dt
IS
1.0 dc
trr
ta tb
0.1 TIME
RDS(on)
THERMAL LIMIT tp 0.25 IS
PACKAGE LIMIT
0.01 IS
0.1 1.0 10 100
–VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS)

Figure 13. Maximum Rated Forward Biased Figure 14. Diode Reverse Recovery Waveform
Safe Operating Area

1.0
D = 0.5
Rthja(t), EFFECTIVE TRANSIENT
THERMAL RESPONSE

0.2

0.1
0.1
0.05 Chip Normalized to RθJA at Steady State (1″ pad)
Junction 2.32 Ω 18.5 Ω 50.9 Ω 37.1 Ω 56.8 Ω 24.4 Ω
0.02

0.01 0.0014 F 0.0073 F 0.022 F 0.105 F 0.484 F 3.68 F


Single Pulse Ambient
0.01
1E–03 1E–02 1E–01 1E+00 1E+01 1E+02 1E+03
t, TIME (s)

Figure 15. FET Thermal Response

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NTMS3P03R2

INFORMATION FOR USING THE SO–8 SURFACE MOUNT PACKAGE

MINIMUM RECOMMENDED FOOTPRINT FOR SURFACE MOUNTED APPLICATIONS


Surface mount board layout is a critical portion of the total interface between the board and the package. With the
design. The footprint for the semiconductor packages must correct pad geometry, the packages will self–align when
be the correct size to ensure proper solder connection subjected to a solder reflow process.

9
$#

#:$ $$
: 6

#6 $
9 #:
inches
mm

SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • The soldering temperature and time shall not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within • When shifting from preheating to soldering, the
a short time could result in device failure. Therefore, the maximum temperature gradient shall be 5°C or less.
following items should always be observed in order to • After soldering has been completed, the device should
minimize the thermal stress to which the devices are be allowed to cool naturally for at least three minutes.
subjected. Gradual cooling should be used as the use of forced
• Always preheat the device. cooling will increase the temperature gradient and
• The delta temperature between the preheat and result in latent failure due to mechanical stress.
soldering should be 100°C or less.* • Mechanical stress or shock should not be applied
• When preheating and soldering, the temperature of the during cooling.
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When * Soldering a device without preheating can cause
using infrared heating with the reflow soldering excessive thermal shock and stress which can result in
method, the difference shall be a maximum of 10°C. damage to the device.

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155
NTMS3P03R2

TYPICAL SOLDER HEATING PROFILE


For any given circuit board, there will be a group of temperature versus time. The line on the graph shows the
control settings that will give the desired heat pattern. The actual temperature that might be experienced on the surface
operator must set temperatures for several heating zones of a test board at or near a central solder joint. The two
and a figure for belt speed. Taken together, these control profiles are based on a high density and a low density
settings make up a heating “profile” for that particular board. The Vitronics SMD310 convection/infrared reflow
circuit board. On machines controlled by a computer, the soldering system was used to generate this profile. The type
computer remembers these profiles from one operating of solder used was 62/36/2 Tin Lead Silver with a melting
session to the next. Figure 16 shows a typical heating point between 177–189°C. When this type of furnace is
profile for use when soldering a surface mount device to a used for solder reflow work, the circuit boards and solder
printed circuit board. This profile will vary among joints tend to heat first. The components on the board are
soldering systems, but it is a good starting point. Factors then heated by conduction. The circuit board, because it has
that can affect the profile include the type of soldering a large surface area, absorbs the thermal energy more
system in use, density and types of components on the efficiently, then distributes this energy to the components.
board, type of solder used, and the type of board or Because of this effect, the main body of a component may
substrate material being used. This profile shows be up to 30 degrees cooler than the adjacent solder joints.

STEP 1 STEP 2 STEP 3 STEP 4 STEP 5 STEP 6 STEP 7


PREHEAT VENT HEATING HEATING HEATING VENT COOLING
ZONE 1 “SOAK” ZONES 2 & 5 ZONES 3 & 6 ZONES 4 & 7
“RAMP” “RAMP” “SOAK” “SPIKE” 205° TO 219°C
PEAK AT
200°C DESIRED CURVE FOR HIGH 170°C SOLDER
MASS ASSEMBLIES JOINT
160°C
150°C

150°C
SOLDER IS LIQUID FOR
40 TO 80 SECONDS
100°C 140°C (DEPENDING ON
MASS OF ASSEMBLY)
100°C

DESIRED CURVE FOR LOW


MASS ASSEMBLIES
5°C

TIME (3 TO 7 MINUTES TOTAL) TMAX


Figure 16. Typical Solder Heating Profile

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#$%& '(
-    
N–Channel Enhancement–Mode
Single SO–8 Package
Features
• High Density Power MOSFET with Ultra Low RDS(on) Providing http://onsemi.com
Higher Efficiency
• Miniature SO–8 Surface Mount Package Saving Board Space; 4.2 AMPERES
Mounting Information for the SO–8 Package is Provided
• IDSS Specified at Elevated Temperature 20 VOLTS
• Drain–to–Source Avalanche Energy Specified 0.045 W @ VGS = 4.5 V
• Diode Exhibits High Speed, Soft Recovery
Applications
• Power Management in Portable and Battery–Powered Products, i.e.: Single N–Channel
Computers, Printers, PCMCIA Cards, Cellular & Cordless Telephones D

MAXIMUM RATINGS (TJ = 25°C unless otherwise noted)


Rating Symbol Value Unit
Drain–to–Source Voltage VDSS 20 V G
Drain–to–Gate Voltage (RGS = 1.0 mW) VDGR 20 V
Gate–to–Source Voltage – Continuous VGS ±10 V S
Thermal Resistance –
Junction–to–Ambient (Note 1.) RθJA 50 °C/W
Total Power Dissipation @ TA = 25°C PD 2.5 W
Continuous Drain Current @ 25°C ID 5.9 A
Continuous Drain Current @ 70°C ID 4.7 A
Pulsed Drain Current (Note 4.) IDM 25 A 8
Thermal Resistance –
Junction–to–Ambient (Note 2.) RθJA 100 °C/W 1
Total Power Dissipation @ TA = 25°C PD 1.25 W SO–8
Continuous Drain Current @ 25°C ID 4.2 A CASE 751
Continuous Drain Current @ 70°C ID 3.3 A STYLE 13
Pulsed Drain Current (Note 4.) IDM 20 A
Thermal Resistance –
Junction–to–Ambient (Note 3.) RθJA 162 °C/W MARKING DIAGRAM
Total Power Dissipation @ TA = 25°C PD 0.77 W & PIN ASSIGNMENT
Continuous Drain Current @ 25°C ID 3.3 A 1 8
Continuous Drain Current @ 70°C ID 2.6 A N.C. Drain
Pulsed Drain Current (Note 4.) IDM 15 A 2 7
Source E4N01 Drain
Operating and Storage TJ, Tstg –55 to °C 3
LYWW
6
Source Drain
Temperature Range +150 4 5
Single Pulse Drain–to–Source Avalanche EAS 169 mJ Gate Drain
Energy – Starting TJ = 25°C Top View
(VDD = 20 Vdc, VGS = 5.0 Vdc, Peak IL
= 7.5 Apk, L = 6 mH, RG = 25 Ω) E4N01 = Device Code
Maximum Lead Temperature for Soldering TL 260 °C L = Assembly Location
Purposes, 1/8″ from case for 10 seconds Y = Year
WW = Work Week
1. Mounted onto a 2″ square FR–4 Board (1″ sq. 2 oz Cu 0.06″ thick single
sided), t ≤ 10 seconds.
2. Mounted onto a 2″ square FR–4 Board (1″ sq. 2 oz Cu 0.06″ thick single
sided), t = steady state. ORDERING INFORMATION
3. Minimum FR–4 or G–10 PCB, t = Steady State.
4. Pulse Test: Pulse Width = 300 ms, Duty Cycle = 2%. Device Package Shipping

NTMS4N01R2 SO–8 2500/Tape & Reel

 Semiconductor Components Industries, LLC, 2001 157 Publication Order Number:


February, 2001 – Rev. 2 NTMS4N01R2/D
NTMS4N01R2

ELECTRICAL CHARACTERISTICS (TC = 25°C unless otherwise noted) (Note 5.)


Characteristic Symbol Min Typ Max Unit
OFF CHARACTERISTICS
Drain–to–Source Breakdown Voltage V(BR)DSS Vdc
(VGS = 0 Vdc, ID = 250 µAdc) 20 – –
Temperature Coefficient (Positive) – 20 – mV/°C
Zero Gate Voltage Drain Current IDSS µAdc
(VDS = 12 Vdc, VGS = 0 Vdc, TJ = 25°C) – – 1.0
(VDS = 12 Vdc, VGS = 0 Vdc, TJ = 125°C) – – 10
(VDS = 20 Vdc, VGS = 0 Vdc, TJ = 25°C) – 0.2 –
Gate–Body Leakage Current IGSS nAdc
(VGS = +10 Vdc, VDS = 0 Vdc) – – 100
Gate–Body Leakage Current IGSS nAdc
(VGS = –10 Vdc, VDS = 0 Vdc) – – –100

ON CHARACTERISTICS
Gate Threshold Voltage VGS(th) Vdc
(VDS = VGS, ID = 250 µAdc) 0.6 0.95 1.2
Temperature Coefficient (Negative) – –3.0 – mV/°C
Static Drain–to–Source On–State Resistance RDS(on) Ω
(VGS = 4.5 Vdc, ID = 4.2 Adc) – 0.030 0.04
(VGS = 2.7 Vdc, ID = 2.1 Adc) – 0.035 0.05
(VGS = 2.5 Vdc, ID = 2.0 Adc) – 0.037 –
Forward Transconductance (VDS = 2.5 Vdc, ID = 2.0 Adc) gFS – 10 – Mhos
DYNAMIC CHARACTERISTICS
Input Capacitance Ciss – 870 1200 pF
Output Capacitance (VDS = 10 Vd
Vdc, VGS = 0 Vd
Vdc,
Coss – 260 400
f = 1.0 MHz)
Reverse Transfer Capacitance Crss – 60 100

SWITCHING CHARACTERISTICS (Notes 6. & 7.)


Turn–On Delay Time td(on) – 13 25 ns
Rise Time (VDD = 12 Vdc, ID = 4.2 Adc, tr – 35 65
VGS = 4
4.55 Vdc
Vdc,
Turn–Off Delay Time RG = 2.3 Ω) td(off) – 45 75
Fall Time tf – 50 90
Total Gate Charge Qtot – 11 16 nC
(VDS = 12 Vdc,
Gate–Source Charge VGS = 4.5 Vdc, Qgs – 2.0 –
ID = 4.2
4 2 Ad
Adc))
Gate–Drain Charge Qgd – 3.0 –

BODY–DRAIN DIODE RATINGS (Note 6.)


Diode Forward On–Voltage (IS = 4.2 Adc, VGS = 0 Vdc) VSD – 0.85 1.1 Vdc
(IS = 4.2 Adc, VGS = 0 Vdc, TJ = 125°C) – 0.70 –
Reverse Recovery Time trr – 20 – ns
(IS = 4.2
4 2 Adc,
Ad VGS = 0 Vdc,
Vd
ta – 12 –
dIS/dt = 100 A/µs)
tb – 8.0 –
Reverse Recovery Stored Charge QRR – 0.01 – µC
5. Handling precautions to protect against electrostatic discharge is mandatory.
6. Indicates Pulse Test: Pulse Width = 300 µs max, Duty Cycle = 2%.
7. Switching characteristics are independent of operating junction temperature.

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NTMS4N01R2

7
8V 2.1 V 1.9 V
8 VDS ≥ 10 V
6
ID, DRAIN CURRENT (AMPS)

ID, DRAIN CURRENT (AMPS)


4.5 V
3.1 V
5 TJ = 25°C
2.7 V 6
2.5 V
4 2.3 V

3 1.7 V 4
100°C
2
2 25°C
1 1.5 V TJ = –55°C
VGS = 1.3 V
0 0
0 0.25 0.5 0.75 1 1.25 1.5 1.75 2 0.5 1 1.5 2 2.5
VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS) VGS, GATE–TO–SOURCE VOLTAGE (VOLTS)

Figure 1. On–Region Characteristics Figure 2. Transfer Characteristics


RDS(on), DRAIN–TO SOURCE–RESISTANCE (W)

RDS(on), DRAIN–TO SOURCE–RESISTANCE (W)


0.08 0.05
ID = 4.2 A TJ = 25°C
0.07 TJ = 25°C
0.04
VGS = 2.5 V
0.06

VGS = 2.7 V
0.05 0.03
VGS = 4.5 V
0.04
0.02
0.03

0.02 0.01
0 2 4 6 8 0 2 4 6 8 10
VGS, GATE–TO–SOURCE VOLTAGE (VOLTS) ID, DRAIN CURRENT (AMPS)

Figure 3. On–Resistance versus Figure 4. On-Resistance versus Drain Current


RDS(on), DRAIN–TO–SOURCE RESISTANCE (NORMALIZED)

Gate–To–Source Voltage and Gate Voltage

1.6 10,000
VGS = 0 V
ID = 4.2 A
1.4 VGS = 4.5 V
IDSS, LEAKAGE (nA)

TJ = 150°C
1.2
1000
1

TJ = 125°C
0.8

0.6 100
–50 –25 0 25 50 75 100 125 150 2 4 6 8 10 12 14 16 18 20
TJ, JUNCTION TEMPERATURE (°C) VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS)

Figure 5. On–Resistance Variation with Figure 6. Drain–To–Source Leakage Current


Temperature versus Voltage

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NTMS4N01R2

2500
VDS = 0 V VGS = 0 V
Ciss TJ = 25°C
2000

C, CAPACITANCE (pF)
1500
Crss

1000
Ciss

500
Coss
Crss
0
8 6 4 2 0 2 4 6 8 10 12
VGS VDS

GATE–TO–SOURCE OR DRAIN–TO–SOURCE VOLTAGE (VOLTS)

Figure 7. Capacitance Variation


VGS , GATE–TO–SOURCE VOLTAGE (VOLTS)

5 20

V DS, DRAIN–TO–SOURCE VOLTAGE (VOLTS)


QT

4 VGS 16

VDS
3 12
Q1 Q2
2 8

ID = 4.2 A
1 TJ = 25°C 4

0 0
0 2 4 6 8 10 12
Qg, TOTAL GATE CHARGE (nC)
Figure 8. Gate–To–Source and Drain–To–Source
Voltage versus Total Charge

1000 1000
VDD = 10 V VDD = 10 V
ID = 4.2 A ID = 2.1 A
VGS = 4.5 V VGS = 4.5 V
t, TIME (ns)

t, TIME (ns)

td(off) tf
100 tf 100
td(off)
tr
tr

td(on) td(on)

10 10
1 10 100 1 10 100
RG, GATE RESISTANCE (OHMS) RG, GATE RESISTANCE (OHMS)
Figure 9. Resistive Switching Time Variation Figure 10. Resistive Switching Time Variation
versus Gate Resistance versus Gate Resistance

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NTMS4N01R2

DRAIN–TO–SOURCE DIODE CHARACTERISTICS

4 100
VGS = 20 V
VGS = 0 V
IS, SOURCE CURRENT (AMPS)

ID , DRAIN CURRENT (AMPS)


SINGLE PULSE 100 ms
TJ = 25°C
TC = 25°C
3 10 1.0 ms

10 ms
2 1
RDS(on) LIMIT
THERMAL LIMIT
PACKAGE LIMIT dc
1 0.1
Mounted on 2″ sq. FR4 board (1″ sq. 2 oz.
Cu 0.06″ thick single sided), 10s max.
0 0.01
0.3 0.4 0.5 0.6 0.7 0.8 0.9 0.1 1 10 100
VSD, SOURCE–TO–DRAIN VOLTAGE (VOLTS) VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS)

Figure 11. Diode Forward Voltage versus Current Figure 12. Maximum Rated Forward Biased
Safe Operating Area

di/dt
IS
trr
ta tb
TIME

tp 0.25 IS

IS

Figure 13. Diode Reverse Recovery Waveform

TYPICAL ELECTRICAL CHARACTERISTICS

10
Rthja(t), EFFECTIVE TRANSIENT
THERMAL RESISTANCE

1
D = 0.5
0.2
0.1
0.1
0.05 
 θ   
0.02 2%* ## Ω # Ω #$8: Ω :#4 Ω 9894 Ω
0.01
0.01
# . #: . 4$: . 464 . 866 .
+%1'
SINGLE PULSE
0.001
1.0E–05 1.0E–04 1.0E–03 1.0E–02 1.0E–01 1.0E+00 1.0E+01 1.0E+02 1.0E+03
t, TIME (s)

Figure 14. Thermal Response

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161
NTMS4N01R2

INFORMATION FOR USING THE SO–8 SURFACE MOUNT PACKAGE

MINIMUM RECOMMENDED FOOTPRINT FOR SURFACE MOUNTED APPLICATIONS


Surface mount board layout is a critical portion of the total interface between the board and the package. With the
design. The footprint for the semiconductor packages must correct pad geometry, the packages will self–align when
be the correct size to ensure proper solder connection subjected to a solder reflow process.

9
$#

#:$ $$
: 6

#6 $
9 #:
inches
mm

SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • The soldering temperature and time shall not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within • When shifting from preheating to soldering, the
a short time could result in device failure. Therefore, the maximum temperature gradient shall be 5°C or less.
following items should always be observed in order to • After soldering has been completed, the device should
minimize the thermal stress to which the devices are be allowed to cool naturally for at least three minutes.
subjected. Gradual cooling should be used as the use of forced
• Always preheat the device. cooling will increase the temperature gradient and
• The delta temperature between the preheat and result in latent failure due to mechanical stress.
soldering should be 100°C or less.* • Mechanical stress or shock should not be applied
• When preheating and soldering, the temperature of the during cooling.
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When * Soldering a device without preheating can cause
using infrared heating with the reflow soldering excessive thermal shock and stress which can result in
method, the difference shall be a maximum of 10°C. damage to the device.

http://onsemi.com
162
NTMS4N01R2

TYPICAL SOLDER HEATING PROFILE


For any given circuit board, there will be a group of temperature versus time. The line on the graph shows the
control settings that will give the desired heat pattern. The actual temperature that might be experienced on the surface
operator must set temperatures for several heating zones of a test board at or near a central solder joint. The two
and a figure for belt speed. Taken together, these control profiles are based on a high density and a low density
settings make up a heating “profile” for that particular board. The Vitronics SMD310 convection/infrared reflow
circuit board. On machines controlled by a computer, the soldering system was used to generate this profile. The type
computer remembers these profiles from one operating of solder used was 62/36/2 Tin Lead Silver with a melting
session to the next. Figure 15 shows a typical heating point between 177–189°C. When this type of furnace is
profile for use when soldering a surface mount device to a used for solder reflow work, the circuit boards and solder
printed circuit board. This profile will vary among joints tend to heat first. The components on the board are
soldering systems, but it is a good starting point. Factors then heated by conduction. The circuit board, because it has
that can affect the profile include the type of soldering a large surface area, absorbs the thermal energy more
system in use, density and types of components on the efficiently, then distributes this energy to the components.
board, type of solder used, and the type of board or Because of this effect, the main body of a component may
substrate material being used. This profile shows be up to 30 degrees cooler than the adjacent solder joints.

STEP 1 STEP 2 STEP 3 STEP 4 STEP 5 STEP 6 STEP 7


PREHEAT VENT HEATING HEATING HEATING VENT COOLING
ZONE 1 “SOAK” ZONES 2 & 5 ZONES 3 & 6 ZONES 4 & 7
“RAMP” “RAMP” “SOAK” “SPIKE” 205° TO 219°C
PEAK AT
200°C DESIRED CURVE FOR HIGH 170°C SOLDER
MASS ASSEMBLIES JOINT
160°C
150°C

150°C
SOLDER IS LIQUID FOR
40 TO 80 SECONDS
100°C 140°C (DEPENDING ON
MASS OF ASSEMBLY)
100°C

DESIRED CURVE FOR LOW


MASS ASSEMBLIES
5°C

TIME (3 TO 7 MINUTES TOTAL) TMAX


Figure 15. Typical Solder Heating Profile

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163
#

 

#$%& '(
-    
P–Channel Enhancement–Mode
Single SO–8 Package http://onsemi.com
Features
• High Density Power MOSFET with Ultra Low RDS(on)
Providing Higher Efficiency –4.5 AMPERES
• Miniature SO–8 Surface Mount Package – Saves Board Space –12 VOLTS
• Diode Exhibits High Speed with Soft Recovery
0.045 W @ VGS = –4.5 V
• IDSS Specified at Elevated Temperature
• Drain–to–Source Avalanche Energy Specified
• Mounting Information for the SO–8 Package is Provided Single P–Channel

Applications D
• Power Management in Portable and Battery–Powered Products, i.e.:
Computers, Printers, PCMCIA Cards, Cellular & Cordless Telephones

MAXIMUM RATINGS G

Please See the Table on the Following Page


S

1
SO–8
CASE 751
STYLE 13

MARKING DIAGRAM
& PIN ASSIGNMENT
1 8
N.C. Drain
2 7
Source E4P01 Drain
3 LYWW 6
Source Drain
4 5
Gate Drain
Top View

E4P01 = Device Code


L = Assembly Location
Y = Year
WW = Work Week

ORDERING INFORMATION

Device Package Shipping

NTMS4P01R2 SO–8 2500/Tape & Reel


This document contains information on a product under development. ON Semiconductor
reserves the right to change or discontinue this product without notice.

 Semiconductor Components Industries, LLC, 2001 164 Publication Order Number:


February, 2001 – Rev. 0 NTMS4P01R2/D
NTMS4P01R2

MAXIMUM RATINGS (TJ = 25°C unless otherwise noted)


Rating Symbol Value Unit
Drain–to–Source Voltage VDSS –12 V
Drain–to–Gate Voltage (RGS = 1.0 mW) VDGR –12 V
Gate–to–Source Voltage – Continuous VGS ±10 V
Thermal Resistance –
Junction–to–Ambient (Note 1.) RθJA 50 °C/W
Total Power Dissipation @ TA = 25°C PD 2.5 W
Continuous Drain Current @ 25°C ID –6.04 A
Continuous Drain Current @ 70°C ID –4.82 A
Maximum Operating Power Dissipation PD 1.2 W
Maximum Operating Drain Current ID –4.18 A
Pulsed Drain Current (Note 4.) IDM –20 A
Thermal Resistance –
Junction–to–Ambient (Note 2.) RθJA 85 °C/W
Total Power Dissipation @ TA = 25°C PD 1.47 W
Continuous Drain Current @ 25°C ID –4.50 A
Continuous Drain Current @ 70°C ID –3.65 A
Maximum Operating Power Dissipation PD 0.7 W
Maximum Operating Drain Current ID –3.20 A
Pulsed Drain Current (Note 4.) IDM –15 A
Thermal Resistance –
Junction–to–Ambient (Note 3.) RθJA 159 °C/W
Total Power Dissipation @ TA = 25°C PD 0.79 W
Continuous Drain Current @ 25°C ID –3.40 A
Continuous Drain Current @ 70°C ID –2.72 A
Maximum Operating Power Dissipation PD 0.38 W
Maximum Operating Drain Current ID –2.32 A
Pulsed Drain Current (Note 4.) IDM –12 A
Operating and Storage Temperature Range TJ, Tstg –55 to +150 °C
Single Pulse Drain–to–Source Avalanche Energy – Starting TJ = 25°C EAS 320 mJ
(VDD = –12 Vdc, VGS = –5.0 Vdc, Peak IL = –8.0 Apk, L = 10 mH, RG = 25 Ω)
Maximum Lead Temperature for Soldering Purposes, 1/8″ from case for 10 seconds TL 260 °C
1. Mounted onto a 2″ square FR–4 Board (1″ sq. 2 oz Cu 0.06″ thick single sided), t ≤ 10 seconds.
2. Mounted onto a 2″ square FR–4 Board (1″ sq. 2 oz Cu 0.06″ thick single sided), t = steady state.
3. Minimum FR–4 or G–10 PCB, t = Steady State.
4. Pulse Test: Pulse Width = 300 ms, Duty Cycle = 2%.

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ELECTRICAL CHARACTERISTICS (TC = 25°C unless otherwise noted) (Note 5.)


Characteristic Symbol Min Typ Max Unit
OFF CHARACTERISTICS
Drain–to–Source Breakdown Voltage V(BR)DSS Vdc
(VGS = 0 Vdc, ID = –250 µAdc) –12 – –
Temperature Coefficient (Positive) – –15 – mV/°C
Zero Gate Voltage Drain Current IDSS µAdc
(VDS = –12 Vdc, VGS = 0 Vdc, TJ = 25°C) – – –1.0
(VDS = –12 Vdc, VGS = 0 Vdc, TJ = 125°C) – – –10
Gate–Body Leakage Current IGSS nAdc
(VGS = –10 Vdc, VDS = 0 Vdc) – – –100
Gate–Body Leakage Current IGSS nAdc
(VGS = +10 Vdc, VDS = 0 Vdc) – – 100

ON CHARACTERISTICS
Gate Threshold Voltage VGS(th) Vdc
(VDS = VGS, ID = –250 µAdc) –0.65 –0.9 –1.15
Temperature Coefficient (Negative) – 2.9 – mV/°C
Static Drain–to–Source On–State Resistance RDS(on) Ω
(VGS = –4.5 Vdc, ID = –4.5 Adc) – 0.030 0.045
(VGS = –2.7 Vdc, ID = –2.25 Adc) – 0.040 0.055
(VGS = –2.5 Vdc, ID = –2.25 Adc) – 0.045 –
Forward Transconductance (VDS = –2.5 Vdc, ID = –2.25 Adc) gFS – 10 – Mhos
DYNAMIC CHARACTERISTICS
Input Capacitance Ciss – 1435 1850 pF
Output Capacitance (VDS = –9.6
9 6 Vdc,
Vd VGS = 0 Vdc,
Vd
Coss – 635 1000
f = 1.0 MHz)
Reverse Transfer Capacitance Crss – 210 400
SWITCHING CHARACTERISTICS (Notes 6. & 7.)
Turn–On Delay Time td(on) – 20 35 ns
Rise Time (VDD = –12 Vdc, ID = –4.5 Adc, tr – 60 100
VGS = –4.5
4 5 Vdc,
Vdc
Turn–Off Delay Time RG = 6.0 Ω) td(off) – 65 100
Fall Time tf – 75 125
Total Gate Charge Qtot – 20 35 nC
(VDS = –9.6 Vdc,
Gate–Source Charge VGS = –4.5 Vdc, Qgs – 4.0 –
ID = –4.5
4 5 Ad
Adc))
Gate–Drain Charge Qgd – 7.0 –
BODY–DRAIN DIODE RATINGS (Note 6.)
Diode Forward On–Voltage (IS = –4.5 Adc, VGS = 0 V) VSD – –0.9 –1.25 Vdc
(IS = –4.5 Adc, VGS = 0 Vdc, TJ = 125°C) – –0.7 –
Reverse Recovery Time trr – 38 – ns
(IS = –4.5
4 5 Adc,
Ad VGS = 0 Vdc,
Vd
ta – 20 –
dIS/dt = 100 A/µs)
tb – 18 –
Reverse Recovery Stored Charge QRR – 0.03 – µC
5. Handling precautions to protect against electrostatic discharge is mandatory.
6. Indicates Pulse Test: Pulse Width = 300 µs max, Duty Cycle = 2%.
7. Switching characteristics are independent of operating junction temperature.

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NTMS4P01R2

8 –8 V
–2.3 V –2.1 V
TJ = 25°C VDS ≥ –10 V
7 8
–ID, DRAIN CURRENT (AMPS)

–ID, DRAIN CURRENT (AMPS)


–4.5 V
6 –3.7 V
–3.1 V
–2.7 V –1.9 V 6
5

4
–2.5 V 4
3 100°C
–1.7 V
2 25°C
2
1 TJ = –55°C
VGS = –1.3 V
0 0
0 0.25 0.5 0.75 1 1.25 1.5 1.75 2 0.5 1 1.5 2 2.5
–VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS) –VGS, GATE–TO–SOURCE VOLTAGE (VOLTS)

Figure 1. On–Region Characteristics Figure 2. Transfer Characteristics


RDS(on), DRAIN–TO–SOURCE RESISTANCE (W)

RDS(on), DRAIN–TO–SOURCE RESISTANCE (W)


0.12 0.05
ID = –4.5 A
TJ = 25°C
TJ = 25°C
VGS = –2.5 V
0.09 0.04

VGS = –2.7 V
0.06 0.03

VGS = –4.5 V

0.03 0.02

0 0.01
0 2 4 6 8 2 4 6 8
–VGS, GATE–TO–SOURCE VOLTAGE (VOLTS) –ID, DRAIN CURRENT (AMPS)

Figure 3. On–Resistance versus Figure 4. On-Resistance versus Drain Current


RDS(on), DRAIN–TO–SOURCE RESISTANCE (NORMALIZED)

Gate–To–Source Voltage and Gate Voltage

1.6 10,000
VGS = 0 V
ID = –4.5 A
1.4
VGS = –4.5 V TJ = 150°C
–IDSS, LEAKAGE (nA)

1.2
1000
1
TJ = 125°C

0.8

0.6 100
–50 –25 0 25 50 75 100 125 150 2 4 6 8 10 12
TJ, JUNCTION TEMPERATURE (°C) –VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS)

Figure 5. On–Resistance Variation with Figure 6. Drain–To–Source Leakage Current


Temperature versus Voltage

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NTMS4P01R2

–VGS , GATE–TO–SOURCE VOLTAGE (VOLTS)

–VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS)


5 10
VDS = 0 V VGS = 0 V
4000
Ciss TJ = 25°C QT
4 8
C, CAPACITANCE (pF)

–VDS –VGS
3000
3 Q1 Q2 6
Crss
2000
Ciss 2 4

1000 ID = –4.5 A
Coss 1 2
TJ = 25°C
Crss
0 0 0
10 8 6 4 2 0 2 4 6 8 10 12 0 4 8 12 16 20 24
–VGS –VDS Qg, TOTAL GATE CHARGE (nC)

GATE–TO–SOURCE OR Figure 8. Gate–To–Source and Drain–To–Source


DRAIN–TO–SOURCE VOLTAGE (VOLTS) Voltage versus Total Charge
Figure 7. Capacitance Variation
1000 4
VGS = 0 V

–IS, SOURCE CURRENT (AMPS)


VDD = –12 V
ID = –4.5 A TJ = 25°C
VGS = –4.5 V 3
td(off)
tf
t, TIME (ns)

tr
100 2

td(on)
1

10 0
1 10 100 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9 1
RG, GATE RESISTANCE (OHMS) –VSD, SOURCE–TO–DRAIN VOLTAGE (VOLTS)

Figure 9. Resistive Switching Time Variation Figure 10. Diode Forward Voltage versus Current
versus Gate Resistance

DRAIN–TO–SOURCE DIODE CHARACTERISTICS


100
VGS = 10 V
ID , DRAIN CURRENT (AMPS)

SINGLE PULSE
TC = 25°C
10 1.0 ms

10 ms
di/dt
1 IS
RDS(on) LIMIT
THERMAL LIMIT trr
dc
PACKAGE LIMIT ta tb
0.1
Mounted on 2″ sq. FR4 board TIME
(1″ sq. 2 oz. Cu 0.06″ thick
single sided), 10s max. tp 0.25 IS
0.01
0.1 1 10 100 IS
VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS)

Figure 11. Maximum Rated Forward Biased Figure 12. Diode Reverse Recovery Waveform
Safe Operating Area

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NTMS4P01R2

TYPICAL ELECTRICAL CHARACTERISTICS

10
Rthja(t), EFFECTIVE TRANSIENT
THERMAL RESISTANCE

1
D = 0.5
0.2
0.1
0.1
0.05 
 θ   
0.02 2%* 94 Ω 9$# Ω 788 Ω 96 Ω 7$# Ω
0.01
0.01
4: . 998 . $$6 . 764: . :#69 .
+%1'
SINGLE PULSE
0.001
1.0E–05 1.0E–04 1.0E–03 1.0E–02 1.0E–01 1.0E+00 1.0E+01 1.0E+02 1.0E+03
t, TIME (s)

Figure 13. Thermal Response

INFORMATION FOR USING THE SO–8 SURFACE MOUNT PACKAGE


MINIMUM RECOMMENDED FOOTPRINT FOR SURFACE MOUNTED APPLICATIONS
Surface mount board layout is a critical portion of the total interface between the board and the package. With the
design. The footprint for the semiconductor packages must correct pad geometry, the packages will self–align when
be the correct size to ensure proper solder connection subjected to a solder reflow process.

9
$#

#:$ $$
: 6

#6 $ inches


9 #: mm

SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • The soldering temperature and time shall not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within • When shifting from preheating to soldering, the
a short time could result in device failure. Therefore, the maximum temperature gradient shall be 5°C or less.
following items should always be observed in order to • After soldering has been completed, the device should
minimize the thermal stress to which the devices are be allowed to cool naturally for at least three minutes.
subjected. Gradual cooling should be used as the use of forced
• Always preheat the device. cooling will increase the temperature gradient and
• The delta temperature between the preheat and result in latent failure due to mechanical stress.
soldering should be 100°C or less.* • Mechanical stress or shock should not be applied
• When preheating and soldering, the temperature of the during cooling.
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When * Soldering a device without preheating can cause
using infrared heating with the reflow soldering excessive thermal shock and stress which can result in
method, the difference shall be a maximum of 10°C. damage to the device.

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NTMS4P01R2

TYPICAL SOLDER HEATING PROFILE


For any given circuit board, there will be a group of temperature versus time. The line on the graph shows the
control settings that will give the desired heat pattern. The actual temperature that might be experienced on the surface
operator must set temperatures for several heating zones of a test board at or near a central solder joint. The two
and a figure for belt speed. Taken together, these control profiles are based on a high density and a low density
settings make up a heating “profile” for that particular board. The Vitronics SMD310 convection/infrared reflow
circuit board. On machines controlled by a computer, the soldering system was used to generate this profile. The type
computer remembers these profiles from one operating of solder used was 62/36/2 Tin Lead Silver with a melting
session to the next. Figure 14 shows a typical heating point between 177–189°C. When this type of furnace is
profile for use when soldering a surface mount device to a used for solder reflow work, the circuit boards and solder
printed circuit board. This profile will vary among joints tend to heat first. The components on the board are
soldering systems, but it is a good starting point. Factors then heated by conduction. The circuit board, because it has
that can affect the profile include the type of soldering a large surface area, absorbs the thermal energy more
system in use, density and types of components on the efficiently, then distributes this energy to the components.
board, type of solder used, and the type of board or Because of this effect, the main body of a component may
substrate material being used. This profile shows be up to 30 degrees cooler than the adjacent solder joints.

STEP 1 STEP 2 STEP 3 STEP 4 STEP 5 STEP 6 STEP 7


PREHEAT VENT HEATING HEATING HEATING VENT COOLING
ZONE 1 “SOAK” ZONES 2 & 5 ZONES 3 & 6 ZONES 4 & 7
“RAMP” “RAMP” “SOAK” “SPIKE” 205° TO 219°C
PEAK AT
200°C DESIRED CURVE FOR HIGH 170°C SOLDER
MASS ASSEMBLIES JOINT
160°C
150°C

150°C
SOLDER IS LIQUID FOR
40 TO 80 SECONDS
100°C 140°C (DEPENDING ON
MASS OF ASSEMBLY)
100°C

DESIRED CURVE FOR LOW


MASS ASSEMBLIES
5°C

TIME (3 TO 7 MINUTES TOTAL) TMAX


Figure 14. Typical Solder Heating Profile

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# 

 

#$%& '(
-     
P–Channel Enhancement–Mode
Single SO–8 Package http://onsemi.com
Features
• High Density Power MOSFET with Ultra Low RDS(on)
Providing Higher Efficiency –5.4 AMPERES
• Miniature SO–8 Surface Mount Package – Saves Board Space –20 VOLTS
• Diode Exhibits High Speed with Soft Recovery
0.033 W @ VGS = –4.5 V
• IDSS Specified at Elevated Temperature
• Drain–to–Source Avalanche Energy Specified
• Mounting Information for the SO–8 Package is Provided Single P–Channel

Applications D
• Power Management in Portable and Battery–Powered Products, i.e.:
Computers, Printers, PCMCIA Cards, Cellular & Cordless Telephones

MAXIMUM RATINGS G

Please See the Table on the Following Page


S

1
SO–8
CASE 751
STYLE 13

MARKING DIAGRAM
& PIN ASSIGNMENT
1 8
N.C. Drain
2 7
Source E5P02 Drain
3 LYWW 6
Source Drain
4 5
Gate Drain
Top View

E5P02 = Device Code


L = Assembly Location
Y = Year
WW = Work Week

ORDERING INFORMATION

Device Package Shipping

NTMS5P02R2 SO–8 2500/Tape & Reel


This document contains information on a product under development. ON Semiconductor
reserves the right to change or discontinue this product without notice.

 Semiconductor Components Industries, LLC, 2001 171 Publication Order Number:


February, 2001 – Rev. 0 NTMS5P02R2/D
NTMS5P02R2

MAXIMUM RATINGS (TJ = 25°C unless otherwise noted)


Rating Symbol Value Unit
Drain–to–Source Voltage VDSS –20 V
Drain–to–Gate Voltage (RGS = 1.0 mW) VDGR –20 V
Gate–to–Source Voltage – Continuous VGS ±10 V
Thermal Resistance –
Junction–to–Ambient (Note 1) RθJA 50 °C/W
Total Power Dissipation @ TA = 25°C PD 2.5 W
Continuous Drain Current @ 25°C ID –7.05 A
Continuous Drain Current @ 70°C ID –5.62 A
Maximum Operating Power Dissipation PD 1.2 W
Maximum Operating Drain Current ID –4.85 A
Pulsed Drain Current (Note 4.) IDM –28 A
Thermal Resistance –
Junction–to–Ambient (Note 2.) RθJA 85 °C/W
Total Power Dissipation @ TA = 25°C PD 1.47 W
Continuous Drain Current @ 25°C ID –5.40 A
Continuous Drain Current @ 70°C ID –4.30 A
Maximum Operating Power Dissipation PD 0.7 W
Maximum Operating Drain Current ID –3.72 A
Pulsed Drain Current (Note 4.) IDM –20 A
Thermal Resistance –
Junction–to–Ambient (Note 3.) RθJA 159 °C/W
Total Power Dissipation @ TA = 25°C PD 0.79 W
Continuous Drain Current @ 25°C ID –3.95 A
Continuous Drain Current @ 70°C ID –3.15 A
Maximum Operating Power Dissipation PD 0.38 W
Maximum Operating Drain Current ID –2.75 A
Pulsed Drain Current (Note 4.) IDM –12 A
Operating and Storage TJ, Tstg –55 to +150 °C
Temperature Range
Single Pulse Drain–to–Source Avalanche Energy – Starting TJ = 25°C EAS 360 mJ
(VDD = –20 Vdc, VGS = –5.0 Vdc, Peak IL = –8.5 Apk, L = 10 mH, RG = 25 Ω)
Maximum Lead Temperature for Soldering Purposes, 1/8″ from case for 10 seconds TL 260 °C
1. Mounted onto a 2″ square FR–4 Board (1″ sq. 2 oz Cu 0.06″ thick single sided), t ≤ 10 seconds.
2. Mounted onto a 2″ square FR–4 Board (1″ sq. 2 oz Cu 0.06″ thick single sided), t = steady state.
3. Minimum FR–4 or G–10 PCB, t = Steady State.
4. Pulse Test: Pulse Width = 300 ms, Duty Cycle = 2%.

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NTMS5P02R2

ELECTRICAL CHARACTERISTICS (TC = 25°C unless otherwise noted) (Note 5.)


Characteristic Symbol Min Typ Max Unit
OFF CHARACTERISTICS
Drain–to–Source Breakdown Voltage V(BR)DSS Vdc
(VGS = 0 Vdc, ID = –250 µAdc) –20 – –
Temperature Coefficient (Positive) – –15 – mV/°C
Zero Gate Voltage Drain Current IDSS µAdc
(VDS = –16 Vdc, VGS = 0 Vdc, TJ = 25°C) – – –1.0
(VDS = –16 Vdc, VGS = 0 Vdc, TJ = 125°C) – – –10
(VDS = –20 Vdc, VGS = 0 Vdc, TJ = 25°C) – –0.2 –
Gate–Body Leakage Current IGSS nAdc
(VGS = –10 Vdc, VDS = 0 Vdc) – – –100
Gate–Body Leakage Current IGSS nAdc
(VGS = +10 Vdc, VDS = 0 Vdc) – – 100

ON CHARACTERISTICS
Gate Threshold Voltage VGS(th) Vdc
(VDS = VGS, ID = –250 µAdc) –0.65 –0.9 –1.25
Temperature Coefficient (Negative) – 2.9 – mV/°C
Static Drain–to–Source On–State Resistance RDS(on) Ω
(VGS = –4.5 Vdc, ID = –5.4 Adc) – 0.026 0.033
(VGS = –2.5 Vdc, ID = –2.7 Adc) – 0.037 0.048
Forward Transconductance (VDS = –9.0 Vdc, ID = –5.4 Adc) gFS – 15 – Mhos
DYNAMIC CHARACTERISTICS
Input Capacitance Ciss – 1375 1900 pF
Output Capacitance (VDS = –16
16 Vdc,
Vd VGS = 0 Vdc,
Vd
Coss – 510 900
f = 1.0 MHz)
Reverse Transfer Capacitance Crss – 200 380
SWITCHING CHARACTERISTICS (Notes 6. & 7.)
Turn–On Delay Time td(on) – 18 35 ns
Rise Time (VDD = –16 Vdc, ID = –1.0 Adc, tr – 25 50
VGS = –4.5
4 5 Vdc,
Vdc
Turn–Off Delay Time RG = 6.0 Ω) td(off) – 70 125
Fall Time tf – 55 100
Turn–On Delay Time td(on) – 22 – ns
Rise Time (VDD = –16 Vdc, ID = –5.4 Adc, tr – 70 –
VGS = –4.5
4 5 Vdc,
Vdc
Turn–Off Delay Time RG = 6.0 Ω) td(off) – 65 –
Fall Time tf – 90 –
Total Gate Charge Qtot – 20 35 nC
(VDS = –16 Vdc,
Gate–Source Charge VGS = –4.5 Vdc, Qgs – 4.0 –
ID = –5.4
5 4 Ad
Adc))
Gate–Drain Charge Qgd – 7.0 –

BODY–DRAIN DIODE RATINGS (Note 6.)


Diode Forward On–Voltage (IS = –5.4 Adc, VGS = 0 V) VSD – –0.95 –1.25 Vdc
(IS = –5.4 Adc, VGS = 0 Vdc, TJ = 125°C) – –0.72 –
Reverse Recovery Time trr – 40 75 ns
(IS = –5.4
5 4 Adc,
Ad VGS = 0 Vdc,
Vd
ta – 20 –
dIS/dt = 100 A/µs)
tb – 20 –
Reverse Recovery Stored Charge QRR – 0.03 – µC
5. Handling precautions to protect against electrostatic discharge is mandatory.
6. Indicates Pulse Test: Pulse Width = 300 µs max, Duty Cycle = 2%.
7. Switching characteristics are independent of operating junction temperature.

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NTMS5P02R2

12 12
–8 V –2.3 V
TJ = 25°C VDS ≥ –10 V
–ID, DRAIN CURRENT (AMPS)

–ID, DRAIN CURRENT (AMPS)


10 –4.5 V 10
–3.7 V –2.1 V
–3.1 V
8 8

–2.7 V
6 –2.5 V 6
–1.9 V 100°C

4 4
25°C TJ = –55°C
–1.7 V
2 2
VGS = –1.3 V
0 0
0 0.25 0.5 0.75 1 1.25 1.5 1.75 2 1 1.5 2 2.5 3
–VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS) –VGS, GATE–TO–SOURCE VOLTAGE (VOLTS)

Figure 1. On–Region Characteristics Figure 2. Transfer Characteristics


RDS(on), DRAIN–TO–SOURCE RESISTANCE (W)

RDS(on), DRAIN–TO–SOURCE RESISTANCE (W)


0.08 0.05
ID = –5.4 A
TJ = 25°C
TJ = 25°C VGS = –2.5 V
0.06 0.04

VGS = –2.7 V
0.04 0.03

VGS = –4.5 V
0.02 0.02

0 0.01
0 2 4 6 8 10 2 4 6 8 10 12
–VGS, GATE–TO–SOURCE VOLTAGE (VOLTS) –ID, DRAIN CURRENT (AMPS)

Figure 3. On–Resistance versus Figure 4. On-Resistance versus Drain Current


RDS(on), DRAIN–TO–SOURCE RESISTANCE (NORMALIZED)

Gate–To–Source Voltage and Gate Voltage

1.6 10,000
VGS = 0 V
ID = –5.4 A
1.4 TJ = 150°C
VGS = –4.5 V
–IDSS, LEAKAGE (nA)

1.2
1000
1 TJ = 125°C

0.8

0.6 100
–50 –25 0 25 50 75 100 125 150 2 4 6 8 10 12 14 16 18 20
TJ, JUNCTION TEMPERATURE (°C) –VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS)

Figure 5. On–Resistance Variation with Figure 6. Drain–To–Source Leakage Current


Temperature versus Voltage

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NTMS5P02R2

–VGS , GATE–TO–SOURCE VOLTAGE (VOLTS)

–VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS)


5 20
VDS = 0 V VGS = 0 V QT
4000
Ciss TJ = 25°C
4 –VGS 16
C, CAPACITANCE (pF)

–VDS
3000
3 Q1 Q2 12
Crss
2000
2 8
Ciss
ID = –5.4 A
1000 TJ = 25°C
1 4
Coss
Crss
0 0 0
10 5 0 5 10 15 20 0 4 8 12 16 20 24
–VGS –VDS Qg, TOTAL GATE CHARGE (nC)

GATE–TO–SOURCE OR Figure 8. Gate–To–Source and Drain–To–Source


DRAIN–TO–SOURCE VOLTAGE (VOLTS) Voltage versus Total Charge
Figure 7. Capacitance Variation
1000
VDD = –16 V 5

–IS, SOURCE CURRENT (AMPS)


VGS = 0 V
ID = –5.4 A TJ = 25°C
VGS = –4.5 V
td(off) 4
tf
t, TIME (ns)

tr
3
100

2
td(on)
1

10 0
1 10 100 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9 1
RG, GATE RESISTANCE (OHMS) –VSD, SOURCE–TO–DRAIN VOLTAGE (VOLTS)

Figure 9. Resistive Switching Time Variation Figure 10. Diode Forward Voltage versus Current
versus Gate Resistance

DRAIN–TO–SOURCE DIODE CHARACTERISTICS


100
VGS = 20 V
ID , DRAIN CURRENT (AMPS)

SINGLE PULSE
TC = 25°C 1 ms

10
di/dt
IS
10 ms
trr
1
ta tb
RDS(on) LIMIT TIME
THERMAL LIMIT
PACKAGE LIMIT dc tp 0.25 IS
0.1
0.1 1 10 100 IS
VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS)

Figure 11. Maximum Rated Forward Biased Figure 12. Diode Reverse Recovery Waveform
Safe Operating Area

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175
NTMS5P02R2

TYPICAL ELECTRICAL CHARACTERISTICS

10
Rthja(t), EFFECTIVE TRANSIENT
THERMAL RESISTANCE

1
D = 0.5
0.2
0.1
0.1
0.05 
 θ   
0.02 2%* 94 Ω 9$# Ω 788 Ω 96 Ω 7$# Ω
0.01
0.01
4: . 998 . $$6 . 764: . :#69 .
+%1'
SINGLE PULSE
0.001
1.0E–05 1.0E–04 1.0E–03 1.0E–02 1.0E–01 1.0E+00 1.0E+01 1.0E+02 1.0E+03
t, TIME (s)

Figure 13. Thermal Response

INFORMATION FOR USING THE SO–8 SURFACE MOUNT PACKAGE


MINIMUM RECOMMENDED FOOTPRINT FOR SURFACE MOUNTED APPLICATIONS
Surface mount board layout is a critical portion of the total interface between the board and the package. With the
design. The footprint for the semiconductor packages must correct pad geometry, the packages will self–align when
be the correct size to ensure proper solder connection subjected to a solder reflow process.

9
$#

#:$ $$
: 6

#6 $ inches


9 #: mm

SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • The soldering temperature and time shall not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within • When shifting from preheating to soldering, the
a short time could result in device failure. Therefore, the maximum temperature gradient shall be 5°C or less.
following items should always be observed in order to • After soldering has been completed, the device should
minimize the thermal stress to which the devices are be allowed to cool naturally for at least three minutes.
subjected. Gradual cooling should be used as the use of forced
• Always preheat the device. cooling will increase the temperature gradient and
• The delta temperature between the preheat and result in latent failure due to mechanical stress.
soldering should be 100°C or less.* • Mechanical stress or shock should not be applied
• When preheating and soldering, the temperature of the during cooling.
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When * Soldering a device without preheating can cause
using infrared heating with the reflow soldering excessive thermal shock and stress which can result in
method, the difference shall be a maximum of 10°C. damage to the device.

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NTMS5P02R2

TYPICAL SOLDER HEATING PROFILE


For any given circuit board, there will be a group of temperature versus time. The line on the graph shows the
control settings that will give the desired heat pattern. The actual temperature that might be experienced on the surface
operator must set temperatures for several heating zones of a test board at or near a central solder joint. The two
and a figure for belt speed. Taken together, these control profiles are based on a high density and a low density
settings make up a heating “profile” for that particular board. The Vitronics SMD310 convection/infrared reflow
circuit board. On machines controlled by a computer, the soldering system was used to generate this profile. The type
computer remembers these profiles from one operating of solder used was 62/36/2 Tin Lead Silver with a melting
session to the next. Figure 14 shows a typical heating point between 177–189°C. When this type of furnace is
profile for use when soldering a surface mount device to a used for solder reflow work, the circuit boards and solder
printed circuit board. This profile will vary among joints tend to heat first. The components on the board are
soldering systems, but it is a good starting point. Factors then heated by conduction. The circuit board, because it has
that can affect the profile include the type of soldering a large surface area, absorbs the thermal energy more
system in use, density and types of components on the efficiently, then distributes this energy to the components.
board, type of solder used, and the type of board or Because of this effect, the main body of a component may
substrate material being used. This profile shows be up to 30 degrees cooler than the adjacent solder joints.

STEP 1 STEP 2 STEP 3 STEP 4 STEP 5 STEP 6 STEP 7


PREHEAT VENT HEATING HEATING HEATING VENT COOLING
ZONE 1 “SOAK” ZONES 2 & 5 ZONES 3 & 6 ZONES 4 & 7
“RAMP” “RAMP” “SOAK” “SPIKE” 205° TO 219°C
PEAK AT
200°C DESIRED CURVE FOR HIGH 170°C SOLDER
MASS ASSEMBLIES JOINT
160°C
150°C

150°C
SOLDER IS LIQUID FOR
40 TO 80 SECONDS
100°C 140°C (DEPENDING ON
MASS OF ASSEMBLY)
100°C

DESIRED CURVE FOR LOW


MASS ASSEMBLIES
5°C

TIME (3 TO 7 MINUTES TOTAL) TMAX


Figure 14. Typical Solder Heating Profile

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177
 # 

 

(45
Power MOSFET and Schottky Diode
Dual SO–8 Package
Features
• High Efficiency Components in a Single SO–8 Package http://onsemi.com
• High Density Power MOSFET with Low RDS(on),
Schottky Diode with Low VF
MOSFET
• Logic Level Gate Drive
• Independent Pin–Outs for MOSFET and Schottky Die –2.3 AMPERES
Allowing for Flexibility in Application Use –20 VOLTS
• Less Component Placement for Board Space Savings 90 mW @ VGS = –4.5 V
• SO–8 Surface Mount Package,
Mounting Information for SO–8 Package Provided
Applications
• Power Management in Portable and Battery–Powered Products, i.e.: SCHOTTKY DIODE
Computers, Printers, PCMCIA Cards, Cellular and Cordless Telephones
2.0 AMPERES
MOSFET MAXIMUM RATINGS (TJ = 25°C unless otherwise noted) 20 VOLTS
Rating Symbol Value Unit
580 mV @ IF = 2.0 A
Drain–to–Source Voltage VDSS –20 V
Gate–to–Source Voltage – Continuous VGS "10 V
Thermal Resistance – Junction–to–Ambient
(Note 1.) RθJA 175 °C/W  8
Total Power Dissipation @ TA = 25°C PD 0.71 W 
Continuous Drain Current @ TA = 25°C ID –2.3 A 8 # :

Continuous Drain Current @ TA = 100°C ID –1.45 A 9
Pulsed Drain Current (Note 4.) IDM –9.0 A 1  
4
Thermal Resistance – Junction–to–Ambient SO–8  
6 $
(Note 2.) RθJA 105 °C/W CASE 751
Total Power Dissipation @ TA = 25°C PD 1.19 W STYLE 18   /
Continuous Drain Current @ TA = 25°C ID –2.97 A
Continuous Drain Current @ TA = 100°C ID –1.88 A
Pulsed Drain Current (Note 4.) IDM –12 A
MARKING DIAGRAM
Thermal Resistance – Junction–to–Ambient & PIN ASSIGNMENTS
(Note 3.) RθJA 62.5 °C/W
Total Power Dissipation @ TA = 25°C PD 2.0 W 1 8
Continuous Drain Current @ TA = 25°C ID –3.85 A Anode Cathode
2 7
Continuous Drain Current @ TA = 100°C ID –2.43 A Anode E2P102 Cathode
Pulsed Drain Current (Note 4.) IDM –15 A 3 6
Source LYWW Drain
Operating and Storage TJ, Tstg –55 to °C 4 5
Gate Drain
Temperature Range +150
(Top View)
Single Pulse Drain–to–Source Avalanche EAS 350 mJ
Energy – Starting TJ = 25°C E2P102 = Device Code
(VDD = –20 Vdc, VGS = –4.5 Vdc, Peak IL L = Assembly Location
= –5.0 Apk, L = 28 mH, RG = 25 Ω) Y = Year
Maximum Lead Temperature for Soldering TL 260 °C WW = Work Week
Purposes, 1/8″ from case for 10 seconds
1. Minimum FR–4 or G–10 PCB, Steady State.
2. Mounted onto a 2″ square FR–4 Board (1″ sq. 2 oz Cu 0.06″ thick single ORDERING INFORMATION
sided), Steady State.
3. Mounted onto a 2″ square FR–4 Board (1″ sq. 2 oz Cu 0.06″ thick single Device Package Shipping
sided), t ≤ 10 seconds.
4. Pulse Test: Pulse Width = 300 ms, Duty Cycle = 2%. NTMSD2P102LR2 SO–8 2500/Tape & Reel
This document contains information on a product under development. ON Semiconductor
reserves the right to change or discontinue this product without notice.

 Semiconductor Components Industries, LLC, 2000 178 Publication Order Number:


December, 2000 – Rev. 1 NTMSD2P102LR2/D
NTMSD2P102LR2

SCHOTTKY MAXIMUM RATINGS (TJ = 25°C unless otherwise noted)


Rating Symbol Value Unit
Peak Repetitive Reverse Voltage VRRM 20 V
DC Blocking Voltage VR
Average Forward Current (Note 5.) IO 1.0 A
(Rated VR, TA = 100°C)
Peak Repetitive Forward Current IFRM 2.0 A
(Note 5.) (Rated VR, Square Wave, 20 kHz, TA = 105°C)
Non–Repetitive Peak Surge Current (Note 5.) IFSM 20 A
(Surge Applied at Rated Load Conditions, Half–Wave, Single Phase, 60 Hz)

ELECTRICAL CHARACTERISTICS (TJ = 25°C unless otherwise noted) (Note 6.)


Characteristic Symbol Min Typ Max Unit
OFF CHARACTERISTICS
Drain–to–Source Breakdown Voltage V(BR)DSS Vdc
(VGS = 0 Vdc, ID = –250 µAdc) –20 – –
Temperature Coefficient (Positive) – –12.7 – mV/°C
Zero Gate Voltage Drain Current IDSS µAdc
(VDS = –16 Vdc, VGS = 0 Vdc, TJ = 25°C) – – –1.0
(VDS = –16 Vdc, VGS = 0 Vdc, TJ = 125°C) – – –25
Zero Gate Voltage Drain Current IDSS µAdc
(VGS = 0 Vdc, VDS = –20 Vdc, TJ = 25°C) – – –2.0
Gate–Body Leakage Current IGSS nAdc
(VGS = –10 Vdc, VDS = 0 Vdc) – – –100
Gate–Body Leakage Current IGSS nAdc
(VGS = +10 Vdc, VDS = 0 Vdc) – – 100

ON CHARACTERISTICS
Gate Threshold Voltage VGS(th) Vdc
(VDS = VGS, ID = –250 µAdc) –0.5 –0.90 –1.5
Temperature Coefficient (Negative) – 2.5 – mV/°C
Static Drain–to–Source On–State Resistance RDS(on) Ω
(VGS = –4.5 Vdc, ID = –2.4 Adc) – 0.070 0.090
(VGS = –2.7 Vdc, ID = –1.2 Adc) – 0.100 0.130
(VGS = –2.5 Vdc, ID = –1.2 Adc) – 0.110 0.150
Forward Transconductance gFS Mhos
(VDS = –10 Vdc, ID = –1.2 Adc) – 4.2 –

DYNAMIC CHARACTERISTICS
Input Capacitance Ciss – 550 750 pF
Output Capacitance (VDS = –16
16 Vdc,
Vd VGS = 0 Vdc,
Vd
Coss – 200 300
f = 1.0 MHz)
Reverse Transfer Capacitance Crss – 100 175
5. Mounted onto a 2″ square FR–4 Board (1″ sq. 2 oz Cu 0.06″ thick single sided), t ≤ 10 seconds.
6. Handling precautions to protect against electrostatic discharge is mandatory.

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NTMSD2P102LR2

ELECTRICAL CHARACTERISTICS (TJ = 25°C unless otherwise noted) (continued) (Note 7.)
Characteristic Symbol Min Typ Max Unit
SWITCHING CHARACTERISTICS (Notes 8. & 9.)
Turn–On Delay Time td(on) – 10 20 ns
Rise Time (VDD = –10 Vdc, ID = –2.4 Adc, tr – 35 65
4 5 Vdc,
VGS = –4.5 Vdc
Turn–Off Delay Time RG = 6.0 Ω) td(off) – 33 60
Fall Time tf – 29 55
Turn–On Delay Time td(on) – 15 – ns
Rise Time (VDD = –10 Vdc, ID = –1.2 Adc, tr – 40 –
VGS = –2.7
2 7 Vdc,
Vdc
Turn–Off Delay Time RG = 6.0 Ω) td(off) – 35 –
Fall Time tf – 35 –
Total Gate Charge Qtot – 10 18 nC
(VDS = –16 Vdc,
Gate–Source Charge VGS = –4.5 Vdc, Qgs – 1.5 –
ID = –2.4
2 4 Ad
Adc))
Gate–Drain Charge Qgd – 5.0 –

BODY–DRAIN DIODE RATINGS (Note 8.)


Diode Forward On–Voltage (IS = –2.4 Adc, VGS = 0 Vdc) VSD – –0.88 –1.0 Vdc
(IS = –2.4 Adc, VGS = 0 Vdc, TJ = 125°C) – –0.75 –
Reverse Recovery Time trr – 37 – ns
(IS = –2.4
2 4 Adc,
Ad VGS = 0 Vdc,
Vd
ta – 16 –
dIS/dt = 100 A/µs)
tb – 21 –
Reverse Recovery Stored Charge QRR – 0.025 – µC

SCHOTTKY RECTIFIER ELECTRICAL CHARACTERISTICS (TJ = 25°C unless otherwise noted) (Note 8.)
g
Maximum Instantaneous Forward Voltage VF TJ = 25°C TJ = 125°C Volts
IF = 1.0
1 0 Ad
Adc
0.47 0.39
IF = 2.0 Adc
0.58 0.53

Maximum Instantaneous Reverse Current IR TJ = 25°C TJ = 125°C mA


Vd
VR = 20 Vdc
0.05 10
Maximum Voltage Rate of Change VR = 20 Vdc dV/dt 10,000 V/ms
7. Handling precautions to protect against electrostatic discharge is mandatory.
8. Indicates Pulse Test: Pulse Width = 300 µs max, Duty Cycle = 2%.
9. Switching characteristics are independent of operating junction temperature.

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180
NTMSD2P102LR2

4 5
VGS = –2.1 V TJ = 25°C
VDS > = –10 V
–ID, DRAIN CURRENT (AMPS)

–ID, DRAIN CURRENT (AMPS)


VGS = –10 V
4
3 VGS = –4.5 V
VGS = –1.9 V
VGS = –2.5 V
3
2
VGS = –1.7 V 2 TJ = 25°C

1
VGS = –1.5 V 1
TJ = 100°C
TJ = 55°C
0 0
0 2 4 6 8 10 1 1.5 2 2.5 3
–VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS) –VGS, GATE–TO–SOURCE VOLTAGE (VOLTS)

Figure 1. On–Region Characteristics. Figure 2. Transfer Characteristics.


RDS(on), DRAIN–TO–SOURCE RESISTANCE (W)

RDS(on), DRAIN–TO–SOURCE RESISTANCE (W)


0.2 0.12
TJ = 25°C TJ = 25°C

0.15 0.1
VGS = –2.7 V

0.1 0.08
VGS = –4.5 V

0.05 0.06

0 0.04
2 4 6 8 1 1.5 2 2.5 3 3.5 4 4.5
–VGS, GATE–TO–SOURCE VOLTAGE (VOLTS) –ID, DRAIN CURRENT (AMPS)

Figure 3. On–Resistance vs. Gate–to–Source Figure 4. On–Resistance vs. Drain Current and
Voltage. Gate Voltage.

1.6 1000
ID = –2.4 A VGS = 0 V
RDS(on), DRAIN–TO–SOURCE

VGS = –4.5 V TJ = 125°C


RESISTANCE (NORMALIZED)

1.4 100
–IDSS, LEAKAGE (nA)

TJ = 100°C
1.2 10

TJ = 25°C
1 1

0.8 0.1

0.6 0.01
–50 –25 0 25 50 75 100 125 150 0 4 8 12 16 20
TJ, JUNCTION TEMPERATURE (°C) –VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS)

Figure 5. On–Resistance Variation with Figure 6. Drain–to–Source Leakage Current


Temperature. vs. Voltage.

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NTMSD2P102LR2

–VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS)


–VGS, GATE–TO–SOURCE VOLTAGE (VOLTS)
1500 5 20
VDS = 0 V VGS = 0 V
QT 18
1200 Ciss TJ = 25°C 4 16
C, CAPACITANCE (pF)

14
900 3 VGS 12
Crss
Q1 10
Q2
600 Ciss 2 8
6
300 ID = –2.4 A
Coss 1 VDS 4
TJ = 25°C
Crss 2
0 0 0
10 5 0 5 10 15 20 0 2 4 6 8 10 12 14
–VGS –VDS Qg, TOTAL GATE CHARGE (nC)

GATE–TO–SOURCE OR DRAIN–TO–SOURCE
Figure 8. Gate–to–Source and
VOLTAGE (VOLTS) Drain–to–Source Voltage versus Total Charge
Figure 7. Capacitance Variation

1000 100
VDD = –10 V td (off)
ID = –1.2 A
VGS = –2.7 V tr tf
t, TIME (ns)

t, TIME (ns)

td
100 10 (on)
tr

tf
td (off) VDD = –10 V
ID = –2.4 A
VGS = –4.5 V
td (on)
10 1.0
1.0 10 100 1.0 10 100
RG, GATE RESISTANCE (OHMS) RG, GATE RESISTANCE (OHMS)

Figure 9. Resistive Switching Time Variation Figure 10. Resistive Switching Time Variation
versus Gate Resistance versus Gate Resistance

2
–IS, SOURCE CURRENT (AMPS)

VGS = 0 V
TJ = 25°C di/dt
1.6
IS
trr
1.2
ta tb
TIME
0.8
tp 0.25 IS

0.4 IS

0
0.4 0.5 0.6 0.7 0.8 0.9 1 Figure 12. Diode Reverse Recovery Waveform
–VSD, SOURCE–TO–DRAIN VOLTAGE (VOLTS)

Figure 11. Diode Forward Voltage


versus Current

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NTMSD2P102LR2

Rthja(t), EFFECTIVE TRANSIENT THERMAL RESPONSE

D = 0.5

0.2

Normalized to R∅ja at Steady State (1 inch pad)


0.1 0.1
0.0125 Ω 0.0563 Ω 0.110 Ω 0.273 Ω 0.113 Ω 0.436 Ω

0.05

0.02

0.01 0.021 F 0.137 F 1.15 F 2.93 F 152 F 261 F

Single Pulse

0.01
1E–03 1E–02 1E–01 1E+00 1E+03 1E+02 1E+03
t, TIME (s)

Figure 13. FET Thermal Response

TYPICAL SCHOTTKY ELECTRICAL CHARACTERISTICS

10 10
IF, INSTANTANEOUS FORWARD

IF, INSTANTANEOUS FORWARD

TJ = 125°C
CURRENT (AMPS)

CURRENT (AMPS)

TJ = 125°C
85°C
1.0 1.0

85°C 25°C
25°C

–40°C

0.1 0.1
0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9 1.0 0 0.2 0.4 0.6 0.8 1.0 1.2 1.4
VF, INSTANTANEOUS FORWARD VOLTAGE (VOLTS) VF, MAXIMUM INSTANTANEOUS
FORWARD VOLTAGE (VOLTS)

Figure 14. Typical Forward Voltage Figure 15. Maximum Forward Voltage

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NTMSD2P102LR2

TYPICAL SCHOTTKY ELECTRICAL CHARACTERISTICS

1E–2

IR, MAXIMUM REVERSE CURRENT (AMPS)


1E–1
IR , REVERSE CURRENT (AMPS)

TJ = 125°C
TJ = 125°C
1E–3 1E–2

85°C
1E–4 1E–3

1E–5 1E–4
25°C
25°C
1E–6 1E–5

1E–7 1E–6
0 5.0 10 15 20 0 5.0 10 15 20
VR, REVERSE VOLTAGE (VOLTS) VR, REVERSE VOLTAGE (VOLTS)

Figure 16. Typical Reverse Current Figure 17. Maximum Reverse Current

IO, AVERAGE FORWARD CURRENT (AMPS)


1000 1.6
TYPICAL CAPACITANCE AT 0 V = 170 pF dc
1.4 FREQ = 20 kHz
C, CAPACITANCE (pF)

1.2 SQUARE WAVE

1.0
Ipk/Io = p
100 0.8
Ipk/Io = 5.0
0.6
Ipk/Io = 10
0.4
Ipk/Io = 20
0.2
10 0
0 5.0 10 15 20 0 20 40 60 80 100 120 140 160
VR, REVERSE VOLTAGE (VOLTS) TA, AMBIENT TEMPERATURE (°C)

Figure 18. Typical Capacitance Figure 19. Current Derating


PFO, AVERAGE POWER DISSIPATION (WATTS)

0.7
SQUARE dc
0.6 WAVE
Ipk/Io = p
0.5
Ipk/Io = 5.0
0.4 Ipk/Io = 10
Ipk/Io = 20
0.3

0.2

0.1

0
0 0.5 1.0 1.5 2.0
IO, AVERAGE FORWARD CURRENT (AMPS)

Figure 20. Forward Power Dissipation

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184
NTMSD2P102LR2

TYPICAL SCHOTTKY ELECTRICAL CHARACTERISTICS

1.0
D = 0.5
Rthja(t), EFFECTIVE TRANSIENT

0.2
THERMAL RESISTANCE

0.1
0.1
0.05 NORMALIZED TO RqJA AT STEADY STATE (1″ PAD)
0.02
0.01 4 W $6 W $# W 6$:$ W 4:7 W
 
0.01 ,   6 . 8# . $# . #:6 . $896 .
SINGLE PULSE
=  

0.001
1.0E–05 1.0E–04 1.0E–03 1.0E–02 1.0E–01 1.0E+00 1.0E+01 1.0E+02 1.0E+03
t, TIME (s)

Figure 21. Schottky Thermal Response

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185
NTMSD2P102LR2

INFORMATION FOR USING THE SO–8 SURFACE MOUNT PACKAGE

MINIMUM RECOMMENDED FOOTPRINT FOR SURFACE MOUNTED APPLICATIONS


Surface mount board layout is a critical portion of the total interface between the board and the package. With the
design. The footprint for the semiconductor packages must correct pad geometry, the packages will self–align when
be the correct size to ensure proper solder connection subjected to a solder reflow process.

9
$#

#:$ $$
: 6
inches
mm

#6 $
9 #:

SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • The soldering temperature and time shall not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within • When shifting from preheating to soldering, the
a short time could result in device failure. Therefore, the maximum temperature gradient shall be 5°C or less.
following items should always be observed in order to • After soldering has been completed, the device should
minimize the thermal stress to which the devices are be allowed to cool naturally for at least three minutes.
subjected. Gradual cooling should be used as the use of forced
• Always preheat the device. cooling will increase the temperature gradient and
• The delta temperature between the preheat and result in latent failure due to mechanical stress.
soldering should be 100°C or less.* • Mechanical stress or shock should not be applied
• When preheating and soldering, the temperature of the during cooling.
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When * Soldering a device without preheating can cause
using infrared heating with the reflow soldering excessive thermal shock and stress which can result in
method, the difference shall be a maximum of 10°C. damage to the device.

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186
NTMSD2P102LR2

TYPICAL SOLDER HEATING PROFILE


For any given circuit board, there will be a group of temperature versus time. The line on the graph shows the
control settings that will give the desired heat pattern. The actual temperature that might be experienced on the surface
operator must set temperatures for several heating zones of a test board at or near a central solder joint. The two
and a figure for belt speed. Taken together, these control profiles are based on a high density and a low density
settings make up a heating “profile” for that particular board. The Vitronics SMD310 convection/infrared reflow
circuit board. On machines controlled by a computer, the soldering system was used to generate this profile. The type
computer remembers these profiles from one operating of solder used was 62/36/2 Tin Lead Silver with a melting
session to the next. Figure 22 shows a typical heating point between 177–189°C. When this type of furnace is
profile for use when soldering a surface mount device to a used for solder reflow work, the circuit boards and solder
printed circuit board. This profile will vary among joints tend to heat first. The components on the board are
soldering systems, but it is a good starting point. Factors then heated by conduction. The circuit board, because it has
that can affect the profile include the type of soldering a large surface area, absorbs the thermal energy more
system in use, density and types of components on the efficiently, then distributes this energy to the components.
board, type of solder used, and the type of board or Because of this effect, the main body of a component may
substrate material being used. This profile shows be up to 30 degrees cooler than the adjacent solder joints.

STEP 1 STEP 2 STEP 3 STEP 4 STEP 5 STEP 6 STEP 7


PREHEAT VENT HEATING HEATING HEATING VENT COOLING
ZONE 1 “SOAK” ZONES 2 & 5 ZONES 3 & 6 ZONES 4 & 7
“RAMP” “RAMP” “SOAK” “SPIKE” 205° TO 219°C
PEAK AT
200°C DESIRED CURVE FOR HIGH 170°C SOLDER
MASS ASSEMBLIES JOINT
160°C
150°C

150°C
SOLDER IS LIQUID FOR
40 TO 80 SECONDS
100°C 140°C (DEPENDING ON
MASS OF ASSEMBLY)
100°C

DESIRED CURVE FOR LOW


MASS ASSEMBLIES
5°C

TIME (3 TO 7 MINUTES TOTAL) TMAX


Figure 22. Typical Solder Heating Profile

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!# 

 

(45
P–Channel Enhancement–Mode
Power MOSFET and Schottky Diode
Dual SO–8 Package
http://onsemi.com
Features
• High Efficiency Components in a Single SO–8 Package
• High Density Power MOSFET with Low RDS(on), MOSFET
Schottky Diode with Low VF –3.05 AMPERES
• Independent Pin–Outs for MOSFET and Schottky Die
Allowing for Flexibility in Application Use –20 VOLTS
• Less Component Placement for Board Space Savings 0.085 W @ VGS = –10 V
• SO–8 Surface Mount Package,
Mounting Information for SO–8 Package Provided
Applications SCHOTTKY DIODE
• DC–DC Converters 1.0 AMPERES
• Low Voltage Motor Control
20 VOLTS
• Power Management in Portable and Battery–Powered Products, i.e.:
Computers, Printers, PCMCIA Cards, Cellular and Cordless Telephones 470 mV @ IF = 1.0 A
MOSFET MAXIMUM RATINGS (TJ = 25°C unless otherwise noted)
Rating Symbol Value Unit  8

Drain–to–Source Voltage VDSS –20 V 8 # :

Gate–to–Source Voltage – Continuous VGS "20 V 9
1  
Thermal Resistance – 4
Junction–to–Ambient (Note 1.) RθJA 171 °C/W  
SO–8 6 $
Total Power Dissipation @ TA = 25°C PD 0.73 W
CASE 751
Continuous Drain Current @ TA = 25°C ID –2.34 A   /
STYLE 18
Continuous Drain Current @ TA = 70°C ID –1.87 A
Pulsed Drain Current (Note 4.) IDM –8.0 A
Thermal Resistance – MARKING DIAGRAM
Junction–to–Ambient (Note 2.) RθJA 100 °C/W & PIN ASSIGNMENTS
Total Power Dissipation @ TA = 25°C PD 1.25 W
1 8
Continuous Drain Current @ TA = 25°C ID –3.05 A Anode Cathode
Continuous Drain Current @ TA = 70°C ID –2.44 A 2 7
Anode E3P102 Cathode
Pulsed Drain Current (Note 4.) IDM –12 A 3 6
Source LYWW Drain
Thermal Resistance – 4 5
Junction–to–Ambient (Note 3.) RθJA 62.5 °C/W Gate Drain
Total Power Dissipation @ TA = 25°C PD 2.0 W (Top View)
Continuous Drain Current @ TA = 25°C ID –3.86 A
Continuous Drain Current @ TA = 70°C ID –3.10 A E3P102 = Device Code
Pulsed Drain Current (Note 4.) IDM –15 A L = Assembly Location
Operating and Storage TJ, Tstg –55 to °C Y = Year
Temperature Range +150 WW = Work Week
Single Pulse Drain–to–Source Avalanche EAS 140 mJ
Energy – Starting TJ = 25°C (VDD = ORDERING INFORMATION
–20 Vdc, VGS = –4.5 Vdc, Peak IL =
–7.5 Apk, L = 5 mH, RG = 25 Ω) Device Package Shipping
Maximum Lead Temperature for Soldering TL 260 °C
Purposes, 1/8″ from case for 10 seconds NTMSD3P102R2 SO–8 2500/Tape & Reel
1. Minimum FR–4 or G–10 PCB, Steady State.
2. Mounted onto a 2″ square FR–4 Board (1″ sq. 2 oz Cu 0.06″ thick single sided), Steady State.
3. Mounted onto a 2″ square FR–4 Board (1″ sq. 2 oz Cu 0.06″ thick single sided), t ≤ 10 seconds.
4. Pulse Test: Pulse Width = 300 ms, Duty Cycle = 2%.
This document contains information on a product under development. ON Semiconductor reserves the right to change or discontinue this product without notice.

 Semiconductor Components Industries, LLC, 2001 188 Publication Order Number:


January, 2001 – Rev. 0 NTMSD3P102R2/D
NTMSD3P102R2

SCHOTTKY MAXIMUM RATINGS (TJ = 25°C unless otherwise noted)


Rating Symbol Value Unit
Peak Repetitive Reverse Voltage VRRM 20 V
DC Blocking Voltage VR
Thermal Resistance – Junction–to–Ambient (Note 5.) RθJA 204 °C/W
Thermal Resistance – Junction–to–Ambient (Note 6.) RθJA 122 °C/W
Thermal Resistance – Junction–to–Ambient (Note 7.) RθJA 83 °C/W
Average Forward Current (Note 7.) IO 1.0 A
(Rated VR, TA = 100°C)
Peak Repetitive Forward Current IFRM 2.0 A
(Note 7.) (Rated VR, Square Wave, 20 kHz, TA = 105°C)
Non–Repetitive Peak Surge Current (Note 7.) IFSM 20 A
(Surge Applied at Rated Load Conditions, Half–Wave, Single Phase, 60 Hz)

ELECTRICAL CHARACTERISTICS (TJ = 25°C unless otherwise noted) (Note 8.)


Characteristic Symbol Min Typ Max Unit
OFF CHARACTERISTICS
Drain–to–Source Breakdown Voltage V(BR)DSS Vdc
(VGS = 0 Vdc, ID = –250 µAdc) –20 – –
Temperature Coefficient (Positive) – –30 – mV/°C
Zero Gate Voltage Drain Current IDSS µAdc
(VDS = –20 Vdc, VGS = 0 Vdc, TJ = 25°C) – – –1.0
(VDS = –20 Vdc, VGS = 0 Vdc, TJ = 125°C) – – –25
Gate–Body Leakage Current IGSS nAdc
(VGS = –20 Vdc, VDS = 0 Vdc) – – –100
Gate–Body Leakage Current IGSS nAdc
(VGS = +20 Vdc, VDS = 0 Vdc) – – 100

ON CHARACTERISTICS
Gate Threshold Voltage VGS(th) Vdc
(VDS = VGS, ID = –250 µAdc) –1.0 –1.7 –2.5
Temperature Coefficient (Negative) – 3.6 –
Static Drain–to–Source On–State Resistance RDS(on) Ω
(VGS = –10 Vdc, ID = –3.05 Adc) – 0.063 0.085
(VGS = –4.5 Vdc, ID = –1.5 Adc) – 0.090 0.125
Forward Transconductance gFS Mhos
(VDS = –15 Vdc, ID = –3.05 Adc) – 5.0 –

DYNAMIC CHARACTERISTICS
Input Capacitance Ciss – 518 750 pF
Output Capacitance (VDS = –16
16 Vdc,
Vd VGS = 0 Vdc,
Vd
Coss – 190 350
f = 1.0 MHz)
Reverse Transfer Capacitance Crss – 70 135
5. Minimum FR–4 or G–10 PCB, Steady State.
6. Mounted onto a 2″ square FR–4 Board (1″ sq. 2 oz Cu 0.06″ thick single sided), Steady State.
7. Mounted onto a 2″ square FR–4 Board (1″ sq. 2 oz Cu 0.06″ thick single sided), t ≤ 10 seconds.
8. Handling precautions to protect against electrostatic discharge is mandatory.

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ELECTRICAL CHARACTERISTICS (TJ = 25°C unless otherwise noted) (Note 9.)


Characteristic Symbol Min Typ Max Unit
SWITCHING CHARACTERISTICS (Notes 10. & 11.)
Turn–On Delay Time td(on) – 12 22 ns
Rise Time (VDD = –20 Vdc, ID = –3.05 Adc, tr – 16 30
10 Vdc,
VGS = –10 Vdc
Turn–Off Delay Time RG = 6.0 Ω) td(off) – 45 80
Fall Time tf – 45 80
Turn–On Delay Time td(on) – 16 – ns
Rise Time (VDD = –20 Vdc, ID = –1.5 Adc, tr – 42 –
VGS = –4.5
4 5 Vdc,
Vdc
Turn–Off Delay Time RG = 6.0 Ω) td(off) – 32 –
Fall Time tf – 35 –
Total Gate Charge Qtot – 16 25 nC
(VDS = –20 Vdc,
Gate–Source Charge VGS = –10 Vdc, Qgs – 2.0 –
ID = –3.05
3 05 Adc)
Ad )
Gate–Drain Charge Qgd – 4.5 –

BODY–DRAIN DIODE RATINGS (Note 10.)


Diode Forward On–Voltage (IS = –3.05 Adc, VGS = 0 Vdc) VSD – –0.96 –1.25 Vdc
(IS = –3.05 Adc, VGS = 0 Vdc, TJ = 125°C) – –0.78 –
Reverse Recovery Time trr – 34 – ns
(IS = –3.05
3 05 Adc,
Ad VGS = 0 Vdc,
Vd
ta – 18 –
dIS/dt = 100 A/µs)
tb – 16 –
Reverse Recovery Stored Charge QRR – 0.03 – µC

SCHOTTKY RECTIFIER ELECTRICAL CHARACTERISTICS (TJ = 25°C unless otherwise noted) (Note 10.)
g
Maximum Instantaneous Forward Voltage VF TJ = 25°C TJ = 125°C Volts
IF = 1.0
1 0 Ad
Adc
0.47 0.39
IF = 2.0 Adc
0.58 0.53

Maximum Instantaneous Reverse Current IR TJ = 25°C TJ = 125°C mA


Vd
VR = 20 Vdc
0.05 10
Maximum Voltage Rate of Change VR = 20 Vdc dV/dt 10,000 V/ms
9. Handling precautions to protect against electrostatic discharge is mandatory.
10. Indicates Pulse Test: Pulse Width = 300 µs max, Duty Cycle = 2%.
11. Switching characteristics are independent of operating junction temperature.

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TYPICAL MOSFET ELECTRICAL CHARACTERISTICS

6 6
VGS = –10 V
VGS = –4.4 V VDS > = –10 V
–ID, DRAIN CURRENT (AMPS)

–ID, DRAIN CURRENT (AMPS)


5 VGS = –8 V 5
VGS = –4 V
VGS = –6 V
VGS = –4.6 V
4 4
TJ = 25°C VGS = –4.8 V TJ = 100°C
3 VGS = –3.6 V 3
VGS = –2.8 V
VGS = –3.2 V TJ = 25°C
2 VGS = –5 V 2
VGS = –3 V TJ = –55°C
VGS = –2.6 V
1 1

0 0
0 0.25 0.5 0.75 1 1.25 1.5 1.75 2 1 2 3 4 5
–VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS) –VGS, GATE–TO–SOURCE VOLTAGE (VOLTS)

Figure 1. On–Region Characteristics Figure 2. Transfer Characteristics


RDS(on), DRAIN–TO–SOURCE RESISTANCE (Ω)

RDS(on), DRAIN–TO–SOURCE RESISTANCE (Ω)


0.7 0.7
ID = –3.05 A ID = –1.5 A
0.6 TJ = 25°C 0.6 TJ = 25°C

0.5 0.5

0.4 0.4

0.3 0.3

0.2 0.2

0.1 0.1

0 0
3 4 5 6 7 8 2 3 4 5 6 7
–VGS, GATE–TO–SOURCE VOLTAGE (VOLTS) –VGS, GATE–TO–SOURCE VOLTAGE (VOLTS)
Figure 3. On–Resistance vs. Gate–to–Source Figure 4. On–Resistance vs. Gate–to–Source
Voltage Voltage
RDS(on), DRAIN–TO–SOURCE RESISTANCE (Ω)

RDS(on), DRAIN–TO–SOURCE RESISTANCE

0.25 1.6
ID = –3.05 A
TJ = 25°C VGS = –10 V
1.4
0.2 VGS = –4.5 V
(NORMALIZED)

1.2
0.15
1
VGS = –10 V

0.1
0.8

0.05 0.6
1 2 3 4 5 6 –50 –25 0 25 50 75 100 125 150
–ID, DRAIN CURRENT (AMPS) TJ, JUNCTION TEMPERATURE (°C)

Figure 5. On–Resistance vs. Drain Current and Figure 6. On Resistance Variation with
Gate Voltage Temperature

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NTMSD3P102R2

10000
VGS = 0 V VDS = 0 V VGS = 0 V
1200
Ciss

C, CAPACITANCE (pF)
1000
IDSS, LEAKAGE (nA)

TJ = 150°C
1000
800
Ciss
600 Crss
TJ = 125°C
100 400 Coss

200 Crss
TJ = 25°C
10 0
2 4 6 8 10 12 14 16 18 20 10 5 0 5 10 15 20
–VGS –VDS
–VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS) GATE–TO–SOURCE OR DRAIN–TO–SOURCE
VOLTAGE (VOLTS)
Figure 7. Drain–to–Source Leakage Current Figure 8. Capacitance Variation
vs. Voltage
–VGS, GATE–TO–SOURCE VOLTAGE (VOLTS)

12 24 1000
VDS = –20 V
QT ID = –3.05 A
10 20
VGS = –10 V
VDS
8 16 100
t, TIME (ns)

VGS td(off)

6 12 tf
Q1 tr
4 Q2 8 10
td(on)
2 4
ID = –3.05 A
TJ = 25°C
0 0 1
0 2 4 6 8 10 12 14 16 1 10 100
Qg, TOTAL GATE CHARGE (nC) RG, GATE RESISTANCE (Ω)

Figure 9. Gate–to–Source and Figure 10. Resistive Switching Time Variation


Drain–to–Source Voltage vs. Total Charge vs. Gate Resistance

1000 3
VDS = –20 V VGS = 0 V
IS, SOURCE CURRENT (AMPS)

ID = –1.5 A TJ = 25°C
2.5
VGS = –4.5 V

2
t, TIME (ns)

100 1.5
tr
td(off)
tf 1
td(on)

0.5

10 0
1 10 100 0.2 0.4 0.6 0.8 1 1.2
RG, GATE RESISTANCE (Ω) –VSD, DRAIN–TO–SOURCE VOLTAGE (VOLTS)

Figure 11. Resistive Switching Time Variation Figure 12. Diode Forward Voltage vs. Current
vs. Gate Resistance

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NTMSD3P102R2

di/dt
IS
trr
ta tb
TIME

tp 0.25 IS

IS

Figure 13. Diode Reverse Recovery Waveform

1.0
D = 0.5
Rthja(t), EFFECTIVE TRANSIENT
THERMAL RESPONSE

0.2

0.1
0.1
0.05 Chip Normalized to RθJA at Steady State (1″ pad)
Junction 2.32 Ω 18.5 Ω 50.9 Ω 37.1 Ω 56.8 Ω 24.4 Ω
0.02

0.01 0.0014 F 0.0073 F 0.022 F 0.105 F 0.484 F 3.68 F


Single Pulse Ambient
0.01
1E–03 1E–02 1E–01 1E+00 1E+01 1E+02 1E+03
t, TIME (s)

Figure 14. FET Thermal Response

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NTMSD3P102R2

TYPICAL SCHOTTKY ELECTRICAL CHARACTERISTICS

10 10
IF, INSTANTANEOUS FORWARD

IF, INSTANTANEOUS FORWARD


TJ = 125°C
CURRENT (AMPS)

CURRENT (AMPS)
TJ = 125°C
85°C
1.0 1.0

85°C 25°C
25°C

–40°C

0.1 0.1
0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9 1.0 0 0.2 0.4 0.6 0.8 1.0 1.2 1.4
VF, INSTANTANEOUS FORWARD VOLTAGE (VOLTS) VF, MAXIMUM INSTANTANEOUS
FORWARD VOLTAGE (VOLTS)

Figure 15. Typical Forward Voltage Figure 16. Maximum Forward Voltage

1E–2
IR, MAXIMUM REVERSE CURRENT (AMPS)
1E–1
IR , REVERSE CURRENT (AMPS)

TJ = 125°C
TJ = 125°C
1E–3 1E–2

85°C
1E–4 1E–3

1E–5 1E–4
25°C
25°C
1E–6 1E–5

1E–7 1E–6
0 5.0 10 15 20 0 5.0 10 15 20
VR, REVERSE VOLTAGE (VOLTS) VR, REVERSE VOLTAGE (VOLTS)

Figure 17. Typical Reverse Current Figure 18. Maximum Reverse Current
IO, AVERAGE FORWARD CURRENT (AMPS)

1000 1.6
TYPICAL CAPACITANCE AT 0 V = 170 pF dc
1.4 FREQ = 20 kHz
C, CAPACITANCE (pF)

1.2 SQUARE WAVE

1.0
Ipk/Io = p
100 0.8
Ipk/Io = 5.0
0.6
Ipk/Io = 10
0.4
Ipk/Io = 20
0.2
10 0
0 5.0 10 15 20 0 20 40 60 80 100 120 140 160
VR, REVERSE VOLTAGE (VOLTS) TA, AMBIENT TEMPERATURE (°C)

Figure 19. Typical Capacitance Figure 20. Current Derating

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TYPICAL SCHOTTKY ELECTRICAL CHARACTERISTICS

PFO, AVERAGE POWER DISSIPATION (WATTS)


0.7
SQUARE dc
0.6 WAVE
Ipk/Io = p
0.5
Ipk/Io = 5.0
0.4 Ipk/Io = 10
Ipk/Io = 20
0.3

0.2

0.1

0
0 0.5 1.0 1.5 2.0
IO, AVERAGE FORWARD CURRENT (AMPS)

Figure 21. Forward Power Dissipation

1.0
D = 0.5
Rthja(t), EFFECTIVE TRANSIENT

0.2
THERMAL RESISTANCE

0.1
0.1
0.05 NORMALIZED TO RqJA AT STEADY STATE (1″ PAD)
0.02
0.01 4 W $6 W $# W 6$:$ W 4:7 W
 
0.01 ,   6 . 8# . $# . #:6 . $896 .
SINGLE PULSE
=  

0.001
1.0E–05 1.0E–04 1.0E–03 1.0E–02 1.0E–01 1.0E+00 1.0E+01 1.0E+02 1.0E+03
t, TIME (s)

Figure 22. Schottky Thermal Response

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INFORMATION FOR USING THE SO–8 SURFACE MOUNT PACKAGE

MINIMUM RECOMMENDED FOOTPRINT FOR SURFACE MOUNTED APPLICATIONS


Surface mount board layout is a critical portion of the total interface between the board and the package. With the
design. The footprint for the semiconductor packages must correct pad geometry, the packages will self–align when
be the correct size to ensure proper solder connection subjected to a solder reflow process.
9
$#

#:$ $$
: 6

#6 $
9 #:
inches
mm

SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • The soldering temperature and time shall not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within • When shifting from preheating to soldering, the
a short time could result in device failure. Therefore, the maximum temperature gradient shall be 5°C or less.
following items should always be observed in order to • After soldering has been completed, the device should
minimize the thermal stress to which the devices are be allowed to cool naturally for at least three minutes.
subjected. Gradual cooling should be used as the use of forced
• Always preheat the device. cooling will increase the temperature gradient and
• The delta temperature between the preheat and result in latent failure due to mechanical stress.
soldering should be 100°C or less.* • Mechanical stress or shock should not be applied
• When preheating and soldering, the temperature of the during cooling.
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When * Soldering a device without preheating can cause
using infrared heating with the reflow soldering excessive thermal shock and stress which can result in
method, the difference shall be a maximum of 10°C. damage to the device.

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NTMSD3P102R2

TYPICAL SOLDER HEATING PROFILE


For any given circuit board, there will be a group of temperature versus time. The line on the graph shows the
control settings that will give the desired heat pattern. The actual temperature that might be experienced on the surface
operator must set temperatures for several heating zones of a test board at or near a central solder joint. The two
and a figure for belt speed. Taken together, these control profiles are based on a high density and a low density
settings make up a heating “profile” for that particular board. The Vitronics SMD310 convection/infrared reflow
circuit board. On machines controlled by a computer, the soldering system was used to generate this profile. The type
computer remembers these profiles from one operating of solder used was 62/36/2 Tin Lead Silver with a melting
session to the next. Figure 23 shows a typical heating point between 177–189°C. When this type of furnace is
profile for use when soldering a surface mount device to a used for solder reflow work, the circuit boards and solder
printed circuit board. This profile will vary among joints tend to heat first. The components on the board are
soldering systems, but it is a good starting point. Factors then heated by conduction. The circuit board, because it has
that can affect the profile include the type of soldering a large surface area, absorbs the thermal energy more
system in use, density and types of components on the efficiently, then distributes this energy to the components.
board, type of solder used, and the type of board or Because of this effect, the main body of a component may
substrate material being used. This profile shows be up to 30 degrees cooler than the adjacent solder joints.

STEP 1 STEP 2 STEP 3 STEP 4 STEP 5 STEP 6 STEP 7


PREHEAT VENT HEATING HEATING HEATING VENT COOLING
ZONE 1 “SOAK” ZONES 2 & 5 ZONES 3 & 6 ZONES 4 & 7
“RAMP” “RAMP” “SOAK” “SPIKE” 205° TO 219°C
PEAK AT
200°C DESIRED CURVE FOR HIGH 170°C SOLDER
MASS ASSEMBLIES JOINT
160°C
150°C

150°C
SOLDER IS LIQUID FOR
40 TO 80 SECONDS
100°C 140°C (DEPENDING ON
MASS OF ASSEMBLY)
100°C

DESIRED CURVE FOR LOW


MASS ASSEMBLIES
5°C

TIME (3 TO 7 MINUTES TOTAL) TMAX


Figure 23. Typical Solder Heating Profile

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!#!!

 

(45
P–Channel Enhancement–Mode
Power MOSFET and Schottky Diode
Dual SO–8 Package
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Features
• High Efficiency Components in a Single SO–8 Package
• High Density Power MOSFET with Low RDS(on), MOSFET
Schottky Diode with Low VF –3.05 AMPERES
• Independent Pin–Outs for MOSFET and Schottky Die
Allowing for Flexibility in Application Use –30 VOLTS
• Less Component Placement for Board Space Savings 0.085 W @ VGS = –10 V
• SO–8 Surface Mount Package,
Mounting Information for SO–8 Package Provided
Applications SCHOTTKY DIODE
• DC–DC Converters 3.0 AMPERES
• Low Voltage Motor Control
30 VOLTS
• Power Management in Portable and Battery–Powered Products, i.e.:
Computers, Printers, PCMCIA Cards, Cellular and Cordless Telephones 420 mV @ IF = 3.0 A
MOSFET MAXIMUM RATINGS (TJ = 25°C unless otherwise noted)
Rating Symbol Value Unit  8

Drain–to–Source Voltage VDSS –30 V 8 # :

Gate–to–Source Voltage – Continuous VGS "20 V 9
1  
Thermal Resistance – 4
Junction–to–Ambient (Note 1.) RθJA 171 °C/W  
SO–8 6 $
Total Power Dissipation @ TA = 25°C PD 0.73 W
CASE 751
Continuous Drain Current @ TA = 25°C ID –2.34 A   /
STYLE 18
Continuous Drain Current @ TA = 70°C ID –1.87 A
Pulsed Drain Current (Note 4.) IDM –8.0 A
Thermal Resistance – MARKING DIAGRAM
Junction–to–Ambient (Note 2.) RθJA 100 °C/W & PIN ASSIGNMENTS
Total Power Dissipation @ TA = 25°C PD 1.25 W
1 8
Continuous Drain Current @ TA = 25°C ID –3.05 A Anode Cathode
Continuous Drain Current @ TA = 70°C ID –2.44 A 2 7
Anode E3P303 Cathode
Pulsed Drain Current (Note 4.) IDM –12 A 3 6
Source LYWW Drain
Thermal Resistance – 4 5
Junction–to–Ambient (Note 3.) RθJA 62.5 °C/W Gate Drain
Total Power Dissipation @ TA = 25°C PD 2.0 W (Top View)
Continuous Drain Current @ TA = 25°C ID –3.86 A
Continuous Drain Current @ TA = 70°C ID –3.10 A E3P303 = Device Code
Pulsed Drain Current (Note 4.) IDM –15 A L = Assembly Location
Operating and Storage TJ, Tstg –55 to °C Y = Year
Temperature Range +150 WW = Work Week
Single Pulse Drain–to–Source Avalanche EAS 140 mJ
Energy – Starting TJ = 25°C (VDD = ORDERING INFORMATION
–30 Vdc, VGS = –4.5 Vdc, Peak IL =
–7.5 Apk, L = 5 mH, RG = 25 Ω) Device Package Shipping
Maximum Lead Temperature for Soldering TL 260 °C
Purposes, 1/8″ from case for 10 seconds NTMSD3P303R2 SO–8 2500/Tape & Reel
1. Minimum FR–4 or G–10 PCB, Steady State.
2. Mounted onto a 2″ square FR–4 Board (1″ sq. 2 oz Cu 0.06″ thick single sided), Steady State.
3. Mounted onto a 2″ square FR–4 Board (1″ sq. 2 oz Cu 0.06″ thick single sided), t ≤ 10 seconds.
4. Pulse Test: Pulse Width = 300 ms, Duty Cycle = 2%.
This document contains information on a product under development. ON Semiconductor reserves the right to change or discontinue this product without notice.

 Semiconductor Components Industries, LLC, 2001 198 Publication Order Number:


January, 2001 – Rev. 0 NTMSD3P303R2/D
NTMSD3P303R2

SCHOTTKY MAXIMUM RATINGS (TJ = 25°C unless otherwise noted)


Rating Symbol Value Unit
Peak Repetitive Reverse Voltage VRRM 30 V
DC Blocking Voltage VR
Thermal Resistance – Junction–to–Ambient (Note 5.) RθJA 197 °C/W
Thermal Resistance – Junction–to–Ambient (Note 6.) RθJA 97 °C/W
Thermal Resistance – Junction–to–Ambient (Note 7.) RθJA 62.5 °C/W
Average Forward Current (Note 7.) IO 3.0 A
(Rated VR, TA = 100°C)
Peak Repetitive Forward Current (Note 7.) IFRM 6.0 A
(Rated VR, Square Wave, 20 kHz, TA = 105°C)
Non–Repetitive Peak Surge Current (Note 7.) IFSM 30 A
(Surge Applied at Rated Load Conditions, Half–Wave, Single Phase, 60 Hz)

ELECTRICAL CHARACTERISTICS (TJ = 25°C unless otherwise noted) (Note 8.)


Characteristic Symbol Min Typ Max Unit
OFF CHARACTERISTICS
Drain–to–Source Breakdown Voltage V(BR)DSS Vdc
(VGS = 0 Vdc, ID = –250 µAdc) –30 – –
Temperature Coefficient (Positive) – –30 – mV/°C
Zero Gate Voltage Drain Current IDSS µAdc
(VDS = –30 Vdc, VGS = 0 Vdc, TJ = 25°C) – – –1.0
(VDS = –30 Vdc, VGS = 0 Vdc, TJ = 125°C) – – –25
Gate–Body Leakage Current IGSS nAdc
(VGS = –20 Vdc, VDS = 0 Vdc) – – –100
Gate–Body Leakage Current IGSS nAdc
(VGS = +20 Vdc, VDS = 0 Vdc) – – 100

ON CHARACTERISTICS
Gate Threshold Voltage VGS(th) Vdc
(VDS = VGS, ID = –250 µAdc) –1.0 –1.7 –2.5
Temperature Coefficient (Negative) – 3.6 –
Static Drain–to–Source On–State Resistance RDS(on) Ω
(VGS = –10 Vdc, ID = –3.05 Adc) – 0.063 0.085
(VGS = –4.5 Vdc, ID = –1.5 Adc) – 0.090 0.125
Forward Transconductance gFS Mhos
(VDS = –15 Vdc, ID = –3.05 Adc) – 5.0 –

DYNAMIC CHARACTERISTICS
Input Capacitance Ciss – 520 750 pF
Output Capacitance (VDS = –24
24 Vdc,
Vd VGS = 0 Vdc,
Vd
Coss – 170 325
f = 1.0 MHz)
Reverse Transfer Capacitance Crss – 70 135
5. Minimum FR–4 or G–10 PCB, Steady State.
6. Mounted onto a 2″ square FR–4 Board (1″ sq. 2 oz Cu 0.06″ thick single sided), Steady State.
7. Mounted onto a 2″ square FR–4 Board (1″ sq. 2 oz Cu 0.06″ thick single sided), t ≤ 10 seconds.
8. Handling precautions to protect against electrostatic discharge is mandatory.

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ELECTRICAL CHARACTERISTICS (TJ = 25°C unless otherwise noted) (Note 9.)


Characteristic Symbol Min Typ Max Unit
SWITCHING CHARACTERISTICS (Notes 10. & 11.)
Turn–On Delay Time td(on) – 12 22 ns
Rise Time (VDD = –24 Vdc, ID = –3.05 Adc, tr – 16 30
10 Vdc,
VGS = –10 Vdc
Turn–Off Delay Time RG = 6.0 Ω) td(off) – 45 80
Fall Time tf – 45 80
Turn–On Delay Time td(on) – 16 – ns
Rise Time (VDD = –24 Vdc, ID = –1.5 Adc, tr – 42 –
VGS = –4.5
4 5 Vdc,
Vdc
Turn–Off Delay Time RG = 6.0 Ω) td(off) – 32 –
Fall Time tf – 35 –
Total Gate Charge Qtot – 16 25 nC
(VDS = –24 Vdc,
Gate–Source Charge VGS = –10 Vdc, Qgs – 2.0 –
ID = –3.05
3 05 Adc)
Ad )
Gate–Drain Charge Qgd – 4.5 –

BODY–DRAIN DIODE RATINGS (Note 10.)


Diode Forward On–Voltage (IS = –3.05 Adc, VGS = 0 Vdc) VSD – –0.96 –1.25 Vdc
(IS = –3.05 Adc, VGS = 0 Vdc, TJ = 125°C) – –0.78 –
Reverse Recovery Time trr – 34 – ns
(IS = –3.05
3 05 Adc,
Ad VGS = 0 Vdc,
Vd
ta – 18 –
dIS/dt = 100 A/µs)
tb – 16 –
Reverse Recovery Stored Charge QRR – 0.03 – µC

SCHOTTKY RECTIFIER ELECTRICAL CHARACTERISTICS (TJ = 25°C unless otherwise noted) (Note 10.)
Maximum Instantaneous Forward Voltage VF TJ = 25°C TJ = 125°C Volts

IF = 100 mAdc 0.28 0.13


IF = 3.0 Adc 0.42 0.33
IF = 6.0 Adc 0.50 0.45

Maximum Instantaneous Reverse Current IR TJ = 25°C TJ = 125°C


VR = 30 Vdc
Vd
250 mA
25 mA
Maximum Voltage Rate of Change VR = 30 Vdc dV/dt 10,000 V/ms
9. Handling precautions to protect against electrostatic discharge is mandatory.
10. Indicates Pulse Test: Pulse Width = 300 µs max, Duty Cycle = 2%.
11. Switching characteristics are independent of operating junction temperature.

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TYPICAL MOSFET ELECTRICAL CHARACTERISTICS

6 6
VGS = –10 V
VGS = –4.4 V VDS > = –10 V
–ID, DRAIN CURRENT (AMPS)

–ID, DRAIN CURRENT (AMPS)


5 VGS = –8 V 5
VGS = –4 V
VGS = –6 V
VGS = –4.6 V
4 4
TJ = 25°C VGS = –4.8 V TJ = 100°C
3 VGS = –3.6 V 3
VGS = –2.8 V
VGS = –3.2 V TJ = 25°C
2 VGS = –5 V 2
VGS = –3 V TJ = –55°C
VGS = –2.6 V
1 1

0 0
0 0.25 0.5 0.75 1 1.25 1.5 1.75 2 1 2 3 4 5
–VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS) –VGS, GATE–TO–SOURCE VOLTAGE (VOLTS)

Figure 1. On–Region Characteristics Figure 2. Transfer Characteristics


RDS(on), DRAIN–TO–SOURCE RESISTANCE (Ω)

RDS(on), DRAIN–TO–SOURCE RESISTANCE (Ω)


0.7 0.7
ID = –3.05 A ID = –1.5 A
0.6 TJ = 25°C 0.6 TJ = 25°C

0.5 0.5

0.4 0.4

0.3 0.3

0.2 0.2

0.1 0.1

0 0
3 4 5 6 7 8 2 3 4 5 6 7
–VGS, GATE–TO–SOURCE VOLTAGE (VOLTS) –VGS, GATE–TO–SOURCE VOLTAGE (VOLTS)
Figure 3. On–Resistance vs. Gate–to–Source Figure 4. On–Resistance vs. Gate–to–Source
Voltage Voltage
RDS(on), DRAIN–TO–SOURCE RESISTANCE (Ω)

RDS(on), DRAIN–TO–SOURCE RESISTANCE

0.25 1.6
ID = –3.05 A
TJ = 25°C VGS = –10 V
1.4
0.2 VGS = –4.5 V
(NORMALIZED)

1.2
0.15
1
VGS = –10 V

0.1
0.8

0.05 0.6
1 2 3 4 5 6 –50 –25 0 25 50 75 100 125 150
–ID, DRAIN CURRENT (AMPS) TJ, JUNCTION TEMPERATURE (°C)

Figure 5. On–Resistance vs. Drain Current and Figure 6. On Resistance Variation with
Gate Voltage Temperature

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201
NTMSD3P303R2

10000
VGS = 0 V VDS = 0 V VGS = 0 V
1200
Ciss

C, CAPACITANCE (pF)
TJ = 150°C 1000
IDSS, LEAKAGE (nA)

1000
800

600 Crss Ciss


TJ = 125°C
100 400
Coss
200
Crss
TJ = 25°C
10 0
6 10 14 18 22 26 30 10 5 0 5 10 15 20 25 30
–VGS –VDS
–VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS) GATE–TO–SOURCE OR DRAIN–TO–SOURCE
VOLTAGE (VOLTS)
Figure 7. Drain–to–Source Leakage Current Figure 8. Capacitance Variation
vs. Voltage
–VGS, GATE–TO–SOURCE VOLTAGE (VOLTS)

12 30 1000
VDS = –24 V
QT ID = –3.05 A
10 25
VGS = –10 V
VDS
8 20 100 td(off)
t, TIME (ns)

VGS
6 15 tf
Q1 tr
4 Q2 10 10
td(on)
2 5
ID = –3.05 A
TJ = 25°C
0 0 1
0 2 4 6 8 10 12 14 16 1 10 100
Qg, TOTAL GATE CHARGE (nC) RG, GATE RESISTANCE (Ω)

Figure 9. Gate–to–Source and Figure 10. Resistive Switching Time Variation


Drain–to–Source Voltage vs. Total Charge vs. Gate Resistance

1000 3
VDS = –24 V VGS = 0 V
IS, SOURCE CURRENT (AMPS)

ID = –1.5 A TJ = 25°C
2.5
VGS = –4.5 V

2
t, TIME (ns)

100 1.5
tr
td(off)
tf 1
td(on)

0.5

10 0
1 10 100 0.2 0.4 0.6 0.8 1 1.2
RG, GATE RESISTANCE (Ω) –VSD, SOURCE–TO–DRAIN VOLTAGE (VOLTS)

Figure 11. Resistive Switching Time Variation Figure 12. Diode Forward Voltage vs. Current
vs. Gate Resistance

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202
NTMSD3P303R2

100
VGS = 12 V
SINGLE PULSE
–ID, DRAIN CURRENT (AMPS)

1.0 ms
TA = 25°C
10

10 ms di/dt
IS
1.0 dc
trr
ta tb
0.1 TIME
RDS(on)
THERMAL LIMIT tp 0.25 IS
PACKAGE LIMIT
0.01 IS
1 1.0 10 100
–VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS)

Figure 13. Maximum Rated Forward Biased Figure 14. Diode Reverse Recovery Waveform
Safe Operating Area

1.0
D = 0.5
Rthja(t), EFFECTIVE TRANSIENT
THERMAL RESPONSE

0.2

0.1
0.1
0.05 Chip Normalized to RθJA at Steady State (1″ pad)
Junction 2.32 Ω 18.5 Ω 50.9 Ω 37.1 Ω 56.8 Ω 24.4 Ω
0.02

0.01 0.0014 F 0.0073 F 0.022 F 0.105 F 0.484 F 3.68 F


Single Pulse Ambient
0.01
1E–03 1E–02 1E–01 1E+00 1E+01 1E+02 1E+03
t, TIME (s)

Figure 15. FET Thermal Response

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203
NTMSD3P303R2

TYPICAL SCHOTTKY ELECTRICAL CHARACTERISTICS

 
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Figure 16. Typical Forward Voltage Figure 17. Maximum Forward Voltage

 

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Figure 18. Typical Reverse Current Figure 19. Maximum Reverse Current

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6
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4$
4
pk/Io = p
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Ipk/Io = 5.0
#
$ Ipk/Io = 10
 Ipk/Io = 20
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     =   

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Figure 20. Typical Capacitance Figure 21. Current Derating

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204
NTMSD3P303R2

TYPICAL SCHOTTKY ELECTRICAL CHARACTERISTICS

:$

.  
/
     / 

$ @

/ 
#$ *0&  " p
*0&  " $

*0&  " 
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Figure 22. Forward Power Dissipation


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Figure 23. Schottky Thermal Response

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205
NTMSD3P303R2

INFORMATION FOR USING THE SO–8 SURFACE MOUNT PACKAGE

MINIMUM RECOMMENDED FOOTPRINT FOR SURFACE MOUNTED APPLICATIONS


Surface mount board layout is a critical portion of the total interface between the board and the package. With the
design. The footprint for the semiconductor packages must correct pad geometry, the packages will self–align when
be the correct size to ensure proper solder connection subjected to a solder reflow process.
9
$#

#:$ $$
: 6

#6 $
9 #:
inches
mm

SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • The soldering temperature and time shall not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within • When shifting from preheating to soldering, the
a short time could result in device failure. Therefore, the maximum temperature gradient shall be 5°C or less.
following items should always be observed in order to • After soldering has been completed, the device should
minimize the thermal stress to which the devices are be allowed to cool naturally for at least three minutes.
subjected. Gradual cooling should be used as the use of forced
• Always preheat the device. cooling will increase the temperature gradient and
• The delta temperature between the preheat and result in latent failure due to mechanical stress.
soldering should be 100°C or less.* • Mechanical stress or shock should not be applied
• When preheating and soldering, the temperature of the during cooling.
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When * Soldering a device without preheating can cause
using infrared heating with the reflow soldering excessive thermal shock and stress which can result in
method, the difference shall be a maximum of 10°C. damage to the device.

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NTMSD3P303R2

TYPICAL SOLDER HEATING PROFILE


For any given circuit board, there will be a group of temperature versus time. The line on the graph shows the
control settings that will give the desired heat pattern. The actual temperature that might be experienced on the surface
operator must set temperatures for several heating zones of a test board at or near a central solder joint. The two
and a figure for belt speed. Taken together, these control profiles are based on a high density and a low density
settings make up a heating “profile” for that particular board. The Vitronics SMD310 convection/infrared reflow
circuit board. On machines controlled by a computer, the soldering system was used to generate this profile. The type
computer remembers these profiles from one operating of solder used was 62/36/2 Tin Lead Silver with a melting
session to the next. Figure 24 shows a typical heating point between 177–189°C. When this type of furnace is
profile for use when soldering a surface mount device to a used for solder reflow work, the circuit boards and solder
printed circuit board. This profile will vary among joints tend to heat first. The components on the board are
soldering systems, but it is a good starting point. Factors then heated by conduction. The circuit board, because it has
that can affect the profile include the type of soldering a large surface area, absorbs the thermal energy more
system in use, density and types of components on the efficiently, then distributes this energy to the components.
board, type of solder used, and the type of board or Because of this effect, the main body of a component may
substrate material being used. This profile shows be up to 30 degrees cooler than the adjacent solder joints.

STEP 1 STEP 2 STEP 3 STEP 4 STEP 5 STEP 6 STEP 7


PREHEAT VENT HEATING HEATING HEATING VENT COOLING
ZONE 1 “SOAK” ZONES 2 & 5 ZONES 3 & 6 ZONES 4 & 7
“RAMP” “RAMP” “SOAK” “SPIKE” 205° TO 219°C
PEAK AT
200°C DESIRED CURVE FOR HIGH 170°C SOLDER
MASS ASSEMBLIES JOINT
160°C
150°C

150°C
SOLDER IS LIQUID FOR
40 TO 80 SECONDS
100°C 140°C (DEPENDING ON
MASS OF ASSEMBLY)
100°C

DESIRED CURVE FOR LOW


MASS ASSEMBLIES
5°C

TIME (3 TO 7 MINUTES TOTAL) TMAX


Figure 24. Typical Solder Heating Profile

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# "


  
#$%& '(
"    
N–Channel TO–220
Designed for low voltage, high speed switching applications in http://onsemi.com
power supplies, converters and power motor controls and bridge
circuits. 27 AMPERES
Features 60 VOLTS
• Higher Current Rating
RDS(on) = 46 mΩ
• Lower RDS(on)
• Lower VDS(on)
• Lower Capacitances N–Channel

• Lower Total Gate Charge D

• Tighter VSD Specification


• Lower Diode Reverse Recovery Time
• Lower Reverse Recovery Stored Charge G
Typical Applications
• Power Supplies S
• Converters
• Power Motor Controls
• Bridge Circuits MARKING DIAGRAM
& PIN ASSIGNMENT
4
MAXIMUM RATINGS (TC = 25°C unless otherwise noted) 4 Drain
Rating Symbol Value Unit
Drain–to–Source Voltage VDSS 60 Vdc
Drain–to–Gate Voltage (RGS = 10 MΩ) VDGR 60 Vdc TO–220AB
CASE 221A
Gate–to–Source Voltage Vdc STYLE 5 NTP27N06
– Continuous VGS ±20 LLYWW
– Non–Repetitive (tp ≤ 10 ms) VGS ±30
1 1 3
Drain Current 2 Gate Source
– Continuous @ TA = 25°C ID 27 Adc 3
– Continuous @ TA = 100°C ID 15 2
– Single Pulse (tp ≤ 10 µs) IDM 80 Apk Drain
Total Power Dissipation @ TA = 25°C PD 88.2 W
Derate above 25°C 0.59 W/°C NTP27N06 = Device Code
LL = Location Code
Operating and Storage Temperature Range TJ, Tstg –55 to °C Y = Year
175 WW = Work Week
Single Pulse Drain–to–Source Avalanche EAS mJ
Energy – Starting TJ = 25°C 109 ORDERING INFORMATION
(VDD = 50 Vdc, VGS = 10 Vdc,
L = 0.3 mH, IL(pk) = 27 A, VDS = 60 Vdc) Device Package Shipping

Thermal Resistance – Junction–to–Case RθJC 1.7 °C/W NTP27N06 TO–220AB 50 Units/Rail


Maximum Lead Temperature for Soldering TL 260 °C
Purposes, 1/8″ from Case for 10 seconds

This document contains information on a new product. Specifications and information


herein are subject to change without notice.

 Semiconductor Components Industries, LLC, 2001 208 Publication Order Number:


March, 2001 – Rev. 1 NTP27N06/D
NTP27N06

ELECTRICAL CHARACTERISTICS (TJ = 25°C unless otherwise noted)


Characteristic Symbol Min Typ Max Unit
OFF CHARACTERISTICS
Drain–to–Source Breakdown Voltage (Note 1.) V(BR)DSS Vdc
(VGS = 0 Vdc, ID = 250 µAdc) 60 70 –
Temperature Coefficient (Positive) – 79.4 – mV/°C
Zero Gate Voltage Drain Current IDSS µAdc
(VDS = 60 Vdc, VGS = 0 Vdc) – – 1.0
(VDS = 60 Vdc, VGS = 0 Vdc, TJ = 150°C) – – 10
Gate–Body Leakage Current (VGS = ±20 Vdc, VDS = 0 Vdc) IGSS – – ±100 nAdc
ON CHARACTERISTICS (Note 1.)
Gate Threshold Voltage (Note 1.) VGS(th) Vdc
(VDS = VGS, ID = 250 µAdc) 2.0 2.8 4.0
Threshold Temperature Coefficient (Negative) – 6.9 – mV/°C
Static Drain–to–Source On–Resistance (Note 1.) RDS(on) mW
(VGS = 10 Vdc, ID = 13.5 Adc) – 37.5 46
Static Drain–to–Source On–Resistance (Note 1.) VDS(on) Vdc
(VGS = 10 Vdc, ID = 27 Adc) – 1.05 1.5
(VGS = 10 Vdc, ID = 13.5 Adc, TJ = 150°C) – 2.12 –
Forward Transconductance (Note 1.) (VDS = 7.0 Vdc, ID = 6.0 Adc) gFS – 13.2 – mhos
DYNAMIC CHARACTERISTICS
Input Capacitance Ciss – 725 1015 pF
Output Capacitance (VDS = 25 Vd
Vdc, VGS = 0 Vd
Vdc,
Coss – 213 300
f = 1.0 MHz)
Transfer Capacitance Crss – 58 120
SWITCHING CHARACTERISTICS (Note 2.)
Turn–On Delay Time td(on) – 13.6 30 ns
Rise Time (VDD = 30 Vdc, ID = 27 Adc, tr – 62.7 125
VGS = 10 Vdc
Vdc,
Turn–Off Delay Time RG = 9.1 Ω) (Note 1.) td(off) – 26.6 60
Fall Time tf – 70.4 140
Gate Charge QT – 21.2 30 nC
(VDS = 48 Vd
Vdc, ID = 27 Adc,
Ad
Q1 – 5.6 –
VGS = 10 Vdc) (Note 1.)
Q2 – 7.3 –

SOURCE–DRAIN DIODE CHARACTERISTICS


Forward On–Voltage VSD Vdc
(IS = 27 Adc, VGS = 0 Vdc) (Note 1.) – 1.05 1.25
(IS = 27 Adc, VGS = 0 Vdc, TJ = 150°C) – 0.93 –
Reverse Recovery Time trr – 42 – ns
(IS = 27 Ad
Adc, VGS = 0 Vd
Vdc,
ta – 26 –
dIS/dt = 100 A/µs) (Note 1.)
tb – 16 –
Reverse Recovery Stored Charge QRR – 0.07 – µc
1. Pulse Test: Pulse Width ≤ 300 µs, Duty Cycle ≤ 2%.
2. Switching characteristics are independent of operating junction temperature.

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#$%& '(
    
N–Channel TO–220 and D2PAK
Designed for low voltage, high speed switching applications in
power supplies, converters and power motor controls and bridge
circuits. http://onsemi.com
Features
• Higher Current Rating
45 AMPERES
• Lower RDS(on) 60 VOLTS
• Lower VDS(on) RDS(on) = 26 mΩ
• Lower Capacitances
• Lower Total Gate Charge N–Channel
• Tighter VSD Specification D

• Lower Diode Reverse Recovery Time


• Lower Reverse Recovery Stored Charge
Typical Applications G
• Power Supplies 4
• Converters S
• Power Motor Controls 4

• Bridge Circuits 1 2
3
MAXIMUM RATINGS (TJ = 25°C unless otherwise noted) TO–220AB D2PAK
CASE 221A CASE 418B
Rating Symbol Value Unit
STYLE 5 STYLE 2
1
Drain–to–Source Voltage VDSS 60 Vdc 2
Drain–to–Gate Voltage (RGS = 10 MΩ) VDGR 60 Vdc 3
MARKING DIAGRAMS
Gate–to–Source Voltage Vdc
& PIN ASSIGNMENTS
– Continuous VGS "20
– Non–Repetitive (tpv10 ms) VGS "30 4
Drain 4
Drain Current Drain
– Continuous @ TA = 25°C ID 45 Adc
– Continuous @ TA = 100°C ID 30
– Single Pulse (tpv10 µs) IDM 150 Apk
NTB45N06
Total Power Dissipation @ TA = 25°C PD 125 W LLYWW
Derate above 25°C 0.83 W/°C NTP45N06
Total Power Dissipation @ TA = 25°C (Note 1.) 3.2 W LLYWW
Total Power Dissipation @ TA = 25°C (Note 2.) 2.4 W 1 2 3
1 3
Operating and Storage Temperature Range TJ, Tstg –55 to °C Gate Source
Gate Drain Source
+175
Single Pulse Drain–to–Source Avalanche EAS 240 mJ 2
NTx45N06 = Device Code
Energy – Starting TJ = 25°C Drain
LL = Location Code
(VDD = 50 Vdc, VGS = 10 Vdc, RG = 25 Ω,
Y = Year
IL(pk) = 40 A, L = 0.3 mH, VDS = 60 Vdc)
WW = Work Week
1. When surface mounted to an FR4 board using 1″ pad size,
(Cu Area 1.127 in2).
ORDERING INFORMATION
2. When surface mounted to an FR4 board using the minimum recommended
pad size, (Cu Area 0.412 in2). Device Package Shipping

NTP45N06 TO–220AB 50 Units/Rail

NTB45N06 D2PAK 50 Units/Rail

NTB45N06T4 D2PAK 800/Tape & Reel

 Semiconductor Components Industries, LLC, 2001 210 Publication Order Number:


March, 2001 – Rev. 0 NTP45N06/D
NTP45N06, NTB45N06

MAXIMUM RATINGS (TJ = 25°C unless otherwise noted)


Rating Symbol Value Unit
Thermal Resistance – Junction–to–Case RθJC 1.2 °C/W
– Junction–to–Ambient (Note 3.) RθJA 46.8
– Junction–to–Ambient (Note 4.) RθJA 63.2
Maximum Lead Temperature for Soldering Purposes, 1/8″ from case for 10 seconds TL 260 °C

ELECTRICAL CHARACTERISTICS (TJ = 25°C unless otherwise noted)


Characteristic Symbol Min Typ Max Unit
OFF CHARACTERISTICS
Drain–to–Source Breakdown Voltage (Note 5.) V(BR)DSS Vdc
(VGS = 0 Vdc, ID = 250 µAdc) 60 70 –
Temperature Coefficient (Positive) – 57 – mV/°C
Zero Gate Voltage Drain Current IDSS µAdc
(VDS = 60 Vdc, VGS = 0 Vdc) – – 1.0
(VDS = 60 Vdc, VGS = 0 Vdc, TJ = 150°C) – – 10
Gate–Body Leakage Current (VGS = ±20 Vdc, VDS = 0 Vdc) IGSS – – ±100 nAdc
ON CHARACTERISTICS (Note 5.)
Gate Threshold Voltage (Note 5.) VGS(th) Vdc
(VDS = VGS, ID = 250 µAdc) 2.0 2.8 4.0 mV/°C
Threshold Temperature Coefficient (Negative) – 7.2 –
Static Drain–to–Source On–Resistance (Note 5.) RDS(on) mOhm
(VGS = 10 Vdc, ID = 22.5 Adc) – 21 26

Static Drain–to–Source On–Voltage (Note 5.) VDS(on) Vdc


(VGS = 10 Vdc, ID = 45 Adc) – 0.93 1.4
(VGS = 10 Vdc, ID = 22.5 Adc, TJ = 150°C) – 0.93 –
Forward Transconductance (Note 5.) (VDS = 8.0 Vdc, ID = 12 Adc) gFS – 16.6 – mhos
DYNAMIC CHARACTERISTICS
Input Capacitance Ciss – 1224 1725 pF
Output Capacitance (VDS = 25 Vd
Vdc, VGS = 0 Vd
Vdc,
Coss – 345 485
f = 1.0 MHz)
Transfer Capacitance Crss – 76 160

SWITCHING CHARACTERISTICS (Note 6.)


Turn–On Delay Time td(on) – 10 25 ns
Rise Time (VDD = 30 Vdc, ID = 45 Adc, tr – 101 200
Turn–Off Delay Time VGS = 10 Vdc, RG = 9.1 Ω) (Note 5.) td(off) – 33 70
Fall Time tf – 106 220
Gate Charge QT – 33 46 nC
(VDS = 48 Vd
Vdc, ID = 45 Adc,
Ad
Q1 – 6.4 –
VGS = 10 Vdc) (Note 5.)
Q2 – 15 –
SOURCE–DRAIN DIODE CHARACTERISTICS
Forward On–Voltage (IS = 45 Adc, VGS = 0 Vdc) (Note 5.) VSD – 1.08 1.2 Vdc
(IS = 45 Adc, VGS = 0 Vdc, TJ = 150°C) – 0.93 –
Reverse Recovery Time trr – 53.1 – ns
(IS = 45 Ad
Adc, VGS = 0 Vd
Vdc,
ta – 36 –
dIS/dt = 100 A/µs) (Note 5.)
tb – 16.9 –
Reverse Recovery Stored Charge QRR – 0.087 – µC
3. When surface mounted to an FR4 board using 1″ pad size, (Cu Area 1.127 in2).
4. When surface mounted to an FR4 board using the minimum recommended pad size, (Cu Area 0.412 in2).
5. Pulse Test: Pulse Width ≤ 300 µs, Duty Cycle ≤ 2%.
6. Switching characteristics are independent of operating junction temperatures.

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211
NTP45N06, NTB45N06

90 90
VGS = 10 V VGS = 7 V VDS > = 10 V
80 80
ID, DRAIN CURRENT (AMPS)

ID, DRAIN CURRENT (AMPS)


VGS = 9 V
70 VGS = 6.5 V 70
60 60
VGS = 8 V VGS = 6 V
50 50
VGS = 7.5 V VGS = 5.5 V
40 40

30 30
VGS = 5 V TJ = 25°C
20 20
VGS = 4.5 V TJ = 100°C
10 10
TJ = –55°C
0 0
0 1 2 3 4 5 6 3 3.5 4 4.5 5 5.5 6 6.5 7 7.5 8
VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS) VGS, GATE–TO–SOURCE VOLTAGE (VOLTS)

Figure 1. On–Region Characteristics Figure 2. Transfer Characteristics


RDS(on), DRAIN–TO–SOURCE RESISTANCE (Ω)

RDS(on), DRAIN–TO–SOURCE RESISTANCE (Ω)


0.05 0.032
VGS = 10 V
0.03
0.042
0.028

0.034 TJ = 100°C
0.026

0.024 VGS = 10 V
0.026 TJ = 25°C

0.022
0.018 TJ = –55°C
0.02 VGS = 15 V

0.01 0.018
0 10 20 30 40 50 60 70 80 90 0 10 20 30 40 50 60 70 80 90
ID, DRAIN CURRENT (AMPS) ID, DRAIN CURRENT (AMPS)

Figure 3. On–Resistance vs. Gate–to–Source Figure 4. On–Resistance vs. Drain Current and
Voltage Gate Voltage
RDS(on), DRAIN–TO–SOURCE RESISTANCE

2.2 10000
VGS = 0 V
ID = 22.5 A
2 VGS = 10 V
IDSS, LEAKAGE (nA)

TJ = 150°C
1.8
(NORMALIZED)

1000
1.6

1.4 TJ = 125°C

1.2
100
1
TJ = 100°C
0.8

0.6 10
–50 –25 0 25 50 75 100 125 150 175 0 10 20 30 40 50 60
TJ, JUNCTION TEMPERATURE (°C) VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS)

Figure 5. On–Resistance Variation with Figure 6. Drain–to–Source Leakage Current


Temperature vs. Voltage

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212
NTP45N06, NTB45N06

VGS, GATE–TO–SOURCE VOLTAGE (VOLTS)


3600 12
VDS = 0 V VGS = 0 V TJ = 25°C
3200 QT
Ciss 10
2800
C, CAPACITANCE (pF)

VGS
2400 Crss 8
2000 Q1 Q2
6
1600 Ciss
1200 4
800 Coss
2 ID = 45
400 Crss TJ = 25°C
0 0
10 5 VGS 0 VDS 5 10 15 20 25 0 4 8 12 16 20 24 28 32 36
GATE–TO–SOURCE OR DRAIN–TO–SOURCE VOLTAGE Qg, TOTAL GATE CHARGE (nC)
(VOLTS)
Figure 7. Capacitance Variation Figure 8. Gate–to–Source and
Drain–to–Source Voltage vs. Total Charge
1000 50
VDS = 30 V VGS = 0 V

IS, SOURCE CURRENT (AMPS)


ID = 45 A TJ = 25°C
VGS = 10 V 40
tf
100
t, TIME (ns)

tr 30
td(off)

td(on) 20
10

10

1 0
1 10 100 0.6 0.64 0.68 0.72 0.76 0.8 0.84 0.88 0.92 0.96 1 1.04
RG, GATE RESISTANCE (Ω) VSD, SOURCE–TO–DRAIN VOLTAGE (VOLTS)

Figure 9. Resistive Switching Time Variation Figure 10. Diode Forward Voltage vs. Current
vs. Gate Resistance
EAS, SINGLE PULSE DRAIN–TO–SOURCE

1000 280
VGS = 20 V ID = 45 A
SINGLE PULSE
ID, DRAIN CURRENT (AMPS)

240
AVALANCHE ENERGY (mJ)

TC = 25°C
100
200
dc
160
10 ms
10
1 ms 120

RDS(on) Limit 100 µs


80
1 Thermal Limit
Package Limit
40

0.1 0
0.10 1 10 100 25 50 75 100 125 150 175
VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS) TJ, STARTING JUNCTION TEMPERATURE (°C)

Figure 11. Maximum Rated Forward Biased Figure 12. Maximum Avalanche Energy vs.
Safe Operating Area Starting Junction Temperature

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213
NTP45N06, NTB45N06

1
r(t), EFFECTIVE TRANSIENT THERMAL RESPONSE (NORMALIZED) Normalized to RθJC at Steady State

0.1

0.01
0.00001 0.0001 0.001 0.01 0.1 1 10
t, TIME (s)
Figure 13. Thermal Response

10
Normalized to RθJA at Steady State,
r(t), EFFECTIVE TRANSIENT THERMAL RESISTANCE (NORMALIZED)

1″ square Cu Pad, Cu Area 1.127 in2,


3 x 3 inch FR4 board

0.1

0.01

0.001
0.00001 0.0001 0.001 0.01 0.1 1 10 100 1000
t, TIME (s)
Figure 14. Thermal Response

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214
# 

#$%& '(
     
* %+%
N–Channel TO–220 and D2PAK
Designed for low voltage, high speed switching applications in
power supplies, converters and power motor controls and bridge
circuits. http://onsemi.com
Features
• Higher Current Rating
45 AMPERES
• Lower RDS(on) 60 VOLTS
• Lower VDS(on) RDS(on) = 28 mΩ
• Lower Capacitances
• Lower Total Gate Charge N–Channel
• Tighter VSD Specification D

• Lower Diode Reverse Recovery Time


• Lower Reverse Recovery Stored Charge
Typical Applications G
• Power Supplies 4
• Converters S
• Power Motor Controls 4

• Bridge Circuits 1 2
3
MAXIMUM RATINGS (TJ = 25°C unless otherwise noted) TO–220AB D2PAK
CASE 221A CASE 418B
Rating Symbol Value Unit
STYLE 5 STYLE 2
1
Drain–to–Source Voltage VDSS 60 Vdc 2
Drain–to–Gate Voltage (RGS = 10 MΩ) VDGR 60 Vdc 3
MARKING DIAGRAMS
Gate–to–Source Voltage Vdc
& PIN ASSIGNMENTS
– Continuous VGS "15
– Non–Repetitive (tpv10 ms) VGS "20 4
Drain 4
Drain Current Drain
– Continuous @ TA = 25°C ID 45 Adc
– Continuous @ TA = 100°C ID 30
– Single Pulse (tpv10 µs) IDM 150 Apk
NTB45N06L
Total Power Dissipation @ TA = 25°C PD 125 W
NTP45N06L LLYWW
Derate above 25°C 0.83 W/°C
Total Power Dissipation @ TA = 25°C (Note 1.) 3.2 W LLYWW
Total Power Dissipation @ TA = 25°C (Note 2.) 2.4 W 2
1 3 1 3
Operating and Storage Temperature Range TJ, Tstg –55 to °C Gate Source Drain
Gate Source
+175
Single Pulse Drain–to–Source Avalanche EAS 240 mJ 2
NTx45N06L = Device Code
Energy – Starting TJ = 25°C Drain
LL = Location Code
(VDD = 50 Vdc, VGS = 5.0 Vdc, L = 0.3 mH
Y = Year
IL(pk) = 40 A, VDS = 60 Vdc, RG = 25 Ω)
WW = Work Week
1. When surface mounted to an FR4 board using 1″ pad size,
(Cu Area 1.127 in2).
ORDERING INFORMATION
2. When surface mounted to an FR4 board using the minimum recommended
pad size, (Cu Area 0.412 in2). Device Package Shipping

NTP45N06L TO–220AB 50 Units/Rail

NTB45N06L D2PAK 50 Units/Rail

NTB45N06LT4 D2PAK 800/Tape & Reel

 Semiconductor Components Industries, LLC, 2001 215 Publication Order Number:


March, 2001 – Rev. 0 NTP45N06L/D
NTP45N06L, NTB45N06L

MAXIMUM RATINGS (TJ = 25°C unless otherwise noted)


Rating Symbol Value Unit
Thermal Resistance – Junction–to–Case RθJC 1.2 °C/W
– Junction–to–Ambient (Note 3.) RθJA 46.8
– Junction–to–Ambient (Note 4.) RθJA 63.2
Maximum Lead Temperature for Soldering Purposes, 1/8″ from case for 10 seconds TL 260 °C

ELECTRICAL CHARACTERISTICS (TJ = 25°C unless otherwise noted)


Characteristic Symbol Min Typ Max Unit
OFF CHARACTERISTICS
Drain–to–Source Breakdown Voltage (Note 4.) V(BR)DSS Vdc
(VGS = 0 Vdc, ID = 250 µAdc) 60 67 –
Temperature Coefficient (Positive) – 67.2 – mV/°C
Zero Gate Voltage Drain Current IDSS µAdc
(VDS = 60 Vdc, VGS = 0 Vdc) – – 1.0
(VDS = 60 Vdc, VGS = 0 Vdc, TJ = 150°C) – – 10
Gate–Body Leakage Current (VGS = ±15 Vdc, VDS = 0 Vdc) IGSS – – ±100 nAdc
ON CHARACTERISTICS (Note 5.)
Gate Threshold Voltage (Note 5.) VGS(th) Vdc
(VDS = VGS, ID = 250 µAdc) 1.0 1.8 2.0
Threshold Temperature Coefficient (Negative) – 4.7 – mV/°C
Static Drain–to–Source On–Resistance (Note 5.) RDS(on) mOhm
(VGS = 5.0 Vdc, ID = 22.5 Adc) – 23 28

Static Drain–to–Source On–Voltage (Note 5.) VDS(on) Vdc


(VGS = 5.0 Vdc, ID = 45 Adc) – 1.03 1.51
(VGS = 5.0 Vdc, ID = 22.5 Adc, TJ = 150°C) – 0.93 –
Forward Transconductance (Note 5.) (VDS = 8.0 Vdc, ID = 12 Adc) gFS – 22.8 – mhos
DYNAMIC CHARACTERISTICS
Input Capacitance Ciss – 1212 1700 pF
Output Capacitance (VDS = 25 Vd
Vdc, VGS = 0 Vd
Vdc,
Coss – 352 480
f = 1.0 MHz)
Transfer Capacitance Crss – 90 180
SWITCHING CHARACTERISTICS (Note 6.)
Turn–On Delay Time td(on) – 13 30 ns
Rise Time (VDD = 30 Vdc, ID = 45 Adc, tr – 341 680
Turn–Off Delay Time VGS = 5.0 Vdc, RG = 9.1 Ω) (Note 5.) td(off) – 36 75
Fall Time tf – 158 320
Gate Charge QT – 23 32 nC
(VDS = 48 Vd
Vdc, ID = 45 Adc,
Ad
Q1 – 4.6 –
VGS = 5.0 Vdc) (Note 5.)
Q2 – 14.1 –

SOURCE–DRAIN DIODE CHARACTERISTICS


Forward On–Voltage (IS = 45 Adc, VGS = 0 Vdc) (Note 5.) VSD – 1.01 1.15 Vdc
(IS = 45 Adc, VGS = 0 Vdc, TJ = 150°C) – 0.92 –
Reverse Recovery Time trr – 56 – ns
(IS = 45 Ad
Adc, VGS = 0 Vd
Vdc,
ta – 30 –
dIS/dt = 100 A/µs) (Note 5.)
tb – 26 –
Reverse Recovery Stored Charge QRR – 0.09 – µC
3. When surface mounted to an FR4 board using 1″ pad size, (Cu Area 1.127 in2).
4. When surface mounted to an FR4 board using the minimum recommended pad size, (Cu Area 0.412 in2).
5. Pulse Test: Pulse Width ≤ 300 µs, Duty Cycle ≤ 2%.
6. Switching characteristics are independent of operating junction temperatures.

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216
NTP45N06L, NTB45N06L

80 80
VGS = 10 V VGS = 5.5 V
VDS > = 10 V
70 70
ID, DRAIN CURRENT (AMPS)

ID, DRAIN CURRENT (AMPS)


VGS = 5 V
60 VGS = 6 V 60

50 VGS = 4.5 V 50
VGS = 7 V
40 40
VGS = 4 V
30 30
TJ = 25°C
VGS = 8 V
20 20
VGS = 3.5 V TJ = 100°C
10 VGS = 9 V 10
TJ = –55°C
0 0
0 1 2 3 4 1.8 2.6 3.4 4.2 5 5.8
VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS) VGS, GATE–TO–SOURCE VOLTAGE (VOLTS)

Figure 1. On–Region Characteristics Figure 2. Transfer Characteristics


RDS(on), DRAIN–TO–SOURCE RESISTANCE (Ω)

RDS(on), DRAIN–TO–SOURCE RESISTANCE (Ω)


0.046 0.046
VGS = 5 V
0.042 0.042
TJ = 100°C
0.038
0.038
0.034
0.034
0.03 TJ = 25°C VGS = 5 V
0.03
0.026
0.026
0.022
TJ = –55°C
0.022 VGS = 10 V
0.018

0.014 0.018
0 10 20 30 40 50 60 70 80 0 10 20 30 40 50 60 70 80
ID, DRAIN CURRENT (AMPS) ID, DRAIN CURRENT (AMPS)
Figure 3. On–Resistance vs. Gate–to–Source Figure 4. On–Resistance vs. Drain Current and
Voltage Gate Voltage
RDS(on), DRAIN–TO–SOURCE RESISTANCE

2 10000
ID = 22.5 A VGS = 0 V
1.8 VGS = 5 V
TJ = 150°C
IDSS, LEAKAGE (nA)

1.6
1000
(NORMALIZED)

1.4 TJ = 125°C

1.2
100
1
TJ = 100°C
0.8

0.6 10
–50 –25 0 25 50 75 100 125 150 175 0 10 20 30 40 50 60
TJ, JUNCTION TEMPERATURE (°C) VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS)

Figure 5. On–Resistance Variation with Figure 6. Drain–to–Source Leakage Current


Temperature vs. Voltage

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217
NTP45N06L, NTB45N06L

VGS, GATE–TO–SOURCE VOLTAGE (VOLTS)


4000 6
VDS = 0 V VGS = 0 V TJ = 25°C
3600 Ciss QT
5 VGS
3200
C, CAPACITANCE (pF)

Crss Q1 Q2
2800
4
2400
2000 3
1600 Ciss
2
1200
800 Coss
1 ID = 45 A
400 Crss TJ = 25°C
0 0
10 5 VGS 0 VDS 5 10 15 20 25 0 4 8 12 16 20 24
GATE–TO–SOURCE OR DRAIN–TO–SOURCE VOLTAGE Qg, TOTAL GATE CHARGE (nC)
(VOLTS)
Figure 7. Capacitance Variation Figure 8. Gate–to–Source and
Drain–to–Source Voltage vs. Total Charge
1000 48
VDS = 30 V
VGS = 0 V

IS, SOURCE CURRENT (AMPS)


ID = 45 A
40 TJ = 25°C
VGS = 5 V tr

tf 32
t, TIME (ns)

100 24

td(off)
16

8
td(on)
10 0
1 10 100 0.6 0.64 0.68 0.72 0.76 0.8 0.84 0.88 0.92 0.96 1
RG, GATE RESISTANCE (Ω) VSD, SOURCE–TO–DRAIN VOLTAGE (VOLTS)

Figure 9. Resistive Switching Time Variation Figure 10. Diode Forward Voltage vs. Current
vs. Gate Resistance
EAS, SINGLE PULSE DRAIN–TO–SOURCE

1000 280
VGS = 15 V
ID = 45 A
SINGLE PULSE
ID, DRAIN CURRENT (AMPS)

240
AVALANCHE ENERGY (mJ)

TC = 25°C
100
200

dc 160
10
10 ms
120
1 ms
1
RDS(on) Limit 100 µs 80
Thermal Limit
Package Limit
40

0.1 0
0.10 1 10 100 25 50 75 100 125 150 175
VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS) TJ, STARTING JUNCTION TEMPERATURE (°C)

Figure 11. Maximum Rated Forward Biased Figure 12. Maximum Avalanche Energy vs.
Safe Operating Area Starting Junction Temperature

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218
NTP45N06L, NTB45N06L

1
r(t), EFFECTIVE TRANSIENT THERMAL RESPONSE (NORMALIZED) Normalized to RθJC at Steady State

0.1

0.01
0.00001 0.0001 0.001 0.01 0.1 1 10

t, TIME (s)

Figure 13. Thermal Response

10
Normalized to RθJA at Steady State,
r(t), EFFECTIVE TRANSIENT THERMAL RESISTANCE (NORMALIZED)

1″ square Cu Pad, Cu Area 1.127 in2,


3 x 3 inch FR4 board

0.1

0.01

0.001
0.00001 0.0001 0.001 0.01 0.1 1 10 100 1000
t, TIME (s)

Figure 14. Thermal Response

http://onsemi.com
219
#"!
"!

#$%& '(
"  !  
N–Channel TO–220 and D2PAK
This 10 VGS gate drive vertical Power MOSFET is a general http://onsemi.com
purpose part that provides the “best of design” available today in a low
cost power package. Avalanche energy issues make this part an ideal 75 AMPERES
design in. The drain–to–source diode has a ideal fast but soft recovery. 30 VOLTS
Features
• Ultra–Low RDS(on), Single Base, Advanced Technology
RDS(on) = 6.5 mΩ
• SPICE Parameters Available N–Channel
• Diode is Characterized for Use in Bridge Circuits 
• IDSS and VDS(on) Specified at Elevated Temperatures
• High Avalanche Energy Specified
• ESD JEDAC Rated HBM Class 1, MM Class B, CDM Class 0
Typical Applications 

• Power Supplies
• Inductive Loads 4 

• PWM Motor Controls 4


• Replaces MTP1306 and MTB1306 in Many Applications
1 2
3
TO–220AB D2PAK
CASE 221A CASE 418B
1 STYLE 5 STYLE 2
2
3

MARKING DIAGRAMS
& PIN ASSIGNMENTS
4 4
Drain Drain

E75
N03–06
YWW
E75
N03–06
YWW 1 3
Gate Source
1 3 2
Gate Source Drain

2 N03–06 = Device Code


Drain Y = Year
WW = Work Week

ORDERING INFORMATION
Device Package Shipping

NTP75N03–06 TO–220 50 Units/Rail

NTB75N03–06 D2PAK 50 Units/Rail


NTB75N03–06T4 D2PAK 800 Tape & Reel

 Semiconductor Components Industries, LLC, 2000 220 Publication Order Number:


December, 2000 – Rev. 0 NTP75N03–06/D
NTP75N03–06, NTB75N03–06

MAXIMUM RATINGS (TJ = 25°C unless otherwise noted)


Rating Symbol Value Unit
Drain–to–Source Voltage VDSS 30 Vdc
Drain–to–Gate Voltage VDGB 30 Vdc
(RGS = 10 MΩ)
Gate–to–Source Voltage – Continuous VGS ±20 Vdc
Non–repetitive (tp ≤ 10 ms) VGS ±24 Vdc
Drain Current
– Continuous @ TA = 25_C ID 75 Adc
– Continuous @ TA = 100_C ID 59
– Single Pulse (tp ≤ 10 µs) IDM 225 Apk
Total Power Dissipation @ TC = 25°C PD 150 W
Derate above 25°C 1.0 W/_C
Total Power Dissipation @ TA = 25°C (Note 1.) 2.5 W
Operating and Storage Temperature Range TJ and Tstg –55 to 150 _C
Single Pulse Drain–to–Source Avalanche Energy – Starting TJ = 25°C EAS 1500 mJ
(VDD = 38 Vdc, VGS = 10 Vdc, L = 1 mH, IL(pk) = 55 A, VDS = 40 Vdc)
Thermal Resistance
– Junction–to–Case RθJC 1.0 _C/W
– Junction–to–Ambient RθJA 62.5
– Junction–to–Ambient (Note 1.) RθJA 50
Maximum Lead Temperature for Soldering Purposes, 1/8″ from case for 10 seconds TL 260 _C
1. When surface mounted to an FR4 board using the minimum recommended pad size.

http://onsemi.com
221
NTP75N03–06, NTB75N03–06

ELECTRICAL CHARACTERISTICS (TA = 25°C unless otherwise noted)


Characteristic Symbol Min Typ. Max Unit

OFF CHARACTERISTICS
Drain–Source Breakdown Voltage (Note 2.) V(BR)DSS
(VGS = 0 Vdc, ID = 250 µAdc) 30 – – Vdc
Temperature Coefficient (Negative) –57 – mV°C
Zero Gate Voltage Drain Current IDSS µAdc
(VDS = 30 Vdc, VGS = 0 Vdc) – – 1.0
(VDS = 30 Vdc, VGS = 0 Vdc, TJ = 150°C) – – 10
Gate–Body Leakage Current (VGS = ±20 Vdc, VDS = 0 Vdc) IGSS – – ±100 nAdc
ON CHARACTERISTICS (Note 2.)
Gate Threshold Voltage (Note 2.) VGS(th)
(VDS = VGS, ID = 250 µAdc) 1.0 1.6 2.0 Vdc
Threshold Temperature Coefficient (Negative) – –6 – mV°C
Static Drain–to–Source On–Resistance (Note 2.) RDS(on) mΩ
(VGS = 10 Vdc, ID = 37.5 Adc) – 5.3 6.5
Static Drain–to–Source On Resistance (Note 2.) VDS(on) Vdc
(VGS = 10 Vdc, ID = 75 Adc) – 0.53 0.68
(VGS = 10 Vdc, ID = 37.5 Adc, TJ = 125°C) – 0.35 0.50
Forward Transconductance (Notes 2. & 4.) (VDS = 3 Vdc, ID = 20 Adc) gFS – 58 – Mhos

DYNAMIC CHARACTERISTICS (Note 4.)


Input Capacitance Ciss – 4398 5635 pF
(VDS = 25 Vd
Vdc, VGS = 0
0,
Output Capacitance Coss – 1160 1894
f = 1.0 MHz)
Transfer Capacitance Crss – 317 430

SWITCHING CHARACTERISTICS (Notes 3. & 4.)


Turn–On Delay Time td(on) – 31 48 ns
(VGS = 55.0
0 Vd
Vdc,
Rise Time tr – 510 986
VDD = 20 Vdc, ID = 75 Adc,
Turn–Off Delay Time RG = 4.7 Ω) (Note 2.) td(off) – 99 120
Fall Time tf – 203 300
Gate Charge (VGS = 5.0 Vdc, QT – 52 122 nC
ID = 75 Adc,
Ad
Q1 – 6.6 28
VDS = 24 Vdc) (Note 2.)
Q2 – 28 66

SOURCE–DRAIN DIODE CHARACTERISTICS


Forward On–Voltage (IS = 75 Adc, VGS = 0 Vdc) VSD – 1.19 1.25 Vdc
(IS = 75 Adc, VGS = 0 Vdc, TJ = 125°C) – 1.09 –
(Note 2.)
Reverse Recovery Time trr – 37 – ns
(N t 4
(Note 4.)) (IS = 75 Ad
Adc, VGS = 0 Vd
Vdc
ta – 20 –
dlS/dt = 100 A/µs) (Note 2.)
Reverse Recovery Stored tb – 17 – µC
Ch
Charge (Note
(N t 4.)
4)
QRR – 0.023 –
2. Pulse Test: Pulse Width v 300 µS, Duty Cycle v 2%.
3. Switching characteristics are independent of operating junction temperatures.
4. From characterization test data.

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222
NTP75N03–06, NTB75N03–06

150
120 VGS = 4 V
VGS = 3.5 V 135 VDS ≥ 10 V
VGS = 4.5 V
ID, DRAIN CURRENT (AMPS)

ID, DRAIN CURRENT (AMPS)


120
90
VGS = 5 V
105
VGS = 6 V
VGS = 8 V 90
60
VGS = 10 V 75
VGS = 3 V
60
30
45 TJ = 25°C
TJ = 25°C
VGS = 2.5 V 30
0 TJ = 100°C
15 TJ = –55°C
0
0 0.2 0.4 0.6 0.8 1 1.2 1.4 1.6 1.8 2 2.2 2.4 2.6 0.5 1 1.5 2 2.5 3 3.5 4
VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS) VGS, GATE–TO–SOURCE VOLTAGE (VOLTS)

Figure 1. On–Region Characteristics Figure 2. Transfer Characteristics


RDS(on), DRAIN–TO SOURCE RESISTANCE (Ω)

RDS(on), DRAIN–TO SOURCE RESISTANCE (Ω)


0.0085 0.009
VGS = 5 V TJ = 25°C
0.008
TJ = 100°C
0.0075 0.008

0.007
TJ = 25°C 0.007
0.0065 VGS = 5 V
0.006
0.006
0.0055 VGS = 10 V
TJ = –55°C
0.005 0.005
0.0045
0.004 0.004
10 20 30 40 50 60 70 80 90 100 120 0 20 40 60 80 100 120
ID, DRAIN CURRENT (AMPS) ID, DRAIN CURRENT (AMPS)

Figure 3. On–Resistance vs. Drain Current and Figure 4. On–Resistance vs. Drain Current and
Temperature Gate Voltage
RDS(on), DRAIN–TO SOURCE RESISTANCE (NORMALIZED)

1.6 1000
VGS = 10 V VGS = 0 V
ID = 37.5 A
1.4
TJ = 125°C
IDSS, LEAKAGE (nA)

100
1.2
TJ = 100°C
1
10

0.8

0.6 1
–50 –25 0 25 50 75 100 125 150 5 10 15 20 25 30
TJ, JUNCTION TEMPERATURE (°C) VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS)

Figure 5. On–Resistance Variation Temperature Figure 6. Drain–to–Source Leakage Current vs.


Voltage

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223
NTP75N03–06, NTB75N03–06

VGS, GATE–TO–SOURCE VOLTAGE (VOLTS)


1200 12 30
VGS VDS
VDS = 0 V
QT
1000 VGS = 0 V 10 25
TJ = 25°C
C, CAPACITANCE (pF)

800 8 20
VGS
600 6 15
Ciss Q1
Q2
400 4 10
Coss
200 2 ID = 75 A 5
Crss TJ = 25°C
0 0 0
10 8 6 4 2 0 2 4 6 8 10 12 14 16 18 20 22 25 0 4 8 12 16 20 24 28 32 36 40 44 48 52
GATE–TO–SOURCE OR DRAIN–TO–SOURCE Qg, TOTAL GATE CHARGE (nC)
VOLTAGE (VOLTS)
Figure 7. Capacitance Variation Figure 8. Gate–to–Source Voltage vs. Total Charge

1000 75
70 VGS = 0 V
tr IS, SOURCE CURRENT (AMPS) 65 TJ = 25°C
60
55
50
t, TIME (ns)

tf 45
40
100
35
td(off) 30
25
20
td(on) 15
TJ = 25°C VDD = 15 V 10
ID = 75 A VGS = 5 V 5
10 0
1 2.2 4.7 6.2 9.1 10 20 0.0 0.2 0.4 0.6 0.8 1.0
RG, GATE RESISTANCE (Ω) VSD, SOURCE–TO–DRAIN VOLTAGE (VOLTS)

Figure 9. Resistive Switching Time Variation Figure 10. Diode Forward Voltage vs. Current
vs. Gate Resistance
EAS, SINGLE PULSE DRAIN–TO–SOURCE

1600

1400 ID = 75 A
AVALANCHE ENERGY (mJ)

1200

1000

800

600

400

200

0
25 50 75 100 125 150
TJ, STARTING JUNCTION TEMPERATURE (°C)

Figure 11. Maximum Avalanche Energy vs.


Starting Junction Temperature

http://onsemi.com
224
#"!)
"!)

#$%& '(
"  !  
N–Channel TO–220 and D2PAK
This Logic Level Vertical Power MOSFET is a general purpose part http://onsemi.com
that provides the “best of design” available today in a low cost power
package. Avalanche energy issues make this part an ideal design in. 75 AMPERES
The drain–to–source diode has a ideal fast but soft recovery. 30 VOLTS
Features
• Ultra–Low RDS(on), Single Base, Advanced Technology
RDS(on) = 9 mΩ
• SPICE Parameters Available N–Channel
• Diode is Characterized for Use in Bridge Circuits 
• IDSS and VDS(on) Specified at Elevated Temperatures
• High Avalanche Energy Specified
• ESD JEDAC Rated HBM Class 1, MM Class B, CDM Class 0
Typical Applications 

• Power Supplies
• Inductive Loads 
4
• PWM Motor Controls
• Replaces MTP75N03HDL and MTB75N03HDL in Many 4

Applications 1 2
3
TO–220AB D2PAK
CASE 221A CASE 418B
STYLE 5 STYLE 2
1
2
3 MARKING DIAGRAMS
& PIN ASSIGNMENTS
4 4
Drain Drain

E75
N03L09
YWW
E75
N03L09
YWW 1 3
Gate 2 Source
1 3
Gate Source Drain

2 N03L09 = Device Code


Drain Y = Year
WW = Work Week

ORDERING INFORMATION
Device Package Shipping

NTP75N03L09 TO–220 50 Units/Rail

NTB75N03L09 D2PAK 50 Units/Rail


NTB75N03L09T4 D2PAK 800 Tape & Reel

 Semiconductor Components Industries, LLC, 2000 225 Publication Order Number:


December, 2000 – Rev. 0 NTP75N03L09/D
NTP75N03L09, NTB75N03L09

MAXIMUM RATINGS (TJ = 25°C unless otherwise noted)


Rating Symbol Value Unit
Drain–to–Source Voltage VDSS 30 Vdc
Drain–to–Gate Voltage VDGB 30 Vdc
(RGS = 10 MΩ)
Gate–to–Source Voltage – Continuous VGS ±20 Vdc
Non–repetitive (tp ≤ 10 ms) VGS ±24 Vdc
Drain Current
– Continuous @ TA = 25_C ID 75 Adc
– Continuous @ TA = 100_C ID 59
– Single Pulse (tp ≤ 10 µs) IDM 225 Apk
Total Power Dissipation @ TC = 25°C PD 150 W
Derate above 25°C 1.0 W/_C
Total Power Dissipation @ TA = 25°C (Note 1.) 2.5 W
Operating and Storage Temperature Range TJ and Tstg –55 to 150 _C
Single Pulse Drain–to–Source Avalanche Energy – Starting TJ = 25°C EAS 1500 mJ
(VDD = 38 Vdc, VGS = 10 Vdc, L = 1 mH, IL(pk) = 55 A, VDS = 40 Vdc)
Thermal Resistance
– Junction–to–Case RθJC 1.0 _C/W
– Junction–to–Ambient RθJA 62.5
– Junction–to–Ambient (Note 1.) RθJA 50
Maximum Lead Temperature for Soldering Purposes, 1/8″ from case for 10 seconds TL 260 _C
1. When surface mounted to an FR4 board using the minimum recommended pad size.

http://onsemi.com
226
NTP75N03L09, NTB75N03L09

ELECTRICAL CHARACTERISTICS (TA = 25°C unless otherwise noted)


Characteristic Symbol Min Typ. Max Unit

OFF CHARACTERISTICS
Drain–Source Breakdown Voltage (Note 2.) V(BR)DSS
(VGS = 0 Vdc, ID = 250 µAdc) 30 34 – Vdc
Temperature Coefficient (Negative) –57 – mV°C
Zero Gate Voltage Drain Current IDSS µAdc
(VDS = 30 Vdc, VGS = 0 Vdc) – – 1.0
(VDS = 30 Vdc, VGS = 0 Vdc, TJ = 150°C) – – 10
Gate–Body Leakage Current (VGS = ±20 Vdc, VDS = 0 Vdc) IGSS – – ±100 nAdc
ON CHARACTERISTICS (Note 2.)
Gate Threshold Voltage (Note 2.) VGS(th)
(VDS = VGS, ID = 250 µAdc) 1.0 1.6 2.0 Vdc
Threshold Temperature Coefficient (Negative) – –6 – mV°C
Static Drain–to–Source On–Resistance (Note 2.) RDS(on) mΩ
(VGS = 5.0 Vdc, ID = 37.5 Adc) – 7.5 9
Static Drain–to–Source On Resistance (Note 2.) VDS(on) Vdc
(VGS = 10 Vdc, ID = 75 Adc) – 0.52 0.68
(VGS = 10 Vdc, ID = 37.5 Adc, TJ = 125°C) – 0.35 0.50
Forward Transconductance (Notes 2. & 4.) (VDS = 3 Vdc, ID = 20 Adc) gFS – 58 – mΩ

DYNAMIC CHARACTERISTICS (Note 4.)


Input Capacitance Ciss – 4398 5635 pF
(VDS = 25 Vd
Vdc, VGS = 0
0,
Output Capacitance Coss – 1160 1894
f = 1.0 MHz)
Transfer Capacitance Crss – 317 430

SWITCHING CHARACTERISTICS (Notes 3. & 4.)


Turn–On Delay Time td(on) – 31 48 ns
(VGS = 55.0
0 Vd
Vdc,
Rise Time tr – 510 986
VDD = 20 Vdc, ID = 75 Adc,
Turn–Off Delay Time RG = 4.7 Ω) (Note 2.) td(off) – 99 120
Fall Time tf – 203 300
Gate Charge (VGS = 5.0 Vdc, QT – 52 122 nC
ID = 75 Adc,
Ad
Q1 – 6.6 28
VDS = 24 Vdc) (Note 2.)
Q2 – 28 66

SOURCE–DRAIN DIODE CHARACTERISTICS


Forward On–Voltage (IS = 75 Adc, VGS = 0 Vdc) VSD – 1.19 1.25 Vdc
(IS = 75 Adc, VGS = 0 Vdc, TJ = 125°C) – 1.09 –
(Note 2.)
Reverse Recovery Time trr – 37 – ns
(N t 4
(Note 4.)) (IS = 75 Ad
Adc, VGS = 0 Vd
Vdc
ta – 20 –
dlS/dt = 100 A/µs) (Note 2.)
Reverse Recovery Stored tb – 17 – µC
Ch
Charge (Note
(N t 4.)
4)
QRR – 0.023 –
2. Pulse Test: Pulse Width v 300 µS, Duty Cycle v 2%.
3. Switching characteristics are independent of operating junction temperatures.
4. From characterization test data.

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NTP75N03L09, NTB75N03L09

150
120 VGS = 4 V
VGS = 3.5 V 135 VDS ≥ 10 V
VGS = 4.5 V
ID, DRAIN CURRENT (AMPS)

ID, DRAIN CURRENT (AMPS)


120
90
VGS = 5 V
105
VGS = 6 V
VGS = 8 V 90
60
VGS = 10 V 75
VGS = 3 V
60
30
45 TJ = 25°C
TJ = 25°C
VGS = 2.5 V 30
0 TJ = 100°C
15 TJ = –55°C
0
0 0.2 0.4 0.6 0.8 1 1.2 1.4 1.6 1.8 2 2.2 2.4 2.6 0.5 1 1.5 2 2.5 3 3.5 4
VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS) VGS, GATE–TO–SOURCE VOLTAGE (VOLTS)

Figure 1. On–Region Characteristics Figure 2. Transfer Characteristics


RDS(on), DRAIN–TO SOURCE RESISTANCE (Ω)

RDS(on), DRAIN–TO SOURCE RESISTANCE (Ω)


0.0085 0.009
VGS = 5 V TJ = 25°C
0.008
TJ = 100°C
0.0075 0.008

0.007
TJ = 25°C 0.007
0.0065 VGS = 5 V
0.006
0.006
0.0055 VGS = 10 V
TJ = –55°C
0.005 0.005
0.0045
0.004 0.004
10 20 30 40 50 60 70 80 90 100 120 0 20 40 60 80 100 120
ID, DRAIN CURRENT (AMPS) ID, DRAIN CURRENT (AMPS)

Figure 3. On–Resistance vs. Drain Current and Figure 4. On–Resistance vs. Drain Current and
Temperature Gate Voltage
RDS(on), DRAIN–TO SOURCE RESISTANCE (NORMALIZED)

1.6 1000
VGS = 10 V VGS = 0 V
ID = 37.5 A
1.4
TJ = 125°C
IDSS, LEAKAGE (nA)

100
1.2
TJ = 100°C
1
10

0.8

0.6 1
–50 –25 0 25 50 75 100 125 150 5 10 15 20 25 30
TJ, JUNCTION TEMPERATURE (°C) VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS)

Figure 5. On–Resistance Variation Temperature Figure 6. Drain–to–Source Leakage Current vs.


Voltage

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NTP75N03L09, NTB75N03L09

VGS, GATE–TO–SOURCE VOLTAGE (VOLTS)


1200 12 30
VGS VDS
VDS = 0 V
QT
1000 VGS = 0 V 10 25
TJ = 25°C
C, CAPACITANCE (pF)

800 8 20
VGS
600 6 15
Ciss Q1
Q2
400 4 10
Coss
200 2 ID = 75 A 5
Crss TJ = 25°C
0 0 0
10 8 6 4 2 0 2 4 6 8 10 12 14 16 18 20 22 25 0 4 8 12 16 20 24 28 32 36 40 44 48 52
GATE–TO–SOURCE OR DRAIN–TO–SOURCE Qg, TOTAL GATE CHARGE (nC)
VOLTAGE (VOLTS)
Figure 7. Capacitance Variation Figure 8. Gate–to–Source Voltage vs. Total Charge

1000 75
70 VGS = 0 V
tr IS, SOURCE CURRENT (AMPS) 65 TJ = 25°C
60
55
50
t, TIME (ns)

tf 45
40
100
35
td(off) 30
25
20
td(on) 15
TJ = 25°C VDD = 15 V 10
ID = 75 A VGS = 5 V 5
10 0
1 2.2 4.7 6.2 9.1 10 20 0.0 0.2 0.4 0.6 0.8 1.0
RG, GATE RESISTANCE (Ω) VSD, SOURCE–TO–DRAIN VOLTAGE (VOLTS)

Figure 9. Resistive Switching Time Variation Figure 10. Diode Forward Voltage vs. Current
vs. Gate Resistance
EAS, SINGLE PULSE DRAIN–TO–SOURCE

1600

1400 ID = 75 A
AVALANCHE ENERGY (mJ)

1200

1000

800

600

400

200

0
25 50 75 100 125 150
TJ, STARTING JUNCTION TEMPERATURE (°C)

Figure 11. Maximum Avalanche Energy vs.


