Documenti di Didattica
Documenti di Professioni
Documenti di Cultura
Rev. 7, Apr-2001
Power MOSFETs
Power MOSFETs
DL135/D
Rev. 7, Apr–2001
SCILLC, 2001
Previous Edition 1996
“All Rights Reserved”
EZFET, MiniMOS & SMARTDISCRETES are trademarks of Semiconductor Components Industries, LLC (SCILLC).
ChipFET is a trademark of Vishay Siliconix.
FETKY is a trademark of International Rectifier Corporation.
Micro8 is a trademark of International Rectifier.
ON Semiconductor and are trademarks of Semiconductor Components Industries, LLC (SCILLC). SCILLC reserves the right to make changes
without further notice to any products herein. SCILLC makes no warranty, representation or guarantee regarding the suitability of its products for any particular
purpose, nor does SCILLC assume any liability arising out of the application or use of any product or circuit, and specifically disclaims any and all liability,
including without limitation special, consequential or incidental damages. “Typical” parameters which may be provided in SCILLC data sheets and/or
specifications can and do vary in different applications and actual performance may vary over time. All operating parameters, including “Typicals” must be
validated for each customer application by customer’s technical experts. SCILLC does not convey any license under its patent rights nor the rights of others.
SCILLC products are not designed, intended, or authorized for use as components in systems intended for surgical implant into the body, or other applications
intended to support or sustain life, or for any other application in which the failure of the SCILLC product could create a situation where personal injury or
death may occur. Should Buyer purchase or use SCILLC products for any such unintended or unauthorized application, Buyer shall indemnify and hold
SCILLC and its officers, employees, subsidiaries, affiliates, and distributors harmless against all claims, costs, damages, and expenses, and reasonable
attorney fees arising out of, directly or indirectly, any claim of personal injury or death associated with such unintended or unauthorized use, even if such claim
alleges that SCILLC was negligent regarding the design or manufacture of the part. SCILLC is an Equal Opportunity/Affirmative Action Employer.
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Table of Contents
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Power MOSFET Numeric Data Sheet Listing
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Power MOSFET Numeric Data Sheet Listing (continued)
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Power MOSFET Numeric Data Sheet Listing (continued)
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Power MOSFET Numeric Data Sheet Listing (continued)
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Power MOSFET Selector Guide
1. TC = 25°C
2. See Data Sheet for Applicable Mounting Configuration.
3. Available in Tape and Reel only. T1 suffix = 3000 per reel.
4. Available in Tape and Reel only. R2 suffix = 2500 per reel.
5. VGS = 5.0 V
6. Data for all Complementary Devices listed as Nch/Pch.
7. VGS = 3.6 V
8. t ≤ 5 sec
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Power MOSFET Selector Guide (continued)
Table 4. EZFET – SO–8 Power MOSFETs with Zener Gate Protection – Case 751–06
V(BR)DSS Max RDS(on) @ VGS ID PD
(Volts) 10 V 4.5 V 2.7 V 2.5 V (cont) Device (Notes 9. & 10.) Page
Min (Ω) (Ω) (Ω) (Ω) Amps (Note 11.) (Watts) Max Configuration No.
50 0.3 – – – 2.0 MMDF2N05ZR2 2.0 Dual N–Channel 459
30 0.03 0.04 – – 7.5 MMSF7N03ZR2 2.5 Single N–Channel 751
0.013 0.018 – – 10 MMSF10N03ZR2 1.6 Single N–Channel 671
20 – 0.015 0.019 – 10 MMSF10N02ZR2 2.5 Single N–Channel 662
– 0.04 0.05 – 5.0 MMDF5N02ZR2 2.0 Dual N–Channel 551
– 0.027 – 0.035 7.0 MMDF7N02ZR2 2.0 Dual N–Channel 569
9. TC = 25°C
10. See Data Sheet for Applicable Mounting Configuration.
11. Available in Tape and Reel only. R2 suffix = 2500 per reel.
12. Data for all Complementary Devices listed as Nch/Pch.
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Power MOSFET Selector Guide (continued)
13. TC = 25°C
14. See Data Sheet for Applicable Mounting Configuration.
15. Available in Tape and Reel only. R2 suffix = 4000 per reel.
16. Available in Tape and Reel only. T1 suffix = 1000 per reel, T3 suffix = 4000 per reel.
17. Available in Tape and Reel only. T1 suffix = 3000 per reel.
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Power MOSFET Selector Guide (continued)
18. TC = 25°C
19. See Data Sheet for Applicable Mounting Configuration.
20. Available in Tape and Reel only. R2 suffix = 4000 per reel.
21. Available in Tape and Reel only. T1 suffix = 3000 per reel, T3 suffix = 10,000 per reel.
22. Available in Tape and Reel only. T1 suffix = 3000 per reel.
23. VGS = 4.0 V
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Power MOSFET Selector Guide (continued)
24. TC = 25°C
25. See Data Sheet for Applicable Mounting Configuration.
26. Also available in Tape and Reel. T4 suffix = 2500 per reel.
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Power MOSFET Selector Guide (continued)
27. TC = 25°C
28. See Data Sheet for Applicable Mounting Configuration.
29. Also available in Tape and Reel. T4 suffix = 800 per reel.
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Power MOSFET Selector Guide (continued)
P-Channel
500 6.0 – – 2.0 MTP2P50E 75 1207
200 1.0 – – 6.0 MTP6P20E 75 1293
100 0.30 – – 12 MTP12P10 75 1136
60 0.45 – – 5.0 MTP5P06V 40 1280
0.20 – – 12 MTP2955V 60 1193
0.12 – – 23 MTP23P06V 90 1181
0.08 – – 30 MTP30P06V 125 1231
30 – 0.025 – 50 MTP50P03HDL 125 1261
30. TC = 25°C
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Power MOSFET Selector Guide (continued)
31. TC = 25°C
32. See Data Sheet for Applicable Mounting Configuration.
33. Available in Tape and Reel only. T4 suffix = 2500 per reel.
34. Available in Tape and Reel only. R2 suffix = 2500 per reel.
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Power MOSFET Selector Guide (continued)
D2PAK
400 V (Clamped) 1.6 1.9 50 15 MGB15N40CLT4 150 301
(Note 37.)
350 V (Clamped) 1.6 1.9 50 15 MGB15N35CLT4 150 293
(Note 37.)
1.6 1.8 50 19 MGB19N35CLT4 166 309
(Note 37.)
DPAK
410 V (Clamped) 1.7 2.1 50 15 NGD15N41CLT4 96 21
(Note 38.)
35. TC = 25°C
36. See Data Sheet for Applicable Mounting Configuration.
37. Available in Tape and Reel only. T4 suffix = 800 per reel.
38. Available in Tape and Reel only. T4 suffix = 2500 per reel.
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CHAPTER 1
MOSFET Data Sheets
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N–Channel DPAK
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This Logic Level Insulated Gate Bipolar Transistor (IGBT) features
monolithic circuitry integrating ESD and Over–Voltage clamped
protection for use in inductive coil drivers applications. Primary uses 15 AMPS
include Ignition, Direct Fuel Injection, or wherever high voltage and
410 VOLTS
high current switching is required.
• Ideal for Coil–on–Plug Applications VCE(on) @ 10 A = 2.1 V MAX
• DPAK Package Offers Smaller Footprint and Increased Board Space
• Gate–Emitter ESD Protection C
• Temperature Compensated Gate–Collector Voltage Clamp Limits
Stress Applied to Load
• Integrated ESD Diode Protection RG
G
• New Cell Design Increases Unclamped Inductive Switching (UIS)
Energy Per Area RGE
• Short–Circuit Withstand Capability
• Low Threshold Voltage to Interface Power Loads to Logic or
E
Microprocessor Devices
• Low Saturation Voltage
• High Pulsed Current Capability
MARKING
• Optional Gate Resistor (RG) and Gate–Emitter Resistor (RGE) DIAGRAM
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Preferred Device
t
Self Protected with Temperature Sense
N–Channel D2PAK http://onsemi.com
Forward Transconductance (VDS = 15 Vdc, ID = 10 Adc) (Note 2.) gFS TBD 34 – mhos
DYNAMIC CHARACTERISTICS
Input Capacitance Ciss – 1720 – pF
Output Capacitance (VDS = 25 Vd
Vdc, VGS = 0 Vd
Vdc,
Coss – 525 –
f = 1.0 MHz)
Transfer Capacitance Crss – 120 –
SWITCHING CHARACTERISTICS (Note 3.)
Turn–On Delay Time td(on) – 16 – ns
Rise Time (VDD = 32 Vdc, ID = 25 Adc, tr – 263 –
VGS = 55.0
0 Vdc
Vdc,
Turn–Off Delay Time RG = 10 Ω) (Note 2.) td(off) – 149 –
Fall Time tf – 345 –
Gate Charge QT – 29 – nC
Temperature Coefficient IF(R) = 250 µAdc, VFTC 1.57 1.71 1.85 mV/°C
(Negative) TJ = 160°C
Forward Voltage Hysteresis IF(R) = 125 µAdc to 250 µAdc Vhys 25 37 50 mVdc
2. Pulse Test: Pulse Width ≤ 300 µs, Duty Cycle ≤ 2%.
3. Switching characteristics are independent of operating junction temperatures.
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NIB6404–5L
50 40
5.0 V 4.0 V
45
I D, DRAIN CURRENT (AMPS)
25 20
TJ = 175°C
20 3.0 V 15
15 25°C
10
10 –55°C
5.0 VGS = 2.5 V 5.0
0 0
0 0.5 1.0 1.5 2.0 2.5 3.0 3.5 4.0 4.5 5.0 0 0.5 1.0 1.5 2.0 2.5 3.0 3.5
VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS) VGS, GATE–TO–SOURCE VOLTAGE (VOLTS)
15 15
10 V
10 10
–55°C
5.0 5.0 TJ = 25°C
0 0
0 10 20 30 40 50 0 10 20 30 40 50
ID, DRAIN CURRENT (AMPS) ID, DRAIN CURRENT (AMPS)
Figure 3. On–Resistance versus Drain Current Figure 4. On–Resistance versus Drain Current
and Temperature and Gate Voltage
RDS(on), DRAIN–TO–SOURCE RESISTANCE
2.2 4500
VGS = 5.0 V VGS = 0 V
2.0 4000 TJ = 25°C
ID = 20 A f = 1.0 MHz
3500
C, CAPACITANCE (pF)
1.8
3000
(NORMALIZED)
1.6
2500
1.4
2000 Ciss
1.2
1500
1.0 1000
Coss
0.8 500
Crss
0.6 0
–50 0 50 100 150 200 0 5.0 10 15 20 25 30
TJ, JUNCTION TEMPERATURE (°C) VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS)
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NIB6404–5L
5000 20
Ciss
4500 18
3500 14
3000 Coss 12
2500 10
2000 8.0
1500 6.0
TJ = 175°C
1000 TJ = 25°C 4.0
VDS = 0 V 25°C
500 f = 1 MHz 2.0
0 0
0 2.0 4.0 6.0 8.0 10 0 0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9 1.0
VGS, GATE–TO–SOURCE VOLTAGE (VOLTS) VSD, SOURCE–TO–DRAIN VOLTAGE (VOLTS)
0.9 –1.4
VF, FORWARD VOLTAGE (V)
IF(R) = 500 mA
0.8 –1.5
250 mA –1.6
0.7 IF(R) = 250 mA
125 mA –1.7
0.6
–1.8
0.5
–1.9
50 mA
0.4 –2.0
25 mA
0.3 –2.1
–100 –50 0 50 100 150 200 –50 0 50 100 150
TJ, JUNCTION TEMPERATURE (°C) TJ, JUNCTION TEMPERATURE (°C)
Figure 9. Sense Diode Forward Voltage Figure 10. Sense Diode Temperature
Variation with Temperature Coefficient Variation with Temperature
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Self Protected with Current Sense
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N–Channel SO–8, Dual
SMARTDISCRETES devices are an advanced series of Power 5.0 AMPERES
MOSFETs which utilize ON Semiconductor’s latest MOSFET
technology process to achieve the lowest possible on–resistance per 30 VOLTS
silicon area while incorporating smart features. They are capable of RDS(on) = 50 mΩ
withstanding high energy in the avalanche and commutation modes.
The avalanche energy is specified to eliminate guesswork in designs Drain
where inductive loads are switched and offer additional safety margin
against unexpected voltage transients.
This new SMARTDISCRETES device features an integrated Gate
Gate–to–Source clamp for ESD protection. Also, this device features a Sense Main FET
sense FET for current monitoring.
• Ultra Low RDS(on) Provides Higher Efficiency and Extends Battery
Life
• IDSS Specified at Elevated Temperature Source Source
• Avalanche Energy Specified Sense Main
• Current Sense FET
• ESD Protected, Main FET and SENSEFET
ABSOLUTE MAXIMUM RATINGS
SOIC–8
Stresses beyond those listed may cause permanent damage to the device. CASE 751
These are stress ratings only and functional operation of the device at these STYLE 19
or any other conditions beyond those indicated in this specification is not
implied. Exposure to absolute maximum rated conditions for extended peri-
ods may affect device reliability.
MARKING DIAGRAM
MAIN MOSFET MAXIMUM RATINGS (TJ = 25°C unless otherwise noted) 1 8
Source 1 Mirror 1
Rating Symbol Value Unit 2 7
Gate 1 Drain 1
Drain–to–Source Voltage VDSS 30 Vdc 3 TBD 6
Source 2 Mirror 2
Drain–to–Gate Voltage VDGR 30 Vdc 4 5
(RGS = 1.0 MW) Gate 2 Drain 2
Gate–to–Source Voltage VGS "16 Vdc (Top View)
Single Pulse Drain–to–Source EAS 250 mJ
Avalanche Energy (Note 1.) TBD = Specific Device Code
(VDD = 25 Vdc, VGS = 10 Vdc,
VDS = 20 Vdc, IL = 15 Apk,
L = 10 mH, RG = 25 Ω)
Drain Current ORDERING INFORMATION
– Continuous @ TA = 25°C ID 6.5 Adc
– Continuous @ TA = 100°C (Note 1.) ID 4.4 Adc Device Package Shipping
– Single Pulse (tpv10 µs) IDM 33 Apk
NIMD6302R2 SOIC–8 TBD
Maximum Power Dissipation (TA = 25°C) PD TBD W
1. Switching characteristics are independent of operating junction temperatures
This document contains information on a product under development. ON Semiconductor
reserves the right to change or discontinue this product without notice.
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N–Channel DPAK
This logic level vertical power MOSFET is a general purpose part
that provides the “best of design” available today in a low cost power
package. Avalanche energy issues make this part an ideal design in. http://onsemi.com
The drain–to–source diode has a ideal fast but soft recovery.
Features 20 AMPERES
• Ultra–Low RDS(on), single base, advanced technology 30 VOLTS
• SPICE parameters available
RDS(on) = 27 mΩ
• Diode is characterized for use in bridge circuits
• IDSS and VDS(on) specified at elevated temperatures
N–Channel
• High Avalanche Energy Specified
• ESD JEDAC rated HBM Class 1, MM Class A, CDM Class 0
D
Typical Applications
• Power Supplies
• Inductive Loads G
• PWM Motor Controls
• Replaces MTD20N03L in many applications S
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NTD20N03L27
40 40
VGS = 10 V VDS > = 10 V
35 36
–ID, DRAIN CURRENT (AMPS)
VGS = 4 V
0.015 VGS = 10 V
0.01 0.015
0.005
0 0.01
2 5 8 12 15 18 22 25 28 32 35 38 0 4 8 12 16 20 24 28 32 36 40
ID, DRAIN CURRENT (AMPS) ID, DRAIN CURRENT (AMPS)
Figure 3. On–Resistance vs. Drain Current and Figure 4. On–Resistance vs. Drain Current and
RDS(on), DRAIN–TO–SOURCE RESISTANCE (NORMALIZED)
1.6 1000
ID = 10 A VGS = 0 V
VGS = 5 V
1.4
TJ = 125°C
–IDSS, LEAKAGE (nA)
100
1.2
TJ = 100°C
1
10
0.8
0.6 1
–50 –25 0 25 50 75 100 125 150 0 3 6 9 12 15 18 21 24 27 30
TJ, JUNCTION TEMPERATURE (°C) –VDS, DRAIN–TO–SOURCE VOLTAGE (V)
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NTD20N03L27
2500 12
8
1500 VGS
Ciss 6
1000
Q1 Q2
4
500 Coss
Crss 2 ID = 20 A
TJ = 25°C
0 0
10 8 6 4 2 0 2 4 6 8 10 12 14 16 18 20 23 25 0 2 4 6 8 10 12 14
GATE–TO–SOURCE OR DRAIN–TO–SOURCE VOLTAGE (V) Qg, TOTAL GATE CHARGE (nC)
1000 20
VGS = 0 V
18
IS, SOURCE CURRENT (AMPS)
TJ = 25°C
16
tr 14
100
t, TIME (ns)
tf 12
td(off) 10
8
10 td(on) 6
VDS = 20 V
ID = 20 A 4
VGS = 5.0 V 2
TJ = 25°C
1 0
1 10 100 0.0 0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9 1.0
RG, GATE RESISTANCE (Ω) VSD, SOURCE–TO–DRAIN VOLTAGE (V)
Figure 9. Resistive Switching Time Variation Figure 10. Diode Forward Voltage vs. Current
vs. Gate Resistance
EAS, SINGLE PULSE DRAIN–TO–SOURCE
350
ID = 24 A
300
AVALANCHE ENERGY (mJ)
250
200
150
100
50
0
25 50 75 100 125 150
TJ, STARTING JUNCTION TEMPERATURE (°C)
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#$%& '(
N–Channel DPAK
Designed for low voltage, high speed switching applications in
power supplies, converters and power motor controls and bridge
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circuits.
Features 20 AMPERES
• Lower RDS(on) 60 VOLTS
• Lower VDS(on) RDS(on) = 46 mΩ
• Lower Capacitances
• Lower Total Gate Charge N–Channel
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N–Channel DPAK
Designed for low voltage, high speed switching applications in http://onsemi.com
power supplies, converters and power motor controls and bridge
circuits. 12 AMPERES
Features 60 VOLTS
• Lower RDS(on) RDS(on) = 94 mΩ
• Lower VDS(on)
• Lower and Tighter VSD N–Channel
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* %+%
N–Channel DPAK
Designed for low voltage, high speed switching applications in http://onsemi.com
power supplies, converters and power motor controls and bridge
circuits. 12 AMPERES
Features 60 VOLTS
• Lower RDS(on) RDS(on) = 104 mΩ
• Lower VDS(on)
• Tighter VSD Specification N–Channel
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N–Channel DPAK
Designed for low voltage, high speed switching applications in
power supplies, converters and power motor controls and bridge
circuits. http://onsemi.com
Features 32 AMPERES
• Smaller Package than MTB36N06V
60 VOLTS
• Lower RDS(on)
• Lower VDS(on) RDS(on) = 26 mΩ
• Lower Total Gate Charge N–Channel
• Lower and Tighter VSD D
• Lower Diode Reverse Recovery Time
• Lower Reverse Recovery Stored Charge
Typical Applications G
• Power Supplies
•
4
Converters
S
• Power Motor Controls 4
• Bridge Circuits
1 2 1
3 2 3
MAXIMUM RATINGS (TJ = 25°C unless otherwise noted)
CASE 369A CASE 369
Rating Symbol Value Unit DPAK DPAK
Drain–to–Source Voltage VDSS 60 Vdc (Bent Lead) (Straight Lead)
Drain–to–Gate Voltage (RGS = 10 MΩ) VDGR 60 Vdc STYLE 2 STYLE 2
Gate–to–Source Voltage Vdc NTD32N06 = Device Code
– Continuous VGS "20 Y = Year
– Non–Repetitive (tpv10 ms) VGS "30 WW = Work Week
Drain Current T = MOSFET
– Continuous @ TA = 25°C ID 32 Adc
– Continuous @ TA = 100°C ID 22
MARKING DIAGRAMS
– Single Pulse (tpv10 µs) IDM 90 Apk & PIN ASSIGNMENTS
Total Power Dissipation @ TA = 25°C PD 93.75 W 4
Derate above 25°C 0.625 W/°C Drain
Total Power Dissipation @ TA = 25°C (Note 1.) 2.88 W 4
Total Power Dissipation @ TA = 25°C (Note 2.) 1.5 W Drain YWW
Operating and Storage Temperature Range TJ, Tstg –55 to °C NTD
+175 YWW 32N06
NTD
Single Pulse Drain–to–Source Avalanche EAS 313 mJ
32N06
Energy – Starting TJ = 25°C (Note 3.)
(VDD = 50 Vdc, VGS = 10 Vdc, L = 1.0 mH,
IL(pk) = 25 A, VDS = 60 Vdc, RG = 25 Ω) 1 2 3
1 3
Gate Drain Source
Gate Source
Thermal Resistance °C/W
2
– Junction–to–Case RθJC 1.6
Drain
– Junction–to–Ambient (Note 1.) RθJA 52
– Junction–to–Ambient (Note 2.) RθJA 100 ORDERING INFORMATION
Maximum Lead Temperature for Soldering TL 260 °C
Device Package Shipping
Purposes, 1/8″ from case for 10 seconds
NTD32N06 DPAK 75 Units/Rail
1. When surface mounted to an FR4 board using 1″ pad size,
(Cu Area 1.127 in2). DPAK
NTD32N06–1 75 Units/Rail
2. When surface mounted to an FR4 board using minimum recommended pad Straight Lead
size, (Cu Area 0.412 in2).
NTD32N06T4 DPAK 2500 Tape & Reel
3. Repetitive rating; pulse width limited by maximum junction temperature.
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NTD32N06
60 60
VGS = 10 V VDS > = 10 V
VGS = 6 V
ID, DRAIN CURRENT (AMPS)
30 VGS = 8 V 30
VGS = 5 V
20 20 TJ = 25°C
VGS = 4.5 V
10 10 TJ = 100°C
VGS = 4 V TJ = –55°C
0 0
0 1 2 3 4 3 3.4 3.8 4.2 4.6 5 5.4 5.8 6.2 6.6 7
VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS) VGS, GATE–TO–SOURCE VOLTAGE (VOLTS)
0.03
0.022
VGS = 10 V
0.026
0.021
TJ = 25°C
0.022
0.02
0.018 VGS = 15 V
TJ = –55°C
0.014 0.019
0.01 0.018
0 10 20 30 40 50 60 0 10 20 30 40 50 60
ID, DRAIN CURRENT (AMPS) ID, DRAIN CURRENT (AMPS)
Figure 3. On–Resistance vs. Gate–to–Source Figure 4. On–Resistance vs. Drain Current and
Voltage Gate Voltage
RDS(on), DRAIN–TO–SOURCE RESISTANCE
1.8 10000
ID = 16 A VGS = 0 V
VGS = 10 V
1.6
IDSS, LEAKAGE (nA)
TJ = 150°C
1.4 1000
(NORMALIZED)
1.2 TJ = 125°C
1 100
0.8 TJ = 100°C
0.6 10
–50 –25 0 25 50 75 100 125 150 175 0 10 20 30 40 50 60
TJ, JUNCTION TEMPERATURE (°C) VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS)
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NTD32N06
2400
8
2000 Q1
Crss
Q2
1600 Ciss 6
1200
4
800 Coss
2 ID = 32 A
400 Crss TJ = 25°C
0 0
10 5 VGS 0 VDS 5 10 15 20 25 0 4 8 12 16 20 24 28 32 36
GATE–TO–SOURCE OR DRAIN–TO–SOURCE VOLTAGE Qg, TOTAL GATE CHARGE (nC)
(VOLTS)
Figure 7. Capacitance Variation Figure 8. Gate–to–Source and
Drain–to–Source Voltage vs. Total Charge
1000 32
VDS = 30 V VGS = 0 V
20
100 tr 16
tf 12
td(off) 8
4
td(on)
10 0
1 10 100 0.6 0.64 0.68 0.72 0.76 0.8 0.84 0.88 0.92 0.96
RG, GATE RESISTANCE (Ω) VSD, SOURCE–TO–DRAIN VOLTAGE (VOLTS)
Figure 9. Resistive Switching Time Variation Figure 10. Diode Forward Voltage vs. Current
vs. Gate Resistance
EAS, SINGLE PULSE DRAIN–TO–SOURCE
1000 350
VGS = 20 V RDS(on) Limit ID = 32 A
SINGLE PULSE Thermal Limit
ID, DRAIN CURRENT (AMPS)
300
AVALANCHE ENERGY (mJ)
dc 200
10
10 ms 150
1 ms
100 µs 100
1
Mounted on 3″ sq. FR4 board (1″ sq.
2 oz. Cu 0.06″ thick single sided) 50
with one die operating,10 s max
0.1 0
0.1 1 10 100 25 50 75 100 125 150 175
VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS) TJ, STARTING JUNCTION TEMPERATURE (°C)
Figure 11. Maximum Rated Forward Biased Figure 12. Maximum Avalanche Energy vs.
Safe Operating Area Starting Junction Temperature
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NTD32N06
10
r(t), EFFECTIVE TRANSIENT THERMAL RESISTANCE
Normalized to RθJC at Steady State
1
(NORMALIZED)
0.1
0.01
0.00001 0.0001 0.001 0.01 0.1 1 10
t, TIME (s)
10
Normalized to RθJA at Steady State,
r(t), EFFECTIVE TRANSIENT THERMAL RESPONSE
1
(NORMALIZED)
0.1
0.01
0.00001 0.0001 0.001 0.01 0.1 1 10 100 1000
t, TIME (s)
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#$%& '(
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* %+%
N–Channel DPAK
Designed for low voltage, high speed switching applications in
power supplies, converters and power motor controls and bridge
circuits. http://onsemi.com
Features
• Smaller Package than MTB30N06VL 32 AMPERES
• Lower RDS(on) 60 VOLTS
• Lower VDS(on) RDS(on) = 28 mΩ
• Lower Total Gate Charge
• Lower and Tighter VSD N–Channel
• Lower Diode Reverse Recovery Time D
• Lower Reverse Recovery Stored Charge
Typical Applications
• Power Supplies
• Converters
G
MARKING
MAXIMUM RATINGS (TJ = 25°C unless otherwise noted) DIAGRAM
Rating Symbol Value Unit
Drain–to–Source Voltage VDSS 60 Vdc 4 YWW
CASE 369A
Drain–to–Gate Voltage (RGS = 10 MΩ) VDGR 60 Vdc NTD
DPAK
Gate–to–Source Voltage Vdc 1 2 32N06L
STYLE 2
– Continuous VGS "15 3
– Non–Repetitive (tpv10 ms) VGS "20
Drain Current NTD32N06L = Device Code
– Continuous @ TA = 25°C ID 32 Adc Y = Year
– Continuous @ TA = 100°C ID 22 WW = Work Week
– Single Pulse (tpv10 µs) IDM 90 Apk T = MOSFET
Total Power Dissipation @ TA = 25°C PD 93.75 W
Derate above 25°C 0.625 W/°C PIN ASSIGNMENT
Total Power Dissipation @ TA = 25°C (Note 1.) 2.88 W
Total Power Dissipation @ TA = 25°C (Note 2.) 1.5 W 4
Drain
Operating and Storage Temperature Range TJ, Tstg –55 to °C
+175
Single Pulse Drain–to–Source Avalanche EAS 313 mJ
Energy – Starting TJ = 25°C (Note 3.)
(VDD = 50 Vdc, VGS = 5 Vdc, L = 1.0 mH,
IL(pk) = 25 A, VDS = 60 Vdc, RG = 25 Ω) 1 3
2
Gate Source
Thermal Resistance °C/W Drain
– Junction–to–Case RθJC 1.6
– Junction–to–Ambient (Note 1.) RθJA 52 ORDERING INFORMATION
– Junction–to–Ambient (Note 2.) RθJA 100
Device Package Shipping
Maximum Lead Temperature for Soldering TL 260 °C
Purposes, 1/8″ from case for 10 seconds NTD32N06L DPAK 75 Units/Rail
1. When surface mounted to an FR4 board using 1″ pad size,
NTD32N06L–1 DPAK 75 Units/Rail
(Cu Area 1.127 in2).
2. When surface mounted to an FR4 board using minimum recommended pad NTD32N06LT4 DPAK 2500 Tape & Reel
size, (Cu Area 0.412 in2).
3. Repetitive rating; pulse width limited by maximum junction temperature.
http://onsemi.com
45
NTD32N06L
60 60
VGS = 10 V VDS > = 10 V
VGS = 4.5 V
ID, DRAIN CURRENT (AMPS)
40 VGS = 4 V 40
30 VGS = 6 V 30
VGS = 3.5 V
20 20
VGS = 8 V TJ = 25°C
10 VGS = 3 V 10
TJ = 100°C TJ = –55°C
0 0
0 1 2 3 4 1.8 2.2 2.6 3 3.4 3.8 4.2 4.6 5
VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS) VGS, GATE–TO–SOURCE VOLTAGE (VOLTS)
0.042 0.042
VGS = 5 V VGS = 10 V
0.038 0.038
0.03 0.03
TJ = 25°C
0.026 0.026 TJ = 100°C
0.01 0.01
0 10 20 30 40 50 60 0 10 20 30 40 50 60
ID, DRAIN CURRENT (AMPS) ID, DRAIN CURRENT (AMPS)
Figure 3. On–Resistance vs. Gate–to–Source Figure 4. On–Resistance vs. Drain Current and
Voltage Gate Voltage
RDS(on), DRAIN–TO–SOURCE RESISTANCE
1.8 10000
ID = 16 A VGS = 0 V
VGS = 5 V TJ = 150°C
1.6
IDSS, LEAKAGE (nA)
1000
(NORMALIZED)
1.4
TJ = 125°C
1.2
1 100
TJ = 100°C
0.8
0.6 10
–50 –25 0 25 50 75 100 125 150 175 0 10 20 30 40 50 60
TJ, JUNCTION TEMPERATURE (°C) VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS)
http://onsemi.com
46
NTD32N06L
Ciss
2800 Q1 Q2
4
2400 Crss
2000 3
1600 Ciss
2
1200
800 Coss
1 ID = 32 A
400 Crss TJ = 25°C
0 0
10 5 VGS 0 VDS 5 10 15 20 25 0 4 8 12 16 20 24
GATE–TO–SOURCE OR DRAIN–TO–SOURCE VOLTAGE Qg, TOTAL GATE CHARGE (nC)
(VOLTS)
Figure 7. Capacitance Variation Figure 8. Gate–to–Source and
Drain–to–Source Voltage vs. Total Charge
1000 32
VDS = 30 V VGS = 0 V
20
tf
100 16
12
td(off)
8
4
td(on)
10 0
1 10 100 0.6 0.64 0.68 0.72 0.76 0.8 0.84 0.88 0.92 0.96
RG, GATE RESISTANCE (Ω) VSD, SOURCE–TO–DRAIN VOLTAGE (VOLTS)
Figure 9. Resistive Switching Time Variation Figure 10. Diode Forward Voltage vs. Current
vs. Gate Resistance
EAS, SINGLE PULSE DRAIN–TO–SOURCE
1000 350
VGS = 20 V RDS(on) Limit ID = 32 A
SINGLE PULSE Thermal Limit
ID, DRAIN CURRENT (AMPS)
300
AVALANCHE ENERGY (mJ)
dc 200
10 10 ms
1 ms 150
100 µs
100
1
Mounted on 3″ sq. FR4 board (1″ sq. 50
2 oz. Cu 0.06″ thick single sided)
with one die operating,10 s max
0.1 0
0.1 1 10 100 25 50 75 100 125 150 175
VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS) TJ, STARTING JUNCTION TEMPERATURE (°C)
Figure 11. Maximum Rated Forward Biased Figure 12. Maximum Avalanche Energy vs.
Safe Operating Area Starting Junction Temperature
http://onsemi.com
47
NTD32N06L
10
r(t), EFFECTIVE TRANSIENT THERMAL RESISTANCE
Normalized to RθJC at Steady State
1
(NORMALIZED)
0.1
0.01
0.00001 0.0001 0.001 0.01 0.1 1 10
t, TIME (s)
10
Normalized to RθJA at Steady State,
r(t), EFFECTIVE TRANSIENT THERMAL RESPONSE
1
(NORMALIZED)
0.1
0.01
0.00001 0.0001 0.001 0.01 0.1 1 10 100 1000
t, TIME (s)
http://onsemi.com
48
!
#$%& '(
,- !
N–Channel DPAK
Features
• Ultra Low RDS(on) http://onsemi.com
• Higher Efficiency Extending Battery Life
• Logic Level Gate Drive 18.5 AMPERES
• Diode Exhibits High Speed, Soft Recovery 30 VOLTS
• Avalanche Energy Specified 10 mΩ @ VGS = 10 V
• IDSS Specified at Elevated Temperature N–Channel
• SO–8 Mounting Information Provided D
Applications
• DC–DC Converters G
• Low Voltage Motor Control
• Power Management in Portable and Battery Powered Products: S
4
4
i.e., Computers, Printers, Cellular and Cordless Telephones, and
PCMCIA Cards
1 2
3 12
CASE 369A 3
DPAK CASE 369
(Bend Lead) DPAK
STYLE 2 (Straight Lead)
STYLE 2
MARKING DIAGRAMS
& PIN ASSIGNMENTS
4
Drain
4
Drain
YWW
T
YWW 4302
T
4302
1 2 3
1 3
Gate Drain Source
Gate 2 Source
Drain
4302 = Device Code
Y = Year
WW = Work Week
T = MOSFET
ORDERING INFORMATION
DPAK
NTD4302–1 75 Units/Rail
Straight Lead
http://onsemi.com
50
NTD4302
http://onsemi.com
51
NTD4302
50 60
VGS = 4 V TJ = 25°C
VDS > = 10 V
ID, DRAIN CURRENT (AMPS)
0 0
0 0.5 1 1.5 2 2.5 3 2 3 4 5 6
VDS, DRAIN–TO–SOURCE VOLTAGE (V) VGS, GATE–TO–SOURCE VOLTAGE (V)
0.05
VGS = 10 V
0.005
0.025
0 0
0 2 4 6 8 10 0.00E+00 1.00E+01 2.00E+01 3.00E+01 4.00E+01 5.00E+01 6.00E+01
1.6 10000
ID = 18.5 A VGS = 0 V
VGS = 10 V
TJ = 150°C
1.4
1000
IDSS, LEAKAGE (nA)
(NORMALIZED)
1.2
100
TJ = 100°C
1
10
0.8
0.6 1
–50 –25 0 25 50 75 100 125 150 5 10 15 20 25 30
TJ, JUNCTION TEMPERATURE (°C) VDS, DRAIN–TO–SOURCE VOLTAGE (V)
http://onsemi.com
52
NTD4302
Ciss VD
40
7.5 20
30 VGS
Crss Ciss
5 15
20 Q1 Q2
Coss 2.5 10
10 Crss
ID = 2 A
TJ = 25°C
0 0 0
10 VGS 0 VDS 10 20 30 0 10 20 30 40 50 60
GATE–TO–SOURCE OR DRAIN–TO–SOURCE VOLTAGE (V) Qg, TOTAL GATE CHARGE (nC)
1000 25
VGS = 0 V
VDD = 24 V
IS, SOURCE CURRENT (AMPS)
TJ = 25°C
ID = 18.5 A
VGS = 10 V 20
t, TIME (ns)
15
100
tf
10
td(off)
tr
5
td(on)
10 0
1 10 100 0.5 0.6 0.7 0.8 0.9 1
RG, GATE RESISTANCE (Ω) VSD, SOURCE–TO–DRAIN VOLTAGE (V)
Figure 9. Resistive Switching Time Variation Figure 10. Diode Forward Voltage vs. Current
vs. Gate Resistance
http://onsemi.com
53
NTD4302
m!
%&'
" !
'((
" #$° ') '+
!
'* #$
Figure 11. Maximum Rated Forward Biased Figure 12. Diode Reverse Recovery Waveform
Safe Operating Area
.
- -
#
$
#
θ,' " ('
θ,
*0
- .
/
'
/
'
'#
- - " '&'# ,*0 " *0
θ,'
$ 6 4 # 5 5 5# 54
' !1!
http://onsemi.com
54
NTD4302
9$ 8
67 4
#$6
94
9
7 #64
68#9 9:#
inches
mm
ÇÇ ÇÇÇ
ÇÇÇÇÇÇ
ÇÇÇ ÇÇ
made of brass or stainless steel. For packages such as the
SC–59, SC–70/SOT–323, SOD–123, SOT–23, SOT–143,
SOT–223, SO–8, SO–14, SO–16, and SMB/SMC diode
ÇÇ ÇÇ
ÇÇ ÇÇÇÇÇÇ
packages, the stencil opening should be the same as the pad
ÇÇ ÇÇÇÇÇÇ
size or a 1:1 registration. This is not the case with the DPAK
and D2PAK packages. If one uses a 1:1 opening to screen
ÇÇ ÇÇÇ
solder onto the drain pad, misalignment and/or
“tombstoning” may occur due to an excess of solder. For
these two packages, the opening in the stencil for the paste
Figure 14. Typical Stencil for DPAK and
should be approximately 50% of the tab area. The opening D2PAK Packages
for the leads is still a 1:1 registration. Figure 14 shows a
typical stencil for the DPAK and D2PAK packages. The
SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • When shifting from preheating to soldering, the
temperature of the device. When the entire device is heated maximum temperature gradient shall be 5°C or less.
to a high temperature, failure to complete soldering within • After soldering has been completed, the device should
a short time could result in device failure. Therefore, the be allowed to cool naturally for at least three minutes.
following items should always be observed in order to Gradual cooling should be used as the use of forced
minimize the thermal stress to which the devices are cooling will increase the temperature gradient and
subjected. result in latent failure due to mechanical stress.
• Always preheat the device. • Mechanical stress or shock should not be applied
• The delta temperature between the preheat and during cooling.
soldering should be 100°C or less.*
• When preheating and soldering, the temperature of the * Soldering a device without preheating can cause
leads and the case must not exceed the maximum excessive thermal shock and stress which can result in
temperature ratings as shown on the data sheet. When damage to the device.
using infrared heating with the reflow soldering
method, the difference shall be a maximum of 10°C. * Due to shadowing and the inability to set the wave height
• The soldering temperature and time shall not exceed to incorporate other surface mount components, the D2PAK
260°C for more than 10 seconds. is not recommended for wave soldering.
http://onsemi.com
55
NTD4302
150°C
SOLDER IS LIQUID FOR
40 TO 80 SECONDS
100°C 140°C (DEPENDING ON
MASS OF ASSEMBLY)
100°C
http://onsemi.com
56
!!!
'(
!-!
P–Channel TSOP–6
Features http://onsemi.com
• Ultra Low RDS(on)
• Higher Efficiency Extending Battery Life –3.3 AMPERES
• Miniature TSOP–6 Surface Mount Package
–12 VOLTS
Applications
75 m @ VGS = –4.5 V
• Power Management in Portable and Battery–Powered Products, i.e.:
Cellular and Cordless Telephones, and PCMCIA Cards
P–Channel
1 2 3
Drain Drain Gate
ORDERING INFORMATION
ELECTRICAL CHARACTERISTICS (TA = 25°C unless otherwise noted) (Notes 3. & 4.)
Characteristic Symbol Min Typ Max Unit
OFF CHARACTERISTICS
Drain–Source Breakdown Voltage V(BR)DSS Vdc
(VGS = 0 Vdc, ID = –10 µA) –12 – –
ON CHARACTERISTICS
Gate Threshold Voltage VGS(th) Vdc
(VDS = VGS, ID = –250 µAdc) –0.50 –0.70 –1.50
DYNAMIC CHARACTERISTICS
Total Gate Charge Qtot – 7.0 15 nC
(VDS = –10
10 Vdc,
Vd VGS = –4.54 5 Vdc,
Vd
Gate–Source Charge Qgs – 2.0 –
ID = –3.3 Adc)
Gate–Drain Charge Qgd – 3.5 –
Input Capacitance Ciss – 550 – pF
(VDS = –5.0
5 0 Vdc,
Vd VGS = 0 Vdc,
Vd
Output Capacitance Coss – 450 –
f = 1.0 MHz)
Reverse Transfer Capacitance Crss – 200 –
SWITCHING CHARACTERISTICS
Turn–On Delay Time td(on) – 20 30 ns
Rise Time (VDD = –10
10 Vdc, ID = –1.0
1.0 Adc, tr – 20 30
Turn–Off Delay Time VGS = –4.5 Vdc, Rg = 6.0 W) td(off) – 110 120
Fall Time tf – 100 115
Reverse Recovery Time (IS = –1.7 Adc, dlS/dt = 100 A/µs) trr – 30 – ns
BODY–DRAIN DIODE RATINGS
Diode Forward On–Voltage (IS = –1.7 Adc, VGS = 0 Vdc) VSD – –0.80 –1.5 Vdc
Diode Forward On–Voltage (IS = –3.3 Adc, VGS = 0 Vdc) VSD – –0.90 – Vdc
3. Indicates Pulse Test: P.W. = 300 µsec max, Duty Cycle = 2%.
4. Class 1 ESD rated – Handling precautions to protect against electrostatic discharge is mandatory.
http://onsemi.com
58
NTGS3433T1
12 20
VGS = –5 V VGS = –2.5 V VDS ≥ –10 V
18
–ID, DRAIN CURRENT (AMPS)
0.15
0.1
0.1 VGS = –4.5 V
0.05
0.05
0 0
0 2 4 6 8 0 2 4 6 8 10 12 14 16 18 20
–VGS, GATE–TO–SOURCE VOLTAGE (VOLTS) –ID, DRAIN CURRENT (AMPS)
Figure 3. On–Resistance vs. Gate–to–Source Figure 4. On–Resistance vs. Drain Current and
Voltage Gate Voltage
RDS(on), DRAIN–TO–SOURCE RESISTANCE (NORMALIZED)
1.6 1200
ID = –3.3 A VGS = 0 V
VGS = –4.5 V 1000 TJ = 25°C
1.4
C, CAPACITANCE (pF)
800
1.2
600 Ciss
1
400 Coss
0.6 0
–50 –25 0 25 50 75 100 125 150 0 2.5 5 7.5 10 12.5 15 17.5 20
TJ, JUNCTION TEMPERATURE (°C) –VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS)
http://onsemi.com
59
NTGS3433T1
6 10
–VGS, GATE–TO–SOURCE VOLTAGE
4 7
6 TJ = 150°C
(VOLTS)
3 5
Qgs
Qgd 4
2
3 TJ = 25°C
TJ = 25°C 2
1
ID = –3.3 A
1
0 0
0 2 4 6 8 10 0 0.2 0.4 0.6 0.8 1 1.2
Qg, TOTAL GATE CHARGE (nC) –VSD, SOURCE–TO–DRAIN VOLTAGE (VOLTS)
1
NORMALIZED EFFECTIVE TRANSIENT
0.2
0.1
0.1
0.05
0.02
20
16
POWER (W)
12
0
0.01 0.10 1.00 10.00 100.00
TIME (sec)
http://onsemi.com
60
!
#$%& '(
P–Channel TSOP–6
Features
• Ultra Low RDS(on)
• Higher Efficiency Extending Battery Life http://onsemi.com
• Miniature TSOP–6 Surface Mount Package
1 AMPERE
Applications
• Power Management in Portable and Battery–Powered Products, i.e.: 20 VOLTS
Cellular and Cordless Telephones, and PCMCIA Cards RDS(on) = 90 m
MAXIMUM RATINGS (TJ = 25°C unless otherwise noted) P–Channel
Rating Symbol Value Unit
# $ 9
Drain–to–Source Voltage VDSS –20 Volts
Gate–to–Source Voltage – Continuous VGS "8.0 Volts
Thermal Resistance
Junction–to–Ambient (Note 1.) RθJA 244 °C/W 4
Total Power Dissipation @ TA = 25°C Pd 0.5 Watts
Drain Current – Continuous @ TA = 25°C ID –1.65 Amps
– Pulsed Drain Current (Tp t 10 µS) IDM –10 Amps
Thermal Resistance 6
Junction–to–Ambient (Note 2.) RθJA 128 °C/W
Total Power Dissipation @ TA = 25°C Pd 1.0 Watts
Drain Current – Continuous @ TA = 25°C ID –2.35 Amps MARKING
– Pulsed Drain Current (Tp t 10 µS) IDM –14 Amps
DIAGRAM
Thermal Resistance
Junction–to–Ambient (Note 3.) RθJA 62.5 °C/W 3
Total Power Dissipation @ TA = 25°C Pd 2.0 Watts 2
1 TSOP–6 441
Drain Current – Continuous @ TA = 25°C ID –3.3 Amps
CASE 318G W
– Pulsed Drain Current (Tp t 10 µS) IDM –20 Amps
4 STYLE 1
Operating and Storage Temperature Range TJ, Tstg –55 to °C 5
150 6
1 2 3
()% ()% )'1
ORDERING INFORMATION
ELECTRICAL CHARACTERISTICS (TA = 25°C unless otherwise noted) (Notes 4. & 5.)
Characteristic Symbol Min Typ Max Unit
OFF CHARACTERISTICS
Drain–Source Breakdown Voltage V(BR)DSS Vdc
(VGS = 0 Vdc, ID = –10 µA) –20 – –
ON CHARACTERISTICS
Gate Threshold Voltage VGS(th) Vdc
(VDS = VGS, ID = –250 µAdc) –0.45 –1.05 –1.50
DYNAMIC CHARACTERISTICS
Input Capacitance Ciss – 480 – pF
(VDS = –5.0
5 0 Vdc,
Vd VGS = 0 Vdc,
Vd
Output Capacitance Coss – 265 – pF
f = 1.0 MHz)
Reverse Transfer Capacitance Crss – 100 – pF
SWITCHING CHARACTERISTICS
Turn–On Delay Time td(on) – 13 25 ns
Rise Time (VDD = –20
20 Vdc, ID = –1.6
1.6 Adc, tr – 23.5 45 ns
Turn–Off Delay Time VGS = –4.5 Vdc, Rg = 6.0 W) td(off) – 27 50 ns
Fall Time tf – 24 45 ns
Total Gate Charge Qtot – 6.2 14 nC
(VDS = –10
10 Vdc,
Vd VGS = –4.54 5 Vdc,
Vd
Gate–Source Charge Qgs – 1.3 – nC
ID = –3.3 Adc)
Gate–Drain Charge Qgd – 2.5 – nC
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62
NTGS3441T1
10 20
TJ = 25°C VGS = –2.7 V VDS> = –10 V
TJ = 25°C
8 16
VGS = –2.5 V
TJ = –55°C
6 VGS = –3 V 12
TJ = 100°C
VGS = –3.5 V
VGS = –4 V
4 VGS = –4.5 V 8
VGS = –6 V VGS = –2 V
2 4
VGS = –10 V VGS = –1.5 V
0 0
0 0.4 0.8 1.2 1.6 2 0.4 0.8 1.2 1.6 2 2.4 2.8 3.2 3.6 4
–VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS) –VGS, GATE–TO–SOURCE VOLTAGE (VOLTS)
0.4 0.28
TJ = 25°C 0.24
0.16
0.2
0.12
VGS = –4.5 V
0.08
0.1
0.04
0 0
2 3 4 5 6 7 8 0 4 8 12 16 20
–VGS, GATE–TO–SOURCE VOLTAGE (VOLTS) –ID, DRAIN CURRENT (AMPS)
Figure 3. On–Resistance vs. Gate–to–Source Figure 4. On–Resistance vs. Drain Current and
Voltage Gate Voltage
100
VGS = 0 V
ID = –3.3 A
1.4
RDS(on), DRAIN–TO–SOURCE
VGS = –4.5 V
RESISTANCE (NORMALIZED)
TJ = 125°C
–IDSS, LEAKAGE (nA)
1.2 10
TJ = 100°C
1
1 TJ = 25°C
0.8
0.6 0.1
–50 –25 0 25 50 75 100 125 150 0 4 8 12 16 20
TJ, JUNCTION TEMPERATURE (°C) –VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS)
http://onsemi.com
63
NTGS3441T1
1200 8
VDS = 0 V VGS = 0 V TJ = 25°C
900 6
QT
(VOLTS)
Crss
600 4
Ciss Qgs Qgd
VDD = –20 V
300 2 ID = –3.3 A
Coss TJ = 25°C
Crss
0 0
8 4 0 4 8 12 16 20 0 2 4 6 8
–VGS –VDS Qg, TOTAL GATE CHARGE (nC)
GATE–TO–SOURCE OR DRAIN–TO–SOURCE
VOLTAGE (VOLTS) Figure 8. Gate–to–Source and
Figure 7. Capacitance Variation Drain–to–Source Voltage vs. Total Charge
1.3 10
VGS(th), GATE THRESHOLD VOLTAGE
6
1
0.9 4
0.8
2
0.7
0.6 0
–50 –25 0 25 50 75 100 125 150 0.5 0.6 0.7 0.8 0.9 1 1.1 1.2 1.3 1.4
TJ, JUNCTION TEMPERATURE (°C) –VSD, SOURCE–TO–DRAIN VOLTAGE (VOLTS)
Figure 9. Gate Threshold Voltage Variation Figure 10. Diode Forward Voltage vs. Current
with Temperature
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64
NTGS3441T1
20
16
POWER (W)
12
0
0.01 0.10 1.00 10.00 100.00
TIME (sec)
Figure 11. Single Pulse Power
1
NORMALIZED EFFECTIVE TRANSIENT
0.2
0.1
0.1
0.05
0.02
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65
NTGS3441T1
4:
7$
:6
7
4:
7$
#8
:
47 %21!
SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • The soldering temperature and time shall not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within • When shifting from preheating to soldering, the
a short time could result in device failure. Therefore, the maximum temperature gradient shall be 5°C or less.
following items should always be observed in order to • After soldering has been completed, the device should
minimize the thermal stress to which the devices are be allowed to cool naturally for at least three minutes.
subjected. Gradual cooling should be used as the use of forced
• Always preheat the device. cooling will increase the temperature gradient and
• The delta temperature between the preheat and result in latent failure due to mechanical stress.
soldering should be 100°C or less.* • Mechanical stress or shock should not be applied
• When preheating and soldering, the temperature of the during cooling.
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When * Soldering a device without preheating can cause
using infrared heating with the reflow soldering excessive thermal shock and stress which can result in
method, the difference shall be a maximum of 10°C. damage to the device.
http://onsemi.com
66
!!
#$%& '(
P–Channel TSOP–6
Features
• Ultra Low RDS(on)
• Higher Efficiency Extending Battery Life http://onsemi.com
• Miniature TSOP6 Surface Mount Package
2 AMPERES
Applications
• Power Management in Portable and Battery–Powered Products, i.e.: 20 VOLTS
Cellular and Cordless Telephones, and PCMCIA Cards RDS(on) = 65 m
MAXIMUM RATINGS (TJ = 25°C unless otherwise noted) P–Channel
Rating Symbol Value Unit
# $ 9
Drain–to–Source Voltage VDSS –20 Volts
Gate–to–Source Voltage – Continuous VGS "12 Volts
Thermal Resistance
Junction–to–Ambient (Note 1.) RθJA 244 °C/W 4
Total Power Dissipation @ TA = 25°C Pd 0.5 Watts
Drain Current – Continuous @ TA = 25°C ID –2.2 Amps
– Pulsed Drain Current (Tp t 10 µS) IDM –10 Amps
Thermal Resistance 6
Junction–to–Ambient (Note 2.) RθJA 128 °C/W
Total Power Dissipation @ TA = 25°C Pd 1.0 Watts
Drain Current – Continuous @ TA = 25°C ID –3.1 Amps MARKING
– Pulsed Drain Current (Tp t 10 µS) IDM –14 Amps
DIAGRAM
Thermal Resistance
Junction–to–Ambient (Note 3.) RθJA 62.5 °C/W 3
Total Power Dissipation @ TA = 25°C Pd 2.0 Watts 2
1 TSOP–6 443
Drain Current – Continuous @ TA = 25°C ID –4.4 Amps
CASE 318G W
– Pulsed Drain Current (Tp t 10 µS) IDM –20 Amps
4 STYLE 1
Operating and Storage Temperature Range TJ, Tstg –55 to °C 5
150 6
1 2 3
()% ()% )'1
ORDERING INFORMATION
ELECTRICAL CHARACTERISTICS (TA = 25°C unless otherwise noted) (Notes 4. & 5.)
Characteristic Symbol Min Typ Max Unit
OFF CHARACTERISTICS
Drain–Source Breakdown Voltage V(BR)DSS Vdc
(VGS = 0 Vdc, ID = –10 µA) –20 – –
ON CHARACTERISTICS
Gate Threshold Voltage VGS(th) Vdc
(VDS = VGS, ID = –250 µAdc) –0.60 –0.95 –1.50
DYNAMIC CHARACTERISTICS
Input Capacitance Ciss – 565 – pF
(VDS = –5.0
5 0 Vdc,
Vd VGS = 0 Vdc,
Vd
Output Capacitance Coss – 320 – pF
f = 1.0 MHz)
Reverse Transfer Capacitance Crss – 120 – pF
SWITCHING CHARACTERISTICS
Turn–On Delay Time td(on) – 10 25 ns
Rise Time (VDD = –20
20 Vdc, ID = –1.0
1.0 Adc, tr – 18 45 ns
Turn–Off Delay Time VGS = –4.5 Vdc, Rg = 6.0 W) td(off) – 30 50 ns
Fall Time tf – 31 50 ns
Total Gate Charge Qtot – 7.5 15 nC
(VDS = –10
10 Vdc,
Vd VGS = –4.54 5 Vdc,
Vd
Gate–Source Charge Qgs – 1.4 – nC
ID = –4.4 Adc)
Gate–Drain Charge Qgd – 2.9 – nC
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68
NTGS3443T1
8 8
VGS = –5 V VGS = –2.5 V VDS≥ = –10 V
–ID, DRAIN CURRENT (AMPS)
2 2
TJ = 125°C
VGS = –1.5 V TJ = –55°C
0 0
0 0.4 0.8 1.2 1.6 2 0.6 1 1.4 1.8 2.2 2.6 3
–VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS) –VGS, GATE–TO–SOURCE VOLTAGE (VOLTS)
Figure 1. On–Region Characteristics Figure 2. Transfer Characteristics
RDS(on), DRAIN–TO–SOURCE RESISTANCE (OHMS)
0 0.04
1.5 2 2.5 3 3.5 4 4.5 5 0 1 2 3 4 5 6 7 8
–VGS, GATE–TO–SOURCE VOLTAGE (VOLTS) –ID, DRAIN CURRENT (AMPS)
Figure 3. On–Resistance vs. Gate–to–Source Figure 4. On–Resistance vs. Drain Current and
Voltage Gate Voltage
RDS(on), DRAIN–TO–SOURCE RESISTANCE (NORMALIZED)
1.5 100
TJ = 125°C
ID = –4.4 A
1.4
VGS = –4.5 V TJ = 100°C
–IDSS, LEAKAGE (nA)
1.3 10
1.2
1.1 1
TJ = 25°C
1
0.9 0.1
0.8 VGS = 0 V
0.7 0.01
–50 –25 0 25 50 75 100 125 150 0 4 8 12 16 20
TJ, JUNCTION TEMPERATURE (°C) –VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS)
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69
NTGS3443T1
1200 5
QT
TJ = 25°C
1000 VGS = 0 V
–VGS, GATE–TO–SOURCE
4 VGS
C, CAPACITANCE (pF)
VOLTAGE (VOLTS)
800
3 Q1 Q2
600 Ciss
2
400
Coss
200 1 TJ = 25°C
Crss ID = –4.4 A
0 0
0 2 4 6 8 10 12 14 16 18 20 0 1 2 3 4 5 6 7 8
–VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS) Qg, TOTAL GATE CHARGE (nC)
1.3 4
VGS(th), GATE THRESHOLD VOLTAGE
VGS = 0 V
–IS, SOURCE CURRENT (AMPS)
1.2 ID = –250 µA
1.1 3
TJ = 150°C
(NORMALIZED)
1
2
0.9 TJ = 25°C
0.8
1
0.7
0.6 0
–50 –25 0 25 50 75 100 125 150 0.3 0.4 0.5 0.6 0.7 0.8 0.9 1
TJ, JUNCTION TEMPERATURE (°C) –VSD, SOURCE–TO–DRAIN VOLTAGE (VOLTS)
Figure 9. Gate Threshold Voltage Variation Figure 10. Diode Forward Voltage vs. Current
with Temperature
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NTGS3443T1
20
16
POWER (W)
12
0
0.01 0.10 1.00 10.00 100.00
TIME (sec)
Figure 11. Single Pulse Power
1
NORMALIZED EFFECTIVE TRANSIENT
0.2
0.1
0.1
0.05
0.02
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NTGS3443T1
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:6
7
4:
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#8
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47 %21!
SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • The soldering temperature and time shall not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within • When shifting from preheating to soldering, the
a short time could result in device failure. Therefore, the maximum temperature gradient shall be 5°C or less.
following items should always be observed in order to • After soldering has been completed, the device should
minimize the thermal stress to which the devices are be allowed to cool naturally for at least three minutes.
subjected. Gradual cooling should be used as the use of forced
• Always preheat the device. cooling will increase the temperature gradient and
• The delta temperature between the preheat and result in latent failure due to mechanical stress.
soldering should be 100°C or less.* • Mechanical stress or shock should not be applied
• When preheating and soldering, the temperature of the during cooling.
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When * Soldering a device without preheating can cause
using infrared heating with the reflow soldering excessive thermal shock and stress which can result in
method, the difference shall be a maximum of 10°C. damage to the device.
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N–Channel TSOP–6
Features
• Ultra Low RDS(on)
• Higher Efficiency Extending Battery Life http://onsemi.com
• Logic Level Gate Drive
• Diode Exhibits High Speed, Soft Recovery 5.3 AMPERES
• Avalanche Energy Specified 20 VOLTS
• IDSS Specified at Elevated Temperature RDS(on) = 45 m
Applications
• Power Management in portable and battery–powered products, i.e. N–Channel
computers, printers, PCMCIA cards, cellular and cordless
Drain 1 2 5 6
• Lithium Ion Battery Applications
• Notebook PC
1 2 3
Drain Drain Gate
ORDERING INFORMATION
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74
NTGS3446T1
1.4 td(off)
(NORMALIZED)
t, TIME (ns)
tr
1.2
10
1 td(on)
0.8
VDD = 10 V
0.6 ID = 1.0 A
VGS = 4.5 V
0.4 1
–50 –25 0 25 50 75 100 125 150 1 10 100
TJ, JUNCTION TEMPERATURE (°C) RG, GATE RESISTANCE (Ω)
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P–Channel TSOP–6
Features http://onsemi.com
• Ultra Low RDS(on)
• Higher Efficiency Extending Battery Life –3.5 AMPERES
• Miniature TSOP–6 Surface Mount Package
–30 VOLTS
Applications
100 m @ VGS = –10 V
• Power Management in Portable and Battery–Powered Products, i.e.:
Cellular and Cordless Telephones, and PCMCIA Cards
P–Channel
1 2 3
Drain Drain Gate
ORDERING INFORMATION
ELECTRICAL CHARACTERISTICS (TA = 25°C unless otherwise noted) (Notes 3. & 4.)
Characteristic Symbol Min Typ Max Unit
OFF CHARACTERISTICS
Drain–Source Breakdown Voltage V(BR)DSS Vdc
(VGS = 0 Vdc, ID = –10 µA) –30 – –
ON CHARACTERISTICS
Gate Threshold Voltage VGS(th) Vdc
(VDS = VGS, ID = –250 µAdc) –1.0 –1.87 –3.0
DYNAMIC CHARACTERISTICS
Total Gate Charge Qtot – 9.0 13 nC
(VDS = –15
15 Vdc,
Vd VGS = –1010 Vdc,
Vd
Gate–Source Charge Qgs – 2.5 –
ID = –3.5 Adc)
Gate–Drain Charge Qgd – 2.0 –
Input Capacitance Ciss – 480 – pF
(VDS = –5.0
5 0 Vdc,
Vd VGS = 0 Vdc,
Vd
Output Capacitance Coss – 220 –
f = 1.0 MHz)
Reverse Transfer Capacitance Crss – 60 –
SWITCHING CHARACTERISTICS
Turn–On Delay Time td(on) – 10 20 ns
Rise Time (VDD = –20
20 Vdc, ID = –1.0
1.0 Adc, tr – 15 30
Turn–Off Delay Time VGS = –10 Vdc, Rg = 6.0 W) td(off) – 20 35
Fall Time tf – 10 20
Reverse Recovery Time (IS = –1.7 Adc, dlS/dt = 100 A/µs) trr – 30 – ns
BODY–DRAIN DIODE RATINGS
Diode Forward On–Voltage (IS = –1.7 Adc, VGS = 0 Vdc) VSD – –0.90 –1.2 Vdc
Diode Forward On–Voltage (IS = –3.5 Adc, VGS = 0 Vdc) VSD – –1.0 – Vdc
3. Indicates Pulse Test: P.W. = 300 µsec max, Duty Cycle = 2%.
4. Class 1 ESD rated – Handling precautions to protect against electrostatic discharge is mandatory.
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NTGS3455T1
20 20
VGS = –10 V
18 TJ = –55°C
–ID, DRAIN CURRENT (AMPS)
0.15 0.15
VGS = –10 V
0.1 0.1
0.05 0.05
0 0
2 3 4 5 6 7 8 9 10 0 2 4 6 8 10 12 14 16 18 20
–VGS, GATE–TO–SOURCE VOLTAGE (VOLTS) –ID, DRAIN CURRENT (AMPS)
Figure 3. On–Resistance vs. Gate–to–Source Figure 4. On–Resistance vs. Drain Current and
Voltage Gate Voltage
RDS(on), DRAIN–TO–SOURCE RESISTANCE (NORMALIZED)
1.6 700
ID = –3.5 A VGS = 0 V
VGS = –10 V TJ = 25°C
1.4
C, CAPACITANCE (pF)
500
Ciss
1.2
300
1 Coss
100
0.8
Crss
0.6 –100
–50 –25 0 25 50 75 100 125 150 0 5 10 15 20 25 30
TJ, JUNCTION TEMPERATURE (°C) –VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS)
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78
NTGS3455T1
12 10
–VGS, GATE–TO–SOURCE VOLTAGE
11
7
6
Qgs
5 4
Qgd
4
TJ = 25°C
3
TJ = 25°C 2
2
ID = –3.5 A
1
0 0
0 2 4 6 8 10 12 0 0.2 0.4 0.6 0.8 1 1.2 1.4
Qg, TOTAL GATE CHARGE (nC) –VSD, SOURCE–TO–DRAIN VOLTAGE (VOLTS)
1
NORMALIZED EFFECTIVE TRANSIENT
0.2
0.1
0.1
0.05
0.02
20
16
POWER (W)
12
0
0.01 0.10 1.00 10.00 100.00
TIME (sec)
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D1 D2
G1 G2
PRODUCT SUMMARY S1 S2
VDS (V) rDS(on) (Ω) ID (A)
0.085 @ VGS = 10 V "3.9 N–Channel MOSFET N–Channel MOSFET
30
0.143 @ VGS = 4.5 V "3.0
ORDERING INFORMATION
THERMAL CHARACTERISTICS
Characteristic Symbol Typ Max Unit
Maximum Junction–to–Ambient (Note 2.) RthJA °C/W
t v 5 sec 50 60
Steady State 90 110
Maximum Junction–to–Foot RthJF 30 40 °C/W
Steady State
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81
NTHD5902T1
10 10
VGS = 10
thru 5 V
8 8
6 4V 6
4 4
125°C
2 2 25°C
3V
TC = –55°C
0 0
0 0.5 1.0 1.5 2.0 2.5 3.0 0 1 2 3 4 5
VDS, Drain–to–Source Voltage (V) VGS, Gate–to–Source Voltage (V)
Figure 1. Output Characteristics Figure 2. Transfer Characteristics
0.20 400
r DS(on),On–Resistance ( Ω )
300
Ciss
0.15
C, Capacitance (pF)
VGS = 4.5 V
0.10 200
VGS = 10 V
Coss
0.05
100 Crss
0 0
0 2 4 6 8 10 0 4 8 12 16 20
ID, Drain Current (A) VDS, Drain–to–Source Voltage (V)
Figure 3. On–Resistance vs. Drain Current Figure 4. Capacitance
10 1.8
VGS = 10 V
VGS,Gate–to–Source Voltage (V)
r DS(on),On–Resistance ( Ω )
VDS = 15 V 1.6
8 ID = 2.9 A
ID = 2.9 A
(Normalized)
1.4
6
1.2
4
1.0
2 0.8
0 0.6
0 1 2 3 4 5 –50 –25 0 25 50 75 100 125 150
Qg, Total Gate Charge (nC) TJ, Junction Temperature (°C)
Figure 5. Gate Charge Figure 6. On–Resistance vs.
Junction Temperature
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82
NTHD5902T1
10 0.20
rDS(on),On–Resistance ( Ω )
I S,Source Current (A)
0.15
ID = 2.9 A
TJ = 150°C
0.10
TJ = 25°C
0.05
1 0
0 0.2 0.4 0.6 0.8 1.0 1.2 0 2 4 6 8 10
VDS, Drain–to–Source Voltage (V) VGS, Gate–to–Source Voltage (V)
Figure 7. Source–Drain Diode Forward Voltage Figure 8. On–Resistance vs. Gate–to–Source
Voltage
0.4 50
0.2 40
ID = 250 µA
V GS (th),Varience (V)
–0.0
Power (W)
30
–0.2
20
–0.4
10
–0.6
–0.8 0
–50 –25 0 25 50 75 100 125 150 10–4 10–3 10–2 10 –1 1 10 100 600
TJ, Temperature (°C) Time (sec)
Figure 9. Threshold Voltage Figure 10. Single Pulse Power
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83
NTHD5902T1
1
Normalized Effective Transient
Notes:
PDM
0.2
t1
0.1 t2
0.1
0.05 t1
1. Duty Cycle, D = t
0.02 2
2. Per Unit Base = RthJA = 90°C/W
3. TJM – TA = PDMZthJA(t)
Single Pulse 4. Surface Mounted
0.01
10–4 10–3 10–2 10 –1 1 10 100 600
Square Wave Pulse Duration (sec)
Figure 11. Normalized Thermal Transient Impedance, Junction–to–Ambient
2
Normalized Effective Transient
1
Duty Cycle = 0.5
Thermal Impedance
0.2
0.1
0.1
0.05
0.02
Single Pulse
0.01
10–4 10–3 10–2 10 –1 1 10
Square Wave Pulse Duration (sec)
Figure 12. Normalized Thermal Transient Impedance, Junction–to–Foot
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S1 S2
G1 G2
PRODUCT SUMMARY D1 D2
VDS (V) rDS(on) (Ω) ID (A)
P–Channel MOSFET P–Channel MOSFET
0.155 @ VGS = –4.5 V "2.9
ORDERING INFORMATION
This document contains information on a product under development. ON Semiconductor NTHD5903T1 ChipFET 3000/Tape & Reel
reserves the right to change or discontinue this product without notice.
THERMAL CHARACTERISTICS
Characteristic Symbol Typ Max Unit
Maximum Junction–to–Ambient (Note 2.) RthJA °C/W
t v 5 sec 50 60
Steady State 90 110
Maximum Junction–to–Foot (Drain) RthJF 30 40 °C/W
Steady State
On–State Drain Current (Note 3.) ID(on) VDS v –5.0 V, VGS = –4.5 V –10 – – A
Drain–Source On–State Resistance (Note 3.) rDS(on)
S( ) VGS = –4.5 V, ID = –2.1 A – 0.130 0.155 Ω
VGS = –3.6 V, ID = –2.0 A – 0.150 0.180
VGS = –2.5 V, ID = –1.7 A – 0.215 0.260
Forward Transconductance (Note 3.) gfs VDS = –10 V, ID = –2.1 A – 5.0 – S
Diode Forward Voltage (Note 3.) VSD IS = –0.9 A, VGS = 0 V – –0.8 –1.2 V
Dynamic (Note 4.)
Total Gate Charge Qg – 3.0 6.0 nC
10 V
VDS = –10 V, VGS = –4.5
45V V,
Gate–Source Charge Qgs – 0.9 –
ID = –2.1 A
Gate–Drain Charge Qgd – 0.6 –
Turn–On Delay Time td(on) – 13 20 ns
Rise Time tr VDD = –10 V, RL = 10 Ω – 35 55
ID ^ –1.0
–1 0 A
A, VGEN = –4
–4.5
5VV,
Turn–Off Delay Time td(off) RG = 6 Ω – 25 40
Fall Time tf – 25 40
Source–Drain Reverse Recovery Time trr IF = –0.9 A, di/dt = 100 A/µs – 40 80
2. Surface Mounted on 1″ x 1″ FR4 Board.
3. Pulse Test: Pulse Width v 300 µs, Duty Cycle v 2%.
4. Guaranteed by design, not subject to production testing.
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86
NTHD5903T1
10 10
3.5 V
VGS = 5 thru 4 V TC = –55°C
8 8
3V
6 6 125°C
2.5 V
4 4
2V
2 2
1.5 V
0 0
0 0.5 1.0 1.5 2.0 2.5 3.0 0 0.5 1.0 1.5 2.0 2.5 3.0 3.5 4.0
VDS, Drain–to–Source Voltage (V) VGS, Gate–to–Source Voltage (V)
Figure 1. Output Characteristics Figure 2. Transfer Characteristics
0.4 600
r DS(on),On–Resistance ( Ω )
500
0.3 VGS = 2.5 V
C, Capacitance (pF)
Ciss
400
5 1.6
VGS,Gate–to–Source Voltage (V)
r DS(on),On–Resistance ( Ω )
3 1.2
2 1.0
1 0.8
0 0.6
0 0.5 1.0 1.5 2.0 2.5 3.0 –50 –25 0 25 50 75 100 125 150
Qg, Total Gate Charge (nC) TJ, Junction Temperature (°C)
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87
NTHD5903T1
10 0.40
0.35
rDS(on),On–Resistance ( Ω )
ID = 2.1 A
I S,Source Current (A)
0.30
0.25
TJ = 150°C 0.20
0.15
TJ = 25°C
0.10
0.05
1 0
0 0.2 0.4 0.6 0.8 1.0 1.2 1.4 0 1 2 3 4 5
VDS, Drain–to–Source Voltage (V) VGS, Gate–to–Source Voltage (V)
Figure 7. Source–Drain Diode Forward Voltage Figure 8. On–Resistance vs. Gate–to–Source
Voltage
0.4 50
0.3
40
ID = 250 µA
V GS (th),Varience (V)
0.2
Power (W)
30
0.1
20
0.0
10
–0.1
–0.2 0
–50 –25 0 25 50 75 100 125 150 10–4 10–3 10–2 10 –1 1 10 100 600
TJ, Temperature (°C) Time (sec)
Figure 9. Threshold Voltage Figure 10. Single Pulse Power
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88
NTHD5903T1
1
Normalized Effective Transient
Notes:
PDM
0.2
t1
0.1 t2
0.1
0.05 t1
1. Duty Cycle, D = t
0.02 2
2. Per Unit Base = RthJA = 90°C/W
3. TJM – TA = PDMZthJA(t)
Single Pulse 4. Surface Mounted
0.01
10–4 10–3 10–2 10 –1 1 10 100 600
Square Wave Pulse Duration (sec)
Figure 11. Normalized Thermal Transient Impedance, Junction–to–Ambient
2
Normalized Effective Transient
1
Duty Cycle = 0.5
Thermal Impedance
0.2
0.1
0.1
0.05
0.02
Single Pulse
0.01
10–4 10–3 10–2 10 –1 1 10
Square Wave Pulse Duration (sec)
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D1 D2
G1 G2
PRODUCT SUMMARY S1 S2
ORDERING INFORMATION
This document contains information on a product under development. ON Semiconductor NTHD5904T1 ChipFET 3000/Tape & Reel
reserves the right to change or discontinue this product without notice.
THERMAL CHARACTERISTICS
Characteristic Symbol Typ Max Unit
Maximum Junction–to–Ambient (Note 2.) RthJA °C/W
t v 5 sec 50 60
Steady State 90 110
Maximum Junction–to–Foot (Drain) RthJF 30 40 °C/W
Steady State
On–State Drain Current (Note 3.) ID(on) VDS w 5.0 V, VGS = 4.5 V 10 – – A
Drain–Source On–State Resistance (Note 3.) rDS(on)
S( ) VGS = 4.5 V, ID = 3.1 A – 0.065 0.075 Ω
VGS = 2.5 V, ID = 2.3 A – 0.115 0.143
Forward Transconductance (Note 3.) gfs VDS = 10 V, ID = 3.1 A – 8.0 – S
Diode Forward Voltage (Note 3.) VSD IS = 0.9 A, VGS = 0 V – 0.8 1.2 V
Dynamic (Note 4.)