Starting Junction Temperature

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N–Channel TSSOP–8
Features http://onsemi.com
• New Low Profile TSSOP–8 Package
• Ultra Low RDS(on)
• Higher Efficiency Extending Battery Life
5.8 AMPERES
• Logic Level Gate Drive 20 VOLTS
• Diode Exhibits High Speed, Soft Recovery RDS(on) = 30 mΩ
• Avalanche Energy Specified
• IDSS and VDS(on) Specified at Elevated Temperatures N–Channel N–Channel
Applications D D
• Power Management in Portable and Battery–Powered Products, i.e.:
Computers, Printers, PCMCIA Cards, Cellular and Cordless
Telephones
• Lithium Ion Battery Applications
• Note Book PC
G1 G2

MAXIMUM RATINGS (TC = 25°C unless otherwise noted)


S1 S2
Rating Symbol Value Unit
Drain–to–Source Voltage VDSS 20 Vdc
Gate–to–Source Voltage – Continuous VGS "12 Vdc
Drain Current – Continuous ID 5.8 Adc TSSOP–8
Drain Current – Continuous @ 70°C ID TBD 8 CASE 948S
Drain Current – Single Pulse (tp ≤ 10 ms) IDM 20 PLASTIC
Total Power Dissipation PD 1.6 W 1
Operating and Storage TJ, Tstg –55 to °C
Temperature Range +150 MARKING DIAGRAM
Single Pulse Drain–to–Source Avalanche EAS 580 mJ & PIN ASSIGNMENT
Energy – Starting TJ = 25°C
(VDD = 20 Vdc, VGS = 5 Vdc, S1 1 8 D
IL = 10 Apk, L = 10 mH, RG = 25 Ω) DEVICE D
G1 2 7
Thermal Resistance – RqJA °C/W S2 3
MARKING
6 D
Junction–to–Ambient (Note 1.) TBD
G2 4 5 D
Single Channel Steady State 180
Both Channels 176
Top View
Junction–to–Ambient (Note 2.)
Both Channels 100
Thermal Resistance – Junction–to–Lead RqJL °C/W
Single Channel 27
ORDERING INFORMATION
Both Channels Steady State 24
1. Surface Mounted to Min Pad. Device Package Shipping
2. Surface Mounted to 1″ x 1″ FR4 Board.
NTQD6866 TSSOP–8 100 Units/Rail

NTQD6866R2 TSSOP–8 3000/Tape & Reel

This document contains information on a product under development. ON Semiconductor


reserves the right to change or discontinue this product without notice.

 Semiconductor Components Industries, LLC, 2001 230 Publication Order Number:


January, 2001 – Rev. 1 NTQD6866/D
NTQD6866

ELECTRICAL CHARACTERISTICS (TC = 25°C unless otherwise noted)


Characteristic Symbol Min Typ Max Unit
OFF CHARACTERISTICS
Drain–to–Source Breakdown Voltage V(BR)DSS Vdc
(VGS = 0 Vdc, ID = 0.25 mAdc) 20 – –
Temperature Coefficient (Positive) – TBD – mV/°C
Zero Gate Voltage Collector Current IDSS µAdc
(VDS = 20 Vdc, VGS = 0 Vdc) – – 1.0
(VDS = 20 Vdc, VGS = 0 Vdc, TJ = 85°C) – – 25
Gate–Body Leakage Current IGSS(f) – – 100 nAdc
(VGS = ±12 Vdc, VDS = 0 Vdc) IGSS(r) – – 100

ON CHARACTERISTICS (Note 3.)


Gate Threshold Voltage VGS(th) Vdc
(VDS = VGS, ID = 0.25 mA) 0.6 0.9 1.2
Temperature Coefficient (Negative) – TBD – mV/°C
Static Drain–to–Source On–State Resistance RDS(on) Ω
(VGS = 4.5 Vdc, ID = 7.0 Adc) – TBD TBD
(VGS = 4.0 Vdc, ID = 7.0 Adc) – 0.026 0.030
(VGS = 2.5 Vdc, ID = 3.5 Adc) – 0.031 0.040
Forward Transconductance (VDS = 10 Vdc, ID = 7.0 Adc) gFS TBD 17 – Mhos
DYNAMIC CHARACTERISTICS
Input Capacitance Ciss – 930 TBD pF
Output Capacitance (VDS = 10 Vd
Vdc, VGS = 0 Vd
Vdc,
Coss – 370 TBD
f = 1.0 MHz)
Transfer Capacitance Crss – 105 TBD
SWITCHING CHARACTERISTICS (Note 4.)
Turn–On Delay Time td(on) – 8.6 TBD ns
Rise Time (VDD = 10 Vdc, ID = 1.0 Adc, tr – 14 TBD
VGS = 44.5
5 Vdc
Vdc,
Turn–Off Delay Time RL = 10, RG = 6.0 Ω) td(off) – 57 TBD
Fall Time tf – 54 TBD
Gate Charge QT – 11 15 nC
(VDS = 10 Vdc,
VGS = 4.5 Vdc, Q1 – 2.4 –
ID = 5.8
5 8 Ad
Adc))
Q2 – 2.4 –
SOURCE–DRAIN DIODE CHARACTERISTICS
Forward On–Voltage (Note 3.) (IS = 1.8 Adc, VGS = 0 Vdc) VSD – 0.7 1.0 Vdc
(IS = 1.8 Adc, VGS = 0 Vdc, TJ = 85°C) – TBD –
Reverse Recovery Time trr – 30 – ns
(IS = 1.5
1 5 Adc,
Ad VGS = 0 Vdc,
Vd
ta – 14.5 –
dIS/dt = 100 A/µs)
tb – 15.5 –
Reverse Recovery Stored Charge QRR – 0.01 – µC
3. Pulse Test: Pulse Width = 300 µs, Duty Cycle = 2%.
4. Switching characteristics are independent of operating junction temperature.

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P–Channel TSSOP–8
Features http://onsemi.com
• New Low Profile TSSOP–8 Package
• Ultra Low RDS(on) 6.2 AMPERES
• Higher Efficiency Extending Battery Life
• Logic Level Gate Drive 20 VOLTS
• Diode Exhibits High Speed, Soft Recovery RDS(on) = 20 mΩ
• Avalanche Energy Specified
• IDSS and VDS(on) Specified at Elevated Temperatures P–Channel
Applications
• Power Management in Portable and Battery–Powered Products, i.e.: D
Computers, Printers, PCMCIA Cards, Cellular and Cordless
Telephones
• Lithium Ion Battery Applications
• Note Book PC G

MAXIMUM RATINGS (TC = 25°C unless otherwise noted) S

Rating Symbol 10 Steady Unit


MARKING
secs State
DIAGRAM
Drain–to–Source Voltage VDS –20 Vdc
Gate–to–Source Voltage VGS "12 8 TSSOP–8 463
Continuous Drain Current ID Adc CASE 948S YWW
– TJ = 150°C (Note 1.) PLASTIC X
– TA = 25°C "7.4 "6.2 1
– TA = 70°C "5.9 "4.9
Pulsed Drain Current (10 µs IDM "30 Apk 463 = Device Code
Pulse Width) Y = Year
Continuous Source Current IS –1.35 –0.95 Adc WW = Work Week
(Diode Conduction) (Note 1.) X = MOSFET
Maximum Power Dissipation PD W
(Note 1.) PIN ASSIGNMENT
– TA = 25°C 1.5 1.05
– TA = 70°C 1.0 0.67 D 1 8 D
Operating Junction and Storage TJ, Tstg –55 to +150 °C S 2 7 S
Temperature Range S 3 6 S
Single Pulse Drain–to–Source EAS 1.38 J G 4 5 D
Avalanche Energy – Starting
TJ= 25°C Top View
(VDD = 50 V, IL = 16.3 Apk,
L = 10 mH)
ORDERING INFORMATION
1. Surface mounted to 1″ x 1″ FR–4 board.
Device Package Shipping

NTQS6463 TSSOP–8 100 Units/Rail

NTQS6463R2 TSSOP–8 3000/Tape & Reel

This document contains information on a product under development. ON Semiconductor


reserves the right to change or discontinue this product without notice.

 Semiconductor Components Industries, LLC, 2001 232 Publication Order Number:


January, 2001 – Rev. 0 NTQS6463/D
NTQS6463

THERMAL RESISTANCE RATINGS


Rating Symbol Typical Max Unit
Maximum Junction–to–Ambient (Note 2.) RθJA °C/W
t ≤ 10 sec 65 83
Steady State 100 120
Maximum Junction–to–Foot RθJF °C/W
Steady State 43 52

ELECTRICAL CHARACTERISTICS (TJ = 25°C unless otherwise noted)


Characteristic Symbol Min Typ Max Unit
STATIC
Gate Threshold Voltage VGS(th) Vdc
(VDS = VGS, ID = –250 µA) –0.45 –0.9 –

Gate–Body Leakage (VGS = 0 Vdc, VGS = ±8 Vdc) IGSS – – ±100 nAdc


Zero Gate Threshold Voltage Drain Current IDSS
(VDS = –16 Vdc, VGS = 0 Vdc) – – –1.0 µΑdc
(VDS = –16 Vdc, VGS = 0 Vdc, TJ = 70_C) – – –10
On–State Drain Current (Note 3.) ID(on) Adc
(VDS = –5.0 Vdc, VGS = –4.5 Vdc) 20 – –

Drain–Source On–State Resistance (Note 3.) RDS(on) Ω


(VGS = –4.5 Vdc, ID = –7.4 Adc) – 0.018 0.020
(VGS = –2.5 Vdc, ID = –6.3 Adc) – 0.025 0.027
Forward Transconductance (VDS = –15 Vdc, ID = –7.4 Adc) (Note 3.) gFS – 21 – S
Diode Forward Voltage (IS = –1.3 Adc, VGS = 0 Vdc) (Note 3.) VSD – –0.71 –1.1 Vdc
DYNAMIC (Note 4.)
Total Gate Charge Qg – 28 50 nC
(VDS = –10 Vdc,
Gate–Source Charge VGS = –5.0 Vdc, Qgs – 4.0 –
ID = –7.4
7 4 Ad
Adc))
Gate–Drain Charge Qgd – 9.0 –
Turn–On Delay Time td(on) – 19 50 ns
(VDD = –10 Vdc RL = 15 Ω,
10 Vdc, Ω
Rise Time ID ≅ –1.0
1.0 Adc, tr – 20 50
Turn–Off Delay Time VGEN = –4.5 Vdc, td(off) – 95 120
RG = 6 0 Ω)
6.0
Fall Time tf – 65 100
Source–Drain Reverse (IF = –1.3 Adc, trr – 45 80 ns
Recovery Time di/dt = 100 A/µs)
2. Surface mounted to 1″ x 1″ FR–4 board.
3. Pulse Test: Pulse Width ≤ 300 µs, Duty Cycle ≤ 2%.
4. Guaranteed by design, not subject to production testing.

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P–Channel Enhancement Mode
Dual Micro8 Package http://onsemi.com
Features
• Ultra Low RDS(on)
–1.45 AMPERES
• Higher Efficiency Extending Battery Life
• Logic Level Gate Drive –20 VOLTS
• Miniature Dual Micro8 Surface Mount Package 160 mW @ VGS = –4.5
• Diode Exhibits High Speed, Soft Recovery
• Micro8 Mounting Information Provided
Applications Dual P–Channel
• Power Management in Portable and Battery–Powered Products, i.e.: D
Computers, Printers, PCMCIA Cards, Cellular and Cordless
Telephones

MAXIMUM RATINGS (TJ = 25°C unless otherwise noted) G


Rating Symbol Value Unit
Drain–to–Source Voltage VDSS –20 V S
Gate–to–Source Voltage – Continuous VGS "8.0 V
Thermal Resistance –
Junction–to–Ambient (Note 1.) RθJA 250 °C/W
8
Total Power Dissipation @ TA = 25°C PD 0.50 W
Continuous Drain Current @ TA = 25°C ID –1.45 A
Continuous Drain Current @ TA = 70°C ID –1.15 A 1
Pulsed Drain Current (Note 3.) IDM –10 A Micro8
Thermal Resistance – CASE 846A
Junction–to–Ambient (Note 2.) RθJA 125 °C/W STYLE 2
Total Power Dissipation @ TA = 25°C PD 1.0 W
Continuous Drain Current @ TA = 25°C ID –2.04 A
Continuous Drain Current @ TA = 70°C ID –1.64 A MARKING DIAGRAM
Pulsed Drain Current (Note 3.) IDM –16 A & PIN ASSIGNMENT
Operating and Storage TJ, Tstg –55 to °C
Temperature Range +150 1 Drain 1
Source 1 8
Single Pulse Drain–to–Source Avalanche EAS 35 mJ Gate 1 2 YWW 7 Drain 1
Energy – Starting TJ = 25°C Source 2 3 6 Drain 2
BC
(VDD = –20 Vdc, VGS = –4.5 Vdc, Gate 2 4 5 Drain 2
Peak IL = –3.5 Apk, L = 5.6 mH,
RG = 25 Ω) (Top View)
Maximum Lead Temperature for Soldering TL 260 °C Y = Year
Purposes for 10 seconds WW = Work Week
1. Minimum FR–4 or G–10 PCB, Steady State. BC = Device Code
2. Mounted onto a 2″ square FR–4 Board (1″ sq. 2 oz Cu 0.06″ thick single
sided), Steady State.
3. Pulse Test: Pulse Width = 300 ms, Duty Cycle = 2%.
ORDERING INFORMATION
This document contains information on a product under development. ON Semiconductor
Device Package Shipping
reserves the right to change or discontinue this product without notice.

NTTD1P02R2 Micro8 4000/Tape & Reel

 Semiconductor Components Industries, LLC, 2000 234 Publication Order Number:


November, 2000 – Rev. 0 NTTD1P02R2/D
NTTD1P02R2

ELECTRICAL CHARACTERISTICS (TC = 25°C unless otherwise noted) (Note 4.)


Characteristic Symbol Min Typ Max Unit
OFF CHARACTERISTICS
Drain–to–Source Breakdown Voltage V(BR)DSS Vdc
(VGS = 0 Vdc, ID = –250 µAdc) –20 – –
Temperature Coefficient (Positive) – –12 – mV/°C
Zero Gate Voltage Drain Current IDSS µAdc
(VGS = 0 Vdc, VDS = –20 Vdc, TJ = 25°C) – – –1.0
(VGS = 0 Vdc, VDS = –20 Vdc, TJ = 125°C) – – –10
Gate–Body Leakage Current IGSS nAdc
(VGS = –8 Vdc, VDS = 0 Vdc) – – –100
Gate–Body Leakage Current IGSS nAdc
(VGS = +8 Vdc, VDS = 0 Vdc) – – 100
ON CHARACTERISTICS
Gate Threshold Voltage VGS(th) Vdc
(VDS = VGS, ID = –250 µAdc) –0.7 –0.95 –1.4
Temperature Coefficient (Negative) – 2.3 –
Static Drain–to–Source On–State Resistance RDS(on) Ω
(VGS = –4.5 Vdc, ID = –1.45 Adc) – 0.130 0.160
(VGS = –2.7 Vdc, ID = –0.7 Adc) – 0.175 0.250
(VGS = –2.5 Vdc, ID = –0.7 Adc) – 0.190 –
Forward Transconductance (VDS = –10 Vdc, ID = –0.7 Adc) gFS – 2.5 – Mhos
DYNAMIC CHARACTERISTICS
Input Capacitance Ciss – 265 – pF
Output Capacitance (VDS = –16
16 Vdc,
Vd VGS = 0 Vdc,
Vd
Coss – 100 –
f = 1.0 MHz)
Reverse Transfer Capacitance Crss – 60 –
SWITCHING CHARACTERISTICS (Notes 5. & 6.)
Turn–On Delay Time td(on) – 10 – ns
Rise Time (VDD = –16
16 Vdc, ID = –1.45
1.45 Adc, tr – 25 –
Turn–Off Delay Time VGS = –4.5 Vdc, RG = 6.0 Ω) td(off) – 30 –
Fall Time tf – 25 –
Turn–On Delay Time td(on) – 10 – ns
Rise Time (VDD = –16
16 Vdc, ID = –0.7
0.7 Adc, tr – 20 –
Turn–Off Delay Time VGS = –4.5 Vdc, RG = 6.0 Ω) td(off) – 30 –
Fall Time tf – 20 –
Total Gate Charge Qtot – 5.0 10 nC
(VDS = –16 Vdc,
Gate–Source Charge VGS = –4.5 Vdc, Qgs – 1.5 –
ID = –1.45
1 45 Adc)
Ad )
Gate–Drain Charge Qgd – 2.0 –
BODY–DRAIN DIODE RATINGS (Note 5.)
Diode Forward On–Voltage (IS = –1.45 Adc, VGS = 0 Vdc) VSD – –0.91 –1.1 Vdc
(IS = –1.45 Adc, VGS = 0 Vdc, – –0.72 –
TJ = 125°C)
Reverse Recovery Time trr – 25 – ns
(IS = –1.45
1 45 Adc,
Ad VGS = 0 Vdc,
Vd
ta – 13 –
dIS/dt = 100 A/µs)
tb – 12 –
Reverse Recovery Stored Charge QRR – 0.015 – µC
4. Handling precautions to protect against electrostatic discharge is mandatory.
5. Indicates Pulse Test: Pulse Width = 300 µs max, Duty Cycle = 2%.
6. Switching characteristics are independent of operating junction temperature.

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NTTD1P02R2

3 –2.7 V 3
–2.5 V
–2.9 V –2.3 V VDS ≥ –10 V
–ID, DRAIN CURRENT (AMPS)

–ID, DRAIN CURRENT (AMPS)


–3.1 V
TJ = 25°C
–3.3 V
–3.7 V
–4.5 V –2.1 V
2 2

–8 V

–1.9 V TJ = –55°C
1 1
TJ = 100°C TJ = 25°C
–1.7 V
VGS = –1.5 V
0 0
0 0.25 0.5 0.75 1 1.25 1.5 1.75 0 0.5 1 1.5 2 2.5 3 3.5
–VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS) –VGS, GATE–TO–SOURCE VOLTAGE (VOLTS)

Figure 1. On–Region Characteristics Figure 2. Transfer Characteristics


RDS(on), DRAIN–TO–SOURCE RESISTANCE (W)

RDS(on), DRAIN–TO–SOURCE RESISTANCE (W)


0.4 0.3
TJ = 25°C

ID = –1.45 A
0.3 VGS = –2.5 V
TJ = 25°C
0.2

VGS = –2.7 V
0.2

VGS = –4.5 V
0.1
0.1

0 0
0 2 4 6 8 10 12 0 0.5 1 1.5 2 2.5 3 3.5
–VGS, GATE–TO–SOURCE VOLTAGE (VOLTS) –ID, DRAIN CURRENT (AMPS)

Figure 3. On–Resistance versus Figure 4. On–Resistance versus Drain Current


Gate–to–Source Voltage and Gate Voltage

1.6 100
VGS = 0 V
ID = –1.45 A
RDS(on), DRAIN–TO–SOURCE
RESISTANCE (NORMALIZED)

1.4 VGS = –4.5 V


–IDSS, LEAKAGE (nA)

TJ = 125°C

1.2
10 TJ = 100°C
1

0.8

0.6 1
–50 –25 0 25 50 75 100 125 150 4 8 12 16 20
TJ, JUNCTION TEMPERATURE (°C) –VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS)

Figure 5. On–Resistance Variation with Figure 6. Drain–to–Source Leakage Current


Temperature versus Voltage

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NTTD1P02R2

–VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS)


–VGS, GATE–TO–SOURCE VOLTAGE (VOLTS)
800 5 20
VDS = 0 V VGS = 0 V QT
Ciss 18
TJ = 25°C 4 16
C, CAPACITANCE (pF)

600
Crss 14
–VGS
3 12
400 Q1 Q2 10
2 8
Ciss
6
200 ID = –1.45 A
1 –VDS TJ = 25°C 4
Coss
2
Crss 0
0 0
10 5 0 5 10 15 20 0 1 2 3 4 5 6
–VGS –VDS Qg, TOTAL GATE CHARGE (nC)

GATE–TO–SOURCE OR DRAIN–TO–SOURCE
Figure 8. Gate–to–Source and
VOLTAGE (VOLTS)
Drain–to–Source Voltage versus Total Charge
Figure 7. Capacitance Variation

100
VDD = –16 V VGS = 0 V
ID = –1.45 A –IS, SOURCE CURRENT (AMPS) 1.6
TJ = 25°C
VGS = –4.5 V

1.2
t, TIME (ns)

tr
td (off)
10 tf
0.8
td (on)

0.4

1 0
1 10 100 0.4 0.5 0.6 0.7 0.8 0.9 1
RG, GATE RESISTANCE (OHMS) –VSD, SOURCE–TO–DRAIN VOLTAGE (VOLTS)

Figure 9. Resistive Switching Time Variation Figure 10. Diode Forward Voltage
versus Gate Resistance versus Current

100
VGS = 8 V
SINGLE PULSE
ID , DRAIN CURRENT (AMPS)

TC = 25°C di/dt
10 IS
100 ms
trr
1 ms ta tb
1
10 ms TIME

tp 0.25 IS
0.1
RDS(on) LIMIT IS
THERMAL LIMIT dc
PACKAGE LIMIT
0.01
0.1 1 10 100 Figure 12. Diode Reverse Recovery Waveform
VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS)

Figure 11. Maximum Rated Forward Biased


Safe Operating Area

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NTTD1P02R2

TYPICAL ELECTRICAL CHARACTERISTICS

1000
Rthja(t), EFFECTIVE TRANSIENT
THERMAL RESISTANCE (°C/W)

D = 0.5
100
0.2
0.1
0.05
10 *0
0.02
θ,' " ('
θ,
0.01  
 - .
/

 
/
1 '
     '
'# ,*0   " *0
θ,'
SINGLE PULSE
- -  " '&'#
0.1
1.0E–05 1.0E–04 1.0E–03 1.0E–02 1.0E–01 1.0E+00 1.0E+01 1.0E+02 1.0E+03
t, TIME (s)

Figure 13. Thermal Response

INFORMATION FOR USING THE Micro8 SURFACE MOUNT PACKAGE

MINIMUM RECOMMENDED FOOTPRINT FOR SURFACE MOUNTED APPLICATIONS


Surface mount board layout is a critical portion of the total interface between the board and the package. With the
design. The footprint for the semiconductor packages must correct pad geometry, the packages will self–align when
be the correct size to ensure proper solder connection subjected to a solder reflow process.

0.041
1.04

0.208 0.126
5.28 3.20

0.015 0.0256
0.38 0.65
inches
mm

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238
NTTD1P02R2

SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • The soldering temperature and time shall not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within • When shifting from preheating to soldering, the
a short time could result in device failure. Therefore, the maximum temperature gradient shall be 5°C or less.
following items should always be observed in order to • After soldering has been completed, the device should
minimize the thermal stress to which the devices are be allowed to cool naturally for at least three minutes.
subjected. Gradual cooling should be used as the use of forced
• Always preheat the device. cooling will increase the temperature gradient and
• The delta temperature between the preheat and result in latent failure due to mechanical stress.
soldering should be 100°C or less.* • Mechanical stress or shock should not be applied
• When preheating and soldering, the temperature of the during cooling.
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When * Soldering a device without preheating can cause
using infrared heating with the reflow soldering excessive thermal shock and stress which can result in
method, the difference shall be a maximum of 10°C. damage to the device.

TYPICAL SOLDER HEATING PROFILE


For any given circuit board, there will be a group of temperature versus time. The line on the graph shows the
control settings that will give the desired heat pattern. The actual temperature that might be experienced on the surface
operator must set temperatures for several heating zones of a test board at or near a central solder joint. The two
and a figure for belt speed. Taken together, these control profiles are based on a high density and a low density
settings make up a heating “profile” for that particular board. The Vitronics SMD310 convection/infrared reflow
circuit board. On machines controlled by a computer, the soldering system was used to generate this profile. The type
computer remembers these profiles from one operating of solder used was 62/36/2 Tin Lead Silver with a melting
session to the next. Figure 14 shows a typical heating point between 177–189°C. When this type of furnace is
profile for use when soldering a surface mount device to a used for solder reflow work, the circuit boards and solder
printed circuit board. This profile will vary among joints tend to heat first. The components on the board are
soldering systems, but it is a good starting point. Factors then heated by conduction. The circuit board, because it has
that can affect the profile include the type of soldering a large surface area, absorbs the thermal energy more
system in use, density and types of components on the efficiently, then distributes this energy to the components.
board, type of solder used, and the type of board or Because of this effect, the main body of a component may
substrate material being used. This profile shows be up to 30 degrees cooler than the adjacent solder joints.

STEP 1 STEP 2 STEP 3 STEP 4 STEP 5 STEP 6 STEP 7


PREHEAT VENT HEATING HEATING HEATING VENT COOLING
ZONE 1 “SOAK” ZONES 2 & 5 ZONES 3 & 6 ZONES 4 & 7
“RAMP” “RAMP” “SOAK” “SPIKE” 205° TO 219°C
PEAK AT
200°C DESIRED CURVE FOR HIGH 170°C SOLDER
MASS ASSEMBLIES JOINT
160°C
150°C

150°C
SOLDER IS LIQUID FOR
40 TO 80 SECONDS
100°C 140°C (DEPENDING ON
MASS OF ASSEMBLY)
100°C

DESIRED CURVE FOR LOW


MASS ASSEMBLIES
5°C

TIME (3 TO 7 MINUTES TOTAL) TMAX


Figure 14. Typical Solder Heating Profile

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239
NTTD1P02R2

TAPE & REEL INFORMATION


Micro8
Dimensions are shown in millimeters (inches)

2.05 (.080) 1.60 (.063)


1.95 (.077) 1.50 (.059)

PIN 4.10 (.161) B B A 1.85 (.072) 0.35 (.013)


NUMBER 1 3.90 (.154) 1.65 (.065) 0.25 (.010)

12.30 5.55 (.218)


11.70 5.45 (.215)
(.484) 3.50 (.137)
(.461) 3.30 (.130)

A 1.60 (.063) 1.50 (.059)


1.50 (.059) 1.30 (.052)
FEED DIRECTION TYP.
8.10 (.318)
7.90 (.312) SECTION A–A
5.40 (.212)
5.20 (.205)

SECTION B–B
NOTES:
1. CONFORMS TO EIA–481–1.
2. CONTROLLING DIMENSION: MILLIMETER.

18.4 (.724)
MAX.
NOTE 3

13.2 (.52)
12.8 (.50)
330.0 50.0
(13.20) (1.97)
MAX. MIN.

14.4 (.57)
12.4 (.49)
NOTE 4
NOTES:
1. CONFORMS TO EIA–481–1.
2. CONTROLLING DIMENSION: MILLIMETER.
3. INCLUDES FLANGE DISTORTION AT OUTER EDGE.
4. DIMENSION MEASURED AT INNER HUB.

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 # 

#$%& '(
 -     
Dual P–Channel Micro8
Features
• Ultra Low RDS(on)
• Higher Efficiency Extending Battery Life http://onsemi.com
• Logic Level Gate Drive
• Miniature Micro–8 Surface Mount Package –2.4 AMPERES
• Diode Exhibits High Speed, Soft Recovery
• Micro8 Mounting Information Provided –20 VOLTS
Applications RDS(on) = 90 m
• Power Management in Portable and Battery–Powered Products, i.e.:
Cellular and Cordless Telephones and PCMCIA Cards
P–Channel

MAXIMUM RATINGS (TJ = 25°C unless otherwise noted) 

Rating Symbol Value Unit


Drain–to–Source Voltage VDSS –20 V
Gate–to–Source Voltage – Continuous VGS "8.0 V 
Thermal Resistance –
Junction–to–Ambient (Note 1.) RθJA 160 °C/W
Total Power Dissipation @ TA = 25°C PD 0.78 W 
Continuous Drain Current @ TA = 25°C ID –2.4 A
Continuous Drain Current @ TA = 70°C ID –1.92 A
MARKING
Pulsed Drain Current (Note 3.) IDM –20 A
DIAGRAM
Thermal Resistance – 8
Junction–to–Ambient (Note 2.) RθJA 88 °C/W
Total Power Dissipation @ TA = 25°C PD 1.42 W
Continuous Drain Current @ TA = 25°C ID –3.25 A 1
Continuous Drain Current @ TA = 70°C ID –2.6 A YWW
Micro8
Pulsed Drain Current (Note 3.) IDM –30 A BE
CASE 846A
Operating and Storage TJ, Tstg –55 to °C STYLE 2
Temperature Range +150
Single Pulse Drain–to–Source Avalanche EAS 350 mJ
Energy – Starting TJ = 25°C Y = Year
(VDD = –20 Vdc, VGS = –4.5 Vdc, WW = Work Week
Peak IL = –5.0 Apk, L = 28 mH, BE = Device Code
RG = 25 Ω)
Maximum Lead Temperature for Soldering TL 260 °C
PIN ASSIGNMENT
Purposes for 10 seconds
1. Minimum FR–4 or G–10 PCB, Steady State. Source 1 1 8 Drain 1
2. Mounted onto a 2″ square FR–4 Board (1″ sq. 2 oz Cu 0.06″ thick single Gate 1 2 7 Drain 1
sided), Steady State. Source 2 Drain 2
3 6
3. Pulse Test: Pulse Width  300 ms, Duty Cycle  2%. Gate 2 Drain 2
4 5

Top View

ORDERING INFORMATION

Device Package Shipping

NTTD2P02R2 Micro8 4000/Tape & Reel

 Semiconductor Components Industries, LLC, 2000 241 Publication Order Number:


December, 2000 – Rev. 0 NTTD2P02R2/D
NTTD2P02R2

ELECTRICAL CHARACTERISTICS (TC = 25°C unless otherwise noted) (Note 4.)


Characteristic Symbol Min Typ Max Unit
OFF CHARACTERISTICS
Drain–to–Source Breakdown Voltage V(BR)DSS Vdc
(VGS = 0 Vdc, ID = –250 µAdc) –20 – –
Temperature Coefficient (Positive) – –12.7 – mV/°C
Zero Gate Voltage Drain Current IDSS µAdc
(VGS = 0 Vdc, VDS = –16 Vdc, TJ = 25°C) – – –1.0
(VGS = 0 Vdc, VDS = –16 Vdc, TJ = 125°C) – – –25
Zero Gate Voltage Drain Current IDSS µAdc
(VGS = 0 Vdc, VDS = –20 Vdc, TJ = 25°C) – – –5.0
Gate–Body Leakage Current IGSS nAdc
(VGS = –8 Vdc, VDS = 0 Vdc) – – –100
Gate–Body Leakage Current IGSS nAdc
(VGS = +8 Vdc, VDS = 0 Vdc) – – 100
ON CHARACTERISTICS
Gate Threshold Voltage VGS(th) Vdc
(VDS = VGS, ID = –250 µAdc) –0.5 –0.90 –1.4
Temperature Coefficient (Negative) – 2.5 – mV/°C
Static Drain–to–Source On–State Resistance RDS(on) Ω
(VGS = –4.5 Vdc, ID = –2.4 Adc) – 0.070 0.090
(VGS = –2.7 Vdc, ID = –1.2 Adc) – 0.100 0.130
(VGS = –2.5 Vdc, ID = –1.2 Adc) – 0.110 –
Forward Transconductance (VDS = –10 Vdc, ID = –1.2 Adc) gFS 2.0 4.2 – Mhos
DYNAMIC CHARACTERISTICS
Input Capacitance Ciss – 550 – pF
Output Capacitance (VDS = –16
16 Vdc,
Vd VGS = 0 Vdc,
Vd
Coss – 200 –
f = 1.0 MHz)
Reverse Transfer Capacitance Crss – 100 –
SWITCHING CHARACTERISTICS (Notes 5. & 6.)
Turn–On Delay Time td(on) – 10 – ns
Rise Time (VDD = –10
10 Vdc, ID = –2.4
2.4 Adc, tr – 31 –
Turn–Off Delay Time VGS = –4.5 Vdc, RG = 6.0 Ω) td(off) – 33 –
Fall Time tf – 29 –
Turn–On Delay Time td(on) – 15 – ns
Rise Time (VDD = –10
10 Vdc, ID = –1.2
1.2 Adc, tr – 40 –
Turn–Off Delay Time VGS = –2.7 Vdc, RG = 6.0 Ω) td(off) – 35 –
Fall Time tf – 35 –
Total Gate Charge Qtot – 10 18 nC
(VDS = –16 Vdc,
Gate–Source Charge VGS = –4.5 Vdc, Qgs – 1.5 –
ID = –2.4
2 4 Ad
Adc))
Gate–Drain Charge Qgd – 5.0 –
BODY–DRAIN DIODE RATINGS (Note 5.)
Diode Forward On–Voltage (IS = –2.4 Adc, VGS = 0 Vdc) VSD – –0.88 –1.0 Vdc
(IS = –2.4 Adc, VGS = 0 Vdc, TJ = 125°C) – –0.75 –
Reverse Recovery Time trr – 37 – ns
(IS = –2.4
2 4 Adc,
Ad VGS = 0 Vdc,
Vd
ta – 16 –
dIS/dt = 100 A/µs)
tb – 21 –
Reverse Recovery Stored Charge QRR – 0.025 – µC
4. Handling precautions to protect against electrostatic discharge is mandatory.
5. Indicates Pulse Test: Pulse Width = 300 µs max, Duty Cycle = 2%.
6. Switching characteristics are independent of operating junction temperature.

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NTTD2P02R2

4 5
VGS = –2.1 V TJ = 25°C
VDS > = 10 V
–ID, DRAIN CURRENT (AMPS)

–ID, DRAIN CURRENT (AMPS)


VGS = –10 V
4
3 VGS = –4.5 V
VGS = –1.9 V
VGS = –2.5 V
3
2
VGS = –1.7 V 2 TJ = 25°C

1
VGS = –1.5 V 1
TJ = 100°C
TJ = 55°C
0 0
0 2 4 6 8 10 1 1.5 2 2.5 3
–VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS) –VGS, GATE–TO–SOURCE VOLTAGE (VOLTS)

Figure 1. On–Region Characteristics. Figure 2. Transfer Characteristics.


RDS(on), DRAIN–TO–SOURCE RESISTANCE (W)

RDS(on), DRAIN–TO–SOURCE RESISTANCE (W)


0.2 0.12
TJ = 25°C TJ = 25°C

0.15 0.1
VGS = –2.7 V

0.1 0.08
VGS = –4.5 V

0.05 0.06

0 0.04
2 4 6 8 1 1.5 2 2.5 3 3.5 4 4.5
–VGS, GATE–TO–SOURCE VOLTAGE (VOLTS) –ID, DRAIN CURRENT (AMPS)

Figure 3. On–Resistance vs. Gate–to–Source Figure 4. On–Resistance vs. Drain Current and
Voltage. Gate Voltage.
RDS(on), DRAIN–TO–SOURCE RESISTANCE

1.6 1000
ID = –2.4 A VGS = 0 V
VGS = –4.5 V TJ = 125°C
1.4 100
–IDSS, LEAKAGE (nA)

TJ = 100°C
(NORMALIZED)

1.2 10

TJ = 25°C
1 1

0.8 0.1

0.6 0.01
–50 –25 0 25 50 75 100 125 150 0 4 8 12 16 20
TJ, JUNCTION TEMPERATURE (°C) –VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS)

Figure 5. On–Resistance Variation with Figure 6. Drain–to–Source Leakage Current


Temperature. vs. Voltage.

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243
NTTD2P02R2

–VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS)


–VGS, GATE–TO–SOURCE VOLTAGE (VOLTS)
1500 5 20
VDS = 0 V VGS = 0 V
QT 18
1200 Ciss TJ = 25°C 4 16
C, CAPACITANCE (pF)

14
900 3 VGS 12
Crss
Q1 10
Q2
600 Ciss 2 8
6
300 ID = –2.4 A
Coss 1 VDS 4
TJ = 25°C
Crss 2
0 0 0
10 5 0 5 10 15 20 0 2 4 6 8 10 12 14
–VGS –VDS Qg, TOTAL GATE CHARGE (nC)

GATE–TO–SOURCE OR DRAIN–TO–SOURCE
VOLTAGE (VOLTS) Figure 8. Gate–to–Source and
Drain–to–Source Voltage versus Total Charge
Figure 7. Capacitance Variation

1000 100
VDD = –10 V td (off)
ID = –1.2 A
VGS = –2.7 V tr tf
t, TIME (ns)

t, TIME (ns)

td
100 10 (on)
tr

tf
td (off) VDD = –10 V
ID = –2.4 A
VGS = –4.5 V
td (on)
10 1.0
1.0 10 100 1.0 10 100
RG, GATE RESISTANCE (OHMS) RG, GATE RESISTANCE (OHMS)

Figure 9. Resistive Switching Time Variation Figure 10. Resistive Switching Time Variation
versus Gate Resistance versus Gate Resistance

2
–IS, SOURCE CURRENT (AMPS)

VGS = 0 V
TJ = 25°C di/dt
1.6
IS
trr
1.2
ta tb
TIME
0.8
tp 0.25 IS

0.4 IS

0
0.4 0.5 0.6 0.7 0.8 0.9 1 Figure 12. Diode Reverse Recovery Waveform
–VSD, SOURCE–TO–DRAIN VOLTAGE (VOLTS)

Figure 11. Diode Forward Voltage


versus Current

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244
NTTD2P02R2

Rthja(t), EFFECTIVE TRANSIENT THERMAL RESPONSE

D = 0.5

0.2

Normalized to R∅ja at Steady State (1 inch pad)


0.1 0.1
0.0125 Ω 0.0563 Ω 0.110 Ω 0.273 Ω 0.113 Ω 0.436 Ω

0.05

0.02

0.01 0.021 F 0.137 F 1.15 F 2.93 F 152 F 261 F

Single Pulse

0.01
1E–03 1E–02 1E–01 1E+00 1E+03 1E+02 1E+03
t, TIME (s)

Figure 13. FET Thermal Response.

INFORMATION FOR USING THE Micro–8 SURFACE MOUNT PACKAGE

MINIMUM RECOMMENDED FOOTPRINT FOR SURFACE MOUNTED APPLICATIONS


Surface mount board layout is a critical portion of the total interface between the board and the package. With the
design. The footprint for the semiconductor packages must correct pad geometry, the packages will self–align when
be the correct size to ensure proper solder connection subjected to a solder reflow process.

0.041
1.04

0.208 0.126
5.28 3.20

0.015 0.0256
0.38 0.65
inches
mm

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245
NTTD2P02R2

SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • The soldering temperature and time shall not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within • When shifting from preheating to soldering, the
a short time could result in device failure. Therefore, the maximum temperature gradient shall be 5°C or less.
following items should always be observed in order to • After soldering has been completed, the device should
minimize the thermal stress to which the devices are be allowed to cool naturally for at least three minutes.
subjected. Gradual cooling should be used as the use of forced
• Always preheat the device. cooling will increase the temperature gradient and
• The delta temperature between the preheat and result in latent failure due to mechanical stress.
soldering should be 100°C or less.* • Mechanical stress or shock should not be applied
• When preheating and soldering, the temperature of the during cooling.
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When * Soldering a device without preheating can cause
using infrared heating with the reflow soldering excessive thermal shock and stress which can result in
method, the difference shall be a maximum of 10°C. damage to the device.

TYPICAL SOLDER HEATING PROFILE


For any given circuit board, there will be a group of temperature versus time. The line on the graph shows the
control settings that will give the desired heat pattern. The actual temperature that might be experienced on the surface
operator must set temperatures for several heating zones of a test board at or near a central solder joint. The two
and a figure for belt speed. Taken together, these control profiles are based on a high density and a low density
settings make up a heating “profile” for that particular board. The Vitronics SMD310 convection/infrared reflow
circuit board. On machines controlled by a computer, the soldering system was used to generate this profile. The type
computer remembers these profiles from one operating of solder used was 62/36/2 Tin Lead Silver with a melting
session to the next. Figure 14 shows a typical heating point between 177–189°C. When this type of furnace is
profile for use when soldering a surface mount device to a used for solder reflow work, the circuit boards and solder
printed circuit board. This profile will vary among joints tend to heat first. The components on the board are
soldering systems, but it is a good starting point. Factors then heated by conduction. The circuit board, because it has
that can affect the profile include the type of soldering a large surface area, absorbs the thermal energy more
system in use, density and types of components on the efficiently, then distributes this energy to the components.
board, type of solder used, and the type of board or Because of this effect, the main body of a component may
substrate material being used. This profile shows be up to 30 degrees cooler than the adjacent solder joints.

STEP 1 STEP 2 STEP 3 STEP 4 STEP 5 STEP 6 STEP 7


PREHEAT VENT HEATING HEATING HEATING VENT COOLING
ZONE 1 “SOAK” ZONES 2 & 5 ZONES 3 & 6 ZONES 4 & 7
“RAMP” “RAMP” “SOAK” “SPIKE” 205° TO 219°C
PEAK AT
200°C DESIRED CURVE FOR HIGH 170°C SOLDER
MASS ASSEMBLIES JOINT
160°C
150°C

150°C
SOLDER IS LIQUID FOR
40 TO 80 SECONDS
100°C 140°C (DEPENDING ON
MASS OF ASSEMBLY)
100°C

DESIRED CURVE FOR LOW


MASS ASSEMBLIES
5°C

TIME (3 TO 7 MINUTES TOTAL) TMAX


Figure 14. Typical Solder Heating Profile

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NTTD2P02R2

TAPE & REEL INFORMATION


Micro–8
Dimensions are shown in millimeters (inches)

2.05 (.080) 1.60 (.063)


1.95 (.077) 1.50 (.059)

PIN 4.10 (.161) B B A 1.85 (.072) 0.35 (.013)


NUMBER 1 3.90 (.154) 1.65 (.065) 0.25 (.010)

12.30 5.55 (.218)


11.70 5.45 (.215)
(.484) 3.50 (.137)
(.461) 3.30 (.130)

A 1.60 (.063) 1.50 (.059)


1.50 (.059) 1.30 (.052)
FEED DIRECTION TYP.
8.10 (.318)
7.90 (.312) SECTION A–A
5.40 (.212)
5.20 (.205)

SECTION B–B
NOTES:
1. CONFORMS TO EIA–481–1.
2. CONTROLLING DIMENSION: MILLIMETER.

18.4 (.724)
MAX.
NOTE 3

13.2 (.52)
12.8 (.50)
330.0 50.0
(13.20) (1.97)
MAX. MIN.

14.4 (.57)
12.4 (.49)
NOTE 4
NOTES:
1. CONFORMS TO EIA–481–1.
2. CONTROLLING DIMENSION: MILLIMETER.
3. INCLUDES FLANGE DISTORTION AT OUTER EDGE.
4. DIMENSION MEASURED AT INNER HUB.

http://onsemi.com
247
 # 

#$%& '(
 -     
Single P–Channel Micro8t
Features
• Ultra Low RDS(on)
• Higher Efficiency Extending Battery Life http://onsemi.com
• Logic Level Gate Drive
• Miniature Micro–8 Surface Mount Package –2.4 AMPERES
• Diode Exhibits High Speed, Soft Recovery
• Micro8 Mounting Information Provided –20 VOLTS
Applications RDS(on) = 90 m
• Power Management in Portable and Battery–Powered Products, i.e.:
Cellular and Cordless Telephones and PCMCIA Cards
Single P–Channel

MAXIMUM RATINGS (TJ = 25°C unless otherwise noted) 

Rating Symbol Value Unit


Drain–to–Source Voltage VDSS –20 V
Gate–to–Source Voltage – Continuous VGS ±8.0 V 
Thermal Resistance – Junction–to–Ambient
(Note 1.) RθJA 160 °C/W
Total Power Dissipation @ TA = 25°C PD 0.78 W 
Continuous Drain Current @ TA = 25°C ID –2.4 A
Continuous Drain Current @ TA = 70°C ID –1.92 A
MARKING
Pulsed Drain Current (Note 3.) IDM –20 A
DIAGRAM
Thermal Resistance – Junction–to–Ambient 8
(Note 2.) RθJA 88 °C/W
Total Power Dissipation @ TA = 25°C PD 1.42 W
Continuous Drain Current @ TA = 25°C ID –3.25 A 1
Continuous Drain Current @ TA = 70°C ID –2.6 A YWW
Micro8
Pulsed Drain Current (Note 3.) IDM –30 A AD
CASE 846A
Operating and Storage TJ, Tstg –55 to °C STYLE 1
Temperature Range +150
Single Pulse Drain–to–Source Avalanche EAS 350 mJ
Energy – Starting TJ = 25°C Y = Year
(VDD = –20 Vdc, VGS = –4.5 Vdc, WW = Work Week
Peak IL = –5.0 Apk, L = 28 mH, AD = Device Code
RG = 25 Ω)
Maximum Lead Temperature for Soldering TL 260 °C
PIN ASSIGNMENT
Purposes for 10 seconds
1. Minimum FR–4 or G–10 PCB, Steady State. Source 1 8 Drain
2. Mounted onto a 2″ square FR–4 Board (1″ sq. 2 oz Cu 0.06″ thick single Source 2 7 Drain
sided), Steady State. Source Drain
3 6
3. Pulse Test: Pulse Width ≤ 300 ms, Duty Cycle ≤ 2%. Gate Drain
4 5

Top View

ORDERING INFORMATION

Device Package Shipping

NTTS2P02R2 Micro8 4000/Tape & Reel

 Semiconductor Components Industries, LLC, 2000 248 Publication Order Number:


December, 2000 – Rev. 4 NTTS2P02R2/D
NTTS2P02R2

ELECTRICAL CHARACTERISTICS (TC = 25°C unless otherwise noted) (Note 4.)


Characteristic Symbol Min Typ Max Unit
OFF CHARACTERISTICS
Drain–to–Source Breakdown Voltage V(BR)DSS Vdc
(VGS = 0 Vdc, ID = –250 µAdc) –20 – –
Temperature Coefficient (Positive) – –12.7 – mV/°C
Zero Gate Voltage Drain Current IDSS µAdc
(VGS = 0 Vdc, VDS = –16 Vdc, TJ = 25°C) – – –1.0
(VGS = 0 Vdc, VDS = –16 Vdc, TJ = 125°C) – – –25
Zero Gate Voltage Drain Current IDSS µAdc
(VGS = 0 Vdc, VDS = –20 Vdc, TJ = 25°C) – – –5.0
Gate–Body Leakage Current IGSS nAdc
(VGS = –8 Vdc, VDS = 0 Vdc) – – –100
Gate–Body Leakage Current IGSS nAdc
(VGS = +8 Vdc, VDS = 0 Vdc) – – 100
ON CHARACTERISTICS
Gate Threshold Voltage VGS(th) Vdc
(VDS = VGS, ID = –250 µAdc) –0.5 –0.90 –1.4
Temperature Coefficient (Negative) – 2.5 – mV/°C
Static Drain–to–Source On–State Resistance RDS(on) Ω
(VGS = –4.5 Vdc, ID = –2.4 Adc) – 0.070 0.090
(VGS = –2.7 Vdc, ID = –1.2 Adc) – 0.100 0.130
(VGS = –2.5 Vdc, ID = –1.2 Adc) – 0.110 –
Forward Transconductance (VDS = –10 Vdc, ID = –1.2 Adc) gFS 2.0 4.2 – Mhos
DYNAMIC CHARACTERISTICS
Input Capacitance Ciss – 550 – pF
Output Capacitance (VDS = –16
16 Vdc,
Vd VGS = 0 Vdc,
Vd
Coss – 200 –
f = 1.0 MHz)
Reverse Transfer Capacitance Crss – 100 –
SWITCHING CHARACTERISTICS (Notes 5. & 6.)
Turn–On Delay Time td(on) – 10 – ns
Rise Time (VDD = –10
10 Vdc, ID = –2.4
2.4 Adc, tr – 31 –
Turn–Off Delay Time VGS = –4.5 Vdc, RG = 6.0 Ω) td(off) – 33 –
Fall Time tf – 29 –
Turn–On Delay Time td(on) – 15 – ns
Rise Time (VDD = –10
10 Vdc, ID = –1.2
1.2 Adc, tr – 40 –
Turn–Off Delay Time VGS = –2.7 Vdc, RG = 6.0 Ω) td(off) – 35 –
Fall Time tf – 35 –
Total Gate Charge Qtot – 10 18 nC
(VDS = –16 Vdc,
Gate–Source Charge VGS = –4.5 Vdc, Qgs – 1.5 –
ID = –2.4
2 4 Ad
Adc))
Gate–Drain Charge Qgd – 5.0 –
BODY–DRAIN DIODE RATINGS (Note 5.)
Diode Forward On–Voltage (IS = –2.4 Adc, VGS = 0 Vdc) VSD – –0.88 –1.0 Vdc
(IS = –2.4 Adc, VGS = 0 Vdc, TJ = 125°C) – –0.75 –
Reverse Recovery Time trr – 37 – ns
(IS = –2.4
2 4 Adc,
Ad VGS = 0 Vdc,
Vd
ta – 16 –
dIS/dt = 100 A/µs)
tb – 21 –
Reverse Recovery Stored Charge QRR – 0.025 – µC
4. Handling precautions to protect against electrostatic discharge is mandatory.
5. Indicates Pulse Test: Pulse Width = 300 µs max, Duty Cycle = 2%.
6. Switching characteristics are independent of operating junction temperature.

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249
NTTS2P02R2

4 5
VGS = –2.1 V TJ = 25°C
VDS > = 10 V
–ID, DRAIN CURRENT (AMPS)

–ID, DRAIN CURRENT (AMPS)


VGS = –10 V
4
3 VGS = –4.5 V
VGS = –1.9 V
VGS = –2.5 V
3
2
VGS = –1.7 V 2 TJ = 25°C

1
VGS = –1.5 V 1
TJ = 100°C
TJ = 55°C
0 0
0 2 4 6 8 10 1 1.5 2 2.5 3
–VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS) –VGS, GATE–TO–SOURCE VOLTAGE (VOLTS)

Figure 1. On–Region Characteristics. Figure 2. Transfer Characteristics.


RDS(on), DRAIN–TO–SOURCE RESISTANCE (W)

RDS(on), DRAIN–TO–SOURCE RESISTANCE (W)


0.2 0.12
TJ = 25°C TJ = 25°C

0.15 0.1
VGS = –2.7 V

0.1 0.08
VGS = –4.5 V

0.05 0.06

0 0.04
2 4 6 8 1 1.5 2 2.5 3 3.5 4 4.5
–VGS, GATE–TO–SOURCE VOLTAGE (VOLTS) –ID, DRAIN CURRENT (AMPS)

Figure 3. On–Resistance vs. Gate–to–Source Figure 4. On–Resistance vs. Drain Current and
Voltage. Gate Voltage.
RDS(on), DRAIN–TO–SOURCE RESISTANCE

1.6 1000
ID = –2.4 A VGS = 0 V
VGS = –4.5 V TJ = 125°C
1.4 100
–IDSS, LEAKAGE (nA)

TJ = 100°C
(NORMALIZED)

1.2 10

TJ = 25°C
1 1

0.8 0.1

0.6 0.01
–50 –25 0 25 50 75 100 125 150 0 4 8 12 16 20
TJ, JUNCTION TEMPERATURE (°C) –VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS)

Figure 5. On–Resistance Variation with Figure 6. Drain–to–Source Leakage Current


Temperature. vs. Voltage.

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250
NTTS2P02R2

–VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS)


–VGS, GATE–TO–SOURCE VOLTAGE (VOLTS)
1500 5 20
VDS = 0 V VGS = 0 V
QT 18
1200 Ciss TJ = 25°C 4 16
C, CAPACITANCE (pF)

14
900 3 VGS 12
Crss
Q1 10
Q2
600 Ciss 2 8
6
300 ID = –2.4 A
Coss 1 VDS 4
TJ = 25°C
Crss 2
0 0 0
10 5 0 5 10 15 20 0 2 4 6 8 10 12 14
–VGS –VDS Qg, TOTAL GATE CHARGE (nC)

GATE–TO–SOURCE OR DRAIN–TO–SOURCE
VOLTAGE (VOLTS) Figure 8. Gate–to–Source and
Drain–to–Source Voltage versus Total Charge
Figure 7. Capacitance Variation

1000 100
VDD = –10 V td (off)
ID = –1.2 A
VGS = –2.7 V tr tf
t, TIME (ns)

t, TIME (ns)

td
100 10 (on)
tr

tf
td (off) VDD = –10 V
ID = –2.4 A
VGS = –4.5 V
td (on)
10 1.0
1.0 10 100 1.0 10 100
RG, GATE RESISTANCE (OHMS) RG, GATE RESISTANCE (OHMS)

Figure 9. Resistive Switching Time Variation Figure 10. Resistive Switching Time Variation
versus Gate Resistance versus Gate Resistance

2
–IS, SOURCE CURRENT (AMPS)

VGS = 0 V
TJ = 25°C di/dt
1.6
IS
trr
1.2
ta tb
TIME
0.8
tp 0.25 IS

0.4 IS

0
0.4 0.5 0.6 0.7 0.8 0.9 1 Figure 12. Diode Reverse Recovery Waveform
–VSD, SOURCE–TO–DRAIN VOLTAGE (VOLTS)

Figure 11. Diode Forward Voltage


versus Current

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NTTS2P02R2

Rthja(t), EFFECTIVE TRANSIENT THERMAL RESPONSE

D = 0.5

0.2

Normalized to R∅ja at Steady State (1 inch pad)


0.1 0.1
0.0125 Ω 0.0563 Ω 0.110 Ω 0.273 Ω 0.113 Ω 0.436 Ω

0.05

0.02

0.01 0.021 F 0.137 F 1.15 F 2.93 F 152 F 261 F

Single Pulse

0.01
1E–03 1E–02 1E–01 1E+00 1E+03 1E+02 1E+03
t, TIME (s)

Figure 13. FET Thermal Response.

INFORMATION FOR USING THE Micro–8 SURFACE MOUNT PACKAGE

MINIMUM RECOMMENDED FOOTPRINT FOR SURFACE MOUNTED APPLICATIONS


Surface mount board layout is a critical portion of the total interface between the board and the package. With the
design. The footprint for the semiconductor packages must correct pad geometry, the packages will self–align when
be the correct size to ensure proper solder connection subjected to a solder reflow process.

0.041
1.04

0.208 0.126
5.28 3.20

0.015 0.0256
0.38 0.65
inches
mm

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252
NTTS2P02R2

SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • The soldering temperature and time shall not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within • When shifting from preheating to soldering, the
a short time could result in device failure. Therefore, the maximum temperature gradient shall be 5°C or less.
following items should always be observed in order to • After soldering has been completed, the device should
minimize the thermal stress to which the devices are be allowed to cool naturally for at least three minutes.
subjected. Gradual cooling should be used as the use of forced
• Always preheat the device. cooling will increase the temperature gradient and
• The delta temperature between the preheat and result in latent failure due to mechanical stress.
soldering should be 100°C or less.* • Mechanical stress or shock should not be applied
• When preheating and soldering, the temperature of the during cooling.
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When * Soldering a device without preheating can cause
using infrared heating with the reflow soldering excessive thermal shock and stress which can result in
method, the difference shall be a maximum of 10°C. damage to the device.

TYPICAL SOLDER HEATING PROFILE


For any given circuit board, there will be a group of temperature versus time. The line on the graph shows the
control settings that will give the desired heat pattern. The actual temperature that might be experienced on the surface
operator must set temperatures for several heating zones of a test board at or near a central solder joint. The two
and a figure for belt speed. Taken together, these control profiles are based on a high density and a low density
settings make up a heating “profile” for that particular board. The Vitronics SMD310 convection/infrared reflow
circuit board. On machines controlled by a computer, the soldering system was used to generate this profile. The type
computer remembers these profiles from one operating of solder used was 62/36/2 Tin Lead Silver with a melting
session to the next. Figure 14 shows a typical heating point between 177–189°C. When this type of furnace is
profile for use when soldering a surface mount device to a used for solder reflow work, the circuit boards and solder
printed circuit board. This profile will vary among joints tend to heat first. The components on the board are
soldering systems, but it is a good starting point. Factors then heated by conduction. The circuit board, because it has
that can affect the profile include the type of soldering a large surface area, absorbs the thermal energy more
system in use, density and types of components on the efficiently, then distributes this energy to the components.
board, type of solder used, and the type of board or Because of this effect, the main body of a component may
substrate material being used. This profile shows be up to 30 degrees cooler than the adjacent solder joints.

STEP 1 STEP 2 STEP 3 STEP 4 STEP 5 STEP 6 STEP 7


PREHEAT VENT HEATING HEATING HEATING VENT COOLING
ZONE 1 “SOAK” ZONES 2 & 5 ZONES 3 & 6 ZONES 4 & 7
“RAMP” “RAMP” “SOAK” “SPIKE” 205° TO 219°C
PEAK AT
200°C DESIRED CURVE FOR HIGH 170°C SOLDER
MASS ASSEMBLIES JOINT
160°C
150°C

150°C
SOLDER IS LIQUID FOR
40 TO 80 SECONDS
100°C 140°C (DEPENDING ON
MASS OF ASSEMBLY)
100°C

DESIRED CURVE FOR LOW


MASS ASSEMBLIES
5°C

TIME (3 TO 7 MINUTES TOTAL) TMAX


Figure 14. Typical Solder Heating Profile

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NTTS2P02R2

TAPE & REEL INFORMATION


Micro–8
Dimensions are shown in millimeters (inches)

2.05 (.080) 1.60 (.063)


1.95 (.077) 1.50 (.059)

PIN 4.10 (.161) B B A 1.85 (.072) 0.35 (.013)


NUMBER 1 3.90 (.154) 1.65 (.065) 0.25 (.010)

12.30 5.55 (.218)


11.70 5.45 (.215)
(.484) 3.50 (.137)
(.461) 3.30 (.130)

A 1.60 (.063) 1.50 (.059)


1.50 (.059) 1.30 (.052)
FEED DIRECTION TYP.
8.10 (.318)
7.90 (.312) SECTION A–A
5.40 (.212)
5.20 (.205)

SECTION B–B
NOTES:
1. CONFORMS TO EIA–481–1.
2. CONTROLLING DIMENSION: MILLIMETER.

18.4 (.724)
MAX.
NOTE 3

13.2 (.52)
12.8 (.50)
330.0 50.0
(13.20) (1.97)
MAX. MIN.

14.4 (.57)
12.4 (.49)
NOTE 4
NOTES:
1. CONFORMS TO EIA–481–1.
2. CONTROLLING DIMENSION: MILLIMETER.
3. INCLUDES FLANGE DISTORTION AT OUTER EDGE.
4. DIMENSION MEASURED AT INNER HUB.

http://onsemi.com
254
 #!

 

#$%& '(
 -,  !  
P–Channel Enhancement Mode
Single Micro8t Package http://onsemi.com
Features
• Ultra Low RDS(on) –2.48 AMPERES
• Higher Efficiency Extending Battery Life
• Miniature Micro8 Surface Mount Package –30 VOLTS
• Diode Exhibits High Speed, Soft Recovery 85 mW @ VGS = –10 V
• Micro8 Mounting Information Provided
Applications Single P–Channel
• Power Management in Portable and Battery–Powered Products, i.e.:
Cellular and Cordless Telephones and PCMCIA Cards D

MAXIMUM RATINGS (TJ = 25°C unless otherwise noted)


Rating Symbol Value Unit
G
Drain–to–Source Voltage VDSS –30 V
Gate–to–Source Voltage – Continuous VGS "20 V
S
Thermal Resistance –
Junction–to–Ambient (Note 1.) RθJA 160 °C/W
Total Power Dissipation @ TA = 25°C PD 0.78 W
Continuous Drain Current @ TA = 25°C ID –2.48 A
8
Continuous Drain Current @ TA = 70°C ID –1.98 A
Thermal Resistance – 1
Junction–to–Ambient (Note 2.) RθJA 70 °C/W
Total Power Dissipation @ TA = 25°C PD 1.78 W Micro8
Continuous Drain Current @ TA = 25°C ID –3.75 A CASE 846A
Continuous Drain Current @ TA = 70°C ID –3.0 A STYLE 1
Thermal Resistance –
Junction–to–Ambient (Note 3.) RθJA 210 °C/W MARKING DIAGRAM
Total Power Dissipation @ TA = 25°C PD 0.60 W & PIN ASSIGNMENT
Continuous Drain Current @ TA = 25°C ID –2.10 A
Continuous Drain Current @ TA = 70°C ID –1.67 A Source 1 8 Drain
Pulsed Drain Current (Note 5.) IDM –17 A Source 2 YWW 7 Drain
Thermal Resistance – Source 3 AE 6 Drain
Junction–to–Ambient (Note 4.) RθJA 100 °C/W Gate 4 5 Drain
Total Power Dissipation @ TA = 25°C PD 1.25 W
Continuous Drain Current @ TA = 25°C ID –3.02 A (Top View)
Continuous Drain Current @ TA = 70°C ID –2.42 A
Pulsed Drain Current (Note 5.) IDM –24 A Y = Year
WW = Work Week
Operating and Storage TJ, Tstg –55 to °C AE = Device Code
Temperature Range +150
1. Minimum FR–4 or G–10 PCB, Time ≤ 10 Seconds.
2. Mounted onto a 2″ square FR–4 Board (1″ sq. 2 oz Cu 0.06″ thick single ORDERING INFORMATION
sided), Time ≤ 10 Seconds.
3. Minimum FR–4 or G–10 PCB, Steady State. Device Package Shipping
4. Mounted onto a 2″ square FR–4 Board (1″ sq. 2 oz Cu 0.06″ thick single
sided), Steady State. NTTS2P03R2 Micro8 4000/Tape & Reel
5. Pulse Test: Pulse Width = 300 ms, Duty Cycle = 2%.

This document contains information on a product under development. ON Semiconductor


reserves the right to change or discontinue this product without notice.

 Semiconductor Components Industries, LLC, 2001 255 Publication Order Number:


February, 2001 – Rev. 0 NTTS2P03R2/D
NTTS2P03R2

MAXIMUM RATINGS (TJ = 25°C unless otherwise noted) (continued)


Rating Symbol Value Unit
Single Pulse Drain–to–Source Avalanche Energy – Starting TJ = 25°C EAS 292.5 mJ
(VDD = –30 Vdc, VGS = –10 Vdc, Peak IL = –3.0 Apk, L = 65 mH, RG = 25 Ω)
Maximum Lead Temperature for Soldering Purposes for 10 seconds TL 260 °C
ELECTRICAL CHARACTERISTICS (TC = 25°C unless otherwise noted) (Note 6.)
Characteristic Symbol Min Typ Max Unit
OFF CHARACTERISTICS
Drain–to–Source Breakdown Voltage (VGS = 0 Vdc, ID = –250 µAdc) V(BR)DSS –30 – – Vdc
Temperature Coefficient (Positive) – –30 – mV/°C
Zero Gate Voltage Drain Current IDSS µAdc
(VGS = 0 Vdc, VDS = –30 Vdc, TJ = 25°C) – – –1.0
(VGS = 0 Vdc, VDS = –30 Vdc, TJ = 125°C) – – –25
Gate–Body Leakage Current (VGS = –20 Vdc, VDS = 0 Vdc) IGSS – – –100 nAdc
Gate–Body Leakage Current (VGS = +20 Vdc, VDS = 0 Vdc) IGSS – – 100 nAdc
ON CHARACTERISTICS
Gate Threshold Voltage (VDS = VGS, ID = –250 µAdc) VGS(th) –1.0 –1.7 –3.0 Vdc
Temperature Coefficient (Negative) – 3.6 –
Static Drain–to–Source On–State Resistance RDS(on) Ω
(VGS = –10 Vdc, ID = –2.48 Adc) – 0.063 0.085
(VGS = –4.5 Vdc, ID = –1.24 Adc) – 0.100 0.135
Forward Transconductance (VDS = –15 Vdc, ID = –1.24 Adc) gFS – 3.1 – Mhos
DYNAMIC CHARACTERISTICS
Input Capacitance Ciss – 500 – pF
Output Capacitance (VDS = –24
24 Vdc,
Vd VGS = 0 Vdc,
Vd
Coss – 160 –
f = 1.0 MHz)
Reverse Transfer Capacitance Crss – 65 –
SWITCHING CHARACTERISTICS (Notes 7. & 8.)
Turn–On Delay Time td(on) – 10 – ns
Rise Time (VDD = –24
24 Vdc, ID = –2.48
2.48 Adc, tr – 20 –
Turn–Off Delay Time VGS = –10 Vdc, RG = 6.0 Ω) td(off) – 40 –
Fall Time tf – 35 –
Turn–On Delay Time td(on) – 16 – ns
Rise Time (VDD = –24
24 Vdc, ID = –1.24
1.24 Adc, tr – 40 –
Turn–Off Delay Time VGS = –4.5 Vdc, RG = 6.0 Ω) td(off) – 30 –
Fall Time tf – 30 –
Total Gate Charge Qtot – 15 22 nC
(VDS = –24 Vdc,
Gate–Source Charge VGS = –4.5 Vdc, Qgs – 3.2 –
2 48 Adc)
ID = –2.48 Ad )
Gate–Drain Charge Qgd – 4.0 –
BODY–DRAIN DIODE RATINGS (Note 7.)
Diode Forward On–Voltage (IS = –2.48 Adc, VGS = 0 Vdc) VSD – –0.92 –1.3 Vdc
(IS = –2.48 Adc, VGS = 0 Vdc, – –0.72 –
TJ = 125°C)
Reverse Recovery Time trr – 38 – ns
(IS = –1.45
1 45 Adc,
Ad VGS = 0 Vdc,
Vd
ta – 20 –
dIS/dt = 100 A/µs)
tb – 18 –
Reverse Recovery Stored Charge QRR – 0.04 – µC
6. Handling precautions to protect against electrostatic discharge is mandatory.
7. Indicates Pulse Test: Pulse Width = 300 µsec max, Duty Cycle = 2%.
8. Switching characteristics are independent of operating junction temperature.

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256
NTTS2P03R2

3 5
–10 V –3.5 V
–3.3 V TJ = 25°C VDS ≥ –10 V

–ID, DRAIN CURRENT (AMPS)


–ID, DRAIN CURRENT (AMPS)

–3.7 V 4
–3.9 V –3.1 V
2 –4.1 V
–4.5 V 3
–4.9 V –2.9 V
–6 V TJ = 25°C
2
1
–2.7 V
1 TJ = 100°C
–2.5 V
TJ = –55°C
VGS = –2.3 V
0 0
0 0.25 0.5 0.75 1 1.25 1.5 1.75 1 2 3 4 5
–VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS) –VGS, GATE–TO–SOURCE VOLTAGE (VOLTS)

Figure 1. On–Region Characteristics Figure 2. Transfer Characteristics


RDS(on), DRAIN–TO–SOURCE RESISTANCE (W)

RDS(on), DRAIN–TO–SOURCE RESISTANCE (W)


0.3 0.15
TJ = 25°C
ID = –2.48 A
0.25
TJ = 25°C

0.2 0.1 VGS = –4.5 V

0.15
VGS = –10 V

0.1 0.05

0.05

0 0
0 2 4 6 8 10 0.5 1.5 2.5 3.5 4.5 5.5
–VGS, GATE–TO–SOURCE VOLTAGE (VOLTS) –ID, DRAIN CURRENT (AMPS)

Figure 3. On–Resistance versus Figure 4. On–Resistance versus Drain Current


Gate–to–Source Voltage and Gate Voltage
RDS(on), DRAIN–TO–SOURCE RESISTANCE

1.6 10,000
VGS = 0 V
ID = –2.48 A
1.4
–IDSS, LEAKAGE (nA)

VGS = –10 V 1000 TJ = 150°C


(NORMALIZED)

1.2
100
1
TJ = 100°C
10
0.8

0.6 1
–50 –25 0 25 50 75 100 125 150 5 10 15 20 25 30
TJ, JUNCTION TEMPERATURE (°C) –VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS)

Figure 5. On–Resistance Variation with Figure 6. Drain–to–Source Leakage Current


Temperature versus Voltage

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NTTS2P03R2

–VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS)


–VGS, GATE–TO–SOURCE VOLTAGE (VOLTS)
6 30
1200 VDS = 0 V VGS = 0 V
Ciss TJ = 25°C 5 25
C, CAPACITANCE (pF)

1000 QT

4 VGS 20
800 Q1 Q2
Crss
3 15
600 Ciss

400 2 10

ID = –2.48 A
200 Coss 1 5
TJ = 25°C
Crss VDS
0 0 0
–10 –5 0 5 10 15 20 25 30 0 2 4 6 8 10 12 14 16
–VGS –VDS Qg, TOTAL GATE CHARGE (nC)

GATE–TO–SOURCE OR DRAIN–TO–SOURCE
VOLTAGE (VOLTS) Figure 8. Gate–to–Source and
Drain–to–Source Voltage versus Total Charge
Figure 7. Capacitance Variation

100 3
–IS, SOURCE CURRENT (AMPS)
2.5 VGS = 0 V
td (off)
TJ = 25°C
tf 2
t, TIME (ns)

tr

10 1.5
td (on)

1
VDD = –24 V
ID = –2.48 A 0.5
VGS = –10 V
1 0
1 10 100 0.4 0.5 0.6 0.7 0.8 0.9 1
RG, GATE RESISTANCE (OHMS) –VSD, SOURCE–TO–DRAIN VOLTAGE (VOLTS)

Figure 9. Resistive Switching Time Variation Figure 10. Diode Forward Voltage
versus Gate Resistance versus Current

100
VGS = 30 V
SINGLE PULSE
ID , DRAIN CURRENT (AMPS)

di/dt
TC = 25°C
10 IS
1 ms
trr
10 ms ta tb
1 TIME

tp 0.25 IS

0.1 RDS(on) LIMIT IS


dc
THERMAL LIMIT
PACKAGE LIMIT
0.01
0.1 1 10 100 Figure 12. Diode Reverse Recovery Waveform
VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS)

Figure 11. Maximum Rated Forward Biased


Safe Operating Area

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258
NTTS2P03R2

TYPICAL ELECTRICAL CHARACTERISTICS

1000
Rthja(t), EFFECTIVE TRANSIENT
THERMAL RESISTANCE (°C/W)

100 D = 0.5
0.2
0.1
10 0.05 *0

θ,' " ('
θ,
0.02
 
 - .
/

0.01  
/
1 '
     '
'# ,*0   " *0
θ,'
- -  " '&'#
SINGLE PULSE
0.1
1.0E–05 1.0E–04 1.0E–03 1.0E–02 1.0E–01 1.0E+00 1.0E+01 1.0E+02 1.0E+03
t, TIME (s)

Figure 13. Thermal Response

INFORMATION FOR USING THE Micro8 SURFACE MOUNT PACKAGE

MINIMUM RECOMMENDED FOOTPRINT FOR SURFACE MOUNTED APPLICATIONS


Surface mount board layout is a critical portion of the total interface between the board and the package. With the
design. The footprint for the semiconductor packages must correct pad geometry, the packages will self–align when
be the correct size to ensure proper solder connection subjected to a solder reflow process.

0.041
1.04

0.208 0.126
5.28 3.20

0.015 0.0256
0.38 0.65
inches
mm

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259
NTTS2P03R2

SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • The soldering temperature and time shall not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within • When shifting from preheating to soldering, the
a short time could result in device failure. Therefore, the maximum temperature gradient shall be 5°C or less.
following items should always be observed in order to • After soldering has been completed, the device should
minimize the thermal stress to which the devices are be allowed to cool naturally for at least three minutes.
subjected. Gradual cooling should be used as the use of forced
• Always preheat the device. cooling will increase the temperature gradient and
• The delta temperature between the preheat and result in latent failure due to mechanical stress.
soldering should be 100°C or less.* • Mechanical stress or shock should not be applied
• When preheating and soldering, the temperature of the during cooling.
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When * Soldering a device without preheating can cause
using infrared heating with the reflow soldering excessive thermal shock and stress which can result in
method, the difference shall be a maximum of 10°C. damage to the device.

TYPICAL SOLDER HEATING PROFILE


For any given circuit board, there will be a group of temperature versus time. The line on the graph shows the
control settings that will give the desired heat pattern. The actual temperature that might be experienced on the surface
operator must set temperatures for several heating zones of a test board at or near a central solder joint. The two
and a figure for belt speed. Taken together, these control profiles are based on a high density and a low density
settings make up a heating “profile” for that particular board. The Vitronics SMD310 convection/infrared reflow
circuit board. On machines controlled by a computer, the soldering system was used to generate this profile. The type
computer remembers these profiles from one operating of solder used was 62/36/2 Tin Lead Silver with a melting
session to the next. Figure 14 shows a typical heating point between 177–189°C. When this type of furnace is
profile for use when soldering a surface mount device to a used for solder reflow work, the circuit boards and solder
printed circuit board. This profile will vary among joints tend to heat first. The components on the board are
soldering systems, but it is a good starting point. Factors then heated by conduction. The circuit board, because it has
that can affect the profile include the type of soldering a large surface area, absorbs the thermal energy more
system in use, density and types of components on the efficiently, then distributes this energy to the components.
board, type of solder used, and the type of board or Because of this effect, the main body of a component may
substrate material being used. This profile shows be up to 30 degrees cooler than the adjacent solder joints.

STEP 1 STEP 2 STEP 3 STEP 4 STEP 5 STEP 6 STEP 7


PREHEAT VENT HEATING HEATING HEATING VENT COOLING
ZONE 1 “SOAK” ZONES 2 & 5 ZONES 3 & 6 ZONES 4 & 7
“RAMP” “RAMP” “SOAK” “SPIKE” 205° TO 219°C
PEAK AT
200°C DESIRED CURVE FOR HIGH 170°C SOLDER
MASS ASSEMBLIES JOINT
160°C
150°C

150°C
SOLDER IS LIQUID FOR
40 TO 80 SECONDS
100°C 140°C (DEPENDING ON
MASS OF ASSEMBLY)
100°C

DESIRED CURVE FOR LOW


MASS ASSEMBLIES
5°C

TIME (3 TO 7 MINUTES TOTAL) TMAX


Figure 14. Typical Solder Heating Profile

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260
NTTS2P03R2

TAPE & REEL INFORMATION


Micro–8
Dimensions are shown in millimeters (inches)

2.05 (.080) 1.60 (.063)


1.95 (.077) 1.50 (.059)

PIN 4.10 (.161) B B A 1.85 (.072) 0.35 (.013)


NUMBER 1 3.90 (.154) 1.65 (.065) 0.25 (.010)

12.30 5.55 (.218)


11.70 5.45 (.215)
(.484) 3.50 (.137)
(.461) 3.30 (.130)

A 1.60 (.063) 1.50 (.059)


1.50 (.059) 1.30 (.052)
FEED DIRECTION TYP.
8.10 (.318)
7.90 (.312) SECTION A–A
5.40 (.212)
5.20 (.205)

SECTION B–B
NOTES:
1. CONFORMS TO EIA–481–1.
2. CONTROLLING DIMENSION: MILLIMETER.

18.4 (.724)
MAX.
NOTE 3

13.2 (.52)
12.8 (.50)
330.0 50.0
(13.20) (1.97)
MAX. MIN.

14.4 (.57)
12.4 (.49)
NOTE 4
NOTES:
1. CONFORMS TO EIA–481–1.
2. CONTROLLING DIMENSION: MILLIMETER.
3. INCLUDES FLANGE DISTORTION AT OUTER EDGE.
4. DIMENSION MEASURED AT INNER HUB.

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261
7

 

#$%& '(
    
Dual N–Channel SC–88
• 2.5 V Gate Drive with Low On–Resistance http://onsemi.com
• Low Threshold Voltage: Vth = 0.5 to 1.5 V, Ideal for Portable
• High Speed 100 mAMPS
• Enhancement Mode 20 VOLTS
• Small Package RDS(on) = 10 
• Easily Designed Drive Circuits
N–Channel

MAXIMUM RATINGS (TJ = 25°C unless otherwise noted)
Rating Symbol Value Unit
Drain–to–Source Voltage VDS 20 Vdc
Gate–to–Source Voltage – Continuous VGSS 10 Vdc

Drain Current mAdc
– Continuous @ TA = 25°C ID 100

Total Power Dissipation @ TA = 25°C PD 150 mW 

Channel Temperature Tch 150 °C MARKING


Operating and Storage Temperature Tstg – 55 to °C DIAGRAM
Range 150
4
5 SC–88/SOT–363
6 N02
CASE 419B
D
STYLE 1
2 3
1

N02 = Device Code


D = Date Code

PIN ASSIGNMENT

Source–1 1 6 Drain–1

Gate–1 2 5 Gate–2

Drain–2 3 4 Source–2

Top View

ORDERING INFORMATION

Device Package Shipping

NTUD01N02 SC–88 3000 Tape & Reel

This document contains information on a product under development. ON Semiconductor


reserves the right to change or discontinue this product without notice.

 Semiconductor Components Industries, LLC, 2001 262 Publication Order Number:


January, 2001 – Rev. 0 NTUD01N02/D
NTUD01N02

ELECTRICAL CHARACTERISTICS (TA = 25°C unless otherwise noted)


Characteristic Symbol Min Typ Max Unit
OFF CHARACTERISTICS
Drain–to–Source Breakdown Voltage V(BR)DSS 20 – – Vdc
(VGS = 0 Vdc, ID = 100 µA)
Drain Cut–off Current IDSS µAdc
(VDS = 20 Vdc, VGS = 0 Vdc) – – 1.0
Gate–Body Leakage Current (VGS = 10 Vdc, VDS = 0) IGSS – – 1.0 µAdc
ON CHARACTERISTICS
Gate Threshold Voltage Vth Vdc
(VDS = 3.0 Vdc, ID = 0.1 mAdc) 0.5 – 1.5
Drain–to–Source On–Resistance RDS(on) Ω
(VGS = 2.5 Vdc, ID = 10 mAdc) – 5.0 10
Forward Transfer Admittance (VDS = 3.0 Vdc, ID = 10 mAdc) YFS 20 – – mS
DYNAMIC CHARACTERISTICS
Input Capacitance (VDS = 3.0 Vdc, VGS = 0 Vdc, Ciss – 5.5 – pF
f = 1.0 MHz)
Output Capacitance (VDS = 3.0 Vdc, VGS = 0 Vdc, Coss – 25 –
f = 1.0 MHz)
Reverse Transfer Capacitance (VDS = 3.0 Vdc, VGS = 0 Vdc, Crss – 1.6 –
f = 1.0 MHz)

SWITCHING CHARACTERISTICS
Turn–On Delay Time (VDD = 3.0 Vdc, ID = 10 mAdc, ton – 0.14 – µs
Turn–Off Delay Time VGS = 0 to 2.5 Vdc) toff – 0.14 –

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"
Preferred Device

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N–Channel TO–92

MAXIMUM RATINGS http://onsemi.com


Rating Symbol Value Unit
200 mAMPS
Drain Source Voltage VDSS 60 Vdc
60 VOLTS
Drain–Gate Voltage (RGS = 1.0 MΩ) VDGR 60 Vdc
RDS(on) = 5 Ω
Gate–Source Voltage
– Continuous VGS ±?20 Vdc N–Channel
– Non–repetitive (tp ≤ 50 µs) VGSM ±?40 Vpk

Drain Current mAdc
– Continuous ID 200
– Pulsed IDM 500
Total Power Dissipation @ TC = 25°C PD 350 mW 
Derate above 25°C 2.8 mW/°C
Operating and Storage Temperature TJ, Tstg –55 to °C

Range +150

THERMAL CHARACTERISTICS
Characteristic Symbol Max Unit
TO–92
Thermal Resistance, Junction to RθJA 357 °C/W
CASE 29
Ambient
Style 22
Maximum Lead Temperature for TL 300 °C
Soldering Purposes, 1/16″ from case 12
3
for 10 seconds
MARKING DIAGRAM
& PIN ASSIGNMENT

2N7000
YWW

1 3
Source Drain

2
Gate

Y = Year
WW = Work Week

ORDERING INFORMATION
See detailed ordering and shipping information in the package
dimensions section on page 266 of this data sheet.

Preferred devices are recommended choices for future use


and best overall value.

 Semiconductor Components Industries, LLC, 2000 264 Publication Order Number:


November, 2000 – Rev. 5 2N7000/D
2N7000

ELECTRICAL CHARACTERISTICS (TC = 25°C unless otherwise noted)


Characteristic Symbol Min Max Unit

OFF CHARACTERISTICS
Drain–Source Breakdown Voltage V(BR)DSS 60 – Vdc
(VGS = 0, ID = 10 µAdc)
Zero Gate Voltage Drain Current IDSS
(VDS = 48 Vdc, VGS = 0) – 1.0 µAdc
(VDS = 48 Vdc, VGS = 0, TJ = 125°C) – 1.0 mAdc
Gate–Body Leakage Current, Forward IGSSF – –10 nAdc
(VGSF = 15 Vdc, VDS = 0)

ON CHARACTERISTICS (Note 1.)


Gate Threshold Voltage VGS(th) 0.8 3.0 Vdc
(VDS = VGS, ID = 1.0 mAdc)
Static Drain–Source On–Resistance rDS(on) Ohm
(VGS = 10 Vdc, ID = 0.5 Adc) – 5.0
(VGS = 4.5 Vdc, ID = 75 mAdc) – 6.0
Drain–Source On–Voltage VDS(on) Vdc
(VGS = 10 Vdc, ID = 0.5 Adc) – 2.5
(VGS = 4.5 Vdc, ID = 75 mAdc) – 0.45
On–State Drain Current Id(on) 75 – mAdc
(VGS = 4.5 Vdc, VDS = 10 Vdc)
Forward Transconductance gfs 100 – µmhos
(VDS = 10 Vdc, ID = 200 mAdc)

DYNAMIC CHARACTERISTICS
Input Capacitance Ciss – 60 pF
Output Capacitance ((VDS = 25 V,, VGS = 0,, Coss – 25
f=11.0
0 MH
MHz))
Reverse Transfer Crss – 5.0
Capacitance

SWITCHING CHARACTERISTICS (Note 1.)


Turn–On Delay Time (VDD = 15 V, ID = 500 mA, ton – 10 ns
Turn–Off Delay Time RG = 25 W, RL = 30 W, Vgen = 10 V) toff – 10
1. Pulse Test: Pulse Width ≤ 300 µs, Duty Cycle ≤ 2.0%.

http://onsemi.com
265
2N7000

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Figure 3. Temperature versus Static Figure 4. Temperature versus Gate


Drain–Source On–Resistance Threshold Voltage

ORDERING INFORMATION

Device Package Shipping


2N7000 TO–92 1000 Unit/Box
2N7000RLRA TO–92 2000 Tape & Reel
2N7000RLRM TO–92 2000 Ammo Pack
2N7000RLRP TO–92 2000 Ammo Pack
2N7000ZL1 TO–92 2000 Ammo Pack

http://onsemi.com
266
" 
Preferred Device

0 
0 '(
    
N–Channel SOT–23

MAXIMUM RATINGS
http://onsemi.com
Rating Symbol Value Unit
Drain–Source Voltage VDSS 60 Vdc 115 mAMPS
Drain–Gate Voltage (RGS = 1.0 MΩ) VDGR 60 Vdc 60 VOLTS
Drain Current ID ±?115 mAdc RDS(on) = 7.5 
– Continuous TC = 25°C (Note 1.) ID ±?75
– Continuous TC = 100°C (Note 1.) IDM ±?800 N–Channel
– Pulsed (Note 2.) 4
Gate–Source Voltage
– Continuous VGS ±?20 Vdc
– Non–repetitive (tp ≤ 50 µs) VGSM ±?40 Vpk

THERMAL CHARACTERISTICS

Characteristic Symbol Max Unit
Total Device Dissipation FR–5 Board PD 225 mW
(Note 3.) TA = 25°C 1.8 mW/°C
#
Derate above 25°C
Thermal Resistance, Junction to Ambient RθJA 556 °C/W
3
Total Device Dissipation PD 300 mW
Alumina Substrate,(Note 4.) TA = 25°C mW/°C
Derate above 25°C 2.4 1
2
Thermal Resistance, Junction to Ambient RθJA 417 °C/W
SOT–23
Junction and Storage Temperature TJ, Tstg –?55 to °C
CASE 318
+150
STYLE 21
1. The Power Dissipation of the package may result in a lower continuous drain
current. MARKING DIAGRAM
2. Pulse Test: Pulse Width ≤ 300 µs, Duty Cycle ≤ 2.0%. & PIN ASSIGNMENT
3. FR–5 = 1.0 x 0.75 x 0.062 in.
4. Alumina = 0.4 x 0.3 x 0.025 in 99.5% alumina. ()%
3

702
W

1 2
)'1 ;(1
702 = Device Code
W = Work Week

ORDERING INFORMATION

Device Package Shipping

2N7002LT1 SOT–23 3000 Tape & Reel

2N7002LT3 SOT–23 10,000 Tape & Reel

Preferred devices are recommended choices for future use


and best overall value.

 Semiconductor Components Industries, LLC, 2000 267 Publication Order Number:


December, 2000 – Rev. 4 2N7002LT1/D
2N7002LT1

ELECTRICAL CHARACTERISTICS (TA = 25°C unless otherwise noted)


Characteristic Symbol Min Typ Max Unit

OFF CHARACTERISTICS
Drain–Source Breakdown Voltage V(BR)DSS 60 – – Vdc
(VGS = 0, ID = 10 µAdc)
Zero Gate Voltage Drain Current TJ = 25°C IDSS – – 1.0 µAdc
(VGS = 0, VDS = 60 Vdc) TJ = 125°C – – 500
Gate–Body Leakage Current, Forward IGSSF – – 100 nAdc
(VGS = 20 Vdc)
Gate–Body Leakage Current, Reverse IGSSR – – –100 nAdc
(VGS = –?20 Vdc)

ON CHARACTERISTICS (Note 2.)


Gate Threshold Voltage VGS(th) 1.0 – 2.5 Vdc
(VDS = VGS, ID = 250 µAdc)
On–State Drain Current ID(on) 500 – – mA
(VDS ≥ 2.0 VDS(on), VGS = 10 Vdc)
Static Drain–Source On–State Voltage VDS(on) Vdc
(VGS = 10 Vdc, ID = 500 mAdc) – – 3.75
(VGS = 5.0 Vdc, ID = 50 mAdc) – – 0.375
Static Drain–Source On–State Resistance rDS(on) Ohms
(VGS = 10 V, ID = 500 mAdc) TC = 25°C – – 7.5
TC = 125°C – – 13.5
(VGS = 5.0 Vdc, ID = 50 mAdc) TC = 25°C – – 7.5
TC = 125°C – – 13.5
Forward Transconductance gFS 80 – – mmhos
(VDS ≥ 2.0 VDS(on), ID = 200 mAdc)

DYNAMIC CHARACTERISTICS
Input Capacitance Ciss – – 50 pF
(VDS = 25 Vdc, VGS = 0, f = 1.0 MHz)
Output Capacitance Coss – – 25 pF
(VDS = 25 Vdc, VGS = 0, f = 1.0 MHz)
Reverse Transfer Capacitance Crss – – 5.0 pF
(VDS = 25 Vdc, VGS = 0, f = 1.0 MHz)

SWITCHING CHARACTERISTICS (Note 2.)


Turn–On Delay Time (VDD = 25 Vdc, ID ^ 500 mAdc, td(on) – – 20 ns
Turn–Off Delay Time RG = 25 Ω, RL = 50 Ω, Vgen = 10 V) td(off) – – 40 ns

BODY–DRAIN DIODE RATINGS


Diode Forward On–Voltage VSD – – –1.5 Vdc
(IS = 11.5 mAdc, VGS = 0 V)
Source Current Continuous IS – – –115 mAdc
(Body Diode)
Source Current Pulsed ISM – – –800 mAdc
2. Pulse Test: Pulse Width ≤ 300 µs, Duty Cycle ≤ 2.0%.

http://onsemi.com
268
2N7002LT1

TYPICAL ELECTRICAL CHARACTERISTICS

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Figure 3. Temperature versus Static Figure 4. Temperature versus Gate


Drain–Source On–Resistance Threshold Voltage

http://onsemi.com
269
2N7002LT1

INFORMATION FOR USING THE SOT–23 SURFACE MOUNT PACKAGE

MINIMUM RECOMMENDED FOOTPRINT FOR SURFACE MOUNTED APPLICATIONS


Surface mount board layout is a critical portion of the interface between the board and the package. With the
total design. The footprint for the semiconductor packages correct pad geometry, the packages will self align when
must be the correct size to insure proper solder connection subjected to a solder reflow process.
4:
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SOT–23 POWER DISSIPATION


The power dissipation of the SOT–23 is a function of the one can calculate the power dissipation of the device which
pad size. This can vary from the minimum pad size for in this case is 225 milliwatts.
soldering to a pad size given for maximum power 150°C – 25°C
PD = = 225 milliwatts
dissipation. Power dissipation for a surface mount device is 556°C/W
determined by TJ(max), the maximum rated junction
temperature of the die, RθJA, the thermal resistance from The 556°C/W for the SOT–23 package assumes the use
the device junction to ambient, and the operating of the recommended footprint on a glass epoxy printed
temperature, TA. Using the values provided on the data circuit board to achieve a power dissipation of 225
sheet for the SOT–23 package, PD can be calculated as milliwatts. There are other alternatives to achieving higher
follows: power dissipation from the SOT–23 package. Another
alternative would be to use a ceramic substrate or an
TJ(max) – TA
PD = aluminum core board such as Thermal Cladt. Using a
RθJA board material such as Thermal Clad, an aluminum core
The values for the equation are found in the maximum board, the power dissipation can be doubled using the same
ratings table on the data sheet. Substituting these values footprint.
into the equation for an ambient temperature TA of 25°C,

SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • The soldering temperature and time shall not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within • When shifting from preheating to soldering, the
a short time could result in device failure. Therefore, the maximum temperature gradient shall be 5°C or less.
following items should always be observed in order to • After soldering has been completed, the device should
minimize the thermal stress to which the devices are be allowed to cool naturally for at least three minutes.
subjected. Gradual cooling should be used as the use of forced
• Always preheat the device. cooling will increase the temperature gradient and
• The delta temperature between the preheat and result in latent failure due to mechanical stress.
soldering should be 100°C or less.* • Mechanical stress or shock should not be applied
• When preheating and soldering, the temperature of the during cooling.
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When * Soldering a device without preheating can cause
using infrared heating with the reflow soldering excessive thermal shock and stress which can result in
method, the difference shall be a maximum of 10°C. damage to the device.

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" "
Preferred Device

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0 '(
    
N–Channel TO–92

MAXIMUM RATINGS http://onsemi.com


Rating Symbol Value Unit
250 mAMPS
Drain–Source Voltage VDS 200 Vdc
200 VOLTS
Gate–Source Voltage
– Continuous VGS ±20 Vdc RDS(on) = 14 Ω (BS107)
– Non–repetitive (tp ≤ 50 µs) ±30
VGSM Vpk
RDS(on) = 6.4 Ω (BS107A)
Drain Current mAdc
Continuous (Note 1.) ID 250 N–Channel
Pulsed (Note 2.) IDM 500

Total Device Dissipation @ TA = 25°C PD 350 mW
Derate above 25°C
Operating and Storage Junction TJ, Tstg –55 to °C
Temperature Range 150 
1. The Power Dissipation of the package may result in a lower continuous drain
current. 
2. Pulse Test: Pulse Width v 300 µs, Duty Cycle v 2.0%.

TO–92
CASE 29
Style 30

12
3
MARKING DIAGRAM
& PIN ASSIGNMENT

BS107
YWW

1 3
Drain Source

2
Gate

Y = Year
WW = Work Week

ORDERING INFORMATION
See detailed ordering and shipping information in the package
dimensions section on page 274 of this data sheet.

Preferred devices are recommended choices for future use


and best overall value.

 Semiconductor Components Industries, LLC, 2000 271 Publication Order Number:


November, 2000 – Rev. 2 BS107/D
BS107, BS107A

ELECTRICAL CHARACTERISTICS (TA = 25°C unless otherwise noted)


Characteristic Symbol Min Typ Max Unit

OFF CHARACTERISTICS
Zero–Gate–Voltage Drain Current (VDS = 130 Vdc, VGS = 0) IDSS – – 30 nAdc
Drain–Source Breakdown Voltage (VGS = 0, ID = 100 µAdc) V(BR)DSX 200 – – Vdc
Gate Reverse Current (VGS = 15 Vdc, VDS = 0) IGSS – 0.01 10 nAdc
ON CHARACTERISTICS (Note 3.)
Gate Threshold Voltage (ID = 1.0 mAdc, VDS = VGS) VGS(Th) 1.0 – 3.0 Vdc
Static Drain–Source On Resistance rDS(on) Ohms
BS107 (VGS = 2.6 Vdc, ID = 20 mAdc) – – 28
(VGS = 10 Vdc, ID = 200 mAdc) – – 14
BS107A (VGS = 10 Vdc)
(ID = 100 mAdc) – 4.5 6.0
(ID = 250 mAdc) – 4.8 6.4
SMALL–SIGNAL CHARACTERISTICS
Input Capacitance Ciss – 60 – pF
(VDS = 25 Vdc, VGS = 0, f = 1.0 MHz)
Reverse Transfer Capacitance Crss – 6.0 – pF
(VDS = 25 Vdc, VGS = 0, f = 1.0 MHz)
Output Capacitance Coss – 30 – pF
(VDS = 25 Vdc, VGS = 0, f = 1.0 MHz)
Forward Transconductance gfs 200 400 – mmhos
(VDS = 25 Vdc, ID = 250 mAdc)
SWITCHING CHARACTERISTICS
Turn–On Time ton – 6.0 15 ns
Turn–Off Time toff – 12 15 ns
3. Pulse Test: Pulse Width v 300 µs, Duty Cycle v 2.0%.

RESISTIVE SWITCHING

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Figure 1. Switching Test Circuit Figure 2. Switching Waveforms

http://onsemi.com
272
BS107, BS107A

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Figure 7. Saturation Characteristic

http://onsemi.com
273
BS107, BS107A

ORDERING INFORMATION

Device Package Shipping


BS107 TO–92 1000 Unit/Box
BS107RLRA TO–92 2000 Tape & Reel
BS107RL1 TO–92 2000 Tape & Reel
BS107A TO–92 1000 Units/Box
BS107ARLRM TO–92 2000 Ammo Pack
BS107ARLRP TO–92 2000 Ammo Pack
BS107ARL1 TO–92 2000 Tape & Reel

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274
,
Preferred Device

0 
0 '(
     
*
%+%
N–Channel TO–92
http://onsemi.com
This MOSFET is designed for high voltage, high speed switching
applications such as line drivers, relay drivers, CMOS logic, 250 mAMPS
microprocessor or TTL to high voltage interface and high voltage 200 VOLTS
display drivers.
• Low Drive Requirement, VGS = 3.0 V max RDS(on) = 8 Ω
• Inherent Current Sharing Capability Permits Easy Paralleling of N–Channel
many Devices 

MAXIMUM RATINGS
Rating Symbol Value Unit
Drain–Source Voltage VDSS 200 Vdc 

Gate–Source Voltage VGS ±20 Vdc



Drain Current mAdc
Continuous (Note 1.) ID 250
Pulsed (Note 2.) IDM 500
Total Power Dissipation PD TO–92
@ TA = 25°C 350 mW CASE 29
Derate above TA = 25°C 6.4 mW/°C Style 30
Operating and Storage Temperature TJ, Tstg –55 to °C
Range +150 12
3
1. The Power Dissipation of the package may result in a lower continuous drain MARKING DIAGRAM
current. & PIN ASSIGNMENT
2. Pulse Test: Pulse Width v 300 µs, Duty Cycle v 2.0%.

BS108
YWW

1 3
Drain Source

2
Gate
BS108 = Device Code
Y = Year
WW = Work Week

ORDERING INFORMATION

Device Package Shipping

BS108 TO–92 1000 Units/Box

BS108ZL1 TO–92 2000 Ammo Pack

Preferred devices are recommended choices for future use


and best overall value.

 Semiconductor Components Industries, LLC, 2000 275 Publication Order Number:


November, 2000 – Rev. 1 BS108/D
BS108

ELECTRICAL CHARACTERISTICS (TC = 25°C unless otherwise noted)


Characteristic Symbol Min Typ Max Unit
OFF CHARACTERISTICS
Drain–Source Breakdown Voltage V(BR)DS – Vdc
(VGS = 0, ID = 10 µA) 200 – –
Zero Gate Voltage Drain Current IDSS nAdc
(VDSS = 130 Vdc, VGS = 0) – – 30
Gate–Body Leakage Current IGSSF nAdc
(VGS = 15 Vdc, VDS = 0) – – 10
ON CHARACTERISTICS (Note 3.)
Gate Threshold Voltage VGS(th) Vdc
(ID = 1.0 mA, VDS = VGS) 0.5 – 1.5
Static Drain–to–Source On–Resistance rDS(on) Ohms
(VGS = 2.0 Vdc, ID = 50 mA) – – 10
(VGS = 2.8 Vdc, ID = 100 mA) – – 8.0
Drain Cutoff Current IDSX mA
(VGS = 0.2 V, VDS = 70 V) – – 25
DYNAMIC CHARACTERISTICS
Input Capacitance Ciss pF
(VDS = 25 V, VGS = 0, f = 1.0 MHz) – – 150
Output Capacitance Coss pF
(VDS = 25 V, VGS = 0, f = 1.0 MHz) – – 30
Reverse Transfer Capacitance Crss pF
(VDS = 25 V, VGS = 0, f = 1.0 MHz) – – 10

SWITCHING CHARACTERISTICS
Turn–On Time (See Figure 1) td(on) – – 15 ns
Turn–Off Time (See Figure 1) td(off) – – 15 ns
3. Pulse Test: Pulse Width ≤ 300 µs, Duty Cycle = 2.0%.

RESISTIVE SWITCHING

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Figure 1. Switching Test Circuit Figure 2. Switching Waveforms

http://onsemi.com
276
"
Preferred Device

0 
0 '(
    
N–Channel TO–92

MAXIMUM RATINGS http://onsemi.com


Rating Symbol Value Unit
500 mAMPS
Drain–Source Voltage VDS 60 Vdc
60 VOLTS
Gate–Source Voltage
– Continuous VGS ±20 Vdc RDS(on) = 5 Ω
– Non–repetitive (tp ≤ 50 µs) VGSM ±40 Vpk
N–Channel
Drain Current (Note 1.) ID 0.5 Adc

Total Device Dissipation @ TA = 25°C PD 350 mW
Operating and Storage Junction TJ, Tstg –55 to °C
Temperature Range +150
1. The Power Dissipation of the package may result in a lower continuous drain 
current.

TO–92
CASE 29
Style 30

12
3
MARKING DIAGRAM
& PIN ASSIGNMENT

BS170
YWW

1 3
Drain Source

2
Gate

Y = Year
WW = Work Week

ORDERING INFORMATION
See detailed ordering and shipping information in the package
dimensions section on page 278 of this data sheet.

Preferred devices are recommended choices for future use


and best overall value.

 Semiconductor Components Industries, LLC, 2000 277 Publication Order Number:


November, 2000 – Rev. 2 BS170/D
BS170

ELECTRICAL CHARACTERISTICS (TA = 25°C unless otherwise noted)


Characteristic Symbol Min Typ Max Unit

OFF CHARACTERISTICS
Gate Reverse Current IGSS – 0.01 10 nAdc
(VGS = 15 Vdc, VDS = 0)
Drain–Source Breakdown Voltage V(BR)DSS 60 90 – Vdc
(VGS = 0, ID = 100 µAdc)

ON CHARACTERISTICS (Note 2.)


Gate Threshold Voltage VGS(Th) 0.8 2.0 3.0 Vdc
(VDS = VGS, ID = 1.0 mAdc)
Static Drain–Source On Resistance rDS(on) – 1.8 5.0 Ω
(VGS = 10 Vdc, ID = 200 mAdc)
Drain Cutoff Current ID(off) – – 0.5 µA
(VDS = 25 Vdc, VGS = 0 Vdc)
Forward Transconductance gfs – 200 – mmhos
(VDS = 10 Vdc, ID = 250 mAdc)

SMALL–SIGNAL CHARACTERISTICS
Input Capacitance Ciss – – 60 pF
(VDS = 10 Vdc, VGS = 0, f = 1.0 MHz)

SWITCHING CHARACTERISTICS
Turn–On Time ton – 4.0 10 ns
(ID = 0.2 Adc) See Figure 1
Turn–Off Time toff – 4.0 10 ns
(ID = 0.2 Adc) See Figure 1
2. Pulse Test: Pulse Width v 300 µs, Duty Cycle v 2.0%.

ORDERING INFORMATION

Device Package Shipping


BS170 TO–92 1000 Unit/Box
BS170RLRA TO–92 2000 Tape & Reel
BS170RLRM TO–92 2000 Ammo Pack
BS170RLRP TO–92 2000 Ammo Pack
BS170RL1 TO–92 2000 Tape & Reel
BS170ZL1 TO–92 2000 Ammo Pack

http://onsemi.com
278
BS170

RESISTIVE SWITCHING

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Figure 1. Switching Test Circuit Figure 2. Switching Waveforms

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Figure 3. VGS(th) Normalized versus Temperature Figure 4. On–Region Characteristics

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Figure 5. Output Characteristics Figure 6. Capacitance versus


Drain–To–Source Voltage

http://onsemi.com
279
 !
Preferred Device

#$%& '(
"    
N–Channel SOT–23

MAXIMUM RATINGS
http://onsemi.com
Rating Symbol Value Unit
Drain–Source Voltage VDSS 100 Vdc 170 mAMPS
Gate–Source Voltage 100 VOLTS
– Continuous VGS ±20 Vdc
– Non–repetitive (tp ≤ 50 µs) VGSM ±40 Vpk RDS(on) = 6 
Drain Current Adc N–Channel
Continuous (Note 1.) ID 0.17 4
Pulsed (Note 2.) IDM 0.68

THERMAL CHARACTERISTICS
Characteristic Symbol Max Unit
Total Device Dissipation FR–5 PD 225 mW 
Board (Note 3.)
TA = 25°C 1.8 mW/°C
Derate above 25°C
#
Thermal Resistance, Junction to RqJA 556 °C/W
Ambient MARKING
Junction and Storage Temperature TJ, Tstg –55 to +150 °C DIAGRAM
1. The Power Dissipation of the package may result in a lower continuous drain
current. 3
2. Pulse Width v 300 ms, Duty Cycle v 2.0%. SOT–23 SA
3. FR–5 = 1.0  0.75  0.062 in. CASE 318 W
1 STYLE 21
2

SA = Device Code
W = Work Week

PIN ASSIGNMENT
()%
3

1 2
)'1 ;(1

ORDERING INFORMATION

Device Package Shipping

BSS123LT1 SOT–23 3000 Tape & Reel

BSS123LT3 SOT–23 10,000 Tape & Reel

Preferred devices are recommended choices for future use


and best overall value.

 Semiconductor Components Industries, LLC, 2001 280 Publication Order Number:


February, 2001 – Rev. 3 BSS123LT1/D
BSS123LT1

ELECTRICAL CHARACTERISTICS (TA = 25°C unless otherwise noted)


Characteristic Symbol Min Typ Max Unit

OFF CHARACTERISTICS
Drain–Source Breakdown Voltage V(BR)DSS 100 – – Vdc
(VGS = 0, ID = 250 µAdc)
Zero Gate Voltage Drain Current IDSS µAdc
(VGS = 0, VDS = 100 Vdc) TJ = 25°C – – 15
TJ = 125°C – – 60
Gate–Body Leakage Current IGSS – – 50 nAdc
(VGS = 20 Vdc, VDS = 0)

ON CHARACTERISTICS (Note 4.)


Gate Threshold Voltage VGS(th) 0.8 – 2.8 Vdc
(VDS = VGS, ID = 1.0 mAdc)
Static Drain–Source On–Resistance rDS(on) – 5.0 6.0 Ω
(VGS = 10 Vdc, ID = 100 mAdc)
Forward Transconductance gfs 80 – – mmhos
(VDS = 25 Vdc, ID = 100 mAdc)

DYNAMIC CHARACTERISTICS
Input Capacitance Ciss – 20 – pF
(VDS = 25 Vdc, VGS = 0, f = 1.0 MHz)
Output Capacitance Coss – 9.0 – pF
(VDS = 25 Vdc, VGS = 0, f = 1.0 MHz)
Reverse Transfer Capacitance Crss – 4.0 – pF
(VDS = 25 Vdc, VGS = 0, f = 1.0 MHz)

SWITCHING CHARACTERISTICS(4)
Turn–On Delay Time (VCC = 30 Vdc, IC = 0.28 Adc, td(on) – 20 – ns
Turn–Off Delay Time VGS = 10 Vdc, RGS = 50 Ω) td(off) – 40 – ns

REVERSE DIODE
Diode Forward On–Voltage VSD – – 1.3 V
(ID = 0.34 Adc, VGS = 0 Vdc)
4. Pulse Test: Pulse Width v 300 ms, Duty Cycle v 2.0%.

http://onsemi.com
281
BSS123LT1

TYPICAL ELECTRICAL CHARACTERISTICS

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Figure 1. Ohmic Region Figure 2. Transfer Characteristics


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Figure 3. Temperature versus Static Figure 4. Temperature versus Gate


Drain–Source On–Resistance Threshold Voltage

http://onsemi.com
282
BSS123LT1

INFORMATION FOR USING THE SOT–23 SURFACE MOUNT PACKAGE

MINIMUM RECOMMENDED FOOTPRINT FOR SURFACE MOUNTED APPLICATIONS


Surface mount board layout is a critical portion of the interface between the board and the package. With the
total design. The footprint for the semiconductor packages correct pad geometry, the packages will self align when
must be the correct size to insure proper solder connection subjected to a solder reflow process.

4:
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SOT–23
The power dissipation of the SOT–23 is a function of the one can calculate the power dissipation of the device which
pad size. This can vary from the minimum pad size for in this case is 225 milliwatts.
soldering to a pad size given for maximum power 150°C – 25°C
PD = = 225 milliwatts
dissipation. Power dissipation for a surface mount device is 556°C/W
determined by TJ(max), the maximum rated junction
temperature of the die, RθJA, the thermal resistance from The 556°C/W for the SOT–23 package assumes the use
the device junction to ambient, and the operating of the recommended footprint on a glass epoxy printed
temperature, TA. Using the values provided on the data circuit board to achieve a power dissipation of 225
sheet for the SOT–23 package, PD can be calculated as milliwatts. There are other alternatives to achieving higher
follows: power dissipation from the SOT–23 package. Another
alternative would be to use a ceramic substrate or an
TJ(max) – TA
PD = aluminum core board such as Thermal Cladt. Using a
RθJA board material such as Thermal Clad, an aluminum core
The values for the equation are found in the maximum board, the power dissipation can be doubled using the same
ratings table on the data sheet. Substituting these values footprint.
into the equation for an ambient temperature TA of 25°C,

SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • The soldering temperature and time shall not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within • When shifting from preheating to soldering, the
a short time could result in device failure. Therefore, the maximum temperature gradient shall be 5°C or less.
following items should always be observed in order to • After soldering has been completed, the device should
minimize the thermal stress to which the devices are be allowed to cool naturally for at least three minutes.
subjected. Gradual cooling should be used as the use of forced
• Always preheat the device. cooling will increase the temperature gradient and
• The delta temperature between the preheat and result in latent failure due to mechanical stress.
soldering should be 100°C or less.* • Mechanical stress or shock should not be applied
• When preheating and soldering, the temperature of the during cooling.
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When * Soldering a device without preheating can cause
using infrared heating with the reflow soldering excessive thermal shock and stress which can result in
method, the difference shall be a maximum of 10°C. damage to the device.

http://onsemi.com
283
!,
Preferred Device

#$%& '(
    
N–Channel SOT–23
Typical applications are dc–dc converters, power management in
portable and battery–powered products such as computers, printers,
PCMCIA cards, cellular and cordless telephones. http://onsemi.com
• Low Threshold Voltage (VGS(th): 0.5V...1.5V) makes it ideal for low
voltage applications 200 mAMPS
• Miniature SOT–23 Surface Mount Package saves board space 50 VOLTS
RDS(on) = 3.5 
MAXIMUM RATINGS (TA = 25°C unless otherwise noted)
Rating Symbol Value Unit N–Channel
4
Drain–to–Source Voltage VDSS 50 Vdc
Gate–to–Source Voltage – Continuous VGS ± 20 Vdc
Drain Current mA
– Continuous @ TA = 25°C ID 200
– Pulsed Drain Current (tp ≤ 10 µs) IDM 800 

Total Power Dissipation @ TA = 25°C PD 225 mW


Operating and Storage Temperature TJ, Tstg – 55 to °C
#
Range 150

Thermal Resistance – Junction–to–Ambient RθJA 556 °C/W MARKING


Maximum Lead Temperature for Soldering TL 260 °C DIAGRAM
Purposes, for 10 seconds
3
SOT–23 J1
CASE 318 W
1 STYLE 21
2

J1 = Device Code
W = Work Week

PIN ASSIGNMENT
3
()%

1 2
)'1 ;(1

ORDERING INFORMATION

Device Package Shipping

BSS138LT1 SOT–23 3000 Tape & Reel

BSS138LT3 SOT–23 10,000 Tape & Reel

Preferred devices are recommended choices for future use


and best overall value.

 Semiconductor Components Industries, LLC, 2000 284 Publication Order Number:


November, 2000 – Rev. 2 BSS138LT1/D
BSS138LT1

ELECTRICAL CHARACTERISTICS (TA = 25°C unless otherwise noted)


Characteristic Symbol Min Typ Max Unit
OFF CHARACTERISTICS
Drain–to–Source Breakdown Voltage V(BR)DSS 50 – – Vdc
(VGS = 0 Vdc, ID = 250 µAdc)
Zero Gate Voltage Drain Current IDSS µAdc
(VDS = 25 Vdc, VGS = 0 Vdc) – – 0.1
(VDS = 50 Vdc, VGS = 0 Vdc) – – 0.5
Gate–Source Leakage Current (VGS = ± 20 Vdc, VDS = 0 Vdc) IGSS – – ±0.1 µAdc
ON CHARACTERISTICS (Note 1.)
Gate–Source Threshold Voltage VGS(th) 0.5 – 1.5 Vdc
(VDS = VGS, ID = 1.0 mAdc)
Static Drain–to–Source On–Resistance rDS(on) Ohms
(VGS = 2.75 Vdc, ID < 200 mAdc, TA = –40°C to +85°C) – 5.6 10
(VGS = 5.0 Vdc, ID = 200 mAdc) – – 3.5
Forward Transconductance gfs 100 – – mmhos
(VDS = 25 Vdc, ID = 200 mAdc, f = 1.0 kHz)

DYNAMIC CHARACTERISTICS
Input Capacitance (VDS = 25 Vdc, VGS = 0, f = 1 MHz) Ciss – 40 50 pF
Output Capacitance (VDS = 25 Vdc, VGS = 0, f = 1 MHz) Coss – 12 25
Transfer Capacitance (VDG = 25 Vdc, VGS = 0, f = 1 MHz) Crss – 3.5 5.0

SWITCHING CHARACTERISTICS (Note 2.)


Turn–On Delay Time td(on) – – 20 ns
(VDD = 30 Vdc
Vdc, ID = 0.2
0 2 Adc,)
Adc )
Turn–Off Delay Time td(off) – – 20
1. Pulse Test: Pulse Width ≤ 300 µs, Duty Cycle ≤ 2%.
2. Switching characteristics are independent of operating junction temperature.

http://onsemi.com
285
BSS138LT1

TYPICAL ELECTRICAL CHARACTERISTICS

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Figure 1. On–Region Characteristics Figure 2. Transfer Characteristics

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Figure 3. On–Resistance Variation with Figure 4. Threshold Voltage Variation


Temperature with Temperature


  
 

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Figure 5. Gate Charge

http://onsemi.com
286
BSS138LT1

TYPICAL ELECTRICAL CHARACTERISTICS



 


  


 


  
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Figure 8. On–Resistance versus Drain Current Figure 9. On–Resistance versus Drain Current

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Figure 10. Body Diode Forward Voltage Figure 11. Capacitance

http://onsemi.com
287
BSS138LT1

INFORMATION FOR USING THE SOT–23 SURFACE MOUNT PACKAGE

MINIMUM RECOMMENDED FOOTPRINT FOR SURFACE MOUNTED APPLICATIONS


Surface mount board layout is a critical portion of the interface between the board and the package. With the
total design. The footprint for the semiconductor packages correct pad geometry, the packages will self align when
must be the correct size to insure proper solder connection subjected to a solder reflow process.

4:
4: 7$
7$

:7
#

4$
7

4 %21!
8

SOT–23 POWER DISSIPATION


The power dissipation of the SOT–23 is a function of the one can calculate the power dissipation of the device which
drain pad size. This can vary from the minimum pad size in this case is 225 milliwatts.
for soldering to a pad size given for maximum power 150°C – 25°C
PD = = 225 milliwatts
dissipation. Power dissipation for a surface mount device is 556°C/W
determined by TJ(max), the maximum rated junction
temperature of the die, RθJA, the thermal resistance from The 556°C/W for the SOT–23 package assumes the use
the device junction to ambient, and the operating of the recommended footprint on a glass epoxy printed
temperature, TA. Using the values provided on the data circuit board to achieve a power dissipation of 225
sheet for the SOT–23 package, PD can be calculated as milliwatts. There are other alternatives to achieving higher
follows: power dissipation from the SOT–23 package. Another
alternative would be to use a ceramic substrate or an
TJ(max) – TA
PD = aluminum core board such as Thermal Cladt. Using a
RθJA board material such as Thermal Clad, an aluminum core
The values for the equation are found in the maximum board, the power dissipation can be doubled using the same
ratings table on the data sheet. Substituting these values footprint.
into the equation for an ambient temperature TA of 25°C,

SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • The soldering temperature and time shall not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within • When shifting from preheating to soldering, the
a short time could result in device failure. Therefore, the maximum temperature gradient shall be 5°C or less.
following items should always be observed in order to • After soldering has been completed, the device should
minimize the thermal stress to which the devices are be allowed to cool naturally for at least three minutes.
subjected. Gradual cooling should be used as the use of forced
• Always preheat the device. cooling will increase the temperature gradient and
• The delta temperature between the preheat and result in latent failure due to mechanical stress.
soldering should be 100°C or less.* • Mechanical stress or shock should not be applied
• When preheating and soldering, the temperature of the during cooling.
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When * Soldering a device without preheating can cause
using infrared heating with the reflow soldering excessive thermal shock and stress which can result in
method, the difference shall be a maximum of 10°C. damage to the device.

http://onsemi.com
288
,
Preferred Device

#$%& '(
!    
P–Channel SOT–23
These miniature surface mount MOSFETs reduce power loss
conserve energy, making this device ideal for use in small power
management circuitry. Typical applications are dc–dc converters, load http://onsemi.com
switching, power management in portable and battery–powered
products such as computers, printers, cellular and cordless telephones. 130 mAMPS
• Energy Efficient 50 VOLTS
• Miniature SOT–23 Surface Mount Package Saves Board Space RDS(on) = 10 
MAXIMUM RATINGS (TJ = 25°C unless otherwise noted) P–Channel
Rating Symbol Value Unit 4

Drain–to–Source Voltage VDSS 50 Vdc


Gate–to–Source Voltage – Continuous VGS ± 20 Vdc
Drain Current mA
ID 130 
– Continuous @ TA = 25°C
– Pulsed Drain Current (tp ≤ 10 µs) IDM 520
Total Power Dissipation @ TA = 25°C PD 225 mW
#
Operating and Storage Temperature TJ, Tstg – 55 to °C
Range 150
MARKING
Thermal Resistance – Junction–to–Ambient RθJA 556 °C/W DIAGRAM
Maximum Lead Temperature for Soldering TL 260 °C
Purposes, for 10 seconds 3
SOT–23 PD
CASE 318 W
1 STYLE 21
2

PD = Device Code
W = Work Week

PIN ASSIGNMENT
3
()%

1 2
)'1 ;(1

ORDERING INFORMATION

Device Package Shipping

BSS84LT1 SOT–23 3000 Tape & Reel

Preferred devices are recommended choices for future use


and best overall value.

 Semiconductor Components Industries, LLC, 2000 289 Publication Order Number:


November, 2000 – Rev. 2 BSS84LT1/D
BSS84LT1

ELECTRICAL CHARACTERISTICS (TA = 25°C unless otherwise noted)


Characteristic Symbol Min Typ Max Unit
OFF CHARACTERISTICS
Drain–to–Source Breakdown Voltage V(BR)DSS 50 – – Vdc
(VGS = 0 Vdc, ID = 250 µAdc)
Zero Gate Voltage Drain Current IDSS µAdc
(VDS = 25 Vdc, VGS = 0 Vdc) – – 0.1
(VDS = 50 Vdc, VGS = 0 Vdc) – – 15
(VDS = 50 Vdc, VGS = 0 Vdc, TJ = 125°C) – – 60
Gate–Body Leakage Current (VGS = ± 20 Vdc, VDS = 0 Vdc) IGSS – – ±60 µAdc
ON CHARACTERISTICS (Note 1.)
Gate–Source Threaded Voltage VGS(th) 0.8 – 2.0 Vdc
(VDS = VGS, ID = 1.0 mAdc)
Static Drain–to–Source On–Resistance rDS(on) – 5.0 10 Ohms
(VGS = 5.0 Vdc, ID = 100 mAdc)
Transfer Admittance |yfs| 50 – – mS
(VDS = 25 Vdc, ID = 100 mAdc, f = 1.0 kHz)

DYNAMIC CHARACTERISTICS
Input Capacitance (VDS = 5.0 Vdc) Ciss – 30 – pF
Output Capacitance (VDS = 5.0 Vdc) Coss – 10 –
Transfer Capacitance (VDG = 5.0 Vdc) Crss – 5.0 –

SWITCHING CHARACTERISTICS (Note 2.)


Turn–On Delay Time td(on) – 2.5 – ns
Rise Time (VDD = –15
15 Vdc, ID = –2.5
2.5 Adc, tr – 1.0 –
Turn–Off Delay Time RL = 50 Ω) td(off) – 16 –
Fall Time tf – 8.0 –
Gate Charge QT – 6000 – pC
SOURCE–DRAIN DIODE CHARACTERISTICS
Continuous Current IS – – 0.130 A
Pulsed Current ISM – – 0.520
Forward Voltage (Note 2.) VSD – 2.5 – V
1. Pulse Test: Pulse Width ≤ 300 µs, Duty Cycle ≤ 2%.
2. Switching characteristics are independent of operating junction temperature.

TYPICAL ELECTRICAL CHARACTERISTICS


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Figure 1. Transfer Characteristics Figure 2. On–Region Characteristics

http://onsemi.com
290
BSS84LT1

TYPICAL ELECTRICAL CHARACTERISTICS



 


  


 


  
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Figure 3. On–Resistance versus Drain Current Figure 4. On–Resistance versus Drain Current

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Figure 5. On–Resistance Variation with Temperature Figure 6. Gate Charge


  

  

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Figure 7. Body Diode Forward Voltage

http://onsemi.com
291
BSS84LT1

INFORMATION FOR USING THE SOT–23 SURFACE MOUNT PACKAGE

MINIMUM RECOMMENDED FOOTPRINT FOR SURFACE MOUNTED APPLICATIONS


Surface mount board layout is a critical portion of the interface between the board and the package. With the
total design. The footprint for the semiconductor packages correct pad geometry, the packages will self align when
must be the correct size to insure proper solder connection subjected to a solder reflow process.

4:
4: 7$
7$

:7
#

4$
7

4 %21!
8

SOT–23 POWER DISSIPATION


The power dissipation of the SOT–23 is a function of the one can calculate the power dissipation of the device which
drain pad size. This can vary from the minimum pad size in this case is 225 milliwatts.
for soldering to a pad size given for maximum power 150°C – 25°C
PD = = 225 milliwatts
dissipation. Power dissipation for a surface mount device is 556°C/W
determined by TJ(max), the maximum rated junction
temperature of the die, RθJA, the thermal resistance from The 556°C/W for the SOT–23 package assumes the use
the device junction to ambient, and the operating of the recommended footprint on a glass epoxy printed
temperature, TA. Using the values provided on the data circuit board to achieve a power dissipation of 225
sheet for the SOT–23 package, PD can be calculated as milliwatts. There are other alternatives to achieving higher
follows: power dissipation from the SOT–23 package. Another
alternative would be to use a ceramic substrate or an
TJ(max) – TA
PD = aluminum core board such as Thermal Cladt. Using a
RθJA board material such as Thermal Clad, an aluminum core
The values for the equation are found in the maximum board, the power dissipation can be doubled using the same
ratings table on the data sheet. Substituting these values footprint.
into the equation for an ambient temperature TA of 25°C,

SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • The soldering temperature and time shall not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within • When shifting from preheating to soldering, the
a short time could result in device failure. Therefore, the maximum temperature gradient shall be 5°C or less.
following items should always be observed in order to • After soldering has been completed, the device should
minimize the thermal stress to which the devices are be allowed to cool naturally for at least three minutes.
subjected. Gradual cooling should be used as the use of forced
• Always preheat the device. cooling will increase the temperature gradient and
• The delta temperature between the preheat and result in latent failure due to mechanical stress.
soldering should be 100°C or less.* • Mechanical stress or shock should not be applied
• When preheating and soldering, the temperature of the during cooling.
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When * Soldering a device without preheating can cause
using infrared heating with the reflow soldering excessive thermal shock and stress which can result in
method, the difference shall be a maximum of 10°C. damage to the device.

http://onsemi.com
292
#!
!
Preferred Device


 
  !  
N–Channel TO–220 and D2PAK
This Logic Level Insulated Gate Bipolar Transistor (IGBT) features http://onsemi.com
monolithic circuitry integrating ESD and Over–Voltage clamped
protection for use in inductive coil drivers applications. Primary uses 15 AMPERES
include Ignition, Direct Fuel Injection, or wherever high voltage and 350 VOLTS (Clamped)
high current switching is required.
VCE(on) @ 10 A = 1.8 V Max
• Ideal for Coil–On–Plug, IGBT–On–Coil, or Distributorless Ignition
System Applications N–Channel
• High Pulsed Current Capability up to 50 A C
• Gate–Emitter ESD Protection
• Temperature Compensated Gate–Collector Voltage Clamp Limits
G RG
Stress Applied to Load
• Integrated ESD Diode Protection RGE
• Low Threshold Voltage to Interface Power Loads to Logic or
Microprocessor Devices 4
• Low Saturation Voltage E

• Optional Gate Resistor (RG) 4

1 2
MAXIMUM RATINGS (–55°C ≤ TJ ≤ 175°C unless otherwise noted)
3
Rating Symbol Value Unit
TO–220AB D2PAK
Collector–Emitter Voltage VCES 380 VDC CASE 221A CASE 418B
STYLE 9 STYLE 4
Collector–Gate Voltage VCER 380 VDC 1
2
Gate–Emitter Voltage VGE 22 VDC 3 MARKING DIAGRAMS
& PIN ASSIGNMENTS
Collector Current–Continuous IC 15 ADC
4 4
@ TC = 25°C – Pulsed 50 AAC
Collector Collector
ESD (Human Body Model) ESD kV
R = 1500 Ω, C = 100 pF 8.0
ESD (Machine Model) R = 0 Ω, C = 200 pF ESD 800 V G15N35CL
YWW
Total Power Dissipation @ TC = 25°C PD 150 Watts G15N35CL
Derate above 25°C 1.0 W/°C YWW
1 3
Operating and Storage Temperature Range TJ, Tstg –55 to °C Gate Emitter
1 3 2
175
Gate Emitter Collector
UNCLAMPED COLLECTOR–TO–EMITTER AVALANCHE
CHARACTERISTICS (–55°C ≤ TJ ≤ 175°C) 2
G15N35CL = Device Code
Collector
Y = Year
Characteristic Symbol Value Unit
WW = Work Week
Single Pulse Collector–to–Emitter Avalanche EAS mJ
Energy ORDERING INFORMATION
VCC = 50 V, VGE = 5.0 V, Pk IL = 17.4 A, L 300
= 2.0 mH, Starting TJ = 25°C Device Package Shipping
VCC = 50 V, VGE = 5.0 V, Pk IL = 14.2 A, L 200
MGP15N35CL TO–220 50 Units/Rail
= 2.0 mH, Starting TJ = 150°C
MGB15N35CLT4 D2PAK 800 Tape & Reel
Reverse Avalanche Energy EAS(R) mJ
VCC = 100 V, VGE = 20 V, L = 3.0 mH, 1000
Pk IL = 25.8 A, Starting TJ = 25°C Preferred devices are recommended choices for future use
and best overall value.

 Semiconductor Components Industries, LLC, 2001 293 Publication Order Number:


March, 2001 – Rev. 4 MGP15N35CL/D
MGP15N35CL, MGB15N35CL

THERMAL CHARACTERISTICS
Characteristic Symbol Value Unit
Thermal Resistance, Junction to Case RθJC 1.0 °C/W
Thermal Resistance, Junction to Ambient TO–220 RθJA 62.5

D2PAK (Note 1.) RθJA 50


Maximum Lead Temperature for Soldering Purposes, 1/8″ from case for 5 seconds TL 275 °C

ELECTRICAL CHARACTERISTICS
Characteristic Symbol Test Conditions Temperature Min Typ Max Unit
OFF CHARACTERISTICS
Collector–Emitter
Collector Emitter Clamp
Clam Voltage BVCES IC = 2.0 mA TJ = –40°C
40 C to 320 350 380 VDC
150°C
IC = 10 mA TJ = –40°C to 330 360 380
150°C

Zero Gate Voltage


g Collector Current ICES TJ = 25°C – 1.5 20 µADC
µ
VCE = 300 V,
V
TJ = 150°C – 10 40*
VGE = 0 V
TJ = –40°C – 0.7 1.5
Reverse Collector–Emitter Leakage
g Current IECS TJ = 25°C – 0.35 1.0 mA
VCE = –24
24 V
TJ = 150°C – 8.0 15*
TJ = –40°C – 0.05 0.5
Reverse Collector–Emitter Clamp Voltage
g BVCES(R) TJ = 25°C 25 33 50 VDC
IC = –75
75 mA
A
TJ = 150°C 25 36 50
TJ = –40°C 25 30 50
Gate–Emitter Clamp Voltage BVGES IG = 5.0 mA TJ = –40°C to 17 20 22 VDC
150°C
Gate–Emitter Leakage Current IGES VGE = 10 V TJ = –40°C to 384 600 1000 µADC
150°C
Gate Resistor (Optional) RG – TJ = –40°C to – 70 – Ω
150°C
Gate Emitter Resistor RGE – TJ = –40°C to 10 16 26 kΩ
150°C
ON CHARACTERISTICS (Note 2.)
g
Gate Threshold Voltage VGE(th) TJ = 25°C 1.4 1.7 2.0 VDC
IC = 1.0
1 0 mA,
A
TJ = 150°C 0.75 1.1 1.4
VGE = VCE
TJ = –40°C 1.6 1.9 2.1*
Threshold Temperature Coefficient – – – – 4.4 – mV/°C
(Negative)
1. When surface mounted to an FR4 board using the minimum recommended pad size.
2. Pulse Test: Pulse Width v 300 µS, Duty Cycle v 2%.
*Maximum Value of Characteristic across Temperature Range.

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MGP15N35CL, MGB15N35CL

ELECTRICAL CHARACTERISTICS (continued)


Characteristic Symbol Test Conditions Temperature Min Typ Max Unit
ON CHARACTERISTICS (continued) (Note 3.)
g
Collector–to–Emitter On–Voltage VCE(on) TJ = 25°C 1.0 1.3 1.6 VDC
IC = 6.0
6 0 A,
A
TJ = 150°C 0.9 1.2 1.5
VGE = 4.0 V
TJ = –40°C 1.1 1.4 1.7*
TJ = 25°C 1.3 1.6 1.9
IC = 10 A,
A
TJ = 150°C 1.2 1.5 1.8
VGE = 4.0 V
TJ = –40°C 1.3 1.6 1.9*
TJ = 25°C 1.6 1.95 2.25
IC = 15 A,
A
TJ = 150°C 1.7 2.0 2.3*
VGE = 4.0 V
TJ = –40°C 1.6 1.9 2.2
TJ = 25°C 1.9 2.2 2.5
IC = 20 A,
A
TJ = 150°C 2.1 2.4 2.7*
VGE = 4.0 V
TJ = –40°C 1.85 2.15 2.45
TJ = 25°C 2.1 2.5 2.9
IC = 25 A,
A
TJ = 150°C 2.5 2.9 3.3*
VGE = 4.0 V
TJ = –40°C 2.0 2.4 2.8
Collector–to–Emitter On–Voltage VCE(on) IC = 10 A, VGE = 4.5 V TJ = 150°C – 1.5 1.8 VDC
Forward Transconductance gfs VCE = 5.0 V, IC = 6.0 A TJ = –40°C to 8.0 15 25 Mhos
150°C
DYNAMIC CHARACTERISTICS
Input Capacitance CISS – 1000 1300 pF
VCC = 25 VV, VGE = 0 V TJ = –40°C
40°C to
Output Capacitance COSS – 100 130
f = 1.0 MHz 150°C
Transfer Capacitance CRSS – 5.0 8.0
SWITCHING CHARACTERISTICS (Note 3.)
Turn–Off Delayy Time (Inductive)
( ) td(off) VCC = 300 V,, IC = 6.5 A TJ = 25°C – 4.0 10 µSec
µ
RG = 1
1.0 kΩ, L = 300 µH
0 kΩ H
TJ = 150°C – 4.5 10
Fall Time ((Inductive)) tf VCC = 300 V,, IC = 6.5 A TJ = 25°C – 7.0 10
RG = 1
1.0 kΩ, L = 300 µH
0 kΩ H
TJ = 150°C – 10 15*
Turn–Off Delay
y Time ((Resistive)) td(off) VCC = 300 V,, IC = 6.5 A TJ = 25°C – 4.0 10 µSec
µ
RG = 1
1.0 kΩ, RL = 46 Ω
0 kΩ Ω,
TJ = 150°C – 4.5 10
Fall Time ((Resistive)) tf VCC = 300 V,, IC = 6.5 A TJ = 25°C – 13 20
RG = 1
1.0 kΩ, RL = 46 Ω
0 kΩ Ω,
TJ = 150°C – 16 20
Turn–On Delay
y Time td(on) VCC = 10 V,, IC = 6.5 A TJ = 25°C – 1.0 1.5 µSec
µ
RG = 1
1.0
0 kΩ
kΩ, RL = 1 5Ω
1.5
TJ = 150°C – 1.0 1.5
Rise Time tr VCC = 10 V,, IC = 6.5 A TJ = 25°C – 4.5 6.0
RG = 1
1.0
0 kΩ
kΩ, RL = 1 5Ω
1.5
TJ = 150°C – 5.0 6.0
3. Pulse Test: Pulse Width v 300 µS, Duty Cycle v 2%.
*Maximum Value of Characteristic across Temperature Range.

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MGP15N35CL, MGB15N35CL

TYPICAL ELECTRICAL CHARACTERISTICS (unless otherwise noted)

60 60
IC, COLLECTOR CURRENT (AMPS)

IC, COLLECTOR CURRENT (AMPS)


VGE = 10.0 V VGE = 4.5 V VGE = 10.0 V VGE = 4.5 V
50 50
VGE = 5.0 V VGE = 5.0 V
40 VGE = 4.0 V 40
VGE = 4.0 V
30 TJ = 25°C 30 TJ = 150°C
VGE = 3.5 V VGE = 3.5 V
20 20
VGE = 3.0 V
VGE = 3.0 V
10 10 VGE = 2.5 V
VGE = 2.5 V
0 0
0 1 2 3 4 5 6 7 8 0 1 2 3 4 5 6 7 8
VCE, COLLECTOR TO EMITTER VOLTAGE (VOLTS) VCE, COLLECTOR TO EMITTER VOLTAGE (VOLTS)

Figure 1. Output Characteristics Figure 2. Output Characteristics

VCE, COLLECTOR TO EMITTER VOLTAGE (VOLTS)


30 4.0
IC, COLLECTOR CURRENT (AMPS)

3.5 VGE = 5.0 V


25 VCE = 10 V
3.0 IC = 25 A
IC = 20 A
20
2.5

15 2.0
TJ = 150°C
1.5
10
TJ = 25°C 1.0 IC = 15 A IC = 5 A
5 TJ = –40°C
0.5
IC = 10 A
0 0.0
0 0.5 1 1.5 2 2.5 3 3.5 4 4.5 5 –50 –25 0 25 50 75 100 125 150
VGE, GATE TO EMITTER VOLTAGE (VOLTS) TJ, JUNCTION TEMPERATURE (°C)

Figure 3. Transfer Characteristics Figure 4. Collector–to–Emitter Saturation


Voltage vs. Junction Temperature

10000 2.5
Mean + 4 σ
THRESHOLD VOLTAGE (VOLTS)

IC = 1 mA
Mean
Ciss 2.0
C, CAPACITANCE (pF)

1000

1.5
Coss
100 Mean – 4 σ

1.0

10
Crss
0.5

1 0.0
0 20 40 60 80 100 120 140 160 180 200 –50 –25 0 25 50 75 100 125 150
VCE, COLLECTOR TO EMITTER VOLTAGE (VOLTS) TEMPERATURE (°C)

Figure 5. Capacitance Variation Figure 6. Threshold Voltage vs. Temperature

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MGP15N35CL, MGB15N35CL

30 30
VCC = 50 V VCC = 50 V
IL, LATCH CURRENT (AMPS)

IL, LATCH CURRENT (AMPS)


25 VGE = 5.0 V 25 VGE = 5.0 V
RG = 1000 Ω RG = 1000 Ω
20 20 L = 2.0 mH
T = 25°C
15 15
L = 3.0 mH
10 10
T = 150°C L = 6.0 mH
5 5

0 0
0 2 4 6 8 10 –50 –25 0 25 50 75 100 125 150 175
INDUCTOR (mH) TEMPERATURE (°C)

Figure 7. Minimum Open Secondary Latch Figure 8. Minimum Open Secondary Latch
Current vs. Inductor Current vs. Temperature

30 30
VCC = 50 V
VCC = 50 V
T = 25°C VGE = 5.0 V
IL, LATCH CURRENT (AMPS)

25 VGE = 5.0 V IL, LATCH CURRENT (AMPS) 25 L = 2.0 mH


RG = 1000 Ω
RG = 1000 Ω
20 20
L = 3.0 mH
15 T = 150°C 15
L = 6.0 mH
10 10

5 5

0 0
0 2 4 6 8 10 –50 –25 0 25 50 75 100 125 150 175
INDUCTOR (mH) TEMPERATURE (°C)

Figure 9. Typical Open Secondary Latch Figure 10. Typical Open Secondary Latch
Current vs. Inductor Current vs. Temperature

12 14
VCC = 300 V
VGE = 5.0 V 12 tf
10
RG = 1000 Ω
SWITCHING TIME (µS)
SWITCHING TIME (µS)

tf
IC = 10 A 10 VCC = 300 V
8 L = 300 µH VGE = 5.0 V
8 RG = 1000 Ω
6 td(off) TJ = 150°C td(off)
6 L = 300 µH
4
4

2 2

0 0
–50 –25 0 25 50 75 100 125 150 0 2 4 6 8 10 12 14 16
TC, CASE TEMPERATURE (°C) IC, COLLECTOR CURRENT (AMPS)

Figure 11. Switching Speed vs. Case Figure 12. Switching Speed vs. Collector
Temperature Current

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MGP15N35CL, MGB15N35CL

14 14
VCC = 300 V
12 VGE = 5.0 V 12 tf
TJ = 25°C
SWITCHING TIME (µS)

SWITCHING TIME (µS)


10 IC = 10 A 10
L = 300 µH VCC = 300 V
8 8 VGE = 5.0 V
tf TJ = 150°C
6 6 IC = 10 A
L = 300 µH td(off)
4 td(off) 4

2 2

0 0
250 500 750 1000 250 500 750 1000
RG, EXTERNAL GATE RESISTANCE (Ω) RG, EXTERNAL GATE RESISTANCE (Ω)

Figure 13. Switching Speed vs. External Gate Figure 14. Switching Speed vs. External Gate
Resistance Resistance

10
R(t), TRANSIENT THERMAL RESISTANCE (°C/Watt)

Duty Cycle = 0.5

1 0.2

0.1

0.05

0.02
0.1
D CURVES APPLY FOR POWER
0.01 P(pk)
PULSE TRAIN SHOWN
t1 READ TIME AT T1
Single Pulse
t2 TJ(pk) – TA = P(pk) RθJA(t)
RθJC ≅ R(t) for t ≤ 0.2 s
DUTY CYCLE, D = t1/t2

0.01
0.00001 0.0001 0.001 0.01 0.1 1 10 100 1000
t,TIME (S)

Figure 15. Transient Thermal Resistance


(Non–normalized Junction–to–Ambient mounted on
fixture in Figure 16)

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298
MGP15N35CL, MGB15N35CL

1.5″

4″
4″

0.125″
4″

Figure 16. Test Fixture for Transient Thermal Curve


(48 square inches of 1/8, thick aluminum)

100 100
COLLECTOR CURRENT (AMPS)
COLLECTOR CURRENT (AMPS)

DC DC
10 100 µs 10
100 µs
1 ms

1 10 ms 1 1 ms
100 ms 10 ms
100 ms
0.1 0.1

0.01 0.01
1 10 100 1000 1 10 100 1000
COLLECTOR–EMITTER VOLTAGE (VOLTS) COLLECTOR–EMITTER VOLTAGE (VOLTS)

Figure 17. Single Pulse Safe Operating Area Figure 18. Single Pulse Safe Operating Area
(Mounted on an Infinite Heatsink at TC = 255C) (Mounted on an Infinite Heatsink at TC = 1255C)

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299
MGP15N35CL, MGB15N35CL

100 100

COLLECTOR CURRENT (AMPS)


COLLECTOR CURRENT (AMPS)

t1 = 1 ms, D = 0.05 t1 = 1 ms, D = 0.05


DC DC
t1 = 2 ms, D = 0.10 t1 = 2 ms, D = 0.10
10 10
t1 = 3 ms, D = 0.30
t1 = 3 ms, D = 0.30

1 1
P(pk) P(pk)

t1 t1
0.1 0.1
t2 t2
DUTY CYCLE, D = t1/t2 DUTY CYCLE, D = t1/t2
0.01 0.01
1 10 100 1000 1 10 100 1000
COLLECTOR–EMITTER VOLTAGE (VOLTS) COLLECTOR–EMITTER VOLTAGE (VOLTS)

Figure 19. Pulse Train Safe Operating Area Figure 20. Pulse Train Safe Operating Area
(Mounted on an Infinite Heatsink at TC = 255C) (Mounted on an Infinite Heatsink at TC = 1255C)

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300
#

Preferred Device


 
    
N–Channel TO–220 and D2PAK
This Logic Level Insulated Gate Bipolar Transistor (IGBT) features http://onsemi.com
monolithic circuitry integrating ESD and Over–Voltage clamped
protection for use in inductive coil drivers applications. Primary uses 15 AMPERES
include Ignition, Direct Fuel Injection, or wherever high voltage and 410 VOLTS (Clamped)
high current switching is required.
VCE(on) @ 10 A = 1.8 V Max
• Ideal for Coil–On–Plug, IGBT–On–Coil, or Distributorless Ignition
System Applications N–Channel
• High Pulsed Current Capability up to 50 A C
• Gate–Emitter ESD Protection
• Temperature Compensated Gate–Collector Voltage Clamp Limits
Stress Applied to Load G RG

• Integrated ESD Diode Protection


RGE
• Low Threshold Voltage to Interface Power Loads to Logic or
Microprocessor Devices
4
• Low Saturation Voltage E

• Optional Gate Resistor (RG) 4

1 2
MAXIMUM RATINGS (–55°C ≤ TJ ≤ 175°C unless otherwise noted)
3
Rating Symbol Value Unit
TO–220AB D2PAK
Collector–Emitter Voltage VCES 380 VDC CASE 221A CASE 418B
STYLE 9 STYLE 4
Collector–Gate Voltage VCER 380 VDC 1
2
Gate–Emitter Voltage VGE 22 VDC 3 MARKING DIAGRAMS
& PIN ASSIGNMENTS
Collector Current–Continuous IC 15 ADC
@ TC = 25°C – Pulsed 50 AAC 4 4
Collector Collector
ESD (Human Body Model) ESD kV
R = 1500 Ω, C = 100 pF 8.0
ESD (Machine Model) R = 0 Ω, C = 200 pF ESD 800 V G15N40CL
YWW
Total Power Dissipation @ TC = 25°C PD 150 Watts G15N40CL
Derate above 25°C 1.0 W/°C YWW
1 3
Operating and Storage Temperature Range TJ, Tstg –55 to °C
Gate 2 Emitter
175 1 3
Gate Emitter Collector
UNCLAMPED COLLECTOR–TO–EMITTER AVALANCHE
CHARACTERISTICS (–55°C ≤ TJ ≤ 175°C) 2 G15N40CL = Device Code
Collector Y = Year
Characteristic Symbol Value Unit
WW = Work Week
Single Pulse Collector–to–Emitter Avalanche EAS mJ
Energy ORDERING INFORMATION
VCC = 50 V, VGE = 5.0 V, Pk IL = 17.4 A, L 300
= 2.0 mH, Starting TJ = 25°C Device Package Shipping
VCC = 50 V, VGE = 5.0 V, Pk IL = 14.2 A, L 200
MGP15N40CL TO–220 50 Units/Rail
= 2.0 mH, Starting TJ = 150°C
Reverse Avalanche Energy EAS(R) mJ MGB15N40CLT4 D2PAK 800 Tape & Reel
VCC = 100 V, VGE = 20 V, L = 3.0 mH, 1000
Pk IL = 25.8 A, Starting TJ = 25°C Preferred devices are recommended choices for future use
and best overall value.

 Semiconductor Components Industries, LLC, 2001 301 Publication Order Number:


March, 2001 – Rev. 5 MGP15N40CL/D
MGP15N40CL, MGB15N40CL

THERMAL CHARACTERISTICS
Characteristic Symbol Value Unit
Thermal Resistance, Junction to Case RθJC 1.0 °C/W
Thermal Resistance, Junction to Ambient TO–220 RθJA 62.5
D2PAK (Note 1.) RθJA 50
Maximum Lead Temperature for Soldering Purposes, 1/8″ from case for 5 seconds TL 275 °C

ELECTRICAL CHARACTERISTICS
Characteristic Symbol Test Conditions Temperature Min Typ Max Unit
OFF CHARACTERISTICS
Collector–Emitter
Collector Emitter Clamp
Clam Voltage BVCES IC = 2.0 mA TJ = –40°C
40 C to 320 350 380 VDC
150°C
IC = 10 mA TJ = –40°C to 330 360 380
150°C

Zero Gate Voltage


g Collector Current ICES TJ = 25°C – 1.5 20 µADC
µ
VCE = 300 V,
V
TJ = 150°C – 10 40*
VGE = 0 V
TJ = –40°C – 0.7 1.5
Reverse Collector–Emitter Leakage
g Current IECS TJ = 25°C – 0.35 1.0 mA
VCE = –24
24 V
TJ = 150°C – 8.0 15*
TJ = –40°C – 0.05 0.5
Reverse Collector–Emitter Clamp Voltage
g BVCES(R) TJ = 25°C 25 33 50 VDC
IC = –75
75 mA
A
TJ = 150°C 25 36 50
TJ = –40°C 25 30 50
Gate–Emitter Clamp Voltage BVGES IG = 5.0 mA TJ = –40°C to 17 20 22 VDC
150°C
Gate–Emitter Leakage Current IGES VGE = 10 V TJ = –40°C to 384 600 1000 µADC
150°C
Gate Resistor (Optional) RG – TJ = –40°C to – 70 – Ω
150°C
Gate Emitter Resistor RGE – TJ = –40°C to 10 16 26 kΩ
150°C
ON CHARACTERISTICS (Note 2.)
g
Gate Threshold Voltage VGE(th) TJ = 25°C 1.4 1.7 2.0 VDC
IC = 1.0
1 0 mA,
A
TJ = 150°C 0.75 1.1 1.4
VGE = VCE
TJ = –40°C 1.6 1.9 2.1*
Threshold Temperature Coefficient – – – – 4.4 – mV/°C
(Negative)
1. When surface mounted to an FR4 board using the minimum recommended pad size.
2. Pulse Test: Pulse Width v 300 µS, Duty Cycle v 2%.
*Maximum Value of Characteristic across Temperature Range.

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MGP15N40CL, MGB15N40CL

ELECTRICAL CHARACTERISTICS (continued)


Characteristic Symbol Test Conditions Temperature Min Typ Max Unit
ON CHARACTERISTICS (continued) (Note 3.)
g
Collector–to–Emitter On–Voltage VCE(on) TJ = 25°C 1.0 1.3 1.6 VDC
IC = 6.0
6 0 A,
A
TJ = 150°C 0.9 1.2 1.5
VGE = 4.0 V
TJ = –40°C 1.1 1.4 1.7*
TJ = 25°C 1.3 1.6 1.9
IC = 10 A,
A
TJ = 150°C 1.2 1.5 1.8
VGE = 4.0 V
TJ = –40°C 1.3 1.6 1.9*
TJ = 25°C 1.6 1.95 2.25
IC = 15 A,
A
TJ = 150°C 1.7 2.0 2.3*
VGE = 4.0 V
TJ = –40°C 1.6 1.9 2.2
TJ = 25°C 1.9 2.2 2.5
IC = 20 A,
A
TJ = 150°C 2.1 2.4 2.7*
VGE = 4.0 V
TJ = –40°C 1.85 2.15 2.45
TJ = 25°C 2.1 2.5 2.9
IC = 25 A,
A
TJ = 150°C 2.5 2.9 3.3*
VGE = 4.0 V
TJ = –40°C 2.0 2.4 2.8
Collector–to–Emitter On–Voltage VCE(on) IC = 10 A, VGE = 4.5 V TJ = 150°C – 1.5 1.8 VDC
Forward Transconductance gfs VCE = 5.0 V, IC = 6.0 A TJ = –40°C to 8.0 15 25 Mhos
150°C
DYNAMIC CHARACTERISTICS
Input Capacitance CISS – 1000 1300 pF
VCC = 25 VV, VGE = 0 V TJ = –40°C
40°C to
Output Capacitance COSS – 100 130
f = 1.0 MHz 150°C
Transfer Capacitance CRSS – 5.0 8.0
SWITCHING CHARACTERISTICS (Note 3.)
Turn–Off Delayy Time (Inductive)
( ) td(off) VCC = 300 V,, IC = 6.5 A TJ = 25°C – 4.0 10 µSec
µ
RG = 1
1.0 kΩ, L = 300 µH
0 kΩ H
TJ = 150°C – 4.5 10
Fall Time ((Inductive)) tf VCC = 300 V,, IC = 6.5 A TJ = 25°C – 7.0 10
RG = 1
1.0 kΩ, L = 300 µH
0 kΩ H
TJ = 150°C – 10 15*
Turn–Off Delay
y Time ((Resistive)) td(off) VCC = 300 V,, IC = 6.5 A TJ = 25°C – 4.0 10 µSec
µ
RG = 1
1.0 kΩ, RL = 46 Ω
0 kΩ Ω,
TJ = 150°C – 4.5 10
Fall Time ((Resistive)) tf VCC = 300 V,, IC = 6.5 A TJ = 25°C – 13 20
RG = 1
1.0 kΩ, RL = 46 Ω
0 kΩ Ω,
TJ = 150°C – 16 20
Turn–On Delay
y Time td(on) VCC = 10 V,, IC = 6.5 A TJ = 25°C – 1.0 1.5 µSec
µ
RG = 1
1.0
0 kΩ
kΩ, RL = 1 5Ω
1.5
TJ = 150°C – 1.0 1.5
Rise Time tr VCC = 10 V,, IC = 6.5 A TJ = 25°C – 4.5 6.0
RG = 1
1.0
0 kΩ
kΩ, RL = 1 5Ω
1.5
TJ = 150°C – 5.0 6.0
3. Pulse Test: Pulse Width v 300 µS, Duty Cycle v 2%.
*Maximum Value of Characteristic across Temperature Range.

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MGP15N40CL, MGB15N40CL

TYPICAL ELECTRICAL CHARACTERISTICS (unless otherwise noted)

60 60
IC, COLLECTOR CURRENT (AMPS)

IC, COLLECTOR CURRENT (AMPS)


VGE = 10.0 V VGE = 4.5 V VGE = 10.0 V VGE = 4.5 V
50 50
VGE = 5.0 V VGE = 5.0 V
40 VGE = 4.0 V 40
VGE = 4.0 V
30 TJ = 25°C 30 TJ = 150°C
VGE = 3.5 V VGE = 3.5 V
20 20
VGE = 3.0 V
VGE = 3.0 V
10 10 VGE = 2.5 V
VGE = 2.5 V
0 0
0 1 2 3 4 5 6 7 8 0 1 2 3 4 5 6 7 8
VCE, COLLECTOR TO EMITTER VOLTAGE (VOLTS) VCE, COLLECTOR TO EMITTER VOLTAGE (VOLTS)

Figure 1. Output Characteristics Figure 2. Output Characteristics

VCE, COLLECTOR TO EMITTER VOLTAGE (VOLTS)


30 4.0
IC, COLLECTOR CURRENT (AMPS)

3.5 VGE = 5.0 V


25 VCE = 10 V
3.0 IC = 25 A
IC = 20 A
20
2.5

15 2.0
TJ = 150°C
1.5
10
TJ = 25°C 1.0 IC = 15 A IC = 5 A
5 TJ = –40°C
0.5
IC = 10 A
0 0.0
0 0.5 1 1.5 2 2.5 3 3.5 4 4.5 5 –50 –25 0 25 50 75 100 125 150
VGE, GATE TO EMITTER VOLTAGE (VOLTS) TJ, JUNCTION TEMPERATURE (°C)

Figure 3. Transfer Characteristics Figure 4. Collector–to–Emitter Saturation


Voltage vs. Junction Temperature

10000 2.5
Mean + 4 σ
THRESHOLD VOLTAGE (VOLTS)

IC = 1 mA
Mean
Ciss 2.0
C, CAPACITANCE (pF)

1000

1.5
Coss
100 Mean – 4 σ

1.0

10
Crss
0.5

1 0.0
0 20 40 60 80 100 120 140 160 180 200 –50 –25 0 25 50 75 100 125 150
VCE, COLLECTOR TO EMITTER VOLTAGE (VOLTS) TEMPERATURE (°C)

Figure 5. Capacitance Variation Figure 6. Threshold Voltage vs. Temperature

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304
MGP15N40CL, MGB15N40CL

30 30
VCC = 50 V VCC = 50 V
IL, LATCH CURRENT (AMPS)

IL, LATCH CURRENT (AMPS)


25 VGE = 5.0 V 25 VGE = 5.0 V
RG = 1000 Ω RG = 1000 Ω
20 20 L = 2.0 mH
T = 25°C
15 15
L = 3.0 mH
10 10
T = 150°C L = 6.0 mH
5 5

0 0
0 2 4 6 8 10 –50 –25 0 25 50 75 100 125 150 175
INDUCTOR (mH) TEMPERATURE (°C)

Figure 7. Minimum Open Secondary Latch Figure 8. Minimum Open Secondary Latch
Current vs. Inductor Current vs. Temperature

30 30
VCC = 50 V
VCC = 50 V
T = 25°C VGE = 5.0 V
IL, LATCH CURRENT (AMPS)

25 VGE = 5.0 V IL, LATCH CURRENT (AMPS) 25 L = 2.0 mH


RG = 1000 Ω
RG = 1000 Ω
20 20
L = 3.0 mH
15 T = 150°C 15
L = 6.0 mH
10 10

5 5

0 0
0 2 4 6 8 10 –50 –25 0 25 50 75 100 125 150 175
INDUCTOR (mH) TEMPERATURE (°C)

Figure 9. Typical Open Secondary Latch Figure 10. Typical Open Secondary Latch
Current vs. Inductor Current vs. Temperature

12 14
VCC = 300 V
VGE = 5.0 V 12 tf
10
RG = 1000 Ω
SWITCHING TIME (µS)
SWITCHING TIME (µS)

tf
IC = 10 A 10 VCC = 300 V
8 L = 300 µH VGE = 5.0 V
8 RG = 1000 Ω
6 td(off) TJ = 150°C td(off)
6 L = 300 µH
4
4

2 2

0 0
–50 –25 0 25 50 75 100 125 150 0 2 4 6 8 10 12 14 16
TC, CASE TEMPERATURE (°C) IC, COLLECTOR CURRENT (AMPS)

Figure 11. Switching Speed vs. Case Figure 12. Switching Speed vs. Collector
Temperature Current

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305
MGP15N40CL, MGB15N40CL

14 14
VCC = 300 V
12 VGE = 5.0 V 12 tf
TJ = 25°C
SWITCHING TIME (µS)

SWITCHING TIME (µS)


10 IC = 10 A 10
L = 300 µH VCC = 300 V
8 8 VGE = 5.0 V
tf TJ = 150°C
6 6 IC = 10 A
L = 300 µH td(off)
4 td(off) 4

2 2

0 0
250 500 750 1000 250 500 750 1000
RG, EXTERNAL GATE RESISTANCE (Ω) RG, EXTERNAL GATE RESISTANCE (Ω)

Figure 13. Switching Speed vs. External Gate Figure 14. Switching Speed vs. External Gate
Resistance Resistance

10
R(t), TRANSIENT THERMAL RESISTANCE (°C/Watt)

Duty Cycle = 0.5

1 0.2

0.1

0.05

0.02
0.1 D CURVES APPLY FOR POWER
0.01 P(pk)
PULSE TRAIN SHOWN
t1 READ TIME AT T1
Single Pulse
t2 TJ(pk) – TA = P(pk) RθJA(t)
RθJC ≅ R(t) for t ≤ 0.2 s
DUTY CYCLE, D = t1/t2

0.01
0.00001 0.0001 0.001 0.01 0.1 1 10 100 1000
t,TIME (S)

Figure 15. Transient Thermal Resistance


(Non–normalized Junction–to–Ambient mounted on
fixture in Figure 16)

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306
MGP15N40CL, MGB15N40CL

1.5″

4″
4″

0.125″
4″

Figure 16. Test Fixture for Transient Thermal Curve


(48 square inches of 1/8, thick aluminum)

100 100
COLLECTOR CURRENT (AMPS)
COLLECTOR CURRENT (AMPS)

DC DC
10 100 µs 10
100 µs
1 ms

1 10 ms 1 1 ms
100 ms 10 ms
100 ms
0.1 0.1

0.01 0.01
1 10 100 1000 1 10 100 1000
COLLECTOR–EMITTER VOLTAGE (VOLTS) COLLECTOR–EMITTER VOLTAGE (VOLTS)

Figure 17. Single Pulse Safe Operating Area Figure 18. Single Pulse Safe Operating Area
(Mounted on an Infinite Heatsink at TC = 255C) (Mounted on an Infinite Heatsink at TC = 1255C)

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MGP15N40CL, MGB15N40CL

100 100

COLLECTOR CURRENT (AMPS)


COLLECTOR CURRENT (AMPS)

t1 = 1 ms, D = 0.05 t1 = 1 ms, D = 0.05


DC DC
t1 = 2 ms, D = 0.10 t1 = 2 ms, D = 0.10
10 10
t1 = 3 ms, D = 0.30
t1 = 3 ms, D = 0.30

1 1
P(pk) P(pk)

t1 t1
0.1 0.1
t2 t2
DUTY CYCLE, D = t1/t2 DUTY CYCLE, D = t1/t2
0.01 0.01
1 10 100 1000 1 10 100 1000
COLLECTOR–EMITTER VOLTAGE (VOLTS) COLLECTOR–EMITTER VOLTAGE (VOLTS)

Figure 19. Pulse Train Safe Operating Area Figure 20. Pulse Train Safe Operating Area
(Mounted on an Infinite Heatsink at TC = 255C) (Mounted on an Infinite Heatsink at TC = 1255C)

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308
#)!
)!
Preferred Device


 
)  !  
N–Channel TO–220 and D2PAK
This Logic Level Insulated Gate Bipolar Transistor (IGBT) features http://onsemi.com
monolithic circuitry integrating ESD and Over–Voltage clamped
protection for use in inductive coil drivers applications. Primary uses 19 AMPERES
include Ignition, Direct Fuel Injection, or wherever high voltage and 350 VOLTS (Clamped)
high current switching is required.
VCE(on) @ 10 A = 1.8 V Max
• Ideal for IGBT–On–Coil or Distributorless Ignition System
Applications N–Channel
• High Pulsed Current Capability up to 50 A C
• Gate–Emitter ESD Protection
• Temperature Compensated Gate–Collector Voltage Clamp Limits
Stress Applied to Load G
• Integrated ESD Diode Protection RGE
• Low Threshold Voltage to Interface Power Loads to Logic or
Microprocessor Devices 4
• Low Saturation Voltage E
4
• Optional Gate Resistor (RG)
1 2
MAXIMUM RATINGS (–55°C ≤ TJ ≤ 175°C unless otherwise noted)
3
Rating Symbol Value Unit
TO–220AB D2PAK
Collector–Emitter Voltage VCES 380 VDC CASE 221A CASE 418B
STYLE 9 STYLE 4
Collector–Gate Voltage VCER 380 VDC 1
2
Gate–Emitter Voltage VGE 22 VDC 3 MARKING DIAGRAMS
& PIN ASSIGNMENTS
Collector Current – Continuous IC 19 ADC
@ TC = 25°C – Pulsed 50 AAC 4 4
Collector Collector
ESD (Human Body Model) ESD kV
R = 1500 Ω, C = 100 pF 8.0
ESD (Machine Model) R = 0 Ω, C = 200 pF ESD 800 V G19N35CL
YWW
Total Power Dissipation @ TC = 25°C PD 165 Watts
G19N35CL
Derate above 25°C 1.1 W/°C
YWW
Operating and Storage Temperature Range TJ, Tstg –55 to °C 1 3
175 Gate 2 Emitter
1 3
Gate Emitter Collector
UNCLAMPED COLLECTOR–TO–EMITTER AVALANCHE
CHARACTERISTICS (–55°C ≤ TJ ≤ 175°C) 2
G19N35CL = Device Code
Collector
Characteristic Symbol Value Unit Y = Year
WW = Work Week
Single Pulse Collector–to–Emitter Avalanche EAS mJ
Energy
ORDERING INFORMATION
VCC = 50 V, VGE = 5.0 V, Pk IL = 22.4 A, 500
L = 2.0 mH, Starting TJ = 25°C Device Package Shipping
VCC = 50 V, VGE = 5.0 V, Pk IL = 17.4 A, 300
L = 2.0 mH, Starting TJ = 150°C MGP19N35CL TO–220 50 Units/Rail

Reverse Avalanche Energy EAS(R) mJ MGB19N35CLT4 D2PAK 800 Tape & Reel
VCC = 100 V, VGE = 20 V, L = 3.0 mH, 1000
Pk IL = 25.8 A, Starting TJ = 25_C Preferred devices are recommended choices for future use
and best overall value.

 Semiconductor Components Industries, LLC, 2001 309 Publication Order Number:


March, 2001 – Rev. 3 MGP19N35CL/D
MGP19N35CL, MGB19N35CL

THERMAL CHARACTERISTICS
Characteristic Symbol Value Unit
Thermal Resistance, Junction to Case RθJC 0.9 °C/W
Thermal Resistance, Junction to Ambient TO–220 RθJA 62.5
D2PAK (Note 1.) RθJA 50
Maximum Lead Temperature for Soldering Purposes, 1/8″ from case for 5 seconds TL 275 °C

ELECTRICAL CHARACTERISTICS
Characteristic Symbol Test Conditions Temperature Min Typ Max Unit
OFF CHARACTERISTICS
Collector–Emitter Clamp Voltage BVCES IC = 2.0 mA TJ = –40°C to 320 350 380 VDC
150°C
IC = 10 mA TJ = –40°C to 330 360 380
150°C

Zero Gate Voltage


g Collector Current ICES TJ = 25°C – 1.5 20 µADC
µ
VCE = 300 V,
V
TJ = 150°C – 15 40*
VGE = 0 V
TJ = –40°C – 0.7 1.5
Reverse Collector–Emitter Leakage
g Current IECS TJ = 25°C – 0.35 1.0 mA
VCE = –24
24 V
TJ = 150°C – 10 20*
TJ = –40°C – 0.05 0.5
Reverse Collector–Emitter Clamp Voltage
g BVCES(R) TJ = 25°C 25 33 50 VDC
IC = –75
75 mA
A
TJ = 150°C 25 36 50
TJ = –40°C 25 30 50
Gate–Emitter Clamp Voltage BVGES IG = 5.0 mA TJ = –40°C to 17 20 22 VDC
150°C
Gate–Emitter Leakage Current IGES VGE = 10 V TJ = –40°C to 384 500 1000 µADC
150°C
Gate Resistor (Optional) RG – TJ = –40°C to – 70 – Ω
150°C
Gate Emitter Resistor RGE – TJ = –40°C to 10 20 26 kΩ
150°C
ON CHARACTERISTICS (Note 2.)
g
Gate Threshold Voltage VGE(th) TJ = 25°C 1.4 1.7 2.0 VDC
IC = 1.0
1 0 mA,
A
TJ = 150°C 0.75 1.1 1.4
VGE = VCE
TJ = –40°C 1.6 1.9 2.1*
Threshold Temperature Coefficient – – – – 4.4 – mV/°C
(Negative)
1. When surface mounted to an FR4 board using the minimum recommended pad size.
2. Pulse Test: Pulse Width v 300 µS, Duty Cycle v 2%.
*Maximum Value of Characteristic across Temperature Range.

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MGP19N35CL, MGB19N35CL

ELECTRICAL CHARACTERISTICS (continued)


Characteristic Symbol Test Conditions Temperature Min Typ Max Unit
ON CHARACTERISTICS (continued) (Note 3.)
g
Collector–to–Emitter On–Voltage VCE(on) TJ = 25°C 1.0 1.25 1.6 VDC
IC = 6.0
6 0 A,
A
TJ = 150°C 0.8 1.05 1.4
VGE = 4.0 V
TJ = –40°C 1.15 1.4 1.75*
TJ = 25°C 1.2 1.5 1.8
IC = 10 A,
A
TJ = 150°C 1.0 1.3 1.6
VGE = 4.0 V
TJ = –40°C 1.3 1.6 1.9*
TJ = 25°C 1.5 1.75 2.1
IC = 15 A,
A
TJ = 150°C 1.35 1.65 1.95
VGE = 4.0 V
TJ = –40°C 1.5 1.8 2.1*
TJ = 25°C 1.7 2.0 2.3
IC = 20 A,
A
TJ = 150°C 1.6 1.9 2.2
VGE = 4.0 V
TJ = –40°C 1.7 2.0 2.3*
TJ = 25°C 2.0 2.25 2.6
IC = 25 A,
A
TJ = 150°C 2.0 2.3 2.7*
VGE = 4.0 V
TJ = –40°C 2.0 2.2 2.6
Collector–to–Emitter On–Voltage VCE(on) IC = 10 A, VGE = 4.5 V TJ = 150°C – 1.3 1.8 VDC
Forward Transconductance gfs VCE = 5.0 V, IC = 6.0 A TJ = –40°C to 8.0 15 25 Mhos
150°C
DYNAMIC CHARACTERISTICS
Input Capacitance CISS – 1500 1800 pF
VCC = 25 VV, VGE = 0 V TJ = –40°C
40°C to
Output Capacitance COSS – 130 160
f = 1.0 MHz 150°C
Transfer Capacitance CRSS – 6.0 8.0
SWITCHING CHARACTERISTICS (Note 3.)
Turn–Off Delayy Time (Inductive)
( ) td(off) VCC = 300 V,, IC = 10 A TJ = 25°C – 5.0 10 µSec
µ
RG = 1
1.0 kΩ, L = 300 µH
0 kΩ H
TJ = 150°C – 6.0 10
Fall Time ((Inductive)) tf VCC = 300 V,, IC = 10 A TJ = 25°C – 6.0 10
RG = 1
1.0 kΩ, L = 300 µH
0 kΩ H
TJ = 150°C – 11 15*
Turn–Off Delay
y Time ((Resistive)) td(off) VCC = 300 V,, IC = 6.5 A TJ = 25°C – 6.0 10 µSec
µ
RG = 1
1.0 kΩ, RL = 46 Ω
0 kΩ
TJ = 150°C – 7.0 10
Fall Time ((Resistive)) tf VCC = 300 V,, IC = 6.5 A TJ = 25°C – 12 20
RG = 1
1.0 kΩ, RL = 46 Ω
0 kΩ
TJ = 150°C – 18 22*
Turn–On Delay
y Time td(on) VCC = 10 V,, IC = 6.5 A TJ = 25°C – 1.5 2.0 µSec
µ
RG = 1
1.0
0 kΩ
kΩ, RL = 1 5Ω
1.5
TJ = 150°C – 1.5 2.0
Rise Time tr VCC = 10 V,, IC = 6.5 A TJ = 25°C – 4.0 6.0
RG = 1
1.0
0 kΩ
kΩ, RL = 1 5Ω
1.5
TJ = 150°C – 5.0 6.0
3. Pulse Test: Pulse Width v 300 µS, Duty Cycle v 2%.
*Maximum Value of Characteristic across Temperature Range.

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MGP19N35CL, MGB19N35CL

TYPICAL ELECTRICAL CHARACTERISTICS (unless otherwise noted)

60 60
VGE = 4.5 V
IC, COLLECTOR CURRENT (AMPS)

IC, COLLECTOR CURRENT (AMPS)


VGE = 10.0 V VGE = 10.0 V
VGE = 4.0 V
50 50
VGE = 5.0 V VGE = 5.0 V VGE = 4.0 V
40 40
TJ = 25°C VGE = 4.5 V VGE = 3.5 V TJ = 150°C VGE = 3.5 V
30 30

VGE = 3.0 V
20 VGE = 3.0 V 20

VGE = 2.5 V
10 VGE = 2.5 V 10

0 0
0 1 2 3 4 5 6 7 8 0 1 2 3 4 5 6 7 8
VCE, COLLECTOR TO EMITTER VOLTAGE (VOLTS) VCE, COLLECTOR TO EMITTER VOLTAGE (VOLTS)

Figure 1. Output Characteristics Figure 2. Output Characteristics

VCE, COLLECTOR TO EMITTER VOLTAGE (VOLTS)


60 3.0
IC, COLLECTOR CURRENT (AMPS)

55 VCE = 10 V VGE = 5.0 V


50 2.5
IC = 20 A IC = 25 A
45
40 2.0
35
30 1.5
25
20 TJ = 25°C 1.0
IC = 15 A
15 IC = 5 A
10 TJ = 150°C 0.5 IC = 10 A
5 TJ = –40°C
0 0.0
0 0.5 1 1.5 2 2.5 3 3.5 4 4.5 5 –50 –25 0 25 50 75 100 125 150
VGE, GATE TO EMITTER VOLTAGE (VOLTS) TJ, JUNCTION TEMPERATURE (°C)

Figure 3. Transfer Characteristics Figure 4. Collector–to–Emitter Saturation


Voltage vs. Junction Temperature

10000 2.5
Ciss IC = 1 mA
THRESHOLD VOLTAGE (VOLTS)

Mean + 4 σ
1000 2.0 Mean
C, CAPACITANCE (pF)

Coss
100 1.5
Mean – 4 σ

10 Crss 1.0

1 0.5

0 0.0
0 20 40 60 80 100 120 140 160 180 –50 –25 0 25 50 75 100 125 150
VCE, COLLECTOR TO EMITTER VOLTAGE (VOLTS) TEMPERATURE (°C)

Figure 5. Capacitance Variation Figure 6. Threshold Voltage vs. Temperature

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312
MGP19N35CL, MGB19N35CL

14 14
VCC = 300 V
12 VGE = 5.0 V 12 tf
RG = 1000 Ω
SWITCHING TIME (µS)

SWITCHING TIME (µS)


10 IC = 10 A 10
L = 300 µH tf
8 8
td(off)
6 td(off) 6
VCC = 300 V
4 4 VGE = 5.0 V
RG = 1000 Ω
2 2 TJ = 150°C
L = 300 µH
0 0
–50 –25 0 25 50 75 100 125 150 0 2 4 6 8 10 12 14 16
TC, CASE TEMPERATURE (°C) IC, COLLECTOR CURRENT (AMPS)

Figure 7. Switching Speed vs. Case Figure 8. Switching Speed vs. Collector
Temperature Current

30 30
VCC = 50 V
IL, LATCH CURRENT (AMPS)

25 VGE = 5.0 V IL, LATCH CURRENT (AMPS) 25


RG = 1000 Ω L = 2.0 mH
T = 25°C
20 20

15 15 L = 3.0 mH
T = 150°C
10 10 L = 6.0 mH
VCC = 50 V
5 5 VGE = 5.0 V
RG = 1000 Ω
0 0
0 2 4 6 8 10 –50 –25 0 25 50 75 100 125 150 175
INDUCTOR (mH) TEMPERATURE (°C)

Figure 9. Minimum Open Secondary Latch Figure 10. Minimum Open Secondary Latch
Current vs. Inductor Current vs. Temperature

30 30
VCC = 50 V L = 2.0 mH
IL, LATCH CURRENT (AMPS)
IL, LATCH CURRENT (AMPS)

25 T = 25°C VGE = 5.0 V 25


RG = 1000 Ω
L = 3.0 mH
20 20

L = 6.0 mH
15 T = 150°C 15

10 10
VCC = 50 V
5 5 VGE = 5.0 V
RG = 1000 Ω
0 0
0 1 2 3 4 5 6 7 8 9 10 –50 –25 0 25 50 75 100 125 150 175
INDUCTOR (mH) TEMPERATURE (°C)

Figure 11. Typical Open Secondary Latch vs. Figure 12. Typical Open Secondary Latch vs.
Inductor Temperature

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313
MGP19N35CL, MGB19N35CL

R(t), TRANSIENT THERMAL RESISTANCE (°C/Watt) 10

Duty Cycle = 0.5

1 0.2

0.1

0.05

0.02
0.1 D CURVES APPLY FOR POWER
P(pk)
PULSE TRAIN SHOWN
0.01
t1 READ TIME AT T1

t2 TJ(pk) – TA = P(pk) RθJA(t)


Single Pulse RθJC ≅ R(t) for t ≤ 0.2 s
DUTY CYCLE, D = t1/t2

0.01
0.00001 0.0001 0.001 0.01 0.1 1 10 100 1000
t,TIME (S)

Figure 13. Transient Thermal Resistance


(Non–normalized Junction–to–Ambient mounted on
fixture in Figure 14)

1.5″

4″
4″

0.125″
4″

Figure 14. Test Fixture for Transient Thermal Curve


(48 square inches of 1/8, thick aluminum)

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314
MGP19N35CL, MGB19N35CL

100 100

COLLECTOR CURRENT (AMPS)


COLLECTOR CURRENT (AMPS)

DC DC
100 µs
10 10 100 µs

1 ms
1 10 ms 1
1 ms
100 ms 10 ms

0.1 0.1 100 ms

0.01 0.01
1 10 100 1000 1 10 100 1000
COLLECTOR–EMITTER VOLTAGE (VOLTS) COLLECTOR–EMITTER VOLTAGE (VOLTS)

Figure 15. Single Pulse Safe Operating Area Figure 16. Single Pulse Safe Operating Area
(Mounted on an Infinite Heatsink at TC = 255C) (Mounted on an Infinite Heatsink at TC = 1255C)

100 100
t1 = 1 ms
COLLECTOR CURRENT (AMPS)
COLLECTOR CURRENT (AMPS)

DC D = 0.05 DC
t1 = 1 ms
10 t1 = 2 ms 10 D = 0.05
D = 0.10
t1 = 3 ms t1 = 3 ms t1 = 2 ms
D = 0.30 D = 0.30 D = 0.10
1 1
P(pk) P(pk)

t1 t1
0.1 0.1
t2 t2

DUTY CYCLE, D = t1/t2 DUTY CYCLE, D = t1/t2


0.01 0.01
1 10 100 1000 1 10 100 1000
COLLECTOR–EMITTER VOLTAGE (VOLTS) COLLECTOR–EMITTER VOLTAGE (VOLTS)

Figure 17. Pulse Train Safe Operating Area Figure 18. Pulse Train Safe Operating Area
(Mounted on an Infinite Heatsink at TC = 255C) (Mounted on an Infinite Heatsink at TC = 1255C)

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315
( 
Preferred Device

#$%& '(
"    
N–Channel SOT–23
These miniature surface mount MOSFETs low RDS(on) assure
minimal power loss and conserve energy, making these devices ideal
for use in space sensitive power management circuitry. Typical http://onsemi.com
applications are dc–dc converters and power management in portable
and battery–powered products such as computers, printers, PCMCIA 750 mAMPS
cards, cellular and cordless telephones. 20 VOLTS
• Low RDS(on) Provides Higher Efficiency and Extends Battery Life RDS(on) = 85 m
• Miniature SOT–23 Surface Mount Package Saves Board Space
N–Channel
MAXIMUM RATINGS (TJ = 25°C unless otherwise noted) 4
Rating Symbol Value Unit
Drain–to–Source Voltage VDSS 20 Vdc
Gate–to–Source Voltage – Continuous VGS ± 8.0 Vdc

Drain Current mA
– Continuous @ TA = 25°C ID 750
– Pulsed Drain Current (tp ≤ 10 µs) IDM 2000
Total Power Dissipation @ TA = 25°C PD 400 mW #

Operating and Storage Temperature TJ, Tstg – 55 to °C MARKING


Range 150
DIAGRAM
Thermal Resistance – Junction–to–Ambient RθJA 300 °C/W
Maximum Lead Temperature for Soldering TL 260 °C 3
Purposes, 1/8″ from case for 10 SOT–23 NE
seconds CASE 318 W
1 STYLE 21
2

NE = Device Code
W = Work Week

PIN ASSIGNMENT
3
()%

1 2
)'1 ;(1

ORDERING INFORMATION

Device Package Shipping

MGSF1N02ELT1 SOT–23 3000 Tape & Reel

MGSF1N02ELT3 SOT–23 10,000 Tape & Reel

Preferred devices are recommended choices for future use


and best overall value.

 Semiconductor Components Industries, LLC, 2000 316 Publication Order Number:


November, 2000 – Rev. 1 MGSF1N02ELT1/D
MGSF1N02ELT1

ELECTRICAL CHARACTERISTICS (TA = 25°C unless otherwise noted)


Characteristic Symbol Min Typ Max Unit
OFF CHARACTERISTICS
Drain–to–Source Breakdown Voltage V(BR)DSS 20 – – Vdc
(VGS = 0 Vdc, ID = 10 µA)
Zero Gate Voltage Drain Current IDSS µAdc
(VDS = 20 Vdc, VGS = 0 Vdc) – – 1.0
(VDS = 20 Vdc, VGS = 0 Vdc, TJ = 125°C) – – 10
Gate–Source Leakage Current (VGS = ± 8.0 Vdc, VDS = 0 Vdc) IGSS – – ±0.1 µAdc
ON CHARACTERISTICS (Note 1.)
Gate–Source Threshold Voltage VGS(th) 0.5 – 1.0 Vdc
(VDS = VGS, ID = 250 µAdc)
Static Drain–to–Source On–Resistance rDS(on) Ohms
(VGS = 4.5 Vdc, ID = 1.0 A) – – 0.085
(VGS = 2.5 Vdc, ID = 0.75 A) – – 0.115

DYNAMIC CHARACTERISTICS
Input Capacitance (VDS = 5.0 Vdc, VGS = 0 Ciss – 160 – pF
V, f = 1.0 Mhz)
Output Capacitance (VDS = 5.0 Vdc, VGS = 0 Coss – 130 –
V, f = 1.0 Mhz)
Transfer Capacitance (VDG = 5.0 Vdc, VGS = 0 Crss – 60 –
V, f = 1.0 Mhz)

SWITCHING CHARACTERISTICS (Note 2.)


Turn–On Delay Time td(on) – 6.0 – ns
Rise Time (VDD = 5 Vdc, ID = 1.0 Adc, tr – 26 –
Turn–Off Delay Time RL = 5 Ω, RG = 6 Ω) td(off) – 117 –
Fall Time tf – 105 –
Total Gate Charge (VDS = 16 Vdc, ID = 1.2 Adc, QT – 6500 – pC
VGS = 4.0 Vdc)

SOURCE–DRAIN DIODE CHARACTERISTICS


Continuous Current IS – – 0.6 A
Pulsed Current ISM – – 0.75
Forward Voltage (Note 2.) (VGS = 0 Vdc, IS = 0.6 Adc) VSD – – 1.2 V
1. Pulse Test: Pulse Width ≤ 300 µs, Duty Cycle ≤ 2%.
2. Switching characteristics are independent of operating junction temperature.
TYPICAL ELECTRICAL CHARACTERISTICS
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Figure 1. Transfer Characteristics Figure 2. On–Region Characteristics

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317
MGSF1N02ELT1

TYPICAL ELECTRICAL CHARACTERISTICS

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Figure 3. On–Resistance versus Drain Current Figure 4. On–Resistance versus Drain Current

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Figure 5. On–Resistance Variation Over Figure 6. Gate Charge


Temperature

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Figure 7. Body Diode Forward Voltage Figure 8. Capacitance Variation

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318
MGSF1N02ELT1

INFORMATION FOR USING THE SOT–23 SURFACE MOUNT PACKAGE

MINIMUM RECOMMENDED FOOTPRINT FOR SURFACE MOUNTED APPLICATIONS


Surface mount board layout is a critical portion of the interface between the board and the package. With the
total design. The footprint for the semiconductor packages correct pad geometry, the packages will self align when
must be the correct size to insure proper solder connection subjected to a solder reflow process.

4:
4: 7$
7$

:7
#

4$
7

4 %21!
8

SOT–23 POWER DISSIPATION


The power dissipation of the SOT–23 is a function of the one can calculate the power dissipation of the device which
drain pad size. This can vary from the minimum pad size in this case is 416 milliwatts.
for soldering to a pad size given for maximum power 150°C – 25°C
PD = = 416 milliwatts
dissipation. Power dissipation for a surface mount device is 300°C/W
determined by TJ(max), the maximum rated junction
temperature of the die, RθJA, the thermal resistance from The 300°C/W for the SOT–23 package assumes the use
the device junction to ambient, and the operating of the recommended footprint on a glass epoxy printed
temperature, TA. Using the values provided on the data circuit board to achieve a power dissipation of 416
sheet for the SOT–23 package, PD can be calculated as milliwatts. There are other alternatives to achieving higher
follows: power dissipation from the SOT–23 package. Another
alternative would be to use a ceramic substrate or an
TJ(max) – TA
PD = aluminum core board such as Thermal Cladt. Using a
RθJA board material such as Thermal Clad, an aluminum core
The values for the equation are found in the maximum board, the power dissipation can be doubled using the same
ratings table on the data sheet. Substituting these values footprint.
into the equation for an ambient temperature TA of 25°C,

SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • The soldering temperature and time shall not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within • When shifting from preheating to soldering, the
a short time could result in device failure. Therefore, the maximum temperature gradient shall be 5°C or less.
following items should always be observed in order to • After soldering has been completed, the device should
minimize the thermal stress to which the devices are be allowed to cool naturally for at least three minutes.
subjected. Gradual cooling should be used as the use of forced
• Always preheat the device. cooling will increase the temperature gradient and
• The delta temperature between the preheat and result in latent failure due to mechanical stress.
soldering should be 100°C or less.* • Mechanical stress or shock should not be applied
• When preheating and soldering, the temperature of the during cooling.
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When * Soldering a device without preheating can cause
using infrared heating with the reflow soldering excessive thermal shock and stress which can result in
method, the difference shall be a maximum of 10°C. damage to the device.

http://onsemi.com
319
( 
Preferred Device

#$%& '(
"    
N–Channel SOT–23
These miniature surface mount MOSFETs low RDS(on) assure
minimal power loss and conserve energy, making these devices ideal
for use in space sensitive power management circuitry. Typical http://onsemi.com
applications are dc–dc converters and power management in portable
and battery–powered products such as computers, printers, PCMCIA 750 mAMPS
cards, cellular and cordless telephones. 20 VOLTS
• Low RDS(on) Provides Higher Efficiency and Extends Battery Life RDS(on) = 90 m
• Miniature SOT–23 Surface Mount Package Saves Board Space
N–Channel
MAXIMUM RATINGS (TJ = 25°C unless otherwise noted) 4
Rating Symbol Value Unit
Drain–to–Source Voltage VDSS 20 Vdc
Gate–to–Source Voltage – Continuous VGS ± 20 Vdc

Drain Current
– Continuous @ TA = 25°C ID 750 mA
– Pulsed Drain Current (tp ≤ 10 µs) IDM 2000
Total Power Dissipation @ TA = 25°C PD 400 mW #

Operating and Storage Temperature TJ, Tstg – 55 to °C MARKING


Range 150
DIAGRAM
Thermal Resistance – Junction–to–Ambient RθJA 300 °C/W
Maximum Lead Temperature for Soldering TL 260 °C 3
Purposes, 1/8″ from case for 10 SOT–23 N2
seconds CASE 318 W
1 STYLE 21
2

N2 = Device Code
W = Work Week

PIN ASSIGNMENT
3
()%

1 2
)'1 ;(1

ORDERING INFORMATION

Device Package Shipping

MGSF1N02LT1 SOT–23 3000 Tape & Reel

MGSF1N02LT3 SOT–23 10,000 Tape & Reel

Preferred devices are recommended choices for future use


and best overall value.

 Semiconductor Components Industries, LLC, 2000 320 Publication Order Number:


November, 2000 – Rev. 3 MGSF1N02LT1/D
MGSF1N02LT1

ELECTRICAL CHARACTERISTICS (TA = 25°C unless otherwise noted)


Characteristic Symbol Min Typ Max Unit
OFF CHARACTERISTICS
Drain–to–Source Breakdown Voltage V(BR)DSS 20 – – Vdc
(VGS = 0 Vdc, ID = 10 µAdc)
Zero Gate Voltage Drain Current IDSS µAdc
(VDS = 20 Vdc, VGS = 0 Vdc) – – 1.0
(VDS = 20 Vdc, VGS = 0 Vdc, TJ = 125°C) – – 10
Gate–Body Leakage Current (VGS = ± 20 Vdc, VDS = 0 Vdc) IGSS – – ±100 nAdc
ON CHARACTERISTICS (Note 1.)
Gate Threshold Voltage VGS(th) 1.0 1.7 2.4 Vdc
(VDS = VGS, ID = 250 µAdc)
Static Drain–to–Source On–Resistance rDS(on) Ohms
(VGS = 10 Vdc, ID = 1.2 Adc) – 0.075 0.090
(VGS = 4.5 Vdc, ID = 1.0 Adc) – 0.115 0.130

DYNAMIC CHARACTERISTICS
Input Capacitance (VDS = 5.0 Vdc) Ciss – 125 – pF
Output Capacitance (VDS = 5.0 Vdc) Coss – 120 –
Transfer Capacitance (VDG = 5.0 Vdc) Crss – 45 –

SWITCHING CHARACTERISTICS (Note 2.)


Turn–On Delay Time td(on) – 2.5 – ns
Rise Time (VDD = 15 Vdc, ID = 1.0 Adc, tr – 1.0 –
Turn–Off Delay Time RL = 50 Ω) td(off) – 16 –
Fall Time tf – 8.0 –
Gate Charge (See Figure 6) QT – 6000 – pC
SOURCE–DRAIN DIODE CHARACTERISTICS
Continuous Current IS – – 0.6 A
Pulsed Current ISM – – 0.75
Forward Voltage (Note 2.) VSD – 0.8 – V
1. Pulse Test: Pulse Width ≤ 300 µs, Duty Cycle ≤ 2%.
2. Switching characteristics are independent of operating junction temperature.

TYPICAL ELECTRICAL CHARACTERISTICS

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Figure 1. Transfer Characteristics Figure 2. On–Region Characteristics

http://onsemi.com
321
MGSF1N02LT1

TYPICAL ELECTRICAL CHARACTERISTICS



 


  


 


  
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Figure 3. On–Resistance versus Drain Current Figure 4. On–Resistance versus Drain Current

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Figure 7. Body Diode Forward Voltage Figure 8. Capacitance

http://onsemi.com
322
MGSF1N02LT1

INFORMATION FOR USING THE SOT–23 SURFACE MOUNT PACKAGE

MINIMUM RECOMMENDED FOOTPRINT FOR SURFACE MOUNTED APPLICATIONS


Surface mount board layout is a critical portion of the interface between the board and the package. With the
total design. The footprint for the semiconductor packages correct pad geometry, the packages will self align when
must be the correct size to insure proper solder connection subjected to a solder reflow process.

4:
4: 7$
7$

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#

4$
7

4 %21!
8

SOT–23 POWER DISSIPATION


The power dissipation of the SOT–23 is a function of the one can calculate the power dissipation of the device which
drain pad size. This can vary from the minimum pad size in this case is 416 milliwatts.
for soldering to a pad size given for maximum power 150°C – 25°C
PD = = 416 milliwatts
dissipation. Power dissipation for a surface mount device is 300°C/W
determined by TJ(max), the maximum rated junction
temperature of the die, RθJA, the thermal resistance from The 300°C/W for the SOT–23 package assumes the use
the device junction to ambient, and the operating of the recommended footprint on a glass epoxy printed
temperature, TA. Using the values provided on the data circuit board to achieve a power dissipation of 416
sheet for the SOT–23 package, PD can be calculated as milliwatts. There are other alternatives to achieving higher
follows: power dissipation from the SOT–23 package. Another
alternative would be to use a ceramic substrate or an
TJ(max) – TA
PD = aluminum core board such as Thermal Cladt. Using a
RθJA board material such as Thermal Clad, an aluminum core
The values for the equation are found in the maximum board, the power dissipation can be doubled using the same
ratings table on the data sheet. Substituting these values footprint.
into the equation for an ambient temperature TA of 25°C,

SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • The soldering temperature and time shall not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within • When shifting from preheating to soldering, the
a short time could result in device failure. Therefore, the maximum temperature gradient shall be 5°C or less.
following items should always be observed in order to • After soldering has been completed, the device should
minimize the thermal stress to which the devices are be allowed to cool naturally for at least three minutes.
subjected. Gradual cooling should be used as the use of forced
• Always preheat the device. cooling will increase the temperature gradient and
• The delta temperature between the preheat and result in latent failure due to mechanical stress.
soldering should be 100°C or less.* • Mechanical stress or shock should not be applied
• When preheating and soldering, the temperature of the during cooling.
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When * Soldering a device without preheating can cause
using infrared heating with the reflow soldering excessive thermal shock and stress which can result in
method, the difference shall be a maximum of 10°C. damage to the device.

http://onsemi.com
323
(!
Preferred Device

#$%& '(
"  !  
N–Channel SOT–23
These miniature surface mount MOSFETs low RDS(on) assure
minimal power loss and conserve energy, making these devices ideal
for use in space sensitive power management circuitry. Typical http://onsemi.com
applications are dc–dc converters and power management in portable
and battery–powered products such as computers, printers, PCMCIA 750 mAMPS
cards, cellular and cordless telephones. 30 VOLTS
• Low RDS(on) Provides Higher Efficiency and Extends Battery Life RDS(on) = 100 m
• Miniature SOT–23 Surface Mount Package Saves Board Space
N–Channel
MAXIMUM RATINGS (TJ = 25°C unless otherwise noted) 4
Rating Symbol Value Unit
Drain–to–Source Voltage VDSS 30 Vdc
Gate–to–Source Voltage – Continuous VGS ± 20 Vdc

Drain Current mA
– Continuous @ TA = 25°C ID 750
– Pulsed Drain Current (tp ≤ 10 µs) IDM 2000
Total Power Dissipation @ TA = 25°C PD 400 mW #

Operating and Storage Temperature TJ, Tstg – 55 to °C MARKING


Range 150
DIAGRAM
Thermal Resistance – Junction–to–Ambient RθJA 300 °C/W
Maximum Lead Temperature for Soldering TL 260 °C 3
Purposes, 1/8″ from case for 10 SOT–23 N3
seconds CASE 318 W
1 STYLE 21
2

N3 = Device Code
W = Work Week

PIN ASSIGNMENT
3
()%

1 2
)'1 ;(1

ORDERING INFORMATION

Device Package Shipping

MGSF1N03LT1 SOT–23 3000 Tape & Reel

MGSF1N03LT3 SOT–23 10,000 Tape & Reel

Preferred devices are recommended choices for future use


and best overall value.

 Semiconductor Components Industries, LLC, 2000 324 Publication Order Number:


November, 2000 – Rev. 5 MGSF1N03LT1/D
MGSF1N03LT1

ELECTRICAL CHARACTERISTICS (TA = 25°C unless otherwise noted)


Characteristic Symbol Min Typ Max Unit
OFF CHARACTERISTICS
Drain–to–Source Breakdown Voltage V(BR)DSS 30 – – Vdc
(VGS = 0 Vdc, ID = 10 µAdc)
Zero Gate Voltage Drain Current IDSS µAdc
(VDS = 30 Vdc, VGS = 0 Vdc) – – 1.0
(VDS = 30 Vdc, VGS = 0 Vdc, TJ = 125°C) – – 10
Gate–Body Leakage Current (VGS = ± 20 Vdc, VDS = 0 Vdc) IGSS – – ±100 nAdc
ON CHARACTERISTICS (Note 1.)
Gate Threshold Voltage VGS(th) 1.0 1.7 2.4 Vdc
(VDS = VGS, ID = 250 µAdc)
Static Drain–to–Source On–Resistance rDS(on) Ohms
(VGS = 10 Vdc, ID = 1.2 Adc) – 0.08 0.10
(VGS = 4.5 Vdc, ID = 1.0 Adc) – 0.125 0.145

DYNAMIC CHARACTERISTICS
Input Capacitance (VDS = 5.0 Vdc) Ciss – 140 – pF
Output Capacitance (VDS = 5.0 Vdc) Coss – 100 –
Transfer Capacitance (VDG = 5.0 Vdc) Crss – 40 –

SWITCHING CHARACTERISTICS (Note 2.)


Turn–On Delay Time td(on) – 2.5 – ns
Rise Time (VDD = 15 Vdc, ID = 1.0 Adc, tr – 1.0 –
Turn–Off Delay Time RL = 50 Ω) td(off) – 16 –
Fall Time tf – 8.0 –
Gate Charge (See Figure 6) QT – 6000 – pC
SOURCE–DRAIN DIODE CHARACTERISTICS
Continuous Current IS – – 0.6 A
Pulsed Current ISM – – 0.75
Forward Voltage (Note 2.) VSD – 0.8 – V
1. Pulse Test: Pulse Width ≤ 300 µs, Duty Cycle ≤ 2%.
2. Switching characteristics are independent of operating junction temperature.

TYPICAL ELECTRICAL CHARACTERISTICS

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Figure 1. Transfer Characteristics Figure 2. On–Region Characteristics

http://onsemi.com
325
MGSF1N03LT1

TYPICAL ELECTRICAL CHARACTERISTICS



 


  


 


  
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Figure 3. On–Resistance versus Drain Current Figure 4. On–Resistance versus Drain Current

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Figure 5. On–Resistance Variation with Temperature Figure 6. Gate Charge

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Figure 7. Body Diode Forward Voltage Figure 8. Capacitance

http://onsemi.com
326
MGSF1N03LT1

INFORMATION FOR USING THE SOT–23 SURFACE MOUNT PACKAGE

MINIMUM RECOMMENDED FOOTPRINT FOR SURFACE MOUNTED APPLICATIONS


Surface mount board layout is a critical portion of the interface between the board and the package. With the
total design. The footprint for the semiconductor packages correct pad geometry, the packages will self align when
must be the correct size to insure proper solder connection subjected to a solder reflow process.

4:
4: 7$
7$

:7
#

4$
7

4 %21!
8

SOT–23 POWER DISSIPATION


The power dissipation of the SOT–23 is a function of the one can calculate the power dissipation of the device which
drain pad size. This can vary from the minimum pad size in this case is 416 milliwatts.
for soldering to a pad size given for maximum power 150°C – 25°C
PD = = 416 milliwatts
dissipation. Power dissipation for a surface mount device is 300°C/W
determined by TJ(max), the maximum rated junction
temperature of the die, RθJA, the thermal resistance from The 300°C/W for the SOT–23 package assumes the use
the device junction to ambient, and the operating of the recommended footprint on a glass epoxy printed
temperature, TA. Using the values provided on the data circuit board to achieve a power dissipation of 416
sheet for the SOT–23 package, PD can be calculated as milliwatts. There are other alternatives to achieving higher
follows: power dissipation from the SOT–23 package. Another
alternative would be to use a ceramic substrate or an
TJ(max) – TA
PD = aluminum core board such as Thermal Cladt. Using a
RθJA board material such as Thermal Clad, an aluminum core
The values for the equation are found in the maximum board, the power dissipation can be doubled using the same
ratings table on the data sheet. Substituting these values footprint.
into the equation for an ambient temperature TA of 25°C,

SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • The soldering temperature and time shall not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within • When shifting from preheating to soldering, the
a short time could result in device failure. Therefore, the maximum temperature gradient shall be 5°C or less.
following items should always be observed in order to • After soldering has been completed, the device should
minimize the thermal stress to which the devices are be allowed to cool naturally for at least three minutes.
subjected. Gradual cooling should be used as the use of forced
• Always preheat the device. cooling will increase the temperature gradient and
• The delta temperature between the preheat and result in latent failure due to mechanical stress.
soldering should be 100°C or less.* • Mechanical stress or shock should not be applied
• When preheating and soldering, the temperature of the during cooling.
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When * Soldering a device without preheating can cause
using infrared heating with the reflow soldering excessive thermal shock and stress which can result in
method, the difference shall be a maximum of 10°C. damage to the device.

http://onsemi.com
327
(# 
Preferred Device

#$%& '(
"    
P–Channel SOT–23
These miniature surface mount MOSFETs low RDS(on) assure
minimal power loss and conserve energy, making these devices ideal
for use in space sensitive power management circuitry. Typical http://onsemi.com
applications are dc–dc converters and power management in portable
and battery–powered products such as computers, printers, PCMCIA 750 mAMPS
cards, cellular and cordless telephones. 20 VOLTS
• Low RDS(on) Provides Higher Efficiency and Extends Battery Life RDS(on) = 260 m
• Miniature SOT–23 Surface Mount Package Saves Board Space
P–Channel
MAXIMUM RATINGS (TJ = 25°C unless otherwise noted) 4
Rating Symbol Value Unit
Drain–to–Source Voltage VDSS 20 Vdc
Gate–to–Source Voltage – Continuous VGS ± 8.0 Vdc

Drain Current mA
– Continuous @ TA = 25°C ID 750
– Pulsed Drain Current (tp ≤ 10 µs) IDM 2000
Total Power Dissipation @ TA = 25°C PD 400 mW #

Operating and Storage Temperature TJ, Tstg – 55 to °C MARKING


Range 150
DIAGRAM
Thermal Resistance – Junction–to–Ambient RθJA 300 °C/W
Maximum Lead Temperature for Soldering TL 260 °C 3
Purposes, 1/8″ from case for 10 SOT–23 PE
seconds CASE 318 W
1 STYLE 21
2

PE = Device Code
W = Work Week

PIN ASSIGNMENT
3
()%

1 2
)'1 ;(1

ORDERING INFORMATION

Device Package Shipping

MGSF1P02ELT1 SOT–23 3000 Tape & Reel

MGSF1P02ELT3 SOT–23 10,000 Tape & Reel

Preferred devices are recommended choices for future use


and best overall value.

 Semiconductor Components Industries, LLC, 2000 328 Publication Order Number:


November, 2000 – Rev. 2 MGSF1P02ELT1/D
MGSF1P02ELT1

ELECTRICAL CHARACTERISTICS (TA = 25°C unless otherwise noted)


Characteristic Symbol Min Typ Max Unit
OFF CHARACTERISTICS
Drain–to–Source Breakdown Voltage V(BR)DSS 20 – – Vdc
(VGS = 0 Vdc, ID = 10 µAdc)
Zero Gate Voltage Drain Current IDSS µAdc
(VDS = 16 Vdc, VGS = 0 Vdc) – – 1.0
(VDS = 16 Vdc, VGS = 0 Vdc, TJ = 125°C) – – 10
Gate–Body Leakage Current (VGS = ± 8.0 Vdc, VDS = 0 Vdc) IGSS – – ±100 nAdc
ON CHARACTERISTICS (Note 1.)
Gate Threshold Voltage VGS(th) 0.7 1.0 1.25 Vdc
(VDS = VGS, ID = 250 µAdc)
Static Drain–to–Source On–Resistance rDS(on) Ohms
(VGS = 4.5 Vdc, ID = 0.75 Adc) – 0.22 0.26
(VGS = 2.5 Vdc, ID = 0.5 Adc) – 0.40 0.50

DYNAMIC CHARACTERISTICS
Input Capacitance (VDS = 5.0 Vdc) Ciss – 140 – pF
Output Capacitance (VDS = 5.0 Vdc) Coss – 130 –
Transfer Capacitance (VDG = 5.0 Vdc) Crss – 50 –

SWITCHING CHARACTERISTICS (Note 2.)


Turn–On Delay Time td(on) – 9.5 – ns
Rise Time (VDD = 5 Vdc, ID = 1.0 Adc, tr – 32 –
Turn–Off Delay Time RL = 5 Ω, RG = 6 Ω) td(off) – 200 –
Fall Time tf – 200 –
Total Gate Charge (VDS = 16 Vdc, ID = 1.5 Adc, QT – 5500 – pC
VGS = 4.0 Vdc)

SOURCE–DRAIN DIODE CHARACTERISTICS


Continuous Current IS – – 0.6 A
Pulsed Current ISM – – 0.75
Forward Voltage (Note 2.) (VGS = 0 Vdc, IS = 0.6 Adc) VSD – – 1.0 V
1. Pulse Test: Pulse Width ≤ 300 µs, Duty Cycle ≤ 2%.
2. Switching characteristics are independent of operating junction temperature.

TYPICAL ELECTRICAL CHARACTERISTICS

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Figure 1. Transfer Characteristics Figure 2. On–Region Characteristics

http://onsemi.com
329
MGSF1P02ELT1

TYPICAL ELECTRICAL CHARACTERISTICS

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Figure 3. On–Resistance versus Drain Current Figure 4. On–Resistance versus Drain Current

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Figure 5. On–Resistance Variation with Temperature Figure 6. Gate Charge

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Figure 7. Body Diode Forward Voltage Figure 8. Capacitance Variation

http://onsemi.com
330
MGSF1P02ELT1

INFORMATION FOR USING THE SOT–23 SURFACE MOUNT PACKAGE

MINIMUM RECOMMENDED FOOTPRINT FOR SURFACE MOUNTED APPLICATIONS


Surface mount board layout is a critical portion of the interface between the board and the package. With the
total design. The footprint for the semiconductor packages correct pad geometry, the packages will self align when
must be the correct size to insure proper solder connection subjected to a solder reflow process.

4:
4: 7$
7$

:7
#

4$
7

4 %21!
8

SOT–23 POWER DISSIPATION


The power dissipation of the SOT–23 is a function of the one can calculate the power dissipation of the device which
drain pad size. This can vary from the minimum pad size in this case is 416 milliwatts.
for soldering to a pad size given for maximum power 150°C – 25°C
PD = = 416 milliwatts
dissipation. Power dissipation for a surface mount device is 300°C/W
determined by TJ(max), the maximum rated junction
temperature of the die, RθJA, the thermal resistance from The 300°C/W for the SOT–23 package assumes the use
the device junction to ambient, and the operating of the recommended footprint on a glass epoxy printed
temperature, TA. Using the values provided on the data circuit board to achieve a power dissipation of 416
sheet for the SOT–23 package, PD can be calculated as milliwatts. There are other alternatives to achieving higher
follows: power dissipation from the SOT–23 package. Another
alternative would be to use a ceramic substrate or an
TJ(max) – TA
PD = aluminum core board such as Thermal Cladt. Using a
RθJA board material such as Thermal Clad, an aluminum core
The values for the equation are found in the maximum board, the power dissipation can be doubled using the same
ratings table on the data sheet. Substituting these values footprint.
into the equation for an ambient temperature TA of 25°C,

SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • The soldering temperature and time shall not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within • When shifting from preheating to soldering, the
a short time could result in device failure. Therefore, the maximum temperature gradient shall be 5°C or less.
following items should always be observed in order to • After soldering has been completed, the device should
minimize the thermal stress to which the devices are be allowed to cool naturally for at least three minutes.
subjected. Gradual cooling should be used as the use of forced
• Always preheat the device. cooling will increase the temperature gradient and
• The delta temperature between the preheat and result in latent failure due to mechanical stress.
soldering should be 100°C or less.* • Mechanical stress or shock should not be applied
• When preheating and soldering, the temperature of the during cooling.
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When * Soldering a device without preheating can cause
using infrared heating with the reflow soldering excessive thermal shock and stress which can result in
method, the difference shall be a maximum of 10°C. damage to the device.

http://onsemi.com
331
(# 
Preferred Device

#$%& '(
"    
P–Channel SOT–23
These miniature surface mount MOSFETs low RDS(on) assure
minimal power loss and conserve energy, making these devices ideal
for use in space sensitive power management circuitry. Typical http://onsemi.com
applications are dc–dc converters and power management in portable
and battery–powered products such as computers, printers, PCMCIA 750 mAMPS
cards, cellular and cordless telephones. 20 VOLTS
• Low RDS(on) Provides Higher Efficiency and Extends Battery Life RDS(on) = 350 m
• Miniature SOT–23 Surface Mount Package Saves Board Space
P–Channel
MAXIMUM RATINGS (TJ = 25°C unless otherwise noted) 4
Rating Symbol Value Unit
Drain–to–Source Voltage VDSS 20 Vdc
Gate–to–Source Voltage – Continuous VGS ± 20 Vdc

Drain Current mA
– Continuous @ TA = 25°C ID 750
– Pulsed Drain Current (tp ≤ 10 µs) IDM 2000
Total Power Dissipation @ TA = 25°C PD 400 mW #

Operating and Storage Temperature TJ, Tstg – 55 to °C MARKING


Range 150
DIAGRAM
Thermal Resistance – Junction–to–Ambient RθJA 300 °C/W
Maximum Lead Temperature for Soldering TL 260 °C 3
Purposes, 1/8″ from case for 10 SOT–23 PC
seconds CASE 318 W
1 STYLE 21
2

PC = Device Code
W = Work Week

PIN ASSIGNMENT
3
()%

1 2
)'1 ;(1

ORDERING INFORMATION

Device Package Shipping

MGSF1P02LT1 SOT–23 3000 Tape & Reel

MGSF1P02LT3 SOT–23 10,000 Tape & Reel

Preferred devices are recommended choices for future use


and best overall value.

 Semiconductor Components Industries, LLC, 2000 332 Publication Order Number:


November, 2000 – Rev. 3 MGSF1P02LT1/D
MGSF1P02LT1

ELECTRICAL CHARACTERISTICS (TA = 25°C unless otherwise noted)


Characteristic Symbol Min Typ Max Unit
OFF CHARACTERISTICS
Drain–to–Source Breakdown Voltage V(BR)DSS 20 – – Vdc
(VGS = 0 Vdc, ID = 10 µAdc)
Zero Gate Voltage Drain Current IDSS µAdc
(VDS = 20 Vdc, VGS = 0 Vdc) – – 1.0
(VDS = 20 Vdc, VGS = 0 Vdc, TJ = 125°C) – – 10
Gate–Body Leakage Current (VGS = ± 20 Vdc, VDS = 0 Vdc) IGSS – – ±100 nAdc
ON CHARACTERISTICS (Note 1.)
Gate Threshold Voltage VGS(th) 1.0 1.7 2.4 Vdc
(VDS = VGS, ID = 250 µAdc)
Static Drain–to–Source On–Resistance rDS(on) Ohms
(VGS = 10 Vdc, ID = 1.5 Adc) – 0.235 0.350
(VGS = 4.5 Vdc, ID = 0.75 Adc) – 0.375 0.500

DYNAMIC CHARACTERISTICS
Input Capacitance (VDS = 5.0 Vdc) Ciss – 130 – pF
Output Capacitance (VDS = 5.0 Vdc) Coss – 120 –
Transfer Capacitance (VDG = 5.0 Vdc) Crss – 60 –

SWITCHING CHARACTERISTICS (Note 2.)


Turn–On Delay Time td(on) – 2.5 – ns
Rise Time (VDD = 15 Vdc, ID = 1.0 Adc, tr – 1.0 –
Turn–Off Delay Time RL = 50 Ω) td(off) – 16 –
Fall Time tf – 8.0 –
Gate Charge (See Figure 6) QT – 6000 – pC
SOURCE–DRAIN DIODE CHARACTERISTICS
Continuous Current IS – – 0.6 A
Pulsed Current ISM – – 0.75
Forward Voltage (Note 2.) VSD – 1.5 – V
1. Pulse Test: Pulse Width ≤ 300 µs, Duty Cycle ≤ 2%.
2. Switching characteristics are independent of operating junction temperature.

TYPICAL ELECTRICAL CHARACTERISTICS

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Figure 1. Transfer Characteristics Figure 2. On–Region Characteristics

http://onsemi.com
333
MGSF1P02LT1

TYPICAL ELECTRICAL CHARACTERISTICS

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Figure 7. Body Diode Forward Voltage Figure 8. Capacitance

http://onsemi.com
334
MGSF1P02LT1

INFORMATION FOR USING THE SOT–23 SURFACE MOUNT PACKAGE

MINIMUM RECOMMENDED FOOTPRINT FOR SURFACE MOUNTED APPLICATIONS


Surface mount board layout is a critical portion of the interface between the board and the package. With the
total design. The footprint for the semiconductor packages correct pad geometry, the packages will self align when
must be the correct size to insure proper solder connection subjected to a solder reflow process.

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SOT–23 POWER DISSIPATION


The power dissipation of the SOT–23 is a function of the one can calculate the power dissipation of the device which
drain pad size. This can vary from the minimum pad size in this case is 416 milliwatts.
for soldering to a pad size given for maximum power 150°C – 25°C
PD = = 416 milliwatts
dissipation. Power dissipation for a surface mount device is 300°C/W
determined by TJ(max), the maximum rated junction
temperature of the die, RθJA, the thermal resistance from The 300°C/W for the SOT–23 package assumes the use
the device junction to ambient, and the operating of the recommended footprint on a glass epoxy printed
temperature, TA. Using the values provided on the data circuit board to achieve a power dissipation of 416
sheet for the SOT–23 package, PD can be calculated as milliwatts. There are other alternatives to achieving higher
follows: power dissipation from the SOT–23 package. Another
alternative would be to use a ceramic substrate or an
TJ(max) – TA
PD = aluminum core board such as Thermal Cladt. Using a
RθJA board material such as Thermal Clad, an aluminum core
The values for the equation are found in the maximum board, the power dissipation can be doubled using the same
ratings table on the data sheet. Substituting these values footprint.
into the equation for an ambient temperature TA of 25°C,

SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • The soldering temperature and time shall not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within • When shifting from preheating to soldering, the
a short time could result in device failure. Therefore, the maximum temperature gradient shall be 5°C or less.
following items should always be observed in order to • After soldering has been completed, the device should
minimize the thermal stress to which the devices are be allowed to cool naturally for at least three minutes.
subjected. Gradual cooling should be used as the use of forced
• Always preheat the device. cooling will increase the temperature gradient and
• The delta temperature between the preheat and result in latent failure due to mechanical stress.
soldering should be 100°C or less.* • Mechanical stress or shock should not be applied
• When preheating and soldering, the temperature of the during cooling.
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When * Soldering a device without preheating can cause
using infrared heating with the reflow soldering excessive thermal shock and stress which can result in
method, the difference shall be a maximum of 10°C. damage to the device.

http://onsemi.com
335
( # .

 

#$%& '(
   
P–Channel TSOP–6
This device represents a series of Power MOSFETs which are http://onsemi.com
capable of withstanding high energy in the avalanche and
commutation modes and the drain–to–source diode has a very low 2 AMPERES
reverse recovery time. These devices are designed for use in low
20 VOLTS
voltage, high speed switching applications where power efficiency is
important. Typical applications are dc–dc converters, and power RDS(on) = 175 m
management in portable and battery powered products such as
computers, printers, cellular and cordless phones. They can also be P–Channel
used for low voltage motor controls in mass storage products such as
 # $ 9
disk drives and tape drives. The avalanche energy is specified to
eliminate the guesswork in designs where inductive loads are switched
and offer additional safety margin against unexpected voltage
transients. 4
• Miniature TSOP–6 Surface Mount Package – Saves Board Space
• Low Profile for Thin Applications such as PCMCIA Cards
• Very Low RDS(on) Provides Higher Efficiency and Expands 6
Battery Life
• Logic Level Gate Drive – Can Be Driven by Logic ICs
MARKING
• Diode is Characterized for Use in Bridge Circuits DIAGRAM
• Diode Exhibits High Speed, with Soft Recovery
• IDSS Specified at Elevated Temperatures 3
2
• Avalanche Energy Specified
1 TSOP–6 3V
CASE 318G W
• Package Mounting Information Provided 4 STYLE 1
5
6

3V = Device Code
W = Work Week

PIN ASSIGNMENT
()% ()% ;(1
6 5 4

1 2 3
()% ()% )'1

ORDERING INFORMATION

Device Package Shipping

MGSF2P02HDT1 TSOP–6 3000 Tape & Reel

MGSF2P02HDT3 TSOP–6 10,000 Tape & Reel


This document contains information on a product under development. ON Semiconductor
reserves the right to change or discontinue this product without notice.

 Semiconductor Components Industries, LLC, 2000 336 Publication Order Number:


November, 2000 – Rev. 1 MGSF2P02HD/D
MGSF2P02HD

MAXIMUM RATINGS (TJ = 25°C unless otherwise noted)


Rating Symbol Value Unit
Drain–to–Source Voltage VDSS 20 V
Drain–to–Gate Voltage (RGS = 1.0 MΩ) VDGR 20 V
Gate–to–Source Voltage VGS ±9 V
Drain Current – Continuous ID 1.3 A
Drain Current – Single Pulse (tp ≤ 10 µs) IDM 10
Total Power Dissipation @ TC = 25°C PD 400 mW
Total Power Dissipation @ TC = 85°C PD 210 mW
Thermal Resistance – Junction to Ambient (Note 1.) RqJA 312 °C/W
Drain Current – Continuous ID 2.9 A
Drain Current – Single Pulse (tp ≤ 10 µs) IDM 15
Total Power Dissipation @ TC = 25°C PD 2.0 W
Total Power Dissipation @ TC = 85°C PD 1.0 W
Thermal Resistance – Junction to Ambient (Note 2.) RqJA 62.5 °C/W
Operating and Storage Temperature Range TJ, Tstg – 55 to °C
150
Single Pulse Drain Source Avalanche Energy VDD = 20 V, VGS = 4.5 Vpk, EAS mJ
IL = 3.6 Apk, L = 25 mH, RG = 25 W 160
THERMAL CHARACTERISTICS
Maximum Lead Temperature for Soldering Purposes, 1/8″ from Case for 5 seconds TL 260 °C
1. Minimum FR–4 or G–10 PCB, Operating to Steady State.
2. Mounted onto a 2″ square FR–4 Board (1″ sq. 2 oz. Cu 0.06″ thick single sided), Operating time ≤5 seconds.

http://onsemi.com
337
MGSF2P02HD

ELECTRICAL CHARACTERISTICS (TC = 25°C unless otherwise noted)


Characteristic Symbol Min Typ Max Unit
OFF CHARACTERISTICS
Drain–to–Source Breakdown Voltage V(BR)DSS Vdc
(VGS = 0 Vdc, ID = 0.25 mAdc) 20 – –
Zero Gate Voltage Drain Current IDSS µA
(VDS = 20 Vdc, VGS = 0 Vdc) – – 1.0
(VDS = 20 Vdc, VGS = 0 Vdc, TJ = 125°C) – – 10
Gate–to–Source Leakage Current IGSS nAdc
(VGS = ±9.0 Vdc, VDS = 0 Vdc) – – ±100

ON CHARACTERISTICS
Gate Threshold Voltage VGS(th) Vdc
(VDS = VGS, ID = 0.25 mAdc) 0.7 0.95 1.4
Temperature Coefficient (Negative) – 2.2 – mV/°C
Drain–to–Source On–Voltage RDS(on) mW
(VGS = 4.5 Vdc, ID = 1.3 Adc) – 145 175
(VGS = 2.7 Vdc, ID = 0.8 Adc) – 220 280
Forward Transconductance gFS mhos
(VDS = 10 Vdc, ID = 0.6 Adc) 1.3 2.0 –

DYNAMIC CHARACTERISTICS
Input Capacitance Ciss – 225 – pF
Output Capacitance (VDS = 15 Vd
Vdc, VGS = 0 Vd
Vdc,
Coss – 150 –
f = 1.0 MHz)
Transfer Capacitance Crss – 60 –
SWITCHING CHARACTERISTICS
Turn–On Delay Time td(on) – 15 – nsec
Rise Time (VDS = 10 Vdc, ID = 1.2 Adc, tr – 27 –
VGS = 4
4.55 Vdc
Vdc,
Turn–Off Delay Time RG = 6.0 Ω) td(off) – 60 –
Fall Time tf – 72 –
Turn–On Delay Time td(on) – 20 –
Rise Time (VDD = 10 Vdc, ID = 0.6 Adc, tr – 94 –
VGS = 2
2.77 Vdc
Vdc,
Turn–Off Delay Time RG = 6.0 Ω) td(off) – 49 –
Fall Time tf – 76 –
Gate Charge QT – 5.3 7.5 nC

(VDS = 16 Vdc, ID = 1.2 Adc, Q1 – 0.7 –


VGS = 4.5 Vdc) Q2 – 2.6 –
Q3 – 1.9 –
SOURCE–DRAIN DIODE CHARACTERISTICS
Forward On–Voltage VSD Vdc
(IS = 1.2 Adc, VGS = 0 Vdc) – 0.89 1.1
– 0.72 –
Reverse Recovery Time trr – 86 – nsec
(IS = 1.2 Adc, VGS = 0 Vdc, ta – 27 –
dIS/dt = 100 A/µs)
tb – 59 –
QRR – 0.115 – µC
NOTE: Pulse Test: Pulse Width ≤ 300 µs, Duty Cycle ≤ 2%.

http://onsemi.com
338
MGSF2P02HD

TYPICAL ELECTRICAL CHARACTERISTICS

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Figure 3. On–Resistance versus Drain Current Figure 4. On–Resistance versus Drain Current
and Gate Voltage

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Figure 5. On–Resistance versus Temperature Figure 6. Drain–To–Source Leakage Current


versus Voltage

http://onsemi.com
339
MGSF2P02HD

POWER MOSFET SWITCHING

Switching behavior is most easily modeled and predicted The capacitance (Ciss) is read from the capacitance curve at
by recognizing that the power MOSFET is charge a voltage corresponding to the off–state condition when
controlled. The lengths of various switching intervals (∆t) calculating td(on) and is read at a voltage corresponding to the
are determined by how fast the FET input capacitance can on–state when calculating td(off).
be charged by current from the generator. At high switching speeds, parasitic circuit elements
The published capacitance data is difficult to use for complicate the analysis. The inductance of the MOSFET
calculating rise and fall because drain–gate capacitance source lead, inside the package and in the circuit wiring
varies greatly with applied voltage. Accordingly, gate which is common to both the drain and gate current paths,
charge data is used. In most cases, a satisfactory estimate of produces a voltage at the source which reduces the gate drive
average input current (IG(AV)) can be made from a current. The voltage is determined by Ldi/dt, but since di/dt
rudimentary analysis of the drive circuit so that is a function of drain current, the mathematical solution is
t = Q/IG(AV) complex. The MOSFET output capacitance also
complicates the mathematics. And finally, MOSFETs have
During the rise and fall time interval when switching a finite internal gate resistance which effectively adds to the
resistive load, VGS remains virtually constant at a level resistance of the driving source, but the internal resistance
known as the plateau voltage, VSGP. Therefore, rise and fall is difficult to measure and, consequently, is not specified.
times may be approximated by the following: The resistive switching time variation versus gate
tr = Q2 x RG/(VGG – VGSP) resistance (Figure 9) shows how typical switching
tf = Q2 x RG/VGSP performance is affected by the parasitic circuit elements. If
where the parasitics were not present, the slope of the curves would
maintain a value of unity regardless of the switching speed.
VGG = the gate drive voltage, which varies from zero to VGG
The circuit used to obtain the data is constructed to minimize
RG = the gate drive resistance
common inductance in the drain and gate circuit loops and
and Q2 and VGSP are read from the gate charge curve.
is believed readily achievable with board mounted
During the turn–on and turn–off delay times, gate current is components. Most power electronic loads are inductive; the
not constant. The simplest calculation uses appropriate data in the figure is taken with a resistive load, which
values from the capacitance curves in a standard equation for approximates an optimally snubbed inductive load. Power
voltage change in an RC network. The equations are: MOSFETs may be safely operated into an inductive load;
td(on) = RG Ciss In [VGG/(VGG – VGSP)] however, snubbing reduces switching losses.
td(off) = RG Ciss In (VGG/VGSP)

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Figure 7. Capacitance Variation

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Figure 8. Gate–To–Source and Drain–To–Source Figure 9. Resistive Switching Time


Voltage versus Total Charge Variation versus Gate Resistance

DRAIN–TO–SOURCE DIODE CHARACTERISTICS

The switching characteristics of a MOSFET body diode high di/dts. The diode’s negative di/dt during ta is directly
are very important in systems using it as a freewheeling or controlled by the device clearing the stored charge.
commutating diode. Of particular interest are the reverse However, the positive di/dt during tb is an uncontrollable
recovery characteristics which play a major role in diode characteristic and is usually the culprit that induces
determining switching losses, radiated noise, EMI and RFI. current ringing. Therefore, when comparing diodes, the
System switching losses are largely due to the nature of ratio of tb/ta serves as a good indicator of recovery
the body diode itself. The body diode is a minority carrier abruptness and thus gives a comparative estimate of
device, therefore it has a finite reverse recovery time, trr, due probable noise generated. A ratio of 1 is considered ideal and
to the storage of minority carrier charge, QRR, as shown in values less than 0.5 are considered snappy.
the typical reverse recovery wave form of Figure 11. It is this Compared to ON Semiconductor standard cell density
stored charge that, when cleared from the diode, passes low voltage MOSFETs, high cell density MOSFET diodes
through a potential and defines an energy loss. Obviously, are faster (shorter trr), have less stored charge and a softer
repeatedly forcing the diode through reverse recovery reverse recovery characteristic. The softness advantage of
further increases switching losses. Therefore, one would the high cell density diode means they can be forced through
like a diode with short trr and low QRR specifications to reverse recovery at a higher di/dt than a standard cell
minimize these losses. MOSFET diode without increasing the current ringing or the
The abruptness of diode reverse recovery effects the noise generated. In addition, power dissipation incurred
amount of radiated noise, voltage spikes, and current from switching the diode will be less due to the shorter
ringing. The mechanisms at work are finite irremovable recovery time and lower switching losses.
circuit parasitic inductances and capacitances acted upon by
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Figure 10. Diode Forward Voltage versus Current Figure 11. Reverse Recovery Time (trr)

http://onsemi.com
341
MGSF2P02HD

TYPICAL ELECTRICAL CHARACTERISTICS


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Figure 13. Diode Reverse Recovery Waveform

http://onsemi.com
342
MGSF2P02HD

INFORMATION FOR USING THE TSOP–6 SURFACE MOUNT PACKAGE


MINIMUM RECOMMENDED FOOTPRINT FOR SURFACE MOUNTED APPLICATIONS
Surface mount board layout is a critical portion of the interface between the board and the package. With the
total design. The footprint for the semiconductor packages correct pad geometry, the packages will self align when
must be the correct size to insure proper solder connection subjected to a solder reflow process.

76
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TSOP–6 POWER DISSIPATION


The power dissipation of the TSOP–6 is a function of the one can calculate the power dissipation of the device which
drain pad size. This can vary from the minimum pad size in this case is 400 milliwatts.
for soldering to a pad size given for maximum power 150°C – 25°C
PD = = 400 milliwatts
dissipation. Power dissipation for a surface mount device is 312°C/W
determined by TJ(max), the maximum rated junction
temperature of the die, RθJA, the thermal resistance from The 312°C/W for the TSOP–6 package assumes the use
the device junction to ambient, and the operating of the recommended footprint on a glass epoxy printed
temperature, TA. Using the values provided on the data circuit board to achieve a power dissipation of 400
sheet for the TSOP–6 package, PD can be calculated as milliwatts. There are other alternatives to achieving higher
follows: power dissipation from the TSOP–6 package. Another
alternative would be to use a ceramic substrate or an
TJ(max) – TA
PD = aluminum core board such as Thermal Cladt. Using a
RθJA board material such as Thermal Clad, an aluminum core
The values for the equation are found in the maximum board, the power dissipation can be doubled using the same
ratings table on the data sheet. Substituting these values footprint.
into the equation for an ambient temperature TA of 25°C,

SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • The soldering temperature and time shall not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within • When shifting from preheating to soldering, the
a short time could result in device failure. Therefore, the maximum temperature gradient shall be 5°C or less.
following items should always be observed in order to • After soldering has been completed, the device should
minimize the thermal stress to which the devices are be allowed to cool naturally for at least three minutes.
subjected. Gradual cooling should be used as the use of forced
• Always preheat the device. cooling will increase the temperature gradient and
• The delta temperature between the preheat and result in latent failure due to mechanical stress.
soldering should be 100°C or less.* • Mechanical stress or shock should not be applied
• When preheating and soldering, the temperature of the during cooling.
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When * Soldering a device without preheating can cause
using infrared heating with the reflow soldering excessive thermal shock and stress which can result in
method, the difference shall be a maximum of 10°C. damage to the device.

http://onsemi.com
343
(! 
Preferred Device

#$%& '(
    
N–Channel TSOP–6
These miniature surface mount MOSFETs low RDS(on) assure
minimal power loss and conserve energy, making these devices ideal
for use in small power management circuitry. Typical applications are http://onsemi.com
dc–dc converters, power management in portable and
battery–powered products such as computers, printers, PCMCIA 4 AMPERES
cards, cellular and cordless telephones. 20 VOLTS
• Low RDS(on) Provides Higher Efficiency and Extends Battery Life RDS(on) = 70 mΩ
• Miniature TSOP–6 Surface Mount Package Saves Board Space
N–Channel
MAXIMUM RATINGS (TJ = 25°C unless otherwise noted)
 # $ 9
Rating Symbol Value Unit
Drain–to–Source Voltage VDSS 20 Vdc
Gate–to–Source Voltage – Continuous VGS ± 8.0 Vdc
Drain Current A 4
– Continuous @ TA = 25°C ID 4.0
– Pulsed Drain Current (tp ≤ 10 µs) IDM 20
Total Power Dissipation @ TA = 25°C PD 2.0 W 6
Mounted on FR4 t  5 sec
Operating and Storage Temperature TJ, Tstg – 55 to °C
MARKING
Range 150
DIAGRAM
Thermal Resistance – Junction–to–Ambient RθJA 62.5 °C/W
3
Maximum Lead Temperature for Soldering TL 260 °C 2
1 TSOP–6 442
Purposes, for 10 seconds
CASE 318G W
4 STYLE 1
5
6

442 = Device Code


W = Work Week

PIN ASSIGNMENT
()% ()% ;(1
6 5 4

1 2 3
()% ()% )'1

ORDERING INFORMATION

Device Package Shipping

MGSF3442VT1 TSOP–6 3000 Tape & Reel

Preferred devices are recommended choices for future use


and best overall value.

 Semiconductor Components Industries, LLC, 2000 344 Publication Order Number:


November, 2000 – Rev. 1 MGSF3442VT1/D
MGSF3442VT1

ELECTRICAL CHARACTERISTICS (TA = 25°C unless otherwise noted)


Characteristic Symbol Min Typ Max Unit
OFF CHARACTERISTICS
Drain–to–Source Breakdown Voltage V(BR)DSS Vdc
(VGS = 0 Vdc, ID = 10 µA) 20 – –
Zero Gate Voltage Drain Current IDSS µAdc
(VDS = 20 Vdc, VGS = 0 Vdc) – – 1.0
(VDS = 20 Vdc, VGS = 0 Vdc, TJ = 70°C) – – 5.0
Gate–Body Leakage Current (VGS = ± 8.0 Vdc, VDS = 0) IGSS – – ±100 nAdc
ON CHARACTERISTICS (Note 1.)
Gate Threshold Voltage VGS(th) Vdc
(VDS = VGS, ID = 250 µAdc) 0.6 – –
Static Drain–to–Source On–Resistance rDS(on) Ohms
(VGS = 4.5 Vdc, ID = 4.0 A) – 0.058 0.070
(VGS = 2.5 Vdc, ID = 3.4 A) – 0.072 0.095

DYNAMIC CHARACTERISTICS
Input Capacitance (VDS = 5.0 V) Ciss – 90 – pF
Output Capacitance (VDS = 5.0 V) Coss – 50 –
Transfer Capacitance (VDG = 5.0 V) Crss – 10 –

SWITCHING CHARACTERISTICS (Note 2.)


Turn–On Delay Time td(on) – 8.0 20 ns
Rise Time (VDD = 10 Vdc, ID = 1.0 A, tr – 24 40
Turn–Off Delay Time VGEN = 10 V, RL = 10 Ω) td(off) – 36 60
Fall Time tf – 10 20
Gate Charge QT – – – nC
SOURCE–DRAIN DIODE CHARACTERISTICS
Continuous Current IS – – 1.0 A
Pulsed Current ISM – – 5.0 A
Forward Voltage (Note 2.) VSD – – 1.2 V
1. Pulse Test: Pulse Width ≤ 300 µs, Duty Cycle ≤ 2%.
2. Switching characteristics are independent of operating junction temperature.

http://onsemi.com
345
MGSF3442VT1

TYPICAL ELECTRICAL CHARACTERISTICS

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Figure 1. Output Characteristics Figure 2. Transfer Characteristics

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Figure 5. Gate Charge Figure 6. On–Resistance versus Junction


Temperature

http://onsemi.com
346
MGSF3442VT1

TYPICAL ELECTRICAL CHARACTERISTICS

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Figure 7. Source–Drain Diode Forward Voltage Figure 8. On–Resistance versus


Gate–to–Source Voltage

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Figure 11. Normalized Thermal Transient Impedance, Junction–to–Ambient

http://onsemi.com
347
MGSF3442VT1

INFORMATION FOR USING THE TSOP–6 SURFACE MOUNT PACKAGE

MINIMUM RECOMMENDED FOOTPRINT FOR SURFACE MOUNTED APPLICATIONS


Surface mount board layout is a critical portion of the interface between the board and the package. With the
total design. The footprint for the semiconductor packages correct pad geometry, the packages will self align when
must be the correct size to insure proper solder connection subjected to a solder reflow process.

76
#6

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TSOP–6 POWER DISSIPATION


The power dissipation of the TSOP–6 is a function of the into the equation for an ambient temperature TA of 25°C,
drain pad size. This can vary from the minimum pad size one can calculate the power dissipation of the device which
for soldering to a pad size given for maximum power in this case is 2.0 watts.
dissipation. Power dissipation for a surface mount device is 150°C – 25°C
PD = = 2.0 watts
determined by TJ(max), the maximum rated junction 62.5°C/W
temperature of the die, RθJA, the thermal resistance from
the device junction to ambient, and the operating The 62.5°C/W for the TSOP–6 package assumes the use
temperature, TA. Using the values provided on the data of the recommended footprint on a glass epoxy printed
sheet for the TSOP–6 package, PD can be calculated as circuit board to achieve a power dissipation of 2.0 watts.
follows: There are other alternatives to achieving higher power
dissipation from the TSOP–6 package. Another alternative
TJ(max) – TA
PD = would be to use a ceramic substrate or an aluminum core
RθJA board such as Thermal Cladt. Using a board material such
The values for the equation are found in the maximum as Thermal Clad, an aluminum core board, the power
ratings table on the data sheet. Substituting these values dissipation can be doubled using the same footprint.

SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • The soldering temperature and time shall not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within • When shifting from preheating to soldering, the
a short time could result in device failure. Therefore, the maximum temperature gradient shall be 5°C or less.
following items should always be observed in order to • After soldering has been completed, the device should
minimize the thermal stress to which the devices are be allowed to cool naturally for at least three minutes.
subjected. Gradual cooling should be used as the use of forced
• Always preheat the device. cooling will increase the temperature gradient and
• The delta temperature between the preheat and result in latent failure due to mechanical stress.
soldering should be 100°C or less.* • Mechanical stress or shock should not be applied
• When preheating and soldering, the temperature of the during cooling.
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When * Soldering a device without preheating can cause
using infrared heating with the reflow soldering excessive thermal shock and stress which can result in
method, the difference shall be a maximum of 10°C. damage to the device.

http://onsemi.com
348
(!
Preferred Device

#$%& '(
  !  
N–Channel TSOP–6
These miniature surface mount MOSFETs low RDS(on) assure
minimal power loss and conserve energy, making these devices ideal
for use in small power management circuitry. Typical applications are http://onsemi.com
dc–dc converters, power management in portable and
battery–powered products such as computers, printers, PCMCIA 4 AMPERES
cards, cellular and cordless telephones. 30 VOLTS
• Low RDS(on) Provides Higher Efficiency and Extends Battery Life RDS(on) = 65 mΩ
• Miniature TSOP–6 Surface Mount Package Saves Board Space
N–Channel
MAXIMUM RATINGS (TJ = 25°C unless otherwise noted)
 # $ 9
Rating Symbol Value Unit
Drain–to–Source Voltage VDSS 30 Vdc
Gate–to–Source Voltage – Continuous VGS ± 20 Vdc
Drain Current A 4
– Continuous @ TA = 25°C ID 4.2
– Pulsed Drain Current (tp ≤ 10 µs) IDM 20
Total Power Dissipation @ TA = 25°C PD 2.0 W 6
Mounted on FR4 t ≤ 5 sec
Operating and Storage Temperature TJ, Tstg – 55 to °C
MARKING
Range 150
DIAGRAM
Thermal Resistance – Junction–to–Ambient RθJA 62.5 °C/W
3
Maximum Lead Temperature for Soldering TL 260 °C 2
1 TSOP–6 3P
Purposes, for 10 seconds
CASE 318G W
4 STYLE 1
5
6

3P = Device Code
W = Work Week

PIN ASSIGNMENT
()% ()% ;(1
6 5 4

1 2 3
()% ()% )'1

ORDERING INFORMATION

Device Package Shipping

MGSF3454VT1 TSOP–6 3000 Tape & Reel

Preferred devices are recommended choices for future use


and best overall value.

 Semiconductor Components Industries, LLC, 2000 349 Publication Order Number:


November, 2000 – Rev. 1 MGSF3454VT1/D
MGSF3454VT1

ELECTRICAL CHARACTERISTICS (TA = 25°C unless otherwise noted)


Characteristic Symbol Min Typ Max Unit
OFF CHARACTERISTICS
Drain–to–Source Breakdown Voltage V(BR)DSS Vdc
(VGS = 0 Vdc, ID = 10 µA) 30 – –
Zero Gate Voltage Drain Current IDSS µAdc
(VDS = 30 Vdc, VGS = 0 Vdc) – – 1.0
(VDS = 30 Vdc, VGS = 0 Vdc, TJ = 70°C) – – 25
Gate–Body Leakage Current (VGS = ± 20 Vdc, VDS = 0) IGSS – – ±100 nAdc
ON CHARACTERISTICS (Note 1.)
Gate Threshold Voltage VGS(th) Vdc
(VDS = VGS, ID = 250 µAdc) 1.0 – –
Static Drain–to–Source On–Resistance rDS(on) Ohms
(VGS = 10 Vdc, ID = 4.2 A) – 0.05 0.065
(VGS = 4.5 Vdc, ID = 3.4 A) – 0.07 0.095

DYNAMIC CHARACTERISTICS
Input Capacitance (VDS = 5.0 V) Ciss – 90 – pF
Output Capacitance (VDS = 5.0 V) Coss – 50 –
Transfer Capacitance (VDG = 5.0 V) Crss – 10 –

SWITCHING CHARACTERISTICS (Note 2.)


Turn–On Delay Time td(on) – 10 20 ns
Rise Time (VDD = 10 Vdc, ID = 1.0 A, tr – 15 30
Turn–Off Delay Time VGEN = 10 V, RL = 10 Ω) td(off) – 20 35
Fall Time tf – 10 20
Gate Charge QT – – 15 nC
SOURCE–DRAIN DIODE CHARACTERISTICS
Continuous Current IS – – 1.0 A
Pulsed Current ISM – – 5.0 A
Forward Voltage (Note 2.) VSD – – 1.2 V
1. Pulse Test: Pulse Width ≤ 300 µs, Duty Cycle ≤ 2%.
2. Switching characteristics are independent of operating junction temperature.

http://onsemi.com
350
MGSF3454VT1

TYPICAL ELECTRICAL CHARACTERISTICS

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Figure 1. Output Characteristics Figure 2. Transfer Characteristics

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Figure 3. On–Resistance vs. Drain Current Figure 4. Capacitance

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Figure 5. Gate Charge Figure 6. On–Resistance vs. Junction Temperature

http://onsemi.com
351
MGSF3454VT1

TYPICAL ELECTRICAL CHARACTERISTICS

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Figure 7. Source–Drain Diode Forward Voltage Figure 8. On–Resistance vs. Gate–to–Source Voltage

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Figure 11. Normalized Thermal Transient Impedance, Junction–to–Ambient

http://onsemi.com
352
MGSF3454VT1

INFORMATION FOR USING THE TSOP–6 SURFACE MOUNT PACKAGE

MINIMUM RECOMMENDED FOOTPRINT FOR SURFACE MOUNTED APPLICATIONS


Surface mount board layout is a critical portion of the interface between the board and the package. With the
total design. The footprint for the semiconductor packages correct pad geometry, the packages will self align when
must be the correct size to insure proper solder connection subjected to a solder reflow process.

76
#6

4:
7$
:6
7
4:
7$
#8
:

47 %21!


TSOP–6 POWER DISSIPATION


The power dissipation of the TSOP–6 is a function of the into the equation for an ambient temperature TA of 25°C,
drain pad size. This can vary from the minimum pad size one can calculate the power dissipation of the device which
for soldering to a pad size given for maximum power in this case is 2.0 watts.
dissipation. Power dissipation for a surface mount device is 150°C – 25°C
PD = = 2.0 watts
determined by TJ(max), the maximum rated junction 62.5°C/W
temperature of the die, RθJA, the thermal resistance from
the device junction to ambient, and the operating The 62.5°C/W for the TSOP–6 package assumes the use
temperature, TA. Using the values provided on the data of the recommended footprint on a glass epoxy printed
sheet for the TSOP–6 package, PD can be calculated as circuit board to achieve a power dissipation of 2.0 watts.
follows: There are other alternatives to achieving higher power
dissipation from the TSOP–6 package. Another alternative
TJ(max) – TA
PD = would be to use a ceramic substrate or an aluminum core
RθJA board such as Thermal Cladt. Using a board material such
The values for the equation are found in the maximum as Thermal Clad, an aluminum core board, the power
ratings table on the data sheet. Substituting these values dissipation can be doubled using the same footprint.

SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • The soldering temperature and time shall not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within • When shifting from preheating to soldering, the
a short time could result in device failure. Therefore, the maximum temperature gradient shall be 5°C or less.
following items should always be observed in order to • After soldering has been completed, the device should
minimize the thermal stress to which the devices are be allowed to cool naturally for at least three minutes.
subjected. Gradual cooling should be used as the use of forced
• Always preheat the device. cooling will increase the temperature gradient and
• The delta temperature between the preheat and result in latent failure due to mechanical stress.
soldering should be 100°C or less.* • Mechanical stress or shock should not be applied
• When preheating and soldering, the temperature of the during cooling.
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When * Soldering a device without preheating can cause
using infrared heating with the reflow soldering excessive thermal shock and stress which can result in
method, the difference shall be a maximum of 10°C. damage to the device.

http://onsemi.com
353

Preferred Device

 t '(


     
* %+%
N–Channel DPAK
The MLD1N06CL is designed for applications that require a rugged
power switching device with short circuit protection that can be
directly interfaced to a microcontrol unit (MCU). Ideal applications http://onsemi.com
include automotive fuel injector driver, incandescent lamp driver or
other applications where a high in–rush current or a shorted load 1 AMPERE
condition could occur. 62 VOLTS (Clamped)
This Logic Level Power MOSFET features current limiting for
RDS(on) = 750 mΩ
short circuit protection, integrated Gate–Source clamping for ESD
protection and integral Gate–Drain clamping for over–voltage N–Channel 
protection and Sensefet technology for low on–resistance. No
additional gate series resistance is required when interfacing to the
output of a MCU, but a 40 kΩ gate pulldown resistor is recommended
to avoid a floating gate condition.
The internal Gate–Source and Gate–Drain clamps allow the device

to be applied without use of external transient suppression 
components. The Gate–Source clamp protects the MOSFET input
from electrostatic voltage stress up to 2.0 kV. The Gate–Drain clamp
protects the MOSFET drain from the avalanche stress that occurs with
#
inductive loads. Their unique design provides voltage clamping that is
essentially independent of operating temperature.


MAXIMUM RATINGS (TJ = 25°C unless otherwise noted) MARKING


DIAGRAM
Rating Symbol Value Unit
Drain–to–Source Voltage VDSS Clamped Vdc
4
CASE 369A YWW
Drain–to–Gate Voltage VDGR Clamped Vdc L1N
(RGS = 1.0 MΩ) DPAK
1 2 STYLE 2 06C
Gate–to–Source Voltage 3
– Continuous VGS ±10 Vdc L1N06C = Device Code
Y = Year
Drain Current – Continuous ID Self–limited Adc
WW = Work Week
– Single Pulse IDM 1.8 Apk
T = MOSFET
Total Power Dissipation PD 40 Watts
Operating and Storage Temperature TJ, Tstg –50 to 150 °C
PIN ASSIGNMENT
Range 4
Drain
Electrostatic Discharge Voltage ESD 2.0 kV
(Human Model)

THERMAL CHARACTERISTICS
Thermal Resistance °C/W
– Junction to Case RθJC 3.12 1 2 3
– Junction to Ambient RθJA 100 Gate Drain Source
– Junction to Ambient (Note 1.) RθJA 71.4
ORDERING INFORMATION
Maximum Lead Temperature for TL 260 °C
Soldering Purposes, Device Package Shipping
1/8″ from case for 5 sec.
1. When surface mounted to an FR4 board using the minimum recommended MLD1N06CLT4 DPAK 2500 Tape & Reel
pad size.
Preferred devices are recommended choices for future use
and best overall value.

 Semiconductor Components Industries, LLC, 2000 354 Publication Order Number:


November, 2000 – Rev. 1 MLD1N06CL/D
MLD1N06CL

UNCLAMPED DRAIN–TO–SOURCE AVALANCHE CHARACTERISTICS


Rating Symbol Value Unit
Single Pulse Drain–to–Source Avalanche Energy EAS 80 mJ
Starting TJ = 25°C

ELECTRICAL CHARACTERISTICS (TC = 25°C unless otherwise noted)


Characteristic Symbol Min Typ Max Unit
OFF CHARACTERISTICS
Drain–to–Source Breakdown Voltage (Internally Clamped) V(BR)DSS Vdc
(ID = 20 mAdc, VGS = 0 Vdc) 59 62 65
(ID = 20 mAdc, VGS = 0 Vdc, TJ = 150°C) 59 62 65
Zero Gate Voltage Drain Current IDSS µAdc
(VDS = 45 Vdc, VGS = 0 Vdc) – 0.6 5.0
(VDS = 45 Vdc, VGS = 0 Vdc, TJ = 150°C) – 6.0 20
Gate–Source Leakage Current IGSS µAdc
(VG = 5.0 Vdc, VDS = 0 Vdc) – 0.5 5.0
(VG = 5.0 Vdc, VDS = 0 Vdc, TJ = 150°C) – 1.0 20

ON CHARACTERISTICS (Note 2.)


Gate Threshold Voltage VGS(th) Vdc
(ID = 250 µAdc, VDS = VGS) 1.0 1.5 2.0
(ID = 250 µAdc, VDS = VGS, TJ = 150°C) 0.6 – 1.6
Static Drain–to–Source On–Resistance RDS(on) Ohms
(ID = 1.0 Adc, VGS = 4.0 Vdc) – 0.63 0.75
(ID = 1.0 Adc, VGS = 5.0 Vdc) – 0.59 0.75
(ID = 1.0 Adc, VGS = 4.0 Vdc, TJ = 150°C) – 1.1 1.9
(ID = 1.0 Adc, VGS = 5.0 Vdc, TJ = 150°C) – 1.0 1.8
Static Source–to–Drain Diode Voltage (IS = 1.0 Adc, VGS = 0 Vdc) VSD – 1.1 1.5 Vdc
Static Drain Current Limit ID(lim) Adc
(VGS = 5.0 Vdc, VDS = 10 Vdc) 2.0 2.3 2.75
(VGS = 5.0 Vdc, VDS = 10 Vdc, TJ = 150°C) 1.1 1.3 1.8
Forward Transconductance (ID = 1.0 Adc, VDS = 10 Vdc) gFS 1.0 1.4 – mhos
RESISTIVE SWITCHING CHARACTERISTICS (Note 3.)
Turn–On Delay Time td(on) – 1.2 2.0 ns
Rise Time (VDD = 25 Vdc, ID = 1.0 Adc, tr – 4.0 6.0
Turn–Off Delay Time VGS(on) = 5.0 Vdc, RGS = 50 Ohms) td(off) – 4.0 6.0
Fall Time tf – 3.0 5.0
INTERNAL PACKAGE INDUCTANCE
Internal Drain Inductance LD nH
(Measured from drain lead 0.25″ from package to center of die) – 4.5 –
Internal Source Inductance LS nH
(Measured from the source lead 0.25″ from package to source bond – 7.5 –
pad)
2. Pulse Test: Pulse Width ≤ 300 µs, Duty Cycle ≤ 2%.
3. Switching characteristics are independent of operating junction temperature.

http://onsemi.com
355
MLD1N06CL

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Figure 1. Output Characteristics Figure 2. Transfer Function

THE SMARTDISCRETES CONCEPT SHORT CIRCUIT PROTECTION AND THE EFFECT OF


From a standard power MOSFET process, several active TEMPERATURE
and passive elements can be obtained that provide on–chip The on–chip circuitry of the MLD1N06CL offers an
protection to the basic power device. Such elements require integrated means of protecting the MOSFET component from
only a small increase in silicon area and/or the addition of one high in–rush current or a shorted load. As shown in the
masking layer to the process. The resulting device exhibits schematic diagram, the current limiting feature is provided by an
significant improvements in ruggedness and reliability as NPN transistor and integral resistors R1 and R2. R2 senses the
well as system cost reduction. The SMARTDISCRETES current through the MOSFET and forward biases the NPN
device functions can now provide an economical alternative transistor’s base as the current increases. As the NPN turns on,
to smart power ICs for power applications requiring low it begins to pull gate drive current through R1, dropping the gate
on–resistance, high voltage and high current. drive voltage across it, and thus lowering the voltage across the
These devices are designed for applications that require a gate–to–source of the power MOSFET and limiting the current.
rugged power switching device with short circuit protection The current limit is temperature dependent as shown in Figure
that can be directly interfaced to a microcontroller unit 3, and decreases from about 2.3 Amps at 25°C to about 1.3
(MCU). Ideal applications include automotive fuel injector Amps at 150°C.
driver, incandescent lamp driver or other applications where Since the MLD1N06CL continues to conduct current and
a high in–rush current or a shorted load condition could occur. dissipate power during a shorted load condition, it is important
to provide sufficient heatsinking to limit the device junction
OPERATION IN THE CURRENT LIMIT MODE temperature to a maximum of 150°C.
The amount of time that an unprotected device can The metal current sense resistor R2 adds about 0.4 ohms to
withstand the current stress resulting from a shorted load the power MOSFET’s on–resistance, but the effect of
before its maximum junction temperature is exceeded is temperature on the combination is less than on a standard
dependent upon a number of factors that include the amount MOSFET due to the lower temperature coefficient of R2. The
of heatsinking that is provided, the size or rating of the device, on–resistance variation with temperature for gate voltages of 4
its initial junction temperature, and the supply voltage. and 5 Volts is shown in Figure 5.
Without some form of current limiting, a shorted load can Back–to–back polysilicon diodes between gate and source
raise a device’s junction temperature beyond the maximum provide ESD protection to greater than 2 kV, HBM. This
rated operating temperature in only a few milliseconds. on–chip protection feature eliminates the need for an external
Even with no heatsink, the MLD1N06CL can withstand a Zener diode for systems with potentially heavy line transients.
shorted load powered by an automotive battery (10 to 14
Volts) for almost a second if its initial operating temperature
is under 100°C. For longer periods of operation in the
current–limited mode, device heatsinking can extend
operation from several seconds to indefinitely depending on
the amount of heatsinking provided.

http://onsemi.com
356
MLD1N06CL

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Figure 3. ID(lim) Variation Gate–To–Source Voltage
With Temperature

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Figure 5. On–Resistance Variation With


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Figure 6. Single Pulse Avalanche Energy Figure 7. Drain–Source Sustaining


versus Junction Temperature Voltage Variation With Temperature

http://onsemi.com
357
MLD1N06CL

FORWARD BIASED SAFE OPERATING AREA (1.8 A at 150°C) and not the RDS(on). The maximum voltage
The FBSOA curves define the maximum drain–to–source can be calculated by the following equation:
voltage and drain current that a device can safely handle (150 – TA)
when it is forward biased, or when it is on, or being turned Vsupply =
ID(lim) (RθJC + RθCA)
on. Because these curves include the limitations of
simultaneous high voltage and high current, up to the rating where the value of RθCA is determined by the heatsink that
of the device, they are especially useful to designers of linear is being used in the application.
systems. The curves are based on a case temperature of 25°C
and a maximum junction temperature of 150°C. Limitations DUTY CYCLE OPERATION
for repetitive pulses at various case temperatures can be When operating in the duty cycle mode, the maximum
determined by using the thermal response curves. ON drain voltage can be increased. The maximum operating
Semiconductor Application Note, AN569, “Transient temperature is related to the duty cycle (DC) by the
Thermal Resistance – General Data and Its Use” provides following equation:
detailed instructions. TC = (VDS x ID x DC x RθCA) + TA

MAXIMUM DC VOLTAGE CONSIDERATIONS The maximum value of VDS applied when operating in a
The maximum drain–to–source voltage that can be duty cycle mode can be approximated by:
continuously applied across the MLD1N06CL when it is in 150 – TC
current limit is a function of the power that must be VDS =
ID(lim) x DC x RθJC
dissipated. This power is determined by the maximum
current limit at maximum rated operating temperature


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Figure 8. Maximum Rated Forward Bias


Safe Operating Area (MLD1N06CL)


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Figure 9. Thermal Response (MLD1N06CL)

http://onsemi.com
358
MLD1N06CL

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7B 7B

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A " $ Ω B

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Figure 10. Switching Test Circuit Figure 11. Switching Waveforms

ACTIVE CLAMPING MLD1N06CL, the integrated gate–to–source voltage


SMARTDISCRETES technology can provide on–chip elements provide greater than 2.0 kV electrostatic voltage
realization of the popular gate–to–source and gate–to–drain protection.
Zener diode clamp elements. Until recently, such features The avalanche voltage of the gate–to–drain voltage clamp
have been implemented only with discrete components is set less than that of the power MOSFET device. As soon
which consume board space and add system cost. The as the drain–to–source voltage exceeds this avalanche
SMARTDISCRETES technology approach economically voltage, the resulting gate–to–drain Zener current builds a
melds these features and the power chip with only a slight gate voltage across the gate–to–source impedance, turning
increase in chip area. on the power device which then conducts the current. Since
In practice, back–to–back diode elements are formed in a virtually all of the current is carried by the power device, the
polysilicon region monolithicly integrated with, but gate–to–drain voltage clamp element may be small in size.
electrically isolated from, the main device structure. Each This technique of establishing a temperature compensated
back–to–back diode element provides a temperature drain–to–source sustaining voltage (Figure 7) effectively
compensated voltage element of about 7.2 volts. As the removes the possibility of drain–to–source avalanche in the
polysilicon region is formed on top of silicon dioxide, the power device.
diode elements are free from direct interaction with the The gate–to–drain voltage clamp technique is particularly
conduction regions of the power device, thus eliminating useful for snubbing loads where the inductive energy would
parasitic electrical effects while maintaining excellent otherwise avalanche the power device. An improvement in
thermal coupling. ruggedness of at least four times has been observed when
To achieve high gate–to–drain clamp voltages, several inductive energy is dissipated in the gate–to–drain clamped
voltage elements are strung together; the MLD1N06CL uses conduction mode rather than in the more stressful
8 such elements. Customarily, two voltage elements are used gate–to–source avalanche mode.
to provide a 14.4 volt gate–to–source voltage clamp. For the

TYPICAL APPLICATIONS: INJECTOR DRIVER, SOLENOIDS, LAMPS, RELAY COILS

The MLD1N06CL has been designed to allow direct = 


interface to the output of a microcontrol unit to control an
isolated load. No additional series gate resistance is 
required, but a 40 kΩ gate pulldown resistor is
recommended to avoid a floating gate condition in the event
of an MCU failure. The internal clamps allow the device to 
be used without any external transistent suppressing 
  9
components.


http://onsemi.com
359
#
Preferred Device

 t '(


     
* %+%
N–Channel TO–220
These SMARTDISCRETES devices feature current limiting for
short circuit protection, an integral gate–to–source clamp for ESD http://onsemi.com
protection and gate–to–drain clamp for over–voltage protection. No
additional gate series resistance is required when interfacing to the 1 AMPERE
output of a MCU, but a 40 kΩ gate pulldown resistor is recommended
to avoid a floating gate condition. 62 VOLTS (Clamped)
The internal gate–to–source and gate–to–drain clamps allow the RDS(on) = 750 mΩ
devices to be applied without use of external transient suppression
components. The gate–to–source clamp protects the MOSFET input N–Channel

from electrostatic gate voltage stresses up to 2.0 kV. The gate–to–drain
clamp protects the MOSFET drain from drain avalanche stresses that
occur with inductive loads. This unique design provides voltage
clamping that is essentially independent of operating temperature.
• Temperature Compensated Gate–to–Drain Clamp Limits Voltage

Stress Applied to the Device and Protects the Load From 
Overvoltage
• Integrated ESD Diode Protection
• Controlled Switching Minimizes RFI
#

• Low Threshold Voltage Enables Interfacing Power Loads to


Microprocessors 

MARKING DIAGRAM
MAXIMUM RATINGS (TC = 25°C unless otherwise noted) & PIN ASSIGNMENT
Rating Symbol Value Unit 4
4
Drain
Drain–to–Source Voltage VDSS Clamped Vdc
Drain–to–Gate Voltage VDGR Clamped Vdc
(RGS = 1.0 MΩ)
TO–220AB
Gate–to–Source Voltage – Continuous VGS ±10 Vdc CASE 221A
STYLE 5 L1N06CL
Drain Current – Continuous ID Self–limited Adc
Drain Current – Single Pulse IDM 1.8 LLYWW
1
Total Power Dissipation PD 40 Watts 2
3 1 3
Electrostatic Discharge Voltage ESD 2.0 kV Gate Source
(Human Body Model)
2
Operating and Storage Junction TJ, Tstg –50 to 150 °C Drain
Temperature Range
L1N06CL = Device Code
THERMAL CHARACTERISTICS
LL = Location Code
Thermal Resistance, Junction to Case
θ, 3.12 °C/W Y = Year
Thermal Resistance, Junction to
θ, 62.5 WW = Work Week
Ambient
ORDERING INFORMATION
Maximum Lead Temperature for TL 260 °C
Soldering Purposes, 1/8″ from case Device Package Shipping

MLP1N06CL TO–220AB 50 Units/Rail

Preferred devices are recommended choices for future use


and best overall value.

 Semiconductor Components Industries, LLC, 2000 360 Publication Order Number:


November, 2000 – Rev. 2 MLP1N06CL/D
MLP1N06CL

UNCLAMPED DRAIN–TO–SOURCE AVALANCHE CHARACTERISTICS


Rating Symbol Value Unit
Single Pulse Drain–to–Source Avalanche Energy EAS 80 mJ
(Starting TJ = 25°C, ID = 2.0 A, L = 40 mH) (Figure 6)

ELECTRICAL CHARACTERISTICS (TJ = 25°C unless otherwise noted)


Characteristic Symbol Min Typ Max Unit
OFF CHARACTERISTICS
Drain–to–Source Sustaining Voltage (Internally Clamped) V(BR)DSS Vdc
(ID = 20 mA, VGS = 0) 59 62 65
(ID = 20 mA, VGS = 0, TJ = 150°C) 59 62 65
Zero Gate Voltage Drain Current IDSS µAdc
(VDS = 45 V, VGS = 0) – 0.6 5.0
(VDS = 45 V, VGS = 0, TJ = 150°C) – 6.0 20
Gate–Body Leakage Current IGSS µAdc
(VG = 5.0 V, VDS = 0) – 0.5 5.0
(VG = 5.0 V, VDS = 0, TJ = 150°C) – 1.0 20

ON CHARACTERISTICS (Note 1.)


Gate Threshold Voltage VGS(th) Vdc
(ID = 250 µA, VDS = VGS) 1.0 1.5 2.0
(ID = 250 µA, VDS = VGS, TJ = 150°C) 0.6 – 1.6
Static Drain–to–Source On–Resistance RDS(on) Ohms
(ID = 1.0 A, VGS = 4.0 V) – 0.63 0.75
(ID = 1.0 A, VGS = 5.0 V) – 0.59 0.75
(ID = 1.0 A, VGS = 4.0 V, TJ = 150°C) – 1.1 1.9
(ID = 1.0 A, VGS = 5.0 V, TJ = 150°C) – 1.0 1.8
Forward Transconductance (ID = 1.0 A, VDS = 10 V) gFS 1.0 1.4 – mhos
Static Source–to–Drain Diode Voltage (IS = 1.0 A, VGS = 0) VSD – 1.1 1.5 Vdc
Static Drain Current Limit ID(lim) A
(VGS = 5.0 V, VDS = 10 V) 2.0 2.3 2.75
(VGS = 5.0 V, VDS = 10 V, TJ = 150°C) 1.1 1.3 1.8

RESISTIVE SWITCHING CHARACTERISTICS (Note 1.)


Turn–On Delay Time td(on) – 1.2 2.0 µs
Rise Time (VDD = 25 V, ID = 1.0 A, tr – 4.0 6.0
Turn–Off Delay Time VGS = 5.0 V, RG = 50 Ohms) td(off) – 4.0 6.0
Fall Time tf – 3.0 5.0
1. Indicates Pulse Test: Pulse Width ≤ 300 µs, Duty Cycle ≤ 2.0%.

http://onsemi.com
361
MLP1N06CL

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Figure 1. Output Characteristics Figure 2. Transfer Function

THE SMARTDISCRETES CONCEPT SHORT CIRCUIT PROTECTION AND THE EFFECT OF


From a standard power MOSFET process, several active TEMPERATURE
and passive elements can be obtained that provide on–chip The on–chip circuitry of the MLP1N06CL offers an
protection to the basic power device. Such elements require integrated means of protecting the MOSFET component
only a small increase in silicon area and/or the addition of one from high in–rush current or a shorted load. As shown in the
masking layer to the process. The resulting device exhibits schematic diagram, the current limiting feature is provided
significant improvements in ruggedness and reliability as by an NPN transistor and integral resistors R1 and R2. R2
well as system cost reduction. The SMARTDISCRETES senses the current through the MOSFET and forward biases
device functions can now provide an economical alternative the NPN transistor’s base as the current increases. As the
to smart power ICs for power applications requiring low NPN turns on, it begins to pull gate drive current through R1,
on–resistance, high voltage and high current. dropping the gate drive voltage across it, and thus lowering
These devices are designed for applications that require a the voltage across the gate–to–source of the power
rugged power switching device with short circuit protection MOSFET and limiting the current. The current limit is
that can be directly interfaced to a microcontroller unit temperature dependent as shown in Figure 3, and decreases
(MCU). Ideal applications include automotive fuel injector from about 2.3 Amps at 25°C to about 1.3 Amps at 150°C.
driver, incandescent lamp driver or other applications where Since the MLP1N06CL continues to conduct current and
a high in–rush current or a shorted load condition could occur. dissipate power during a shorted load condition, it is
important to provide sufficient heatsinking to limit the
OPERATION IN THE CURRENT LIMIT MODE device junction temperature to a maximum of 150°C.
The amount of time that an unprotected device can The metal current sense resistor R2 adds about 0.4 ohms
withstand the current stress resulting from a shorted load to the power MOSFET’s on–resistance, but the effect of
before its maximum junction temperature is exceeded is temperature on the combination is less than on a standard
dependent upon a number of factors that include the amount MOSFET due to the lower temperature coefficient of R2.
of heatsinking that is provided, the size or rating of the The on–resistance variation with temperature for gate
device, its initial junction temperature, and the supply voltages of 4 and 5 Volts is shown in Figure 5.
voltage. Without some form of current limiting, a shorted Back–to–back polysilicon diodes between gate and
load can raise a device’s junction temperature beyond the source provide ESD protection to greater than 2 kV, HBM.
maximum rated operating temperature in only a few This on–chip protection feature eliminates the need for an
milliseconds. external Zener diode for systems with potentially heavy line
Even with no heatsink, the MLP1N06CL can withstand a transients.
shorted load powered by an automotive battery (10 to 14
Volts) for almost a second if its initial operating temperature
is under 100°C. For longer periods of operation in the
current–limited mode, device heatsinking can extend
operation from several seconds to indefinitely depending on
the amount of heatsinking provided.

http://onsemi.com
362
MLP1N06CL

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Figure 6. Single Pulse Avalanche Energy Figure 7. Drain–Source Sustaining


versus Junction Temperature Voltage Variation With Temperature

http://onsemi.com
363
MLP1N06CL

FORWARD BIASED SAFE OPERATING AREA (1.8 A at 150°C) and not the RDS(on). The maximum voltage
The FBSOA curves define the maximum drain–to–source can be calculated by the following equation:
voltage and drain current that a device can safely handle (150 – TA)
when it is forward biased, or when it is on, or being turned Vsupply =
ID(lim) (RθJC + RθCA)
on. Because these curves include the limitations of
simultaneous high voltage and high current, up to the rating where the value of RθCA is determined by the heatsink that
of the device, they are especially useful to designers of linear is being used in the application.
systems. The curves are based on a case temperature of 25°C
and a maximum junction temperature of 150°C. Limitations DUTY CYCLE OPERATION
for repetitive pulses at various case temperatures can be When operating in the duty cycle mode, the maximum
determined by using the thermal response curves. ON drain voltage can be increased. The maximum operating
Semiconductor Application Note, AN569, “Transient temperature is related to the duty cycle (DC) by the
Thermal Resistance – General Data and Its Use” provides following equation:
detailed instructions. TC = (VDS x ID x DC x RθCA) + TA

MAXIMUM DC VOLTAGE CONSIDERATIONS The maximum value of VDS applied when operating in a
The maximum drain–to–source voltage that can be duty cycle mode can be approximated by:
continuously applied across the MLP1N06CL when it is in 150 – TC
current limit is a function of the power that must be VDS =
ID(lim) x DC x RθJC
dissipated. This power is determined by the maximum
current limit at maximum rated operating temperature


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Safe Operating Area (MLP1N06CL)


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Figure 10. Switching Test Circuit Figure 11. Switching Waveforms

ACTIVE CLAMPING MLP1N06CL, the integrated gate–to–source voltage


SMARTDISCRETES technology can provide on–chip elements provide greater than 2.0 kV electrostatic voltage
realization of the popular gate–to–source and gate–to–drain protection.
Zener diode clamp elements. Until recently, such features The avalanche voltage of the gate–to–drain voltage clamp
have been implemented only with discrete components is set less than that of the power MOSFET device. As soon
which consume board space and add system cost. The as the drain–to–source voltage exceeds this avalanche
SMARTDISCRETES technology approach economically voltage, the resulting gate–to–drain Zener current builds a
melds these features and the power chip with only a slight gate voltage across the gate–to–source impedance, turning
increase in chip area. on the power device which then conducts the current. Since
In practice, back–to–back diode elements are formed in a virtually all of the current is carried by the power device, the
polysilicon region monolithicly integrated with, but gate–to–drain voltage clamp element may be small in size.
electrically isolated from, the main device structure. Each This technique of establishing a temperature compensated
back–to–back diode element provides a temperature drain–to–source sustaining voltage (Figure 7) effectively
compensated voltage element of about 7.2 volts. As the removes the possibility of drain–to–source avalanche in the
polysilicon region is formed on top of silicon dioxide, the power device.
diode elements are free from direct interaction with the The gate–to–drain voltage clamp technique is particularly
conduction regions of the power device, thus eliminating useful for snubbing loads where the inductive energy would
parasitic electrical effects while maintaining excellent otherwise avalanche the power device. An improvement in
thermal coupling. ruggedness of at least four times has been observed when
To achieve high gate–to–drain clamp voltages, several inductive energy is dissipated in the gate–to–drain clamped
voltage elements are strung together; the MLP1N06CL uses conduction mode rather than in the more stressful
8 such elements. Customarily, two voltage elements are used gate–to–source avalanche mode.
to provide a 14.4 volt gate–to–source voltage clamp. For the

TYPICAL APPLICATIONS: INJECTOR DRIVER, SOLENOIDS, LAMPS, RELAY COILS

The MLP1N06CL has been designed to allow direct = 


interface to the output of a microcontrol unit to control an
isolated load. No additional series gate resistance is 
required, but a 40 kΩ gate pulldown resistor is
recommended to avoid a floating gate condition in the event
of an MCU failure. The internal clamps allow the device to 
be used without any external transistent suppressing 
  9
components.


http://onsemi.com
365
# 
Preferred Device

 t '(


    
* %+%
N–Channel TO–220
This logic level power MOSFET features current limiting for short
circuit protection, integrated Gate–Source clamping for ESD http://onsemi.com
protection and integral Gate–Drain clamping for over–voltage
protection and Sensefet technology for low on–resistance. No 2 AMPERES
additional gate series resistance is required when interfacing to the
output of a MCU, but a 40 kΩ gate pulldown resistor is recommended 62 VOLTS (Clamped)
to avoid a floating gate condition. RDS(on) = 400 mΩ
The internal Gate–Source and Gate–Drain clamps allow the device
to be applied without use of external transient suppression N–Channel

components. The Gate–Source clamp protects the MOSFET input
from electrostatic voltage stress up to 2.0 kV. The Gate–Drain clamp
protects the MOSFET drain from the avalanche stress that occurs with
inductive loads. Their unique design provides voltage clamping that is
essentially independent of operating temperature.


MAXIMUM RATINGS (TJ = 25°C unless otherwise noted)
Rating Symbol Value Unit

#
Drain–to–Source Voltage VDSS Clamped Vdc
Drain–to–Gate Voltage VDGR Clamped Vdc
(RGS = 1.0 MΩ) 

Gate–to–Source Voltage – Continuous VGS ±10 Vdc MARKING DIAGRAM


Drain Current & PIN ASSIGNMENT
– Continuous @ TC = 25°C ID Self–limited Adc 4
4
Drain
Total Power Dissipation @ TC = 25°C PD 40 Watts
Electrostatic Voltage ESD 2.0 kV
Operating and Storage Temperature TJ, Tstg –50 to 150 °C TO–220AB
Range CASE 221A
STYLE 5 L2N06CL
THERMAL CHARACTERISTICS LLYWW
Maximum Junction Temperature TJ(max) 150 °C 1
2 1 3
Thermal Resistance – Junction to RθJC 3.12 °C/W 3
Case Gate Source

Maximum Lead Temperature for TL 260 °C 2


Soldering Purposes, 1/8″ from case Drain
for 5 sec.
L2N06CL = Device Code
DRAIN–TO–SOURCE AVALANCHE CHARACTERISTICS LL = Location Code
Single Pulse Drain–to–Source EAS 80 mJ Y = Year
Avalanche Energy (Starting WW = Work Week
TJ = 25°C, ID = 2.0 A, L = 40 mH)
ORDERING INFORMATION

Device Package Shipping

MLP2N06CL TO–220AB 50 Units/Rail

Preferred devices are recommended choices for future use


and best overall value.

 Semiconductor Components Industries, LLC, 2000 366 Publication Order Number:


November, 2000 – Rev. 1 MLP2N06CL/D
MLP2N06CL

ELECTRICAL CHARACTERISTICS (TC = 25°C unless otherwise noted)


Characteristic Symbol Min Typ Max Unit
OFF CHARACTERISTICS
Drain–to–Source Breakdown Voltage V(BR)DSS Vdc
(ID = 20 mAdc, VGS = 0 Vdc) 58 62 66
(ID = 20 mAdc, VGS = 0 Vdc, TJ = 150°C) 58 62 66
Zero Gate Voltage Drain Current IDSS µAdc
(VDS = 40 Vdc, VGS = 0 Vdc) – 0.6 5.0
(VDS = 40 Vdc, VGS = 0 Vdc, TJ = 150°C) – 6.0 20
Gate–Source Leakage Current IGSS µAdc
(VG = 5.0 Vdc, VDS = 0 Vdc) – 0.5 5.0
(VG = 5.0 Vdc, VDS = 0 Vdc, TJ = 150°C) – 1.0 20

ON CHARACTERISTICS (Note 1.)


Gate Threshold Voltage VGS(th) Vdc
(ID = 250 µAdc, VDS = VGS) 1.0 1.5 2.0
(ID = 250 µAdc, VDS = VGS, TJ = 150°C) 0.6 1 1.6
Static Drain Current Limit ID(lim) Adc
(VGS = 5.0 Vdc, VDS = 10 Vdc) 3.8 4.4 5.2
(VGS = 5.0 Vdc, VDS = 10 Vdc, TJ = 150°C) 1.6 2.4 2.9
Static Drain–to–Source On–Resistance RDS(on) Ohms
(ID = 1.0 Adc, VGS = 5.0 Vdc) – 0.3 0.4
(ID = 1.0 Adc, VGS = 5.0 Vdc, TJ = 150°C) – 0.53 0.7
Forward Transconductance (ID = 1.0 Adc, VDS = 10 Vdc) gFS 1.0 1.4 – mhos
Static Source–to–Drain Diode Voltage VSD Vdc
(IS = 1.0 Adc, VGS = 0 Vdc) – 1.1 1.5

SWITCHING CHARACTERISTICS (Note 2.)


Turn–On Delay Time td(on) – 1.0 1.5 µs
Rise Time (VDD = 30 Vdc, ID = 1.0 Adc, tr – 3.0 5.0
Turn–Off Delay Time VGS(on) = 5.0 Vdc, RGS = 25 Ohms) td(off) – 5.0 8.0
Fall Time tf – 3.0 5.0
1. Pulse Test: Pulse Width ≤ 300 µs, Duty Cycle ≤ 2%.
2. Switching characteristics are independent of operating junction temperature.

http://onsemi.com
367
MLP2N06CL

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Figure 1. Output Characteristics Figure 2. Transfer Function

THE SMARTDISCRETES CONCEPT SHORT CIRCUIT PROTECTION AND THE EFFECT OF


From a standard power MOSFET process, several active TEMPERATURE
and passive elements can be obtained that provide on–chip The on–chip circuitry of the MLP2N06CL offers an
protection to the basic power device. Such elements require integrated means of protecting the MOSFET component from
only a small increase in silicon area and/or the addition of one high in–rush current or a shorted load. As shown in the
masking layer to the process. The resulting device exhibits schematic diagram, the current limiting feature is provided by an
significant improvements in ruggedness and reliability as NPN transistor and integral resistors R1 and R2. R2 senses the
well as system cost reduction. The SMARTDISCRETES current through the MOSFET and forward biases the NPN
device functions can now provide an economical alternative transistor’s base as the current increases. As the NPN turns on,
to smart power ICs for power applications requiring low it begins to pull gate drive current through R1, dropping the gate
on–resistance, high voltage and high current. drive voltage across it, and thus lowering the voltage across the
These devices are designed for applications that require a gate–to–source of the power MOSFET and limiting the current.
rugged power switching device with short circuit protection The current limit is temperature dependent as shown in Figure
that can be directly interfaced to a microcontroller unit 3, and decreases from about 2.3 Amps at 25°C to about 1.3
(MCU). Ideal applications include automotive fuel injector Amps at 150°C.
driver, incandescent lamp driver or other applications where Since the MLP2N06CL continues to conduct current and
a high in–rush current or a shorted load condition could occur. dissipate power during a shorted load condition, it is important
to provide sufficient heatsinking to limit the device junction
OPERATION IN THE CURRENT LIMIT MODE temperature to a maximum of 150°C.
The amount of time that an unprotected device can The metal current sense resistor R2 adds about 0.4 ohms to
withstand the current stress resulting from a shorted load the power MOSFET’s on–resistance, but the effect of
before its maximum junction temperature is exceeded is temperature on the combination is less than on a standard
dependent upon a number of factors that include the amount MOSFET due to the lower temperature coefficient of R2. The
of heatsinking that is provided, the size or rating of the device, on–resistance variation with temperature for gate voltages of 4
its initial junction temperature, and the supply voltage. and 5 Volts is shown in Figure 5.
Without some form of current limiting, a shorted load can Back–to–back polysilicon diodes between gate and source
raise a device’s junction temperature beyond the maximum provide ESD protection to greater than 2 kV, HBM. This
rated operating temperature in only a few milliseconds. on–chip protection feature eliminates the need for an external
Even with no heatsink, the MLP2N06CL can withstand a Zener diode for systems with potentially heavy line transients.
shorted load powered by an automotive battery (10 to 14
Volts) for almost a second if its initial operating temperature
is under 100°C. For longer periods of operation in the
current–limited mode, device heatsinking can extend
operation from several seconds to indefinitely depending on
the amount of heatsinking provided.

http://onsemi.com
368
MLP2N06CL

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Gate–To–Source Voltage

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Figure 6. Maximum Avalanche Energy Figure 7. Drain–Source Sustaining


versus Starting Junction Temperature Voltage Variation With Temperature

http://onsemi.com
369
MLP2N06CL

FORWARD BIASED SAFE OPERATING AREA (1.8 A at 150°C) and not the RDS(on). The maximum voltage
The FBSOA curves define the maximum drain–to–source can be calculated by the following equation:
voltage and drain current that a device can safely handle (150 – TA)
when it is forward biased, or when it is on, or being turned Vsupply =
ID(lim) (RθJC + RθCA)
on. Because these curves include the limitations of
simultaneous high voltage and high current, up to the rating where the value of RθCA is determined by the heatsink that
of the device, they are especially useful to designers of linear is being used in the application.
systems. The curves are based on a case temperature of 25°C
and a maximum junction temperature of 150°C. Limitations DUTY CYCLE OPERATION
for repetitive pulses at various case temperatures can be When operating in the duty cycle mode, the maximum
determined by using the thermal response curves. ON drain voltage can be increased. The maximum operating
Semiconductor Application Note, AN569, “Transient temperature is related to the duty cycle (DC) by the
Thermal Resistance – General Data and Its Use” provides following equation:
detailed instructions. TC = (VDS x ID x DC x RθCA) + TA

MAXIMUM DC VOLTAGE CONSIDERATIONS The maximum value of VDS applied when operating in a
The maximum drain–to–source voltage that can be duty cycle mode can be approximated by:
continuously applied across the MLP2N06CL when it is in 150 – TC
current limit is a function of the power that must be VDS =
ID(lim) x DC x RθJC
dissipated. This power is determined by the maximum
current limit at maximum rated operating temperature


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Figure 8. Maximum Rated Forward Bias


Safe Operating Area (MLP2N06CL)


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Figure 9. Thermal Response (MLP2N06CL)

http://onsemi.com
370
MLP2N06CL

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7B 7B

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Figure 10. Switching Test Circuit Figure 11. Switching Waveforms

ACTIVE CLAMPING MLP2N06CL, the integrated gate–to–source voltage


SMARTDISCRETES technology can provide on–chip elements provide greater than 2.0 kV electrostatic voltage
realization of the popular gate–to–source and gate–to–drain protection.
Zener diode clamp elements. Until recently, such features The avalanche voltage of the gate–to–drain voltage clamp
have been implemented only with discrete components is set less than that of the power MOSFET device. As soon
which consume board space and add system cost. The as the drain–to–source voltage exceeds this avalanche
SMARTDISCRETES technology approach economically voltage, the resulting gate–to–drain Zener current builds a
melds these features and the power chip with only a slight gate voltage across the gate–to–source impedance, turning
increase in chip area. on the power device which then conducts the current. Since
In practice, back–to–back diode elements are formed in a virtually all of the current is carried by the power device, the
polysilicon region monolithicly integrated with, but gate–to–drain voltage clamp element may be small in size.
electrically isolated from, the main device structure. Each This technique of establishing a temperature compensated
back–to–back diode element provides a temperature drain–to–source sustaining voltage (Figure 7) effectively
compensated voltage element of about 7.2 volts. As the removes the possibility of drain–to–source avalanche in the
polysilicon region is formed on top of silicon dioxide, the power device.
diode elements are free from direct interaction with the The gate–to–drain voltage clamp technique is particularly
conduction regions of the power device, thus eliminating useful for snubbing loads where the inductive energy would
parasitic electrical effects while maintaining excellent otherwise avalanche the power device. An improvement in
thermal coupling. ruggedness of at least four times has been observed when
To achieve high gate–to–drain clamp voltages, several inductive energy is dissipated in the gate–to–drain clamped
voltage elements are strung together; the MLP2N06CL uses conduction mode rather than in the more stressful
8 such elements. Customarily, two voltage elements are used gate–to–source avalanche mode.
to provide a 14.4 volt gate–to–source voltage clamp. For the

TYPICAL APPLICATIONS: INJECTOR DRIVER, SOLENOIDS, LAMPS, RELAY COILS

The MLP2N06CL has been designed to allow direct = 


interface to the output of a microcontrol unit to control an
isolated load. No additional series gate resistance is 
required, but a 40 kΩ gate pulldown resistor is
recommended to avoid a floating gate condition in the event
of an MCU failure. The internal clamps allow the device to 
be used without any external transistent suppressing 
 # 9
components.


http://onsemi.com
371
( 
Preferred Device

#$%& '(
!    
N–Channel SOT–23
These miniature surface mount MOSFETs low RDS(on) assure
minimal power loss and conserve energy, making these devices ideal
for use in small power management circuitry. Typical applications are http://onsemi.com
dc–dc converters, power management in portable and
battery–powered products such as computers, printers, PCMCIA 300 mAMPS
cards, cellular and cordless telephones. 20 VOLTS
• Low RDS(on) Provides Higher Efficiency and Extends Battery Life RDS(on) = 1 
• Miniature SOT–23 Surface Mount Package Saves Board Space
N–Channel
MAXIMUM RATINGS (TJ = 25°C unless otherwise noted) 4
Rating Symbol Value Unit
Drain–to–Source Voltage VDSS 20 Vdc
Gate–to–Source Voltage – Continuous VGS ± 20 Vdc

Drain Current mAdc
– Continuous @ TA = 25°C ID 300
– Continuous @ TA = 70°C ID 240
– Pulsed Drain Current (tp ≤ 10 µs) IDM 750 #
Total Power Dissipation @ TA = 25°C(1) PD 225 mW
MARKING
Operating and Storage Temperature TJ, Tstg – 55 to °C
Range 150
DIAGRAM

Thermal Resistance – Junction–to–Ambient RθJA 556 °C/W 3


Maximum Lead Temperature for Soldering TL 260 °C SOT–23 N1
Purposes, 1/8″ from case for 10 CASE 318 W
1 STYLE 21
seconds
2

N1 = Device Code
W = Work Week

PIN ASSIGNMENT
3
()%

1 2
)'1 ;(1

ORDERING INFORMATION

Device Package Shipping

MMBF0201NLT1 SOT–23 3000 Tape & Reel

Preferred devices are recommended choices for future use


and best overall value.

 Semiconductor Components Industries, LLC, 2000 372 Publication Order Number:


November, 2000 – Rev. 2 MMBF0201NLT1/D
MMBF0201NLT1

ELECTRICAL CHARACTERISTICS (TA = 25°C unless otherwise noted)


Characteristic Symbol Min Typ Max Unit
OFF CHARACTERISTICS
Drain–to–Source Breakdown Voltage V(BR)DSS 20 – – Vdc
(VGS = 0 Vdc, ID = 10 µA)
Zero Gate Voltage Drain Current IDSS µAdc
(VDS = 16 Vdc, VGS = 0 Vdc) – – 1.0
(VDS = 16 Vdc, VGS = 0 Vdc, TJ = 125°C) – – 10
Gate–Body Leakage Current (VGS = ± 20 Vdc, VDS = 0) IGSS – – ±100 nAdc
ON CHARACTERISTICS (Note 1.)
Gate Threshold Voltage VGS(th) 1.0 1.7 2.4 Vdc
(VDS = VGS, ID = 250 µAdc)
Static Drain–to–Source On–Resistance rDS(on) Ohms
(VGS = 10 Vdc, ID = 300 mAdc) – 0.75 1.0
(VGS = 4.5 Vdc, ID = 100 mAdc) – 1.0 1.4
Forward Transconductance (VDS = 10 Vdc, ID = 200 mAdc) gFS – 450 – mMhos
DYNAMIC CHARACTERISTICS
Input Capacitance (VDS = 5.0 V) Ciss – 45 – pF
Output Capacitance (VDS = 5.0 V) Coss – 25 –
Transfer Capacitance (VDG = 5.0 V) Crss – 5.0 –

SWITCHING CHARACTERISTICS (Note 2.)


Turn–On Delay Time td(on) – 2.5 – ns
Rise Time (VDD = 15 Vdc, ID = 300 mAdc, tr – 2.5 –
Turn–Off Delay Time RL = 50 Ω) td(off) – 15 –
Fall Time tf – 0.8 –
Gate Charge (See Figure 5) QT – 1400 – pC
SOURCE–DRAIN DIODE CHARACTERISTICS
Continuous Current IS – – 0.3 A
Pulsed Current ISM – – 0.75
Forward Voltage (Note 2.) VSD – 0.85 – V
1. Pulse Test: Pulse Width ≤ 300 µs, Duty Cycle ≤ 2%.
2. Switching characteristics are independent of operating junction temperature.

http://onsemi.com
373
MMBF0201NLT1

TYPICAL ELECTRICAL CHARACTERISTICS

 
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Figure 1. Transfer Characteristics Figure 2. On–Region Characteristics


 


  
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Figure 3. On–Resistance versus Drain Current Figure 4. On–Resistance versus


Gate–to–Source Voltage

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Figure 5. Gate Charge Figure 6. Threshold Voltage Variance


Over Temperature

http://onsemi.com
374
MMBF0201NLT1

TYPICAL ELECTRICAL CHARACTERISTICS

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Figure 7. On–Resistance versus Figure 8. Capacitance


Junction Temperature





  





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Figure 9. Source–to–Drain Forward Voltage


versus Continuous Current (IS)

http://onsemi.com
375
MMBF0201NLT1

INFORMATION FOR USING THE SOT–23 SURFACE MOUNT PACKAGE

MINIMUM RECOMMENDED FOOTPRINT FOR SURFACE MOUNTED APPLICATIONS


Surface mount board layout is a critical portion of the interface between the board and the package. With the
total design. The footprint for the semiconductor packages correct pad geometry, the packages will self align when
must be the correct size to insure proper solder connection subjected to a solder reflow process.

4:
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4$
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8

SOT–23 POWER DISSIPATION


The power dissipation of the SOT–23 is a function of the one can calculate the power dissipation of the device which
drain pad size. This can vary from the minimum pad size in this case is 225 milliwatts.
for soldering to a pad size given for maximum power 150°C – 25°C
PD = = 225 milliwatts
dissipation. Power dissipation for a surface mount device is 556°C/W
determined by TJ(max), the maximum rated junction
temperature of the die, RθJA, the thermal resistance from The 556°C/W for the SOT–23 package assumes the use
the device junction to ambient, and the operating of the recommended footprint on a glass epoxy printed
temperature, TA. Using the values provided on the data circuit board to achieve a power dissipation of 225
sheet for the SOT–23 package, PD can be calculated as milliwatts. There are other alternatives to achieving higher
follows: power dissipation from the SOT–23 package. Another
alternative would be to use a ceramic substrate or an
TJ(max) – TA
PD = aluminum core board such as Thermal Cladt. Using a
RθJA board material such as Thermal Clad, an aluminum core
The values for the equation are found in the maximum board, the power dissipation can be doubled using the same
ratings table on the data sheet. Substituting these values footprint.
into the equation for an ambient temperature TA of 25°C,

SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • The soldering temperature and time should not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within • When shifting from preheating to soldering, the
a short time could result in device failure. Therefore, the maximum temperature gradient should be 5°C or less.
following items should always be observed in order to • After soldering has been completed, the device should
minimize the thermal stress to which the devices are be allowed to cool naturally for at least three minutes.
subjected. Gradual cooling should be used as the use of forced
• Always preheat the device. cooling will increase the temperature gradient and
• The delta temperature between the preheat and result in latent failure due to mechanical stress.
soldering should be 100°C or less.* • Mechanical stress or shock should not be applied
• When preheating and soldering, the temperature of the during cooling
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When * Soldering a device without preheating can cause
using infrared heating with the reflow soldering excessive thermal shock and stress which can result in
method, the difference should be a maximum of 10°C. damage to the device.

http://onsemi.com
376
(  #
Preferred Device

#$%& '(
!    
P–Channel SOT–23
These miniature surface mount MOSFETs low RDS(on) assure
minimal power loss and conserve energy, making these devices ideal
for use in small power management circuitry. Typical applications are http://onsemi.com
dc–dc converters, power management in portable and
battery–powered products such as computers, printers, PCMCIA 300 mAMPS
cards, cellular and cordless telephones. 20 VOLTS
• Low RDS(on) Provides Higher Efficiency and Extends Battery Life RDS(on) = 1.4 
• Miniature SOT–23 Surface Mount Package Saves Board Space
P–Channel
MAXIMUM RATINGS (TJ = 25°C unless otherwise noted) 4
Rating Symbol Value Unit
Drain–to–Source Voltage VDSS 20 Vdc
Gate–to–Source Voltage – Continuous VGS ± 20 Vdc

Drain Current mAdc
– Continuous @ TA = 25°C ID 300
– Continuous @ TA = 70°C ID 240
– Pulsed Drain Current (tp ≤ 10 µs) IDM 750 #
Total Power Dissipation @ TA = 25°C PD 225 mW
(Note 1.) MARKING
DIAGRAM
Operating and Storage Temperature TJ, Tstg – 55 to °C
Range 150
3
Thermal Resistance – Junction–to–Ambient RθJA 625 °C/W SOT–23 P3
Maximum Lead Temperature for Soldering TL 260 °C CASE 318 W
1 STYLE 21
Purposes, 1/8″ from case for 10
seconds 2

1. Pulse Test: Pulse Width ≤ 300 µs, Duty Cycle ≤ 2%.


P3 = Device Code
W = Work Week

PIN ASSIGNMENT
3
()%

1 2
)'1 ;(1

ORDERING INFORMATION

Device Package Shipping

MMBF0202PLT1 SOT–23 3000 Tape & Reel

Preferred devices are recommended choices for future use


and best overall value.

 Semiconductor Components Industries, LLC, 2000 377 Publication Order Number:


November, 2000 – Rev. 1 MMBF0202PLT1/D
MMBF0202PLT1

ELECTRICAL CHARACTERISTICS (TA = 25°C unless otherwise noted)


Characteristic Symbol Min Typ Max Unit
OFF CHARACTERISTICS
Drain–to–Source Breakdown Voltage V(BR)DSS 20 – – Vdc
(VGS = 0 Vdc, ID = 10 µA)
Zero Gate Voltage Drain Current IDSS µAdc
(VDS = 16 Vdc, VGS = 0 Vdc) – – 1.0
(VDS = 16 Vdc, VGS = 0 Vdc, TJ = 125°C) – – 10
Gate–Body Leakage Current (VGS = ± 20 Vdc, VDS = 0) IGSS – – ±100 nAdc
ON CHARACTERISTICS (Note 2.)
Gate Threshold Voltage VGS(th) 1.0 1.7 2.4 Vdc
(VDS = VGS, ID = 250 µAdc)
Static Drain–to–Source On–Resistance rDS(on) Ohms
(VGS = 10 Vdc, ID = 200 mAdc) – 0.9 1.4
(VGS = 4.5 Vdc, ID = 50 mAdc) – 2.0 3.5
Forward Transconductance (VDS = 10 Vdc, ID = 200 mAdc) gFS – 600 – mMhos
DYNAMIC CHARACTERISTICS
Input Capacitance (VDS = 5.0 V) Ciss – 50 – pF
Output Capacitance (VDS = 5.0 V) Coss – 45 –
Transfer Capacitance (VDG = 5.0 V) Crss – 20 –

SWITCHING CHARACTERISTICS (Note 3.)


Turn–On Delay Time td(on) – 2.5 – ns
Rise Time (VDD = –15 Vdc, tr – 1.0 –
RL = 75 Ω,
Ω ID = 200 mAdc,
mAdc
Turn–Off Delay Time 10 V, RG = 6.0 Ω)
VGEN = –10 td(off) – 16 –
Fall Time tf – 8.0 –
Gate Charge (See Figure 5) (VDS = 16 V, VGS = 10 V, QT – 2700 – pC
ID = 200 mA)

SOURCE–DRAIN DIODE CHARACTERISTICS


Continuous Current IS – – 0.3 A
Pulsed Current ISM – – 0.75
Forward Voltage (Note 3.) VSD – 1.5 – V
2. Pulse Test: Pulse Width ≤ 300 µs, Duty Cycle ≤ 2%.
3. Switching characteristics are independent of operating junction temperature.

http://onsemi.com
378
MMBF0202PLT1

TYPICAL ELECTRICAL CHARACTERISTICS

 
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6 6

4
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Figure 1. Transfer Characteristics Figure 2. On–Region Characteristics


 


  
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Figure 3. On–Resistance versus Drain Current Figure 4. On–Resistance versus


Gate–to–Source Voltage

9 #
  
 

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Figure 5. Gate Charge Figure 6. Threshold Voltage Variance


Over Temperature

http://onsemi.com
379
MMBF0202PLT1

TYPICAL ELECTRICAL CHARACTERISTICS

4 6
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Figure 7. On–Resistance versus Figure 8. Capacitance


Junction Temperature





  



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Figure 9. Source–to–Drain Forward Voltage


versus Continuous Current (IS)

http://onsemi.com
380
MMBF0202PLT1

INFORMATION FOR USING THE SOT–23 SURFACE MOUNT PACKAGE

MINIMUM RECOMMENDED FOOTPRINT FOR SURFACE MOUNTED APPLICATIONS


Surface mount board layout is a critical portion of the interface between the board and the package. With the
total design. The footprint for the semiconductor packages correct pad geometry, the packages will self align when
must be the correct size to insure proper solder connection subjected to a solder reflow process.

4:
4: 7$
7$

:7
#

4$
7

4 %21!
8

SOT–23 POWER DISSIPATION


The power dissipation of the SOT–23 is a function of the one can calculate the power dissipation of the device which
drain pad size. This can vary from the minimum pad size in this case is 225 milliwatts.
for soldering to a pad size given for maximum power 150°C – 25°C
PD = = 225 milliwatts
dissipation. Power dissipation for a surface mount device is 556°C/W
determined by TJ(max), the maximum rated junction
temperature of the die, RθJA, the thermal resistance from The 556°C/W for the SOT–23 package assumes the use
the device junction to ambient, and the operating of the recommended footprint on a glass epoxy printed
temperature, TA. Using the values provided on the data circuit board to achieve a power dissipation of 225
sheet for the SOT–23 package, PD can be calculated as milliwatts. There are other alternatives to achieving higher
follows: power dissipation from the SOT–23 package. Another
alternative would be to use a ceramic substrate or an
TJ(max) – TA
PD = aluminum core board such as Thermal Cladt. Using a
RθJA board material such as Thermal Clad, an aluminum core
The values for the equation are found in the maximum board, the power dissipation can be doubled using the same
ratings table on the data sheet. Substituting these values footprint.
into the equation for an ambient temperature TA of 25°C,

SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • The soldering temperature and time should not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within • When shifting from preheating to soldering, the
a short time could result in device failure. Therefore, the maximum temperature gradient should be 5°C or less.
following items should always be observed in order to • After soldering has been completed, the device should
minimize the thermal stress to which the devices are be allowed to cool naturally for at least three minutes.
subjected. Gradual cooling should be used as the use of forced
• Always preheat the device. cooling will increase the temperature gradient and
• The delta temperature between the preheat and result in latent failure due to mechanical stress.
soldering should be 100°C or less.* • Mechanical stress or shock should not be applied
• When preheating and soldering, the temperature of the during cooling
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When * Soldering a device without preheating can cause
using infrared heating with the reflow soldering excessive thermal shock and stress which can result in
method, the difference should be a maximum of 10°C. damage to the device.

http://onsemi.com
381
(!"
Preferred Device

0 
0 '(
  !  
N–Channel SC–70/SOT–323
These miniature surface mount MOSFETs low RDS(on) assure
minimal power loss and conserve energy, making these devices ideal
for use in small power management circuitry. Typical applications are http://onsemi.com
dc–dc converters, power management in portable and
battery–powered products such as computers, printers, PCMCIA 50 mAMPS
cards, cellular and cordless telephones. 30 VOLTS
• Low RDS(on) Provides Higher Efficiency and Extends Battery Life RDS(on) = 50 
• Miniature SC–70/SOT–323 Surface Mount Package Saves
Board Space N–Channel


MAXIMUM RATINGS (TJ = 25°C unless otherwise noted)
Rating Symbol Value Unit
Drain–to–Source Voltage VDS 20 Vdc
Gate–to–Source Voltage – Pulse VGS ± 20 Vdc 

Drain Current – Continuous @ TA = 25°C ID 50 mAdc



Total Power Dissipation @ TA = 25°C PD
(Note 1.) Derate above 25°C 100 mW
MARKING
Operating and Storage Temperature TJ, Tstg – 55 to °C DIAGRAM
Range 150

Maximum Lead Temperature for Soldering TL 260 °C 3


Purposes, for 10 seconds SC–70/SOT–323 F1
CASE 419 W
1. Mounted on G10/FR4 glass epoxy board using minimum recommended STYLE 8
footprint. 1
2
F1 = Device Code
W = Work Week

PIN ASSIGNMENT
3
Drain

Gate 1 2 Source
Top View

ORDERING INFORMATION

Device Package Shipping

MMBF1374T1 SC–70/ 3000 Tape & Reel


SOT–323

Preferred devices are recommended choices for future use


and best overall value.

 Semiconductor Components Industries, LLC, 2001 382 Publication Order Number:


January, 2001 – Rev. 0 MMBF1374T1/D
MMBF1374T1

ELECTRICAL CHARACTERISTICS (TA = 25°C unless otherwise noted)


Characteristic Symbol Min Typ Max Unit
OFF CHARACTERISTICS
Drain–to–Source Breakdown Voltage V(BR)DSS 30 – – Vdc
(VGS = 0 Vdc, ID = 10 µA)
Zero Gate Voltage Drain Current IDSS – – 1.0 µAdc
(VDS = 16 Vdc, VGS = 0 Vdc)
Gate–Body Leakage Current (VGS = ± 20 Vdc, VDS = 0) IGSS – – 1.0 µAdc
ON CHARACTERISTICS (Note 2.)
Gate Threshold Voltage VGS(th) – 2 2.8 Vdc
(VDS = VGS, ID = 250 µAdc)
Static Drain–to–Source On–Resistance rDS(on) – 27 50 Ω
(VGS = 4.5 Vdc, ID = 10 mAdc)
Forward Transconductance (VDS = 10 Vdc, ID = 50 mAdc) gFS – 450 – mMhos
DYNAMIC CHARACTERISTICS
Input Capacitance (VDS = 5.0 V) Ciss – 45 – pF
Output Capacitance (VDS = 5.0 V) Coss – 25 –
Transfer Capacitance (VDG = 5.0 V) Crss – 5.0 –

SWITCHING CHARACTERISTICS (Note 3.)


Turn–On Delay Time td(on) – 2.5 – ns
Rise Time (VDD = 15 Vdc, ID = 50 mAdc, tr – 2.5 –
Turn–Off Delay Time RL = 50 Ω) td(off) – 15 –
Fall Time tf – 0.8 –
2. Pulse Test: Pulse Width ≤ 300 µs, Duty Cycle ≤ 2%.
3. Switching characteristics are independent of operating junction temperature.

http://onsemi.com
383
("

#$%& '(
    
N–Channel SOT–23

MAXIMUM RATINGS
http://onsemi.com
Rating Symbol Value Unit
Drain–Source Voltage VDSS 60 Vdc
500 mAMPS
Drain–Gate Voltage VDGS 60 Vdc
60 VOLTS
Gate–Source Voltage
– Continuous VGS ±20 Vdc
RDS(on) = 5 
– Non–repetitive (tp ≤ 50 ms) VGSM ±40 Vpk
N–Channel
Drain Current – Continuous ID 0.5 Adc
– Pulsed IDM 0.8 4

THERMAL CHARACTERISTICS
Characteristic Symbol Max Unit
Total Device Dissipation FR–5 Board PD
(Note 1.) TA = 25°C 225 mW 
Derate above 25°C 1.8 mW/°C
Thermal Resistance, Junction to Ambient RqJA 556 °C/W
#
Junction and Storage Temperature TJ, Tstg –55 to °C
+150
1. FR–5 = 1.0  0.75  0.062 in. MARKING
DIAGRAM

3
SOT–23 6Z
CASE 318 W
1 STYLE 21
2

6Z = Device Code
W = Work Week

PIN ASSIGNMENT
3
Drain

Gate 1 2 Source

ORDERING INFORMATION

Device Package Shipping

MMBF170LT1 SOT–23 3000 Tape & Reel

MMBF170LT3 SOT–23 10,000 Tape & Reel

 Semiconductor Components Industries, LLC, 2000 384 Publication Order Number:


November, 2000 – Rev. 3 MMBF170LT1/D
MMBF170LT1

ELECTRICAL CHARACTERISTICS (TC = 25°C unless otherwise noted)


Characteristic Symbol Min Max Unit

OFF CHARACTERISTICS
Drain–Source Breakdown Voltage (VGS = 0, ID = 100 mA) V(BR)DSS 60 – Vdc
Gate–Body Leakage Current, Forward (VGSF = 15 Vdc, VDS = 0) IGSS – 10 nAdc

ON CHARACTERISTICS (Note 2.)


Gate Threshold Voltage (VDS = VGS, ID = 1.0 mA) VGS(th) 0.8 3.0 Vdc
Static Drain–Source On–Resistance (VGS = 10 Vdc, ID = 200 mA) rDS(on) – 5.0 W
On–State Drain Current (VDS = 25 Vdc, VGS = 0) ID(off) – 0.5 mA
DYNAMIC CHARACTERISTICS
Input Capacitance Ciss – 60 pF
(VDS = 10 Vdc, VGS = 0 V, f = 1.0 MHz)

SWITCHING CHARACTERISTICS (Note 2.)


Turn–On Delay Time (VDD = 25 Vdc, ID = 500 mA, Rgen = 50 W) td(on) – 10 ns
Turn–Off Delay Time Figure 1 td(off) – 10
2. Pulse Test: Pulse Width v 300 ms, Duty Cycle v 2.0%.

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Figure 1. Switching Test Circuit Figure 2. Switching Waveform

http://onsemi.com
385
MMBF170LT1

TYPICAL ELECTRICAL CHARACTERISTICS

# 
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Figure 3. Ohmic Region Figure 4. Transfer Characteristics


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Figure 5. Temperature versus Static Figure 6. Temperature versus Gate


Drain–Source On–Resistance Threshold Voltage

http://onsemi.com
386
MMBF170LT1

INFORMATION FOR USING THE SOT–23 SURFACE MOUNT PACKAGE

MINIMUM RECOMMENDED FOOTPRINT FOR SURFACE MOUNTED APPLICATIONS


Surface mount board layout is a critical portion of the interface between the board and the package. With the
total design. The footprint for the semiconductor packages correct pad geometry, the packages will self align when
must be the correct size to insure proper solder connection subjected to a solder reflow process.

4:
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8

SOT–23 POWER DISSIPATION


The power dissipation of the SOT–23 is a function of the one can calculate the power dissipation of the device which
pad size. This can vary from the minimum pad size for in this case is 225 milliwatts.
soldering to a pad size given for maximum power 150°C – 25°C
PD = = 225 milliwatts
dissipation. Power dissipation for a surface mount device is 556°C/W
determined by TJ(max), the maximum rated junction
temperature of the die, RθJA, the thermal resistance from The 556°C/W for the SOT–23 package assumes the use
the device junction to ambient, and the operating of the recommended footprint on a glass epoxy printed
temperature, TA. Using the values provided on the data circuit board to achieve a power dissipation of 225
sheet for the SOT–23 package, PD can be calculated as milliwatts. There are other alternatives to achieving higher
follows: power dissipation from the SOT–23 package. Another
alternative would be to use a ceramic substrate or an
TJ(max) – TA
PD = aluminum core board such as Thermal Cladt. Using a
RθJA board material such as Thermal Clad, an aluminum core
The values for the equation are found in the maximum board, the power dissipation can be doubled using the same
ratings table on the data sheet. Substituting these values footprint.
into the equation for an ambient temperature TA of 25°C,

SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • The soldering temperature and time shall not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within • When shifting from preheating to soldering, the
a short time could result in device failure. Therefore, the maximum temperature gradient shall be 5°C or less.
following items should always be observed in order to • After soldering has been completed, the device should
minimize the thermal stress to which the devices are be allowed to cool naturally for at least three minutes.
subjected. Gradual cooling should be used as the use of forced
• Always preheat the device. cooling will increase the temperature gradient and
• The delta temperature between the preheat and result in latent failure due to mechanical stress.
soldering should be 100°C or less.* • Mechanical stress or shock should not be applied
• When preheating and soldering, the temperature of the during cooling.
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When * Soldering a device without preheating can cause
using infrared heating with the reflow soldering excessive thermal shock and stress which can result in
method, the difference shall be a maximum of 10°C. damage to the device.

http://onsemi.com
387
( 
Preferred Device

#$%& '(
!    
N–Channel SC–70/SOT–323
These miniature surface mount MOSFETs low RDS(on) assure
minimal power loss and conserve energy, making these devices ideal
for use in small power management circuitry. Typical applications are http://onsemi.com
dc–dc converters, power management in portable and
battery–powered products such as computers, printers, PCMCIA 300 mAMPS
cards, cellular and cordless telephones. 20 VOLTS
• Low RDS(on) Provides Higher Efficiency and Extends Battery Life RDS(on) = 1 
• Miniature SC–70/SOT–323 Surface Mount Package Saves
Board Space N–Channel
4
MAXIMUM RATINGS (TJ = 25°C unless otherwise noted)
Rating Symbol Value Unit
Drain–to–Source Voltage VDSS 20 Vdc
Gate–to–Source Voltage – Continuous VGS ± 20 Vdc 

Drain Current mAdc


– Continuous @ TA = 25°C ID 300
– Continuous @ TA = 70°C ID 240 #
– Pulsed Drain Current (tp ≤ 10 µs) IDM 750
MARKING
Total Power Dissipation @ TA = 25°C PD DIAGRAM
(Note 1.) 150 mW
Derate above 25°C 1.2 mW/°C
3
Operating and Storage Temperature TJ, Tstg – 55 to °C SC–70/SOT–323 N1
Range 150 CASE 419 W
STYLE 8
Thermal Resistance – Junction–to–Ambient RθJA 833 °C/W 1
2
Maximum Lead Temperature for Soldering TL 260 °C
Purposes, for 10 seconds N1 = Device Code
1. Mounted on G10/FR4 glass epoxy board using minimum recommended W = Work Week
footprint.
PIN ASSIGNMENT
3 Drain

Gate 1 2 Source
Top View

ORDERING INFORMATION

Device Package Shipping

MMBF2201NT1 SC–70/ 3000 Tape & Reel


SOT–323

Preferred devices are recommended choices for future use


and best overall value.

 Semiconductor Components Industries, LLC, 2000 388 Publication Order Number:


November, 2000 – Rev. 3 MMBF2201NT1/D
MMBF2201NT1

ELECTRICAL CHARACTERISTICS (TA = 25°C unless otherwise noted)


Characteristic Symbol Min Typ Max Unit
OFF CHARACTERISTICS
Drain–to–Source Breakdown Voltage V(BR)DSS 20 – – Vdc
(VGS = 0 Vdc, ID = 10 µA)
Zero Gate Voltage Drain Current IDSS µAdc
(VDS = 16 Vdc, VGS = 0 Vdc) – – 1.0
(VDS = 16 Vdc, VGS = 0 Vdc, TJ = 125°C) – – 10
Gate–Body Leakage Current (VGS = ± 20 Vdc, VDS = 0) IGSS – – ±100 nAdc
ON CHARACTERISTICS (Note 2.)
Gate Threshold Voltage VGS(th) 1.0 1.7 2.4 Vdc
(VDS = VGS, ID = 250 µAdc)
Static Drain–to–Source On–Resistance rDS(on) Ohms
(VGS = 10 Vdc, ID = 300 mAdc) – 0.75 1.0
(VGS = 4.5 Vdc, ID = 100 mAdc) – 1.0 1.4
Forward Transconductance (VDS = 10 Vdc, ID = 200 mAdc) gFS – 450 – mMhos
DYNAMIC CHARACTERISTICS
Input Capacitance (VDS = 5.0 V) Ciss – 45 – pF
Output Capacitance (VDS = 5.0 V) Coss – 25 –
Transfer Capacitance (VDG = 5.0 V) Crss – 5.0 –

SWITCHING CHARACTERISTICS (Note 3.)


Turn–On Delay Time td(on) – 2.5 – ns
Rise Time (VDD = 15 Vdc, ID = 300 mAdc, tr – 2.5 –
Turn–Off Delay Time RL = 50 Ω) td(off) – 15 –
Fall Time tf – 0.8 –
Gate Charge (See Figure 5) QT – 1400 – pC
SOURCE–DRAIN DIODE CHARACTERISTICS
Continuous Current IS – – 0.3 A
Pulsed Current ISM – – 0.75
Forward Voltage (Note 3.) VSD – 0.85 – V
2. Pulse Test: Pulse Width ≤ 300 µs, Duty Cycle ≤ 2%.
3. Switching characteristics are independent of operating junction temperature.

TYPICAL CHARACTERISTICS

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Figure 1. Typical Drain Characteristics Figure 2. On Resistance versus Temperature

http://onsemi.com
389
MMBF2201NT1

TYPICAL CHARACTERISTICS

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Figure 3. On Resistance versus Gate–Source Figure 4. On Resistance versus Drain Current


Voltage

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Figure 5. Source–Drain Forward Voltage Figure 6. Capacitance Variation


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Figure 7. Transfer Characteristics

http://onsemi.com
390
MMBF2201NT1

INFORMATION FOR USING THE SC–70/SOT–323 SURFACE MOUNT PACKAGE

MINIMUM RECOMMENDED FOOTPRINT FOR SURFACE MOUNTED APPLICATIONS


Surface mount board layout is a critical portion of the interface between the board and the package. With the
total design. The footprint for the semiconductor packages correct pad geometry, the packages will self align when
must be the correct size to insure proper solder connection subjected to a solder reflow process.
0.025
0.025
0.65
0.65

0.075
1.9
0.035
0.9

0.028
0.7 inches
mm

SC–70/SOT–323 POWER DISSIPATION


The power dissipation of the SC–70/SOT–323 is a one can calculate the power dissipation of the device which
function of the drain pad size. This can vary from the in this case is 150 milliwatts.
minimum pad size for soldering to a pad size given for 150°C – 25°C
PD = = 150 milliwatts
maximum power dissipation. Power dissipation for a 833°C/W
surface mount device is determined by TJ(max), the
maximum rated junction temperature of the die, RθJA, the The 833°C/W for the SC–70/SOT–323 package assumes
thermal resistance from the device junction to ambient, and the use of the recommended footprint on a glass epoxy
the operating temperature, TA. Using the values provided printed circuit board to achieve a power dissipation of 150
on the data sheet for the SC–70 package, PD can be milliwatts. There are other alternatives to achieving higher
calculated as follows: power dissipation from the SC–70/SOT–323 package.
Another alternative would be to use a ceramic substrate or
TJ(max) – TA
PD = an aluminum core board such as Thermal Cladt. Using a
RθJA board material such as Thermal Clad, an aluminum core
The values for the equation are found in the maximum board, the power dissipation can be doubled using the same
ratings table on the data sheet. Substituting these values footprint.
into the equation for an ambient temperature TA of 25°C,

SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • The soldering temperature and time should not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within • When shifting from preheating to soldering, the
a short time could result in device failure. Therefore, the maximum temperature gradient should be 5°C or less.
following items should always be observed in order to • After soldering has been completed, the device should
minimize the thermal stress to which the devices are be allowed to cool naturally for at least three minutes.
subjected. Gradual cooling should be used as the use of forced
• Always preheat the device. cooling will increase the temperature gradient and
• The delta temperature between the preheat and result in latent failure due to mechanical stress.
soldering should be 100°C or less.* • Mechanical stress or shock should not be applied
• When preheating and soldering, the temperature of the during cooling
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When * Soldering a device without preheating can cause
using infrared heating with the reflow soldering excessive thermal shock and stress which can result in
method, the difference should be a maximum of 10°C. damage to the device.

http://onsemi.com
391
(  #
Preferred Device

#$%& '(
!    
P–Channel SC–70/SOT–323
These miniature surface mount MOSFETs low RDS(on) assure
minimal power loss and conserve energy, making these devices ideal
for use in small power management circuitry. Typical applications are http://onsemi.com
dc–dc converters, power management in portable and
battery–powered products such as computers, printers, PCMCIA 300 mAMPS
cards, cellular and cordless telephones. 20 VOLTS
• Low RDS(on) Provides Higher Efficiency and Extends Battery Life RDS(on) = 2.2 
• Miniature SC–70/SOT–323 Surface Mount Package Saves
Board Space P–Channel
4
MAXIMUM RATINGS (TJ = 25°C unless otherwise noted)
Rating Symbol Value Unit
Drain–to–Source Voltage VDSS 20 Vdc

Gate–to–Source Voltage – Continuous VGS ± 20 Vdc
Drain Current mAdc
– Continuous @ TA = 25°C ID 300
– Continuous @ TA = 70°C ID 240 #
– Pulsed Drain Current (tp ≤ 10 µs) IDM 750
MARKING
Total Power Dissipation @ TA = 25°C PD DIAGRAM
(Note 1.) 150 mW
Derate above 25°C 1.2 mW/°C
3
Operating and Storage Temperature TJ, Tstg – 55 to °C SC–70/SOT–323 P3
Range 150 CASE 419 W
STYLE 8
Thermal Resistance – Junction–to–Ambient RθJA 833 °C/W 1
2
Maximum Lead Temperature for Soldering TL 260 °C
Purposes, for 10 seconds P3 = Device Code
W = Work Week
1. Mounted on G10/FR4 glass epoxy board using minimum recommended
footprint.
PIN ASSIGNMENT
3 Drain

Gate 1 2 Source
Top View

ORDERING INFORMATION

Device Package Shipping

MMBF2202PT1 SC–70/ 3000 Tape & Reel


SOT–323

Preferred devices are recommended choices for future use


and best overall value.

 Semiconductor Components Industries, LLC, 2000 392 Publication Order Number:


November, 2000 – Rev. 3 MMBF2202PT1/D
MMBF2202PT1

ELECTRICAL CHARACTERISTICS (TA = 25°C unless otherwise noted)


Characteristic Symbol Min Typ Max Unit
OFF CHARACTERISTICS
Drain–to–Source Breakdown Voltage V(BR)DSS 20 – – Vdc
(VGS = 0 Vdc, ID = 10 µA)
Zero Gate Voltage Drain Current IDSS µAdc
(VDS = 16 Vdc, VGS = 0 Vdc) – – 1.0
(VDS = 16 Vdc, VGS = 0 Vdc, TJ = 125°C) – – 10
Gate–Body Leakage Current (VGS = ± 20 Vdc, VDS = 0) IGSS – – ±100 nAdc
ON CHARACTERISTICS (Note 2.)
Gate Threshold Voltage VGS(th) 1.0 1.7 2.4 Vdc
(VDS = VGS, ID = 250 µAdc)
Static Drain–to–Source On–Resistance rDS(on) Ohms
(VGS = 10 Vdc, ID = 200 mAdc) – 1.5 2.2
(VGS = 4.5 Vdc, ID = 50 mAdc) – 2.0 3.5
Forward Transconductance (VDS = 10 Vdc, ID = 200 mAdc) gFS – 600 – mMhos
DYNAMIC CHARACTERISTICS
Input Capacitance (VDS = 5.0 V) Ciss – 50 – pF
Output Capacitance (VDS = 5.0 V) Coss – 45 –
Transfer Capacitance (VDG = 5.0 V) Crss – 20 –

SWITCHING CHARACTERISTICS (Note 3.)


Turn–On Delay Time td(on) – 2.5 – ns
Rise Time (VDD = –15 Vdc, tr – 1.0 –
RL = 75 Ω,
Ω ID = 200 mAdc,
mAdc
Turn–Off Delay Time 10 V, RG = 6.0 Ω)
VGEN = –10 td(off) – 16 –
Fall Time tf – 8.0 –
Gate Charge (See Figure 5) (VDS = 16 V, VGS = 10 V, QT – 2700 – pC
ID = 200 mA)

SOURCE–DRAIN DIODE CHARACTERISTICS


Continuous Current IS – – 0.3 A
Pulsed Current ISM – – 0.75
Forward Voltage (Note 3.) VSD – 1.5 – V
2. Pulse Test: Pulse Width ≤ 300 µs, Duty Cycle ≤ 2%.
3. Switching characteristics are independent of operating junction temperature.

TYPICAL CHARACTERISTICS
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Figure 1. On Resistance versus Gate–Source Voltage Figure 2. On Resistance versus Temperature

http://onsemi.com
393
MMBF2202PT1

TYPICAL CHARACTERISTICS

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Figure 3. On Resistance versus Drain Current Figure 4. Transfer Characteristics

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Figure 5. Source–Drain Forward Voltage Figure 6. On Region Characteristics

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Figure 7. Capacitance Variation

http://onsemi.com
394
MMBF2202PT1

INFORMATION FOR USING THE SC–70/SOT–323 SURFACE MOUNT PACKAGE

MINIMUM RECOMMENDED FOOTPRINT FOR SURFACE MOUNTED APPLICATIONS


Surface mount board layout is a critical portion of the interface between the board and the package. With the
total design. The footprint for the semiconductor packages correct pad geometry, the packages will self align when
must be the correct size to insure proper solder connection subjected to a solder reflow process.
0.025
0.025
0.65
0.65

0.075
1.9
0.035
0.9

0.028
0.7 inches
mm

SC–70/SOT–323 POWER DISSIPATION


The power dissipation of the SC–70/SOT–323 is a one can calculate the power dissipation of the device which
function of the drain pad size. This can vary from the in this case is 150 milliwatts.
minimum pad size for soldering to a pad size given for 150°C – 25°C
PD = = 150 milliwatts
maximum power dissipation. Power dissipation for a 833°C/W
surface mount device is determined by TJ(max), the
maximum rated junction temperature of the die, RθJA, the The 833°C/W for the SC–70/SOT–323 package assumes
thermal resistance from the device junction to ambient, and the use of the recommended footprint on a glass epoxy
the operating temperature, TA. Using the values provided printed circuit board to achieve a power dissipation of 150
on the data sheet for the SC–70/SOT–323 package, PD can milliwatts. There are other alternatives to achieving higher
be calculated as follows: power dissipation from the SC–70/SOT–323 package.
Another alternative would be to use a ceramic substrate or
TJ(max) – TA
PD = an aluminum core board such as Thermal Cladt. Using a
RθJA board material such as Thermal Clad, an aluminum core
The values for the equation are found in the maximum board, the power dissipation can be doubled using the same
ratings table on the data sheet. Substituting these values footprint.
into the equation for an ambient temperature TA of 25°C,

SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • The soldering temperature and time should not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within • When shifting from preheating to soldering, the
a short time could result in device failure. Therefore, the maximum temperature gradient should be 5°C or less.
following items should always be observed in order to • After soldering has been completed, the device should
minimize the thermal stress to which the devices are be allowed to cool naturally for at least three minutes.
subjected. Gradual cooling should be used as the use of forced
• Always preheat the device. cooling will increase the temperature gradient and
• The delta temperature between the preheat and result in latent failure due to mechanical stress.
soldering should be 100°C or less.* • Mechanical stress or shock should not be applied
• When preheating and soldering, the temperature of the during cooling
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When * Soldering a device without preheating can cause
using infrared heating with the reflow soldering excessive thermal shock and stress which can result in
method, the difference should be a maximum of 10°C. damage to the device.

http://onsemi.com
395
(!

#$%& '(
!    
Complementary SO–8, Dual
These miniature surface mount MOSFETs feature ultra low RDS(on)
and true logic level performance. They are capable of withstanding http://onsemi.com
high energy in the avalanche and commutation modes and the
drain–to–source diode has a very low reverse recovery time. 3 AMPERES
MiniMOSt devices are designed for use in low voltage, high speed
25 VOLTS
switching applications where power efficiency is important. Typical
applications are dc–dc converters, and power management in portable RDS(on) = 100 mW (N–Channel)
and battery powered products such as computers, printers, cellular and RDS(on) = 210 mW (P–Channel)
cordless phones. They can also be used for low voltage motor controls
in mass storage products such as disk drives and tape drives. The N–Channel P–Channel
avalanche energy is specified to eliminate the guesswork in designs
D D
where inductive loads are switched and offer additional safety margin
against unexpected voltage transients.
• Low RDS(on) Provides Higher Efficiency and Extends Battery Life
• Logic Level Gate Drive – Can be Driven by Logic ICs G G
• Miniature SO–8 Surface Mount Package – Saves Board Space
• Diode Exhibits High Speed, with Soft Recovery S S

MAXIMUM RATINGS (TJ = 25°C unless otherwise noted)


Rating Symbol Value Unit MARKING
Drain–to–Source Voltage VDSS 25 Vdc DIAGRAM
Gate–to–Source Voltage VGS ± 20 Vdc
Drain Current – Continuous ID Adc SO–8, Dual
N–Channel 3.0 1300
8 CASE 751 LYWW
P–Channel 2.0 STYLE 11
Drain Current – Pulsed IDM Apk
1
N–Channel 9.0
P–Channel 6.0 1300 = Device Code
Operating and Storage Temperature Range TJ, Tstg –65 to °C L = Location Code
+150 Y = Year
Total Power Dissipation @ TA = 25°C PD 1.8 Watts WW = Work Week

Single Pulse Drain–to–Source Avalanche EAS mJ


Energy – Starting TJ = 25°C PIN ASSIGNMENT
(VDD = 20 Vdc, VGS = 10 Vdc, 113
IL = 3.0 Apk, L = 25 mH, RG = 25 W) Source–1 1 8 Drain–1
Thermal Resistance – Junction–to–Ambient RθJA 66.3 °C/W Gate–1 2 7 Drain–1
(Note 1.) Source–2 3 6 Drain–2
Maximum Lead Temperature for Soldering TL 260 °C Gate–2 4 5 Drain–2
Purposes, 1/8″ from Case for 10 sec.
Top View
1. Mounted on 2″ square FR4 board (1″ sq. 2 oz. Cu 0.06″ thick single sided),
10 sec. max.
ORDERING INFORMATION

Device Package Shipping


MMDF1300R2 SO–8 2500 Tape & Reel

 Semiconductor Components Industries, LLC, 2001 396 Publication Order Number:


March, 2001 – Rev. 1 MMDF1300/D
MMDF1300

ELECTRICAL CHARACTERISTICS (TA = 25°C unless otherwise noted)


Characteristic Symbol Polarity Min Typ Max Unit
OFF CHARACTERISTICS
Drain–to–Source Breakdown Voltage V(BR)DSS Vdc
(VGS = 0 Vdc, ID = 250 µAdc) – 30 – –
Zero Gate Voltage Drain Current IDSS (N) – – 1.0 µAdc
(VDS = 25 Vdc, VGS = 0 Vdc) (P) – – 1.0
Gate–Body Leakage Current (VGS = 20 Vdc, VDS = 0) IGSS – – – ±100 nAdc
ON CHARACTERISTICS (Notes 2. & 3.)
Gate Threshold Voltage VGS(th) (N) 1.0 1.5 2.0 Vdc
(VDS = VGS, ID = 250 µAdc) (P) 1.0 2.0 3.0
Drain–to–Source On–Resistance RDS(on) (N) – 0.09 0.10 Ohms
(VGS = 10 Vdc, ID = 2.0 Adc) (P) – 0.16 0.21
Drain–to–Source On–Resistance RDS(on) Ohms
(VGS = 4.5 Vdc, ID = 1.0 Adc) (N) – 0.13 0.16
(P) – 0.30 0.375
Forward Transconductance gFS (N) 1.0 – – mhos
(VDS = 3.0 Vdc, ID = 1.5 Adc) (P) 1.0 – –
DYNAMIC CHARACTERISTICS
Input Capacitance Ciss (N) – 215 301 pF
(P) – 200 300
Output Capacitance (VDS = 16 Vd
Vdc,
Coss (N) – 111 158
VGS = 0 Vdc,
(P) – 100 160
f = 1.0 MHz)
Transfer Capacitance Crss (N) – 30 60
(P) – 40 75
SWITCHING CHARACTERISTICS (Note 4.)
Turn–On Delay Time td(on) (N) – 18 36 ns
(P) – 14 28
Rise Time (VDD = 10 Vdc, tr (N) – 98 196
ID = 2.0 Adc, (P) – 95 180
Turn–Off Delay Time VGS = 4.5 Vdc, td(off) (N) – 16 32
RG = 6.0 Ω) (P) – 22 45
Fall Time tf (N) – 30 60
(P) – 40 80
Total Gate Charge QT (N) – 3.3 5.0 nC
(P) – 7.0 10
Q1 (N) – 1.2 –
(VDS = 16 Vdc, (P) – 1.2 –
ID = 2
2.0
0 Adc
Adc,
VGS = 4.5 Vdc) Q2 (N) – 2.0 –
(P) – 2.5 –
Q3 (N) – 1.9 –
(P) – 3.5 –
2. Pulse Test: Pulse Width ≤ 300 µs, Duty Cycle ≤ 2%.
3. Negative signs for P–Channel device omitted for clarity.
4. Switching characteristics are independent of operating junction temperature.

http://onsemi.com
397
MMDF1300

ELECTRICAL CHARACTERISTICS – continued (TA = 25°C unless otherwise noted)


Characteristic Symbol Polarity Min Typ Max Unit
SOURCE–DRAIN DIODE CHARACTERISTICS (Note 5.)
Forward On–Voltage (IS = 3.0 Adc, VGS = 0 Vdc) VSD (N) – 1.0 1.4 Vdc
(Note 6.) (IS = 2.0 Adc, VGS = 0 Vdc) (P) – 1.3 1.7
Reverse Recovery Time trr (N) – 23 – ns
(P) – 20 –

(N) ta (N) – 18 –
(ID = 2.0 Adc, (P) – 13 –
VGS = 0 Vdc tb (N) – 5.0 –
dIS/dt = 100 A/µs) (P) – 7.0 –
Reverse Recovery Stored QRR (N) – 0.02 – µC
Charge (P) – 0.02 –
5. Negative signs for P–Channel device omitted for clarity.
6. Pulse Test: Pulse Width ≤ 300 µs, Duty Cycle ≤ 2%.

http://onsemi.com
398
(

#$%& '(
    
N–Channel SO–8, Dual
These miniature surface mount MOSFETs feature ultra low RDS(on)
and true logic level performance. They are capable of withstanding
high energy in the avalanche and commutation modes and the http://onsemi.com
drain–to–source diode has a low reverse recovery time. MiniMOSt
devices are designed for use in low voltage, high speed switching 1 AMPERE
applications where power efficiency is important. Typical applications 50 VOLTS
are dc–dc converters, and power management in portable and battery
powered products such as computers, printers, cellular and cordless
RDS(on) = 300 m
phones. They can also be used for low voltage motor controls in mass
storage products such as disk drives and tape drives. The avalanche N–Channel
energy is specified to eliminate the guesswork in designs where 
inductive loads are switched and offer additional safety margin against
unexpected voltage transients.
• Ultra Low RDS(on) Provides Higher Efficiency and Extends Battery
Life 

• Logic Level Gate Drive – Can Be Driven by Logic ICs


• Miniature SO–8 Surface Mount Package – Saves Board Space 

• Diode Is Characterized for Use In Bridge Circuits


• Diode Exhibits High Speed MARKING
• Avalanche Energy Specified DIAGRAM

• Mounting Information for SO–8 Package Provided


• IDSS Specified at Elevated Temperature SO–8, Dual
F1N05
8 CASE 751
LYWW
STYLE 11
MAXIMUM RATINGS (TJ = 25°C unless otherwise noted)
1
Rating Symbol Value Unit
Drain–to–Source Voltage VDS 50 Volts F1N05 = Device Code
L = Location Code
Gate–to–Source Voltage – Continuous VGS ±20 Volts
Y = Year
Drain Current – Continuous ID 2.0 Amps WW = Work Week
Drain Current – Pulsed IDM 10

Single Pulse Drain–to–Source Avalanche EAS 300 mJ PIN ASSIGNMENT


Energy – Starting TJ = 25°C
(VDD = 25 V, VGS = 10 V, IL = 2 Apk)
Source–1 1 8 Drain–1
Operating and Storage Temperature Range TJ, Tstg –55 to °C Gate–1 2 7 Drain–1
150
Source–2 3 6 Drain–2
Total Power Dissipation @ TA = 25°C PD 2.0 Watts 4 5
Gate–2 Drain–2
Thermal Resistance – Junction to Ambient RθJA 62.5 °C/W Top View
(Note 1.)

Maximum Temperature for Soldering, TL 260 °C


Time in Solder Bath 10 Sec ORDERING INFORMATION

1. Mounted on 2″ square FR4 board (1″ sq. 2 oz. Cu 0.06″ thick single sided) with Device Package Shipping
one die operating, 10 sec. max.
MMDF1N05ER2 SO–8 2500 Tape & Reel

 Semiconductor Components Industries, LLC, 2000 399 Publication Order Number:


November, 2000 – Rev. 6 MMDF1N05E/D
MMDF1N05E

ELECTRICAL CHARACTERISTICS (TA = 25°C unless otherwise noted)


Characteristic Symbol Min Typ Max Unit
OFF CHARACTERISTICS
Drain–to–Source Breakdown Voltage V(BR)DSS 50 – – Vdc
(VGS = 0, ID = 250 µA)
Zero Gate Voltage Drain Current IDSS – – 250 µAdc
(VDS = 50 V, VGS = 0)
Gate–Body Leakage Current IGSS – – 100 nAdc
(VGS = 20 Vdc, VDS = 0)

ON CHARACTERISTICS (Note 2.)


Gate Threshold Voltage VGS(th) 1.0 – 3.0 Vdc
(VDS = VGS, ID = 250 µAdc)
Drain–to–Source On–Resistance Ohms
(VGS = 10 Vdc, ID = 1.5 Adc) RDS(on) – – 0.30
(VGS = 4.5 Vdc, ID = 0.6 Adc) RDS(on) – – 0.50
Forward Transconductance (VDS = 15 V, ID = 1.5 A) gFS – 1.5 – mhos
DYNAMIC CHARACTERISTICS
Input Capacitance Ciss – 330 – pF
(VDS = 25 VV, VGS = 0
0,
Output Capacitance Coss – 160 –
f = 1.0 MHz)
Reverse Transfer Capacitance Crss – 50 –
SWITCHING CHARACTERISTICS (Note 3.)
Turn–On Delay Time td(on) – – 20 ns
Rise Time (VDD = 10 V, ID = 1.5 A, RL = 10 Ω, tr – – 30
Turn–Off Delay Time VG = 10 V, RG = 50 Ω) td(off) – – 40
Fall Time tf – – 25
Total Gate Charge Qg – 12.5 – nC
(VDS = 10 V
V, ID = 1.5
15A A,
Gate–Source Charge Qgs – 1.9 –
VGS = 10 V)
Gate–Drain Charge Qgd – 3.0 –

SOURCE–DRAIN DIODE CHARACTERISTICS (TC = 25°C)


Forward Voltage (Note 2.) (IS = 1.5 A, VGS = 0 V) VSD – – 1.6 V
Reverse Recovery Time (dIS/dt = 100 A/µs) trr – 45 – ns
2. Pulse Test: Pulse Width ≤ 300 µs, Duty Cycle ≤ 2.0%.
3. Switching characteristics are independent of operating junction temperature.

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400
MMDF1N05E

TYPICAL ELECTRICAL CHARACTERISTICS

 
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Gate–To–Source Voltage with Temperature

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MMDF1N05E

  
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Gate–To–Source Voltage

SAFE OPERATING AREA INFORMATION 


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simultaneous high voltage and high current, up to the rating
of the device, they are especially useful to designers of linear
systems. The curves are based on a case temperature of 25°C 

   
and a maximum junction temperature of 150°C. Limitations 
    
for repetitive pulses at various case temperatures can be      
determined by using the thermal response curves. ON 
   
Semiconductor Application Note, AN569, “Transient
 

   
Thermal Resistance – General Data and Its Use” provides
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402
MMDF1N05E

INFORMATION FOR USING THE SO–8 SURFACE MOUNT PACKAGE

MINIMUM RECOMMENDED FOOTPRINT FOR SURFACE MOUNTED APPLICATIONS


Surface mount board layout is a critical portion of the interface between the board and the package. With the
total design. The footprint for the semiconductor packages correct pad geometry, the packages will self–align when
must be the correct size to insure proper solder connection subjected to a solder reflow process.