Total Gate Charge Qg – 4.0 6.0 nC
VDS = 10 V
V, VGS = 4.5
4 5 V,
V
Gate–Source Charge Qgs – 0.6 –
ID = 3.1 A
Gate–Drain Charge Qgd – 1.3 –
Turn–On Delay Time td(on) – 12 18 ns
Rise Time tr VDD = 10 V, RL = 10 Ω – 35 55
ID ^ 1.0
1 0 A,
A VGEN = 4.5
4 5 V,
V
Turn–Off Delay Time td(off) RG = 6 Ω – 19 30
Fall Time tf – 9.0 15
Source–Drain Reverse Recovery Time trr IF = 0.9 A, di/dt = 100 A/µs – 40 80
2. Surface Mounted on 1″ x 1″ FR4 Board.
3. Pulse Test: Pulse Width v 300 µs, Duty Cycle v 2%.
4. Guaranteed by design, not subject to production testing.
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NTHD5904T1
10 10
TC = –55°C
VGS = 5 thru 3 V
8 8 25°C
2.5 V 125°C
6 6
4 4
I
2V
2 2
1.5 V
0 0
0 0.5 1.0 1.5 2.0 2.5 3.0 0 0.5 1.0 1.5 2.0 2.5 3.0 3.5
VDS, Drain–to–Source Voltage (V) VGS, Gate–to–Source Voltage (V)
Figure 1. Output Characteristics Figure 2. Transfer Characteristics
0.30 600
r DS(on),On–Resistance ( Ω )
0.25 500
Ciss
C, Capacitance (pF)
0.20 400
0 0
0 2 4 6 8 10 0 4 8 12 16 20
ID, Drain Current (A) VDS, Drain–to–Source Voltage (V)
Figure 3. On–Resistance vs. Drain Current Figure 4. Capacitance
5 1.6
VGS,Gate–to–Source Voltage (V)
VGS = 4.5 V
r DS(on),On–Resistance ( Ω )
VDS = 10 V
4 ID = 3.1 A 1.4 ID = 3.1 A
(Normalized)
3 1.2
2 1.0
1 0.8
0 0.6
0 1 2 3 4 –50 –25 0 25 50 75 100 125 150
Qg, Total Gate Charge (nC) TJ, Junction Temperature (°C)
Figure 5. Gate Charge Figure 6. On–Resistance vs.
Junction Temperature
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NTHD5904T1
10 0.20
rDS(on),On–Resistance ( Ω )
I S,Source Current (A)
0.15
ID = 3.1 A
TJ = 150°C
0.10
TJ = 25°C
0.05
1 0
0 0.2 0.4 0.6 0.8 1.0 1.2 0 1 2 3 4 5
VDS, Drain–to–Source Voltage (V) VGS, Gate–to–Source Voltage (V)
Figure 7. Source–Drain Diode Forward Voltage Figure 8. On–Resistance vs. Gate–to–Source
Voltage
0.4 50
0.2
40
V GS (th),Varience (V)
–0.0 ID = 250 µA
Power (W)
30
–0.2
20
–0.4
10
–0.6
–0.8 0
–50 –25 0 25 50 75 100 125 150 10–4 10–3 10–2 10 –1 1 10 100 600
TJ, Temperature (°C) Time (sec)
Figure 9. Threshold Voltage Figure 10. Single Pulse Power
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93
NTHD5904T1
1
Normalized Effective Transient
Notes:
PDM
0.2
t1
0.1 t2
0.1
0.05 t1
1. Duty Cycle, D = t
0.02 2
2. Per Unit Base = RthJA = 90°C/W
3. TJM – TA = PDMZthJA(t)
Single Pulse 4. Surface Mounted
0.01
10–4 10–3 10–2 10 –1 1 10 100 600
Square Wave Pulse Duration (sec)
Figure 11. Normalized Thermal Transient Impedance, Junction–to–Ambient
2
Normalized Effective Transient
1
Duty Cycle = 0.5
Thermal Impedance
0.2
0.1
0.1
0.05
0.02
Single Pulse
0.01
10–4 10–3 10–2 10 –1 1 10
Square Wave Pulse Duration (sec)
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S1 S2
G1 G2
PRODUCT SUMMARY D1 D2
ORDERING INFORMATION
This document contains information on a product under development. ON Semiconductor NTHD5905T1 ChipFET 3000/Tape & Reel
reserves the right to change or discontinue this product without notice.
THERMAL CHARACTERISTICS
Characteristic Symbol Typ Max Unit
Maximum Junction–to–Ambient (Note 2.) RthJA °C/W
t v 5 sec 50 60
Steady State 90 110
Maximum Junction–to–Foot (Drain) RthJF 30 40 °C/W
Steady State
On–State Drain Current (Note 3.) ID(on) VDS v –5.0 V, VGS = –4.5 V –10 – – A
Drain–Source On–State Resistance (Note 3.) rDS(on)
S( ) VGS = –4.5 V, ID = –3.0 A – 0.075 0.090 Ω
VGS = –2.5 V, ID = –2.5 A – 0.110 0.130
VGS = –1.8 V, ID = –1.0 A – 0.150 0.180
Forward Transconductance (Note 3.) gfs VDS = –5.0 V, ID = –3.0 A – 7.0 – S
Diode Forward Voltage (Note 3.) VSD IS = –0.9 A, VGS = 0 V – –0.8 –1.2 V
Dynamic (Note 4.)
Total Gate Charge Qg – 5.5 9.0 nC
40V
VDS = –4.0 V, VGS = –4.5
45V V,
Gate–Source Charge Qgs – 0.5 –
ID = –3.0 A
Gate–Drain Charge Qgd – 1.5 –
Turn–On Delay Time td(on) – 10 15 ns
Rise Time tr VDD = –4.0 V, RL = 4 Ω – 45 70
ID ^ –1.0
–1 0 A
A, VGEN = –4
–4.5
5VV,
Turn–Off Delay Time td(off) RG = 6 Ω – 30 45
Fall Time tf – 10 15
Source–Drain Reverse Recovery Time trr IF = –0.9 A, di/dt = 100 A/µs – 30 60
2. Surface Mounted on 1″ x 1″ FR4 Board.
3. Pulse Test: Pulse Width v 300 µs, Duty Cycle v 2%.
4. Guaranteed by design, not subject to production testing.
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NTHD5905T1
10 10
VGS = 5 2.5 V TC = –55°C
thru 3 V
8 8 25°C
2V 125°C
6 6
4 4
1.5 V
2 2
1V
0 0
0 0.5 1.0 1.5 2.0 2.5 3.0 0 0.5 1.0 1.5 2.0 2.5 3.0
VDS, Drain–to–Source Voltage (V) VGS, Gate–to–Source Voltage (V)
Figure 1. Output Characteristics Figure 2. Transfer Characteristics
0.30 1000
r DS(on),On–Resistance ( Ω )
0.25
800
VGS = 1.8 V Ciss
C, Capacitance (pF)
0.20
600
0.15 VGS = 2.5 V
400
VGS = 4.5 V
0.10
Coss
200
0.05
Crss
0 0
0 2 4 6 8 10 0 4 8 12 16 20
ID, Drain Current (A) VDS, Drain–to–Source Voltage (V)
Figure 3. On–Resistance vs. Drain Current Figure 4. Capacitance
5 1.6
VGS,Gate–to–Source Voltage (V)
VGS = 4.5 V
r DS(on),On–Resistance ( Ω )
4 1.4 ID = 3 A
(Normalized)
3 1.2
2 1.0
1 0.8
0 0.6
0 1 2 3 4 5 6 –50 –25 0 25 50 75 100 125 150
Qg, Total Gate Charge (nC) TJ, Junction Temperature (°C)
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NTHD5905T1
10 0.25
rDS(on),On–Resistance ( Ω )
0.20 ID = 3 A
I S,Source Current (A)
0.15
TJ = 150°C
0.10
0.05
TJ = 25°C
1 0
0 0.2 0.4 0.6 0.8 1.0 1.2 1.4 0 1 2 3 4 5
VDS, Drain–to–Source Voltage (V) VGS, Gate–to–Source Voltage (V)
0.4 50
0.3
40
V GS (th),Varience (V)
0.2 ID = 250 µA
Power (W)
30
0.1
20
0.0
10
–0.1
–0.2 0
–50 –25 0 25 50 75 100 125 150 10–4 10–3 10–2 10 –1 1 10 100 600
TJ, Temperature (°C) Time (sec)
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NTHD5905T1
1
Normalized Effective Transient
Notes:
PDM
0.2
t1
0.1 t2
0.1
0.05 t1
1. Duty Cycle, D = t
0.02 2
2. Per Unit Base = RthJA = 90°C/W
3. TJM – TA = PDMZthJA(t)
Single Pulse 4. Surface Mounted
0.01
10–4 10–3 10–2 10 –1 1 10 100 600
Square Wave Pulse Duration (sec)
Figure 11. Normalized Thermal Transient Impedance, Junction–to–Ambient
2
Normalized Effective Transient
1
Duty Cycle = 0.5
Thermal Impedance
0.2
0.1
0.1
0.05
0.02
Single Pulse
0.01
10–4 10–3 10–2 10 –1 1 10
Square Wave Pulse Duration (sec)
Figure 12. Normalized Thermal Transient Impedance, Junction–to–Foot
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PRODUCT SUMMARY S
ORDERING INFORMATION
This document contains information on a product under development. ON Semiconductor
Device Package Shipping
reserves the right to change or discontinue this product without notice.
NTHS5402T1 ChipFET 3000/Tape & Reel
THERMAL CHARACTERISTICS
Characteristic Symbol Typ Max Unit
Maximum Junction–to–Ambient (Note 2.) RthJA °C/W
t v 5 sec 40 50
Steady State 80 95
Maximum Junction–to–Foot (Drain) RthJF 15 20 °C/W
Steady State
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NTHS5402T1
TYPICAL CHARACTERISTICS
20 20
VGS = 10 thru 5 V
4V
16 16
12 12
8 8
3V TC125°C
4 4 25°C
TC = –55°C
0 0
0 0.5 1.0 1.5 2.0 2.5 3.0 0 0.5 1.0 1.5 2.0 2.5 3.0 3.5 4.0
VDS, Drain–to–Source Voltage (V) VGS, Gate–to–Source Voltage (V)
0.10 1200
r DS(on),On–Resistance ( Ω )
1000
0.08 Ciss
C, Capacitance (pF)
800
0.06
VGS = 4.5 V
600
0.04 VGS = 10 V
400
0.02 Coss
200
Crss
0 0
0 4 8 12 16 20 0 6 12 18 24 30
ID, Drain Current (A) VDS, Drain–to–Source Voltage (V)
10 1.6
VGS,Gate–to–Source Voltage (V)
r DS(on),On–Resistance ( Ω )
VDS = 15 V VGS = 10 V
8 ID = 4.9 A 1.4
ID = 4.9 A
(Normalized)
6 1.2
4 1.0
2 0.8
0 0.6
0 3 6 9 12 15 –50 –25 0 25 50 75 100 125 150
Qg, Total Gate Charge (nC) TJ, Junction Temperature (°C)
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NTHS5402T1
TYPICAL CHARACTERISTICS
20 0.10
TJ = 150°C
rDS(on),On–Resistance ( Ω )
10 0.08
I S,Source Current (A)
ID = 4.9 A
0.06
0.04
TJ = 25°C
0.02
1 0
0 0.2 0.4 0.6 0.8 1.0 1.2 0 2 4 6 8 10
VSD, Source–to–Drain Voltage (V) VGS, Gate–to–Source Voltage (V)
0.4 50
0.2
40
ID = 250 µA
V GS (th),Varience (V)
–0.0
Power (W)
30
–0.2
20
–0.4
10
–0.6
–0.8 0
–50 –25 0 25 50 75 100 125 150 10–3 10–2 10 –1 1 10 100 600
TJ, Temperature (°C) Time (sec)
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NTHS5402T1
TYPICAL CHARACTERISTICS
1
Normalized Effective Transient
Notes:
PDM
0.2
t1
0.1 t2
0.1
0.05 t1
1. Duty Cycle, D = t
2
0.02 2. Per Unit Base = RthJA = 80°C/W
3. TJM – TA = PDMZthJA(t)
Single Pulse 4. Surface Mounted
0.01
10–4 10–3 10–2 10 –1 1 10 100 600
Square Wave Pulse Duration (sec)
2
Normalized Effective Transient
1
Duty Cycle = 0.5
Thermal Impedance
0.2
0.1
0.1
0.05
0.02
Single Pulse
0.01
10–4 10–3 10–2 10 –1 1 10
Square Wave Pulse Duration (sec)
Figure 12. Normalized Thermal Transient Impedance, Junction–to–Foot
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NTHS5402T1
80 mm 80 mm
18 mm
25 mm
68 mm
28 mm 28 mm
26 mm 26 mm
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105
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PRODUCT SUMMARY S
ORDERING INFORMATION
THERMAL CHARACTERISTICS
Characteristic Symbol Typ Max Unit
Maximum Junction–to–Ambient (Note 2.) RthJA °C/W
t v 5 sec 40 50
Steady State 80 95
Maximum Junction–to–Foot (Drain) RthJF 15 20 °C/W
Steady State
On–State Drain Current (Note 3.) ID(on) VDS w 5.0 V, VGS = 4.5 V 20 – – A
Drain–Source On–State Resistance (Note 3.) rDS(on)
S( ) VGS = 4.5 V, ID = 5.2 A – 0.025 0.030 Ω
VGS = 2.5 V, ID = 4.3 A – 0.038 0.045
Forward Transconductance (Note 3.) gfs VDS = 10 V, ID = 5.2 A – 20 – S
Diode Forward Voltage (Note 3.) VSD IS = 1.1 A, VGS = 0 V – 0.8 1.2 V
Dynamic (Note 4.)
Total Gate Charge Qg – 12 18 nC
VDS = 10 V
V, VGS = 4.5
4 5 V,
V
Gate–Source Charge Qgs – 2.4 –
ID = 5.2 A
Gate–Drain Charge Qgd – 3.2 –
Turn–On Delay Time td(on) – 20 30 ns
Rise Time tr VDD = 10 V, RL = 10 Ω – 40 60
ID ^ 1.0
1 0 A,
A VGEN = 4.5
4 5 V,
V
Turn–Off Delay Time td(off) RG = 6 Ω – 40 60
Fall Time tf – 15 23
Source–Drain Reverse Recovery Time trr IF = 1.1 A, di/dt = 100 A/µs – 30 60
2. Surface Mounted on 1″ x 1″ FR4 Board.
3. Pulse Test: Pulse Width v 300 µs, Duty Cycle v 2%.
4. Guaranteed by design, not subject to production testing.
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107
NTHS5404T1
80 mm 80 mm
18 mm
25 mm
68 mm
28 mm 28 mm
26 mm 26 mm
Figure 1. Figure 2.
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PRODUCT SUMMARY
VDS (V) rDS(on) (Ω) ID (A) P–Channel MOSFET
ChipFET
MAXIMUM RATINGS (TA = 25°C unless otherwise noted) CASE 1206A
Steady STYLE 1
Rating Symbol 5 secs State Unit
Drain–Source Voltage VDS –20 V
Gate–Source Voltage VGS "12 V PIN CONNECTIONS
Continuous Drain Current ID A
(TJ = 150°C) (Note 1.)
D 8 1 D
TA = 25°C "5.3 "3.9
TA = 85°C "3.8 "2.8
D 7 2 D
Pulsed Drain Current IDM "20 A
D 6 3 D
Continuous Source Current IS –2.1 –1.1 A
(Note 1.) S 5 4 G
Maximum Power Dissipation PD W
(Note 1.)
TA = 25°C 2.5 1.3
MARKING DIAGRAM
TA = 85°C 1.3 0.7
Operating Junction and Storage TJ, Tstg –55 to +150 °C
Temperature Range
A3
1. Surface Mounted on 1″ x 1″ FR4 Board.
ORDERING INFORMATION
This document contains information on a product under development. ON Semiconductor NTHS5441T1 ChipFET 3000/Tape & Reel
reserves the right to change or discontinue this product without notice.
THERMAL CHARACTERISTICS
Characteristic Symbol Typ Max Unit
Maximum Junction–to–Ambient (Note 2.) RthJA °C/W
t v 5 sec 40 50
Steady State 80 95
Maximum Junction–to–Foot (Drain) RthJF 15 20 °C/W
Steady State
On–State Drain Current (Note 3.) ID(on) VDS v –5.0 V, VGS = –4.5 V –20 – – A
Drain–Source On–State Resistance (Note 3.) rDS(on)
S( ) VGS = –3.6 V, ID = –3.7 A – 0.050 0.06 Ω
VGS = –2.5 V, ID = –3.1 A – 0.070 0.083
Forward Transconductance (Note 3.) gfs VDS = –10 V, ID = –3.9 A – 12 – S
Diode Forward Voltage (Note 3.) VSD IS = –1.1 A, VGS = 0 V – –0.8 –1.2 V
Dynamic (Note 4.)
Total Gate Charge Qg – 11 22 nC
VDS = –10
10 V
V, VGS = –4.5
45V V,
Gate–Source Charge Qgs – 3.0 –
ID = –3.9 A
Gate–Drain Charge Qgd – 2.5 –
Turn–On Delay Time td(on) – 20 30 ns
Rise Time tr VDD = –10 V, RL = 10 Ω – 35 55
ID ^ –1.0
–1 0 A
A, VGEN = –4
–4.5
5VV,
Turn–Off Delay Time td(off) RG = 6 Ω – 65 100
Fall Time tf – 45 70
Source–Drain Reverse Recovery Time trr IF = –1.1 A, di/dt = 100 A/µs – 30 60
2. Surface Mounted on 1″ x 1″ FR4 Board.
3. Pulse Test: Pulse Width v 300 µs, Duty Cycle v 2%.
4. Guaranteed by design, not subject to production testing.
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NTHS5441T1
80 mm 80 mm
18 mm
25 mm
68 mm
28 mm 28 mm
26 mm 26 mm
Figure 1. Figure 2.
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PRODUCT SUMMARY
VDS (V) RDS(on) (Ω) ID (A) P–Channel MOSFET
ChipFET
MAXIMUM RATINGS (TA = 25°C unless otherwise noted) CASE 1206A
STYLE 1
Steady
Rating Symbol 5 secs State Unit
Drain–Source Voltage VDS –20 V
PIN CONNECTIONS
Gate–Source Voltage VGS "12 V
Continuous Drain Current ID A
(TJ = 150°C) (Note 1.) D 8 1 D
TA = 25°C "4.9 "3.6
TA = 85°C "3.5 "2.6 D 7 2 D
ORDERING INFORMATION
This document contains information on a product under development. ON Semiconductor NTHS5443T1 ChipFET 3000/Tape & Reel
reserves the right to change or discontinue this product without notice.
THERMAL CHARACTERISTICS
Characteristic Symbol Typ Max Unit
Maximum Junction–to–Ambient (Note 2.) RthJA °C/W
t v 5 sec 40 50
Steady State 80 95
Maximum Junction–to–Foot (Drain) RthJF 15 20 °C/W
Steady State
On–State Drain Current (Note 3.) ID(on) VDS v –5.0 V, VGS = –4.5 V –15 – – A
Drain–Source On–State Resistance rDS(on)
S( ) VGS = –4.5 V, ID = –3.6 A – 0.056 0.065 Ω
(N t 3
(Note 3.))
VGS = –3.6 V, ID = –3.3 A – 0.065 0.074
VGS = –2.5 V, ID = –2.7 A – 0.095 0.110
Forward Transconductance (Note 3.) gfs VDS = –10 V, ID = –3.6 A – 10 – S
Diode Forward Voltage (Note 3.) VSD IS = –1.1 A, VGS = 0 V – –0.8 –1.2 V
Dynamic (Note 4.)
Total Gate Charge Qg – 9.0 14 nC
10 V
VDS = –10 V, VGS = –4.5
45V V,
Gate–Source Charge Qgs – 2.2 –
ID = –3.6 A
Gate–Drain Charge Qgd – 2.2 –
Turn–On Delay Time td(on) – 15 25 µs
Rise Time tr VDD = –10 V, RL = 10 Ω – 30 45
ID ^ –1.0
–1 0 A
A, VGEN = –4
–4.5
5VV,
Turn–Off Delay Time td(off) RG = 6 Ω – 50 75
Fall Time tf – 35 50
Source–Drain Reverse Recovery Time trr IF = –1.1 A, di/dt = 100 A/µs – 30 60 ns
2. Surface Mounted on 1″ x 1″ FR4 Board.
3. Pulse Test: Pulse Width v 300 µs, Duty Cycle v 2%.
4. Guaranteed by design, not subject to production testing.
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PRODUCT SUMMARY D
ORDERING INFORMATION
THERMAL CHARACTERISTICS
Characteristic Symbol Typ Max Unit
Maximum Junction–to–Ambient (Note 2.) RthJA °C/W
t v 5 sec 40 50
Steady State 80 95
Maximum Junction–to–Foot (Drain) RthJF 15 20 °C/W
Steady State
On–State Drain Current (Note 3.) ID(on) VDS v –5.0 V, VGS = –4.5 V –20 – – A
Drain–Source On–State Resistance (Note 3.) rDS(on)
S( ) VGS = –4.5 V, ID = –5.2 A – 0.030 0.035 Ω
VGS = –2.5 V, ID = –4.5 A – 0.040 0.047
VGS = –1.8 V, ID = –2.0 A – 0.052 0.062
Forward Transconductance (Note 3.) gfs VDS = –5.0 V, ID = –5.2 A – 18 – S
Diode Forward Voltage (Note 3.) VSD IS = –1.1 A, VGS = 0 V – –0.8 –1.2 V
Dynamic (Note 4.)
Total Gate Charge Qg – 17 26 nC
40V
VDS = –4.0 V, VGS = –4.5
45V V,
Gate–Source Charge Qgs – 2.8 –
ID = –5.2 A
Gate–Drain Charge Qgd – 2.6 –
Turn–On Delay Time td(on) – 15 25 ns
Rise Time tr VDD = –4.0 V, RL = 4 Ω – 45 70
ID ^ –1.0
–1 0 A
A, VGEN = –4
–4.5
5VV,
Turn–Off Delay Time td(off) RG = 6 Ω – 110 165
Fall Time tf – 65 100
Source–Drain Reverse Recovery Time trr IF = –1.1 A, di/dt = 100 A/µs – 30 60
2. Surface Mounted on 1″ x 1″ FR4 Board.
3. Pulse Test: Pulse Width v 300 µs, Duty Cycle v 2%.
4. Guaranteed by design, not subject to production testing.
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NTHS5445T1
20 20
VGS = 5 thru 2.5 V TC = –55°C
16 2V 16 25°C
12 12 125°C
8 8
1.5 V
4 4
1V
0 0
0 0.5 1.0 1.5 2.0 2.5 3.0 0 0.5 1.0 1.5 2.0 2.5
VDS, Drain–to–Source Voltage (V) VGS, Gate–to–Source Voltage (V)
Figure 1. Output Characteristics Figure 2. Transfer Characteristics
0.10 3000
r DS(on),On–Resistance ( Ω )
2500
0.08 VGS = 1.8 V Ciss
C, Capacitance (pF)
2000
0.06
VGS = 2.5 V 1500
0.04 VGS = 4.5 V Coss
1000
0.02
500
Crss
0 0
0 4 8 12 16 20 0 2 4 6 8
ID, Drain Current (A) VDS, Drain–to–Source Voltage (V)
Figure 3. On–Resistance vs. Drain Current Figure 4. Capacitance
5 1.6
VGS,Gate–to–Source Voltage (V)
r DS(on),On–Resistance ( Ω )
3 1.2
2 1.0
1 0.8
0 0.6
0 4 8 12 16 20 –50 –25 0 25 50 75 100 125 150
Qg, Total Gate Charge (nC) TJ, Junction Temperature (°C)
Figure 5. Gate Charge Figure 6. On–Resistance vs. Junction
Temperature
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NTHS5445T1
20 0.10
rDS(on),On–Resistance ( Ω )
TJ = 150°C
10 0.08
I S,Source Current (A)
0.06 ID = 5.2 A
0.04
TJ = 25°C
0.02
1 0
0 0.2 0.4 0.6 0.8 1.0 1.2 0 1 2 3 4 5
VDS, Drain–to–Source Voltage (V) VGS, Gate–to–Source Voltage (V)
0.4 50
0.3
40
ID = 250 µA
V GS (th),Varience (V)
0.2
Power (W)
30
0.1
20
0.0
10
–0.1
–0.2 0
–50 –25 0 25 50 75 100 125 150 10–3 10–2 10 –1 1 10 100 600
TJ, Temperature (°C) Time (sec)
Figure 9. Threshold Voltage Figure 10. Single Pulse Power
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NTHS5445T1
1
Normalized Effective Transient
Notes:
PDM
0.2
t1
0.1 t2
0.1
0.05 t1
1. Duty Cycle, D = t
2
0.02 2. Per Unit Base = RthJA = 80°C/W
3. TJM – TA = PDMZthJA(t)
Single Pulse 4. Surface Mounted
0.01
10–4 10–3 10–2 10 –1 1 10 100 600
Square Wave Pulse Duration (sec)
2
Normalized Effective Transient
1
Duty Cycle = 0.5
Thermal Impedance
0.2
0.1
0.1
0.05
0.02
Single Pulse
0.01
10–4 10–3 10–2 10 –1 1 10
Square Wave Pulse Duration (sec)
Figure 12. Normalized Thermal Transient Impedance, Junction–to–Foot
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NTHS5445T1
80 mm 80 mm
18 mm
25 mm
68 mm
28 mm 28 mm
26 mm 26 mm
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!#!
#$%& '(
!- !
Dual P–Channel SO–8
Features
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• High Efficiency Components in a Dual SO–8 Package
• High Density Power MOSFET with Low RDS(on)
• Miniature SO–8 Surface Mount Package – Saves Board Space –3.05 AMPERES
• Diode Exhibits High Speed with Soft Recovery –30 VOLTS
• IDSS Specified at Elevated Temperature
• Avalanche Energy Specified
0.085 W @ VGS = –10 V
• Mounting Information for the SO–8 Package is Provided
P–Channel
Applications
• DC–DC Converters D
• Low Voltage Motor Control
• Power Management in Portable and Battery–Powered Products, i.e.:
Computers, Printers, PCMCIA Cards, Cellular & Cordless Telephones
G
MOSFET MAXIMUM RATINGS (TJ = 25°C unless otherwise noted)
Rating Symbol Value Unit S
Drain–to–Source Voltage VDSS –30 V
Gate–to–Source Voltage – Continuous VGS ±20 V MARKING
DIAGRAM
Thermal Resistance –
Junction–to–Ambient (Note 1.) RθJA 171 °C/W
Total Power Dissipation @ TA = 25°C PD 0.73 W
SO–8 ED3P03
Continuous Drain Current @ 25°C ID –2.34 A
CASE 751 LYWW
Continuous Drain Current @ 70°C ID –1.87 A 8
STYLE 11
Pulsed Drain Current (Note 4.) IDM –8.0 A
Thermal Resistance – 1
Junction–to–Ambient (Note 2.) RθJA 100 °C/W
Total Power Dissipation @ TA = 25°C PD 1.25 W ED3P03 = Device Code
Continuous Drain Current @ 25°C ID –3.05 A L = Assembly Location
Continuous Drain Current @ 70°C ID –2.44 A Y = Year
Pulsed Drain Current (Note 4.) IDM –12 A WW = Work Week
Thermal Resistance –
Junction–to–Ambient (Note 3.) RθJA 62.5 °C/W PIN ASSIGNMENT
Total Power Dissipation @ TA = 25°C PD 2.0 W
Continuous Drain Current @ 25°C ID –3.86 A
Source–1 1 8 Drain–1
Continuous Drain Current @ 70°C ID –3.1 A
Pulsed Drain Current (Note 4.) IDM –15 A Gate–1 2 7 Drain–1
Operating and Storage TJ, Tstg –55 to °C Source–2 3 6 Drain–2
Temperature Range +150
Gate–2 4 5 Drain–2
Single Pulse Drain–to–Source Avalanche EAS 140 mJ
Energy – Starting TJ = 25°C Top View
(VDD = –30 Vdc, VGS = –4.5 Vdc, Peak
IL = –7.5 Apk, L = 5 mH, RG = 25 Ω) ORDERING INFORMATION
Maximum Lead Temperature for Soldering TL 260 °C
Purposes, 1/8″ from case for 10 seconds Device Package Shipping
1. Minimum FR–4 or G–10 PCB, t = Steady State.
NTMD3P03R2 SO–8 2500/Tape & Reel
2. Mounted onto a 2″ square FR–4 Board (1″ sq. 2 oz Cu 0.06″ thick single
sided), t = steady state.
3. Mounted onto a 2″ square FR–4 Board (1″ sq. 2 oz Cu 0.06″ thick single This document contains information on a product under
sided), t ≤ 10 seconds. development. ON Semiconductor reserves the right to
4. Pulse Test: Pulse Width = 300 ms, Duty Cycle = 2%. change or discontinue this product without notice.
ON CHARACTERISTICS
Gate Threshold Voltage VGS(th) Vdc
(VDS = VGS, ID = –250 µAdc) –1.0 –1.7 –2.5
Temperature Coefficient (Negative) – 3.6 –
Static Drain–to–Source On–State Resistance RDS(on) Ω
(VGS = –10 Vdc, ID = –3.05 Adc) – 0.063 0.085
(VGS = –4.5 Vdc, ID = –1.5 Adc) – 0.090 0.125
Forward Transconductance (VDS = –15 Vdc, ID = –3.05 Adc) gFS – 5.0 – Mhos
DYNAMIC CHARACTERISTICS
Input Capacitance Ciss – 520 750 pF
Output Capacitance (VDS = –24
24 Vdc,
Vd VGS = 0 Vdc,
Vd
Coss – 170 325
f = 1.0 MHz)
Reverse Transfer Capacitance Crss – 70 135
SWITCHING CHARACTERISTICS (Notes 6. and 7.)
Turn–On Delay Time td(on) – 12 22 ns
Rise Time (VDD = –24 Vdc, ID = –3.05 Adc, tr – 16 30
VGS = –10
10 Vdc
Vdc,
Turn–Off Delay Time RG = 6.0 Ω) td(off) – 45 80
Fall Time tf – 45 80
Turn–On Delay Time td(on) – 16 – ns
Rise Time (VDD = –24 Vdc, ID = –1.5 Adc, tr – 42 –
VGS = –4.5
4 5 Vdc,
Vdc
Turn–Off Delay Time RG = 6.0 Ω) td(off) – 32 –
Fall Time tf – 35 –
Total Gate Charge Qtot – 16 25 nC
(VDS = –24 Vdc,
Gate–Source Charge VGS = –10 Vdc, Qgs – 2.0 –
ID = –3.05
3 05 Adc)
Ad )
Gate–Drain Charge Qgd – 4.5 –
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121
NTMD3P03R2
6 6
VGS = –10 V
VGS = –4.4 V VDS > = –10 V
–ID, DRAIN CURRENT (AMPS)
0 0
0 0.25 0.5 0.75 1 1.25 1.5 1.75 2 1 2 3 4 5
–VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS) –VGS, GATE–TO–SOURCE VOLTAGE (VOLTS)
0.5 0.5
0.4 0.4
0.3 0.3
0.2 0.2
0.1 0.1
0 0
3 4 5 6 7 8 2 3 4 5 6 7
–VGS, GATE–TO–SOURCE VOLTAGE (VOLTS) –VGS, GATE–TO–SOURCE VOLTAGE (VOLTS)
Figure 3. On–Resistance vs. Gate–to–Source Figure 4. On–Resistance vs. Gate–to–Source
Voltage Voltage
RDS(on), DRAIN–TO–SOURCE RESISTANCE (Ω)
0.25 1.6
ID = –3.05 A
TJ = 25°C VGS = –10 V
1.4
0.2 VGS = –4.5 V
(NORMALIZED)
1.2
0.15
1
VGS = –10 V
0.1
0.8
0.05 0.6
1 2 3 4 5 6 –50 –25 0 25 50 75 100 125 150
–ID, DRAIN CURRENT (AMPS) TJ, JUNCTION TEMPERATURE (°C)
Figure 5. On–Resistance vs. Drain Current and Figure 6. On Resistance Variation with
Gate Voltage Temperature
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122
NTMD3P03R2
10000
VGS = 0 V VDS = 0 V VGS = 0 V
1200
Ciss
C, CAPACITANCE (pF)
TJ = 150°C 1000
IDSS, LEAKAGE (nA)
1000
800
Ciss
TJ = 125°C 600 Crss
100 400
Coss
200
Crss
TJ = 25°C
10 0
6 10 14 18 22 26 30 10 5 0 5 10 15 20 25 30
–VGS –VDS
–VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS) GATE–TO–SOURCE OR DRAIN–TO–SOURCE
VOLTAGE (VOLTS)
Figure 7. Drain–to–Source Leakage Current Figure 8. Capacitance Variation
vs. Voltage
–VGS, GATE–TO–SOURCE VOLTAGE (VOLTS)
12 30 1000
VDS = –24 V
QT ID = –3.05 A
10 25
VGS = –10 V
VDS
8 20 100
t, TIME (ns)
VGS td(off)
6 15 tf
Q1 tr
4 Q2 10 10
td(on)
2 5
ID = –3.05 A
TJ = 25°C
0 0 1
0 2 4 6 8 10 12 14 16 1 10 100
Qg, TOTAL GATE CHARGE (nC) RG, GATE RESISTANCE (Ω)
1000 3
VDS = –24 V VGS = 0 V
IS, SOURCE CURRENT (AMPS)
ID = –1.5 A TJ = 25°C
2.5
VGS = –4.5 V
2
t, TIME (ns)
100 1.5
tr
td(off)
tf 1
td(on)
0.5
10 0
1 10 100 0.2 0.4 0.6 0.8 1 1.2
RG, GATE RESISTANCE (Ω) –VSD, DRAIN–TO–SOURCE VOLTAGE (VOLTS)
Figure 11. Resistive Switching Time Variation Figure 12. Diode Forward Voltage vs. Current
vs. Gate Resistance
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123
NTMD3P03R2
100
VGS = 12 V
SINGLE PULSE
–ID, DRAIN CURRENT (AMPS)
1.0 ms
TC = 25°C
10
10 ms di/dt
IS
1.0 dc
trr
ta tb
0.1 TIME
RDS(on) LIMIT
THERMAL LIMIT tp 0.25 IS
PACKAGE LIMIT
0.01 IS
1 1.0 10 100
–VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS)
Figure 13. Maximum Rated Forward Biased Figure 14. Diode Reverse Recovery Waveform
Safe Operating Area
1.0
D = 0.5
Rthja(t), EFFECTIVE TRANSIENT
THERMAL RESPONSE
0.2
0.1
0.1
0.05 Chip Normalized to RθJA at Steady State (1″ pad)
Junction 2.32 Ω 18.5 Ω 50.9 Ω 37.1 Ω 56.8 Ω 24.4 Ω
0.02
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124
NTMD3P03R2
9
$#
#:$ $$
: 6
#6 $
9 #:
inches
mm
SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • The soldering temperature and time shall not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within • When shifting from preheating to soldering, the
a short time could result in device failure. Therefore, the maximum temperature gradient shall be 5°C or less.
following items should always be observed in order to • After soldering has been completed, the device should
minimize the thermal stress to which the devices are be allowed to cool naturally for at least three minutes.
subjected. Gradual cooling should be used as the use of forced
• Always preheat the device. cooling will increase the temperature gradient and
• The delta temperature between the preheat and result in latent failure due to mechanical stress.
soldering should be 100°C or less.* • Mechanical stress or shock should not be applied
• When preheating and soldering, the temperature of the during cooling.
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When * Soldering a device without preheating can cause
using infrared heating with the reflow soldering excessive thermal shock and stress which can result in
method, the difference shall be a maximum of 10°C. damage to the device.