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SO–8 POWER DISSIPATION


The power dissipation of the SO–8 is a function of the into the equation for an ambient temperature TA of 25°C,
input pad size. These can vary from the minimum pad size one can calculate the power dissipation of the device which
for soldering to the pad size given for maximum power in this case is 2.0 Watts.
dissipation. Power dissipation for a surface mount device is 150°C – 25°C
determined by TJ(max), the maximum rated junction PD = = 2.0 Watts
62.5°C/W
temperature of the die, RθJA, the thermal resistance from
the device junction to ambient; and the operating The 62.5°C/W for the SO–8 package assumes the
temperature, TA. Using the values provided on the data recommended footprint on a glass epoxy printed circuit
sheet for the SO–8 package, PD can be calculated as board to achieve a power dissipation of 2.0 Watts using the
follows: footprint shown. Another alternative would be to use a
TJ(max) – TA
ceramic substrate or an aluminum core board such as
PD = Thermal Cladt. Using board material such as Thermal
RθJA
Clad, the power dissipation can be doubled using the same
The values for the equation are found in the maximum footprint.
ratings table on the data sheet. Substituting these values

SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • The soldering temperature and time shall not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within • When shifting from preheating to soldering, the
a short time could result in device failure. Therefore, the maximum temperature gradient shall be 5°C or less.
following items should always be observed in order to • After soldering has been completed, the device should
minimize the thermal stress to which the devices are be allowed to cool naturally for at least three minutes.
subjected. Gradual cooling should be used as the use of forced
• Always preheat the device. cooling will increase the temperature gradient and
• The delta temperature between the preheat and result in latent failure due to mechanical stress.
soldering should be 100°C or less.* • Mechanical stress or shock should not be applied
• When preheating and soldering, the temperature of the during cooling
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When * Soldering a device without preheating can cause
using infrared heating with the reflow soldering excessive thermal shock and stress which can result in
method, the difference shall be a maximum of 10°C. damage to the device.

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403
( .
Preferred Device

#$%& '(
   
Complementary SO–8, Dual
These miniature surface mount MOSFETs feature ultra low RDS(on)
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and true logic level performance. They are capable of withstanding
high energy in the avalanche and commutation modes and the
2 AMPERES
drain–to–source diode has a very low reverse recovery time.
MiniMOSt devices are designed for use in low voltage, high speed 12 VOLTS
switching applications where power efficiency is important. Typical RDS(on) = 45 m (N–Channel)
applications are dc–dc converters, and power management in portable RDS(on) = 180 m (P–Channel)
and battery powered products such as computers, printers, cellular and
cordless phones. They can also be used for low voltage motor controls
in mass storage products such as disk drives and tape drives. N–Channel P–Channel
• Ultra Low RDS(on) Provides Higher Efficiency and Extends D D
Battery Life
• Logic Level Gate Drive – Can Be Driven by Logic ICs
• Miniature SO–8 Surface Mount Package – Saves Board Space
G
• Diode Is Characterized for Use In Bridge Circuits G

• Diode Exhibits High Speed, With Soft Recovery S


• IDSS Specified at Elevated Temperature S

• Mounting Information for SO–8 Package Provided


MARKING
DIAGRAM
MAXIMUM RATINGS (TJ = 25°C unless otherwise noted) (Note 1.)
Rating Symbol Value Unit
SO–8, Dual
Drain–to–Source Voltage VDSS Vdc CASE 751 D2C01
N–Channel 20 8 LYWW
STYLE 14
P–Channel 12
1
Gate–to–Source Voltage VGS ± 8.0 Vdc
Drain Current – Continuous N–Channel ID 5.2 A D2C01 = Device Code
P–Channel 3.4 L = Location Code
– Pulsed N–Channel IDM 48 Y = Year
P–Channel 17 WW = Work Week
Operating and Storage Temperature Range TJ and –55 to °C
Tstg 150 PIN ASSIGNMENT
Total Power Dissipation @ TA= 25°C PD 2.0 Watts
(Note 2.) N–Source 1 8 N–Drain

Thermal Resistance – Junction to Ambient RθJA 62.5 °C/W N–Gate 2 7 N–Drain


(Note 2.) P–Source 3 6 P–Drain
Maximum Lead Temperature for Soldering TL 260 °C P–Gate 4 5 P–Drain
Purposes, 1/8″ from case for 10 seconds. Top View
1. Negative signs for P–Channel device omitted for clarity.
2. Mounted on 2” square FR4 board (1” sq. 2 oz. Cu 0.06” thick single sided) with ORDERING INFORMATION
one die operating, 10 sec. max.
Device Package Shipping

MMDF2C01HDR2 SO–8 2500 Tape & Reel

Preferred devices are recommended choices for future use


and best overall value.

 Semiconductor Components Industries, LLC, 2000 404 Publication Order Number:


November, 2000 – Rev. 6 MMDF2C01HD/D
MMDF2C01HD

ELECTRICAL CHARACTERISTICS (TA = 25°C unless otherwise noted) (Note 3.)


Characteristic Symbol Polarity Min Typ Max Unit
OFF CHARACTERISTICS
Drain–Source Breakdown Voltage V(BR)DSS (N) 20 – – Vdc
(VGS = 0 Vdc, ID = 250 µAdc) (P) 12 – –
Zero Gate Voltage Drain Current IDSS µAdc
(VGS = 0 Vdc, VDS = 20 Vdc) (N) – – 1.0
(VGS = 0 Vdc, VDS = 12 Vdc) (P) – – 1.0
Gate–Body Leakage Current IGSS nAdc
(VGS = ±8.0 Vdc, VDS = 0) – – – 100
ON CHARACTERISTICS (Note 4.)
Gate Threshold Voltage VGS(th) (N) 0.7 0.8 1.1 Vdc
(VDS = VGS, ID = 250 µAdc) (P) 0.7 1.0 1.1
Drain–to–Source On–Resistance RDS(on) Ohm
(VGS = 4.5 Vdc, ID = 4.0 Adc) (N) – 0.035 0.045
(VGS = 4.5 Vdc, ID = 2.0 Adc) (P) – 0.16 0.18
Drain–to–Source On–Resistance RDS(on) Ohm
(VGS = 2.7 Vdc, ID = 2.0 Adc) (N) – 0.043 0.055
(VGS = 2.7 Vdc, ID = 1.0 Adc) (P) – 0.2 0.22
Forward Transconductance gFS mhos
(VDS = 2.5 Adc, ID = 2.0 Adc) (N) 3.0 6.0 –
(VDS = 2.5 Adc, ID = 1.0 Adc) (P) 3.0 4.75 –
DYNAMIC CHARACTERISTICS
Input Capacitance Ciss (N) – 425 595 pF
(P) – 530 740
Output Capacitance (VDS = 10 Vdc, VGS = 0 Vdc, Coss (N) – 270 378
f = 1.0 MHz)) (P) – 410 570
Transfer Capacitance Crss (N) – 115 230
(P) – 177 250
SWITCHING CHARACTERISTICS (Note 5.)
Turn–On Delay Time td(on) (N) – 13 26 ns
(VDD = 6.0 Vdc, ID = 4.0 Adc, (P) – 21 45
Rise Time VGS = 2.7 Vdc, tr (N) – 60 120
RG = 2.3 Ω) (P) – 156 315
Turn–Off Delay Time (VDD = 6.0 Vdc, ID = 2.0 Adc, td(off) (N) – 20 40
VGS = 2.7 Vdc, (P) – 38 75
Fall Time RG = 6.0 Ω) tf (N) – 29 58
(P) – 68 135
Turn–On Delay Time td(on) (N) – 10 20
(VDS = 6.0 Vdc, ID = 4.0 Adc, (P) – 16 35
Rise Time VGS = 4.5 Vdc, tr (N) – 42 84
RG = 2.3 Ω) (P) – 44 90
Turn–Off Delay Time (VDS = 6.0 Vdc, ID = 2.0 Adc, td(off) (N) – 24 48
VGS = 4.5 Vdc, (P) – 68 135
Fall Time RG = 6.0 Ω) tf (N) – 28 56
(P) – 54 110
3. Negative signs for P–Channel device omitted for clarity.
4. Pulse Test: Pulse Width ≤ 300 µs, Duty Cycle ≤ 2%.
5. Switching characteristics are independent of operating junction temperature.

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405
MMDF2C01HD

ELECTRICAL CHARACTERISTICS – continued (TA = 25°C unless otherwise noted) (Note 6.)
Characteristic Symbol Polarity Min Typ Max Unit

SWITCHING CHARACTERISTICS – continued (Note 8.)


Total Gate Charge QT (N) – 9.2 13 nC
(P) – 9.3 13
Gate–Source Charge (VDS = 10 Vdc, ID = 4.0 Adc, Q1 (N) – 1.3 –
VGS = 4.5 Vdc) (P) – 0.8 –
Gate–Drain Charge (VDS = 6.0 Vdc, ID = 2.0 Adc, Q2 (N) – 3.5 –
VGS = 4.5 Vdc) (P) – 4.0 –
Q3 (N) – 3.0 –
(P) – 3.0 –
SOURCE–DRAIN DIODE CHARACTERISTICS (TC = 25°C)
Forward Voltage (Note 7.) (IS = 4.0 Adc, VGS = 0 Vdc) VSD (N) – 0.95 1.1 Vdc
(IS = 2.0 Adc, VGS = 0 Vdc) (P) – 1.69 2.0
Reverse Recovery Time trr (N) – 38 – ns
(P) – 48 –
ta (N) – 17 –
(IF = IS, (P) – 23 –
dIS/dt = 100 A/µs) tb (N) – 22 –
(P) – 25 –
Reverse Recovery Stored QRR (N) – 0.028 – µC
Charge (P) – 0.05 –
6. Negative signs for P–Channel device omitted for clarity.
7. Pulse Test: Pulse Width ≤ 300 µs, Duty Cycle ≤ 2%.
8. Switching characteristics are independent of operating junction temperature.

http://onsemi.com
406
MMDF2C01HD

TYPICAL ELECTRICAL CHARACTERISTICS

N–Channel P–Channel
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Figure 1. On–Region Characteristics Figure 1. On–Region Characteristics

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Figure 2. Transfer Characteristics Figure 2. Transfer Characteristics

http://onsemi.com
407
MMDF2C01HD

TYPICAL ELECTRICAL CHARACTERISTICS

N–Channel P–Channel

 


  


 


  
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Figure 3. On–Resistance versus Figure 3. On–Resistance versus


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Figure 5. On–Resistance Variation with Figure 5. On–Resistance Variation with


Temperature Temperature

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TYPICAL ELECTRICAL CHARACTERISTICS

N–Channel P–Channel

 
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Figure 6. Drain–To–Source Leakage Figure 6. Drain–To–Source Leakage


Current versus Voltage Current versus Voltage

POWER MOSFET SWITCHING

Switching behavior is most easily modeled and predicted The capacitance (Ciss) is read from the capacitance curve at
by recognizing that the power MOSFET is charge a voltage corresponding to the off–state condition when
controlled. The lengths of various switching intervals (∆t) calculating td(on) and is read at a voltage corresponding to the
are determined by how fast the FET input capacitance can on–state when calculating td(off).
be charged by current from the generator. At high switching speeds, parasitic circuit elements
The published capacitance data is difficult to use for complicate the analysis. The inductance of the MOSFET
calculating rise and fall because drain–gate capacitance source lead, inside the package and in the circuit wiring
varies greatly with applied voltage. Accordingly, gate which is common to both the drain and gate current paths,
charge data is used. In most cases, a satisfactory estimate of produces a voltage at the source which reduces the gate drive
average input current (IG(AV)) can be made from a current. The voltage is determined by Ldi/dt, but since di/dt
rudimentary analysis of the drive circuit so that is a function of drain current, the mathematical solution is
t = Q/IG(AV) complex. The MOSFET output capacitance also
complicates the mathematics. And finally, MOSFETs have
During the rise and fall time interval when switching a finite internal gate resistance which effectively adds to the
resistive load, VGS remains virtually constant at a level resistance of the driving source, but the internal resistance
known as the plateau voltage, VSGP. Therefore, rise and fall is difficult to measure and, consequently, is not specified.
times may be approximated by the following: The resistive switching time variation versus gate
tr = Q2 x RG/(VGG – VGSP) resistance (Figure 9) shows how typical switching
tf = Q2 x RG/VGSP performance is affected by the parasitic circuit elements. If
where the parasitics were not present, the slope of the curves would
maintain a value of unity regardless of the switching speed.
VGG = the gate drive voltage, which varies from zero to VGG
The circuit used to obtain the data is constructed to minimize
RG = the gate drive resistance
common inductance in the drain and gate circuit loops and
and Q2 and VGSP are read from the gate charge curve.
is believed readily achievable with board mounted
During the turn–on and turn–off delay times, gate current is components. Most power electronic loads are inductive; the
not constant. The simplest calculation uses appropriate data in the figure is taken with a resistive load, which
values from the capacitance curves in a standard equation for approximates an optimally snubbed inductive load. Power
voltage change in an RC network. The equations are: MOSFETs may be safely operated into an inductive load;
td(on) = RG Ciss In [VGG/(VGG – VGSP)] however, snubbing reduces switching losses.
td(off) = RG Ciss In (VGG/VGSP)

http://onsemi.com
409
MMDF2C01HD

N–Channel P–Channel
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Figure 8. Gate–To–Source and Drain–To–Source Figure 8. Gate–To–Source and Drain–To–Source


Voltage versus Total Charge Voltage versus Total Charge

 
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Figure 9. Resistive Switching Time Figure 9. Resistive Switching Time


Variation versus Gate Resistance Variation versus Gate Resistance

http://onsemi.com
410
MMDF2C01HD

DRAIN–TO–SOURCE DIODE CHARACTERISTICS

The switching characteristics of a MOSFET body diode high di/dts. The diode’s negative di/dt during ta is directly
are very important in systems using it as a freewheeling or controlled by the device clearing the stored charge.
commutating diode. Of particular interest are the reverse However, the positive di/dt during tb is an uncontrollable
recovery characteristics which play a major role in diode characteristic and is usually the culprit that induces
determining switching losses, radiated noise, EMI and RFI. current ringing. Therefore, when comparing diodes, the
System switching losses are largely due to the nature of ratio of tb/ta serves as a good indicator of recovery
the body diode itself. The body diode is a minority carrier abruptness and thus gives a comparative estimate of
device, therefore it has a finite reverse recovery time, trr, due probable noise generated. A ratio of 1 is considered ideal and
to the storage of minority carrier charge, QRR, as shown in values less than 0.5 are considered snappy.
the typical reverse recovery wave form of Figure 14. It is this Compared to ON Semiconductor standard cell density
stored charge that, when cleared from the diode, passes low voltage MOSFETs, high cell density MOSFET diodes
through a potential and defines an energy loss. Obviously, are faster (shorter trr), have less stored charge and a softer
repeatedly forcing the diode through reverse recovery reverse recovery characteristic. The softness advantage of
further increases switching losses. Therefore, one would the high cell density diode means they can be forced through
like a diode with short trr and low QRR specifications to reverse recovery at a higher di/dt than a standard cell
minimize these losses. MOSFET diode without increasing the current ringing or the
The abruptness of diode reverse recovery effects the noise generated. In addition, power dissipation incurred
amount of radiated noise, voltage spikes, and current from switching the diode will be less due to the shorter
ringing. The mechanisms at work are finite irremovable recovery time and lower switching losses.
circuit parasitic inductances and capacitances acted upon by

N–Channel P–Channel

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Figure 10. Diode Forward Voltage versus Current Figure 10. Diode Forward Voltage versus Current

http://onsemi.com
411
MMDF2C01HD

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SAFE OPERATING AREA

The Forward Biased Safe Operating Area curves define total power averaged over a complete switching cycle must
the maximum simultaneous drain–to–source voltage and not exceed (TJ(MAX) – TC)/(RθJC).
drain current that a transistor can handle safely when it is A power MOSFET designated E–FET can be safely used
forward biased. Curves are based upon maximum peak in switching circuits with unclamped inductive loads. For
junction temperature and a case temperature (TC) of 25°C. reliable operation, the stored energy from circuit inductance
Peak repetitive pulsed power limits are determined by using dissipated in the transistor while in avalanche must be less
the thermal response data in conjunction with the procedures than the rated limit and must be adjusted for operating
discussed in AN569, “Transient Thermal Resistance – conditions differing from those specified. Although industry
General Data and Its Use.” practice is to rate in terms of energy, avalanche energy
Switching between the off–state and the on–state may capability is not a constant. The energy rating decreases
traverse any load line provided neither rated peak current non–linearly with an increase of peak current in avalanche
(IDM) nor rated voltage (VDSS) is exceeded, and that the and peak junction temperature.
transition time (tr, tf) does not exceed 10 µs. In addition the

N–Channel P–Channel
 
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Figure 12. Maximum Rated Forward Biased Figure 12. Maximum Rated Forward Biased
Safe Operating Area Safe Operating Area

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412
MMDF2C01HD

TYPICAL ELECTRICAL CHARACTERISTICS



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Figure 13. Thermal Response

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Figure 14. Diode Reverse Recovery Waveform

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413
MMDF2C01HD

INFORMATION FOR USING THE SO–8 SURFACE MOUNT PACKAGE

MINIMUM RECOMMENDED FOOTPRINT FOR SURFACE MOUNTED APPLICATIONS


Surface mount board layout is a critical portion of the total interface between the board and the package. With the
design. The footprint for the semiconductor packages must correct pad geometry, the packages will self–align when
be the correct size to ensure proper solder connection subjected to a solder reflow process.

9
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#6 $
9 #:
inches
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SO–8 POWER DISSIPATION


The power dissipation of the SO–8 is a function of the into the equation for an ambient temperature TA of 25°C,
input pad size. This can vary from the minimum pad size one can calculate the power dissipation of the device which
for soldering to the pad size given for maximum power in this case is 2.0 Watts.
dissipation. Power dissipation for a surface mount device is 150°C – 25°C
determined by TJ(max), the maximum rated junction PD = = 2.0 Watts
62.5°C/W
temperature of the die, RθJA, the thermal resistance from
the device junction to ambient; and the operating The 62.5°C/W for the SO–8 package assumes the
temperature, TA. Using the values provided on the data recommended footprint on a glass epoxy printed circuit
sheet for the SO–8 package, PD can be calculated as board to achieve a power dissipation of 2.0 Watts using the
follows: footprint shown. Another alternative would be to use a
TJ(max) – TA
ceramic substrate or an aluminum core board such as
PD = Thermal Cladt. Using board material such as Thermal
RθJA
Clad, the power dissipation can be doubled using the same
The values for the equation are found in the maximum footprint.
ratings table on the data sheet. Substituting these values

SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • The soldering temperature and time shall not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within • When shifting from preheating to soldering, the
a short time could result in device failure. Therefore, the maximum temperature gradient shall be 5°C or less.
following items should always be observed in order to • After soldering has been completed, the device should
minimize the thermal stress to which the devices are be allowed to cool naturally for at least three minutes.
subjected. Gradual cooling should be used as the use of forced
• Always preheat the device. cooling will increase the temperature gradient and
• The delta temperature between the preheat and result in latent failure due to mechanical stress.
soldering should be 100°C or less.* • Mechanical stress or shock should not be applied
• When preheating and soldering, the temperature of the during cooling.
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When * Soldering a device without preheating can cause
using infrared heating with the reflow soldering excessive thermal shock and stress which can result in
method, the difference shall be a maximum of 10°C. damage to the device.

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414
MMDF2C01HD

TYPICAL SOLDER HEATING PROFILE


For any given circuit board, there will be a group of temperature versus time. The line on the graph shows the
control settings that will give the desired heat pattern. The actual temperature that might be experienced on the surface
operator must set temperatures for several heating zones of a test board at or near a central solder joint. The two
and a figure for belt speed. Taken together, these control profiles are based on a high density and a low density
settings make up a heating “profile” for that particular board. The Vitronics SMD310 convection/infrared reflow
circuit board. On machines controlled by a computer, the soldering system was used to generate this profile. The type
computer remembers these profiles from one operating of solder used was 62/36/2 Tin Lead Silver with a melting
session to the next. Figure 15 shows a typical heating point between 177–189°C. When this type of furnace is
profile for use when soldering a surface mount device to a used for solder reflow work, the circuit boards and solder
printed circuit board. This profile will vary among joints tend to heat first. The components on the board are
soldering systems, but it is a good starting point. Factors then heated by conduction. The circuit board, because it has
that can affect the profile include the type of soldering a large surface area, absorbs the thermal energy more
system in use, density and types of components on the efficiently, then distributes this energy to the components.
board, type of solder used, and the type of board or Because of this effect, the main body of a component may
substrate material being used. This profile shows be up to 30 degrees cooler than the adjacent solder joints.

STEP 1 STEP 2 STEP 3 STEP 4 STEP 5 STEP 6 STEP 7


PREHEAT VENT HEATING HEATING HEATING VENT COOLING
ZONE 1 “SOAK” ZONES 2 & 5 ZONES 3 & 6 ZONES 4 & 7
“RAMP” “RAMP” “SOAK” “SPIKE” 205° TO 219°C
PEAK AT
200°C DESIRED CURVE FOR HIGH 170°C SOLDER
MASS ASSEMBLIES JOINT
160°C
150°C

150°C
SOLDER IS LIQUID FOR
40 TO 80 SECONDS
100°C 140°C (DEPENDING ON
MASS OF ASSEMBLY)
100°C

DESIRED CURVE FOR LOW


MASS ASSEMBLIES
5°C

TIME (3 TO 7 MINUTES TOTAL) TMAX


Figure 15. Typical Solder Heating Profile

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415
(  

  
#$%& '(
-    
Complementary SO–8, Dual
These miniature surface mount MOSFETs feature ultra low RDS(on)
and true logic level performance. They are capable of withstanding http://onsemi.com
high energy in the avalanche and commutation modes and the
drain–to–source diode has a low reverse recovery time. MiniMOSt 2.5 AMPERES
devices are designed for use in low voltage, high speed switching 25 VOLTS
applications where power efficiency is important. Typical applications
are dc–dc converters, and power management in portable and battery
RDS(on) = 100 m (N–Channel)
powered products such as computers, printers, cellular and cordless RDS(on) = 250 m (P–Channel)
phones. They can also be used for low voltage motor controls in mass
storage products such as disk drives and tape drives. The avalanche N–Channel P–Channel
energy is specified to eliminate the guesswork in designs where
D D
inductive loads are switched and offer additional safety margin against
unexpected voltage transients.
• Ultra Low RDS(on) Provides Higher Efficiency and Extends Battery
Life G
G
• Logic Level Gate Drive – Can Be Driven by Logic ICs
• Miniature SO–8 Surface Mount Package – Saves Board Space S
S
• Diode Is Characterized for Use In Bridge Circuits
• Diode Exhibits High Speed, with Soft Recovery MARKING
• Avalanche Energy Specified DIAGRAM
• Mounting Information for SO–8 Package Provided
MAXIMUM RATINGS (TJ = 25°C unless otherwise noted) (Note 1.)
SO–8, Dual
Rating Symbol Value Unit F2C02
8 CASE 751
LYWW
Drain–to–Source Voltage VDSS 25 Vdc STYLE 14
Gate–to–Source Voltage VGS ± 20 Vdc 1
Drain Current – Continuous N–Channel ID 3.6 Adc
P–Channel 2.5 F2C02 = Device Code
– Pulsed N–Channel IDM 18 L = Location Code
P–Channel 13 Y = Year
WW = Work Week
Operating and Storage Temperature Range TJ and – 55 °C
Tstg to 150
Total Power Dissipation @ TA= 25°C (Note 2.) PD 2.0 Watts PIN ASSIGNMENT
Single Pulse Drain–to–Source Avalanche EAS mJ
N–Source 1 8 N–Drain
Energy – Starting TJ = 25°C
(VDD = 20 V, VGS = 10 V, Peak IL = 9.0 A, N–Gate 2 7 N–Drain
L = 6.0 mH, RG = 25 Ω) N–Channel 245 P–Source 3 6 P–Drain
(VDD = 20 V, VGS = 10 V, Peak IL = 7.0 A,
L = 10 mH, RG = 25 Ω) P–Channel 245 P–Gate 4 5 P–Drain
Thermal Resistance – Junction to Ambient RθJA 62.5 °C/W Top View
(Note 2.)
Maximum Lead Temperature for Soldering, TL 260 °C ORDERING INFORMATION
0.0625″ from case. Time in Solder Bath is
Device Package Shipping
10 seconds.
1. Negative signs for P–Channel device omitted for clarity. MMDF2C02ER2 SO–8 2500 Tape & Reel
2. Mounted on 2” square FR4 board (1” sq. 2 oz. Cu 0.06” thick single sided) with
one die operating, 10 sec. max.
This document contains information on a new product. Specifications and information
herein are subject to change without notice.

 Semiconductor Components Industries, LLC, 2000 416 Publication Order Number:


November, 2000 – Rev. 6 MMDF2C02E/D
MMDF2C02E

ELECTRICAL CHARACTERISTICS (TA = 25°C unless otherwise noted) (Note 3.)


Characteristic Symbol Polarity Min Typ Max Unit
OFF CHARACTERISTICS
Drain–Source Breakdown Voltage V(BR)DSS Vdc
(VGS = 0 Vdc, ID = 250 µAdc) – 25 – –
Zero Gate Voltage Drain Current IDSS (N) – – 1.0 µAdc
(VDS = 20 Vdc, VGS = 0 Vdc) (P) – – 1.0
Gate–Body Leakage Current (VGS = ±20 Vdc, VDS = 0) IGSS – – – 100 nAdc
ON CHARACTERISTICS (Note 4.)
Gate Threshold Voltage VGS(th) Vdc
(VDS = VGS, ID = 250 µAdc) – 1.0 2.0 3.0
Drain–to–Source On–Resistance RDS(on) Ohm
(VGS = 10 Vdc, ID = 2.2 Adc) (N) – – 0.100
(VGS = 10 Vdc, ID = 2.0 Adc) (P) – – 0.250
Drain–to–Source On–Resistance RDS(on) Ohm
(VGS = 4.5 Vdc, ID = 1.0 Adc) (N) – – 0.200
(VGS = 4.5 Vdc, ID = 1.0 Adc) (P) – – 0.400
On–State Drain Current ID(on) (N) 2.0 – – Adc
(VDS = 5.0 Vdc, VGS = 4.5 Vdc) (P) 2.0 – –
Forward Transconductance gFS mhos
(VDS = 3.0 Vdc, ID = 1.5 Adc) (N) 1.0 2.6 –
(VDS = 3.0 Vdc, ID = 1.0 Adc) (P) 1.0 2.8 –
DYNAMIC CHARACTERISTICS
Input Capacitance Ciss (N) – 380 532 pF
(P) – 340 475
Output Capacitance (VDS = 16 Vdc, VGS = 0 Vdc, Coss (N) – 235 329
f = 1.0 MHz) (P) – 220 300
Transfer Capacitance Crss (N) – 55 110
(P) – 75 150
SWITCHING CHARACTERISTICS (Note 5.)
Turn–On Delay Time td(on) (N) – 10 30 ns
(VDD = 10 Vdc, ID = 2.0 Adc, (P) – 20 40
Rise Time VGS = 4.5 Vdc, tr (N) – 35 70
RG = 9.1 Ω) (P) – 40 80
Turn–Off Delay Time (VDD = 10 Vdc, ID = 1.0 Adc, td(off) (N) – 19 38
VGS = 5.0 Vdc, (P) – 53 106
Fall Time RG = 25 Ω) tf (N) – 25 50
(P) – 41 82
Turn–On Delay Time td(on) (N) – 7.0 21
(VDD = 10 Vdc, ID = 2.0 Adc, (P) – 13 26
Rise Time VGS = 10 Vdc, tr (N) – 17 30
RG = 6.0 Ω) (P) – 29 58
Turn–Off Delay Time (VDD = 10 Vdc, ID = 2.0 Adc, td(off) (N) – 27 48
VGS = 10 Vdc, (P) – 30 60
Fall Time RG = 6.0 Ω) tf (N) – 18 30
(P) – 28 56
3. Negative signs for P–Channel device omitted for clarity.
4. Pulse Test: Pulse Width ≤ 300 µs, Duty Cycle ≤ 2%.
5. Switching characteristics are independent of operating junction temperature.

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417
MMDF2C02E

ELECTRICAL CHARACTERISTICS – continued (TA = 25°C unless otherwise noted) (Note 6.)
Characteristic Symbol Polarity Min Typ Max Unit
SWITCHING CHARACTERISTICS – continued (Note 8.)
Total Gate Charge QT (N) – 10.6 30 nC
(P) – 10 15
Gate–Source Charge Q1 (N) – 1.3 –
(VDS = 16 Vdc, ID = 2.0 Adc, (P) – 1.0 –
Gate–Drain Charge VGS = 10 Vdc) Q2 (N) – 2.9 –
(P) – 3.5 –
Q3 (N) – 2.7 –
(P) – 3.0 –
SOURCE–DRAIN DIODE CHARACTERISTICS (TC = 25°C)
Forward Voltage (Note 7.) (IS = 2.0 Adc, VGS = 0 Vdc) VSD (N) – 1.0 1.4 Vdc
(IS = 2.0 Adc, VGS = 0 Vdc) (P) – 1.5 2.0
Reverse Recovery Time trr (N) – 34 66 ns
see Figure 7 (P) – 32 64
ta (N) – 17 –
(IF = IS, (P) – 19 –
dIS/dt = 100 A/µs) tb (N) – 17 –
(P) – 12 –
QRR (N) – 0.025 – µC
(P) – 0.035 –
6. Negative signs for P–Channel device omitted for clarity.
7. Pulse Test: Pulse Width ≤ 300 µs, Duty Cycle ≤ 2%.
8. Pulse Test: Pulse Width ≤ 300 µs, Duty Cycle ≤ 2%.

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418
MMDF2C02E

TYPICAL ELECTRICAL CHARACTERISTICS

N–Channel P–Channel

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Figure 1. On–Region Characteristics Figure 1. On–Region Characteristics

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Figure 2. Transfer Characteristics Figure 2. Transfer Characteristics

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TYPICAL ELECTRICAL CHARACTERISTICS

N–Channel P–Channel

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Figure 3. On–Resistance versus Figure 3. On–Resistance versus


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Figure 5. On–Resistance Variation Figure 5. On–Resistance Variation with


with Temperature Temperature

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TYPICAL ELECTRICAL CHARACTERISTICS

N–Channel P–Channel

 
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Figure 6. Drain–to–Source Leakage Current Figure 6. Drain–to–Source Leakage Current


versus Voltage versus Voltage

POWER MOSFET SWITCHING

Switching behavior is most easily modeled and predicted During the turn–on and turn–off delay times, gate current is
by recognizing that the power MOSFET is charge not constant. The simplest calculation uses appropriate
controlled. The lengths of various switching intervals (∆t) values from the capacitance curves in a standard equation for
are determined by how fast the FET input capacitance can voltage change in an RC network. The equations are:
be charged by current from the generator. td(on) = RG Ciss In [VGG/(VGG – VGSP)]
The published capacitance data is difficult to use for td(off) = RG Ciss In (VGG/VGSP)
calculating rise and fall because drain–gate capacitance
varies greatly with applied voltage. Accordingly, gate The capacitance (Ciss) is read from the capacitance curve at
charge data is used. In most cases, a satisfactory estimate of a voltage corresponding to the off–state condition when
average input current (IG(AV)) can be made from a calculating td(on) and is read at a voltage corresponding to the
rudimentary analysis of the drive circuit so that on–state when calculating td(off).
At high switching speeds, parasitic circuit elements
t = Q/IG(AV) complicate the analysis. The inductance of the MOSFET
During the rise and fall time interval when switching a source lead, inside the package and in the circuit wiring
resistive load, VGS remains virtually constant at a level which is common to both the drain and gate current paths,
known as the plateau voltage, VSGP. Therefore, rise and fall produces a voltage at the source which reduces the gate drive
times may be approximated by the following: current. The voltage is determined by Ldi/dt, but since di/dt
tr = Q2 x RG/(VGG – VGSP) is a function of drain current, the mathematical solution is
tf = Q2 x RG/VGSP complex. The MOSFET output capacitance also
complicates the mathematics. And finally, MOSFETs have
where finite internal gate resistance which effectively adds to the
VGG = the gate drive voltage, which varies from zero to VGG resistance of the driving source, but the internal resistance
RG = the gate drive resistance is difficult to measure and, consequently, is not specified.
and Q2 and VGSP are read from the gate charge curve.

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MMDF2C02E

DRAIN–TO–SOURCE DIODE CHARACTERISTICS

The switching characteristics of a MOSFET body diode high di/dts. The diode’s negative di/dt during ta is directly
are very important in systems using it as a freewheeling or controlled by the device clearing the stored charge.
commutating diode. Of particular interest are the reverse However, the positive di/dt during tb is an uncontrollable
recovery characteristics which play a major role in diode characteristic and is usually the culprit that induces
determining switching losses, radiated noise, EMI and RFI. current ringing. Therefore, when comparing diodes, the
System switching losses are largely due to the nature of ratio of tb/ta serves as a good indicator of recovery
the body diode itself. The body diode is a minority carrier abruptness and thus gives a comparative estimate of
device, therefore it has a finite reverse recovery time, trr, due probable noise generated. A ratio of 1 is considered ideal and
to the storage of minority carrier charge, QRR, as shown in values less than 0.5 are considered snappy.
the typical reverse recovery wave form of Figure 11. It is this Compared to ON Semiconductor standard cell density
stored charge that, when cleared from the diode, passes low voltage MOSFETs, high cell density MOSFET diodes
through a potential and defines an energy loss. Obviously, are faster (shorter trr), have less stored charge and a softer
repeatedly forcing the diode through reverse recovery reverse recovery characteristic. The softness advantage of
further increases switching losses. Therefore, one would the high cell density diode means they can be forced through
like a diode with short trr and low QRR specifications to reverse recovery at a higher di/dt than a standard cell
minimize these losses. MOSFET diode without increasing the current ringing or the
The abruptness of diode reverse recovery effects the noise generated. In addition, power dissipation incurred
amount of radiated noise, voltage spikes, and current from switching the diode will be less due to the shorter
ringing. The mechanisms at work are finite irremovable recovery time and lower switching losses.
circuit parasitic inductances and capacitances acted upon by

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Figure 7. Reverse Recovery Time (trr)

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422
MMDF2C02E

SAFE OPERATING AREA

The Forward Biased Safe Operating Area curves define reliable operation, the stored energy from circuit inductance
the maximum simultaneous drain–to–source voltage and dissipated in the transistor while in avalanche must be less
drain current that a transistor can handle safely when it is than the rated limit and must be adjusted for operating
forward biased. Curves are based upon maximum peak conditions differing from those specified. Although industry
junction temperature and a case temperature (TC) of 25°C. practice is to rate in terms of energy, avalanche energy
Peak repetitive pulsed power limits are determined by using capability is not a constant. The energy rating decreases
the thermal response data in conjunction with the procedures non–linearly with an increase of peak current in avalanche
discussed in AN569, “Transient Thermal Resistance – and peak junction temperature.
General Data and Its Use.” Although many E–FETs can withstand the stress of
Switching between the off–state and the on–state may drain–to–source avalanche at currents up to rated pulsed
traverse any load line provided neither rated peak current current (IDM), the energy rating is specified at rated
(IDM) nor rated voltage (VDSS) is exceeded, and that the continuous current (ID), in accordance with industry
transition time (tr, tf) does not exceed 10 µs. In addition the custom. The energy rating must be derated for temperature
total power averaged over a complete switching cycle must as shown in the accompanying graph (Figure 9). Maximum
not exceed (TJ(MAX) – TC)/(RθJC). energy at currents below rated continuous ID can safely be
A power MOSFET designated E–FET can be safely used assumed to equal the values indicated.
in switching circuits with unclamped inductive loads. For

N–Channel P–Channel
 
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Safe Operating Area Safe Operating Area
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Figure 9. Maximum Avalanche Energy versus Figure 9. Maximum Avalanche Energy versus
Starting Junction Temperature Starting Junction Temperature

http://onsemi.com
423
MMDF2C02E



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Figure 10. Thermal Response

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Figure 11. Diode Reverse Recovery Waveform

http://onsemi.com
424
MMDF2C02E

INFORMATION FOR USING THE SO–8 SURFACE MOUNT PACKAGE

MINIMUM RECOMMENDED FOOTPRINT FOR SURFACE MOUNTED APPLICATIONS


Surface mount board layout is a critical portion of the total interface between the board and the package. With the
design. The footprint for the semiconductor packages must correct pad geometry, the packages will self–align when
be the correct size to ensure proper solder connection subjected to a solder reflow process.

9
$#

#:$ $$
: 6

#6 $
9 #:
inches
mm

SO–8 POWER DISSIPATION


The power dissipation of the SO–8 is a function of the into the equation for an ambient temperature TA of 25°C,
input pad size. This can vary from the minimum pad size one can calculate the power dissipation of the device which
for soldering to the pad size given for maximum power in this case is 2.0 Watts.
dissipation. Power dissipation for a surface mount device is 150°C – 25°C
determined by TJ(max), the maximum rated junction PD = = 2.0 Watts
62.5°C/W
temperature of the die, RθJA, the thermal resistance from
the device junction to ambient; and the operating The 62.5°C/W for the SO–8 package assumes the
temperature, TA. Using the values provided on the data recommended footprint on a glass epoxy printed circuit
sheet for the SO–8 package, PD can be calculated as board to achieve a power dissipation of 2.0 Watts using the
follows: footprint shown. Another alternative would be to use a
TJ(max) – TA
ceramic substrate or an aluminum core board such as
PD = Thermal Cladt. Using board material such as Thermal
RθJA
Clad, the power dissipation can be doubled using the same
The values for the equation are found in the maximum footprint.
ratings table on the data sheet. Substituting these values

SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • The soldering temperature and time shall not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within • When shifting from preheating to soldering, the
a short time could result in device failure. Therefore, the maximum temperature gradient shall be 5°C or less.
following items should always be observed in order to • After soldering has been completed, the device should
minimize the thermal stress to which the devices are be allowed to cool naturally for at least three minutes.
subjected. Gradual cooling should be used as the use of forced
• Always preheat the device. cooling will increase the temperature gradient and
• The delta temperature between the preheat and result in latent failure due to mechanical stress.
soldering should be 100°C or less.* • Mechanical stress or shock should not be applied
• When preheating and soldering, the temperature of the during cooling.
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When * Soldering a device without preheating can cause
using infrared heating with the reflow soldering excessive thermal shock and stress which can result in
method, the difference shall be a maximum of 10°C. damage to the device.

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425
MMDF2C02E

TYPICAL SOLDER HEATING PROFILE


For any given circuit board, there will be a group of temperature versus time. The line on the graph shows the
control settings that will give the desired heat pattern. The actual temperature that might be experienced on the surface
operator must set temperatures for several heating zones of a test board at or near a central solder joint. The two
and a figure for belt speed. Taken together, these control profiles are based on a high density and a low density
settings make up a heating “profile” for that particular board. The Vitronics SMD310 convection/infrared reflow
circuit board. On machines controlled by a computer, the soldering system was used to generate this profile. The type
computer remembers these profiles from one operating of solder used was 62/36/2 Tin Lead Silver with a melting
session to the next. Figure 12 shows a typical heating point between 177–189°C. When this type of furnace is
profile for use when soldering a surface mount device to a used for solder reflow work, the circuit boards and solder
printed circuit board. This profile will vary among joints tend to heat first. The components on the board are
soldering systems, but it is a good starting point. Factors then heated by conduction. The circuit board, because it has
that can affect the profile include the type of soldering a large surface area, absorbs the thermal energy more
system in use, density and types of components on the efficiently, then distributes this energy to the components.
board, type of solder used, and the type of board or Because of this effect, the main body of a component may
substrate material being used. This profile shows be up to 30 degrees cooler than the adjacent solder joints.

STEP 1 STEP 2 STEP 3 STEP 4 STEP 5 STEP 6 STEP 7


PREHEAT VENT HEATING HEATING HEATING VENT COOLING
ZONE 1 “SOAK” ZONES 2 & 5 ZONES 3 & 6 ZONES 4 & 7
“RAMP” “RAMP” “SOAK” “SPIKE” 205° TO 219°C
PEAK AT
200°C DESIRED CURVE FOR HIGH 170°C SOLDER
MASS ASSEMBLIES JOINT
160°C
150°C

150°C
SOLDER IS LIQUID FOR
40 TO 80 SECONDS
100°C 140°C (DEPENDING ON
MASS OF ASSEMBLY)
100°C

DESIRED CURVE FOR LOW


MASS ASSEMBLIES
5°C

TIME (3 TO 7 MINUTES TOTAL) TMAX


Figure 12. Typical Solder Heating Profile

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426
(  .
Preferred Device

#$%& '(
   
Complementary SO–8, Dual
These miniature surface mount MOSFETs feature ultra low RDS(on)
and true logic level performance. They are capable of withstanding http://onsemi.com
high energy in the avalanche and commutation modes and the
drain–to–source diode has a very low reverse recovery time. 2 AMPERES
MiniMOSt devices are designed for use in low voltage, high speed 20 VOLTS
switching applications where power efficiency is important. Typical
applications are dc–dc converters, and power management in portable
RDS(on) = 90 m (N–Channel)
and battery powered products such as computers, printers, cellular and RDS(on) = 160 m (P–Channel)
cordless phones. They can also be used for low voltage motor controls
in mass storage products such as disk drives and tape drives. The N–Channel P–Channel
avalanche energy is specified to eliminate the guesswork in designs
where inductive loads are switched and offer additional safety margin D D
against unexpected voltage transients.
• Ultra Low RDS(on) Provides Higher Efficiency and Extends
Battery Life G
• Logic Level Gate Drive – Can Be Driven by Logic ICs G

• Miniature SO–8 Surface Mount Package – Saves Board Space S


S
• Diode Is Characterized for Use In Bridge Circuits
• Diode Exhibits High Speed, With Soft Recovery MARKING
• Avalanche Energy Specified DIAGRAM
• Mounting Information for SO–8 Package Provided
MAXIMUM RATINGS (TJ = 25°C unless otherwise noted) (Note 1.) SO–8, Dual
CASE 751 D2C02
Rating Symbol Value Unit 8 LYWW
STYLE 14
Drain–to–Source Voltage VDSS 20 Vdc
1
Gate–to–Source Voltage VGS ± 20 Vdc
Drain–to–Gate Voltage (RGS = 1.0 mΩ) VDGR 20 Vdc D2C02 = Device Code
Drain Current – Continuous N–Channel ID 3.8 A L = Location Code
P–Channel 3.3 Y = Year
– Pulsed N–Channel IDM 19 WW = Work Week
P–Channel 20
Operating and Storage Temperature Range TJ, Tstg – 55 °C PIN ASSIGNMENT
to 150
Total Power Dissipation @ TA= 25°C (Note 2.) PD 2.0 Watts N–Source 1 8 N–Drain
Single Pulse Drain–to–Source Avalanche EAS mJ N–Gate 2 7 N–Drain
Energy – Starting TJ = 25°C P–Source 3 6 P–Drain
(VDD = 20 V, VGS = 5.0 V, Peak IL = 9.0 A,
L = 10 mH, RG = 25 Ω) N–Channel 405 P–Gate 4 5 P–Drain
(VDD = 20 V, VGS = 5.0 V, Peak IL = 6.0 A, Top View
L = 18 mH, RG = 25 Ω) P–Channel 324
Thermal Resistance – Junction to Ambient RθJA 62.5 °C/W ORDERING INFORMATION
(Note 2.)
Maximum Lead Temperature for Soldering, TL 260 °C Device Package Shipping
0.0625″ from case. Time in Solder Bath is
MMDF2C02HDR2 SO–8 2500 Tape & Reel
10 seconds.
1. Negative signs for P–Channel device omitted for clarity.
2. Mounted on 2” square FR4 board (1” sq. 2 oz. Cu 0.06” thick single sided) with Preferred devices are recommended choices for future use
one die operating, 10 sec. max. and best overall value.

 Semiconductor Components Industries, LLC, 2000 427 Publication Order Number:


November, 2000 – Rev. 6 MMDF2C02HD/D
MMDF2C02HD

ELECTRICAL CHARACTERISTICS (TA = 25°C unless otherwise noted) (Note 3.)


Characteristic Symbol Polarity Min Typ Max Unit
OFF CHARACTERISTICS
Drain–Source Breakdown Voltage V(BR)DSS Vdc
(VGS = 0 Vdc, ID = 250 µAdc) – 20 – –
Zero Gate Voltage Drain Current IDSS (N) – – 1.0 µAdc
(VDS = 20 Vdc, VGS = 0 Vdc) (P) – – 1.0
Gate–Body Leakage Current (VGS = ±20 Vdc, VDS = 0) IGSS – – – 100 nAdc
ON CHARACTERISTICS (Note 4.)
Gate Threshold Voltage VGS(th) Vdc
(VDS = VGS, ID = 250 µAdc) – 1.0 1.5 2.0
Drain–to–Source On–Resistance RDS(on) Ohm
(VGS = 4.5 Vdc, ID = 1.5 Adc) (N) – 0.074 0.100
(VGS = 4.5 Vdc, ID = 1.0 Adc) (P) – 0.152 0.180
Drain–to–Source On–Resistance RDS(on) Ohm
(VGS = 10 Vdc, ID = 3.0 Adc) (N) – 0.058 0.090
(VGS = 10 Vdc, ID = 2.0 Adc) (P) – 0.118 0.160
Forward Transconductance gFS mhos
(VDS = 3.0 Vdc, ID = 1.5 Adc) (N) 2.0 3.88 –
(VDS = 3.0 Vdc, ID = 1.0 Adc) (P) 2.0 3.0 –
DYNAMIC CHARACTERISTICS
Input Capacitance Ciss (N) – 455 630 pF
(P) – 420 588
Output Capacitance (VDS = 16 Vdc, VGS = 0 Vdc, Coss (N) – 184 250
f = 1.0 MHz)) (P) – 290 406
Transfer Capacitance Crss (N) – 45 90
(P) – 116 232
SWITCHING CHARACTERISTICS (Note 5.)
Turn–On Delay Time td(on) (N) – 11 22 ns
(VDD = 10 Vdc, ID = 3.0 Adc, (P) – 19 38
Rise Time VGS = 4.5 Vdc, tr (N) – 58 116
RG = 6.0 Ω) (P) – 66 132
Turn–Off Delay Time (VDD = 10 Vdc, ID = 2.0 Adc, td(off) (N) – 17 35
VGS = 4.5 Vdc, (P) – 25 50
Fall Time RG = 6.0 Ω) tf (N) – 20 40
(P) – 37 74
Turn–On Delay Time td(on) (N) – 7.0 21
(VDD = 10 Vdc, ID = 3.0 Adc, (P) – 11 22
Rise Time VGS = 10 Vdc, tr (N) – 32 64
RG = 6.0 Ω) (P) – 21 42
Turn–Off Delay Time (VDD = 10 Vdc, ID = 2.0 Adc, td(off) (N) – 27 54
VGS = 10 Vdc, (P) – 45 90
Fall Time RG = 6.0 Ω) tf (N) – 21 42
(P) – 36 72
3. Negative signs for P–Channel device omitted for clarity.
4. Pulse Test: Pulse Width ≤ 300 µs, Duty Cycle ≤ 2%.
5. Switching characteristics are independent of operating junction temperature.

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428
MMDF2C02HD

ELECTRICAL CHARACTERISTICS – continued (TA = 25°C unless otherwise noted) (Note 6.)
Characteristic Symbol Polarity Min Typ Max Unit
SWITCHING CHARACTERISTICS – continued (Note 8.)
Total Gate Charge QT (N) – 12.5 18 nC
(P) – 15 20
Gate–Source Charge (VDS = 16 Vdc, ID = 3.0 Adc, Q1 (N) – 1.3 –
VGS = 10 Vdc) (P) – 1.2 –
Gate–Drain Charge (VDS = 16 Vdc, ID = 2.0 Adc, Q2 (N) – 2.8 –
VGS = 10 Vdc) (P) – 5.0 –
Q3 (N) – 2.4 –
(P) – 4.0 –
SOURCE–DRAIN DIODE CHARACTERISTICS (TC = 25°C)
Forward Voltage (Note 7.) (IS = 3.0 Adc, VGS = 0 Vdc) VSD (N) – 0.79 1.3 Vdc
(IS = 2.0 Adc, VGS = 0 Vdc) (P) – 1.5 2.1
Reverse Recovery Time trr (N) – 23 – ns
(P) – 38 –
(IS = 3.0 Adc, VAS = 0 Vdc, ta (N) – 18 –
dIS/dt = 100 A/µs) (P) – 17 –

(IS = 2.0 Adc, VAS = 0 Vdc, tb (N) – 5.0 –


dIS/dt = 100 A/µs) (P) – 21 –
Reverse Recovery Stored QRR (N) – 0.025 – µC
Charge (P) – 0.034 –
6. Negative signs for P–Channel device omitted for clarity.
7. Pulse Test: Pulse Width ≤ 300 µs, Duty Cycle ≤ 2%.
8. Switching characteristics are independent of operating junction temperature.

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429
MMDF2C02HD

TYPICAL ELECTRICAL CHARACTERISTICS

N–Channel P–Channel

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Figure 1. On–Region Characteristics Figure 1. On–Region Characteristics

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Figure 2. Transfer Characteristics Figure 2. Transfer Characteristics

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430
MMDF2C02HD

TYPICAL ELECTRICAL CHARACTERISTICS

N–Channel P–Channel

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Figure 3. On–Resistance versus Figure 3. On–Resistance versus


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Figure 4. On–Resistance versus Drain Current Figure 4. On–Resistance versus Drain Current
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Figure 5. On–Resistance Variation with Figure 5. On–Resistance Variation with


Temperature Temperature

http://onsemi.com
431
MMDF2C02HD

TYPICAL ELECTRICAL CHARACTERISTICS

N–Channel P–Channel

 
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Figure 6. Drain–To–Source Leakage Figure 6. Drain–To–Source Leakage


Current versus Voltage Current versus Voltage

POWER MOSFET SWITCHING

Switching behavior is most easily modeled and predicted The capacitance (Ciss) is read from the capacitance curve at
by recognizing that the power MOSFET is charge a voltage corresponding to the off–state condition when
controlled. The lengths of various switching intervals (∆t) calculating td(on) and is read at a voltage corresponding to the
are determined by how fast the FET input capacitance can on–state when calculating td(off).
be charged by current from the generator. At high switching speeds, parasitic circuit elements
The published capacitance data is difficult to use for complicate the analysis. The inductance of the MOSFET
calculating rise and fall because drain–gate capacitance source lead, inside the package and in the circuit wiring
varies greatly with applied voltage. Accordingly, gate which is common to both the drain and gate current paths,
charge data is used. In most cases, a satisfactory estimate of produces a voltage at the source which reduces the gate drive
average input current (IG(AV)) can be made from a current. The voltage is determined by Ldi/dt, but since di/dt
rudimentary analysis of the drive circuit so that is a function of drain current, the mathematical solution is
t = Q/IG(AV) complex. The MOSFET output capacitance also
complicates the mathematics. And finally, MOSFETs have
During the rise and fall time interval when switching a finite internal gate resistance which effectively adds to the
resistive load, VGS remains virtually constant at a level resistance of the driving source, but the internal resistance
known as the plateau voltage, VSGP. Therefore, rise and fall is difficult to measure and, consequently, is not specified.
times may be approximated by the following: The resistive switching time variation versus gate
tr = Q2 x RG/(VGG – VGSP) resistance (Figure 9) shows how typical switching
tf = Q2 x RG/VGSP performance is affected by the parasitic circuit elements. If
where the parasitics were not present, the slope of the curves would
maintain a value of unity regardless of the switching speed.
VGG = the gate drive voltage, which varies from zero to VGG
The circuit used to obtain the data is constructed to minimize
RG = the gate drive resistance
common inductance in the drain and gate circuit loops and
and Q2 and VGSP are read from the gate charge curve.
is believed readily achievable with board mounted
During the turn–on and turn–off delay times, gate current is components. Most power electronic loads are inductive; the
not constant. The simplest calculation uses appropriate data in the figure is taken with a resistive load, which
values from the capacitance curves in a standard equation for approximates an optimally snubbed inductive load. Power
voltage change in an RC network. The equations are: MOSFETs may be safely operated into an inductive load;
td(on) = RG Ciss In [VGG/(VGG – VGSP)] however, snubbing reduces switching losses.
td(off) = RG Ciss In (VGG/VGSP)

http://onsemi.com
432
MMDF2C02HD

N–Channel P–Channel

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Figure 7. Capacitance Variation Figure 7. Capacitance Variation

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Figure 8. Gate–To–Source and Drain–To–Source Figure 8. Gate–To–Source and Drain–To–Source


Voltage versus Total Charge Voltage versus Total Charge

 
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Figure 9. Resistive Switching Time Figure 9. Resistive Switching Time


Variation versus Gate Resistance Variation versus Gate Resistance

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433
MMDF2C02HD

DRAIN–TO–SOURCE DIODE CHARACTERISTICS

The switching characteristics of a MOSFET body diode high di/dts. The diode’s negative di/dt during ta is directly
are very important in systems using it as a freewheeling or controlled by the device clearing the stored charge.
commutating diode. Of particular interest are the reverse However, the positive di/dt during tb is an uncontrollable
recovery characteristics which play a major role in diode characteristic and is usually the culprit that induces
determining switching losses, radiated noise, EMI and RFI. current ringing. Therefore, when comparing diodes, the
System switching losses are largely due to the nature of ratio of tb/ta serves as a good indicator of recovery
the body diode itself. The body diode is a minority carrier abruptness and thus gives a comparative estimate of
device, therefore it has a finite reverse recovery time, trr, due probable noise generated. A ratio of 1 is considered ideal and
to the storage of minority carrier charge, QRR, as shown in values less than 0.5 are considered snappy.
the typical reverse recovery wave form of Figure 15. It is this Compared to ON Semiconductor standard cell density
stored charge that, when cleared from the diode, passes low voltage MOSFETs, high cell density MOSFET diodes
through a potential and defines an energy loss. Obviously, are faster (shorter trr), have less stored charge and a softer
repeatedly forcing the diode through reverse recovery reverse recovery characteristic. The softness advantage of
further increases switching losses. Therefore, one would the high cell density diode means they can be forced through
like a diode with short trr and low QRR specifications to reverse recovery at a higher di/dt than a standard cell
minimize these losses. MOSFET diode without increasing the current ringing or the
The abruptness of diode reverse recovery effects the noise generated. In addition, power dissipation incurred
amount of radiated noise, voltage spikes, and current from switching the diode will be less due to the shorter
ringing. The mechanisms at work are finite irremovable recovery time and lower switching losses.
circuit parasitic inductances and capacitances acted upon by

N–Channel P–Channel
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Figure 10. Diode Forward Voltage versus Current Figure 10. Diode Forward Voltage versus Current

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434
MMDF2C02HD

SAFE OPERATING AREA

The Forward Biased Safe Operating Area curves define reliable operation, the stored energy from circuit inductance
the maximum simultaneous drain–to–source voltage and dissipated in the transistor while in avalanche must be less
drain current that a transistor can handle safely when it is than the rated limit and must be adjusted for operating
forward biased. Curves are based upon maximum peak conditions differing from those specified. Although industry
junction temperature and a case temperature (TC) of 25°C. practice is to rate in terms of energy, avalanche energy
Peak repetitive pulsed power limits are determined by using capability is not a constant. The energy rating decreases
the thermal response data in conjunction with the procedures non–linearly with an increase of peak current in avalanche
discussed in AN569, “Transient Thermal Resistance – and peak junction temperature.
General Data and Its Use.” Although many E–FETs can withstand the stress of
Switching between the off–state and the on–state may drain–to–source avalanche at currents up to rated pulsed
traverse any load line provided neither rated peak current current (IDM), the energy rating is specified at rated
(IDM) nor rated voltage (VDSS) is exceeded, and that the continuous current (ID), in accordance with industry
transition time (tr, tf) does not exceed 10 µs. In addition the custom. The energy rating must be derated for temperature
total power averaged over a complete switching cycle must as shown in the accompanying graph (Figure 13). Maximum
not exceed (TJ(MAX) – TC)/(RθJC). energy at currents below rated continuous ID can safely be
A power MOSFET designated E–FET can be safely used assumed to equal the values indicated.
in switching circuits with unclamped inductive loads. For
N–Channel P–Channel
 
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Safe Operating Area Safe Operating Area

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Figure 13. Maximum Avalanche Energy versus Figure 13. Maximum Avalanche Energy versus
Starting Junction Temperature Starting Junction Temperature

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435
MMDF2C02HD

TYPICAL ELECTRICAL CHARACTERISTICS



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http://onsemi.com
436
MMDF2C02HD

INFORMATION FOR USING THE SO–8 SURFACE MOUNT PACKAGE

MINIMUM RECOMMENDED FOOTPRINT FOR SURFACE MOUNTED APPLICATIONS


Surface mount board layout is a critical portion of the total interface between the board and the package. With the
design. The footprint for the semiconductor packages must correct pad geometry, the packages will self–align when
be the correct size to ensure proper solder connection subjected to a solder reflow process.

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SO–8 POWER DISSIPATION


The power dissipation of the SO–8 is a function of the into the equation for an ambient temperature TA of 25°C,
input pad size. This can vary from the minimum pad size one can calculate the power dissipation of the device which
for soldering to the pad size given for maximum power in this case is 2.0 Watts.
dissipation. Power dissipation for a surface mount device is 150°C – 25°C
determined by TJ(max), the maximum rated junction PD = = 2.0 Watts
62.5°C/W
temperature of the die, RθJA, the thermal resistance from
the device junction to ambient; and the operating The 62.5°C/W for the SO–8 package assumes the
temperature, TA. Using the values provided on the data recommended footprint on a glass epoxy printed circuit
sheet for the SO–8 package, PD can be calculated as board to achieve a power dissipation of 2.0 Watts using the
follows: footprint shown. Another alternative would be to use a
TJ(max) – TA
ceramic substrate or an aluminum core board such as
PD = Thermal Cladt. Using board material such as Thermal
RθJA
Clad, the power dissipation can be doubled using the same
The values for the equation are found in the maximum footprint.
ratings table on the data sheet. Substituting these values

SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • The soldering temperature and time shall not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within • When shifting from preheating to soldering, the
a short time could result in device failure. Therefore, the maximum temperature gradient shall be 5°C or less.
following items should always be observed in order to • After soldering has been completed, the device should
minimize the thermal stress to which the devices are be allowed to cool naturally for at least three minutes.
subjected. Gradual cooling should be used as the use of forced
• Always preheat the device. cooling will increase the temperature gradient and
• The delta temperature between the preheat and result in latent failure due to mechanical stress.
soldering should be 100°C or less.* • Mechanical stress or shock should not be applied
• When preheating and soldering, the temperature of the during cooling.
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When * Soldering a device without preheating can cause
using infrared heating with the reflow soldering excessive thermal shock and stress which can result in
method, the difference shall be a maximum of 10°C. damage to the device.

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MMDF2C02HD

TYPICAL SOLDER HEATING PROFILE


For any given circuit board, there will be a group of temperature versus time. The line on the graph shows the
control settings that will give the desired heat pattern. The actual temperature that might be experienced on the surface
operator must set temperatures for several heating zones of a test board at or near a central solder joint. The two
and a figure for belt speed. Taken together, these control profiles are based on a high density and a low density
settings make up a heating “profile” for that particular board. The Vitronics SMD310 convection/infrared reflow
circuit board. On machines controlled by a computer, the soldering system was used to generate this profile. The type
computer remembers these profiles from one operating of solder used was 62/36/2 Tin Lead Silver with a melting
session to the next. Figure 16 shows a typical heating point between 177–189°C. When this type of furnace is
profile for use when soldering a surface mount device to a used for solder reflow work, the circuit boards and solder
printed circuit board. This profile will vary among joints tend to heat first. The components on the board are
soldering systems, but it is a good starting point. Factors then heated by conduction. The circuit board, because it has
that can affect the profile include the type of soldering a large surface area, absorbs the thermal energy more
system in use, density and types of components on the efficiently, then distributes this energy to the components.
board, type of solder used, and the type of board or Because of this effect, the main body of a component may
substrate material being used. This profile shows be up to 30 degrees cooler than the adjacent solder joints.

STEP 1 STEP 2 STEP 3 STEP 4 STEP 5 STEP 6 STEP 7


PREHEAT VENT HEATING HEATING HEATING VENT COOLING
ZONE 1 “SOAK” ZONES 2 & 5 ZONES 3 & 6 ZONES 4 & 7
“RAMP” “RAMP” “SOAK” “SPIKE” 205° TO 219°C
PEAK AT
200°C DESIRED CURVE FOR HIGH 170°C SOLDER
MASS ASSEMBLIES JOINT
160°C
150°C

150°C
SOLDER IS LIQUID FOR
40 TO 80 SECONDS
100°C 140°C (DEPENDING ON
MASS OF ASSEMBLY)
100°C

DESIRED CURVE FOR LOW


MASS ASSEMBLIES
5°C

TIME (3 TO 7 MINUTES TOTAL) TMAX


Figure 16. Typical Solder Heating Profile

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438
( !.
Preferred Device

#$%& '(
 !  
Complementary SO–8, Dual
These miniature surface mount MOSFETs feature ultra low RDS(on)
and true logic level performance. They are capable of withstanding
high energy in the avalanche and commutation modes and the http://onsemi.com
drain-to-source diode has a very low reverse recovery time.
MiniMOSt devices are designed for use in low voltage, high speed 2 AMPERES
switching applications where power efficiency is important. Typical 30 VOLTS
applications are dc-dc converters, and power management in portable RDS(on) = 70 m (N-Channel)
and battery powered products such as computers, printers, cellular and
cordless phones. They can also be used for low voltage motor controls RDS(on) = 200 m (P-Channel)
in mass storage products such as disk drives and tape drives. The
avalanche energy is specified to eliminate the guesswork in designs N–Channel P–Channel
where inductive loads are switched and offer additional safety margin  
against unexpected voltage transients.
• Ultra Low RDS(on) Provides Higher Efficiency and Extends
Battery Life
 
• Logic Level Gate Drive – Can Be Driven by Logic ICs
• Miniature SO-8 Surface Mount Package – Saves Board Space  
• Diode Is Characterized for Use In Bridge Circuits
• Diode Exhibits High Speed, With Soft Recovery MARKING
• IDSS Specified at Elevated Temperature DIAGRAM
• Avalanche Energy Specified
• Mounting Information for SO-8 Package Provided SO–8, Dual
D2C03
8 CASE 751
LYWW
STYLE 14
MAXIMUM RATINGS (TJ = 25°C unless otherwise noted) (Note 1.)
1
Rating Symbol Value Unit
Drain–to–Source Voltage VDSS 30 Vdc D2C03 = Device Code
Gate–to–Source Voltage VGS ± 20 Vdc L = Location Code
Drain Current – Continuous N–Channel ID 4.1 A Y = Year
P–Channel 3.0 WW = Work Week
Drain Current – Pulsed N–Channel IDM 21
P–Channel 15
PIN ASSIGNMENT
Operating and Storage Temperature Range TJ, Tstg – 55 °C
to 150
N–Source 1 8 N–Drain
Total Power Dissipation @ TA= 25°C (Note 2.) PD 2.0 Watts
N–Gate 2 7 N–Drain
Thermal Resistance – Junction to Ambient RθJA 62.5 °C/W
P–Source 3 6 P–Drain
(Note 2.)
P–Gate 4 5 P–Drain
Single Pulse Drain–to–Source Avalanche EAS mJ
Energy – Starting TJ = 25°C Top View
(VDD = 30 V, VGS = 5.0 V, Peak IL = 9.0
Apk, L = 8.0 mH, RG = 25 Ω) N–Channel 324
(VDD = 30 V, VGS = 5.0 V, Peak IL = 6.0 ORDERING INFORMATION
Apk, L = 18 mH, RG = 25 Ω) P–Channel 324
Device Package Shipping
Maximum Lead Temperature for Soldering, TL 260 °C
0.0625″ from case. Time in Solder Bath is MMDF2C03HDR2 SO–8 2500 Tape & Reel
10 seconds.
1. Negative signs for P–Channel device omitted for clarity.
2. Mounted on 2” square FR4 board (1” sq. 2 oz. Cu 0.06” thick single sided) with Preferred devices are recommended choices for future use
one die operating, 10 sec. max. and best overall value.

 Semiconductor Components Industries, LLC, 2000 439 Publication Order Number:


November, 2000 – Rev. 6 MMDF2C03HD/D
MMDF2C03HD

ELECTRICAL CHARACTERISTICS (TA = 25°C unless otherwise noted) (Note 3.)


Characteristic Symbol Polarity Min Typ Max Unit
OFF CHARACTERISTICS
Drain–Source Breakdown Voltage V(BR)DSS Vdc
(VGS = 0 Vdc, ID = 250 µAdc) – 30 – –
Zero Gate Voltage Drain Current IDSS (N) – – 1.0 µAdc
(VDS = 30 Vdc, VGS = 0 Vdc) (P) – – 1.0
Gate–Body Leakage Current (VGS = ±20 Vdc, VDS = 0) IGSS – – – 100 nAdc
ON CHARACTERISTICS (Note 4.)
Gate Threshold Voltage VGS(th) (N) 1.0 1.7 3.0 Vdc
(VDS = VGS, ID = 250 µAdc) (P) 1.0 1.5 2.0
Drain–to–Source On–Resistance RDS(on) Ohm
(VGS = 10 Vdc, ID = 3.0 Adc) (N) – 0.06 0.070
(VGS = 10 Vdc, ID = 2.0 Adc) (P) – 0.17 0.200
Drain–to–Source On–Resistance RDS(on) Ohm
(VGS = 4.5 Vdc, ID = 1.5 Adc) (N) – 0.065 0.075
(VGS = 4.5 Vdc, ID = 1.0 Adc) (P) – 0.225 0.300
Forward Transconductance gFS mhos
(VDS = 3.0 Vdc, ID = 1.5 Adc) (N) 2.0 3.6 –
(VDS = 3.0 Vdc, ID = 1.0 Adc) (P) 2.0 3.4 –
DYNAMIC CHARACTERISTICS
Input Capacitance Ciss (N) – 450 630 pF
(P) – 397 550
Output Capacitance (VDS = 24 Vdc, VGS = 0 Vdc, Coss (N) – 160 225
f = 1.0 MHz) (P) – 189 250
Transfer Capacitance Crss (N) – 35 70
(P) – 64 126
SWITCHING CHARACTERISTICS (Note 5.)
Turn–On Delay Time td(on) (N) – 12 24 ns
(VDD = 15 Vdc, ID = 3.0 Adc, (P) – 16 32
Rise Time VGS = 4.5 Vdc, tr (N) – 65 130
RG = 9.1 Ω) (P) – 18 36
Turn–Off Delay Time (VDD = 15 Vdc, ID = 2.0 Adc, td(off) (N) – 16 32
VGS = 4.5 Vdc, (P) – 63 126
Fall Time RG = 6.0 Ω) tf (N) – 19 38
(P) – 194 390
Turn–On Delay Time td(on) (N) – 8.0 16
(VDD = 15 Vdc, ID = 3.0 Adc, (P) – 9.0 18
Rise Time VGS = 10 Vdc, tr (N) – 15 30
RG = 9.1 Ω) (P) – 10 20
Turn–Off Delay Time (VDD = 15 Vdc, ID = 2.0 Adc, td(off) (N) – 30 60
VGS = 10 Vdc, (P) – 81 162
Fall Time RG = 6.0 Ω) tf (N) – 23 46
(P) – 192 384
3. Negative signs for P–Channel device omitted for clarity.
4. Pulse Test: Pulse Width ≤ 300 µs, Duty Cycle ≤ 2%.
5. Switching characteristics are independent of operating junction temperature.

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ELECTRICAL CHARACTERISTICS – continued (TA = 25°C unless otherwise noted) (Note 6.)
Characteristic Symbol Polarity Min Typ Max Unit
SWITCHING CHARACTERISTICS – continued (Note 8.)
Total Gate Charge QT (N) – 11.5 16 nC
(P) – 14.2 19
Gate–Source Charge (VDS = 10 Vdc, ID = 3.0 Adc, Q1 (N) – 1.5 –
VGS = 10 Vdc) (P) – 1.1 –
Gate–Drain Charge (VDS = 24 Vdc, ID = 2.0 Adc, Q2 (N) – 3.5 –
VGS = 10 Vdc) (P) – 4.5 –
Q3 (N) – 2.8 –
(P) – 3.5 –
SOURCE–DRAIN DIODE CHARACTERISTICS (TC = 25°C)
Forward Voltage (Note 7.) (IS = 3.0 Adc, VGS = 0 Vdc) VSD (N) – 0.82 1.2 Vdc
(IS = 2.0 Adc, VGS = 0 Vdc) (P) – 1.82 2.0
Reverse Recovery Time trr (N) – 24 – ns
(P) – 42 –
ta (N) – 17 –
(P) – 16 –
(IF = IS,
dIS/dt = 100 A/µs) tb (N) – 7.0 –
(P) – 26 –
Reverse Recovery Storage QRR (N) – 0.025 – µC
Charge (P) – 0.043 –

6. Negative signs for P–Channel device omitted for clarity.


7. Pulse Test: Pulse Width ≤ 300 µs, Duty Cycle ≤ 2%.
8. Switching characteristics are independent of operating junction temperature.

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TYPICAL ELECTRICAL CHARACTERISTICS

N–Channel P–Channel

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Figure 2. Transfer Characteristics Figure 2. Transfer Characteristics

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TYPICAL ELECTRICAL CHARACTERISTICS

N–Channel P–Channel

 


  


 


  
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Figure 3. On–Resistance versus Figure 3. On–Resistance versus


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Figure 5. On–Resistance Variation with Figure 5. On–Resistance Variation with


Temperature Temperature

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TYPICAL ELECTRICAL CHARACTERISTICS

N–Channel P–Channel

 
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Figure 6. Drain–To–Source Leakage Figure 6. Drain–To–Source Leakage


Current versus Voltage Current versus Voltage

POWER MOSFET SWITCHING

Switching behavior is most easily modeled and predicted The capacitance (Ciss) is read from the capacitance curve at
by recognizing that the power MOSFET is charge a voltage corresponding to the off–state condition when
controlled. The lengths of various switching intervals (∆t) calculating td(on) and is read at a voltage corresponding to the
are determined by how fast the FET input capacitance can on–state when calculating td(off).
be charged by current from the generator. At high switching speeds, parasitic circuit elements
The published capacitance data is difficult to use for complicate the analysis. The inductance of the MOSFET
calculating rise and fall because drain–gate capacitance source lead, inside the package and in the circuit wiring
varies greatly with applied voltage. Accordingly, gate which is common to both the drain and gate current paths,
charge data is used. In most cases, a satisfactory estimate of produces a voltage at the source which reduces the gate drive
average input current (IG(AV)) can be made from a current. The voltage is determined by Ldi/dt, but since di/dt
rudimentary analysis of the drive circuit so that is a function of drain current, the mathematical solution is
t = Q/IG(AV) complex. The MOSFET output capacitance also
complicates the mathematics. And finally, MOSFETs have
During the rise and fall time interval when switching a finite internal gate resistance which effectively adds to the
resistive load, VGS remains virtually constant at a level resistance of the driving source, but the internal resistance
known as the plateau voltage, VSGP. Therefore, rise and fall is difficult to measure and, consequently, is not specified.
times may be approximated by the following: The resistive switching time variation versus gate
tr = Q2 x RG/(VGG – VGSP) resistance (Figure 9) shows how typical switching
tf = Q2 x RG/VGSP performance is affected by the parasitic circuit elements. If
where the parasitics were not present, the slope of the curves would
maintain a value of unity regardless of the switching speed.
VGG = the gate drive voltage, which varies from zero to VGG
The circuit used to obtain the data is constructed to minimize
RG = the gate drive resistance
common inductance in the drain and gate circuit loops and
and Q2 and VGSP are read from the gate charge curve.
is believed readily achievable with board mounted
During the turn–on and turn–off delay times, gate current is components. Most power electronic loads are inductive; the
not constant. The simplest calculation uses appropriate data in the figure is taken with a resistive load, which
values from the capacitance curves in a standard equation for approximates an optimally snubbed inductive load. Power
voltage change in an RC network. The equations are: MOSFETs may be safely operated into an inductive load;
td(on) = RG Ciss In [VGG/(VGG – VGSP)] however, snubbing reduces switching losses.
td(off) = RG Ciss In (VGG/VGSP)

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N–Channel P–Channel
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Figure 8. Gate–To–Source and Drain–To–Source Figure 8. Gate–To–Source and Drain–To–Source


Voltage versus Total Charge Voltage versus Total Charge

 
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Figure 9. Resistive Switching Time Figure 9. Resistive Switching Time


Variation versus Gate Resistance Variation versus Gate Resistance

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DRAIN–TO–SOURCE DIODE CHARACTERISTICS

The switching characteristics of a MOSFET body diode high di/dts. The diode’s negative di/dt during ta is directly
are very important in systems using it as a freewheeling or controlled by the device clearing the stored charge.
commutating diode. Of particular interest are the reverse However, the positive di/dt during tb is an uncontrollable
recovery characteristics which play a major role in diode characteristic and is usually the culprit that induces
determining switching losses, radiated noise, EMI and RFI. current ringing. Therefore, when comparing diodes, the
System switching losses are largely due to the nature of ratio of tb/ta serves as a good indicator of recovery
the body diode itself. The body diode is a minority carrier abruptness and thus gives a comparative estimate of
device, therefore it has a finite reverse recovery time, trr, due probable noise generated. A ratio of 1 is considered ideal and
to the storage of minority carrier charge, QRR, as shown in values less than 0.5 are considered snappy.
the typical reverse recovery wave form of Figure 15. It is this Compared to ON Semiconductor standard cell density
stored charge that, when cleared from the diode, passes low voltage MOSFETs, high cell density MOSFET diodes
through a potential and defines an energy loss. Obviously, are faster (shorter trr), have less stored charge and a softer
repeatedly forcing the diode through reverse recovery reverse recovery characteristic. The softness advantage of
further increases switching losses. Therefore, one would the high cell density diode means they can be forced through
like a diode with short trr and low QRR specifications to reverse recovery at a higher di/dt than a standard cell
minimize these losses. MOSFET diode without increasing the current ringing or the
The abruptness of diode reverse recovery effects the noise generated. In addition, power dissipation incurred
amount of radiated noise, voltage spikes, and current from switching the diode will be less due to the shorter
ringing. The mechanisms at work are finite irremovable recovery time and lower switching losses.
circuit parasitic inductances and capacitances acted upon by

N–Channel P–Channel
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Figure 10. Diode Forward Voltage versus Current Figure 10. Diode Forward Voltage versus Current

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Figure 11. Reverse Recovery Time (trr)

SAFE OPERATING AREA

The Forward Biased Safe Operating Area curves define reliable operation, the stored energy from circuit inductance
the maximum simultaneous drain–to–source voltage and dissipated in the transistor while in avalanche must be less
drain current that a transistor can handle safely when it is than the rated limit and must be adjusted for operating
forward biased. Curves are based upon maximum peak conditions differing from those specified. Although industry
junction temperature and a case temperature (TC) of 25°C. practice is to rate in terms of energy, avalanche energy
Peak repetitive pulsed power limits are determined by using capability is not a constant. The energy rating decreases
the thermal response data in conjunction with the procedures non–linearly with an increase of peak current in avalanche
discussed in AN569, “Transient Thermal Resistance – and peak junction temperature.
General Data and Its Use.” Although many E–FETs can withstand the stress of
Switching between the off–state and the on–state may drain–to–source avalanche at currents up to rated pulsed
traverse any load line provided neither rated peak current current (IDM), the energy rating is specified at rated
(IDM) nor rated voltage (VDSS) is exceeded, and that the continuous current (ID), in accordance with industry
transition time (tr, tf) does not exceed 10 µs. In addition the custom. The energy rating must be derated for temperature
total power averaged over a complete switching cycle must as shown in the accompanying graph (Figure 13). Maximum
not exceed (TJ(MAX) – TC)/(RθJC). energy at currents below rated continuous ID can safely be
A power MOSFET designated E–FET can be safely used assumed to equal the values indicated.
in switching circuits with unclamped inductive loads. For

N–Channel P–Channel
 
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Figure 12. Maximum Rated Forward Biased Figure 12. Maximum Rated Forward Biased
Safe Operating Area Safe Operating Area

N–Channel P–Channel

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Figure 13. Maximum Avalanche Energy versus Figure 13. Maximum Avalanche Energy versus
Starting Junction Temperature Starting Junction Temperature

TYPICAL ELECTRICAL CHARACTERISTICS



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INFORMATION FOR USING THE SO–8 SURFACE MOUNT PACKAGE

MINIMUM RECOMMENDED FOOTPRINT FOR SURFACE MOUNTED APPLICATIONS


Surface mount board layout is a critical portion of the total interface between the board and the package. With the
design. The footprint for the semiconductor packages must correct pad geometry, the packages will self–align when
be the correct size to ensure proper solder connection subjected to a solder reflow process.

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SO–8 POWER DISSIPATION


The power dissipation of the SO–8 is a function of the into the equation for an ambient temperature TA of 25°C,
input pad size. This can vary from the minimum pad size one can calculate the power dissipation of the device which
for soldering to the pad size given for maximum power in this case is 2.0 Watts.
dissipation. Power dissipation for a surface mount device is 150°C – 25°C
determined by TJ(max), the maximum rated junction PD = = 2.0 Watts
62.5°C/W
temperature of the die, RθJA, the thermal resistance from
the device junction to ambient; and the operating The 62.5°C/W for the SO–8 package assumes the
temperature, TA. Using the values provided on the data recommended footprint on a glass epoxy printed circuit
sheet for the SO–8 package, PD can be calculated as board to achieve a power dissipation of 2.0 Watts using the
follows: footprint shown. Another alternative would be to use a
TJ(max) – TA
ceramic substrate or an aluminum core board such as
PD = Thermal Cladt. Using board material such as Thermal
RθJA
Clad, the power dissipation can be doubled using the same
The values for the equation are found in the maximum footprint.
ratings table on the data sheet. Substituting these values

SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • The soldering temperature and time shall not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within • When shifting from preheating to soldering, the
a short time could result in device failure. Therefore, the maximum temperature gradient shall be 5°C or less.
following items should always be observed in order to • After soldering has been completed, the device should
minimize the thermal stress to which the devices are be allowed to cool naturally for at least three minutes.
subjected. Gradual cooling should be used as the use of forced
• Always preheat the device. cooling will increase the temperature gradient and
• The delta temperature between the preheat and result in latent failure due to mechanical stress.
soldering should be 100°C or less.* • Mechanical stress or shock should not be applied
• When preheating and soldering, the temperature of the during cooling.
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When * Soldering a device without preheating can cause
using infrared heating with the reflow soldering excessive thermal shock and stress which can result in
method, the difference shall be a maximum of 10°C. damage to the device.

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TYPICAL SOLDER HEATING PROFILE


For any given circuit board, there will be a group of temperature versus time. The line on the graph shows the
control settings that will give the desired heat pattern. The actual temperature that might be experienced on the surface
operator must set temperatures for several heating zones of a test board at or near a central solder joint. The two
and a figure for belt speed. Taken together, these control profiles are based on a high density and a low density
settings make up a heating “profile” for that particular board. The Vitronics SMD310 convection/infrared reflow
circuit board. On machines controlled by a computer, the soldering system was used to generate this profile. The type
computer remembers these profiles from one operating of solder used was 62/36/2 Tin Lead Silver with a melting
session to the next. Figure 16 shows a typical heating point between 177–189°C. When this type of furnace is
profile for use when soldering a surface mount device to a used for solder reflow work, the circuit boards and solder
printed circuit board. This profile will vary among joints tend to heat first. The components on the board are
soldering systems, but it is a good starting point. Factors then heated by conduction. The circuit board, because it has
that can affect the profile include the type of soldering a large surface area, absorbs the thermal energy more
system in use, density and types of components on the efficiently, then distributes this energy to the components.
board, type of solder used, and the type of board or Because of this effect, the main body of a component may
substrate material being used. This profile shows be up to 30 degrees cooler than the adjacent solder joints.

STEP 1 STEP 2 STEP 3 STEP 4 STEP 5 STEP 6 STEP 7


PREHEAT VENT HEATING HEATING HEATING VENT COOLING
ZONE 1 “SOAK” ZONES 2 & 5 ZONES 3 & 6 ZONES 4 & 7
“RAMP” “RAMP” “SOAK” “SPIKE” 205° TO 219°C
PEAK AT
200°C DESIRED CURVE FOR HIGH 170°C SOLDER
MASS ASSEMBLIES JOINT
160°C
150°C

150°C
SOLDER IS LIQUID FOR
40 TO 80 SECONDS
100°C 140°C (DEPENDING ON
MASS OF ASSEMBLY)
100°C

DESIRED CURVE FOR LOW


MASS ASSEMBLIES
5°C

TIME (3 TO 7 MINUTES TOTAL) TMAX


Figure 16. Typical Solder Heating Profile

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#$%& '(
   
N–Channel SO–8, Dual
These miniature surface mount MOSFETs feature ultra low RDS(on)
and true logic level performance. They are capable of withstanding
high energy in the avalanche and commutation modes and the http://onsemi.com
drain–to–source diode has a low reverse recovery time. MiniMOSt
devices are designed for use in low voltage, high speed switching 2 AMPERES
applications where power efficiency is important. Typical applications 25 VOLTS
are dc–dc converters, and power management in portable and battery
powered products such as computers, printers, cellular and cordless RDS(on) = 100 m
phones. They can also be used for low voltage motor controls in mass
storage products such as disk drives and tape drives. The avalanche N–Channel
energy is specified to eliminate the guesswork in designs where 
inductive loads are switched and offer additional safety margin against
unexpected voltage transients.
• Ultra Low RDS(on) Provides Higher Efficiency and Extends Battery
Life 
• Logic Level Gate Drive – Can Be Driven by Logic ICs
• Miniature SO–8 Surface Mount Package – Saves Board Space 

• Diode Is Characterized for Use In Bridge Circuits


• IDSS Specified at Elevated Temperatures MARKING
• Avalanche Energy Specified DIAGRAM
• Mounting Information for SO–8 Package Provided
SO–8, Dual
MAXIMUM RATINGS (TJ = 25°C unless otherwise noted) CASE 751 F2N02
8 LYWW
Rating Symbol Value Unit STYLE 11
Drain–to–Source Voltage VDSS 25 Vdc 1
Gate–to–Source Voltage – Continuous VGS ± 20 Vdc
F2N02 = Device Code
Drain Current – Continuous @ TA = 25°C ID 3.6 Adc
L = Location Code
Drain Current – Continuous @ TA = 100°C ID 2.5
Y = Year
Drain Current – Single Pulse (tp ≤ 10 µs) IDM 18 Apk
WW = Work Week
Total Power Dissipation @ TA = 25°C PD 2.0 W
(Note 1.)
Operating and Storage Temperature Range TJ, Tstg –55 to °C PIN ASSIGNMENT
150
Single Pulse Drain–to–Source Avalanche EAS mJ Source–1 1 8 Drain–1
Energy – Starting TJ = 25°C 245 Gate–1 2 7 Drain–1
(VDD = 20 Vdc, VGS = 10 Vdc, Peak Source–2 3 6 Drain–2
IL = 9.0 Apk, L = 6.0 mH, RG = 25 Ω)
Gate–2 4 5 Drain–2
Thermal Resistance, Junction to Ambient RθJA 62.5 °C/W
(Note 1.) Top View
Maximum Lead Temperature for Soldering TL 260 °C
Purposes, 0.0625″ from case for 10
ORDERING INFORMATION
seconds
1. Mounted on 2″ square FR4 board (1″ sq. 2 oz. Cu 0.06″ thick single sided) with Device Package Shipping
one die operating, 10 sec. max.
MMDF2N02ER2 SO–8 2500 Tape & Reel

 Semiconductor Components Industries, LLC, 2000 451 Publication Order Number:


November, 2000 – Rev. 6 MMDFN02E/D
MMDF2N02E

ELECTRICAL CHARACTERISTICS (TA = 25°C unless otherwise noted)


Characteristic Symbol Min Typ Max Unit
OFF CHARACTERISTICS
Drain–to–Source Breakdown Voltage V(BR)DSS Vdc
(VGS = 0 Vdc, ID = 250 µAdc) 25 – –

Zero Gate Voltage Drain Current IDSS µAdc


(VDS = 20 Vdc, VGS = 0 Vdc) – – 1.0
(VDS = 20 Vdc, VGS = 0 Vdc, TJ = 125°C) – – 10
Gate–Body Leakage Current (VGS = ± 20 Vdc, VDS = 0) IGSS – – 100 nAdc
ON CHARACTERISTICS (Note 2.)
Gate Threshold Voltage VGS(th) Vdc
(VDS = VGS, ID = 250 µAdc 1.0 2.0 3.0

Static Drain–to–Source On–Resistance RDS(on) Ohm


(VGS = 10 Vdc, ID = 2.2 Adc) – 0.083 0.100
(VGS = 4.5 Vdc, ID = 1.0 Adc) – 0.110 0.200
Forward Transconductance (VDS = 3.0 Vdc, ID = 1.0 Adc) gFS 1.0 2.6 – Mhos
DYNAMIC CHARACTERISTICS
Input Capacitance Ciss – 380 532 pF
Output Capacitance (VDS = 16 Vd
Vdc, VGS = 0 Vd
Vdc,
Coss – 235 329
f = 1.0 MHz)
Transfer Capacitance Crss – 55 110
SWITCHING CHARACTERISTICS (Note 3.)
Turn–On Delay Time td(on) – 7.0 21 ns
Rise Time (VDD = 10 Vdc, ID = 2.0 Adc, tr – 17 30
VGS = 10 Vdc
Vdc,
Turn–Off Delay Time RG = 6.0 Ω) td(off) – 27 48
Fall Time tf – 18 30
Turn–On Delay Time td(on) – 10 30
Rise Time (VDD = 10 Vdc, ID = 2.0 Adc, tr – 35 70
VGS = 4
4.55 Vdc
Vdc,
Turn–Off Delay Time RG = 9.1 Ω) td(off) – 19 38
Fall Time tf – 25 50
Gate Charge QT – 10.6 30 nC

(VDS = 16 Vdc, ID = 2.0 Adc, Q1 – 1.3 –


VGS = 10 Vdc) Q2 – 2.9 –
Q3 – 2.7 –
SOURCE–DRAIN DIODE CHARACTERISTICS
Forward On–Voltage (Note 2.) (IS = 2.0 Adc, VGS = 0 Vdc) VSD – 1.0 1.4 Vdc
Reverse Recovery Time trr – 34 66 ns
S Fi
See Figure 11
(IS = 2.0 Adc, VGS = 0 Vdc, ta – 17 –
dIS/dt = 100 A/µs) tb – 17 –
Reverse Recovery Storage Charge QRR – 0.03 – µC
2. Pulse Test: Pulse Width ≤ 300 µs, Duty Cycle ≤ 2%.
3. Switching characteristics are independent of operating junction temperature.

http://onsemi.com
452
MMDF2N02E

TYPICAL ELECTRICAL CHARACTERISTICS

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Temperature versus Voltage

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POWER MOSFET SWITCHING

Switching behavior is most easily modeled and predicted During the turn–on and turn–off delay times, gate current is
by recognizing that the power MOSFET is charge not constant. The simplest calculation uses appropriate
controlled. The lengths of various switching intervals (∆t) values from the capacitance curves in a standard equation for
are determined by how fast the FET input capacitance can voltage change in an RC network. The equations are:
be charged by current from the generator. td(on) = RG Ciss In [VGG/(VGG – VGSP)]
The published capacitance data is difficult to use for td(off) = RG Ciss In (VGG/VGSP)
calculating rise and fall because drain–gate capacitance
varies greatly with applied voltage. Accordingly, gate The capacitance (Ciss) is read from the capacitance curve at
charge data is used. In most cases, a satisfactory estimate of a voltage corresponding to the off–state condition when
average input current (IG(AV)) can be made from a calculating td(on) and is read at a voltage corresponding to the
rudimentary analysis of the drive circuit so that on–state when calculating td(off).
At high switching speeds, parasitic circuit elements
t = Q/IG(AV) complicate the analysis. The inductance of the MOSFET
During the rise and fall time interval when switching a source lead, inside the package and in the circuit wiring
resistive load, VGS remains virtually constant at a level which is common to both the drain and gate current paths,
known as the plateau voltage, VSGP. Therefore, rise and fall produces a voltage at the source which reduces the gate drive
times may be approximated by the following: current. The voltage is determined by Ldi/dt, but since di/dt
tr = Q2 x RG/(VGG – VGSP) is a function of drain current, the mathematical solution is
tf = Q2 x RG/VGSP complex. The MOSFET output capacitance also
complicates the mathematics. And finally, MOSFETs have
where finite internal gate resistance which effectively adds to the
VGG = the gate drive voltage, which varies from zero to VGG resistance of the driving source, but the internal resistance
RG = the gate drive resistance is difficult to measure and, consequently, is not specified.
and Q2 and VGSP are read from the gate charge curve.

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Figure 7. Capacitance Variation Drain–to–Source Voltage versus Total Charge

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Figure 11. Reverse Recovery Time (trr)

SAFE OPERATING AREA

The Forward Biased Safe Operating Area curves define reliable operation, the stored energy from circuit inductance
the maximum simultaneous drain–to–source voltage and dissipated in the transistor while in avalanche must be less
drain current that a transistor can handle safely when it is than the rated limit and must be adjusted for operating
forward biased. Curves are based upon maximum peak conditions differing from those specified. Although industry
junction temperature and a case temperature (TC) of 25°C. practice is to rate in terms of energy, avalanche energy
Peak repetitive pulsed power limits are determined by using capability is not a constant. The energy rating decreases
the thermal response data in conjunction with the procedures non–linearly with an increase of peak current in avalanche
discussed in AN569, “Transient Thermal Resistance – and peak junction temperature.
General Data and Its Use.” Although many E–FETs can withstand the stress of
Switching between the off–state and the on–state may drain–to–source avalanche at currents up to rated pulsed
traverse any load line provided neither rated peak current current (IDM), the energy rating is specified at rated
(IDM) nor rated voltage (VDSS) is exceeded, and that the continuous current (ID), in accordance with industry
transition time (tr, tf) does not exceed 10 µs. In addition the custom. The energy rating must be derated for temperature
total power averaged over a complete switching cycle must as shown in the accompanying graph (Figure 13). Maximum
not exceed (TJ(MAX) – TC)/(RθJC). energy at currents below rated continuous ID can safely be
A power MOSFET designated E–FET can be safely used assumed to equal the values indicated.
in switching circuits with unclamped inductive loads. For

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Safe Operating Area Starting Junction Temperature

TYPICAL ELECTRICAL CHARACTERISTICS



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INFORMATION FOR USING THE SO–8 SURFACE MOUNT PACKAGE

MINIMUM RECOMMENDED FOOTPRINT FOR SURFACE MOUNTED APPLICATIONS


Surface mount board layout is a critical portion of the interface between the board and the package. With the
total design. The footprint for the semiconductor packages correct pad geometry, the packages will self–align when
must be the correct size to insure proper solder connection subjected to a solder reflow process.
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SO–8 POWER DISSIPATION


The power dissipation of the SO–8 is a function of the into the equation for an ambient temperature TA of 25°C,
input pad size. These can vary from the minimum pad size one can calculate the power dissipation of the device which
for soldering to the pad size given for maximum power in this case is 2.0 Watts.
dissipation. Power dissipation for a surface mount device is 150°C – 25°C
determined by TJ(max), the maximum rated junction PD = = 2.0 Watts
62.5°C/W
temperature of the die, RθJA, the thermal resistance from
the device junction to ambient; and the operating The 62.5°C/W for the SO–8 package assumes the
temperature, TA. Using the values provided on the data recommended footprint on a glass epoxy printed circuit
sheet for the SO–8 package, PD can be calculated as board to achieve a power dissipation of 2.0 Watts using the
follows: footprint shown. Another alternative would be to use a
TJ(max) – TA
ceramic substrate or an aluminum core board such as
PD = Thermal Cladt. Using board material such as Thermal
RθJA
Clad, the power dissipation can be doubled using the same
The values for the equation are found in the maximum footprint.
ratings table on the data sheet. Substituting these values

SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • The soldering temperature and time shall not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within a • When shifting from preheating to soldering, the
short time could result in device failure. Therefore, the maximum temperature gradient shall be 5°C or less.
following items should always be observed in order to
• After soldering has been completed, the device should
minimize the thermal stress to which the devices are
subjected.
be allowed to cool naturally for at least three minutes.
• Always preheat the device. Gradual cooling should be used as the use of forced
• The delta temperature between the preheat and cooling will increase the temperature gradient and
soldering should be 100°C or less.* result in latent failure due to mechanical stress.
• When preheating and soldering, the temperature of the • Mechanical stress or shock should not be applied
leads and the case must not exceed the maximum during cooling
temperature ratings as shown on the data sheet. When
using infrared heating with the reflow soldering * Soldering a device without preheating can cause
method, the difference shall be a maximum of 10°C. excessive thermal shock and stress which can result in
damage to the device.

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457
MMDF2N02E

TYPICAL SOLDER HEATING PROFILE


For any given circuit board, there will be a group of temperature versus time. The line on the graph shows the
control settings that will give the desired heat pattern. The actual temperature that might be experienced on the surface
operator must set temperatures for several heating zones of a test board at or near a central solder joint. The two
and a figure for belt speed. Taken together, these control profiles are based on a high density and a low density
settings make up a heating “profile” for that particular board. The Vitronics SMD310 convection/infrared reflow
circuit board. On machines controlled by a computer, the soldering system was used to generate this profile. The type
computer remembers these profiles from one operating of solder used was 62/36/2 Tin Lead Silver with a melting
session to the next. Figure 12 shows a typical heating point between 177–189°C. When this type of furnace is
profile for use when soldering a surface mount device to a used for solder reflow work, the circuit boards and solder
printed circuit board. This profile will vary among joints tend to heat first. The components on the board are
soldering systems, but it is a good starting point. Factors then heated by conduction. The circuit board, because it has
that can affect the profile include the type of soldering a large surface area, absorbs the thermal energy more
system in use, density and types of components on the efficiently, then distributes this energy to the components.
board, type of solder used, and the type of board or Because of this effect, the main body of a component may
substrate material being used. This profile shows be up to 30 degrees cooler than the adjacent solder joints.

STEP 1 STEP 2 STEP 3 STEP 4 STEP 5 STEP 6 STEP 7


PREHEAT VENT HEATING HEATING HEATING VENT COOLING
ZONE 1 “SOAK” ZONES 2 & 5 ZONES 3 & 6 ZONES 4 & 7
“RAMP” “RAMP” “SOAK” “SPIKE” 205° TO 219°C
PEAK AT
200°C DESIRED CURVE FOR HIGH 170°C SOLDER
MASS ASSEMBLIES JOINT
160°C
150°C

150°C
SOLDER IS LIQUID FOR
40 TO 80 SECONDS
100°C 140°C (DEPENDING ON
MASS OF ASSEMBLY)
100°C

DESIRED CURVE FOR LOW


MASS ASSEMBLIES
5°C

TIME (3 TO 7 MINUTES TOTAL) TMAX


Figure 16. Typical Solder Heating Profile

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458
( 8
Preferred Device

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N–Channel SO–8, Dual
EZFETst are an advanced series of power MOSFETs which
contain monolithic back–to–back zener diodes. These zener diodes
provide protection against ESD and unexpected transients. These http://onsemi.com
miniature surface mount MOSFETs feature ultra low RDS(on) and true
logic level performance. They are capable of withstanding high energy 2 AMPERES
in the avalanche and commutation modes and the drain–to–source 50 VOLTS
diode has a very low reverse recovery time. EZFET devices are
designed for use in low voltage, high speed switching applications
RDS(on) = 300 m
where power efficiency is important. Typical applications are dc–dc
converters, and power management in portable and battery powered N–Channel
products such as computers, printers, cellular and cordless phones. 
They can also be used for low voltage motor controls in mass storage
products such as disk drives and tape drives.
• Ultra Low RDS(on) Provides Higher Efficiency and Extends Battery

Life
• Logic Level Gate Drive – Can Be Driven by Logic ICs

• Miniature SO–8 Surface Mount Package – Saves Board Space
• Diode Is Characterized for Use In Bridge Circuits
• Diode Exhibits High Speed, With Soft Recovery
MARKING
DIAGRAM
• IDSS Specified at Elevated Temperature
• Mounting Information for SO–8 Package Provided
SO–8, Dual
F2N05Z
MAXIMUM RATINGS (TJ = 25°C unless otherwise noted) 8 CASE 751
LYWW
STYLE 11
Rating Symbol Value Unit
1
Drain–to–Source Voltage VDSS 50 Vdc
Drain–to–Gate Voltage (RGS = 1.0 MΩ) VDGR 50 Vdc F2N05Z = Device Code
Gate–to–Source Voltage – Continuous VGS ± 15 Vdc L = Location Code
Y = Year
Drain Current – Continuous @ TA = 25°C ID 2.0 Adc
WW = Work Week
Drain Current – Continuous @ TA = 70°C ID 1.7
Drain Current – Single Pulse (tp ≤ 10 µs) IDM 8.0 Apk
Total Power Dissipation @ TA = 25°C PD 2.0 Watts PIN ASSIGNMENT
(Note 1.)
Operating and Storage Temperature Range TJ, Tstg – 55 to °C Source–1 1 8 Drain–1
150 Gate–1 2 7 Drain–1
Thermal Resistance – Junction to Ambient RθJA 62.5 °C/W Source–2 3 6 Drain–2
Maximum Temperature for Soldering TL 260 °C
Gate–2 4 5 Drain–2
Purposes
Top View
1. When mounted on G10/FR–4 glass epoxy board using minimum
recommended footprint.
ORDERING INFORMATION

Device Package Shipping

MMDF2N05ZR2 SO–8 2500 Tape & Reel

Preferred devices are recommended choices for future use


and best overall value.

 Semiconductor Components Industries, LLC, 2000 459 Publication Order Number:


November, 2000 – Rev. 2 MMDF2N05ZR2/D
MMDF2N05ZR2

ELECTRICAL CHARACTERISTICS (TA = 25°C unless otherwise noted)


Characteristic Symbol Min Typ Max Unit
OFF CHARACTERISTICS
Drain–to–Source Breakdown Voltage (Cpk ≥ 2.0) (Note 4.) V(BR)DSS Vdc
(VGS = 0 Vdc, ID = 0.25 mAdc) 50 56 –
Temperature Coefficient (Positive) – 55 – mV/°C
Zero Gate Voltage Drain Current IDSS µAdc
(VDS = 15 Vdc, VGS = 0 Vdc) – – 2.0
(VDS = 15 Vdc, VGS = 0 Vdc, TJ = 55°C) – – 25
Gate–Body Leakage Current (VGS = ± 15 Vdc, VDS = 0) IGSS – 0.14 0.5
ON CHARACTERISTICS (Note 2.)
Gate Threshold Voltage (Cpk ≥ 2.0) (Note 4.) VGS(th) Vdc
(VDS = VGS, ID = 0.25 mAdc) 2.0 3.0 4.0
Threshold Temperature Coefficient (Negative) – –5.0 – mV/°C
Static Drain–to–Source On–Resistance (Cpk ≥ 2.0) (Note 4.) RDS(on) mΩ
(VGS = 10 Vdc, ID = 1.5 Adc) – 200 300
(VGS = 5.0 Vdc, ID = 0.6 Adc) – 350 500
Forward Transconductance gFS mMhos
(VDS = 15 Vdc, ID = 2.5 Adc) – 2.0 –

DYNAMIC CHARACTERISTICS
Input Capacitance Ciss – 104 – pF
Output Capacitance (VDS = 15 Vd
Vdc, VGS = 0 Vd
Vdc,
Coss – 58 –
f = 1.0 MHz)
Transfer Capacitance Crss – 16 –
SWITCHING CHARACTERISTICS (Note 3.)
Turn–On Delay Time td(on) – 24 48 ns
Rise Time (VDD = 30 Vdc, ID = 0.6 Adc, tr – 46 92
VGS = 10 Vdc
Vdc,
Turn–Off Delay Time RG = 25 Ω) td(off) – 130 260
Fall Time tf – 71 142
Gate Charge QT – 3.3 4.6 nC
(
(see fifigure 8)
(VDS = 25 Vdc, ID = 1.3 Adc, Q1 – 0.7 –
VGS = 10 Vdc) Q2 – 1.3 –
Q3 – 1.4 –

SOURCE–DRAIN DIODE CHARACTERISTICS


Forward On–Voltage VSD Vdc
(IS = 2.0 Adc, VGS = 0 Vdc)
– 0.82 1.4
Reverse Recovery Time trr – 66 – ns
(IS = 2.0
2 0 Adc,
Ad VGS = 0 Vdc,
Vd
ta – 23 –
dIS/dt = 100 A/µs)
tb – 43 –
Reverse Recovery Storage Charge QRR – 0.08 – µC
2. Pulse Test: Pulse Width ≤ 300 µs, Duty Cycle ≤ 2%.
3. Switching characteristics are independent of operating junction temperature.
4. Reflects typical values. Max limit – Typ
Cpk =
3 x SIGMA

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460
MMDF2N05ZR2

TYPICAL ELECTRICAL CHARACTERISTICS

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Figure 3. On–Resistance versus Figure 4. On–Resistance versus Drain Current


Gate–to–Source Voltage and Gate Voltage

 


   
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Figure 5. On–Resistance Variation Figure 6. Drain–to–Source Leakage Current


with Temperature versus Voltage

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461
MMDF2N05ZR2

POWER MOSFET SWITCHING

Switching behavior is most easily modeled and predicted The capacitance (Ciss) is read from the capacitance curve at
by recognizing that the power MOSFET is charge a voltage corresponding to the off–state condition when
controlled. The lengths of various switching intervals (∆t) calculating td(on) and is read at a voltage corresponding to the
are determined by how fast the FET input capacitance can on–state when calculating td(off).
be charged by current from the generator. At high switching speeds, parasitic circuit elements
The published capacitance data is difficult to use for complicate the analysis. The inductance of the MOSFET
calculating rise and fall because drain–gate capacitance source lead, inside the package and in the circuit wiring
varies greatly with applied voltage. Accordingly, gate which is common to both the drain and gate current paths,
charge data is used. In most cases, a satisfactory estimate of produces a voltage at the source which reduces the gate drive
average input current (IG(AV)) can be made from a current. The voltage is determined by Ldi/dt, but since di/dt
rudimentary analysis of the drive circuit so that is a function of drain current, the mathematical solution is
t = Q/IG(AV) complex. The MOSFET output capacitance also
complicates the mathematics. And finally, MOSFETs have
During the rise and fall time interval when switching a finite internal gate resistance which effectively adds to the
resistive load, VGS remains virtually constant at a level resistance of the driving source, but the internal resistance
known as the plateau voltage, VSGP. Therefore, rise and fall is difficult to measure and, consequently, is not specified.
times may be approximated by the following: The resistive switching time variation versus gate
tr = Q2 x RG/(VGG – VGSP) resistance (Figure 9) shows how typical switching
tf = Q2 x RG/VGSP performance is affected by the parasitic circuit elements. If
where the parasitics were not present, the slope of the curves would
maintain a value of unity regardless of the switching speed.
VGG = the gate drive voltage, which varies from zero to VGG
The circuit used to obtain the data is constructed to minimize
RG = the gate drive resistance
common inductance in the drain and gate circuit loops and
and Q2 and VGSP are read from the gate charge curve.
is believed readily achievable with board mounted
During the turn–on and turn–off delay times, gate current is components. Most power electronic loads are inductive; the
not constant. The simplest calculation uses appropriate data in the figure is taken with a resistive load, which
values from the capacitance curves in a standard equation for approximates an optimally snubbed inductive load. Power
voltage change in an RC network. The equations are: MOSFETs may be safely operated into an inductive load;
td(on) = RG Ciss In [VGG/(VGG – VGSP)] however, snubbing reduces switching losses.
td(off) = RG Ciss In (VGG/VGSP)

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Figure 8. Gate–To–Source and Drain–To–Source Figure 9. Resistive Switching Time


Voltage versus Total Charge Variation versus Gate Resistance

DRAIN–TO–SOURCE DIODE CHARACTERISTICS

The switching characteristics of a MOSFET body diode high di/dts. The diode’s negative di/dt during ta is directly
are very important in systems using it as a freewheeling or controlled by the device clearing the stored charge.
commutating diode. Of particular interest are the reverse However, the positive di/dt during tb is an uncontrollable
recovery characteristics which play a major role in diode characteristic and is usually the culprit that induces
determining switching losses, radiated noise, EMI and RFI. current ringing. Therefore, when comparing diodes, the
System switching losses are largely due to the nature of ratio of tb/ta serves as a good indicator of recovery
the body diode itself. The body diode is a minority carrier abruptness and thus gives a comparative estimate of
device, therefore it has a finite reverse recovery time, trr, due probable noise generated. A ratio of 1 is considered ideal and
to the storage of minority carrier charge, QRR, as shown in values less than 0.5 are considered snappy.
the typical reverse recovery wave form of Figure 11. It is this Compared to ON Semiconductor standard cell density
stored charge that, when cleared from the diode, passes low voltage MOSFETs, high cell density MOSFET diodes
through a potential and defines an energy loss. Obviously, are faster (shorter trr), have less stored charge and a softer
repeatedly forcing the diode through reverse recovery reverse recovery characteristic. The softness advantage of
further increases switching losses. Therefore, one would the high cell density diode means they can be forced through
like a diode with short trr and low QRR specifications to reverse recovery at a higher di/dt than a standard cell
minimize these losses. MOSFET diode without increasing the current ringing or the
The abruptness of diode reverse recovery effects the noise generated. In addition, power dissipation incurred
amount of radiated noise, voltage spikes, and current from switching the diode will be less due to the shorter
ringing. The mechanisms at work are finite irremovable recovery time and lower switching losses.
circuit parasitic inductances and capacitances acted upon by
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Figure 11. Reverse Recovery Time (trr)

SAFE OPERATING AREA

The Forward Biased Safe Operating Area curves define total power averaged over a complete switching cycle must
the maximum simultaneous drain–to–source voltage and not exceed (TJ(MAX) – TC)/(RθJC).
drain current that a transistor can handle safely when it is A power MOSFET designated E–FET can be safely used
forward biased. Curves are based upon maximum peak in switching circuits with unclamped inductive loads. For
junction temperature and a case temperature (TC) of 25°C. reliable operation, the stored energy from circuit inductance
Peak repetitive pulsed power limits are determined by using dissipated in the transistor while in avalanche must be less
the thermal response data in conjunction with the procedures than the rated limit and must be adjusted for operating
discussed in AN569, “Transient Thermal Resistance – conditions differing from those specified. Although industry
General Data and Its Use.” practice is to rate in terms of energy, avalanche energy
Switching between the off–state and the on–state may capability is not a constant. The energy rating decreases
traverse any load line provided neither rated peak current non–linearly with an increase of peak current in avalanche
(IDM) nor rated voltage (VDSS) is exceeded, and that the and peak junction temperature.
transition time (tr, tf) does not exceed 10 µs. In addition the


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Figure 12. Maximum Rated Forward Biased


Safe Operating Area

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TYPICAL ELECTRICAL CHARACTERISTICS

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Figure 13. Thermal Response

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Figure 14. Diode Reverse Recovery Waveform

http://onsemi.com
465
MMDF2N05ZR2

INFORMATION FOR USING THE SO–8 SURFACE MOUNT PACKAGE

MINIMUM RECOMMENDED FOOTPRINT FOR SURFACE MOUNTED APPLICATIONS


Surface mount board layout is a critical portion of the total interface between the board and the package. With the
design. The footprint for the semiconductor packages must correct pad geometry, the packages will self–align when
be the correct size to ensure proper solder connection subjected to a solder reflow process.

9
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#6 $
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inches
mm

SO–8 POWER DISSIPATION


The power dissipation of the SO–8 is a function of the into the equation for an ambient temperature TA of 25°C,
input pad size. This can vary from the minimum pad size one can calculate the power dissipation of the device which
for soldering to the pad size given for maximum power in this case is 2.0 Watts.
dissipation. Power dissipation for a surface mount device is
PD = 150°C – 25°C = 2.0 Watts
determined by TJ(max), the maximum rated junction 62.5°C/W
temperature of the die, RθJA, the thermal resistance from
the device junction to ambient; and the operating The 62.5°C/W for the SO–8 package assumes the
temperature, TA. Using the values provided on the data recommended footprint on a glass epoxy printed circuit
sheet for the SO–8 package, PD can be calculated as board to achieve a power dissipation of 2.0 Watts using the
follows: footprint shown. Another alternative would be to use a
TJ(max) – TA
ceramic substrate or an aluminum core board such as
PD = Thermal Cladt. Using board material such as Thermal
RθJA
Clad, the power dissipation can be doubled using the same
The values for the equation are found in the maximum footprint.
ratings table on the data sheet. Substituting these values

SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • The soldering temperature and time shall not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within • When shifting from preheating to soldering, the
a short time could result in device failure. Therefore, the maximum temperature gradient shall be 5°C or less.
following items should always be observed in order to • After soldering has been completed, the device should
minimize the thermal stress to which the devices are be allowed to cool naturally for at least three minutes.
subjected. Gradual cooling should be used as the use of forced
• Always preheat the device. cooling will increase the temperature gradient and
• The delta temperature between the preheat and result in latent failure due to mechanical stress.
soldering should be 100°C or less.* • Mechanical stress or shock should not be applied
• When preheating and soldering, the temperature of the during cooling.
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When * Soldering a device without preheating can cause
using infrared heating with the reflow soldering excessive thermal shock and stress which can result in
method, the difference shall be a maximum of 10°C. damage to the device.

http://onsemi.com
466
MMDF2N05ZR2

TYPICAL SOLDER HEATING PROFILE


For any given circuit board, there will be a group of temperature versus time. The line on the graph shows the
control settings that will give the desired heat pattern. The actual temperature that might be experienced on the surface
operator must set temperatures for several heating zones of a test board at or near a central solder joint. The two
and a figure for belt speed. Taken together, these control profiles are based on a high density and a low density
settings make up a heating “profile” for that particular board. The Vitronics SMD310 convection/infrared reflow
circuit board. On machines controlled by a computer, the soldering system was used to generate this profile. The type
computer remembers these profiles from one operating of solder used was 62/36/2 Tin Lead Silver with a melting
session to the next. Figure 12 shows a typical heating point between 177–189°C. When this type of furnace is
profile for use when soldering a surface mount device to a used for solder reflow work, the circuit boards and solder
printed circuit board. This profile will vary among joints tend to heat first. The components on the board are
soldering systems, but it is a good starting point. Factors then heated by conduction. The circuit board, because it has
that can affect the profile include the type of soldering a large surface area, absorbs the thermal energy more
system in use, density and types of components on the efficiently, then distributes this energy to the components.
board, type of solder used, and the type of board or Because of this effect, the main body of a component may
substrate material being used. This profile shows be up to 30 degrees cooler than the adjacent solder joints.

STEP 1 STEP 2 STEP 3 STEP 4 STEP 5 STEP 6 STEP 7


PREHEAT VENT HEATING HEATING HEATING VENT COOLING
ZONE 1 “SOAK” ZONES 2 & 5 ZONES 3 & 6 ZONES 4 & 7
“RAMP” “RAMP” “SOAK” “SPIKE” 205° TO 219°C
PEAK AT
200°C DESIRED CURVE FOR HIGH 170°C SOLDER
MASS ASSEMBLIES JOINT
160°C
150°C

150°C
SOLDER IS LIQUID FOR
40 TO 80 SECONDS
100°C 140°C (DEPENDING ON
MASS OF ASSEMBLY)
100°C

DESIRED CURVE FOR LOW


MASS ASSEMBLIES
5°C

TIME (3 TO 7 MINUTES TOTAL) TMAX


Figure 15. Typical Solder Heating Profile

http://onsemi.com
467
( #.
Preferred Device

#$%& '(
   
P–Channel SO–8, Dual
These miniature surface mount MOSFETs feature ultra low RDS(on)
and true logic level performance. They are capable of withstanding
high energy in the avalanche and commutation modes and the http://onsemi.com
drain–to–source diode has a very low reverse recovery time.
MiniMOSt devices are designed for use in low voltage, high speed 2 AMPERES
switching applications where power efficiency is important. Typical 12 VOLTS
applications are dc–dc converters, and power management in portable
and battery powered products such as computers, printers, cellular and RDS(on) = 180 m
cordless phones. They can also be used for low voltage motor controls
in mass storage products such as disk drives and tape drives. P–Channel
• Ultra Low RDS(on) Provides Higher Efficiency and Extends Battery 
Life
• Logic Level Gate Drive – Can Be Driven by Logic ICs
• Miniature SO–8 Surface Mount Package – Saves Board Space 
• Diode Is Characterized for Use In Bridge Circuits
• Diode Exhibits High Speed, With Soft Recovery 
• IDSS Specified at Elevated Temperature
• Mounting Information for SO–8 Package Provided
MARKING
DIAGRAM

MAXIMUM RATINGS (TJ = 25°C unless otherwise noted) (Note 1.) SO–8, Dual
CASE 751 D2P01
Rating Symbol Value Unit
8 LYWW
STYLE 11
Drain–to–Source Voltage VDSS 12 Vdc
Drain–to–Gate Voltage (RGS = 1.0 MΩ) VDGR 12 Vdc 1
Gate–to–Source Voltage – Continuous VGS ± 8.0 Vdc
D2P01 = Device Code
Drain Current – Continuous @ TA = 25°C ID 3.4 Adc L = Location Code
Drain Current – Continuous @ TA = 100°C ID 2.1 Y = Year
Drain Current – Single Pulse (tp ≤ 10 µs) IDM 17 Apk WW = Work Week
Total Power Dissipation @ TA = 25°C PD 2.0 Watts
(Note 2.)
PIN ASSIGNMENT
Operating and Storage Temperature Range – 55 to 150 °C
Thermal Resistance – Junction to Ambient RθJA 62.5 °C/W Source–1 1 8 Drain–1
(Note 2.) Gate–1 2 7 Drain–1
Maximum Lead Temperature for Soldering TL 260 °C Source–2 3 6 Drain–2
Purposes, 1/8″ from case for 10 seconds
Gate–2 4 5 Drain–2
1. Negative sign for P–Channel device omitted for clarity.
Top View
2. Mounted on 2″ square FR4 board (1″ sq. 2 oz. Cu 0.06″ thick single sided) with
one die operating, 10 sec. max.
ORDERING INFORMATION

Device Package Shipping

MMDF2P01HDR2 SO–8 2500 Tape & Reel

Preferred devices are recommended choices for future use


and best overall value.

 Semiconductor Components Industries, LLC, 2000 468 Publication Order Number:


November, 2000 – Rev. 6 MMDF2P01HD/D
MMDF2P01HD

ELECTRICAL CHARACTERISTICS (TC = 25°C unless otherwise noted) (Note 3.)


Characteristic Symbol Min Typ Max Unit
OFF CHARACTERISTICS
Drain–Source Breakdown Voltage V(BR)DSS Vdc
(VGS = 0 Vdc, ID = 250 µAdc) 12 – –
Temperature Coefficient (Positive) – 17 – mV/°C
Zero Gate Voltage Drain Current IDSS µAdc
(VDS = 12 Vdc, VGS = 0 Vdc) – – 1.0
(VDS = 12 Vdc, VGS = 0 Vdc, TJ = 125°C) – – 10
Gate–Body Leakage Current (VGS = ± 8.0 Vdc, VDS = 0) IGSS – – 100 nAdc
ON CHARACTERISTICS (Note 4.)
Gate Threshold Voltage VGS(th) Vdc
(VDS = VGS, ID = 250 µAdc) 0.7 1.0 1.1
Temperature Coefficient (Negative) – 3.0 – mV/°C
Static Drain–to–Source On–Resistance RDS(on) Ohm
(VGS = 4.5 Vdc, ID = 2.0 Adc) – 0.16 0.180
(VGS = 2.7 Vdc, ID = 1.0 Adc) – 0.2 0.220
Forward Transconductance (VDS = 2.5 Vdc, ID = 1.0 Adc) gFS 3.0 4.75 – mhos
DYNAMIC CHARACTERISTICS
Input Capacitance Ciss – 530 740 pF
Output Capacitance (VDS = 10 Vd
Vdc, VGS = 0 Vd
Vdc,
Coss – 410 570
f = 1.0 MHz)
Reverse Transfer Capacitance Crss – 177 250
SWITCHING CHARACTERISTICS (Note 5.)
Turn–On Delay Time td(on) – 21 45 ns
Rise Time (VDD = 6.0 Vdc, ID = 2.0 Adc, tr – 156 315
VGS = 22.7
7 Vdc
Vdc,
Turn–Off Delay Time RG = 6.0 Ω) td(off) – 38 75
Fall Time tf – 68 135
Turn–On Delay Time td(on) – 16 35
Rise Time (VDS = 6.0 Vdc, ID = 2.0 Adc, tr – 44 90
VGS = 44.5
5 Vdc
Vdc,
Turn–Off Delay Time RG = 6.0 Ω) td(off) – 68 135
Fall Time tf – 54 110
Gate Charge QT – 9.3 13 nC

(VDS = 10 Vdc, ID = 2.0 Adc, Q1 – 0.8 –


VGS = 4.5 Vdc) Q2 – 4.0 –
Q3 – 3.0 –

SOURCE–DRAIN DIODE CHARACTERISTICS


Forward On–Voltage (Note 4.) VSD Vdc
(IS = 2.0 Adc, VGS = 0 Vdc)
– 1.69 2.0
(IS = 2.0 Adc, VGS = 0 Vdc, TJ = 125°C)
– 1.2 –
Reverse Recovery Time trr – 48 – ns

(IS = 2.0 Adc, VGS = 0 Vdc, ta – 23 –


dIS/dt = 100 A/µs) tb – 25 –
Reverse Recovery Stored Charge QRR – 0.05 – µC
3. Negative sign for P–Channel device omitted for clarity.
4. Pulse Test: Pulse Width ≤ 300 µs, Duty Cycle ≤ 2%.
5. Switching characteristics are independent of operating junction temperature.

http://onsemi.com
469
MMDF2P01HD

TYPICAL ELECTRICAL CHARACTERISTICS

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Figure 1. On–Region Characteristics Figure 2. Transfer Characteristics



 


  


 


  
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Figure 3. On–Resistance versus Figure 4. On–Resistance versus Drain Current


Gate–To–Source Voltage and Gate Voltage

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Figure 5. On–Resistance Variation with Figure 6. Drain–To–Source Leakage


Temperature Current versus Voltage

http://onsemi.com
470
MMDF2P01HD

POWER MOSFET SWITCHING

Switching behavior is most easily modeled and predicted The capacitance (Ciss) is read from the capacitance curve at
by recognizing that the power MOSFET is charge a voltage corresponding to the off–state condition when
controlled. The lengths of various switching intervals (∆t) calculating td(on) and is read at a voltage corresponding to the
are determined by how fast the FET input capacitance can on–state when calculating td(off).
be charged by current from the generator. At high switching speeds, parasitic circuit elements
The published capacitance data is difficult to use for complicate the analysis. The inductance of the MOSFET
calculating rise and fall because drain–gate capacitance source lead, inside the package and in the circuit wiring
varies greatly with applied voltage. Accordingly, gate which is common to both the drain and gate current paths,
charge data is used. In most cases, a satisfactory estimate of produces a voltage at the source which reduces the gate drive
average input current (IG(AV)) can be made from a current. The voltage is determined by Ldi/dt, but since di/dt
rudimentary analysis of the drive circuit so that is a function of drain current, the mathematical solution is
t = Q/IG(AV) complex. The MOSFET output capacitance also
complicates the mathematics. And finally, MOSFETs have
During the rise and fall time interval when switching a finite internal gate resistance which effectively adds to the
resistive load, VGS remains virtually constant at a level resistance of the driving source, but the internal resistance
known as the plateau voltage, VSGP. Therefore, rise and fall is difficult to measure and, consequently, is not specified.
times may be approximated by the following: The resistive switching time variation versus gate
tr = Q2 x RG/(VGG – VGSP) resistance (Figure 9) shows how typical switching
tf = Q2 x RG/VGSP performance is affected by the parasitic circuit elements. If
where the parasitics were not present, the slope of the curves would
maintain a value of unity regardless of the switching speed.
VGG = the gate drive voltage, which varies from zero to VGG
The circuit used to obtain the data is constructed to minimize
RG = the gate drive resistance
common inductance in the drain and gate circuit loops and
and Q2 and VGSP are read from the gate charge curve.
is believed readily achievable with board mounted
During the turn–on and turn–off delay times, gate current is components. Most power electronic loads are inductive; the
not constant. The simplest calculation uses appropriate data in the figure is taken with a resistive load, which
values from the capacitance curves in a standard equation for approximates an optimally snubbed inductive load. Power
voltage change in an RC network. The equations are: MOSFETs may be safely operated into an inductive load;
td(on) = RG Ciss In [VGG/(VGG – VGSP)] however, snubbing reduces switching losses.
td(off) = RG Ciss In (VGG/VGSP)

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Figure 7. Capacitance Variation

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Figure 8. Gate–To–Source and Drain–To–Source Figure 9. Resistive Switching Time


Voltage versus Total Charge Variation versus Gate Resistance

DRAIN–TO–SOURCE DIODE CHARACTERISTICS

The switching characteristics of a MOSFET body diode high di/dts. The diode’s negative di/dt during ta is directly
are very important in systems using it as a freewheeling or controlled by the device clearing the stored charge.
commutating diode. Of particular interest are the reverse However, the positive di/dt during tb is an uncontrollable
recovery characteristics which play a major role in diode characteristic and is usually the culprit that induces
determining switching losses, radiated noise, EMI and RFI. current ringing. Therefore, when comparing diodes, the
System switching losses are largely due to the nature of ratio of tb/ta serves as a good indicator of recovery
the body diode itself. The body diode is a minority carrier abruptness and thus gives a comparative estimate of
device, therefore it has a finite reverse recovery time, trr, due probable noise generated. A ratio of 1 is considered ideal and
to the storage of minority carrier charge, QRR, as shown in values less than 0.5 are considered snappy.
the typical reverse recovery wave form of Figure 14. It is this Compared to ON Semiconductor standard cell density
stored charge that, when cleared from the diode, passes low voltage MOSFETs, high cell density MOSFET diodes
through a potential and defines an energy loss. Obviously, are faster (shorter trr), have less stored charge and a softer
repeatedly forcing the diode through reverse recovery reverse recovery characteristic. The softness advantage of
further increases switching losses. Therefore, one would the high cell density diode means they can be forced through
like a diode with short trr and low QRR specifications to reverse recovery at a higher di/dt than a standard cell
minimize these losses. MOSFET diode without increasing the current ringing or the
The abruptness of diode reverse recovery effects the noise generated. In addition, power dissipation incurred
amount of radiated noise, voltage spikes, and current from switching the diode will be less due to the shorter
ringing. The mechanisms at work are finite irremovable recovery time and lower switching losses.
circuit parasitic inductances and capacitances acted upon by
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Figure 10. Diode Forward Voltage versus Current

http://onsemi.com
472
MMDF2P01HD

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Figure 11. Reverse Recovery Time (trr)

SAFE OPERATING AREA

The Forward Biased Safe Operating Area curves define total power averaged over a complete switching cycle must
the maximum simultaneous drain–to–source voltage and not exceed (TJ(MAX) – TC)/(RθJC).
drain current that a transistor can handle safely when it is A power MOSFET designated E–FET can be safely used
forward biased. Curves are based upon maximum peak in switching circuits with unclamped inductive loads. For
junction temperature and a case temperature (TC) of 25°C. reliable operation, the stored energy from circuit inductance
Peak repetitive pulsed power limits are determined by using dissipated in the transistor while in avalanche must be less
the thermal response data in conjunction with the procedures than the rated limit and must be adjusted for operating
discussed in AN569, “Transient Thermal Resistance – conditions differing from those specified. Although industry
General Data and Its Use.” practice is to rate in terms of energy, avalanche energy
Switching between the off–state and the on–state may capability is not a constant. The energy rating decreases
traverse any load line provided neither rated peak current non–linearly with an increase of peak current in avalanche
(IDM) nor rated voltage (VDSS) is exceeded, and that the and peak junction temperature.
transition time (tr, tf) does not exceed 10 µs. In addition the


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Figure 12. Maximum Rated Forward Biased


Safe Operating Area

http://onsemi.com
473
MMDF2P01HD

TYPICAL ELECTRICAL CHARACTERISTICS



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Figure 14. Diode Reverse Recovery Waveform

http://onsemi.com
474
MMDF2P01HD

INFORMATION FOR USING THE SO–8 SURFACE MOUNT PACKAGE

MINIMUM RECOMMENDED FOOTPRINT FOR SURFACE MOUNTED APPLICATIONS


Surface mount board layout is a critical portion of the total interface between the board and the package. With the
design. The footprint for the semiconductor packages must correct pad geometry, the packages will self–align when
be the correct size to ensure proper solder connection subjected to a solder reflow process.

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mm

SO–8 POWER DISSIPATION


The power dissipation of the SO–8 is a function of the into the equation for an ambient temperature TA of 25°C,
input pad size. This can vary from the minimum pad size one can calculate the power dissipation of the device which
for soldering to the pad size given for maximum power in this case is 2.0 Watts.
dissipation. Power dissipation for a surface mount device is 150°C – 25°C
determined by TJ(max), the maximum rated junction PD = = 2.0 Watts
62.5°C/W
temperature of the die, RθJA, the thermal resistance from
the device junction to ambient; and the operating The 62.5°C/W for the SO–8 package assumes the
temperature, TA. Using the values provided on the data recommended footprint on a glass epoxy printed circuit
sheet for the SO–8 package, PD can be calculated as board to achieve a power dissipation of 2.0 Watts using the
follows: footprint shown. Another alternative would be to use a
TJ(max) – TA
ceramic substrate or an aluminum core board such as
PD = Thermal Cladt. Using board material such as Thermal
RθJA
Clad, the power dissipation can be doubled using the same
The values for the equation are found in the maximum footprint.
ratings table on the data sheet. Substituting these values

SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • The soldering temperature and time shall not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within • When shifting from preheating to soldering, the
a short time could result in device failure. Therefore, the maximum temperature gradient shall be 5°C or less.
following items should always be observed in order to • After soldering has been completed, the device should
minimize the thermal stress to which the devices are be allowed to cool naturally for at least three minutes.
subjected. Gradual cooling should be used as the use of forced
• Always preheat the device. cooling will increase the temperature gradient and
• The delta temperature between the preheat and result in latent failure due to mechanical stress.
soldering should be 100°C or less.* • Mechanical stress or shock should not be applied
• When preheating and soldering, the temperature of the during cooling.
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When * Soldering a device without preheating can cause
using infrared heating with the reflow soldering excessive thermal shock and stress which can result in
method, the difference shall be a maximum of 10°C. damage to the device.

http://onsemi.com
475
MMDF2P01HD

TYPICAL SOLDER HEATING PROFILE


For any given circuit board, there will be a group of temperature versus time. The line on the graph shows the
control settings that will give the desired heat pattern. The actual temperature that might be experienced on the surface
operator must set temperatures for several heating zones of a test board at or near a central solder joint. The two
and a figure for belt speed. Taken together, these control profiles are based on a high density and a low density
settings make up a heating “profile” for that particular board. The Vitronics SMD310 convection/infrared reflow
circuit board. On machines controlled by a computer, the soldering system was used to generate this profile. The type
computer remembers these profiles from one operating of solder used was 62/36/2 Tin Lead Silver with a melting
session to the next. Figure 15 shows a typical heating point between 177–189°C. When this type of furnace is
profile for use when soldering a surface mount device to a used for solder reflow work, the circuit boards and solder
printed circuit board. This profile will vary among joints tend to heat first. The components on the board are
soldering systems, but it is a good starting point. Factors then heated by conduction. The circuit board, because it has
that can affect the profile include the type of soldering a large surface area, absorbs the thermal energy more
system in use, density and types of components on the efficiently, then distributes this energy to the components.
board, type of solder used, and the type of board or Because of this effect, the main body of a component may
substrate material being used. This profile shows be up to 30 degrees cooler than the adjacent solder joints.

STEP 1 STEP 2 STEP 3 STEP 4 STEP 5 STEP 6 STEP 7


PREHEAT VENT HEATING HEATING HEATING VENT COOLING
ZONE 1 “SOAK” ZONES 2 & 5 ZONES 3 & 6 ZONES 4 & 7
“RAMP” “RAMP” “SOAK” “SPIKE” 205° TO 219°C
PEAK AT
200°C DESIRED CURVE FOR HIGH 170°C SOLDER
MASS ASSEMBLIES JOINT
160°C
150°C

150°C
SOLDER IS LIQUID FOR
40 TO 80 SECONDS
100°C 140°C (DEPENDING ON
MASS OF ASSEMBLY)
100°C

DESIRED CURVE FOR LOW


MASS ASSEMBLIES
5°C

TIME (3 TO 7 MINUTES TOTAL) TMAX


Figure 15. Typical Solder Heating Profile

http://onsemi.com
476
( # 

#$%& '(
   
P–Channel SO–8, Dual
These miniature surface mount MOSFETs feature ultra low RDS(on)
and true logic level performance. They are capable of withstanding
high energy in the avalanche and commutation modes and the http://onsemi.com
drain–to–source diode has a low reverse recovery time. MiniMOSt
devices are designed for use in low voltage, high speed switching 2 AMPERES
applications where power efficiency is important. Typical applications 25 VOLTS
are dc–dc converters, and power management in portable and battery
powered products such as computers, printers, cellular and cordless RDS(on) = 250 m
phones. They can also be used for low voltage motor controls in mass
storage products such as disk drives and tape drives. The avalanche P–Channel
energy is specified to eliminate the guesswork in designs where 
inductive loads are switched and offer additional safety margin against
unexpected voltage transients.
• Ultra Low RDS(on) Provides Higher Efficiency and Extends Battery
Life 
• Logic Level Gate Drive – Can Be Driven by Logic ICs
• Miniature SO–8 Surface Mount Package – Saves Board Space 

• Diode Is Characterized for Use In Bridge Circuits


• Diode Exhibits High Speed, with Soft Recovery MARKING
• IDSS Specified at Elevated Temperatures DIAGRAM
• Avalanche Energy Specified
• Mounting Information for SO–8 Package Provided SO–8, Dual
CASE 751 F2P02
MAXIMUM RATINGS (TJ = 25°C unless otherwise noted) (Note 1.) 8 LYWW
STYLE 11
Rating Symbol Value Unit
1
Drain–to–Source Voltage VDSS 25 Vdc
Gate–to–Source Voltage – Continuous VGS ± 20 Vdc L = Location Code
Drain Current – Continuous @ TA = 25°C ID 2.5 Adc Y = Year
Drain Current – Continuous @ TA = 100°C ID 1.7 WW = Work Week
Drain Current – Single Pulse (tp ≤ 10 µs) IDM 13 Apk
Total Power Dissipation @ TA = 25°C PD 2.0 W
(Note 2.) PIN ASSIGNMENT
Derate above 25°C 16 mW/°C
Operating and Storage Temperature Range TJ, Tstg –55 to °C Source–1 1 8 Drain–1
150 Gate–1 2 7 Drain–1
Single Pulse Drain–to–Source Avalanche EAS mJ Source–2 3 6 Drain–2
Energy – Starting TJ = 25°C 245 4 5
Gate–2 Drain–2
(VDD = 20 Vdc, VGS = 10 Vdc, Peak
IL = 7.0 Apk, L = 10 mH, RG = 25 Ω) Top View
Thermal Resistance, Junction to Ambient RθJA 62.5 °C/W
(Note 2.)
ORDERING INFORMATION
Maximum Lead Temperature for Soldering TL 260 °C
Purposes, 0.0625″ from case for 10 Device Package Shipping
seconds
MMDF2P02ER2 SO–8 2500 Tape & Reel
1. Negative sign for P–Channel device omitted for clarity.
2. Mounted on 2″ square FR4 board (1″ sq. 2 oz. Cu 0.06″ thick single sided)
with one die operating, 10 sec. max.

 Semiconductor Components Industries, LLC, 2000 477 Publication Order Number:


November, 2000 – Rev. 6 MMDF2P02E/D
MMDF2P02E

ELECTRICAL CHARACTERISTICS (TA = 25°C unless otherwise noted) (Note 3.)


Characteristic Symbol Min Typ Max Unit
OFF CHARACTERISTICS
Drain–to–Source Breakdown Voltage V(BR)DSS Vdc
(VGS = 0 Vdc, ID = 250 µAdc) 25 – –
Temperature Coefficient (Positive) – 2.2 – mV/°C
Zero Gate Voltage Drain Current IDSS µAdc
(VDS = 20 Vdc, VGS = 0 Vdc) – – 1.0
(VDS = 20 Vdc, VGS = 0 Vdc, TJ = 125°C) – – 10
Gate–Body Leakage Current (VGS = ± 20 Vdc, VDS = 0) IGSS – – 100 nAdc
ON CHARACTERISTICS (Note 4.)
Gate Threshold Voltage VGS(th) Vdc
(VDS = VGS, ID = 250 µAdc) 1.0 2.0 3.0
Temperature Coefficient (Negative) – 3.8 –
Static Drain–to–Source On–Resistance RDS(on) Ohm
(VGS = 10 Vdc, ID = 2.0 Adc) – 0.19 0.25
(VGS = 4.5 Vdc, ID = 1.0 Adc) – 0.3 0.4
Forward Transconductance (VDS = 3.0 Vdc, ID = 1.0 Adc) gFS 1.0 2.8 – Mhos
DYNAMIC CHARACTERISTICS
Input Capacitance Ciss – 340 475 pF
Output Capacitance (VDS = 16 Vd
Vdc, VGS = 0 Vd
Vdc,
Coss – 220 300
f = 1.0 MHz)
Transfer Capacitance Crss – 75 150
SWITCHING CHARACTERISTICS (Note 5.)
Turn–On Delay Time td(on) – 20 40 ns
Rise Time (VDD = 10 Vdc, ID = 2.0 Adc, tr – 40 80
VGS = 5
5.00 Vdc
Vdc,
Turn–Off Delay Time RG = 6.0 Ω) td(off) – 53 106
Fall Time tf – 41 82
Turn–On Delay Time td(on) – 13 26
Rise Time (VDD = 10 Vdc, ID = 2.0 Adc, tr – 29 58
VGS = 10 Vdc
Vdc,
Turn–Off Delay Time RG = 6.0 Ω) td(off) – 30 60
Fall Time tf – 28 56
Gate Charge QT – 10 15 nC

(VDS = 16 Vdc, ID = 2.0 Adc, Q1 – 1.0 –


VGS = 10 Vdc) Q2 – 3.5 –
Q3 – 3.0 –
SOURCE–DRAIN DIODE CHARACTERISTICS
Forward On–Voltage (Note 4.) (IS = 2.0 Adc, VGS = 0 Vdc) VSD – 1.5 2.0 Vdc
Reverse Recovery Time trr – 32 64 ns
S Fi
See Figure 11
(IS = 2.0 Adc, VGS = 0 Vdc, ta – 19 –
dIS/dt = 100 A/µs) tb – 12 –
Reverse Recovery Storage Charge QRR – 0.035 – µC
3. Negative sign for P–Channel device omitted for clarity.
4. Pulse Test: Pulse Width ≤ 300 µs, Duty Cycle ≤ 2%.
5. Switching characteristics are independent of operating junction temperature.

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MMDF2P02E

TYPICAL ELECTRICAL CHARACTERISTICS

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Temperature versus Voltage

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MMDF2P02E

POWER MOSFET SWITCHING

Switching behavior is most easily modeled and predicted During the turn–on and turn–off delay times, gate current is
by recognizing that the power MOSFET is charge not constant. The simplest calculation uses appropriate
controlled. The lengths of various switching intervals (∆t) values from the capacitance curves in a standard equation for
are determined by how fast the FET input capacitance can voltage change in an RC network. The equations are:
be charged by current from the generator. td(on) = RG Ciss In [VGG/(VGG – VGSP)]
The published capacitance data is difficult to use for td(off) = RG Ciss In (VGG/VGSP)
calculating rise and fall because drain–gate capacitance
varies greatly with applied voltage. Accordingly, gate The capacitance (Ciss) is read from the capacitance curve at
charge data is used. In most cases, a satisfactory estimate of a voltage corresponding to the off–state condition when
average input current (IG(AV)) can be made from a calculating td(on) and is read at a voltage corresponding to the
rudimentary analysis of the drive circuit so that on–state when calculating td(off).
At high switching speeds, parasitic circuit elements
t = Q/IG(AV) complicate the analysis. The inductance of the MOSFET
During the rise and fall time interval when switching a source lead, inside the package and in the circuit wiring
resistive load, VGS remains virtually constant at a level which is common to both the drain and gate current paths,
known as the plateau voltage, VSGP. Therefore, rise and fall produces a voltage at the source which reduces the gate drive
times may be approximated by the following: current. The voltage is determined by Ldi/dt, but since di/dt
tr = Q2 x RG/(VGG – VGSP) is a function of drain current, the mathematical solution is
tf = Q2 x RG/VGSP complex. The MOSFET output capacitance also
complicates the mathematics. And finally, MOSFETs have
where finite internal gate resistance which effectively adds to the
VGG = the gate drive voltage, which varies from zero to VGG resistance of the driving source, but the internal resistance
RG = the gate drive resistance is difficult to measure and, consequently, is not specified.
and Q2 and VGSP are read from the gate charge curve.

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Figure 7. Capacitance Variation Drain–to–Source Voltage versus Total Charge

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Figure 11. Reverse Recovery Time (trr)

SAFE OPERATING AREA

The Forward Biased Safe Operating Area curves define reliable operation, the stored energy from circuit inductance
the maximum simultaneous drain–to–source voltage and dissipated in the transistor while in avalanche must be less
drain current that a transistor can handle safely when it is than the rated limit and must be adjusted for operating
forward biased. Curves are based upon maximum peak conditions differing from those specified. Although industry
junction temperature and a case temperature (TC) of 25°C. practice is to rate in terms of energy, avalanche energy
Peak repetitive pulsed power limits are determined by using capability is not a constant. The energy rating decreases
the thermal response data in conjunction with the procedures non–linearly with an increase of peak current in avalanche
discussed in AN569, “Transient Thermal Resistance – and peak junction temperature.
General Data and Its Use.” Although many E–FETs can withstand the stress of
Switching between the off–state and the on–state may drain–to–source avalanche at currents up to rated pulsed
traverse any load line provided neither rated peak current current (IDM), the energy rating is specified at rated
(IDM) nor rated voltage (VDSS) is exceeded, and that the continuous current (ID), in accordance with industry
transition time (tr, tf) does not exceed 10 µs. In addition the custom. The energy rating must be derated for temperature
total power averaged over a complete switching cycle must as shown in the accompanying graph (Figure 13). Maximum
not exceed (TJ(MAX) – TC)/(RθJC). energy at currents below rated continuous ID can safely be
A power MOSFET designated E–FET can be safely used assumed to equal the values indicated.
in switching circuits with unclamped inductive loads. For

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TYPICAL ELECTRICAL CHARACTERISTICS



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MMDF2P02E

INFORMATION FOR USING THE SO–8 SURFACE MOUNT PACKAGE

MINIMUM RECOMMENDED FOOTPRINT FOR SURFACE MOUNTED APPLICATIONS


Surface mount board layout is a critical portion of the interface between the board and the package. With the
total design. The footprint for the semiconductor packages correct pad geometry, the packages will self–align when
must be the correct size to ensure proper solder connection subjected to a solder reflow process.

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SO–8 POWER DISSIPATION


The power dissipation of the SO–8 is a function of the the equation for an ambient temperature TA of 25°C, one
input pad size. These can vary from the minimum pad size can calculate the power dissipation of the device which in
for soldering to the pad size given for maximum power this case is 2.0 Watts.
dissipation. Power dissipation for a surface mount device is
PD = 150°C – 25°C = 2.0 Watts
determined by TJ(max), the maximum rated junction 62.5°C/W
temperature of the die, RθJA, the thermal resistance from
the device junction to ambient; and the operating The 62.5°C/W for the SO–8 package assumes the
temperature, TA. Using the values provided on the data recommended footprint on a glass epoxy printed circuit
sheet for the SO–8 package, PD can be calculated as board to achieve a power dissipation of 2.0 Watts using the
follows: footprint shown. Another alternative would be to use a
TJ(max) – TA
ceramic substrate or an aluminum core board such as
PD = Thermal Cladt. Using board material such as Thermal
RθJA
Clad, the power dissipation can be doubled using the same
The values for the equation are found in the maximum footprint.
ratings table on the data sheet. Substituting these values into

SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • The soldering temperature and time shall not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within • When shifting from preheating to soldering, the
a short time could result in device failure. Therefore, the maximum temperature gradient shall be 5°C or less.
following items should always be observed in order to • After soldering has been completed, the device should
minimize the thermal stress to which the devices are be allowed to cool naturally for at least three minutes.
subjected. Gradual cooling should be used as the use of forced
• Always preheat the device. cooling will increase the temperature gradient and
• The delta temperature between the preheat and result in latent failure due to mechanical stress.
soldering should be 100°C or less.* • Mechanical stress or shock should not be applied
• When preheating and soldering, the temperature of the during cooling.
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When * Soldering a device without preheating can cause
using infrared heating with the reflow soldering excessive thermal shock and stress which can result in
method, the difference shall be a maximum of 10°C. damage to the device.

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TYPICAL SOLDER HEATING PROFILE


For any given circuit board, there will be a group of temperature versus time. The line on the graph shows the
control settings that will give the desired heat pattern. The actual temperature that might be experienced on the surface
operator must set temperatures for several heating zones of a test board at or near a central solder joint. The two
and a figure for belt speed. Taken together, these control profiles are based on a high density and a low density
settings make up a heating “profile” for that particular board. The Vitronics SMD310 convection/infrared reflow
circuit board. On machines controlled by a computer, the soldering system was used to generate this profile. The type
computer remembers these profiles from one operating of solder used was 62/36/2 Tin Lead Silver with a melting
session to the next. Figure 12 shows a typical heating point between 177–189°C. When this type of furnace is
profile for use when soldering a surface mount device to a used for solder reflow work, the circuit boards and solder
printed circuit board. This profile will vary among joints tend to heat first. The components on the board are
soldering systems, but it is a good starting point. Factors then heated by conduction. The circuit board, because it has
that can affect the profile include the type of soldering a large surface area, absorbs the thermal energy more
system in use, density and types of components on the efficiently, then distributes this energy to the components.
board, type of solder used, and the type of board or Because of this effect, the main body of a component may
substrate material being used. This profile shows be up to 30 degrees cooler than the adjacent solder joints.

STEP 1 STEP 2 STEP 3 STEP 4 STEP 5 STEP 6 STEP 7


PREHEAT VENT HEATING HEATING HEATING VENT COOLING
ZONE 1 “SOAK” ZONES 2 & 5 ZONES 3 & 6 ZONES 4 & 7
“RAMP” “RAMP” “SOAK” “SPIKE” 205° TO 219°C
PEAK AT
200°C DESIRED CURVE FOR HIGH 170°C SOLDER
MASS ASSEMBLIES JOINT
160°C
150°C

150°C
SOLDER IS LIQUID FOR
40 TO 80 SECONDS
100°C 140°C (DEPENDING ON
MASS OF ASSEMBLY)
100°C

DESIRED CURVE FOR LOW


MASS ASSEMBLIES
5°C

TIME (3 TO 7 MINUTES TOTAL) TMAX


Figure 16. Typical Solder Heating Profile

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484
( # .
Preferred Device

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P–Channel SO–8, Dual
These miniature surface mount MOSFETs feature ultra low RDS(on)
and true logic level performance. They are capable of withstanding
high energy in the avalanche and commutation modes and the http://onsemi.com
drain–to–source diode has a very low reverse recovery time.
MiniMOSt devices are designed for use in low voltage, high speed 2 AMPERES
switching applications where power efficiency is important. Typical 20 VOLTS
applications are dc–dc converters, and power management in portable
and battery powered products such as computers, printers, cellular and RDS(on) = 160 m
cordless phones. They can also be used for low voltage motor controls
in mass storage products such as disk drives and tape drives. The P–Channel
avalanche energy is specified to eliminate the guesswork in designs D
where inductive loads are switched and offer additional safety margin
against unexpected voltage transients.
• Ultra Low RDS(on) Provides Higher Efficiency and Extends Battery
Life G
• Logic Level Gate Drive – Can Be Driven by Logic ICs
• Miniature SO–8 Surface Mount Package – Saves Board Space S

• Diode Is Characterized for Use In Bridge Circuits


• Diode Exhibits High Speed, With Soft Recovery MARKING
• IDSS Specified at Elevated Temperature DIAGRAM
• Avalanche Energy Specified
• Mounting Information for SO–8 Package Provided SO–8, Dual
CASE 751 D2P02
MAXIMUM RATINGS (TJ = 25°C unless otherwise noted) (Note 1.) 8 LYWW
STYLE 11
Rating Symbol Value Unit
1
Drain–to–Source Voltage VDSS 20 Vdc
Drain–to–Gate Voltage (RGS = 1.0 MΩ) VDGR 20 Vdc L = Location Code
Gate–to–Source Voltage – Continuous VGS ± 20 Vdc Y = Year
WW = Work Week
Drain Current – Continuous @ TA = 25°C ID 3.3 Adc
Drain Current – Continuous @ TA = 100°C ID 2.1
Drain Current – Single Pulse (tp ≤ 10 µs) IDM 20 Apk
PIN ASSIGNMENT
Total Power Dissipation @ TA = 25°C PD 2.0 Watts
(Note 2.) Source–1 Drain–1
1 8
Operating and Storage Temperature Range TJ, Tstg – 55 to °C Gate–1 2 7 Drain–1
150
Source–2 3 6 Drain–2
Single Pulse Drain–to–Source Avalanche EAS 324 mJ
Gate–2 4 5 Drain–2
Energy – Starting TJ = 25°C
(VDD = 20 Vdc, VGS = 5.0 Vdc, Top View
IL = 6.0 Apk, L = 18 mH, RG = 25 Ω)
Thermal Resistance – Junction to Ambient RθJA 62.5 °C/W
ORDERING INFORMATION
(Note 2.)
Maximum Lead Temperature for Soldering TL 260 °C Device Package Shipping
Purposes, 1/8″ from case for 10 seconds
MMDF2P02HDR2 SO–8 2500 Tape & Reel
1. Negative sign for P–Channel device omitted for clarity.
2. Mounted on 2″ square FR4 board (1″ sq. 2 oz. Cu 0.06″ thick single sided)
with one die operating, 10 sec. max.
Preferred devices are recommended choices for future use
and best overall value.

 Semiconductor Components Industries, LLC, 2000 485 Publication Order Number:


November, 2000 – Rev. 6 MMDF2P02HD/D
MMDF2P02HD

ELECTRICAL CHARACTERISTICS (TA = 25°C unless otherwise noted) (Note 3.)


Characteristic Symbol Min Typ Max Unit
OFF CHARACTERISTICS
Drain–Source Breakdown Voltage V(BR)DSS Vdc
(VGS = 0 Vdc, ID = 250 µAdc) 20 – –
Temperature Coefficient (Positive) – 25 – mV/°C
Zero Gate Voltage Drain Current IDSS µAdc
(VDS = 20 Vdc, VGS = 0 Vdc) – – 1.0
(VDS = 20 Vdc, VGS = 0 Vdc, TJ = 125°C) – – 10
Gate–Body Leakage Current (VGS = ± 20 Vdc, VDS = 0) IGSS – – 100 nAdc
ON CHARACTERISTICS (Note 4.)
Gate Threshold Voltage VGS(th) Vdc
(VDS = VGS, ID = 250 µAdc) 1.0 1.5 2.0
Temperature Coefficient (Negative) – 4.0 – mV/°C
Static Drain–to–Source On–Resistance RDS(on) Ohm
(VGS = 10 Vdc, ID = 2.0 Adc) – 0.118 0.160
(VGS = 4.5 Vdc, ID = 1.0 Adc) – 0.152 0.180
Forward Transconductance (VDS = 3.0 Vdc, ID = 1.0 Adc) gFS 2.0 3.0 – mhos
DYNAMIC CHARACTERISTICS
Input Capacitance Ciss – 420 588 pF
Output Capacitance (VDS = 16 Vd
Vdc, VGS = 0 Vd
Vdc,
Coss – 290 406
f = 1.0 MHz)
Reverse Transfer Capacitance Crss – 116 232
SWITCHING CHARACTERISTICS (Note 5.)
Turn–On Delay Time td(on) – 19 38 ns
Rise Time (VDS = 10 Vdc, ID = 2.0 Adc, tr – 66 132
VGS = 4
4.55 Vdc
Vdc,
Turn–Off Delay Time RG = 6.0 Ω) td(off) – 25 50
Fall Time tf – 37 74
Turn–On Delay Time td(on) – 11 22
Rise Time (VDD = 10 Vdc, ID = 2.0 Adc, tr – 21 42
VGS = 10 Vdc
Vdc,
Turn–Off Delay Time RG = 6.0 Ω) td(off) – 45 90
Fall Time tf – 36 72
Gate Charge QT – 15 20 nC

(VDS = 16 Vdc, ID = 2.0 Adc, Q1 – 1.2 –


VGS = 10 Vdc) Q2 – 5.0 –
Q3 – 4.0 –

SOURCE–DRAIN DIODE CHARACTERISTICS


Forward On–Voltage (Note 4.) VSD Vdc
(IS = 2.0 Adc, VGS = 0 Vdc)
– 1.5 2.1
(IS = 2.0 Adc, VGS = 0 Vdc, TJ = 125°C)
– 1.24 –
Reverse Recovery Time trr – 38 – ns
(VDD = 15 V, IS = 2.0 A, ta – 17 –
dIS/dt = 100 A/µs)
tb – 21 –
QRR – 0.034 – µC
3. Negative sign for P–Channel device omitted for clarity.
4. Pulse Test: Pulse Width ≤ 300 µs, Duty Cycle ≤ 2%.max.
5. Switching characteristics are independent of operating junction temperature.

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486
MMDF2P02HD

TYPICAL ELECTRICAL CHARACTERISTICS

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Figure 3. On–Resistance versus Figure 4. On–Resistance versus Drain Current


Gate–To–Source Voltage and Gate Voltage

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Figure 5. On–Resistance Variation with Figure 6. Drain–To–Source Leakage Current


Temperature versus Voltage

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487
MMDF2P02HD

POWER MOSFET SWITCHING

Switching behavior is most easily modeled and predicted The capacitance (Ciss) is read from the capacitance curve at
by recognizing that the power MOSFET is charge a voltage corresponding to the off–state condition when
controlled. The lengths of various switching intervals (∆t) calculating td(on) and is read at a voltage corresponding to the
are determined by how fast the FET input capacitance can on–state when calculating td(off).
be charged by current from the generator. At high switching speeds, parasitic circuit elements
The published capacitance data is difficult to use for complicate the analysis. The inductance of the MOSFET
calculating rise and fall because drain–gate capacitance source lead, inside the package and in the circuit wiring
varies greatly with applied voltage. Accordingly, gate which is common to both the drain and gate current paths,
charge data is used. In most cases, a satisfactory estimate of produces a voltage at the source which reduces the gate drive
average input current (IG(AV)) can be made from a current. The voltage is determined by Ldi/dt, but since di/dt
rudimentary analysis of the drive circuit so that is a function of drain current, the mathematical solution is
t = Q/IG(AV) complex. The MOSFET output capacitance also
complicates the mathematics. And finally, MOSFETs have
During the rise and fall time interval when switching a finite internal gate resistance which effectively adds to the
resistive load, VGS remains virtually constant at a level resistance of the driving source, but the internal resistance
known as the plateau voltage, VSGP. Therefore, rise and fall is difficult to measure and, consequently, is not specified.
times may be approximated by the following: The resistive switching time variation versus gate
tr = Q2 x RG/(VGG – VGSP) resistance (Figure 9) shows how typical switching
tf = Q2 x RG/VGSP performance is affected by the parasitic circuit elements. If
where the parasitics were not present, the slope of the curves would
maintain a value of unity regardless of the switching speed.
VGG = the gate drive voltage, which varies from zero to VGG
The circuit used to obtain the data is constructed to minimize
RG = the gate drive resistance
common inductance in the drain and gate circuit loops and
and Q2 and VGSP are read from the gate charge curve.
is believed readily achievable with board mounted
During the turn–on and turn–off delay times, gate current is components. Most power electronic loads are inductive; the
not constant. The simplest calculation uses appropriate data in the figure is taken with a resistive load, which
values from the capacitance curves in a standard equation for approximates an optimally snubbed inductive load. Power
voltage change in an RC network. The equations are: MOSFETs may be safely operated into an inductive load;
td(on) = RG Ciss In [VGG/(VGG – VGSP)] however, snubbing reduces switching losses.
td(off) = RG Ciss In (VGG/VGSP)

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Figure 8. Gate–To–Source and Drain–To–Source Figure 9. Resistive Switching Time


Voltage versus Total Charge Variation versus Gate Resistance

DRAIN–TO–SOURCE DIODE CHARACTERISTICS

The switching characteristics of a MOSFET body diode high di/dts. The diode’s negative di/dt during ta is directly
are very important in systems using it as a freewheeling or controlled by the device clearing the stored charge.
commutating diode. Of particular interest are the reverse However, the positive di/dt during tb is an uncontrollable
recovery characteristics which play a major role in diode characteristic and is usually the culprit that induces
determining switching losses, radiated noise, EMI and RFI. current ringing. Therefore, when comparing diodes, the
System switching losses are largely due to the nature of ratio of tb/ta serves as a good indicator of recovery
the body diode itself. The body diode is a minority carrier abruptness and thus gives a comparative estimate of
device, therefore it has a finite reverse recovery time, trr, due probable noise generated. A ratio of 1 is considered ideal and
to the storage of minority carrier charge, QRR, as shown in values less than 0.5 are considered snappy.
the typical reverse recovery wave form of Figure 15. It is this Compared to ON Semiconductor standard cell density
stored charge that, when cleared from the diode, passes low voltage MOSFETs, high cell density MOSFET diodes
through a potential and defines an energy loss. Obviously, are faster (shorter trr), have less stored charge and a softer
repeatedly forcing the diode through reverse recovery reverse recovery characteristic. The softness advantage of
further increases switching losses. Therefore, one would the high cell density diode means they can be forced through
like a diode with short trr and low QRR specifications to reverse recovery at a higher di/dt than a standard cell
minimize these losses. MOSFET diode without increasing the current ringing or the
The abruptness of diode reverse recovery effects the noise generated. In addition, power dissipation incurred
amount of radiated noise, voltage spikes, and current from switching the diode will be less due to the shorter
ringing. The mechanisms at work are finite irremovable recovery time and lower switching losses.
circuit parasitic inductances and capacitances acted upon by
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Figure 11. Reverse Recovery Time (trr)

SAFE OPERATING AREA

The Forward Biased Safe Operating Area curves define reliable operation, the stored energy from circuit inductance
the maximum simultaneous drain–to–source voltage and dissipated in the transistor while in avalanche must be less
drain current that a transistor can handle safely when it is than the rated limit and must be adjusted for operating
forward biased. Curves are based upon maximum peak conditions differing from those specified. Although industry
junction temperature and a case temperature (TC) of 25°C. practice is to rate in terms of energy, avalanche energy
Peak repetitive pulsed power limits are determined by using capability is not a constant. The energy rating decreases
the thermal response data in conjunction with the procedures non–linearly with an increase of peak current in avalanche
discussed in AN569, “Transient Thermal Resistance – and peak junction temperature.
General Data and Its Use.” Although many E–FETs can withstand the stress of
Switching between the off–state and the on–state may drain–to–source avalanche at currents up to rated pulsed
traverse any load line provided neither rated peak current current (IDM), the energy rating is specified at rated
(IDM) nor rated voltage (VDSS) is exceeded, and that the continuous current (ID), in accordance with industry
transition time (tr, tf) does not exceed 10 µs. In addition the custom. The energy rating must be derated for temperature
total power averaged over a complete switching cycle must as shown in the accompanying graph (Figure 13). Maximum
not exceed (TJ(MAX) – TC)/(RθJC). energy at currents below rated continuous ID can safely be
A power MOSFET designated E–FET can be safely used assumed to equal the values indicated.
in switching circuits with unclamped inductive loads. For

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Safe Operating Area Starting Junction Temperature

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TYPICAL ELECTRICAL CHARACTERISTICS



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Figure 14. Thermal Response

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Figure 15. Diode Reverse Recovery Waveform

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491
MMDF2P02HD

INFORMATION FOR USING THE SO–8 SURFACE MOUNT PACKAGE

MINIMUM RECOMMENDED FOOTPRINT FOR SURFACE MOUNTED APPLICATIONS


Surface mount board layout is a critical portion of the total interface between the board and the package. With the
design. The footprint for the semiconductor packages must correct pad geometry, the packages will self–align when
be the correct size to ensure proper solder connection subjected to a solder reflow process.

9
$#

#:$ $$
: 6

#6 $
9 #:
inches
mm

SO–8 POWER DISSIPATION


The power dissipation of the SO–8 is a function of the into the equation for an ambient temperature TA of 25°C,
input pad size. This can vary from the minimum pad size one can calculate the power dissipation of the device which
for soldering to the pad size given for maximum power in this case is 2.0 Watts.
dissipation. Power dissipation for a surface mount device is
PD = 150°C – 25°C = 2.0 Watts
determined by TJ(max), the maximum rated junction 62.5°C/W
temperature of the die, RθJA, the thermal resistance from
the device junction to ambient; and the operating The 62.5°C/W for the SO–8 package assumes the
temperature, TA. Using the values provided on the data recommended footprint on a glass epoxy printed circuit
sheet for the SO–8 package, PD can be calculated as board to achieve a power dissipation of 2.0 Watts using the
follows: footprint shown. Another alternative would be to use a
TJ(max) – TA
ceramic substrate or an aluminum core board such as
PD = Thermal Cladt. Using board material such as Thermal
RθJA
Clad, the power dissipation can be doubled using the same
The values for the equation are found in the maximum footprint.
ratings table on the data sheet. Substituting these values

SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • The soldering temperature and time shall not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within • When shifting from preheating to soldering, the
a short time could result in device failure. Therefore, the maximum temperature gradient shall be 5°C or less.
following items should always be observed in order to • After soldering has been completed, the device should
minimize the thermal stress to which the devices are be allowed to cool naturally for at least three minutes.
subjected. Gradual cooling should be used as the use of forced
• Always preheat the device. cooling will increase the temperature gradient and
• The delta temperature between the preheat and result in latent failure due to mechanical stress.
soldering should be 100°C or less.* • Mechanical stress or shock should not be applied
• When preheating and soldering, the temperature of the during cooling.
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When * Soldering a device without preheating can cause
using infrared heating with the reflow soldering excessive thermal shock and stress which can result in
method, the difference shall be a maximum of 10°C. damage to the device.

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492
MMDF2P02HD

TYPICAL SOLDER HEATING PROFILE


For any given circuit board, there will be a group of temperature versus time. The line on the graph shows the
control settings that will give the desired heat pattern. The actual temperature that might be experienced on the surface
operator must set temperatures for several heating zones of a test board at or near a central solder joint. The two
and a figure for belt speed. Taken together, these control profiles are based on a high density and a low density
settings make up a heating “profile” for that particular board. The Vitronics SMD310 convection/infrared reflow
circuit board. On machines controlled by a computer, the soldering system was used to generate this profile. The type
computer remembers these profiles from one operating of solder used was 62/36/2 Tin Lead Silver with a melting
session to the next. Figure 16 shows a typical heating point between 177–189°C. When this type of furnace is
profile for use when soldering a surface mount device to a used for solder reflow work, the circuit boards and solder
printed circuit board. This profile will vary among joints tend to heat first. The components on the board are
soldering systems, but it is a good starting point. Factors then heated by conduction. The circuit board, because it has
that can affect the profile include the type of soldering a large surface area, absorbs the thermal energy more
system in use, density and types of components on the efficiently, then distributes this energy to the components.
board, type of solder used, and the type of board or Because of this effect, the main body of a component may
substrate material being used. This profile shows be up to 30 degrees cooler than the adjacent solder joints.

STEP 1 STEP 2 STEP 3 STEP 4 STEP 5 STEP 6 STEP 7


PREHEAT VENT HEATING HEATING HEATING VENT COOLING
ZONE 1 “SOAK” ZONES 2 & 5 ZONES 3 & 6 ZONES 4 & 7
“RAMP” “RAMP” “SOAK” “SPIKE” 205° TO 219°C
PEAK AT
200°C DESIRED CURVE FOR HIGH 170°C SOLDER
MASS ASSEMBLIES JOINT
160°C
150°C

150°C
SOLDER IS LIQUID FOR
40 TO 80 SECONDS
100°C 140°C (DEPENDING ON
MASS OF ASSEMBLY)
100°C

DESIRED CURVE FOR LOW


MASS ASSEMBLIES
5°C

TIME (3 TO 7 MINUTES TOTAL) TMAX


Figure 16. Typical Solder Heating Profile

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493
( #!.
Preferred Device

#$%& '(
 !  
P–Channel SO–8, Dual
These miniature surface mount MOSFETs feature ultra low RDS(on)
and true logic level performance. They are capable of withstanding
high energy in the avalanche and commutation modes and the http://onsemi.com
drain–to–source diode has a very low reverse recovery time.
MiniMOSt devices are designed for use in low voltage, high speed 2 AMPERES
switching applications where power efficiency is important. Typical 30 VOLTS
applications are dc–dc converters, and power management in portable
and battery powered products such as computers, printers, cellular and RDS(on) = 200 m
cordless phones. They can also be used for low voltage motor controls
in mass storage products such as disk drives and tape drives. The P–Channel
avalanche energy is specified to eliminate the guesswork in designs D
where inductive loads are switched and offer additional safety margin
against unexpected voltage transients.
• Ultra Low RDS(on) Provides Higher Efficiency and Extends Battery
Life G
• Logic Level Gate Drive – Can Be Driven by Logic ICs
• Miniature SO–8 Surface Mount Package – Saves Board Space S
• Diode Is Characterized for Use In Bridge Circuits
• Diode Exhibits High Speed, With Soft Recovery MARKING
• IDSS Specified at Elevated Temperature DIAGRAM

• Avalanche Energy Specified


• Mounting Information for SO–8 Package Provided SO–8, Dual
D2P03
8 CASE 751
LYWW
STYLE 11
MAXIMUM RATINGS (TJ = 25°C unless otherwise noted) (Note 1.)
1
Rating Symbol Value Unit
Drain–to–Source Voltage VDSS 30 Vdc L = Location Code
Drain–to–Gate Voltage (RGS = 1.0 MΩ) VDGR 30 Vdc Y = Year
Gate–to–Source Voltage – Continuous VGS ± 20 Vdc WW = Work Week

Drain Current – Continuous @ TA = 25°C ID 3.0 Adc


Drain Current – Continuous @ TA = 100°C ID 1.9
PIN ASSIGNMENT
Drain Current – Single Pulse (tp ≤ 10 µs) IDM 15 Apk
Total Power Dissipation @ TC = 25°C (Note 2.) PD 2.0 Watts Source–1 Drain–1
1 8
Operating and Storage Temperature Range TJ, Tstg – 55 °C
Gate–1 2 7 Drain–1
to 150
Source–2 3 6 Drain–2
Single Pulse Drain–to–Source Avalanche EAS 324 mJ
Energy – Starting TJ = 25°C Gate–2 4 5 Drain–2
(VDD = 30 Vdc, VGS = 5.0 Vdc, Peak Top View
IL = 6.0 Apk, L = 18 mH, RG = 25 Ω)
Thermal Resistance – Junction to Ambient RθJA 62.5 °C/W
(Note 2.) ORDERING INFORMATION
Maximum Lead Temperature for Soldering TL 260 °C Device Package Shipping
Purposes, 1/8″ from case for 10 seconds
1. Negative sign for P–Channel device omitted for clarity. MMDF2P03HDR2 SO–8 2500 Tape & Reel
2. Mounted on 2″ square FR4 board (1″ sq. 2 oz. Cu 0.06″ thick single sided)
with one die operating, 10 sec. max.
Preferred devices are recommended choices for future use
and best overall value.