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125
NTMD3P03R2
150°C
SOLDER IS LIQUID FOR
40 TO 80 SECONDS
100°C 140°C (DEPENDING ON
MASS OF ASSEMBLY)
100°C
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126
#$%& '(
-
N–Channel Enhancement Mode
Dual SO–8 Package http://onsemi.com
Features
• Ultra Low RDS(on)
• Higher Efficiency Extending Battery Life 6.0 AMPERES
• Logic Level Gate Drive 20 VOLTS
• Miniature Dual SO–8 Surface Mount Package
• Diode Exhibits High Speed, Soft Recovery
35 mW @ VGS = 4.5 V
• Avalanche Energy Specified
• SO–8 Mounting Information Provided N–Channel
Applications D
• DC–DC Converters
• Low Voltage Motor Control
• Power Management in Portable and Battery–Powered Products, i.e.:
Computers, Printers, Cellular and Cordless Telephones and PCMCIA G
Cards
MAXIMUM RATINGS (TJ = 25°C unless otherwise noted) S
Rating Symbol Value Unit
Drain–to–Source Voltage VDSS 20 V
Drain–to–Gate Voltage (RGS = 1.0 MW) VDGR 20 V 8
Gate–to–Source Voltage – Continuous VGS "12 V
1
Thermal Resistance –
Junction–to–Ambient (Note 1.) RθJA 62.5 °C/W SO–8
Total Power Dissipation @ TA = 25°C PD 2.0 W CASE 751
Continuous Drain Current @ TA = 25°C ID 6.5 A STYLE 11
Continuous Drain Current @ TA = 70°C ID 5.5 A
Pulsed Drain Current (Note 4.) IDM 20 A
MARKING DIAGRAM
Thermal Resistance – & PIN ASSIGNMENT
Junction–to–Ambient (Note 2.) RθJA 102 °C/W
1 8
Total Power Dissipation @ TA = 25°C PD 1.22 W Source 1 Drain 1
Continuous Drain Current @ TA = 25°C ID 5.07 A 2 7
Gate 1 E6N02 Drain 1
Continuous Drain Current @ TA = 70°C ID 4.07 A 3 6
Pulsed Drain Current (Note 4.) IDM 16 A Source 2 LYWW Drain 2
4 5
Gate 2 Drain 2
Thermal Resistance –
Junction–to–Ambient (Note 3.) RθJA 172 °C/W (Top View)
Total Power Dissipation @ TA = 25°C PD 0.73 W
Continuous Drain Current @ TA = 25°C ID 3.92 A
E6N02 = Device Code
Continuous Drain Current @ TA = 70°C ID 3.14 A
L = Assembly Location
Pulsed Drain Current (Note 4.) IDM 12 A
Y = Year
1. Mounted onto a 2″ square FR–4 Board (1″ sq. 2 oz. Cu 0.06″ thick single WW = Work Week
sided), t < 10 seconds.
2. Mounted onto a 2″ square FR–4 Board (1″ sq. 2 oz. Cu 0.06″ thick single
sided), t = steady state. ORDERING INFORMATION
3. Minimum FR–4 or G–10 PCB, t = steady state.
4. Pulse Test: Pulse Width = 300 ms, Duty Cycle = 2%. Device Package Shipping
This document contains information on a product under development. ON Semiconductor
NTMD6N02R2 SO–8 2500/Tape & Reel
reserves the right to change or discontinue this product without notice.
http://onsemi.com
128
NTMD6N02R2
ELECTRICAL CHARACTERISTICS (TC = 25°C unless otherwise noted) (continued) (Note 8.)
Characteristic Symbol Min Typ Max Unit
BODY–DRAIN DIODE RATINGS (Note 9.)
Diode Forward On–Voltage (IS = 4.0 Adc, VGS = 0 Vdc) VSD – 0.83 1.1 Vdc
(IS = 6.0 Adc, VGS = 0 Vdc) – 0.88 1.2
(IS = 6.0 Adc, VGS = 0 Vdc, TJ = 125°C) – 0.75 –
Reverse Recovery Time trr – 30 – ns
(IS = 6.0
6 0 Adc,
Ad VGS = 0 Vdc,
Vd
ta – 15 –
dIS/dt = 100 A/µs)
tb – 15 –
Reverse Recovery Stored Charge QRR – 0.02 – µC
8. Handling precautions to protect against electrostatic discharge is mandatory.
9. Indicates Pulse Test: Pulse Width = 300 µs max, Duty Cycle = 2%.
12 12
10 V 2.5 V 2.0 V
VDS ≥ 10 V
I D, DRAIN CURRENT (AMPS)
4 25°C
4 100°C
0 0
0 0.25 0.5 0.75 1 1.25 1.5 1.75 0.5 1 1.5 2 2.5
VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS) VGS, GATE–TO–SOURCE VOLTAGE (VOLTS)
0.07 0.05
ID = 6.0 A TJ = 25°C
0.06
TJ = 25°C
0.04
0.05
VGS = 2.5 V
0.04
0.03 4.5 V
0.03
0.02
0.02
0.01
0 0.01
0 2 4 6 8 10 1 3 5 7 9 11 13
VGS, GATE–TO–SOURCE VOLTAGE (VOLTS) ID, DRAIN CURRENT (AMPS)
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129
NTMD6N02R2
1 1 25°C
0.8 0.1
0.6 0.01
–50 –25 0 25 50 75 100 125 150 4 8 12 16 20
TJ, JUNCTION TEMPERATURE (°C) VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS)
VDS
VGS
1500 3 12
Crss
ID = 6 A
1000 Q1 Q2 VDS = 16 V
2 8
Ciss VGS = 4.5 V
TJ = 25°C
500 1 4
Coss
Crss
0 0 0
10 5 0 5 10 15 20 0 4 8 12 16
VGS VDS Qg, TOTAL GATE CHARGE (nC)
1000
VDS = 16 V
ID = 6.0 A
VGS = 4.5 V
t, TIME (ns)
100
tf
tr
td(off)
td(on)
10
1 10 100
RG, GATE RESISTANCE (OHMS)
Figure 9. Resistive Switching Time Variation
versus Gate Resistance
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130
NTMD6N02R2
5 100
VGS = 12 V
I S, SOURCE CURRENT (AMPS)
VGS = 0 V
10
3
10 ms
2
1
1 RDS(on) LIMIT
THERMAL LIMIT
PACKAGE LIMIT dc
0 0.1
0 0.2 0.4 0.6 0.8 1.0 1.2 0.1 1 10 100
VSD, SOURCE–TO–DRAIN VOLTAGE (VOLTS) VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS)
Figure 10. Diode Forward Voltage versus Current Figure 11. Maximum Rated Forward Biased
Safe Operating Area
di/dt
IS
trr
ta tb
TIME
tp 0.25 IS
IS
1
Rthja(t), EFFECTIVE TRANSIENT
D = 0.5
0.2
THERMAL RESISTANCE
0.1
0.1
0.05
0.02 *0
θ,' " ('
θ,
0.01
- .
/
0.01
/
'
'
'# ,*0 " *0
θ,'
SINGLE PULSE - - " '&'#
0.001
1.0E–05 1.0E–04 1.0E–03 1.0E–02 1.0E–01 1.0E+00 1.0E+01 1.0E+02 1.0E+03
t, TIME (s)
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131
NTMD6N02R2
9
$#
#:$ $$
: 6
#6 $
9 #:
inches
mm
SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • The soldering temperature and time shall not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within • When shifting from preheating to soldering, the
a short time could result in device failure. Therefore, the maximum temperature gradient shall be 5°C or less.
following items should always be observed in order to • After soldering has been completed, the device should
minimize the thermal stress to which the devices are be allowed to cool naturally for at least three minutes.
subjected. Gradual cooling should be used as the use of forced
• Always preheat the device. cooling will increase the temperature gradient and
• The delta temperature between the preheat and result in latent failure due to mechanical stress.
soldering should be 100°C or less.* • Mechanical stress or shock should not be applied
• When preheating and soldering, the temperature of the during cooling.
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When * Soldering a device without preheating can cause
using infrared heating with the reflow soldering excessive thermal shock and stress which can result in
method, the difference shall be a maximum of 10°C. damage to the device.
http://onsemi.com
132
NTMD6N02R2
150°C
SOLDER IS LIQUID FOR
40 TO 80 SECONDS
100°C 140°C (DEPENDING ON
MASS OF ASSEMBLY)
100°C
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133
#
Preferred Device
#$%& '(
P–Channel SO–8, Dual
Features
• Ultra Low RDS(on)
• Higher Efficiency Extending Battery Life http://onsemi.com
• Logic Level Gate Drive
• Miniature Dual SO–8 Surface Mount Package 6 AMPERES
• Diode Exhibits High Speed, Soft Recovery
20 VOLTS
• Avalanche Energy Specified
• SO–8 Mounting Information Provided RDS(on) = 33 mW
Applications
• Power Management in Portable and Battery–Powered Products, i.e.: P–Channel
Cellular and Cordless Telephones and PCMCIA Cards
D
MAXIMUM RATINGS (TJ = 25°C unless otherwise noted)
Rating Symbol Value Unit
Drain–to–Source Voltage VDSS –20 V
G
Gate–to–Source Voltage – Continuous VGS "12 V
Thermal Resistance – S
Junction–to–Ambient (Note 1.) RθJA 62.5 °C/W
Total Power Dissipation @ TA = 25°C PD 2.0 W
Continuous Drain Current @ TA = 25°C ID –7.8 A MARKING
Continuous Drain Current @ TA = 70°C ID –5.7 A DIAGRAM
Maximum Operating Power Dissipation PD 0.5 W
Maximum Operating Drain Current ID –3.89 A
Pulsed Drain Current (Note 4.) IDM –40 A
SO–8, Dual
CASE 751 E6P02
Thermal Resistance – 8
Junction–to–Ambient (Note 2.) RθJA 98 °C/W STYLE 11 LYWW
Total Power Dissipation @ TA = 25°C PD 1.28 W
1
Continuous Drain Current @ TA = 25°C ID –6.2 A
Continuous Drain Current @ TA = 70°C ID –4.6 A
E6P02 = Device Code
Maximum Operating Power Dissipation PD 0.3 W
L = Location Code
Maximum Operating Drain Current ID –3.01 A
Y = Year
Pulsed Drain Current (Note 4.) IDM –35 A
WW = Work Week
Thermal Resistance –
Junction–to–Ambient (Note 3.) RθJA 166 °C/W
Total Power Dissipation @ TA = 25°C PD 0.75 W PIN ASSIGNMENT
Continuous Drain Current @ TA = 25°C ID –4.8 A
Continuous Drain Current @ TA = 70°C ID –3.5 A Source–1 1 8 Drain–1
Maximum Operating Power Dissipation PD 0.2 W Gate–1 2 7 Drain–1
Maximum Operating Drain Current ID –2.48 A
Pulsed Drain Current (Note 4.) IDM –30 A Source–2 3 6 Drain–2
1. Mounted onto a 2″ square FR–4 Board (1″ sq. 2 oz. Cu 0.06″ thick single Gate–2 4 5 Drain–2
sided), t = 10 seconds. Top View
2. Mounted onto a 2″ square FR–4 Board (1″ sq. 2 oz. Cu 0.06″ thick single
sided), t = steady state.
3. Minimum FR–4 or G–10 PCB, t = steady state. ORDERING INFORMATION
4. Pulse Test: Pulse Width = 300 ms, Duty Cycle = 2%.
Device Package Shipping
ON CHARACTERISTICS
Gate Threshold Voltage VGS(th) Vdc
(VDS = VGS, ID = –250 µAdc) –0.6 –0.88 –1.20
Temperature Coefficient (Negative) – 2.6 – mV/°C
Static Drain–to–Source On–State Resistance RDS(on) Ω
(VGS = –4.5 Vdc, ID = –6.2 Adc) – 0.027 0.033
(VGS = –2.5 Vdc, ID = –5.0 Adc) – 0.038 0.050
(VGS = –2.5 Vdc, ID = –3.1 Adc) – 0.038 –
Forward Transconductance (VDS = –10 Vdc, ID = –6.2 Adc) gFS – 15 – Mhos
DYNAMIC CHARACTERISTICS
Input Capacitance Ciss – 1380 1700 pF
Output Capacitance 16 Vdc,
(VDS = –16 Vd VGS = 0 Vdc,
Vd
Coss – 515 775
f = 1.0 MHz)
Reverse Transfer Capacitance Crss – 250 450
SWITCHING CHARACTERISTICS (Notes 6. and 7.)
Turn–On Delay Time td(on) – 15 25 ns
Rise Time (VDD = –10 Vdc, ID = –1.0 Adc, tr – 20 50
10 Vdc,
VGS = –10 Vdc
Turn–Off Delay Time RG = 6.0 Ω) td(off) – 85 125
Fall Time tf – 50 110
Turn–On Delay Time td(on) – 17 – ns
Rise Time (VDD = –16 Vdc, ID = –6.2 Adc, tr – 65 –
VGS = –4.5
4 5 Vdc,
Vdc
Turn–Off Delay Time RG = 6.0 Ω) td(off) – 50 –
Fall Time tf – 80 –
Total Gate Charge Qtot – 20 35 nC
(VDS = –16 Vdc,
Gate–Source Charge VGS = –4.5 Vdc, Qgs – 4.0 –
ID = –6.2
6 2 Ad
Adc))
Gate–Drain Charge Qgd – 8.0 –
5. Handling precautions to protect against electrostatic discharge is mandatory.
6. Indicates Pulse Test: Pulse Width = 300 µs max, Duty Cycle = 2%.
7. Switching characteristics are independent of operating junction temperature.
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135
NTMD6P02R2
ELECTRICAL CHARACTERISTICS (TC = 25°C unless otherwise noted) (continued) (Note 8.)
Characteristic Symbol Min Typ Max Unit
BODY–DRAIN DIODE RATINGS (Note 9..)
Diode Forward On–Voltage (IS = –1.7 Adc, VGS = 0 Vdc) VSD – –0.80 –1.2 Vdc
(IS = –1.7 Adc, VGS = 0 Vdc, TJ = 125°C) – –0.65 –
Diode Forward On–Voltage (IS = –6.2 Adc, VGS = 0 Vdc) VSD – –0.95 – Vdc
(IS = –6.2 Adc, VGS = 0 Vdc, TJ = 125°C) – –0.80 –
Reverse Recovery Time trr – 50 80 ns
(IS = –1.7
1 7 Adc,
Ad VGS = 0 Vdc,
Vd
ta – 20 –
dIS/dt = 100 A/µs)
tr – 30 –
Reverse Recovery Stored Charge QRR – 0.04 – µC
8. Handling precautions to protect against electrostatic discharge is mandatory.
9. Indicates Pulse Test: Pulse Width = 300 µs max, Duty Cycle = 2%.
12 10
–10 V –4.5 V –2.1 V
VDS ≥ –10 V
–ID, DRAIN CURRENT (AMPS)
0.05 0.05
ID = –6.2 A TJ = 25°C
0.04 TJ = 25°C
0.04 VGS = –2.5 V
–2.7 V
0.03
0.03 –4.5 V
0.02
0.02
0.01
0 0.01
0 2.0 4.0 6.0 8.0 10 0 2.0 4.0 6.0 8.0 10 12 14
–VGS, GATE–TO–SOURCE VOLTAGE (VOLTS) –ID, DRAIN CURRENT (AMPS)
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136
NTMD6P02R2
1.2 10
1 1
25°C
0.8 0.1
0.6 0.01
–50 –25 0 25 50 75 100 125 150 4 8 12 16 20
TJ, JUNCTION TEMPERATURE (°C) –VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS)
VDS
3500 VGS
3000 3 Q1 Q2 12
2500 Crss
2000 2 8
1500 Ciss ID = –6.2 A
VDS = –16 V
1000 1 VGS = –4.5 V 4
Coss
500 Crss TJ = 25°C
0 0 0
10 5.0 0 5.0 10 15 20 0 5.0 10 15 20 25
–VGS –VDS Qg, TOTAL GATE CHARGE (nC)
1000 1000
VDD = –16 V VDD = –16 V
ID = –1.0 A ID = –6.2 A
VGS = –10 V td(off) VGS = –4.5 V
tf
t, TIME (ns)
t, TIME (ns)
100 100
tf
tr tr
td(off)
td(on)
td(on)
10 10
1 10 100 1 10 100
RG, GATE RESISTANCE (OHMS) RG, GATE RESISTANCE (OHMS)
Figure 9. Resistive Switching Time Variation Figure 10. Resistive Switching Time Variation
versus Gate Resistance versus Gate Resistance
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137
NTMD6P02R2
5 100
VGS = 2.5 V
–IS, SOURCE CURRENT (AMPS)
10
3
10 ms
2
1
1 RDS(on) LIMIT
THERMAL LIMIT
PACKAGE LIMIT dc
0 0.1
0 0.2 0.4 0.6 0.8 1.0 1.2 0.1 1 10 100
–VSD, SOURCE–TO–DRAIN VOLTAGE (VOLTS) –VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS)
Figure 11. Diode Forward Voltage versus Current Figure 12. Maximum Rated Forward Biased
Safe Operating Area
di/dt
IS
trr
ta tb
TIME
tp 0.25 IS
IS
10
, EFFECTIVE TRANSIENT
THERMAL RESISTANCE
1 D = 0.5
0.2
0.1
0.1
0.05
θ
0.02 2%* :$ Ω : Ω #:9 Ω $::9 Ω :89 Ω
0.01
Rthja(t)
0.01
$6 . 8$6 . 4:6 . :87 . :$$ .
SINGLE PULSE +%1'
0.001
1.0E–05 1.0E–04 1.0E–03 1.0E–02 1.0E–01 1.0E+00 1.0E+01 1.0E+02 1.0E+03
t, TIME (s)
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138
NTMD6P02R2
9
$#
#:$ $$
: 6
#6 $
9 #:
inches
mm
SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • The soldering temperature and time shall not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within • When shifting from preheating to soldering, the
a short time could result in device failure. Therefore, the maximum temperature gradient shall be 5°C or less.
following items should always be observed in order to • After soldering has been completed, the device should
minimize the thermal stress to which the devices are be allowed to cool naturally for at least three minutes.
subjected. Gradual cooling should be used as the use of forced
• Always preheat the device. cooling will increase the temperature gradient and
• The delta temperature between the preheat and result in latent failure due to mechanical stress.
soldering should be 100°C or less.* • Mechanical stress or shock should not be applied
• When preheating and soldering, the temperature of the during cooling.
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When * Soldering a device without preheating can cause
using infrared heating with the reflow soldering excessive thermal shock and stress which can result in
method, the difference shall be a maximum of 10°C. damage to the device.
http://onsemi.com
139
NTMD6P02R2
150°C
SOLDER IS LIQUID FOR
40 TO 80 SECONDS
100°C 140°C (DEPENDING ON
MASS OF ASSEMBLY)
100°C
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140
"
#$%& '(
)-
213
2#13
Complementary SO–8
http://onsemi.com
MAXIMUM RATINGS (TC = 25°C unless otherwise noted)
Rating Symbol N P Unit 9.5 AMPERES, 20 VOLTS
Drain–to–Source Voltage VDSS 20 –20 Vdc RDS(on) = 24 mW (N–Channel)
Gate–to–Source Voltage VGS ±20 ±12 Vdc 4 AMPERES, 20 VOLTS
Drain Current – Continuous ID 7.0 4.5 A RDS(on) = 108 mW (P–Channel)
(Note 1.)
Operating and Storage TJ, Tstg –55 to +150 °C N–Channel P–Channel
Temperature Range
D D
Thermal Resistance (Note 2.) °C/W
– Junction–to–Ambient RθJA 50 50
1. Mounted on 1″ square FR–4 board.
2. Mounted on 1″ square FR–4 board, t ≤ 10 seconds.
G G
S S
MARKING
DIAGRAM
SO–8
NTMDC02
8 CASE 751 YWW
STYLE 20
1
PIN ASSIGNMENT
ORDERING INFORMATION
http://onsemi.com
142
#
#$%& '(
P–Channel Enhancement–Mode
Single SO–8 Package http://onsemi.com
Features
• Ultra Low RDS(on) –10 AMPERES
• Higher Efficiency Extending Battery Life
• Logic Level Gate Drive –20 VOLTS
• Miniature SO–8 Surface Mount Package 14 mW @ VGS = –4.5 V
• Diode Exhibits High Speed, Soft Recovery
• Avalanche Energy Specified
• SO–8 Mounting Information Provided P–Channel
Applications D
• Power Management in Portable and Battery–Powered Products, i.e.:
Cellular and Cordless Telephones and PCMCIA Cards
MAXIMUM RATINGS (TJ = 25°C unless otherwise noted) G
Rating Symbol Value Unit
Drain–to–Source Voltage VDSS –20 Vdc S
Gate–to–Source Voltage – Continuous VGS "12 Vdc
Thermal Resistance –
Junction–to–Ambient (Note 1.) RθJA 50 °C/W
Total Power Dissipation @ TA = 25°C PD 2.5 W
Continuous Drain Current @ 25°C ID –10 A 8
Continuous Drain Current @ 70°C ID –8.0 A
Maximum Operating Power Dissipation PD 0.6 W 1
Maximum Operating Drain Current ID –5.5 A
Pulsed Drain Current (Note 3.) IDM –50 A SO–8
Thermal Resistance – CASE 751
Junction–to–Ambient (Note 2.) RθJA 80 °C/W STYLE 12
Total Power Dissipation @ TA = 25°C PD 1.6 W
Continuous Drain Current @ 25°C ID –8.8 A MARKING DIAGRAM
Continuous Drain Current @ 70°C ID –6.4 A & PIN ASSIGNMENT
Maximum Operating Power Dissipation PD 0.4 W
Maximum Operating Drain Current ID –4.5 A 1 8
Source Drain
Pulsed Drain Current (Note 3.) IDM –44 A 2 7
Operating and Storage TJ, Tstg –55 to °C Source E10P02 Drain
3 LYWW 6
Temperature Range +150 Source Drain
4 5
Single Pulse Drain–to–Source Avalanche EAS 500 mJ Gate Drain
Energy – Starting TJ = 25°C
(VDD = –20 Vdc, VGS = –4.5 Vdc, Top View
Peak IL = 5.0 Apk, L = 40 mH,
RG = 25 Ω) E10P02 = Device Code
L = Assembly Location
Maximum Lead Temperature for Soldering TL 260 °C Y = Year
Purposes, 1/8″ from case for 10 seconds WW = Work Week
1. Mounted onto a 2″ square FR–4 Board (1″ sq. Cu 0.06″ thick single sided),
t = 10 seconds.
2. Mounted onto a 2″ square FR–4 Board (1″ sq. Cu 0.06″ thick single sided),
ORDERING INFORMATION
t = steady state.
3. Pulse Test: Pulse Width < 300 ms, Duty Cycle < 2%. Device Package Shipping
This document contains information on a product under development. ON Semiconductor
reserves the right to change or discontinue this product without notice. NTMS10P02R2 SO–8 2500/Tape & Reel
ON CHARACTERISTICS
Gate Threshold Voltage VGS(th) Vdc
(VDS = VGS, ID = –250 µAdc) –0.6 –0.88 –1.20
Temperature Coefficient (Negative) – 2.8 – mV/°C
Static Drain–to–Source On–State Resistance RDS(on) Ω
(VGS = –4.5 Vdc, ID = –10 Adc) – 0.012 0.014
(VGS = –2.5 Vdc, ID = –8.8 Adc) – 0.017 0.020
Forward Transconductance (VDS = –10 Vdc, ID = –10 Adc) gFS – 30 – Mhos
DYNAMIC CHARACTERISTICS
Input Capacitance Ciss – 3100 3640 pF
Output Capacitance (VDS = –16
16 Vdc,
Vd VGS = 0 Vdc,
Vd
Coss – 1100 1670
f = 1.0 MHz)
Reverse Transfer Capacitance Crss – 475 1010
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144
NTMS10P02R2
20 10
–2.3 V –2.1 V
VDS ≥ –10 V
8.0
15 TJ = 25°C
–10 V
–3.1 V 6.0
–1.9 V
10
25°C
4.0
0 0
0 0.25 0.50 0.75 1.00 1.25 1.50 1.75 2.00 0 0.5 1.0 1.5 2.0 2.5
–VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS) –VGS, GATE–TO–SOURCE VOLTAGE (VOLTS)
0.100 0.020
TJ = 25°C VGS = –2.5 V
ID = –10 A
TJ = 25°C
0.075
0.016
0.050
VGS = –4.5 V
0.012
0.025
0 0.008
0 2.0 4.0 6.0 8.0 10 6.0 10 14 18
–VGS, GATE–TO–SOURCE VOLTAGE (VOLTS) –ID, DRAIN CURRENT (AMPS)
<
1.6 10,000
VGS = 0 V
ID = –10 A
1.4 VGS = –4.5 V
1000 TJ = 125°C
1.2
1.0 TJ = 100°C
100
0.8
0.6 10
–50 –25 0 25 50 75 100 125 150 2.0 6.0 10 14 18
TJ, JUNCTION TEMPERATURE (°C) –VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS)
http://onsemi.com
145
NTMS10P02R2
10,000
VGS = 0 V VDS = 0 V
TJ = 25°C
8000 Ciss
C, CAPACITANCE (pF)
6000
Crss
4000
Ciss
2000
Coss
Crss
0
10 5.0 0 5.0 10 15 20
–VGS –VDS
3.0 6.0
Q1 Q2
2.0 4.0
ID = –10 A
1.0 TJ = 25°C 2.0
Q3
0 0
0 10 20 30 40 50
Qg, TOTAL GATE CHARGE (nC)
Figure 8. Gate–To–Source and Drain–To–Source
Voltage versus Total Charge
1000 1000
VDD = –10 V td(off) VDD = –10 V
td(off)
ID = –1.0 A tf ID = –10 A
VGS = –4.5 V VGS = –4.5 V
tr
t, TIME (ns)
t, TIME (ns)
tr tf
100 100
td(on)
td(on)
10 10
1.0 10 100 1.0 10 100
RG, GATE RESISTANCE (OHMS) RG, GATE RESISTANCE (OHMS)
Figure 9. Resistive Switching Time Variation Figure 10. Resistive Switching Time Variation
versus Gate Resistance versus Gate Resistance
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146
NTMS10P02R2
100
2.0
–IS, SOURCE CURRENT (AMPS)
VGS = 0 V
1.2
VGS = 2.5 V 10 ms
SINGLE PULSE
0.8 1.0 TC = 25°C
Figure 11. Diode Forward Voltage versus Current Figure 12. Maximum Rated Forward Biased
Safe Operating Area
di/dt
IS
trr
ta tb
TIME
tp 0.25 IS
IS
10
, EFFECTIVE TRANSIENT
THERMAL RESISTANCE
1.0 D = 0.5
0.2
0.1
0.1
0.05
θ
0.02 2%* 94 Ω 9$# Ω 788 Ω 96 Ω 7$# Ω
0.01
Rthja(t)
0.01
4: . 998 . $$6 . 764: . :#69 .
+%1'
SINGLE PULSE
0.001
1.0E–05 1.0E–04 1.0E–03 1.0E–02 1.0E–01 1.0E+00 1.0E+01 1.0E+02 1.0E+03
t, TIME (s)
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147
NTMS10P02R2
9
$#
#:$ $$
: 6
#6 $
9 #:
inches
mm
SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • The soldering temperature and time shall not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within • When shifting from preheating to soldering, the
a short time could result in device failure. Therefore, the maximum temperature gradient shall be 5°C or less.
following items should always be observed in order to • After soldering has been completed, the device should
minimize the thermal stress to which the devices are be allowed to cool naturally for at least three minutes.
subjected. Gradual cooling should be used as the use of forced
• Always preheat the device. cooling will increase the temperature gradient and
• The delta temperature between the preheat and result in latent failure due to mechanical stress.
soldering should be 100°C or less.* • Mechanical stress or shock should not be applied
• When preheating and soldering, the temperature of the during cooling.
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When * Soldering a device without preheating can cause
using infrared heating with the reflow soldering excessive thermal shock and stress which can result in
method, the difference shall be a maximum of 10°C. damage to the device.
http://onsemi.com
148
NTMS10P02R2
150°C
SOLDER IS LIQUID FOR
40 TO 80 SECONDS
100°C 140°C (DEPENDING ON
MASS OF ASSEMBLY)
100°C
http://onsemi.com
149
!#!
#$%& '(
!- !
P–Channel SO–8
Features
http://onsemi.com
• High Efficiency Components in a Single SO–8 Package
• High Density Power MOSFET with Low RDS(on)
• Miniature SO–8 Surface Mount Package – Saves Board Space –3.05 AMPERES
• Diode Exhibits High Speed with Soft Recovery –30 VOLTS
• IDSS Specified at Elevated Temperature
• Avalanche Energy Specified
0.085 W @ VGS = –10 V
• Mounting Information for the SO–8 Package is Provided
P–Channel
Applications
• DC–DC Converters D
• Low Voltage Motor Control
• Power Management in Portable and Battery–Powered Products, i.e.:
Computers, Printers, PCMCIA Cards, Cellular & Cordless Telephones
G
MOSFET MAXIMUM RATINGS (TJ = 25°C unless otherwise noted)
Rating Symbol Value Unit S
Drain–to–Source Voltage VDSS –30 V
Gate–to–Source Voltage – Continuous VGS ±20 V MARKING
DIAGRAM
Thermal Resistance –
Junction–to–Ambient (Note 1.) RθJA 171 °C/W
Total Power Dissipation @ TA = 25°C PD 0.73 W
SO–8 E3P03
Continuous Drain Current @ 25°C ID –2.34 A
CASE 751 LYWW
Continuous Drain Current @ 70°C ID –1.87 A 8
STYLE 13
Pulsed Drain Current (Note 4.) IDM –8.0 A
Thermal Resistance – 1
Junction–to–Ambient (Note 2.) RθJA 100 °C/W
Total Power Dissipation @ TA = 25°C PD 1.25 W E3P03 = Device Code
Continuous Drain Current @ 25°C ID –3.05 A L = Assembly Location
Continuous Drain Current @ 70°C ID –2.44 A Y = Year
Pulsed Drain Current (Note 4.) IDM –12 A WW = Work Week
Thermal Resistance –
Junction–to–Ambient (Note 3.) RθJA 62.5 °C/W
Total Power Dissipation @ TA = 25°C PD 2.0 W
PIN ASSIGNMENT
Continuous Drain Current @ 25°C ID –3.86 A
N.C. 1 8 Drain
Continuous Drain Current @ 70°C ID –3.1 A
Pulsed Drain Current (Note 4.) IDM –15 A Source 2 7 Drain
Operating and Storage TJ, Tstg –55 to °C Source 3 6 Drain
Temperature Range +150 4 5
Gate Drain
Single Pulse Drain–to–Source Avalanche EAS 140 mJ
Energy – Starting TJ = 25°C Top View
(VDD = –30 Vdc, VGS = –4.5 Vdc, Peak
IL = –7.5 Apk, L = 5 mH, RG = 25 Ω) ORDERING INFORMATION
Maximum Lead Temperature for Soldering TL 260 °C
Purposes, 1/8″ from case for 10 seconds Device Package Shipping
1. Minimum FR–4 or G–10 PCB, t = Steady State. NTMS3P03R2 SO–8 2500/Tape & Reel
2. Mounted onto a 2″ square FR–4 Board (1″ sq. 2 oz Cu 0.06″ thick single
sided), t = steady state.
3. Mounted onto a 2″ square FR–4 Board (1″ sq. 2 oz Cu 0.06″ thick single This document contains information on a product under
sided), t ≤ 10 seconds. development. ON Semiconductor reserves the right to
4. Pulse Test: Pulse Width = 300 ms, Duty Cycle = 2%. change or discontinue this product without notice.
ON CHARACTERISTICS
Gate Threshold Voltage VGS(th) Vdc
(VDS = VGS, ID = –250 µAdc) –1.0 –1.7 –2.5
Temperature Coefficient (Negative) – 3.6 –
Static Drain–to–Source On–State Resistance RDS(on) Ω
(VGS = –10 Vdc, ID = –3.05 Adc) – 0.063 0.085
(VGS = –4.5 Vdc, ID = –1.5 Adc) – 0.090 0.115
Forward Transconductance (VDS = –15 Vdc, ID = –3.05 Adc) gFS – 5.0 – Mhos
DYNAMIC CHARACTERISTICS
Input Capacitance Ciss – 520 750 pF
Output Capacitance (VDS = –24
24 Vdc,
Vd VGS = 0 Vdc,
Vd
Coss – 170 325
f = 1.0 MHz)
Reverse Transfer Capacitance Crss – 70 135
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151
NTMS3P03R2
6 6
VGS = –10 V
VGS = –4.4 V VDS > = –10 V
–ID, DRAIN CURRENT (AMPS)
0 0
0 0.25 0.5 0.75 1 1.25 1.5 1.75 2 1 2 3 4 5
–VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS) –VGS, GATE–TO–SOURCE VOLTAGE (VOLTS)
0.5 0.5
0.4 0.4
0.3 0.3
0.2 0.2
0.1 0.1
0 0
3 4 5 6 7 8 2 3 4 5 6 7
–VGS, GATE–TO–SOURCE VOLTAGE (VOLTS) –VGS, GATE–TO–SOURCE VOLTAGE (VOLTS)
Figure 3. On–Resistance vs. Gate–to–Source Figure 4. On–Resistance vs. Gate–to–Source
Voltage Voltage
RDS(on), DRAIN–TO–SOURCE RESISTANCE (Ω)
0.25 1.6
ID = –3.05 A
TJ = 25°C VGS = –10 V
1.4
0.2 VGS = –4.5 V
(NORMALIZED)
1.2
0.15
1
VGS = –10 V
0.1
0.8
0.05 0.6
1 2 3 4 5 6 –50 –25 0 25 50 75 100 125 150
–ID, DRAIN CURRENT (AMPS) TJ, JUNCTION TEMPERATURE (°C)
Figure 5. On–Resistance vs. Drain Current and Figure 6. On Resistance Variation with
Gate Voltage Temperature
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152
NTMS3P03R2
10000
VGS = 0 V VDS = 0 V VGS = 0 V
1200
Ciss
C, CAPACITANCE (pF)
TJ = 150°C 1000
IDSS, LEAKAGE (nA)
1000
800
100 400
Coss
200
Crss
TJ = 25°C
10 0
6 10 14 18 22 26 30 10 5 0 5 10 15 20 25 30
–VGS –VDS
–VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS) GATE–TO–SOURCE OR DRAIN–TO–SOURCE
VOLTAGE (VOLTS)
Figure 7. Drain–to–Source Leakage Current Figure 8. Capacitance Variation
vs. Voltage
–VGS, GATE–TO–SOURCE VOLTAGE (VOLTS)
12 30 1000
VDS = –24 V
QT ID = –3.05 A
10 25
VGS = –10 V
VDS
8 20 100
td(off)
t, TIME (ns)
VGS
6 15 tf
Q1 tr
4 Q2 10 10
td(on)
2 5
ID = –3.05 A
TJ = 25°C
0 0 1
0 2 4 6 8 10 12 14 16 1 10 100
Qg, TOTAL GATE CHARGE (nC) RG, GATE RESISTANCE (Ω)
1000 3
VDS = –24 V VGS = 0 V
IS, SOURCE CURRENT (AMPS)
ID = –1.5 A TJ = 25°C
2.5
VGS = –4.5 V
2
t, TIME (ns)
100 1.5
tr
td(off)
tf 1
td(on)
0.5
10 0
1 10 100 0.2 0.4 0.6 0.8 1 1.2
RG, GATE RESISTANCE (Ω) –VSD, SOURCE–TO–DRAIN VOLTAGE (VOLTS)
Figure 11. Resistive Switching Time Variation Figure 12. Diode Forward Voltage vs. Current
vs. Gate Resistance
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153
NTMS3P03R2
100
VGS = 12 V
SINGLE PULSE
–ID, DRAIN CURRENT (AMPS)
1.0 ms
TA = 25°C
10
10 ms di/dt
IS
1.0 dc
trr
ta tb
0.1 TIME
RDS(on)
THERMAL LIMIT tp 0.25 IS
PACKAGE LIMIT
0.01 IS
0.1 1.0 10 100
–VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS)
Figure 13. Maximum Rated Forward Biased Figure 14. Diode Reverse Recovery Waveform
Safe Operating Area
1.0
D = 0.5
Rthja(t), EFFECTIVE TRANSIENT
THERMAL RESPONSE
0.2
0.1
0.1
0.05 Chip Normalized to RθJA at Steady State (1″ pad)
Junction 2.32 Ω 18.5 Ω 50.9 Ω 37.1 Ω 56.8 Ω 24.4 Ω
0.02
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154
NTMS3P03R2
9
$#
#:$ $$
: 6
#6 $
9 #:
inches
mm
SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • The soldering temperature and time shall not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within • When shifting from preheating to soldering, the
a short time could result in device failure. Therefore, the maximum temperature gradient shall be 5°C or less.
following items should always be observed in order to • After soldering has been completed, the device should
minimize the thermal stress to which the devices are be allowed to cool naturally for at least three minutes.
subjected. Gradual cooling should be used as the use of forced
• Always preheat the device. cooling will increase the temperature gradient and
• The delta temperature between the preheat and result in latent failure due to mechanical stress.
soldering should be 100°C or less.* • Mechanical stress or shock should not be applied
• When preheating and soldering, the temperature of the during cooling.