 Semiconductor Components Industries, LLC, 2000 494 Publication Order Number:


November, 2000 – Rev. 7 MMDF2P03HD/D
MMDF2P03HD

ELECTRICAL CHARACTERISTICS (TC = 25°C unless otherwise noted) (Note 1.)


Characteristic Symbol Min Typ Max Unit
OFF CHARACTERISTICS
Drain–to–Source Breakdown Voltage V(BR)DSS Vdc
(VGS = 0 Vdc, ID = 250 µAdc) 30 – –
Temperature Coefficient (Positive) – 27 – mV/°C
Zero Gate Voltage Drain Current IDSS µAdc
(VDS = 30 Vdc, VGS = 0 Vdc) – – 1.0
(VDS = 30 Vdc, VGS = 0 Vdc, TJ = 125°C) – – 10
Gate–Body Leakage Current (VGS = ± 20 Vdc, VDS = 0) IGSS – – 100 nAdc
ON CHARACTERISTICS (Note 3.)
Gate Threshold Voltage VGS(th) Vdc
(VDS = VGS, ID = 250 µAdc) 1.0 1.5 2.0
Temperature Coefficient (Negative) – 4.0 – mV/°C
Static Drain–to–Source On–Resistance RDS(on) Ohm
(VGS = 10 Vdc, ID = 2.0 Adc) – 0.170 0.200
(VGS = 4.5 Vdc, ID = 1.0 Adc) – 0.225 0.300
Forward Transconductance (VDS = 3.0 Vdc, ID = 1.0 Adc) gFS 2.0 3.4 – mhos
DYNAMIC CHARACTERISTICS
Input Capacitance Ciss – 397 550 pF
Output Capacitance (VDS = 24 Vd
Vdc, VGS = 0 Vd
Vdc,
Coss – 189 250
f = 1.0 MHz)
Transfer Capacitance Crss – 64 126
SWITCHING CHARACTERISTICS (Note 4.)
Turn–On Delay Time td(on) – 16.25 33 ns
Rise Time (VDD = 15 Vdc, ID = 2.0 Adc, tr – 17.5 35
VGS = 4
4.55 Vdc
Vdc,
Turn–Off Delay Time RG = 6.0 Ω) td(off) – 62.5 125
Fall Time tf – 194 390
Turn–On Delay Time td(on) – 9.0 18
Rise Time (VDD = 15 Vdc, ID = 2.0 Adc, tr – 10 20
VGS = 10 Vdc
Vdc,
Turn–Off Delay Time RG = 6.0 Ω) td(off) – 81 162
Fall Time tf – 192 384
Gate Charge QT – 14.2 19 nC
S Fi
See Figure 8
(VDS = 24 Vdc, ID = 2.0 Adc, Q1 – 1.1 –
VGS = 10 Vdc) Q2 – 4.5 –
Q3 – 3.5 –

SOURCE–DRAIN DIODE CHARACTERISTICS


Forward On–Voltage (Note 3.) (IS = 2.0 Adc, VGS = 0 Vdc) VSD – 1.82 2.0 Vdc
(IS = 2.0 Adc, VGS = 0 Vdc, – 1.36 –
TJ = 125°C)
Reverse Recovery Time trr – 42.3 – ns
S Fi
See Figure 15
(IS = 2.0 Adc, VGS = 0 Vdc, ta – 15.6 –
dIS/dt = 100 A/µs) tb – 26.7 –
Reverse Recovery Stored Charge QRR – 0.044 – µC
1. Negative sign for P–Channel device omitted for clarity.
3. Pulse Test: Pulse Width ≤ 300 µs, Duty Cycle ≤ 2%.
4. Switching characteristics are independent of operating junction temperature.

http://onsemi.com
495
MMDF2P03HD

TYPICAL ELECTRICAL CHARACTERISTICS

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Figure 3. On–Resistance versus Figure 4. On–Resistance versus Drain Current


Gate–to–Source Voltage and Gate Voltage

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Figure 5. On–Resistance Variation with Figure 6. Drain–To–Source Leakage


Temperature Current versus Voltage

http://onsemi.com
496
MMDF2P03HD

POWER MOSFET SWITCHING

Switching behavior is most easily modeled and predicted The capacitance (Ciss) is read from the capacitance curve at
by recognizing that the power MOSFET is charge a voltage corresponding to the off–state condition when
controlled. The lengths of various switching intervals (∆t) calculating td(on) and is read at a voltage corresponding to the
are determined by how fast the FET input capacitance can on–state when calculating td(off).
be charged by current from the generator. At high switching speeds, parasitic circuit elements
The published capacitance data is difficult to use for complicate the analysis. The inductance of the MOSFET
calculating rise and fall because drain–gate capacitance source lead, inside the package and in the circuit wiring
varies greatly with applied voltage. Accordingly, gate which is common to both the drain and gate current paths,
charge data is used. In most cases, a satisfactory estimate of produces a voltage at the source which reduces the gate drive
average input current (IG(AV)) can be made from a current. The voltage is determined by Ldi/dt, but since di/dt
rudimentary analysis of the drive circuit so that is a function of drain current, the mathematical solution is
t = Q/IG(AV) complex. The MOSFET output capacitance also
complicates the mathematics. And finally, MOSFETs have
During the rise and fall time interval when switching a finite internal gate resistance which effectively adds to the
resistive load, VGS remains virtually constant at a level resistance of the driving source, but the internal resistance
known as the plateau voltage, VSGP. Therefore, rise and fall is difficult to measure and, consequently, is not specified.
times may be approximated by the following: The resistive switching time variation versus gate
tr = Q2 x RG/(VGG – VGSP) resistance (Figure 9) shows how typical switching
tf = Q2 x RG/VGSP performance is affected by the parasitic circuit elements. If
where the parasitics were not present, the slope of the curves would
maintain a value of unity regardless of the switching speed.
VGG = the gate drive voltage, which varies from zero to VGG
The circuit used to obtain the data is constructed to minimize
RG = the gate drive resistance
common inductance in the drain and gate circuit loops and
and Q2 and VGSP are read from the gate charge curve.
is believed readily achievable with board mounted
During the turn–on and turn–off delay times, gate current is components. Most power electronic loads are inductive; the
not constant. The simplest calculation uses appropriate data in the figure is taken with a resistive load, which
values from the capacitance curves in a standard equation for approximates an optimally snubbed inductive load. Power
voltage change in an RC network. The equations are: MOSFETs may be safely operated into an inductive load;
td(on) = RG Ciss In [VGG/(VGG – VGSP)] however, snubbing reduces switching losses.
td(off) = RG Ciss In (VGG/VGSP)

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Figure 7. Capacitance Variation

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497
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Figure 8. Gate–To–Source and Drain–To–Source Figure 9. Resistive Switching Time


Voltage versus Total Charge Variation versus Gate Resistance

DRAIN–TO–SOURCE DIODE CHARACTERISTICS

The switching characteristics of a MOSFET body diode high di/dts. The diode’s negative di/dt during ta is directly
are very important in systems using it as a freewheeling or controlled by the device clearing the stored charge.
commutating diode. Of particular interest are the reverse However, the positive di/dt during tb is an uncontrollable
recovery characteristics which play a major role in diode characteristic and is usually the culprit that induces
determining switching losses, radiated noise, EMI and RFI. current ringing. Therefore, when comparing diodes, the
System switching losses are largely due to the nature of ratio of tb/ta serves as a good indicator of recovery
the body diode itself. The body diode is a minority carrier abruptness and thus gives a comparative estimate of
device, therefore it has a finite reverse recovery time, trr, due probable noise generated. A ratio of 1 is considered ideal and
to the storage of minority carrier charge, QRR, as shown in values less than 0.5 are considered snappy.
the typical reverse recovery wave form of Figure 15. It is this Compared to ON Semiconductor standard cell density
stored charge that, when cleared from the diode, passes low voltage MOSFETs, high cell density MOSFET diodes
through a potential and defines an energy loss. Obviously, are faster (shorter trr), have less stored charge and a softer
repeatedly forcing the diode through reverse recovery reverse recovery characteristic. The softness advantage of
further increases switching losses. Therefore, one would the high cell density diode means they can be forced through
like a diode with short trr and low QRR specifications to reverse recovery at a higher di/dt than a standard cell
minimize these losses. MOSFET diode without increasing the current ringing or the
The abruptness of diode reverse recovery effects the noise generated. In addition, power dissipation incurred
amount of radiated noise, voltage spikes, and current from switching the diode will be less due to the shorter
ringing. The mechanisms at work are finite irremovable recovery time and lower switching losses.
circuit parasitic inductances and capacitances acted upon by
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Figure 10. Diode Forward Voltage versus Current

http://onsemi.com
498
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Figure 11. Reverse Recovery Time (trr)

SAFE OPERATING AREA

The Forward Biased Safe Operating Area curves define reliable operation, the stored energy from circuit inductance
the maximum simultaneous drain–to–source voltage and dissipated in the transistor while in avalanche must be less
drain current that a transistor can handle safely when it is than the rated limit and must be adjusted for operating
forward biased. Curves are based upon maximum peak conditions differing from those specified. Although industry
junction temperature and a case temperature (TC) of 25°C. practice is to rate in terms of energy, avalanche energy
Peak repetitive pulsed power limits are determined by using capability is not a constant. The energy rating decreases
the thermal response data in conjunction with the procedures non–linearly with an increase of peak current in avalanche
discussed in AN569, “Transient Thermal Resistance – and peak junction temperature.
General Data and Its Use.” Although many E–FETs can withstand the stress of
Switching between the off–state and the on–state may drain–to–source avalanche at currents up to rated pulsed
traverse any load line provided neither rated peak current current (IDM), the energy rating is specified at rated
(IDM) nor rated voltage (VDSS) is exceeded, and that the continuous current (ID), in accordance with industry
transition time (tr, tf) does not exceed 10 µs. In addition the custom. The energy rating must be derated for temperature
total power averaged over a complete switching cycle must as shown in the accompanying graph (Figure 13). Maximum
not exceed (TJ(MAX) – TC)/(RθJC). energy at currents below rated continuous ID can safely be
A power MOSFET designated E–FET can be safely used assumed to equal the values indicated.
in switching circuits with unclamped inductive loads. For

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Figure 12. Maximum Rated Forward Biased Figure 13. Maximum Avalanche Energy versus
Safe Operating Area Starting Junction Temperature

http://onsemi.com
499
MMDF2P03HD

TYPICAL ELECTRICAL CHARACTERISTICS



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Figure 14. Thermal Response

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Figure 15. Diode Reverse Recovery Waveform

http://onsemi.com
500
MMDF2P03HD

INFORMATION FOR USING THE SO–8 SURFACE MOUNT PACKAGE

MINIMUM RECOMMENDED FOOTPRINT FOR SURFACE MOUNTED APPLICATIONS


Surface mount board layout is a critical portion of the total interface between the board and the package. With the
design. The footprint for the semiconductor packages must correct pad geometry, the packages will self–align when
be the correct size to ensure proper solder connection subjected to a solder reflow process.

9
$#

#:$ $$
: 6

#6 $
9 #:
inches
mm

SO–8 POWER DISSIPATION


The power dissipation of the SO–8 is a function of the into the equation for an ambient temperature TA of 25°C,
input pad size. This can vary from the minimum pad size one can calculate the power dissipation of the device which
for soldering to the pad size given for maximum power in this case is 2.0 Watts.
dissipation. Power dissipation for a surface mount device is
PD = 150°C – 25°C = 2.0 Watts
determined by TJ(max), the maximum rated junction 62.5°C/W
temperature of the die, RθJA, the thermal resistance from
the device junction to ambient; and the operating The 62.5°C/W for the SO–8 package assumes the
temperature, TA. Using the values provided on the data recommended footprint on a glass epoxy printed circuit
sheet for the SO–8 package, PD can be calculated as board to achieve a power dissipation of 2.0 Watts using the
follows: footprint shown. Another alternative would be to use a
TJ(max) – TA
ceramic substrate or an aluminum core board such as
PD = Thermal Cladt. Using board material such as Thermal
RθJA
Clad, the power dissipation can be doubled using the same
The values for the equation are found in the maximum footprint.
ratings table on the data sheet. Substituting these values

SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • The soldering temperature and time shall not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within • When shifting from preheating to soldering, the
a short time could result in device failure. Therefore, the maximum temperature gradient shall be 5°C or less.
following items should always be observed in order to • After soldering has been completed, the device should
minimize the thermal stress to which the devices are be allowed to cool naturally for at least three minutes.
subjected. Gradual cooling should be used as the use of forced
• Always preheat the device. cooling will increase the temperature gradient and
• The delta temperature between the preheat and result in latent failure due to mechanical stress.
soldering should be 100°C or less.* • Mechanical stress or shock should not be applied
• When preheating and soldering, the temperature of the during cooling.
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When * Soldering a device without preheating can cause
using infrared heating with the reflow soldering excessive thermal shock and stress which can result in
method, the difference shall be a maximum of 10°C. damage to the device.

http://onsemi.com
501
MMDF2P03HD

TYPICAL SOLDER HEATING PROFILE


For any given circuit board, there will be a group of temperature versus time. The line on the graph shows the
control settings that will give the desired heat pattern. The actual temperature that might be experienced on the surface
operator must set temperatures for several heating zones of a test board at or near a central solder joint. The two
and a figure for belt speed. Taken together, these control profiles are based on a high density and a low density
settings make up a heating “profile” for that particular board. The Vitronics SMD310 convection/infrared reflow
circuit board. On machines controlled by a computer, the soldering system was used to generate this profile. The type
computer remembers these profiles from one operating of solder used was 62/36/2 Tin Lead Silver with a melting
session to the next. Figure 16 shows a typical heating point between 177–189°C. When this type of furnace is
profile for use when soldering a surface mount device to a used for solder reflow work, the circuit boards and solder
printed circuit board. This profile will vary among joints tend to heat first. The components on the board are
soldering systems, but it is a good starting point. Factors then heated by conduction. The circuit board, because it has
that can affect the profile include the type of soldering a large surface area, absorbs the thermal energy more
system in use, density and types of components on the efficiently, then distributes this energy to the components.
board, type of solder used, and the type of board or Because of this effect, the main body of a component may
substrate material being used. This profile shows be up to 30 degrees cooler than the adjacent solder joints.

STEP 1 STEP 2 STEP 3 STEP 4 STEP 5 STEP 6 STEP 7


PREHEAT VENT HEATING HEATING HEATING VENT COOLING
ZONE 1 “SOAK” ZONES 2 & 5 ZONES 3 & 6 ZONES 4 & 7
“RAMP” “RAMP” “SOAK” “SPIKE” 205° TO 219°C
PEAK AT
200°C DESIRED CURVE FOR HIGH 170°C SOLDER
MASS ASSEMBLIES JOINT
160°C
150°C

150°C
SOLDER IS LIQUID FOR
40 TO 80 SECONDS
100°C 140°C (DEPENDING ON
MASS OF ASSEMBLY)
100°C

DESIRED CURVE FOR LOW


MASS ASSEMBLIES
5°C

TIME (3 TO 7 MINUTES TOTAL) TMAX


Figure 16. Typical Solder Heating Profile

http://onsemi.com
502
(! .
Preferred Device

#$%& '(
!    
N–Channel SO–8, Dual
These miniature surface mount MOSFETs feature ultra low RDS(on)
and true logic level performance. They are capable of withstanding
high energy in the avalanche and commutation modes and the http://onsemi.com
drain–to–source diode has a very low reverse recovery time.
MiniMOSt devices are designed for use in low voltage, high speed 3 AMPERES
switching applications where power efficiency is important. Typical 20 VOLTS
applications are dc–dc converters, and power management in portable
and battery powered products such as computers, printers, cellular and RDS(on) = 90 m
cordless phones. They can also be used for low voltage motor controls
in mass storage products such as disk drives and tape drives. The N–Channel
avalanche energy is specified to eliminate the guesswork in designs 
where inductive loads are switched and offer additional safety margin
against unexpected voltage transients.
• Ultra Low RDS(on) Provides Higher Efficiency and Extends Battery
Life 
• Logic Level Gate Drive – Can Be Driven by Logic ICs
• Miniature SO–8 Surface Mount Package – Saves Board Space 

• Diode Is Characterized for Use In Bridge Circuits


• Diode Exhibits High Speed, With Soft Recovery MARKING
• IDSS Specified at Elevated Temperature DIAGRAM
• Avalanche Energy Specified
• Mounting Information for SO–8 Package Provided SO–8, Dual
CASE 751 D3N02
8 LYWW
STYLE 11
MAXIMUM RATINGS (TJ = 25°C unless otherwise noted)
1
Rating Symbol Value Unit
Drain–to–Source Voltage VDSS 20 Vdc L = Location Code
Drain–to–Gate Voltage (RGS = 1.0 MΩ) VDGR 20 Vdc Y = Year
WW = Work Week
Gate–to–Source Voltage – Continuous VGS ± 20 Vdc
Drain Current – Continuous @ TA = 25°C ID 3.8 Adc
Drain Current – Continuous @ TA = 100°C ID 2.6 PIN ASSIGNMENT
Drain Current – Single Pulse (tp ≤ 10 µs) IDM 19 Apk
Total Power Dissipation @ TA = 25°C PD 2.0 Watts Source–1 1 8 Drain–1
(Note 1.)
Gate–1 2 7 Drain–1
Operating and Storage Temperature Range TJ, Tstg – 55 to °C
Source–2 3 6 Drain–2
150
Gate–2 4 5 Drain–2
Single Pulse Drain–to–Source Avalanche EAS 405 mJ
Energy – Starting TJ = 25°C Top View
(VDD = 20 Vdc, VGS = 5.0 Vdc, Peak
IL = 9.0 Apk, L = 10 mH, RG = 25 Ω)
Thermal Resistance – Junction to Ambient RθJA 62.5 °C/W ORDERING INFORMATION
(Note 1.)
Device Package Shipping
Maximum Lead Temperature for Soldering TL 260 °C
Purposes, 1/8″ from case for 10 seconds MMDF3N02HDR2 SO–8 2500 Tape & Reel
1. Mounted on 2″ square FR4 board (1″ sq. 2 oz. Cu 0.06″ thick single sided) with
one die operating, 10 sec. max.
Preferred devices are recommended choices for future use
and best overall value.

 Semiconductor Components Industries, LLC, 2000 503 Publication Order Number:


November, 2000 – Rev. 6 MMDF3N02HD/D
MMDF3N02HD

ELECTRICAL CHARACTERISTICS (TA = 25°C unless otherwise noted)


Characteristic Symbol Min Typ Max Unit
OFF CHARACTERISTICS
Drain–to–Source Breakdown Voltage V(BR)DSS Vdc
(VGS = 0 Vdc, ID = 250 µAdc) 20 – –
Temperature Coefficient (Positive) – 29 – mV/°C
Zero Gate Voltage Drain Current IDSS µAdc
(VDS = 20 Vdc, VGS = 0 Vdc) – – 1.0
(VDS = 20 Vdc, VGS = 0 Vdc, TJ = 125°C) – – 10
Gate–Body Leakage Current (VGS = ± 20 Vdc, VDS = 0) IGSS – – 100 nAdc
ON CHARACTERISTICS (Note 2.)
Gate Threshold Voltage VGS(th) Vdc
(VDS = VGS, ID = 250 µAdc) 1.0 1.5 2.0
Threshold Temperature Coefficient (Negative) – 4.0 – mV/°C
Static Drain–to–Source On–Resistance RDS(on) Ohms
(VGS = 10 Vdc, ID = 3.0 Adc) – 0.058 0.090
(VGS = 4.5 Vdc, ID = 1.5 Adc) – 0.074 0.100
Forward Transconductance (VDS = 3.0 Vdc, ID = 1.5 Adc) gFS 2.0 3.88 – Mhos
DYNAMIC CHARACTERISTICS
Input Capacitance Ciss – 455 630 pF
Output Capacitance (VDS = 16 Vd
Vdc, VGS = 0 Vd
Vdc,
Coss – 184 250
f = 1.0 MHz)
Transfer Capacitance Crss – 45 90
SWITCHING CHARACTERISTICS (Note 3.)
Turn–On Delay Time td(on) – 11 22 ns
Rise Time (VDD = 10 Vdc, ID = 3.0 Adc, tr – 58 116
VGS = 4
4.55 Vdc
Vdc,
Turn–Off Delay Time RG = 6.0 Ω) td(off) – 17 35
Fall Time tf – 20 40
Turn–On Delay Time td(on) – 7.0 21
Rise Time (VDD = 10 Vdc, ID = 3.0 Adc, tr – 32 64
VGS = 10 Vdc
Vdc,
Turn–Off Delay Time RG = 6.0 Ω) td(off) – 27 54
Fall Time tf – 21 42
Gate Charge QT – 12.5 18 nC
S Fi
See Figure 8
(VDS = 16 Vdc, ID = 3.0 Adc, Q1 – 1.3 –
VGS = 10 Vdc) Q2 – 2.8 –
Q3 – 2.4 –

SOURCE–DRAIN DIODE CHARACTERISTICS


Forward On–Voltage (Note 2.) (IS = 3.0 Adc, VGS = 0 Vdc) VSD – 0.79 1.3 Vdc
(IS = 3.0 Adc, VGS = 0 Vdc, TJ = 125°C) – 0.72 –
Reverse Recovery Time trr – 23 – ns
S Fi
See Figure 15
(IS = 3.0 Adc, VGS = 0 Vdc, ta – 18 –
dIS/dt = 100 A/µs) tb – 5.0 –
Reverse Recovery Stored Charge QRR – 0.025 – µC
2. Pulse Test: Pulse Width ≤ 300 µs, Duty Cycle ≤ 2%.
3. Switching characteristics are independent of operating junction temperature.

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504
MMDF3N02HD

TYPICAL ELECTRICAL CHARACTERISTICS

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Figure 3. On–Resistance versus Figure 4. On–Resistance versus Drain Current


Gate–To–Source Voltage and Gate Voltage

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Figure 5. On–Resistance Variation with Figure 6. Drain–To–Source Leakage


Temperature Current versus Voltage

http://onsemi.com
505
MMDF3N02HD

POWER MOSFET SWITCHING

Switching behavior is most easily modeled and predicted The capacitance (Ciss) is read from the capacitance curve at
by recognizing that the power MOSFET is charge a voltage corresponding to the off–state condition when
controlled. The lengths of various switching intervals (∆t) calculating td(on) and is read at a voltage corresponding to the
are determined by how fast the FET input capacitance can on–state when calculating td(off).
be charged by current from the generator. At high switching speeds, parasitic circuit elements
The published capacitance data is difficult to use for complicate the analysis. The inductance of the MOSFET
calculating rise and fall because drain–gate capacitance source lead, inside the package and in the circuit wiring
varies greatly with applied voltage. Accordingly, gate which is common to both the drain and gate current paths,
charge data is used. In most cases, a satisfactory estimate of produces a voltage at the source which reduces the gate drive
average input current (IG(AV)) can be made from a current. The voltage is determined by Ldi/dt, but since di/dt
rudimentary analysis of the drive circuit so that is a function of drain current, the mathematical solution is
t = Q/IG(AV) complex. The MOSFET output capacitance also
complicates the mathematics. And finally, MOSFETs have
During the rise and fall time interval when switching a finite internal gate resistance which effectively adds to the
resistive load, VGS remains virtually constant at a level resistance of the driving source, but the internal resistance
known as the plateau voltage, VSGP. Therefore, rise and fall is difficult to measure and, consequently, is not specified.
times may be approximated by the following: The resistive switching time variation versus gate
tr = Q2 x RG/(VGG – VGSP) resistance (Figure 9) shows how typical switching
tf = Q2 x RG/VGSP performance is affected by the parasitic circuit elements. If
where the parasitics were not present, the slope of the curves would
maintain a value of unity regardless of the switching speed.
VGG = the gate drive voltage, which varies from zero to VGG
The circuit used to obtain the data is constructed to minimize
RG = the gate drive resistance
common inductance in the drain and gate circuit loops and
and Q2 and VGSP are read from the gate charge curve.
is believed readily achievable with board mounted
During the turn–on and turn–off delay times, gate current is components. Most power electronic loads are inductive; the
not constant. The simplest calculation uses appropriate data in the figure is taken with a resistive load, which
values from the capacitance curves in a standard equation for approximates an optimally snubbed inductive load. Power
voltage change in an RC network. The equations are: MOSFETs may be safely operated into an inductive load;
td(on) = RG Ciss In [VGG/(VGG – VGSP)] however, snubbing reduces switching losses.
td(off) = RG Ciss In (VGG/VGSP)

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Figure 7. Capacitance Variation

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Figure 8. Gate–To–Source and Drain–To–Source Figure 9. Resistive Switching Time


Voltage versus Total Charge Variation versus Gate Resistance

DRAIN–TO–SOURCE DIODE CHARACTERISTICS

The switching characteristics of a MOSFET body diode high di/dts. The diode’s negative di/dt during ta is directly
are very important in systems using it as a freewheeling or controlled by the device clearing the stored charge.
commutating diode. Of particular interest are the reverse However, the positive di/dt during tb is an uncontrollable
recovery characteristics which play a major role in diode characteristic and is usually the culprit that induces
determining switching losses, radiated noise, EMI and RFI. current ringing. Therefore, when comparing diodes, the
System switching losses are largely due to the nature of ratio of tb/ta serves as a good indicator of recovery
the body diode itself. The body diode is a minority carrier abruptness and thus gives a comparative estimate of
device, therefore it has a finite reverse recovery time, trr, due probable noise generated. A ratio of 1 is considered ideal and
to the storage of minority carrier charge, QRR, as shown in values less than 0.5 are considered snappy.
the typical reverse recovery wave form of Figure 15. It is this Compared to ON Semiconductor standard cell density
stored charge that, when cleared from the diode, passes low voltage MOSFETs, high cell density MOSFET diodes
through a potential and defines an energy loss. Obviously, are faster (shorter trr), have less stored charge and a softer
repeatedly forcing the diode through reverse recovery reverse recovery characteristic. The softness advantage of
further increases switching losses. Therefore, one would the high cell density diode means they can be forced through
like a diode with short trr and low QRR specifications to reverse recovery at a higher di/dt than a standard cell
minimize these losses. MOSFET diode without increasing the current ringing or the
The abruptness of diode reverse recovery effects the noise generated. In addition, power dissipation incurred
amount of radiated noise, voltage spikes, and current from switching the diode will be less due to the shorter
ringing. The mechanisms at work are finite irremovable recovery time and lower switching losses.
circuit parasitic inductances and capacitances acted upon by
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Figure 10. Diode Forward Voltage versus Current

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Figure 11. Reverse Recovery Time (trr)

SAFE OPERATING AREA

The Forward Biased Safe Operating Area curves define reliable operation, the stored energy from circuit inductance
the maximum simultaneous drain–to–source voltage and dissipated in the transistor while in avalanche must be less
drain current that a transistor can handle safely when it is than the rated limit and must be adjusted for operating
forward biased. Curves are based upon maximum peak conditions differing from those specified. Although industry
junction temperature and a case temperature (TC) of 25°C. practice is to rate in terms of energy, avalanche energy
Peak repetitive pulsed power limits are determined by using capability is not a constant. The energy rating decreases
the thermal response data in conjunction with the procedures non–linearly with an increase of peak current in avalanche
discussed in AN569, “Transient Thermal Resistance – and peak junction temperature.
General Data and Its Use.” Although many E–FETs can withstand the stress of
Switching between the off–state and the on–state may drain–to–source avalanche at currents up to rated pulsed
traverse any load line provided neither rated peak current current (IDM), the energy rating is specified at rated
(IDM) nor rated voltage (VDSS) is exceeded, and that the continuous current (ID), in accordance with industry
transition time (tr, tf) does not exceed 10 µs. In addition the custom. The energy rating must be derated for temperature
total power averaged over a complete switching cycle must as shown in the accompanying graph (Figure 13). Maximum
not exceed (TJ(MAX) – TC)/(RθJC). energy at currents below rated continuous ID can safely be
A power MOSFET designated E–FET can be safely used assumed to equal the values indicated.
in switching circuits with unclamped inductive loads. For

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Figure 12. Maximum Rated Forward Biased Figure 13. Maximum Avalanche Energy versus
Safe Operating Area Starting Junction Temperature

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TYPICAL ELECTRICAL CHARACTERISTICS



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Figure 15. Diode Reverse Recovery Waveform

http://onsemi.com
509
MMDF3N02HD

INFORMATION FOR USING THE SO–8 SURFACE MOUNT PACKAGE

MINIMUM RECOMMENDED FOOTPRINT FOR SURFACE MOUNTED APPLICATIONS


Surface mount board layout is a critical portion of the total interface between the board and the package. With the
design. The footprint for the semiconductor packages must correct pad geometry, the packages will self–align when
be the correct size to ensure proper solder connection subjected to a solder reflow process.

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SO–8 POWER DISSIPATION


The power dissipation of the SO–8 is a function of the into the equation for an ambient temperature TA of 25°C,
input pad size. This can vary from the minimum pad size one can calculate the power dissipation of the device which
for soldering to the pad size given for maximum power in this case is 2.0 Watts.
dissipation. Power dissipation for a surface mount device is 150°C – 25°C
determined by TJ(max), the maximum rated junction PD = = 2.0 Watts
62.5°C/W
temperature of the die, RθJA, the thermal resistance from
the device junction to ambient; and the operating The 62.5°C/W for the SO–8 package assumes the
temperature, TA. Using the values provided on the data recommended footprint on a glass epoxy printed circuit
sheet for the SO–8 package, PD can be calculated as board to achieve a power dissipation of 2.0 Watts using the
follows: footprint shown. Another alternative would be to use a
TJ(max) – TA
ceramic substrate or an aluminum core board such as
PD = Thermal Cladt. Using board material such as Thermal
RθJA
Clad, the power dissipation can be doubled using the same
The values for the equation are found in the maximum footprint.
ratings table on the data sheet. Substituting these values

SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • The soldering temperature and time shall not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within • When shifting from preheating to soldering, the
a short time could result in device failure. Therefore, the maximum temperature gradient shall be 5°C or less.
following items should always be observed in order to • After soldering has been completed, the device should
minimize the thermal stress to which the devices are be allowed to cool naturally for at least three minutes.
subjected. Gradual cooling should be used as the use of forced
• Always preheat the device. cooling will increase the temperature gradient and
• The delta temperature between the preheat and result in latent failure due to mechanical stress.
soldering should be 100°C or less.* • Mechanical stress or shock should not be applied
• When preheating and soldering, the temperature of the during cooling.
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When * Soldering a device without preheating can cause
using infrared heating with the reflow soldering excessive thermal shock and stress which can result in
method, the difference shall be a maximum of 10°C. damage to the device.

http://onsemi.com
510
MMDF3N02HD

TYPICAL SOLDER HEATING PROFILE


For any given circuit board, there will be a group of temperature versus time. The line on the graph shows the
control settings that will give the desired heat pattern. The actual temperature that might be experienced on the surface
operator must set temperatures for several heating zones of a test board at or near a central solder joint. The two
and a figure for belt speed. Taken together, these control profiles are based on a high density and a low density
settings make up a heating “profile” for that particular board. The Vitronics SMD310 convection/infrared reflow
circuit board. On machines controlled by a computer, the soldering system was used to generate this profile. The type
computer remembers these profiles from one operating of solder used was 62/36/2 Tin Lead Silver with a melting
session to the next. Figure 16 shows a typical heating point between 177–189°C. When this type of furnace is
profile for use when soldering a surface mount device to a used for solder reflow work, the circuit boards and solder
printed circuit board. This profile will vary among joints tend to heat first. The components on the board are
soldering systems, but it is a good starting point. Factors then heated by conduction. The circuit board, because it has
that can affect the profile include the type of soldering a large surface area, absorbs the thermal energy more
system in use, density and types of components on the efficiently, then distributes this energy to the components.
board, type of solder used, and the type of board or Because of this effect, the main body of a component may
substrate material being used. This profile shows be up to 30 degrees cooler than the adjacent solder joints.

STEP 1 STEP 2 STEP 3 STEP 4 STEP 5 STEP 6 STEP 7


PREHEAT VENT HEATING HEATING HEATING VENT COOLING
ZONE 1 “SOAK” ZONES 2 & 5 ZONES 3 & 6 ZONES 4 & 7
“RAMP” “RAMP” “SOAK” “SPIKE” 205° TO 219°C
PEAK AT
200°C DESIRED CURVE FOR HIGH 170°C SOLDER
MASS ASSEMBLIES JOINT
160°C
150°C

150°C
SOLDER IS LIQUID FOR
40 TO 80 SECONDS
100°C 140°C (DEPENDING ON
MASS OF ASSEMBLY)
100°C

DESIRED CURVE FOR LOW


MASS ASSEMBLIES
5°C

TIME (3 TO 7 MINUTES TOTAL) TMAX


Figure 16. Typical Solder Heating Profile

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511
(!!.
Preferred Device

#$%& '(
!  !  
N–Channel SO–8, Dual
These miniature surface mount MOSFETs feature ultra low RDS(on)
and true logic level performance. They are capable of withstanding
high energy in the avalanche and commutation modes and the http://onsemi.com
drain–to–source diode has a very low reverse recovery time.
MiniMOSt devices are designed for use in low voltage, high speed 3 AMPERES
switching applications where power efficiency is important. Typical 30 VOLTS
applications are dc–dc converters, and power management in portable
and battery powered products such as computers, printers, cellular and RDS(on) = 70 m
cordless phones. They can also be used for low voltage motor controls
in mass storage products such as disk drives and tape drives. The N–Channel
avalanche energy is specified to eliminate the guesswork in designs 
where inductive loads are switched and offer additional safety margin
against unexpected voltage transients.
• Ultra Low RDS(on) Provides Higher Efficiency and Extends Battery
Life 
• Logic Level Gate Drive – Can Be Driven by Logic ICs
• Miniature SO–8 Surface Mount Package – Saves Board Space 
• Diode Is Characterized for Use In Bridge Circuits
• Diode Exhibits High Speed, With Soft Recovery MARKING
• IDSS Specified at Elevated Temperature DIAGRAM

• Avalanche Energy Specified


• Mounting Information for SO–8 Package Provided SO–8, Dual
D3N03
8 CASE 751
LYWW
STYLE 11
MAXIMUM RATINGS (TJ = 25°C unless otherwise noted)
Rating Symbol Value Unit 1

Drain–to–Source Voltage VDSS 30 Vdc L = Location Code


Drain–to–Gate Voltage (RGS = 1.0 MΩ) VDGR 30 Vdc Y = Year
Gate–to–Source Voltage – Continuous VGS ± 20 Vdc WW = Work Week
Drain Current – Continuous @ TA = 25°C ID 4.1 Adc
Drain Current – Continuous @ TA = 100°C ID 3.0
Drain Current – Single Pulse (tp ≤ 10 µs) IDM 40 Apk PIN ASSIGNMENT
Total Power Dissipation @ TA = 25°C PD 2.0 Watts
Source–1 1 8 Drain–1
(Note 1.)
Gate–1 2 7 Drain–1
Operating and Storage Temperature Range TJ, Tstg – 55 to °C
150 Source–2 3 6 Drain–2
Single Pulse Drain–to–Source Avalanche EAS 324 mJ Gate–2 4 5 Drain–2
Energy – Starting TJ = 25°C Top View
(VDD = 30 Vdc, VGS = 5.0 Vdc, Peak
IL = 9.0 Apk, L = 8.0 mH, RG = 25 Ω)
Thermal Resistance – Junction to Ambient RθJA 62.5 °C/W ORDERING INFORMATION
(Note 1.)
Device Package Shipping
Maximum Lead Temperature for Soldering TL 260 °C
Purposes, 1/8″ from case for 10 seconds MMDF3N03HDR2 SO–8 2500 Tape & Reel
1. When mounted on 2″ square FR–4 board (1″ square 2 oz. Cu 0.06″ thick
single sided) with one die operating, 10s max.
Preferred devices are recommended choices for future use
and best overall value.

 Semiconductor Components Industries, LLC, 2000 512 Publication Order Number:


November, 2000 – Rev. 7 MMDF3N03HD/D
MMDF3N03HD

ELECTRICAL CHARACTERISTICS (TA = 25°C unless otherwise noted)


Characteristic Symbol Min Typ Max Unit
OFF CHARACTERISTICS
Drain–to–Source Breakdown Voltage V(BR)DSS Vdc
(VGS = 0 Vdc, ID = 250 µAdc) 30 – –
Temperature Coefficient (Positive) – 34.5 – mV/°C
Zero Gate Voltage Drain Current IDSS µAdc
(VDS = 30 Vdc, VGS = 0 Vdc) – – 1.0
(VDS = 30 Vdc, VGS = 0 Vdc, TJ = 125°C) – – 10
Gate–Body Leakage Current (VGS = ± 20 Vdc, VDS = 0) IGSS – – 100 nAdc
ON CHARACTERISTICS (Note 2.)
Gate Threshold Voltage VGS(th) Vdc
(VDS = VGS, ID = 250 µAdc) 1.0 1.7 3.0
Threshold Temperature Coefficient (Negative) mV/°C
Static Drain–to–Source On–Resistance RDS(on) Ohms
(VGS = 10 Vdc, ID = 3.0 Adc) – 0.06 0.07
(VGS = 4.5 Vdc, ID = 1.5 Adc) – 0.065 0.075
Forward Transconductance gFS Mhos
(VDS = 3.0 Vdc, ID = 1.5 Adc) 2.0 3.6 –

DYNAMIC CHARACTERISTICS
Input Capacitance Ciss – 450 630 pF
Output Capacitance (VDS = 24 Vd
Vdc, VGS = 0 Vd
Vdc,
Coss – 160 225
f = 1.0 MHz)
Transfer Capacitance Crss – 35 70

SWITCHING CHARACTERISTICS (Note 3.)


Turn–On Delay Time td(on) – 12 24 ns
Rise Time (VDD = 15 Vdc, ID = 3.0 Adc, tr – 65 130
VGS = 4
4.55 Vdc
Vdc,
Turn–Off Delay Time RG = 9.1 Ω) td(off) – 16 32
Fall Time tf – 19 38
Turn–On Delay Time td(on) – 8 16 ns
Rise Time (VDD = 15 Vdc, ID = 3.0 Adc, tr – 15 30
VGS = 10 Vdc
Vdc,
Turn–Off Delay Time RG = 9.1 Ω) td(off) – 30 60
Fall Time tf – 23 46
Gate Charge QT – 11.5 16 nC

(VDS = 10 Vdc, ID = 3.0 Adc, Q1 – 1.5 –


VGS = 10 Vdc) Q2 – 3.5 –
Q3 – 2.8 –
SOURCE–DRAIN DIODE CHARACTERISTICS
Forward On–Voltage (Note 2.) (IS = 3.0 Adc, VGS = 0 Vdc) VSD Vdc
(IS = 3.0 Adc, VGS = 0 Vdc, – 0.82 1.2
TJ = 125°C) – 0.7 –
Reverse Recovery Time trr – 24 – ns
S Fi
See Figure 12 (IS = 3.0
3 0 Adc,
Ad VGS = 0 Vdc,
Vd
ta – 17 –
dIS/dt = 100 A/µs)
tb – 7 –
Reverse Recovery Storage Charge QRR – 0.025 – µC
2. Pulse Test: Pulse Width ≤ 300 µs, Duty Cycle ≤ 2%.
3. Switching characteristics are independent of operating junction temperature.

http://onsemi.com
513
MMDF3N03HD

TYPICAL ELECTRICAL CHARACTERISTICS

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Figure 3. On–Resistance versus Figure 4. On–Resistance versus Drain Current


Gate–to–Source Voltage and Gate Voltage

 


   
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Figure 5. On–Resistance Variation Figure 6. Drain–to–Source Leakage Current


with Temperature versus Voltage

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514
MMDF3N03HD

POWER MOSFET SWITCHING

Switching behavior is most easily modeled and predicted During the turn–on and turn–off delay times, gate current is
by recognizing that the power MOSFET is charge not constant. The simplest calculation uses appropriate
controlled. The lengths of various switching intervals (∆t) values from the capacitance curves in a standard equation for
are determined by how fast the FET input capacitance can voltage change in an RC network. The equations are:
be charged by current from the generator. td(on) = RG Ciss In [VGG/(VGG – VGSP)]
The published capacitance data is difficult to use for td(off) = RG Ciss In (VGG/VGSP)
calculating rise and fall because drain–gate capacitance
varies greatly with applied voltage. Accordingly, gate The capacitance (Ciss) is read from the capacitance curve at
charge data is used. In most cases, a satisfactory estimate of a voltage corresponding to the off–state condition when
average input current (IG(AV)) can be made from a calculating td(on) and is read at a voltage corresponding to the
rudimentary analysis of the drive circuit so that on–state when calculating td(off).
At high switching speeds, parasitic circuit elements
t = Q/IG(AV) complicate the analysis. The inductance of the MOSFET
During the rise and fall time interval when switching a source lead, inside the package and in the circuit wiring
resistive load, VGS remains virtually constant at a level which is common to both the drain and gate current paths,
known as the plateau voltage, VSGP. Therefore, rise and fall produces a voltage at the source which reduces the gate drive
times may be approximated by the following: current. The voltage is determined by Ldi/dt, but since di/dt
tr = Q2 x RG/(VGG – VGSP) is a function of drain current, the mathematical solution is
tf = Q2 x RG/VGSP complex. The MOSFET output capacitance also
complicates the mathematics. And finally, MOSFETs have
where finite internal gate resistance which effectively adds to the
VGG = the gate drive voltage, which varies from zero to VGG resistance of the driving source, but the internal resistance
RG = the gate drive resistance is difficult to measure and, consequently, is not specified.
and Q2 and VGSP are read from the gate charge curve.

DRAIN–TO–SOURCE DIODE CHARACTERISTICS

The switching characteristics of a MOSFET body diode high di/dts. The diode’s negative di/dt during ta is directly
are very important in systems using it as a freewheeling or controlled by the device clearing the stored charge.
commutating diode. Of particular interest are the reverse However, the positive di/dt during tb is an uncontrollable
recovery characteristics which play a major role in diode characteristic and is usually the culprit that induces
determining switching losses, radiated noise, EMI and RFI. current ringing. Therefore, when comparing diodes, the
System switching losses are largely due to the nature of ratio of tb/ta serves as a good indicator of recovery
the body diode itself. The body diode is a minority carrier abruptness and thus gives a comparative estimate of
device, therefore it has a finite reverse recovery time, trr, due probable noise generated. A ratio of 1 is considered ideal and
to the storage of minority carrier charge, QRR, as shown in values less than 0.5 are considered snappy.
the typical reverse recovery wave form of Figure 11. It is this Compared to ON Semiconductor standard cell density
stored charge that, when cleared from the diode, passes low voltage MOSFETs, high cell density MOSFET diodes
through a potential and defines an energy loss. Obviously, are faster (shorter trr), have less stored charge and a softer
repeatedly forcing the diode through reverse recovery reverse recovery characteristic. The softness advantage of
further increases switching losses. Therefore, one would the high cell density diode means they can be forced through
like a diode with short trr and low QRR specifications to reverse recovery at a higher di/dt than a standard cell
minimize these losses. MOSFET diode without increasing the current ringing or the
The abruptness of diode reverse recovery effects the noise generated. In addition, power dissipation incurred
amount of radiated noise, voltage spikes, and current from switching the diode will be less due to the shorter
ringing. The mechanisms at work are finite irremovable recovery time and lower switching losses.
circuit parasitic inductances and capacitances acted upon by

http://onsemi.com
515
MMDF3N03HD

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Figure 7. Reverse Recovery Time (trr)

SAFE OPERATING AREA

The Forward Biased Safe Operating Area curves define reliable operation, the stored energy from circuit inductance
the maximum simultaneous drain–to–source voltage and dissipated in the transistor while in avalanche must be less
drain current that a transistor can handle safely when it is than the rated limit and must be adjusted for operating
forward biased. Curves are based upon maximum peak conditions differing from those specified. Although industry
junction temperature and a case temperature (TC) of 25°C. practice is to rate in terms of energy, avalanche energy
Peak repetitive pulsed power limits are determined by using capability is not a constant. The energy rating decreases
the thermal response data in conjunction with the procedures non–linearly with an increase of peak current in avalanche
discussed in AN569, “Transient Thermal Resistance – and peak junction temperature.
General Data and Its Use.” Although many E–FETs can withstand the stress of
Switching between the off–state and the on–state may drain–to–source avalanche at currents up to rated pulsed
traverse any load line provided neither rated peak current current (IDM), the energy rating is specified at rated
(IDM) nor rated voltage (VDSS) is exceeded, and that the continuous current (ID), in accordance with industry
transition time (tr, tf) does not exceed 10 µs. In addition the custom. The energy rating must be derated for temperature
total power averaged over a complete switching cycle must as shown in the accompanying graph (Figure 9). Maximum
not exceed (TJ(MAX) – TC)/(RθJC). energy at currents below rated continuous ID can safely be
A power MOSFET designated E–FET can be safely used assumed to equal the values indicated.
in switching circuits with unclamped inductive loads. For

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Figure 12. Maximum Rated Forward Biased Figure 13. Maximum Avalanche Energy versus
Safe Operating Area Starting Junction Temperature

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TYPICAL ELECTRICAL CHARACTERISTICS



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Figure 15. Diode Reverse Recovery Waveform

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MMDF3N03HD

INFORMATION FOR USING THE SO–8 SURFACE MOUNT PACKAGE

MINIMUM RECOMMENDED FOOTPRINT FOR SURFACE MOUNTED APPLICATIONS


Surface mount board layout is a critical portion of the total interface between the board and the package. With the
design. The footprint for the semiconductor packages must correct pad geometry, the packages will self–align when
be the correct size to ensure proper solder connection subjected to a solder reflow process.

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SO–8 POWER DISSIPATION


The power dissipation of the SO–8 is a function of the into the equation for an ambient temperature TA of 25°C,
input pad size. This can vary from the minimum pad size one can calculate the power dissipation of the device which
for soldering to the pad size given for maximum power in this case is 2.0 Watts.
dissipation. Power dissipation for a surface mount device is
PD = 150°C – 25°C = 2.0 Watts
determined by TJ(max), the maximum rated junction 62.5°C/W
temperature of the die, RθJA, the thermal resistance from
the device junction to ambient; and the operating The 62.5°C/W for the SO–8 package assumes the
temperature, TA. Using the values provided on the data recommended footprint on a glass epoxy printed circuit
sheet for the SO–8 package, PD can be calculated as board to achieve a power dissipation of 2.0 Watts using the
follows: footprint shown. Another alternative would be to use a
TJ(max) – TA
ceramic substrate or an aluminum core board such as
PD = Thermal Cladt. Using board material such as Thermal
RθJA
Clad, the power dissipation can be doubled using the same
The values for the equation are found in the maximum footprint.
ratings table on the data sheet. Substituting these values

SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • The soldering temperature and time shall not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within • When shifting from preheating to soldering, the
a short time could result in device failure. Therefore, the maximum temperature gradient shall be 5°C or less.
following items should always be observed in order to • After soldering has been completed, the device should
minimize the thermal stress to which the devices are be allowed to cool naturally for at least three minutes.
subjected. Gradual cooling should be used as the use of forced
• Always preheat the device. cooling will increase the temperature gradient and
• The delta temperature between the preheat and result in latent failure due to mechanical stress.
soldering should be 100°C or less.* • Mechanical stress or shock should not be applied
• When preheating and soldering, the temperature of the during cooling.
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When * Soldering a device without preheating can cause
using infrared heating with the reflow soldering excessive thermal shock and stress which can result in
method, the difference shall be a maximum of 10°C. damage to the device.

http://onsemi.com
519
MMDF3N03HD

TYPICAL SOLDER HEATING PROFILE


For any given circuit board, there will be a group of temperature versus time. The line on the graph shows the
control settings that will give the desired heat pattern. The actual temperature that might be experienced on the surface
operator must set temperatures for several heating zones of a test board at or near a central solder joint. The two
and a figure for belt speed. Taken together, these control profiles are based on a high density and a low density
settings make up a heating “profile” for that particular board. The Vitronics SMD310 convection/infrared reflow
circuit board. On machines controlled by a computer, the soldering system was used to generate this profile. The type
computer remembers these profiles from one operating of solder used was 62/36/2 Tin Lead Silver with a melting
session to the next. Figure 12 shows a typical heating point between 177–189°C. When this type of furnace is
profile for use when soldering a surface mount device to a used for solder reflow work, the circuit boards and solder
printed circuit board. This profile will vary among joints tend to heat first. The components on the board are
soldering systems, but it is a good starting point. Factors then heated by conduction. The circuit board, because it has
that can affect the profile include the type of soldering a large surface area, absorbs the thermal energy more
system in use, density and types of components on the efficiently, then distributes this energy to the components.
board, type of solder used, and the type of board or Because of this effect, the main body of a component may
substrate material being used. This profile shows be up to 30 degrees cooler than the adjacent solder joints.

STEP 1 STEP 2 STEP 3 STEP 4 STEP 5 STEP 6 STEP 7


PREHEAT VENT HEATING HEATING HEATING VENT COOLING
ZONE 1 “SOAK” ZONES 2 & 5 ZONES 3 & 6 ZONES 4 & 7
“RAMP” “RAMP” “SOAK” “SPIKE” 205° TO 219°C
PEAK AT
200°C DESIRED CURVE FOR HIGH 170°C SOLDER
MASS ASSEMBLIES JOINT
160°C
150°C

150°C
SOLDER IS LIQUID FOR
40 TO 80 SECONDS
100°C 140°C (DEPENDING ON
MASS OF ASSEMBLY)
100°C

DESIRED CURVE FOR LOW


MASS ASSEMBLIES
5°C

TIME (3 TO 7 MINUTES TOTAL) TMAX


Figure 16. Typical Solder Heating Profile

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520
(!.
Preferred Device

#$%& '(
!    
N–Channel SO–8, Dual
These miniature surface mount MOSFETs feature ultra low RDS(on) and
true logic level performance. They are capable of withstanding high energy
in the avalanche and commutation modes and the drain–to–source diode http://onsemi.com
has a very low reverse recovery time. MiniMOSt devices are designed
for use in low voltage, high speed switching applications where power 3 AMPERES
efficiency is important. Typical applications are dc–dc converters, and 40 VOLTS
power management in portable and battery powered products such as
computers, printers, cellular and cordless phones. They can also be used for
RDS(on) = 80 m
low voltage motor controls in mass storage products such as disk drives
and tape drives. The avalanche energy is specified to eliminate the N–Channel
guesswork in designs where inductive loads are switched and offer 
additional safety margin against unexpected voltage transients.
• Ultra Low RDS(on) Provides Higher Efficiency and Extends Battery
Life

• Logic Level Gate Drive – Can Be Driven by Logic ICs
• Miniature SO–8 Surface Mount Package – Saves Board Space

• Diode Is Characterized for Use In Bridge Circuits
• Diode Exhibits High Speed, With Soft Recovery
• IDSS Specified at Elevated Temperature MARKING
DIAGRAM
• Mounting Information for SO–8 Package Provided
• Avalanche Energy Specified
SO–8, Dual
D3N04H
8 CASE 751
LYWW
STYLE 14
1

L = Location Code
Y = Year
WW = Work Week

PIN ASSIGNMENT

N–Source 1 8 N–Drain
N–Gate 2 7 N–Drain
P–Source 3 6 P–Drain
P–Gate 4 5 P–Drain
Top View

ORDERING INFORMATION

Device Package Shipping

MMDF3N04HDR2 SO–8 2500 Tape & Reel

Preferred devices are recommended choices for future use


and best overall value.

 Semiconductor Components Industries, LLC, 2000 521 Publication Order Number:


November, 2000 – Rev. 2 MMDF3N04HD/D
MMDF3N04HD

MAXIMUM RATINGS (TJ = 25°C unless otherwise noted)


Rating Symbol Value Unit
Drain–to–Source Voltage VDSS 40 Vdc
Drain–to–Gate Voltage (RGS = 1.0 MΩ) VDGR 40 Vdc
Gate–to–Source Voltage – Continuous VGS ± 20 Vdc
Drain Current – Continuous @ TA = 25°C (Note 1.) ID 3.4 Adc
Drain Current– Continuous @ TA = 70°C (Note 1.) ID 3.0
Drain Current– Pulsed Drain Current (Note 3.) IDM 40 Apk
Total Power Dissipation @ TA = 25°C (Note 1.) PD 2.0 Watts
Linear Derating Factor (1) 16 mW/°C
Total Power Dissipation @ TA = 25°C (Note 2.) PD 1.39 Watts
Linear Derating Factor (2) 11.11 mW/°C
Operating and Storage Temperature Range TJ, Tstg – 55 to 150 °C
Single Pulse Drain–to–Source Avalanche Energy – Starting TJ = 25°C EAS mJ
(VDD = 25 Vdc, VGS = 10 Vdc, Peak IL = 9.0 Apk, L = 4.0 mH, VDS = 40 Vdc) 162

THERMAL RESISTANCE
Rating Symbol Typ. Max. Unit
Thermal Resistance – Junction to Ambient, PCB Mount (Note 1.) RθJA – 62.5 °C/W
– Junction to Ambient, PCB Mount (Note 2.) RθJA – 90
1. When mounted on 1″ square FR–4 or G–10 board (VGS = 10 V, @ 10 Seconds)
2. When mounted on minimum recommended FR–4 or G–10 board (VGS = 10 V, @ Steady State)
3. Repetitive rating; pulse width limited by maximum junction temperature.

http://onsemi.com
522
MMDF3N04HD

ELECTRICAL CHARACTERISTICS (TC = 25°C unless otherwise noted)


Characteristic Symbol Min Typ Max Unit
OFF CHARACTERISTICS
Drain–to–Source Breakdown Voltage (Cpk ≥ 2.0) (Notes 4. & 6.) V(BR)DSS Vdc
(VGS = 0 Vdc, ID = 0.25 mAdc) 40 – –
Temperature Coefficient (Positive) – 4.3 – mV/°C
Zero Gate Voltage Drain Current IDSS µAdc
(VDS = 40 Vdc, VGS = 0 Vdc) – 0.015 2.5
(VDS = 40 Vdc, VGS = 0 Vdc, TJ = 125°C) – 0.15 10
Gate–Body Leakage Current (VGS = ± 20 Vdc, VDS = 0) IGSS – 0.013 500 nAdc
ON CHARACTERISTICS (Note 4.)
Gate Threshold Voltage (Cpk ≥ 2.0) (Notes 4. & 6.) VGS(th) Vdc
(VDS = VGS, ID = 0.25 mAdc) 1.0 2.0 3.0
Threshold Temperature Coefficient (Negative) – 4.9 – mV/°C
Static Drain–to–Source On–Resistance (Cpk ≥ 2.0) (Notes 4. & 6.) RDS(on) mΩ
(VGS = 10 Vdc, ID = 3.4 Adc) – 55 80
(VGS = 4.5 Vdc, ID = 1.7 Adc) – 79 100
Forward Transconductance (VDS = 3.0 Vdc, ID = 1.7 Adc) (Note 4.) gFS 2.0 4.5 – Mhos
DYNAMIC CHARACTERISTICS
Input Capacitance Ciss – 450 900 pF
Output Capacitance (VDS = 32 Vd
Vdc, VGS = 0 Vd
Vdc,
Coss – 130 230
f = 1.0 MHz)
Transfer Capacitance Crss – 32 96
SWITCHING CHARACTERISTICS (Note 5.)
Turn–On Delay Time td(on) – 9.0 18 ns
Rise Time (VDD = 20 Vdc, ID = 3.4 Adc, tr – 15 30
Turn–Off Delay Time VGS = 10 Vdc, RG = 6 Ω) (Note 4.) td(off) – 28 56
Fall Time tf – 19 38
Turn–On Delay Time td(on) – 13 26 ns
Rise Time (VDD = 20 Vdc, ID = 1.7 Adc, tr – 77 144
Turn–Off Delay Time VGS = 4.5 Vdc, RG = 6 Ω) (Note 4.) td(off) – 17 34
Fall Time tf – 20 40
Gate Charge QT – 13.9 28 nC

(VDS = 40 Vdc, ID = 3.4 Adc, Q1 – 2.1 –


VGS = 10 Vdc) (Note 4.) Q2 – 3.7 –
Q3 – 5.4 –

SOURCE–DRAIN DIODE CHARACTERISTICS


Forward On–Voltage (IS = 3.4 Adc, VGS = 0 Vdc) (Note 4.) VSD Vdc
(IS = 3.4 Adc, VGS = 0 Vdc, – 0.87 1.5
TJ = 125°C) – 0.8 –
Reverse Recovery Time trr – 27 – ns
(IS = 3.4
3 4 Adc,
Ad VGS = 0 Vdc,
Vd
ta – 20 –
dIS/dt = 100 A/µs) (Note 4.)
tb – 7.0 –
Reverse Recovery Storage Charge QRR – 0.03 – µC
4. Pulse Test: Pulse Width ≤ 300 µs, Duty Cycle ≤ 2%.
5. Switching characteristics are independent of operating junction temperature.
6. Reflects typical values. Max limit – Typ
Cpk =
3 x SIGMA

http://onsemi.com
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MMDF3N04HD

TYPICAL ELECTRICAL CHARACTERISTICS

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Figure 3. On–Resistance versus Figure 4. On–Resistance versus Drain Current


Gate–to–Source Voltage and Gate Voltage

 


   
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Figure 5. On–Resistance Variation Figure 6. Drain–to–Source Leakage Current


with Temperature versus Voltage

http://onsemi.com
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MMDF3N04HD

POWER MOSFET SWITCHING

Switching behavior is most easily modeled and predicted The capacitance (Ciss) is read from the capacitance curve at
by recognizing that the power MOSFET is charge a voltage corresponding to the off–state condition when
controlled. The lengths of various switching intervals (∆t) calculating td(on) and is read at a voltage corresponding to the
are determined by how fast the FET input capacitance can on–state when calculating td(off).
be charged by current from the generator. At high switching speeds, parasitic circuit elements
The published capacitance data is difficult to use for complicate the analysis. The inductance of the MOSFET
calculating rise and fall because drain–gate capacitance source lead, inside the package and in the circuit wiring
varies greatly with applied voltage. Accordingly, gate which is common to both the drain and gate current paths,
charge data is used. In most cases, a satisfactory estimate of produces a voltage at the source which reduces the gate drive
average input current (IG(AV)) can be made from a current. The voltage is determined by Ldi/dt, but since di/dt
rudimentary analysis of the drive circuit so that is a function of drain current, the mathematical solution is
t = Q/IG(AV) complex. The MOSFET output capacitance also
complicates the mathematics. And finally, MOSFETs have
During the rise and fall time interval when switching a finite internal gate resistance which effectively adds to the
resistive load, VGS remains virtually constant at a level resistance of the driving source, but the internal resistance
known as the plateau voltage, VSGP. Therefore, rise and fall is difficult to measure and, consequently, is not specified.
times may be approximated by the following: The resistive switching time variation versus gate
tr = Q2 x RG/(VGG – VGSP) resistance (Figure 9) shows how typical switching
tf = Q2 x RG/VGSP performance is affected by the parasitic circuit elements. If
where the parasitics were not present, the slope of the curves would
maintain a value of unity regardless of the switching speed.
VGG = the gate drive voltage, which varies from zero to VGG
The circuit used to obtain the data is constructed to minimize
RG = the gate drive resistance
common inductance in the drain and gate circuit loops and
and Q2 and VGSP are read from the gate charge curve.
is believed readily achievable with board mounted
During the turn–on and turn–off delay times, gate current is components. Most power electronic loads are inductive; the
not constant. The simplest calculation uses appropriate data in the figure is taken with a resistive load, which
values from the capacitance curves in a standard equation for approximates an optimally snubbed inductive load. Power
voltage change in an RC network. The equations are: MOSFETs may be safely operated into an inductive load;
td(on) = RG Ciss In [VGG/(VGG – VGSP)] however, snubbing reduces switching losses.
td(off) = RG Ciss In (VGG/VGSP)

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Figure 8. Gate–To–Source and Drain–To–Source Figure 9. Resistive Switching Time


Voltage versus Total Charge Variation versus Gate Resistance

DRAIN–TO–SOURCE DIODE CHARACTERISTICS

The switching characteristics of a MOSFET body diode high di/dts. The diode’s negative di/dt during ta is directly
are very important in systems using it as a freewheeling or controlled by the device clearing the stored charge.
commutating diode. Of particular interest are the reverse However, the positive di/dt during tb is an uncontrollable
recovery characteristics which play a major role in diode characteristic and is usually the culprit that induces
determining switching losses, radiated noise, EMI and RFI. current ringing. Therefore, when comparing diodes, the
System switching losses are largely due to the nature of ratio of tb/ta serves as a good indicator of recovery
the body diode itself. The body diode is a minority carrier abruptness and thus gives a comparative estimate of
device, therefore it has a finite reverse recovery time, trr, due probable noise generated. A ratio of 1 is considered ideal and
to the storage of minority carrier charge, QRR, as shown in values less than 0.5 are considered snappy.
the typical reverse recovery wave form of Figure 12. It is this Compared to ON Semiconductor standard cell density
stored charge that, when cleared from the diode, passes low voltage MOSFETs, high cell density MOSFET diodes
through a potential and defines an energy loss. Obviously, are faster (shorter trr), have less stored charge and a softer
repeatedly forcing the diode through reverse recovery reverse recovery characteristic. The softness advantage of
further increases switching losses. Therefore, one would the high cell density diode means they can be forced through
like a diode with short trr and low QRR specifications to reverse recovery at a higher di/dt than a standard cell
minimize these losses. MOSFET diode without increasing the current ringing or the
The abruptness of diode reverse recovery effects the noise generated. In addition, power dissipation incurred
amount of radiated noise, voltage spikes, and current from switching the diode will be less due to the shorter
ringing. The mechanisms at work are finite irremovable recovery time and lower switching losses.
circuit parasitic inductances and capacitances acted upon by
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Figure 10. Diode Forward Voltage versus Current

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Figure 11. Reverse Recovery Time (trr)

SAFE OPERATING AREA

The Forward Biased Safe Operating Area curves define reliable operation, the stored energy from circuit inductance
the maximum simultaneous drain–to–source voltage and dissipated in the transistor while in avalanche must be less
drain current that a transistor can handle safely when it is than the rated limit and must be adjusted for operating
forward biased. Curves are based upon maximum peak conditions differing from those specified. Although industry
junction temperature and a case temperature (TC) of 25°C. practice is to rate in terms of energy, avalanche energy
Peak repetitive pulsed power limits are determined by using capability is not a constant. The energy rating decreases
the thermal response data in conjunction with the procedures non–linearly with an increase of peak current in avalanche
discussed in AN569, “Transient Thermal Resistance – and peak junction temperature.
General Data and Its Use.” Although many E–FETs can withstand the stress of
Switching between the off–state and the on–state may drain–to–source avalanche at currents up to rated pulsed
traverse any load line provided neither rated peak current current (IDM), the energy rating is specified at rated
(IDM) nor rated voltage (VDSS) is exceeded, and that the continuous current (ID), in accordance with industry
transition time (tr, tf) does not exceed 10 µs. In addition the custom. The energy rating must be derated for temperature
total power averaged over a complete switching cycle must as shown in the accompanying graph (Figure 13). Maximum
not exceed (TJ(MAX) – TC)/(RθJC). energy at currents below rated continuous ID can safely be
A power MOSFET designated E–FET can be safely used assumed to equal the values indicated.
in switching circuits with unclamped inductive loads. For

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Safe Operating Area Starting Junction Temperature

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TYPICAL ELECTRICAL CHARACTERISTICS

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Figure 14. Thermal Response

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Figure 15. Diode Reverse Recovery Waveform

http://onsemi.com
528
MMDF3N04HD

INFORMATION FOR USING THE SO–8 SURFACE MOUNT PACKAGE

MINIMUM RECOMMENDED FOOTPRINT FOR SURFACE MOUNTED APPLICATIONS


Surface mount board layout is a critical portion of the total interface between the board and the package. With the
design. The footprint for the semiconductor packages must correct pad geometry, the packages will self–align when
be the correct size to ensure proper solder connection subjected to a solder reflow process.

6
6

#8 #9
$#8 4#

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48 9$
inches
mm

SO–8 POWER DISSIPATION


The power dissipation of the SO–8 is a function of the into the equation for an ambient temperature TA of 25°C,
input pad size. This can vary from the minimum pad size one can calculate the power dissipation of the device which
for soldering to the pad size given for maximum power in this case is 2.0 Watts.
dissipation. Power dissipation for a surface mount device is
PD = 150°C – 25°C = 2.0 Watts
determined by TJ(max), the maximum rated junction 62.5°C/W
temperature of the die, RθJA, the thermal resistance from
the device junction to ambient; and the operating The 62.5°C/W for the SO–8 package assumes the
temperature, TA. Using the values provided on the data recommended footprint on a glass epoxy printed circuit
sheet for the SO–8 package, PD can be calculated as board to achieve a power dissipation of 2.0 Watts using the
follows: footprint shown. Another alternative would be to use a
TJ(max) – TA
ceramic substrate or an aluminum core board such as
PD = Thermal Cladt. Using board material such as Thermal
RθJA
Clad, the power dissipation can be doubled using the same
The values for the equation are found in the maximum footprint.
ratings table on the data sheet. Substituting these values

SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • The soldering temperature and time shall not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within • When shifting from preheating to soldering, the
a short time could result in device failure. Therefore, the maximum temperature gradient shall be 5°C or less.
following items should always be observed in order to • After soldering has been completed, the device should
minimize the thermal stress to which the devices are be allowed to cool naturally for at least three minutes.
subjected. Gradual cooling should be used as the use of forced
• Always preheat the device. cooling will increase the temperature gradient and
• The delta temperature between the preheat and result in latent failure due to mechanical stress.
soldering should be 100°C or less.* • Mechanical stress or shock should not be applied
• When preheating and soldering, the temperature of the during cooling.
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When * Soldering a device without preheating can cause
using infrared heating with the reflow soldering excessive thermal shock and stress which can result in
method, the difference shall be a maximum of 10°C. damage to the device.

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529
MMDF3N04HD

TYPICAL SOLDER HEATING PROFILE


For any given circuit board, there will be a group of temperature versus time. The line on the graph shows the
control settings that will give the desired heat pattern. The actual temperature that might be experienced on the surface
operator must set temperatures for several heating zones of a test board at or near a central solder joint. The two
and a figure for belt speed. Taken together, these control profiles are based on a high density and a low density
settings make up a heating “profile” for that particular board. The Vitronics SMD310 convection/infrared reflow
circuit board. On machines controlled by a computer, the soldering system was used to generate this profile. The type
computer remembers these profiles from one operating of solder used was 62/36/2 Tin Lead Silver with a melting
session to the next. Figure 12 shows a typical heating point between 177–189°C. When this type of furnace is
profile for use when soldering a surface mount device to a used for solder reflow work, the circuit boards and solder
printed circuit board. This profile will vary among joints tend to heat first. The components on the board are
soldering systems, but it is a good starting point. Factors then heated by conduction. The circuit board, because it has
that can affect the profile include the type of soldering a large surface area, absorbs the thermal energy more
system in use, density and types of components on the efficiently, then distributes this energy to the components.
board, type of solder used, and the type of board or Because of this effect, the main body of a component may
substrate material being used. This profile shows be up to 30 degrees cooler than the adjacent solder joints.

STEP 1 STEP 2 STEP 3 STEP 4 STEP 5 STEP 6 STEP 7


PREHEAT VENT HEATING HEATING HEATING VENT COOLING
ZONE 1 “SOAK” ZONES 2 & 5 ZONES 3 & 6 ZONES 4 & 7
“RAMP” “RAMP” “SOAK” “SPIKE” 205° TO 219°C
PEAK AT
200°C DESIRED CURVE FOR HIGH 170°C SOLDER
MASS ASSEMBLIES JOINT
160°C
150°C

150°C
SOLDER IS LIQUID FOR
40 TO 80 SECONDS
100°C 140°C (DEPENDING ON
MASS OF ASSEMBLY)
100°C

DESIRED CURVE FOR LOW


MASS ASSEMBLIES
5°C

TIME (3 TO 7 MINUTES TOTAL) TMAX


Figure 16. Typical Solder Heating Profile

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(!.
Preferred Device


  
#$%& '(
!    
N–Channel SO–8, Dual
These miniature surface mount MOSFETs feature low RDS(on) and http://onsemi.com
true logic level performance. Dual MOSFET devices are designed for
use in low voltage, high speed switching applications where power 3 AMPERES
efficiency is important. Typical applications are dc–dc converters, and
power management in portable and battery powered products such as 60 VOLTS
computers, printers, cellular and cordless phones. They can also be RDS(on) = 100 mW
used for low voltage motor controls in mass storage products such as
disk drives and tape drives. N–Channel
• Low RDS(on) Provides Higher Efficiency and Extends Battery Life  
• Logic Level Gate Drive – Can Be Driven by Logic ICs
• Miniature SO–8 Surface Mount Package – Saves Board Space
• Diode Is Characterized for Use In Bridge Circuits
 
• Diode Exhibits High Speed, With Soft Recovery
• IDSS Specified at Elevated Temperature  
• Mounting Information for SO–8 Package Provided

MAXIMUM RATINGS (TJ = 25°C unless otherwise noted) MARKING


DIAGRAM
Rating Symbol Value Unit
Drain–to–Source Voltage VDSS 60 Vdc
Gate–to–Source Voltage – Continuous VGS ± 20 Vdc SO–8, Dual
D3N06
Drain Current – Continuous @ TA = 25°C ID 3.3 Adc 8 CASE 751
LYWW
IDM 16.5 Apk STYLE 11
Source Current – Continuous @ TA = 25°C IS 1.7 Adc 1
Total Power Dissipation @ TA = 25°C PD 2.0 Watts
(Note 1.) L = Location Code
Y = Year
Operating and Storage Temperature Range TJ, Tstg – 55 to °C
WW = Work Week
150
Single Pulse Drain–to–Source Avalanche EAS 105 mJ
Energy – Starting TJ = 25°C PIN ASSIGNMENT
(VDD = 60 Vdc, VGS = 5.0 Vdc,
VDS = 32 Vdc, IL = 15 Apk, L = 10 mH, Source–1 Drain–1
1 8
RG = 25 Ω)
Gate–1 2 7 Drain–1
Thermal Resistance – Junction–to–Ambient RθJA 62.5 °C/W
Source–2 3 6 Drain–2
Maximum Lead Temperature for Soldering TL 260 °C
Purposes, 1/8″ from case for 10 seconds Gate–2 4 5 Drain–2
1. Mounted on G10/FR4 glass epoxy board using minimum recommended Top View
footprint.

ORDERING INFORMATION

Device Package Shipping

MMDF3N06HDR2 SO–8 2500 Tape & Reel

Preferred devices are recommended choices for future use


This document contains information on a new product. Specifications and information and best overall value.
herein are subject to change without notice.

 Semiconductor Components Industries, LLC, 2000 531 Publication Order Number:


November, 2000 – Rev. 1 MMDF3N06HD/D
MMDF3N06HD

ELECTRICAL CHARACTERISTICS (TA = 25°C unless otherwise noted)


Characteristic Symbol Min Typ Max Unit
OFF CHARACTERISTICS
Drain–to–Source Breakdown Voltage V(BR)DSS Vdc
(VGS = 0 Vdc, ID = 0.25 mAdc) 60 – –

Zero Gate Voltage Drain Current IDSS µAdc


(VDS = 48 Vdc, VGS = 0 Vdc) – 0.001 1.0
(VDS = 48 Vdc, VGS = 0 Vdc, TJ = 125°C) – 0.05 25
Gate–Body Leakage Current (VGS = ± 20 Vdc, VDS = 0 Vdc) IGSS – 12 100 nAdc
ON CHARACTERISTICS (Note 2.)
Gate Threshold Voltage VGS(th) Vdc
(VDS = VGS, ID = 0.25 mAdc) 1.0 – –

Static Drain–to–Source On–Resistance RDS(on) mW


(VGS = 10 Vdc, ID = 3.3 Adc) – 67.5 100
(VGS = 4.5 Vdc, ID = 2.5 Adc) – 82.5 200
Forward Transconductance gFS Mhos
(VDS = 15 Vdc, ID = 1.5 Adc) – 7.5 –

DYNAMIC CHARACTERISTICS
Input Capacitance Ciss – 442 618 pF
Output Capacitance (VDS = 25 Vd
Vdc, VGS = 0 Vd
Vdc,
Coss – 97.6 137
f = 1.0 MHz)
Transfer Capacitance Crss – 24.4 34.2

SWITCHING CHARACTERISTICS (Note 3.)


Turn–On Delay Time td(on) – 10.6 22.1 ns
Rise Time (VDD = 30 Vdc, ID = 3.3 Adc, tr – 15.9 31.8
VGS = 4
4.55 Vdc
Vdc,
Turn–Off Delay Time RG = 30 Ω) td(off) – 23.8 47.6
Fall Time tf – 14.7 29.4
Turn–On Delay Time td(on) – 7.0 14 ns
Rise Time (VDD = 15 Vdc, ID = 3.0 Adc, tr – 4.8 9.6
VGS = 10 Vdc
Vdc,
Turn–Off Delay Time RG = 9.1 Ω) td(off) – 32.4 64.8
Fall Time tf – 14.2 28.4
Gate Charge QT – 14.5 29 nC
(S Figure
(See Fi 8)
(VDS = 30 Vdc, ID = 3.3 Adc, Q1 – 1.8 –
VGS = 10 Vdc) Q2 – 3.5 –
Q3 – 3.75 –
SOURCE–DRAIN DIODE CHARACTERISTICS
Forward On–Voltage VSD Vdc
(IS = 1.7 Adc, VGS = 0 Vdc) – 0.78 1.2
(IS = 1.7 Adc, VGS = 0 Vdc, TJ = 125°C) – 0.65 –
Reverse Recovery Time trr – 27.9 – ns
(IS = 1.7
1 7 Adc,
Ad VGS = 0 Vdc,
Vd
ta – 23 –
dIS/dt = 100 A/µs)
tb – 4.9 –
Reverse Recovery Stored Charge QRR – 0.038 – µC
2. Pulse Test: Pulse Width ≤ 300 µs, Duty Cycle ≤ 2%.
3. Switching characteristics are independent of operating junction temperature.

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MMDF3N06HD

TYPICAL ELECTRICAL CHARACTERISTICS

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Figure 5. On–Resistance Variation Figure 6. Drain–to–Source Leakage Current


with Temperature versus Voltage

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MMDF3N06HD

POWER MOSFET SWITCHING

Switching behavior is most easily modeled and predicted During the turn–on and turn–off delay times, gate current is
by recognizing that the power MOSFET is charge not constant. The simplest calculation uses appropriate
controlled. The lengths of various switching intervals (∆t) values from the capacitance curves in a standard equation for
are determined by how fast the FET input capacitance can voltage change in an RC network. The equations are:
be charged by current from the generator. td(on) = RG Ciss In [VGG/(VGG – VGSP)]
The published capacitance data is difficult to use for td(off) = RG Ciss In (VGG/VGSP)
calculating rise and fall because drain–gate capacitance
varies greatly with applied voltage. Accordingly, gate The capacitance (Ciss) is read from the capacitance curve at
charge data is used. In most cases, a satisfactory estimate of a voltage corresponding to the off–state condition when
average input current (IG(AV)) can be made from a calculating td(on) and is read at a voltage corresponding to the
rudimentary analysis of the drive circuit so that on–state when calculating td(off).
At high switching speeds, parasitic circuit elements
t = Q/IG(AV) complicate the analysis. The inductance of the MOSFET
During the rise and fall time interval when switching a source lead, inside the package and in the circuit wiring
resistive load, VGS remains virtually constant at a level which is common to both the drain and gate current paths,
known as the plateau voltage, VSGP. Therefore, rise and fall produces a voltage at the source which reduces the gate drive
times may be approximated by the following: current. The voltage is determined by Ldi/dt, but since di/dt
tr = Q2 x RG/(VGG – VGSP) is a function of drain current, the mathematical solution is
tf = Q2 x RG/VGSP complex. The MOSFET output capacitance also
complicates the mathematics. And finally, MOSFETs have
where finite internal gate resistance which effectively adds to the
VGG = the gate drive voltage, which varies from zero to VGG resistance of the driving source, but the internal resistance
RG = the gate drive resistance is difficult to measure and, consequently, is not specified.
and Q2 and VGSP are read from the gate charge curve.

DRAIN–TO–SOURCE DIODE CHARACTERISTICS

The switching characteristics of a MOSFET body diode high di/dts. The diode’s negative di/dt during ta is directly
are very important in systems using it as a freewheeling or controlled by the device clearing the stored charge.
commutating diode. Of particular interest are the reverse However, the positive di/dt during tb is an uncontrollable
recovery characteristics which play a major role in diode characteristic and is usually the culprit that induces
determining switching losses, radiated noise, EMI and RFI. current ringing. Therefore, when comparing diodes, the
System switching losses are largely due to the nature of ratio of tb/ta serves as a good indicator of recovery
the body diode itself. The body diode is a minority carrier abruptness and thus gives a comparative estimate of
device, therefore it has a finite reverse recovery time, trr, due probable noise generated. A ratio of 1 is considered ideal and
to the storage of minority carrier charge, QRR, as shown in values less than 0.5 are considered snappy.
the typical reverse recovery wave form of Figure 11. It is this Compared to ON Semiconductor standard cell density
stored charge that, when cleared from the diode, passes low voltage MOSFETs, high cell density MOSFET diodes
through a potential and defines an energy loss. Obviously, are faster (shorter trr), have less stored charge and a softer
repeatedly forcing the diode through reverse recovery reverse recovery characteristic. The softness advantage of
further increases switching losses. Therefore, one would the high cell density diode means they can be forced through
like a diode with short trr and low QRR specifications to reverse recovery at a higher di/dt than a standard cell
minimize these losses. MOSFET diode without increasing the current ringing or the
The abruptness of diode reverse recovery effects the noise generated. In addition, power dissipation incurred
amount of radiated noise, voltage spikes, and current from switching the diode will be less due to the shorter
ringing. The mechanisms at work are finite irremovable recovery time and lower switching losses.
circuit parasitic inductances and capacitances acted upon by

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534
MMDF3N06HD

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Figure 7. Reverse Recovery Time (trr)

SAFE OPERATING AREA

The Forward Biased Safe Operating Area curves define reliable operation, the stored energy from circuit inductance
the maximum simultaneous drain–to–source voltage and dissipated in the transistor while in avalanche must be less
drain current that a transistor can handle safely when it is than the rated limit and must be adjusted for operating
forward biased. Curves are based upon maximum peak conditions differing from those specified. Although industry
junction temperature and a case temperature (TC) of 25°C. practice is to rate in terms of energy, avalanche energy
Peak repetitive pulsed power limits are determined by using capability is not a constant. The energy rating decreases
the thermal response data in conjunction with the procedures non–linearly with an increase of peak current in avalanche
discussed in AN569, “Transient Thermal Resistance – and peak junction temperature.
General Data and Its Use.” Although many E–FETs can withstand the stress of
Switching between the off–state and the on–state may drain–to–source avalanche at currents up to rated pulsed
traverse any load line provided neither rated peak current current (IDM), the energy rating is specified at rated
(IDM) nor rated voltage (VDSS) is exceeded, and that the continuous current (ID), in accordance with industry
transition time (tr, tf) does not exceed 10 µs. In addition the custom. The energy rating must be derated for temperature
total power averaged over a complete switching cycle must as shown in the accompanying graph (Figure 9). Maximum
not exceed (TJ(MAX) – TC)/(RθJC). energy at currents below rated continuous ID can safely be
A power MOSFET designated E–FET can be safely used assumed to equal the values indicated.
in switching circuits with unclamped inductive loads. For

http://onsemi.com
535
MMDF3N06HD

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Drain–to–Source Voltage versus Total Charge

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Figure 10. Resistive Switching Time Variation Figure 11. Diode Forward Voltage
versus Gate Resistance versus Current

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Safe Operating Area Starting Junction Temperature

TYPICAL ELECTRICAL CHARACTERISTICS


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MMDF3N06HD

INFORMATION FOR USING THE SO–8 SURFACE MOUNT PACKAGE

MINIMUM RECOMMENDED FOOTPRINT FOR SURFACE MOUNTED APPLICATIONS


Surface mount board layout is a critical portion of the total interface between the board and the package. With the
design. The footprint for the semiconductor packages must correct pad geometry, the packages will self–align when
be the correct size to ensure proper solder connection subjected to a solder reflow process.

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SO–8 POWER DISSIPATION


The power dissipation of the SO–8 is a function of the into the equation for an ambient temperature TA of 25°C,
input pad size. This can vary from the minimum pad size one can calculate the power dissipation of the device which
for soldering to the pad size given for maximum power in this case is 2.0 Watts.
dissipation. Power dissipation for a surface mount device is
PD = 150°C – 25°C = 2.0 Watts
determined by TJ(max), the maximum rated junction 62.5°C/W
temperature of the die, RθJA, the thermal resistance from
the device junction to ambient; and the operating The 62.5°C/W for the SO–8 package assumes the
temperature, TA. Using the values provided on the data recommended footprint on a glass epoxy printed circuit
sheet for the SO–8 package, PD can be calculated as board to achieve a power dissipation of 2.0 Watts using the
follows: footprint shown. Another alternative would be to use a
TJ(max) – TA
ceramic substrate or an aluminum core board such as
PD = Thermal Cladt. Using board material such as Thermal
RθJA
Clad, the power dissipation can be doubled using the same
The values for the equation are found in the maximum footprint.
ratings table on the data sheet. Substituting these values

SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • The soldering temperature and time shall not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within • When shifting from preheating to soldering, the
a short time could result in device failure. Therefore, the maximum temperature gradient shall be 5°C or less.
following items should always be observed in order to • After soldering has been completed, the device should
minimize the thermal stress to which the devices are be allowed to cool naturally for at least three minutes.
subjected. Gradual cooling should be used as the use of forced
• Always preheat the device. cooling will increase the temperature gradient and
• The delta temperature between the preheat and result in latent failure due to mechanical stress.
soldering should be 100°C or less.* • Mechanical stress or shock should not be applied
• When preheating and soldering, the temperature of the during cooling.
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When * Soldering a device without preheating can cause
using infrared heating with the reflow soldering excessive thermal shock and stress which can result in
method, the difference shall be a maximum of 10°C. damage to the device.

http://onsemi.com
538
MMDF3N06HD

TYPICAL SOLDER HEATING PROFILE


For any given circuit board, there will be a group of temperature versus time. The line on the graph shows the
control settings that will give the desired heat pattern. The actual temperature that might be experienced on the surface
operator must set temperatures for several heating zones of a test board at or near a central solder joint. The two
and a figure for belt speed. Taken together, these control profiles are based on a high density and a low density
settings make up a heating “profile” for that particular board. The Vitronics SMD310 convection/infrared reflow
circuit board. On machines controlled by a computer, the soldering system was used to generate this profile. The type
computer remembers these profiles from one operating of solder used was 62/36/2 Tin Lead Silver with a melting
session to the next. Figure 12 shows a typical heating point between 177–189°C. When this type of furnace is
profile for use when soldering a surface mount device to a used for solder reflow work, the circuit boards and solder
printed circuit board. This profile will vary among joints tend to heat first. The components on the board are
soldering systems, but it is a good starting point. Factors then heated by conduction. The circuit board, because it has
that can affect the profile include the type of soldering a large surface area, absorbs the thermal energy more
system in use, density and types of components on the efficiently, then distributes this energy to the components.
board, type of solder used, and the type of board or Because of this effect, the main body of a component may
substrate material being used. This profile shows be up to 30 degrees cooler than the adjacent solder joints.

STEP 1 STEP 2 STEP 3 STEP 4 STEP 5 STEP 6 STEP 7


PREHEAT VENT HEATING HEATING HEATING VENT COOLING
ZONE 1 “SOAK” ZONES 2 & 5 ZONES 3 & 6 ZONES 4 & 7
“RAMP” “RAMP” “SOAK” “SPIKE” 205° TO 219°C
PEAK AT
200°C DESIRED CURVE FOR HIGH 170°C SOLDER
MASS ASSEMBLIES JOINT
160°C
150°C

150°C
SOLDER IS LIQUID FOR
40 TO 80 SECONDS
100°C 140°C (DEPENDING ON
MASS OF ASSEMBLY)
100°C

DESIRED CURVE FOR LOW


MASS ASSEMBLIES
5°C

TIME (3 TO 7 MINUTES TOTAL) TMAX


Figure 16. Typical Solder Heating Profile

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(!

 

#$%& '(
!    
N–Channel SO–8, Dual
Designed for low voltage, high speed switching applications in http://onsemi.com
power supplies, converters and power motor controls, these devices
are particularly well suited for bridge circuits where diode speed and 3 AMPERES
commutating safe operating areas are critical and offer additional
safety margin against unexpected voltage transients.
60 VOLTS
• On–resistance Area Product about One–half that of Standard RDS(on) = 130 mΩ
MOSFETs with New Low Voltage, Low RDS(on) Technology
• Faster Switching than E–FETt Predecessors N–Channel
• Avalanche Energy Specified 

• IDSS and VDS(on) Specified at Elevated Temperature


• Static Parameters are the Same for both TMOS V and TMOS E–FET
• Miniature SO–8 Surface Mount Package – Saves Board Space 
• Mounting Information for SO–8 Package Provided

MAXIMUM RATINGS (TJ = 25°C unless otherwise noted)
Rating Symbol Value Unit
MARKING
Drain–to–Source Voltage VDSS 60 Vdc
DIAGRAM
Drain–to–Gate Voltage, (RGS = 1 MΩ) VDGR 60 Vdc
Gate–to–Source Voltage – Continuous VGS ± 15 Vdc
Drain Current – Continuous @ TA = 25°C ID 3.3 Adc SO–8, Dual
3N06V
Drain Current – Continuous @ TA = 100°C ID 0.7 8 CASE 751
LYWW
Drain Current – Single Pulse (tp ≤ 10 µs) IDM 10 Apk STYLE 11
Total Power Dissipation @ TA = 25°C PD 2.0 W 1
(Note 1.)
Operating and Storage Temperature Range TJ, Tstg –55 to °C L = Location Code
150 Y = Year
WW = Work Week
Single Pulse Drain–to–Source Avalanche EAS 54 mJ
Energy – Starting TJ = 25°C
(VDD = 25 Vdc, VGS = 5.0 Vdc, Peak
IL = 3.3 Apk, L = 10 mH, RG = 25 Ω)
PIN ASSIGNMENT
Thermal Resistance, Junction to Ambient RθJA 62.5 °C/W
Source–1 1 8 Drain–1
(Note 1.)
Gate–1 2 7 Drain–1
Maximum Lead Temperature for Soldering TL 260 °C
Purposes, 0.0625″ from case for 10 Source–2 3 6 Drain–2
seconds Gate–2 4 5 Drain–2
1. Mounted on G10/FR4 glass epoxy board using minimum recommended Top View
footprint.

ORDERING INFORMATION

Device Package Shipping

MMDF3N06VLR2 SO–8 2500 Tape & Reel

This document contains information on a product under development. ON Semiconductor


reserves the right to change or discontinue this product without notice.

 Semiconductor Components Industries, LLC, 2000 540 Publication Order Number:


November, 2000 – Rev. 1 MMDF3N06VL/D
MMDF3N06VL

ELECTRICAL CHARACTERISTICS (TA = 25°C unless otherwise noted)


Characteristic Symbol Min Typ Max Unit
OFF CHARACTERISTICS
Drain–to–Source Breakdown Voltage V(BR)DSS Vdc
(VGS = 0 Vdc, ID = 0.25 mAdc) 60 – –
Temperature Coefficient (Positive) – 66 – mV/°C
Zero Gate Voltage Drain Current IDSS µAdc
(VDS = 60 Vdc, VGS = 0 Vdc) – – 10
(VDS = 60 Vdc, VGS = 0 Vdc, TJ = 150°C) – – 100
Gate–Body Leakage Current (VGS = ± 15 Vdc, VDS = 0 Vdc) IGSS – – 100 nAdc
ON CHARACTERISTICS (Note 2.)
Gate Threshold Voltage VGS(th) Vdc
(VDS = VGS, ID = 250 µAdc) 1.0 1.5 2.0
Threshold Temperature Coefficient (Negative) – 3.0 – mV/°C
Static Drain–to–Source On–Resistance RDS(on) Ohm
(VGS = 5.0 Vdc, ID = 3.3 Adc) – 0.12 0.13

Drain–to–Source On–Voltage VDS(on) Vdc


(VGS = 5.0 Vdc, ID = 3.3 Adc) – – 0.5
(VGS = 5.0 Vdc, ID = 1.65 Adc, TJ = 150°C) – – 0.4
Forward Transconductance (VDS = 15 Vdc, ID = 1.65 Adc) gFS 1.0 3.0 – Mhos
DYNAMIC CHARACTERISTICS
Input Capacitance Ciss – 340 480 pF
Output Capacitance (VDS = 25 Vd
Vdc, VGS = 0 Vd
Vdc,
Coss – 110 150
f = 1.0 MHz)
Transfer Capacitance Crss – 27 50
SWITCHING CHARACTERISTICS (Note 3.)
Turn–On Delay Time td(on) – 10 20 ns
Rise Time (VDD = 30 Vdc, ID = 3.3 Adc, tr – 30 60
VGS = 5
5.00 Vdc
Vdc,
Turn–Off Delay Time RG = 9.1 Ω) td(off) – 32 60
Fall Time tf – 28 60
Gate Charge QT – 9.0 20 nC

(VDS = 48 Vdc, ID = 3.3 Adc, Q1 – 1.5 –


VGS = 5.0 Vdc) Q2 – 4.3 –
Q3 – 3.5 –
SOURCE–DRAIN DIODE CHARACTERISTICS
Forward On–Voltage (Note 2.) (IS = 3.3 Adc, VGS = 0 Vdc) VSD – 0.84 1.2 Vdc
(IS = 3.3 Adc, VGS = 0 Vdc, TJ = 150°C) – 0.67 –
Reverse Recovery Time trr – 58 – ns
ta – 38 –
(IS = 3.3
3 3 Adc,
Adc VGS = 0 Vdc,
Vdc
dIS/dt = 100 A/µs) tb – 20 –
Reverse Recovery Storage QRR – 0.11 – µC
Charge
2. Pulse Test: Pulse Width ≤ 300 µs, Duty Cycle ≤ 2%.
3. Switching characteristics are independent of operating junction temperature.

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541
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Preferred Device

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N–Channel SO–8, Dual
These miniature surface mount MOSFETs feature ultra low RDS(on)
and true logic level performance. They are capable of withstanding http://onsemi.com
high energy in the avalanche and commutation modes and the
drain–to–source diode has a very low reverse recovery time.
MiniMOSt devices are designed for use in low voltage, high speed
4 AMPERES
switching applications where power efficiency is important. Typical 20 VOLTS
applications are dc–dc converters, and power management in portable RDS(on) = 45 m
and battery powered products such as computers, printers, cellular and
cordless phones. They can also be used for low voltage motor controls
N–Channel
in mass storage products such as disk drives and tape drives.

• Ultra Low RDS(on) Provides Higher Efficiency and Extends Battery
Life
• Logic Level Gate Drive – Can Be Driven by Logic ICs
• Miniature SO–8 Surface Mount Package – Saves Board Space 
• Diode Is Characterized for Use In Bridge Circuits
• Diode Exhibits High Speed, With Soft Recovery 

• IDSS Specified at Elevated Temperature


• Mounting Information for SO–8 Package Provided MARKING
DIAGRAM

MAXIMUM RATINGS (TJ = 25°C unless otherwise noted) SO–8, Dual


CASE 751 D4N01
Rating Symbol Value Unit 8 LYWW
STYLE 11
Drain–to–Source Voltage VDSS 20 Vdc 1
Drain–to–Gate Voltage (RGS = 1.0 MΩ) VDGR 20 Vdc
L = Location Code
Gate–to–Source Voltage – Continuous VGS ± 12 Vdc Y = Year
Drain Current – Continuous @ TA = 25°C ID 5.2 Adc WW = Work Week
Drain Current – Continuous @ TA = 100°C ID 4.1
Drain Current – Single Pulse (tp ≤ 10 µs) IDM 48 Apk
PIN ASSIGNMENT
Total Power Dissipation @ TA = 25°C PD 2.0 Watts
(Note 1.) Source–1 Drain–1
1 8
Operating and Storage Temperature Range TJ, Tstg – 55 to °C Gate–1 2 7 Drain–1
150
Source–2 3 6 Drain–2
Thermal Resistance – Junction to Ambient RθJA 62.5 °C/W Gate–2 4 5 Drain–2
(Note 1.)
Top View
Maximum Lead Temperature for Soldering TL 260 °C
Purposes, 1/8″ from case for 10 seconds
1. Mounted on 2″ square FR4 board (1″ sq. 2 oz. Cu 0.06″ thick single sided) with
ORDERING INFORMATION
one die operating, 10 sec. max.
Device Package Shipping

MMDF4N01HDR2 SO–8 2500 Tape & Reel

Preferred devices are recommended choices for future use


and best overall value.

 Semiconductor Components Industries, LLC, 2000 542 Publication Order Number:


November, 2000 – Rev. 6 MMDF4N01HD/D
MMDF4N01HD

ELECTRICAL CHARACTERISTICS (TC = 25°C unless otherwise noted)


Characteristic Symbol Min Typ Max Unit
OFF CHARACTERISTICS
Drain–Source Breakdown Voltage V(BR)DSS Vdc
(VGS = 0 Vdc, ID = 0.25 mAdc) 20 – –
Temperature Coefficient (Positive) – 2.0 – mV/°C
Zero Gate Voltage Drain Current IDSS µAdc
(VDS = 12 Vdc, VGS = 0 Vdc) – – 1.0
(VDS = 12 Vdc, VGS = 0 Vdc, TJ = 125°C) – – 10
Gate–Body Leakage Current (VGS = ± 8.0 Vdc, VDS = 0) IGSS – – 100 nAdc
ON CHARACTERISTICS (Note 2.)
Gate Threshold Voltage VGS(th) Vdc
(VDS = VGS, ID = 0.25 mAdc) 0.6 0.8 1.1
Temperature Coefficient (Negative) – 2.8 – mV/°C
Static Drain–to–Source On–Resistance RDS(on) Ohm
(VGS = 4.5 Vdc, ID = 4.0 Adc) – 0.035 0.045
(VGS = 2.7 Vdc, ID = 2.0 Adc) – 0.043 0.055
Forward Transconductance (VDS = 2.5 Vdc, ID = 2.0 Adc) gFS 3.0 6.0 – mhos
DYNAMIC CHARACTERISTICS
Input Capacitance Ciss – 425 595 pF
Output Capacitance (VDS = 10 Vd
Vdc, VGS = 0 Vd
Vdc,
Coss – 270 378
f = 1.0 MHz)
Reverse Transfer Capacitance Crss – 115 230
SWITCHING CHARACTERISTICS (Note 3.)
Turn–On Delay Time td(on) – 13 26 ns
Rise Time (VDD = 6.0 Vdc, ID = 4.0 Adc, tr – 60 120
VGS = 22.7
7 Vdc
Vdc,
Turn–Off Delay Time RG = 2.3 Ω) td(off) – 20 40
Fall Time tf – 29 58
Turn–On Delay Time td(on) – 10 20
Rise Time (VDD = 6.0 Vdc, ID = 4.0 Adc, tr – 42 84
VGS = 44.5
5 Vdc
Vdc,
Turn–Off Delay Time RG = 2.3 Ω) td(off) – 24 48
Fall Time tf – 28 56
Gate Charge QT – 9.2 13 nC
(S Figure
(See Fi 8)
(VDS = 10 Vdc, ID = 4.0 Adc, Q1 – 1.3 –
VGS = 4.5 Vdc) Q2 – 3.5 –
Q3 – 3.0 –

SOURCE–DRAIN DIODE CHARACTERISTICS


Forward On–Voltage (Note 2.) (IS = 4.0 Adc, VGS = 0 Vdc) VSD Vdc
(IS = 4.0 Adc, VGS = 0 Vdc, – 0.95 1.1
TJ = 125°C) – 0.78 –
Reverse Recovery Time trr – 38 – ns

(IS = 4.0 Adc, VGS = 0 Vdc, ta – 17 –


dIS/dt = 100 A/µs) tb – 22 –
Reverse Recovery Stored Charge QRR – 0.028 – µC
2. Pulse Test: Pulse Width ≤ 300 µs, Duty Cycle ≤ 2%.
3. Switching characteristics are independent of operating junction temperature.

http://onsemi.com
543
MMDF4N01HD

TYPICAL ELECTRICAL CHARACTERISTICS

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Figure 3. On–Resistance versus Figure 4. On–Resistance versus Drain Current


Gate–To–Source Voltage and Gate Voltage

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Figure 5. On–Resistance Variation with Figure 6. Drain–To–Source Leakage


Temperature Current versus Voltage

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544
MMDF4N01HD

POWER MOSFET SWITCHING

Switching behavior is most easily modeled and predicted The capacitance (Ciss) is read from the capacitance curve at
by recognizing that the power MOSFET is charge a voltage corresponding to the off–state condition when
controlled. The lengths of various switching intervals (∆t) calculating td(on) and is read at a voltage corresponding to the
are determined by how fast the FET input capacitance can on–state when calculating td(off).
be charged by current from the generator. At high switching speeds, parasitic circuit elements
The published capacitance data is difficult to use for complicate the analysis. The inductance of the MOSFET
calculating rise and fall because drain–gate capacitance source lead, inside the package and in the circuit wiring
varies greatly with applied voltage. Accordingly, gate which is common to both the drain and gate current paths,
charge data is used. In most cases, a satisfactory estimate of produces a voltage at the source which reduces the gate drive
average input current (IG(AV)) can be made from a current. The voltage is determined by Ldi/dt, but since di/dt
rudimentary analysis of the drive circuit so that is a function of drain current, the mathematical solution is
t = Q/IG(AV) complex. The MOSFET output capacitance also
complicates the mathematics. And finally, MOSFETs have
During the rise and fall time interval when switching a finite internal gate resistance which effectively adds to the
resistive load, VGS remains virtually constant at a level resistance of the driving source, but the internal resistance
known as the plateau voltage, VSGP. Therefore, rise and fall is difficult to measure and, consequently, is not specified.
times may be approximated by the following: The resistive switching time variation versus gate
tr = Q2 x RG/(VGG – VGSP) resistance (Figure 9) shows how typical switching
tf = Q2 x RG/VGSP performance is affected by the parasitic circuit elements. If
where the parasitics were not present, the slope of the curves would
maintain a value of unity regardless of the switching speed.
VGG = the gate drive voltage, which varies from zero to VGG
The circuit used to obtain the data is constructed to minimize
RG = the gate drive resistance
common inductance in the drain and gate circuit loops and
and Q2 and VGSP are read from the gate charge curve.
is believed readily achievable with board mounted
During the turn–on and turn–off delay times, gate current is components. Most power electronic loads are inductive; the
not constant. The simplest calculation uses appropriate data in the figure is taken with a resistive load, which
values from the capacitance curves in a standard equation for approximates an optimally snubbed inductive load. Power
voltage change in an RC network. The equations are: MOSFETs may be safely operated into an inductive load;
td(on) = RG Ciss In [VGG/(VGG – VGSP)] however, snubbing reduces switching losses.
td(off) = RG Ciss In (VGG/VGSP)

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Figure 8. Gate–To–Source and Drain–To–Source Figure 9. Resistive Switching Time


Voltage versus Total Charge Variation versus Gate Resistance

DRAIN–TO–SOURCE DIODE CHARACTERISTICS

The switching characteristics of a MOSFET body diode high di/dts. The diode’s negative di/dt during ta is directly
are very important in systems using it as a freewheeling or controlled by the device clearing the stored charge.
commutating diode. Of particular interest are the reverse However, the positive di/dt during tb is an uncontrollable
recovery characteristics which play a major role in diode characteristic and is usually the culprit that induces
determining switching losses, radiated noise, EMI and RFI. current ringing. Therefore, when comparing diodes, the
System switching losses are largely due to the nature of ratio of tb/ta serves as a good indicator of recovery
the body diode itself. The body diode is a minority carrier abruptness and thus gives a comparative estimate of
device, therefore it has a finite reverse recovery time, trr, due probable noise generated. A ratio of 1 is considered ideal and
to the storage of minority carrier charge, QRR, as shown in values less than 0.5 are considered snappy.
the typical reverse recovery wave form of Figure 14. It is this Compared to ON Semiconductor standard cell density
stored charge that, when cleared from the diode, passes low voltage MOSFETs, high cell density MOSFET diodes
through a potential and defines an energy loss. Obviously, are faster (shorter trr), have less stored charge and a softer
repeatedly forcing the diode through reverse recovery reverse recovery characteristic. The softness advantage of
further increases switching losses. Therefore, one would the high cell density diode means they can be forced through
like a diode with short trr and low QRR specifications to reverse recovery at a higher di/dt than a standard cell
minimize these losses. MOSFET diode without increasing the current ringing or the
The abruptness of diode reverse recovery effects the noise generated. In addition, power dissipation incurred
amount of radiated noise, voltage spikes, and current from switching the diode will be less due to the shorter
ringing. The mechanisms at work are finite irremovable recovery time and lower switching losses.
circuit parasitic inductances and capacitances acted upon by
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Figure 10. Diode Forward Voltage versus Current

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Figure 11. Reverse Recovery Time (trr)

SAFE OPERATING AREA

The Forward Biased Safe Operating Area curves define total power averaged over a complete switching cycle must
the maximum simultaneous drain–to–source voltage and not exceed (TJ(MAX) – TC)/(RθJC).
drain current that a transistor can handle safely when it is A power MOSFET designated E–FET can be safely used
forward biased. Curves are based upon maximum peak in switching circuits with unclamped inductive loads. For
junction temperature and a case temperature (TC) of 25°C. reliable operation, the stored energy from circuit inductance
Peak repetitive pulsed power limits are determined by using dissipated in the transistor while in avalanche must be less
the thermal response data in conjunction with the procedures than the rated limit and must be adjusted for operating
discussed in AN569, “Transient Thermal Resistance – conditions differing from those specified. Although industry
General Data and Its Use.” practice is to rate in terms of energy, avalanche energy
Switching between the off–state and the on–state may capability is not a constant. The energy rating decreases
traverse any load line provided neither rated peak current non–linearly with an increase of peak current in avalanche
(IDM) nor rated voltage (VDSS) is exceeded, and that the and peak junction temperature.
transition time (tr, tf) does not exceed 10 µs. In addition the


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Figure 12. Maximum Rated Forward Biased


Safe Operating Area

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547
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TYPICAL ELECTRICAL CHARACTERISTICS



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Figure 14. Diode Reverse Recovery Waveform

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548
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INFORMATION FOR USING THE SO–8 SURFACE MOUNT PACKAGE

MINIMUM RECOMMENDED FOOTPRINT FOR SURFACE MOUNTED APPLICATIONS


Surface mount board layout is a critical portion of the total interface between the board and the package. With the
design. The footprint for the semiconductor packages must correct pad geometry, the packages will self–align when
be the correct size to ensure proper solder connection subjected to a solder reflow process.

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SO–8 POWER DISSIPATION


The power dissipation of the SO–8 is a function of the into the equation for an ambient temperature TA of 25°C,
input pad size. This can vary from the minimum pad size one can calculate the power dissipation of the device which
for soldering to the pad size given for maximum power in this case is 2.0 Watts.
dissipation. Power dissipation for a surface mount device is 150°C – 25°C
determined by TJ(max), the maximum rated junction PD = = 2.0 Watts
62.5°C/W
temperature of the die, RθJA, the thermal resistance from
the device junction to ambient; and the operating The 62.5°C/W for the SO–8 package assumes the
temperature, TA. Using the values provided on the data recommended footprint on a glass epoxy printed circuit
sheet for the SO–8 package, PD can be calculated as board to achieve a power dissipation of 2.0 Watts using the
follows: footprint shown. Another alternative would be to use a
TJ(max) – TA
ceramic substrate or an aluminum core board such as
PD = Thermal Cladt. Using board material such as Thermal
RθJA
Clad, the power dissipation can be doubled using the same
The values for the equation are found in the maximum footprint.
ratings table on the data sheet. Substituting these values

SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • The soldering temperature and time shall not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within • When shifting from preheating to soldering, the
a short time could result in device failure. Therefore, the maximum temperature gradient shall be 5°C or less.
following items should always be observed in order to • After soldering has been completed, the device should
minimize the thermal stress to which the devices are be allowed to cool naturally for at least three minutes.
subjected. Gradual cooling should be used as the use of forced
• Always preheat the device. cooling will increase the temperature gradient and
• The delta temperature between the preheat and result in latent failure due to mechanical stress.
soldering should be 100°C or less.* • Mechanical stress or shock should not be applied
• When preheating and soldering, the temperature of the during cooling.
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When * Soldering a device without preheating can cause
using infrared heating with the reflow soldering excessive thermal shock and stress which can result in
method, the difference shall be a maximum of 10°C. damage to the device.

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549
MMDF4N01HD

TYPICAL SOLDER HEATING PROFILE


For any given circuit board, there will be a group of temperature versus time. The line on the graph shows the
control settings that will give the desired heat pattern. The actual temperature that might be experienced on the surface
operator must set temperatures for several heating zones of a test board at or near a central solder joint. The two
and a figure for belt speed. Taken together, these control profiles are based on a high density and a low density
settings make up a heating “profile” for that particular board. The Vitronics SMD310 convection/infrared reflow
circuit board. On machines controlled by a computer, the soldering system was used to generate this profile. The type
computer remembers these profiles from one operating of solder used was 62/36/2 Tin Lead Silver with a melting
session to the next. Figure 15 shows a typical heating point between 177–189°C. When this type of furnace is
profile for use when soldering a surface mount device to a used for solder reflow work, the circuit boards and solder
printed circuit board. This profile will vary among joints tend to heat first. The components on the board are
soldering systems, but it is a good starting point. Factors then heated by conduction. The circuit board, because it has
that can affect the profile include the type of soldering a large surface area, absorbs the thermal energy more
system in use, density and types of components on the efficiently, then distributes this energy to the components.
board, type of solder used, and the type of board or Because of this effect, the main body of a component may
substrate material being used. This profile shows be up to 30 degrees cooler than the adjacent solder joints.

STEP 1 STEP 2 STEP 3 STEP 4 STEP 5 STEP 6 STEP 7


PREHEAT VENT HEATING HEATING HEATING VENT COOLING
ZONE 1 “SOAK” ZONES 2 & 5 ZONES 3 & 6 ZONES 4 & 7
“RAMP” “RAMP” “SOAK” “SPIKE” 205° TO 219°C
PEAK AT
200°C DESIRED CURVE FOR HIGH 170°C SOLDER
MASS ASSEMBLIES JOINT
160°C
150°C

150°C
SOLDER IS LIQUID FOR
40 TO 80 SECONDS
100°C 140°C (DEPENDING ON
MASS OF ASSEMBLY)
100°C

DESIRED CURVE FOR LOW


MASS ASSEMBLIES
5°C

TIME (3 TO 7 MINUTES TOTAL) TMAX


Figure 15. Typical Solder Heating Profile

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550
( 8

#$%& '(
    
N–Channel SO–8, Dual
EZFETst are an advanced series of Power MOSFETs which
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contain monolithic back–to–back zener diodes. These zener diodes
provide protection against ESD and unexpected transients. These
miniature surface mount MOSFETs feature low RDS(on) and true logic 5 AMPERES
level performance. They are capable of withstanding high energy in 20 VOLTS
the avalanche and commutation modes and the drain–to–source diode RDS(on) = 40 mΩ
has a very low reverse recovery time. EZFET devices are designed for
use in low voltage, high speed switching applications where power N–Channel
efficiency is important. D
• Zener Protected Gates Provide Electrostatic Discharge Protection
• Low RDS(on) Provides Higher Efficiency and Extends Battery Life
• Logic Level Gate Drive – Can Be Driven by Logic ICs
G
• Miniature SO–8 Surface Mount Package – Saves Board Space
• Diode Exhibits High Speed, With Soft Recovery
• IDSS Specified at Elevated Temperature S
• Mounting Information for SO–8 Package Provided
MARKING
MAXIMUM RATINGS (TJ = 25°C unless otherwise noted) DIAGRAM
Rating Symbol Value Unit
Drain–to–Source Voltage VDSS 20 Vdc SO–8, Dual
CASE 751 5N02Z
Drain–to–Gate Voltage (RGS = 1.0 MΩ) VDGR 20 Vdc 8
STYLE 11 LYWW
Gate–to–Source Voltage – Continuous VGS ± 12 Vdc
Drain Current – Continuous @ TA = 25°C ID 5.0 Adc 1
Drain Current – Continuous @ TA = 70°C ID 4.5
Drain Current – Single Pulse (tp ≤ 10 µs) IDM 40 Apk 5N02Z = Device Code
L = Location Code
Total Power Dissipation @ TA = 25°C (Note 1.) PD 2.0 Watts
Y = Year
Operating and Storage Temperature Range TJ, Tstg – 55 °C WW = Work Week
to 150
Thermal Resistance – Junction to RθJA 62.5 °C/W
Ambient PIN ASSIGNMENT
Maximum Temperature for Soldering TL 260 °C
Source–1 1 8 Drain–1
1. When mounted on 1 inch square FR–4 or G–10 board
(VGS = 4.5 V, @ 10 Seconds). Gate–1 2 7 Drain–1
Source–2 3 6 Drain–2
Gate–2 4 5 Drain–2
Top View

ORDERING INFORMATION

Device Package Shipping

MMDF5N02ZR2 SO–8 2500 Tape & Reel

 Semiconductor Components Industries, LLC, 2001 551 Publication Order Number:


January, 2001 – Rev. 2 MMDF5N02Z/D
MMDF5N02Z

ELECTRICAL CHARACTERISTICS (TA = 25°C unless otherwise noted)


Characteristic Symbol Min Typ Max Unit
OFF CHARACTERISTICS
Drain–to–Source Breakdown Voltage (Cpk ≥ 2.0) (Note 4.) V(BR)DSS Vdc
(VGS = 0 Vdc, ID = 0.25 mAdc) 20 – –
Temperature Coefficient (Positive) – 15 – mV/°C
Zero Gate Voltage Drain Current IDSS µAdc
(VDS = 12 Vdc, VGS = 0 Vdc) – – 0.5
(VDS = 20 Vdc, VGS = 0 Vdc) – – 15
(VDS = 20 Vdc, VGS = 0 Vdc, TJ = 125°C) – – 150
Gate–Body Leakage Current (VGS = ± 12 Vdc, VDS = 0 Vdc) IGSS – – 1.5 µAdc
ON CHARACTERISTICS (Note 2.)
Gate Threshold Voltage (Cpk ≥ 2.0) (Note 4.) VGS(th) Vdc
(VDS = VGS, ID = 0.25 mAdc) 0.5 0.78 1.1
Threshold Temperature Coefficient (Negative) – 3.0 – mV/°C
Static Drain–to–Source On–Resistance (Cpk ≥ 2.0) (Note 4.) RDS(on) mΩ
(VGS = 4.5 Vdc, ID = 5.0 Adc) – 34 40
(VGS = 2.7 Vdc, ID = 2.5 Adc) – 44 50
Forward Transconductance (VDS = 9.0 Vdc, ID = 2.0 Adc) gFS 3.0 5.6 – Mhos
DYNAMIC CHARACTERISTICS
Input Capacitance Ciss – 450 630 pF
Output Capacitance (VDS = 10 Vd
Vdc, VGS = 0 Vd
Vdc,
Coss – 330 460
f = 1.0 MHz)
Transfer Capacitance Crss – 160 225

SWITCHING CHARACTERISTICS (Note 3.)


Turn–On Delay Time td(on) – 29 37 ns
Rise Time (VDD = 6.0 Vdc, ID = 5.0 Adc, tr – 182 258
Turn–Off Delay Time VGS = 4.5 Vdc, RG = 6 Ω) td(off) – 190 238
Fall Time tf – 225 274
Gate Charge QT – 10.7 12 nC

(VDS = 10 Vdc, ID = 5.0 Adc, Q1 – 1.1 –


VGS = 4.5 Vdc) Q2 – 5.4 –
Q3 – 3.5 –
SOURCE–DRAIN DIODE CHARACTERISTICS
Forward On–Voltage (IS = 5.0 Adc, VGS = 0 Vdc) VSD Vdc
(IS = 5.0 Adc, VGS = 0 Vdc, – 0.78 1.0
TJ = 125°C) – 0.65 –
Reverse Recovery Time trr – 195 – ns
(IS = 5.0
5 0 Adc,
Ad VGS = 0 Vdc,
Vd
ta – 72 –
dIS/dt = 100 A/µs)
tb – 123 –
Reverse Recovery Storage Charge QRR – 0.5 – µC
2. Pulse Test: Pulse Width ≤ 300 µs, Duty Cycle ≤ 2%.
3. Switching characteristics are independent of operating junction temperature.
4. Reflects typical values. Max limit – Typ
Cpk =
3 x SIGMA

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552
MMDF5N02Z

TYPICAL ELECTRICAL CHARACTERISTICS

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Figure 3. On–Resistance versus Figure 4. On–Resistance versus Drain Current


Gate–to–Source Voltage and Gate Voltage

 


   
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Figure 5. On–Resistance Variation Figure 6. Drain–to–Source Leakage Current


with Temperature versus Voltage

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553
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POWER MOSFET SWITCHING

Switching behavior is most easily modeled and predicted The capacitance (Ciss) is read from the capacitance curve at
by recognizing that the power MOSFET is charge a voltage corresponding to the off–state condition when
controlled. The lengths of various switching intervals (∆t) calculating td(on) and is read at a voltage corresponding to the
are determined by how fast the FET input capacitance can on–state when calculating td(off).
be charged by current from the generator. At high switching speeds, parasitic circuit elements
The published capacitance data is difficult to use for complicate the analysis. The inductance of the MOSFET
calculating rise and fall because drain–gate capacitance source lead, inside the package and in the circuit wiring
varies greatly with applied voltage. Accordingly, gate which is common to both the drain and gate current paths,
charge data is used. In most cases, a satisfactory estimate of produces a voltage at the source which reduces the gate drive
average input current (IG(AV)) can be made from a current. The voltage is determined by Ldi/dt, but since di/dt
rudimentary analysis of the drive circuit so that is a function of drain current, the mathematical solution is
t = Q/IG(AV) complex. The MOSFET output capacitance also
complicates the mathematics. And finally, MOSFETs have
During the rise and fall time interval when switching a finite internal gate resistance which effectively adds to the
resistive load, VGS remains virtually constant at a level resistance of the driving source, but the internal resistance
known as the plateau voltage, VSGP. Therefore, rise and fall is difficult to measure and, consequently, is not specified.
times may be approximated by the following: The resistive switching time variation versus gate
tr = Q2 x RG/(VGG – VGSP) resistance (Figure 9) shows how typical switching
tf = Q2 x RG/VGSP performance is affected by the parasitic circuit elements. If
where the parasitics were not present, the slope of the curves would
maintain a value of unity regardless of the switching speed.
VGG = the gate drive voltage, which varies from zero to VGG
The circuit used to obtain the data is constructed to minimize
RG = the gate drive resistance
common inductance in the drain and gate circuit loops and
and Q2 and VGSP are read from the gate charge curve.
is believed readily achievable with board mounted
During the turn–on and turn–off delay times, gate current is components. Most power electronic loads are inductive; the
not constant. The simplest calculation uses appropriate data in the figure is taken with a resistive load, which
values from the capacitance curves in a standard equation for approximates an optimally snubbed inductive load. Power
voltage change in an RC network. The equations are: MOSFETs may be safely operated into an inductive load;
td(on) = RG Ciss In [VGG/(VGG – VGSP)] however, snubbing reduces switching losses.
td(off) = RG Ciss In (VGG/VGSP)

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Figure 8. Gate–To–Source and Drain–To–Source Figure 9. Resistive Switching Time


Voltage versus Total Charge Variation versus Gate Resistance

DRAIN–TO–SOURCE DIODE CHARACTERISTICS

The switching characteristics of a MOSFET body diode high di/dts. The diode’s negative di/dt during ta is directly
are very important in systems using it as a freewheeling or controlled by the device clearing the stored charge.
commutating diode. Of particular interest are the reverse However, the positive di/dt during tb is an uncontrollable
recovery characteristics which play a major role in diode characteristic and is usually the culprit that induces
determining switching losses, radiated noise, EMI and RFI. current ringing. Therefore, when comparing diodes, the
System switching losses are largely due to the nature of ratio of tb/ta serves as a good indicator of recovery
the body diode itself. The body diode is a minority carrier abruptness and thus gives a comparative estimate of
device, therefore it has a finite reverse recovery time, trr, due probable noise generated. A ratio of 1 is considered ideal and
to the storage of minority carrier charge, QRR, as shown in values less than 0.5 are considered snappy.
the typical reverse recovery wave form of Figure 11. It is this Compared to ON Semiconductor standard cell density
stored charge that, when cleared from the diode, passes low voltage MOSFETs, high cell density MOSFET diodes
through a potential and defines an energy loss. Obviously, are faster (shorter trr), have less stored charge and a softer
repeatedly forcing the diode through reverse recovery reverse recovery characteristic. The softness advantage of
further increases switching losses. Therefore, one would the high cell density diode means they can be forced through
like a diode with short trr and low QRR specifications to reverse recovery at a higher di/dt than a standard cell
minimize these losses. MOSFET diode without increasing the current ringing or the
The abruptness of diode reverse recovery effects the noise generated. In addition, power dissipation incurred
amount of radiated noise, voltage spikes, and current from switching the diode will be less due to the shorter
ringing. The mechanisms at work are finite irremovable recovery time and lower switching losses.
circuit parasitic inductances and capacitances acted upon by

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Figure 10. Diode Forward Voltage versus Current

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Figure 11. Reverse Recovery Time (trr)

SAFE OPERATING AREA

The Forward Biased Safe Operating Area curves the total power averaged over a complete switching cycle
define the maximum simultaneous drain–to–source must not exceed (T J(MAX) – T C )/(RθJC ).
voltage and drain current that a transistor can handle A power MOSFET designated E–FET can be safely
safely when it is forward biased. Curves are based upon used in switching circuits with unclamped inductive
maximum peak junction temperature and a case loads. For reliable operation, the stored energy from
temperature (T C ) of 25°C. Peak repetitive pulsed power circuit inductance dissipated in the transistor while in
limits are determined by using the thermal response data avalanche must be less than the rated limit and must be
in conjunction with the procedures discussed in AN569, adjusted for operating conditions differing from those
“Transient Thermal Resistance – General Data and Its specified. Although industry practice is to rate in terms
Use.” of energy, avalanche energy capability is not a constant.
Switching between the off–state and the on–state may The energy rating decreases non–linearly with an
traverse any load line provided neither rated peak current increase of peak current in avalanche and peak junction
(I DM ) nor rated voltage (V DSS ) is exceeded, and that the temperature.
transition time (t r, tf ) does not exceed 10 µs. In addition

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Safe Operating Area

TYPICAL ELECTRICAL CHARACTERISTICS


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INFORMATION FOR USING THE SO–8 SURFACE MOUNT PACKAGE

MINIMUM RECOMMENDED FOOTPRINT FOR SURFACE MOUNTED APPLICATIONS


Surface mount board layout is a critical portion of the total interface between the board and the package. With the
design. The footprint for the semiconductor packages must correct pad geometry, the packages will self–align when
be the correct size to ensure proper solder connection subjected to a solder reflow process.

0.060
1.52

0.275 0.155
7.0 4.0

0.024 0.050
0.6 1.270
inches
mm

SO–8 POWER DISSIPATION


The power dissipation of the SO–8 is a function of the into the equation for an ambient temperature TA of 25°C,
input pad size. This can vary from the minimum pad size one can calculate the power dissipation of the device which
for soldering to the pad size given for maximum power in this case is 2.0 Watts.
dissipation. Power dissipation for a surface mount device is
PD = 150°C – 25°C = 2.0 Watts
determined by TJ(max), the maximum rated junction 62.5°C/W
temperature of the die, RθJA, the thermal resistance from
the device junction to ambient; and the operating The 62.5°C/W for the SO–8 package assumes the
temperature, TA. Using the values provided on the data recommended footprint on a glass epoxy printed circuit
sheet for the SO–8 package, PD can be calculated as board to achieve a power dissipation of 2.0 Watts using the
follows: footprint shown. Another alternative would be to use a
TJ(max) – TA
ceramic substrate or an aluminum core board such as
PD = Thermal Cladt. Using board material such as Thermal
RθJA
Clad, the power dissipation can be doubled using the same
The values for the equation are found in the maximum footprint.
ratings table on the data sheet. Substituting these values

SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • The soldering temperature and time shall not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within • When shifting from preheating to soldering, the
a short time could result in device failure. Therefore, the maximum temperature gradient shall be 5°C or less.
following items should always be observed in order to • After soldering has been completed, the device should
minimize the thermal stress to which the devices are be allowed to cool naturally for at least three minutes.
subjected. Gradual cooling should be used as the use of forced
• Always preheat the device. cooling will increase the temperature gradient and
• The delta temperature between the preheat and result in latent failure due to mechanical stress.
soldering should be 100°C or less.* • Mechanical stress or shock should not be applied
• When preheating and soldering, the temperature of the during cooling.
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When * Soldering a device without preheating can cause
using infrared heating with the reflow soldering excessive thermal shock and stress which can result in
method, the difference shall be a maximum of 10°C. damage to the device.

http://onsemi.com
558
MMDF5N02Z

TYPICAL SOLDER HEATING PROFILE


For any given circuit board, there will be a group of temperature versus time. The line on the graph shows the
control settings that will give the desired heat pattern. The actual temperature that might be experienced on the surface
operator must set temperatures for several heating zones of a test board at or near a central solder joint. The two
and a figure for belt speed. Taken together, these control profiles are based on a high density and a low density
settings make up a heating “profile” for that particular board. The Vitronics SMD310 convection/infrared reflow
circuit board. On machines controlled by a computer, the soldering system was used to generate this profile. The type
computer remembers these profiles from one operating of solder used was 62/36/2 Tin Lead Silver with a melting
session to the next. Figure 16 shows a typical heating point between 177–189°C. When this type of furnace is
profile for use when soldering a surface mount device to a used for solder reflow work, the circuit boards and solder
printed circuit board. This profile will vary among joints tend to heat first. The components on the board are
soldering systems, but it is a good starting point. Factors then heated by conduction. The circuit board, because it has
that can affect the profile include the type of soldering a large surface area, absorbs the thermal energy more
system in use, density and types of components on the efficiently, then distributes this energy to the components.
board, type of solder used, and the type of board or Because of this effect, the main body of a component may
substrate material being used. This profile shows be up to 30 degrees cooler than the adjacent solder joints.

STEP 1 STEP 2 STEP 3 STEP 4 STEP 5 STEP 6 STEP 7


PREHEAT VENT HEATING HEATING HEATING VENT COOLING
ZONE 1 “SOAK” ZONES 2 & 5 ZONES 3 & 6 ZONES 4 & 7
“RAMP” “RAMP” “SOAK” “SPIKE” 205° TO 219°C
PEAK AT
200°C DESIRED CURVE FOR HIGH 170°C SOLDER
MASS ASSEMBLIES JOINT
160°C
150°C

150°C
SOLDER IS LIQUID FOR
40 TO 80 SECONDS
100°C 140°C (DEPENDING ON
MASS OF ASSEMBLY)
100°C

DESIRED CURVE FOR LOW


MASS ASSEMBLIES
5°C

TIME (3 TO 7 MINUTES TOTAL) TMAX


Figure 15. Typical Solder Heating Profile

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559
(!.
Preferred Device

#$%& '(
  !  
N–Channel SO–8, Dual
These miniature surface mount MOSFETs feature low RDS(on) and
true logic level performance. Dual MOSFET devices are designed for
use in low voltage, high speed switching applications where power http://onsemi.com
efficiency is important. Typical applications are dc–dc converters, and
power management in portable and battery powered products such as 6 AMPERES
computers, printers, cellular and cordless phones. They can also be 30 VOLTS
used for low voltage motor controls in mass storage products such as
disk drives and tape drives. RDS(on) = 35 mW
• Low RDS(on) Provides Higher Efficiency and Extends Battery Life
• Logic Level Gate Drive – Can Be Driven by Logic ICs N–Channel

• Miniature SO–8 Surface Mount Package – Saves Board Space  

• Diode Is Characterized for Use In Bridge Circuits


• Diode Exhibits High Speed, With Soft Recovery
• IDSS Specified at Elevated Temperature  
• Mounting Information for SO–8 Package Provided
 
MAXIMUM RATINGS (TJ = 25°C unless otherwise noted)
Rating Symbol Value Unit MARKING
Drain–to–Source Voltage VDSS 30 Vdc DIAGRAM
Gate–to–Source Voltage – Continuous VGS ± 20 Vdc
Drain Current – Continuous @ TA = 25°C ID 6.0 Adc
SO–8, Dual
Drain Current – Single Pulse (tp ≤ 10 µs) IDM 30 Apk D6N03
8 CASE 751
Source Current – Continuous @ TA = 25°C IS 1.7 Adc LYWW
STYLE 11
Total Power Dissipation @ TA = 25°C PD 2.0 Watts
1
(Note 1.)
Operating and Storage Temperature Range TJ, Tstg – 55 to °C D6N03 = Device Code
150 L = Location Code
Single Pulse Drain–to–Source Avalanche EAS 325 mJ Y = Year
Energy – Starting TJ = 25°C WW = Work Week
(VDD = 30 Vdc, VGS = 5.0 Vdc,
VDS = 20 Vdc, IL = 9.0 Apk,
PIN ASSIGNMENT
L = 10 mH, RG = 25 W)
Thermal Resistance – Junction–to–Ambient RθJA 62.5 °C/W Source–1 Drain–1
1 8
Maximum Lead Temperature for Soldering TL 260 °C Gate–1 2 7 Drain–1
Purposes, 1/8″ from Case for 10 sec.
Source–2 3 6 Drain–2
1. Mounted on G10/FR4 glass epoxy board using minimum recommended
footprint. Gate–2 4 5 Drain–2
Top View

ORDERING INFORMATION

Device Package Shipping

MMDF6N03HDR2 SO–8 2500 Tape & Reel

Preferred devices are recommended choices for future use


and best overall value.

 Semiconductor Components Industries, LLC, 2000 560 Publication Order Number:


November, 2000 – Rev. 3 MMDF6N03HD/D
MMDF6N03HD

ELECTRICAL CHARACTERISTICS (TA = 25°C unless otherwise noted)


Characteristic Symbol Min Typ Max Unit
OFF CHARACTERISTICS
Drain–to–Source Breakdown Voltage V(BR)DSS Vdc
(VGS = 0 Vdc, ID = 0.25 mAdc) 30 – –
Zero Gate Voltage Drain Current IDSS µAdc
(VDS = 24 Vdc, VGS = 0 Vdc) – – 1.0
(VDS = 24 Vdc, VGS = 0 Vdc, TJ = 125°C) – – 20
Gate–Body Leakage Current (VGS = ±20 Vdc, VDS = 0 Vdc) IGSS – – 100 nAdc
ON CHARACTERISTICS (Note 2.)
Gate Threshold Voltage VGS(th) Vdc
(VDS = VGS, ID = 0.25 mAdc) 1.0 – –
Threshold Temperature Coefficient (Negative)
Static Drain–to–Source On–Resistance RDS(on) mΩ
(VGS = 10 Vdc, ID = 5.0 Adc) – 28 35
(VGS = 4.5 Vdc, ID = 3.9 Adc) – 42 50
Forward Transconductance (VDS = 15 Vdc, ID = 5.0 Adc) gFS – 9.0 – Mhos
DYNAMIC CHARACTERISTICS
Input Capacitance Ciss – 430 600 pF
(VDS = 24 Vdc,
Output Capacitance VGS = 0 Vdc, Coss – 217 300
f=1
1.0
0 MH
MHz))
Transfer Capacitance Crss – 67.5 135

SWITCHING CHARACTERISTICS (Note 3.)


Turn–On Delay Time td(on) – 8.2 16.4 ns
(VDD = 15 Vdc
Vdc,
Rise Time VGS = 10 Vdc, tr – 8.48 16.9
Turn–Off Delay Time ID = 1.0 Adc, td(off) – 89.6 179
RG = 6 0 Ω)
6.0
Fall Time tf – 61.1 122
Turn–On Delay Time td(on) – 11.8 23 ns
(VDD = 15 Vdc
Vdc,
Rise Time VGS = 4.5 Vdc, tr – 51.3 102
Turn–Off Delay Time ID = 1.0 Adc, td(off) – 47.2 94.5
RG = 6 0 Ω)
6.0
Fall Time tf – 62 104
Gate Charge QT – 15.7 31.4 nC
(S Figure
(See Fi 8) (VDS = 15 Vdc, Q1 – 2.0 –
ID = 5
5.0
0 Adc
Adc,
VGS = 10 Vdc) Q2 – 4.6 –
Q3 – 3.86 –
SOURCE–DRAIN DIODE CHARACTERISTICS
Forward On–Voltage (IS = 1.7 Adc, VGS = 0 Vdc) VSD Vdc
(IS = 1.7 Adc, VGS = 0 Vdc, – 0.77 1.2
TJ = 125°C) – 0.65 –
Reverse Recovery Time trr – 54.5 – ns

(IS = 5.0 Adc, VGS = 0 Vdc, ta – 14.8 –


dIS/dt = 100 A/µs) tb – 39.7 –
Reverse Recovery Stored Charge QRR – 0.048 – µC
2. Pulse Test: Pulse Width ≤ 300 µs, Duty Cycle ≤ 2%.
3. Switching characteristics are independent of operating junction temperature.

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TYPICAL ELECTRICAL CHARACTERISTICS

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Figure 3. On–Resistance versus Figure 4. On–Resistance versus Drain Current


Gate–To–Source Voltage and Gate Voltage

 


   
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Figure 5. On–Resistance Variation with Figure 6. Drain–To–Source Leakage


Temperature Current versus Voltage

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POWER MOSFET SWITCHING

Switching behavior is most easily modeled and predicted The capacitance (Ciss) is read from the capacitance curve at
by recognizing that the power MOSFET is charge a voltage corresponding to the off–state condition when
controlled. The lengths of various switching intervals (∆t) calculating td(on) and is read at a voltage corresponding to the
are determined by how fast the FET input capacitance can on–state when calculating td(off).
be charged by current from the generator. At high switching speeds, parasitic circuit elements
The published capacitance data is difficult to use for complicate the analysis. The inductance of the MOSFET
calculating rise and fall because drain–gate capacitance source lead, inside the package and in the circuit wiring
varies greatly with applied voltage. Accordingly, gate which is common to both the drain and gate current paths,
charge data is used. In most cases, a satisfactory estimate of produces a voltage at the source which reduces the gate drive
average input current (IG(AV)) can be made from a current. The voltage is determined by Ldi/dt, but since di/dt
rudimentary analysis of the drive circuit so that is a function of drain current, the mathematical solution is
t = Q/IG(AV) complex. The MOSFET output capacitance also
complicates the mathematics. And finally, MOSFETs have
During the rise and fall time interval when switching a finite internal gate resistance which effectively adds to the
resistive load, VGS remains virtually constant at a level resistance of the driving source, but the internal resistance
known as the plateau voltage, VSGP. Therefore, rise and fall is difficult to measure and, consequently, is not specified.
times may be approximated by the following: The resistive switching time variation versus gate
tr = Q2 x RG/(VGG – VGSP) resistance (Figure 9) shows how typical switching
tf = Q2 x RG/VGSP performance is affected by the parasitic circuit elements. If
where the parasitics were not present, the slope of the curves would
maintain a value of unity regardless of the switching speed.
VGG = the gate drive voltage, which varies from zero to VGG
The circuit used to obtain the data is constructed to minimize
RG = the gate drive resistance
common inductance in the drain and gate circuit loops and
and Q2 and VGSP are read from the gate charge curve.
is believed readily achievable with board mounted
During the turn–on and turn–off delay times, gate current is components. Most power electronic loads are inductive; the
not constant. The simplest calculation uses appropriate data in the figure is taken with a resistive load, which
values from the capacitance curves in a standard equation for approximates an optimally snubbed inductive load. Power
voltage change in an RC network. The equations are: MOSFETs may be safely operated into an inductive load;
td(on) = RG Ciss In [VGG/(VGG – VGSP)] however, snubbing reduces switching losses.
td(off) = RG Ciss In (VGG/VGSP)

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Figure 8. Gate–To–Source and Drain–To–Source Figure 9. Resistive Switching Time


Voltage versus Total Charge Variation versus Gate Resistance

DRAIN–TO–SOURCE DIODE CHARACTERISTICS

The switching characteristics of a MOSFET body diode high di/dts. The diode’s negative di/dt during ta is directly
are very important in systems using it as a freewheeling or controlled by the device clearing the stored charge.
commutating diode. Of particular interest are the reverse However, the positive di/dt during tb is an uncontrollable
recovery characteristics which play a major role in diode characteristic and is usually the culprit that induces
determining switching losses, radiated noise, EMI and RFI. current ringing. Therefore, when comparing diodes, the
System switching losses are largely due to the nature of ratio of tb/ta serves as a good indicator of recovery
the body diode itself. The body diode is a minority carrier abruptness and thus gives a comparative estimate of
device, therefore it has a finite reverse recovery time, trr, due probable noise generated. A ratio of 1 is considered ideal and
to the storage of minority carrier charge, QRR, as shown in values less than 0.5 are considered snappy.
the typical reverse recovery wave form of Figure 15. It is this Compared to ON Semiconductor standard cell density
stored charge that, when cleared from the diode, passes low voltage MOSFETs, high cell density MOSFET diodes
through a potential and defines an energy loss. Obviously, are faster (shorter trr), have less stored charge and a softer
repeatedly forcing the diode through reverse recovery reverse recovery characteristic. The softness advantage of
further increases switching losses. Therefore, one would the high cell density diode means they can be forced through
like a diode with short trr and low QRR specifications to reverse recovery at a higher di/dt than a standard cell
minimize these losses. MOSFET diode without increasing the current ringing or the
The abruptness of diode reverse recovery effects the noise generated. In addition, power dissipation incurred
amount of radiated noise, voltage spikes, and current from switching the diode will be less due to the shorter
ringing. The mechanisms at work are finite irremovable recovery time and lower switching losses.
circuit parasitic inductances and capacitances acted upon by
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Figure 10. Diode Forward Voltage versus Current

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Figure 11. Reverse Recovery Time (trr)

SAFE OPERATING AREA

The Forward Biased Safe Operating Area curves define total power averaged over a complete switching cycle must
the maximum simultaneous drain–to–source voltage and not exceed (TJ(MAX) – TC)/(RθJC).
drain current that a transistor can handle safely when it is A power MOSFET designated E–FET can be safely used
forward biased. Curves are based upon maximum peak in switching circuits with unclamped inductive loads. For
junction temperature and a case temperature (TC) of 25°C. reliable operation, the stored energy from circuit inductance
Peak repetitive pulsed power limits are determined by using dissipated in the transistor while in avalanche must be less
the thermal response data in conjunction with the procedures than the rated limit and must be adjusted for operating
discussed in AN569, “Transient Thermal Resistance – conditions differing from those specified. Although industry
General Data and Its Use.” practice is to rate in terms of energy, avalanche energy
Switching between the off–state and the on–state may capability is not a constant. The energy rating decreases
traverse any load line provided neither rated peak current non–linearly with an increase of peak current in avalanche
(IDM) nor rated voltage (VDSS) is exceeded, and that the and peak junction temperature.
transition time (tr, tf) does not exceed 10 µs. In addition the

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Figure 12. Maximum Rated Forward Biased Figure 13. Maximum Avalanche Energy versus
Safe Operating Area Starting Junction Temperature

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TYPICAL ELECTRICAL CHARACTERISTICS


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Figure 14. Thermal Response

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INFORMATION FOR USING THE SO–8 SURFACE MOUNT PACKAGE

MINIMUM RECOMMENDED FOOTPRINT FOR SURFACE MOUNTED APPLICATIONS


Surface mount board layout is a critical portion of the total interface between the board and the package. With the
design. The footprint for the semiconductor packages must correct pad geometry, the packages will self–align when
be the correct size to ensure proper solder connection subjected to a solder reflow process.

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SO–8 POWER DISSIPATION


The power dissipation of the SO–8 is a function of the into the equation for an ambient temperature TA of 25°C,
input pad size. This can vary from the minimum pad size one can calculate the power dissipation of the device which
for soldering to the pad size given for maximum power in this case is 2.0 Watts.
dissipation. Power dissipation for a surface mount device is 150°C – 25°C
determined by TJ(max), the maximum rated junction PD = = 2.0 Watts
62.5°C/W
temperature of the die, RθJA, the thermal resistance from
the device junction to ambient; and the operating The 62.5°C/W for the SO–8 package assumes the
temperature, TA. Using the values provided on the data recommended footprint on a glass epoxy printed circuit
sheet for the SO–8 package, PD can be calculated as board to achieve a power dissipation of 2.0 Watts using the
follows: footprint shown. Another alternative would be to use a
TJ(max) – TA
ceramic substrate or an aluminum core board such as
PD = Thermal Cladt. Using board material such as Thermal
RθJA
Clad, the power dissipation can be doubled using the same
The values for the equation are found in the maximum footprint.
ratings table on the data sheet. Substituting these values

SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • The soldering temperature and time shall not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within • When shifting from preheating to soldering, the
a short time could result in device failure. Therefore, the maximum temperature gradient shall be 5°C or less.
following items should always be observed in order to • After soldering has been completed, the device should
minimize the thermal stress to which the devices are be allowed to cool naturally for at least three minutes.
subjected. Gradual cooling should be used as the use of forced
• Always preheat the device. cooling will increase the temperature gradient and
• The delta temperature between the preheat and result in latent failure due to mechanical stress.
soldering should be 100°C or less.* • Mechanical stress or shock should not be applied
• When preheating and soldering, the temperature of the during cooling.
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When * Soldering a device without preheating can cause
using infrared heating with the reflow soldering excessive thermal shock and stress which can result in
method, the difference shall be a maximum of 10°C. damage to the device.

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567
MMDF6N03HD

TYPICAL SOLDER HEATING PROFILE


For any given circuit board, there will be a group of temperature versus time. The line on the graph shows the
control settings that will give the desired heat pattern. The actual temperature that might be experienced on the surface
operator must set temperatures for several heating zones of a test board at or near a central solder joint. The two
and a figure for belt speed. Taken together, these control profiles are based on a high density and a low density
settings make up a heating “profile” for that particular board. The Vitronics SMD310 convection/infrared reflow
circuit board. On machines controlled by a computer, the soldering system was used to generate this profile. The type
computer remembers these profiles from one operating of solder used was 62/36/2 Tin Lead Silver with a melting
session to the next. Figure 16 shows a typical heating point between 177–189°C. When this type of furnace is
profile for use when soldering a surface mount device to a used for solder reflow work, the circuit boards and solder
printed circuit board. This profile will vary among joints tend to heat first. The components on the board are
soldering systems, but it is a good starting point. Factors then heated by conduction. The circuit board, because it has
that can affect the profile include the type of soldering a large surface area, absorbs the thermal energy more
system in use, density and types of components on the efficiently, then distributes this energy to the components.
board, type of solder used, and the type of board or Because of this effect, the main body of a component may
substrate material being used. This profile shows be up to 30 degrees cooler than the adjacent solder joints.

STEP 1 STEP 2 STEP 3 STEP 4 STEP 5 STEP 6 STEP 7


PREHEAT VENT HEATING HEATING HEATING VENT COOLING
ZONE 1 “SOAK” ZONES 2 & 5 ZONES 3 & 6 ZONES 4 & 7
“RAMP” “RAMP” “SOAK” “SPIKE” 205° TO 219°C
PEAK AT
200°C DESIRED CURVE FOR HIGH 170°C SOLDER
MASS ASSEMBLIES JOINT
160°C
150°C

150°C
SOLDER IS LIQUID FOR
40 TO 80 SECONDS
100°C 140°C (DEPENDING ON
MASS OF ASSEMBLY)
100°C

DESIRED CURVE FOR LOW


MASS ASSEMBLIES
5°C

TIME (3 TO 7 MINUTES TOTAL) TMAX


Figure 16. Typical Solder Heating Profile

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568
(" 8

#$%& '(
"    
N–Channel SO–8, Dual
EZFETst are an advanced series of Power MOSFETs which
contain monolithic back–to–back zener diodes. These zener diodes http://onsemi.com
provide protection against ESD and unexpected transients. These
miniature surface mount MOSFETs feature ultra low RDS(on) and true 7 AMPERES
logic level performance. They are capable of withstanding high energy
20 VOLTS
in the avalanche and commutation modes and the drain–to–source
diode has a very low reverse recovery time. EZFET devices are RDS(on) = 27 mΩ
designed for use in low voltage, high speed switching applications
where power efficiency is important. Typical applications are dc–dc N–Channel
converters, and power management in portable and battery powered D
products such as computers, printers, cellular and cordless phones.
They can also be used for low voltage motor controls in mass storage
products such as disk drives and tape drives.
G
• Zener Protected Gates Provide Electrostatic Discharge Protection
• Designed to Withstand 200 V Machine Model and 2000 V Human
Body Model S
• Ultra Low RDS(on) Provides Higher Efficiency and Extends Battery
Life MARKING
DIAGRAM
• Logic Level Gate Drive – Can be Driven by Logic ICs
• Miniature SO–8 Surface Mount Package – Saves Board Space
• Diode is Characterized for use in Bridge Circuits SO–8, Dual
7N02Z
• Diode Exhibits High Speed, with Soft Recovery 8 CASE 751
STYLE 11
LYWW
• IDSS Specified at Elevated Temperature 1
• Mounting Information for SO–8 Package Provided
7N02Z = Device Code
L = Location Code
Y = Year
WW = Work Week

PIN ASSIGNMENT

Source–1 1 8 Drain–1
Gate–1 2 7 Drain–1
Source–2 3 6 Drain–2
Gate–2 4 5 Drain–2
Top View

ORDERING INFORMATION

Device Package Shipping

MMDF7N02ZR2 SO–8 2500 Tape & Reel

 Semiconductor Components Industries, LLC, 2001 569 Publication Order Number:


January, 2001 – Rev. 1 MMDF7N02Z/D
MMDF7N02Z

MAXIMUM RATINGS (TJ = 25°C unless otherwise noted)


Rating Symbol Max Unit
Drain–to–Source Voltage VDSS 20 Vdc
Drain–to–Gate Voltage (RGS = 1.0 MΩ) VDGR 20 Vdc
Gate–to–Source Voltage – Continuous VGS ±12 Vdc
Drain Current Adc
Continuous @ TA = 25°C (Note 1.) ID 7.0
Continuous @ TA = 70°C (Note 1.) ID 4.6
Pulsed Drain Current (Note 3.) IDM 35
Total Power Dissipation @ TA = 25°C (Note 1.) PD 2.0 Watts
Linear Derating Factor @ TA = 25°C (Note 1.) 16 mW/°C
Total Power Dissipation @ TA = 25°C (Note 2.) PD 1.39 Watts
Linear Derating Factor @ TA = 25°C (Note 2.) 11.11 mW/°C
Operating and Storage Temperature Range TJ, Tstg – 55 to 150 °C
THERMAL RESISTANCE
Parameter Symbol Typ Max Unit
Junction–to–Ambient (Note 1.) RqJA – 62.5 °C/W
Junction–to–Ambient (Note 2.) – 90

ELECTRICAL CHARACTERISTICS (TC = 25°C unless otherwise noted)


Characteristic Symbol Min Typ Max Unit
OFF CHARACTERISTICS
Drain–to–Source Breakdown Voltage (Cpk ≥ 2.0) (Notes 4. & 5.) V(BR)DSS Vdc
(VGS = 0 Vdc, ID = 0.25 mAdc) 20 – –
Temperature Coefficient (Positive) – 15 – mV/°C
Zero Gate Voltage Drain Current IDSS µAdc
(VDS = 20 Vdc, VGS = 0 Vdc) – – 1.0
(VDS = 20 Vdc, VGS = 0 Vdc, TJ = 125°C) – – 10
Gate–Body Leakage Current (VGS = ±12 Vdc, VDS = 0 Vdc) IGSS – – 3.0 µAdc
ON CHARACTERISTICS (Note 4.)
Gate Threshold Voltage (Cpk ≥ 2.0) (Notes 4. & 5.) VGS(th) Vdc
(VDS = VGS, ID = 0.25 mAdc) 0.5 0.7 1.0
Threshold Temperature Coefficient (Negative) – 2.5 – mV/°C
Static Drain–to–Source On–Resistance (Cpk ≥ 2.0) (Notes 4. & 5.) RDS(on) mΩ
(VGS = 4.5 Vdc, ID = 7.0 Adc) – 23 27
(VGS = 2.5 Vdc, ID = 3.5 Adc) – 30 35
Forward Transconductance (VDS = 10 Vdc, ID = 6.0 Adc) (Note 4.) gFS 5.0 11 – Mhos
1. When mounted on 1″ square FR4 or G–10 board (VGS = 10 V, @ 10 seconds).
2. When mounted on minimum recommended FR4 or G–10 board (VGS = 10 V, @ Steady State).
3. Repetitive rating; pulse width limited by maximum junction temperature.
4. Pulse Test: Pulse Width ≤ 300 µs, Duty Cycle ≤ 2%.
5. Reflects typical values. Max limit – Typ
Cpk =
3 x SIGMA

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MMDF7N02Z

ELECTRICAL CHARACTERISTICS (TC = 25°C unless otherwise noted)


Characteristic Symbol Min Typ Max Unit
DYNAMIC CHARACTERISTICS
Input Capacitance Ciss – 450 630 pF
Output Capacitance (VDS = 16 Vd
Vdc, VGS = 0 Vd
Vdc,
Coss – 350 490
f = 1.0 MHz)
Transfer Capacitance Crss – 110 155
SWITCHING CHARACTERISTICS (Note 7.)
Turn–On Delay Time td(on) – 31 62 ns
Rise Time (VDD = 10 Vdc, ID = 1.0 Adc, tr – 230 460
VGS = 4
4.55 Vdc
Vdc,
Turn–Off Delay Time RG = 6.0 Ω) (Note 6.) td(off) – 725 1450
Fall Time tf – 780 1560
Gate Charge QT – 17 24 nC
S Fi
See Figure 8
(VDS = 12 Vdc, ID = 5.0 Adc, Q1 – 1.4 –
VGS = 4.5 Vdc) (Note 6.) Q2 – 6.7 –
Q3 – 6.5 –
SOURCE–DRAIN DIODE CHARACTERISTICS
Forward On–Voltage (IS = 7.0 Adc, VGS = 0 Vdc) (Note 6.) VSD – 0.90 1.1 Vdc
(IS = 7.0 Adc, VGS = 0 Vdc, TJ = 125°C) – 0.84 –
Reverse Recovery Time trr – 780 – ns

(IS = 7.0 Adc, VGS = 0 Vdc, ta – 190 –


dIS/dt = 100 A/µs) (Note 6.) tb – 590 –
Reverse Recovery Stored Charge QRR – 5.7 – µC
6. Pulse Test: Pulse Width ≤ 300 µs, Duty Cycle ≤ 2%.
7. Switching characteristics are independent of operating junction temperatures.

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571
MMDF7N02Z

TYPICAL ELECTRICAL CHARACTERISTICS


$ $
2.3 V 2.1 V

ID, DRAIN CURRENT (AMPS)


10 V  ≥  
ID, DRAIN CURRENT (AMPS)

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4.5 V
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Figure 1. On–Region Characteristics Figure 2. Transfer Characteristics


RDS(on) , DRAIN–TO–SOURCE RESISTANCE (OHMS)

RDS(on) , DRAIN–TO–SOURCE RESISTANCE (OHMS)


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Figure 3. On–Resistance versus Figure 4. On–Resistance versus Drain Current


Drain Current and Gate Voltage
RDS(on) , DRAIN–TO–SOURCE RESISTANCE

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Figure 5. On–Resistance Variation with Figure 6. Drain–To–Source Leakage


Temperature Current versus Voltage

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572
MMDF7N02Z

POWER MOSFET SWITCHING

Switching behavior is most easily modeled and predicted The capacitance (Ciss) is read from the capacitance curve at
by recognizing that the power MOSFET is charge a voltage corresponding to the off–state condition when
controlled. The lengths of various switching intervals (∆t) calculating td(on) and is read at a voltage corresponding to the
are determined by how fast the FET input capacitance can on–state when calculating td(off).
be charged by current from the generator. At high switching speeds, parasitic circuit elements
The published capacitance data is difficult to use for complicate the analysis. The inductance of the MOSFET
calculating rise and fall because drain–gate capacitance source lead, inside the package and in the circuit wiring
varies greatly with applied voltage. Accordingly, gate which is common to both the drain and gate current paths,
charge data is used. In most cases, a satisfactory estimate of produces a voltage at the source which reduces the gate drive
average input current (IG(AV)) can be made from a current. The voltage is determined by Ldi/dt, but since di/dt
rudimentary analysis of the drive circuit so that is a function of drain current, the mathematical solution is
t = Q/IG(AV) complex. The MOSFET output capacitance also
complicates the mathematics. And finally, MOSFETs have
During the rise and fall time interval when switching a finite internal gate resistance which effectively adds to the
resistive load, VGS remains virtually constant at a level resistance of the driving source, but the internal resistance
known as the plateau voltage, VSGP. Therefore, rise and fall is difficult to measure and, consequently, is not specified.
times may be approximated by the following: The resistive switching time variation versus gate
tr = Q2 x RG/(VGG – VGSP) resistance (Figure 9) shows how typical switching
tf = Q2 x RG/VGSP performance is affected by the parasitic circuit elements. If
where the parasitics were not present, the slope of the curves would
maintain a value of unity regardless of the switching speed.
VGG = the gate drive voltage, which varies from zero to VGG
The circuit used to obtain the data is constructed to minimize
RG = the gate drive resistance
common inductance in the drain and gate circuit loops and
and Q2 and VGSP are read from the gate charge curve.
is believed readily achievable with board mounted
During the turn–on and turn–off delay times, gate current is components. Most power electronic loads are inductive; the
not constant. The simplest calculation uses appropriate data in the figure is taken with a resistive load, which
values from the capacitance curves in a standard equation for approximates an optimally snubbed inductive load. Power
voltage change in an RC network. The equations are: MOSFETs may be safely operated into an inductive load;
td(on) = RG Ciss In [VGG/(VGG – VGSP)] however, snubbing reduces switching losses.
td(off) = RG Ciss In (VGG/VGSP)

4
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Figure 7. Capacitance Variation

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573
MMDF7N02Z

$ $ 
VGS , GATE–TO–SOURCE VOLTAGE (VOLTS) @ td(off)

VDS , DRAIN–TO–SOURCE VOLTAGE (VOLTS)


tf
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tr

t, TIME (ns)
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Figure 8. Gate–To–Source and Drain–To–Source Figure 9. Resistive Switching Time


Voltage versus Total Charge Variation versus Gate Resistance

DRAIN–TO–SOURCE DIODE CHARACTERISTICS

The switching characteristics of a MOSFET body diode high di/dts. The diode’s negative di/dt during ta is directly
are very important in systems using it as a freewheeling or controlled by the device clearing the stored charge.
commutating diode. Of particular interest are the reverse However, the positive di/dt during tb is an uncontrollable
recovery characteristics which play a major role in diode characteristic and is usually the culprit that induces
determining switching losses, radiated noise, EMI and RFI. current ringing. Therefore, when comparing diodes, the
System switching losses are largely due to the nature of ratio of tb/ta serves as a good indicator of recovery
the body diode itself. The body diode is a minority carrier abruptness and thus gives a comparative estimate of
device, therefore it has a finite reverse recovery time, trr, due probable noise generated. A ratio of 1 is considered ideal and
to the storage of minority carrier charge, QRR, as shown in values less than 0.5 are considered snappy.
the typical reverse recovery wave form of Figure 15. It is this Compared to ON Semiconductor standard cell density
stored charge that, when cleared from the diode, passes low voltage MOSFETs, high cell density MOSFET diodes
through a potential and defines an energy loss. Obviously, are faster (shorter trr), have less stored charge and a softer
repeatedly forcing the diode through reverse recovery reverse recovery characteristic. The softness advantage of
further increases switching losses. Therefore, one would the high cell density diode means they can be forced through
like a diode with short trr and low QRR specifications to reverse recovery at a higher di/dt than a standard cell
minimize these losses. MOSFET diode without increasing the current ringing or the
The abruptness of diode reverse recovery effects the noise generated. In addition, power dissipation incurred
amount of radiated noise, voltage spikes, and current from switching the diode will be less due to the shorter
ringing. The mechanisms at work are finite irremovable recovery time and lower switching losses.
circuit parasitic inductances and capacitances acted upon by
:
, " #$_
IS, SOURCE CURRENT (AMPS)

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Figure 10. Diode Forward Voltage versus Current

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574
MMDF7N02Z

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'((

I S, SOURCE CURRENT
%D2 1EE 1!%'H
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Figure 11. Reverse Recovery Time (trr)

SAFE OPERATING AREA

The Forward Biased Safe Operating Area curves define total power averaged over a complete switching cycle must
the maximum simultaneous drain–to–source voltage and not exceed (TJ(MAX) – TC)/(RθJC).
drain current that a transistor can handle safely when it is A power MOSFET designated E–FET can be safely used
forward biased. Curves are based upon maximum peak in switching circuits with unclamped inductive loads. For
junction temperature and a case temperature (TC) of 25°C. reliable operation, the stored energy from circuit inductance
Peak repetitive pulsed power limits are determined by using dissipated in the transistor while in avalanche must be less
the thermal response data in conjunction with the procedures than the rated limit and must be adjusted for operating
discussed in AN569, “Transient Thermal Resistance – conditions differing from those specified. Although industry
General Data and Its Use.” practice is to rate in terms of energy, avalanche energy
Switching between the off–state and the on–state may capability is not a constant. The energy rating decreases
traverse any load line provided neither rated peak current non–linearly with an increase of peak current in avalanche
(IDM) nor rated voltage (VDSS) is exceeded, and that the and peak junction temperature.
transition time (tr, tf) does not exceed 10 µs. In addition the


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ID, DRAIN CURRENT (AMPS)

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Figure 12. Maximum Rated Forward Biased


Safe Operating Area

http://onsemi.com
575
MMDF7N02Z

TYPICAL ELECTRICAL CHARACTERISTICS


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Rthja(t) , EFFECTIVE TRANSIENT

#
THERMAL RESISTANCE



$

#
P(pk)

θ,' " ('
θ,

  
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t, TIME (s)

Figure 13. Thermal Response

di/dt
IS
trr
ta tb
TIME

tp 0.25 IS

IS

Figure 14. Diode Reverse Recovery Waveform

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576
MMDF7N02Z

INFORMATION FOR USING THE SO–8 SURFACE MOUNT PACKAGE

MINIMUM RECOMMENDED FOOTPRINT FOR SURFACE MOUNTED APPLICATIONS


Surface mount board layout is a critical portion of the total interface between the board and the package. With the
design. The footprint for the semiconductor packages must correct pad geometry, the packages will self–align when
be the correct size to ensure proper solder connection subjected to a solder reflow process.

9
$#

#:$ $$
: 6

#6 $
9 #:
inches
mm

SO–8 POWER DISSIPATION


The power dissipation of the SO–8 is a function of the into the equation for an ambient temperature TA of 25°C,
input pad size. This can vary from the minimum pad size one can calculate the power dissipation of the device which
for soldering to the pad size given for maximum power in this case is 2.0 Watts.
dissipation. Power dissipation for a surface mount device is
PD + 150°C * 25°C + 2.0 Watts
determined by TJ(max), the maximum rated junction 62.5°CńW
temperature of the die, RθJA, the thermal resistance from
The 62.5°C/W for the SO–8 package assumes the
the device junction to ambient; and the operating
recommended footprint on a glass epoxy printed circuit
temperature, TA. Using the values provided on the data
board to achieve a power dissipation of 2.0 Watts using the
sheet for the SO–8 package, PD can be calculated as
footprint shown. Another alternative would be to use a
follows:
ceramic substrate or an aluminum core board such as
T (max) * TA
PD + J Thermal Cladt. Using board material such as Thermal
RqJA Clad, the power dissipation can be doubled using the same
The values for the equation are found in the maximum footprint.
ratings table on the data sheet. Substituting these values

SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • The soldering temperature and time shall not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within • When shifting from preheating to soldering, the
a short time could result in device failure. Therefore, the maximum temperature gradient shall be 5°C or less.
following items should always be observed in order to • After soldering has been completed, the device should
minimize the thermal stress to which the devices are be allowed to cool naturally for at least three minutes.
subjected. Gradual cooling should be used as the use of forced
• Always preheat the device. cooling will increase the temperature gradient and
• The delta temperature between the preheat and result in latent failure due to mechanical stress.
soldering should be 100°C or less.* • Mechanical stress or shock should not be applied
• When preheating and soldering, the temperature of the during cooling.
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When * Soldering a device without preheating can cause
using infrared heating with the reflow soldering excessive thermal shock and stress which can result in
method, the difference shall be a maximum of 10°C. damage to the device.

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577
MMDF7N02Z

TYPICAL SOLDER HEATING PROFILE


For any given circuit board, there will be a group of temperature versus time. The line on the graph shows the
control settings that will give the desired heat pattern. The actual temperature that might be experienced on the surface
operator must set temperatures for several heating zones of a test board at or near a central solder joint. The two
and a figure for belt speed. Taken together, these control profiles are based on a high density and a low density
settings make up a heating “profile” for that particular board. The Vitronics SMD310 convection/infrared reflow
circuit board. On machines controlled by a computer, the soldering system was used to generate this profile. The type
computer remembers these profiles from one operating of solder used was 62/36/2 Tin Lead Silver with a melting
session to the next. Figure 15 shows a typical heating point between 177–189°C. When this type of furnace is
profile for use when soldering a surface mount device to a used for solder reflow work, the circuit boards and solder
printed circuit board. This profile will vary among joints tend to heat first. The components on the board are
soldering systems, but it is a good starting point. Factors then heated by conduction. The circuit board, because it has
that can affect the profile include the type of soldering a large surface area, absorbs the thermal energy more
system in use, density and types of components on the efficiently, then distributes this energy to the components.
board, type of solder used, and the type of board or Because of this effect, the main body of a component may
substrate material being used. This profile shows be up to 30 degrees cooler than the adjacent solder joints.

   #  4  6  $  9  :



                
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O
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Figure 15. Typical Solder Heating Profile

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578
( #

#$%& '(
   
P–Channel SO–8, FETKYt
The FETKY product family incorporates low RDS(on), true logic
level MOSFETs packaged with industry leading, low forward drop, http://onsemi.com
low leakage Schottky Barrier rectifiers to offer high efficiency
components in a space saving configuration. Independent pinouts for 2 AMPERES
MOSFET and Schottky die allow the flexibility to use a single
component for switching and rectification functions in a wide variety
20 VOLTS
of applications such as Buck Converter, Buck–Boost, Synchronous RDS(on) = 160 mW
Rectification, Low Voltage Motor Control, and Load Management in VF = 0.39 Volts
Battery Packs, Chargers, Cell Phones and other Portable Products.
• Power MOSFET with Low VF, Low IR Schottky Rectifier P–Channel
• Lower Component Placement and Inventory Costs along with
D
Board Space Savings
• Logic Level Gate Drive – Can be Driven by Logic ICs
• Mounting Information for SO–8 Package Provided
• IDSS Specified at Elevated Temperature G
• Applications Information Provided
S
MOSFET MAXIMUM RATINGS (TJ = 25°C unless otherwise noted)
(Note 1.)
MARKING
Rating Symbol Value Unit DIAGRAM
Drain–to–Source Voltage VDSS 20 Vdc
Drain–to–Gate Voltage (RGS = 1.0 MW) VDGR 20 Vdc SO–8
2P102
Gate–to–Source Voltage – Continuous VGS "20 Vdc 8 CASE 751
LYWW
STYLE 18
Drain Current (Note 3.)
– Continuous @ TA = 25°C ID 3.3 Adc 1
– Continuous @ TA = 100°C ID 2.1
– Single Pulse (tp v 10 ms) IDM 20 Apk L = Location Code
Y = Year
Total Power Dissipation @ TA = 25°C PD 2.0 Watts WW = Work Week
(Note 2.)

Single Pulse Drain–to–Source Avalanche EAS 324 mJ PIN ASSIGNMENT


Energy – STARTING TJ = 25°C
VDD = 30 Vdc, VGS = 5.0 Vdc, VDS = 20
Anode 1 8 Cathode
Vdc, IL = 9.0 Apk, L = 10 mH, RG = 25 W
Anode 2 7 Cathode
1. Negative sign for P–channel device omitted for clarity.
2. Pulse Test: Pulse Width ≤ 250 µs, Duty Cycle ≤ 2.0%. Source 3 6 Drain
3. Mounted on 2″ square FR4 board (1″ sq. 2 oz. Cu 0.06″ thick single sided), Gate 4 5 Drain
10 sec. max.
Top View

ORDERING INFORMATION

Device Package Shipping

MMDFS2P102R2 SO–8 2500 Tape & Reel

 Semiconductor Components Industries, LLC, 2000 579 Publication Order Number:


November, 2000 – Rev. 1 MMDFS2P102/D
MMDFS2P102

SCHOTTKY RECTIFIER MAXIMUM RATINGS (TJ = 25°C unless otherwise noted)


Peak Repetitive Reverse Voltage VRRM 20 Volts
DC Blocking Voltage VR

Average Forward Current (Note 4.) (Rated VR) TA = 100°C IO 1.0 Amps
Peak Repetitive Forward Current (Note 3.) (Rated VR, Square Wave, 20 kHz) TA = 105°C Ifrm 2.0 Amps
Non–Repetitive Peak Surge Current Ifsm 20 Amps
(Surge applied at rated load conditions, halfwave, single phase, 60 Hz)

THERMAL CHARACTERISTICS – SCHOTTKY AND MOSFET


Thermal Resistance – Junction–to–Ambient (Note 5.) – MOSFET RqJA 167 °C/W
Thermal Resistance – Junction–to–Ambient (Note 6.) – MOSFET RqJA 100
Thermal Resistance – Junction–to–Ambient (Note 3.) – MOSFET RqJA 62.5
Thermal Resistance – Junction–to–Ambient (Note 5.) – Schottky RqJA 204
Thermal Resistance – Junction–to–Ambient (Note 6.) – Schottky RqJA 122
Thermal Resistance – Junction–to–Ambient (Note 4.) – Schottky RqJA 83
Operating and Storage Temperature Range Tj, Tstg –55 to 150
4. Mounted on 2″ square FR4 board (1″ sq. 2 oz. Cu 0.06″ thick single sided), 10 sec. max.
5. Mounted with minimum recommended pad size, PC Board FR4.
6. Mounted on 2″ square FR4 board (1″ sq. 2 oz. Cu 0.06″ thick single sided), Steady State.

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MMDFS2P102

MOSFET ELECTRICAL CHARACTERISTICS (TJ = 25°C unless otherwise noted) (Note 7.)
Characteristic Symbol Min Typ Max Unit
OFF CHARACTERISTICS
Drain–Source Voltage V(BR)DSS
(VGS = 0 Vdc, ID = 0.25 mA) 20 – – Vdc
Temperature Coefficient (Positive) – 25 – mV/°C
Zero Gate Drain Current IDSS µAdc
(VDS = 30 Vdc, VGS = 0 Vdc) – – 1.0
(VDS = 20 Vdc, VGS = 0 Vdc, TJ = 125°C) – – 10
Gate Body Leakage Current (VGS = ± 20 Vdc, VDS = 0) IGSS – – 100 nAdc
ON CHARACTERISTICS (Note 8.)
Gate Threshold Voltage VGS(th) Vdc
(VDS = VGS, ID = 0.25 mA) 1.0 1.5 2.0
Temperature Coefficient (Negative) – 4.0 – mV/°C
Static Drain–Source Resistance RDS(on) Ohms
(VGS = 10 Vdc, ID = 2.0 Adc) – 0.118 0.160
(VGS = 4.5 Vdc, ID = 2.5 Adc) – 0.152 0.180
Forward Transconductance (VDS = 3.0 Vdc, ID = 1.0 Adc) gFS 2.0 3.0 – mhos
DYNAMIC CHARACTERISTICS
Input Capacitance Ciss – 420 588 pF
Output Capacitance (VDS = 16 Vd
Vdc, VGS = 0 Vd
Vdc,
Coss – 290 406
f = 1.0 MHz)
Reverse Transfer Capacitance Crss – 116 232

SWITCHING CHARACTERISTICS (Note 9.)


Turn–On Delay Time td(on) – 19 38 ns
Rise Time (VDS = 10 Vdc, ID = 2.0 Adc, tr – 66 132
VGS = 4
4.55 Vdc
Vdc,
Turn–Off Delay Time RG = 6.0 Ω) td(off) – 25 50
Fall Time tf – 37 74
Gate Charge QT – 15 20 nC

(VDS = 16 Vdc, ID = 2.0 Adc, Q1 – 1.2 –


VGS = 10 Vdc) Q2 – 5.0 –
Q3 – 4.0 –

DRAIN SOURCE DIODE CHARACTERISTICS


Forward On–Voltage (Note 8.) (IS = 2.0 Adc, VSD V
VGS = 0 Vdc) – 1.5 2.1
Reverse Recovery Time trr – 38 – ns
ta – 17 –
(IS = 2.0
2 0 Adc,
Adc VDD = 15 VV,
dIS/dt = 100 A/µs) tb – 21 –
Reverse Recovery Stored QRR – 0.034 – µC
Charge

SCHOTTKY RECTIFIER ELECTRICAL CHARACTERISTICS (TJ = 25°C unless otherwise noted)


g (Note
Maximum Instantaneous Forward Voltage ( 8.)) VF TJ = 25°C TJ = 125°C Volts
IF = 1.0
10A
0.47 0.39
IF = 2.0 A
0.58 0.53

Maximum Instantaneous Reverse Current (Note


( 8.)) IR TJ = 25°C TJ = 125°C mA
VR = 20 V
0.05 10
Maximum Voltage Rate of Change VR = 20 V dV/dt 10,000 V/ms
7. Negative sign for P–channel device omitted for clarity.
8. Pulse Test: Pulse Width ≤ 300 µsec, Duty Cycle ≤ 2.0%.
9. Switching characteristics are independent of operating temperature.

http://onsemi.com
581
MMDFS2P102

TYPICAL FET ELECTRICAL CHARACTERISTICS

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Figure 3. On–Resistance versus Figure 4. On–Resistance versus Drain Current


Gate–To–Source Voltage and Gate Voltage

 


   
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Figure 5. On–Resistance Variation with Figure 6. Drain–To–Source Leakage


Temperature Current versus Voltage

http://onsemi.com
582
MMDFS2P102

TYPICAL FET ELECTRICAL CHARACTERISTICS

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Figure 7. Capacitance Variation
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versus Gate Resistance Current

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Figure 11. Maximum Rated Forward Biased Figure 12. Maximum Avalanche Energy versus
Safe Operating Area Starting Junction Temperature

http://onsemi.com
583
MMDFS2P102

TYPICAL FET ELECTRICAL CHARACTERISTICS


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Figure 13. FET Thermal Response

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Figure 14. Diode Reverse Recovery Waveform

TYPICAL SCHOTTKY ELECTRICAL CHARACTERISTICS

 
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Figure 15. Typical Forward Voltage Figure 16. Maximum Forward Voltage

http://onsemi.com
584
MMDFS2P102

TYPICAL SCHOTTKY ELECTRICAL CHARACTERISTICS

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Figure 17. Typical Reverse Current Figure 18. Maximum Reverse Current

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Figure 19. Typical Capacitance Figure 20. Current Derating

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Figure 21. Forward Power Dissipation

http://onsemi.com
585
MMDFS2P102

TYPICAL SCHOTTKY ELECTRICAL CHARACTERISTICS


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Figure 22. Schottky Thermal Response

TYPICAL APPLICATIONS

STEP DOWN SWITCHING REGULATORS



5 5

%  ;'  

 

Buck Regulator



5 5

%  ;'  

 

Synchronous Buck Regulator

http://onsemi.com
586
MMDFS2P102

TYPICAL APPLICATIONS

STEP UP SWITCHING REGULATORS



5 5

%  ;'  
@
 

Boost Regulator

5 5

%  ;'  

 

Buck–Boost Regulator

MULTIPLE BATTERY CHARGERS

Buck Regulator/Charger

@  @# #
=  R
5

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@4 4
=  R#

http://onsemi.com
587
MMDFS2P102

TYPICAL APPLICATIONS

Li–lon BATTERY PACK APPLICATIONS

Battery Pack
  5

% 
= 
- SMART IC


 
 


@ @#

  

- -

• Applicable in battery packs which require a high current level.


• During charge cycle Q2 is on and Q1 is off. Schottky can reduce power loss during fast charge.
• During discharge Q1 is on and Q2 is off. Again, Schottky can reduce power dissipation.
• Under normal operation, both transistors are on.

http://onsemi.com
588
(!!

 

#$%& '(
  !  
N–Channel SO–8, FETKYt
http://onsemi.com
The FETKY product family incorporates low RDS(on), true logic
level MOSFETs packaged with industry leading, low forward drop,
6 AMPERES
low leakage Schottky Barrier rectifiers to offer high efficiency
components in a space saving configuration. Independent pinouts for 30 VOLTS
MOSFET and Schottky die allow the flexibility to use a single RDS(on) = 35 mW
component for switching and rectification functions in a wide variety VF = 0.42 Volts
of applications such as Buck Converter, Buck–Boost, Synchronous
Rectification, Low Voltage Motor Control, and Load Management in
N–Channel
Battery Packs, Chargers, Cell Phones and other Portable Products.
• Power MOSFET with Low VF D
• Lower Component Placement and Inventory Costs along with
Board Space Savings
• Logic Level Gate Drive — Can be Driven by Logic ICs G
• Mounting Information for SO–8 Package Provided
• Applications Information Provided S
• R2 Suffix for Tape and Reel (2500 units/13″ reel)
• Marking: 6N303 MARKING
DIAGRAM
MOSFET MAXIMUM RATINGS (TJ = 25°C unless otherwise noted)
(Note 1.)
SO–8
Rating Symbol Value Unit 6N303
8 CASE 751
Drain–to–Source Voltage VDSS 30 Vdc LYWW
STYLE 18
Drain–to–Gate Voltage (RGS = 1.0 MW) VDGR 30 Vdc 1
Gate–to–Source Voltage — Continuous VGS "20 Vdc
6N303 = Device Code
Drain Current (Note 2.) L = Location Code
– Continuous @ TA = 25°C ID 6.0 Adc Y = Year
– Single Pulse (tp v 10 ms) IDM 30 Apk WW = Work Week
Total Power Dissipation @ TA = 25°C PD 2.0 Watts
(Note 2.) PIN ASSIGNMENT
Single Pulse Drain–to–Source Avalanche EAS 325 mJ
Energy — Startin TJ = 25°C Anode 1 8 Cathode
VDD = 30 Vdc, VGS = 5.0 Vdc, VDS = 20 Anode 2 7 Cathode
Vdc, IL = 9.0 Apk, L = 10 mH, RG = 25 W
Source 3 6 Drain
1. Pulse Test: Pulse Width ≤ 250 µs, Duty Cycle ≤ 2.0%.
2. Mounted on 2″ square FR4 board (1″ sq. 2 oz. Cu 0.06″ thick single sided), Gate 4 5 Drain
10 sec. max. Top View

ORDERING INFORMATION

Device Package Shipping

MMDFS6N303R2 SO–8 2500 Tape & Reel

This document contains information on a product under development. ON Semiconductor


reserves the right to change or discontinue this product without notice.

 Semiconductor Components Industries, LLC, 2000 589 Publication Order Number:


November, 2000 – Rev. 1 MMDFS6N303/D
MMDFS6N303

SCHOTTKY RECTIFIER MAXIMUM RATINGS (TJ = 25°C unless otherwise noted)


Peak Repetitive Reverse Voltage VRRM 30 Volts
DC Blocking Voltage VR

Average Forward Current (Note 3.) IO Amps


(Rated VR) TA = 104°C 2.0

Peak Repetitive Forward Current (Note 3.) Ifrm Amps


(Rated VR, Square Wave, 20 kHz) TA = 108°C 4.0

Non–Repetitive Peak Surge Current Ifsm 30 Amps


(Surge applied at rated load conditions, halfwave, single phase, 60 Hz)

THERMAL CHARACTERISTICS — SCHOTTKY AND MOSFET


Thermal Resistance — Junction–to–Ambient (Note 4.) — MOSFET RqJA 167 °C/W
Thermal Resistance — Junction–to–Ambient (Note 5.) — MOSFET RqJA 97
Thermal Resistance — Junction–to–Ambient (Note 2.) — MOSFET RqJA 62.5
Thermal Resistance — Junction–to–Ambient (Note 4.) — Schottky RqJA 197
Thermal Resistance — Junction–to–Ambient (Note 5.) — Schottky RqJA 97
Thermal Resistance — Junction–to–Ambient (Note 3.) — Schottky RqJA 62.5
Operating and Storage Temperature Range Tj, Tstg –55 to 150

MOSFET ELECTRICAL CHARACTERISTICS (TC = 25°C unless otherwise noted) (Note 6.)
Characteristic Symbol Min Typ Max Unit
OFF CHARACTERISTICS
Drain–Source Voltage V(BR)DSS
(VGS = 0 Vdc, ID = 0.25 mA) 30 — — Vdc
Temperature Coefficient (Positive) — — — mV/°C
Zero Gate Drain Current IDSS µAdc
(VDS = 24 Vdc, VGS = 0 Vdc) — — 1.0
(VDS = 24 Vdc, VGS = 0 Vdc, TJ = 125°C) — — 20
Gate Body Leakage Current (VGS = ± 20 Vdc, VDS = 0) IGSS — — 100 nAdc
ON CHARACTERISTICS (Note 6.)
Gate Threshold Voltage VGS(th) Vdc
(VDS = VGS, ID = 0.25 mA) 1.0 — —
Temperature Coefficient (Negative) — — —
Static Drain–Source Resistance RDS(on) mW
(VGS = 10 Vdc, ID = 5.0 Adc) — 28 35
(VGS = 4.5 Vdc, ID = 3.9 Adc) — 42 50
Forward Transconductance (VDS = 15 Vdc, ID = 5.0 Adc) gFS — 9.0 — mhos
DYNAMIC CHARACTERISTICS
Input Capacitance Ciss — 430 600 pF
Output Capacitance (VDS = 24 Vd
Vdc, VGS = 0 Vd
Vdc,
Coss — 217 300
f = 1.0 MHz)
Reverse Transfer Capacitance Crss — 67.5 135
3. Mounted on 2″ square FR4 board (1″ sq. 2 oz. Cu 0.06″ thick single sided), 10 sec. max.
4. Mounted with minimum recommended pad size, PC Board FR4.
5. Mounted on 2″ square FR4 board (1″ sq. 2 oz. Cu 0.06″ thick single sided), Steady State.
6. Pulse Test: Pulse Width ≤ 300 µs, Duty Cycle ≤ 2.0%.

http://onsemi.com
590
MMDFS6N303

MOSFET ELECTRICAL CHARACTERISTICS – continued (TC = 25°C unless otherwise noted) (Note 7.)
Characteristic Symbol Min Typ Max Unit
SWITCHING CHARACTERISTICS (Note 8.)
Turn–On Delay Time td(on) — 8.2 16.5 ns
Rise Time (VDD = 15 Vdc, ID = 1.0 Adc, tr — 8.5 17
VGS = 10 Vdc
Vdc,
Turn–Off Delay Time RG = 6.0 Ω) td(off) — 89.6 179
Fall Time tf — 61.1 122
Gate Charge QT — 15.7 31.4 nC

(VDS = 15 Vdc, ID = 5.0 Adc, Q1 — 2.0 —


VGS = 10 Vdc) Q2 — 4.6 —
Q3 — 3.9 —

DRAIN SOURCE DIODE CHARACTERISTICS


Forward On–Voltage (Note 7.) (IS = 1.7 Adc, VSD Vdc
VGS = 0 Vdc) — 0.77 1.2
Reverse Recovery Time trr — 54.5 — ns
ta — 14.8 —
(VGS = 0 VV, IS = 5.0
50A A,
dIS/dt = 100 A/µs) tb — 39.7 —
Reverse Recovery Stored QRR — 0.048 — µC
Charge

SCHOTTKY RECTIFIER ELECTRICAL CHARACTERISTICS (TC = 25°C unless otherwise noted)


g (Note
Maximum Instantaneous Forward Voltage ( 7.)) VF TJ = 25°C TJ = 125°C Volts
IF = 100 mAdc
Ad
0.28 0.13
IF = 3.0 Adc
0.42 0.33
IF = 6.0 Adc
0.50 0.45

Maximum Instantaneous Reverse Current (Note


( 7.)) IR TJ = 25°C TJ = 125°C mA
VR = 30 V
250 —
— 25 mA
Maximum Voltage Rate of Change VR = 30 V dV/dt 10,000 V/ms
7. Pulse Test: Pulse Width ≤ 300 µs, Duty Cycle ≤ 2.0%.
8. Switching characteristics are independent of operating junction temperature.

http://onsemi.com
591
MMDFS6N303

TYPICAL FET ELECTRICAL CHARACTERISTICS

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Figure 1. On–Region Characteristics Figure 2. Transfer Characteristics

 


  


 


  
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Figure 3. On–Resistance versus Figure 4. On–Resistance versus Drain Current


Gate–To–Source Voltage and Gate Voltage

 


   
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Figure 5. On–Resistance Variation with Figure 6. Drain–To–Source Leakage


Temperature Current versus Voltage

http://onsemi.com
592
MMDFS6N303

TYPICAL FET ELECTRICAL CHARACTERISTICS

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Figure 7. Capacitance Variation
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Figure 11. Maximum Rated Forward Biased Figure 12. Maximum Avalanche Energy versus
Safe Operating Area Starting Junction Temperature

http://onsemi.com
593
MMDFS6N303

TYPICAL FET ELECTRICAL CHARACTERISTICS


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Figure 13. FET Thermal Response

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TYPICAL SCHOTTKY ELECTRICAL CHARACTERISTICS

 
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Figure 15. Typical Forward Voltage Figure 16. Maximum Forward Voltage

http://onsemi.com
594
MMDFS6N303

TYPICAL SCHOTTKY ELECTRICAL CHARACTERISTICS

 


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Figure 17. Typical Reverse Current Figure 18. Maximum Reverse Current

   
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Figure 21. Forward Power Dissipation

http://onsemi.com
595
MMDFS6N303

TYPICAL SCHOTTKY ELECTRICAL CHARACTERISTICS


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Figure 22. Schottky Thermal Response

TYPICAL APPLICATIONS

STEP DOWN SWITCHING REGULATORS



5 5

%  ;'  

 

Buck Regulator



5 5

%  ;'  

 

Synchronous Buck Regulator

http://onsemi.com
596
MMDFS6N303

TYPICAL APPLICATIONS

STEP UP SWITCHING REGULATORS



5 5

%  ;'  
@
 

Boost Regulator

5 5

%  ;'  

 

Buck–Boost Regulator

MULTIPLE BATTERY CHARGERS

Buck Regulator/Charger

@  @# #
=  R
5

%


@4 4
=  R#

http://onsemi.com
597
MMDFS6N303

TYPICAL APPLICATIONS

Li–lon BATTERY PACK APPLICATIONS

Battery Pack
  5

% 
= 
- SMART IC


 
 


@ @#

  

- -

• Applicable in battery packs which require a high current level.


• During charge cycle Q2 is on and Q1 is off. Schottky can reduce power loss during fast charge.
• During discharge Q1 is on and Q2 is off. Again, Schottky can reduce power dissipation.
• Under normal operation, both transistors are on.

http://onsemi.com
598
("
Preferred Device

#$%& '(
    
N–Channel SOT–223
This Power MOSFET is designed for high speed, low loss power
switching applications such as switching regulators, dc–dc converters,
solenoid and relay drivers. The device is housed in the SOT–223 http://onsemi.com
package which is designed for medium power surface mount
applications.
250 mA
• Silicon Gate for Fast Switching Speeds 200 VOLTS
• Low Drive Requirement RDS(on) = 14 
• The SOT–223 Package can be soldered using wave or reflow.
N–Channel
The formed leads absorb thermal stress during soldering
eliminating the possibility of damage to the die. 

MAXIMUM RATINGS (TC = 25°C unless otherwise noted)


Rating Symbol Value Unit 
Drain–to–Source Voltage VDSS 200 Volts
Gate–to–Source Voltage – Non–Repetitive VGS ±20 Volts 

Drain Current ID 250 mAdc


Total Power Dissipation @ TA = 25°C PD 0.8 Watts MARKING
(Note 1.) DIAGRAM
Derate above 25°C 6.4 mW/°C
Operating and Storage Temperature TJ, Tstg –65 to °C 4
TO–261AA FT107
Range 150
CASE 318E LWW
THERMAL CHARACTERISTICS 1 STYLE 3
2
3
Thermal Resistance – RθJA 156 °C/W
Junction–to–Ambient
L = Location Code
Maximum Temperature for Soldering TL WW = Work Week
Purposes 260 °C
Time in Solder Bath 10 Sec
1. Device mounted on FR–4 glass epoxy printed circuit using minimum PIN ASSIGNMENT
recommended footprint.
4 ()%

1 2 3
)'1 ()% ;(1

ORDERING INFORMATION

Device Package Shipping

MMFT107T1 SOT–223 1000 Tape & Reel

MMFT107T3 SOT–223 4000 Tape & Reel

Preferred devices are recommended choices for future use


and best overall value.

 Semiconductor Components Industries, LLC, 2000 599 Publication Order Number:


November, 2000 – Rev. 4 MMFT107T1/D
MMFT107T1

ELECTRICAL CHARACTERISTICS (TA = 25°C unless otherwise noted)


Characteristic Symbol Min Typ Max Unit

OFF CHARACTERISTICS
Drain–to–Source Breakdown Voltage V(BR)DSS 200 – – Vdc
(VGS = 0, ID = 10 µA)

Zero Gate Voltage Drain Current IDSS – – 30 nAdc


(VDS = 130 V, VGS = 0)

Gate–Body Leakage Current – Reverse IGSS – – 10 nAdc


(VGS = 15 Vdc, VDS = 0)

ON CHARACTERISTICS (Note 2.)


Gate Threshold Voltage VGS(th) 1.0 – 3.0 Vdc
(VDS = VGS, ID = 1.0 mAdc)

Static Drain–to–Source On–Resistance RDS(on) – – 14 Ohms


(VGS = 10 Vdc, ID = 200 mA)

Drain–to–Source On–Voltage VDS(on) – – 2.8 Vdc


(VGS = 10 V, ID = 200 mA)

Forward Transconductance gfs – 300 – mmhos


(VDS = 25 V, ID = 250 mA)

DYNAMIC CHARACTERISTICS
Input Capacitance Ciss – 60 – pF
(VDS = 25 VV, VGS = 0
0,
Output Capacitance Coss – 30 –
f = 1.0 MHz)
Transfer Capacitance Crss – 6.0 –

SOURCE DRAIN DIODE CHARACTERISTICS


Diode Forward Voltage VF – 0.8 – V
Continuous Source Current, Body IS – – 250 mA
(VGS = 0,
Diode
IS = 250 mA)
Pulsed Source Current, Body ISM – – 500
Diode
2. Pulse Test: Pulse Width ≤ 300 µs, Duty Cycle ≤ 2.0%.

TYPICAL ELECTRICAL CHARACTERISTICS

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Figure 1. On–Region Characteristics Figure 2. Transfer Characteristics

http://onsemi.com
600
MMFT107T1

TYPICAL ELECTRICAL CHARACTERISTICS


 


   
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Figure 7. Gate Charge versus Gate–to–Source Voltage Figure 8. Transconductance

http://onsemi.com
601
MMFT107T1

INFORMATION FOR USING THE SOT-223 SURFACE MOUNT PACKAGE

MINIMUM RECOMMENDED FOOTPRINT FOR SURFACE MOUNTED APPLICATIONS


Surface mount board layout is a critical portion of the interface between the board and the package. With the
total design. The footprint for the semiconductor packages correct pad geometry, the packages will self align when
must be the correct size to insure proper solder connection subjected to a solder reflow process.

$
48

:7
#

#68
94
7 7
#4 #4

:7
#

$7 $7 $7 %21!


$ $ $

SOT-223 POWER DISSIPATION


The power dissipation of the SOT-223 is a function of the PD = 150°C – 25°C = 0.8 watts
pad size. This can vary from the minimum pad size for 156°C/W
soldering to a pad size given for maximum power
The 156°C/W for the SOT-223 package assumes the use
dissipation. Power dissipation for a surface mount device is
of the recommended footprint on a glass epoxy printed
determined by TJ(max), the maximum rated junction
circuit board to achieve a power dissipation of 0.8 watts.
temperature of the die, RθJA, the thermal resistance from
There are other alternatives to achieving higher power
the device junction to ambient, and the operating
dissipation from the SOT-223 package. One is to increase
temperature, TA. Using the values provided on the data
the area of the collector pad. By increasing the area of the
sheet for the SOT-223 package, PD can be calculated as
collector pad, the power dissipation can be increased.
follows:
Although the power dissipation can almost be doubled with
TJ(max) – TA
PD = this method, area is taken up on the printed circuit board
RθJA which can defeat the purpose of using surface mount
The values for the equation are found in the maximum technology. A graph of RθJA versus collector pad area is
ratings table on the data sheet. Substituting these values shown in Figure 9.
into the equation for an ambient temperature TA of 25°C,
one can calculate the power dissipation of the device which
in this case is 0.8 watts.

http://onsemi.com
602
MMFT107T1

9

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θ
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Figure 9. Thermal Resistance versus Collector


Pad Area for the SOT-223 Package (Typical)

Another alternative would be to use a ceramic substrate board, the power dissipation can be doubled using the same
or an aluminum core board such as Thermal Cladt. Using footprint.
a board material such as Thermal Clad, an aluminum core

SOLDER STENCIL GUIDELINES


Prior to placing surface mount components onto a printed or stainless steel with a typical thickness of 0.008 inches.
circuit board, solder paste must be applied to the pads. A The stencil opening size for the SOT-223 package should
solder stencil is required to screen the optimum amount of be the same as the pad size on the printed circuit board, i.e.,
solder paste onto the footprint. The stencil is made of brass a 1:1 registration.

SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • The soldering temperature and time should not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within • When shifting from preheating to soldering, the
a short time could result in device failure. Therefore, the maximum temperature gradient should be 5°C or less.
following items should always be observed in order to • After soldering has been completed, the device should
minimize the thermal stress to which the devices are be allowed to cool naturally for at least three minutes.
subjected. Gradual cooling should be used as the use of forced
• Always preheat the device. cooling will increase the temperature gradient and
• The delta temperature between the preheat and result in latent failure due to mechanical stress.
soldering should be 100°C or less.* • Mechanical stress or shock should not be applied
• When preheating and soldering, the temperature of the during cooling
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When * Soldering a device without preheating can cause
using infrared heating with the reflow soldering excessive thermal shock and stress which can result in
method, the difference should be a maximum of 10°C. damage to the device.

http://onsemi.com
603
MMFT107T1

TYPICAL SOLDER HEATING PROFILE


For any given circuit board, there will be a group of The line on the graph shows the actual temperature that
control settings that will give the desired heat pattern. The might be experienced on the surface of a test board at or
operator must set temperatures for several heating zones, near a central solder joint. The two profiles are based on a
and a figure for belt speed. Taken together, these control high density and a low density board. The Vitronics
settings make up a heating “profile” for that particular SMD310 convection/infrared reflow soldering system was
circuit board. On machines controlled by a computer, the used to generate this profile. The type of solder used was
computer remembers these profiles from one operating 62/36/2 Tin Lead Silver with a melting point between
session to the next. Figure 10 shows a typical heating 177–189°C. When this type of furnace is used for solder
profile for use when soldering a surface mount device to a reflow work, the circuit boards and solder joints tend to
printed circuit board. This profile will vary among heat first. The components on the board are then heated by
soldering systems but it is a good starting point. Factors that conduction. The circuit board, because it has a large surface
can affect the profile include the type of soldering system in area, absorbs the thermal energy more efficiently, then
use, density and types of components on the board, type of distributes this energy to the components. Because of this
solder used, and the type of board or substrate material effect, the main body of a component may be up to 30
being used. This profile shows temperature versus time. degrees cooler than the adjacent solder joints.

STEP 1 STEP 2 STEP 3 STEP 4 STEP 5 STEP 6 STEP 7


PREHEAT VENT HEATING HEATING HEATING VENT COOLING
ZONE 1 “SOAK” ZONES 2 & 5 ZONES 3 & 6 ZONES 4 & 7
“RAMP” “RAMP” “SOAK” “SPIKE” 205° TO 219°C
PEAK AT
200°C DESIRED CURVE FOR HIGH 170°C SOLDER
MASS ASSEMBLIES JOINT
160°C
150°C

150°C
SOLDER IS LIQUID FOR
40 TO 80 SECONDS
100°C 140°C (DEPENDING ON
MASS OF ASSEMBLY)
100°C

DESIRED CURVE FOR LOW


MASS ASSEMBLIES
5°C

TIME (3 TO 7 MINUTES TOTAL) TMAX


Figure 10. Typical Solder Heating Profile

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604
( 
Preferred Device

#$%& '(
"    
N–Channel SOT–223
This Power MOSFET is designed for high speed, low loss power
switching applications such as switching regulators, converters,
solenoid and relay drivers. The device is housed in the SOT–223 http://onsemi.com
package which is designed for medium power surface mount
applications.
700 mA
• Silicon Gate for Fast Switching Speeds 240 VOLTS
• High Voltage – 240 Vdc RDS(on) = 6.0 
• Low Drive Requirement
N–Channel
• The SOT–223 Package can be soldered using wave or reflow.

The formed leads absorb thermal stress during soldering,
eliminating the possibility of damage to the die.

MAXIMUM RATINGS (TC = 25°C unless otherwise noted) 


Rating Symbol Value Unit
Drain–to–Source Voltage VDS 240 Vdc 

Gate–to–Source Voltage – Continuous VGS ±20 Vdc


Drain Current ID 700 mAdc MARKING
DIAGRAM
Total Power Dissipation @ TA = 25°C PD 1.5 Watts
(Note 1.)
Derate above 25°C 12 mW/°C 4
TO–261AA T2406
Operating and Storage Temperature TJ, Tstg –65 to °C CASE 318E LWW
Range 150 1 STYLE 3
2
THERMAL CHARACTERISTICS 3

Thermal Resistance – RθJA 83.3 °C/W


L = Location Code
Junction–to–Ambient (surface mounted)
WW = Work Week
(Note 1.)
Lead Temperature for Soldering Purposes, TL 260 °C
1/16″ from case PIN ASSIGNMENT
Time in Solder Bath 10 Sec
4 ()%
1. Device mounted on a glass epoxy printed circuit board 1.575 in. x 1.575 in.
x 0.059 in.; mounting pad for the collector lead min. 0.93 sq. in.

1 2 3
)'1 ()% ;(1

ORDERING INFORMATION

Device Package Shipping

MMFT2406T1 SOT–223 1000 Tape & Reel

MMFT2406T3 SOT–223 4000 Tape & Reel

Preferred devices are recommended choices for future use


and best overall value.

 Semiconductor Components Industries, LLC, 2000 605 Publication Order Number:


November, 2000 – Rev. 2 MMFT2406T1/D
MMFT2406T1

ELECTRICAL CHARACTERISTICS (TA = 25°C unless otherwise noted)


Characteristics Symbol Min Max Unit

OFF CHARACTERISTICS
Drain–to–Source Breakdown Voltage V(BR)DSS 240 – Vdc
(VGS = 0, ID = 100 µA)

Zero Gate Voltage Drain Current IDSS – 10 µAdc


(VDS = 120 V, VGS = 0)

Gate–Body Leakage Current IGSS – 100 nAdc


(VGS = 15 Vdc, VDS = 0)

ON CHARACTERISTICS (Note 2.)


Gate Threshold Voltage VGS(th) 0.8 2.0 Vdc
(VDS = VGS, ID = 1.0 mAdc)

Static Drain–to–Source On–Resistance RDS(on) Ohms


(VGS = 2.5 Vdc, ID = 0.1 Adc) – 10
(VGS = 10 Vdc, ID = 0.5 Adc) – 6.0
Drain–to–Source On–Voltage VDS(on) – 3.0 Vdc
(VGS = 10 V, ID = 0.5 A)

Forward Transconductance gFS 300 – mmhos


(VDS = 6.0 V, ID = 0.5 A)

DYNAMIC CHARACTERISTICS
Input Capacitance Ciss – 125 pF
(VDS = 25 VV, VGS = 0,
0
Output Capacitance Coss – 50
f = 1.0 MHz)
Transfer Capacitance Crss – 20
2. Pulse Test: Pulse Width ≤ 300 µs, Duty Cycle ≤ 2.0%.

http://onsemi.com
606
MMFT2406T1

INFORMATION FOR USING THE SOT-223 SURFACE MOUNT PACKAGE

MINIMUM RECOMMENDED FOOTPRINT FOR SURFACE MOUNTED APPLICATIONS


Surface mount board layout is a critical portion of the interface between the board and the package. With the
total design. The footprint for the semiconductor packages correct pad geometry, the packages will self align when
must be the correct size to insure proper solder connection subjected to a solder reflow process.

$
48

:7
#

#68
94
7 7
#4 #4

:7
#

$7 $7 $7 %21!


$ $ $

SOT-223 POWER DISSIPATION


The power dissipation of the SOT-223 is a function of the PD = 150°C – 25°C = 1.5 watts
pad size. This can vary from the minimum pad size for 83.3°C/W
soldering to a pad size given for maximum power
The 83.3°C/W for the SOT-223 package assumes the use
dissipation. Power dissipation for a surface mount device is
of the recommended footprint on a glass epoxy printed
determined by TJ(max), the maximum rated junction
circuit board to achieve a power dissipation of 1.5 watts.
temperature of the die, RθJA, the thermal resistance from
There are other alternatives to achieving higher power
the device junction to ambient, and the operating
dissipation from the SOT-223 package. One is to increase
temperature, TA. Using the values provided on the data
the area of the collector pad. By increasing the area of the
sheet for the SOT-223 package, PD can be calculated as
collector pad, the power dissipation can be increased.
follows:
Although the power dissipation can almost be doubled with
TJ(max) – TA
PD = this method, area is taken up on the printed circuit board
RθJA which can defeat the purpose of using surface mount
The values for the equation are found in the maximum technology. A graph of RθJA versus collector pad area is
ratings table on the data sheet. Substituting these values shown in Figure 1.
into the equation for an ambient temperature TA of 25°C,
one can calculate the power dissipation of the device which
in this case is 1.5 watts.

http://onsemi.com
607
MMFT2406T1

)E
1!%!')1 ,;'%' +%1'U&/
9
°
=)( )'1(%)E " 9#$″  " #$°
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S;'1  '21   C'*(%'

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,
θ

(1) !J;)(1 %21!

Figure 1. Thermal Resistance versus Collector


Pad Area for the SOT-223 Package (Typical)

Another alternative would be to use a ceramic substrate board, the power dissipation can be doubled using the same
or an aluminum core board such as Thermal Cladt. Using footprint.
a board material such as Thermal Clad, an aluminum core

SOLDER STENCIL GUIDELINES


Prior to placing surface mount components onto a printed or stainless steel with a typical thickness of 0.008 inches.
circuit board, solder paste must be applied to the pads. A The stencil opening size for the SOT-223 package should
solder stencil is required to screen the optimum amount of be the same as the pad size on the printed circuit board, i.e.,
solder paste onto the footprint. The stencil is made of brass a 1:1 registration.

SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • The soldering temperature and time should not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within • When shifting from preheating to soldering, the
a short time could result in device failure. Therefore, the maximum temperature gradient should be 5°C or less.
following items should always be observed in order to • After soldering has been completed, the device should
minimize the thermal stress to which the devices are be allowed to cool naturally for at least three minutes.
subjected. Gradual cooling should be used as the use of forced
• Always preheat the device. cooling will increase the temperature gradient and
• The delta temperature between the preheat and result in latent failure due to mechanical stress.
soldering should be 100°C or less.* • Mechanical stress or shock should not be applied
• When preheating and soldering, the temperature of the during cooling
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When * Soldering a device without preheating can cause
using infrared heating with the reflow soldering excessive thermal shock and stress which can result in
method, the difference should be a maximum of 10°C. damage to the device.

http://onsemi.com
608
MMFT2406T1

TYPICAL SOLDER HEATING PROFILE


For any given circuit board, there will be a group of The line on the graph shows the actual temperature that
control settings that will give the desired heat pattern. The might be experienced on the surface of a test board at or
operator must set temperatures for several heating zones, near a central solder joint. The two profiles are based on a
and a figure for belt speed. Taken together, these control high density and a low density board. The Vitronics
settings make up a heating “profile” for that particular SMD310 convection/infrared reflow soldering system was
circuit board. On machines controlled by a computer, the used to generate this profile. The type of solder used was
computer remembers these profiles from one operating 62/36/2 Tin Lead Silver with a melting point between
session to the next. Figure 2 shows a typical heating profile 177–189°C. When this type of furnace is used for solder
for use when soldering a surface mount device to a printed reflow work, the circuit boards and solder joints tend to
circuit board. This profile will vary among soldering heat first. The components on the board are then heated by
systems but it is a good starting point. Factors that can conduction. The circuit board, because it has a large surface
affect the profile include the type of soldering system in area, absorbs the thermal energy more efficiently, then
use, density and types of components on the board, type of distributes this energy to the components. Because of this
solder used, and the type of board or substrate material effect, the main body of a component may be up to 30
being used. This profile shows temperature versus time. degrees cooler than the adjacent solder joints.

STEP 1 STEP 2 STEP 3 STEP 4 STEP 5 STEP 6 STEP 7


PREHEAT VENT HEATING HEATING HEATING VENT COOLING
ZONE 1 “SOAK” ZONES 2 & 5 ZONES 3 & 6 ZONES 4 & 7
“RAMP” “RAMP” “SOAK” “SPIKE” 205° TO 219°C
PEAK AT
200°C DESIRED CURVE FOR HIGH 170°C SOLDER
MASS ASSEMBLIES JOINT
160°C
150°C

150°C
SOLDER IS LIQUID FOR
40 TO 80 SECONDS
100°C 140°C (DEPENDING ON
MASS OF ASSEMBLY)
100°C

DESIRED CURVE FOR LOW


MASS ASSEMBLIES
5°C

TIME (3 TO 7 MINUTES TOTAL) TMAX


Figure 2. Typical Solder Heating Profile

http://onsemi.com
609
( )
Preferred Device

#$%& '(
    
P–Channel SOT–223
This Power MOSFET is designed to withstand high energy in the
avalanche and commutation modes. This new energy efficient device
also offers a drain–to–source diode with a fast recovery time. http://onsemi.com
Designed for low voltage, high speed switching applications in power
supplies, converters and PWM motor controls, these devices are
1 AMPERE
particularly well suited for bridge circuits where diode speed and 60 VOLTS
commutating safe operating areas are critical and offer additional RDS(on) = 300 m
safety margin against unexpected voltage transients. The device is
housed in the SOT–223 package which is designed for medium power P–Channel
surface mount applications. 
• Silicon Gate for Fast Switching Speeds
• The SOT–223 Package can be Soldered Using Wave or Reflow. The
Formed Leads Absorb Thermal Stress During Soldering, Eliminating
the Possibility of Damage to the Die 

MAXIMUM RATINGS (TA = 25°C unless otherwise noted) 

Rating Symbol Value Unit


Drain–to–Source Voltage VDS 60 MARKING
Vdc DIAGRAM
Gate–to–Source Voltage – Continuous VGS ±15
Drain Current – Continuous ID 1.2 Adc
Drain Current – Pulsed IDM 4.8 4
TO–261AA 2955E
CASE 318E LWW
Total Power Dissipation @ TA = 25°C PD 0.8 Watts 1 STYLE 3
Derate above 25°C (Note 1.) 6.4 mW/°C 2
3
Operating and Storage Temperature TJ, Tstg –65 to °C
Range 150
2955E = Device Code
Single Pulse Drain–to–Source Avalanche EAS 108 mJ L = Location Code
Energy – Starting TJ = 25°C WW = Work Week
(VDD = 25 V, VGS = 10 V, Peak
IL= 1.2 A, L = 0.2 mH, RG = 25 Ω)
PIN ASSIGNMENT
THERMAL CHARACTERISTICS 4 ()%
Thermal Resistance – RθJA 156 °C/W
Junction–to–Ambient (surface mounted)
Maximum Temperature for Soldering 260 °C
Purposes, TL
Time in Solder Bath 10 Sec
1. Power rating when mounted on FR–4 glass epoxy printed circuit board using 1 2 3
recommended footprint. )'1 ()% ;(1

ORDERING INFORMATION

Device Package Shipping

MMFT2955ET1 SOT–223 1000 Tape & Reel

MMFT2955ET3 SOT–223 1000 Tape & Reel

Preferred devices are recommended choices for future use


and best overall value.

 Semiconductor Components Industries, LLC, 2000 610 Publication Order Number:


November, 2000 – Rev. 5 MMFT2955E/D
MMFT2955E

ELECTRICAL CHARACTERISTICS (TA = 25°C unless otherwise noted)


Characteristic Symbol Min Typ Max Unit
OFF CHARACTERISTICS
Drain–to–Source Breakdown Voltage, (VGS = 0, ID = 250 µA) V(BR)DSS 60 – – Vdc
Zero Gate Voltage Drain Current, IDSS µAdc
(VDS = 60 Vdc, VGS = 0 Vdc) – – 1.0
(VDS = 60 Vdc, VGS = 0 Vdc, TJ = 125°C) – – 50
Gate–Body Leakage Current, IGSS nAdc
(VGS = 15 V, VDS = 0) – – 100

ON CHARACTERISTICS
Gate Threshold Voltage, (VDS = VGS, ID = 1 mA) VGS(th) 2.0 – 4.5 Vdc
Static Drain–to–Source On–Resistance, (VGS = 10 V, ID = 0.6 A) RDS(on) – – 0.3 Ohms
Drain–to–Source On–Voltage, (VGS = 10 V, ID = 1.2 A) VDS(on) – – 0.48 Vdc
Forward Transconductance, (VDS = 15 V, ID = 0.6 A) gFS – 7.5 – mhos
DYNAMIC CHARACTERISTICS
Input Capacitance Ciss – 460 –
(VDS = 20 V,
Output Capacitance VGS = 0, Coss – 210 – pF
f = 1 MH
MHz))
Reverse Transfer Capacitance Crss – 84 –

SWITCHING CHARACTERISTICS (Note 2.)


Turn–On Delay Time td(on) – 18 –
Rise Time (VDD = 25 V, ID = 1.6 A tr – 29 –
VGS = 10 V
V, RG = 50 ohms,
ohms ns
Turn–Off Delay Time RGS = 25 ohms) td(off) – 44 –
Fall Time tf – 32 –
Total Gate Charge Qg – 18 –
(VDS = 48 V, ID = 1.2 A,
Gate–Source Charge VGS = 10 Vdc) Qgs – 2.8 – nC
S Figures
See Fi 15 andd 16
Gate–Drain Charge Qgd – 7.5 –
SOURCE DRAIN DIODE CHARACTERISTICS (Note 3.)
Forward On–Voltage IS = 1.2 A, VGS = 0 VSD – 1.0 – Vdc
Forward Turn–On Time IS = 1.2 A, VGS = 0, ton Limited by stray inductance
dlS/dt = 400 A/µs,
A/µs
Reverse Recovery Time VR = 30 V trr – 90 – ns
2. Switching characteristics are independent of operating junction temperature.
3. Pulse Test: Pulse Width ≤ 300 µs, Duty Cycle ≤ 2%.

http://onsemi.com
611
MMFT2955E

TYPICAL ELECTRICAL CHARACTERISTICS

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Figure 1. On Region Characteristics Figure 2. Gate–Threshold Voltage Variation


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Figure 5. On–Resistance versus Figure 6. On–Resistance versus


Gate–to–Source Voltage Junction Temperature

http://onsemi.com
612
MMFT2955E

FORWARD BIASED SAFE OPERATING AREA


The FBSOA curves define the maximum drain–to–source

voltage and drain current that a device can safely handle  " # 
when it is forward biased, or when it is on, or being turned   
on. Because these curves include the limitations of #F !  " #$°

 


  
simultaneous high voltage and high current, up to the rating  !

of the device, they are especially useful to designers of linear
systems. The curves are based on a ambient temperature of $ !
25°C and a maximum junction temperature of 150°C. !
Limitations for repetitive pulses at various ambient 

temperatures can be determined by using the thermal
response curves. ON Semiconductor Application Note,
   



    
AN569, “Transient Thermal Resistance–General Data and      
Its Use” provides detailed instructions.

   
SWITCHING SAFE OPERATING AREA
 

   
The switching safe operating area (SOA) is the boundary
that the load line may traverse without incurring damage to Figure 7. Maximum Rated Forward Biased
the MOSFET. The fundamental limits are the peak current, Safe Operating Area
IDM and the breakdown voltage, BVDSS. The switching
SOA is applicable for both turn–on and turn–off of the
devices for switching times less than one microsecond.


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Figure 8. Thermal Response

COMMUTATING SAFE OPERATING AREA (CSOA)

The Commutating Safe Operating Area (CSOA) of Figure 10 defines the limits of safe operation for commutated
source–drain current versus re–applied drain voltage when the source–drain diode has undergone forward bias. The curve shows
the limitations of IFM and peak VDS for a given rate of change of source current. It is applicable when waveforms similar to
those of Figure 9 are present. Full or half–bridge PWM DC motor controllers are common applications requiring CSOA data.
Device stresses increase with increasing rate of change of source current so dIS/dt is specified with a maximum value. Higher
values of dIS/dt require an appropriate derating of IFM, peak VDS or both. Ultimately dIS/dt is limited primarily by device,
package, and circuit impedances. Maximum device stress occurs during trr as the diode goes from conduction to reverse
blocking.
VDS(pk) is the peak drain–to–source voltage that the device must sustain during commutation; IFM is the maximum forward
source–drain diode current just prior to the onset of commutation.
VR is specified at 80% rated BVDSS to ensure that the CSOA stress is maximized as IS decays from IRM to zero.
RGS should be minimized during commutation. TJ has only a second order effect on CSOA.
Stray inductances in ON Semiconductor’s test circuit are assumed to be practical minimums. dV DS /dt in excess of 10 V/ns
was attained with dI S /dt of 400 A/µs.

http://onsemi.com
613
MMFT2955E

$ 


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Figure 9. Commutating Waveforms

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Figure 10. Commutating Safe Operating Figure 11. Commutating Safe Operating Area
Area (CSOA) Test Circuit

=


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Figure 12. Unclamped Inductive Switching Figure 13. Unclamped Inductive Switching
Test Circuit Waveforms

http://onsemi.com
614
MMFT2955E

 
8
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6

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Figure 14. Capacitance Variation with Voltage


  
 

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Figure 15. Gate Charge versus Gate–To–Source Voltage

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Figure 16. Gate Charge Test Circuit

http://onsemi.com
615
MMFT2955E

INFORMATION FOR USING THE SOT–223 SURFACE MOUNT PACKAGE

MINIMUM RECOMMENDED FOOTPRINT FOR SURFACE MOUNTED APPLICATIONS


Surface mount board layout is a critical portion of the interface between the board and the package. With the
total design. The footprint for the semiconductor packages correct pad geometry, the packages will self align when
must be the correct size to insure proper solder connection subjected to a solder reflow process.

$
48

:7
#

#68
94
7 7
#4 #4

:7
#

$7 $7 $7 inches


$ $ $ mm

SOT–223 POWER DISSIPATION


The power dissipation of the SOT–223 is a function of 150°C – 25°C = 800 milliwatts
PD =
the drain pad size. This can vary from the minimum pad 156°C/W
size for soldering to a pad size given for maximum power
dissipation. Power dissipation for a surface mount device is The 156°C/W for the SOT–223 package assumes the use
determined by TJ(max), the maximum rated junction of the recommended footprint on a glass epoxy printed
temperature of the die, RθJA, the thermal resistance from circuit board to achieve a power dissipation of 800
the device junction to ambient, and the operating milliwatts. There are other alternatives to achieving higher
temperature, TA. Using the values provided on the data power dissipation from the SOT–223 package. One is to
sheet for the SOT–223 package, PD can be calculated as increase the area of the drain pad. By increasing the area of
follows: the drain pad, the power dissipation can be increased.
Although one can almost double the power dissipation with
TJ(max) – TA
PD = this method, one will be giving up area on the printed
RθJA circuit board which can defeat the purpose of using surface
The values for the equation are found in the maximum mount technology. A graph of RθJA versus drain pad area is
ratings table on the data sheet. Substituting these values shown in Figure 17.
into the equation for an ambient temperature TA of 25°C,
one can calculate the power dissipation of the device which
in this case is 800 milliwatts.

http://onsemi.com
616
MMFT2955E

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Figure 17. Thermal Resistance versus Drain Pad


Area for the SOT–223 Package (Typical)

Another alternative would be to use a ceramic substrate board, the power dissipation can be doubled using the same
or an aluminum core board such as Thermal Cladt. Using footprint.
a board material such as Thermal Clad, an aluminum core

SOLDER STENCIL GUIDELINES


Prior to placing surface mount components onto a printed or stainless steel with a typical thickness of 0.008 inches.
circuit board, solder paste must be applied to the pads. A The stencil opening size for the SOT–223 package should
solder stencil is required to screen the optimum amount of be the same as the pad size on the printed circuit board, i.e.,
solder paste onto the footprint. The stencil is made of brass a 1:1 registration.

SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • The soldering temperature and time shall not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within • When shifting from preheating to soldering, the
a short time could result in device failure. Therefore, the maximum temperature gradient shall be 5°C or less.
following items should always be observed in order to • After soldering has been completed, the device should
minimize the thermal stress to which the devices are be allowed to cool naturally for at least three minutes.
subjected. Gradual cooling should be used as the use of forced
• Always preheat the device. cooling will increase the temperature gradient and
• The delta temperature between the preheat and result in latent failure due to mechanical stress.
soldering should be 100°C or less.* • Mechanical stress or shock should not be applied
• When preheating and soldering, the temperature of the during cooling
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When * Soldering a device without preheating can cause
using infrared heating with the reflow soldering excessive thermal shock and stress which can result in
method, the difference shall be a maximum of 10°C. damage to the device.

http://onsemi.com
617
MMFT2955E

TYPICAL SOLDER HEATING PROFILE


For any given circuit board, there will be a group of The line on the graph shows the actual temperature that
control settings that will give the desired heat pattern. The might be experienced on the surface of a test board at or
operator must set temperatures for several heating zones, near a central solder joint. The two profiles are based on a
and a figure for belt speed. Taken together, these control high density and a low density board. The Vitronics
settings make up a heating “profile” for that particular SMD310 convection/infrared reflow soldering system was
circuit board. On machines controlled by a computer, the used to generate this profile. The type of solder used was
computer remembers these profiles from one operating 62/36/2 Tin Lead Silver with a melting point between
session to the next. Figure 18 shows a typical heating 177–189°C. When this type of furnace is used for solder
profile for use when soldering a surface mount device to a reflow work, the circuit boards and solder joints tend to
printed circuit board. This profile will vary among heat first. The components on the board are then heated by
soldering systems but it is a good starting point. Factors that conduction. The circuit board, because it has a large surface
can affect the profile include the type of soldering system in area, absorbs the thermal energy more efficiently, then
use, density and types of components on the board, type of distributes this energy to the components. Because of this
solder used, and the type of board or substrate material effect, the main body of a component may be up to 30
being used. This profile shows temperature versus time. degrees cooler than the adjacent solder joints.

STEP 1 STEP 2 STEP 3 STEP 4 STEP 5 STEP 6 STEP 7


PREHEAT VENT HEATING HEATING HEATING VENT COOLING
ZONE 1 “SOAK” ZONES 2 & 5 ZONES 3 & 6 ZONES 4 & 7
“RAMP” “RAMP” “SOAK” “SPIKE” 205° TO 219°C
PEAK AT
200°C DESIRED CURVE FOR HIGH 170°C SOLDER
MASS ASSEMBLIES JOINT
160°C
150°C

150°C
SOLDER IS LIQUID FOR
40 TO 80 SECONDS
100°C 140°C (DEPENDING ON
MASS OF ASSEMBLY)
100°C

DESIRED CURVE FOR LOW


MASS ASSEMBLIES
5°C

TIME (3 TO 7 MINUTES TOTAL) TMAX


Figure 18. Typical Solder Heating Profile

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618
(  
Preferred Device

#$%& '(
   
N–Channel SOT–223
This Power MOSFET is designed to withstand high energy in the
avalanche and commutation modes. This device is also designed with
a low threshold voltage so it is fully enhanced with 5 Volts. This new http://onsemi.com
energy efficient device also offers a drain–to–source diode with a fast
recovery time. Designed for low voltage, high speed switching
2 AMPERES
applications in power supplies, dc–dc converters and PWM motor 20 VOLTS
controls, these devices are particularly well suited for bridge circuits RDS(on) = 150 m
where diode speed and commutating safe operating areas are critical
and offer additional safety margin against unexpected voltage N–Channel
transients. The device is housed in the SOT–223 package which is 
designed for medium power surface mount applications.
• Silicon Gate for Fast Switching Speeds
• Low Drive Requirement to Interface Power Loads to Logic Level
ICs, VGS(th) = 2 Volts Max 
• The SOT–223 Package can be Soldered Using Wave or Reflow. The
Formed Leads Absorb Thermal Stress During Soldering, Eliminating 
the Possibility of Damage to the Die
MARKING
MAXIMUM RATINGS (TA = 25°C unless otherwise noted) DIAGRAM
Rating Symbol Value Unit
Drain–to–Source Voltage VDS 20 4
TO–261AA
Vdc 2N02L
Gate–to–Source Voltage – Continuous VGS ±15 CASE 318E LWW
1 STYLE 3
Drain Current – Continuous ID 1.6 Adc 2
3
Drain Current – Pulsed IDM 6.4
Total Power Dissipation @ TA = 25°C PD 0.8 Watts L = Location Code
Derate above 25°C (Note 1.) 6.4 mW/°C WW = Work Week
Operating and Storage Temperature TJ, Tstg –65 to °C
Range 150
PIN ASSIGNMENT
Single Pulse Drain–to–Source Avalanche EAS 66 mJ
4 ()%
Energy – Starting TJ = 25°C
(VDD = 10 V, VGS = 5 V, Peak
IL= 2 A, L = 0.2 mH, RG = 25 Ω)

THERMAL CHARACTERISTICS
Thermal Resistance – RθJA 156 °C/W
Junction–to–Ambient (surface mounted)
1 2 3
Maximum Temperature for Soldering 260 °C )'1 ()% ;(1
Purposes, TL
Time in Solder Bath 10 Sec ORDERING INFORMATION
1. Power rating when mounted on FR–4 glass epoxy printed circuit board using
recommended footprint. Device Package Shipping

MMFT2N02ELT1 SOT–223 1000 Tape & Reel

Preferred devices are recommended choices for future use


and best overall value.

 Semiconductor Components Industries, LLC, 2000 619 Publication Order Number:


November, 2000 – Rev. 4 MMFT2N02EL/D
MMFT2N02EL

ELECTRICAL CHARACTERISTICS (TA = 25°C unless otherwise noted)


Characteristic Symbol Min Typ Max Unit
OFF CHARACTERISTICS
Drain–to–Source Breakdown Voltage, (VGS = 0, ID = 250 µA) V(BR)DSS 20 – – Vdc
Zero Gate Voltage Drain Current, (VDS = 20 V, VGS = 0) IDSS – – 10 µAdc
Gate–Body Leakage Current, (VGS = 15 V, VDS = 0) IGSS – – 100 nAdc
ON CHARACTERISTICS
Gate Threshold Voltage, (VDS = VGS, ID = 1 mA) VGS(th) 1 – 2 Vdc
Static Drain–to–Source On–Resistance, (VGS = 5 V, ID = 0.8 A) RDS(on) – – 0.15 Ohms
Drain–to–Source On–Voltage, (VGS = 5 V, ID = 1.6 A) VDS(on) – – 0.32 Vdc
Forward Transconductance, (VDS = 10 V, ID = 0.8 A) gFS – 2.6 – mhos
DYNAMIC CHARACTERISTICS
Input Capacitance Ciss – 580 –
(VDS = 15 V,
Output Capacitance VGS = 0, Coss – 430 – pF
f = 1 MH
MHz))
Reverse Transfer Capacitance Crss – 250 –

SWITCHING CHARACTERISTICS
Turn–On Delay Time td(on) – 16 –
Rise Time (VDD = 15 V, ID = 1.6 A tr – 73 –
VGS = 5 V
V, RG = 50 ohms,
ohms ns
Turn–Off Delay Time RGS = 25 ohms) td(off) – 77 –
Fall Time tf – 107 –
Total Gate Charge Qg – 20 –
(VDS = 16 V, ID = 1.6 A,
Gate–Source Charge VGS = 5 Vdc) Qgs – 1.7 – nC
S Figures
See Fi 15 andd 16
Gate–Drain Charge Qgd – 6 –
SOURCE DRAIN DIODE CHARACTERISTICS (Note 2.)
Forward On–Voltage IS = 1.6 A, VGS = 0 VSD – 0.9 – Vdc
Forward Turn–On Time IS = 1.6 A, VGS = 0, ton Limited by stray inductance
dlS/dt = 400 A/µs,
A/µs
Reverse Recovery Time VR = 16 V trr – 55 – ns
2. Pulse Test: Pulse Width ≤ 300 µs, Duty Cycle ≤ 2%

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620
MMFT2N02EL

TYPICAL ELECTRICAL CHARACTERISTICS

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Figure 1. On Region Characteristics Figure 2. Gate–Threshold Voltage Variation


With Temperature

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Figure 5. On–Resistance versus Figure 6. On–Resistance versus Junction


Gate–to–Source Voltage Temperature

http://onsemi.com
621
MMFT2N02EL

FORWARD BIASED SAFE OPERATING AREA


The FBSOA curves define the maximum drain–to–source
voltage and drain current that a device can safely handle 
 " $ 
when it is forward biased, or when it is on, or being turned   
on. Because these curves include the limitations of  " #$°

 


  
simultaneous high voltage and high current, up to the rating
of the device, they are especially useful to designers of linear  #F !
systems. The curves are based on an ambient temperature of 
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25°C and a maximum junction temperature of 150°C.
!
Limitations for repetitive pulses at various ambient 
temperatures can be determined by using the thermal 
response curves. ON Semiconductor Application Note, $F !

   
AN569, “Transient Thermal Resistance–General Data and 
    
Its Use” provides detailed instructions.      

SWITCHING SAFE OPERATING AREA    
The switching safe operating area (SOA) is the boundary  

   
that the load line may traverse without incurring damage to Figure 7. Maximum Rated Forward Biased
the MOSFET. The fundamental limits are the peak current, Safe Operating Area
IDM and the breakdown voltage, BVDSS. The switching SOA
is applicable for both turn–on and turn–off of the devices for
switching times less than one microsecond.


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Figure 8. Thermal Response

COMMUTATING SAFE OPERATING AREA (CSOA)

The Commutating Safe Operating Area (CSOA) of Figure 10 defines the limits of safe operation for commutated
source–drain current versus re–applied drain voltage when the source–drain diode has undergone forward bias. The curve shows
the limitations of IFM and peak VDS for a given rate of change of source current. It is applicable when waveforms similar to
those of Figure 9 are present. Full or half–bridge PWM DC motor controllers are common applications requiring CSOA data.
Device stresses increase with increasing rate of change of source current so dIS/dt is specified with a maximum value. Higher
values of dIS/dt require an appropriate derating of IFM, peak VDS or both. Ultimately dIS/dt is limited primarily by device,
package, and circuit impedances. Maximum device stress occurs during trr as the diode goes from conduction to reverse
blocking.
VDS(pk) is the peak drain–to–source voltage that the device must sustain during commutation; IFM is the maximum forward
source–drain diode current just prior to the onset of commutation.
VR is specified at 80% rated BVDSS to ensure that the CSOA stress is maximized as IS decays from IRM to zero.
RGS should be minimized during commutation. TJ has only a second order effect on CSOA.
Stray inductances in ON Semiconductor’s test circuit are assumed to be practical minimums. dVDS/dt in excess of 10 V/ns
was attained with dI S /dt of 400 A/µs.

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622
MMFT2N02EL

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Figure 10. Commutating Safe Operating Area (CSOA) Figure 11. Commutating Safe Operating Area
Test Circuit

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Figure 12. Unclamped Inductive Switching Figure 13. Unclamped Inductive Switching
Test Circuit Waveforms

http://onsemi.com
623
MMFT2N02EL

 
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Figure 14. Capacitance Variation With Voltage


  
 

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Figure 15. Gate Charge versus Gate–To–Source Voltage

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Figure 16. Gate Charge Test Circuit

http://onsemi.com
624
MMFT2N02EL

INFORMATION FOR USING THE SOT–223 SURFACE MOUNT PACKAGE

MINIMUM RECOMMENDED FOOTPRINT FOR SURFACE MOUNTED APPLICATIONS


Surface mount board layout is a critical portion of the interface between the board and the package. With the
total design. The footprint for the semiconductor packages correct pad geometry, the packages will self align when
must be the correct size to insure proper solder connection subjected to a solder reflow process.

$
48

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#

#68
94
7 7
#4 #4

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$7 $7 $7 inches


$ $ $ mm

SOT–223 POWER DISSIPATION


The power dissipation of the SOT–223 is a function of 150°C – 25°C
PD = = 800 milliwatts
the drain pad size. This can vary from the minimum pad 156°C/W
size for soldering to a pad size given for maximum power
The 156°C/W for the SOT–223 package assumes the use
dissipation. Power dissipation for a surface mount device is
of the recommended footprint on a glass epoxy printed
determined by TJ(max), the maximum rated junction
circuit board to achieve a power dissipation of 800
temperature of the die, RθJA, the thermal resistance from
milliwatts. There are other alternatives to achieving higher
the device junction to ambient, and the operating
power dissipation from the SOT–223 package. One is to
temperature, TA. Using the values provided on the data
increase the area of the drain pad. By increasing the area of
sheet for the SOT–223 package, PD can be calculated as
the drain pad, the power dissipation can be increased.
follows:
Although one can almost double the power dissipation with
TJ(max) – TA this method, one will be giving up area on the printed
PD =
RθJA circuit board which can defeat the purpose of using surface
The values for the equation are found in the maximum mount technology. A graph of RθJA versus drain pad area is
ratings table on the data sheet. Substituting these values shown in Figure 17.
into the equation for an ambient temperature TA of 25°C,
one can calculate the power dissipation of the device which
in this case is 800 milliwatts.

http://onsemi.com
625
MMFT2N02EL

9

)E
1!%!')1 ,;'%
=)( )'1(%)E " 9#$″  " #$°
6 &.
6 # A **1(

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θ
S;'1  '21   C'*(%'
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 # 6 9 8 
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Figure 17. Thermal Resistance versus Drain Pad


Area for the SOT–223 Package (Typical)

Another alternative would be to use a ceramic substrate board, the power dissipation can be doubled using the same
or an aluminum core board such as Thermal Cladt. Using footprint.
a board material such as Thermal Clad, an aluminum core

SOLDER STENCIL GUIDELINES


Prior to placing surface mount components onto a printed or stainless steel with a typical thickness of 0.008 inches.
circuit board, solder paste must be applied to the pads. A The stencil opening size for the SOT–223 package should
solder stencil is required to screen the optimum amount of be the same as the pad size on the printed circuit board, i.e.,
solder paste onto the footprint. The stencil is made of brass a 1:1 registration.

SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • The soldering temperature and time shall not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within • When shifting from preheating to soldering, the
a short time could result in device failure. Therefore, the maximum temperature gradient shall be 5°C or less.
following items should always be observed in order to • After soldering has been completed, the device should
minimize the thermal stress to which the devices are be allowed to cool naturally for at least three minutes.
subjected. Gradual cooling should be used as the use of forced
• Always preheat the device. cooling will increase the temperature gradient and
• The delta temperature between the preheat and result in latent failure due to mechanical stress.
soldering should be 100°C or less.* • Mechanical stress or shock should not be applied
• When preheating and soldering, the temperature of the during cooling
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When * Soldering a device without preheating can cause
using infrared heating with the reflow soldering excessive thermal shock and stress which can result in
method, the difference shall be a maximum of 10°C. damage to the device.

http://onsemi.com
626
MMFT2N02EL

TYPICAL SOLDER HEATING PROFILE


For any given circuit board, there will be a group of The line on the graph shows the actual temperature that
control settings that will give the desired heat pattern. The might be experienced on the surface of a test board at or
operator must set temperatures for several heating zones, near a central solder joint. The two profiles are based on a
and a figure for belt speed. Taken together, these control high density and a low density board. The Vitronics
settings make up a heating “profile” for that particular SMD310 convection/infrared reflow soldering system was
circuit board. On machines controlled by a computer, the used to generate this profile. The type of solder used was
computer remembers these profiles from one operating 62/36/2 Tin Lead Silver with a melting point between
session to the next. Figure 18 shows a typical heating 177–189°C. When this type of furnace is used for solder
profile for use when soldering a surface mount device to a reflow work, the circuit boards and solder joints tend to
printed circuit board. This profile will vary among heat first. The components on the board are then heated by
soldering systems but it is a good starting point. Factors that conduction. The circuit board, because it has a large surface
can affect the profile include the type of soldering system in area, absorbs the thermal energy more efficiently, then
use, density and types of components on the board, type of distributes this energy to the components. Because of this
solder used, and the type of board or substrate material effect, the main body of a component may be up to 30
being used. This profile shows temperature versus time. degrees cooler than the adjacent solder joints.

STEP 1 STEP 2 STEP 3 STEP 4 STEP 5 STEP 6 STEP 7


PREHEAT VENT HEATING HEATING HEATING VENT COOLING
ZONE 1 “SOAK” ZONES 2 & 5 ZONES 3 & 6 ZONES 4 & 7
“RAMP” “RAMP” “SOAK” “SPIKE” 205° TO 219°C
PEAK AT
200°C DESIRED CURVE FOR HIGH 170°C SOLDER
MASS ASSEMBLIES JOINT
160°C
150°C

150°C
SOLDER IS LIQUID FOR
40 TO 80 SECONDS
100°C 140°C (DEPENDING ON
MASS OF ASSEMBLY)
100°C

DESIRED CURVE FOR LOW


MASS ASSEMBLIES
5°C

TIME (3 TO 7 MINUTES TOTAL) TMAX


Figure 18. Typical Solder Heating Profile

http://onsemi.com
627
(!

#$%& '(
    
N–Channel SOT–223
These Power MOSFETs are designed for low voltage, high speed
switching applications in power supplies, converters and power motor
controls, these devices are particularly well suited for bridge circuits http://onsemi.com
where diode speed and commutating safe operating areas are critical
and offer additional safety margin against unexpected voltage
1 AMPERE
transients. 60 VOLTS
• Avalanche Energy Specified RDS(on) = 130 m
• IDSS and VDS(on) Specified at Elevated Temperature
N–Channel
MAXIMUM RATINGS (TC = 25°C unless otherwise noted) 

Rating Symbol Value Unit


Drain–to–Source Voltage VDSS 60 Vdc
Drain–to–Gate Voltage (RGS = 1.0 MΩ) VDGR 60 Vdc 
Gate–to–Source Voltage
– Continuous VGS ± 20 Vdc

– Non–repetitive (tp ≤ 10 ms) VGSM ± 25 Vpk
Drain Current – Continuous ID 1.7 Adc
Drain Current – Continuous @ 100°C ID 1.4 MARKING
Drain Current – Single Pulse (tp ≤ 10 µs) IDM 6.0 Apk DIAGRAM
Total PD @ TA = 25°C mounted on 1″ sq. PD 2.1 Watts
Drain pad on FR–4 bd material
Total PD @ TA = 25°C mounted on 1.7 4
TO–261AA TBD
0.70″ sq. Drain pad on FR–4 bd material CASE 318E LWW
Total PD @ TA = 25°C mounted on min. 0.94 1 STYLE 3
Drain pad on FR–4 bd material 2
3
Derate above 25°C 6.3 mW/°C
Operating and Storage Temperature TJ, Tstg –55 to °C
L = Location Code
Range 175
WW = Work Week
Single Pulse Drain–to–Source Avalanche EAS mJ
Energy – Starting TJ = 25°C
(VDD = 25 Vdc, VGS = 10 Vdc, Peak 58 PIN ASSIGNMENT
IL = 3.4 Apk, L = 10 mH, RG = 25 Ω )
4 ()%
Thermal Resistance °C/W
– Junction to Ambient on 1″ sq. Drain RθJA 70
pad on FR–4 bd material
– Junction to Ambient on 0.70″ sq. Drain RθJA 88
pad on FR–4 bd material
– Junction to Ambient on min. Drain pad RθJA 159
on FR–4 bd material 1 2 3
Maximum Lead Temperature for Soldering TL 260 °C )'1 ()% ;(1
Purposes, 1/8″ from case for 10
seconds ORDERING INFORMATION

Device Package Shipping

MMFT3055VT1 SOT–223 1000 Tape & Reel

MMFT3055VT3 SOT–223 4000 Tape & Reel

 Semiconductor Components Industries, LLC, 2000 628 Publication Order Number:


November, 2000 – Rev. 2 MMFT3055V/D
MMFT3055V

ELECTRICAL CHARACTERISTICS (TJ = 25°C unless otherwise noted)


Characteristic Symbol Min Typ Max Unit
OFF CHARACTERISTICS
Drain–to–Source Breakdown Voltage (Cpk ≥ 2.0) (Note 3.) V(BR)DSS
(VGS = 0 Vdc, ID = 0.25 mAdc) 60 – – Vdc
Temperature Coefficient (Positive) – 63 – mV/°C
Zero Gate Voltage Drain Current IDSS µAdc
(VDS = 60 Vdc, VGS = 0 Vdc) – – 10
(VDS = 60 Vdc, VGS = 0 Vdc, TJ = 150°C) – – 100
Gate–Body Leakage Current (VGS = ± 20 Vdc, VDS = 0 Vdc) IGSS – – 100 nAdc
ON CHARACTERISTICS (Note 1.)
Gate Threshold Voltage (Cpk ≥ 2.0) (Note 3.) VGS(th)
(VDS = VGS, ID = 250 µAdc) 2.0 2.8 4.0 Vdc
Threshold Temperature Coefficient (Negative) – 5.6 – mV/°C
Static Drain–to–Source On–Resistance (Cpk ≥ 2.0) (Note 3.) RDS(on) Ohm
(VGS = 10 Vdc, ID = 0.85 Adc) – 0.115 0.13

Drain–to–Source On–Voltage VDS(on) Vdc


(VGS = 10 Vdc, ID = 1.7 Adc) – – 0.27
(VGS = 10 Vdc, ID = 0.85 Adc, TJ = 150°C) – – 0.25
Forward Transconductance (VDS = 8.0 Vdc, ID = 1.7 Adc) gFS 1.0 2.7 – mhos
DYNAMIC CHARACTERISTICS
Input Capacitance Ciss – 360 500 pF
Output Capacitance (VDS = 25 Vd
Vdc, VGS = 0 Vd
Vdc,
Coss – 110 150
f = 1.0 MHz)
Transfer Capacitance Crss – 25 50
SWITCHING CHARACTERISTICS (Note 2.)
Turn–On Delay Time td(on) – 8.0 20 ns
Rise Time (VDD = 30 Vdc, ID = 1.7 Adc, tr – 9.0 20
VGS = 10 Vdc
Vdc,
Turn–Off Delay Time RG = 9.1 Ω) td(off) – 32 60
Fall Time tf – 18 40
Gate Charge QT – 13 20 nC

(VDS = 48 Vdc, ID = 1.7 Adc, Q1 – 2.0 –


VGS = 10 Vdc) Q2 – 5.0 –
Q3 – 4.0 –
SOURCE–DRAIN DIODE CHARACTERISTICS
Forward On–Voltage (Note 1.) (IS = 1.7 Adc, VGS = 0 Vdc) VSD Vdc
(IS = 1.7 Adc, VGS = 0 Vdc, – 0.85 1.6
TJ = 150°C) – 0.7 –
Reverse Recovery Time trr – 40 – ns
ta – 34 –
(IS = 1.7
1 7 Adc,
Adc VGS = 0 Vdc,
Vdc
dIS/dt = 100 A/µs) tb – 6.0 –
Reverse Recovery Stored QRR – 0.089 – µC
Charge
INTERNAL PACKAGE INDUCTANCE
Internal Drain Inductance LD nH
(Measured from the drain lead 0.25″ from package to center of die) – 4.5 –

Internal Source Inductance LS nH


(Measured from the source lead 0.25″ from package to source bond pad) – 7.5 –
1. Pulse Test: Pulse Width ≤ 300 µs, Duty Cycle ≤ 2%.
2. Switching characteristics are independent of operating junction temperature.
3. Reflects typical values. Max limit – Typ
Cpk =
3 x SIGMA

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629
MMFT3055V

TYPICAL ELECTRICAL CHARACTERISTICS

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Figure 3. On–Resistance versus Drain Current Figure 4. On–Resistance versus Drain Current
and Temperature and Gate Voltage

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Temperature Current versus Voltage

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MMFT3055V

POWER MOSFET SWITCHING

Switching behavior is most easily modeled and predicted The capacitance (Ciss) is read from the capacitance curve at
by recognizing that the power MOSFET is charge a voltage corresponding to the off–state condition when
controlled. The lengths of various switching intervals (∆t) calculating td(on) and is read at a voltage corresponding to the
are determined by how fast the FET input capacitance can on–state when calculating td(off).
be charged by current from the generator. At high switching speeds, parasitic circuit elements
The published capacitance data is difficult to use for complicate the analysis. The inductance of the MOSFET
calculating rise and fall because drain–gate capacitance source lead, inside the package and in the circuit wiring
varies greatly with applied voltage. Accordingly, gate which is common to both the drain and gate current paths,
charge data is used. In most cases, a satisfactory estimate of produces a voltage at the source which reduces the gate drive
average input current (IG(AV)) can be made from a current. The voltage is determined by Ldi/dt, but since di/dt
rudimentary analysis of the drive circuit so that is a function of drain current, the mathematical solution is
t = Q/IG(AV) complex. The MOSFET output capacitance also
complicates the mathematics. And finally, MOSFETs have
During the rise and fall time interval when switching a finite internal gate resistance which effectively adds to the
resistive load, VGS remains virtually constant at a level resistance of the driving source, but the internal resistance
known as the plateau voltage, VSGP. Therefore, rise and fall is difficult to measure and, consequently, is not specified.
times may be approximated by the following: The resistive switching time variation versus gate
tr = Q2 x RG/(VGG – VGSP) resistance (Figure 9) shows how typical switching
tf = Q2 x RG/VGSP performance is affected by the parasitic circuit elements. If
where the parasitics were not present, the slope of the curves would
maintain a value of unity regardless of the switching speed.
VGG = the gate drive voltage, which varies from zero to VGG
The circuit used to obtain the data is constructed to minimize
RG = the gate drive resistance
common inductance in the drain and gate circuit loops and
and Q2 and VGSP are read from the gate charge curve.
is believed readily achievable with board mounted
During the turn–on and turn–off delay times, gate current is components. Most power electronic loads are inductive; the
not constant. The simplest calculation uses appropriate data in the figure is taken with a resistive load, which
values from the capacitance curves in a standard equation for approximates an optimally snubbed inductive load. Power
voltage change in an RC network. The equations are: MOSFETs may be safely operated into an inductive load;
td(on) = RG Ciss In [VGG/(VGG – VGSP)] however, snubbing reduces switching losses.
td(off) = RG Ciss In (VGG/VGSP)


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Figure 8. Gate–To–Source and Drain–To–Source Figure 9. Resistive Switching Time


Voltage versus Total Charge Variation versus Gate Resistance

DRAIN–TO–SOURCE DIODE CHARACTERISTICS

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Figure 10. Diode Forward Voltage versus Current

SAFE OPERATING AREA

The Forward Biased Safe Operating Area curves define reliable operation, the stored energy from circuit inductance
the maximum simultaneous drain–to–source voltage and dissipated in the transistor while in avalanche must be less
drain current that a transistor can handle safely when it is than the rated limit and adjusted for operating conditions
forward biased. Curves are based upon maximum peak differing from those specified. Although industry practice is
junction temperature and a case temperature (TC) of 25°C. to rate in terms of energy, avalanche energy capability is not
Peak repetitive pulsed power limits are determined by using a constant. The energy rating decreases non–linearly with an
the thermal response data in conjunction with the procedures increase of peak current in avalanche and peak junction
discussed in AN569, “Transient Thermal temperature.
Resistance–General Data and Its Use.” Although many E–FETs can withstand the stress of
Switching between the off–state and the on–state may drain–to–source avalanche at currents up to rated pulsed
traverse any load line provided neither rated peak current current (IDM), the energy rating is specified at rated
(IDM) nor rated voltage (VDSS) is exceeded and the continuous current (ID), in accordance with industry
transition time (tr,tf) do not exceed 10 µs. In addition the total custom. The energy rating must be derated for temperature
power averaged over a complete switching cycle must not as shown in the accompanying graph (Figure 13). Maximum
exceed (TJ(MAX) – TC)/(RθJC). energy at currents below rated continuous ID can safely be
A Power MOSFET designated E–FET can be safely used assumed to equal the values indicated.
in switching circuits with unclamped inductive loads. For

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632
MMFT3055V

SAFE OPERATING AREA

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Safe Operating Area Starting Junction Temperature


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Figure 14. Diode Reverse Recovery Waveform

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MMFT3055V

INFORMATION FOR USING THE SOT–223 SURFACE MOUNT PACKAGE

MINIMUM RECOMMENDED FOOTPRINT FOR SURFACE MOUNTED APPLICATIONS


Surface mount board layout is a critical portion of the interface between the board and the package. With the
total design. The footprint for the semiconductor packages correct pad geometry, the packages will self align when
must be the correct size to insure proper solder connection subjected to a solder reflow process.

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SOT–223 POWER DISSIPATION


The power dissipation of the SOT–223 is a function of 175°C – 25°C = 943 milliwatts
PD =
the drain pad size. This can vary from the minimum pad 159°C/W
size for soldering to a pad size given for maximum power
dissipation. Power dissipation for a surface mount device is The 159°C/W for the SOT–223 package assumes the use
determined by TJ(max), the maximum rated junction of the recommended footprint on a glass epoxy printed
temperature of the die, RθJA, the thermal resistance from circuit board to achieve a power dissipation of 943
the device junction to ambient, and the operating milliwatts. There are other alternatives to achieving higher
temperature, TA. Using the values provided on the data power dissipation from the SOT–223 package. One is to
sheet for the SOT–223 package, PD can be calculated as increase the area of the drain pad. By increasing the area of
follows: the drain pad, the power dissipation can be increased.
Although one can almost double the power dissipation with
TJ(max) – TA
PD = this method, one will be giving up area on the printed
RθJA circuit board which can defeat the purpose of using surface
The values for the equation are found in the maximum mount technology. A graph of RθJA versus drain pad area is
ratings table on the data sheet. Substituting these values shown in Figure 17.
into the equation for an ambient temperature TA of 25°C,
one can calculate the power dissipation of the device which
in this case is 943 milliwatts.

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634
MMFT3055V

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Figure 15. Thermal Resistance versus Drain Pad


Area for the SOT–223 Package (Typical)

Another alternative would be to use a ceramic substrate board, the power dissipation can be doubled using the same
or an aluminum core board such as Thermal Cladt. Using footprint.
a board material such as Thermal Clad, an aluminum core

SOLDER STENCIL GUIDELINES


Prior to placing surface mount components onto a printed or stainless steel with a typical thickness of 0.008 inches.
circuit board, solder paste must be applied to the pads. A The stencil opening size for the SOT–223 package should
solder stencil is required to screen the optimum amount of be the same as the pad size on the printed circuit board, i.e.,
solder paste onto the footprint. The stencil is made of brass a 1:1 registration.

SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • The soldering temperature and time shall not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within • When shifting from preheating to soldering, the
a short time could result in device failure. Therefore, the maximum temperature gradient shall be 5°C or less.
following items should always be observed in order to • After soldering has been completed, the device should
minimize the thermal stress to which the devices are be allowed to cool naturally for at least three minutes.
subjected. Gradual cooling should be used as the use of forced
• Always preheat the device. cooling will increase the temperature gradient and
• The delta temperature between the preheat and result in latent failure due to mechanical stress.
soldering should be 100°C or less.* • Mechanical stress or shock should not be applied
• When preheating and soldering, the temperature of the during cooling
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When * Soldering a device without preheating can cause
using infrared heating with the reflow soldering excessive thermal shock and stress which can result in
method, the difference shall be a maximum of 10°C. damage to the device.

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635
MMFT3055V

TYPICAL SOLDER HEATING PROFILE


For any given circuit board, there will be a group of The line on the graph shows the actual temperature that
control settings that will give the desired heat pattern. The might be experienced on the surface of a test board at or
operator must set temperatures for several heating zones, near a central solder joint. The two profiles are based on a
and a figure for belt speed. Taken together, these control high density and a low density board. The Vitronics
settings make up a heating “profile” for that particular SMD310 convection/infrared reflow soldering system was
circuit board. On machines controlled by a computer, the used to generate this profile. The type of solder used was
computer remembers these profiles from one operating 62/36/2 Tin Lead Silver with a melting point between
session to the next. Figure 18 shows a typical heating 177–189°C. When this type of furnace is used for solder
profile for use when soldering a surface mount device to a reflow work, the circuit boards and solder joints tend to
printed circuit board. This profile will vary among heat first. The components on the board are then heated by
soldering systems but it is a good starting point. Factors that conduction. The circuit board, because it has a large surface
can affect the profile include the type of soldering system in area, absorbs the thermal energy more efficiently, then
use, density and types of components on the board, type of distributes this energy to the components. Because of this
solder used, and the type of board or substrate material effect, the main body of a component may be up to 30
being used. This profile shows temperature versus time. degrees cooler than the adjacent solder joints.

STEP 1 STEP 2 STEP 3 STEP 4 STEP 5 STEP 6 STEP 7


PREHEAT VENT HEATING HEATING HEATING VENT COOLING
ZONE 1 “SOAK” ZONES 2 & 5 ZONES 3 & 6 ZONES 4 & 7
“RAMP” “RAMP” “SOAK” “SPIKE” 205° TO 219°C
PEAK AT
200°C DESIRED CURVE FOR HIGH 170°C SOLDER
MASS ASSEMBLIES JOINT
160°C
150°C

150°C
SOLDER IS LIQUID FOR
40 TO 80 SECONDS
100°C 140°C (DEPENDING ON
MASS OF ASSEMBLY)
100°C

DESIRED CURVE FOR LOW


MASS ASSEMBLIES
5°C

TIME (3 TO 7 MINUTES TOTAL) TMAX


Figure 16. Typical Solder Heating Profile

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636
(!

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N–Channel SOT–223
These Power MOSFETs are designed for low voltage, high speed
switching applications in power supplies, converters and power motor
controls, these devices are particularly well suited for bridge circuits http://onsemi.com
where diode speed and commutating safe operating areas are critical
and offer additional safety margin against unexpected voltage
1 AMPERE
transients. 60 VOLTS
• Avalanche Energy Specified RDS(on) = 140 m
• IDSS and VDS(on) Specified at Elevated Temperature
N–Channel
MAXIMUM RATINGS (TC = 25°C unless otherwise noted) 

Rating Symbol Value Unit


Drain–to–Source Voltage VDSS 60 Vdc
Drain–to–Gate Voltage (RGS = 1.0 MΩ) VDGR 60 Vdc 
Gate–to–Source Voltage
– Continuous VGS ± 15 Vdc

– Non–repetitive (tp ≤ 10 ms) VGSM ± 20 Vpk
Drain Current – Continuous ID 1.5 Adc
Drain Current – Continuous @ 100°C ID 1.2 MARKING
Drain Current – Single Pulse (tp ≤ 10 µs) IDM 5.0 Apk DIAGRAM
Total PD @ TA = 25°C mounted on 1″ sq. PD 2.1 Watts
Drain pad on FR–4 bd material
Total PD @ TA = 25°C mounted on 1.7 4
TO–261AA TBD
0.70″ sq. Drain pad on FR–4 bd material CASE 318E LWW
Total PD @ TA = 25°C mounted on min. 0.94 1 STYLE 3
Drain pad on FR–4 bd material 2
3
Derate above 25°C 6.3 mW/°C
Operating and Storage Temperature TJ, Tstg –55 to °C
L = Location Code
Range 175
WW = Work Week
Single Pulse Drain–to–Source Avalanche EAS mJ
Energy – Starting TJ = 25°C
(VDD = 25 Vdc, VGS = 5.0 Vdc, Peak 58 PIN ASSIGNMENT
IL = 3.4 Apk, L = 10 mH, RG = 25 Ω )
4 ()%
Thermal Resistance °C/W
– Junction to Ambient on 1″ sq. Drain RθJA 70
pad on FR–4 bd material
– Junction to Ambient on 0.70″ sq. Drain RθJA 88
pad on FR–4 bd material
– Junction to Ambient on min. Drain pad RθJA 159
on FR–4 bd material 1 2 3
Maximum Lead Temperature for Soldering TL 260 °C )'1 ()% ;(1
Purposes, 1/8″ from case for 10
seconds ORDERING INFORMATION

Device Package Shipping

MMFT3055VLT1 SOT–223 1000 Tape & Reel

MMFT3055VLT3 SOT–223 4000 Tape & Reel

 Semiconductor Components Industries, LLC, 2000 637 Publication Order Number:


November, 2000 – Rev. 2 MMFT3055VL/D
MMFT3055VL

ELECTRICAL CHARACTERISTICS (TJ = 25°C unless otherwise noted)


Characteristic Symbol Min Typ Max Unit
OFF CHARACTERISTICS
Drain–to–Source Breakdown Voltage (Cpk ≥ 2.0) (Note 3.) V(BR)DSS
(VGS = 0 Vdc, ID = 0.25 mAdc) 60 – – Vdc
Temperature Coefficient (Positive) – 65 – mV/°C
Zero Gate Voltage Drain Current IDSS µAdc
(VDS = 60 Vdc, VGS = 0 Vdc) – – 10
(VDS = 60 Vdc, VGS = 0 Vdc, TJ = 150°C) – – 100
Gate–Body Leakage Current (VGS = ± 15 Vdc, VDS = 0 Vdc) IGSS – – 100 nAdc
ON CHARACTERISTICS (Note 1.)
Gate Threshold Voltage (Cpk ≥ 2.0) (Note 3.) VGS(th)
(VDS = VGS, ID = 250 µAdc) 1.0 1.5 2.0 Vdc
Threshold Temperature Coefficient (Negative) – 3.7 – mV/°C
Static Drain–to–Source On–Resistance (Cpk ≥ 2.0) (Note 3.) RDS(on) – 0.125 0.14 Ohm
(VGS = 5.0 Vdc, ID = 0.75 Adc)

Drain–to–Source On–Voltage VDS(on) Vdc


(VGS = 5.0 Vdc, ID = 1.5 Adc) – – 0.25
(VGS = 5.0 Vdc, ID = 0.75 Adc, TJ = 150°C) – – 0.24
Forward Transconductance (VDS = 8.0 Vdc, ID = 1.5 Adc) gFS 1.0 3.5 – mhos
DYNAMIC CHARACTERISTICS
Input Capacitance Ciss – 350 490 pF
Output Capacitance (VDS = 25 Vd
Vdc, VGS = 0 Vd
Vdc,
Coss – 110 150
f = 1.0 MHz)
Transfer Capacitance Crss – 29 60
SWITCHING CHARACTERISTICS (Note 2.)
Turn–On Delay Time td(on) – 9.5 20 ns
Rise Time (VDD = 30 Vdc, ID = 1.5 Adc, tr – 18 40
VGS = 5
5.00 Vdc
Vdc,
Turn–Off Delay Time RG = 9.1 Ω) td(off) – 35 70
Fall Time tf – 22 40
Gate Charge QT – 9.0 10 nC

(VDS = 48 Vdc, ID = 1.5 Adc, Q1 – 1.0 –


VGS = 5.0 Vdc) Q2 – 4.0 –
Q3 – 3.5 –
SOURCE–DRAIN DIODE CHARACTERISTICS
Forward On–Voltage (Note 1.) (IS = 1.5 Adc, VGS = 0 Vdc) VSD Vdc
(IS = 1.5 Adc, VGS = 0 Vdc, – 0.82 1.2
TJ = 150°C) – 0.68 –
Reverse Recovery Time trr – 41 – ns
ta – 29 –
(IS = 1.5
1 5 Adc,
Adc VGS = 0 Vdc,
Vdc
dIS/dt = 100 A/µs) tb – 12 –
Reverse Recovery Stored QRR – 0.066 – µC
Charge
INTERNAL PACKAGE INDUCTANCE
Internal Drain Inductance LD nH
(Measured from the drain lead 0.25″ from package to center of die) – 4.5 –

Internal Source Inductance LS nH


(Measured from the source lead 0.25″ from package to source bond pad) – 7.5 –
1. Pulse Test: Pulse Width ≤ 300 µs, Duty Cycle ≤ 2%.
2. Switching characteristics are independent of operating junction temperature.
3. Reflects typical values. Max limit – Typ
Cpk =
3 x SIGMA

http://onsemi.com
638
MMFT3055VL

TYPICAL ELECTRICAL CHARACTERISTICS

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Figure 1. On–Region Characteristics Figure 2. Transfer Characteristics

 


  


 


  
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Figure 3. On–Resistance versus Drain Current Figure 4. On–Resistance versus Drain Current
and Temperature and Gate Voltage

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Figure 5. On–Resistance Variation with Figure 6. Drain–To–Source Leakage


Temperature Current versus Voltage

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639
MMFT3055VL

POWER MOSFET SWITCHING

Switching behavior is most easily modeled and predicted The capacitance (Ciss) is read from the capacitance curve at
by recognizing that the power MOSFET is charge a voltage corresponding to the off–state condition when
controlled. The lengths of various switching intervals (∆t) calculating td(on) and is read at a voltage corresponding to the
are determined by how fast the FET input capacitance can on–state when calculating td(off).
be charged by current from the generator. At high switching speeds, parasitic circuit elements
The published capacitance data is difficult to use for complicate the analysis. The inductance of the MOSFET
calculating rise and fall because drain–gate capacitance source lead, inside the package and in the circuit wiring
varies greatly with applied voltage. Accordingly, gate which is common to both the drain and gate current paths,
charge data is used. In most cases, a satisfactory estimate of produces a voltage at the source which reduces the gate drive
average input current (IG(AV)) can be made from a current. The voltage is determined by Ldi/dt, but since di/dt
rudimentary analysis of the drive circuit so that is a function of drain current, the mathematical solution is
t = Q/IG(AV) complex. The MOSFET output capacitance also
complicates the mathematics. And finally, MOSFETs have
During the rise and fall time interval when switching a finite internal gate resistance which effectively adds to the
resistive load, VGS remains virtually constant at a level resistance of the driving source, but the internal resistance
known as the plateau voltage, VSGP. Therefore, rise and fall is difficult to measure and, consequently, is not specified.
times may be approximated by the following: The resistive switching time variation versus gate
tr = Q2 x RG/(VGG – VGSP) resistance (Figure 9) shows how typical switching
tf = Q2 x RG/VGSP performance is affected by the parasitic circuit elements. If
where the parasitics were not present, the slope of the curves would
maintain a value of unity regardless of the switching speed.
VGG = the gate drive voltage, which varies from zero to VGG
The circuit used to obtain the data is constructed to minimize
RG = the gate drive resistance
common inductance in the drain and gate circuit loops and
and Q2 and VGSP are read from the gate charge curve.
is believed readily achievable with board mounted
During the turn–on and turn–off delay times, gate current is components. Most power electronic loads are inductive; the
not constant. The simplest calculation uses appropriate data in the figure is taken with a resistive load, which
values from the capacitance curves in a standard equation for approximates an optimally snubbed inductive load. Power
voltage change in an RC network. The equations are: MOSFETs may be safely operated into an inductive load;
td(on) = RG Ciss In [VGG/(VGG – VGSP)] however, snubbing reduces switching losses.
td(off) = RG Ciss In (VGG/VGSP)


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Figure 7. Capacitance Variation

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Figure 8. Gate–To–Source and Drain–To–Source Figure 9. Resistive Switching Time


Voltage versus Total Charge Variation versus Gate Resistance

DRAIN–TO–SOURCE DIODE CHARACTERISTICS


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Figure 10. Diode Forward Voltage versus Current

SAFE OPERATING AREA

The Forward Biased Safe Operating Area curves define reliable operation, the stored energy from circuit inductance
the maximum simultaneous drain–to–source voltage and dissipated in the transistor while in avalanche must be less
drain current that a transistor can handle safely when it is than the rated limit and adjusted for operating conditions
forward biased. Curves are based upon maximum peak differing from those specified. Although industry practice is
junction temperature and a case temperature (TC) of 25°C. to rate in terms of energy, avalanche energy capability is not
Peak repetitive pulsed power limits are determined by using a constant. The energy rating decreases non–linearly with an
the thermal response data in conjunction with the procedures increase of peak current in avalanche and peak junction
discussed in AN569, “Transient Thermal temperature.
Resistance–General Data and Its Use.” Although many E–FETs can withstand the stress of
Switching between the off–state and the on–state may drain–to–source avalanche at currents up to rated pulsed
traverse any load line provided neither rated peak current current (IDM), the energy rating is specified at rated
(IDM) nor rated voltage (VDSS) is exceeded and the continuous current (ID), in accordance with industry
transition time (tr,tf) do not exceed 10 µs. In addition the total custom. The energy rating must be derated for temperature
power averaged over a complete switching cycle must not as shown in the accompanying graph (Figure 13). Maximum
exceed (TJ(MAX) – TC)/(RθJC). energy at currents below rated continuous ID can safely be
A Power MOSFET designated E–FET can be safely used assumed to equal the values indicated.
in switching circuits with unclamped inductive loads. For

http://onsemi.com
641
MMFT3055VL

SAFE OPERATING AREA

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Figure 11. Maximum Rated Forward Biased Figure 12. Maximum Avalanche Energy versus
Safe Operating Area Starting Junction Temperature


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Figure 13. Thermal Response

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Figure 14. Diode Reverse Recovery Waveform

http://onsemi.com
642
MMFT3055VL

INFORMATION FOR USING THE SOT–223 SURFACE MOUNT PACKAGE

MINIMUM RECOMMENDED FOOTPRINT FOR SURFACE MOUNTED APPLICATIONS


Surface mount board layout is a critical portion of the interface between the board and the package. With the
total design. The footprint for the semiconductor packages correct pad geometry, the packages will self align when
must be the correct size to insure proper solder connection subjected to a solder reflow process.

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SOT–223 POWER DISSIPATION


The power dissipation of the SOT–223 is a function of 175°C – 25°C = 943 milliwatts
PD =
the drain pad size. This can vary from the minimum pad 159°C/W
size for soldering to a pad size given for maximum power
dissipation. Power dissipation for a surface mount device is The 159°C/W for the SOT–223 package assumes the use
determined by TJ(max), the maximum rated junction of the recommended footprint on a glass epoxy printed
temperature of the die, RθJA, the thermal resistance from circuit board to achieve a power dissipation of 943
the device junction to ambient, and the operating milliwatts. There are other alternatives to achieving higher
temperature, TA. Using the values provided on the data power dissipation from the SOT–223 package. One is to
sheet for the SOT–223 package, PD can be calculated as increase the area of the drain pad. By increasing the area of
follows: the drain pad, the power dissipation can be increased.
Although one can almost double the power dissipation with
TJ(max) – TA
PD = this method, one will be giving up area on the printed
RθJA circuit board which can defeat the purpose of using surface
The values for the equation are found in the maximum mount technology. A graph of RθJA versus drain pad area is
ratings table on the data sheet. Substituting these values shown in Figure 17.
into the equation for an ambient temperature TA of 25°C,
one can calculate the power dissipation of the device which
in this case is 943 milliwatts.

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643
MMFT3055VL

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Figure 15. Thermal Resistance versus Drain Pad


Area for the SOT–223 Package (Typical)

Another alternative would be to use a ceramic substrate board, the power dissipation can be doubled using the same
or an aluminum core board such as Thermal Cladt. Using footprint.
a board material such as Thermal Clad, an aluminum core

SOLDER STENCIL GUIDELINES


Prior to placing surface mount components onto a printed or stainless steel with a typical thickness of 0.008 inches.
circuit board, solder paste must be applied to the pads. A The stencil opening size for the SOT–223 package should
solder stencil is required to screen the optimum amount of be the same as the pad size on the printed circuit board, i.e.,
solder paste onto the footprint. The stencil is made of brass a 1:1 registration.

SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • The soldering temperature and time shall not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within • When shifting from preheating to soldering, the
a short time could result in device failure. Therefore, the maximum temperature gradient shall be 5°C or less.
following items should always be observed in order to • After soldering has been completed, the device should
minimize the thermal stress to which the devices are be allowed to cool naturally for at least three minutes.
subjected. Gradual cooling should be used as the use of forced
• Always preheat the device. cooling will increase the temperature gradient and
• The delta temperature between the preheat and result in latent failure due to mechanical stress.
soldering should be 100°C or less.* • Mechanical stress or shock should not be applied
• When preheating and soldering, the temperature of the during cooling
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When * Soldering a device without preheating can cause
using infrared heating with the reflow soldering excessive thermal shock and stress which can result in
method, the difference shall be a maximum of 10°C. damage to the device.

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MMFT3055VL

TYPICAL SOLDER HEATING PROFILE


For any given circuit board, there will be a group of The line on the graph shows the actual temperature that
control settings that will give the desired heat pattern. The might be experienced on the surface of a test board at or
operator must set temperatures for several heating zones, near a central solder joint. The two profiles are based on a
and a figure for belt speed. Taken together, these control high density and a low density board. The Vitronics
settings make up a heating “profile” for that particular SMD310 convection/infrared reflow soldering system was
circuit board. On machines controlled by a computer, the used to generate this profile. The type of solder used was
computer remembers these profiles from one operating 62/36/2 Tin Lead Silver with a melting point between
session to the next. Figure 18 shows a typical heating 177–189°C. When this type of furnace is used for solder
profile for use when soldering a surface mount device to a reflow work, the circuit boards and solder joints tend to
printed circuit board. This profile will vary among heat first. The components on the board are then heated by
soldering systems but it is a good starting point. Factors that conduction. The circuit board, because it has a large surface
can affect the profile include the type of soldering system in area, absorbs the thermal energy more efficiently, then
use, density and types of components on the board, type of distributes this energy to the components. Because of this
solder used, and the type of board or substrate material effect, the main body of a component may be up to 30
being used. This profile shows temperature versus time. degrees cooler than the adjacent solder joints.

STEP 1 STEP 2 STEP 3 STEP 4 STEP 5 STEP 6 STEP 7


PREHEAT VENT HEATING HEATING HEATING VENT COOLING
ZONE 1 “SOAK” ZONES 2 & 5 ZONES 3 & 6 ZONES 4 & 7
“RAMP” “RAMP” “SOAK” “SPIKE” 205° TO 219°C
PEAK AT
200°C DESIRED CURVE FOR HIGH 170°C SOLDER
MASS ASSEMBLIES JOINT
160°C
150°C

150°C
SOLDER IS LIQUID FOR
40 TO 80 SECONDS
100°C 140°C (DEPENDING ON
MASS OF ASSEMBLY)
100°C

DESIRED CURVE FOR LOW


MASS ASSEMBLIES
5°C

TIME (3 TO 7 MINUTES TOTAL) TMAX


Figure 16. Typical Solder Heating Profile

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(#!.
Preferred Device

#$%& '(
  !  
P–Channel SOT–223
This miniature surface mount MOSFET features ultra low RDS(on)
and true logic level performance. It is capable of withstanding high
energy in the avalanche and commutation modes and the http://onsemi.com
drain–to–source diode has a very low reverse recovery time.
MMFT5P03HD devices are designed for use in low voltage, high
5 AMPERES
speed switching applications where power efficiency is important. 30 VOLTS
Typical applications are dc–dc converters, and power management in RDS(on) = 100 mΩ
portable and battery powered products such as computers, printers,
cellular and cordless phones. They can also be used for low voltage P–Channel
motor controls in mass storage products such as disk drives and tape 
drives. The avalanche energy is specified to eliminate the guesswork
in designs where inductive loads are switched and offer additional
safety margin against unexpected voltage transients.
• Ultra Low RDS(on) Provides Higher Efficiency and Extends Battery 
Life
• Logic Level Gate Drive – Can Be Driven by Logic ICs 
• Miniature SOT–223 Surface Mount Package – Saves Board Space
• Diode Is Characterized for Use In Bridge Circuits MARKING
• Diode Exhibits High Speed, With Soft Recovery DIAGRAM
• IDSS Specified at Elevated Temperature
• Avalanche Energy Specified 4
TO–261AA 5P03H
CASE 318E LWW
1 STYLE 3
2
3

L = Location Code
WW = Work Week

PIN ASSIGNMENT
4 ()%

1 2 3
)'1 ()% ;(1

ORDERING INFORMATION

Device Package Shipping

MMFT5P03HDT3 SOT–223 4000 Tape & Reel

Preferred devices are recommended choices for future use


and best overall value.

 Semiconductor Components Industries, LLC, 2000 646 Publication Order Number:


November, 2000 – Rev. 3 MMFT5P03HD/D
MMFT5P03HD

MAXIMUM RATINGS (TJ = 25°C unless otherwise noted)


Negative sign for P–Channel devices omitted for clarity
Rating Symbol Max Unit
Drain–to–Source Voltage VDSS 30 V
Drain–to–Gate Voltage (RGS = 1.0 MΩ) VDGR 30 V
Gate–to–Source Voltage – Continuous VGS ± 20 V
1″ SQ. Thermal Resistance – Junction to Ambient RTHJA 40 °C/W
FR–4 or G–10 PCB Total Power Dissipation @ TA = 25°C PD 3.13 Watts
Linear Derating Factor 25 mW/°C
Drain Current – Continuous @ TA = 25°C ID 5.2 A
10 seconds Continuous @ TA = 70°C ID 4.1 A
Pulsed Drain Current (Note 1.) IDM 26 A
Minimum Thermal Resistance – Junction to Ambient RTHJA 80 °C/W
FR–4 or G–10 PCB Total Power Dissipation @ TA = 25°C PD 1.56 Watts
Linear Derating Factor 12.5 mW/°C
Drain Current – Continuous @ TA = 25°C ID 3.7 A
10 seconds Continuous @ TA = 70°C ID 2.9 A
Pulsed Drain Current (Note 1.) IDM 19 A
Operating and Storage Temperature Range TJ, Tstg – 55 to °C
150
Single Pulse Drain–to–Source Avalanche Energy – Starting TJ = 25°C EAS mJ
(VDD = 30 Vdc, VGS = 10 Vdc, Peak IL = 12 Apk, L = 3.5 mH, RG = 25 W) 250
1. Repetitive rating; pulse width limited by maximum junction temperature.

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MMFT5P03HD

ELECTRICAL CHARACTERISTICS (TC = 25°C unless otherwise noted)


Characteristic Symbol Min Typ Max Unit
OFF CHARACTERISTICS
Drain–to–Source Breakdown Voltage (Cpk ≥ 2.0) (Notes 2. & 4.) V(BR)DSS Vdc
(VGS = 0 Vdc, ID = 0.25 mAdc) 30 – –
Temperature Coefficient (Positive) – 28 – mV/°C
Zero Gate Voltage Drain Current IDSS µAdc
(VDS = 24 Vdc, VGS = 0 Vdc) – – 1.0
(VDS = 24 Vdc, VGS = 0 Vdc, TJ = 125°C) – – 25
Gate–Body Leakage Current (VGS = ± 20 Vdc, VDS = 0) IGSS – – 100 nAdc
ON CHARACTERISTICS(1)
Gate Threshold Voltage (Cpk ≥ 2.0) (Notes 2. & 4.) VGS(th) Vdc
(VDS = VGS, ID = 0.25 mAdc) 1.0 1.75 3.0
Threshold Temperature Coefficient (Negative) – 3.5 – mV/°C
Static Drain–to–Source On–Resistance (Cpk ≥ 2.0) (Notes 2. & 4.) RDS(on) mΩ
(VGS = 10 Vdc, ID = 5.2 Adc) – 79 100
(VGS = 4.5 Vdc, ID = 2.6 Adc) – 119 150
Forward Transconductance (VDS = 15 Vdc, ID = 2.0 Adc) (Note 2.) gFS 2.0 4.0 – Mhos
DYNAMIC CHARACTERISTICS
Input Capacitance Ciss – 475 950 pF
Output Capacitance (VDS = 25 Vd
Vdc, VGS = 0 Vd
Vdc,
Coss – 220 440
f = 1.0 MHz)
Transfer Capacitance Crss – 70 140
SWITCHING CHARACTERISTICS (Note 3.)
Turn–On Delay Time td(on) – 12 24 ns
Rise Time (VDD = 15 Vdc, ID = 4.0 Adc, tr – 24 48
VGS = 10 Vdc
Vdc,
Turn–Off Delay Time RG = 6.0 Ω) (Note 2.) td(off) – 47 94
Fall Time tf – 46 92
Turn–On Delay Time td(on) – 19 38
Rise Time (VDD = 15 Vdc, ID = 2.0 Adc, tr – 55 110
VGS = 4
4.55 Vdc
Vdc,
Turn–Off Delay Time RG = 6.0 Ω) (Note 2.) td(off) – 30 60
Fall Time tf – 40 80
Gate Charge QT – 17 24 nC

(VDS = 24 Vdc, ID = 4.0 Adc, Q1 – 1.7 –


VGS = 10 Vdc) (Note 2.) Q2 – 6.3 –
Q3 – 4.6 –

SOURCE–DRAIN DIODE CHARACTERISTICS


Forward On–Voltage (Note 2.) (IS = 4.0 Adc, VGS = 0 Vdc) (Note 2.) VSD Vdc
(IS = 4.0 Adc, VGS = 0 Vdc, – 1.1 1.5
TJ = 125°C) – 0.89 –
Reverse Recovery Time trr – 39 – ns

(IS = 4.0 Adc, VGS = 0 Vdc, ta – 20 –


dIS/dt = 100 A/µs) (Note 2.) tb – 19 –
Reverse Recovery Stored Charge QRR – 0.042 – µC
2. Pulse Test: Pulse Width ≤ 300 µs, Duty Cycle ≤ 2%.
3. Switching characteristics are independent of operating junction temperature.
4. Reflects typical values. Max limit – Typ
Cpk =
3 x SIGMA

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648
MMFT5P03HD

TYPICAL ELECTRICAL CHARACTERISTICS

 
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Figure 3. On–Resistance versus Figure 4. On–Resistance versus Drain Current


Gate–To–Source Voltage and Gate Voltage

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Figure 5. On–Resistance Variation with Figure 6. Drain–To–Source Leakage


Temperature Current versus Voltage

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MMFT5P03HD

POWER MOSFET SWITCHING

Switching behavior is most easily modeled and predicted The capacitance (Ciss) is read from the capacitance curve at
by recognizing that the power MOSFET is charge a voltage corresponding to the off–state condition when
controlled. The lengths of various switching intervals (∆t) calculating td(on) and is read at a voltage corresponding to the
are determined by how fast the FET input capacitance can on–state when calculating td(off).
be charged by current from the generator. At high switching speeds, parasitic circuit elements
The published capacitance data is difficult to use for complicate the analysis. The inductance of the MOSFET
calculating rise and fall because drain–gate capacitance source lead, inside the package and in the circuit wiring
varies greatly with applied voltage. Accordingly, gate which is common to both the drain and gate current paths,
charge data is used. In most cases, a satisfactory estimate of produces a voltage at the source which reduces the gate drive
average input current (IG(AV)) can be made from a current. The voltage is determined by Ldi/dt, but since di/dt
rudimentary analysis of the drive circuit so that is a function of drain current, the mathematical solution is
t = Q/IG(AV) complex. The MOSFET output capacitance also
complicates the mathematics. And finally, MOSFETs have
During the rise and fall time interval when switching a finite internal gate resistance which effectively adds to the
resistive load, VGS remains virtually constant at a level resistance of the driving source, but the internal resistance
known as the plateau voltage, VSGP. Therefore, rise and fall is difficult to measure and, consequently, is not specified.
times may be approximated by the following: The resistive switching time variation versus gate
tr = Q2 x RG/(VGG – VGSP) resistance (Figure 9) shows how typical switching
tf = Q2 x RG/VGSP performance is affected by the parasitic circuit elements. If
where the parasitics were not present, the slope of the curves would
maintain a value of unity regardless of the switching speed.
VGG = the gate drive voltage, which varies from zero to VGG
The circuit used to obtain the data is constructed to minimize
RG = the gate drive resistance
common inductance in the drain and gate circuit loops and
and Q2 and VGSP are read from the gate charge curve.
is believed readily achievable with board mounted
During the turn–on and turn–off delay times, gate current is components. Most power electronic loads are inductive; the
not constant. The simplest calculation uses appropriate data in the figure is taken with a resistive load, which
values from the capacitance curves in a standard equation for approximates an optimally snubbed inductive load. Power
voltage change in an RC network. The equations are: MOSFETs may be safely operated into an inductive load;
td(on) = RG Ciss In [VGG/(VGG – VGSP)] however, snubbing reduces switching losses.
td(off) = RG Ciss In (VGG/VGSP)

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Figure 7. Capacitance Variation

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Figure 8. Gate–To–Source and Drain–To–Source Figure 9. Resistive Switching Time


Voltage versus Total Charge Variation versus Gate Resistance

DRAIN–TO–SOURCE DIODE CHARACTERISTICS

The switching characteristics of a MOSFET body diode high di/dts. The diode’s negative di/dt during ta is directly
are very important in systems using it as a freewheeling or controlled by the device clearing the stored charge.
commutating diode. Of particular interest are the reverse However, the positive di/dt during tb is an uncontrollable
recovery characteristics which play a major role in diode characteristic and is usually the culprit that induces
determining switching losses, radiated noise, EMI and RFI. current ringing. Therefore, when comparing diodes, the
System switching losses are largely due to the nature of ratio of tb/ta serves as a good indicator of recovery
the body diode itself. The body diode is a minority carrier abruptness and thus gives a comparative estimate of
device, therefore it has a finite reverse recovery time, trr, due probable noise generated. A ratio of 1 is considered ideal and
to the storage of minority carrier charge, QRR, as shown in values less than 0.5 are considered snappy.
the typical reverse recovery wave form of Figure 11. It is this Compared to ON Semiconductor standard cell density
stored charge that, when cleared from the diode, passes low voltage MOSFETs, high cell density MOSFET diodes
through a potential and defines an energy loss. Obviously, are faster (shorter trr), have less stored charge and a softer
repeatedly forcing the diode through reverse recovery reverse recovery characteristic. The softness advantage of
further increases switching losses. Therefore, one would the high cell density diode means they can be forced through
like a diode with short trr and low QRR specifications to reverse recovery at a higher di/dt than a standard cell
minimize these losses. MOSFET diode without increasing the current ringing or the
The abruptness of diode reverse recovery effects the noise generated. In addition, power dissipation incurred
amount of radiated noise, voltage spikes, and current from switching the diode will be less due to the shorter
ringing. The mechanisms at work are finite irremovable recovery time and lower switching losses.
circuit parasitic inductances and capacitances acted upon by
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Figure 10. Diode Forward Voltage versus Current

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Figure 11. Reverse Recovery Time (trr)

SAFE OPERATING AREA

The Forward Biased Safe Operating Area curves define total power averaged over a complete switching cycle must
the maximum simultaneous drain–to–source voltage and not exceed (TJ(MAX) – TC)/(RθJC).
drain current that a transistor can handle safely when it is A power MOSFET designated E–FET can be safely used
forward biased. Curves are based upon maximum peak in switching circuits with unclamped inductive loads. For
junction temperature and a case temperature (TC) of 25°C. reliable operation, the stored energy from circuit inductance
Peak repetitive pulsed power limits are determined by using dissipated in the transistor while in avalanche must be less
the thermal response data in conjunction with the procedures than the rated limit and must be adjusted for operating
discussed in AN569, “Transient Thermal Resistance – conditions differing from those specified. Although industry
General Data and Its Use.” practice is to rate in terms of energy, avalanche energy
Switching between the off–state and the on–state may capability is not a constant. The energy rating decreases
traverse any load line provided neither rated peak current non–linearly with an increase of peak current in avalanche
(IDM) nor rated voltage (VDSS) is exceeded, and that the and peak junction temperature.
transition time (tr, tf) does not exceed 10 µs. In addition the

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Figure 12. Maximum Rated Forward Biased Figure 13. Maximum Avalanche Energy versus
Safe Operating Area Starting Junction Temperature

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MMFT5P03HD

TYPICAL ELECTRICAL CHARACTERISTICS


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Figure 14. Thermal Response

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Figure 15. Diode Reverse Recovery Waveform

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653
MMFT5P03HD

INFORMATION FOR USING THE SOT–223 SURFACE MOUNT PACKAGE

MINIMUM RECOMMENDED FOOTPRINT FOR SURFACE MOUNTED APPLICATIONS


Surface mount board layout is a critical portion of the interface between the board and the package. With the
total design. The footprint for the semiconductor packages correct pad geometry, the packages will self align when
must be the correct size to insure proper solder connection subjected to a solder reflow process.

$
48

:7
#

#68
94
7 7
#4 #4

:7
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$7 $7 $7 inches


$ $ $ mm

SOT–223 POWER DISSIPATION


The power dissipation of the SOT–223 is a function of 150°C – 25°C = 3.13 watts
PD =
the drain pad size. This can vary from the minimum pad 40°C/W
size for soldering to a pad size given for maximum power
dissipation. Power dissipation for a surface mount device is The 40°C/W for the SOT–223 package assumes the use
determined by TJ(max), the maximum rated junction of the recommended footprint on a glass epoxy printed
temperature of the die, RθJA, the thermal resistance from circuit board to achieve a power dissipation of 3.13 watts.
the device junction to ambient, and the operating There are other alternatives to achieving higher power
temperature, TA. Using the values provided on the data dissipation from the SOT–223 package. One is to increase
sheet for the SOT–223 package, PD can be calculated as the area of the drain pad. By increasing the area of the drain
follows: pad, the power dissipation can be increased. Although one
can almost double the power dissipation with this method,
TJ(max) – TA
PD = one will be giving up area on the printed circuit board
RθJA which can defeat the purpose of using surface mount
The values for the equation are found in the maximum technology.
ratings table on the data sheet. Substituting these values Another alternative would be to use a ceramic substrate
into the equation for an ambient temperature TA of 25°C, or an aluminum core board such as Thermal Cladt. Using
one can calculate the power dissipation of the device which a board material such as Thermal Clad, an aluminum core
in this case is 3.13 watts. board, the power dissipation can be doubled using the same
footprint.

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654
MMFT5P03HD

TYPICAL SOLDER HEATING PROFILE


For any given circuit board, there will be a group of temperature versus time. The line on the graph shows the
control settings that will give the desired heat pattern. The actual temperature that might be experienced on the surface
operator must set temperatures for several heating zones of a test board at or near a central solder joint. The two
and a figure for belt speed. Taken together, these control profiles are based on a high density and a low density
settings make up a heating “profile” for that particular board. The Vitronics SMD310 convection/infrared reflow
circuit board. On machines controlled by a computer, the soldering system was used to generate this profile. The type
computer remembers these profiles from one operating of solder used was 62/36/2 Tin Lead Silver with a melting
session to the next. Figure 16 shows a typical heating point between 177–189°C. When this type of furnace is
profile for use when soldering a surface mount device to a used for solder reflow work, the circuit boards and solder
printed circuit board. This profile will vary among joints tend to heat first. The components on the board are
soldering systems, but it is a good starting point. Factors then heated by conduction. The circuit board, because it has
that can affect the profile include the type of soldering a large surface area, absorbs the thermal energy more
system in use, density and types of components on the efficiently, then distributes this energy to the components.
board, type of solder used, and the type of board or Because of this effect, the main body of a component may
substrate material being used. This profile shows be up to 30 degrees cooler than the adjacent solder joints.

STEP 1 STEP 2 STEP 3 STEP 4 STEP 5 STEP 6 STEP 7


PREHEAT VENT HEATING HEATING HEATING VENT COOLING
ZONE 1 “SOAK” ZONES 2 & 5 ZONES 3 & 6 ZONES 4 & 7
“RAMP” “RAMP” “SOAK” “SPIKE” 205° TO 219°C
PEAK AT
200°C DESIRED CURVE FOR HIGH 170°C SOLDER
MASS ASSEMBLIES JOINT
160°C
150°C

150°C
SOLDER IS LIQUID FOR
40 TO 80 SECONDS
100°C 140°C (DEPENDING ON
MASS OF ASSEMBLY)
100°C

DESIRED CURVE FOR LOW


MASS ASSEMBLIES
5°C

TIME (3 TO 7 MINUTES TOTAL) TMAX


Figure 16. Typical Solder Heating Profile

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()
Preferred Device

#$%& '(
!    
N–Channel SOT–223
This Power MOSFET is designed for high speed, low loss power
switching applications such as switching regulators, dc–dc converters,
solenoid and relay drivers. The device is housed in the SOT–223 http://onsemi.com
package which is designed for medium power surface mount
applications.
300 mA
• Silicon Gate for Fast Switching Speeds 60 VOLTS
• Low Drive Requirement RDS(on) = 1.7 
• The SOT–223 Package can be soldered using wave or reflow.
N–Channel
The formed leads absorb thermal stress during soldering
eliminating the possibility of damage to the die. 

MAXIMUM RATINGS (TC = 25°C unless otherwise noted)


Rating Symbol Value Unit 
Drain–to–Source Voltage VDS 60 Volts
Gate–to–Source Voltage – Non–Repetitive VGS ±30 Volts 

Drain Current ID 300 mAdc


Total Power Dissipation @ TA = 25°C PD 0.8 Watts MARKING
(Note 1.) DIAGRAM
Derate above 25°C 6.4 mW/°C
Operating and Storage Temperature TJ, Tstg –65 to °C 4
TO–261AA FT960
Range 150
CASE 318E LWW
THERMAL CHARACTERISTICS 1 STYLE 3
2
3
Thermal Resistance – RθJA 156 °C/W
Junction–to–Ambient
FT960 = Device Code
Maximum Temperature for Soldering TL 260 °C L = Location Code
Purposes WW = Work Week
Time in Solder Bath 10 Sec
1. Device mounted on a FR–4 glass epoxy printed circuit board using minimum
recommended footprint. PIN ASSIGNMENT
4 ()%

1 2 3
)'1 ()% ;(1

ORDERING INFORMATION

Device Package Shipping

MMFT960T1 SOT–223 1000 Tape & Reel

Preferred devices are recommended choices for future use


and best overall value.

 Semiconductor Components Industries, LLC, 2000 656 Publication Order Number:


November, 2000 – Rev. 4 MMFT960T1/D
MMFT960T1

ELECTRICAL CHARACTERISTICS (TA = 25°C unless otherwise noted)


Characteristic Symbol Min Typ Max Unit

OFF CHARACTERISTICS
Drain–to–Source Breakdown Voltage V(BR)DSS 60 – – Vdc
(VGS = 0, ID = 10 µA)

Zero Gate Voltage Drain Current IDSS – – 10 µAdc


(VDS = 60 V, VGS = 0)

Gate–Body Leakage Current IGSS – – 50 nAdc


(VGS = 15 Vdc, VDS = 0)

ON CHARACTERISTICS (Note 2.)


Gate Threshold Voltage VGS(th) 1.0 – 3.5 Vdc
(VDS = VGS, ID = 1.0 mAdc)

Static Drain–to–Source On–Resistance RDS(on) – – 1.7 Ohms


(VGS = 10 Vdc, ID = 1.0 A)

Drain–to–Source On–Voltage VDS(on) Vdc


(VGS = 10 V, ID = 0.5 A) – – 0.8
(VGS = 10 V, ID = 1.0 A) – – 1.7
Forward Transconductance gfs – 600 – mmhos
(VDS = 25 V, ID = 0.5 A)

DYNAMIC CHARACTERISTICS
Input Capacitance Ciss – 65 – pF
(VDS = 25 VV, VGS = 0
0,
Output Capacitance Coss – 33 –
f = 1.0 MHz)
Transfer Capacitance Crss – 7.0 –
Total Gate Charge Qg – 3.2 – nC
(VGS = 10 V
V, ID = 1.0
1 0 A,
A
Gate–Source Charge Qgs – 1.2 –
VDS = 48 V)
Gate–Drain Charge Qgd – 2.0 –
2. Pulse Test: Pulse Width ≤ 300 µs, Duty Cycle ≤ 2.0%.

TYPICAL ELECTRICAL CHARACTERISTICS

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Figure 1. On–Region Characteristics Figure 2. Transfer Characteristics

TYPICAL ELECTRICAL CHARACTERISTICS

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Figure 3. On–Resistance versus Drain Current Figure 4. On–Resistance Variation with Temperature

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Figure 5. Source–Drain Diode Forward Voltage Figure 6. Capacitance Variation

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Figure 7. Gate Charge versus Gate–to–Source Voltage Figure 8. Transconductance

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INFORMATION FOR USING THE SOT-223 SURFACE MOUNT PACKAGE

MINIMUM RECOMMENDED FOOTPRINT FOR SURFACE MOUNTED APPLICATIONS


Surface mount board layout is a critical portion of the interface between the board and the package. With the
total design. The footprint for the semiconductor packages correct pad geometry, the packages will self align when
must be the correct size to insure proper solder connection subjected to a solder reflow process.

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SOT-223 POWER DISSIPATION


The power dissipation of the SOT-223 is a function of the PD = 150°C – 25°C = 0.8 watts
pad size. This can vary from the minimum pad size for 156°C/W
soldering to a pad size given for maximum power
The 156°C/W for the SOT-223 package assumes the use
dissipation. Power dissipation for a surface mount device is
of the recommended footprint on a glass epoxy printed
determined by TJ(max), the maximum rated junction
circuit board to achieve a power dissipation of 0.8 watts.
temperature of the die, RθJA, the thermal resistance from
There are other alternatives to achieving higher power
the device junction to ambient, and the operating
dissipation from the SOT-223 package. One is to increase
temperature, TA. Using the values provided on the data
the area of the collector pad. By increasing the area of the
sheet for the SOT-223 package, PD can be calculated as
collector pad, the power dissipation can be increased.
follows:
Although the power dissipation can almost be doubled with
TJ(max) – TA
PD = this method, area is taken up on the printed circuit board
RθJA which can defeat the purpose of using surface mount
The values for the equation are found in the maximum technology. A graph of RθJA versus collector pad area is
ratings table on the data sheet. Substituting these values shown in Figure 9.
into the equation for an ambient temperature TA of 25°C,
one can calculate the power dissipation of the device which
in this case is 0.8 watts.

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Figure 9. Thermal Resistance versus Collector


Pad Area for the SOT-223 Package (Typical)

Another alternative would be to use a ceramic substrate board, the power dissipation can be doubled using the same
or an aluminum core board such as Thermal Cladt. Using footprint.
a board material such as Thermal Clad, an aluminum core

SOLDER STENCIL GUIDELINES


Prior to placing surface mount components onto a printed or stainless steel with a typical thickness of 0.008 inches.
circuit board, solder paste must be applied to the pads. A The stencil opening size for the SOT-223 package should
solder stencil is required to screen the optimum amount of be the same as the pad size on the printed circuit board, i.e.,
solder paste onto the footprint. The stencil is made of brass a 1:1 registration.

SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • The soldering temperature and time should not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within • When shifting from preheating to soldering, the
a short time could result in device failure. Therefore, the maximum temperature gradient should be 5°C or less.
following items should always be observed in order to • After soldering has been completed, the device should
minimize the thermal stress to which the devices are be allowed to cool naturally for at least three minutes.
subjected. Gradual cooling should be used as the use of forced
• Always preheat the device. cooling will increase the temperature gradient and
• The delta temperature between the preheat and result in latent failure due to mechanical stress.
soldering should be 100°C or less.* • Mechanical stress or shock should not be applied
• When preheating and soldering, the temperature of the during cooling
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When * Soldering a device without preheating can cause
using infrared heating with the reflow soldering excessive thermal shock and stress which can result in
method, the difference should be a maximum of 10°C. damage to the device.

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MMFT960T1

TYPICAL SOLDER HEATING PROFILE


For any given circuit board, there will be a group of The line on the graph shows the actual temperature that
control settings that will give the desired heat pattern. The might be experienced on the surface of a test board at or
operator must set temperatures for several heating zones, near a central solder joint. The two profiles are based on a
and a figure for belt speed. Taken together, these control high density and a low density board. The Vitronics
settings make up a heating “profile” for that particular SMD310 convection/infrared reflow soldering system was
circuit board. On machines controlled by a computer, the used to generate this profile. The type of solder used was
computer remembers these profiles from one operating 62/36/2 Tin Lead Silver with a melting point between
session to the next. Figure 10 shows a typical heating 177–189°C. When this type of furnace is used for solder
profile for use when soldering a surface mount device to a reflow work, the circuit boards and solder joints tend to
printed circuit board. This profile will vary among heat first. The components on the board are then heated by
soldering systems but it is a good starting point. Factors that conduction. The circuit board, because it has a large surface
can affect the profile include the type of soldering system in area, absorbs the thermal energy more efficiently, then
use, density and types of components on the board, type of distributes this energy to the components. Because of this
solder used, and the type of board or substrate material effect, the main body of a component may be up to 30
being used. This profile shows temperature versus time. degrees cooler than the adjacent solder joints.

STEP 1 STEP 2 STEP 3 STEP 4 STEP 5 STEP 6 STEP 7


PREHEAT VENT HEATING HEATING HEATING VENT COOLING
ZONE 1 “SOAK” ZONES 2 & 5 ZONES 3 & 6 ZONES 4 & 7
“RAMP” “RAMP” “SOAK” “SPIKE” 205° TO 219°C
PEAK AT
200°C DESIRED CURVE FOR HIGH 170°C SOLDER
MASS ASSEMBLIES JOINT
160°C
150°C

150°C
SOLDER IS LIQUID FOR
40 TO 80 SECONDS
100°C 140°C (DEPENDING ON
MASS OF ASSEMBLY)
100°C

DESIRED CURVE FOR LOW


MASS ASSEMBLIES
5°C

TIME (3 TO 7 MINUTES TOTAL) TMAX


Figure 10. Typical Solder Heating Profile

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661
( 8
Preferred Device

#$%& '(
    
N–Channel SO–8
EZFETst are an advanced series of Power MOSFETs which
contain monolithic back–to–back zener diodes. These zener diodes
provide protection against ESD and unexpected transients. These http://onsemi.com
miniature surface mount MOSFETs feature low RDS(on) and true logic
level performance. They are capable of withstanding high energy in 10 AMPERES
the avalanche and commutation modes and the drain–to–source diode 20 VOLTS
has a very low reverse recovery time. EZFET devices are designed for
use in low voltage, high speed switching applications where power RDS(on) = 15 m
efficiency is important.
• Zener Protected Gates Provide Electrostatic Discharge Protection N–Channel

• Low RDS(on) Provides Higher Efficiency and Extends Battery Life 

• Logic Level Gate Drive – Can Be Driven by Logic ICs


• Miniature SO–8 Surface Mount Package – Saves Board Space
• Diode Exhibits High Speed, With Soft Recovery 
• IDSS Specified at Elevated Temperature
• Mounting Information for SO–8 Package Provided 

MAXIMUM RATINGS (TJ = 25°C unless otherwise noted) MARKING


Rating Symbol Value Unit DIAGRAM
Drain–to–Source Voltage VDSS 20 Vdc
Drain–to–Gate Voltage (RGS = 1.0 MΩ) VDGR 20 Vdc
Gate–to–Source Voltage – Continuous VGS ± 12 Vdc SO–8
10N02Z
8 CASE 751
Drain Current – Continuous @ TA = 25°C ID 10 Adc LYWW
STYLE 12
Drain Current – Continuous @ TA = 70°C ID 7.0
Drain Current – Single Pulse (tp ≤ 10 µs) IDM 80 Apk 1
Total Power Dissipation @ TA = 25°C PD 2.5 Watts
L = Location Code
(Note 1.)
Y = Year
Operating and Storage Temperature Range TJ, Tstg – 55 to °C WW = Work Week
150
Thermal Resistance – Junction to Ambient RθJA 50 °C/W
Maximum Temperature for Soldering TL 260 °C PIN ASSIGNMENT
1. When mounted on 1″ square FR–4 or G–10 board (VGS = 4.5 V, @
10 Seconds) Source 1 8 Drain
Source 2 7 Drain
Source 3 6 Drain
Gate 4 5 Drain
Top View

ORDERING INFORMATION

Device Package Shipping

MMSF10N02ZR2 SO–8 2500 Tape & Reel

Preferred devices are recommended choices for future use


and best overall value.

 Semiconductor Components Industries, LLC, 2000 662 Publication Order Number:


November, 2000 – Rev. 3 MMSF10N02Z/D
MMSF10N02Z

ELECTRICAL CHARACTERISTICS (TA = 25°C unless otherwise noted)


Characteristic Symbol Min Typ Max Unit
OFF CHARACTERISTICS
Drain–to–Source Breakdown Voltage (Cpk ≥ 2.0) (Note 4.) V(BR)DSS Vdc
(VGS = 0 Vdc, ID = 0.25 mAdc) 20 – –
Temperature Coefficient (Positive) – 17 – mV/°C
Zero Gate Voltage Drain Current IDSS µAdc
(VDS = 20 Vdc, VGS = 0 Vdc) – – 10
(VDS = 20 Vdc, VGS = 0 Vdc, TJ = 125°C) – – 100
Gate–Body Leakage Current (VGS = ± 12 Vdc, VDS = 0 Vdc) IGSS – 0.6 1.5 µAdc
ON CHARACTERISTICS (Note 2.)
Gate Threshold Voltage (Cpk ≥ 2.0) (Note 4.) VGS(th) Vdc
(VDS = VGS, ID = 0.25 mAdc) 0.5 0.72 1.1
Threshold Temperature Coefficient (Negative) – 2.86 – mV/°C
Static Drain–to–Source On–Resistance (Cpk ≥ 2.0) (Note 4.) RDS(on) mΩ
(VGS = 4.5 Vdc, ID = 10 Adc) – 13 15
(VGS = 2.7 Vdc, ID = 5.0 Adc) – 16 19
Forward Transconductance (VDS = 9.0 Vdc, ID = 5.0 Adc) gFS 11 14 – Mhos
DYNAMIC CHARACTERISTICS
Input Capacitance Ciss – 1150 1225 pF
Output Capacitance (VDS = 10 Vd
Vdc, VGS = 0 Vd
Vdc,
Coss – 775 810
f = 1.0 MHz)
Transfer Capacitance Crss – 375 480
SWITCHING CHARACTERISTICS (Note 3.)
Turn–On Delay Time td(on) – 65 75 ns
Rise Time (VDD = 10 Vdc, ID = 5.0 Adc, tr – 360 440
Turn–Off Delay Time VGS = 4.0 Vdc, RG = 10 Ω) td(off) – 325 640
Fall Time tf – 575 860
Gate Charge QT – 26 32 nC

(VDS = 16 Vdc, ID = 10 Adc, Q1 – 2.5 –


VGS = 4.0 Vdc) Q2 – 13 –
Q3 – 9.0 –

SOURCE–DRAIN DIODE CHARACTERISTICS


Forward On–Voltage VSD Vdc
(IS = 10 Adc, VGS = 0 Vdc)
– 0.83 1.2
(IS = 10 Adc, VGS = 0 Vdc, TJ = 125°C)
– 0.68 –
Reverse Recovery Time trr – 765 – ns
(IS = 10 Ad
Adc, VGS = 0 VdVdc,
ta – 240 –
dIS/dt = 100 A/µs)
tb – 530 –
Reverse Recovery Storage Charge QRR – 8.7 – µC
2. Pulse Test: Pulse Width ≤ 300 µs, Duty Cycle ≤ 2%.
3. Switching characteristics are independent of operating junction temperature.
4. Reflects typical values. Max limit – Typ
Cpk =
3 x SIGMA

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663
MMSF10N02Z

TYPICAL ELECTRICAL CHARACTERISTICS

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Figure 3. On–Resistance versus Figure 4. On–Resistance versus Drain Current


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Figure 5. On–Resistance Variation Figure 6. Drain–to–Source Leakage Current


with Temperature versus Voltage

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MMSF10N02Z

POWER MOSFET SWITCHING

Switching behavior is most easily modeled and predicted The capacitance (Ciss) is read from the capacitance curve at
by recognizing that the power MOSFET is charge a voltage corresponding to the off–state condition when
controlled. The lengths of various switching intervals (∆t) calculating td(on) and is read at a voltage corresponding to the
are determined by how fast the FET input capacitance can on–state when calculating td(off).
be charged by current from the generator. At high switching speeds, parasitic circuit elements
The published capacitance data is difficult to use for complicate the analysis. The inductance of the MOSFET
calculating rise and fall because drain–gate capacitance source lead, inside the package and in the circuit wiring
varies greatly with applied voltage. Accordingly, gate which is common to both the drain and gate current paths,
charge data is used. In most cases, a satisfactory estimate of produces a voltage at the source which reduces the gate drive
average input current (IG(AV)) can be made from a current. The voltage is determined by Ldi/dt, but since di/dt
rudimentary analysis of the drive circuit so that is a function of drain current, the mathematical solution is
t = Q/IG(AV) complex. The MOSFET output capacitance also
complicates the mathematics. And finally, MOSFETs have
During the rise and fall time interval when switching a finite internal gate resistance which effectively adds to the
resistive load, VGS remains virtually constant at a level resistance of the driving source, but the internal resistance
known as the plateau voltage, VSGP. Therefore, rise and fall is difficult to measure and, consequently, is not specified.
times may be approximated by the following: The resistive switching time variation versus gate
tr = Q2 x RG/(VGG – VGSP) resistance (Figure 9) shows how typical switching
tf = Q2 x RG/VGSP performance is affected by the parasitic circuit elements. If
where the parasitics were not present, the slope of the curves would
maintain a value of unity regardless of the switching speed.
VGG = the gate drive voltage, which varies from zero to VGG
The circuit used to obtain the data is constructed to minimize
RG = the gate drive resistance
common inductance in the drain and gate circuit loops and
and Q2 and VGSP are read from the gate charge curve.
is believed readily achievable with board mounted
During the turn–on and turn–off delay times, gate current is components. Most power electronic loads are inductive; the
not constant. The simplest calculation uses appropriate data in the figure is taken with a resistive load, which
values from the capacitance curves in a standard equation for approximates an optimally snubbed inductive load. Power
voltage change in an RC network. The equations are: MOSFETs may be safely operated into an inductive load;
td(on) = RG Ciss In [VGG/(VGG – VGSP)] however, snubbing reduces switching losses.
td(off) = RG Ciss In (VGG/VGSP)

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Figure 8. Gate–To–Source and Drain–To–Source Figure 9. Resistive Switching Time


Voltage versus Total Charge Variation versus Gate Resistance

DRAIN–TO–SOURCE DIODE CHARACTERISTICS

The switching characteristics of a MOSFET body diode high di/dts. The diode’s negative di/dt during ta is directly
are very important in systems using it as a freewheeling or controlled by the device clearing the stored charge.
commutating diode. Of particular interest are the reverse However, the positive di/dt during tb is an uncontrollable
recovery characteristics which play a major role in diode characteristic and is usually the culprit that induces
determining switching losses, radiated noise, EMI and RFI. current ringing. Therefore, when comparing diodes, the
System switching losses are largely due to the nature of ratio of tb/ta serves as a good indicator of recovery
the body diode itself. The body diode is a minority carrier abruptness and thus gives a comparative estimate of
device, therefore it has a finite reverse recovery time, trr, due probable noise generated. A ratio of 1 is considered ideal and
to the storage of minority carrier charge, QRR, as shown in values less than 0.5 are considered snappy.
the typical reverse recovery wave form of Figure 11. It is this Compared to ON Semiconductor standard cell density
stored charge that, when cleared from the diode, passes low voltage MOSFETs, high cell density MOSFET diodes
through a potential and defines an energy loss. Obviously, are faster (shorter trr), have less stored charge and a softer
repeatedly forcing the diode through reverse recovery reverse recovery characteristic. The softness advantage of
further increases switching losses. Therefore, one would the high cell density diode means they can be forced through
like a diode with short trr and low QRR specifications to reverse recovery at a higher di/dt than a standard cell
minimize these losses. MOSFET diode without increasing the current ringing or the
The abruptness of diode reverse recovery effects the noise generated. In addition, power dissipation incurred
amount of radiated noise, voltage spikes, and current from switching the diode will be less due to the shorter
ringing. The mechanisms at work are finite irremovable recovery time and lower switching losses.
circuit parasitic inductances and capacitances acted upon by
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Figure 10. Diode Forward Voltage versus Current

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Figure 11. Reverse Recovery Time (trr)

SAFE OPERATING AREA

The Forward Biased Safe Operating Area curves the total power averaged over a complete switching cycle
define the maximum simultaneous drain–to–source must not exceed (T J(MAX) – T C )/(RθJC ).
voltage and drain current that a transistor can handle A power MOSFET designated E–FET can be safely
safely when it is forward biased. Curves are based upon used in switching circuits with unclamped inductive
maximum peak junction temperature and a case loads. For reliable operation, the stored energy from
temperature (T C ) of 25°C. Peak repetitive pulsed power circuit inductance dissipated in the transistor while in
limits are determined by using the thermal response data avalanche must be less than the rated limit and must be
in conjunction with the procedures discussed in AN569, adjusted for operating conditions differing from those
“Transient Thermal Resistance – General Data and Its specified. Although industry practice is to rate in terms
Use.” of energy, avalanche energy capability is not a constant.
Switching between the off–state and the on–state may The energy rating decreases non–linearly with an
traverse any load line provided neither rated peak current increase of peak current in avalanche and peak junction
(I DM ) nor rated voltage (V DSS ) is exceeded, and that the temperature.
transition time (t r, tf ) does not exceed 10 µs. In addition


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Figure 12. Maximum Rated Forward Biased


Safe Operating Area

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TYPICAL ELECTRICAL CHARACTERISTICS


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668
MMSF10N02Z

INFORMATION FOR USING THE SO–8 SURFACE MOUNT PACKAGE

MINIMUM RECOMMENDED FOOTPRINT FOR SURFACE MOUNTED APPLICATIONS


Surface mount board layout is a critical portion of the total interface between the board and the package. With the
design. The footprint for the semiconductor packages must correct pad geometry, the packages will self–align when
be the correct size to ensure proper solder connection subjected to a solder reflow process.

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SO–8 POWER DISSIPATION


The power dissipation of the SO–8 is a function of the into the equation for an ambient temperature TA of 25°C,
input pad size. This can vary from the minimum pad size one can calculate the power dissipation of the device which
for soldering to the pad size given for maximum power in this case is 2.5 Watts.
dissipation. Power dissipation for a surface mount device is
PD = 150°C – 25°C = 2.5 Watts
determined by TJ(max), the maximum rated junction 50°C/W
temperature of the die, RθJA, the thermal resistance from
the device junction to ambient; and the operating The 50°C/W for the SO–8 package assumes the
temperature, TA. Using the values provided on the data recommended footprint on a glass epoxy printed circuit
sheet for the SO–8 package, PD can be calculated as board to achieve a power dissipation of 2.5 Watts using the
follows: footprint shown. Another alternative would be to use a
TJ(max) – TA
ceramic substrate or an aluminum core board such as
PD = Thermal Cladt. Using board material such as Thermal
RθJA
Clad, the power dissipation can be doubled using the same
The values for the equation are found in the maximum footprint.
ratings table on the data sheet. Substituting these values

SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • The soldering temperature and time shall not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within • When shifting from preheating to soldering, the
a short time could result in device failure. Therefore, the maximum temperature gradient shall be 5°C or less.
following items should always be observed in order to • After soldering has been completed, the device should
minimize the thermal stress to which the devices are be allowed to cool naturally for at least three minutes.
subjected. Gradual cooling should be used as the use of forced
• Always preheat the device. cooling will increase the temperature gradient and
• The delta temperature between the preheat and result in latent failure due to mechanical stress.
soldering should be 100°C or less.* • Mechanical stress or shock should not be applied
• When preheating and soldering, the temperature of the during cooling.
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When * Soldering a device without preheating can cause
using infrared heating with the reflow soldering excessive thermal shock and stress which can result in
method, the difference shall be a maximum of 10°C. damage to the device.

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MMSF10N02Z

TYPICAL SOLDER HEATING PROFILE


For any given circuit board, there will be a group of temperature versus time. The line on the graph shows the
control settings that will give the desired heat pattern. The actual temperature that might be experienced on the surface
operator must set temperatures for several heating zones of a test board at or near a central solder joint. The two
and a figure for belt speed. Taken together, these control profiles are based on a high density and a low density
settings make up a heating “profile” for that particular board. The Vitronics SMD310 convection/infrared reflow
circuit board. On machines controlled by a computer, the soldering system was used to generate this profile. The type
computer remembers these profiles from one operating of solder used was 62/36/2 Tin Lead Silver with a melting
session to the next. Figure 16 shows a typical heating point between 177–189°C. When this type of furnace is
profile for use when soldering a surface mount device to a used for solder reflow work, the circuit boards and solder
printed circuit board. This profile will vary among joints tend to heat first. The components on the board are
soldering systems, but it is a good starting point. Factors then heated by conduction. The circuit board, because it has
that can affect the profile include the type of soldering a large surface area, absorbs the thermal energy more
system in use, density and types of components on the efficiently, then distributes this energy to the components.
board, type of solder used, and the type of board or Because of this effect, the main body of a component may
substrate material being used. This profile shows be up to 30 degrees cooler than the adjacent solder joints.

STEP 1 STEP 2 STEP 3 STEP 4 STEP 5 STEP 6 STEP 7


PREHEAT VENT HEATING HEATING HEATING VENT COOLING
ZONE 1 “SOAK” ZONES 2 & 5 ZONES 3 & 6 ZONES 4 & 7
“RAMP” “RAMP” “SOAK” “SPIKE” 205° TO 219°C
PEAK AT
200°C DESIRED CURVE FOR HIGH 170°C SOLDER
MASS ASSEMBLIES JOINT
160°C
150°C

150°C
SOLDER IS LIQUID FOR
40 TO 80 SECONDS
100°C 140°C (DEPENDING ON
MASS OF ASSEMBLY)
100°C

DESIRED CURVE FOR LOW


MASS ASSEMBLIES
5°C

TIME (3 TO 7 MINUTES TOTAL) TMAX


Figure 15. Typical Solder Heating Profile

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  !  
N–Channel SO–8
EZFETst are an advanced series of Power MOSFETs contain http://onsemi.com
monolithic back–to–back zener diodes. These zener diodes provide
protection against ESD and unexpected transients. These miniature 10 AMPERES
surface mount MOSFETs feature ultra low RDS(on) and true logic level
performance. They are capable of withstanding high energy in the 30 VOLTS
avalanche and commutation modes and the drain–to–source diode has RDS(on) = 13 mW
a very low reverse recovery time. EZFET devices are designed for use
in low voltage, high speed switching applications where power N–Channel
efficiency is important. Typical applications are dc–dc converters, and

power management in portable and battery powered products such as
computers, printers, cellular and cordless phones. They can also be
used for low voltage motor controls in mass storage products such as
disk drives and tape drives. 
• Zener Protected Gates Provide Electrostatic Discharge Protection
• Designed to Withstand 200 V Machine Model and 2000 V Human
Body Model 
• Ultra Low RDS(on) Provides Higher Efficiency and Extends Battery
Life MARKING
• Logic Level Gate Drive – Can Be Driven by Logic ICs DIAGRAM
• Miniature SO–8 Surface Mount Package – Saves Board Space
• Diode Is Characterized for Use In Bridge Circuits SO–8
• Diode Exhibits High Speed, With Soft Recovery 8 CASE 751
10N03Z
LYWW
• IDSS Specified at Elevated Temperature STYLE 12

• Mounting Information for SO–8 Package Provided 1

L = Location Code
Y = Year
WW = Work Week

PIN ASSIGNMENT

Source 1 8 Drain
Source 2 7 Drain
Source 3 6 Drain
Gate 4 5 Drain
Top View

ORDERING INFORMATION

Device Package Shipping

MMSF10N03ZR2 SO–8 2500 Tape & Reel

This document contains information on a new product. Specifications and information Preferred devices are recommended choices for future use
herein are subject to change without notice. and best overall value.

 Semiconductor Components Industries, LLC, 2000 671 Publication Order Number:


November, 2000 – Rev. 1 MMSF10N03Z/D
MMSF10N03Z

MAXIMUM RATINGS (TJ = 25°C unless otherwise noted)


Parameter Symbol Max Unit
Drain–to–Source Voltage VDSS 30 Vdc
Drain–to–Gate Voltage (RGS = 1.0 MΩ) VDGR 30 Vdc
Gate–to–Source Voltage – Continuous VGS ± 20 Vdc
Drain Current – Continuous @ TA = 25°C (Note 1.) ID 10 Adc
Drain Current – Continuous @ TA = 70°C (Note 1.) ID 7.7
Drain Current – Pulsed Drain Current (Note 3.) IDM 50
Total Power Dissipation @ TA = 25°C (Note 1.) PD 2.5 Watts
Linear Derating Factor @ TA = 25°C (Note 1.) 20 mW/°C
Total Power Dissipation @ TA = 25°C (Note 2.) PD 1.6 Watts
Linear Derating Factor @ TA = 25°C (Note 2.) 12 mW/°C
Operating and Storage Temperature Range TJ, Tstg – 55 to °C
150
Single Pulse Drain–to–Source Avalanche Energy – Starting TJ = 25°C EAS mJ
(VDD = 30 Vdc, VGS = 10 Vdc, IL = 10 Apk, L = 20 mH, RG = 25 W) 1000

THERMAL RESISTANCE
Parameter Symbol Typ Max Unit
Junction–to–Ambient (Note 1.) RqJA – 50 °C/W
Junction–to–Ambient (Note 2.) – 80
1. When mounted on 1″ square FR4 or G–10 board (VGS = 10 V, @ 10 seconds).
2. When mounted on minimum recommended FR4 or G–10 board (VGS = 10 V, @ Steady State).
3. Repetitive rating; pulse width limited by maximum junction temperature.

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MMSF10N03Z

ELECTRICAL CHARACTERISTICS (TC = 25°C unless otherwise noted)


Characteristic Symbol Min Typ Max Unit
OFF CHARACTERISTICS
Drain–to–Source Breakdown Voltage (Cpk ≥ 2.0) (Notes 4. & 6.) V(BR)DSS Vdc
(VGS = 0 Vdc, ID = 0.25 mAdc) 30 – –
Temperature Coefficient (Positive) – 65 – mV/°C
Zero Gate Voltage Drain Current IDSS µAdc
(VDS = 30 Vdc, VGS = 0 Vdc) – – 1.0
(VDS = 30 Vdc, VGS = 0 Vdc, TJ = 125°C) – – 10
Gate–Body Leakage Current (VGS = ± 20 Vdc, VDS = 0 Vdc) IGSS – – 3.0 µAdc
ON CHARACTERISTICS(1)
Gate Threshold Voltage (Cpk ≥ 2.0) (Notes 4. & 6.) VGS(th) Vdc
(VDS = VGS, ID = 0.25 mAdc) 1.0 1.2 1.7
Threshold Temperature Coefficient (Negative) – 3.5 – mV/°C
Static Drain–to–Source On–Resistance (Cpk ≥ 2.0) (Notes 4. & 6.) RDS(on) mΩ
(VGS = 10 Vdc, ID = 10 Adc) – 10 13
(VGS = 4.5 Vdc, ID = 5.0 Adc) – 13 18
Forward Transconductance (VDS = 15 Vdc, ID = 5.0 Adc) (Note 4.) gFS 7.0 13 – Mhos
DYNAMIC CHARACTERISTICS
Input Capacitance Ciss – 720 1010 pF
Output Capacitance (VDS = 25 Vd
Vdc, VGS = 0 Vd
Vdc,
Coss – 570 800
f = 1.0 MHz)
Transfer Capacitance Crss – 78 110
SWITCHING CHARACTERISTICS (Note 5.)
Turn–On Delay Time td(on) – 35 70 ns
Rise Time (VDD = 25 Vdc, ID = 1.0 Adc, tr – 105 210
VGS = 10 Vdc
Vdc,
Turn–Off Delay Time RG = 6.0 Ω) (Note 4.) td(off) – 970 1940
Fall Time tf – 550 1100
Gate Charge QT – 46 64 nC
S Fi
See Figure 8
(VDS = 15 Vdc, ID = 2.0 Adc, Q1 – 3.8 –
VGS = 10 Vdc) (Note 4.) Q2 – 11 –
Q3 – 8.1 –

SOURCE–DRAIN DIODE CHARACTERISTICS


Forward On–Voltage (IS = 10 Adc, VGS = 0 Vdc) (Note 4.) VSD Vdc
– 0.80 1.1
(IS = 10 Adc, VGS = 0 Vdc,
– 0.70 –
TJ = 125°C)
Reverse Recovery Time trr – 460 – ns

(IS = 2.3 Adc, VGS = 0 Vdc, ta – 180 –


dIS/dt = 100 A/µs) (Note 4.) tb – 280 –
Reverse Recovery Stored Charge QRR – 4.2 – µC
4. Pulse Test: Pulse Width ≤ 300 µs, Duty Cycle ≤ 2%.
5. Switching characteristics are independent of operating junction temperatures.
6. Reflects typical values. Max limit – Typ
Cpk =
3 x SIGMA

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MMSF10N03Z

TYPICAL ELECTRICAL CHARACTERISTICS

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Figure 5. On–Resistance Variation with Figure 6. Drain–To–Source Leakage


Temperature Current versus Voltage

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POWER MOSFET SWITCHING

Switching behavior is most easily modeled and predicted The capacitance (Ciss) is read from the capacitance curve at
by recognizing that the power MOSFET is charge a voltage corresponding to the off–state condition when
controlled. The lengths of various switching intervals (∆t) calculating td(on) and is read at a voltage corresponding to the
are determined by how fast the FET input capacitance can on–state when calculating td(off).
be charged by current from the generator. At high switching speeds, parasitic circuit elements
The published capacitance data is difficult to use for complicate the analysis. The inductance of the MOSFET
calculating rise and fall because drain–gate capacitance source lead, inside the package and in the circuit wiring
varies greatly with applied voltage. Accordingly, gate which is common to both the drain and gate current paths,
charge data is used. In most cases, a satisfactory estimate of produces a voltage at the source which reduces the gate drive
average input current (IG(AV)) can be made from a current. The voltage is determined by Ldi/dt, but since di/dt
rudimentary analysis of the drive circuit so that is a function of drain current, the mathematical solution is
t = Q/IG(AV) complex. The MOSFET output capacitance also
complicates the mathematics. And finally, MOSFETs have
During the rise and fall time interval when switching a finite internal gate resistance which effectively adds to the
resistive load, VGS remains virtually constant at a level resistance of the driving source, but the internal resistance
known as the plateau voltage, VSGP. Therefore, rise and fall is difficult to measure and, consequently, is not specified.
times may be approximated by the following: The resistive switching time variation versus gate
tr = Q2 x RG/(VGG – VGSP) resistance (Figure 9) shows how typical switching
tf = Q2 x RG/VGSP performance is affected by the parasitic circuit elements. If
where the parasitics were not present, the slope of the curves would
maintain a value of unity regardless of the switching speed.
VGG = the gate drive voltage, which varies from zero to VGG
The circuit used to obtain the data is constructed to minimize
RG = the gate drive resistance
common inductance in the drain and gate circuit loops and
and Q2 and VGSP are read from the gate charge curve.
is believed readily achievable with board mounted
During the turn–on and turn–off delay times, gate current is components. Most power electronic loads are inductive; the
not constant. The simplest calculation uses appropriate data in the figure is taken with a resistive load, which
values from the capacitance curves in a standard equation for approximates an optimally snubbed inductive load. Power
voltage change in an RC network. The equations are: MOSFETs may be safely operated into an inductive load;
td(on) = RG Ciss In [VGG/(VGG – VGSP)] however, snubbing reduces switching losses.
td(off) = RG Ciss In (VGG/VGSP)

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Figure 8. Gate–To–Source and Drain–To–Source Figure 9. Resistive Switching Time


Voltage versus Total Charge Variation versus Gate Resistance

DRAIN–TO–SOURCE DIODE CHARACTERISTICS

The switching characteristics of a MOSFET body diode high di/dts. The diode’s negative di/dt during ta is directly
are very important in systems using it as a freewheeling or controlled by the device clearing the stored charge.
commutating diode. Of particular interest are the reverse However, the positive di/dt during tb is an uncontrollable
recovery characteristics which play a major role in diode characteristic and is usually the culprit that induces
determining switching losses, radiated noise, EMI and RFI. current ringing. Therefore, when comparing diodes, the
System switching losses are largely due to the nature of ratio of tb/ta serves as a good indicator of recovery
the body diode itself. The body diode is a minority carrier abruptness and thus gives a comparative estimate of
device, therefore it has a finite reverse recovery time, trr, due probable noise generated. A ratio of 1 is considered ideal and
to the storage of minority carrier charge, QRR, as shown in values less than 0.5 are considered snappy.
the typical reverse recovery wave form of Figure 15. It is this Compared to ON Semiconductor standard cell density
stored charge that, when cleared from the diode, passes low voltage MOSFETs, high cell density MOSFET diodes
through a potential and defines an energy loss. Obviously, are faster (shorter trr), have less stored charge and a softer
repeatedly forcing the diode through reverse recovery reverse recovery characteristic. The softness advantage of
further increases switching losses. Therefore, one would the high cell density diode means they can be forced through
like a diode with short trr and low QRR specifications to reverse recovery at a higher di/dt than a standard cell
minimize these losses. MOSFET diode without increasing the current ringing or the
The abruptness of diode reverse recovery effects the noise generated. In addition, power dissipation incurred
amount of radiated noise, voltage spikes, and current from switching the diode will be less due to the shorter
ringing. The mechanisms at work are finite irremovable recovery time and lower switching losses.
circuit parasitic inductances and capacitances acted upon by

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Figure 11. Reverse Recovery Time (trr)

SAFE OPERATING AREA

The Forward Biased Safe Operating Area curves define total power averaged over a complete switching cycle must
the maximum simultaneous drain–to–source voltage and not exceed (TJ(MAX) – TC)/(RθJC).
drain current that a transistor can handle safely when it is A power MOSFET designated E–FET can be safely used
forward biased. Curves are based upon maximum peak in switching circuits with unclamped inductive loads. For
junction temperature and a case temperature (TC) of 25°C. reliable operation, the stored energy from circuit inductance
Peak repetitive pulsed power limits are determined by using dissipated in the transistor while in avalanche must be less
the thermal response data in conjunction with the procedures than the rated limit and must be adjusted for operating
discussed in AN569, “Transient Thermal Resistance – conditions differing from those specified. Although industry
General Data and Its Use.” practice is to rate in terms of energy, avalanche energy
Switching between the off–state and the on–state may capability is not a constant. The energy rating decreases
traverse any load line provided neither rated peak current non–linearly with an increase of peak current in avalanche
(IDM) nor rated voltage (VDSS) is exceeded, and that the and peak junction temperature.
transition time (tr, tf) does not exceed 10 µs. In addition the

 
   



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Safe Operating Area Starting Junction Temperature

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TYPICAL ELECTRICAL CHARACTERISTICS


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INFORMATION FOR USING THE SO–8 SURFACE MOUNT PACKAGE

MINIMUM RECOMMENDED FOOTPRINT FOR SURFACE MOUNTED APPLICATIONS


Surface mount board layout is a critical portion of the total interface between the board and the package. With the
design. The footprint for the semiconductor packages must correct pad geometry, the packages will self–align when
be the correct size to ensure proper solder connection subjected to a solder reflow process.

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SO–8 POWER DISSIPATION


The power dissipation of the SO–8 is a function of the into the equation for an ambient temperature TA of 25°C,
input pad size. This can vary from the minimum pad size one can calculate the power dissipation of the device which
for soldering to the pad size given for maximum power in this case is 1.6 Watts.
dissipation. Power dissipation for a surface mount device is 150°C – 25°C
determined by TJ(max), the maximum rated junction PD = = 1.6 Watts
80°C/W
temperature of the die, RθJA, the thermal resistance from
the device junction to ambient; and the operating The 80°C/W for the SO–8 package assumes the
temperature, TA. Using the values provided on the data recommended footprint on a glass epoxy printed circuit
sheet for the SO–8 package, PD can be calculated as board to achieve a power dissipation of 1.6 Watts using the
follows: footprint shown. Another alternative would be to use a
TJ(max) – TA
ceramic substrate or an aluminum core board such as
PD = Thermal Cladt. Using board material such as Thermal
RθJA
Clad, the power dissipation can be doubled using the same
The values for the equation are found in the maximum footprint.
ratings table on the data sheet. Substituting these values

SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • The soldering temperature and time shall not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within • When shifting from preheating to soldering, the
a short time could result in device failure. Therefore, the maximum temperature gradient shall be 5°C or less.
following items should always be observed in order to • After soldering has been completed, the device should
minimize the thermal stress to which the devices are be allowed to cool naturally for at least three minutes.
subjected. Gradual cooling should be used as the use of forced
• Always preheat the device. cooling will increase the temperature gradient and
• The delta temperature between the preheat and result in latent failure due to mechanical stress.
soldering should be 100°C or less.* • Mechanical stress or shock should not be applied
• When preheating and soldering, the temperature of the during cooling.
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When * Soldering a device without preheating can cause
using infrared heating with the reflow soldering excessive thermal shock and stress which can result in
method, the difference shall be a maximum of 10°C. damage to the device.

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MMSF10N03Z

TYPICAL SOLDER HEATING PROFILE


For any given circuit board, there will be a group of temperature versus time. The line on the graph shows the
control settings that will give the desired heat pattern. The actual temperature that might be experienced on the surface
operator must set temperatures for several heating zones of a test board at or near a central solder joint. The two
and a figure for belt speed. Taken together, these control profiles are based on a high density and a low density
settings make up a heating “profile” for that particular board. The Vitronics SMD310 convection/infrared reflow
circuit board. On machines controlled by a computer, the soldering system was used to generate this profile. The type
computer remembers these profiles from one operating of solder used was 62/36/2 Tin Lead Silver with a melting
session to the next. Figure 16 shows a typical heating point between 177–189°C. When this type of furnace is
profile for use when soldering a surface mount device to a used for solder reflow work, the circuit boards and solder
printed circuit board. This profile will vary among joints tend to heat first. The components on the board are
soldering systems, but it is a good starting point. Factors then heated by conduction. The circuit board, because it has
that can affect the profile include the type of soldering a large surface area, absorbs the thermal energy more
system in use, density and types of components on the efficiently, then distributes this energy to the components.
board, type of solder used, and the type of board or Because of this effect, the main body of a component may
substrate material being used. This profile shows be up to 30 degrees cooler than the adjacent solder joints.

STEP 1 STEP 2 STEP 3 STEP 4 STEP 5 STEP 6 STEP 7


PREHEAT VENT HEATING HEATING HEATING VENT COOLING
ZONE 1 “SOAK” ZONES 2 & 5 ZONES 3 & 6 ZONES 4 & 7
“RAMP” “RAMP” “SOAK” “SPIKE” 205° TO 219°C
PEAK AT
200°C DESIRED CURVE FOR HIGH 170°C SOLDER
MASS ASSEMBLIES JOINT
160°C
150°C

150°C
SOLDER IS LIQUID FOR
40 TO 80 SECONDS
100°C 140°C (DEPENDING ON
MASS OF ASSEMBLY)
100°C

DESIRED CURVE FOR LOW


MASS ASSEMBLIES
5°C

TIME (3 TO 7 MINUTES TOTAL) TMAX


Figure 16. Typical Solder Heating Profile

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Preferred Device

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N–Channel SO–8
These miniature surface mount MOSFETs feature ultra low RDS(on)
and true logic level performance. They are capable of withstanding high http://onsemi.com
energy in the avalanche and commutation modes and the drain–to–source
diode has a very low reverse recovery time. MiniMOSt devices are
designed for use in low voltage, high speed switching applications where
7 AMPERES
power efficiency is important. Typical applications are dc–dc converters, 30 VOLTS
and power management in portable and battery powered products such as RDS(on) = 30 mW
computers, printers, cellular and cordless phones. They can also be used
for low voltage motor controls in mass storage products such as disk
drives and tape drives. The avalanche energy is specified to eliminate the N–Channel
guesswork in designs where inductive loads are switched and offer 
additional safety margin against unexpected voltage transients.
• Low RDS(on) Provides Higher Efficiency and Extends Battery Life
• High Speed Switching Provides High Efficiency for DC/DC 
Converter
• Miniature SO–8 Surface Mount Package – Saves Board Space 
• Diode Exhibits High Speed, With Soft Recovery
MARKING
MAXIMUM RATINGS (TJ = 25°C unless otherwise noted)
DIAGRAM
Parameter Symbol Max Unit
Drain–to–Source Voltage VDSS 30 Vdc
Drain–to–Gate Voltage (RGS = 1.0 MΩ) VDGR 30 Vdc SO–8
S1308
Gate–to–Source Voltage – Continuous VGS ± 20 Vdc 8 CASE 751
LYWW
STYLE 12
Continuous Drain Current @ TA = 25°C ID 7.0 Adc
(Note 1.) 1
Pulsed Drain Current (Note 2.) IDM 50
Total Power Dissipation @ TA = 25°C PD 2.5 W L = Location Code
(Note 1.) Y = Year
WW = Work Week
Operating and Storage Temperature Range TJ, Tstg – 55 to °C
150
PIN ASSIGNMENT
THERMAL RESISTANCE
Source 1 8 Drain
Junction–to–Ambient (Note 1.) RθJA 50 °C/W
Source 2 7 Drain
1. When mounted on 1″ square FR–4 or G–10 board
(VGS = 10 V, @ 10 Seconds) Source 3 6 Drain
2. Repetitive rating; pulse width limited by maximum junction temperature. Gate 4 5 Drain
Top View

ORDERING INFORMATION

Device Package Shipping

MMSF1308R2 SO–8 2500 Tape & Reel

Preferred devices are recommended choices for future use


and best overall value.