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When * Soldering a device without preheating can cause
using infrared heating with the reflow soldering excessive thermal shock and stress which can result in
method, the difference shall be a maximum of 10°C. damage to the device.
http://onsemi.com
155
NTMS3P03R2
150°C
SOLDER IS LIQUID FOR
40 TO 80 SECONDS
100°C 140°C (DEPENDING ON
MASS OF ASSEMBLY)
100°C
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156
#$%& '(
-
N–Channel Enhancement–Mode
Single SO–8 Package
Features
• High Density Power MOSFET with Ultra Low RDS(on) Providing http://onsemi.com
Higher Efficiency
• Miniature SO–8 Surface Mount Package Saving Board Space; 4.2 AMPERES
Mounting Information for the SO–8 Package is Provided
• IDSS Specified at Elevated Temperature 20 VOLTS
• Drain–to–Source Avalanche Energy Specified 0.045 W @ VGS = 4.5 V
• Diode Exhibits High Speed, Soft Recovery
Applications
• Power Management in Portable and Battery–Powered Products, i.e.: Single N–Channel
Computers, Printers, PCMCIA Cards, Cellular & Cordless Telephones D
ON CHARACTERISTICS
Gate Threshold Voltage VGS(th) Vdc
(VDS = VGS, ID = 250 µAdc) 0.6 0.95 1.2
Temperature Coefficient (Negative) – –3.0 – mV/°C
Static Drain–to–Source On–State Resistance RDS(on) Ω
(VGS = 4.5 Vdc, ID = 4.2 Adc) – 0.030 0.04
(VGS = 2.7 Vdc, ID = 2.1 Adc) – 0.035 0.05
(VGS = 2.5 Vdc, ID = 2.0 Adc) – 0.037 –
Forward Transconductance (VDS = 2.5 Vdc, ID = 2.0 Adc) gFS – 10 – Mhos
DYNAMIC CHARACTERISTICS
Input Capacitance Ciss – 870 1200 pF
Output Capacitance (VDS = 10 Vd
Vdc, VGS = 0 Vd
Vdc,
Coss – 260 400
f = 1.0 MHz)
Reverse Transfer Capacitance Crss – 60 100
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158
NTMS4N01R2
7
8V 2.1 V 1.9 V
8 VDS ≥ 10 V
6
ID, DRAIN CURRENT (AMPS)
3 1.7 V 4
100°C
2
2 25°C
1 1.5 V TJ = –55°C
VGS = 1.3 V
0 0
0 0.25 0.5 0.75 1 1.25 1.5 1.75 2 0.5 1 1.5 2 2.5
VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS) VGS, GATE–TO–SOURCE VOLTAGE (VOLTS)
VGS = 2.7 V
0.05 0.03
VGS = 4.5 V
0.04
0.02
0.03
0.02 0.01
0 2 4 6 8 0 2 4 6 8 10
VGS, GATE–TO–SOURCE VOLTAGE (VOLTS) ID, DRAIN CURRENT (AMPS)
1.6 10,000
VGS = 0 V
ID = 4.2 A
1.4 VGS = 4.5 V
IDSS, LEAKAGE (nA)
TJ = 150°C
1.2
1000
1
TJ = 125°C
0.8
0.6 100
–50 –25 0 25 50 75 100 125 150 2 4 6 8 10 12 14 16 18 20
TJ, JUNCTION TEMPERATURE (°C) VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS)
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159
NTMS4N01R2
2500
VDS = 0 V VGS = 0 V
Ciss TJ = 25°C
2000
C, CAPACITANCE (pF)
1500
Crss
1000
Ciss
500
Coss
Crss
0
8 6 4 2 0 2 4 6 8 10 12
VGS VDS
5 20
4 VGS 16
VDS
3 12
Q1 Q2
2 8
ID = 4.2 A
1 TJ = 25°C 4
0 0
0 2 4 6 8 10 12
Qg, TOTAL GATE CHARGE (nC)
Figure 8. Gate–To–Source and Drain–To–Source
Voltage versus Total Charge
1000 1000
VDD = 10 V VDD = 10 V
ID = 4.2 A ID = 2.1 A
VGS = 4.5 V VGS = 4.5 V
t, TIME (ns)
t, TIME (ns)
td(off) tf
100 tf 100
td(off)
tr
tr
td(on) td(on)
10 10
1 10 100 1 10 100
RG, GATE RESISTANCE (OHMS) RG, GATE RESISTANCE (OHMS)
Figure 9. Resistive Switching Time Variation Figure 10. Resistive Switching Time Variation
versus Gate Resistance versus Gate Resistance
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160
NTMS4N01R2
4 100
VGS = 20 V
VGS = 0 V
IS, SOURCE CURRENT (AMPS)
10 ms
2 1
RDS(on) LIMIT
THERMAL LIMIT
PACKAGE LIMIT dc
1 0.1
Mounted on 2″ sq. FR4 board (1″ sq. 2 oz.
Cu 0.06″ thick single sided), 10s max.
0 0.01
0.3 0.4 0.5 0.6 0.7 0.8 0.9 0.1 1 10 100
VSD, SOURCE–TO–DRAIN VOLTAGE (VOLTS) VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS)
Figure 11. Diode Forward Voltage versus Current Figure 12. Maximum Rated Forward Biased
Safe Operating Area
di/dt
IS
trr
ta tb
TIME
tp 0.25 IS
IS
10
Rthja(t), EFFECTIVE TRANSIENT
THERMAL RESISTANCE
1
D = 0.5
0.2
0.1
0.1
0.05
θ
0.02 2%* ## Ω # Ω #$8: Ω :#4 Ω 9894 Ω
0.01
0.01
# . #: . 4$: . 464 . 866 .
+%1'
SINGLE PULSE
0.001
1.0E–05 1.0E–04 1.0E–03 1.0E–02 1.0E–01 1.0E+00 1.0E+01 1.0E+02 1.0E+03
t, TIME (s)
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161
NTMS4N01R2
9
$#
#:$ $$
: 6
#6 $
9 #:
inches
mm
SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • The soldering temperature and time shall not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within • When shifting from preheating to soldering, the
a short time could result in device failure. Therefore, the maximum temperature gradient shall be 5°C or less.
following items should always be observed in order to • After soldering has been completed, the device should
minimize the thermal stress to which the devices are be allowed to cool naturally for at least three minutes.
subjected. Gradual cooling should be used as the use of forced
• Always preheat the device. cooling will increase the temperature gradient and
• The delta temperature between the preheat and result in latent failure due to mechanical stress.
soldering should be 100°C or less.* • Mechanical stress or shock should not be applied
• When preheating and soldering, the temperature of the during cooling.
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When * Soldering a device without preheating can cause
using infrared heating with the reflow soldering excessive thermal shock and stress which can result in
method, the difference shall be a maximum of 10°C. damage to the device.
http://onsemi.com
162
NTMS4N01R2
150°C
SOLDER IS LIQUID FOR
40 TO 80 SECONDS
100°C 140°C (DEPENDING ON
MASS OF ASSEMBLY)
100°C
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163
#
#$%& '(
-
P–Channel Enhancement–Mode
Single SO–8 Package http://onsemi.com
Features
• High Density Power MOSFET with Ultra Low RDS(on)
Providing Higher Efficiency –4.5 AMPERES
• Miniature SO–8 Surface Mount Package – Saves Board Space –12 VOLTS
• Diode Exhibits High Speed with Soft Recovery
0.045 W @ VGS = –4.5 V
• IDSS Specified at Elevated Temperature
• Drain–to–Source Avalanche Energy Specified
• Mounting Information for the SO–8 Package is Provided Single P–Channel
Applications D
• Power Management in Portable and Battery–Powered Products, i.e.:
Computers, Printers, PCMCIA Cards, Cellular & Cordless Telephones
MAXIMUM RATINGS G
1
SO–8
CASE 751
STYLE 13
MARKING DIAGRAM
& PIN ASSIGNMENT
1 8
N.C. Drain
2 7
Source E4P01 Drain
3 LYWW 6
Source Drain
4 5
Gate Drain
Top View
ORDERING INFORMATION
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165
NTMS4P01R2
ON CHARACTERISTICS
Gate Threshold Voltage VGS(th) Vdc
(VDS = VGS, ID = –250 µAdc) –0.65 –0.9 –1.15
Temperature Coefficient (Negative) – 2.9 – mV/°C
Static Drain–to–Source On–State Resistance RDS(on) Ω
(VGS = –4.5 Vdc, ID = –4.5 Adc) – 0.030 0.045
(VGS = –2.7 Vdc, ID = –2.25 Adc) – 0.040 0.055
(VGS = –2.5 Vdc, ID = –2.25 Adc) – 0.045 –
Forward Transconductance (VDS = –2.5 Vdc, ID = –2.25 Adc) gFS – 10 – Mhos
DYNAMIC CHARACTERISTICS
Input Capacitance Ciss – 1435 1850 pF
Output Capacitance (VDS = –9.6
9 6 Vdc,
Vd VGS = 0 Vdc,
Vd
Coss – 635 1000
f = 1.0 MHz)
Reverse Transfer Capacitance Crss – 210 400
SWITCHING CHARACTERISTICS (Notes 6. & 7.)
Turn–On Delay Time td(on) – 20 35 ns
Rise Time (VDD = –12 Vdc, ID = –4.5 Adc, tr – 60 100
VGS = –4.5
4 5 Vdc,
Vdc
Turn–Off Delay Time RG = 6.0 Ω) td(off) – 65 100
Fall Time tf – 75 125
Total Gate Charge Qtot – 20 35 nC
(VDS = –9.6 Vdc,
Gate–Source Charge VGS = –4.5 Vdc, Qgs – 4.0 –
ID = –4.5
4 5 Ad
Adc))
Gate–Drain Charge Qgd – 7.0 –
BODY–DRAIN DIODE RATINGS (Note 6.)
Diode Forward On–Voltage (IS = –4.5 Adc, VGS = 0 V) VSD – –0.9 –1.25 Vdc
(IS = –4.5 Adc, VGS = 0 Vdc, TJ = 125°C) – –0.7 –
Reverse Recovery Time trr – 38 – ns
(IS = –4.5
4 5 Adc,
Ad VGS = 0 Vdc,
Vd
ta – 20 –
dIS/dt = 100 A/µs)
tb – 18 –
Reverse Recovery Stored Charge QRR – 0.03 – µC
5. Handling precautions to protect against electrostatic discharge is mandatory.
6. Indicates Pulse Test: Pulse Width = 300 µs max, Duty Cycle = 2%.
7. Switching characteristics are independent of operating junction temperature.
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166
NTMS4P01R2
8 –8 V
–2.3 V –2.1 V
TJ = 25°C VDS ≥ –10 V
7 8
–ID, DRAIN CURRENT (AMPS)
4
–2.5 V 4
3 100°C
–1.7 V
2 25°C
2
1 TJ = –55°C
VGS = –1.3 V
0 0
0 0.25 0.5 0.75 1 1.25 1.5 1.75 2 0.5 1 1.5 2 2.5
–VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS) –VGS, GATE–TO–SOURCE VOLTAGE (VOLTS)
VGS = –2.7 V
0.06 0.03
VGS = –4.5 V
0.03 0.02
0 0.01
0 2 4 6 8 2 4 6 8
–VGS, GATE–TO–SOURCE VOLTAGE (VOLTS) –ID, DRAIN CURRENT (AMPS)
1.6 10,000
VGS = 0 V
ID = –4.5 A
1.4
VGS = –4.5 V TJ = 150°C
–IDSS, LEAKAGE (nA)
1.2
1000
1
TJ = 125°C
0.8
0.6 100
–50 –25 0 25 50 75 100 125 150 2 4 6 8 10 12
TJ, JUNCTION TEMPERATURE (°C) –VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS)
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NTMS4P01R2
–VDS –VGS
3000
3 Q1 Q2 6
Crss
2000
Ciss 2 4
1000 ID = –4.5 A
Coss 1 2
TJ = 25°C
Crss
0 0 0
10 8 6 4 2 0 2 4 6 8 10 12 0 4 8 12 16 20 24
–VGS –VDS Qg, TOTAL GATE CHARGE (nC)
tr
100 2
td(on)
1
10 0
1 10 100 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9 1
RG, GATE RESISTANCE (OHMS) –VSD, SOURCE–TO–DRAIN VOLTAGE (VOLTS)
Figure 9. Resistive Switching Time Variation Figure 10. Diode Forward Voltage versus Current
versus Gate Resistance
SINGLE PULSE
TC = 25°C
10 1.0 ms
10 ms
di/dt
1 IS
RDS(on) LIMIT
THERMAL LIMIT trr
dc
PACKAGE LIMIT ta tb
0.1
Mounted on 2″ sq. FR4 board TIME
(1″ sq. 2 oz. Cu 0.06″ thick
single sided), 10s max. tp 0.25 IS
0.01
0.1 1 10 100 IS
VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS)
Figure 11. Maximum Rated Forward Biased Figure 12. Diode Reverse Recovery Waveform
Safe Operating Area
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168
NTMS4P01R2
10
Rthja(t), EFFECTIVE TRANSIENT
THERMAL RESISTANCE
1
D = 0.5
0.2
0.1
0.1
0.05
θ
0.02 2%* 94 Ω 9$# Ω 788 Ω 96 Ω 7$# Ω
0.01
0.01
4: . 998 . $$6 . 764: . :#69 .
+%1'
SINGLE PULSE
0.001
1.0E–05 1.0E–04 1.0E–03 1.0E–02 1.0E–01 1.0E+00 1.0E+01 1.0E+02 1.0E+03
t, TIME (s)
9
$#
#:$ $$
: 6
SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • The soldering temperature and time shall not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within • When shifting from preheating to soldering, the
a short time could result in device failure. Therefore, the maximum temperature gradient shall be 5°C or less.
following items should always be observed in order to • After soldering has been completed, the device should
minimize the thermal stress to which the devices are be allowed to cool naturally for at least three minutes.
subjected. Gradual cooling should be used as the use of forced
• Always preheat the device. cooling will increase the temperature gradient and
• The delta temperature between the preheat and result in latent failure due to mechanical stress.
soldering should be 100°C or less.* • Mechanical stress or shock should not be applied
• When preheating and soldering, the temperature of the during cooling.
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When * Soldering a device without preheating can cause
using infrared heating with the reflow soldering excessive thermal shock and stress which can result in
method, the difference shall be a maximum of 10°C. damage to the device.
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169
NTMS4P01R2
150°C
SOLDER IS LIQUID FOR
40 TO 80 SECONDS
100°C 140°C (DEPENDING ON
MASS OF ASSEMBLY)
100°C
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170
#
#$%& '(
-
P–Channel Enhancement–Mode
Single SO–8 Package http://onsemi.com
Features
• High Density Power MOSFET with Ultra Low RDS(on)
Providing Higher Efficiency –5.4 AMPERES
• Miniature SO–8 Surface Mount Package – Saves Board Space –20 VOLTS
• Diode Exhibits High Speed with Soft Recovery
0.033 W @ VGS = –4.5 V
• IDSS Specified at Elevated Temperature
• Drain–to–Source Avalanche Energy Specified
• Mounting Information for the SO–8 Package is Provided Single P–Channel
Applications D
• Power Management in Portable and Battery–Powered Products, i.e.:
Computers, Printers, PCMCIA Cards, Cellular & Cordless Telephones
MAXIMUM RATINGS G
1
SO–8
CASE 751
STYLE 13
MARKING DIAGRAM
& PIN ASSIGNMENT
1 8
N.C. Drain
2 7
Source E5P02 Drain
3 LYWW 6
Source Drain
4 5
Gate Drain
Top View
ORDERING INFORMATION
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172
NTMS5P02R2
ON CHARACTERISTICS
Gate Threshold Voltage VGS(th) Vdc
(VDS = VGS, ID = –250 µAdc) –0.65 –0.9 –1.25
Temperature Coefficient (Negative) – 2.9 – mV/°C
Static Drain–to–Source On–State Resistance RDS(on) Ω
(VGS = –4.5 Vdc, ID = –5.4 Adc) – 0.026 0.033
(VGS = –2.5 Vdc, ID = –2.7 Adc) – 0.037 0.048
Forward Transconductance (VDS = –9.0 Vdc, ID = –5.4 Adc) gFS – 15 – Mhos
DYNAMIC CHARACTERISTICS
Input Capacitance Ciss – 1375 1900 pF
Output Capacitance (VDS = –16
16 Vdc,
Vd VGS = 0 Vdc,
Vd
Coss – 510 900
f = 1.0 MHz)
Reverse Transfer Capacitance Crss – 200 380
SWITCHING CHARACTERISTICS (Notes 6. & 7.)
Turn–On Delay Time td(on) – 18 35 ns
Rise Time (VDD = –16 Vdc, ID = –1.0 Adc, tr – 25 50
VGS = –4.5
4 5 Vdc,
Vdc
Turn–Off Delay Time RG = 6.0 Ω) td(off) – 70 125
Fall Time tf – 55 100
Turn–On Delay Time td(on) – 22 – ns
Rise Time (VDD = –16 Vdc, ID = –5.4 Adc, tr – 70 –
VGS = –4.5
4 5 Vdc,
Vdc
Turn–Off Delay Time RG = 6.0 Ω) td(off) – 65 –
Fall Time tf – 90 –
Total Gate Charge Qtot – 20 35 nC
(VDS = –16 Vdc,
Gate–Source Charge VGS = –4.5 Vdc, Qgs – 4.0 –
ID = –5.4
5 4 Ad
Adc))
Gate–Drain Charge Qgd – 7.0 –
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173
NTMS5P02R2
12 12
–8 V –2.3 V
TJ = 25°C VDS ≥ –10 V
–ID, DRAIN CURRENT (AMPS)
–2.7 V
6 –2.5 V 6
–1.9 V 100°C
4 4
25°C TJ = –55°C
–1.7 V
2 2
VGS = –1.3 V
0 0
0 0.25 0.5 0.75 1 1.25 1.5 1.75 2 1 1.5 2 2.5 3
–VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS) –VGS, GATE–TO–SOURCE VOLTAGE (VOLTS)
VGS = –2.7 V
0.04 0.03
VGS = –4.5 V
0.02 0.02
0 0.01
0 2 4 6 8 10 2 4 6 8 10 12
–VGS, GATE–TO–SOURCE VOLTAGE (VOLTS) –ID, DRAIN CURRENT (AMPS)
1.6 10,000
VGS = 0 V
ID = –5.4 A
1.4 TJ = 150°C
VGS = –4.5 V
–IDSS, LEAKAGE (nA)
1.2
1000
1 TJ = 125°C
0.8
0.6 100
–50 –25 0 25 50 75 100 125 150 2 4 6 8 10 12 14 16 18 20
TJ, JUNCTION TEMPERATURE (°C) –VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS)
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174
NTMS5P02R2
–VDS
3000
3 Q1 Q2 12
Crss
2000
2 8
Ciss
ID = –5.4 A
1000 TJ = 25°C
1 4
Coss
Crss
0 0 0
10 5 0 5 10 15 20 0 4 8 12 16 20 24
–VGS –VDS Qg, TOTAL GATE CHARGE (nC)
tr
3
100
2
td(on)
1
10 0
1 10 100 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9 1
RG, GATE RESISTANCE (OHMS) –VSD, SOURCE–TO–DRAIN VOLTAGE (VOLTS)
Figure 9. Resistive Switching Time Variation Figure 10. Diode Forward Voltage versus Current
versus Gate Resistance
SINGLE PULSE
TC = 25°C 1 ms
10
di/dt
IS
10 ms
trr
1
ta tb
RDS(on) LIMIT TIME
THERMAL LIMIT
PACKAGE LIMIT dc tp 0.25 IS
0.1
0.1 1 10 100 IS
VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS)
Figure 11. Maximum Rated Forward Biased Figure 12. Diode Reverse Recovery Waveform
Safe Operating Area
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175
NTMS5P02R2
10
Rthja(t), EFFECTIVE TRANSIENT
THERMAL RESISTANCE
1
D = 0.5
0.2
0.1
0.1
0.05
θ
0.02 2%* 94 Ω 9$# Ω 788 Ω 96 Ω 7$# Ω
0.01
0.01
4: . 998 . $$6 . 764: . :#69 .
+%1'
SINGLE PULSE
0.001
1.0E–05 1.0E–04 1.0E–03 1.0E–02 1.0E–01 1.0E+00 1.0E+01 1.0E+02 1.0E+03
t, TIME (s)
9
$#
#:$ $$
: 6
SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • The soldering temperature and time shall not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within • When shifting from preheating to soldering, the
a short time could result in device failure. Therefore, the maximum temperature gradient shall be 5°C or less.
following items should always be observed in order to • After soldering has been completed, the device should
minimize the thermal stress to which the devices are be allowed to cool naturally for at least three minutes.
subjected. Gradual cooling should be used as the use of forced
• Always preheat the device. cooling will increase the temperature gradient and
• The delta temperature between the preheat and result in latent failure due to mechanical stress.
soldering should be 100°C or less.* • Mechanical stress or shock should not be applied
• When preheating and soldering, the temperature of the during cooling.
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When * Soldering a device without preheating can cause
using infrared heating with the reflow soldering excessive thermal shock and stress which can result in
method, the difference shall be a maximum of 10°C. damage to the device.
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176
NTMS5P02R2
150°C
SOLDER IS LIQUID FOR
40 TO 80 SECONDS
100°C 140°C (DEPENDING ON
MASS OF ASSEMBLY)
100°C
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177
#
(45
Power MOSFET and Schottky Diode
Dual SO–8 Package
Features
• High Efficiency Components in a Single SO–8 Package http://onsemi.com
• High Density Power MOSFET with Low RDS(on),
Schottky Diode with Low VF
MOSFET
• Logic Level Gate Drive
• Independent Pin–Outs for MOSFET and Schottky Die –2.3 AMPERES
Allowing for Flexibility in Application Use –20 VOLTS
• Less Component Placement for Board Space Savings 90 mW @ VGS = –4.5 V
• SO–8 Surface Mount Package,
Mounting Information for SO–8 Package Provided
Applications
• Power Management in Portable and Battery–Powered Products, i.e.: SCHOTTKY DIODE
Computers, Printers, PCMCIA Cards, Cellular and Cordless Telephones
2.0 AMPERES
MOSFET MAXIMUM RATINGS (TJ = 25°C unless otherwise noted) 20 VOLTS
Rating Symbol Value Unit
580 mV @ IF = 2.0 A
Drain–to–Source Voltage VDSS –20 V
Gate–to–Source Voltage – Continuous VGS "10 V
Thermal Resistance – Junction–to–Ambient
(Note 1.) RθJA 175 °C/W 8
Total Power Dissipation @ TA = 25°C PD 0.71 W
Continuous Drain Current @ TA = 25°C ID –2.3 A 8 # :
Continuous Drain Current @ TA = 100°C ID –1.45 A 9
Pulsed Drain Current (Note 4.) IDM –9.0 A 1
4
Thermal Resistance – Junction–to–Ambient SO–8
6 $
(Note 2.) RθJA 105 °C/W CASE 751
Total Power Dissipation @ TA = 25°C PD 1.19 W STYLE 18 /
Continuous Drain Current @ TA = 25°C ID –2.97 A
Continuous Drain Current @ TA = 100°C ID –1.88 A
Pulsed Drain Current (Note 4.) IDM –12 A
MARKING DIAGRAM
Thermal Resistance – Junction–to–Ambient & PIN ASSIGNMENTS
(Note 3.) RθJA 62.5 °C/W
Total Power Dissipation @ TA = 25°C PD 2.0 W 1 8
Continuous Drain Current @ TA = 25°C ID –3.85 A Anode Cathode
2 7
Continuous Drain Current @ TA = 100°C ID –2.43 A Anode E2P102 Cathode
Pulsed Drain Current (Note 4.) IDM –15 A 3 6
Source LYWW Drain
Operating and Storage TJ, Tstg –55 to °C 4 5
Gate Drain
Temperature Range +150
(Top View)
Single Pulse Drain–to–Source Avalanche EAS 350 mJ
Energy – Starting TJ = 25°C E2P102 = Device Code
(VDD = –20 Vdc, VGS = –4.5 Vdc, Peak IL L = Assembly Location
= –5.0 Apk, L = 28 mH, RG = 25 Ω) Y = Year
Maximum Lead Temperature for Soldering TL 260 °C WW = Work Week
Purposes, 1/8″ from case for 10 seconds
1. Minimum FR–4 or G–10 PCB, Steady State.
2. Mounted onto a 2″ square FR–4 Board (1″ sq. 2 oz Cu 0.06″ thick single ORDERING INFORMATION
sided), Steady State.
3. Mounted onto a 2″ square FR–4 Board (1″ sq. 2 oz Cu 0.06″ thick single Device Package Shipping
sided), t ≤ 10 seconds.
4. Pulse Test: Pulse Width = 300 ms, Duty Cycle = 2%. NTMSD2P102LR2 SO–8 2500/Tape & Reel
This document contains information on a product under development. ON Semiconductor
reserves the right to change or discontinue this product without notice.
ON CHARACTERISTICS
Gate Threshold Voltage VGS(th) Vdc
(VDS = VGS, ID = –250 µAdc) –0.5 –0.90 –1.5
Temperature Coefficient (Negative) – 2.5 – mV/°C
Static Drain–to–Source On–State Resistance RDS(on) Ω
(VGS = –4.5 Vdc, ID = –2.4 Adc) – 0.070 0.090
(VGS = –2.7 Vdc, ID = –1.2 Adc) – 0.100 0.130
(VGS = –2.5 Vdc, ID = –1.2 Adc) – 0.110 0.150
Forward Transconductance gFS Mhos
(VDS = –10 Vdc, ID = –1.2 Adc) – 4.2 –
DYNAMIC CHARACTERISTICS
Input Capacitance Ciss – 550 750 pF
Output Capacitance (VDS = –16
16 Vdc,
Vd VGS = 0 Vdc,
Vd
Coss – 200 300
f = 1.0 MHz)
Reverse Transfer Capacitance Crss – 100 175
5. Mounted onto a 2″ square FR–4 Board (1″ sq. 2 oz Cu 0.06″ thick single sided), t ≤ 10 seconds.
6. Handling precautions to protect against electrostatic discharge is mandatory.
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NTMSD2P102LR2
ELECTRICAL CHARACTERISTICS (TJ = 25°C unless otherwise noted) (continued) (Note 7.)
Characteristic Symbol Min Typ Max Unit
SWITCHING CHARACTERISTICS (Notes 8. & 9.)
Turn–On Delay Time td(on) – 10 20 ns
Rise Time (VDD = –10 Vdc, ID = –2.4 Adc, tr – 35 65
4 5 Vdc,
VGS = –4.5 Vdc
Turn–Off Delay Time RG = 6.0 Ω) td(off) – 33 60
Fall Time tf – 29 55
Turn–On Delay Time td(on) – 15 – ns
Rise Time (VDD = –10 Vdc, ID = –1.2 Adc, tr – 40 –
VGS = –2.7
2 7 Vdc,
Vdc
Turn–Off Delay Time RG = 6.0 Ω) td(off) – 35 –
Fall Time tf – 35 –
Total Gate Charge Qtot – 10 18 nC
(VDS = –16 Vdc,
Gate–Source Charge VGS = –4.5 Vdc, Qgs – 1.5 –
ID = –2.4
2 4 Ad
Adc))
Gate–Drain Charge Qgd – 5.0 –
SCHOTTKY RECTIFIER ELECTRICAL CHARACTERISTICS (TJ = 25°C unless otherwise noted) (Note 8.)
g
Maximum Instantaneous Forward Voltage VF TJ = 25°C TJ = 125°C Volts
IF = 1.0
1 0 Ad
Adc
0.47 0.39
IF = 2.0 Adc
0.58 0.53
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180
NTMSD2P102LR2
4 5
VGS = –2.1 V TJ = 25°C
VDS > = –10 V
–ID, DRAIN CURRENT (AMPS)
1
VGS = –1.5 V 1
TJ = 100°C
TJ = 55°C
0 0
0 2 4 6 8 10 1 1.5 2 2.5 3
–VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS) –VGS, GATE–TO–SOURCE VOLTAGE (VOLTS)
0.15 0.1
VGS = –2.7 V
0.1 0.08
VGS = –4.5 V
0.05 0.06
0 0.04
2 4 6 8 1 1.5 2 2.5 3 3.5 4 4.5
–VGS, GATE–TO–SOURCE VOLTAGE (VOLTS) –ID, DRAIN CURRENT (AMPS)
Figure 3. On–Resistance vs. Gate–to–Source Figure 4. On–Resistance vs. Drain Current and
Voltage. Gate Voltage.
1.6 1000
ID = –2.4 A VGS = 0 V
RDS(on), DRAIN–TO–SOURCE
1.4 100
–IDSS, LEAKAGE (nA)
TJ = 100°C
1.2 10
TJ = 25°C
1 1
0.8 0.1
0.6 0.01
–50 –25 0 25 50 75 100 125 150 0 4 8 12 16 20
TJ, JUNCTION TEMPERATURE (°C) –VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS)
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181
NTMSD2P102LR2
14
900 3 VGS 12
Crss
Q1 10
Q2
600 Ciss 2 8
6
300 ID = –2.4 A
Coss 1 VDS 4
TJ = 25°C
Crss 2
0 0 0
10 5 0 5 10 15 20 0 2 4 6 8 10 12 14
–VGS –VDS Qg, TOTAL GATE CHARGE (nC)
GATE–TO–SOURCE OR DRAIN–TO–SOURCE
Figure 8. Gate–to–Source and
VOLTAGE (VOLTS) Drain–to–Source Voltage versus Total Charge
Figure 7. Capacitance Variation
1000 100
VDD = –10 V td (off)
ID = –1.2 A
VGS = –2.7 V tr tf
t, TIME (ns)
t, TIME (ns)
td
100 10 (on)
tr
tf
td (off) VDD = –10 V
ID = –2.4 A
VGS = –4.5 V
td (on)
10 1.0
1.0 10 100 1.0 10 100
RG, GATE RESISTANCE (OHMS) RG, GATE RESISTANCE (OHMS)
Figure 9. Resistive Switching Time Variation Figure 10. Resistive Switching Time Variation
versus Gate Resistance versus Gate Resistance
2
–IS, SOURCE CURRENT (AMPS)
VGS = 0 V
TJ = 25°C di/dt
1.6
IS
trr
1.2
ta tb
TIME
0.8
tp 0.25 IS
0.4 IS
0
0.4 0.5 0.6 0.7 0.8 0.9 1 Figure 12. Diode Reverse Recovery Waveform
–VSD, SOURCE–TO–DRAIN VOLTAGE (VOLTS)
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182
NTMSD2P102LR2
D = 0.5
0.2
0.05
0.02
Single Pulse
0.01
1E–03 1E–02 1E–01 1E+00 1E+03 1E+02 1E+03
t, TIME (s)
10 10
IF, INSTANTANEOUS FORWARD
TJ = 125°C
CURRENT (AMPS)
CURRENT (AMPS)
TJ = 125°C
85°C
1.0 1.0
85°C 25°C
25°C
–40°C
0.1 0.1
0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9 1.0 0 0.2 0.4 0.6 0.8 1.0 1.2 1.4
VF, INSTANTANEOUS FORWARD VOLTAGE (VOLTS) VF, MAXIMUM INSTANTANEOUS
FORWARD VOLTAGE (VOLTS)
Figure 14. Typical Forward Voltage Figure 15. Maximum Forward Voltage
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183
NTMSD2P102LR2
1E–2
TJ = 125°C
TJ = 125°C
1E–3 1E–2
85°C
1E–4 1E–3
1E–5 1E–4
25°C
25°C
1E–6 1E–5
1E–7 1E–6
0 5.0 10 15 20 0 5.0 10 15 20
VR, REVERSE VOLTAGE (VOLTS) VR, REVERSE VOLTAGE (VOLTS)
Figure 16. Typical Reverse Current Figure 17. Maximum Reverse Current
1.0
Ipk/Io = p
100 0.8
Ipk/Io = 5.0
0.6
Ipk/Io = 10
0.4
Ipk/Io = 20
0.2
10 0
0 5.0 10 15 20 0 20 40 60 80 100 120 140 160
VR, REVERSE VOLTAGE (VOLTS) TA, AMBIENT TEMPERATURE (°C)
0.7
SQUARE dc
0.6 WAVE
Ipk/Io = p
0.5
Ipk/Io = 5.0
0.4 Ipk/Io = 10
Ipk/Io = 20
0.3
0.2
0.1
0
0 0.5 1.0 1.5 2.0
IO, AVERAGE FORWARD CURRENT (AMPS)
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184
NTMSD2P102LR2
1.0
D = 0.5
Rthja(t), EFFECTIVE TRANSIENT
0.2
THERMAL RESISTANCE
0.1
0.1
0.05 NORMALIZED TO RqJA AT STEADY STATE (1″ PAD)
0.02
0.01 4 W $6 W $# W 6$:$ W 4:7 W
0.01 ,
6 . 8# . $# . #:6 . $896 .
SINGLE PULSE
=
0.001
1.0E–05 1.0E–04 1.0E–03 1.0E–02 1.0E–01 1.0E+00 1.0E+01 1.0E+02 1.0E+03
t, TIME (s)
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185
NTMSD2P102LR2
9
$#
#:$ $$
: 6
inches
mm
#6 $
9 #:
SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • The soldering temperature and time shall not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within • When shifting from preheating to soldering, the
a short time could result in device failure. Therefore, the maximum temperature gradient shall be 5°C or less.
following items should always be observed in order to • After soldering has been completed, the device should
minimize the thermal stress to which the devices are be allowed to cool naturally for at least three minutes.
subjected. Gradual cooling should be used as the use of forced
• Always preheat the device. cooling will increase the temperature gradient and
• The delta temperature between the preheat and result in latent failure due to mechanical stress.
soldering should be 100°C or less.* • Mechanical stress or shock should not be applied
• When preheating and soldering, the temperature of the during cooling.
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When * Soldering a device without preheating can cause
using infrared heating with the reflow soldering excessive thermal shock and stress which can result in
method, the difference shall be a maximum of 10°C. damage to the device.