 Semiconductor Components Industries, LLC, 2000 681 Publication Order Number:


November, 2000 – Rev. 1 MMSF1308/D
MMSF1308

ELECTRICAL CHARACTERISTICS (TC = 25°C unless otherwise noted)


Characteristic Symbol Min Typ Max Unit
OFF CHARACTERISTICS
Drain–to–Source Breakdown Voltage V(BR)DSS Vdc
(VGS = 0 Vdc, ID = 0.25 mAdc) 30 – –
Temperature Coefficient (Positive) – 30 – mV/°C
Zero Gate Voltage Drain Current IDSS µAdc
(VDS = 30 Vdc, VGS = 0 Vdc) – – 1.0
(VDS = 30 Vdc, VGS = 0 Vdc, TJ = 125°C) – – 10
Gate–Body Leakage Current (VGS = ± 20 Vdc, VDS = 0 Vdc) IGSS – – 100 nAdc
ON CHARACTERISTICS (Note 3.)
Gate Threshold Voltage VGS(th) Vdc
(VDS = VGS, ID = 0.25 mAdc) 1.0 1.6 2.5
Threshold Temperature Coefficient (Negative) – 4.3 – mV/°C
Static Drain–to–Source On–Resistance RDS(on) mΩ
(VGS = 10 Vdc, ID = 7.0 Adc) – 22 30
(VGS = 4.5 Vdc, ID = 3.5 Adc) – 30 39
Forward Transconductance (VDS = 5.0 Vdc, ID = 1.0 Adc) (Note 3.) gFS – 4.5 – Mhos
DYNAMIC CHARACTERISTICS
Input Capacitance Ciss – 690 970 pF
Output Capacitance (VDS = 24 Vd
Vdc, VGS = 0 V
V,
Coss – 290 410
f = 1.0 MHz)
Transfer Capacitance Crss – 90 130
SWITCHING CHARACTERISTICS (Note 4.)
Turn–On Delay Time td(on) – 7.5 15 ns
Rise Time (VDD = 21 Vdc, ID = 7.0 Adc, tr – 24 48
VGS = 10 Vdc
Vdc,
Turn–Off Delay Time RG = 6.0 Ω) (Note 3.) td(off) – 30 60
Fall Time tf – 46 92
Gate Charge QT – 20 30 nC

(VDS = 15 Vdc, ID = 7.0 Adc, Q1 – 2.5 –


VGS = 10 Vdc) (Note 3.) Q2 – 6.0 –
Q3 – 8.0 –

SOURCE–DRAIN DIODE CHARACTERISTICS


Forward On–Voltage (IS = 7.0 Adc, VGS = 0 Vdc) (Note 3.) VSD Vdc
(IS = 7.0 Adc, VGS = 0 Vdc, – 0.85 1.0
TJ = 125°C) – 0.71 –
Reverse Recovery Time trr – 35 – ns

(IS = 7.0 Adc, VGS = 0 Vdc, ta – 20 –


dIS/dt = 100 A/µs) (Note 3.) tb – 15 –
Reverse Recovery Stored Charge QRR – 0.03 – µC
3. Pulse Test: Pulse Width ≤ 300 µs, Duty Cycle ≤ 2%.
4. Switching characteristics are independent of operating junction temperatures.
5. Reflects typical values. Max limit – Typ
Cpk =
3 x SIGMA
6. Repetitive rating; pulse width limited by maximum junction temperature.

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682
MMSF1308

TYPICAL ELECTRICAL CHARACTERISTICS

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Figure 3. On–Resistance versus Figure 4. On–Resistance versus Drain Current


Drain Current and Gate Voltage

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Figure 5. On–Resistance Variation with Figure 6. Drain–To–Source Leakage


Temperature Current versus Voltage

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683
MMSF1308

POWER MOSFET SWITCHING

Switching behavior is most easily modeled and predicted The capacitance (Ciss) is read from the capacitance curve at
by recognizing that the power MOSFET is charge a voltage corresponding to the off–state condition when
controlled. The lengths of various switching intervals (∆t) calculating td(on) and is read at a voltage corresponding to the
are determined by how fast the FET input capacitance can on–state when calculating td(off).
be charged by current from the generator. At high switching speeds, parasitic circuit elements
The published capacitance data is difficult to use for complicate the analysis. The inductance of the MOSFET
calculating rise and fall because drain–gate capacitance source lead, inside the package and in the circuit wiring
varies greatly with applied voltage. Accordingly, gate which is common to both the drain and gate current paths,
charge data is used. In most cases, a satisfactory estimate of produces a voltage at the source which reduces the gate drive
average input current (IG(AV)) can be made from a current. The voltage is determined by Ldi/dt, but since di/dt
rudimentary analysis of the drive circuit so that is a function of drain current, the mathematical solution is
t = Q/IG(AV) complex. The MOSFET output capacitance also
complicates the mathematics. And finally, MOSFETs have
During the rise and fall time interval when switching a finite internal gate resistance which effectively adds to the
resistive load, VGS remains virtually constant at a level resistance of the driving source, but the internal resistance
known as the plateau voltage, VSGP. Therefore, rise and fall is difficult to measure and, consequently, is not specified.
times may be approximated by the following: The resistive switching time variation versus gate
tr = Q2 x RG/(VGG – VGSP) resistance (Figure 8) shows how typical switching
tf = Q2 x RG/VGSP performance is affected by the parasitic circuit elements. If
where the parasitics were not present, the slope of the curves would
maintain a value of unity regardless of the switching speed.
VGG = the gate drive voltage, which varies from zero to VGG
The circuit used to obtain the data is constructed to minimize
RG = the gate drive resistance
common inductance in the drain and gate circuit loops and
and Q2 and VGSP are read from the gate charge curve.
is believed readily achievable with board mounted
During the turn–on and turn–off delay times, gate current is components. Most power electronic loads are inductive; the
not constant. The simplest calculation uses appropriate data in the figure is taken with a resistive load, which
values from the capacitance curves in a standard equation for approximates an optimally snubbed inductive load. Power
voltage change in an RC network. The equations are: MOSFETs may be safely operated into an inductive load;
td(on) = RG Ciss In [VGG/(VGG – VGSP)] however, snubbing reduces switching losses.
td(off) = RG Ciss In (VGG/VGSP)

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Figure 8. Resistive Switching Time Variation


versus Gate Resistance

DRAIN–TO–SOURCE DIODE CHARACTERISTICS

The switching characteristics of a MOSFET body diode high di/dts. The diode’s negative di/dt during ta is directly
are very important in systems using it as a freewheeling or controlled by the device clearing the stored charge.
commutating diode. Of particular interest are the reverse However, the positive di/dt during tb is an uncontrollable
recovery characteristics which play a major role in diode characteristic and is usually the culprit that induces
determining switching losses, radiated noise, EMI and RFI. current ringing. Therefore, when comparing diodes, the
System switching losses are largely due to the nature of ratio of tb/ta serves as a good indicator of recovery
the body diode itself. The body diode is a minority carrier abruptness and thus gives a comparative estimate of
device, therefore it has a finite reverse recovery time, trr, due probable noise generated. A ratio of 1 is considered ideal and
to the storage of minority carrier charge, QRR, as shown in values less than 0.5 are considered snappy.
the typical reverse recovery wave form of Figure 10. It is this Compared to ON Semiconductor standard cell density
stored charge that, when cleared from the diode, passes low voltage MOSFETs, high cell density MOSFET diodes
through a potential and defines an energy loss. Obviously, are faster (shorter trr), have less stored charge and a softer
repeatedly forcing the diode through reverse recovery reverse recovery characteristic. The softness advantage of
further increases switching losses. Therefore, one would the high cell density diode means they can be forced through
like a diode with short trr and low QRR specifications to reverse recovery at a higher di/dt than a standard cell
minimize these losses. MOSFET diode without increasing the current ringing or the
The abruptness of diode reverse recovery effects the noise generated. In addition, power dissipation incurred
amount of radiated noise, voltage spikes, and current from switching the diode will be less due to the shorter
ringing. The mechanisms at work are finite irremovable recovery time and lower switching losses.
circuit parasitic inductances and capacitances acted upon by


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Figure 9. Diode Forward Voltage versus Current

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Figure 10. Reverse Recovery Time (trr)

SAFE OPERATING AREA

The Forward Biased Safe Operating Area curves define total power averaged over a complete switching cycle must
the maximum simultaneous drain–to–source voltage and not exceed (TJ(MAX) – TC)/(RθJC).
drain current that a transistor can handle safely when it is A power MOSFET designated E–FET can be safely used
forward biased. Curves are based upon maximum peak in switching circuits with unclamped inductive loads. For
junction temperature and a case temperature (TC) of 25°C. reliable operation, the stored energy from circuit inductance
Peak repetitive pulsed power limits are determined by using dissipated in the transistor while in avalanche must be less
the thermal response data in conjunction with the procedures than the rated limit and must be adjusted for operating
discussed in AN569, “Transient Thermal Resistance – conditions differing from those specified. Although industry
General Data and Its Use.” practice is to rate in terms of energy, avalanche energy
Switching between the off–state and the on–state may capability is not a constant. The energy rating decreases
traverse any load line provided neither rated peak current non–linearly with an increase of peak current in avalanche
(IDM) nor rated voltage (VDSS) is exceeded, and that the and peak junction temperature.
transition time (tr, tf) does not exceed 10 µs. In addition the


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Figure 11. Maximum Rated Forward Biased


Safe Operating Area

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686
MMSF1308

INFORMATION FOR USING THE SO–8 SURFACE MOUNT PACKAGE

MINIMUM RECOMMENDED FOOTPRINT FOR SURFACE MOUNTED APPLICATIONS


Surface mount board layout is a critical portion of the total interface between the board and the package. With the
design. The footprint for the semiconductor packages must correct pad geometry, the packages will self–align when
be the correct size to ensure proper solder connection subjected to a solder reflow process.
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SO–8 POWER DISSIPATION


The power dissipation of the SO–8 is a function of the into the equation for an ambient temperature TA of 25°C,
input pad size. This can vary from the minimum pad size one can calculate the power dissipation of the device which
for soldering to the pad size given for maximum power in this case is 2.5 Watts.
dissipation. Power dissipation for a surface mount device is 150°C – 25°C
determined by TJ(max), the maximum rated junction PD = = 2.5 Watts
50°C/W
temperature of the die, RθJA, the thermal resistance from
the device junction to ambient; and the operating The 50°C/W for the SO–8 package assumes the
temperature, TA. Using the values provided on the data recommended footprint on a glass epoxy printed circuit
sheet for the SO–8 package, PD can be calculated as board to achieve a power dissipation of 2.5 Watts using the
follows: footprint shown. Another alternative would be to use a
TJ(max) – TA
ceramic substrate or an aluminum core board such as
PD = Thermal Cladt. Using board material such as Thermal
RθJA
Clad, the power dissipation can be doubled using the same
The values for the equation are found in the maximum footprint.
ratings table on the data sheet. Substituting these values

SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • The soldering temperature and time shall not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within • When shifting from preheating to soldering, the
a short time could result in device failure. Therefore, the maximum temperature gradient shall be 5°C or less.
following items should always be observed in order to • After soldering has been completed, the device should
minimize the thermal stress to which the devices are be allowed to cool naturally for at least three minutes.
subjected. Gradual cooling should be used as the use of forced
• Always preheat the device. cooling will increase the temperature gradient and
• The delta temperature between the preheat and result in latent failure due to mechanical stress.
soldering should be 100°C or less.* • Mechanical stress or shock should not be applied
• When preheating and soldering, the temperature of the during cooling.
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When * Soldering a device without preheating can cause
using infrared heating with the reflow soldering excessive thermal shock and stress which can result in
method, the difference shall be a maximum of 10°C. damage to the device.

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687
MMSF1308

TYPICAL SOLDER HEATING PROFILE


For any given circuit board, there will be a group of temperature versus time. The line on the graph shows the
control settings that will give the desired heat pattern. The actual temperature that might be experienced on the surface
operator must set temperatures for several heating zones of a test board at or near a central solder joint. The two
and a figure for belt speed. Taken together, these control profiles are based on a high density and a low density
settings make up a heating “profile” for that particular board. The Vitronics SMD310 convection/infrared reflow
circuit board. On machines controlled by a computer, the soldering system was used to generate this profile. The type
computer remembers these profiles from one operating of solder used was 62/36/2 Tin Lead Silver with a melting
session to the next. Figure 12 shows a typical heating point between 177–189°C. When this type of furnace is
profile for use when soldering a surface mount device to a used for solder reflow work, the circuit boards and solder
printed circuit board. This profile will vary among joints tend to heat first. The components on the board are
soldering systems, but it is a good starting point. Factors then heated by conduction. The circuit board, because it has
that can affect the profile include the type of soldering a large surface area, absorbs the thermal energy more
system in use, density and types of components on the efficiently, then distributes this energy to the components.
board, type of solder used, and the type of board or Because of this effect, the main body of a component may
substrate material being used. This profile shows be up to 30 degrees cooler than the adjacent solder joints.

STEP 1 STEP 2 STEP 3 STEP 4 STEP 5 STEP 6 STEP 7


PREHEAT VENT HEATING HEATING HEATING VENT COOLING
ZONE 1 “SOAK” ZONES 2 & 5 ZONES 3 & 6 ZONES 4 & 7
“RAMP” “RAMP” “SOAK” “SPIKE” 205° TO 219°C
PEAK AT
200°C DESIRED CURVE FOR HIGH 170°C SOLDER
MASS ASSEMBLIES JOINT
160°C
150°C

150°C
SOLDER IS LIQUID FOR
40 TO 80 SECONDS
100°C 140°C (DEPENDING ON
MASS OF ASSEMBLY)
100°C

DESIRED CURVE FOR LOW


MASS ASSEMBLIES
5°C

TIME (3 TO 7 MINUTES TOTAL) TMAX


Figure 12. Typical Solder Heating Profile

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688
(!
Preferred Device

#$%& '(
  !  
N–Channel SO–8
These miniature surface mount MOSFETs feature ultra low RDS(on)
and true logic level performance. They are capable of withstanding high http://onsemi.com
energy in the avalanche and commutation modes and the drain–to–source
diode has a very low reverse recovery time. MiniMOSt devices are
designed for use in low voltage, high speed switching applications where
10 AMPERES
power efficiency is important. Typical applications are dc–dc converters, 30 VOLTS
and power management in portable and battery powered products such as RDS(on) = 15 mW
computers, printers, cellular and cordless phones. They can also be used
for low voltage motor controls in mass storage products such as disk
drives and tape drives. The avalanche energy is specified to eliminate the N–Channel
guesswork in designs where inductive loads are switched and offer 
additional safety margin against unexpected voltage transients.
• Low RDS(on) Provides Higher Efficiency and Extends Battery Life
• High Speed Switching Provides High Efficiency for DC/DC 
Converter
• Miniature SO–8 Surface Mount Package – Saves Board Space 
• Diode Exhibits High Speed, With Soft Recovery
MARKING
MAXIMUM RATINGS (TJ = 25°C unless otherwise noted)
DIAGRAM
Parameter Symbol Max Unit
Drain–to–Source Voltage VDSS 30 Vdc
Drain–to–Gate Voltage (RGS = 1.0 MΩ) VDGR 30 Vdc SO–8
S1310
Gate–to–Source Voltage – Continuous VGS ± 20 Vdc 8 CASE 751
LYWW
STYLE 12
Continuous Drain Current @ TA = 25°C ID 10 Adc
(Note 1.) 1
Pulsed Drain Current (Note 2.) IDM 50
Total Power Dissipation @ TA = 25°C PD 2.5 W L = Location Code
(Note 1.) Y = Year
WW = Work Week
Operating and Storage Temperature Range TJ, Tstg – 55 to °C
150
PIN ASSIGNMENT
THERMAL RESISTANCE
Source 1 8 Drain
Junction–to–Ambient (Note 1.) RθJA 50 °C/W
1. When mounted on 1″ square FR–4 or G–10 board Source 2 7 Drain
(VGS = 10 V, @ 10 Seconds) Source 3 6 Drain
2. Repetitive rating; pulse width limited by maximum junction temperature. Gate 4 5 Drain
Top View

ORDERING INFORMATION

Device Package Shipping

MMSF1310R2 SO–8 2500 Tape & Reel

Preferred devices are recommended choices for future use


and best overall value.

 Semiconductor Components Industries, LLC, 2000 689 Publication Order Number:


November, 2000 – Rev. 1 MMSF1310/D
MMSF1310

ELECTRICAL CHARACTERISTICS (TC = 25°C unless otherwise noted)


Characteristic Symbol Min Typ Max Unit
OFF CHARACTERISTICS
Drain–to–Source Breakdown Voltage V(BR)DSS Vdc
(VGS = 0 Vdc, ID = 0.25 mAdc) 30 – –
Temperature Coefficient (Positive) – 27 – mV/°C
Zero Gate Voltage Drain Current IDSS µAdc
(VDS = 30 Vdc, VGS = 0 Vdc) – – 1.0
(VDS = 30 Vdc, VGS = 0 Vdc, TJ = 125°C) – – 10
Gate–Body Leakage Current (VGS = ± 20 Vdc, VDS = 0 Vdc) IGSS – – 100 nAdc
ON CHARACTERISTICS (Note 3.)
Gate Threshold Voltage VGS(th) Vdc
(VDS = VGS, ID = 0.25 mAdc) 1.0 1.3 2.5
Threshold Temperature Coefficient (Negative) – 4.4 – mV/°C
Static Drain–to–Source On–Resistance RDS(on) mΩ
(VGS = 10 Vdc, ID = 10 Adc) – 9.5 15
(VGS = 4.5 Vdc, ID = 5.0 Adc) – 12.5 19
Forward Transconductance (VDS = 5.0 Vdc, ID = 1.0 Adc) (Note 3.) gFS – 5.0 – Mhos
DYNAMIC CHARACTERISTICS
Input Capacitance Ciss – 1440 2020 pF
Output Capacitance (VDS = 24 Vd
Vdc, VGS = 0 V
V,
Coss – 680 960
f = 1.0 MHz)
Transfer Capacitance Crss – 195 280
SWITCHING CHARACTERISTICS (Note 4.)
Turn–On Delay Time td(on) – 10 20 ns
Rise Time (VDD = 24 Vdc, ID = 10 Adc, tr – 36 72
VGS = 10 Vdc
Vdc,
Turn–Off Delay Time RG = 6.0 Ω) (Note 3.) td(off) – 82 164
Fall Time tf – 95 190
Gate Charge QT – 48 68 nC

(VDS = 15 Vdc, ID = 10 Adc, Q1 – 3.0 –


VGS = 10 Vdc) (Note 3.) Q2 – 4.0 –
Q3 – 7.0 –

SOURCE–DRAIN DIODE CHARACTERISTICS


Forward On–Voltage (IS = 10 Adc, VGS = 0 Vdc) (Note 3.) VSD Vdc
(IS = 10 Adc, VGS = 0 Vdc, – 0.82 1.0
TJ = 125°C) – 0.67 –
Reverse Recovery Time trr – 52 – ns

(IS = 10 Adc, VGS = 0 Vdc, ta – 23 –


dIS/dt = 100 A/µs) (Note 3.) tb – 30 –
Reverse Recovery Stored Charge QRR – 0.05 – µC
3. Pulse Test: Pulse Width ≤ 300 µs, Duty Cycle ≤ 2%.
4. Switching characteristics are independent of operating junction temperatures.
5. Reflects typical values. Max limit – Typ
Cpk =
3 x SIGMA
6. Repetitive rating; pulse width limited by maximum junction temperature.

http://onsemi.com
690
MMSF1310

TYPICAL ELECTRICAL CHARACTERISTICS

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Figure 3. On–Resistance versus Figure 4. On–Resistance versus Drain Current


Drain Current and Gate Voltage

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Figure 5. On–Resistance Variation with Figure 6. Drain–To–Source Leakage


Temperature Current versus Voltage

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MMSF1310

POWER MOSFET SWITCHING

Switching behavior is most easily modeled and predicted The capacitance (Ciss) is read from the capacitance curve at
by recognizing that the power MOSFET is charge a voltage corresponding to the off–state condition when
controlled. The lengths of various switching intervals (∆t) calculating td(on) and is read at a voltage corresponding to the
are determined by how fast the FET input capacitance can on–state when calculating td(off).
be charged by current from the generator. At high switching speeds, parasitic circuit elements
The published capacitance data is difficult to use for complicate the analysis. The inductance of the MOSFET
calculating rise and fall because drain–gate capacitance source lead, inside the package and in the circuit wiring
varies greatly with applied voltage. Accordingly, gate which is common to both the drain and gate current paths,
charge data is used. In most cases, a satisfactory estimate of produces a voltage at the source which reduces the gate drive
average input current (IG(AV)) can be made from a current. The voltage is determined by Ldi/dt, but since di/dt
rudimentary analysis of the drive circuit so that is a function of drain current, the mathematical solution is
t = Q/IG(AV) complex. The MOSFET output capacitance also
complicates the mathematics. And finally, MOSFETs have
During the rise and fall time interval when switching a finite internal gate resistance which effectively adds to the
resistive load, VGS remains virtually constant at a level resistance of the driving source, but the internal resistance
known as the plateau voltage, VSGP. Therefore, rise and fall is difficult to measure and, consequently, is not specified.
times may be approximated by the following: The resistive switching time variation versus gate resistance
tr = Q2 x RG/(VGG – VGSP) (Figure 8) shows how typical switching performance is
tf = Q2 x RG/VGSP affected by the parasitic circuit elements. If the parasitics
where were not present, the slope of the curves would maintain a
value of unity regardless of the switching speed. The circuit
VGG = the gate drive voltage, which varies from zero to VGG
used to obtain the data is constructed to minimize common
RG = the gate drive resistance
inductance in the drain and gate circuit loops and is believed
and Q2 and VGSP are read from the gate charge curve.
readily achievable with board mounted components. Most
During the turn–on and turn–off delay times, gate current is power electronic loads are inductive; the data in the figure
not constant. The simplest calculation uses appropriate is taken with a resistive load, which approximates an
values from the capacitance curves in a standard equation for optimally snubbed inductive load. Power MOSFETs may be
voltage change in an RC network. The equations are: safely operated into an inductive load; however, snubbing
td(on) = RG Ciss In [VGG/(VGG – VGSP)] reduces switching losses.
td(off) = RG Ciss In (VGG/VGSP)

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Figure 7. Capacitance Variation

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Figure 8. Resistive Switching Time Variation


versus Gate Resistance

DRAIN–TO–SOURCE DIODE CHARACTERISTICS

The switching characteristics of a MOSFET body diode high di/dts. The diode’s negative di/dt during ta is directly
are very important in systems using it as a freewheeling or controlled by the device clearing the stored charge.
commutating diode. Of particular interest are the reverse However, the positive di/dt during tb is an uncontrollable
recovery characteristics which play a major role in diode characteristic and is usually the culprit that induces
determining switching losses, radiated noise, EMI and RFI. current ringing. Therefore, when comparing diodes, the
System switching losses are largely due to the nature of ratio of tb/ta serves as a good indicator of recovery
the body diode itself. The body diode is a minority carrier abruptness and thus gives a comparative estimate of
device, therefore it has a finite reverse recovery time, trr, due probable noise generated. A ratio of 1 is considered ideal and
to the storage of minority carrier charge, QRR, as shown in values less than 0.5 are considered snappy.
the typical reverse recovery wave form of Figure 10. It is this Compared to ON Semiconductor standard cell density
stored charge that, when cleared from the diode, passes low voltage MOSFETs, high cell density MOSFET diodes
through a potential and defines an energy loss. Obviously, are faster (shorter trr), have less stored charge and a softer
repeatedly forcing the diode through reverse recovery reverse recovery characteristic. The softness advantage of
further increases switching losses. Therefore, one would the high cell density diode means they can be forced through
like a diode with short trr and low QRR specifications to reverse recovery at a higher di/dt than a standard cell
minimize these losses. MOSFET diode without increasing the current ringing or the
The abruptness of diode reverse recovery effects the noise generated. In addition, power dissipation incurred
amount of radiated noise, voltage spikes, and current from switching the diode will be less due to the shorter
ringing. The mechanisms at work are finite irremovable recovery time and lower switching losses.
circuit parasitic inductances and capacitances acted upon by


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Figure 9. Diode Forward Voltage versus Current

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Figure 10. Reverse Recovery Time (trr)

SAFE OPERATING AREA

The Forward Biased Safe Operating Area curves define total power averaged over a complete switching cycle must
the maximum simultaneous drain–to–source voltage and not exceed (TJ(MAX) – TC)/(RθJC).
drain current that a transistor can handle safely when it is A power MOSFET designated E–FET can be safely used
forward biased. Curves are based upon maximum peak in switching circuits with unclamped inductive loads. For
junction temperature and a case temperature (TC) of 25°C. reliable operation, the stored energy from circuit inductance
Peak repetitive pulsed power limits are determined by using dissipated in the transistor while in avalanche must be less
the thermal response data in conjunction with the procedures than the rated limit and must be adjusted for operating
discussed in AN569, “Transient Thermal Resistance – conditions differing from those specified. Although industry
General Data and Its Use.” practice is to rate in terms of energy, avalanche energy
Switching between the off–state and the on–state may capability is not a constant. The energy rating decreases
traverse any load line provided neither rated peak current non–linearly with an increase of peak current in avalanche
(IDM) nor rated voltage (VDSS) is exceeded, and that the and peak junction temperature.
transition time (tr, tf) does not exceed 10 µs. In addition the



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Figure 11. Maximum Rated Forward Biased


Safe Operating Area

http://onsemi.com
694
MMSF1310

INFORMATION FOR USING THE SO–8 SURFACE MOUNT PACKAGE

MINIMUM RECOMMENDED FOOTPRINT FOR SURFACE MOUNTED APPLICATIONS


Surface mount board layout is a critical portion of the total interface between the board and the package. With the
design. The footprint for the semiconductor packages must correct pad geometry, the packages will self–align when
be the correct size to ensure proper solder connection subjected to a solder reflow process.
9
$#

#:$ $$
: 6

#6 $
9 #:
inches
mm

SO–8 POWER DISSIPATION


The power dissipation of the SO–8 is a function of the into the equation for an ambient temperature TA of 25°C,
input pad size. This can vary from the minimum pad size one can calculate the power dissipation of the device which
for soldering to the pad size given for maximum power in this case is 2.5 Watts.
dissipation. Power dissipation for a surface mount device is 150°C – 25°C
determined by TJ(max), the maximum rated junction PD = = 2.5 Watts
50°C/W
temperature of the die, RθJA, the thermal resistance from
the device junction to ambient; and the operating The 50°C/W for the SO–8 package assumes the
temperature, TA. Using the values provided on the data recommended footprint on a glass epoxy printed circuit
sheet for the SO–8 package, PD can be calculated as board to achieve a power dissipation of 2.5 Watts using the
follows: footprint shown. Another alternative would be to use a
TJ(max) – TA
ceramic substrate or an aluminum core board such as
PD = Thermal Cladt. Using board material such as Thermal
RθJA
Clad, the power dissipation can be doubled using the same
The values for the equation are found in the maximum footprint.
ratings table on the data sheet. Substituting these values

SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • The soldering temperature and time shall not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within • When shifting from preheating to soldering, the
a short time could result in device failure. Therefore, the maximum temperature gradient shall be 5°C or less.
following items should always be observed in order to • After soldering has been completed, the device should
minimize the thermal stress to which the devices are be allowed to cool naturally for at least three minutes.
subjected. Gradual cooling should be used as the use of forced
• Always preheat the device. cooling will increase the temperature gradient and
• The delta temperature between the preheat and result in latent failure due to mechanical stress.
soldering should be 100°C or less.* • Mechanical stress or shock should not be applied
• When preheating and soldering, the temperature of the during cooling.
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When * Soldering a device without preheating can cause
using infrared heating with the reflow soldering excessive thermal shock and stress which can result in
method, the difference shall be a maximum of 10°C. damage to the device.

http://onsemi.com
695
MMSF1310

TYPICAL SOLDER HEATING PROFILE


For any given circuit board, there will be a group of temperature versus time. The line on the graph shows the
control settings that will give the desired heat pattern. The actual temperature that might be experienced on the surface
operator must set temperatures for several heating zones of a test board at or near a central solder joint. The two
and a figure for belt speed. Taken together, these control profiles are based on a high density and a low density
settings make up a heating “profile” for that particular board. The Vitronics SMD310 convection/infrared reflow
circuit board. On machines controlled by a computer, the soldering system was used to generate this profile. The type
computer remembers these profiles from one operating of solder used was 62/36/2 Tin Lead Silver with a melting
session to the next. Figure 12 shows a typical heating point between 177–189°C. When this type of furnace is
profile for use when soldering a surface mount device to a used for solder reflow work, the circuit boards and solder
printed circuit board. This profile will vary among joints tend to heat first. The components on the board are
soldering systems, but it is a good starting point. Factors then heated by conduction. The circuit board, because it has
that can affect the profile include the type of soldering a large surface area, absorbs the thermal energy more
system in use, density and types of components on the efficiently, then distributes this energy to the components.
board, type of solder used, and the type of board or Because of this effect, the main body of a component may
substrate material being used. This profile shows be up to 30 degrees cooler than the adjacent solder joints.

STEP 1 STEP 2 STEP 3 STEP 4 STEP 5 STEP 6 STEP 7


PREHEAT VENT HEATING HEATING HEATING VENT COOLING
ZONE 1 “SOAK” ZONES 2 & 5 ZONES 3 & 6 ZONES 4 & 7
“RAMP” “RAMP” “SOAK” “SPIKE” 205° TO 219°C
PEAK AT
200°C DESIRED CURVE FOR HIGH 170°C SOLDER
MASS ASSEMBLIES JOINT
160°C
150°C

150°C
SOLDER IS LIQUID FOR
40 TO 80 SECONDS
100°C 140°C (DEPENDING ON
MASS OF ASSEMBLY)
100°C

DESIRED CURVE FOR LOW


MASS ASSEMBLIES
5°C

TIME (3 TO 7 MINUTES TOTAL) TMAX


Figure 12. Typical Solder Heating Profile

http://onsemi.com
696
( # 
Preferred Device

#$%& '(
   
P–Channel SO–8
These miniature surface mount MOSFETs feature ultra low RDS(on)
and true logic level performance. They are capable of withstanding
high energy in the avalanche and commutation modes and the http://onsemi.com
drain–to–source diode has a low reverse recovery time. MiniMOSt
devices are designed for use in low voltage, high speed switching 2 AMPERES
applications where power efficiency is important. Typical applications 20 VOLTS
are dc–dc converters, and power management in portable and battery
powered products such as computers, printers, cellular and cordless RDS(on) = 250 m
phones. They can also be used for low voltage motor controls in mass
storage products such as disk drives and tape drives. The avalanche P–Channel
energy is specified to eliminate the guesswork in designs where 
inductive loads are switched and offer additional safety margin against
unexpected voltage transients.
• Ultra Low RDS(on) Provides Higher Efficiency and Extends Battery
Life 

• Logic Level Gate Drive – Can Be Driven by Logic ICs


• Miniature SO–8 Surface Mount Package – Saves Board Space 

• Diode Is Characterized for Use In Bridge Circuits


• Diode Exhibits High Speed MARKING
• Avalanche Energy Specified DIAGRAM

• Mounting Information for SO–8 Package Provided


• IDSS Specified at Elevated Temperature SO–8
S4P01
8 CASE 751
LYWW
MAXIMUM RATINGS (TJ = 25°C unless otherwise noted) (Note 1.) STYLE 13
Rating Symbol Value Unit 1
Drain–to–Source Voltage VDSS 20 Vdc
L = Location Code
Gate–to–Source Voltage – Continuous VGS ± 20 Vdc Y = Year
Drain Current WW = Work Week
– Continuous @ TA = 25°C (Note 2.) ID 2.5 Adc
– Continuous @ TA = 100°C ID 1.7
– Single Pulse (tp ≤ 10 µs) IDM 13 Apk PIN ASSIGNMENT
Total Power Dissipation @ TA = 25°C PD 2.5 Watts
(Note 2.) N–C 1 8 Drain
Operating and Storage Temperature Range TJ, Tstg – 55 to °C Source 2 7 Drain
150 Source 3 6 Drain
Single Pulse Drain–to–Source Avalanche EAS 216 mJ Gate 4 5 Drain
Energy – Starting TJ = 25°C
(VDD = 20 Vdc, VGS = 5.0 Vdc, Top View
IL = 6.0 Apk, L = 12 mH, RG = 25 Ω)
Thermal Resistance – Junction to Ambient RθJA 50 °C/W ORDERING INFORMATION
(Note 2.)
Maximum Lead Temperature for Soldering TL 260 °C Device Package Shipping
Purposes, 1/8″ from case for 10 seconds
MMSF2P02ER2 SO–8 2500 Tape & Reel
1. Negative sign for P–Channel device omitted for clarity.
2. Mounted on 2″ square FR4 board (1″ sq. 2 oz. Cu 0.06″ thick single sided),
10 sec. max. Preferred devices are recommended choices for future use
and best overall value.

 Semiconductor Components Industries, LLC, 2000 697 Publication Order Number:


November, 2000 – Rev. 5 MMSF2P02E/D
MMSF2P02E

ELECTRICAL CHARACTERISTICS (TA = 25°C unless otherwise noted) (Note 3.)


Characteristic Symbol Min Typ Max Unit
OFF CHARACTERISTICS
Drain–to–Source Breakdown Voltage V(BR)DSS Vdc
(VGS = 0 Vdc, ID = 250 µAdc) 20 – –
Temperature Coefficient (Positive) – 24.7 – mV/°C
Zero Gate Voltage Drain Current IDSS µAdc
(VDS = 20 Vdc, VGS = 0 Vdc) – – 1.0
(VDS = 20 Vdc, VGS = 0 Vdc, TJ = 125°C) – – 10
Gate–Body Leakage Current (VGS = ± 20 Vdc, VDS = 0) IGSS – – 100 nAdc
ON CHARACTERISTICS (Note 4.)
Gate Threshold Voltage VGS(th) Vdc
(VDS = VGS, ID = 250 µAdc) 1.0 2.0 3.0
Threshold Temperature Coefficient (Negative) 4.7 – mV/°C
Static Drain–to–Source On–Resistance RDS(on) Ohm
(VGS = 10 Vdc, ID = 2.0 Adc) – 0.19 0.25
(VGS = 4.5 Vdc, ID = 1.0 Adc) – 0.3 0.4
Forward Transconductance (VDS = 3.0 Vdc, ID = 1.0 Adc) gFS 1.0 2.8 – Mhos
DYNAMIC CHARACTERISTICS
Input Capacitance Ciss – 340 475 pF
Output Capacitance (VDS = 16 Vd
Vdc, VGS = 0 Vd
Vdc,
Coss – 220 300
f = 1.0 MHz)
Transfer Capacitance Crss – 75 150
SWITCHING CHARACTERISTICS (Note 5.)
Turn–On Delay Time td(on) – 20 40 ns
Rise Time (VDD = 10 Vdc, ID = 2.0 Adc, tr – 40 80
VGS = 5
5.00 Vdc
Vdc,
Turn–Off Delay Time RG = 6.0 Ω) td(off) – 53 106
Fall Time tf – 41 82
Turn–On Delay Time td(on) – 13 26 ns
Rise Time (VDD = 10 Vdc, ID = 2.0 Adc, tr – 29 58
VGS = 10 Vdc
Vdc,
Turn–Off Delay Time RG = 6.0 Ω) td(off) – 30 60
Fall Time tf – 28 56
Gate Charge QT – 10 15 nC

(VDS = 16 Vdc, ID = 2.0 Adc, Q1 – 1.1 –


VGS = 10 Vdc) Q2 – 3.3 –
Q3 – 2.5 –

SOURCE–DRAIN DIODE CHARACTERISTICS


Forward On–Voltage (Note 4.) (IS = 2.0 Adc, VGS = 0 Vdc) VSD – 1.5 2.0 Vdc
Reverse Recovery Time trr – 34 64 ns

(IS = 2.0 Adc, VGS = 0 Vdc, ta – 18 –


dIS/dt = 100 A/µs) tb – 16 –
Reverse Recovery Stored Charge QRR – 0.035 – µC
3. Negative sign for P–Channel device omitted for clarity.
4. Pulse Test: Pulse Width ≤ 300 µs, Duty Cycle ≤ 2%.
5. Switching characteristics are independent of operating junction temperature.

http://onsemi.com
698
MMSF2P02E

TYPICAL ELECTRICAL CHARACTERISTICS

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Figure 5. On–Resistance Variation with Figure 6. Drain–to–Source Leakage Current


Temperature versus Voltage

http://onsemi.com
699
MMSF2P02E

POWER MOSFET SWITCHING

Switching behavior is most easily modeled and predicted During the turn–on and turn–off delay times, gate current is
by recognizing that the power MOSFET is charge not constant. The simplest calculation uses appropriate
controlled. The lengths of various switching intervals (∆t) values from the capacitance curves in a standard equation for
are determined by how fast the FET input capacitance can voltage change in an RC network. The equations are:
be charged by current from the generator. td(on) = RG Ciss In [VGG/(VGG – VGSP)]
The published capacitance data is difficult to use for td(off) = RG Ciss In (VGG/VGSP)
calculating rise and fall because drain–gate capacitance
varies greatly with applied voltage. Accordingly, gate The capacitance (Ciss) is read from the capacitance curve at
charge data is used. In most cases, a satisfactory estimate of a voltage corresponding to the off–state condition when
average input current (IG(AV)) can be made from a calculating td(on) and is read at a voltage corresponding to the
rudimentary analysis of the drive circuit so that on–state when calculating td(off).
At high switching speeds, parasitic circuit elements
t = Q/IG(AV) complicate the analysis. The inductance of the MOSFET
During the rise and fall time interval when switching a source lead, inside the package and in the circuit wiring
resistive load, VGS remains virtually constant at a level which is common to both the drain and gate current paths,
known as the plateau voltage, VSGP. Therefore, rise and fall produces a voltage at the source which reduces the gate drive
times may be approximated by the following: current. The voltage is determined by Ldi/dt, but since di/dt
tr = Q2 x RG/(VGG – VGSP) is a function of drain current, the mathematical solution is
tf = Q2 x RG/VGSP complex. The MOSFET output capacitance also
complicates the mathematics. And finally, MOSFETs have
where finite internal gate resistance which effectively adds to the
VGG = the gate drive voltage, which varies from zero to VGG resistance of the driving source, but the internal resistance
RG = the gate drive resistance is difficult to measure and, consequently, is not specified.
and Q2 and VGSP are read from the gate charge curve.

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Figure 7. Capacitance Variation Drain–to–Source Voltage versus Total Charge

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versus Gate Resistance versus Current

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Figure 11. Reverse Recovery Time (trr) Figure 12. Maximum Rated Forward Biased
Safe Operating Area

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Figure 13. Maximum Avalanche Energy versus


Starting Junction Temperature

Although many E–FETs can withstand the stress of custom. The energy rating must be derated for temperature
drain–to–source avalanche at currents up to rated pulsed as shown in the accompanying graph (Figure 13). Maximum
current (IDM), the energy rating is specified at rated energy at currents below rated continuous ID can safely be
continuous current (ID), in accordance with industry assumed to equal the values indicated.



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Figure 15. Diode Reverse Recovery Waveform

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702
MMSF2P02E

INFORMATION FOR USING THE SO–8 SURFACE MOUNT PACKAGE

MINIMUM RECOMMENDED FOOTPRINT FOR SURFACE MOUNTED APPLICATIONS


Surface mount board layout is a critical portion of the total interface between the board and the package. With the
design. The footprint for the semiconductor packages must correct pad geometry, the packages will self–align when
be the correct size to ensure proper solder connection subjected to a solder reflow process.

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SO–8 POWER DISSIPATION


The power dissipation of the SO–8 is a function of the into the equation for an ambient temperature TA of 25°C,
input pad size. This can vary from the minimum pad size one can calculate the power dissipation of the device which
for soldering to the pad size given for maximum power in this case is 2.5 Watts.
dissipation. Power dissipation for a surface mount device is 150°C – 25°C
determined by TJ(max), the maximum rated junction PD = = 2.5 Watts
50°C/W
temperature of the die, RθJA, the thermal resistance from
the device junction to ambient; and the operating The 50°C/W for the SO–8 package assumes the
temperature, TA. Using the values provided on the data recommended footprint on a glass epoxy printed circuit
sheet for the SO–8 package, PD can be calculated as board to achieve a power dissipation of 2.5 Watts using the
follows: footprint shown. Another alternative would be to use a
TJ(max) – TA
ceramic substrate or an aluminum core board such as
PD = Thermal Cladt. Using board material such as Thermal
RθJA
Clad, the power dissipation can be doubled using the same
The values for the equation are found in the maximum footprint.
ratings table on the data sheet. Substituting these values

SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • The soldering temperature and time shall not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within • When shifting from preheating to soldering, the
a short time could result in device failure. Therefore, the maximum temperature gradient shall be 5°C or less.
following items should always be observed in order to • After soldering has been completed, the device should
minimize the thermal stress to which the devices are be allowed to cool naturally for at least three minutes.
subjected. Gradual cooling should be used as the use of forced
• Always preheat the device. cooling will increase the temperature gradient and
• The delta temperature between the preheat and result in latent failure due to mechanical stress.
soldering should be 100°C or less.* • Mechanical stress or shock should not be applied
• When preheating and soldering, the temperature of the during cooling.
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When * Soldering a device without preheating can cause
using infrared heating with the reflow soldering excessive thermal shock and stress which can result in
method, the difference shall be a maximum of 10°C. damage to the device.

http://onsemi.com
703
MMSF2P02E

TYPICAL SOLDER HEATING PROFILE


For any given circuit board, there will be a group of temperature versus time. The line on the graph shows the
control settings that will give the desired heat pattern. The actual temperature that might be experienced on the surface
operator must set temperatures for several heating zones of a test board at or near a central solder joint. The two
and a figure for belt speed. Taken together, these control profiles are based on a high density and a low density
settings make up a heating “profile” for that particular board. The Vitronics SMD310 convection/infrared reflow
circuit board. On machines controlled by a computer, the soldering system was used to generate this profile. The type
computer remembers these profiles from one operating of solder used was 62/36/2 Tin Lead Silver with a melting
session to the next. Figure 13 shows a typical heating point between 177–189°C. When this type of furnace is
profile for use when soldering a surface mount device to a used for solder reflow work, the circuit boards and solder
printed circuit board. This profile will vary among joints tend to heat first. The components on the board are
soldering systems, but it is a good starting point. Factors then heated by conduction. The circuit board, because it has
that can affect the profile include the type of soldering a large surface area, absorbs the thermal energy more
system in use, density and types of components on the efficiently, then distributes this energy to the components.
board, type of solder used, and the type of board or Because of this effect, the main body of a component may
substrate material being used. This profile shows be up to 30 degrees cooler than the adjacent solder joints.

STEP 1 STEP 2 STEP 3 STEP 4 STEP 5 STEP 6 STEP 7


PREHEAT VENT HEATING HEATING HEATING VENT COOLING
ZONE 1 “SOAK” ZONES 2 & 5 ZONES 3 & 6 ZONES 4 & 7
“RAMP” “RAMP” “SOAK” “SPIKE” 205° TO 219°C
PEAK AT
200°C DESIRED CURVE FOR HIGH 170°C SOLDER
MASS ASSEMBLIES JOINT
160°C
150°C

150°C
SOLDER IS LIQUID FOR
40 TO 80 SECONDS
100°C 140°C (DEPENDING ON
MASS OF ASSEMBLY)
100°C

DESIRED CURVE FOR LOW


MASS ASSEMBLIES
5°C

TIME (3 TO 7 MINUTES TOTAL) TMAX


Figure 16. Typical Solder Heating Profile

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704
(!!


  
#$%& '(
-  !  
N–Channel SO–8
These Power MOSFETs are capable of withstanding high energy in the http://onsemi.com
avalanche and commutation modes and the drain–to–source diode has a
very low reverse recovery time. WaveFETt devices are designed for use 11.5 AMPERES
in low voltage, high speed switching applications where power efficiency
is important. Typical applications are dc–dc converters, and power 30 VOLTS
management in portable and battery powered products such as computers, RDS(on) = 12.5 mW
printers, cellular and cordless phones. They can also be used for low
voltage motor controls in mass storage products such as disk drives and N–Channel
tape drives. The avalanche energy is specified to eliminate the guesswork 
in designs where inductive loads are switched and offer additional safety
margin against unexpected voltage transients.
• Characterized Over a Wide Range of Power Ratings
• Ultralow RDS(on) Provides Higher Efficiency and Extends Battery 

Life in Portable Applications


• Logic Level Gate Drive – Can Be Driven by Logic ICs 

• Diode Is Characterized for Use In Bridge Circuits


• Diode Exhibits High Speed, With Soft Recovery MARKING
• IDSS Specified at Elevated Temperature DIAGRAM
• Avalanche Energy Specified
• Miniature SO–8 Surface Mount Package – Saves Board Space SO–8
S3300
8 CASE 751
LYWW
MAXIMUM RATINGS (TJ = 25°C unless otherwise specified) STYLE 12

Parameter Symbol Value Unit 1


Drain–to–Source Voltage VDSS 30 Vdc
L = Location Code
Drain–to–Gate Voltage VDGR 30 Vdc Y = Year
Gate–to–Source Voltage VGS ±20 Vdc WW = Work Week
Gate–to–Source Operating Voltage VGS ±16 Vdc
Operating and Storage Temperature Range TJ, Tstg –55 to °C
PIN ASSIGNMENT
150
Single Pulse Drain–to–Source Avalanche EAS 500 mJ Source Drain
1 8
Energy – Starting TJ = 25°C
(VDD = 25 Vdc, VGS = 10 Vdc, Source 2 7 Drain
L = 18.8 mH, IL(pk) = 7.3 A, VDS = 30 Vdc) Source 3 6 Drain
Gate 4 5 Drain
Top View

ORDERING INFORMATION

Device Package Shipping

MMSF3300R2 SO–8 2500 Tape & Reel

This document contains information on a new product. Specifications and information


herein are subject to change without notice.

 Semiconductor Components Industries, LLC, 2000 705 Publication Order Number:


November, 2000 – Rev. 5 MMSF3300/D
MMSF3300

POWER RATINGS (TJ = 25°C unless otherwise specified)


Parameter Symbol Value Unit
Drain Current – Continuous @ TA = 25°C ID 11.5 Adc
Drain Current – Continuous @ TA = 100°C Mounted on 1 inch square ID 8.2 Adc
Drain Current – Single Pulse (tp ≤ 10 ms) FR–4 or G10 board IDM 50 Adc
Total Power Dissipation @ TA = 25°C PD 2.5 Watts
Linear Derating Factor VGS = 10 Vdc 20 mW/°C
Thermal Resistance – Junction–to–Ambient t ≤ 10 seconds RθJA 50 °C/W
Continuous Source Current (Diode Conduction) IS 3.0 Adc

Parameter Symbol Value Unit


Drain Current – Continuous @ TA = 25°C ID 9.1 Adc
Drain Current – Continuous @ TA = 100°C Mounted on 1 inch square ID 6.5 Adc
Drain Current – Single Pulse (tp ≤ 10 ms) FR–4 or G10 board IDM 50 Adc
Total Power Dissipation @ TA = 25°C PD 1.6 Watts
Linear Derating Factor VGS = 10 Vdc 12.5 mW/°C
Thermal Resistance – Junction–to–Ambient Steady State RθJA 80 °C/W
Continuous Source Current (Diode Conduction) IS 2.0 Adc

Parameter Symbol Value Unit


Drain Current – Continuous @ TA = 25°C ID 9.1 Adc
Drain Current – Continuous @ TA = 100°C Mounted on minimum recommended ID 6.5 Adc
Drain Current – Single Pulse (tp ≤ 10 ms) FR–4 or G10 board IDM 50 Adc
Total Power Dissipation @ TA = 25°C PD 1.6 Watts
Linear Derating Factor VGS = 10 Vdc 12.5 mW/°C
Thermal Resistance – Junction–to–Ambient t ≤ 10 seconds RθJA 80 °C/W
Continuous Source Current (Diode Conduction) IS 2.0 Adc

Parameter Symbol Value Unit


Drain Current – Continuous @ TA = 25°C ID 6.7 Adc
Drain Current – Continuous @ TA = 100°C Mounted on minimum recommended ID 4.7 Adc
Drain Current – Single Pulse (tp ≤ 10 ms) FR–4 or G10 board IDM 50 Adc
Total Power Dissipation @ TA = 25°C PD 0.8 Watts
Linear Derating Factor VGS = 10 Vdc 6.7 mW/°C
Thermal Resistance – Junction–to–Ambient Steady State RθJA 150 °C/W
Continuous Source Current (Diode Conduction) IS 1.0 Adc

http://onsemi.com
706
MMSF3300

ELECTRICAL CHARACTERISTICS (TJ = 25°C unless otherwise specified)


Characteristic Symbol Min Typ Max Unit

OFF CHARACTERISTICS
Drain–to–Source Breakdown Voltage V(BR)DSS Vdc
(VGS = 0 Vdc, ID = 250 mAdc) 30 – –
Temperature Coefficient (Positive) – 24 – mV/°C
Zero Gate Voltage Drain Current IDSS µAdc
(VDS = 30 Vdc, VGS = 0 Vdc) – 0.004 1.0
(VDS = 30 Vdc, VGS = 0 Vdc, TJ = 125°C) – 0.5 10
Gate–Body Leakage Current (VGS = ± 20 Vdc, VDS = 0 Vdc) IGSS – – 100 nAdc

ON CHARACTERISTICS (Note 1.)


Gate Threshold Voltage VGS(th) Vdc
(VDS = VGS, ID = 250 mAdc) 1.0 1.9 –
Threshold Temperature Coefficient (Negative) – 4.4 – mV/°C
Static Drain–to–Source On–Resistance RDS(on) mΩ
(VGS = 10 Vdc, ID = 10 Adc) – 10 12.5
(VGS = 4.5 Vdc, ID = 5.0 Adc) – 16 20
Forward Transconductance (VDS = 15 Vdc, ID = 10 Adc) gFS 3.0 18 – Mhos

DYNAMIC CHARACTERISTICS
Input Capacitance Ciss – 1700 – pF
Output Capacitance (VDS = 24 Vd
Vdc, VGS = 0 Vd
Vdc,
Coss – 600 –
f = 1.0 MHz)
Transfer Capacitance Crss – 200 –

SWITCHING CHARACTERISTICS (Note 2.)


Turn–On Delay Time td(on) – 21 40 ns
Rise Time (VDD = 25 Vdc, ID = 1.0 Adc, tr – 45 90
VGS = 4
4.55 Vdc
Vdc,
Turn–Off Delay Time RG = 6.0 Ω) td(off) – 40 80
Fall Time tf – 40 80
Turn–On Delay Time td(on) – 12 25 ns
Rise Time (VDD = 25 Vdc, ID = 1.0 Adc, tr – 12 25
VGS = 10 Vdc
Vdc,
Turn–Off Delay Time RG = 6.0 Ω) td(off) – 55 110
Fall Time tf – 39 80
Gate Charge QT – 45 60 nC

(VDS = 15 Vdc, ID = 2.0 Adc, Q1 – 5.1 –


VGS = 10 Vdc) Q2 – 14 –
Q3 – 13 –

SOURCE–DRAIN DIODE CHARACTERISTICS


Forward On–Voltage (Note 1.) VSD Vdc
(IS = 2.3 Adc, VGS = 0 Vdc) – 0.78 1.1
(IS = 2.3 Adc, VGS = 0 Vdc, TJ = 125°C) – 0.60 –
Reverse Recovery Time trr – 40 – ns

(IS = 3.5 Adc, VGS = 0 Vdc, ta – 21 –


dIS/dt = 100 A/µs) tb – 19 –
Reverse Recovery Stored Charge QRR – 0.043 – µC
1. Pulse Test: Pulse Width ≤ 300 µs, Duty Cycle ≤ 2%.
2. Switching characteristics are independent of operating junction temperatures.

http://onsemi.com
707
MMSF3300

TYPICAL ELECTRICAL CHARACTERISTICS

 
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Gate–To–Source Voltage and Gate Voltage

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Temperature Current versus Voltage

http://onsemi.com
708
MMSF3300

POWER MOSFET SWITCHING

Switching behavior is most easily modeled and predicted The capacitance (Ciss) is read from the capacitance curve at
by recognizing that the power MOSFET is charge a voltage corresponding to the off–state condition when
controlled. The lengths of various switching intervals (∆t) calculating td(on) and is read at a voltage corresponding to the
are determined by how fast the FET input capacitance can on–state when calculating td(off).
be charged by current from the generator. At high switching speeds, parasitic circuit elements
The published capacitance data is difficult to use for complicate the analysis. The inductance of the MOSFET
calculating rise and fall because drain–gate capacitance source lead, inside the package and in the circuit wiring
varies greatly with applied voltage. Accordingly, gate which is common to both the drain and gate current paths,
charge data is used. In most cases, a satisfactory estimate of produces a voltage at the source which reduces the gate drive
average input current (IG(AV)) can be made from a current. The voltage is determined by Ldi/dt, but since di/dt
rudimentary analysis of the drive circuit so that is a function of drain current, the mathematical solution is
t = Q/IG(AV) complex. The MOSFET output capacitance also
complicates the mathematics. And finally, MOSFETs have
During the rise and fall time interval when switching a finite internal gate resistance which effectively adds to the
resistive load, VGS remains virtually constant at a level resistance of the driving source, but the internal resistance
known as the plateau voltage, VSGP. Therefore, rise and fall is difficult to measure and, consequently, is not specified.
times may be approximated by the following: The resistive switching time variation versus gate
tr = Q2 x RG/(VGG – VGSP) resistance (Figure 9) shows how typical switching
tf = Q2 x RG/VGSP performance is affected by the parasitic circuit elements. If
where the parasitics were not present, the slope of the curves would
maintain a value of unity regardless of the switching speed.
VGG = the gate drive voltage, which varies from zero to VGG
The circuit used to obtain the data is constructed to minimize
RG = the gate drive resistance
common inductance in the drain and gate circuit loops and
and Q2 and VGSP are read from the gate charge curve.
is believed readily achievable with board mounted
During the turn–on and turn–off delay times, gate current is components. Most power electronic loads are inductive; the
not constant. The simplest calculation uses appropriate data in the figure is taken with a resistive load, which
values from the capacitance curves in a standard equation for approximates an optimally snubbed inductive load. Power
voltage change in an RC network. The equations are: MOSFETs may be safely operated into an inductive load;
td(on) = RG Ciss In [VGG/(VGG – VGSP)] however, snubbing reduces switching losses.
td(off) = RG Ciss In (VGG/VGSP)

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Figure 8. Gate–To–Source and Drain–To–Source Figure 9. Resistive Switching Time


Voltage versus Total Charge Variation versus Gate Resistance

DRAIN–TO–SOURCE DIODE CHARACTERISTICS

The switching characteristics of a MOSFET body diode are di/dts. The diode’s negative di/dt during ta is directly
very important in systems using it as a freewheeling or controlled by the device clearing the stored charge. However,
commutating diode. Of particular interest are the reverse the positive di/dt during tb is an uncontrollable diode
recovery characteristics which play a major role in characteristic and is usually the culprit that induces current
determining switching losses, radiated noise, EMI and RFI. ringing. Therefore, when comparing diodes, the ratio of tb/ta
System switching losses are largely due to the nature of the serves as a good indicator of recovery abruptness and thus
body diode itself. The body diode is a minority carrier device, gives a comparative estimate of probable noise generated. A
therefore it has a finite reverse recovery time, trr, due to the ratio of 1 is considered ideal and values less than 0.5 are
storage of minority carrier charge, QRR, as shown in the considered snappy.
typical reverse recovery wave form of Figure 16. It is this Compared to ON Semiconductor standard cell density low
stored charge that, when cleared from the diode, passes voltage MOSFETs, high cell density MOSFET diodes are
through a potential and defines an energy loss. Obviously, faster (shorter trr), have less stored charge and a softer reverse
repeatedly forcing the diode through reverse recovery further recovery characteristic. The softness advantage of the high
increases switching losses. Therefore, one would like a diode cell density diode means they can be forced through reverse
with short trr and low QRR specifications to minimize these recovery at a higher di/dt than a standard cell MOSFET diode
losses. without increasing the current ringing or the noise generated.
The abruptness of diode reverse recovery effects the In addition, power dissipation incurred from switching the
amount of radiated noise, voltage spikes, and current ringing. diode will be less due to the shorter recovery time and lower
The mechanisms at work are finite irremovable circuit switching losses.
parasitic inductances and capacitances acted upon by high

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SAFE OPERATING AREA

The Forward Biased Safe Operating Area curves define total power averaged over a complete switching cycle must
the maximum simultaneous drain–to–source voltage and not exceed (TJ(MAX) – TC)/(RθJC).
drain current that a transistor can handle safely when it is A power MOSFET designated E–FET can be safely used
forward biased. Curves are based upon maximum peak in switching circuits with unclamped inductive loads. For
junction temperature and a case temperature (TC) of 25°C. reliable operation, the stored energy from circuit inductance
Peak repetitive pulsed power limits are determined by using dissipated in the transistor while in avalanche must be less
the thermal response data in conjunction with the procedures than the rated limit and must be adjusted for operating
discussed in AN569, “Transient Thermal Resistance – conditions differing from those specified. Although industry
General Data and Its Use.” practice is to rate in terms of energy, avalanche energy
Switching between the off–state and the on–state may capability is not a constant. The energy rating decreases
traverse any load line provided neither rated peak current non–linearly with an increase of peak current in avalanche
(IDM) nor rated voltage (VDSS) is exceeded, and that the and peak junction temperature.
transition time (tr, tf) does not exceed 10 µs. In addition the

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TYPICAL ELECTRICAL CHARACTERISTICS



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Figure 16. Diode Reverse Recovery Waveform Figure 17. Single Pulse Power

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MMSF3300

INFORMATION FOR USING THE SO–8 SURFACE MOUNT PACKAGE

MINIMUM RECOMMENDED FOOTPRINT FOR SURFACE MOUNTED APPLICATIONS


Surface mount board layout is a critical portion of the total interface between the board and the package. With the
design. The footprint for the semiconductor packages must correct pad geometry, the packages will self–align when
be the correct size to ensure proper solder connection subjected to a solder reflow process.
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SO–8 POWER DISSIPATION


The power dissipation of the SO–8 is a function of the into the equation for an ambient temperature TA of 25°C,
input pad size. This can vary from the minimum pad size one can calculate the power dissipation of the device which
for soldering to the pad size given for maximum power in this case is 2.5 Watts.
dissipation. Power dissipation for a surface mount device is 150°C – 25°C
determined by TJ(max), the maximum rated junction PD = = 2.5 Watts
50°C/W
temperature of the die, RθJA, the thermal resistance from
the device junction to ambient; and the operating The 50°C/W for the SO–8 package assumes the
temperature, TA. Using the values provided on the data recommended footprint on a glass epoxy printed circuit
sheet for the SO–8 package, PD can be calculated as board to achieve a power dissipation of 2.5 Watts using the
follows: footprint shown. Another alternative would be to use a
TJ(max) – TA ceramic substrate or an aluminum core board such as
PD = Thermal Cladt. Using board material such as Thermal
RθJA
Clad, the power dissipation can be doubled using the same
The values for the equation are found in the maximum footprint.
ratings table on the data sheet. Substituting these values

SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • The soldering temperature and time shall not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within • When shifting from preheating to soldering, the
a short time could result in device failure. Therefore, the maximum temperature gradient shall be 5°C or less.
following items should always be observed in order to • After soldering has been completed, the device should
minimize the thermal stress to which the devices are be allowed to cool naturally for at least three minutes.
subjected. Gradual cooling should be used as the use of forced
• Always preheat the device. cooling will increase the temperature gradient and
• The delta temperature between the preheat and result in latent failure due to mechanical stress.
soldering should be 100°C or less.* • Mechanical stress or shock should not be applied
• When preheating and soldering, the temperature of the during cooling.
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When *Soldering a device without preheating can cause excessive
using infrared heating with the reflow soldering thermal shock and stress which can result in damage to the
method, the difference shall be a maximum of 10°C. device.

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713
MMSF3300

TYPICAL SOLDER HEATING PROFILE


For any given circuit board, there will be a group of temperature versus time. The line on the graph shows the
control settings that will give the desired heat pattern. The actual temperature that might be experienced on the surface
operator must set temperatures for several heating zones of a test board at or near a central solder joint. The two
and a figure for belt speed. Taken together, these control profiles are based on a high density and a low density
settings make up a heating “profile” for that particular board. The Vitronics SMD310 convection/infrared reflow
circuit board. On machines controlled by a computer, the soldering system was used to generate this profile. The type
computer remembers these profiles from one operating of solder used was 62/36/2 Tin Lead Silver with a melting
session to the next. Figure 18 shows a typical heating point between 177–189°C. When this type of furnace is
profile for use when soldering a surface mount device to a used for solder reflow work, the circuit boards and solder
printed circuit board. This profile will vary among joints tend to heat first. The components on the board are
soldering systems, but it is a good starting point. Factors then heated by conduction. The circuit board, because it has
that can affect the profile include the type of soldering a large surface area, absorbs the thermal energy more
system in use, density and types of components on the efficiently, then distributes this energy to the components.
board, type of solder used, and the type of board or Because of this effect, the main body of a component may
substrate material being used. This profile shows be up to 30 degrees cooler than the adjacent solder joints.

STEP 1 STEP 2 STEP 3 STEP 4 STEP 5 STEP 6 STEP 7


PREHEAT VENT HEATING HEATING HEATING VENT COOLING
ZONE 1 “SOAK” ZONES 2 & 5 ZONES 3 & 6 ZONES 4 & 7
“RAMP” “RAMP” “SOAK” “SPIKE” 205° TO 219°C
PEAK AT
200°C DESIRED CURVE FOR HIGH 170°C SOLDER
MASS ASSEMBLIES JOINT
160°C
150°C

150°C
SOLDER IS LIQUID FOR
40 TO 80 SECONDS
100°C 140°C (DEPENDING ON
MASS OF ASSEMBLY)
100°C

DESIRED CURVE FOR LOW


MASS ASSEMBLIES
5°C

TIME (3 TO 7 MINUTES TOTAL) TMAX


Figure 18. Typical Solder Heating Profile

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714
(!# .
Preferred Device

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P–Channel SO–8
These miniature surface mount MOSFETs feature ultra low RDS(on)
and true logic level performance. They are capable of withstanding
high energy in the avalanche and commutation modes and the http://onsemi.com
drain–to–source diode has a very low reverse recovery time.
MiniMOSt devices are designed for use in low voltage, high speed 3 AMPERES
switching applications where power efficiency is important. Typical 20 VOLTS
applications are dc–dc converters, and power management in portable
and battery powered products such as computers, printers, cellular and RDS(on) = 75 m
cordless phones. They can also be used for low voltage motor controls
in mass storage products such as disk drives and tape drives. The P–Channel
avalanche energy is specified to eliminate the guesswork in designs 
where inductive loads are switched and offer additional safety margin
against unexpected voltage transients.
• Ultra Low RDS(on) Provides Higher Efficiency and Extends Battery
Life 

• Logic Level Gate Drive – Can Be Driven by Logic ICs


• Miniature SO–8 Surface Mount Package – Saves Board Space 

• Diode Is Characterized for Use In Bridge Circuits


• Diode Exhibits High Speed, With Soft Recovery MARKING
• IDSS Specified at Elevated Temperature DIAGRAM

• Avalanche Energy Specified


• Mounting Information for SO–8 Package Provided SO–8
S3P02
CASE 751
8 LYWW
MAXIMUM RATINGS (TJ = 25°C unless otherwise noted) (Note 1.) STYLE 13
Rating Symbol Value Unit 1
Drain–to–Source Voltage VDSS 20 Vdc
L = Location Code
Drain–to–Gate Voltage (RGS = 1.0 MΩ) VDGR 20 Vdc
Y = Year
Gate–to–Source Voltage – Continuous VGS ± 20 Vdc WW = Work Week
Drain Current – Continuous @ TA = 25°C ID 5.6 Adc
Drain Current – Continuous @ TA = 100°C ID 3.6
Drain Current – Single Pulse (tp ≤ 10 µs) IDM 30 Apk PIN ASSIGNMENT
Total Power Dissipation @ TA = 25°C PD 2.5 Watts
(Note 2.) N–C 1 8 Drain
Operating and Storage Temperature Range TJ, Tstg – 55 to °C Source 2 7 Drain
150 Source 3 6 Drain
Single Pulse Drain–to–Source Avalanche EAS 567 mJ Gate 4 5 Drain
Energy – Starting TJ = 25°C
Top View
(VDD = 20 Vdc, VGS = 5.0 Vdc, Peak
IL = 9.0 Apk, L = 14 mH, RG = 25 Ω)
Thermal Resistance – Junction to Ambient RθJA 50 °C/W ORDERING INFORMATION
(Note 2.)
Maximum Lead Temperature for Soldering TL 260 °C Device Package Shipping
Purposes, 1/8″ from case for 10 seconds
MMSF3P02HDR2 SO–8 2500 Tape & Reel
1. Negative sign for P–Channel device omitted for clarity.
2. Mounted on 2″ square FR4 board (1″ sq. 2 oz. Cu 0.06″ thick single sided),
10 sec. max. Preferred devices are recommended choices for future use
and best overall value.

 Semiconductor Components Industries, LLC, 2000 715 Publication Order Number:


November, 2000 – Rev. 6 MMSF3P02HD/D
MMSF3P02HD

ELECTRICAL CHARACTERISTICS (TA = 25°C unless otherwise noted) (Note 3.)


Characteristic Symbol Min Typ Max Unit
OFF CHARACTERISTICS
Drain–to–Source Breakdown Voltage V(BR)DSS Vdc
(VGS = 0 Vdc, ID = 250 µAdc) 20 – –
Temperature Coefficient (Positive) – 24 – mV/°C
Zero Gate Voltage Drain Current IDSS µAdc
(VDS = 20 Vdc, VGS = 0 Vdc) – – 1.0
(VDS = 20 Vdc, VGS = 0 Vdc, TJ = 125°C) – – 10
Gate–Body Leakage Current (VGS = ± 20 Vdc, VDS = 0) IGSS – – 100 nAdc
ON CHARACTERISTICS (Note 4.)
Gate Threshold Voltage VGS(th) Vdc
(VDS = VGS, ID = 250 µAdc) 1.0 1.5 2.0
Temperature Coefficient (Negative) – 4.0 – mV/°C
Static Drain–Source On–Resistance RDS(on) Ohm
(VGS = 10 Vdc, ID = 3.0 Adc) – 0.06 0.075
(VGS = 4.5 Vdc, ID = 1.5 Adc) – 0.08 0.095
Forward Transconductance (VDS = 3.0 Vdc, ID = 1.5 Adc) gFS 3.0 7.2 – mhos
DYNAMIC CHARACTERISTICS
Input Capacitance Ciss – 1010 1400 pF
Output Capacitance (VDS = 16 Vd
Vdc, VGS = 0 Vd
Vdc,
Coss – 740 920
f = 1.0 MHz)
Transfer Capacitance Crss – 260 490
SWITCHING CHARACTERISTICS (Note 5.)
Turn–On Delay Time td(on) – 25 50 ns
Rise Time (VDD = 10 Vdc, ID = 3.0 Adc, tr – 135 270
VGS = 4
4.55 Vdc
Vdc,
Turn–Off Delay Time RG = 6.0 Ω) td(off) – 54 108
Fall Time tf – 84 168
Turn–On Delay Time td(on) – 16 32
Rise Time (VDD = 10 Vdc, ID = 3.0 Adc, tr – 40 80
VGS = 10 Vdc
Vdc,
Turn–Off Delay Time RG = 6.0 Ω) td(off) – 110 220
Fall Time tf – 97 194
Gate Charge QT – 33 46 nC
S Fi
See Figure 8
(VDS = 16 Vdc, ID = 3.0 Adc, Q1 – 3.0 –
VGS = 10 Vdc) Q2 – 11 –
Q3 – 10 –

SOURCE–DRAIN DIODE CHARACTERISTICS


Forward On–Voltage (Note 4.) (IS = 3.0 Adc, VGS = 0 Vdc) VSD Vdc
(IS = 3.0 Adc, VGS = 0 Vdc, – 1.35 1.75
TJ = 125°C) – 0.96 –
Reverse Recovery Time trr – 76 – ns
S Fi
See Figure 15
(IS = 3.0 Adc, VGS = 0 Vdc, ta – 32 –
dIS/dt = 100 A/µs) tb – 44 –
Reverse Recovery Stored Charge QRR – 0.133 – µC
3. Negative sign for P–Channel device omitted for clarity.
4. Pulse Test: Pulse Width ≤ 300 µs, Duty Cycle ≤ 2%.
5. Switching characteristics are independent of operating junction temperature.

http://onsemi.com
716
MMSF3P02HD

TYPICAL ELECTRICAL CHARACTERISTICS

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Figure 1. On–Region Characteristics Figure 2. Transfer Characteristics



 
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Figure 3. On–Resistance versus Figure 4. On–Resistance versus Drain Current


Gate–To–Source Voltage and Gate Voltage

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Figure 5. On–Resistance Variation with Figure 6. Drain–To–Source Leakage


Temperature Current versus Voltage

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717
MMSF3P02HD

POWER MOSFET SWITCHING

Switching behavior is most easily modeled and predicted The capacitance (Ciss) is read from the capacitance curve at
by recognizing that the power MOSFET is charge a voltage corresponding to the off–state condition when
controlled. The lengths of various switching intervals (∆t) calculating td(on) and is read at a voltage corresponding to the
are determined by how fast the FET input capacitance can on–state when calculating td(off).
be charged by current from the generator. At high switching speeds, parasitic circuit elements
The published capacitance data is difficult to use for complicate the analysis. The inductance of the MOSFET
calculating rise and fall because drain–gate capacitance source lead, inside the package and in the circuit wiring
varies greatly with applied voltage. Accordingly, gate which is common to both the drain and gate current paths,
charge data is used. In most cases, a satisfactory estimate of produces a voltage at the source which reduces the gate drive
average input current (IG(AV)) can be made from a current. The voltage is determined by Ldi/dt, but since di/dt
rudimentary analysis of the drive circuit so that is a function of drain current, the mathematical solution is
t = Q/IG(AV) complex. The MOSFET output capacitance also
complicates the mathematics. And finally, MOSFETs have
During the rise and fall time interval when switching a finite internal gate resistance which effectively adds to the
resistive load, VGS remains virtually constant at a level resistance of the driving source, but the internal resistance
known as the plateau voltage, VSGP. Therefore, rise and fall is difficult to measure and, consequently, is not specified.
times may be approximated by the following: The resistive switching time variation versus gate
tr = Q2 x RG/(VGG – VGSP) resistance (Figure 9) shows how typical switching
tf = Q2 x RG/VGSP performance is affected by the parasitic circuit elements. If
where the parasitics were not present, the slope of the curves would
maintain a value of unity regardless of the switching speed.
VGG = the gate drive voltage, which varies from zero to VGG
The circuit used to obtain the data is constructed to minimize
RG = the gate drive resistance
common inductance in the drain and gate circuit loops and
and Q2 and VGSP are read from the gate charge curve.
is believed readily achievable with board mounted
During the turn–on and turn–off delay times, gate current is components. Most power electronic loads are inductive; the
not constant. The simplest calculation uses appropriate data in the figure is taken with a resistive load, which
values from the capacitance curves in a standard equation for approximates an optimally snubbed inductive load. Power
voltage change in an RC network. The equations are: MOSFETs may be safely operated into an inductive load;
td(on) = RG Ciss In [VGG/(VGG – VGSP)] however, snubbing reduces switching losses.
td(off) = RG Ciss In (VGG/VGSP)

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Figure 8. Gate–To–Source and Drain–To–Source Figure 9. Resistive Switching Time


Voltage versus Total Charge Variation versus Gate Resistance

DRAIN–TO–SOURCE DIODE CHARACTERISTICS

The switching characteristics of a MOSFET body diode high di/dts. The diode’s negative di/dt during ta is directly
are very important in systems using it as a freewheeling or controlled by the device clearing the stored charge.
commutating diode. Of particular interest are the reverse However, the positive di/dt during tb is an uncontrollable
recovery characteristics which play a major role in diode characteristic and is usually the culprit that induces
determining switching losses, radiated noise, EMI and RFI. current ringing. Therefore, when comparing diodes, the
System switching losses are largely due to the nature of ratio of tb/ta serves as a good indicator of recovery
the body diode itself. The body diode is a minority carrier abruptness and thus gives a comparative estimate of
device, therefore it has a finite reverse recovery time, trr, due probable noise generated. A ratio of 1 is considered ideal and
to the storage of minority carrier charge, QRR, as shown in values less than 0.5 are considered snappy.
the typical reverse recovery wave form of Figure 15. It is this Compared to ON Semiconductor standard cell density
stored charge that, when cleared from the diode, passes low voltage MOSFETs, high cell density MOSFET diodes
through a potential and defines an energy loss. Obviously, are faster (shorter trr), have less stored charge and a softer
repeatedly forcing the diode through reverse recovery reverse recovery characteristic. The softness advantage of
further increases switching losses. Therefore, one would the high cell density diode means they can be forced through
like a diode with short trr and low QRR specifications to reverse recovery at a higher di/dt than a standard cell
minimize these losses. MOSFET diode without increasing the current ringing or the
The abruptness of diode reverse recovery effects the noise generated. In addition, power dissipation incurred
amount of radiated noise, voltage spikes, and current from switching the diode will be less due to the shorter
ringing. The mechanisms at work are finite irremovable recovery time and lower switching losses.
circuit parasitic inductances and capacitances acted upon by
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Figure 10. Diode Forward Voltage versus Current

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MMSF3P02HD

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Figure 11. Reverse Recovery Time (trr)

SAFE OPERATING AREA

The Forward Biased Safe Operating Area curves define reliable operation, the stored energy from circuit inductance
the maximum simultaneous drain–to–source voltage and dissipated in the transistor while in avalanche must be less
drain current that a transistor can handle safely when it is than the rated limit and must be adjusted for operating
forward biased. Curves are based upon maximum peak conditions differing from those specified. Although industry
junction temperature and a case temperature (TC) of 25°C. practice is to rate in terms of energy, avalanche energy
Peak repetitive pulsed power limits are determined by using capability is not a constant. The energy rating decreases
the thermal response data in conjunction with the procedures non–linearly with an increase of peak current in avalanche
discussed in AN569, “Transient Thermal Resistance – and peak junction temperature.
General Data and Its Use.” Although many E–FETs can withstand the stress of
Switching between the off–state and the on–state may drain–to–source avalanche at currents up to rated pulsed
traverse any load line provided neither rated peak current current (IDM), the energy rating is specified at rated
(IDM) nor rated voltage (VDSS) is exceeded, and that the continuous current (ID), in accordance with industry
transition time (tr, tf) does not exceed 10 µs. In addition the custom. The energy rating must be derated for temperature
total power averaged over a complete switching cycle must as shown in the accompanying graph (Figure 13). Maximum
not exceed (TJ(MAX) – TC)/(RθJC). energy at currents below rated continuous ID can safely be
A power MOSFET designated E–FET can be safely used assumed to equal the values indicated.
in switching circuits with unclamped inductive loads. For

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Safe Operating Area Starting Junction Temperature

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TYPICAL ELECTRICAL CHARACTERISTICS



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721
MMSF3P02HD

INFORMATION FOR USING THE SO–8 SURFACE MOUNT PACKAGE

MINIMUM RECOMMENDED FOOTPRINT FOR SURFACE MOUNTED APPLICATIONS


Surface mount board layout is a critical portion of the total interface between the board and the package. With the
design. The footprint for the semiconductor packages must correct pad geometry, the packages will self–align when
be the correct size to ensure proper solder connection subjected to a solder reflow process.

9
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inches
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SO–8 POWER DISSIPATION


The power dissipation of the SO–8 is a function of the into the equation for an ambient temperature TA of 25°C,
input pad size. This can vary from the minimum pad size one can calculate the power dissipation of the device which
for soldering to the pad size given for maximum power in this case is 2.5 Watts.
dissipation. Power dissipation for a surface mount device is 150°C – 25°C
determined by TJ(max), the maximum rated junction PD = = 2.5 Watts
50°C/W
temperature of the die, RθJA, the thermal resistance from
the device junction to ambient; and the operating The 50°C/W for the SO–8 package assumes the
temperature, TA. Using the values provided on the data recommended footprint on a glass epoxy printed circuit
sheet for the SO–8 package, PD can be calculated as board to achieve a power dissipation of 2.5 Watts using the
follows: footprint shown. Another alternative would be to use a
TJ(max) – TA
ceramic substrate or an aluminum core board such as
PD = Thermal Cladt. Using board material such as Thermal
RθJA
Clad, the power dissipation can be doubled using the same
The values for the equation are found in the maximum footprint.
ratings table on the data sheet. Substituting these values

SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • The soldering temperature and time shall not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within • When shifting from preheating to soldering, the
a short time could result in device failure. Therefore, the maximum temperature gradient shall be 5°C or less.
following items should always be observed in order to • After soldering has been completed, the device should
minimize the thermal stress to which the devices are be allowed to cool naturally for at least three minutes.
subjected. Gradual cooling should be used as the use of forced
• Always preheat the device. cooling will increase the temperature gradient and
• The delta temperature between the preheat and result in latent failure due to mechanical stress.
soldering should be 100°C or less.* • Mechanical stress or shock should not be applied
• When preheating and soldering, the temperature of the during cooling.
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When * Soldering a device without preheating can cause
using infrared heating with the reflow soldering excessive thermal shock and stress which can result in
method, the difference shall be a maximum of 10°C. damage to the device.

http://onsemi.com
722
MMSF3P02HD

TYPICAL SOLDER HEATING PROFILE


For any given circuit board, there will be a group of temperature versus time. The line on the graph shows the
control settings that will give the desired heat pattern. The actual temperature that might be experienced on the surface
operator must set temperatures for several heating zones of a test board at or near a central solder joint. The two
and a figure for belt speed. Taken together, these control profiles are based on a high density and a low density
settings make up a heating “profile” for that particular board. The Vitronics SMD310 convection/infrared reflow
circuit board. On machines controlled by a computer, the soldering system was used to generate this profile. The type
computer remembers these profiles from one operating of solder used was 62/36/2 Tin Lead Silver with a melting
session to the next. Figure 16 shows a typical heating point between 177–189°C. When this type of furnace is
profile for use when soldering a surface mount device to a used for solder reflow work, the circuit boards and solder
printed circuit board. This profile will vary among joints tend to heat first. The components on the board are
soldering systems, but it is a good starting point. Factors then heated by conduction. The circuit board, because it has
that can affect the profile include the type of soldering a large surface area, absorbs the thermal energy more
system in use, density and types of components on the efficiently, then distributes this energy to the components.
board, type of solder used, and the type of board or Because of this effect, the main body of a component may
substrate material being used. This profile shows be up to 30 degrees cooler than the adjacent solder joints.

STEP 1 STEP 2 STEP 3 STEP 4 STEP 5 STEP 6 STEP 7


PREHEAT VENT HEATING HEATING HEATING VENT COOLING
ZONE 1 “SOAK” ZONES 2 & 5 ZONES 3 & 6 ZONES 4 & 7
“RAMP” “RAMP” “SOAK” “SPIKE” 205° TO 219°C
PEAK AT
200°C DESIRED CURVE FOR HIGH 170°C SOLDER
MASS ASSEMBLIES JOINT
160°C
150°C

150°C
SOLDER IS LIQUID FOR
40 TO 80 SECONDS
100°C 140°C (DEPENDING ON
MASS OF ASSEMBLY)
100°C

DESIRED CURVE FOR LOW


MASS ASSEMBLIES
5°C

TIME (3 TO 7 MINUTES TOTAL) TMAX


Figure 16. Typical Solder Heating Profile

http://onsemi.com
723
( .
Preferred Device

#$%& '(
    
N–Channel SO–8
These miniature surface mount MOSFETs feature ultra low RDS(on)
and true logic level performance. They are capable of withstanding
high energy in the avalanche and commutation modes and the http://onsemi.com
drain–to–source diode has a very low reverse recovery time.
MiniMOSt devices are designed for use in low voltage, high speed 5 AMPERES
switching applications where power efficiency is important. Typical 20 VOLTS
applications are dc–dc converters, and power management in portable
and battery powered products such as computers, printers, cellular and RDS(on) = 25 m
cordless phones. They can also be used for low voltage motor controls
in mass storage products such as disk drives and tape drives. The N–Channel
avalanche energy is specified to eliminate the guesswork in designs 
where inductive loads are switched and offer additional safety margin
against unexpected voltage transients.
• Ultra Low RDS(on) Provides Higher Efficiency and Extends Battery
Life 

• Logic Level Gate Drive – Can Be Driven by Logic ICs


• Miniature SO–8 Surface Mount Package – Saves Board Space 

• Diode Is Characterized for Use In Bridge Circuits


• Diode Exhibits High Speed, With Soft Recovery MARKING
• IDSS Specified at Elevated Temperature DIAGRAM

• Avalanche Energy Specified


• Mounting Information for SO–8 Package Provided SO–8
S5N02
8 CASE 751
LYWW
STYLE 13
MAXIMUM RATINGS (TJ = 25°C unless otherwise noted)
1
Rating Symbol Value Unit
Drain–to–Source Voltage VDSS 20 Vdc L = Location Code
Drain–to–Gate Voltage (RGS = 1.0 MΩ) VDGR 20 Vdc Y = Year
WW = Work Week
Gate–to–Source Voltage – Continuous VGS ± 20 Vdc
Drain Current – Continuous @ TA = 25°C ID 8.2 Adc
Drain Current – Continuous @ TA = 100°C ID 5.6
PIN ASSIGNMENT
Drain Current – Single Pulse (tp ≤ 10 µs) IDM 41 Apk
Total Power Dissipation @ TA = 25°C PD 2.5 Watts N–C 1 8 Drain
(Note 1.)
Source 2 7 Drain
Operating and Storage Temperature Range TJ, Tstg – 55 to °C
Source 3 6 Drain
150
Gate 4 5 Drain
Single Pulse Drain–to–Source Avalanche EAS 675 mJ
Energy – Starting TJ = 25°C Top View
(VDD = 20 Vdc, VGS = 5.0 Vdc, Peak
IL = 15 Apk, L = 6.0 mH, RG = 25 Ω)
ORDERING INFORMATION
Thermal Resistance – Junction to Ambient RθJA 50 °C/W
(Note 1.) Device Package Shipping
Maximum Lead Temperature for Soldering TL 260 °C
Purposes, 1/8″ from case for 10 seconds MMSF5N02HDR2 SO–8 2500 Tape & Reel
1. Mounted on 2″ square FR4 board (1″ sq. 2 oz. Cu 0.06″ thick single sided),
10 sec. max.
Preferred devices are recommended choices for future use
and best overall value.

 Semiconductor Components Industries, LLC, 2000 724 Publication Order Number:


November, 2000 – Rev. 6 MMSF5N02HD/D
MMSF5N02HD

ELECTRICAL CHARACTERISTICS (TC = 25°C unless otherwise noted)


Characteristic Symbol Min Typ Max Unit
OFF CHARACTERISTICS
Drain–to–Source Breakdown Voltage V(BR)DSS Vdc
(VGS = 0 Vdc, ID = 250 µAdc) 20 – –
Temperature Coefficient (Positive) – 41 – mV/°C
Zero Gate Voltage Drain Current IDSS µAdc
(VDS = 20 Vdc, VGS = 0 Vdc) – 0.02 1.0
(VDS = 20 Vdc, VGS = 0 Vdc, TJ = 125°C) – – 10
Gate–Body Leakage Current (VGS = ± 20 Vdc, VDS = 0) IGSS – – 100 nAdc
ON CHARACTERISTICS (Note 2.)
Gate Threshold Voltage VGS(th) Vdc
(VDS = VGS, ID = 250 µAdc) 1.0 1.5 2.0
Temperature Coefficient (Negative) – 4.0 – mV/°C
Static Drain–to–Source On–Resistance RDS(on) Ohm
(VGS = 10 Vdc, ID = 5.0 Adc) – 0.0185 0.025
(VGS = 4.5 Vdc, ID = 2.5 Adc) – 0.0219 0.040
Forward Transconductance (VDS = 15 Vdc, ID = 2.5 Adc) gFS 3.0 12 – Mhos
DYNAMIC CHARACTERISTICS
Input Capacitance Ciss – 1130 1582 pF
Output Capacitance (VDS = 16 Vd
Vdc, VGS = 0 Vd
Vdc,
Coss – 464 650
f = 1.0 MHz)
Transfer Capacitance Crss – 117 235
SWITCHING CHARACTERISTICS (Note 3.)
Turn–On Delay Time td(on) – 15 30 ns
Rise Time (VDD = 10 Vdc, ID = 5.0 Adc, tr – 93 185
VGS = 4
4.55 Vdc
Vdc,
Turn–Off Delay Time RG = 6.0 Ω) td(off) – 35 70
Fall Time tf – 40 80
Turn–On Delay Time td(on) – 9.0 –
Rise Time (VDD = 10 Vdc, ID = 5.0 Adc, tr – 53 –
VGS = 10 Vdc
Vdc,
Turn–Off Delay Time RG = 6.0 Ω) td(off) – 56 –
Fall Time tf – 39 –
Gate Charge QT – 30.3 43 nC
S Fi
See Figure 8
(VDS = 16 Vdc, ID = 5.0 Adc, Q1 – 3.0 –
VGS = 10 Vdc) Q2 – 7.5 –
Q3 – 6.0 –

SOURCE–DRAIN DIODE CHARACTERISTICS


Forward On–Voltage (Note 2.) (IS = 5.0 Adc, VGS = 0 Vdc) VSD Vdc
(IS = 5.0 Adc, VGS = 0 Vdc, – 0.82 1.0
TJ = 125°C) – 0.69 –
Reverse Recovery Time trr – 32 – ns
S Fi
See Figure 15
(IS = 5.0 Adc, VGS = 0 Vdc, ta – 24 –
dIS/dt = 100 A/µs) tb – 8.0 –
Reverse Recovery Stored Charge QRR – 0.045 – µC
2. Pulse Test: Pulse Width ≤ 300 µs, Duty Cycle ≤ 2%.
3. Switching characteristics are independent of operating junction temperature.

http://onsemi.com
725
MMSF5N02HD

TYPICAL ELECTRICAL CHARACTERISTICS

 
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Figure 3. On–Resistance versus Figure 4. On–Resistance versus Drain Current


Gate–to–Source Voltage and Gate Voltage

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Figure 5. On–Resistance Variation with Figure 6. Drain–To–Source Leakage


Temperature Current versus Voltage

http://onsemi.com
726
MMSF5N02HD

POWER MOSFET SWITCHING

Switching behavior is most easily modeled and predicted The capacitance (Ciss) is read from the capacitance curve at
by recognizing that the power MOSFET is charge a voltage corresponding to the off–state condition when
controlled. The lengths of various switching intervals (∆t) calculating td(on) and is read at a voltage corresponding to the
are determined by how fast the FET input capacitance can on–state when calculating td(off).
be charged by current from the generator. At high switching speeds, parasitic circuit elements
The published capacitance data is difficult to use for complicate the analysis. The inductance of the MOSFET
calculating rise and fall because drain–gate capacitance source lead, inside the package and in the circuit wiring
varies greatly with applied voltage. Accordingly, gate which is common to both the drain and gate current paths,
charge data is used. In most cases, a satisfactory estimate of produces a voltage at the source which reduces the gate drive
average input current (IG(AV)) can be made from a current. The voltage is determined by Ldi/dt, but since di/dt
rudimentary analysis of the drive circuit so that is a function of drain current, the mathematical solution is
t = Q/IG(AV) complex. The MOSFET output capacitance also
complicates the mathematics. And finally, MOSFETs have
During the rise and fall time interval when switching a finite internal gate resistance which effectively adds to the
resistive load, VGS remains virtually constant at a level resistance of the driving source, but the internal resistance
known as the plateau voltage, VSGP. Therefore, rise and fall is difficult to measure and, consequently, is not specified.
times may be approximated by the following: The resistive switching time variation versus gate
tr = Q2 x RG/(VGG – VGSP) resistance (Figure 9) shows how typical switching
tf = Q2 x RG/VGSP performance is affected by the parasitic circuit elements. If
where the parasitics were not present, the slope of the curves would
maintain a value of unity regardless of the switching speed.
VGG = the gate drive voltage, which varies from zero to VGG
The circuit used to obtain the data is constructed to minimize
RG = the gate drive resistance
common inductance in the drain and gate circuit loops and
and Q2 and VGSP are read from the gate charge curve.
is believed readily achievable with board mounted
During the turn–on and turn–off delay times, gate current is components. Most power electronic loads are inductive; the
not constant. The simplest calculation uses appropriate data in the figure is taken with a resistive load, which
values from the capacitance curves in a standard equation for approximates an optimally snubbed inductive load. Power
voltage change in an RC network. The equations are: MOSFETs may be safely operated into an inductive load;
td(on) = RG Ciss In [VGG/(VGG – VGSP)] however, snubbing reduces switching losses.
td(off) = RG Ciss In (VGG/VGSP)

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Figure 7. Capacitance Variation

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727
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Figure 8. Gate–To–Source and Drain–To–Source Figure 9. Resistive Switching Time


Voltage versus Total Charge Variation versus Gate Resistance

DRAIN–TO–SOURCE DIODE CHARACTERISTICS

The switching characteristics of a MOSFET body diode high di/dts. The diode’s negative di/dt during ta is directly
are very important in systems using it as a freewheeling or controlled by the device clearing the stored charge.
commutating diode. Of particular interest are the reverse However, the positive di/dt during tb is an uncontrollable
recovery characteristics which play a major role in diode characteristic and is usually the culprit that induces
determining switching losses, radiated noise, EMI and RFI. current ringing. Therefore, when comparing diodes, the
System switching losses are largely due to the nature of ratio of tb/ta serves as a good indicator of recovery
the body diode itself. The body diode is a minority carrier abruptness and thus gives a comparative estimate of
device, therefore it has a finite reverse recovery time, trr, due probable noise generated. A ratio of 1 is considered ideal and
to the storage of minority carrier charge, QRR, as shown in values less than 0.5 are considered snappy.
the typical reverse recovery wave form of Figure 15. It is this Compared to ON Semiconductor standard cell density
stored charge that, when cleared from the diode, passes low voltage MOSFETs, high cell density MOSFET diodes
through a potential and defines an energy loss. Obviously, are faster (shorter trr), have less stored charge and a softer
repeatedly forcing the diode through reverse recovery reverse recovery characteristic. The softness advantage of
further increases switching losses. Therefore, one would the high cell density diode means they can be forced through
like a diode with short trr and low QRR specifications to reverse recovery at a higher di/dt than a standard cell
minimize these losses. MOSFET diode without increasing the current ringing or the
The abruptness of diode reverse recovery effects the noise generated. In addition, power dissipation incurred
amount of radiated noise, voltage spikes, and current from switching the diode will be less due to the shorter
ringing. The mechanisms at work are finite irremovable recovery time and lower switching losses.
circuit parasitic inductances and capacitances acted upon by
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Figure 10. Diode Forward Voltage versus Current

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728
MMSF5N02HD

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Figure 11. Reverse Recovery Time (trr)

SAFE OPERATING AREA

The Forward Biased Safe Operating Area curves define reliable operation, the stored energy from circuit inductance
the maximum simultaneous drain–to–source voltage and dissipated in the transistor while in avalanche must be less
drain current that a transistor can handle safely when it is than the rated limit and must be adjusted for operating
forward biased. Curves are based upon maximum peak conditions differing from those specified. Although industry
junction temperature and a case temperature (TC) of 25°C. practice is to rate in terms of energy, avalanche energy
Peak repetitive pulsed power limits are determined by using capability is not a constant. The energy rating decreases
the thermal response data in conjunction with the procedures non–linearly with an increase of peak current in avalanche
discussed in AN569, “Transient Thermal Resistance – and peak junction temperature.
General Data and Its Use.” Although many E–FETs can withstand the stress of
Switching between the off–state and the on–state may drain–to–source avalanche at currents up to rated pulsed
traverse any load line provided neither rated peak current current (IDM), the energy rating is specified at rated
(IDM) nor rated voltage (VDSS) is exceeded, and that the continuous current (ID), in accordance with industry
transition time (tr, tf) does not exceed 10 µs. In addition the custom. The energy rating must be derated for temperature
total power averaged over a complete switching cycle must as shown in the accompanying graph (Figure 13). Maximum
not exceed (TJ(MAX) – TC)/(RθJC). energy at currents below rated continuous ID can safely be
A power MOSFET designated E–FET can be safely used assumed to equal the values indicated.
in switching circuits with unclamped inductive loads. For

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Figure 12. Maximum Rated Forward Biased Figure 13. Maximum Avalanche Energy versus
Safe Operating Area Starting Junction Temperature

http://onsemi.com
729
MMSF5N02HD

TYPICAL ELECTRICAL CHARACTERISTICS



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Figure 14. Thermal Response

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Figure 15. Diode Reverse Recovery Waveform

http://onsemi.com
730
MMSF5N02HD

INFORMATION FOR USING THE SO–8 SURFACE MOUNT PACKAGE

MINIMUM RECOMMENDED FOOTPRINT FOR SURFACE MOUNTED APPLICATIONS


Surface mount board layout is a critical portion of the total interface between the board and the package. With the
design. The footprint for the semiconductor packages must correct pad geometry, the packages will self–align when
be the correct size to ensure proper solder connection subjected to a solder reflow process.
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SO–8 POWER DISSIPATION


The power dissipation of the SO–8 is a function of the into the equation for an ambient temperature TA of 25°C,
input pad size. This can vary from the minimum pad size one can calculate the power dissipation of the device which
for soldering to the pad size given for maximum power in this case is 2.5 Watts.
dissipation. Power dissipation for a surface mount device is 150°C – 25°C
determined by TJ(max), the maximum rated junction PD = = 2.5 Watts
50°C/W
temperature of the die, RθJA, the thermal resistance from
the device junction to ambient; and the operating The 50°C/W for the SO–8 package assumes the
temperature, TA. Using the values provided on the data recommended footprint on a glass epoxy printed circuit
sheet for the SO–8 package, PD can be calculated as board to achieve a power dissipation of 2.5 Watts using the
follows: footprint shown. Another alternative would be to use a
TJ(max) – TA
ceramic substrate or an aluminum core board such as
PD = Thermal Cladt. Using board material such as Thermal
RθJA
Clad, the power dissipation can be doubled using the same
The values for the equation are found in the maximum footprint.
ratings table on the data sheet. Substituting these values

SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • The soldering temperature and time shall not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within • When shifting from preheating to soldering, the
a short time could result in device failure. Therefore, the maximum temperature gradient shall be 5°C or less.
following items should always be observed in order to • After soldering has been completed, the device should
minimize the thermal stress to which the devices are be allowed to cool naturally for at least three minutes.
subjected. Gradual cooling should be used as the use of forced
• Always preheat the device. cooling will increase the temperature gradient and
• The delta temperature between the preheat and result in latent failure due to mechanical stress.
soldering should be 100°C or less.* • Mechanical stress or shock should not be applied
• When preheating and soldering, the temperature of the during cooling.
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When * Soldering a device without preheating can cause
using infrared heating with the reflow soldering excessive thermal shock and stress which can result in
method, the difference shall be a maximum of 10°C. damage to the device.

http://onsemi.com
731
MMSF5N02HD

TYPICAL SOLDER HEATING PROFILE


For any given circuit board, there will be a group of temperature versus time. The line on the graph shows the
control settings that will give the desired heat pattern. The actual temperature that might be experienced on the surface
operator must set temperatures for several heating zones of a test board at or near a central solder joint. The two
and a figure for belt speed. Taken together, these control profiles are based on a high density and a low density
settings make up a heating “profile” for that particular board. The Vitronics SMD310 convection/infrared reflow
circuit board. On machines controlled by a computer, the soldering system was used to generate this profile. The type
computer remembers these profiles from one operating of solder used was 62/36/2 Tin Lead Silver with a melting
session to the next. Figure 16 shows a typical heating point between 177–189°C. When this type of furnace is
profile for use when soldering a surface mount device to a used for solder reflow work, the circuit boards and solder
printed circuit board. This profile will vary among joints tend to heat first. The components on the board are
soldering systems, but it is a good starting point. Factors then heated by conduction. The circuit board, because it has
that can affect the profile include the type of soldering a large surface area, absorbs the thermal energy more
system in use, density and types of components on the efficiently, then distributes this energy to the components.
board, type of solder used, and the type of board or Because of this effect, the main body of a component may
substrate material being used. This profile shows be up to 30 degrees cooler than the adjacent solder joints.

STEP 1 STEP 2 STEP 3 STEP 4 STEP 5 STEP 6 STEP 7


PREHEAT VENT HEATING HEATING HEATING VENT COOLING
ZONE 1 “SOAK” ZONES 2 & 5 ZONES 3 & 6 ZONES 4 & 7
“RAMP” “RAMP” “SOAK” “SPIKE” 205° TO 219°C
PEAK AT
200°C DESIRED CURVE FOR HIGH 170°C SOLDER
MASS ASSEMBLIES JOINT
160°C
150°C

150°C
SOLDER IS LIQUID FOR
40 TO 80 SECONDS
100°C 140°C (DEPENDING ON
MASS OF ASSEMBLY)
100°C

DESIRED CURVE FOR LOW


MASS ASSEMBLIES
5°C

TIME (3 TO 7 MINUTES TOTAL) TMAX


Figure 16. Typical Solder Heating Profile

http://onsemi.com
732
(!.
Preferred Device

#$%& '(
  !  
N–Channel SO–8
These miniature surface mount MOSFETs feature ultra low RDS(on)
and true logic level performance. They are capable of withstanding
high energy in the avalanche and commutation modes and the http://onsemi.com
drain–to–source diode has a very low reverse recovery time.
MiniMOSt devices are designed for use in low voltage, high speed 5 AMPERES
switching applications where power efficiency is important. Typical 30 VOLTS
applications are dc–dc converters, and power management in portable
and battery powered products such as computers, printers, cellular and
RDS(on) = 40 m
cordless phones. They can also be used for low voltage motor controls
in mass storage products such as disk drives and tape drives. The N–Channel
avalanche energy is specified to eliminate the guesswork in designs 
where inductive loads are switched and offer additional safety margin
against unexpected voltage transients.
• Ultra Low RDS(on) Provides Higher Efficiency and Extends Battery
Life 

• Logic Level Gate Drive – Can Be Driven by Logic ICs


• Miniature SO–8 Surface Mount Package – Saves Board Space 

• Diode Is Characterized for Use In Bridge Circuits


• Diode Exhibits High Speed, With Soft Recovery MARKING
• IDSS Specified at Elevated Temperature DIAGRAM

• Avalanche Energy Specified


• Mounting Information for SO–8 Package Provided SO–8
S5N03
8 CASE 751
LYWW
STYLE 13
MAXIMUM RATINGS (TJ = 25°C unless otherwise noted)
1
Rating Symbol Value Unit
Drain–to–Source Voltage VDSS 30 Vdc L = Location Code
Drain–to–Gate Voltage (RGS = 1.0 MΩ) VDGR 30 Vdc Y = Year
WW = Work Week
Gate–to–Source Voltage – Continuous VGS ± 20 Vdc
Drain Current – Continuous @ TA = 25°C ID 6.5 Adc
Drain Current – Continuous @ TA = 100°C ID 4.4 PIN ASSIGNMENT
Drain Current – Single Pulse (tp ≤ 10 µs) IDM 33 Apk
Total Power Dissipation @ TA = 25°C PD 2.5 Watts N–C 1 8 Drain
(Note 1.)
Source 2 7 Drain
Operating and Storage Temperature Range TJ, Tstg – 55 to °C
Source 3 6 Drain
150
Gate 4 5 Drain
Single Pulse Drain–to–Source Avalanche EAS 450 mJ
Energy – Starting TJ = 25°C Top View
(VDD = 30 Vdc, VGS = 5.0 Vdc, Peak
IL = 15 Apk, L = 4.0 mH, RG = 25 Ω)
Thermal Resistance – Junction to Ambient RθJA 50 °C/W
ORDERING INFORMATION
(Note 1.)
Device Package Shipping
Maximum Lead Temperature for Soldering TL 260 °C
Purposes, 1/8″ from case for 10 seconds MMSF5N03HDR2 SO–8 2500 Tape & Reel
1. Mounted on 2″ square FR4 board (1″ sq. 2 oz. Cu 0.06″ thick single sided),
10 sec. max.
Preferred devices are recommended choices for future use
and best overall value.

 Semiconductor Components Industries, LLC, 2000 733 Publication Order Number:


November, 2000 – Rev. 6 MMSF5N03HD/D
MMSF5N03HD

ELECTRICAL CHARACTERISTICS (TC = 25°C unless otherwise noted)


Characteristic Symbol Min Typ Max Unit
OFF CHARACTERISTICS
Drain–to–Source Breakdown Voltage V(BR)DSS Vdc
(VGS = 0 Vdc, ID = 250 µAdc) 30 – –
Temperature Coefficient (Positive) – 34 – mV/°C
Zero Gate Voltage Drain Current IDSS µAdc
(VDS = 30 Vdc, VGS = 0 Vdc) – – 1.0
(VDS = 30 Vdc, VGS = 0 Vdc, TJ = 125°C) – – 10
Gate–Body Leakage Current (VGS = ± 20 Vdc, VDS = 0) IGSS – – 100 nAdc
ON CHARACTERISTICS (Note 2.)
Gate Threshold Voltage VGS(th) Vdc
(VDS = VGS, ID = 250 µAdc) 1.0 2.0 3.0
Temperature Coefficient (Negative) – 5.0 – mV/°C
Static Drain–Source On–Resistance RDS(on) Ohms
(VGS = 10 Vdc, ID = 5.0 Adc) – 0.033 0.040
(VGS = 4.5 Vdc, ID = 2.5 Adc) – 0.04 0.050
Forward Transconductance (VDS = 3 Vdc, ID = 2.5 Adc) gFS 3.0 8.0 – Mhos
DYNAMIC CHARACTERISTICS
Input Capacitance Ciss – 1207 1680 pF
Output Capacitance (VDS = 24 Vd
Vdc, VGS = 0 Vd
Vdc,
Coss – 354 490
f = 1.0 MHz)
Transfer Capacitance Crss – 62 120
SWITCHING CHARACTERISTICS (Note 3.)
Turn–On Delay Time td(on) – 20 40 ns
Rise Time (VDD = 15 Vdc, ID = 5.0 Adc, tr – 108 216
VGS = 4
4.55 Vdc
Vdc,
Turn–Off Delay Time RG = 9.1 Ω) td(off) – 36 72
Fall Time tf – 37 74
Turn–On Delay Time td(on) – 11 22
Rise Time (VDD = 15 Vdc, ID = 5.0 Adc, tr – 36 72
VGS = 10 Vdc
Vdc,
Turn–Off Delay Time RG = 9.1 Ω) td(off) – 68 136
Fall Time tf – 38 76
Gate Charge QT – 15.2 21 nC
S Fi
See Figure 8
(VDS = 24 Vdc, ID = 5.0 Adc, Q1 – 3.4 –
VGS = 10 Vdc) Q2 – 6.6 –
Q3 – 5.6 –

SOURCE–DRAIN DIODE CHARACTERISTICS


Forward On–Voltage (Note 2.) VSD Vdc
(IS = 5 Adc, VGS = 0 Vdc)
– 0.88 1.3
(IS = 5 Adc, VGS = 0 Vdc, TJ = 125°C)
– 0.77 –
Reverse Recovery Time trr – 33 – ns
S Fi
See Figure 15
(IS = 5.0 Adc, VGS = 0 Vdc, ta – 21 –
dIS/dt = 100 A/µs) tb – 12 –
Reverse Recovery Stored Charge QRR – 0.037 – µC
2. Pulse Test: Pulse Width ≤ 300 µs, Duty Cycle ≤ 2%.
3. Switching characteristics are independent of operating junction temperature.

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734
MMSF5N03HD

TYPICAL ELECTRICAL CHARACTERISTICS

 
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Figure 3. On–Resistance versus Figure 4. On–Resistance versus Drain Current


Gate–To–Source Voltage and Gate Voltage

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Figure 5. On–Resistance Variation with Figure 6. Drain–To–Source Leakage


Temperature Current versus Voltage

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735
MMSF5N03HD

POWER MOSFET SWITCHING

Switching behavior is most easily modeled and predicted The capacitance (Ciss) is read from the capacitance curve at
by recognizing that the power MOSFET is charge a voltage corresponding to the off–state condition when
controlled. The lengths of various switching intervals (∆t) calculating td(on) and is read at a voltage corresponding to the
are determined by how fast the FET input capacitance can on–state when calculating td(off).
be charged by current from the generator. At high switching speeds, parasitic circuit elements
The published capacitance data is difficult to use for complicate the analysis. The inductance of the MOSFET
calculating rise and fall because drain–gate capacitance source lead, inside the package and in the circuit wiring
varies greatly with applied voltage. Accordingly, gate which is common to both the drain and gate current paths,
charge data is used. In most cases, a satisfactory estimate of produces a voltage at the source which reduces the gate drive
average input current (IG(AV)) can be made from a current. The voltage is determined by Ldi/dt, but since di/dt
rudimentary analysis of the drive circuit so that is a function of drain current, the mathematical solution is
t = Q/IG(AV) complex. The MOSFET output capacitance also
complicates the mathematics. And finally, MOSFETs have
During the rise and fall time interval when switching a finite internal gate resistance which effectively adds to the
resistive load, VGS remains virtually constant at a level resistance of the driving source, but the internal resistance
known as the plateau voltage, VSGP. Therefore, rise and fall is difficult to measure and, consequently, is not specified.
times may be approximated by the following: The resistive switching time variation versus gate
tr = Q2 x RG/(VGG – VGSP) resistance (Figure 9) shows how typical switching
tf = Q2 x RG/VGSP performance is affected by the parasitic circuit elements. If
where the parasitics were not present, the slope of the curves would
maintain a value of unity regardless of the switching speed.
VGG = the gate drive voltage, which varies from zero to VGG
The circuit used to obtain the data is constructed to minimize
RG = the gate drive resistance
common inductance in the drain and gate circuit loops and
and Q2 and VGSP are read from the gate charge curve.
is believed readily achievable with board mounted
During the turn–on and turn–off delay times, gate current is components. Most power electronic loads are inductive; the
not constant. The simplest calculation uses appropriate data in the figure is taken with a resistive load, which
values from the capacitance curves in a standard equation for approximates an optimally snubbed inductive load. Power
voltage change in an RC network. The equations are: MOSFETs may be safely operated into an inductive load;
td(on) = RG Ciss In [VGG/(VGG – VGSP)] however, snubbing reduces switching losses.
td(off) = RG Ciss In (VGG/VGSP)

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736
MMSF5N03HD

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Figure 8. Gate–To–Source and Drain–To–Source Figure 9. Resistive Switching Time


Voltage versus Total Charge Variation versus Gate Resistance

DRAIN–TO–SOURCE DIODE CHARACTERISTICS

The switching characteristics of a MOSFET body diode high di/dts. The diode’s negative di/dt during ta is directly
are very important in systems using it as a freewheeling or controlled by the device clearing the stored charge.
commutating diode. Of particular interest are the reverse However, the positive di/dt during tb is an uncontrollable
recovery characteristics which play a major role in diode characteristic and is usually the culprit that induces
determining switching losses, radiated noise, EMI and RFI. current ringing. Therefore, when comparing diodes, the
System switching losses are largely due to the nature of ratio of tb/ta serves as a good indicator of recovery
the body diode itself. The body diode is a minority carrier abruptness and thus gives a comparative estimate of
device, therefore it has a finite reverse recovery time, trr, due probable noise generated. A ratio of 1 is considered ideal and
to the storage of minority carrier charge, QRR, as shown in values less than 0.5 are considered snappy.
the typical reverse recovery wave form of Figure 15. It is this Compared to ON Semiconductor standard cell density
stored charge that, when cleared from the diode, passes low voltage MOSFETs, high cell density MOSFET diodes
through a potential and defines an energy loss. Obviously, are faster (shorter trr), have less stored charge and a softer
repeatedly forcing the diode through reverse recovery reverse recovery characteristic. The softness advantage of
further increases switching losses. Therefore, one would the high cell density diode means they can be forced through
like a diode with short trr and low QRR specifications to reverse recovery at a higher di/dt than a standard cell
minimize these losses. MOSFET diode without increasing the current ringing or the
The abruptness of diode reverse recovery effects the noise generated. In addition, power dissipation incurred
amount of radiated noise, voltage spikes, and current from switching the diode will be less due to the shorter
ringing. The mechanisms at work are finite irremovable recovery time and lower switching losses.
circuit parasitic inductances and capacitances acted upon by
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Figure 10. Diode Forward Voltage versus Current

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737
MMSF5N03HD

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Figure 11. Reverse Recovery Time (trr)

SAFE OPERATING AREA

The Forward Biased Safe Operating Area curves define reliable operation, the stored energy from circuit inductance
the maximum simultaneous drain–to–source voltage and dissipated in the transistor while in avalanche must be less
drain current that a transistor can handle safely when it is than the rated limit and must be adjusted for operating
forward biased. Curves are based upon maximum peak conditions differing from those specified. Although industry
junction temperature and a case temperature (TC) of 25°C. practice is to rate in terms of energy, avalanche energy
Peak repetitive pulsed power limits are determined by using capability is not a constant. The energy rating decreases
the thermal response data in conjunction with the procedures non–linearly with an increase of peak current in avalanche
discussed in AN569, “Transient Thermal Resistance – and peak junction temperature.
General Data and Its Use.” Although many E–FETs can withstand the stress of
Switching between the off–state and the on–state may drain–to–source avalanche at currents up to rated pulsed
traverse any load line provided neither rated peak current current (IDM), the energy rating is specified at rated
(IDM) nor rated voltage (VDSS) is exceeded, and that the continuous current (ID), in accordance with industry
transition time (tr, tf) does not exceed 10 µs. In addition the custom. The energy rating must be derated for temperature
total power averaged over a complete switching cycle must as shown in the accompanying graph (Figure 13). Maximum
not exceed (TJ(MAX) – TC)/(RθJC). energy at currents below rated continuous ID can safely be
A power MOSFET designated E–FET can be safely used assumed to equal the values indicated.
in switching circuits with unclamped inductive loads. For

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Figure 12. Maximum Rated Forward Biased Figure 13. Maximum Avalanche Energy versus
Safe Operating Area Starting Junction Temperature

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738
MMSF5N03HD

TYPICAL ELECTRICAL CHARACTERISTICS



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739
MMSF5N03HD

INFORMATION FOR USING THE SO–8 SURFACE MOUNT PACKAGE

MINIMUM RECOMMENDED FOOTPRINT FOR SURFACE MOUNTED APPLICATIONS


Surface mount board layout is a critical portion of the total interface between the board and the package. With the
design. The footprint for the semiconductor packages must correct pad geometry, the packages will self–align when
be the correct size to ensure proper solder connection subjected to a solder reflow process.
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SO–8 POWER DISSIPATION


The power dissipation of the SO–8 is a function of the into the equation for an ambient temperature TA of 25°C,
input pad size. This can vary from the minimum pad size one can calculate the power dissipation of the device which
for soldering to the pad size given for maximum power in this case is 2.5 Watts.
dissipation. Power dissipation for a surface mount device is 150°C – 25°C
determined by TJ(max), the maximum rated junction PD = = 2.5 Watts
50°C/W
temperature of the die, RθJA, the thermal resistance from
the device junction to ambient; and the operating The 50°C/W for the SO–8 package assumes the
temperature, TA. Using the values provided on the data recommended footprint on a glass epoxy printed circuit
sheet for the SO–8 package, PD can be calculated as board to achieve a power dissipation of 2.5 Watts using the
follows: footprint shown. Another alternative would be to use a
TJ(max) – TA
ceramic substrate or an aluminum core board such as
PD = Thermal Cladt. Using board material such as Thermal
RθJA
Clad, the power dissipation can be doubled using the same
The values for the equation are found in the maximum footprint.
ratings table on the data sheet. Substituting these values

SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • The soldering temperature and time shall not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within • When shifting from preheating to soldering, the
a short time could result in device failure. Therefore, the maximum temperature gradient shall be 5°C or less.
following items should always be observed in order to • After soldering has been completed, the device should
minimize the thermal stress to which the devices are be allowed to cool naturally for at least three minutes.
subjected. Gradual cooling should be used as the use of forced
• Always preheat the device. cooling will increase the temperature gradient and
• The delta temperature between the preheat and result in latent failure due to mechanical stress.
soldering should be 100°C or less.* • Mechanical stress or shock should not be applied
• When preheating and soldering, the temperature of the during cooling.
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When * Soldering a device without preheating can cause
using infrared heating with the reflow soldering excessive thermal shock and stress which can result in
method, the difference shall be a maximum of 10°C. damage to the device.

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740
MMSF5N03HD

TYPICAL SOLDER HEATING PROFILE


For any given circuit board, there will be a group of temperature versus time. The line on the graph shows the
control settings that will give the desired heat pattern. The actual temperature that might be experienced on the surface
operator must set temperatures for several heating zones of a test board at or near a central solder joint. The two
and a figure for belt speed. Taken together, these control profiles are based on a high density and a low density
settings make up a heating “profile” for that particular board. The Vitronics SMD310 convection/infrared reflow
circuit board. On machines controlled by a computer, the soldering system was used to generate this profile. The type
computer remembers these profiles from one operating of solder used was 62/36/2 Tin Lead Silver with a melting
session to the next. Figure 16 shows a typical heating point between 177–189°C. When this type of furnace is
profile for use when soldering a surface mount device to a used for solder reflow work, the circuit boards and solder
printed circuit board. This profile will vary among joints tend to heat first. The components on the board are
soldering systems, but it is a good starting point. Factors then heated by conduction. The circuit board, because it has
that can affect the profile include the type of soldering a large surface area, absorbs the thermal energy more
system in use, density and types of components on the efficiently, then distributes this energy to the components.
board, type of solder used, and the type of board or Because of this effect, the main body of a component may
substrate material being used. This profile shows be up to 30 degrees cooler than the adjacent solder joints.

STEP 1 STEP 2 STEP 3 STEP 4 STEP 5 STEP 6 STEP 7


PREHEAT VENT HEATING HEATING HEATING VENT COOLING
ZONE 1 “SOAK” ZONES 2 & 5 ZONES 3 & 6 ZONES 4 & 7
“RAMP” “RAMP” “SOAK” “SPIKE” 205° TO 219°C
PEAK AT
200°C DESIRED CURVE FOR HIGH 170°C SOLDER
MASS ASSEMBLIES JOINT
160°C
150°C

150°C
SOLDER IS LIQUID FOR
40 TO 80 SECONDS
100°C 140°C (DEPENDING ON
MASS OF ASSEMBLY)
100°C

DESIRED CURVE FOR LOW


MASS ASSEMBLIES
5°C

TIME (3 TO 7 MINUTES TOTAL) TMAX


Figure 16. Typical Solder Heating Profile

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741
("!.
Preferred Device

#$%& '(
"  !  
N–Channel SO–8
These miniature surface mount MOSFETs feature ultra low RDS(on)
and true logic level performance. They are capable of withstanding
high energy in the avalanche and commutation modes and the http://onsemi.com
drain–to–source diode has a very low reverse recovery time.
MiniMOSt devices are designed for use in low voltage, high speed 7 AMPERES
switching applications where power efficiency is important. Typical 30 VOLTS
applications are dc–dc converters, and power management in portable
and battery powered products such as computers, printers, cellular and
RDS(on) = 28 m
cordless phones. They can also be used for low voltage motor controls
in mass storage products such as disk drives and tape drives. The N–Channel
avalanche energy is specified to eliminate the guesswork in designs 
where inductive loads are switched and offer additional safety margin
against unexpected voltage transients.
• Ultra Low RDS(on) Provides Higher Efficiency and Extends Battery
Life 

• Logic Level Gate Drive – Can Be Driven by Logic ICs


• Miniature SO–8 Surface Mount Package – Saves Board Space 

• Diode Is Characterized for Use In Bridge Circuits


• Diode Exhibits High Speed, With Soft Recovery MARKING
• IDSS Specified at Elevated Temperature DIAGRAM

• Avalanche Energy Specified


• Mounting Information for SO–8 Package Provided SO–8
S7N03
8 CASE 751
LYWW
STYLE 13
MAXIMUM RATINGS (TJ = 25°C unless otherwise noted)
1
Rating Symbol Value Unit
Drain–to–Source Voltage VDSS 30 Vdc L = Location Code
Drain–to–Gate Voltage (RGS = 1.0 MΩ) VDGR 30 Vdc Y = Year
WW = Work Week
Gate–to–Source Voltage – Continuous VGS ± 20 Vdc
Drain Current – Continuous @ TA = 25°C ID 8.2 Adc
Drain Current – Continuous @ TA = 100°C ID 5.6 PIN ASSIGNMENT
Drain Current – Single Pulse (tp ≤ 10 µs) IDM 50 Apk
Total Power Dissipation @ TA = 25°C PD 2.5 Watts N–C 1 8 Drain
(Note 1.)
Source 2 7 Drain
Operating and Storage Temperature Range TJ, Tstg – 55 to °C
Source 3 6 Drain
150
Gate 4 5 Drain
Single Pulse Drain–to–Source Avalanche EAS 450 mJ
Energy – Starting TJ = 25°C Top View
(VDD = 30 Vdc, VGS = 5.0 Vdc, Peak
IL = 15 Apk, L = 4.0 mH, RG = 25 Ω)
Thermal Resistance – Junction to Ambient RθJA 50 °C/W
ORDERING INFORMATION
(Note 1.)
Device Package Shipping
Maximum Lead Temperature for Soldering TL 260 °C
Purposes, 1/8″ from case for 10 seconds MMSF7N03HDR2 SO–8 2500 Tape & Reel
1. Mounted on 2″ square FR4 board (1″ sq. 2 oz. Cu 0.06″ thick single sided),
10 sec. max.
Preferred devices are recommended choices for future use
and best overall value.

 Semiconductor Components Industries, LLC, 2000 742 Publication Order Number:


November, 2000 – Rev. 4 MMSF7N03HD/D
MMSF7N03HD

ELECTRICAL CHARACTERISTICS (TC = 25°C unless otherwise noted)


Characteristic Symbol Min Typ Max Unit
OFF CHARACTERISTICS
Drain–to–Source Breakdown Voltage V(BR)DSS Vdc
(VGS = 0 Vdc, ID = 250 µAdc) 30 – –
Temperature Coefficient (Positive) – 41 – mV/°C
Zero Gate Voltage Drain Current IDSS µAdc
(VDS = 30 Vdc, VGS = 0 Vdc) – 0.02 1.0
(VDS = 30 Vdc, VGS = 0 Vdc, TJ = 125°C) – – 10
Gate–Body Leakage Current (VGS = ± 20 Vdc, VDS = 0) IGSS – – 100 nAdc
ON CHARACTERISTICS (Note 2.)
Gate Threshold Voltage VGS(th) Vdc
(VDS = VGS, ID = 250 µAdc) 1.0 1.5 2.0
Temperature Coefficient (Negative) – 4.0 – mV/°C
Static Drain–Source On–Resistance RDS(on) Ohms
(VGS = 10 Vdc, ID = 7.0 Adc) – 0.023 0.028
(VGS = 4.5 Vdc, ID = 3.5 Adc) – 0.029 0.040
Forward Transconductance (VDS = 3 Vdc, ID = 2.5 Adc) gFS 3.0 12 – Mhos
DYNAMIC CHARACTERISTICS
Input Capacitance Ciss – 931 1190 pF
Output Capacitance (VDS = 24 Vd
Vdc, VGS = 0 Vd
Vdc,
Coss – 371 490
f = 1.0 MHz)
Transfer Capacitance Crss – 89 120
SWITCHING CHARACTERISTICS (Note 3.)
Turn–On Delay Time td(on) – 15 30 ns
Rise Time (VDD = 10 Vdc, ID = 5.0 Adc, tr – 93 185
VGS = 4
4.55 Vdc
Vdc,
Turn–Off Delay Time RG = 9.1 Ω) td(off) – 35 70
Fall Time tf – 40 80
Turn–On Delay Time td(on) – 9.0 –
Rise Time (VDD = 10 Vdc, ID = 5.0 Adc, tr – 53 –
VGS = 10 Vdc
Vdc,
Turn–Off Delay Time RG = 9.1 Ω) td(off) – 56 –
Fall Time tf – 39
Gate Charge QT – 30 43 nC
S Fi
See Figure 8
(VDS = 16 Vdc, ID = 5.0 Adc, Q1 – 3.0 –
VGS = 10 Vdc) Q2 – 7.5 –
Q3 – 6.0 –

SOURCE–DRAIN DIODE CHARACTERISTICS


Forward On–Voltage (Note 2.) (IS = 7.0 Adc, VGS = 0 Vdc) VSD Vdc
(IS = 7.0 Adc, VGS = 0 Vdc, – 0.82 1.0
TJ = 125°C) – 0.69 –
Reverse Recovery Time trr – 32 – ns
S Fi
See Figure 15
(IS = 7.0 Adc, VGS = 0 Vdc, ta – 24 –
dIS/dt = 100 A/µs) tb – 8.0 –
Reverse Recovery Stored Charge QRR – 0.045 – µC
2. Pulse Test: Pulse Width ≤ 300 µs, Duty Cycle ≤ 2%.
3. Switching characteristics are independent of operating junction temperature.

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743
MMSF7N03HD

TYPICAL ELECTRICAL CHARACTERISTICS

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Figure 3. On–Resistance versus Figure 4. On–Resistance versus Drain Current


Gate–To–Source Voltage and Gate Voltage

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Figure 5. On–Resistance Variation with Figure 6. Drain–To–Source Leakage


Temperature Current versus Voltage

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744
MMSF7N03HD

POWER MOSFET SWITCHING

Switching behavior is most easily modeled and predicted The capacitance (Ciss) is read from the capacitance curve at
by recognizing that the power MOSFET is charge a voltage corresponding to the off–state condition when
controlled. The lengths of various switching intervals (∆t) calculating td(on) and is read at a voltage corresponding to the
are determined by how fast the FET input capacitance can on–state when calculating td(off).
be charged by current from the generator. At high switching speeds, parasitic circuit elements
The published capacitance data is difficult to use for complicate the analysis. The inductance of the MOSFET
calculating rise and fall because drain–gate capacitance source lead, inside the package and in the circuit wiring
varies greatly with applied voltage. Accordingly, gate which is common to both the drain and gate current paths,
charge data is used. In most cases, a satisfactory estimate of produces a voltage at the source which reduces the gate drive
average input current (IG(AV)) can be made from a current. The voltage is determined by Ldi/dt, but since di/dt
rudimentary analysis of the drive circuit so that is a function of drain current, the mathematical solution is
t = Q/IG(AV) complex. The MOSFET output capacitance also
complicates the mathematics. And finally, MOSFETs have
During the rise and fall time interval when switching a finite internal gate resistance which effectively adds to the
resistive load, VGS remains virtually constant at a level resistance of the driving source, but the internal resistance
known as the plateau voltage, VSGP. Therefore, rise and fall is difficult to measure and, consequently, is not specified.
times may be approximated by the following: The resistive switching time variation versus gate
tr = Q2 x RG/(VGG – VGSP) resistance (Figure 9) shows how typical switching
tf = Q2 x RG/VGSP performance is affected by the parasitic circuit elements. If
where the parasitics were not present, the slope of the curves would
maintain a value of unity regardless of the switching speed.
VGG = the gate drive voltage, which varies from zero to VGG
The circuit used to obtain the data is constructed to minimize
RG = the gate drive resistance
common inductance in the drain and gate circuit loops and
and Q2 and VGSP are read from the gate charge curve.
is believed readily achievable with board mounted
During the turn–on and turn–off delay times, gate current is components. Most power electronic loads are inductive; the
not constant. The simplest calculation uses appropriate data in the figure is taken with a resistive load, which
values from the capacitance curves in a standard equation for approximates an optimally snubbed inductive load. Power
voltage change in an RC network. The equations are: MOSFETs may be safely operated into an inductive load;
td(on) = RG Ciss In [VGG/(VGG – VGSP)] however, snubbing reduces switching losses.
td(off) = RG Ciss In (VGG/VGSP)

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Figure 8. Gate–To–Source and Drain–To–Source Figure 9. Resistive Switching Time


Voltage versus Total Charge Variation versus Gate Resistance

DRAIN–TO–SOURCE DIODE CHARACTERISTICS

The switching characteristics of a MOSFET body diode high di/dts. The diode’s negative di/dt during ta is directly
are very important in systems using it as a freewheeling or controlled by the device clearing the stored charge.
commutating diode. Of particular interest are the reverse However, the positive di/dt during tb is an uncontrollable
recovery characteristics which play a major role in diode characteristic and is usually the culprit that induces
determining switching losses, radiated noise, EMI and RFI. current ringing. Therefore, when comparing diodes, the
System switching losses are largely due to the nature of ratio of tb/ta serves as a good indicator of recovery
the body diode itself. The body diode is a minority carrier abruptness and thus gives a comparative estimate of
device, therefore it has a finite reverse recovery time, trr, due probable noise generated. A ratio of 1 is considered ideal and
to the storage of minority carrier charge, QRR, as shown in values less than 0.5 are considered snappy.
the typical reverse recovery wave form of Figure 15. It is this Compared to ON Semiconductor standard cell density
stored charge that, when cleared from the diode, passes low voltage MOSFETs, high cell density MOSFET diodes
through a potential and defines an energy loss. Obviously, are faster (shorter trr), have less stored charge and a softer
repeatedly forcing the diode through reverse recovery reverse recovery characteristic. The softness advantage of
further increases switching losses. Therefore, one would the high cell density diode means they can be forced through
like a diode with short trr and low QRR specifications to reverse recovery at a higher di/dt than a standard cell
minimize these losses. MOSFET diode without increasing the current ringing or the
The abruptness of diode reverse recovery effects the noise generated. In addition, power dissipation incurred
amount of radiated noise, voltage spikes, and current from switching the diode will be less due to the shorter
ringing. The mechanisms at work are finite irremovable recovery time and lower switching losses.
circuit parasitic inductances and capacitances acted upon by
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Figure 10. Diode Forward Voltage versus Current

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SAFE OPERATING AREA

The Forward Biased Safe Operating Area curves define reliable operation, the stored energy from circuit inductance
the maximum simultaneous drain–to–source voltage and dissipated in the transistor while in avalanche must be less
drain current that a transistor can handle safely when it is than the rated limit and must be adjusted for operating
forward biased. Curves are based upon maximum peak conditions differing from those specified. Although industry
junction temperature and a case temperature (TC) of 25°C. practice is to rate in terms of energy, avalanche energy
Peak repetitive pulsed power limits are determined by using capability is not a constant. The energy rating decreases
the thermal response data in conjunction with the procedures non–linearly with an increase of peak current in avalanche
discussed in AN569, “Transient Thermal Resistance – and peak junction temperature.
General Data and Its Use.” Although many E–FETs can withstand the stress of
Switching between the off–state and the on–state may drain–to–source avalanche at currents up to rated pulsed
traverse any load line provided neither rated peak current current (IDM), the energy rating is specified at rated
(IDM) nor rated voltage (VDSS) is exceeded, and that the continuous current (ID), in accordance with industry
transition time (tr, tf) does not exceed 10 µs. In addition the custom. The energy rating must be derated for temperature
total power averaged over a complete switching cycle must as shown in the accompanying graph (Figure 13). Maximum
not exceed (TJ(MAX) – TC)/(RθJC). energy at currents below rated continuous ID can safely be
A power MOSFET designated E–FET can be safely used assumed to equal the values indicated.
in switching circuits with unclamped inductive loads. For

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Safe Operating Area Starting Junction Temperature

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TYPICAL ELECTRICAL CHARACTERISTICS



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748
MMSF7N03HD

INFORMATION FOR USING THE SO–8 SURFACE MOUNT PACKAGE

MINIMUM RECOMMENDED FOOTPRINT FOR SURFACE MOUNTED APPLICATIONS


Surface mount board layout is a critical portion of the total interface between the board and the package. With the
design. The footprint for the semiconductor packages must correct pad geometry, the packages will self–align when
be the correct size to ensure proper solder connection subjected to a solder reflow process.
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SO–8 POWER DISSIPATION


The power dissipation of the SO–8 is a function of the into the equation for an ambient temperature TA of 25°C,
input pad size. This can vary from the minimum pad size one can calculate the power dissipation of the device which
for soldering to the pad size given for maximum power in this case is 2.5 Watts.
dissipation. Power dissipation for a surface mount device is 150°C – 25°C
determined by TJ(max), the maximum rated junction PD = = 2.5 Watts
50°C/W
temperature of the die, RθJA, the thermal resistance from
the device junction to ambient; and the operating The 50°C/W for the SO–8 package assumes the
temperature, TA. Using the values provided on the data recommended footprint on a glass epoxy printed circuit
sheet for the SO–8 package, PD can be calculated as board to achieve a power dissipation of 2.5 Watts using the
follows: footprint shown. Another alternative would be to use a
TJ(max) – TA
ceramic substrate or an aluminum core board such as
PD = Thermal Cladt. Using board material such as Thermal
RθJA
Clad, the power dissipation can be doubled using the same
The values for the equation are found in the maximum footprint.
ratings table on the data sheet. Substituting these values

SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • The soldering temperature and time shall not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within a • When shifting from preheating to soldering, the
short time could result in device failure. Therefore, the maximum temperature gradient shall be 5°C or less.
following items should always be observed in order to
• After soldering has been completed, the device should
minimize the thermal stress to which the devices are
subjected.
be allowed to cool naturally for at least three minutes.
• Always preheat the device. Gradual cooling should be used as the use of forced
• The delta temperature between the preheat and cooling will increase the temperature gradient and
soldering should be 100°C or less.* result in latent failure due to mechanical stress.
• When preheating and soldering, the temperature of the • Mechanical stress or shock should not be applied
leads and the case must not exceed the maximum during cooling.
temperature ratings as shown on the data sheet. When
using infrared heating with the reflow soldering * Soldering a device without preheating can cause
method, the difference shall be a maximum of 10°C. excessive thermal shock and stress which can result in
damage to the device.

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749
MMSF7N03HD

TYPICAL SOLDER HEATING PROFILE


For any given circuit board, there will be a group of temperature versus time. The line on the graph shows the
control settings that will give the desired heat pattern. The actual temperature that might be experienced on the surface
operator must set temperatures for several heating zones of a test board at or near a central solder joint. The two
and a figure for belt speed. Taken together, these control profiles are based on a high density and a low density
settings make up a heating “profile” for that particular board. The Vitronics SMD310 convection/infrared reflow
circuit board. On machines controlled by a computer, the soldering system was used to generate this profile. The type
computer remembers these profiles from one operating of solder used was 62/36/2 Tin Lead Silver with a melting
session to the next. Figure 16 shows a typical heating point between 177–189°C. When this type of furnace is
profile for use when soldering a surface mount device to a used for solder reflow work, the circuit boards and solder
printed circuit board. This profile will vary among joints tend to heat first. The components on the board are
soldering systems, but it is a good starting point. Factors then heated by conduction. The circuit board, because it has
that can affect the profile include the type of soldering a large surface area, absorbs the thermal energy more
system in use, density and types of components on the efficiently, then distributes this energy to the components.
board, type of solder used, and the type of board or Because of this effect, the main body of a component may
substrate material being used. This profile shows be up to 30 degrees cooler than the adjacent solder joints.

STEP 1 STEP 2 STEP 3 STEP 4 STEP 5 STEP 6 STEP 7


PREHEAT VENT HEATING HEATING HEATING VENT COOLING
ZONE 1 “SOAK” ZONES 2 & 5 ZONES 3 & 6 ZONES 4 & 7
“RAMP” “RAMP” “SOAK” “SPIKE” 205° TO 219°C
PEAK AT
200°C DESIRED CURVE FOR HIGH 170°C SOLDER
MASS ASSEMBLIES JOINT
160°C
150°C

150°C
SOLDER IS LIQUID FOR
40 TO 80 SECONDS
100°C 140°C (DEPENDING ON
MASS OF ASSEMBLY)
100°C

DESIRED CURVE FOR LOW


MASS ASSEMBLIES
5°C

TIME (3 TO 7 MINUTES TOTAL) TMAX


Figure 16. Typical Solder Heating Profile

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750
("!8

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N–Channel SO–8
EZFETst are an advanced series of Power MOSFETs which contain
monolithic back–to–back zener diodes. These zener diodes provide http://onsemi.com
protection against ESD and unexpected transients. These miniature
surface mount MOSFETs feature ultra low RDS(on) and true logic level 7 AMPERES
performance. They are capable of withstanding high energy in the
30 VOLTS
avalanche and commutation modes and the drain–to–source diode has a
very low reverse recovery time. EZFET devices are designed for use in RDS(on) = 30 mW
low voltage, high speed switching applications where power efficiency is
important. Typical applications are dc–dc converters, and power N–Channel
management in portable and battery powered products such as 
computers, printers, cellular and cordless phones. They can also be used
for low voltage motor controls in mass storage products such as disk
drives and tape drives.
• Zener Protected Gates Provide Electrostatic Discharge Protection 
• Ultra Low RDS(on) Provides Higher Efficiency and Extends Battery
Life 
• Designed to withstand 200V Machine Model and 2000V Human
Body Model MARKING
• Logic Level Gate Drive – Can Be Driven by Logic ICs DIAGRAM
• Miniature SO–8 Surface Mount Package – Saves Board Space
• Diode Is Characterized for Use In Bridge Circuits SO–8
• Diode Exhibits High Speed, With Soft Recovery 8 CASE 751 7N03Z
LYWW
• IDSS Specified at Elevated Temperature
STYLE 12

• Mounting Information for SO–8 Package Provided 1

7N03Z = Device Code


L = Location Code
Y = Year
WW = Work Week

PIN ASSIGNMENT

Source 1 8 Drain
Source 2 7 Drain
Source 3 6 Drain
Gate 4 5 Drain
Top View

ORDERING INFORMATION

Device Package Shipping

MMSF7N03ZR2 SO–8 2500 Tape & Reel

 Semiconductor Components Industries, LLC, 2001 751 Publication Order Number:


January, 2001 – Rev. 1 MMSF7N03Z/D
MMSF7N03Z

MAXIMUM RATINGS (TJ = 25°C unless otherwise noted)


Rating Symbol Value Unit
Drain–to–Source Voltage VDSS 30 Vdc
Drain–to–Gate Voltage (RGS = 1.0 MΩ) VDGR 30 Vdc
Gate–to–Source Voltage – Continuous VGS ± 15 Vdc
Drain Current
– Continuous @ TA = 25°C (Note 1.) ID 7.5 Adc
– Continuous @ TA = 70°C (Note 1.) ID 5.6
– Pulsed Drain Current (Note 3.) IDM 60 Apk
Total Power Dissipation @ TA = 25°C (Note 1.) PD 2.5 Watts
Linear Derating Factor (Note 1.) 20 mW/°C
Total Power Dissipation @ TA = 25°C (Note 2.) PD 1.6 Watts
Linear Derating Factor (Note 2.) 12 mW/°C
Operating and Storage Temperature Range TJ, Tstg – 55 to 150 °C
Single Pulse Drain–to–Source Avalanche Energy – Starting TJ = 25°C EAS mJ
(VDD = 30 Vdc, VGS = 5.0 Vdc, Peak IL = 15 Apk, L = 4.0 mH, RG = 25 Ω) 450
Thermal Resistance RθJA 50 °C/W
– Junction to Ambient (Note 1.) 80
– Junction to Ambient (Note 2.)
1. When mounted on 1″ square FR–4 or G–10 board (VGS = 10 V, @ 10 Seconds)
2. When mounted on 1″ square FR–4 or G–10 board (VGS = 10 V, @ Steady State)
3. Repetitive rating; pulse width limited by maximum junction temperature.

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752
MMSF7N03Z

ELECTRICAL CHARACTERISTICS (TC = 25°C unless otherwise noted)


Characteristic Symbol Min Typ Max Unit
OFF CHARACTERISTICS
Drain–to–Source Breakdown Voltage (Cpk ≥ 2.0) (Notes 4. & 6.) V(BR)DSS Vdc
(VGS = 0 Vdc, ID = 250 µAdc) 30 – –
Temperature Coefficient (Positive) – 35 – mV/°C
Zero Gate Voltage Drain Current IDSS µAdc
(VDS = 30 Vdc, VGS = 0 Vdc) – 0.03 2.0
(VDS = 30 Vdc, VGS = 0 Vdc, TJ = 125°C) – 0.15 10
Gate–Body Leakage Current (VGS = ± 15 Vdc, VDS = 0) IGSS – 1.3 5.0 µAdc
ON CHARACTERISTICS (Note 4.)
Gate Threshold Voltage (Cpk ≥ 2.0) (Notes 4. & 6.) VGS(th) Vdc
(VDS = VGS, ID = 250 µAdc) 1.0 2.0 3.0
Threshold Temperature Coefficient (Negative) – 5.5 – mV/°C
Static Drain–to–Source On–Resistance (Cpk ≥ 2.0) (Notes 4. & 6.) RDS(on) mΩ
(VGS = 10 Vdc, ID = 7.5 Adc) – 22 30
(VGS = 4.5 Vdc, ID = 3.8 Adc) – 30 40
Forward Transconductance (VDS = 3.0 Vdc, ID = 3.8 Adc) (Note 4.) gFS 4.0 9.5 – Mhos
DYNAMIC CHARACTERISTICS
Input Capacitance Ciss – 750 1500 pF
Output Capacitance (VDS = 24 Vd
Vdc, VGS = 0 Vd
Vdc,
Coss – 340 680
f = 1.0 MHz)
Transfer Capacitance Crss – 45 90
SWITCHING CHARACTERISTICS (Note 5.)
Turn–On Delay Time td(on) – 40 80 ns
Rise Time (VDS = 15 Vdc, ID = 5.0 Adc, tr – 90 180
Turn–Off Delay Time VGS = 10 Vdc, RG = 6 Ω) (Note 4.) td(off) – 470 940
Fall Time tf – 170 340
Turn–On Delay Time td(on) – 120 240 ns
Rise Time (VDD = 15 Vdc, ID = 5.0 Adc, tr – 350 700
Turn–Off Delay Time VGS = 4.5 Vdc, RG = 6 Ω) (Note 4.) td(off) – 430 860
Fall Time tf – 140 280
Gate Charge QT – 34 48 nC

(VDS = 24 Vdc, ID = 5.0 Adc, Q1 – 3.5 –


VGS = 10 Vdc) (Note 4.) Q2 – 9.5 –
Q3 – 6.5 –

SOURCE–DRAIN DIODE CHARACTERISTICS


Forward On–Voltage (Note 4.) (IS = 7.5 Adc, VGS = 0 Vdc) (Note 4.) VSD Vdc
(IS = 7.5 Adc, VGS = 0 Vdc, – 0.83 1.6
TJ = 125°C) – 0.67 –
Reverse Recovery Time trr – 110 – ns
(IS = 7.5
7 5 Adc,
Ad VGS = 0 Vdc,
Vd
ta – 22 –
dIS/dt = 100 A/µs) (Note 4.)
tb – 90 –
Reverse Recovery Storage Charge QRR – 0.17 – µC
4. Pulse Test: Pulse Width ≤ 300 µs, Duty Cycle ≤ 2%.
5. Switching characteristics are independent of operating junction temperatures.
6. Reflects typical values. Max limit – Typ
Cpk =
3 x SIGMA

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753
MMSF7N03Z

TYPICAL ELECTRICAL CHARACTERISTICS

 
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Figure 3. On–Resistance versus Figure 4. On–Resistance versus Drain Current


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Figure 5. On–Resistance Variation Figure 6. Drain–to–Source Leakage Current


with Temperature versus Voltage

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754
MMSF7N03Z

POWER MOSFET SWITCHING

Switching behavior is most easily modeled and predicted The capacitance (Ciss) is read from the capacitance curve at
by recognizing that the power MOSFET is charge a voltage corresponding to the off–state condition when
controlled. The lengths of various switching intervals (∆t) calculating td(on) and is read at a voltage corresponding to the
are determined by how fast the FET input capacitance can on–state when calculating td(off).
be charged by current from the generator. At high switching speeds, parasitic circuit elements
The published capacitance data is difficult to use for complicate the analysis. The inductance of the MOSFET
calculating rise and fall because drain–gate capacitance source lead, inside the package and in the circuit wiring
varies greatly with applied voltage. Accordingly, gate which is common to both the drain and gate current paths,
charge data is used. In most cases, a satisfactory estimate of produces a voltage at the source which reduces the gate drive
average input current (IG(AV)) can be made from a current. The voltage is determined by Ldi/dt, but since di/dt
rudimentary analysis of the drive circuit so that is a function of drain current, the mathematical solution is
t = Q/IG(AV) complex. The MOSFET output capacitance also
complicates the mathematics. And finally, MOSFETs have
During the rise and fall time interval when switching a finite internal gate resistance which effectively adds to the
resistive load, VGS remains virtually constant at a level resistance of the driving source, but the internal resistance
known as the plateau voltage, VSGP. Therefore, rise and fall is difficult to measure and, consequently, is not specified.
times may be approximated by the following: The resistive switching time variation versus gate
tr = Q2 x RG/(VGG – VGSP) resistance (Figure 9) shows how typical switching
tf = Q2 x RG/VGSP performance is affected by the parasitic circuit elements. If
where the parasitics were not present, the slope of the curves would
maintain a value of unity regardless of the switching speed.
VGG = the gate drive voltage, which varies from zero to VGG
The circuit used to obtain the data is constructed to minimize
RG = the gate drive resistance
common inductance in the drain and gate circuit loops and
and Q2 and VGSP are read from the gate charge curve.
is believed readily achievable with board mounted
During the turn–on and turn–off delay times, gate current is components. Most power electronic loads are inductive; the
not constant. The simplest calculation uses appropriate data in the figure is taken with a resistive load, which
values from the capacitance curves in a standard equation for approximates an optimally snubbed inductive load. Power
voltage change in an RC network. The equations are: MOSFETs may be safely operated into an inductive load;
td(on) = RG Ciss In [VGG/(VGG – VGSP)] however, snubbing reduces switching losses.
td(off) = RG Ciss In (VGG/VGSP)

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Figure 8. Gate–To–Source and Drain–To–Source Figure 9. Resistive Switching Time


Voltage versus Total Charge Variation versus Gate Resistance

DRAIN–TO–SOURCE DIODE CHARACTERISTICS

The switching characteristics of a MOSFET body diode high di/dts. The diode’s negative di/dt during ta is directly
are very important in systems using it as a freewheeling or controlled by the device clearing the stored charge.
commutating diode. Of particular interest are the reverse However, the positive di/dt during tb is an uncontrollable
recovery characteristics which play a major role in diode characteristic and is usually the culprit that induces
determining switching losses, radiated noise, EMI and RFI. current ringing. Therefore, when comparing diodes, the
System switching losses are largely due to the nature of ratio of tb/ta serves as a good indicator of recovery
the body diode itself. The body diode is a minority carrier abruptness and thus gives a comparative estimate of
device, therefore it has a finite reverse recovery time, trr, due probable noise generated. A ratio of 1 is considered ideal and
to the storage of minority carrier charge, QRR, as shown in values less than 0.5 are considered snappy.
the typical reverse recovery wave form of Figure 11. It is this Compared to ON Semiconductor standard cell density
stored charge that, when cleared from the diode, passes low voltage MOSFETs, high cell density MOSFET diodes
through a potential and defines an energy loss. Obviously, are faster (shorter trr), have less stored charge and a softer
repeatedly forcing the diode through reverse recovery reverse recovery characteristic. The softness advantage of
further increases switching losses. Therefore, one would the high cell density diode means they can be forced through
like a diode with short trr and low QRR specifications to reverse recovery at a higher di/dt than a standard cell
minimize these losses. MOSFET diode without increasing the current ringing or the
The abruptness of diode reverse recovery effects the noise generated. In addition, power dissipation incurred
amount of radiated noise, voltage spikes, and current from switching the diode will be less due to the shorter
ringing. The mechanisms at work are finite irremovable recovery time and lower switching losses.
circuit parasitic inductances and capacitances acted upon by

http://onsemi.com
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Figure 11. Reverse Recovery Time (trr)

SAFE OPERATING AREA

The Forward Biased Safe Operating Area curves define reliable operation, the stored energy from circuit inductance
the maximum simultaneous drain–to–source voltage and dissipated in the transistor while in avalanche must be less
drain current that a transistor can handle safely when it is than the rated limit and must be adjusted for operating
forward biased. Curves are based upon maximum peak conditions differing from those specified. Although industry
junction temperature and a case temperature (TC) of 25°C. practice is to rate in terms of energy, avalanche energy
Peak repetitive pulsed power limits are determined by using capability is not a constant. The energy rating decreases
the thermal response data in conjunction with the procedures non–linearly with an increase of peak current in avalanche
discussed in AN569, “Transient Thermal Resistance – and peak junction temperature.
General Data and Its Use.” Although many E–FETs can withstand the stress of
Switching between the off–state and the on–state may drain–to–source avalanche at currents up to rated pulsed
traverse any load line provided neither rated peak current current (IDM), the energy rating is specified at rated
(IDM) nor rated voltage (VDSS) is exceeded, and that the continuous current (ID), in accordance with industry
transition time (tr, tf) does not exceed 10 µs. In addition the custom. The energy rating must be derated for temperature
total power averaged over a complete switching cycle must as shown in the accompanying graph (Figure 13). Maximum
not exceed (TJ(MAX) – TC)/(RθJC). energy at currents below rated continuous ID can safely be
A power MOSFET designated E–FET can be safely used assumed to equal the values indicated.
in switching circuits with unclamped inductive loads. For

http://onsemi.com
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Figure 12. Maximum Rated Forward Biased Figure 13. Maximum Avalanche Energy versus
Safe Operating Area Starting Junction Temperature

TYPICAL ELECTRICAL CHARACTERISTICS



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Figure 14. Thermal Response

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Figure 15. Diode Reverse Recovery Waveform

http://onsemi.com
758
MMSF7N03Z

INFORMATION FOR USING THE SO–8 SURFACE MOUNT PACKAGE

MINIMUM RECOMMENDED FOOTPRINT FOR SURFACE MOUNTED APPLICATIONS


Surface mount board layout is a critical portion of the total interface between the board and the package. With the
design. The footprint for the semiconductor packages must correct pad geometry, the packages will self–align when
be the correct size to ensure proper solder connection subjected to a solder reflow process.
9
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#:$ $$
: 6

#6 $
9 #:
inches
mm

SO–8 POWER DISSIPATION


The power dissipation of the SO–8 is a function of the into the equation for an ambient temperature TA of 25°C,
input pad size. This can vary from the minimum pad size one can calculate the power dissipation of the device which
for soldering to the pad size given for maximum power in this case is 2.5 Watts.
dissipation. Power dissipation for a surface mount device is
PD = 150°C – 25°C = 2.5 Watts
determined by TJ(max), the maximum rated junction 50°C/W
temperature of the die, RθJA, the thermal resistance from
the device junction to ambient; and the operating The 50°C/W for the SO–8 package assumes the
temperature, TA. Using the values provided on the data recommended footprint on a glass epoxy printed circuit
sheet for the SO–8 package, PD can be calculated as board to achieve a power dissipation of 2.5 Watts using the
follows: footprint shown. Another alternative would be to use a
TJ(max) – TA
ceramic substrate or an aluminum core board such as
PD = Thermal Cladt. Using board material such as Thermal
RθJA
Clad, the power dissipation can be doubled using the same
The values for the equation are found in the maximum footprint.
ratings table on the data sheet. Substituting these values

SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • The soldering temperature and time shall not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within • When shifting from preheating to soldering, the
a short time could result in device failure. Therefore, the maximum temperature gradient shall be 5°C or less.
following items should always be observed in order to • After soldering has been completed, the device should
minimize the thermal stress to which the devices are be allowed to cool naturally for at least three minutes.
subjected. Gradual cooling should be used as the use of forced
• Always preheat the device. cooling will increase the temperature gradient and
• The delta temperature between the preheat and result in latent failure due to mechanical stress.
soldering should be 100°C or less.* • Mechanical stress or shock should not be applied
• When preheating and soldering, the temperature of the during cooling.
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When * Soldering a device without preheating can cause
using infrared heating with the reflow soldering excessive thermal shock and stress which can result in
method, the difference shall be a maximum of 10°C. damage to the device.

http://onsemi.com
759
MMSF7N03Z

TYPICAL SOLDER HEATING PROFILE


For any given circuit board, there will be a group of temperature versus time. The line on the graph shows the
control settings that will give the desired heat pattern. The actual temperature that might be experienced on the surface
operator must set temperatures for several heating zones of a test board at or near a central solder joint. The two
and a figure for belt speed. Taken together, these control profiles are based on a high density and a low density
settings make up a heating “profile” for that particular board. The Vitronics SMD310 convection/infrared reflow
circuit board. On machines controlled by a computer, the soldering system was used to generate this profile. The type
computer remembers these profiles from one operating of solder used was 62/36/2 Tin Lead Silver with a melting
session to the next. Figure 16 shows a typical heating point between 177–189°C. When this type of furnace is
profile for use when soldering a surface mount device to a used for solder reflow work, the circuit boards and solder
printed circuit board. This profile will vary among joints tend to heat first. The components on the board are
soldering systems, but it is a good starting point. Factors then heated by conduction. The circuit board, because it has
that can affect the profile include the type of soldering a large surface area, absorbs the thermal energy more
system in use, density and types of components on the efficiently, then distributes this energy to the components.
board, type of solder used, and the type of board or Because of this effect, the main body of a component may
substrate material being used. This profile shows be up to 30 degrees cooler than the adjacent solder joints.

STEP 1 STEP 2 STEP 3 STEP 4 STEP 5 STEP 6 STEP 7


PREHEAT VENT HEATING HEATING HEATING VENT COOLING
ZONE 1 “SOAK” ZONES 2 & 5 ZONES 3 & 6 ZONES 4 & 7
“RAMP” “RAMP” “SOAK” “SPIKE” 205° TO 219°C
PEAK AT
200°C DESIRED CURVE FOR HIGH 170°C SOLDER
MASS ASSEMBLIES JOINT
160°C
150°C

150°C
SOLDER IS LIQUID FOR
40 TO 80 SECONDS
100°C 140°C (DEPENDING ON
MASS OF ASSEMBLY)
100°C

DESIRED CURVE FOR LOW


MASS ASSEMBLIES
5°C

TIME (3 TO 7 MINUTES TOTAL) TMAX


Figure 16. Typical Solder Heating Profile

http://onsemi.com
760
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Preferred Device

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N–Channel TO–92

MAXIMUM RATINGS http://onsemi.com


Rating Symbol MPF930 MPF960 MPF990 Unit
2 AMPERES
Drain–Source VDS 35 60 90 Vdc
Voltage 35, 60, 90 VOLTS
Drain–Gate Voltage VDG 35 60 90 Vdc RDS(on) = 0.7 Ω (MPF930)
Gate–Source RDS(on) = 0.8 Ω (MPF960)
±20
Voltage
– Continuous
VGS
VGSM ±40
Vdc
Vpk
RDS(on) = 1.2 Ω (MPF990)
– Non–repetitive
(tp ≤ 50 µs) N–Channel

Drain Current Adc
Continuous ID 2.0
(Note 1.)
Pulsed (Note 2.) IDM 3.0
Total Device PD 
Dissipation 1.0 Watts
@ TA = 25°C 8.0 mW/°C

Derate above
25°C
Operating and TJ, Tstg –55 to 150 °C
Storage Junction
Temperature TO–92
Range CASE 29
Style 22
Thermal Resistance θJA 125 °C/W
12
1. The Power Dissipation of the package may result in a lower continuous drain
3
current.
MARKING DIAGRAM
2. Pulse Test: Pulse Width v 300 µs, Duty Cycle v 2.0%.
& PIN ASSIGNMENT

MPF930
YWW

1 3
Source Drain

2
Gate

Y = Year
WW = Work Week

ORDERING INFORMATION
See detailed ordering and shipping information in the package
dimensions section on page 763 of this data sheet.

Preferred devices are recommended choices for future use


and best overall value.

 Semiconductor Components Industries, LLC, 2000 761 Publication Order Number:


November, 2000 – Rev. 3 MPF930/D
MPF930, MPF960, MPF990

ELECTRICAL CHARACTERISTICS (TA = 25°C unless otherwise noted)


Characteristic Symbol Min Typ Max Unit

OFF CHARACTERISTICS
Drain–Source Breakdown Voltage V(BR)DSX Vdc
(VGS = 0, ID = 10 µAdc) MPF930 35 – –
MPF960 60 – –
MPF990 90 – –
Gate Reverse Current (VGS = 15 Vdc, VDS = 0) IGSS – – 50 nAdc

ON CHARACTERISTICS (Note 3.)


Zero–Gate–Voltage Drain Current IDSS – – 10 µAdc
(VDS = Maximum Rating, VGS = 0)
Gate Threshold Voltage VGS(Th) 1.0 – 3.5 Vdc
(ID = 1.0 mAdc, VDS = VGS)
Drain–Source On–Voltage (VGS = 10 Vdc) VDS(on) Vdc
(ID = 0.5 Adc) MPF930 – 0.4 0.7
MPF960 – 0.6 0.8
MPF990 – 0.6 1.2
(ID = 1.0 Adc) MPF930 – 0.9 1.4
MPF960 – 1.2 1.7
MPF990 – 1.2 2.4
(ID = 2.0 Adc) MPF930 – 2.2 3.0
MPF960 – 2.8 3.5
MPF990 – 2.8 4.8
Static Drain–Source On Resistance rDS(on) Ω
(VGS = 10 Vdc, ID = 1.0 Adc) MPF930 – 0.9 1.4
MPF960 – 1.2 1.7
MPF990 – 1.2 2.0
On–State Drain Current ID(on) 1.0 2.0 – Amps
(VDS = 25 Vdc, VGS = 10 Vdc)

SMALL–SIGNAL CHARACTERISTICS
Input Capacitance Ciss – 70 – pF
(VDS = 25 Vdc, VGS = 0, f = 1.0 MHz)
Reverse Transfer Capacitance Crss – 20 – pF
(VDS = 25 Vdc, VGS = 0, f = 1.0 MHz)
Output Capacitance Coss – 49 – pF
(VDS = 25 Vdc, VGS = 0, f = 1.0 MHz)
Forward Transconductance gfs 200 380 – mmhos
(VDS = 25 Vdc, ID = 0.5 Adc)

SWITCHING CHARACTERISTICS
Turn–On Time ton – 7.0 15 ns
Turn–Off Time toff – 7.0 15 ns
3. Pulse Test: Pulse Width v 300 µs, Duty Cycle v 2.0%.

http://onsemi.com
762
MPF930, MPF960, MPF990

RESISTIVE SWITCHING
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Figure 1. Switching Test Circuit Figure 2. Switching Waveforms

ORDERING INFORMATION

Device Package Shipping


MPF930 TO–92 1000 Unit/Box
MPF930RLRE TO–92 2000 Tape & Reel
MPF930A TO–92 1000 Unit/Box
MPF930ARLRE TO–92 2000 Tape & Reel
MPF960 TO–92 1000 Unit/Box
MPF960RLRA TO–92 2000 Tape & Reel
MPF990 TO–92 1000 Unit/Box
MPF990RLRA TO–92 2000 Tape & Reel
MPF990RLRP TO–92 2000 Ammo Pack

http://onsemi.com
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MPF930, MPF960, MPF990

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Figure 7. Saturation Characteristic

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N–Channel D2PAK
This Power MOSFET is designed to withstand high energy in the
avalanche and commutation modes. The energy efficient design also
http://onsemi.com
offers a drain–to–source diode with fast recovery time. Designed for
low voltage, high speed switching applications in power supplies,
converters and PWM motor controls, these devices are particularly 75 AMPERES
well suited for bridge circuits where diode speed and commutating 30 VOLTS
safe operating areas are critical and offer additional safety margin
RDS(on) = 6.5 mΩ
against unexpected voltage transients.
• Avalanche Energy Specified
• Source–to–Drain Diode Recovery Time Comparable to a Discrete N–Channel
Fast Recovery Diode D
• Diode is Characterized for Use in Bridge Circuits
• IDSS and VDS(on) Specified at Elevated Temperature
• Short Heatsink Tab Manufactured – Not Sheared G
• Specially Designed Leadframe for Maximum Power Dissipation
S
MAXIMUM RATINGS (TC = 25°C unless otherwise noted)
Rating Symbol Value Unit 4
Drain–to–Source Voltage VDSS 30 Vdc
D2PAK
Drain–to–Gate Voltage (RGS = 1.0 MΩ) VDGR 30 Vdc CASE 418B
1 2
STYLE 2
Gate–to–Source Voltage 3
– Continuous VGS ±20 Vdc
– Non–Repetitive (tp ≤ 10 ms) VGSM ±20 Vpk MARKING DIAGRAM
Drain Current & PIN ASSIGNMENT
– Continuous ID 75 Adc 4
– Continuous @ 100°C ID 59 Drain
– Single Pulse (tp ≤ 10 µs) IDM 225 Apk
Total Power Dissipation PD 150 Watts
Derate above 25°C 1.2 W/°C
MTB1306
Total Power Dissipation @ TA = 25°C 2.5 Watts
YWW
(Note 1.)
Operating and Storage Temperature TJ, Tstg –55 to °C
Range 150
1 2 3
Single Pulse Drain–to–Source Avalanche EAS mJ Gate Drain Source
Energy – Starting TJ = 25°C 280
(VDD = 25 Vdc, VGS = 10 Vdc, Peak MTB1306 = Device Code
IL = 75 Apk, L = 0.1 mH, RG = 25 Ω) Y = Year
WW = Work Week
Thermal Resistance °C/W
– Junction–to–Case RθJC 0.8
– Junction–to–Ambient RθJA 62.5
ORDERING INFORMATION
– Junction–to–Ambient (Note 1.) RθJA 50
Device Package Shipping
Maximum Lead Temperature for Soldering TL 260 °C
Purposes, 1/8″ from Case for 5.0 MTB1306 D2PAK 50 Units/Rail
seconds
MTB1306T4 D2PAK 800/Tape & Reel
1. When surface mounted to an FR4 board using the minimum recommended
pad size.
Preferred devices are recommended choices for future use
and best overall value.

 Semiconductor Components Industries, LLC, 2000 765 Publication Order Number:


November, 2000 – Rev.1 MTB1306/D
MTB1306

ELECTRICAL CHARACTERISTICS (TJ = 25°C unless otherwise noted)


Characteristic Symbol Min Typ Max Unit
OFF CHARACTERISTICS
Drain–to–Source Breakdown Voltage V(BR)DSS Vdc
(VGS = 0 Vdc, ID = 0.25 mAdc) 30 – –
Zero Gate Voltage Drain Current IDSS µAdc
(VDS = 30 Vdc, VGS = 0 Vdc) – – 10
(VDS = 30 Vdc, VGS = 0 Vdc, TJ = 125°C) – – 100
Gate–Body Leakage Current (VGS = ±20 Vdc, VDS = 0 Vdc) IGSS – – 100 nAdc
ON CHARACTERISTICS (Note 2.)
Gate Threshold Voltage VGS(th) Vdc
(VDS = VGS, ID = 250 µAdc) 1.0 1.5 2.0
Static Drain–to–Source On–Resistance RDS(on) mW
(VGS = 10 Vdc, ID = 38 Adc) – 5.8 6.5
(VGS = 5.0 Vdc, ID = 38 Adc) – 7.4 8.5
Drain–to–Source On–Voltage VDS(on) Vdc
(VGS = 10 Vdc, ID = 75 Adc) – 0.44 0.5
(VGS = 10 Vdc, ID = 38 Adc, TJ = 150°C) – – 0.38
Forward Transconductance (VDS = 3.0 Vdc, ID = 20 Adc) gFS 15 55 – mhos
DYNAMIC CHARACTERISTICS
Input Capacitance Ciss – 2560 3584 pF
Output Capacitance (VDS = 25 Vd
Vdc, VGS = 0 Vd
Vdc,
Coss – 1305 1827
f = 1.0 MHz)
Transfer Capacitance Crss – 386 772

SWITCHING CHARACTERISTICS (Note 3.)


Turn–On Delay Time td(on) – 17 35 ns
Rise Time (VDD = 15 Vdc, ID = 75 Adc, tr – 170 340
VGS = 55.0
0 Vdc
Vdc,
Turn–Off Delay Time RG = 4.7 Ω) td(off) – 68 136
Fall Time tf – 145 290
Gate Charge QT – 50 70 nC

(VDS = 24 Vdc, ID = 75 Adc, Q1 – 8.3 –


VGS = 5.0 Vdc) Q2 – 25.3 –
Q3 – 17.2 –
SOURCE–DRAIN DIODE CHARACTERISTICS
Forward On–Voltage VSD Vdc
(IS = 20 Adc, VGS = 0 Vdc) – 0.75 1.1
(IS = 20 Adc, VGS = 0 Vdc, TJ = 125°C) – 0.64 –
Reverse Recovery Time trr – 84 – ns
ta – 35 –
Adc VGS = 0 Vdc,
(IS = 20 Adc, Vdc
dIS/dt = 100 A/µs) tb – 53 –
Reverse Recovery Stored QRR – 0.13 – µC
Charge
2. Pulse Test: Pulse Width ≤ 300 µs, Duty Cycle ≤ 2%.
3. Switching characteristics are independent of operating junction temperature.

http://onsemi.com
766
MTB1306

TYPICAL ELECTRICAL CHARACTERISTICS

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Figure 3. On–Resistance versus Drain Current Figure 4. On–Resistance versus Drain Current
and Temperature and Gate Voltage

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Temperature Current versus Voltage

http://onsemi.com
767
MTB1306

POWER MOSFET SWITCHING

Switching behavior is most easily modeled and predicted The capacitance (Ciss) is read from the capacitance curve at
by recognizing that the power MOSFET is charge a voltage corresponding to the off–state condition when
controlled. The lengths of various switching intervals (∆t) calculating td(on) and is read at a voltage corresponding to the
are determined by how fast the FET input capacitance can on–state when calculating td(off).
be charged by current from the generator. At high switching speeds, parasitic circuit elements
The published capacitance data is difficult to use for complicate the analysis. The inductance of the MOSFET
calculating rise and fall because drain–gate capacitance source lead, inside the package and in the circuit wiring
varies greatly with applied voltage. Accordingly, gate which is common to both the drain and gate current paths,
charge data is used. In most cases, a satisfactory estimate of produces a voltage at the source which reduces the gate drive
average input current (IG(AV)) can be made from a current. The voltage is determined by Ldi/dt, but since di/dt
rudimentary analysis of the drive circuit so that is a function of drain current, the mathematical solution is
t = Q/IG(AV) complex. The MOSFET output capacitance also
complicates the mathematics. And finally, MOSFETs have
During the rise and fall time interval when switching a finite internal gate resistance which effectively adds to the
resistive load, VGS remains virtually constant at a level resistance of the driving source, but the internal resistance
known as the plateau voltage, VSGP. Therefore, rise and fall is difficult to measure and, consequently, is not specified.
times may be approximated by the following: The resistive switching time variation versus gate
tr = Q2 x RG/(VGG – VGSP) resistance (Figure 9) shows how typical switching
tf = Q2 x RG/VGSP performance is affected by the parasitic circuit elements. If
where the parasitics were not present, the slope of the curves would
maintain a value of unity regardless of the switching speed.
VGG = the gate drive voltage, which varies from zero to VGG
The circuit used to obtain the data is constructed to minimize
RG = the gate drive resistance
common inductance in the drain and gate circuit loops and
and Q2 and VGSP are read from the gate charge curve.
is believed readily achievable with board mounted
During the turn–on and turn–off delay times, gate current is components. Most power electronic loads are inductive; the
not constant. The simplest calculation uses appropriate data in the figure is taken with a resistive load, which
values from the capacitance curves in a standard equation for approximates an optimally snubbed inductive load. Power
voltage change in an RC network. The equations are: MOSFETs may be safely operated into an inductive load;
td(on) = RG Ciss In [VGG/(VGG – VGSP)] however, snubbing reduces switching losses.
td(off) = RG Ciss In (VGG/VGSP)

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Figure 8. Gate–To–Source and Drain–To–Source Figure 9. Resistive Switching Time


Voltage versus Total Charge Variation versus Gate Resistance

DRAIN–TO–SOURCE DIODE CHARACTERISTICS

The switching characteristics of a MOSFET body diode high di/dts. The diode’s negative di/dt during ta is directly
are very important in systems using it as a freewheeling or controlled by the device clearing the stored charge.
commutating diode. Of particular interest are the reverse However, the positive di/dt during tb is an uncontrollable
recovery characteristics which play a major role in diode characteristic and is usually the culprit that induces
determining switching losses, radiated noise, EMI and RFI. current ringing. Therefore, when comparing diodes, the
System switching losses are largely due to the nature of ratio of tb/ta serves as a good indicator of recovery
the body diode itself. The body diode is a minority carrier abruptness and thus gives a comparative estimate of
device, therefore it has a finite reverse recovery time, trr, due probable noise generated. A ratio of 1 is considered ideal and
to the storage of minority carrier charge, QRR, as shown in values less than 0.5 are considered snappy.
the typical reverse recovery wave form of Figure 15. It is this Compared to ON Semiconductor standard cell density
stored charge that, when cleared from the diode, passes low voltage MOSFETs, high cell density MOSFET diodes
through a potential and defines an energy loss. Obviously, are faster (shorter trr), have less stored charge and a softer
repeatedly forcing the diode through reverse recovery reverse recovery characteristic. The softness advantage of
further increases switching losses. Therefore, one would the high cell density diode means they can be forced through
like a diode with short trr and low QRR specifications to reverse recovery at a higher di/dt than a standard cell
minimize these losses. MOSFET diode without increasing the current ringing or the
The abruptness of diode reverse recovery effects the noise generated. In addition, power dissipation incurred
amount of radiated noise, voltage spikes, and current from switching the diode will be less due to the shorter
ringing. The mechanisms at work are finite irremovable recovery time and lower switching losses.
circuit parasitic inductances and capacitances acted upon by

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SAFE OPERATING AREA

The Forward Biased Safe Operating Area curves define reliable operation, the stored energy from circuit inductance
the maximum simultaneous drain–to–source voltage and dissipated in the transistor while in avalanche must be less
drain current that a transistor can handle safely when it is than the rated limit and adjusted for operating conditions
forward biased. Curves are based upon maximum peak differing from those specified. Although industry practice is
junction temperature and a case temperature (TC) of 25°C. to rate in terms of energy, avalanche energy capability is not
Peak repetitive pulsed power limits are determined by using a constant. The energy rating decreases non–linearly with an
the thermal response data in conjunction with the procedures increase of peak current in avalanche and peak junction
discussed in AN569, “Transient Thermal temperature.
Resistance–General Data and Its Use.” Although many E–FETs can withstand the stress of
Switching between the off–state and the on–state may drain–to–source avalanche at currents up to rated pulsed
traverse any load line provided neither rated peak current current (IDM), the energy rating is specified at rated
(IDM) nor rated voltage (VDSS) is exceeded and the continuous current (ID), in accordance with industry
transition time (tr,tf) do not exceed 10 µs. In addition the total custom. The energy rating must be derated for temperature
power averaged over a complete switching cycle must not as shown in the accompanying graph (Figure 12). Maximum
exceed (TJ(MAX) – TC)/(RθJC). energy at currents below rated continuous ID can safely be
A Power MOSFET designated E–FET can be safely used assumed to equal the values indicated.
in switching circuits with unclamped inductive loads. For

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Figure 14. Thermal Response

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Preferred Device

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N–Channel D2PAK
This Power MOSFET is designed to withstand high energy in the
avalanche and commutation modes. The energy efficient design also
offers a drain–to–source diode with a fast recovery time. Designed for http://onsemi.com
low voltage, high speed switching applications in power supplies,
converters and PWM motor controls, these devices are particularly 20 AMPERES
well suited for bridge circuits where diode speed and commutating 200 VOLTS
safe operating areas are critical and offer additional safety margin
against unexpected voltage transients.
RDS(on) = 160 mΩ
• Avalanche Energy Specified
• Source–to–Drain Diode Recovery Time Comparable to a N–Channel
Discrete Fast Recovery Diode D
• Diode is Characterized for Use in Bridge Circuits
• IDSS and VDS(on) Specified at Elevated Temperature
• Short Heatsink Tab Manufactured – Not Sheared G
• Specially Designed Leadframe for Maximum Power Dissipation
S
MAXIMUM RATINGS (TC = 25°C unless otherwise noted)
Rating Symbol Value Unit
4
Drain–Source Voltage VDSS 200 Vdc
Drain–Gate Voltage (RGS = 1.0 MΩ) VDGR 200 Vdc D2PAK
CASE 418B
Gate–Source Voltage 1 2
STYLE 2
– Continuous VGS ± 20 Vdc 3
– Non–Repetitive (tp ≤ 10 ms) VGSM ± 40 Vpk
Drain Current – Continuous ID 20 Adc MARKING DIAGRAM
Drain Current – Continuous @ 100°C ID 12 & PIN ASSIGNMENT
Drain Current – Single Pulse (tp ≤ 10 µs) IDM 60 Apk 4
Total Power Dissipation PD 125 Watts Drain
Derate above 25°C 1.0 W/°C
Total Power Dissipation @ TA = 25°C, 2.5 Watts
when mounted with the minimum
T20N20E
recommended pad size
YWW
Operating and Storage Temperature TJ, Tstg – 55 to °C
Range 150
1 2 3
Single Pulse Drain–to–Source Avalanche EAS 600 mJ
Gate Drain Source
Energy – Starting TJ = 25°C
(VDD = 25 Vdc, VGS = 10 Vdc,
T20N20E = Device Code
IL = 20 Apk, L = 3.0 mH, RG = 25 Ω)
Y = Year
Thermal Resistance °C/W WW = Work Week
– Junction to Case RθJC 1.0
– Junction to Ambient RθJA 62.5
ORDERING INFORMATION
– Junction to Ambient, when mounted RθJA 50
with the minimum recommended pad size Device Package Shipping
Maximum Lead Temperature for Soldering TL 260 °C
Purposes, 1/8″ from case for 10 MTB20N20E D2PAK 50 Units/Rail
seconds
MTB20N20ET4 D2PAK 800/Tape & Reel

Preferred devices are recommended choices for future use


and best overall value.

 Semiconductor Components Industries, LLC, 2000 772 Publication Order Number:


November, 2000 – Rev. 3 MTB20N20E/D
MTB20N20E

ELECTRICAL CHARACTERISTICS (TJ = 25°C unless otherwise noted)


Characteristic Symbol Min Typ Max Unit
OFF CHARACTERISTICS
Drain–Source Breakdown Voltage V(BR)DSS
(VGS = 0 Vdc, ID = 250 µAdc) 200 – – Vdc
Temperature Coefficient (Positive) – 263 – mV/°C
Zero Gate Voltage Drain Current IDSS µAdc
(VDS = 200 Vdc, VGS = 0 Vdc) – – 10
(VDS = 200 Vdc, VGS = 0 Vdc, TJ = 125°C) – – 100
Gate–Body Leakage Current (VGS = ± 20 Vdc, VDS = 0) IGSS – – 100 nAdc
ON CHARACTERISTICS (Note 1.)
Gate Threshold Voltage VGS(th)
(VDS = VGS, ID = 250 µAdc) 2.0 – 4.0 Vdc
Temperature Coefficient (Negative) – 7.0 – mV/°C
Static Drain–Source On–Resistance (VGS = 10 Vdc, ID = 10 Adc) RDS(on) – 0.12 0.16 Ohm
Drain–Source On–Voltage (VGS = 10 Vdc) VDS(on) Vdc
(ID = 20 Adc) – – 3.84
(ID = 10 Adc, TJ = 125°C) – – 3.36
Forward Transconductance (VDS = 13 Vdc, ID = 10 Adc) gFS 8.0 11 – mhos
DYNAMIC CHARACTERISTICS
Input Capacitance Ciss – 1880 2700 pF
Output Capacitance (VDS = 25 Vd
Vdc, VGS = 0 Vd
Vdc,
Coss – 378 535
f = 1.0 MHz)
Reverse Transfer Capacitance Crss – 68 100

SWITCHING CHARACTERISTICS (Note 2.)


Turn–On Delay Time td(on) – 17 40 ns
Rise Time (VDD = 100 Vdc, ID = 20 Adc, tr – 86 180
VGS = 10 Vdc
Vdc,
Turn–Off Delay Time RG = 9.1 Ω) td(off) – 50 100
Fall Time tf – 60 120
Gate Charge QT – 54 75 nC
(See Figure 8)
(VDS = 160 Vdc, ID = 20 Adc, Q1 – 12 –
VGS = 10 Vdc)
Q2 – 24 –
Q3 – 22 –

SOURCE–DRAIN DIODE CHARACTERISTICS


Forward On–Voltage (Note 1.) (IS = 20 Adc, VGS = 0 Vdc) VSD Vdc
(IS = 20 Adc, VGS = 0 Vdc, – 1.0 1.35
TJ = 125°C) – 0.82 –
Reverse Recovery Time trr – 239 – ns
(S Figure
(See Fi 14)
(IS = 20 Adc, VGS = 0 Vdc, ta – 136 –
dIS/dt = 100 A/µs) tb – 103 –
Reverse Recovery Stored Charge QRR – 2.09 – µC

INTERNAL PACKAGE INDUCTANCE


Internal Drain Inductance LD – 4.5 – nH
(Measured from the drain lead 0.25″ from package to center of die)

Internal Source Inductance LS – 7.5 – nH


(Measured from the source lead 0.25″ from package to source bond pad)
1. Pulse Test: Pulse Width ≤ 300 µs, Duty Cycle ≤ 2%.
2. Switching characteristics are independent of operating junction temperature.

http://onsemi.com
773
MTB20N20E

TYPICAL ELECTRICAL CHARACTERISTICS

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Figure 3. On–Resistance versus Drain Current Figure 4. On–Resistance versus Drain Current
and Temperature and Gate Voltage

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Temperature Current versus Voltage

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POWER MOSFET SWITCHING

Switching behavior is most easily modeled and predicted The capacitance (Ciss) is read from the capacitance curve at
by recognizing that the power MOSFET is charge a voltage corresponding to the off–state condition when
controlled. The lengths of various switching intervals (∆t) calculating td(on) and is read at a voltage corresponding to the
are determined by how fast the FET input capacitance can on–state when calculating td(off).
be charged by current from the generator. At high switching speeds, parasitic circuit elements
The published capacitance data is difficult to use for complicate the analysis. The inductance of the MOSFET
calculating rise and fall because drain–gate capacitance source lead, inside the package and in the circuit wiring
varies greatly with applied voltage. Accordingly, gate which is common to both the drain and gate current paths,
charge data is used. In most cases, a satisfactory estimate of produces a voltage at the source which reduces the gate drive
average input current (IG(AV)) can be made from a current. The voltage is determined by Ldi/dt, but since di/dt
rudimentary analysis of the drive circuit so that is a function of drain current, the mathematical solution is
t = Q/IG(AV) complex. The MOSFET output capacitance also
complicates the mathematics. And finally, MOSFETs have
During the rise and fall time interval when switching a finite internal gate resistance which effectively adds to the
resistive load, VGS remains virtually constant at a level resistance of the driving source, but the internal resistance
known as the plateau voltage, VSGP. Therefore, rise and fall is difficult to measure and, consequently, is not specified.
times may be approximated by the following: The resistive switching time variation versus gate resistance
tr = Q2 x RG/(VGG – VGSP) (Figure 9) shows how typical switching performance is
tf = Q2 x RG/VGSP affected by the parasitic circuit elements. If the parasitics
where were not present, the slope of the curves would maintain a
value of unity regardless of the switching speed. The circuit
VGG = the gate drive voltage, which varies from zero to VGG
used to obtain the data is constructed to minimize common
RG = the gate drive resistance
inductance in the drain and gate circuit loops and is believed
and Q2 and VGSP are read from the gate charge curve.
readily achievable with board mounted components. Most
During the turn–on and turn–off delay times, gate current is power electronic loads are inductive; the data in the figure
not constant. The simplest calculation uses appropriate is taken with a resistive load, which approximates an
values from the capacitance curves in a standard equation for optimally snubbed inductive load. Power MOSFETs may be
voltage change in an RC network. The equations are: safely operated into an inductive load; however, snubbing
td(on) = RG Ciss In [VGG/(VGG – VGSP)] reduces switching losses.
td(off) = RG Ciss In (VGG/VGSP)

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Voltage versus Total Charge Variation versus Gate Resistance

DRAIN–TO–SOURCE DIODE CHARACTERISTICS


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Figure 10. Diode Forward Voltage versus Current

SAFE OPERATING AREA

The Forward Biased Safe Operating Area curves define reliable operation, the stored energy from circuit inductance
the maximum simultaneous drain–to–source voltage and dissipated in the transistor while in avalanche must be less
drain current that a transistor can handle safely when it is than the rated limit and adjusted for operating conditions
forward biased. Curves are based upon maximum peak differing from those specified. Although industry practice is
junction temperature and a case temperature (TC) of 25°C. to rate in terms of energy, avalanche energy capability is not
Peak repetitive pulsed power limits are determined by using a constant. The energy rating decreases non–linearly with an
the thermal response data in conjunction with the procedures increase of peak current in avalanche and peak junction
discussed in AN569, “Transient Thermal temperature.
Resistance–General Data and Its Use.” Although many E–FETs can withstand the stress of
Switching between the off–state and the on–state may drain–to–source avalanche at currents up to rated pulsed
traverse any load line provided neither rated peak current current (IDM), the energy rating is specified at rated
(IDM) nor rated voltage (VDSS) is exceeded and the continuous current (ID), in accordance with industry
transition time (tr,tf) do not exceed 10 µs. In addition the total custom. The energy rating must be derated for temperature
power averaged over a complete switching cycle must not as shown in the accompanying graph (Figure 12). Maximum
exceed (TJ(MAX) – TC)/(RθJC). energy at currents below rated continuous ID can safely be
A Power MOSFET designated E–FET can be safely used assumed to equal the values indicated.
in switching circuits with unclamped inductive loads. For

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MTB20N20E

SAFE OPERATING AREA

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Safe Operating Area Starting Junction Temperature


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MTB20N20E

INFORMATION FOR USING THE D2PAK SURFACE MOUNT PACKAGE

RECOMMENDED FOOTPRINT FOR SURFACE MOUNTED APPLICATIONS


Surface mount board layout is a critical portion of the interface between the board and the package. With the
total design. The footprint for the semiconductor packages correct pad geometry, the packages will self align when
must be the correct size to ensure proper solder connection subjected to a solder reflow process.

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POWER DISSIPATION FOR A SURFACE MOUNT DEVICE


The power dissipation for a surface mount device is a PD = 150°C – 25°C = 2.5 Watts
function of the drain pad size. These can vary from the 50°C/W
minimum pad size for soldering to a pad size given for
The 50°C/W for the D2PAK package assumes the use of
maximum power dissipation. Power dissipation for a
the recommended footprint on a glass epoxy printed circuit
surface mount device is determined by TJ(max), the
board to achieve a power dissipation of 2.5 Watts. There are
maximum rated junction temperature of the die, RθJA, the
other alternatives to achieving higher power dissipation
thermal resistance from the device junction to ambient, and
from the surface mount packages. One is to increase the
the operating temperature, TA. Using the values provided
area of the drain pad. By increasing the area of the drain
on the data sheet, PD can be calculated as follows:
pad, the power dissipation can be increased. Although one
TJ(max) – TA can almost double the power dissipation with this method,
PD =
RθJA one will be giving up area on the printed circuit board
The values for the equation are found in the maximum which can defeat the purpose of using surface mount
ratings table on the data sheet. Substituting these values technology. For example, a graph of RθJA versus drain pad
into the equation for an ambient temperature TA of 25°C, area is shown in Figure 16.
one can calculate the power dissipation of the device. For a
D2PAK device, PD is calculated as follows.

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Area for the D2PAK Package (Typical)

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MTB20N20E

Another alternative would be to use a ceramic substrate board, the power dissipation can be doubled using the same
or an aluminum core board such as Thermal Cladt. Using footprint.
a board material such as Thermal Clad, an aluminum core

SOLDER STENCIL GUIDELINES


Prior to placing surface mount components onto a printed pattern of the opening in the stencil for the drain pad is not
circuit board, solder paste must be applied to the pads. critical as long as it allows approximately 50% of the pad to
Solder stencils are used to screen the optimum amount. be covered with paste.
These stencils are typically 0.008 inches thick and may be
made of brass or stainless steel. For packages such as the
SC–59, SC–70/SOT–323, SOD–123, SOT–23, SOT–143,
ÇÇ
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ÇÇÇ ÇÇ
SOT–223, SO–8, SO–14, SO–16, and SMB/SMC diode

 

ÇÇ ÇÇÇ ÇÇ
packages, the stencil opening should be the same as the pad
 
size or a 1:1 registration. This is not the case with the DPAK
and D2PAK packages. If one uses a 1:1 opening to screen
solder onto the drain pad, misalignment and/or
“tombstoning” may occur due to an excess of solder. For
ÇÇ
ÇÇ ÇÇÇÇÇÇ
ÇÇÇÇÇÇ   

these two packages, the opening in the stencil for the paste
should be approximately 50% of the tab area. The opening Figure 17. Typical Stencil for DPAK and
for the leads is still a 1:1 registration. Figure 17 shows a D2PAK Packages
typical stencil for the DPAK and D2PAK packages. The

SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • When shifting from preheating to soldering, the
temperature of the device. When the entire device is heated maximum temperature gradient shall be 5°C or less.
to a high temperature, failure to complete soldering within • After soldering has been completed, the device should
a short time could result in device failure. Therefore, the be allowed to cool naturally for at least three minutes.
following items should always be observed in order to Gradual cooling should be used as the use of forced
minimize the thermal stress to which the devices are cooling will increase the temperature gradient and
subjected. result in latent failure due to mechanical stress.
• Always preheat the device. • Mechanical stress or shock should not be applied
• The delta temperature between the preheat and during cooling.
soldering should be 100°C or less.*
• When preheating and soldering, the temperature of the * Soldering a device without preheating can cause
leads and the case must not exceed the maximum excessive thermal shock and stress which can result in
temperature ratings as shown on the data sheet. When damage to the device.
using infrared heating with the reflow soldering
method, the difference shall be a maximum of 10°C. * Due to shadowing and the inability to set the wave height
• The soldering temperature and time shall not exceed to incorporate other surface mount components, the D2PAK
260°C for more than 10 seconds. is not recommended for wave soldering.

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779
MTB20N20E

TYPICAL SOLDER HEATING PROFILE


For any given circuit board, there will be a group of The line on the graph shows the actual temperature that
control settings that will give the desired heat pattern. The might be experienced on the surface of a test board at or
operator must set temperatures for several heating zones, near a central solder joint. The two profiles are based on a
and a figure for belt speed. Taken together, these control high density and a low density board. The Vitronics
settings make up a heating “profile” for that particular SMD310 convection/infrared reflow soldering system was
circuit board. On machines controlled by a computer, the used to generate this profile. The type of solder used was
computer remembers these profiles from one operating 62/36/2 Tin Lead Silver with a melting point between
session to the next. Figure 18 shows a typical heating 177–189°C. When this type of furnace is used for solder
profile for use when soldering a surface mount device to a reflow work, the circuit boards and solder joints tend to
printed circuit board. This profile will vary among heat first. The components on the board are then heated by
soldering systems but it is a good starting point. Factors that conduction. The circuit board, because it has a large surface
can affect the profile include the type of soldering system in area, absorbs the thermal energy more efficiently, then
use, density and types of components on the board, type of distributes this energy to the components. Because of this
solder used, and the type of board or substrate material effect, the main body of a component may be up to 30
being used. This profile shows temperature versus time. degrees cooler than the adjacent solder joint.

STEP 1 STEP 2 STEP 3 STEP 4 STEP 5 STEP 6 STEP 7


PREHEAT VENT HEATING HEATING HEATING VENT COOLING
ZONE 1 “SOAK” ZONES 2 & 5 ZONES 3 & 6 ZONES 4 & 7
“RAMP” “RAMP” “SOAK” “SPIKE” 205° TO 219°C
PEAK AT
200°C DESIRED CURVE FOR HIGH 170°C SOLDER
MASS ASSEMBLIES JOINT
160°C
150°C

150°C
SOLDER IS LIQUID FOR
40 TO 80 SECONDS
100°C 140°C (DEPENDING ON
MASS OF ASSEMBLY)
100°C

DESIRED CURVE FOR LOW


MASS ASSEMBLIES
5°C

TIME (3 TO 7 MINUTES TOTAL) TMAX


Figure 18. Typical Solder Heating Profile

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780
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Preferred Device

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P–Channel D2PAK
This Power MOSFET is designed to withstand high energy in the
avalanche and commutation modes. Designed for low voltage, high
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speed switching applications in power supplies, converters and power
motor controls, these devices are particularly well suited for bridge
circuits where diode speed and commutating safe operating areas are 23 AMPERES
critical and offer additional safety margin against unexpected voltage 60 VOLTS
transients.
RDS(on) = 120 mΩ
• Avalanche Energy Specified
• IDSS and VDS(on) Specified at Elevated Temperature
P–Channel
MAXIMUM RATINGS (TC = 25°C unless otherwise noted) 

Rating Symbol Value Unit


Drain–to–Source Voltage VDSS 60 Vdc
Drain–to–Gate Voltage (RGS = 1.0 MΩ) VDGR 60 Vdc 
Gate–to–Source Voltage
– Continuous VGS ± 15 Vdc

– Non–repetitive (tp ≤ 10 ms) VGSM ± 25 Vpk
Drain Current – Continuous @ 25°C ID 23 Adc
Drain Current – Continuous @ 100°C ID 15 4
Drain Current – Single Pulse (tp ≤ 10 µs) IDM 81 Apk
D2PAK
Total Power Dissipation @ 25°C PD 90 Watts CASE 418B
1 2
Derate above 25°C 0.60 W/°C STYLE 2
Total Power Dissipation @ TA = 25°C 3.0 3
(Note 1.)
Operating and Storage Temperature TJ, Tstg –55 to °C
MARKING DIAGRAM
Range 175 & PIN ASSIGNMENT
4
Single Pulse Drain–to–Source Avalanche EAS 794 mJ
Drain
Energy – Starting TJ = 25°C
(VDD = 25 Vdc, VGS = 10 Vdc, Peak
IL = 23 Apk, L = 3.0 mH, RG = 25 Ω)
Thermal Resistance °C/W MTB23P06V
– Junction to Case RθJC 1.67 YWW
– Junction to Ambient RθJA 62.5
– Junction to Ambient (Note 1.) RθJA 50
Maximum Lead Temperature for Soldering TL 260 °C 1 2 3
Purposes, 1/8″ from Case for 10 Gate Drain Source
seconds
1. When surface mounted to an FR4 board using the minimum recommended MTB23P06V = Device Code
pad size. Y = Year
WW = Work Week

ORDERING INFORMATION

Device Package Shipping

MTB23P06V D2PAK 50 Units/Rail

MTB23P06VT4 D2PAK 800/Tape & Reel

Preferred devices are recommended choices for future use


and best overall value.

 Semiconductor Components Industries, LLC, 2000 781 Publication Order Number:


November, 2000 – Rev.2 MTB23P06V/D
MTB23P06V

ELECTRICAL CHARACTERISTICS (TJ = 25°C unless otherwise noted)


Characteristic Symbol Min Typ Max Unit
OFF CHARACTERISTICS
Drain–Source Breakdown Voltage V(BR)DSS
(VGS = 0 Vdc, ID = 0.25 mAdc) 60 – – Vdc
Temperature Coefficient (Positive) – 60.5 – mV/°C
Zero Gate Voltage Drain Current IDSS µAdc
(VDS = 60 Vdc, VGS = 0 Vdc) – – 10
(VDS = 60 Vdc, VGS = 0 Vdc, TJ = 150°C) – – 100
Gate–Body Leakage Current (VGS = ± 15 Vdc, VDS = 0 Vdc) IGSS – – 100 nAdc
ON CHARACTERISTICS (Note 2.)
Gate Threshold Voltage VGS(th)
(VDS = VGS, ID = 250 µAdc) 2.0 2.8 4.0 Vdc
Threshold Temperature Coefficient (Negative) – 5.3 – mV/°C
Static Drain–Source On–Resistance (VGS = 10 Vdc, ID = 11.5 Adc) RDS(on) – 0.093 0.12 Ohm
Drain–Source On–Voltage VDS(on) Vdc
(VGS = 10 Vdc, ID = 23 Adc) – 2.1 3.3
(VGS = 10 Vdc, ID = 11.5 Adc, TJ = 150°C) – – 3.2
Forward Transconductance gFS Mhos
(VDS = 10.9 Vdc, ID = 11.5 Adc) 5.0 11.5 –

DYNAMIC CHARACTERISTICS
Input Capacitance Ciss – 1160 1620 pF
Output Capacitance (VDS = 25 Vd
Vdc, VGS = 0 Vd
Vdc,
Coss – 380 530
f = 1.0 MHz)
Transfer Capacitance Crss – 105 210
SWITCHING CHARACTERISTICS (Note 3.)
Turn–On Delay Time td(on) – 13.8 30 ns
Rise Time (VDD = 30 Vdc, ID = 23 Adc, tr – 98.3 200
VGS = 10 Vdc
Vdc,
Turn–Off Delay Time RG = 9.1 Ω) td(off) – 41 80
Fall Time tf – 62 120
Gate Charge QT – 38 50 nC
(S Figure
(See Fi 8)
(VDS = 48 Vdc, ID = 23 Adc, Q1 – 7.0 –
VGS = 10 Vdc) Q2 – 18 –
Q3 – 14 –

SOURCE–DRAIN DIODE CHARACTERISTICS


Forward On–Voltage VSD Vdc
(IS = 23 Adc, VGS = 0 Vdc)
– 2.2 3.5
(IS = 23 Adc, VGS = 0 Vdc, TJ = 150°C)
– 1.8 –
Reverse Recovery Time trr – 142 – ns
ta – 100 –
(IS = 23 Adc,
Adc VGS = 0 Vdc,
Vdc
dIS/dt = 100 A/µs) tb – 41 –
Reverse Recovery Stored QRR – 0.804 – µC
Charge

INTERNAL PACKAGE INDUCTANCE


Internal Drain Inductance LD nH
(Measured from contact screw on tab to center of die) – 3.5 –
(Measured from the drain lead 0.25″ from package to center of die) 4.5
Internal Source Inductance LS – 7.5 – nH
(Measured from the source lead 0.25″ from package to source bond pad)
2. Pulse Test: Pulse Width ≤ 300 µs, Duty Cycle ≤ 2%.
3. Switching characteristics are independent of operating junction temperature.

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782
MTB23P06V

TYPICAL ELECTRICAL CHARACTERISTICS

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Figure 1. On–Region Characteristics Figure 2. Transfer Characteristics

 


  


 


  
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Figure 3. On–Resistance versus Drain Current Figure 4. On–Resistance versus Drain Current
and Temperature and Gate Voltage

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Figure 5. On–Resistance Variation with Figure 6. Drain–To–Source Leakage


Temperature Current versus Voltage

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783
MTB23P06V

POWER MOSFET SWITCHING

Switching behavior is most easily modeled and predicted The capacitance (Ciss) is read from the capacitance curve at
by recognizing that the power MOSFET is charge a voltage corresponding to the off–state condition when
controlled. The lengths of various switching intervals (∆t) calculating td(on) and is read at a voltage corresponding to the
are determined by how fast the FET input capacitance can on–state when calculating td(off).
be charged by current from the generator. At high switching speeds, parasitic circuit elements
The published capacitance data is difficult to use for complicate the analysis. The inductance of the MOSFET
calculating rise and fall because drain–gate capacitance source lead, inside the package and in the circuit wiring
varies greatly with applied voltage. Accordingly, gate which is common to both the drain and gate current paths,
charge data is used. In most cases, a satisfactory estimate of produces a voltage at the source which reduces the gate drive
average input current (IG(AV)) can be made from a current. The voltage is determined by Ldi/dt, but since di/dt
rudimentary analysis of the drive circuit so that is a function of drain current, the mathematical solution is
t = Q/IG(AV) complex. The MOSFET output capacitance also
complicates the mathematics. And finally, MOSFETs have
During the rise and fall time interval when switching a finite internal gate resistance which effectively adds to the
resistive load, VGS remains virtually constant at a level resistance of the driving source, but the internal resistance
known as the plateau voltage, VSGP. Therefore, rise and fall is difficult to measure and, consequently, is not specified.
times may be approximated by the following: The resistive switching time variation versus gate
tr = Q2 x RG/(VGG – VGSP) resistance (Figure 9) shows how typical switching
tf = Q2 x RG/VGSP performance is affected by the parasitic circuit elements. If
where the parasitics were not present, the slope of the curves would
maintain a value of unity regardless of the switching speed.
VGG = the gate drive voltage, which varies from zero to VGG
The circuit used to obtain the data is constructed to minimize
RG = the gate drive resistance
common inductance in the drain and gate circuit loops and
and Q2 and VGSP are read from the gate charge curve.
is believed readily achievable with board mounted
During the turn–on and turn–off delay times, gate current is components. Most power electronic loads are inductive; the
not constant. The simplest calculation uses appropriate data in the figure is taken with a resistive load, which
values from the capacitance curves in a standard equation for approximates an optimally snubbed inductive load. Power
voltage change in an RC network. The equations are: MOSFETs may be safely operated into an inductive load;
td(on) = RG Ciss In [VGG/(VGG – VGSP)] however, snubbing reduces switching losses.
td(off) = RG Ciss In (VGG/VGSP)

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Figure 7. Capacitance Variation

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Figure 8. Gate–To–Source and Drain–To–Source Figure 9. Resistive Switching Time


Voltage versus Total Charge Variation versus Gate Resistance

DRAIN–TO–SOURCE DIODE CHARACTERISTICS


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Figure 10. Diode Forward Voltage versus Current

SAFE OPERATING AREA

The Forward Biased Safe Operating Area curves define reliable operation, the stored energy from circuit inductance
the maximum simultaneous drain–to–source voltage and dissipated in the transistor while in avalanche must be less
drain current that a transistor can handle safely when it is than the rated limit and adjusted for operating conditions
forward biased. Curves are based upon maximum peak differing from those specified. Although industry practice is
junction temperature and a case temperature (TC) of 25°C. to rate in terms of energy, avalanche energy capability is not
Peak repetitive pulsed power limits are determined by using a constant. The energy rating decreases non–linearly with an
the thermal response data in conjunction with the procedures increase of peak current in avalanche and peak junction
discussed in AN569, “Transient Thermal temperature.
Resistance–General Data and Its Use.” Although many E–FETs can withstand the stress of
Switching between the off–state and the on–state may drain–to–source avalanche at currents up to rated pulsed
traverse any load line provided neither rated peak current current (IDM), the energy rating is specified at rated
(IDM) nor rated voltage (VDSS) is exceeded and the continuous current (ID), in accordance with industry
transition time (tr,tf) do not exceed 10 µs. In addition the total custom. The energy rating must be derated for temperature
power averaged over a complete switching cycle must not as shown in the accompanying graph (Figure 12). Maximum
exceed (TJ(MAX) – TC)/(RθJC). energy at currents below rated continuous ID can safely be
A Power MOSFET designated E–FET can be safely used assumed to equal the values indicated.
in switching circuits with unclamped inductive loads. For

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785
MTB23P06V

SAFE OPERATING AREA

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Figure 11. Maximum Rated Forward Biased Figure 12. Maximum Avalanche Energy versus
Safe Operating Area Starting Junction Temperature


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Figure 13. Thermal Response

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Collector/Drain Pad Size ≈ 450 mils x 350 mils

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Figure 14. Diode Reverse Recovery Waveform Figure 15. D2PAK Power Derating Curve

http://onsemi.com
786
MTB23P06V

INFORMATION FOR USING THE D2PAK SURFACE MOUNT PACKAGE

RECOMMENDED FOOTPRINT FOR SURFACE MOUNTED APPLICATIONS


Surface mount board layout is a critical portion of the interface between the board and the package. With the
total design. The footprint for the semiconductor packages correct pad geometry, the packages will self align when
must be the correct size to ensure proper solder connection subjected to a solder reflow process.

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POWER DISSIPATION FOR A SURFACE MOUNT DEVICE


The power dissipation for a surface mount device is a PD = 175°C – 25°C = 3.0 Watts
function of the drain pad size. These can vary from the 50°C/W
minimum pad size for soldering to a pad size given for
The 50°C/W for the D2PAK package assumes the use of
maximum power dissipation. Power dissipation for a
the recommended footprint on a glass epoxy printed circuit
surface mount device is determined by TJ(max), the
board to achieve a power dissipation of 3.0 Watts. There are
maximum rated junction temperature of the die, RθJA, the
other alternatives to achieving higher power dissipation
thermal resistance from the device junction to ambient, and
from the surface mount packages. One is to increase the
the operating temperature, TA. Using the values provided
area of the drain pad. By increasing the area of the drain
on the data sheet, PD can be calculated as follows:
pad, the power dissipation can be increased. Although one
TJ(max) – TA can almost double the power dissipation with this method,
PD =
RθJA one will be giving up area on the printed circuit board
The values for the equation are found in the maximum which can defeat the purpose of using surface mount
ratings table on the data sheet. Substituting these values technology. For example, a graph of RθJA versus drain pad
into the equation for an ambient temperature TA of 25°C, area is shown in Figure 16.
one can calculate the power dissipation of the device. For a
D2PAK device, PD is calculated as follows.

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Area for the D2PAK Package (Typical)

http://onsemi.com
787
MTB23P06V

Another alternative would be to use a ceramic substrate board, the power dissipation can be doubled using the same
or an aluminum core board such as Thermal Cladt. Using footprint.
a board material such as Thermal Clad, an aluminum core

SOLDER STENCIL GUIDELINES


Prior to placing surface mount components onto a printed pattern of the opening in the stencil for the drain pad is not
circuit board, solder paste must be applied to the pads. critical as long as it allows approximately 50% of the pad to
Solder stencils are used to screen the optimum amount. be covered with paste.
These stencils are typically 0.008 inches thick and may be
made of brass or stainless steel. For packages such as the
SC–59, SC–70/SOT–323, SOD–123, SOT–23, SOT–143,
SOT–223, SO–8, SO–14, SO–16, and SMB/SMC diode ÇÇ
ÇÇ ÇÇÇÇÇÇ ÇÇ
ÇÇÇÇÇÇ ÇÇ 
 

ÇÇ ÇÇÇ
packages, the stencil opening should be the same as the pad  
size or a 1:1 registration. This is not the case with the DPAK
and D2PAK packages. If one uses a 1:1 opening to screen
solder onto the drain pad, misalignment and/or
“tombstoning” may occur due to an excess of solder. For
ÇÇ
ÇÇ ÇÇÇ
ÇÇÇÇÇÇ   

these two packages, the opening in the stencil for the paste
should be approximately 50% of the tab area. The opening Figure 17. Typical Stencil for DPAK and
for the leads is still a 1:1 registration. Figure 17 shows a D2PAK Packages
typical stencil for the DPAK and D2PAK packages. The

SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • When shifting from preheating to soldering, the
temperature of the device. When the entire device is heated maximum temperature gradient shall be 5°C or less.
to a high temperature, failure to complete soldering within • After soldering has been completed, the device should
a short time could result in device failure. Therefore, the be allowed to cool naturally for at least three minutes.
following items should always be observed in order to Gradual cooling should be used as the use of forced
minimize the thermal stress to which the devices are cooling will increase the temperature gradient and
subjected. result in latent failure due to mechanical stress.
• Always preheat the device. • Mechanical stress or shock should not be applied
• The delta temperature between the preheat and during cooling.
soldering should be 100°C or less.*
• When preheating and soldering, the temperature of the * Soldering a device without preheating can cause
leads and the case must not exceed the maximum excessive thermal shock and stress which can result in
temperature ratings as shown on the data sheet. When damage to the device.
using infrared heating with the reflow soldering
method, the difference shall be a maximum of 10°C. * Due to shadowing and the inability to set the wave height
• The soldering temperature and time shall not exceed to incorporate other surface mount components, the D2PAK
260°C for more than 10 seconds. is not recommended for wave soldering.

http://onsemi.com
788
MTB23P06V

TYPICAL SOLDER HEATING PROFILE


For any given circuit board, there will be a group of The line on the graph shows the actual temperature that
control settings that will give the desired heat pattern. The might be experienced on the surface of a test board at or
operator must set temperatures for several heating zones, near a central solder joint. The two profiles are based on a
and a figure for belt speed. Taken together, these control high density and a low density board. The Vitronics
settings make up a heating “profile” for that particular SMD310 convection/infrared reflow soldering system was
circuit board. On machines controlled by a computer, the used to generate this profile. The type of solder used was
computer remembers these profiles from one operating 62/36/2 Tin Lead Silver with a melting point between
session to the next. Figure 18 shows a typical heating 177–189°C. When this type of furnace is used for solder
profile for use when soldering a surface mount device to a reflow work, the circuit boards and solder joints tend to
printed circuit board. This profile will vary among heat first. The components on the board are then heated by
soldering systems but it is a good starting point. Factors that conduction. The circuit board, because it has a large surface
can affect the profile include the type of soldering system in area, absorbs the thermal energy more efficiently, then
use, density and types of components on the board, type of distributes this energy to the components. Because of this
solder used, and the type of board or substrate material effect, the main body of a component may be up to 30
being used. This profile shows temperature versus time. degrees cooler than the adjacent solder joints.

STEP 1 STEP 2 STEP 3 STEP 4 STEP 5 STEP 6 STEP 7


PREHEAT VENT HEATING HEATING HEATING VENT COOLING
ZONE 1 “SOAK” ZONES 2 & 5 ZONES 3 & 6 ZONES 4 & 7
“RAMP” “RAMP” “SOAK” “SPIKE” 205° TO 219°C
PEAK AT
200°C DESIRED CURVE FOR HIGH 170°C SOLDER
MASS ASSEMBLIES JOINT
160°C
150°C

150°C
SOLDER IS LIQUID FOR
40 TO 80 SECONDS
100°C 140°C (DEPENDING ON
MASS OF ASSEMBLY)
100°C

DESIRED CURVE FOR LOW


MASS ASSEMBLIES
5°C

TIME (3 TO 7 MINUTES TOTAL) TMAX


Figure 18. Typical Solder Heating Profile

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789
 )
Preferred Device

#$%& '(
)    
N–Channel D2PAK
This Power MOSFET is designed to withstand high energy in the
avalanche and commutation modes. The energy efficient design also
offers a drain–to–source diode with a fast recovery time. Designed for http://onsemi.com
low voltage, high speed switching applications in power supplies,
converters and PWM motor controls. These devices are particularly 29 AMPERES
well suited for bridge circuits where diode speed and commutating 150 VOLTS
safe operating areas are critical and offer additional safety margin
against unexpected voltage transients.
RDS(on) = 70 mΩ
• Avalanche Energy Specified
• Source–to–Drain Diode Recovery Time Comparable to a N–Channel
Discrete Fast Recovery Diode D
• Diode is Characterized for Use in Bridge Circuits
• IDSS and VDS(on) Specified at Elevated Temperature
G
MAXIMUM RATINGS (TC = 25°C unless otherwise noted)
Rating Symbol Value Unit
S
Drain–to–Source Voltage VDSS 150 Vdc
Drain–to–Gate Voltage (RGS = 1.0 MΩ) VDGR 150 Vdc
Gate–to–Source Voltage 4
– Continuous VGS ± 20 Vdc
D2PAK
– Non–Repetitive (tp ≤ 10 ms) VGSM ± 40 Vpk
CASE 418B
1 2
Drain Current – Continuous ID 29 Adc STYLE 2
Drain Current – Continuous @ 100°C ID 19 3
Drain Current – Single Pulse (tp ≤ 10 µs) IDM 102 Apk
MARKING DIAGRAM
Total Power Dissipation PD 125 Watts
Derate above 25°C 1.0 W/°C & PIN ASSIGNMENT
Total Power Dissipation @ TA = 25°C 2.5 Watts 4
(Note 1.) Drain

Operating and Storage Temperature TJ, Tstg – 55 to °C


Range 150
T29N15E
Single Pulse Drain–to–Source Avalanche EAS mJ
YWW
Energy – Starting TJ = 25°C 421
(VDD = 25 Vdc, VGS = 10 Vdc, Peak
IL = 29 Apk, L = 1.0 mH, RG = 25 Ω)
1 2 3
Thermal Resistance °C/W Gate Drain Source
– Junction to Case RθJC 1.0
– Junction to Ambient RθJA 62.5 T29N15E = Device Code
– Junction to Ambient (Note 1.) RθJA 50 Y = Year
Maximum Lead Temperature for Soldering TL 260 °C WW = Work Week
Purposes, 1/8″ from case for 10
seconds ORDERING INFORMATION
1. When surface mounted to an FR4 board using the minimum recommended
pad size. Device Package Shipping

MTB29N15E D2PAK 50 Units/Rail

MTB29N15ET4 D2PAK 800/Tape & Reel

Preferred devices are recommended choices for future use


and best overall value.

 Semiconductor Components Industries, LLC, 2000 790 Publication Order Number:


November, 2000 – Rev. 2 MTB29N15E/D
MTB29N15E

ELECTRICAL CHARACTERISTICS (TJ = 25°C unless otherwise noted)


Characteristic Symbol Min Typ Max Unit
OFF CHARACTERISTICS
Drain–to–Source Breakdown Voltage V(BR)DSS Vdc
(VGS = 0 Vdc, ID = 0.25 mAdc) 150 – –
Temperature Coefficient (Positive) – 151 – mV/°C
Zero Gate Voltage Drain Current IDSS µAdc
(VDS = 150 Vdc, VGS = 0 Vdc) – – 10
(VDS = 150 Vdc, VGS = 0 Vdc, TJ = 125°C) – – 100
Gate–Body Leakage Current (VGS = ± 20 Vdc, VDS = 0 Vdc) IGSS – – 100 nAdc
ON CHARACTERISTICS (Note 2.)
Gate Threshold Voltage VGS(th) Vdc
(VDS = VGS, ID = 250 µAdc) 2.0 2.7 4.0
Threshold Temperature Coefficient (Negative) – 5.4 – mV/°C
Static Drain–to–Source On–Resistance RDS(on) Ohms
(VGS = 10 Vdc, ID = 14.5 Adc) – 0.054 0.07

Drain–to–Source On–Voltage (VGS = 10 Vdc) VDS(on) Vdc


(ID = 29 Adc) – – 2.4
(ID = 14.5 Adc, TJ = 125°C) – – 2.1
Forward Transconductance (VDS = 8.6 Vdc, ID = 14.5 Adc) gFS 10 20 – mhos
DYNAMIC CHARACTERISTICS
Input Capacitance Ciss – 2300 3220 pF
Output Capacitance (VDS = 25 Vd
Vdc, VGS = 0 Vd
Vdc,
Coss – 450 630
f = 1.0 MHz)
Transfer Capacitance Crss – 130 260
SWITCHING CHARACTERISTICS (Note 3.)
Turn–On Delay Time td(on) – 19 40 ns
Rise Time (VDD = 75 Vdc, ID = 29 Adc, tr – 95 190
VGS = 10 Vdc
Vdc,
Turn–Off Delay Time RG = 9.1 Ω) td(off) – 90 180
Fall Time tf – 85 170
Gate Charge QT – 83 120 nC

(VDS = 120 Vdc, ID = 29 Adc, Q1 – 12 –


VGS = 10 Vdc) Q2 – 37 –
Q3 – 23 –

SOURCE–DRAIN DIODE CHARACTERISTICS


Forward On–Voltage VSD Vdc
(IS = 29 Adc, VGS = 0 Vdc) – 0.92 1.3
(IS = 29 Adc, VGS = 0 Vdc, TJ = 125°C) – 0.84 –
Reverse Recovery Time trr – 174 – ns
ta – 126 –
(IS = 29 Adc,
Adc VGS = 0 Vdc,
Vdc
dIS/dt = 100 A/µs) tb – 48 –
Reverse Recovery Stored QRR – 1.4 – µC
Charge

INTERNAL PACKAGE INDUCTANCE


Internal Drain Inductance LD nH
(Measured from the contact screw on tab to center of die) – 3.5 –
(Measured from the drain lead 0.25″ from package to center of die) – 4.5 –
Internal Source Inductance LS
(Measured from the source lead 0.25″ from package to source bond pad) – 7.5 –
2. Pulse Test: Pulse Width ≤ 300 µs, Duty Cycle ≤ 2%.
3. Switching characteristics are independent of operating junction temperature.

http://onsemi.com
791
MTB29N15E

TYPICAL ELECTRICAL CHARACTERISTICS

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Figure 3. On–Resistance versus Figure 4. On–Resistance versus Drain Current


Drain Current and Temperature and Gate Voltage

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Figure 5. On–Resistance Variation with Figure 6. Drain–To–Source Leakage


Temperature Current versus Voltage

http://onsemi.com
792
MTB29N15E

POWER MOSFET SWITCHING

Switching behavior is most easily modeled and predicted The capacitance (Ciss) is read from the capacitance curve at
by recognizing that the power MOSFET is charge a voltage corresponding to the off–state condition when
controlled. The lengths of various switching intervals (∆t) calculating td(on) and is read at a voltage corresponding to the
are determined by how fast the FET input capacitance can on–state when calculating td(off).
be charged by current from the generator. At high switching speeds, parasitic circuit elements
The published capacitance data is difficult to use for complicate the analysis. The inductance of the MOSFET
calculating rise and fall because drain–gate capacitance source lead, inside the package and in the circuit wiring
varies greatly with applied voltage. Accordingly, gate which is common to both the drain and gate current paths,
charge data is used. In most cases, a satisfactory estimate of produces a voltage at the source which reduces the gate drive
average input current (IG(AV)) can be made from a current. The voltage is determined by Ldi/dt, but since di/dt
rudimentary analysis of the drive circuit so that is a function of drain current, the mathematical solution is
t = Q/IG(AV) complex. The MOSFET output capacitance also
complicates the mathematics. And finally, MOSFETs have
During the rise and fall time interval when switching a finite internal gate resistance which effectively adds to the
resistive load, VGS remains virtually constant at a level resistance of the driving source, but the internal resistance
known as the plateau voltage, VSGP. Therefore, rise and fall is difficult to measure and, consequently, is not specified.
times may be approximated by the following: The resistive switching time variation versus gate
tr = Q2 x RG/(VGG – VGSP) resistance (Figure 9) shows how typical switching
tf = Q2 x RG/VGSP performance is affected by the parasitic circuit elements. If
where the parasitics were not present, the slope of the curves would
maintain a value of unity regardless of the switching speed.
VGG = the gate drive voltage, which varies from zero to VGG
The circuit used to obtain the data is constructed to minimize
RG = the gate drive resistance
common inductance in the drain and gate circuit loops and
and Q2 and VGSP are read from the gate charge curve.
is believed readily achievable with board mounted
During the turn–on and turn–off delay times, gate current is components. Most power electronic loads are inductive; the
not constant. The simplest calculation uses appropriate data in the figure is taken with a resistive load, which
values from the capacitance curves in a standard equation for approximates an optimally snubbed inductive load. Power
voltage change in an RC network. The equations are: MOSFETs may be safely operated into an inductive load;
td(on) = RG Ciss In [VGG/(VGG – VGSP)] however, snubbing reduces switching losses.
td(off) = RG Ciss In (VGG/VGSP)

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Figure 7. Capacitance Variation

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Figure 8. Gate–To–Source and Drain–To–Source Figure 9. Resistive Switching Time


Voltage versus Total Charge Variation versus Gate Resistance

DRAIN–TO–SOURCE DIODE CHARACTERISTICS

The switching characteristics of a MOSFET body diode high di/dts. The diode’s negative di/dt during ta is directly
are very important in systems using it as a freewheeling or controlled by the device clearing the stored charge.
commutating diode. Of particular interest are the reverse However, the positive di/dt during tb is an uncontrollable
recovery characteristics which play a major role in diode characteristic and is usually the culprit that induces
determining switching losses, radiated noise, EMI and RFI. current ringing. Therefore, when comparing diodes, the
System switching losses are largely due to the nature of ratio of tb/ta serves as a good indicator of recovery
the body diode itself. The body diode is a minority carrier abruptness and thus gives a comparative estimate of
device, therefore it has a finite reverse recovery time, trr, due probable noise generated. A ratio of 1 is considered ideal and
to the storage of minority carrier charge, QRR, as shown in values less than 0.5 are considered snappy.
the typical reverse recovery wave form of Figure 15. It is this Compared to ON Semiconductor standard cell density
stored charge that, when cleared from the diode, passes low voltage MOSFETs, high cell density MOSFET diodes
through a potential and defines an energy loss. Obviously, are faster (shorter trr), have less stored charge and a softer
repeatedly forcing the diode through reverse recovery reverse recovery characteristic. The softness advantage of
further increases switching losses. Therefore, one would the high cell density diode means they can be forced through
like a diode with short trr and low QRR specifications to reverse recovery at a higher di/dt than a standard cell
minimize these losses. MOSFET diode without increasing the current ringing or the
The abruptness of diode reverse recovery effects the noise generated. In addition, power dissipation incurred
amount of radiated noise, voltage spikes, and current from switching the diode will be less due to the shorter
ringing. The mechanisms at work are finite irremovable recovery time and lower switching losses.
circuit parasitic inductances and capacitances acted upon by
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Figure 10. Diode Forward Voltage versus Current

http://onsemi.com
794
MTB29N15E

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Figure 11. Reverse Recovery Time (trr)

SAFE OPERATING AREA

The Forward Biased Safe Operating Area curves define total power averaged over a complete switching cycle must
the maximum simultaneous drain–to–source voltage and not exceed (TJ(MAX) – TC)/(RθJC).
drain current that a transistor can handle safely when it is A power MOSFET designated E–FET can be safely used
forward biased. Curves are based upon maximum peak in switching circuits with unclamped inductive loads. For
junction temperature and a case temperature (TC) of 25°C. reliable operation, the stored energy from circuit inductance
Peak repetitive pulsed power limits are determined by using dissipated in the transistor while in avalanche must be less
the thermal response data in conjunction with the procedures than the rated limit and must be adjusted for operating
discussed in AN569, “Transient Thermal Resistance – conditions differing from those specified. Although industry
General Data and Its Use.” practice is to rate in terms of energy, avalanche energy
Switching between the off–state and the on–state may capability is not a constant. The energy rating decreases
traverse any load line provided neither rated peak current non–linearly with an increase of peak current in avalanche
(IDM) nor rated voltage (VDSS) is exceeded, and that the and peak junction temperature.
transition time (tr, tf) does not exceed 10 µs. In addition the

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Figure 12. Maximum Rated Forward Biased Figure 13. Maximum Avalanche Energy versus
Safe Operating Area Starting Junction Temperature

http://onsemi.com
795
MTB29N15E

TYPICAL ELECTRICAL CHARACTERISTICS



 
   
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Figure 14. Thermal Response

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Figure 15. Diode Reverse Recovery Waveform

http://onsemi.com
796
MTB29N15E

TYPICAL SOLDER HEATING PROFILE


For any given circuit board, there will be a group of temperature versus time. The line on the graph shows the
control settings that will give the desired heat pattern. The actual temperature that might be experienced on the surface
operator must set temperatures for several heating zones of a test board at or near a central solder joint. The two
and a figure for belt speed. Taken together, these control profiles are based on a high density and a low density
settings make up a heating “profile” for that particular board. The Vitronics SMD310 convection/infrared reflow
circuit board. On machines controlled by a computer, the soldering system was used to generate this profile. The type
computer remembers these profiles from one operating of solder used was 62/36/2 Tin Lead Silver with a melting
session to the next. Figure 16 shows a typical heating point between 177–189°C. When this type of furnace is
profile for use when soldering a surface mount device to a used for solder reflow work, the circuit boards and solder
printed circuit board. This profile will vary among joints tend to heat first. The components on the board are
soldering systems, but it is a good starting point. Factors then heated by conduction. The circuit board, because it has
that can affect the profile include the type of soldering a large surface area, absorbs the thermal energy more
system in use, density and types of components on the efficiently, then distributes this energy to the components.
board, type of solder used, and the type of board or Because of this effect, the main body of a component may
substrate material being used. This profile shows be up to 30 degrees cooler than the adjacent solder joints.

STEP 1 STEP 2 STEP 3 STEP 4 STEP 5 STEP 6 STEP 7


PREHEAT VENT HEATING HEATING HEATING VENT COOLING
ZONE 1 “SOAK” ZONES 2 & 5 ZONES 3 & 6 ZONES 4 & 7
“RAMP” “RAMP” “SOAK” “SPIKE” 205° TO 219°C
PEAK AT
200°C DESIRED CURVE FOR HIGH 170°C SOLDER
MASS ASSEMBLIES JOINT
160°C
150°C

150°C
SOLDER IS LIQUID FOR
40 TO 80 SECONDS
100°C 140°C (DEPENDING ON
MASS OF ASSEMBLY)
100°C

DESIRED CURVE FOR LOW


MASS ASSEMBLIES
5°C

TIME (3 TO 7 MINUTES TOTAL) TMAX


Figure 16. Typical Solder Heating Profile

http://onsemi.com
797
!
Preferred Device

#$%& '(
!     
* %+%
N–Channel D2PAK
This Power MOSFET is designed to withstand high energy in the
avalanche and commutation modes. Designed for low voltage, high
speed switching applications in power supplies, converters and power http://onsemi.com
motor controls, these devices are particularly well suited for bridge
circuits where diode speed and commutating safe operating areas are 30 AMPERES
critical and offer additional safety margin against unexpected voltage 60 VOLTS
transients.
RDS(on) = 50 mΩ
• Avalanche Energy Specified
• IDSS and VDS(on) Specified at Elevated Temperature
N–Channel
MAXIMUM RATINGS (TC = 25°C unless otherwise noted) D

Rating Symbol Value Unit


Drain–to–Source Voltage VDSS 60 Vdc
Drain–to–Gate Voltage (RGS = 1.0 MΩ) VDGR 60 Vdc G
Gate–to–Source Voltage
– Continuous VGS ±15 Vdc
S
– Non–Repetitive (tp ≤ 10 ms) VGSM ±20 Vpk
Drain Current – Continuous ID 30 Adc
Drain Current – Continuous @ 100°C ID 20
4
Drain Current – Single Pulse (tp ≤ 10 µs) IDM 105 Apk
Total Power Dissipation PD 90 Watts D2PAK
Derate above 25°C 0.6 W/°C CASE 418B
1 2
Total Power Dissipation @ TA = 25°C 3.0 Watts STYLE 2
(Note 1.) 3

Operating and Storage Temperature TJ, Tstg – 55 to °C MARKING DIAGRAM


Range 175
& PIN ASSIGNMENT
Single Pulse Drain–to–Source Avalanche EAS 154 mJ 4
Energy – Starting TJ = 25°C Drain
(VDD = 25 Vdc, VGS = 5 Vdc, Peak
IL = 30 Apk, L = 0.342 mH, RG = 25 Ω)
Thermal Resistance °C/W T30N06VL
– Junction to Case RθJC 1.67 YWW
– Junction to Ambient RθJA 62.5
– Junction to Ambient (Note 1.) RθJA 50
Maximum Lead Temperature for Soldering TL 260 °C 1 2 3
Purposes, 1/8″ from Case for 10 Gate Drain Source
seconds
1. When surface mounted to an FR4 board using the minimum recommended T30N06VL = Device Code
pad size. Y = Year
WW = Work Week

ORDERING INFORMATION

Device Package Shipping

MTB30N06VL D2PAK 50 Units/Rail

MTB30N06VLT4 D2PAK 800/Tape & Reel

Preferred devices are recommended choices for future use


and best overall value.

 Semiconductor Components Industries, LLC, 2000 798 Publication Order Number:


November, 2000 – Rev. 5 MTB30N06VL/D
MTB30N06VL

ELECTRICAL CHARACTERISTICS (TJ = 25°C unless otherwise noted)


Characteristic Symbol Min Typ Max Unit
OFF CHARACTERISTICS
Drain–to–Source Breakdown Voltage V(BR)DSS
(VGS = 0 Vdc, ID = 250 µAdc) 60 – – Vdc
Temperature Coefficient (Positive) – 63 – mV/°C
Zero Gate Voltage Drain Current IDSS µAdc
(VDS = 60 Vdc, VGS = 0 Vdc) – – 10
(VDS = 60 Vdc, VGS = 0 Vdc, TJ = 150°C) – – 100
Gate–Body Leakage Current (VGS = ±15 Vdc, VDS = 0 Vdc) IGSS – – 100 nAdc
ON CHARACTERISTICS (Note 2.)
Gate Threshold Voltage VGS(th)
(VDS = VGS, ID = 250 µAdc) 1.0 1.5 2.0 Vdc
Threshold Temperature Coefficient (Negative) – 4.0 – mV/°C
Static Drain–to–Source On–Resistance (VGS = 5 Vdc, ID = 15 Adc) RDS(on) – 0.033 0.05 Ohms
Drain–to–Source On–Voltage VDS(on) Vdc
(VGS = 5 Vdc, ID = 30 Adc) – 1.1 1.8
(VGS = 5 Vdc, ID = 15 Adc, TJ = 150°C) – – 1.73
Forward Transconductance (VDS = 6.25 Vdc, ID = 15 Adc) gFS 13 21 – Mhos
DYNAMIC CHARACTERISTICS
Input Capacitance Ciss – 1130 1580 pF
Output Capacitance (VDS = 25 Vd
Vdc, VGS = 0 Vd
Vdc,
Coss – 360 500
f = 1.0 MHz)
Transfer Capacitance Crss – 95 190

SWITCHING CHARACTERISTICS (Note 3.)


Turn–On Delay Time td(on) – 14 30 ns
Rise Time (VDD = 30 Vdc, ID = 30 Adc, tr – 260 520
VGS = 5 Vdc,
Vdc
Turn–Off Delay Time RG = 9.1 Ω) td(off) – 54 110
Fall Time tf – 108 220
Gate Charge QT – 27 40 nC
(S Figure
(See Fi 8)
(VDS = 48 Vdc, ID = 30 Adc, Q1 – 5 –
VGS = 5 Vdc) Q2 – 17 –
Q3 – 15 –
SOURCE–DRAIN DIODE CHARACTERISTICS
Forward On–Voltage VSD Vdc
(IS = 30 Adc, VGS = 0 Vdc)
– 0.98 1.6
(IS = 30 Adc, VGS = 0 Vdc, TJ = 150°C)
– 0.89 –
Reverse Recovery Time trr – 86 – ns
ta – 49 –
Adc VGS = 0 Vdc,
(IS = 30 Adc, Vdc
dIS/dt = 100 A/µs) tb – 37 –
Reverse Recovery Stored QRR – 0.228 – µC
Charge

INTERNAL PACKAGE INDUCTANCE


Internal Drain Inductance LD nH
(Measured from the drain lead 0.25″ from package to center of die) – 4.5 –

Internal Source Inductance LS nH


(Measured from the source lead 0.25″ from package to source bond pad) – 7.5 –
2. Pulse Test: Pulse Width ≤ 300 µs, Duty Cycle ≤ 2%.
3. Switching characteristics are independent of operating junction temperature.

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799
MTB30N06VL

TYPICAL ELECTRICAL CHARACTERISTICS

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Figure 3. On–Resistance versus Drain Current Figure 4. On–Resistance versus Drain Current
and Temperature and Gate Voltage

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Figure 5. On–Resistance Variation with Figure 6. Drain–To–Source Leakage


Temperature Current versus Voltage

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MTB30N06VL

POWER MOSFET SWITCHING

Switching behavior is most easily modeled and predicted The capacitance (Ciss) is read from the capacitance curve at
by recognizing that the power MOSFET is charge a voltage corresponding to the off–state condition when
controlled. The lengths of various switching intervals (∆t) calculating td(on) and is read at a voltage corresponding to the
are determined by how fast the FET input capacitance can on–state when calculating td(off).
be charged by current from the generator. At high switching speeds, parasitic circuit elements
The published capacitance data is difficult to use for complicate the analysis. The inductance of the MOSFET
calculating rise and fall because drain–gate capacitance source lead, inside the package and in the circuit wiring
varies greatly with applied voltage. Accordingly, gate which is common to both the drain and gate current paths,
charge data is used. In most cases, a satisfactory estimate of produces a voltage at the source which reduces the gate drive
average input current (IG(AV)) can be made from a current. The voltage is determined by Ldi/dt, but since di/dt
rudimentary analysis of the drive circuit so that is a function of drain current, the mathematical solution is
t = Q/IG(AV) complex. The MOSFET output capacitance also
complicates the mathematics. And finally, MOSFETs have
During the rise and fall time interval when switching a finite internal gate resistance which effectively adds to the
resistive load, VGS remains virtually constant at a level resistance of the driving source, but the internal resistance
known as the plateau voltage, VSGP. Therefore, rise and fall is difficult to measure and, consequently, is not specified.
times may be approximated by the following: The resistive switching time variation versus gate
tr = Q2 x RG/(VGG – VGSP) resistance (Figure 9) shows how typical switching
tf = Q2 x RG/VGSP performance is affected by the parasitic circuit elements. If
where the parasitics were not present, the slope of the curves would
maintain a value of unity regardless of the switching speed.
VGG = the gate drive voltage, which varies from zero to VGG
The circuit used to obtain the data is constructed to minimize
RG = the gate drive resistance
common inductance in the drain and gate circuit loops and
and Q2 and VGSP are read from the gate charge curve.
is believed readily achievable with board mounted
During the turn–on and turn–off delay times, gate current is components. Most power electronic loads are inductive; the
not constant. The simplest calculation uses appropriate data in the figure is taken with a resistive load, which
values from the capacitance curves in a standard equation for approximates an optimally snubbed inductive load. Power
voltage change in an RC network. The equations are: MOSFETs may be safely operated into an inductive load;
td(on) = RG Ciss In [VGG/(VGG – VGSP)] however, snubbing reduces switching losses.
td(off) = RG Ciss In (VGG/VGSP)

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Figure 8. Gate–To–Source and Drain–To–Source Figure 9. Resistive Switching Time


Voltage versus Total Charge Variation versus Gate Resistance

DRAIN–TO–SOURCE DIODE CHARACTERISTICS


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Figure 10. Diode Forward Voltage versus Current

SAFE OPERATING AREA

The Forward Biased Safe Operating Area curves define reliable operation, the stored energy from circuit inductance
the maximum simultaneous drain–to–source voltage and dissipated in the transistor while in avalanche must be less
drain current that a transistor can handle safely when it is than the rated limit and adjusted for operating conditions
forward biased. Curves are based upon maximum peak differing from those specified. Although industry practice is
junction temperature and a case temperature (TC) of 25°C. to rate in terms of energy, avalanche energy capability is not
Peak repetitive pulsed power limits are determined by using a constant. The energy rating decreases non–linearly with an
the thermal response data in conjunction with the procedures increase of peak current in avalanche and peak junction
discussed in AN569, “Transient Thermal temperature.
Resistance–General Data and Its Use.” Although many E–FETs can withstand the stress of
Switching between the off–state and the on–state may drain–to–source avalanche at currents up to rated pulsed
traverse any load line provided neither rated peak current current (IDM), the energy rating is specified at rated
(IDM) nor rated voltage (VDSS) is exceeded and the continuous current (ID), in accordance with industry
transition time (tr,tf) do not exceed 10 µs. In addition the total custom. The energy rating must be derated for temperature
power averaged over a complete switching cycle must not as shown in the accompanying graph (Figure 12). Maximum
exceed (TJ(MAX) – TC)/(RθJC). energy at currents below rated continuous ID can safely be
A Power MOSFET designated E–FET can be safely used assumed to equal the values indicated.
in switching circuits with unclamped inductive loads. For

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MTB30N06VL

SAFE OPERATING AREA

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Safe Operating Area Starting Junction Temperature


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Figure 13. Thermal Response

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Board material = 0.065 mil FR–4
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Collector/Drain Pad Size ≈ 450 mils x 350 mils

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Figure 14. Diode Reverse Recovery Waveform Figure 15. D2PAK Power Derating Curve

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MTB30N06VL

INFORMATION FOR USING THE D2PAK SURFACE MOUNT PACKAGE

RECOMMENDED FOOTPRINT FOR SURFACE MOUNTED APPLICATIONS


Surface mount board layout is a critical portion of the interface between the board and the package. With the
total design. The footprint for the semiconductor packages correct pad geometry, the packages will self align when
must be the correct size to ensure proper solder connection subjected to a solder reflow process.

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POWER DISSIPATION FOR A SURFACE MOUNT DEVICE


The power dissipation for a surface mount device is a PD = 175°C – 25°C = 3.0 Watts
function of the drain pad size. These can vary from the 50°C/W
minimum pad size for soldering to a pad size given for
The 50°C/W for the D2PAK package assumes the use of
maximum power dissipation. Power dissipation for a
the recommended footprint on a glass epoxy printed circuit
surface mount device is determined by TJ(max), the
board to achieve a power dissipation of 3.0 Watts. There are
maximum rated junction temperature of the die, RθJA, the
other alternatives to achieving higher power dissipation
thermal resistance from the device junction to ambient, and
from the surface mount packages. One is to increase the
the operating temperature, TA. Using the values provided
area of the drain pad. By increasing the area of the drain
on the data sheet, PD can be calculated as follows:
pad, the power dissipation can be increased. Although one
TJ(max) – TA can almost double the power dissipation with this method,
PD =
RθJA one will be giving up area on the printed circuit board
The values for the equation are found in the maximum which can defeat the purpose of using surface mount
ratings table on the data sheet. Substituting these values technology. For example, a graph of RθJA versus drain pad
into the equation for an ambient temperature TA of 25°C, area is shown in Figure 16.
one can calculate the power dissipation of the device. For a
D2PAK device, PD is calculated as follows.

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Area for the D2PAK Package (Typical)

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MTB30N06VL

Another alternative would be to use a ceramic substrate board, the power dissipation can be doubled using the same
or an aluminum core board such as Thermal Cladt. Using footprint.
a board material such as Thermal Clad, an aluminum core

SOLDER STENCIL GUIDELINES


Prior to placing surface mount components onto a printed pattern of the opening in the stencil for the drain pad is not
circuit board, solder paste must be applied to the pads. critical as long as it allows approximately 50% of the pad to
Solder stencils are used to screen the optimum amount. be covered with paste.
These stencils are typically 0.008 inches thick and may be
made of brass or stainless steel. For packages such as the
SC–59, SC–70/SOT–323, SOD–123, SOT–23, SOT–143,
SOT–223, SO–8, SO–14, SO–16, and SMB/SMC diode ÇÇ
ÇÇ ÇÇÇÇÇÇ ÇÇ
ÇÇÇÇÇÇ ÇÇ

 

ÇÇ ÇÇÇÇÇÇ
packages, the stencil opening should be the same as the pad  
size or a 1:1 registration. This is not the case with the DPAK
and D2PAK packages. If one uses a 1:1 opening to screen
solder onto the drain pad, misalignment and/or
“tombstoning” may occur due to an excess of solder. For
ÇÇ ÇÇÇÇÇÇ   

these two packages, the opening in the stencil for the paste
Figure 17. Typical Stencil for DPAK and
should be approximately 50% of the tab area. The opening D2PAK Packages
for the leads is still a 1:1 registration. Figure 17 shows a
typical stencil for the DPAK and D2PAK packages. The

SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • When shifting from preheating to soldering, the
temperature of the device. When the entire device is heated maximum temperature gradient shall be 5°C or less.
to a high temperature, failure to complete soldering within • After soldering has been completed, the device should
a short time could result in device failure. Therefore, the be allowed to cool naturally for at least three minutes.
following items should always be observed in order to Gradual cooling should be used as the use of forced
minimize the thermal stress to which the devices are cooling will increase the temperature gradient and
subjected. result in latent failure due to mechanical stress.
• Always preheat the device. • Mechanical stress or shock should not be applied
• The delta temperature between the preheat and during cooling.
soldering should be 100°C or less.*
• When preheating and soldering, the temperature of the * Soldering a device without preheating can cause
leads and the case must not exceed the maximum excessive thermal shock and stress which can result in
temperature ratings as shown on the data sheet. When damage to the device.
using infrared heating with the reflow soldering
method, the difference shall be a maximum of 10°C. * Due to shadowing and the inability to set the wave height
• The soldering temperature and time shall not exceed to incorporate other surface mount components, the D2PAK
260°C for more than 10 seconds. is not recommended for wave soldering.

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805
MTB30N06VL

TYPICAL SOLDER HEATING PROFILE


For any given circuit board, there will be a group of The line on the graph shows the actual temperature that
control settings that will give the desired heat pattern. The might be experienced on the surface of a test board at or
operator must set temperatures for several heating zones, near a central solder joint. The two profiles are based on a
and a figure for belt speed. Taken together, these control high density and a low density board. The Vitronics
settings make up a heating “profile” for that particular SMD310 convection/infrared reflow soldering system was
circuit board. On machines controlled by a computer, the used to generate this profile. The type of solder used was
computer remembers these profiles from one operating 62/36/2 Tin Lead Silver with a melting point between
session to the next. Figure 18 shows a typical heating 177–189°C. When this type of furnace is used for solder
profile for use when soldering a surface mount device to a reflow work, the circuit boards and solder joints tend to
printed circuit board. This profile will vary among heat first. The components on the board are then heated by
soldering systems but it is a good starting point. Factors that conduction. The circuit board, because it has a large surface
can affect the profile include the type of soldering system in area, absorbs the thermal energy more efficiently, then
use, density and types of components on the board, type of distributes this energy to the components. Because of this
solder used, and the type of board or substrate material effect, the main body of a component may be up to 30
being used. This profile shows temperature versus time. degrees cooler than the adjacent solder joints.

STEP 1 STEP 2 STEP 3 STEP 4 STEP 5 STEP 6 STEP 7


PREHEAT VENT HEATING HEATING HEATING VENT COOLING
ZONE 1 “SOAK” ZONES 2 & 5 ZONES 3 & 6 ZONES 4 & 7
“RAMP” “RAMP” “SOAK” “SPIKE” 205° TO 219°C
PEAK AT
200°C DESIRED CURVE FOR HIGH 170°C SOLDER
MASS ASSEMBLIES JOINT
160°C
150°C

150°C
SOLDER IS LIQUID FOR
40 TO 80 SECONDS
100°C 140°C (DEPENDING ON
MASS OF ASSEMBLY)
100°C

DESIRED CURVE FOR LOW


MASS ASSEMBLIES
5°C

TIME (3 TO 7 MINUTES TOTAL) TMAX


Figure 18. Typical Solder Heating Profile

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806
!#
Preferred Device

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P–Channel D2PAK
This Power MOSFET is designed to withstand high energy in the
avalanche and commutation modes. Designed for low voltage, high
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speed switching applications in power supplies, converters and power
motor controls, these devices are particularly well suited for bridge
circuits where diode speed and commutating safe operating areas are 30 AMPERES
critical and offer additional safety margin against unexpected voltage 60 VOLTS
transients.
RDS(on) = 80 mΩ
• Avalanche Energy Specified
• IDSS and VDS(on) Specified at Elevated Temperature
P–Channel
MAXIMUM RATINGS (TC = 25°C unless otherwise noted) 

Rating Symbol Value Unit


Drain–to–Source Voltage VDSS 60 Vdc
Drain–to–Gate Voltage (RGS = 1.0 MΩ) VDGR 60 Vdc 
Gate–to–Source Voltage
– Continuous VGS ± 15 Vdc

– Non–repetitive (tp ≤ 10 ms) VGSM ± 25 Vpk
Drain Current – Continuous @ 25°C ID 30 Adc
Drain Current – Continuous @ 100°C ID 19 4
Drain Current – Single Pulse (tp ≤ 10 µs) IDM 105 Apk
D2PAK
Total Power Dissipation @ 25°C PD 125 Watts CASE 418B
1 2
Derate above 25°C 0.83 W/°C STYLE 2
Total Power Dissipation @ TA = 25°C 3.0 3
(Note 1.)
Operating and Storage Temperature TJ, Tstg –55 to °C
MARKING DIAGRAM
Range 175 & PIN ASSIGNMENT
4
Single Pulse Drain–to–Source Avalanche EAS 450 mJ
Drain
Energy – Starting TJ = 25°C
(VDD = 25 Vdc, VGS = 10 Vdc, Peak
IL = 30 Apk, L = 1.0 mH, RG = 25 Ω)
Thermal Resistance °C/W MTB30P06V
– Junction to Case RθJC 1.2 YWW
– Junction to Ambient RθJA 62.5
– Junction to Ambient (Note 1.) RθJA 50
Maximum Lead Temperature for Soldering TL 260 °C 1 2 3
Purposes, 1/8″ from Case for 10 Gate Drain Source
seconds
1. When surface mounted to an FR4 board using the minimum recommended MTB30P06V = Device Code
pad size. Y = Year
WW = Work Week

ORDERING INFORMATION

Device Package Shipping

MTB30P06V D2PAK 50 Units/Rail

MTB30P06VT4 D2PAK 800/Tape & Reel

Preferred devices are recommended choices for future use


and best overall value.

 Semiconductor Components Industries, LLC, 2000 807 Publication Order Number:


November, 2000 – Rev.2 MTB30P06V/D
MTB30P06V

ELECTRICAL CHARACTERISTICS (TJ = 25°C unless otherwise noted)


Characteristic Symbol Min Typ Max Unit
OFF CHARACTERISTICS
Drain–Source Breakdown Voltage V(BR)DSS
(VGS = 0 Vdc, ID = 0.25 mAdc) 60 – – Vdc
Temperature Coefficient (Positive) – 62 – mV/°C
Zero Gate Voltage Drain Current IDSS µAdc
(VDS = 60 Vdc, VGS = 0 Vdc) – – 10
(VDS = 60 Vdc, VGS = 0 Vdc, TJ = 150°C) – – 100
Gate–Body Leakage Current (VGS = ± 15 Vdc, VDS = 0 Vdc) IGSS – – 100 nAdc
ON CHARACTERISTICS (Note 2.)
Gate Threshold Voltage VGS(th)
(VDS = VGS, ID = 250 µAdc) 2.0 2.6 4.0 Vdc
Threshold Temperature Coefficient (Negative) – 5.3 – mV/°C
Static Drain–Source On–Resistance (VGS = 10 Vdc, ID = 15 Adc) RDS(on) – 0.067 0.08 Ohm
Drain–Source On–Voltage VDS(on) Vdc
(VGS = 10 Vdc, ID = 30 Adc) – 2.0 2.9
(VGS = 10 Vdc, ID = 15 Adc, TJ = 150°C) – – 2.8
Forward Transconductance gFS Mhos
(VDS = 8.3 Vdc, ID = 15 Adc) 5.0 7.9 –

DYNAMIC CHARACTERISTICS
Input Capacitance Ciss – 1562 2190 pF
Output Capacitance (VDS = 25 Vd
Vdc, VGS = 0 Vd
Vdc,
Coss – 524 730
f = 1.0 MHz)
Transfer Capacitance Crss – 154 310
SWITCHING CHARACTERISTICS (Note 3.)
Turn–On Delay Time td(on) – 14.7 30 ns
Rise Time (VDD = 30 Vdc, ID = 30 Adc, tr – 25.9 50
VGS = 10 Vdc
Vdc,
Turn–Off Delay Time RG = 9.1 Ω) td(off) – 98 200
Fall Time tf – 52.4 100
Gate Charge QT – 54 80 nC
(S Figure
(See Fi 8)
(VDS = 48 Vdc, ID = 30 Adc, Q1 – 9.0 –
VGS = 10 Vdc) Q2 – 26 –
Q3 – 20 –

SOURCE–DRAIN DIODE CHARACTERISTICS


Forward On–Voltage VSD Vdc
(IS = 30 Adc, VGS = 0 Vdc)
– 2.3 3.0
(IS = 30 Adc, VGS = 0 Vdc, TJ = 150°C)
– 1.9 –
Reverse Recovery Time trr – 175 – ns
ta – 107 –
(IS = 30 Adc,
Adc VGS = 0 Vdc,
Vdc
dIS/dt = 100 A/µs) tb – 68 –
Reverse Recovery Stored QRR – 0.965 – µC
Charge

INTERNAL PACKAGE INDUCTANCE


Internal Drain Inductance LD nH
(Measured from contact screw on tab to center of die) – 3.5 –
(Measured from the drain lead 0.25″ from package to center of die) 4.5
Internal Source Inductance LS – 7.5 – nH
(Measured from the source lead 0.25″ from package to source bond pad)
2. Pulse Test: Pulse Width ≤ 300 µs, Duty Cycle ≤ 2%.
3. Switching characteristics are independent of operating junction temperature.

http://onsemi.com
808
MTB30P06V

TYPICAL ELECTRICAL CHARACTERISTICS

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Figure 1. On–Region Characteristics Figure 2. Transfer Characteristics

 


  


 


  
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Figure 3. On–Resistance versus Drain Current Figure 4. On–Resistance versus Drain Current
and Temperature and Gate Voltage

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Figure 5. On–Resistance Variation with Figure 6. Drain–To–Source Leakage


Temperature Current versus Voltage

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809
MTB30P06V

POWER MOSFET SWITCHING

Switching behavior is most easily modeled and predicted The capacitance (Ciss) is read from the capacitance curve at
by recognizing that the power MOSFET is charge a voltage corresponding to the off–state condition when
controlled. The lengths of various switching intervals (∆t) calculating td(on) and is read at a voltage corresponding to the
are determined by how fast the FET input capacitance can on–state when calculating td(off).
be charged by current from the generator. At high switching speeds, parasitic circuit elements
The published capacitance data is difficult to use for complicate the analysis. The inductance of the MOSFET
calculating rise and fall because drain–gate capacitance source lead, inside the package and in the circuit wiring
varies greatly with applied voltage. Accordingly, gate which is common to both the drain and gate current paths,
charge data is used. In most cases, a satisfactory estimate of produces a voltage at the source which reduces the gate drive
average input current (IG(AV)) can be made from a current. The voltage is determined by Ldi/dt, but since di/dt
rudimentary analysis of the drive circuit so that is a function of drain current, the mathematical solution is
t = Q/IG(AV) complex. The MOSFET output capacitance also
complicates the mathematics. And finally, MOSFETs have
During the rise and fall time interval when switching a finite internal gate resistance which effectively adds to the
resistive load, VGS remains virtually constant at a level resistance of the driving source, but the internal resistance
known as the plateau voltage, VSGP. Therefore, rise and fall is difficult to measure and, consequently, is not specified.
times may be approximated by the following: The resistive switching time variation versus gate
tr = Q2 x RG/(VGG – VGSP) resistance (Figure 9) shows how typical switching
tf = Q2 x RG/VGSP performance is affected by the parasitic circuit elements. If
where the parasitics were not present, the slope of the curves would
maintain a value of unity regardless of the switching speed.
VGG = the gate drive voltage, which varies from zero to VGG
The circuit used to obtain the data is constructed to minimize
RG = the gate drive resistance
common inductance in the drain and gate circuit loops and
and Q2 and VGSP are read from the gate charge curve.
is believed readily achievable with board mounted
During the turn–on and turn–off delay times, gate current is components. Most power electronic loads are inductive; the
not constant. The simplest calculation uses appropriate data in the figure is taken with a resistive load, which
values from the capacitance curves in a standard equation for approximates an optimally snubbed inductive load. Power
voltage change in an RC network. The equations are: MOSFETs may be safely operated into an inductive load;
td(on) = RG Ciss In [VGG/(VGG – VGSP)] however, snubbing reduces switching losses.
td(off) = RG Ciss In (VGG/VGSP)

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Figure 7. Capacitance Variation

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Figure 8. Gate–To–Source and Drain–To–Source Figure 9. Resistive Switching Time


Voltage versus Total Charge Variation versus Gate Resistance

DRAIN–TO–SOURCE DIODE CHARACTERISTICS


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Figure 10. Diode Forward Voltage versus Current

SAFE OPERATING AREA

The Forward Biased Safe Operating Area curves define reliable operation, the stored energy from circuit inductance
the maximum simultaneous drain–to–source voltage and dissipated in the transistor while in avalanche must be less
drain current that a transistor can handle safely when it is than the rated limit and adjusted for operating conditions
forward biased. Curves are based upon maximum peak differing from those specified. Although industry practice is
junction temperature and a case temperature (TC) of 25°C. to rate in terms of energy, avalanche energy capability is not
Peak repetitive pulsed power limits are determined by using a constant. The energy rating decreases non–linearly with an
the thermal response data in conjunction with the procedures increase of peak current in avalanche and peak junction
discussed in AN569, “Transient Thermal temperature.
Resistance–General Data and Its Use.” Although many E–FETs can withstand the stress of
Switching between the off–state and the on–state may drain–to–source avalanche at currents up to rated pulsed
traverse any load line provided neither rated peak current current (IDM), the energy rating is specified at rated
(IDM) nor rated voltage (VDSS) is exceeded and the continuous current (ID), in accordance with industry
transition time (tr,tf) do not exceed 10 µs. In addition the total custom. The energy rating must be derated for temperature
power averaged over a complete switching cycle must not as shown in the accompanying graph (Figure 12). Maximum
exceed (TJ(MAX) – TC)/(RθJC). energy at currents below rated continuous ID can safely be
A Power MOSFET designated E–FET can be safely used assumed to equal the values indicated.
in switching circuits with unclamped inductive loads. For

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811
MTB30P06V

SAFE OPERATING AREA

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Figure 11. Maximum Rated Forward Biased Figure 12. Maximum Avalanche Energy versus
Safe Operating Area Starting Junction Temperature


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Figure 13. Thermal Response

4
RθJA = 50°C/W
Board material = 0.065 mil FR–4
#$ Mounted on the minimum recommended footprint
 /
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Collector/Drain Pad Size 9 450 mils x 350 mils

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 =   

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Figure 14. Diode Reverse Recovery Waveform Figure 15. D2PAK Power Derating Curve

http://onsemi.com
812
MTB30P06V

INFORMATION FOR USING THE D2PAK SURFACE MOUNT PACKAGE

RECOMMENDED FOOTPRINT FOR SURFACE MOUNTED APPLICATIONS


Surface mount board layout is a critical portion of the interface between the board and the package. With the
total design. The footprint for the semiconductor packages correct pad geometry, the packages will self align when
must be the correct size to ensure proper solder connection subjected to a solder reflow process.

44
848

8
#4#
6# #6
99 979
6
9
#
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:# mm

POWER DISSIPATION FOR A SURFACE MOUNT DEVICE


The power dissipation for a surface mount device is a PD = 175°C – 25°C = 3.0 Watts
function of the drain pad size. These can vary from the 50°C/W
minimum pad size for soldering to a pad size given for
The 50°C/W for the D2PAK package assumes the use of
maximum power dissipation. Power dissipation for a
the recommended footprint on a glass epoxy printed circuit
surface mount device is determined by TJ(max), the
board to achieve a power dissipation of 3.0 Watts. There are
maximum rated junction temperature of the die, RθJA, the
other alternatives to achieving higher power dissipation
thermal resistance from the device junction to ambient, and
from the surface mount packages. One is to increase the
the operating temperature, TA. Using the values provided
area of the drain pad. By increasing the area of the drain
on the data sheet, PD can be calculated as follows:
pad, the power dissipation can be increased. Although one
TJ(max) – TA can almost double the power dissipation with this method,
PD =
RθJA one will be giving up area on the printed circuit board
The values for the equation are found in the maximum which can defeat the purpose of using surface mount
ratings table on the data sheet. Substituting these values technology. For example, a graph of RθJA versus drain pad
into the equation for an ambient temperature TA of 25°C, area is shown in Figure 16.
one can calculate the power dissipation of the device. For a
D2PAK device, PD is calculated as follows.

:

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Figure 16. Thermal Resistance versus Drain Pad
Area for the D2PAK Package (Typical)

http://onsemi.com
813
MTB30P06V

Another alternative would be to use a ceramic substrate board, the power dissipation can be doubled using the same
or an aluminum core board such as Thermal Cladt. Using footprint.
a board material such as Thermal Clad, an aluminum core

SOLDER STENCIL GUIDELINES


Prior to placing surface mount components onto a printed pattern of the opening in the stencil for the drain pad is not
circuit board, solder paste must be applied to the pads. critical as long as it allows approximately 50% of the pad to
Solder stencils are used to screen the optimum amount. be covered with paste.
These stencils are typically 0.008 inches thick and may be
made of brass or stainless steel. For packages such as the
SC–59, SC–70/SOT–323, SOD–123, SOT–23, SOT–143,
SOT–223, SO–8, SO–14, SO–16, and SMB/SMC diode ÇÇ
ÇÇ ÇÇÇÇÇÇ ÇÇ
ÇÇÇÇÇÇ ÇÇ 
 

ÇÇ ÇÇÇ ÇÇ
packages, the stencil opening should be the same as the pad  
size or a 1:1 registration. This is not the case with the DPAK
and D2PAK packages. If one uses a 1:1 opening to screen
solder onto the drain pad, misalignment and/or
“tombstoning” may occur due to an excess of solder. For
ÇÇ
ÇÇ ÇÇÇ
ÇÇÇÇÇÇ   

these two packages, the opening in the stencil for the paste
should be approximately 50% of the tab area. The opening Figure 17. Typical Stencil for DPAK and
for the leads is still a 1:1 registration. Figure 17 shows a D2PAK Packages
typical stencil for the DPAK and D2PAK packages. The

SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • When shifting from preheating to soldering, the
temperature of the device. When the entire device is heated maximum temperature gradient shall be 5°C or less.
to a high temperature, failure to complete soldering within • After soldering has been completed, the device should
a short time could result in device failure. Therefore, the be allowed to cool naturally for at least three minutes.
following items should always be observed in order to Gradual cooling should be used as the use of forced
minimize the thermal stress to which the devices are cooling will increase the temperature gradient and
subjected. result in latent failure due to mechanical stress.
• Always preheat the device. • Mechanical stress or shock should not be applied
• The delta temperature between the preheat and during cooling.
soldering should be 100°C or less.*
• When preheating and soldering, the temperature of the * Soldering a device without preheating can cause
leads and the case must not exceed the maximum excessive thermal shock and stress which can result in
temperature ratings as shown on the data sheet. When damage to the device.
using infrared heating with the reflow soldering
method, the difference shall be a maximum of 10°C. * Due to shadowing and the inability to set the wave height
• The soldering temperature and time shall not exceed to incorporate other surface mount components, the D2PAK
260°C for more than 10 seconds. is not recommended for wave soldering.

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814
MTB30P06V

TYPICAL SOLDER HEATING PROFILE


For any given circuit board, there will be a group of The line on the graph shows the actual temperature that
control settings that will give the desired heat pattern. The might be experienced on the surface of a test board at or
operator must set temperatures for several heating zones, near a central solder joint. The two profiles are based on a
and a figure for belt speed. Taken together, these control high density and a low density board. The Vitronics
settings make up a heating “profile” for that particular SMD310 convection/infrared reflow soldering system was
circuit board. On machines controlled by a computer, the used to generate this profile. The type of solder used was
computer remembers these profiles from one operating 62/36/2 Tin Lead Silver with a melting point between
session to the next. Figure 18 shows a typical heating 177–189°C. When this type of furnace is used for solder
profile for use when soldering a surface mount device to a reflow work, the circuit boards and solder joints tend to
printed circuit board. This profile will vary among heat first. The components on the board are then heated by
soldering systems but it is a good starting point. Factors that conduction. The circuit board, because it has a large surface
can affect the profile include the type of soldering system in area, absorbs the thermal energy more efficiently, then
use, density and types of components on the board, type of distributes this energy to the components. Because of this
solder used, and the type of board or substrate material effect, the main body of a component may be up to 30
being used. This profile shows temperature versus time. degrees cooler than the adjacent solder joints.

STEP 1 STEP 2 STEP 3 STEP 4 STEP 5 STEP 6 STEP 7


PREHEAT VENT HEATING HEATING HEATING VENT COOLING
ZONE 1 “SOAK” ZONES 2 & 5 ZONES 3 & 6 ZONES 4 & 7
“RAMP” “RAMP” “SOAK” “SPIKE” 205° TO 219°C
PEAK AT
200°C DESIRED CURVE FOR HIGH 170°C SOLDER
MASS ASSEMBLIES JOINT
160°C
150°C

150°C
SOLDER IS LIQUID FOR
40 TO 80 SECONDS
100°C 140°C (DEPENDING ON
MASS OF ASSEMBLY)
100°C

DESIRED CURVE FOR LOW


MASS ASSEMBLIES
5°C

TIME (3 TO 7 MINUTES TOTAL) TMAX


Figure 18. Typical Solder Heating Profile

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815
!
Preferred Device

#$%& '(
!    
N–Channel D2PAK
This Power MOSFET is designed to withstand high energy in the
avalanche and commutation modes. Designed for low voltage, high
speed switching applications in power supplies, converters and power http://onsemi.com
motor controls, these devices are particularly well suited for bridge
circuits where diode speed and commutating safe operating areas are 32 AMPERES
critical and offer additional safety margin against unexpected voltage 60 VOLTS
transients.
RDS(on) = 40 mΩ
• Avalanche Energy Specified
• IDSS and VDS(on) Specified at Elevated Temperature
N–Channel
MAXIMUM RATINGS (TC = 25°C unless otherwise noted) D

Rating Symbol Value Unit


Drain–to–Source Voltage VDSS 60 Vdc
Drain–to–Gate Voltage (RGS = 1.0 MΩ) VDGR 60 Vdc G
Gate–to–Source Voltage
– Continuous VGS ±20 Vdc
S
– Non–Repetitive (tp ≤ 50 µs) VGSM ±25 Vpk
Drain Current – Continuous @ 25°C ID 32 Adc
Drain Current – Continuous @ 100°C ID 22.6 4
Drain Current – Single Pulse (tp ≤ 10 µs) IDM 112 Apk
D2PAK
Total Power Dissipation @ 25°C PD 90 Watts CASE 418B
1 2
Derate above 25°C 0.6 W/°C STYLE 2
Total Power Dissipation @ TA = 25°C 3.0 Watts 3
(Note 1.)
Operating and Storage Temperature TJ, Tstg – 55 to °C MARKING DIAGRAM
Range 175 & PIN ASSIGNMENT
4
Single Pulse Drain–to–Source Avalanche EAS 205 mJ
Drain
Energy – Starting TJ = 25°C
(VDD = 25 Vdc, VGS = 10 Vdc, Peak
IL = 32 Apk, L = 0.1 mH, RG = 25 Ω)
Thermal Resistance °C/W MTB36N06V
– Junction to Case RθJC 1.67 YWW
– Junction to Ambient RθJA 62.5
– Junction to Ambient (Note 1.) RθJA 50
Maximum Lead Temperature for Soldering TL 260 °C 1 2 3
Purposes, 1/8″ from Case for 10 Gate Drain Source
seconds
1. When surface mounted to an FR4 board using the minimum recommended MTB36N06V = Device Code
pad size. Y = Year
WW = Work Week

ORDERING INFORMATION

Device Package Shipping

MTB36N06V D2PAK 50 Units/Rail

MTB36N06VT4 D2PAK 800/Tape & Reel

Preferred devices are recommended choices for future use


and best overall value.

 Semiconductor Components Industries, LLC, 2000 816 Publication Order Number:


November, 2000 – Rev. 3 MTB36N06V/D
MTB36N06V

ELECTRICAL CHARACTERISTICS (TJ = 25°C unless otherwise noted)


Characteristic Symbol Min Typ Max Unit
OFF CHARACTERISTICS
Drain–to–Source Breakdown Voltage V(BR)DSS
(VGS = 0 Vdc, ID = 250 µAdc) 60 – – Vdc
Temperature Coefficient (Positive) – 61 – mV/°C
Zero Gate Voltage Drain Current IDSS µAdc
(VDS = 60 Vdc, VGS = 0 Vdc) – – 10
(VDS = 60 Vdc, VGS = 0 Vdc, TJ = 150°C) – – 100
Gate–Body Leakage Current (VGS = ±20 Vdc, VDS = 0 Vdc) IGSS – – 100 nAdc
ON CHARACTERISTICS (Note 2.)
Gate Threshold Voltage VGS(th)
(VDS = VGS, ID = 250 µAdc) 2.0 2.6 4.0 Vdc
Threshold Temperature Coefficient (Negative) – 6.0 – mV/°C
Static Drain–to–Source On–Resistance (VGS = 10 Vdc, ID = 16 Adc) RDS(on) – 0.034 0.04 Ohm
Drain–to–Source On–Voltage VDS(on) Vdc
(VGS = 10 Vdc, ID = 32 Adc) – 1.25 1.54
(VGS = 10 Vdc, ID = 16 Adc, TJ = 150°C) – – 1.47
Forward Transconductance (VDS = 7.6 Vdc, ID = 16 Adc) gFS 5.0 7.83 – mhos
DYNAMIC CHARACTERISTICS
Input Capacitance Ciss – 1220 1700 pF
Output Capacitance (VDS = 25 Vd
Vdc, VGS = 0 Vd
Vdc,
Coss – 337 470
f = 1.0 MHz)
Reverse Transfer Capacitance Crss – 74.8 150

SWITCHING CHARACTERISTICS (Note 3.)


Turn–On Delay Time td(on) – 14 30 ns
Rise Time (VDD = 30 Vdc, ID = 32 Adc, tr – 138 270
VGS = 10 Vdc
Vdc,
Turn–Off Delay Time RG = 9.1 Ω) td(off) – 54 100
Fall Time tf – 91 180
Gate Charge QT – 39 50 nC
(S Figure
(See Fi 8)
(VDS = 48 Vdc, ID = 32 Adc, Q1 – 7 –
VGS = 10 Vdc) Q2 – 17 –
Q3 – 13 –
SOURCE–DRAIN DIODE CHARACTERISTICS
Forward On–Voltage VSD Vdc
(IS = 32 Adc, VGS = 0 Vdc)
– 1.03 2.0
(IS = 32 Adc, VGS = 0 Vdc, TJ = 150°C)
– 0.94 –
Reverse Recovery Time trr – 92 – ns
ta – 64 –
Adc VGS = 0 Vdc,
(IS = 32 Adc, Vdc
dIS/dt = 100 A/µs) tb – 28 –
Reverse Recovery Stored QRR – 0.332 – µC
Charge

INTERNAL PACKAGE INDUCTANCE


Internal Drain Inductance LD nH
(Measured from the drain lead 0.25″ from package to center of die) – 3.5 –

Internal Source Inductance LS nH


(Measured from the source lead 0.25″ from package to source bond pad) – 7.5 –
2. Pulse Test: Pulse Width ≤ 300 µs, Duty Cycle ≤ 2%.
3. Switching characteristics are independent of operating junction temperature.

http://onsemi.com
817
MTB36N06V

TYPICAL ELECTRICAL CHARACTERISTICS

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Figure 1. On–Region Characteristics Figure 2. Transfer Characteristics

 


  


 


  
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Figure 3. On–Resistance versus Drain Current Figure 4. On–Resistance versus Drain Current
and Temperature and Gate Voltage

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Figure 5. On–Resistance Variation with Figure 6. Drain–To–Source Leakage


Temperature Current versus Voltage

http://onsemi.com
818
MTB36N06V

POWER MOSFET SWITCHING

Switching behavior is most easily modeled and predicted The capacitance (Ciss) is read from the capacitance curve at
by recognizing that the power MOSFET is charge a voltage corresponding to the off–state condition when
controlled. The lengths of various switching intervals (∆t) calculating td(on) and is read at a voltage corresponding to the
are determined by how fast the FET input capacitance can on–state when calculating td(off).
be charged by current from the generator. At high switching speeds, parasitic circuit elements
The published capacitance data is difficult to use for complicate the analysis. The inductance of the MOSFET
calculating rise and fall because drain–gate capacitance source lead, inside the package and in the circuit wiring
varies greatly with applied voltage. Accordingly, gate which is common to both the drain and gate current paths,
charge data is used. In most cases, a satisfactory estimate of produces a voltage at the source which reduces the gate drive
average input current (IG(AV)) can be made from a current. The voltage is determined by Ldi/dt, but since di/dt
rudimentary analysis of the drive circuit so that is a function of drain current, the mathematical solution is
t = Q/IG(AV) complex. The MOSFET output capacitance also
complicates the mathematics. And finally, MOSFETs have
During the rise and fall time interval when switching a finite internal gate resistance which effectively adds to the
resistive load, VGS remains virtually constant at a level resistance of the driving source, but the internal resistance
known as the plateau voltage, VSGP. Therefore, rise and fall is difficult to measure and, consequently, is not specified.
times may be approximated by the following: The resistive switching time variation versus gate
tr = Q2 x RG/(VGG – VGSP) resistance (Figure 9) shows how typical switching
tf = Q2 x RG/VGSP performance is affected by the parasitic circuit elements. If
where the parasitics were not present, the slope of the curves would
maintain a value of unity regardless of the switching speed.
VGG = the gate drive voltage, which varies from zero to VGG
The circuit used to obtain the data is constructed to minimize
RG = the gate drive resistance
common inductance in the drain and gate circuit loops and
and Q2 and VGSP are read from the gate charge curve.
is believed readily achievable with board mounted
During the turn–on and turn–off delay times, gate current is components. Most power electronic loads are inductive; the
not constant. The simplest calculation uses appropriate data in the figure is taken with a resistive load, which
values from the capacitance curves in a standard equation for approximates an optimally snubbed inductive load. Power
voltage change in an RC network. The equations are: MOSFETs may be safely operated into an inductive load;
td(on) = RG Ciss In [VGG/(VGG – VGSP)] however, snubbing reduces switching losses.
td(off) = RG Ciss In (VGG/VGSP)

6
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Figure 7. Capacitance Variation

http://onsemi.com
819
MTB36N06V

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Figure 8. Gate–To–Source and Drain–To–Source Figure 9. Resistive Switching Time


Voltage versus Total Charge Variation versus Gate Resistance

DRAIN–TO–SOURCE DIODE CHARACTERISTICS


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Figure 10. Diode Forward Voltage versus Current

SAFE OPERATING AREA

The Forward Biased Safe Operating Area curves define reliable operation, the stored energy from circuit inductance
the maximum simultaneous drain–to–source voltage and dissipated in the transistor while in avalanche must be less
drain current that a transistor can handle safely when it is than the rated limit and adjusted for operating conditions
forward biased. Curves are based upon maximum peak differing from those specified. Although industry practice is
junction temperature and a case temperature (TC) of 25°C. to rate in terms of energy, avalanche energy capability is not
Peak repetitive pulsed power limits are determined by using a constant. The energy rating decreases non–linearly with an
the thermal response data in conjunction with the procedures increase of peak current in avalanche and peak junction
discussed in AN569, “Transient Thermal temperature.
Resistance–General Data and Its Use.” Although many E–FETs can withstand the stress of
Switching between the off–state and the on–state may drain–to–source avalanche at currents up to rated pulsed
traverse any load line provided neither rated peak current current (IDM), the energy rating is specified at rated
(IDM) nor rated voltage (VDSS) is exceeded and the continuous current (ID), in accordance with industry
transition time (tr,tf) do not exceed 10 µs. In addition the total custom. The energy rating must be derated for temperature
power averaged over a complete switching cycle must not as shown in the accompanying graph (Figure 12). Maximum
exceed (TJ(MAX) – TC)/(RθJC). energy at currents below rated continuous ID can safely be
A Power MOSFET designated E–FET can be safely used assumed to equal the values indicated.
in switching circuits with unclamped inductive loads. For

http://onsemi.com
820
MTB36N06V

SAFE OPERATING AREA

 ##$
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     " 4#

   


   
     #
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:$

   
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Figure 11. Maximum Rated Forward Biased Figure 12. Maximum Avalanche Energy versus
Safe Operating Area Starting Junction Temperature


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Figure 13. Thermal Response


4
RθJA = 50°C/W
Board material = 0.065 mil FR–4
#$ Mounted on the minimum recommended footprint
 /
     / 

Collector/Drain Pad Size ≈ 450 mils x 350 mils

#

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'* #$ 

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 =   

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Figure 14. Diode Reverse Recovery Waveform Figure 15. D2PAK Power Derating Curve

http://onsemi.com
821
MTB36N06V

INFORMATION FOR USING THE D2PAK SURFACE MOUNT PACKAGE

RECOMMENDED FOOTPRINT FOR SURFACE MOUNTED APPLICATIONS


Surface mount board layout is a critical portion of the interface between the board and the package. With the
total design. The footprint for the semiconductor packages correct pad geometry, the packages will self align when
must be the correct size to ensure proper solder connection subjected to a solder reflow process.

44
848

8
#4#
6# #6
99 979
6
9
#
4$
94 inches
:# mm

POWER DISSIPATION FOR A SURFACE MOUNT DEVICE


The power dissipation for a surface mount device is a PD = 175°C – 25°C = 3.0 Watts
function of the drain pad size. These can vary from the 50°C/W
minimum pad size for soldering to a pad size given for
The 50°C/W for the D2PAK package assumes the use of
maximum power dissipation. Power dissipation for a
the recommended footprint on a glass epoxy printed circuit
surface mount device is determined by TJ(max), the
board to achieve a power dissipation of 3.0 Watts. There are
maximum rated junction temperature of the die, RθJA, the
other alternatives to achieving higher power dissipation
thermal resistance from the device junction to ambient, and
from the surface mount packages. One is to increase the
the operating temperature, TA. Using the values provided
area of the drain pad. By increasing the area of the drain
on the data sheet, PD can be calculated as follows:
pad, the power dissipation can be increased. Although one
TJ(max) – TA can almost double the power dissipation with this method,
PD =
RθJA one will be giving up area on the printed circuit board
The values for the equation are found in the maximum which can defeat the purpose of using surface mount
ratings table on the data sheet. Substituting these values technology. For example, a graph of RθJA versus drain pad
into the equation for an ambient temperature TA of 25°C, area is shown in Figure 16.
one can calculate the power dissipation of the device. For a
D2PAK device, PD is calculated as follows.

:

θ, 
 
   ,  

=)( )'1(%)E " 9#$″


&.
6 # A **1(  " #$°
9
#$ /)''!
 =  °&/

$

4$ /)''!
6

$ /)''!
4

#
 # 6 9 8  # 6 9

 @
 
Figure 16. Thermal Resistance versus Drain Pad
Area for the D2PAK Package (Typical)

http://onsemi.com
822
MTB36N06V

Another alternative would be to use a ceramic substrate board, the power dissipation can be doubled using the same
or an aluminum core board such as Thermal Cladt. Using footprint.
a board material such as Thermal Clad, an aluminum core

SOLDER STENCIL GUIDELINES


Prior to placing surface mount components onto a printed pattern of the opening in the stencil for the drain pad is not
circuit board, solder paste must be applied to the pads. critical as long as it allows approximately 50% of the pad to
Solder stencils are used to screen the optimum amount. be covered with paste.
These stencils are typically 0.008 inches thick and may be
made of brass or stainless steel. For packages such as the
SC–59, SC–70/SOT–323, SOD–123, SOT–23, SOT–143,
SOT–223, SO–8, SO–14, SO–16, and SMB/SMC diode ÇÇ
ÇÇ ÇÇÇÇÇÇ ÇÇ
ÇÇÇÇÇÇ ÇÇ 
 

ÇÇ ÇÇÇ ÇÇ
packages, the stencil opening should be the same as the pad  
size or a 1:1 registration. This is not the case with the DPAK
and D2PAK packages. If one uses a 1:1 opening to screen
solder onto the drain pad, misalignment and/or
“tombstoning” may occur due to an excess of solder. For
ÇÇ
ÇÇ ÇÇÇ
ÇÇÇÇÇÇ   

these two packages, the opening in the stencil for the paste
should be approximately 50% of the tab area. The opening Figure 17. Typical Stencil for DPAK and
for the leads is still a 1:1 registration. Figure 17 shows a D2PAK Packages
typical stencil for the DPAK and D2PAK packages. The

SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • When shifting from preheating to soldering, the
temperature of the device. When the entire device is heated maximum temperature gradient shall be 5°C or less.
to a high temperature, failure to complete soldering within • After soldering has been completed, the device should
a short time could result in device failure. Therefore, the be allowed to cool naturally for at least three minutes.
following items should always be observed in order to Gradual cooling should be used as the use of forced
minimize the thermal stress to which the devices are cooling will increase the temperature gradient and
subjected. result in latent failure due to mechanical stress.
• Always preheat the device. • Mechanical stress or shock should not be applied
• The delta temperature between the preheat and during cooling.
soldering should be 100°C or less.*
• When preheating and soldering, the temperature of the * Soldering a device without preheating can cause
leads and the case must not exceed the maximum excessive thermal shock and stress which can result in
temperature ratings as shown on the data sheet. When damage to the device.
using infrared heating with the reflow soldering
method, the difference shall be a maximum of 10°C. * Due to shadowing and the inability to set the wave height
• The soldering temperature and time shall not exceed to incorporate other surface mount components, the D2PAK
260°C for more than 10 seconds. is not recommended for wave soldering.

http://onsemi.com
823
MTB36N06V

TYPICAL SOLDER HEATING PROFILE


For any given circuit board, there will be a group of The line on the graph shows the actual temperature that
control settings that will give the desired heat pattern. The might be experienced on the surface of a test board at or
operator must set temperatures for several heating zones, near a central solder joint. The two profiles are based on a
and a figure for belt speed. Taken together, these control high density and a low density board. The Vitronics
settings make up a heating “profile” for that particular SMD310 convection/infrared reflow soldering system was
circuit board. On machines controlled by a computer, the used to generate this profile. The type of solder used was
computer remembers these profiles from one operating 62/36/2 Tin Lead Silver with a melting point between
session to the next. Figure 18 shows a typical heating 177–189°C. When this type of furnace is used for solder
profile for use when soldering a surface mount device to a reflow work, the circuit boards and solder joints tend to
printed circuit board. This profile will vary among heat first. The components on the board are then heated by
soldering systems but it is a good starting point. Factors that conduction. The circuit board, because it has a large surface
can affect the profile include the type of soldering system in area, absorbs the thermal energy more efficiently, then
use, density and types of components on the board, type of distributes this energy to the components. Because of this
solder used, and the type of board or substrate material effect, the main body of a component may be up to 30
being used. This profile shows temperature versus time. degrees cooler than the adjacent solder joints.

STEP 1 STEP 2 STEP 3 STEP 4 STEP 5 STEP 6 STEP 7


PREHEAT VENT HEATING HEATING HEATING VENT COOLING
ZONE 1 “SOAK” ZONES 2 & 5 ZONES 3 & 6 ZONES 4 & 7
“RAMP” “RAMP” “SOAK” “SPIKE” 205° TO 219°C
PEAK AT
200°C DESIRED CURVE FOR HIGH 170°C SOLDER
MASS ASSEMBLIES JOINT
160°C
150°C

150°C
SOLDER IS LIQUID FOR
40 TO 80 SECONDS
100°C 140°C (DEPENDING ON
MASS OF ASSEMBLY)
100°C

DESIRED CURVE FOR LOW


MASS ASSEMBLIES
5°C

TIME (3 TO 7 MINUTES TOTAL) TMAX


Figure 18. Typical Solder Heating Profile

http://onsemi.com
824

Preferred Device

#$%& '(
    
N–Channel D2PAK
This Power MOSFET is designed to withstand high energy in the
avalanche and commutation modes. The energy efficient design also
offers a drain–to–source diode with a fast recovery time. Designed for http://onsemi.com
low voltage, high speed switching applications in power supplies,
converters and PWM motor controls, these devices are particularly 40 AMPERES
well suited for bridge circuits where diode speed and commutating 100 VOLTS
safe operating areas are critical and offer additional safety margin
against unexpected voltage transients.
RDS(on) = 40 mΩ
• Avalanche Energy Specified
• Source–to–Drain Diode Recovery Time Comparable to a N–Channel
Discrete Fast Recovery Diode D
• Diode is Characterized for Use in Bridge Circuits
• IDSS and VDS(on) Specified at Elevated Temperature
G
MAXIMUM RATINGS (TC = 25°C unless otherwise noted)
Rating Symbol Value Unit
S
Drain–to–Source Voltage VDSS 100 Vdc
Drain–to–Gate Voltage (RGS = 1.0 MΩ) VDGR 100 Vdc
Gate–to–Source Voltage 4
– Continuous VGS ± 20 Vdc
D2PAK
– Non–Repetitive (tp ≤ 10 ms) VGSM ± 40 Vpk
CASE 418B
1 2
Drain Current – Continuous ID 40 Adc STYLE 2
Drain Current – Continuous @ 100°C ID 29 3
Drain Current – Single Pulse (tp ≤ 10 µs) IDM 140 Apk
MARKING DIAGRAM
Total Power Dissipation PD 169 Watts
Derate above 25°C 1.35 W/°C & PIN ASSIGNMENT
Total Power Dissipation @ TA = 25°C 2.5 Watts 4
(Note 1.) Drain

Operating and Storage Temperature TJ, Tstg – 55 to °C


Range 150
T40N10E
Single Pulse Drain–to–Source Avalanche EAS mJ
YWW
Energy – Starting TJ = 25°C 800
(VDD = 75 Vdc, VGS = 10 Vdc, Peak
IL = 40 Apk, L = 1.0 mH, RG = 25 Ω)
1 2 3
Thermal Resistance °C/W Gate Drain Source
– Junction to Case RθJC 0.74
– Junction to Ambient RθJA 62.5 T40N10E = Device Code
– Junction to Ambient (Note 1.) RθJA 50 Y = Year
Maximum Lead Temperature for Soldering TL 260 °C WW = Work Week
Purposes, 1/8″ from case for 10
seconds ORDERING INFORMATION
1. When surface mounted to an FR4 board using the minimum recommended
pad size. Device Package Shipping

MTB40N10E D2PAK 50 Units/Rail

MTB40N10ET4 D2PAK 800/Tape & Reel

Preferred devices are recommended choices for future use


and best overall value.

 Semiconductor Components Industries, LLC, 2000 825 Publication Order Number:


November, 2000 – Rev. 2 MTB40N10E/D
MTB40N10E

ELECTRICAL CHARACTERISTICS (TJ = 25°C unless otherwise noted)


Characteristic Symbol Min Typ Max Unit
OFF CHARACTERISTICS
Drain–to–Source Breakdown Voltage V(BR)DSS Vdc
(VGS = 0 Vdc, ID = 0.25 mAdc) 100 – –
Temperature Coefficient (Positive) (Cpk ≥ 2.0) (Note 4.) – 112 – mV/°C
Zero Gate Voltage Drain Current IDSS µAdc
(VDS = 100 Vdc, VGS = 0 Vdc) – – 10
(VDS = 100 Vdc, VGS = 0 Vdc, TJ = 125°C) – – 100
Gate–Body Leakage Current (VGS = ± 20 Vdc, VDS = 0 Vdc) IGSS – – 100 nAdc
ON CHARACTERISTICS (Note 2.)
Gate Threshold Voltage (Cpk ≥ 2.0) (Note 4.) VGS(th) Vdc
(VDS = VGS, ID = 250 µAdc) 2.0 2.9 4.0
Threshold Temperature Coefficient (Negative) – 6.7 – mV/°C
Static Drain–to–Source On–Resistance RDS(on) Ohms
(VGS = 10 Vdc, ID = 20 Adc) (Cpk ≥ 2.0) (Note 4.) – 0.033 0.04

Drain–to–Source On–Voltage (VGS = 10 Vdc) VDS(on) Vdc


(ID = 40 Adc) – – 1.9
(ID = 20 Adc, TJ = 125°C) – – 1.7
Forward Transconductance (VDS = 8.4 Vdc, ID = 20 Adc) gFS 17 21 – mhos
DYNAMIC CHARACTERISTICS
Input Capacitance Ciss – 2305 3230 pF
Output Capacitance (VDS = 25 Vd
Vdc, VGS = 0 Vd
Vdc,
Coss – 620 1240
f = 1.0 MHz)
Transfer Capacitance Crss – 205 290
SWITCHING CHARACTERISTICS (Note 3.)
Turn–On Delay Time td(on) – 19 40 ns
Rise Time (VDD = 50 Vdc, ID = 40 Adc, tr – 165 330
VGS = 10 Vdc
Vdc,
Turn–Off Delay Time RG = 9.1 Ω) td(off) – 75 150
Fall Time tf – 97 190
Gate Charge QT – 80 110 nC
(S Figure
(See Fi 8)
(VDS = 80 Vdc, ID = 40 Adc, Q1 – 15 –
VGS = 10 Vdc) Q2 – 40 –
Q3 – 29 –
SOURCE–DRAIN DIODE CHARACTERISTICS
Forward On–Voltage VSD Vdc
(IS = 40 Adc, VGS = 0 Vdc) – 0.96 1.0
(IS = 40 Adc, VGS = 0 Vdc, TJ = 125°C) – 0.88 –
Reverse Recovery Time trr – 152 – ns
(S Figure
(See Fi 14)
ta – 117 –
(IS = 40 Adc,
Adc VGS = 0 Vdc,
Vdc
dIS/dt = 100 A/µs) tb – 35 –
Reverse Recovery Stored QRR – 1.0 – µC
Charge
INTERNAL PACKAGE INDUCTANCE
Internal Drain Inductance LD nH
(Measured from the contact screw on tab to center of die) – 3.5 –
(Measured from the drain lead 0.25″ from package to center of die) – 4.5 –
Internal Source Inductance LS
(Measured from the source lead 0.25″ from package to source bond pad) – 7.5 –
2. Pulse Test: Pulse Width ≤ 300 µs, Duty Cycle ≤ 2%.
3. Switching characteristics are independent of operating junction temperature.
Ť
4. Reflects typical values. Cpk + Max limit – Typ
3 sigma
Ť
http://onsemi.com
826
MTB40N10E

TYPICAL ELECTRICAL CHARACTERISTICS

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Figure 3. On–Resistance versus Drain Current Figure 4. On–Resistance versus Drain Current
and Temperature and Gate Voltage

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Figure 5. On–Resistance Variation with Figure 6. Drain–To–Source Leakage
Temperature Current versus Voltage

http://onsemi.com
827
MTB40N10E

POWER MOSFET SWITCHING

Switching behavior is most easily modeled and predicted The capacitance (Ciss) is read from the capacitance curve at
by recognizing that the power MOSFET is charge a voltage corresponding to the off–state condition when
controlled. The lengths of various switching intervals (∆t) calculating td(on) and is read at a voltage corresponding to the
are determined by how fast the FET input capacitance can on–state when calculating td(off).
be charged by current from the generator. At high switching speeds, parasitic circuit elements
The published capacitance data is difficult to use for complicate the analysis. The inductance of the MOSFET
calculating rise and fall because drain–gate capacitance source lead, inside the package and in the circuit wiring
varies greatly with applied voltage. Accordingly, gate which is common to both the drain and gate current paths,
charge data is used. In most cases, a satisfactory estimate of produces a voltage at the source which reduces the gate drive
average input current (IG(AV)) can be made from a current. The voltage is determined by Ldi/dt, but since di/dt
rudimentary analysis of the drive circuit so that is a function of drain current, the mathematical solution is
t = Q/IG(AV) complex. The MOSFET output capacitance also
complicates the mathematics. And finally, MOSFETs have
During the rise and fall time interval when switching a finite internal gate resistance which effectively adds to the
resistive load, VGS remains virtually constant at a level resistance of the driving source, but the internal resistance
known as the plateau voltage, VSGP. Therefore, rise and fall is difficult to measure and, consequently, is not specified.
times may be approximated by the following: The resistive switching time variation versus gate
tr = Q2 x RG/(VGG – VGSP) resistance (Figure 9) shows how typical switching
tf = Q2 x RG/VGSP performance is affected by the parasitic circuit elements. If
where the parasitics were not present, the slope of the curves would
maintain a value of unity regardless of the switching speed.
VGG = the gate drive voltage, which varies from zero to VGG
The circuit used to obtain the data is constructed to minimize
RG = the gate drive resistance
common inductance in the drain and gate circuit loops and
and Q2 and VGSP are read from the gate charge curve.
is believed readily achievable with board mounted
During the turn–on and turn–off delay times, gate current is components. Most power electronic loads are inductive; the
not constant. The simplest calculation uses appropriate data in the figure is taken with a resistive load, which
values from the capacitance curves in a standard equation for approximates an optimally snubbed inductive load. Power
voltage change in an RC network. The equations are: MOSFETs may be safely operated into an inductive load;
td(on) = RG Ciss In [VGG/(VGG – VGSP)] however, snubbing reduces switching losses.
td(off) = RG Ciss In (VGG/VGSP)

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Figure 7. Capacitance Variation

http://onsemi.com
828
MTB40N10E

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Figure 8. Gate–To–Source and Drain–To–Source Figure 9. Resistive Switching Time


Voltage versus Total Charge Variation versus Gate Resistance

DRAIN–TO–SOURCE DIODE CHARACTERISTICS


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Figure 10. Diode Forward Voltage versus Current

SAFE OPERATING AREA

The Forward Biased Safe Operating Area curves define reliable operation, the stored energy from circuit inductance
the maximum simultaneous drain–to–source voltage and dissipated in the transistor while in avalanche must be less
drain current that a transistor can handle safely when it is than the rated limit and adjusted for operating conditions
forward biased. Curves are based upon maximum peak differing from those specified. Although industry practice is
junction temperature and a case temperature (TC) of 25°C. to rate in terms of energy, avalanche energy capability is not
Peak repetitive pulsed power limits are determined by using a constant. The energy rating decreases non–linearly with an
the thermal response data in conjunction with the procedures increase of peak current in avalanche and peak junction
discussed in AN569, “Transient Thermal temperature.
Resistance–General Data and Its Use.” Although many E–FETs can withstand the stress of
Switching between the off–state and the on–state may drain–to–source avalanche at currents up to rated pulsed
traverse any load line provided neither rated peak current current (IDM), the energy rating is specified at rated
(IDM) nor rated voltage (VDSS) is exceeded and the continuous current (ID), in accordance with industry
transition time (tr,tf) do not exceed 10 µs. In addition the total custom. The energy rating must be derated for temperature
power averaged over a complete switching cycle must not as shown in the accompanying graph (Figure 12). Maximum
exceed (TJ(MAX) – TC)/(RθJC). energy at currents below rated continuous ID can safely be
A Power MOSFET designated E–FET can be safely used assumed to equal the values indicated.
in switching circuits with unclamped inductive loads. For

http://onsemi.com
829
MTB40N10E

SAFE OPERATING AREA

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Figure 11. Maximum Rated Forward Biased Figure 12. Maximum Avalanche Energy versus
Safe Operating Area Starting Junction Temperature


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Figure 13. Thermal Response

4
RθJA = 50°C/W
Board material = 0.065 mil FR–4
#$ Mounted on the minimum recommended footprint
 /
     / 

Collector/Drain Pad Size ≈ 450 mils x 350 mils

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Figure 14. Diode Reverse Recovery Waveform Figure 15. D2PAK Power Derating Curve

http://onsemi.com
830
MTB40N10E

INFORMATION FOR USING THE D2PAK SURFACE MOUNT PACKAGE

RECOMMENDED FOOTPRINT FOR SURFACE MOUNTED APPLICATIONS


Surface mount board layout is a critical portion of the interface between the board and the package. With the
total design. The footprint for the semiconductor packages correct pad geometry, the packages will self align when
must be the correct size to ensure proper solder connection subjected to a solder reflow process.

44
848

8
#4#
6# #6
99 979
6
9
#
4$
94 inches
:# mm

POWER DISSIPATION FOR A SURFACE MOUNT DEVICE


The power dissipation for a surface mount device is a PD = 150°C – 25°C = 2.5 Watts
function of the drain pad size. These can vary from the 50°C/W
minimum pad size for soldering to a pad size given for
The 50°C/W for the D2PAK package assumes the use of
maximum power dissipation. Power dissipation for a
the recommended footprint on a glass epoxy printed circuit
surface mount device is determined by TJ(max), the
board to achieve a power dissipation of 2.5 Watts. There are
maximum rated junction temperature of the die, RθJA, the
other alternatives to achieving higher power dissipation
thermal resistance from the device junction to ambient, and
from the surface mount packages. One is to increase the
the operating temperature, TA. Using the values provided
area of the drain pad. By increasing the area of the drain
on the data sheet, PD can be calculated as follows:
pad, the power dissipation can be increased. Although one
TJ(max) – TA can almost double the power dissipation with this method,
PD =
RθJA one will be giving up area on the printed circuit board
The values for the equation are found in the maximum which can defeat the purpose of using surface mount
ratings table on the data sheet. Substituting these values technology. For example, a graph of RθJA versus drain pad
into the equation for an ambient temperature TA of 25°C, area is shown in Figure 16.
one can calculate the power dissipation of the device. For a
D2PAK device, PD is calculated as follows.
:

θ, 
 
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Figure 16. Thermal Resistance versus Drain Pad
Area for the D2PAK Package (Typical)

http://onsemi.com
831
MTB40N10E

Another alternative would be to use a ceramic substrate board, the power dissipation can be doubled using the same
or an aluminum core board such as Thermal Cladt. Using footprint.
a board material such as Thermal Clad, an aluminum core

SOLDER STENCIL GUIDELINES


Prior to placing surface mount components onto a printed pattern of the opening in the stencil for the drain pad is not
circuit board, solder paste must be applied to the pads. critical as long as it allows approximately 50% of the pad to
Solder stencils are used to screen the optimum amount. be covered with paste.
These stencils are typically 0.008 inches thick and may be
made of brass or stainless steel. For packages such as the
SC–59, SC–70/SOT–323, SOD–123, SOT–23, SOT–143,
SOT–223, SO–8, SO–14, SO–16, and SMB/SMC diode ÇÇ
ÇÇ ÇÇÇÇÇÇ ÇÇ
ÇÇÇÇÇÇ ÇÇ

 

ÇÇ ÇÇÇÇÇÇ
packages, the stencil opening should be the same as the pad  
size or a 1:1 registration. This is not the case with the DPAK
and D2PAK packages. If one uses a 1:1 opening to screen
solder onto the drain pad, misalignment and/or
“tombstoning” may occur due to an excess of solder. For
ÇÇ ÇÇÇÇÇÇ   

these two packages, the opening in the stencil for the paste
Figure 17. Typical Stencil for DPAK and
should be approximately 50% of the tab area. The opening D2PAK Packages
for the leads is still a 1:1 registration. Figure 17 shows a
typical stencil for the DPAK and D2PAK packages. The

SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • When shifting from preheating to soldering, the
temperature of the device. When the entire device is heated maximum temperature gradient shall be 5°C or less.
to a high temperature, failure to complete soldering within • After soldering has been completed, the device should
a short time could result in device failure. Therefore, the be allowed to cool naturally for at least three minutes.
following items should always be observed in order to Gradual cooling should be used as the use of forced
minimize the thermal stress to which the devices are cooling will increase the temperature gradient and
subjected. result in latent failure due to mechanical stress.
• Always preheat the device. • Mechanical stress or shock should not be applied
• The delta temperature between the preheat and during cooling.
soldering should be 100°C or less.*
• When preheating and soldering, the temperature of the * Soldering a device without preheating can cause
leads and the case must not exceed the maximum excessive thermal shock and stress which can result in
temperature ratings as shown on the data sheet. When damage to the device.
using infrared heating with the reflow soldering
method, the difference shall be a maximum of 10°C. * Due to shadowing and the inability to set the wave height
• The soldering temperature and time shall not exceed to incorporate other surface mount components, the D2PAK
260°C for more than 10 seconds. is not recommended for wave soldering.

http://onsemi.com
832
MTB40N10E

TYPICAL SOLDER HEATING PROFILE


For any given circuit board, there will be a group of The line on the graph shows the actual temperature that
control settings that will give the desired heat pattern. The might be experienced on the surface of a test board at or
operator must set temperatures for several heating zones, near a central solder joint. The two profiles are based on a
and a figure for belt speed. Taken together, these control high density and a low density board. The Vitronics
settings make up a heating “profile” for that particular SMD310 convection/infrared reflow soldering system was
circuit board. On machines controlled by a computer, the used to generate this profile. The type of solder used was
computer remembers these profiles from one operating 62/36/2 Tin Lead Silver with a melting point between
session to the next. Figure 18 shows a typical heating 177–189°C. When this type of furnace is used for solder
profile for use when soldering a surface mount device to a reflow work, the circuit boards and solder joints tend to
printed circuit board. This profile will vary among heat first. The components on the board are then heated by
soldering systems but it is a good starting point. Factors that conduction. The circuit board, because it has a large surface
can affect the profile include the type of soldering system in area, absorbs the thermal energy more efficiently, then
use, density and types of components on the board, type of distributes this energy to the components. Because of this
solder used, and the type of board or substrate material effect, the main body of a component may be up to 30
being used. This profile shows temperature versus time. degrees cooler than the adjacent solder joints.

STEP 1 STEP 2 STEP 3 STEP 4 STEP 5 STEP 6 STEP 7


PREHEAT VENT HEATING HEATING HEATING VENT COOLING
ZONE 1 “SOAK” ZONES 2 & 5 ZONES 3 & 6 ZONES 4 & 7
“RAMP” “RAMP” “SOAK” “SPIKE” 205° TO 219°C
PEAK AT
200°C DESIRED CURVE FOR HIGH 170°C SOLDER
MASS ASSEMBLIES JOINT
160°C
150°C

150°C
SOLDER IS LIQUID FOR
40 TO 80 SECONDS
100°C 140°C (DEPENDING ON
MASS OF ASSEMBLY)
100°C

DESIRED CURVE FOR LOW


MASS ASSEMBLIES
5°C

TIME (3 TO 7 MINUTES TOTAL) TMAX


Figure 18. Typical Solder Heating Profile

http://onsemi.com
833

Preferred Device

#$%& '(
    
N–Channel D2PAK
This Power MOSFET is designed to withstand high energy in the
avalanche and commutation modes. Designed for low voltage, high
speed switching applications in power supplies, converters and power http://onsemi.com
motor controls, these devices are particularly well suited for bridge
circuits where diode speed and commutating safe operating areas are 42 AMPERES
critical and offer additional safety margin against unexpected voltage 60 VOLTS
transients.
RDS(on) = 28 mΩ
• Avalanche Energy Specified
• IDSS and VDS(on) Specified at Elevated Temperature
N–Channel
MAXIMUM RATINGS (TC = 25°C unless otherwise noted) D

Rating Symbol Value Unit


Drain–Source Voltage VDSS 60 Vdc
Drain–Gate Voltage (RGS = 1.0 MΩ) VDGR 60 Vdc G
Gate–Source Voltage
– Continuous VGS ±20 Vdc
S
– Non–Repetitive (tp ≤ 10 ms) VGSM ±25 Vpk
Drain Current – Continuous @ 25°C ID 42 Adc
Drain Current – Continuous @ 100°C ID 30 4
Drain Current – Single Pulse (tp ≤ 10 µs) IDM 147 Apk
D2PAK
Total Power Dissipation @ 25°C PD 125 Watts CASE 418B
1 2
Derate above 25°C 0.83 W/°C STYLE 2
Total Power Dissipation @ TA = 25°C 3.0 Watts 3
(Note 1.)
Operating and Storage Temperature TJ, Tstg – 55 to °C MARKING DIAGRAM
Range 175 & PIN ASSIGNMENT
4
Single Pulse Drain–to–Source Avalanche EAS 400 mJ
Drain
Energy – Starting TJ = 25°C
(VDD = 25 Vdc, VGS = 10 Vdc,
IL = 42 Apk, L = 0.454 µH, RG = 25 Ω)
Thermal Resistance °C/W MTB50N06V
– Junction to Case RθJC 1.2 YWW
– Junction to Ambient RθJA 62.5
– Junction to Ambient (Note 1.) RθJA 50
Maximum Lead Temperature for Soldering TL 260 °C 1 2 3
Purposes, 1/8″ from case for 10 Gate Drain Source
seconds
1. When surface mounted to an FR4 board using the minimum recommended MTB50N06V = Device Code
pad size. Y = Year
WW = Work Week

ORDERING INFORMATION

Device Package Shipping

MTB50N06V D2PAK 50 Units/Rail

MTB50N06VT4 D2PAK 800/Tape & Reel

Preferred devices are recommended choices for future use


and best overall value.

 Semiconductor Components Industries, LLC, 2000 834 Publication Order Number:


November, 2000 – Rev. 4 MTB50N06V/D
MTB50N06V

ELECTRICAL CHARACTERISTICS (TJ = 25°C unless otherwise noted)


Characteristic Symbol Min Typ Max Unit
OFF CHARACTERISTICS
Drain–Source Breakdown Voltage V(BR)DSS
(VGS = 0 Vdc, ID = 0.25 mAdc) 60 – – Vdc
Temperature Coefficient (Positive) – 69 – mV/°C
Zero Gate Voltage Drain Current IDSS µAdc
(VDS = 60 Vdc, VGS = 0 Vdc) – – 10
(VDS = 60 Vdc, VGS = 0 Vdc, TJ = 150°C) – – 100
Gate–Body Leakage Current (VGS = ±20 Vdc, VDS = 0) IGSS – – 100 nAdc
ON CHARACTERISTICS (Note 2.)
Gate Threshold Voltage VGS(th)
(VDS = VGS, ID = 250 µAdc) 2.0 2.7 4.0 Vdc
Temperature Coefficient (Negative) – 3.0 – mV/°C
Static Drain–Source On–Resistance (VGS = 10 Vdc, ID = 21 Adc) RDS(on) – 0.025 0.028 Ohm
Drain–Source On–Voltage (VGS = 10 Vdc) VDS(on) Vdc
(ID = 42 Adc) – 1.4 1.7
(ID = 21 Adc, TJ = 150°C) – – 1.6
Forward Transconductance (VDS = 6.25 Vdc, ID = 20 Adc) gFS 16 23 – mhos
DYNAMIC CHARACTERISTICS
Input Capacitance Ciss – 1644 2320 pF
Output Capacitance (VDS = 25 Vd
Vdc, VGS = 0 Vd
Vdc,
Coss – 465 660
f = 1.0 MHz)
Reverse Transfer Capacitance Crss – 112 230

SWITCHING CHARACTERISTICS (Note 3.)


Turn–On Delay Time td(on) – 12 20 ns
Rise Time (VDD = 25 Vdc, ID = 42 Adc, tr – 122 250
VGS = 10 Vdc
Vdc,
Turn–Off Delay Time RG = 9.1 Ω) td(off) – 64 110
Fall Time tf – 54 90
Gate Charge QT – 47 70 nC
(S Figure
(See Fi 8)
(VDS = 48 Vdc, ID = 42 Adc, Q1 – 9 –
VGS = 10 Vdc) Q2 – 21 –
Q3 – 16 –
SOURCE–DRAIN DIODE CHARACTERISTICS
Forward On–Voltage (Note 2.) VSD Vdc
(IS = 42 Adc, VGS = 0 Vdc)
– 1.06 2.5
(IS = 42 Adc, VGS = 0 Vdc, TJ = 150°C)
– 0.99 –
Reverse Recovery Time trr – 84 – ns
(S Figure
(See Fi 14)
ta – 73 –
Adc VGS = 0 Vdc,
(IS = 42 Adc, Vdc
dIS/dt = 100 A/µs) tb – 11 –
Reverse Recovery Stored QRR – 0.28 – µC
Charge

INTERNAL PACKAGE INDUCTANCE


Internal Drain Inductance LD nH
(Measured from contact screw on tab to center of die) – 3.5 –
(Measured from the drain lead 0.25″ from package to center of die) – 4.5 –
Internal Source Inductance LS – 7.5 – nH
(Measured from the source lead 0.25″ from package to source bond pad)
2. Pulse Test: Pulse Width ≤ 300 µs, Duty Cycle ≤ 2%.
3. Switching characteristics are independent of operating junction temperature.

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835
MTB50N06V

TYPICAL ELECTRICAL CHARACTERISTICS

 
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Figure 3. On–Resistance versus Drain Current Figure 4. On–Resistance versus Drain Current
and Temperature and Gate Voltage

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Figure 5. On–Resistance Variation with Figure 6. Drain–To–Source Leakage


Temperature Current versus Voltage

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836
MTB50N06V

POWER MOSFET SWITCHING

Switching behavior is most easily modeled and predicted The capacitance (Ciss) is read from the capacitance curve at
by recognizing that the power MOSFET is charge a voltage corresponding to the off–state condition when
controlled. The lengths of various switching intervals (∆t) calculating td(on) and is read at a voltage corresponding to the
are determined by how fast the FET input capacitance can on–state when calculating td(off).
be charged by current from the generator. At high switching speeds, parasitic circuit elements
The published capacitance data is difficult to use for complicate the analysis. The inductance of the MOSFET
calculating rise and fall because drain–gate capacitance source lead, inside the package and in the circuit wiring
varies greatly with applied voltage. Accordingly, gate which is common to both the drain and gate current paths,
charge data is used. In most cases, a satisfactory estimate of produces a voltage at the source which reduces the gate drive
average input current (IG(AV)) can be made from a current. The voltage is determined by Ldi/dt, but since di/dt
rudimentary analysis of the drive circuit so that is a function of drain current, the mathematical solution is
t = Q/IG(AV) complex. The MOSFET output capacitance also
complicates the mathematics. And finally, MOSFETs have
During the rise and fall time interval when switching a finite internal gate resistance which effectively adds to the
resistive load, VGS remains virtually constant at a level resistance of the driving source, but the internal resistance
known as the plateau voltage, VSGP. Therefore, rise and fall is difficult to measure and, consequently, is not specified.
times may be approximated by the following: The resistive switching time variation versus gate
tr = Q2 x RG/(VGG – VGSP) resistance (Figure 9) shows how typical switching
tf = Q2 x RG/VGSP performance is affected by the parasitic circuit elements. If
where the parasitics were not present, the slope of the curves would
maintain a value of unity regardless of the switching speed.
VGG = the gate drive voltage, which varies from zero to VGG
The circuit used to obtain the data is constructed to minimize
RG = the gate drive resistance
common inductance in the drain and gate circuit loops and
and Q2 and VGSP are read from the gate charge curve.
is believed readily achievable with board mounted
During the turn–on and turn–off delay times, gate current is components. Most power electronic loads are inductive; the
not constant. The simplest calculation uses appropriate data in the figure is taken with a resistive load, which
values from the capacitance curves in a standard equation for approximates an optimally snubbed inductive load. Power
voltage change in an RC network. The equations are: MOSFETs may be safely operated into an inductive load;
td(on) = RG Ciss In [VGG/(VGG – VGSP)] however, snubbing reduces switching losses.
td(off) = RG Ciss In (VGG/VGSP)

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Figure 7. Capacitance Variation

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Figure 8. Gate–To–Source and Drain–To–Source Figure 9. Resistive Switching Time


Voltage versus Total Charge Variation versus Gate Resistance

DRAIN–TO–SOURCE DIODE CHARACTERISTICS


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Figure 10. Diode Forward Voltage versus Current

SAFE OPERATING AREA

The Forward Biased Safe Operating Area curves define reliable operation, the stored energy from circuit inductance
the maximum simultaneous drain–to–source voltage and dissipated in the transistor while in avalanche must be less
drain current that a transistor can handle safely when it is than the rated limit and adjusted for operating conditions
forward biased. Curves are based upon maximum peak differing from those specified. Although industry practice is
junction temperature and a case temperature (TC) of 25°C. to rate in terms of energy, avalanche energy capability is not
Peak repetitive pulsed power limits are determined by using a constant. The energy rating decreases non–linearly with an
the thermal response data in conjunction with the procedures increase of peak current in avalanche and peak junction
discussed in AN569, “Transient Thermal temperature.
Resistance–General Data and Its Use.” Although many E–FETs can withstand the stress of
Switching between the off–state and the on–state may drain–to–source avalanche at currents up to rated pulsed
traverse any load line provided neither rated peak current current (IDM), the energy rating is specified at rated
(IDM) nor rated voltage (VDSS) is exceeded and the continuous current (ID), in accordance with industry
transition time (tr,tf) do not exceed 10 µs. In addition the total custom. The energy rating must be derated for temperature
power averaged over a complete switching cycle must not as shown in the accompanying graph (Figure 12). Maximum
exceed (TJ(MAX) – TC)/(RθJC). energy at currents below rated continuous ID can safely be
A Power MOSFET designated E–FET can be safely used assumed to equal the values indicated.
in switching circuits with unclamped inductive loads. For

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838
MTB50N06V

SAFE OPERATING AREA

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Safe Operating Area Starting Junction Temperature


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Figure 13. Thermal Response

4
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Board material = 0.065 mil FR–4
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Collector/Drain Pad Size ≈ 450 mils x 350 mils

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Figure 14. Diode Reverse Recovery Waveform Figure 15. D2PAK Power Derating Curve

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839
MTB50N06V

INFORMATION FOR USING THE D2PAK SURFACE MOUNT PACKAGE

RECOMMENDED FOOTPRINT FOR SURFACE MOUNTED APPLICATIONS


Surface mount board layout is a critical portion of the interface between the board and the package. With the
total design. The footprint for the semiconductor packages correct pad geometry, the packages will self align when
must be the correct size to ensure proper solder connection subjected to a solder reflow process.

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POWER DISSIPATION FOR A SURFACE MOUNT DEVICE


The power dissipation for a surface mount device is a PD = 175°C – 25°C = 3.0 Watts
function of the drain pad size. These can vary from the 50°C/W
minimum pad size for soldering to a pad size given for
The 50°C/W for the D2PAK package assumes the use of
maximum power dissipation. Power dissipation for a
the recommended footprint on a glass epoxy printed circuit
surface mount device is determined by TJ(max), the
board to achieve a power dissipation of 3.0 Watts. There are
maximum rated junction temperature of the die, RθJA, the
other alternatives to achieving higher power dissipation
thermal resistance from the device junction to ambient, and
from the surface mount packages. One is to increase the
the operating temperature, TA. Using the values provided
area of the drain pad. By increasing the area of the drain
on the data sheet, PD can be calculated as follows:
pad, the power dissipation can be increased. Although one
TJ(max) – TA can almost double the power dissipation with this method,
PD =
RθJA one will be giving up area on the printed circuit board
The values for the equation are found in the maximum which can defeat the purpose of using surface mount
ratings table on the data sheet. Substituting these values technology. For example, a graph of RθJA versus drain pad
into the equation for an ambient temperature TA of 25°C, area is shown in Figure 16.
one can calculate the power dissipation of the device. For a
D2PAK device, PD is calculated as follows.

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Area for the D2PAK Package (Typical)

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840
MTB50N06V

Another alternative would be to use a ceramic substrate board, the power dissipation can be doubled using the same
or an aluminum core board such as Thermal Cladt. Using footprint.
a board material such as Thermal Clad, an aluminum core

SOLDER STENCIL GUIDELINES


Prior to placing surface mount components onto a printed pattern of the opening in the stencil for the drain pad is not
circuit board, solder paste must be applied to the pads. critical as long as it allows approximately 50% of the pad to
Solder stencils are used to screen the optimum amount. be covered with paste.
These stencils are typically 0.008 inches thick and may be
made of brass or stainless steel. For packages such as the
SC–59, SC–70/SOT–323, SOD–123, SOT–23, SOT–143,
SOT–223, SO–8, SO–14, SO–16, and SMB/SMC diode ÇÇ
ÇÇ ÇÇÇÇÇÇ ÇÇ
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ÇÇ ÇÇÇÇÇÇ
packages, the stencil opening should be the same as the pad  
size or a 1:1 registration. This is not the case with the DPAK
and D2PAK packages. If one uses a 1:1 opening to screen
solder onto the drain pad, misalignment and/or
“tombstoning” may occur due to an excess of solder. For
ÇÇ ÇÇÇÇÇÇ   

these two packages, the opening in the stencil for the paste
Figure 17. Typical Stencil for DPAK and
should be approximately 50% of the tab area. The opening D2PAK Packages
for the leads is still a 1:1 registration. Figure 17 shows a
typical stencil for the DPAK and D2PAK packages. The

SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • When shifting from preheating to soldering, the
temperature of the device. When the entire device is heated maximum temperature gradient shall be 5°C or less.
to a high temperature, failure to complete soldering within • After soldering has been completed, the device should
a short time could result in device failure. Therefore, the be allowed to cool naturally for at least three minutes.
following items should always be observed in order to Gradual cooling should be used as the use of forced
minimize the thermal stress to which the devices are cooling will increase the temperature gradient and
subjected. result in latent failure due to mechanical stress.
• Always preheat the device. • Mechanical stress or shock should not be applied
• The delta temperature between the preheat and during cooling.
soldering should be 100°C or less.*
• When preheating and soldering, the temperature of the * Soldering a device without preheating can cause
leads and the case must not exceed the maximum excessive thermal shock and stress which can result in
temperature ratings as shown on the data sheet. When damage to the device.
using infrared heating with the reflow soldering
method, the difference shall be a maximum of 10°C. * Due to shadowing and the inability to set the wave height
• The soldering temperature and time shall not exceed to incorporate other surface mount components, the D2PAK
260°C for more than 10 seconds. is not recommended for wave soldering.

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MTB50N06V

TYPICAL SOLDER HEATING PROFILE


For any given circuit board, there will be a group of The line on the graph shows the actual temperature that
control settings that will give the desired heat pattern. The might be experienced on the surface of a test board at or
operator must set temperatures for several heating zones, near a central solder joint. The two profiles are based on a
and a figure for belt speed. Taken together, these control high density and a low density board. The Vitronics
settings make up a heating “profile” for that particular SMD310 convection/infrared reflow soldering system was
circuit board. On machines controlled by a computer, the used to generate this profile. The type of solder used was
computer remembers these profiles from one operating 62/36/2 Tin Lead Silver with a melting point between
session to the next. Figure 18 shows a typical heating 177–189°C. When this type of furnace is used for solder
profile for use when soldering a surface mount device to a reflow work, the circuit boards and solder joints tend to
printed circuit board. This profile will vary among heat first. The components on the board are then heated by
soldering systems but it is a good starting point. Factors that conduction. The circuit board, because it has a large surface
can affect the profile include the type of soldering system in area, absorbs the thermal energy more efficiently, then
use, density and types of components on the board, type of distributes this energy to the components. Because of this
solder used, and the type of board or substrate material effect, the main body of a component may be up to 30
being used. This profile shows temperature versus time. degrees cooler than the adjacent solder joints.

STEP 1 STEP 2 STEP 3 STEP 4 STEP 5 STEP 6 STEP 7


PREHEAT VENT HEATING HEATING HEATING VENT COOLING
ZONE 1 “SOAK” ZONES 2 & 5 ZONES 3 & 6 ZONES 4 & 7
“RAMP” “RAMP” “SOAK” “SPIKE” 205° TO 219°C
PEAK AT
200°C DESIRED CURVE FOR HIGH 170°C SOLDER
MASS ASSEMBLIES JOINT
160°C
150°C

150°C
SOLDER IS LIQUID FOR
40 TO 80 SECONDS
100°C 140°C (DEPENDING ON
MASS OF ASSEMBLY)
100°C

DESIRED CURVE FOR LOW


MASS ASSEMBLIES
5°C

TIME (3 TO 7 MINUTES TOTAL) TMAX


Figure 18. Typical Solder Heating Profile

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842

Preferred Device

#$%& '(
     
* %+%
N–Channel D2PAK
This Power MOSFET is designed to withstand high energy in the
avalanche and commutation modes. Designed for low voltage, high
speed switching applications in power supplies, converters and power http://onsemi.com
motor controls, these devices are particularly well suited for bridge
circuits where diode speed and commutating safe operating areas are 42 AMPERES
critical and offer additional safety margin against unexpected voltage 60 VOLTS
transients.
RDS(on) = 32 mΩ
• Avalanche Energy Specified
• IDSS and VDS(on) Specified at Elevated Temperature
N–Channel
MAXIMUM RATINGS (TC = 25°C unless otherwise noted) D

Rating Symbol Value Unit


Drain–to–Source Voltage VDSS 60 Vdc
Drain–to–Gate Voltage (RGS = 1.0 MΩ) VDGR 60 Vdc G
Gate–to–Source Voltage
– Continuous VGS ±15 Vdc
S
– Non–Repetitive (tp ≤ 10 ms) VGSM ±20 Vpk
Drain Current – Continuous @ 25°C ID 42 Adc
Drain Current – Continuous @ 100°C ID 30
4
Drain Current – Single Pulse (tp ≤ 10 µs) IDM 147 Apk
Total Power Dissipation @ 25°C PD 125 Watts D2PAK
Derate above 25°C 0.83 W/°C CASE 418B
1 2
Total Power Dissipation @ TA = 25°C 3.0 Watts STYLE 2
(Note 1.) 3

Operating and Storage Temperature TJ, Tstg – 55 to °C MARKING DIAGRAM


Range 175
& PIN ASSIGNMENT
Single Pulse Drain–to–Source Avalanche EAS 265 mJ 4
Energy – Starting TJ = 25°C Drain
(VDD = 25 Vdc, VGS = 5 Vdc, Peak
IL = 42 Apk, L = 0.3 mH, RG = 25 Ω)
Thermal Resistance °C/W T50N06VL
– Junction to Case RθJC 1.2 YWW
– Junction to Ambient RθJA 62.5
– Junction to Ambient (Note 1.) RθJA 50
Maximum Lead Temperature for Soldering TL 260 °C 1 2 3
Purposes, 1/8″ from Case for 10 Gate Drain Source
seconds
1. When surface mounted to an FR4 board using the minimum recommended T50N06VL = Device Code
pad size. Y = Year
WW = Work Week

ORDERING INFORMATION

Device Package Shipping

MTB50N06VL D2PAK 50 Units/Rail

MTB50N06VLT4 D2PAK 800/Tape & Reel

Preferred devices are recommended choices for future use


and best overall value.

 Semiconductor Components Industries, LLC, 2000 843 Publication Order Number:


November, 2000 – Rev. 3 MTB50N06VL/D
MTB50N06VL

ELECTRICAL CHARACTERISTICS (TJ = 25°C unless otherwise noted)


Characteristic Symbol Min Typ Max Unit
OFF CHARACTERISTICS
Drain–to–Source Breakdown Voltage V(BR)DSS
(VGS = 0 Vdc, ID = .25 mAdc) 60 – – Vdc
Temperature Coefficient (Positive) – 64 – mV/°C
Zero Gate Voltage Drain Current IDSS µAdc
(VDS = 60 Vdc, VGS = 0 Vdc) – – 10
(VDS = 60 Vdc, VGS = 0 Vdc, TJ = 150°C) – – 100
Gate–Body Leakage Current (VGS = ±15 Vdc, VDS = 0 Vdc) IGSS – – 100 nAdc
ON CHARACTERISTICS (Note 2.)
Gate Threshold Voltage VGS(th)
(VDS = VGS, ID = 250 µAdc) 1.0 1.4 2.0 Vdc
Threshold Temperature Coefficient (Negative) – 4.3 – mV/°C
Static Drain–to–Source On–Resistance (VGS = 5 Vdc, ID = 21 Adc) RDS(on) – 0.025 0.032 Ohms
Drain–to–Source On–Voltage VDS(on) Vdc
(VGS = 5 Vdc, ID = 42 Adc) – 1.2 1.6
(VGS = 5 Vdc, ID = 21 Adc, TJ = 150°C) – – 1.5
Forward Transconductance (VDS = 6 Vdc, ID = 20 Adc) gFS 17 28 – Mhos
DYNAMIC CHARACTERISTICS
Input Capacitance Ciss – 1570 2200 pF
Output Capacitance (VDS = 25 Vd
Vdc, VGS = 0 Vd
Vdc,
Coss – 508 710
f = 1.0 MHz)
Transfer Capacitance Crss – 135 270

SWITCHING CHARACTERISTICS (Note 3.)


Turn–On Delay Time td(on) – 16 30 ns
Rise Time (VDD = 30 Vdc, ID = 42 Adc, tr – 355 701
VGS = 5 Vdc,
Vdc
Turn–Off Delay Time RG = 9.1 Ω) td(off) – 80 160
Fall Time tf – 160 320
Gate Charge QT – 40 60 nC
(S Figure
(See Fi 8)
(VDS = 48 Vdc, ID = 42 Adc, Q1 – 11 –
VGS = 5 Vdc) Q2 – 20 –
Q3 – 16 –
SOURCE–DRAIN DIODE CHARACTERISTICS
Forward On–Voltage VSD Vdc
(IS = 42 Adc, VGS = 0 Vdc)
– 1.03 2.5
(IS = 42 Adc, VGS = 0 Vdc, TJ = 150°C)
– 0.94 –
Reverse Recovery Time trr – 91.1 – ns
ta – 63.8 –
Adc VGS = 0 Vdc,
(IS = 42 Adc, Vdc
dIS/dt = 100 A/µs) tb – 27.3 –
Reverse Recovery Stored QRR – 0.299 – µC
Charge

INTERNAL PACKAGE INDUCTANCE


Internal Drain Inductance LD nH
(Measured from contact screw on tab to center of die) – 3.5 –
(Measured from the drain lead 0.25″ from package to center of die) – 4.5 –
Internal Source Inductance LS nH
(Measured from the source lead 0.25″ from package to source bond pad) – 7.5 –
2. Pulse Test: Pulse Width ≤ 300 µs, Duty Cycle ≤ 2%.
3. Switching characteristics are independent of operating junction temperature.

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844
MTB50N06VL

TYPICAL ELECTRICAL CHARACTERISTICS

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Figure 1. On–Region Characteristics Figure 2. Transfer Characteristics

 


  


 


  
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Figure 3. On–Resistance versus Drain Current Figure 4. On–Resistance versus Drain Current
and Temperature and Gate Voltage

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Figure 5. On–Resistance Variation with Figure 6. Drain–To–Source Leakage


Temperature Current versus Voltage

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845
MTB50N06VL

POWER MOSFET SWITCHING

Switching behavior is most easily modeled and predicted The capacitance (Ciss) is read from the capacitance curve at
by recognizing that the power MOSFET is charge a voltage corresponding to the off–state condition when
controlled. The lengths of various switching intervals (∆t) calculating td(on) and is read at a voltage corresponding to the
are determined by how fast the FET input capacitance can on–state when calculating td(off).
be charged by current from the generator. At high switching speeds, parasitic circuit elements
The published capacitance data is difficult to use for complicate the analysis. The inductance of the MOSFET
calculating rise and fall because drain–gate capacitance source lead, inside the package and in the circuit wiring
varies greatly with applied voltage. Accordingly, gate which is common to both the drain and gate current paths,
charge data is used. In most cases, a satisfactory estimate of produces a voltage at the source which reduces the gate drive
average input current (IG(AV)) can be made from a current. The voltage is determined by Ldi/dt, but since di/dt
rudimentary analysis of the drive circuit so that is a function of drain current, the mathematical solution is
t = Q/IG(AV) complex. The MOSFET output capacitance also
complicates the mathematics. And finally, MOSFETs have
During the rise and fall time interval when switching a finite internal gate resistance which effectively adds to the
resistive load, VGS remains virtually constant at a level resistance of the driving source, but the internal resistance
known as the plateau voltage, VSGP. Therefore, rise and fall is difficult to measure and, consequently, is not specified.
times may be approximated by the following: The resistive switching time variation versus gate
tr = Q2 x RG/(VGG – VGSP) resistance (Figure 9) shows how typical switching
tf = Q2 x RG/VGSP performance is affected by the parasitic circuit elements. If
where the parasitics were not present, the slope of the curves would
maintain a value of unity regardless of the switching speed.
VGG = the gate drive voltage, which varies from zero to VGG
The circuit used to obtain the data is constructed to minimize
RG = the gate drive resistance
common inductance in the drain and gate circuit loops and
and Q2 and VGSP are read from the gate charge curve.
is believed readily achievable with board mounted
During the turn–on and turn–off delay times, gate current is components. Most power electronic loads are inductive; the
not constant. The simplest calculation uses appropriate data in the figure is taken with a resistive load, which
values from the capacitance curves in a standard equation for approximates an optimally snubbed inductive load. Power
voltage change in an RC network. The equations are: MOSFETs may be safely operated into an inductive load;
td(on) = RG Ciss In [VGG/(VGG – VGSP)] however, snubbing reduces switching losses.
td(off) = RG Ciss In (VGG/VGSP)

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Figure 7. Capacitance Variation

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Figure 8. Gate–To–Source and Drain–To–Source Figure 9. Resistive Switching Time


Voltage versus Total Charge Variation versus Gate Resistance

DRAIN–TO–SOURCE DIODE CHARACTERISTICS


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Figure 10. Diode Forward Voltage versus Current

SAFE OPERATING AREA

The Forward Biased Safe Operating Area curves define reliable operation, the stored energy from circuit inductance
the maximum simultaneous drain–to–source voltage and dissipated in the transistor while in avalanche must be less
drain current that a transistor can handle safely when it is than the rated limit and adjusted for operating conditions
forward biased. Curves are based upon maximum peak differing from those specified. Although industry practice is
junction temperature and a case temperature (TC) of 25°C. to rate in terms of energy, avalanche energy capability is not
Peak repetitive pulsed power limits are determined by using a constant. The energy rating decreases non–linearly with an
the thermal response data in conjunction with the procedures increase of peak current in avalanche and peak junction
discussed in AN569, “Transient Thermal temperature.
Resistance–General Data and Its Use.” Although many E–FETs can withstand the stress of
Switching between the off–state and the on–state may drain–to–source avalanche at currents up to rated pulsed
traverse any load line provided neither rated peak current current (IDM), the energy rating is specified at rated
(IDM) nor rated voltage (VDSS) is exceeded and the continuous current (ID), in accordance with industry
transition time (tr,tf) do not exceed 10 µs. In addition the total custom. The energy rating must be derated for temperature
power averaged over a complete switching cycle must not as shown in the accompanying graph (Figure 12). Maximum
exceed (TJ(MAX) – TC)/(RθJC). energy at currents below rated continuous ID can safely be
A Power MOSFET designated E–FET can be safely used assumed to equal the values indicated.
in switching circuits with unclamped inductive loads. For

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847
MTB50N06VL

SAFE OPERATING AREA

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Figure 11. Maximum Rated Forward Biased Figure 12. Maximum Avalanche Energy versus
Safe Operating Area Starting Junction Temperature


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Figure 13. Thermal Response

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RθJA = 50°C/W
Board material = 0.065 mil FR–4
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Collector/Drain Pad Size ≈ 450 mils x 350 mils

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Figure 14. Diode Reverse Recovery Waveform Figure 15. D2PAK Power Derating Curve

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MTB50N06VL

INFORMATION FOR USING THE D2PAK SURFACE MOUNT PACKAGE

RECOMMENDED FOOTPRINT FOR SURFACE MOUNTED APPLICATIONS


Surface mount board layout is a critical portion of the interface between the board and the package. With the
total design. The footprint for the semiconductor packages correct pad geometry, the packages will self align when
must be the correct size to ensure proper solder connection subjected to a solder reflow process.

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POWER DISSIPATION FOR A SURFACE MOUNT DEVICE


The power dissipation for a surface mount device is a PD = 175°C – 25°C = 3.0 Watts
function of the drain pad size. These can vary from the 50°C/W
minimum pad size for soldering to a pad size given for
The 50°C/W for the D2PAK package assumes the use of
maximum power dissipation. Power dissipation for a
the recommended footprint on a glass epoxy printed circuit
surface mount device is determined by TJ(max), the
board to achieve a power dissipation of 3.0 Watts. There are
maximum rated junction temperature of the die, RθJA, the
other alternatives to achieving higher power dissipation
thermal resistance from the device junction to ambient, and
from the surface mount packages. One is to increase the
the operating temperature, TA. Using the values provided
area of the drain pad. By increasing the area of the drain
on the data sheet, PD can be calculated as follows:
pad, the power dissipation can be increased. Although one
TJ(max) – TA can almost double the power dissipation with this method,
PD =
RθJA one will be giving up area on the printed circuit board
The values for the equation are found in the maximum which can defeat the purpose of using surface mount
ratings table on the data sheet. Substituting these values technology. For example, a graph of RθJA versus drain pad
into the equation for an ambient temperature TA of 25°C, area is shown in Figure 16.
one can calculate the power dissipation of the device. For a
D2PAK device, PD is calculated as follows.

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Figure 16. Thermal Resistance versus Drain Pad
Area for the D2PAK Package (Typical)

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Another alternative would be to use a ceramic substrate board, the power dissipation can be doubled using the same
or an aluminum core board such as Thermal Cladt. Using footprint.
a board material such as Thermal Clad, an aluminum core

SOLDER STENCIL GUIDELINES


Prior to placing surface mount components onto a printed pattern of the opening in the stencil for the drain pad is not
circuit board, solder paste must be applied to the pads. critical as long as it allows approximately 50% of the pad to
Solder stencils are used to screen the optimum amount. be covered with paste.
These stencils are typically 0.008 inches thick and may be
made of brass or stainless steel. For packages such as the
SC–59, SC–70/SOT–323, SOD–123, SOT–23, SOT–143,
SOT–223, SO–8, SO–14, SO–16, and SMB/SMC diode ÇÇ
ÇÇ ÇÇÇÇÇÇ ÇÇ
ÇÇÇÇÇÇ ÇÇ

 

ÇÇ ÇÇÇÇÇÇ
packages, the stencil opening should be the same as the pad  
size or a 1:1 registration. This is not the case with the DPAK
and D2PAK packages. If one uses a 1:1 opening to screen
solder onto the drain pad, misalignment and/or
“tombstoning” may occur due to an excess of solder. For
ÇÇ ÇÇÇÇÇÇ   

these two packages, the opening in the stencil for the paste
Figure 17. Typical Stencil for DPAK and
should be approximately 50% of the tab area. The opening D2PAK Packages
for the leads is still a 1:1 registration. Figure 17 shows a
typical stencil for the DPAK and D2PAK packages. The

SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • When shifting from preheating to soldering, the
temperature of the device. When the entire device is heated maximum temperature gradient shall be 5°C or less.
to a high temperature, failure to complete soldering within • After soldering has been completed, the device should
a short time could result in device failure. Therefore, the be allowed to cool naturally for at least three minutes.
following items should always be observed in order to Gradual cooling should be used as the use of forced
minimize the thermal stress to which the devices are cooling will increase the temperature gradient and
subjected. result in latent failure due to mechanical stress.
• Always preheat the device. • Mechanical stress or shock should not be applied
• The delta temperature between the preheat and during cooling.
soldering should be 100°C or less.*
• When preheating and soldering, the temperature of the * Soldering a device without preheating can cause
leads and the case must not exceed the maximum excessive thermal shock and stress which can result in
temperature ratings as shown on the data sheet. When damage to the device.
using infrared heating with the reflow soldering
method, the difference shall be a maximum of 10°C. * Due to shadowing and the inability to set the wave height
• The soldering temperature and time shall not exceed to incorporate other surface mount components, the D2PAK
260°C for more than 10 seconds. is not recommended for wave soldering.

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TYPICAL SOLDER HEATING PROFILE


For any given circuit board, there will be a group of The line on the graph shows the actual temperature that
control settings that will give the desired heat pattern. The might be experienced on the surface of a test board at or
operator must set temperatures for several heating zones, near a central solder joint. The two profiles are based on a
and a figure for belt speed. Taken together, these control high density and a low density board. The Vitronics
settings make up a heating “profile” for that particular SMD310 convection/infrared reflow soldering system was
circuit board. On machines controlled by a computer, the used to generate this profile. The type of solder used was
computer remembers these profiles from one operating 62/36/2 Tin Lead Silver with a melting point between
session to the next. Figure 18 shows a typical heating 177–189°C. When this type of furnace is used for solder
profile for use when soldering a surface mount device to a reflow work, the circuit boards and solder joints tend to
printed circuit board. This profile will vary among heat first. The components on the board are then heated by
soldering systems but it is a good starting point. Factors that conduction. The circuit board, because it has a large surface
can affect the profile include the type of soldering system in area, absorbs the thermal energy more efficiently, then
use, density and types of components on the board, type of distributes this energy to the components. Because of this
solder used, and the type of board or substrate material effect, the main body of a component may be up to 30
being used. This profile shows temperature versus time. degrees cooler than the adjacent solder joints.

STEP 1 STEP 2 STEP 3 STEP 4 STEP 5 STEP 6 STEP 7


PREHEAT VENT HEATING HEATING HEATING VENT COOLING
ZONE 1 “SOAK” ZONES 2 & 5 ZONES 3 & 6 ZONES 4 & 7
“RAMP” “RAMP” “SOAK” “SPIKE” 205° TO 219°C
PEAK AT
200°C DESIRED CURVE FOR HIGH 170°C SOLDER
MASS ASSEMBLIES JOINT
160°C
150°C

150°C
SOLDER IS LIQUID FOR
40 TO 80 SECONDS
100°C 140°C (DEPENDING ON
MASS OF ASSEMBLY)
100°C

DESIRED CURVE FOR LOW


MASS ASSEMBLIES
5°C

TIME (3 TO 7 MINUTES TOTAL) TMAX


Figure 18. Typical Solder Heating Profile

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Preferred Device

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P–Channel D2PAK
This Power MOSFET is designed to withstand high energy in the
avalanche and commutation modes. The energy efficient design also
offers a drain–to–source diode with a fast recovery time. Designed for http://onsemi.com
low voltage, high speed switching applications in power supplies,
converters and PWM motor controls, these devices are particularly 50 AMPERES
well suited for bridge circuits where diode speed and commutating 30 VOLTS
safe operating areas are critical and offer additional safety margin
against unexpected voltage transients. RDS(on) = 25 mΩ
• Avalanche Energy Specified
• Source–to–Drain Diode Recovery Time Comparable to a P–Channel
Discrete Fast Recovery Diode 
• Diode is Characterized for Use in Bridge Circuits
• IDSS and VDS(on) Specified at Elevated Temperature
• Short Heatsink Tab Manufactured – Not Sheared 
• Specially Designed Leadframe for Maximum Power Dissipation

MAXIMUM RATINGS (TC = 25°C unless otherwise noted)
Rating Symbol Value Unit 4
Drain–Source Voltage VDSS 30 Vdc D2PAK
Drain–Gate Voltage (RGS = 1.0 MΩ) VDGR 30 Vdc CASE 418B
1 2

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