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186
NTMSD2P102LR2
150°C
SOLDER IS LIQUID FOR
40 TO 80 SECONDS
100°C 140°C (DEPENDING ON
MASS OF ASSEMBLY)
100°C
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(45
P–Channel Enhancement–Mode
Power MOSFET and Schottky Diode
Dual SO–8 Package
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Features
• High Efficiency Components in a Single SO–8 Package
• High Density Power MOSFET with Low RDS(on), MOSFET
Schottky Diode with Low VF –3.05 AMPERES
• Independent Pin–Outs for MOSFET and Schottky Die
Allowing for Flexibility in Application Use –20 VOLTS
• Less Component Placement for Board Space Savings 0.085 W @ VGS = –10 V
• SO–8 Surface Mount Package,
Mounting Information for SO–8 Package Provided
Applications SCHOTTKY DIODE
• DC–DC Converters 1.0 AMPERES
• Low Voltage Motor Control
20 VOLTS
• Power Management in Portable and Battery–Powered Products, i.e.:
Computers, Printers, PCMCIA Cards, Cellular and Cordless Telephones 470 mV @ IF = 1.0 A
MOSFET MAXIMUM RATINGS (TJ = 25°C unless otherwise noted)
Rating Symbol Value Unit 8
Drain–to–Source Voltage VDSS –20 V 8 # :
Gate–to–Source Voltage – Continuous VGS "20 V 9
1
Thermal Resistance – 4
Junction–to–Ambient (Note 1.) RθJA 171 °C/W
SO–8 6 $
Total Power Dissipation @ TA = 25°C PD 0.73 W
CASE 751
Continuous Drain Current @ TA = 25°C ID –2.34 A /
STYLE 18
Continuous Drain Current @ TA = 70°C ID –1.87 A
Pulsed Drain Current (Note 4.) IDM –8.0 A
Thermal Resistance – MARKING DIAGRAM
Junction–to–Ambient (Note 2.) RθJA 100 °C/W & PIN ASSIGNMENTS
Total Power Dissipation @ TA = 25°C PD 1.25 W
1 8
Continuous Drain Current @ TA = 25°C ID –3.05 A Anode Cathode
Continuous Drain Current @ TA = 70°C ID –2.44 A 2 7
Anode E3P102 Cathode
Pulsed Drain Current (Note 4.) IDM –12 A 3 6
Source LYWW Drain
Thermal Resistance – 4 5
Junction–to–Ambient (Note 3.) RθJA 62.5 °C/W Gate Drain
Total Power Dissipation @ TA = 25°C PD 2.0 W (Top View)
Continuous Drain Current @ TA = 25°C ID –3.86 A
Continuous Drain Current @ TA = 70°C ID –3.10 A E3P102 = Device Code
Pulsed Drain Current (Note 4.) IDM –15 A L = Assembly Location
Operating and Storage TJ, Tstg –55 to °C Y = Year
Temperature Range +150 WW = Work Week
Single Pulse Drain–to–Source Avalanche EAS 140 mJ
Energy – Starting TJ = 25°C (VDD = ORDERING INFORMATION
–20 Vdc, VGS = –4.5 Vdc, Peak IL =
–7.5 Apk, L = 5 mH, RG = 25 Ω) Device Package Shipping
Maximum Lead Temperature for Soldering TL 260 °C
Purposes, 1/8″ from case for 10 seconds NTMSD3P102R2 SO–8 2500/Tape & Reel
1. Minimum FR–4 or G–10 PCB, Steady State.
2. Mounted onto a 2″ square FR–4 Board (1″ sq. 2 oz Cu 0.06″ thick single sided), Steady State.
3. Mounted onto a 2″ square FR–4 Board (1″ sq. 2 oz Cu 0.06″ thick single sided), t ≤ 10 seconds.
4. Pulse Test: Pulse Width = 300 ms, Duty Cycle = 2%.
This document contains information on a product under development. ON Semiconductor reserves the right to change or discontinue this product without notice.
ON CHARACTERISTICS
Gate Threshold Voltage VGS(th) Vdc
(VDS = VGS, ID = –250 µAdc) –1.0 –1.7 –2.5
Temperature Coefficient (Negative) – 3.6 –
Static Drain–to–Source On–State Resistance RDS(on) Ω
(VGS = –10 Vdc, ID = –3.05 Adc) – 0.063 0.085
(VGS = –4.5 Vdc, ID = –1.5 Adc) – 0.090 0.125
Forward Transconductance gFS Mhos
(VDS = –15 Vdc, ID = –3.05 Adc) – 5.0 –
DYNAMIC CHARACTERISTICS
Input Capacitance Ciss – 518 750 pF
Output Capacitance (VDS = –16
16 Vdc,
Vd VGS = 0 Vdc,
Vd
Coss – 190 350
f = 1.0 MHz)
Reverse Transfer Capacitance Crss – 70 135
5. Minimum FR–4 or G–10 PCB, Steady State.
6. Mounted onto a 2″ square FR–4 Board (1″ sq. 2 oz Cu 0.06″ thick single sided), Steady State.
7. Mounted onto a 2″ square FR–4 Board (1″ sq. 2 oz Cu 0.06″ thick single sided), t ≤ 10 seconds.
8. Handling precautions to protect against electrostatic discharge is mandatory.
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189
NTMSD3P102R2
SCHOTTKY RECTIFIER ELECTRICAL CHARACTERISTICS (TJ = 25°C unless otherwise noted) (Note 10.)
g
Maximum Instantaneous Forward Voltage VF TJ = 25°C TJ = 125°C Volts
IF = 1.0
1 0 Ad
Adc
0.47 0.39
IF = 2.0 Adc
0.58 0.53
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190
NTMSD3P102R2
6 6
VGS = –10 V
VGS = –4.4 V VDS > = –10 V
–ID, DRAIN CURRENT (AMPS)
0 0
0 0.25 0.5 0.75 1 1.25 1.5 1.75 2 1 2 3 4 5
–VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS) –VGS, GATE–TO–SOURCE VOLTAGE (VOLTS)
0.5 0.5
0.4 0.4
0.3 0.3
0.2 0.2
0.1 0.1
0 0
3 4 5 6 7 8 2 3 4 5 6 7
–VGS, GATE–TO–SOURCE VOLTAGE (VOLTS) –VGS, GATE–TO–SOURCE VOLTAGE (VOLTS)
Figure 3. On–Resistance vs. Gate–to–Source Figure 4. On–Resistance vs. Gate–to–Source
Voltage Voltage
RDS(on), DRAIN–TO–SOURCE RESISTANCE (Ω)
0.25 1.6
ID = –3.05 A
TJ = 25°C VGS = –10 V
1.4
0.2 VGS = –4.5 V
(NORMALIZED)
1.2
0.15
1
VGS = –10 V
0.1
0.8
0.05 0.6
1 2 3 4 5 6 –50 –25 0 25 50 75 100 125 150
–ID, DRAIN CURRENT (AMPS) TJ, JUNCTION TEMPERATURE (°C)
Figure 5. On–Resistance vs. Drain Current and Figure 6. On Resistance Variation with
Gate Voltage Temperature
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191
NTMSD3P102R2
10000
VGS = 0 V VDS = 0 V VGS = 0 V
1200
Ciss
C, CAPACITANCE (pF)
1000
IDSS, LEAKAGE (nA)
TJ = 150°C
1000
800
Ciss
600 Crss
TJ = 125°C
100 400 Coss
200 Crss
TJ = 25°C
10 0
2 4 6 8 10 12 14 16 18 20 10 5 0 5 10 15 20
–VGS –VDS
–VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS) GATE–TO–SOURCE OR DRAIN–TO–SOURCE
VOLTAGE (VOLTS)
Figure 7. Drain–to–Source Leakage Current Figure 8. Capacitance Variation
vs. Voltage
–VGS, GATE–TO–SOURCE VOLTAGE (VOLTS)
12 24 1000
VDS = –20 V
QT ID = –3.05 A
10 20
VGS = –10 V
VDS
8 16 100
t, TIME (ns)
VGS td(off)
6 12 tf
Q1 tr
4 Q2 8 10
td(on)
2 4
ID = –3.05 A
TJ = 25°C
0 0 1
0 2 4 6 8 10 12 14 16 1 10 100
Qg, TOTAL GATE CHARGE (nC) RG, GATE RESISTANCE (Ω)
1000 3
VDS = –20 V VGS = 0 V
IS, SOURCE CURRENT (AMPS)
ID = –1.5 A TJ = 25°C
2.5
VGS = –4.5 V
2
t, TIME (ns)
100 1.5
tr
td(off)
tf 1
td(on)
0.5
10 0
1 10 100 0.2 0.4 0.6 0.8 1 1.2
RG, GATE RESISTANCE (Ω) –VSD, DRAIN–TO–SOURCE VOLTAGE (VOLTS)
Figure 11. Resistive Switching Time Variation Figure 12. Diode Forward Voltage vs. Current
vs. Gate Resistance
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192
NTMSD3P102R2
di/dt
IS
trr
ta tb
TIME
tp 0.25 IS
IS
1.0
D = 0.5
Rthja(t), EFFECTIVE TRANSIENT
THERMAL RESPONSE
0.2
0.1
0.1
0.05 Chip Normalized to RθJA at Steady State (1″ pad)
Junction 2.32 Ω 18.5 Ω 50.9 Ω 37.1 Ω 56.8 Ω 24.4 Ω
0.02
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193
NTMSD3P102R2
10 10
IF, INSTANTANEOUS FORWARD
CURRENT (AMPS)
TJ = 125°C
85°C
1.0 1.0
85°C 25°C
25°C
–40°C
0.1 0.1
0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9 1.0 0 0.2 0.4 0.6 0.8 1.0 1.2 1.4
VF, INSTANTANEOUS FORWARD VOLTAGE (VOLTS) VF, MAXIMUM INSTANTANEOUS
FORWARD VOLTAGE (VOLTS)
Figure 15. Typical Forward Voltage Figure 16. Maximum Forward Voltage
1E–2
IR, MAXIMUM REVERSE CURRENT (AMPS)
1E–1
IR , REVERSE CURRENT (AMPS)
TJ = 125°C
TJ = 125°C
1E–3 1E–2
85°C
1E–4 1E–3
1E–5 1E–4
25°C
25°C
1E–6 1E–5
1E–7 1E–6
0 5.0 10 15 20 0 5.0 10 15 20
VR, REVERSE VOLTAGE (VOLTS) VR, REVERSE VOLTAGE (VOLTS)
Figure 17. Typical Reverse Current Figure 18. Maximum Reverse Current
IO, AVERAGE FORWARD CURRENT (AMPS)
1000 1.6
TYPICAL CAPACITANCE AT 0 V = 170 pF dc
1.4 FREQ = 20 kHz
C, CAPACITANCE (pF)
1.0
Ipk/Io = p
100 0.8
Ipk/Io = 5.0
0.6
Ipk/Io = 10
0.4
Ipk/Io = 20
0.2
10 0
0 5.0 10 15 20 0 20 40 60 80 100 120 140 160
VR, REVERSE VOLTAGE (VOLTS) TA, AMBIENT TEMPERATURE (°C)
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194
NTMSD3P102R2
0.2
0.1
0
0 0.5 1.0 1.5 2.0
IO, AVERAGE FORWARD CURRENT (AMPS)
1.0
D = 0.5
Rthja(t), EFFECTIVE TRANSIENT
0.2
THERMAL RESISTANCE
0.1
0.1
0.05 NORMALIZED TO RqJA AT STEADY STATE (1″ PAD)
0.02
0.01 4 W $6 W $# W 6$:$ W 4:7 W
0.01 ,
6 . 8# . $# . #:6 . $896 .
SINGLE PULSE
=
0.001
1.0E–05 1.0E–04 1.0E–03 1.0E–02 1.0E–01 1.0E+00 1.0E+01 1.0E+02 1.0E+03
t, TIME (s)
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195
NTMSD3P102R2
#:$ $$
: 6
#6 $
9 #:
inches
mm
SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • The soldering temperature and time shall not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within • When shifting from preheating to soldering, the
a short time could result in device failure. Therefore, the maximum temperature gradient shall be 5°C or less.
following items should always be observed in order to • After soldering has been completed, the device should
minimize the thermal stress to which the devices are be allowed to cool naturally for at least three minutes.
subjected. Gradual cooling should be used as the use of forced
• Always preheat the device. cooling will increase the temperature gradient and
• The delta temperature between the preheat and result in latent failure due to mechanical stress.
soldering should be 100°C or less.* • Mechanical stress or shock should not be applied
• When preheating and soldering, the temperature of the during cooling.
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When * Soldering a device without preheating can cause
using infrared heating with the reflow soldering excessive thermal shock and stress which can result in
method, the difference shall be a maximum of 10°C. damage to the device.
http://onsemi.com
196
NTMSD3P102R2
150°C
SOLDER IS LIQUID FOR
40 TO 80 SECONDS
100°C 140°C (DEPENDING ON
MASS OF ASSEMBLY)
100°C
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197
!#!!
(45
P–Channel Enhancement–Mode
Power MOSFET and Schottky Diode
Dual SO–8 Package
http://onsemi.com
Features
• High Efficiency Components in a Single SO–8 Package
• High Density Power MOSFET with Low RDS(on), MOSFET
Schottky Diode with Low VF –3.05 AMPERES
• Independent Pin–Outs for MOSFET and Schottky Die
Allowing for Flexibility in Application Use –30 VOLTS
• Less Component Placement for Board Space Savings 0.085 W @ VGS = –10 V
• SO–8 Surface Mount Package,
Mounting Information for SO–8 Package Provided
Applications SCHOTTKY DIODE
• DC–DC Converters 3.0 AMPERES
• Low Voltage Motor Control
30 VOLTS
• Power Management in Portable and Battery–Powered Products, i.e.:
Computers, Printers, PCMCIA Cards, Cellular and Cordless Telephones 420 mV @ IF = 3.0 A
MOSFET MAXIMUM RATINGS (TJ = 25°C unless otherwise noted)
Rating Symbol Value Unit 8
Drain–to–Source Voltage VDSS –30 V 8 # :
Gate–to–Source Voltage – Continuous VGS "20 V 9
1
Thermal Resistance – 4
Junction–to–Ambient (Note 1.) RθJA 171 °C/W
SO–8 6 $
Total Power Dissipation @ TA = 25°C PD 0.73 W
CASE 751
Continuous Drain Current @ TA = 25°C ID –2.34 A /
STYLE 18
Continuous Drain Current @ TA = 70°C ID –1.87 A
Pulsed Drain Current (Note 4.) IDM –8.0 A
Thermal Resistance – MARKING DIAGRAM
Junction–to–Ambient (Note 2.) RθJA 100 °C/W & PIN ASSIGNMENTS
Total Power Dissipation @ TA = 25°C PD 1.25 W
1 8
Continuous Drain Current @ TA = 25°C ID –3.05 A Anode Cathode
Continuous Drain Current @ TA = 70°C ID –2.44 A 2 7
Anode E3P303 Cathode
Pulsed Drain Current (Note 4.) IDM –12 A 3 6
Source LYWW Drain
Thermal Resistance – 4 5
Junction–to–Ambient (Note 3.) RθJA 62.5 °C/W Gate Drain
Total Power Dissipation @ TA = 25°C PD 2.0 W (Top View)
Continuous Drain Current @ TA = 25°C ID –3.86 A
Continuous Drain Current @ TA = 70°C ID –3.10 A E3P303 = Device Code
Pulsed Drain Current (Note 4.) IDM –15 A L = Assembly Location
Operating and Storage TJ, Tstg –55 to °C Y = Year
Temperature Range +150 WW = Work Week
Single Pulse Drain–to–Source Avalanche EAS 140 mJ
Energy – Starting TJ = 25°C (VDD = ORDERING INFORMATION
–30 Vdc, VGS = –4.5 Vdc, Peak IL =
–7.5 Apk, L = 5 mH, RG = 25 Ω) Device Package Shipping
Maximum Lead Temperature for Soldering TL 260 °C
Purposes, 1/8″ from case for 10 seconds NTMSD3P303R2 SO–8 2500/Tape & Reel
1. Minimum FR–4 or G–10 PCB, Steady State.
2. Mounted onto a 2″ square FR–4 Board (1″ sq. 2 oz Cu 0.06″ thick single sided), Steady State.
3. Mounted onto a 2″ square FR–4 Board (1″ sq. 2 oz Cu 0.06″ thick single sided), t ≤ 10 seconds.
4. Pulse Test: Pulse Width = 300 ms, Duty Cycle = 2%.
This document contains information on a product under development. ON Semiconductor reserves the right to change or discontinue this product without notice.
ON CHARACTERISTICS
Gate Threshold Voltage VGS(th) Vdc
(VDS = VGS, ID = –250 µAdc) –1.0 –1.7 –2.5
Temperature Coefficient (Negative) – 3.6 –
Static Drain–to–Source On–State Resistance RDS(on) Ω
(VGS = –10 Vdc, ID = –3.05 Adc) – 0.063 0.085
(VGS = –4.5 Vdc, ID = –1.5 Adc) – 0.090 0.125
Forward Transconductance gFS Mhos
(VDS = –15 Vdc, ID = –3.05 Adc) – 5.0 –
DYNAMIC CHARACTERISTICS
Input Capacitance Ciss – 520 750 pF
Output Capacitance (VDS = –24
24 Vdc,
Vd VGS = 0 Vdc,
Vd
Coss – 170 325
f = 1.0 MHz)
Reverse Transfer Capacitance Crss – 70 135
5. Minimum FR–4 or G–10 PCB, Steady State.
6. Mounted onto a 2″ square FR–4 Board (1″ sq. 2 oz Cu 0.06″ thick single sided), Steady State.
7. Mounted onto a 2″ square FR–4 Board (1″ sq. 2 oz Cu 0.06″ thick single sided), t ≤ 10 seconds.
8. Handling precautions to protect against electrostatic discharge is mandatory.
http://onsemi.com
199
NTMSD3P303R2
SCHOTTKY RECTIFIER ELECTRICAL CHARACTERISTICS (TJ = 25°C unless otherwise noted) (Note 10.)
Maximum Instantaneous Forward Voltage VF TJ = 25°C TJ = 125°C Volts
http://onsemi.com
200
NTMSD3P303R2
6 6
VGS = –10 V
VGS = –4.4 V VDS > = –10 V
–ID, DRAIN CURRENT (AMPS)
0 0
0 0.25 0.5 0.75 1 1.25 1.5 1.75 2 1 2 3 4 5
–VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS) –VGS, GATE–TO–SOURCE VOLTAGE (VOLTS)
0.5 0.5
0.4 0.4
0.3 0.3
0.2 0.2
0.1 0.1
0 0
3 4 5 6 7 8 2 3 4 5 6 7
–VGS, GATE–TO–SOURCE VOLTAGE (VOLTS) –VGS, GATE–TO–SOURCE VOLTAGE (VOLTS)
Figure 3. On–Resistance vs. Gate–to–Source Figure 4. On–Resistance vs. Gate–to–Source
Voltage Voltage
RDS(on), DRAIN–TO–SOURCE RESISTANCE (Ω)
0.25 1.6
ID = –3.05 A
TJ = 25°C VGS = –10 V
1.4
0.2 VGS = –4.5 V
(NORMALIZED)
1.2
0.15
1
VGS = –10 V
0.1
0.8
0.05 0.6
1 2 3 4 5 6 –50 –25 0 25 50 75 100 125 150
–ID, DRAIN CURRENT (AMPS) TJ, JUNCTION TEMPERATURE (°C)
Figure 5. On–Resistance vs. Drain Current and Figure 6. On Resistance Variation with
Gate Voltage Temperature
http://onsemi.com
201
NTMSD3P303R2
10000
VGS = 0 V VDS = 0 V VGS = 0 V
1200
Ciss
C, CAPACITANCE (pF)
TJ = 150°C 1000
IDSS, LEAKAGE (nA)
1000
800
12 30 1000
VDS = –24 V
QT ID = –3.05 A
10 25
VGS = –10 V
VDS
8 20 100 td(off)
t, TIME (ns)
VGS
6 15 tf
Q1 tr
4 Q2 10 10
td(on)
2 5
ID = –3.05 A
TJ = 25°C
0 0 1
0 2 4 6 8 10 12 14 16 1 10 100
Qg, TOTAL GATE CHARGE (nC) RG, GATE RESISTANCE (Ω)
1000 3
VDS = –24 V VGS = 0 V
IS, SOURCE CURRENT (AMPS)
ID = –1.5 A TJ = 25°C
2.5
VGS = –4.5 V
2
t, TIME (ns)
100 1.5
tr
td(off)
tf 1
td(on)
0.5
10 0
1 10 100 0.2 0.4 0.6 0.8 1 1.2
RG, GATE RESISTANCE (Ω) –VSD, SOURCE–TO–DRAIN VOLTAGE (VOLTS)
Figure 11. Resistive Switching Time Variation Figure 12. Diode Forward Voltage vs. Current
vs. Gate Resistance
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202
NTMSD3P303R2
100
VGS = 12 V
SINGLE PULSE
–ID, DRAIN CURRENT (AMPS)
1.0 ms
TA = 25°C
10
10 ms di/dt
IS
1.0 dc
trr
ta tb
0.1 TIME
RDS(on)
THERMAL LIMIT tp 0.25 IS
PACKAGE LIMIT
0.01 IS
1 1.0 10 100
–VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS)
Figure 13. Maximum Rated Forward Biased Figure 14. Diode Reverse Recovery Waveform
Safe Operating Area
1.0
D = 0.5
Rthja(t), EFFECTIVE TRANSIENT
THERMAL RESPONSE
0.2
0.1
0.1
0.05 Chip Normalized to RθJA at Steady State (1″ pad)
Junction 2.32 Ω 18.5 Ω 50.9 Ω 37.1 Ω 56.8 Ω 24.4 Ω
0.02
http://onsemi.com
203
NTMSD3P303R2
.
.
/
.
.
/
8$° #$°
8$°
# 4 6 $ 9 : # 4 6 $ 9 : 8
.
.
/
. >
.
/
Figure 16. Typical Forward Voltage Figure 17. Maximum Forward Voltage
>
8$°
#$°
$ $ # #$ 4 $ $ # #$ 4
Figure 18. Typical Reverse Current Figure 19. Maximum Reverse Current
$
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Ipk/Io = 20
$
$ $ # #$ 4 # 6 9 8 # 6 9
=
°
http://onsemi.com
204
NTMSD3P303R2
:$
.
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http://onsemi.com
205
NTMSD3P303R2
#:$ $$
: 6
#6 $
9 #:
inches
mm
SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • The soldering temperature and time shall not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within • When shifting from preheating to soldering, the
a short time could result in device failure. Therefore, the maximum temperature gradient shall be 5°C or less.
following items should always be observed in order to • After soldering has been completed, the device should
minimize the thermal stress to which the devices are be allowed to cool naturally for at least three minutes.
subjected. Gradual cooling should be used as the use of forced
• Always preheat the device. cooling will increase the temperature gradient and
• The delta temperature between the preheat and result in latent failure due to mechanical stress.
soldering should be 100°C or less.* • Mechanical stress or shock should not be applied
• When preheating and soldering, the temperature of the during cooling.
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When * Soldering a device without preheating can cause
using infrared heating with the reflow soldering excessive thermal shock and stress which can result in
method, the difference shall be a maximum of 10°C. damage to the device.
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206
NTMSD3P303R2
150°C
SOLDER IS LIQUID FOR
40 TO 80 SECONDS
100°C 140°C (DEPENDING ON
MASS OF ASSEMBLY)
100°C
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207
# "
#$%& '(
"
N–Channel TO–220
Designed for low voltage, high speed switching applications in http://onsemi.com
power supplies, converters and power motor controls and bridge
circuits. 27 AMPERES
Features 60 VOLTS
• Higher Current Rating
RDS(on) = 46 mΩ
• Lower RDS(on)
• Lower VDS(on)
• Lower Capacitances N–Channel
http://onsemi.com
209
#
#$%& '(
N–Channel TO–220 and D2PAK
Designed for low voltage, high speed switching applications in
power supplies, converters and power motor controls and bridge
circuits. http://onsemi.com
Features
• Higher Current Rating
45 AMPERES
• Lower RDS(on) 60 VOLTS
• Lower VDS(on) RDS(on) = 26 mΩ
• Lower Capacitances
• Lower Total Gate Charge N–Channel
• Tighter VSD Specification D
• Bridge Circuits 1 2
3
MAXIMUM RATINGS (TJ = 25°C unless otherwise noted) TO–220AB D2PAK
CASE 221A CASE 418B
Rating Symbol Value Unit
STYLE 5 STYLE 2
1
Drain–to–Source Voltage VDSS 60 Vdc 2
Drain–to–Gate Voltage (RGS = 10 MΩ) VDGR 60 Vdc 3
MARKING DIAGRAMS
Gate–to–Source Voltage Vdc
& PIN ASSIGNMENTS
– Continuous VGS "20
– Non–Repetitive (tpv10 ms) VGS "30 4
Drain 4
Drain Current Drain
– Continuous @ TA = 25°C ID 45 Adc
– Continuous @ TA = 100°C ID 30
– Single Pulse (tpv10 µs) IDM 150 Apk
NTB45N06
Total Power Dissipation @ TA = 25°C PD 125 W LLYWW
Derate above 25°C 0.83 W/°C NTP45N06
Total Power Dissipation @ TA = 25°C (Note 1.) 3.2 W LLYWW
Total Power Dissipation @ TA = 25°C (Note 2.) 2.4 W 1 2 3
1 3
Operating and Storage Temperature Range TJ, Tstg –55 to °C Gate Source
Gate Drain Source
+175
Single Pulse Drain–to–Source Avalanche EAS 240 mJ 2
NTx45N06 = Device Code
Energy – Starting TJ = 25°C Drain
LL = Location Code
(VDD = 50 Vdc, VGS = 10 Vdc, RG = 25 Ω,
Y = Year
IL(pk) = 40 A, L = 0.3 mH, VDS = 60 Vdc)
WW = Work Week
1. When surface mounted to an FR4 board using 1″ pad size,
(Cu Area 1.127 in2).
ORDERING INFORMATION
2. When surface mounted to an FR4 board using the minimum recommended
pad size, (Cu Area 0.412 in2). Device Package Shipping
http://onsemi.com
211
NTP45N06, NTB45N06
90 90
VGS = 10 V VGS = 7 V VDS > = 10 V
80 80
ID, DRAIN CURRENT (AMPS)
30 30
VGS = 5 V TJ = 25°C
20 20
VGS = 4.5 V TJ = 100°C
10 10
TJ = –55°C
0 0
0 1 2 3 4 5 6 3 3.5 4 4.5 5 5.5 6 6.5 7 7.5 8
VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS) VGS, GATE–TO–SOURCE VOLTAGE (VOLTS)
0.034 TJ = 100°C
0.026
0.024 VGS = 10 V
0.026 TJ = 25°C
0.022
0.018 TJ = –55°C
0.02 VGS = 15 V
0.01 0.018
0 10 20 30 40 50 60 70 80 90 0 10 20 30 40 50 60 70 80 90
ID, DRAIN CURRENT (AMPS) ID, DRAIN CURRENT (AMPS)
Figure 3. On–Resistance vs. Gate–to–Source Figure 4. On–Resistance vs. Drain Current and
Voltage Gate Voltage
RDS(on), DRAIN–TO–SOURCE RESISTANCE
2.2 10000
VGS = 0 V
ID = 22.5 A
2 VGS = 10 V
IDSS, LEAKAGE (nA)
TJ = 150°C
1.8
(NORMALIZED)
1000
1.6
1.4 TJ = 125°C
1.2
100
1
TJ = 100°C
0.8
0.6 10
–50 –25 0 25 50 75 100 125 150 175 0 10 20 30 40 50 60
TJ, JUNCTION TEMPERATURE (°C) VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS)
http://onsemi.com
212
NTP45N06, NTB45N06
VGS
2400 Crss 8
2000 Q1 Q2
6
1600 Ciss
1200 4
800 Coss
2 ID = 45
400 Crss TJ = 25°C
0 0
10 5 VGS 0 VDS 5 10 15 20 25 0 4 8 12 16 20 24 28 32 36
GATE–TO–SOURCE OR DRAIN–TO–SOURCE VOLTAGE Qg, TOTAL GATE CHARGE (nC)
(VOLTS)
Figure 7. Capacitance Variation Figure 8. Gate–to–Source and
Drain–to–Source Voltage vs. Total Charge
1000 50
VDS = 30 V VGS = 0 V
tr 30
td(off)
td(on) 20
10
10
1 0
1 10 100 0.6 0.64 0.68 0.72 0.76 0.8 0.84 0.88 0.92 0.96 1 1.04
RG, GATE RESISTANCE (Ω) VSD, SOURCE–TO–DRAIN VOLTAGE (VOLTS)
Figure 9. Resistive Switching Time Variation Figure 10. Diode Forward Voltage vs. Current
vs. Gate Resistance
EAS, SINGLE PULSE DRAIN–TO–SOURCE
1000 280
VGS = 20 V ID = 45 A
SINGLE PULSE
ID, DRAIN CURRENT (AMPS)
240
AVALANCHE ENERGY (mJ)
TC = 25°C
100
200
dc
160
10 ms
10
1 ms 120
0.1 0
0.10 1 10 100 25 50 75 100 125 150 175
VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS) TJ, STARTING JUNCTION TEMPERATURE (°C)
Figure 11. Maximum Rated Forward Biased Figure 12. Maximum Avalanche Energy vs.
Safe Operating Area Starting Junction Temperature
http://onsemi.com
213
NTP45N06, NTB45N06
1
r(t), EFFECTIVE TRANSIENT THERMAL RESPONSE (NORMALIZED) Normalized to RθJC at Steady State
0.1
0.01
0.00001 0.0001 0.001 0.01 0.1 1 10
t, TIME (s)
Figure 13. Thermal Response
10
Normalized to RθJA at Steady State,
r(t), EFFECTIVE TRANSIENT THERMAL RESISTANCE (NORMALIZED)
0.1
0.01
0.001
0.00001 0.0001 0.001 0.01 0.1 1 10 100 1000
t, TIME (s)
Figure 14. Thermal Response
http://onsemi.com
214
#
#$%& '(
* %+%
N–Channel TO–220 and D2PAK
Designed for low voltage, high speed switching applications in
power supplies, converters and power motor controls and bridge
circuits. http://onsemi.com
Features
• Higher Current Rating
45 AMPERES
• Lower RDS(on) 60 VOLTS
• Lower VDS(on) RDS(on) = 28 mΩ
• Lower Capacitances
• Lower Total Gate Charge N–Channel
• Tighter VSD Specification D
• Bridge Circuits 1 2
3
MAXIMUM RATINGS (TJ = 25°C unless otherwise noted) TO–220AB D2PAK
CASE 221A CASE 418B
Rating Symbol Value Unit
STYLE 5 STYLE 2
1
Drain–to–Source Voltage VDSS 60 Vdc 2
Drain–to–Gate Voltage (RGS = 10 MΩ) VDGR 60 Vdc 3
MARKING DIAGRAMS
Gate–to–Source Voltage Vdc
& PIN ASSIGNMENTS
– Continuous VGS "15
– Non–Repetitive (tpv10 ms) VGS "20 4
Drain 4
Drain Current Drain
– Continuous @ TA = 25°C ID 45 Adc
– Continuous @ TA = 100°C ID 30
– Single Pulse (tpv10 µs) IDM 150 Apk
NTB45N06L
Total Power Dissipation @ TA = 25°C PD 125 W
NTP45N06L LLYWW
Derate above 25°C 0.83 W/°C
Total Power Dissipation @ TA = 25°C (Note 1.) 3.2 W LLYWW
Total Power Dissipation @ TA = 25°C (Note 2.) 2.4 W 2
1 3 1 3
Operating and Storage Temperature Range TJ, Tstg –55 to °C Gate Source Drain
Gate Source
+175
Single Pulse Drain–to–Source Avalanche EAS 240 mJ 2
NTx45N06L = Device Code
Energy – Starting TJ = 25°C Drain
LL = Location Code
(VDD = 50 Vdc, VGS = 5.0 Vdc, L = 0.3 mH
Y = Year
IL(pk) = 40 A, VDS = 60 Vdc, RG = 25 Ω)
WW = Work Week
1. When surface mounted to an FR4 board using 1″ pad size,
(Cu Area 1.127 in2).
ORDERING INFORMATION
2. When surface mounted to an FR4 board using the minimum recommended
pad size, (Cu Area 0.412 in2). Device Package Shipping
http://onsemi.com
216
NTP45N06L, NTB45N06L
80 80
VGS = 10 V VGS = 5.5 V
VDS > = 10 V
70 70
ID, DRAIN CURRENT (AMPS)
50 VGS = 4.5 V 50
VGS = 7 V
40 40
VGS = 4 V
30 30
TJ = 25°C
VGS = 8 V
20 20
VGS = 3.5 V TJ = 100°C
10 VGS = 9 V 10
TJ = –55°C
0 0
0 1 2 3 4 1.8 2.6 3.4 4.2 5 5.8
VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS) VGS, GATE–TO–SOURCE VOLTAGE (VOLTS)
0.014 0.018
0 10 20 30 40 50 60 70 80 0 10 20 30 40 50 60 70 80
ID, DRAIN CURRENT (AMPS) ID, DRAIN CURRENT (AMPS)
Figure 3. On–Resistance vs. Gate–to–Source Figure 4. On–Resistance vs. Drain Current and
Voltage Gate Voltage
RDS(on), DRAIN–TO–SOURCE RESISTANCE
2 10000
ID = 22.5 A VGS = 0 V
1.8 VGS = 5 V
TJ = 150°C
IDSS, LEAKAGE (nA)
1.6
1000
(NORMALIZED)
1.4 TJ = 125°C
1.2
100
1
TJ = 100°C
0.8
0.6 10
–50 –25 0 25 50 75 100 125 150 175 0 10 20 30 40 50 60
TJ, JUNCTION TEMPERATURE (°C) VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS)
http://onsemi.com
217
NTP45N06L, NTB45N06L
Crss Q1 Q2
2800
4
2400
2000 3
1600 Ciss
2
1200
800 Coss
1 ID = 45 A
400 Crss TJ = 25°C
0 0
10 5 VGS 0 VDS 5 10 15 20 25 0 4 8 12 16 20 24
GATE–TO–SOURCE OR DRAIN–TO–SOURCE VOLTAGE Qg, TOTAL GATE CHARGE (nC)
(VOLTS)
Figure 7. Capacitance Variation Figure 8. Gate–to–Source and
Drain–to–Source Voltage vs. Total Charge
1000 48
VDS = 30 V
VGS = 0 V
tf 32
t, TIME (ns)
100 24
td(off)
16
8
td(on)
10 0
1 10 100 0.6 0.64 0.68 0.72 0.76 0.8 0.84 0.88 0.92 0.96 1
RG, GATE RESISTANCE (Ω) VSD, SOURCE–TO–DRAIN VOLTAGE (VOLTS)
Figure 9. Resistive Switching Time Variation Figure 10. Diode Forward Voltage vs. Current
vs. Gate Resistance
EAS, SINGLE PULSE DRAIN–TO–SOURCE
1000 280
VGS = 15 V
ID = 45 A
SINGLE PULSE
ID, DRAIN CURRENT (AMPS)
240
AVALANCHE ENERGY (mJ)
TC = 25°C
100
200
dc 160
10
10 ms
120
1 ms
1
RDS(on) Limit 100 µs 80
Thermal Limit
Package Limit
40
0.1 0
0.10 1 10 100 25 50 75 100 125 150 175
VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS) TJ, STARTING JUNCTION TEMPERATURE (°C)
Figure 11. Maximum Rated Forward Biased Figure 12. Maximum Avalanche Energy vs.
Safe Operating Area Starting Junction Temperature
http://onsemi.com
218
NTP45N06L, NTB45N06L
1
r(t), EFFECTIVE TRANSIENT THERMAL RESPONSE (NORMALIZED) Normalized to RθJC at Steady State
0.1
0.01
0.00001 0.0001 0.001 0.01 0.1 1 10
t, TIME (s)
10
Normalized to RθJA at Steady State,
r(t), EFFECTIVE TRANSIENT THERMAL RESISTANCE (NORMALIZED)
0.1
0.01
0.001
0.00001 0.0001 0.001 0.01 0.1 1 10 100 1000
t, TIME (s)
http://onsemi.com
219
#"!
"!
#$%& '(
" !
N–Channel TO–220 and D2PAK
This 10 VGS gate drive vertical Power MOSFET is a general http://onsemi.com
purpose part that provides the “best of design” available today in a low
cost power package. Avalanche energy issues make this part an ideal 75 AMPERES
design in. The drain–to–source diode has a ideal fast but soft recovery. 30 VOLTS
Features
• Ultra–Low RDS(on), Single Base, Advanced Technology
RDS(on) = 6.5 mΩ
• SPICE Parameters Available N–Channel
• Diode is Characterized for Use in Bridge Circuits
• IDSS and VDS(on) Specified at Elevated Temperatures
• High Avalanche Energy Specified
• ESD JEDAC Rated HBM Class 1, MM Class B, CDM Class 0
Typical Applications
• Power Supplies
• Inductive Loads 4
MARKING DIAGRAMS
& PIN ASSIGNMENTS
4 4
Drain Drain
E75
N03–06
YWW
E75
N03–06
YWW 1 3
Gate Source
1 3 2
Gate Source Drain
ORDERING INFORMATION
Device Package Shipping
http://onsemi.com
221
NTP75N03–06, NTB75N03–06
OFF CHARACTERISTICS
Drain–Source Breakdown Voltage (Note 2.) V(BR)DSS
(VGS = 0 Vdc, ID = 250 µAdc) 30 – – Vdc
Temperature Coefficient (Negative) –57 – mV°C
Zero Gate Voltage Drain Current IDSS µAdc
(VDS = 30 Vdc, VGS = 0 Vdc) – – 1.0
(VDS = 30 Vdc, VGS = 0 Vdc, TJ = 150°C) – – 10
Gate–Body Leakage Current (VGS = ±20 Vdc, VDS = 0 Vdc) IGSS – – ±100 nAdc
ON CHARACTERISTICS (Note 2.)
Gate Threshold Voltage (Note 2.) VGS(th)
(VDS = VGS, ID = 250 µAdc) 1.0 1.6 2.0 Vdc
Threshold Temperature Coefficient (Negative) – –6 – mV°C
Static Drain–to–Source On–Resistance (Note 2.) RDS(on) mΩ
(VGS = 10 Vdc, ID = 37.5 Adc) – 5.3 6.5
Static Drain–to–Source On Resistance (Note 2.) VDS(on) Vdc
(VGS = 10 Vdc, ID = 75 Adc) – 0.53 0.68
(VGS = 10 Vdc, ID = 37.5 Adc, TJ = 125°C) – 0.35 0.50
Forward Transconductance (Notes 2. & 4.) (VDS = 3 Vdc, ID = 20 Adc) gFS – 58 – Mhos
http://onsemi.com
222
NTP75N03–06, NTB75N03–06
150
120 VGS = 4 V
VGS = 3.5 V 135 VDS ≥ 10 V
VGS = 4.5 V
ID, DRAIN CURRENT (AMPS)
0.007
TJ = 25°C 0.007
0.0065 VGS = 5 V
0.006
0.006
0.0055 VGS = 10 V
TJ = –55°C
0.005 0.005
0.0045
0.004 0.004
10 20 30 40 50 60 70 80 90 100 120 0 20 40 60 80 100 120
ID, DRAIN CURRENT (AMPS) ID, DRAIN CURRENT (AMPS)
Figure 3. On–Resistance vs. Drain Current and Figure 4. On–Resistance vs. Drain Current and
Temperature Gate Voltage
RDS(on), DRAIN–TO SOURCE RESISTANCE (NORMALIZED)
1.6 1000
VGS = 10 V VGS = 0 V
ID = 37.5 A
1.4
TJ = 125°C
IDSS, LEAKAGE (nA)
100
1.2
TJ = 100°C
1
10
0.8
0.6 1
–50 –25 0 25 50 75 100 125 150 5 10 15 20 25 30
TJ, JUNCTION TEMPERATURE (°C) VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS)
http://onsemi.com
223
NTP75N03–06, NTB75N03–06
800 8 20
VGS
600 6 15
Ciss Q1
Q2
400 4 10
Coss
200 2 ID = 75 A 5
Crss TJ = 25°C
0 0 0
10 8 6 4 2 0 2 4 6 8 10 12 14 16 18 20 22 25 0 4 8 12 16 20 24 28 32 36 40 44 48 52
GATE–TO–SOURCE OR DRAIN–TO–SOURCE Qg, TOTAL GATE CHARGE (nC)
VOLTAGE (VOLTS)
Figure 7. Capacitance Variation Figure 8. Gate–to–Source Voltage vs. Total Charge
1000 75
70 VGS = 0 V
tr IS, SOURCE CURRENT (AMPS) 65 TJ = 25°C
60
55
50
t, TIME (ns)
tf 45
40
100
35
td(off) 30
25
20
td(on) 15
TJ = 25°C VDD = 15 V 10
ID = 75 A VGS = 5 V 5
10 0
1 2.2 4.7 6.2 9.1 10 20 0.0 0.2 0.4 0.6 0.8 1.0
RG, GATE RESISTANCE (Ω) VSD, SOURCE–TO–DRAIN VOLTAGE (VOLTS)
Figure 9. Resistive Switching Time Variation Figure 10. Diode Forward Voltage vs. Current
vs. Gate Resistance
EAS, SINGLE PULSE DRAIN–TO–SOURCE
1600
1400 ID = 75 A
AVALANCHE ENERGY (mJ)
1200
1000
800
600
400
200
0
25 50 75 100 125 150
TJ, STARTING JUNCTION TEMPERATURE (°C)
http://onsemi.com
224
#"!)
"!)
#$%& '(
" !
N–Channel TO–220 and D2PAK
This Logic Level Vertical Power MOSFET is a general purpose part http://onsemi.com
that provides the “best of design” available today in a low cost power
package. Avalanche energy issues make this part an ideal design in. 75 AMPERES
The drain–to–source diode has a ideal fast but soft recovery. 30 VOLTS
Features
• Ultra–Low RDS(on), Single Base, Advanced Technology
RDS(on) = 9 mΩ
• SPICE Parameters Available N–Channel
• Diode is Characterized for Use in Bridge Circuits
• IDSS and VDS(on) Specified at Elevated Temperatures
• High Avalanche Energy Specified
• ESD JEDAC Rated HBM Class 1, MM Class B, CDM Class 0
Typical Applications
• Power Supplies
• Inductive Loads
4
• PWM Motor Controls
• Replaces MTP75N03HDL and MTB75N03HDL in Many 4
Applications 1 2
3
TO–220AB D2PAK
CASE 221A CASE 418B
STYLE 5 STYLE 2
1
2
3 MARKING DIAGRAMS
& PIN ASSIGNMENTS
4 4
Drain Drain
E75
N03L09
YWW
E75
N03L09
YWW 1 3
Gate 2 Source
1 3
Gate Source Drain
ORDERING INFORMATION
Device Package Shipping
http://onsemi.com
226
NTP75N03L09, NTB75N03L09
OFF CHARACTERISTICS
Drain–Source Breakdown Voltage (Note 2.) V(BR)DSS
(VGS = 0 Vdc, ID = 250 µAdc) 30 34 – Vdc
Temperature Coefficient (Negative) –57 – mV°C
Zero Gate Voltage Drain Current IDSS µAdc
(VDS = 30 Vdc, VGS = 0 Vdc) – – 1.0
(VDS = 30 Vdc, VGS = 0 Vdc, TJ = 150°C) – – 10
Gate–Body Leakage Current (VGS = ±20 Vdc, VDS = 0 Vdc) IGSS – – ±100 nAdc
ON CHARACTERISTICS (Note 2.)
Gate Threshold Voltage (Note 2.) VGS(th)
(VDS = VGS, ID = 250 µAdc) 1.0 1.6 2.0 Vdc
Threshold Temperature Coefficient (Negative) – –6 – mV°C
Static Drain–to–Source On–Resistance (Note 2.) RDS(on) mΩ
(VGS = 5.0 Vdc, ID = 37.5 Adc) – 7.5 9
Static Drain–to–Source On Resistance (Note 2.) VDS(on) Vdc
(VGS = 10 Vdc, ID = 75 Adc) – 0.52 0.68
(VGS = 10 Vdc, ID = 37.5 Adc, TJ = 125°C) – 0.35 0.50
Forward Transconductance (Notes 2. & 4.) (VDS = 3 Vdc, ID = 20 Adc) gFS – 58 – mΩ
http://onsemi.com
227
NTP75N03L09, NTB75N03L09
150
120 VGS = 4 V
VGS = 3.5 V 135 VDS ≥ 10 V
VGS = 4.5 V
ID, DRAIN CURRENT (AMPS)
0.007
TJ = 25°C 0.007
0.0065 VGS = 5 V
0.006
0.006
0.0055 VGS = 10 V
TJ = –55°C
0.005 0.005
0.0045
0.004 0.004
10 20 30 40 50 60 70 80 90 100 120 0 20 40 60 80 100 120
ID, DRAIN CURRENT (AMPS) ID, DRAIN CURRENT (AMPS)
Figure 3. On–Resistance vs. Drain Current and Figure 4. On–Resistance vs. Drain Current and
Temperature Gate Voltage
RDS(on), DRAIN–TO SOURCE RESISTANCE (NORMALIZED)
1.6 1000
VGS = 10 V VGS = 0 V
ID = 37.5 A
1.4
TJ = 125°C
IDSS, LEAKAGE (nA)
100
1.2
TJ = 100°C
1
10
0.8
0.6 1
–50 –25 0 25 50 75 100 125 150 5 10 15 20 25 30
TJ, JUNCTION TEMPERATURE (°C) VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS)
http://onsemi.com
228
NTP75N03L09, NTB75N03L09
800 8 20
VGS
600 6 15
Ciss Q1
Q2
400 4 10
Coss
200 2 ID = 75 A 5
Crss TJ = 25°C
0 0 0
10 8 6 4 2 0 2 4 6 8 10 12 14 16 18 20 22 25 0 4 8 12 16 20 24 28 32 36 40 44 48 52
GATE–TO–SOURCE OR DRAIN–TO–SOURCE Qg, TOTAL GATE CHARGE (nC)
VOLTAGE (VOLTS)
Figure 7. Capacitance Variation Figure 8. Gate–to–Source Voltage vs. Total Charge
1000 75
70 VGS = 0 V
tr IS, SOURCE CURRENT (AMPS) 65 TJ = 25°C
60
55
50
t, TIME (ns)
tf 45
40
100
35
td(off) 30
25
20
td(on) 15
TJ = 25°C VDD = 15 V 10
ID = 75 A VGS = 5 V 5
10 0
1 2.2 4.7 6.2 9.1 10 20 0.0 0.2 0.4 0.6 0.8 1.0
RG, GATE RESISTANCE (Ω) VSD, SOURCE–TO–DRAIN VOLTAGE (VOLTS)
Figure 9. Resistive Switching Time Variation Figure 10. Diode Forward Voltage vs. Current
vs. Gate Resistance
EAS, SINGLE PULSE DRAIN–TO–SOURCE
1600
1400 ID = 75 A
AVALANCHE ENERGY (mJ)
1200
1000
800
600
400
200
0
25 50 75 100 125 150
TJ, STARTING JUNCTION TEMPERATURE (°C)
http://onsemi.com
229
6,
#$%& '(
-,
N–Channel TSSOP–8
Features http://onsemi.com
• New Low Profile TSSOP–8 Package
• Ultra Low RDS(on)
• Higher Efficiency Extending Battery Life
5.8 AMPERES
• Logic Level Gate Drive 20 VOLTS
• Diode Exhibits High Speed, Soft Recovery RDS(on) = 30 mΩ
• Avalanche Energy Specified
• IDSS and VDS(on) Specified at Elevated Temperatures N–Channel N–Channel
Applications D D
• Power Management in Portable and Battery–Powered Products, i.e.:
Computers, Printers, PCMCIA Cards, Cellular and Cordless
Telephones
• Lithium Ion Battery Applications
• Note Book PC
G1 G2
http://onsemi.com
231
6!
#$%& '(
-
P–Channel TSSOP–8
Features http://onsemi.com
• New Low Profile TSSOP–8 Package
• Ultra Low RDS(on) 6.2 AMPERES
• Higher Efficiency Extending Battery Life
• Logic Level Gate Drive 20 VOLTS
• Diode Exhibits High Speed, Soft Recovery RDS(on) = 20 mΩ
• Avalanche Energy Specified
• IDSS and VDS(on) Specified at Elevated Temperatures P–Channel
Applications
• Power Management in Portable and Battery–Powered Products, i.e.: D
Computers, Printers, PCMCIA Cards, Cellular and Cordless
Telephones
• Lithium Ion Battery Applications
• Note Book PC G
http://onsemi.com
233
#
#$%& '(
-
P–Channel Enhancement Mode
Dual Micro8 Package http://onsemi.com
Features
• Ultra Low RDS(on)
–1.45 AMPERES
• Higher Efficiency Extending Battery Life
• Logic Level Gate Drive –20 VOLTS
• Miniature Dual Micro8 Surface Mount Package 160 mW @ VGS = –4.5
• Diode Exhibits High Speed, Soft Recovery
• Micro8 Mounting Information Provided
Applications Dual P–Channel
• Power Management in Portable and Battery–Powered Products, i.e.: D
Computers, Printers, PCMCIA Cards, Cellular and Cordless
Telephones
http://onsemi.com
235
NTTD1P02R2
3 –2.7 V 3
–2.5 V
–2.9 V –2.3 V VDS ≥ –10 V
–ID, DRAIN CURRENT (AMPS)
–8 V
–1.9 V TJ = –55°C
1 1
TJ = 100°C TJ = 25°C
–1.7 V
VGS = –1.5 V
0 0
0 0.25 0.5 0.75 1 1.25 1.5 1.75 0 0.5 1 1.5 2 2.5 3 3.5
–VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS) –VGS, GATE–TO–SOURCE VOLTAGE (VOLTS)
ID = –1.45 A
0.3 VGS = –2.5 V
TJ = 25°C
0.2
VGS = –2.7 V
0.2
VGS = –4.5 V
0.1
0.1
0 0
0 2 4 6 8 10 12 0 0.5 1 1.5 2 2.5 3 3.5
–VGS, GATE–TO–SOURCE VOLTAGE (VOLTS) –ID, DRAIN CURRENT (AMPS)
1.6 100
VGS = 0 V
ID = –1.45 A
RDS(on), DRAIN–TO–SOURCE
RESISTANCE (NORMALIZED)
TJ = 125°C
1.2
10 TJ = 100°C
1
0.8
0.6 1
–50 –25 0 25 50 75 100 125 150 4 8 12 16 20
TJ, JUNCTION TEMPERATURE (°C) –VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS)
http://onsemi.com
236
NTTD1P02R2
600
Crss 14
–VGS
3 12
400 Q1 Q2 10
2 8
Ciss
6
200 ID = –1.45 A
1 –VDS TJ = 25°C 4
Coss
2
Crss 0
0 0
10 5 0 5 10 15 20 0 1 2 3 4 5 6
–VGS –VDS Qg, TOTAL GATE CHARGE (nC)
GATE–TO–SOURCE OR DRAIN–TO–SOURCE
Figure 8. Gate–to–Source and
VOLTAGE (VOLTS)
Drain–to–Source Voltage versus Total Charge
Figure 7. Capacitance Variation
100
VDD = –16 V VGS = 0 V
ID = –1.45 A –IS, SOURCE CURRENT (AMPS) 1.6
TJ = 25°C
VGS = –4.5 V
1.2
t, TIME (ns)
tr
td (off)
10 tf
0.8
td (on)
0.4
1 0
1 10 100 0.4 0.5 0.6 0.7 0.8 0.9 1
RG, GATE RESISTANCE (OHMS) –VSD, SOURCE–TO–DRAIN VOLTAGE (VOLTS)
Figure 9. Resistive Switching Time Variation Figure 10. Diode Forward Voltage
versus Gate Resistance versus Current
100
VGS = 8 V
SINGLE PULSE
ID , DRAIN CURRENT (AMPS)
TC = 25°C di/dt
10 IS
100 ms
trr
1 ms ta tb
1
10 ms TIME
tp 0.25 IS
0.1
RDS(on) LIMIT IS
THERMAL LIMIT dc
PACKAGE LIMIT
0.01
0.1 1 10 100 Figure 12. Diode Reverse Recovery Waveform
VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS)
http://onsemi.com
237
NTTD1P02R2
1000
Rthja(t), EFFECTIVE TRANSIENT
THERMAL RESISTANCE (°C/W)
D = 0.5
100
0.2
0.1
0.05
10 *0
0.02
θ,' " ('
θ,
0.01
- .
/
/
1 '
'
'# ,*0 " *0
θ,'
SINGLE PULSE
- - " '&'#
0.1
1.0E–05 1.0E–04 1.0E–03 1.0E–02 1.0E–01 1.0E+00 1.0E+01 1.0E+02 1.0E+03
t, TIME (s)
0.041
1.04
0.208 0.126
5.28 3.20
0.015 0.0256
0.38 0.65
inches
mm
http://onsemi.com
238
NTTD1P02R2
SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • The soldering temperature and time shall not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within • When shifting from preheating to soldering, the
a short time could result in device failure. Therefore, the maximum temperature gradient shall be 5°C or less.
following items should always be observed in order to • After soldering has been completed, the device should
minimize the thermal stress to which the devices are be allowed to cool naturally for at least three minutes.
subjected. Gradual cooling should be used as the use of forced
• Always preheat the device. cooling will increase the temperature gradient and
• The delta temperature between the preheat and result in latent failure due to mechanical stress.
soldering should be 100°C or less.* • Mechanical stress or shock should not be applied
• When preheating and soldering, the temperature of the during cooling.
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When * Soldering a device without preheating can cause
using infrared heating with the reflow soldering excessive thermal shock and stress which can result in
method, the difference shall be a maximum of 10°C. damage to the device.
150°C
SOLDER IS LIQUID FOR
40 TO 80 SECONDS
100°C 140°C (DEPENDING ON
MASS OF ASSEMBLY)
100°C
http://onsemi.com
239
NTTD1P02R2
SECTION B–B
NOTES:
1. CONFORMS TO EIA–481–1.
2. CONTROLLING DIMENSION: MILLIMETER.
18.4 (.724)
MAX.
NOTE 3
13.2 (.52)
12.8 (.50)
330.0 50.0
(13.20) (1.97)
MAX. MIN.
14.4 (.57)
12.4 (.49)
NOTE 4
NOTES:
1. CONFORMS TO EIA–481–1.
2. CONTROLLING DIMENSION: MILLIMETER.
3. INCLUDES FLANGE DISTORTION AT OUTER EDGE.
4. DIMENSION MEASURED AT INNER HUB.
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240
#
#$%& '(
-
Dual P–Channel Micro8
Features
• Ultra Low RDS(on)
• Higher Efficiency Extending Battery Life http://onsemi.com
• Logic Level Gate Drive
• Miniature Micro–8 Surface Mount Package –2.4 AMPERES
• Diode Exhibits High Speed, Soft Recovery
• Micro8 Mounting Information Provided –20 VOLTS
Applications RDS(on) = 90 m
• Power Management in Portable and Battery–Powered Products, i.e.:
Cellular and Cordless Telephones and PCMCIA Cards
P–Channel
Top View
ORDERING INFORMATION
http://onsemi.com
242
NTTD2P02R2
4 5
VGS = –2.1 V TJ = 25°C
VDS > = 10 V
–ID, DRAIN CURRENT (AMPS)
1
VGS = –1.5 V 1
TJ = 100°C
TJ = 55°C
0 0
0 2 4 6 8 10 1 1.5 2 2.5 3
–VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS) –VGS, GATE–TO–SOURCE VOLTAGE (VOLTS)
0.15 0.1
VGS = –2.7 V
0.1 0.08
VGS = –4.5 V
0.05 0.06
0 0.04
2 4 6 8 1 1.5 2 2.5 3 3.5 4 4.5
–VGS, GATE–TO–SOURCE VOLTAGE (VOLTS) –ID, DRAIN CURRENT (AMPS)
Figure 3. On–Resistance vs. Gate–to–Source Figure 4. On–Resistance vs. Drain Current and
Voltage. Gate Voltage.
RDS(on), DRAIN–TO–SOURCE RESISTANCE
1.6 1000
ID = –2.4 A VGS = 0 V
VGS = –4.5 V TJ = 125°C
1.4 100
–IDSS, LEAKAGE (nA)
TJ = 100°C
(NORMALIZED)
1.2 10
TJ = 25°C
1 1
0.8 0.1
0.6 0.01
–50 –25 0 25 50 75 100 125 150 0 4 8 12 16 20
TJ, JUNCTION TEMPERATURE (°C) –VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS)
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243
NTTD2P02R2
14
900 3 VGS 12
Crss
Q1 10
Q2
600 Ciss 2 8
6
300 ID = –2.4 A
Coss 1 VDS 4
TJ = 25°C
Crss 2
0 0 0
10 5 0 5 10 15 20 0 2 4 6 8 10 12 14
–VGS –VDS Qg, TOTAL GATE CHARGE (nC)
GATE–TO–SOURCE OR DRAIN–TO–SOURCE
VOLTAGE (VOLTS) Figure 8. Gate–to–Source and
Drain–to–Source Voltage versus Total Charge
Figure 7. Capacitance Variation
1000 100
VDD = –10 V td (off)
ID = –1.2 A
VGS = –2.7 V tr tf
t, TIME (ns)
t, TIME (ns)
td
100 10 (on)
tr
tf
td (off) VDD = –10 V
ID = –2.4 A
VGS = –4.5 V
td (on)
10 1.0
1.0 10 100 1.0 10 100
RG, GATE RESISTANCE (OHMS) RG, GATE RESISTANCE (OHMS)
Figure 9. Resistive Switching Time Variation Figure 10. Resistive Switching Time Variation
versus Gate Resistance versus Gate Resistance
2
–IS, SOURCE CURRENT (AMPS)
VGS = 0 V
TJ = 25°C di/dt
1.6
IS
trr
1.2
ta tb
TIME
0.8
tp 0.25 IS
0.4 IS
0
0.4 0.5 0.6 0.7 0.8 0.9 1 Figure 12. Diode Reverse Recovery Waveform
–VSD, SOURCE–TO–DRAIN VOLTAGE (VOLTS)
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244
NTTD2P02R2
D = 0.5
0.2
0.05
0.02
Single Pulse
0.01
1E–03 1E–02 1E–01 1E+00 1E+03 1E+02 1E+03
t, TIME (s)
0.041
1.04
0.208 0.126
5.28 3.20
0.015 0.0256
0.38 0.65
inches
mm
http://onsemi.com
245
NTTD2P02R2
SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • The soldering temperature and time shall not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within • When shifting from preheating to soldering, the
a short time could result in device failure. Therefore, the maximum temperature gradient shall be 5°C or less.
following items should always be observed in order to • After soldering has been completed, the device should
minimize the thermal stress to which the devices are be allowed to cool naturally for at least three minutes.
subjected. Gradual cooling should be used as the use of forced
• Always preheat the device. cooling will increase the temperature gradient and
• The delta temperature between the preheat and result in latent failure due to mechanical stress.
soldering should be 100°C or less.* • Mechanical stress or shock should not be applied
• When preheating and soldering, the temperature of the during cooling.
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When * Soldering a device without preheating can cause
using infrared heating with the reflow soldering excessive thermal shock and stress which can result in
method, the difference shall be a maximum of 10°C. damage to the device.
150°C
SOLDER IS LIQUID FOR
40 TO 80 SECONDS
100°C 140°C (DEPENDING ON
MASS OF ASSEMBLY)
100°C
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246
NTTD2P02R2
SECTION B–B
NOTES:
1. CONFORMS TO EIA–481–1.
2. CONTROLLING DIMENSION: MILLIMETER.
18.4 (.724)
MAX.
NOTE 3
13.2 (.52)
12.8 (.50)
330.0 50.0
(13.20) (1.97)
MAX. MIN.
14.4 (.57)
12.4 (.49)
NOTE 4
NOTES:
1. CONFORMS TO EIA–481–1.
2. CONTROLLING DIMENSION: MILLIMETER.
3. INCLUDES FLANGE DISTORTION AT OUTER EDGE.
4. DIMENSION MEASURED AT INNER HUB.
http://onsemi.com
247
#
#$%& '(
-
Single P–Channel Micro8t
Features
• Ultra Low RDS(on)
• Higher Efficiency Extending Battery Life http://onsemi.com
• Logic Level Gate Drive
• Miniature Micro–8 Surface Mount Package –2.4 AMPERES
• Diode Exhibits High Speed, Soft Recovery
• Micro8 Mounting Information Provided –20 VOLTS
Applications RDS(on) = 90 m
• Power Management in Portable and Battery–Powered Products, i.e.:
Cellular and Cordless Telephones and PCMCIA Cards
Single P–Channel
Top View
ORDERING INFORMATION
http://onsemi.com
249
NTTS2P02R2
4 5
VGS = –2.1 V TJ = 25°C
VDS > = 10 V
–ID, DRAIN CURRENT (AMPS)
1
VGS = –1.5 V 1
TJ = 100°C
TJ = 55°C
0 0
0 2 4 6 8 10 1 1.5 2 2.5 3
–VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS) –VGS, GATE–TO–SOURCE VOLTAGE (VOLTS)
0.15 0.1
VGS = –2.7 V
0.1 0.08
VGS = –4.5 V
0.05 0.06
0 0.04
2 4 6 8 1 1.5 2 2.5 3 3.5 4 4.5
–VGS, GATE–TO–SOURCE VOLTAGE (VOLTS) –ID, DRAIN CURRENT (AMPS)
Figure 3. On–Resistance vs. Gate–to–Source Figure 4. On–Resistance vs. Drain Current and
Voltage. Gate Voltage.
RDS(on), DRAIN–TO–SOURCE RESISTANCE
1.6 1000
ID = –2.4 A VGS = 0 V
VGS = –4.5 V TJ = 125°C
1.4 100
–IDSS, LEAKAGE (nA)
TJ = 100°C
(NORMALIZED)
1.2 10
TJ = 25°C
1 1
0.8 0.1
0.6 0.01
–50 –25 0 25 50 75 100 125 150 0 4 8 12 16 20
TJ, JUNCTION TEMPERATURE (°C) –VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS)
http://onsemi.com
250
NTTS2P02R2
14
900 3 VGS 12
Crss
Q1 10
Q2
600 Ciss 2 8
6
300 ID = –2.4 A
Coss 1 VDS 4
TJ = 25°C
Crss 2
0 0 0
10 5 0 5 10 15 20 0 2 4 6 8 10 12 14
–VGS –VDS Qg, TOTAL GATE CHARGE (nC)
GATE–TO–SOURCE OR DRAIN–TO–SOURCE
VOLTAGE (VOLTS) Figure 8. Gate–to–Source and
Drain–to–Source Voltage versus Total Charge
Figure 7. Capacitance Variation
1000 100
VDD = –10 V td (off)
ID = –1.2 A
VGS = –2.7 V tr tf
t, TIME (ns)
t, TIME (ns)
td
100 10 (on)
tr
tf
td (off) VDD = –10 V
ID = –2.4 A
VGS = –4.5 V
td (on)
10 1.0
1.0 10 100 1.0 10 100
RG, GATE RESISTANCE (OHMS) RG, GATE RESISTANCE (OHMS)
Figure 9. Resistive Switching Time Variation Figure 10. Resistive Switching Time Variation
versus Gate Resistance versus Gate Resistance
2
–IS, SOURCE CURRENT (AMPS)
VGS = 0 V
TJ = 25°C di/dt
1.6
IS
trr
1.2
ta tb
TIME
0.8
tp 0.25 IS
0.4 IS
0
0.4 0.5 0.6 0.7 0.8 0.9 1 Figure 12. Diode Reverse Recovery Waveform
–VSD, SOURCE–TO–DRAIN VOLTAGE (VOLTS)
http://onsemi.com
251
NTTS2P02R2
D = 0.5
0.2
0.05
0.02
Single Pulse
0.01
1E–03 1E–02 1E–01 1E+00 1E+03 1E+02 1E+03
t, TIME (s)
0.041
1.04
0.208 0.126
5.28 3.20
0.015 0.0256
0.38 0.65
inches
mm
http://onsemi.com
252
NTTS2P02R2
SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • The soldering temperature and time shall not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within • When shifting from preheating to soldering, the
a short time could result in device failure. Therefore, the maximum temperature gradient shall be 5°C or less.
following items should always be observed in order to • After soldering has been completed, the device should
minimize the thermal stress to which the devices are be allowed to cool naturally for at least three minutes.
subjected. Gradual cooling should be used as the use of forced
• Always preheat the device. cooling will increase the temperature gradient and
• The delta temperature between the preheat and result in latent failure due to mechanical stress.
soldering should be 100°C or less.* • Mechanical stress or shock should not be applied
• When preheating and soldering, the temperature of the during cooling.
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When * Soldering a device without preheating can cause
using infrared heating with the reflow soldering excessive thermal shock and stress which can result in
method, the difference shall be a maximum of 10°C. damage to the device.
150°C
SOLDER IS LIQUID FOR
40 TO 80 SECONDS
100°C 140°C (DEPENDING ON
MASS OF ASSEMBLY)
100°C
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253
NTTS2P02R2
SECTION B–B
NOTES:
1. CONFORMS TO EIA–481–1.
2. CONTROLLING DIMENSION: MILLIMETER.
18.4 (.724)
MAX.
NOTE 3
13.2 (.52)
12.8 (.50)
330.0 50.0
(13.20) (1.97)
MAX. MIN.
14.4 (.57)
12.4 (.49)
NOTE 4
NOTES:
1. CONFORMS TO EIA–481–1.
2. CONTROLLING DIMENSION: MILLIMETER.
3. INCLUDES FLANGE DISTORTION AT OUTER EDGE.
4. DIMENSION MEASURED AT INNER HUB.
http://onsemi.com
254
#!
#$%& '(
-, !
P–Channel Enhancement Mode
Single Micro8t Package http://onsemi.com
Features
• Ultra Low RDS(on) –2.48 AMPERES
• Higher Efficiency Extending Battery Life
• Miniature Micro8 Surface Mount Package –30 VOLTS
• Diode Exhibits High Speed, Soft Recovery 85 mW @ VGS = –10 V
• Micro8 Mounting Information Provided
Applications Single P–Channel
• Power Management in Portable and Battery–Powered Products, i.e.:
Cellular and Cordless Telephones and PCMCIA Cards D
http://onsemi.com
256
NTTS2P03R2
3 5
–10 V –3.5 V
–3.3 V TJ = 25°C VDS ≥ –10 V
–3.7 V 4
–3.9 V –3.1 V
2 –4.1 V
–4.5 V 3
–4.9 V –2.9 V
–6 V TJ = 25°C
2
1
–2.7 V
1 TJ = 100°C
–2.5 V
TJ = –55°C
VGS = –2.3 V
0 0
0 0.25 0.5 0.75 1 1.25 1.5 1.75 1 2 3 4 5
–VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS) –VGS, GATE–TO–SOURCE VOLTAGE (VOLTS)
0.15
VGS = –10 V
0.1 0.05
0.05
0 0
0 2 4 6 8 10 0.5 1.5 2.5 3.5 4.5 5.5
–VGS, GATE–TO–SOURCE VOLTAGE (VOLTS) –ID, DRAIN CURRENT (AMPS)
1.6 10,000
VGS = 0 V
ID = –2.48 A
1.4
–IDSS, LEAKAGE (nA)
1.2
100
1
TJ = 100°C
10
0.8
0.6 1
–50 –25 0 25 50 75 100 125 150 5 10 15 20 25 30
TJ, JUNCTION TEMPERATURE (°C) –VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS)
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257
NTTS2P03R2
1000 QT
4 VGS 20
800 Q1 Q2
Crss
3 15
600 Ciss
400 2 10
ID = –2.48 A
200 Coss 1 5
TJ = 25°C
Crss VDS
0 0 0
–10 –5 0 5 10 15 20 25 30 0 2 4 6 8 10 12 14 16
–VGS –VDS Qg, TOTAL GATE CHARGE (nC)
GATE–TO–SOURCE OR DRAIN–TO–SOURCE
VOLTAGE (VOLTS) Figure 8. Gate–to–Source and
Drain–to–Source Voltage versus Total Charge
Figure 7. Capacitance Variation
100 3
–IS, SOURCE CURRENT (AMPS)
2.5 VGS = 0 V
td (off)
TJ = 25°C
tf 2
t, TIME (ns)
tr
10 1.5
td (on)
1
VDD = –24 V
ID = –2.48 A 0.5
VGS = –10 V
1 0
1 10 100 0.4 0.5 0.6 0.7 0.8 0.9 1
RG, GATE RESISTANCE (OHMS) –VSD, SOURCE–TO–DRAIN VOLTAGE (VOLTS)
Figure 9. Resistive Switching Time Variation Figure 10. Diode Forward Voltage
versus Gate Resistance versus Current
100
VGS = 30 V
SINGLE PULSE
ID , DRAIN CURRENT (AMPS)
di/dt
TC = 25°C
10 IS
1 ms
trr
10 ms ta tb
1 TIME
tp 0.25 IS
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258
NTTS2P03R2
1000
Rthja(t), EFFECTIVE TRANSIENT
THERMAL RESISTANCE (°C/W)
100 D = 0.5
0.2
0.1
10 0.05 *0
θ,' " ('
θ,
0.02
- .
/
0.01
/
1 '
'
'# ,*0 " *0
θ,'
- - " '&'#
SINGLE PULSE
0.1
1.0E–05 1.0E–04 1.0E–03 1.0E–02 1.0E–01 1.0E+00 1.0E+01 1.0E+02 1.0E+03
t, TIME (s)
0.041
1.04
0.208 0.126
5.28 3.20
0.015 0.0256
0.38 0.65
inches
mm
http://onsemi.com
259
NTTS2P03R2
SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • The soldering temperature and time shall not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within • When shifting from preheating to soldering, the
a short time could result in device failure. Therefore, the maximum temperature gradient shall be 5°C or less.
following items should always be observed in order to • After soldering has been completed, the device should
minimize the thermal stress to which the devices are be allowed to cool naturally for at least three minutes.
subjected. Gradual cooling should be used as the use of forced
• Always preheat the device. cooling will increase the temperature gradient and
• The delta temperature between the preheat and result in latent failure due to mechanical stress.
soldering should be 100°C or less.* • Mechanical stress or shock should not be applied
• When preheating and soldering, the temperature of the during cooling.
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When * Soldering a device without preheating can cause
using infrared heating with the reflow soldering excessive thermal shock and stress which can result in
method, the difference shall be a maximum of 10°C. damage to the device.
150°C
SOLDER IS LIQUID FOR
40 TO 80 SECONDS
100°C 140°C (DEPENDING ON
MASS OF ASSEMBLY)
100°C
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260
NTTS2P03R2
SECTION B–B
NOTES:
1. CONFORMS TO EIA–481–1.
2. CONTROLLING DIMENSION: MILLIMETER.
18.4 (.724)
MAX.
NOTE 3
13.2 (.52)
12.8 (.50)
330.0 50.0
(13.20) (1.97)
MAX. MIN.
14.4 (.57)
12.4 (.49)
NOTE 4
NOTES:
1. CONFORMS TO EIA–481–1.
2. CONTROLLING DIMENSION: MILLIMETER.
3. INCLUDES FLANGE DISTORTION AT OUTER EDGE.
4. DIMENSION MEASURED AT INNER HUB.
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261
7
#$%& '(
Dual N–Channel SC–88
• 2.5 V Gate Drive with Low On–Resistance http://onsemi.com
• Low Threshold Voltage: Vth = 0.5 to 1.5 V, Ideal for Portable
• High Speed 100 mAMPS
• Enhancement Mode 20 VOLTS
• Small Package RDS(on) = 10
• Easily Designed Drive Circuits
N–Channel
MAXIMUM RATINGS (TJ = 25°C unless otherwise noted)
Rating Symbol Value Unit
Drain–to–Source Voltage VDS 20 Vdc
Gate–to–Source Voltage – Continuous VGSS 10 Vdc
Drain Current mAdc
– Continuous @ TA = 25°C ID 100
PIN ASSIGNMENT
Source–1 1 6 Drain–1
Gate–1 2 5 Gate–2
Drain–2 3 4 Source–2
Top View
ORDERING INFORMATION
SWITCHING CHARACTERISTICS
Turn–On Delay Time (VDD = 3.0 Vdc, ID = 10 mAdc, ton – 0.14 – µs
Turn–Off Delay Time VGS = 0 to 2.5 Vdc) toff – 0.14 –
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263
"
Preferred Device
0
0 '(
N–Channel TO–92
THERMAL CHARACTERISTICS
Characteristic Symbol Max Unit
TO–92
Thermal Resistance, Junction to RθJA 357 °C/W
CASE 29
Ambient
Style 22
Maximum Lead Temperature for TL 300 °C
Soldering Purposes, 1/16″ from case 12
3
for 10 seconds
MARKING DIAGRAM
& PIN ASSIGNMENT
2N7000
YWW
1 3
Source Drain
2
Gate
Y = Year
WW = Work Week
ORDERING INFORMATION
See detailed ordering and shipping information in the package
dimensions section on page 266 of this data sheet.
OFF CHARACTERISTICS
Drain–Source Breakdown Voltage V(BR)DSS 60 – Vdc
(VGS = 0, ID = 10 µAdc)
Zero Gate Voltage Drain Current IDSS
(VDS = 48 Vdc, VGS = 0) – 1.0 µAdc
(VDS = 48 Vdc, VGS = 0, TJ = 125°C) – 1.0 mAdc
Gate–Body Leakage Current, Forward IGSSF – –10 nAdc
(VGSF = 15 Vdc, VDS = 0)
DYNAMIC CHARACTERISTICS
Input Capacitance Ciss – 60 pF
Output Capacitance ((VDS = 25 V,, VGS = 0,, Coss – 25
f=11.0
0 MH
MHz))
Reverse Transfer Crss – 5.0
Capacitance
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265
2N7000
#
8 " #$° "
?$$° #$°
9 " 8
#$°
6 7
# 9
8
:
8 6
9
9
6 $ #
# 6
4
# 4 6 $ 9 : 8 7 # 4 6 $ 9 : 8 7
#6 #
'2
<
## $
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#
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9
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# 7
8$
8 8
9 :$
6 :
?9 ?# 5?# 5?9 5? 5?6 ?9 ?# 5?# 5?9 5? 5?6
°
°
ORDERING INFORMATION
http://onsemi.com
266
"
Preferred Device
0
0 '(
N–Channel SOT–23
MAXIMUM RATINGS
http://onsemi.com
Rating Symbol Value Unit
Drain–Source Voltage VDSS 60 Vdc 115 mAMPS
Drain–Gate Voltage (RGS = 1.0 MΩ) VDGR 60 Vdc 60 VOLTS
Drain Current ID ±?115 mAdc RDS(on) = 7.5
– Continuous TC = 25°C (Note 1.) ID ±?75
– Continuous TC = 100°C (Note 1.) IDM ±?800 N–Channel
– Pulsed (Note 2.) 4
Gate–Source Voltage
– Continuous VGS ±?20 Vdc
– Non–repetitive (tp ≤ 50 µs) VGSM ±?40 Vpk
THERMAL CHARACTERISTICS
Characteristic Symbol Max Unit
Total Device Dissipation FR–5 Board PD 225 mW
(Note 3.) TA = 25°C 1.8 mW/°C
#
Derate above 25°C
Thermal Resistance, Junction to Ambient RθJA 556 °C/W
3
Total Device Dissipation PD 300 mW
Alumina Substrate,(Note 4.) TA = 25°C mW/°C
Derate above 25°C 2.4 1
2
Thermal Resistance, Junction to Ambient RθJA 417 °C/W
SOT–23
Junction and Storage Temperature TJ, Tstg –?55 to °C
CASE 318
+150
STYLE 21
1. The Power Dissipation of the package may result in a lower continuous drain
current. MARKING DIAGRAM
2. Pulse Test: Pulse Width ≤ 300 µs, Duty Cycle ≤ 2.0%. & PIN ASSIGNMENT
3. FR–5 = 1.0 x 0.75 x 0.062 in.
4. Alumina = 0.4 x 0.3 x 0.025 in 99.5% alumina. ()%
3
702
W
1 2
)'1 ;(1
702 = Device Code
W = Work Week
ORDERING INFORMATION
OFF CHARACTERISTICS
Drain–Source Breakdown Voltage V(BR)DSS 60 – – Vdc
(VGS = 0, ID = 10 µAdc)
Zero Gate Voltage Drain Current TJ = 25°C IDSS – – 1.0 µAdc
(VGS = 0, VDS = 60 Vdc) TJ = 125°C – – 500
Gate–Body Leakage Current, Forward IGSSF – – 100 nAdc
(VGS = 20 Vdc)
Gate–Body Leakage Current, Reverse IGSSR – – –100 nAdc
(VGS = –?20 Vdc)
DYNAMIC CHARACTERISTICS
Input Capacitance Ciss – – 50 pF
(VDS = 25 Vdc, VGS = 0, f = 1.0 MHz)
Output Capacitance Coss – – 25 pF
(VDS = 25 Vdc, VGS = 0, f = 1.0 MHz)
Reverse Transfer Capacitance Crss – – 5.0 pF
(VDS = 25 Vdc, VGS = 0, f = 1.0 MHz)
http://onsemi.com
268
2N7002LT1
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269
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SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • The soldering temperature and time shall not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within • When shifting from preheating to soldering, the
a short time could result in device failure. Therefore, the maximum temperature gradient shall be 5°C or less.
following items should always be observed in order to • After soldering has been completed, the device should
minimize the thermal stress to which the devices are be allowed to cool naturally for at least three minutes.
subjected. Gradual cooling should be used as the use of forced
• Always preheat the device. cooling will increase the temperature gradient and
• The delta temperature between the preheat and result in latent failure due to mechanical stress.
soldering should be 100°C or less.* • Mechanical stress or shock should not be applied
• When preheating and soldering, the temperature of the during cooling.
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When * Soldering a device without preheating can cause
using infrared heating with the reflow soldering excessive thermal shock and stress which can result in
method, the difference shall be a maximum of 10°C. damage to the device.
http://onsemi.com
270
" "
Preferred Device
0
0 '(
N–Channel TO–92
TO–92
CASE 29
Style 30
12
3
MARKING DIAGRAM
& PIN ASSIGNMENT
BS107
YWW
1 3
Drain Source
2
Gate
Y = Year
WW = Work Week
ORDERING INFORMATION
See detailed ordering and shipping information in the package
dimensions section on page 274 of this data sheet.
OFF CHARACTERISTICS
Zero–Gate–Voltage Drain Current (VDS = 130 Vdc, VGS = 0) IDSS – – 30 nAdc
Drain–Source Breakdown Voltage (VGS = 0, ID = 100 µAdc) V(BR)DSX 200 – – Vdc
Gate Reverse Current (VGS = 15 Vdc, VDS = 0) IGSS – 0.01 10 nAdc
ON CHARACTERISTICS (Note 3.)
Gate Threshold Voltage (ID = 1.0 mAdc, VDS = VGS) VGS(Th) 1.0 – 3.0 Vdc
Static Drain–Source On Resistance rDS(on) Ohms
BS107 (VGS = 2.6 Vdc, ID = 20 mAdc) – – 28
(VGS = 10 Vdc, ID = 200 mAdc) – – 14
BS107A (VGS = 10 Vdc)
(ID = 100 mAdc) – 4.5 6.0
(ID = 250 mAdc) – 4.8 6.4
SMALL–SIGNAL CHARACTERISTICS
Input Capacitance Ciss – 60 – pF
(VDS = 25 Vdc, VGS = 0, f = 1.0 MHz)
Reverse Transfer Capacitance Crss – 6.0 – pF
(VDS = 25 Vdc, VGS = 0, f = 1.0 MHz)
Output Capacitance Coss – 30 – pF
(VDS = 25 Vdc, VGS = 0, f = 1.0 MHz)
Forward Transconductance gfs 200 400 – mmhos
(VDS = 25 Vdc, ID = 250 mAdc)
SWITCHING CHARACTERISTICS
Turn–On Time ton – 6.0 15 ns
Turn–Off Time toff – 12 15 ns
3. Pulse Test: Pulse Width v 300 µs, Duty Cycle v 2.0%.
RESISTIVE SWITCHING
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272
BS107, BS107A
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BS107, BS107A
ORDERING INFORMATION
http://onsemi.com
274
,
Preferred Device
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*
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N–Channel TO–92
http://onsemi.com
This MOSFET is designed for high voltage, high speed switching
applications such as line drivers, relay drivers, CMOS logic, 250 mAMPS
microprocessor or TTL to high voltage interface and high voltage 200 VOLTS
display drivers.
• Low Drive Requirement, VGS = 3.0 V max RDS(on) = 8 Ω
• Inherent Current Sharing Capability Permits Easy Paralleling of N–Channel
many Devices
MAXIMUM RATINGS
Rating Symbol Value Unit
Drain–Source Voltage VDSS 200 Vdc
BS108
YWW
1 3
Drain Source
2
Gate
BS108 = Device Code
Y = Year
WW = Work Week
ORDERING INFORMATION
SWITCHING CHARACTERISTICS
Turn–On Time (See Figure 1) td(on) – – 15 ns
Turn–Off Time (See Figure 1) td(off) – – 15 ns
3. Pulse Test: Pulse Width ≤ 300 µs, Duty Cycle = 2.0%.
RESISTIVE SWITCHING
5#$
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http://onsemi.com
276
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Preferred Device
0
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N–Channel TO–92
TO–92
CASE 29
Style 30
12
3
MARKING DIAGRAM
& PIN ASSIGNMENT
BS170
YWW
1 3
Drain Source
2
Gate
Y = Year
WW = Work Week
ORDERING INFORMATION
See detailed ordering and shipping information in the package
dimensions section on page 278 of this data sheet.
OFF CHARACTERISTICS
Gate Reverse Current IGSS – 0.01 10 nAdc
(VGS = 15 Vdc, VDS = 0)
Drain–Source Breakdown Voltage V(BR)DSS 60 90 – Vdc
(VGS = 0, ID = 100 µAdc)
SMALL–SIGNAL CHARACTERISTICS
Input Capacitance Ciss – – 60 pF
(VDS = 10 Vdc, VGS = 0, f = 1.0 MHz)
SWITCHING CHARACTERISTICS
Turn–On Time ton – 4.0 10 ns
(ID = 0.2 Adc) See Figure 1
Turn–Off Time toff – 4.0 10 ns
(ID = 0.2 Adc) See Figure 1
2. Pulse Test: Pulse Width v 300 µs, Duty Cycle v 2.0%.
ORDERING INFORMATION
http://onsemi.com
278
BS170
RESISTIVE SWITCHING
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279
!
Preferred Device
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N–Channel SOT–23
MAXIMUM RATINGS
http://onsemi.com
Rating Symbol Value Unit
Drain–Source Voltage VDSS 100 Vdc 170 mAMPS
Gate–Source Voltage 100 VOLTS
– Continuous VGS ±20 Vdc
– Non–repetitive (tp ≤ 50 µs) VGSM ±40 Vpk RDS(on) = 6
Drain Current Adc N–Channel
Continuous (Note 1.) ID 0.17 4
Pulsed (Note 2.) IDM 0.68
THERMAL CHARACTERISTICS
Characteristic Symbol Max Unit
Total Device Dissipation FR–5 PD 225 mW
Board (Note 3.)
TA = 25°C 1.8 mW/°C
Derate above 25°C
#
Thermal Resistance, Junction to RqJA 556 °C/W
Ambient MARKING
Junction and Storage Temperature TJ, Tstg –55 to +150 °C DIAGRAM
1. The Power Dissipation of the package may result in a lower continuous drain
current. 3
2. Pulse Width v 300 ms, Duty Cycle v 2.0%. SOT–23 SA
3. FR–5 = 1.0 0.75 0.062 in. CASE 318 W
1 STYLE 21
2
SA = Device Code
W = Work Week
PIN ASSIGNMENT
()%
3
1 2
)'1 ;(1
ORDERING INFORMATION
OFF CHARACTERISTICS
Drain–Source Breakdown Voltage V(BR)DSS 100 – – Vdc
(VGS = 0, ID = 250 µAdc)
Zero Gate Voltage Drain Current IDSS µAdc
(VGS = 0, VDS = 100 Vdc) TJ = 25°C – – 15
TJ = 125°C – – 60
Gate–Body Leakage Current IGSS – – 50 nAdc
(VGS = 20 Vdc, VDS = 0)
DYNAMIC CHARACTERISTICS
Input Capacitance Ciss – 20 – pF
(VDS = 25 Vdc, VGS = 0, f = 1.0 MHz)
Output Capacitance Coss – 9.0 – pF
(VDS = 25 Vdc, VGS = 0, f = 1.0 MHz)
Reverse Transfer Capacitance Crss – 4.0 – pF
(VDS = 25 Vdc, VGS = 0, f = 1.0 MHz)
SWITCHING CHARACTERISTICS(4)
Turn–On Delay Time (VCC = 30 Vdc, IC = 0.28 Adc, td(on) – 20 – ns
Turn–Off Delay Time VGS = 10 Vdc, RGS = 50 Ω) td(off) – 40 – ns
REVERSE DIODE
Diode Forward On–Voltage VSD – – 1.3 V
(ID = 0.34 Adc, VGS = 0 Vdc)
4. Pulse Test: Pulse Width v 300 ms, Duty Cycle v 2.0%.
http://onsemi.com
281
BSS123LT1
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282
BSS123LT1
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SOT–23
The power dissipation of the SOT–23 is a function of the one can calculate the power dissipation of the device which
pad size. This can vary from the minimum pad size for in this case is 225 milliwatts.
soldering to a pad size given for maximum power 150°C – 25°C
PD = = 225 milliwatts
dissipation. Power dissipation for a surface mount device is 556°C/W
determined by TJ(max), the maximum rated junction
temperature of the die, RθJA, the thermal resistance from The 556°C/W for the SOT–23 package assumes the use
the device junction to ambient, and the operating of the recommended footprint on a glass epoxy printed
temperature, TA. Using the values provided on the data circuit board to achieve a power dissipation of 225
sheet for the SOT–23 package, PD can be calculated as milliwatts. There are other alternatives to achieving higher
follows: power dissipation from the SOT–23 package. Another
alternative would be to use a ceramic substrate or an
TJ(max) – TA
PD = aluminum core board such as Thermal Cladt. Using a
RθJA board material such as Thermal Clad, an aluminum core
The values for the equation are found in the maximum board, the power dissipation can be doubled using the same
ratings table on the data sheet. Substituting these values footprint.
into the equation for an ambient temperature TA of 25°C,
SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • The soldering temperature and time shall not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within • When shifting from preheating to soldering, the
a short time could result in device failure. Therefore, the maximum temperature gradient shall be 5°C or less.
following items should always be observed in order to • After soldering has been completed, the device should
minimize the thermal stress to which the devices are be allowed to cool naturally for at least three minutes.
subjected. Gradual cooling should be used as the use of forced
• Always preheat the device. cooling will increase the temperature gradient and
• The delta temperature between the preheat and result in latent failure due to mechanical stress.
soldering should be 100°C or less.* • Mechanical stress or shock should not be applied
• When preheating and soldering, the temperature of the during cooling.
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When * Soldering a device without preheating can cause
using infrared heating with the reflow soldering excessive thermal shock and stress which can result in
method, the difference shall be a maximum of 10°C. damage to the device.
http://onsemi.com
283
!,
Preferred Device
#$%& '(
N–Channel SOT–23
Typical applications are dc–dc converters, power management in
portable and battery–powered products such as computers, printers,
PCMCIA cards, cellular and cordless telephones. http://onsemi.com
• Low Threshold Voltage (VGS(th): 0.5V...1.5V) makes it ideal for low
voltage applications 200 mAMPS
• Miniature SOT–23 Surface Mount Package saves board space 50 VOLTS
RDS(on) = 3.5
MAXIMUM RATINGS (TA = 25°C unless otherwise noted)
Rating Symbol Value Unit N–Channel
4
Drain–to–Source Voltage VDSS 50 Vdc
Gate–to–Source Voltage – Continuous VGS ± 20 Vdc
Drain Current mA
– Continuous @ TA = 25°C ID 200
– Pulsed Drain Current (tp ≤ 10 µs) IDM 800
J1 = Device Code
W = Work Week
PIN ASSIGNMENT
3
()%
1 2
)'1 ;(1
ORDERING INFORMATION
DYNAMIC CHARACTERISTICS
Input Capacitance (VDS = 25 Vdc, VGS = 0, f = 1 MHz) Ciss – 40 50 pF
Output Capacitance (VDS = 25 Vdc, VGS = 0, f = 1 MHz) Coss – 12 25
Transfer Capacitance (VDG = 25 Vdc, VGS = 0, f = 1 MHz) Crss – 3.5 5.0
http://onsemi.com
285
BSS138LT1
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286
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http://onsemi.com
287
BSS138LT1
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SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • The soldering temperature and time shall not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within • When shifting from preheating to soldering, the
a short time could result in device failure. Therefore, the maximum temperature gradient shall be 5°C or less.
following items should always be observed in order to • After soldering has been completed, the device should
minimize the thermal stress to which the devices are be allowed to cool naturally for at least three minutes.
subjected. Gradual cooling should be used as the use of forced
• Always preheat the device. cooling will increase the temperature gradient and
• The delta temperature between the preheat and result in latent failure due to mechanical stress.
soldering should be 100°C or less.* • Mechanical stress or shock should not be applied
• When preheating and soldering, the temperature of the during cooling.
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When * Soldering a device without preheating can cause
using infrared heating with the reflow soldering excessive thermal shock and stress which can result in
method, the difference shall be a maximum of 10°C. damage to the device.
http://onsemi.com
288
,
Preferred Device
#$%& '(
!
P–Channel SOT–23
These miniature surface mount MOSFETs reduce power loss
conserve energy, making this device ideal for use in small power
management circuitry. Typical applications are dc–dc converters, load http://onsemi.com
switching, power management in portable and battery–powered
products such as computers, printers, cellular and cordless telephones. 130 mAMPS
• Energy Efficient 50 VOLTS
• Miniature SOT–23 Surface Mount Package Saves Board Space RDS(on) = 10
MAXIMUM RATINGS (TJ = 25°C unless otherwise noted) P–Channel
Rating Symbol Value Unit 4
PD = Device Code
W = Work Week
PIN ASSIGNMENT
3
()%
1 2
)'1 ;(1
ORDERING INFORMATION
DYNAMIC CHARACTERISTICS
Input Capacitance (VDS = 5.0 Vdc) Ciss – 30 – pF
Output Capacitance (VDS = 5.0 Vdc) Coss – 10 –
Transfer Capacitance (VDG = 5.0 Vdc) Crss – 5.0 –
6
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290
BSS84LT1
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SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • The soldering temperature and time shall not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within • When shifting from preheating to soldering, the
a short time could result in device failure. Therefore, the maximum temperature gradient shall be 5°C or less.
following items should always be observed in order to • After soldering has been completed, the device should
minimize the thermal stress to which the devices are be allowed to cool naturally for at least three minutes.
subjected. Gradual cooling should be used as the use of forced
• Always preheat the device. cooling will increase the temperature gradient and
• The delta temperature between the preheat and result in latent failure due to mechanical stress.
soldering should be 100°C or less.* • Mechanical stress or shock should not be applied
• When preheating and soldering, the temperature of the during cooling.
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When * Soldering a device without preheating can cause
using infrared heating with the reflow soldering excessive thermal shock and stress which can result in
method, the difference shall be a maximum of 10°C. damage to the device.
http://onsemi.com
292
#!
!
Preferred Device
!
N–Channel TO–220 and D2PAK
This Logic Level Insulated Gate Bipolar Transistor (IGBT) features http://onsemi.com
monolithic circuitry integrating ESD and Over–Voltage clamped
protection for use in inductive coil drivers applications. Primary uses 15 AMPERES
include Ignition, Direct Fuel Injection, or wherever high voltage and 350 VOLTS (Clamped)
high current switching is required.
VCE(on) @ 10 A = 1.8 V Max
• Ideal for Coil–On–Plug, IGBT–On–Coil, or Distributorless Ignition
System Applications N–Channel
• High Pulsed Current Capability up to 50 A C
• Gate–Emitter ESD Protection
• Temperature Compensated Gate–Collector Voltage Clamp Limits
G RG
Stress Applied to Load
• Integrated ESD Diode Protection RGE
• Low Threshold Voltage to Interface Power Loads to Logic or
Microprocessor Devices 4
• Low Saturation Voltage E
1 2
MAXIMUM RATINGS (–55°C ≤ TJ ≤ 175°C unless otherwise noted)
3
Rating Symbol Value Unit
TO–220AB D2PAK
Collector–Emitter Voltage VCES 380 VDC CASE 221A CASE 418B
STYLE 9 STYLE 4
Collector–Gate Voltage VCER 380 VDC 1
2
Gate–Emitter Voltage VGE 22 VDC 3 MARKING DIAGRAMS
& PIN ASSIGNMENTS
Collector Current–Continuous IC 15 ADC
4 4
@ TC = 25°C – Pulsed 50 AAC
Collector Collector
ESD (Human Body Model) ESD kV
R = 1500 Ω, C = 100 pF 8.0
ESD (Machine Model) R = 0 Ω, C = 200 pF ESD 800 V G15N35CL
YWW
Total Power Dissipation @ TC = 25°C PD 150 Watts G15N35CL
Derate above 25°C 1.0 W/°C YWW
1 3
Operating and Storage Temperature Range TJ, Tstg –55 to °C Gate Emitter
1 3 2
175
Gate Emitter Collector
UNCLAMPED COLLECTOR–TO–EMITTER AVALANCHE
CHARACTERISTICS (–55°C ≤ TJ ≤ 175°C) 2
G15N35CL = Device Code
Collector
Y = Year
Characteristic Symbol Value Unit
WW = Work Week
Single Pulse Collector–to–Emitter Avalanche EAS mJ
Energy ORDERING INFORMATION
VCC = 50 V, VGE = 5.0 V, Pk IL = 17.4 A, L 300
= 2.0 mH, Starting TJ = 25°C Device Package Shipping
VCC = 50 V, VGE = 5.0 V, Pk IL = 14.2 A, L 200
MGP15N35CL TO–220 50 Units/Rail
= 2.0 mH, Starting TJ = 150°C
MGB15N35CLT4 D2PAK 800 Tape & Reel
Reverse Avalanche Energy EAS(R) mJ
VCC = 100 V, VGE = 20 V, L = 3.0 mH, 1000
Pk IL = 25.8 A, Starting TJ = 25°C Preferred devices are recommended choices for future use
and best overall value.
THERMAL CHARACTERISTICS
Characteristic Symbol Value Unit
Thermal Resistance, Junction to Case RθJC 1.0 °C/W
Thermal Resistance, Junction to Ambient TO–220 RθJA 62.5
ELECTRICAL CHARACTERISTICS
Characteristic Symbol Test Conditions Temperature Min Typ Max Unit
OFF CHARACTERISTICS
Collector–Emitter
Collector Emitter Clamp
Clam Voltage BVCES IC = 2.0 mA TJ = –40°C
40 C to 320 350 380 VDC
150°C
IC = 10 mA TJ = –40°C to 330 360 380
150°C
http://onsemi.com
294
MGP15N35CL, MGB15N35CL
http://onsemi.com
295
MGP15N35CL, MGB15N35CL
60 60
IC, COLLECTOR CURRENT (AMPS)
15 2.0
TJ = 150°C
1.5
10
TJ = 25°C 1.0 IC = 15 A IC = 5 A
5 TJ = –40°C
0.5
IC = 10 A
0 0.0
0 0.5 1 1.5 2 2.5 3 3.5 4 4.5 5 –50 –25 0 25 50 75 100 125 150
VGE, GATE TO EMITTER VOLTAGE (VOLTS) TJ, JUNCTION TEMPERATURE (°C)
10000 2.5
Mean + 4 σ
THRESHOLD VOLTAGE (VOLTS)
IC = 1 mA
Mean
Ciss 2.0
C, CAPACITANCE (pF)
1000
1.5
Coss
100 Mean – 4 σ
1.0
10
Crss
0.5
1 0.0
0 20 40 60 80 100 120 140 160 180 200 –50 –25 0 25 50 75 100 125 150
VCE, COLLECTOR TO EMITTER VOLTAGE (VOLTS) TEMPERATURE (°C)
http://onsemi.com
296
MGP15N35CL, MGB15N35CL
30 30
VCC = 50 V VCC = 50 V
IL, LATCH CURRENT (AMPS)
0 0
0 2 4 6 8 10 –50 –25 0 25 50 75 100 125 150 175
INDUCTOR (mH) TEMPERATURE (°C)
Figure 7. Minimum Open Secondary Latch Figure 8. Minimum Open Secondary Latch
Current vs. Inductor Current vs. Temperature
30 30
VCC = 50 V
VCC = 50 V
T = 25°C VGE = 5.0 V
IL, LATCH CURRENT (AMPS)
5 5
0 0
0 2 4 6 8 10 –50 –25 0 25 50 75 100 125 150 175
INDUCTOR (mH) TEMPERATURE (°C)
Figure 9. Typical Open Secondary Latch Figure 10. Typical Open Secondary Latch
Current vs. Inductor Current vs. Temperature
12 14
VCC = 300 V
VGE = 5.0 V 12 tf
10
RG = 1000 Ω
SWITCHING TIME (µS)
SWITCHING TIME (µS)
tf
IC = 10 A 10 VCC = 300 V
8 L = 300 µH VGE = 5.0 V
8 RG = 1000 Ω
6 td(off) TJ = 150°C td(off)
6 L = 300 µH
4
4
2 2
0 0
–50 –25 0 25 50 75 100 125 150 0 2 4 6 8 10 12 14 16
TC, CASE TEMPERATURE (°C) IC, COLLECTOR CURRENT (AMPS)
Figure 11. Switching Speed vs. Case Figure 12. Switching Speed vs. Collector
Temperature Current
http://onsemi.com
297
MGP15N35CL, MGB15N35CL
14 14
VCC = 300 V
12 VGE = 5.0 V 12 tf
TJ = 25°C
SWITCHING TIME (µS)
2 2
0 0
250 500 750 1000 250 500 750 1000
RG, EXTERNAL GATE RESISTANCE (Ω) RG, EXTERNAL GATE RESISTANCE (Ω)
Figure 13. Switching Speed vs. External Gate Figure 14. Switching Speed vs. External Gate
Resistance Resistance
10
R(t), TRANSIENT THERMAL RESISTANCE (°C/Watt)
1 0.2
0.1
0.05
0.02
0.1
D CURVES APPLY FOR POWER
0.01 P(pk)
PULSE TRAIN SHOWN
t1 READ TIME AT T1
Single Pulse
t2 TJ(pk) – TA = P(pk) RθJA(t)
RθJC ≅ R(t) for t ≤ 0.2 s
DUTY CYCLE, D = t1/t2
0.01
0.00001 0.0001 0.001 0.01 0.1 1 10 100 1000
t,TIME (S)
http://onsemi.com
298
MGP15N35CL, MGB15N35CL
1.5″
4″
4″
0.125″
4″
100 100
COLLECTOR CURRENT (AMPS)
COLLECTOR CURRENT (AMPS)
DC DC
10 100 µs 10
100 µs
1 ms
1 10 ms 1 1 ms
100 ms 10 ms
100 ms
0.1 0.1
0.01 0.01
1 10 100 1000 1 10 100 1000
COLLECTOR–EMITTER VOLTAGE (VOLTS) COLLECTOR–EMITTER VOLTAGE (VOLTS)
Figure 17. Single Pulse Safe Operating Area Figure 18. Single Pulse Safe Operating Area
(Mounted on an Infinite Heatsink at TC = 255C) (Mounted on an Infinite Heatsink at TC = 1255C)
http://onsemi.com
299
MGP15N35CL, MGB15N35CL
100 100
1 1
P(pk) P(pk)
t1 t1
0.1 0.1
t2 t2
DUTY CYCLE, D = t1/t2 DUTY CYCLE, D = t1/t2
0.01 0.01
1 10 100 1000 1 10 100 1000
COLLECTOR–EMITTER VOLTAGE (VOLTS) COLLECTOR–EMITTER VOLTAGE (VOLTS)
Figure 19. Pulse Train Safe Operating Area Figure 20. Pulse Train Safe Operating Area
(Mounted on an Infinite Heatsink at TC = 255C) (Mounted on an Infinite Heatsink at TC = 1255C)
http://onsemi.com
300
#
Preferred Device
N–Channel TO–220 and D2PAK
This Logic Level Insulated Gate Bipolar Transistor (IGBT) features http://onsemi.com
monolithic circuitry integrating ESD and Over–Voltage clamped
protection for use in inductive coil drivers applications. Primary uses 15 AMPERES
include Ignition, Direct Fuel Injection, or wherever high voltage and 410 VOLTS (Clamped)
high current switching is required.
VCE(on) @ 10 A = 1.8 V Max
• Ideal for Coil–On–Plug, IGBT–On–Coil, or Distributorless Ignition
System Applications N–Channel
• High Pulsed Current Capability up to 50 A C
• Gate–Emitter ESD Protection
• Temperature Compensated Gate–Collector Voltage Clamp Limits
Stress Applied to Load G RG
1 2
MAXIMUM RATINGS (–55°C ≤ TJ ≤ 175°C unless otherwise noted)
3
Rating Symbol Value Unit
TO–220AB D2PAK
Collector–Emitter Voltage VCES 380 VDC CASE 221A CASE 418B
STYLE 9 STYLE 4
Collector–Gate Voltage VCER 380 VDC 1
2
Gate–Emitter Voltage VGE 22 VDC 3 MARKING DIAGRAMS
& PIN ASSIGNMENTS
Collector Current–Continuous IC 15 ADC
@ TC = 25°C – Pulsed 50 AAC 4 4
Collector Collector
ESD (Human Body Model) ESD kV
R = 1500 Ω, C = 100 pF 8.0
ESD (Machine Model) R = 0 Ω, C = 200 pF ESD 800 V G15N40CL
YWW
Total Power Dissipation @ TC = 25°C PD 150 Watts G15N40CL
Derate above 25°C 1.0 W/°C YWW
1 3
Operating and Storage Temperature Range TJ, Tstg –55 to °C
Gate 2 Emitter
175 1 3
Gate Emitter Collector
UNCLAMPED COLLECTOR–TO–EMITTER AVALANCHE
CHARACTERISTICS (–55°C ≤ TJ ≤ 175°C) 2 G15N40CL = Device Code
Collector Y = Year
Characteristic Symbol Value Unit
WW = Work Week
Single Pulse Collector–to–Emitter Avalanche EAS mJ
Energy ORDERING INFORMATION
VCC = 50 V, VGE = 5.0 V, Pk IL = 17.4 A, L 300
= 2.0 mH, Starting TJ = 25°C Device Package Shipping
VCC = 50 V, VGE = 5.0 V, Pk IL = 14.2 A, L 200
MGP15N40CL TO–220 50 Units/Rail
= 2.0 mH, Starting TJ = 150°C
Reverse Avalanche Energy EAS(R) mJ MGB15N40CLT4 D2PAK 800 Tape & Reel
VCC = 100 V, VGE = 20 V, L = 3.0 mH, 1000
Pk IL = 25.8 A, Starting TJ = 25°C Preferred devices are recommended choices for future use
and best overall value.
THERMAL CHARACTERISTICS
Characteristic Symbol Value Unit
Thermal Resistance, Junction to Case RθJC 1.0 °C/W
Thermal Resistance, Junction to Ambient TO–220 RθJA 62.5
D2PAK (Note 1.) RθJA 50
Maximum Lead Temperature for Soldering Purposes, 1/8″ from case for 5 seconds TL 275 °C
ELECTRICAL CHARACTERISTICS
Characteristic Symbol Test Conditions Temperature Min Typ Max Unit
OFF CHARACTERISTICS
Collector–Emitter
Collector Emitter Clamp
Clam Voltage BVCES IC = 2.0 mA TJ = –40°C
40 C to 320 350 380 VDC
150°C
IC = 10 mA TJ = –40°C to 330 360 380
150°C
http://onsemi.com
302
MGP15N40CL, MGB15N40CL
http://onsemi.com
303
MGP15N40CL, MGB15N40CL
60 60
IC, COLLECTOR CURRENT (AMPS)
15 2.0
TJ = 150°C
1.5
10
TJ = 25°C 1.0 IC = 15 A IC = 5 A
5 TJ = –40°C
0.5
IC = 10 A
0 0.0
0 0.5 1 1.5 2 2.5 3 3.5 4 4.5 5 –50 –25 0 25 50 75 100 125 150
VGE, GATE TO EMITTER VOLTAGE (VOLTS) TJ, JUNCTION TEMPERATURE (°C)
10000 2.5
Mean + 4 σ
THRESHOLD VOLTAGE (VOLTS)
IC = 1 mA
Mean
Ciss 2.0
C, CAPACITANCE (pF)
1000
1.5
Coss
100 Mean – 4 σ
1.0
10
Crss
0.5
1 0.0
0 20 40 60 80 100 120 140 160 180 200 –50 –25 0 25 50 75 100 125 150
VCE, COLLECTOR TO EMITTER VOLTAGE (VOLTS) TEMPERATURE (°C)
http://onsemi.com
304
MGP15N40CL, MGB15N40CL
30 30
VCC = 50 V VCC = 50 V
IL, LATCH CURRENT (AMPS)
0 0
0 2 4 6 8 10 –50 –25 0 25 50 75 100 125 150 175
INDUCTOR (mH) TEMPERATURE (°C)
Figure 7. Minimum Open Secondary Latch Figure 8. Minimum Open Secondary Latch
Current vs. Inductor Current vs. Temperature
30 30
VCC = 50 V
VCC = 50 V
T = 25°C VGE = 5.0 V
IL, LATCH CURRENT (AMPS)
5 5
0 0
0 2 4 6 8 10 –50 –25 0 25 50 75 100 125 150 175
INDUCTOR (mH) TEMPERATURE (°C)
Figure 9. Typical Open Secondary Latch Figure 10. Typical Open Secondary Latch
Current vs. Inductor Current vs. Temperature
12 14
VCC = 300 V
VGE = 5.0 V 12 tf
10
RG = 1000 Ω
SWITCHING TIME (µS)
SWITCHING TIME (µS)
tf
IC = 10 A 10 VCC = 300 V
8 L = 300 µH VGE = 5.0 V
8 RG = 1000 Ω
6 td(off) TJ = 150°C td(off)
6 L = 300 µH
4
4
2 2
0 0
–50 –25 0 25 50 75 100 125 150 0 2 4 6 8 10 12 14 16
TC, CASE TEMPERATURE (°C) IC, COLLECTOR CURRENT (AMPS)
Figure 11. Switching Speed vs. Case Figure 12. Switching Speed vs. Collector
Temperature Current
http://onsemi.com
305
MGP15N40CL, MGB15N40CL
14 14
VCC = 300 V
12 VGE = 5.0 V 12 tf
TJ = 25°C
SWITCHING TIME (µS)
2 2
0 0
250 500 750 1000 250 500 750 1000
RG, EXTERNAL GATE RESISTANCE (Ω) RG, EXTERNAL GATE RESISTANCE (Ω)
Figure 13. Switching Speed vs. External Gate Figure 14. Switching Speed vs. External Gate
Resistance Resistance
10
R(t), TRANSIENT THERMAL RESISTANCE (°C/Watt)
1 0.2
0.1
0.05
0.02
0.1 D CURVES APPLY FOR POWER
0.01 P(pk)
PULSE TRAIN SHOWN
t1 READ TIME AT T1
Single Pulse
t2 TJ(pk) – TA = P(pk) RθJA(t)
RθJC ≅ R(t) for t ≤ 0.2 s
DUTY CYCLE, D = t1/t2
0.01
0.00001 0.0001 0.001 0.01 0.1 1 10 100 1000
t,TIME (S)
http://onsemi.com
306
MGP15N40CL, MGB15N40CL
1.5″
4″
4″
0.125″
4″
100 100
COLLECTOR CURRENT (AMPS)
COLLECTOR CURRENT (AMPS)
DC DC
10 100 µs 10
100 µs
1 ms
1 10 ms 1 1 ms
100 ms 10 ms
100 ms
0.1 0.1
0.01 0.01
1 10 100 1000 1 10 100 1000
COLLECTOR–EMITTER VOLTAGE (VOLTS) COLLECTOR–EMITTER VOLTAGE (VOLTS)
Figure 17. Single Pulse Safe Operating Area Figure 18. Single Pulse Safe Operating Area
(Mounted on an Infinite Heatsink at TC = 255C) (Mounted on an Infinite Heatsink at TC = 1255C)
http://onsemi.com
307
MGP15N40CL, MGB15N40CL
100 100
1 1
P(pk) P(pk)
t1 t1
0.1 0.1
t2 t2
DUTY CYCLE, D = t1/t2 DUTY CYCLE, D = t1/t2
0.01 0.01
1 10 100 1000 1 10 100 1000
COLLECTOR–EMITTER VOLTAGE (VOLTS) COLLECTOR–EMITTER VOLTAGE (VOLTS)
Figure 19. Pulse Train Safe Operating Area Figure 20. Pulse Train Safe Operating Area
(Mounted on an Infinite Heatsink at TC = 255C) (Mounted on an Infinite Heatsink at TC = 1255C)
http://onsemi.com
308
#)!
)!
Preferred Device
) !
N–Channel TO–220 and D2PAK
This Logic Level Insulated Gate Bipolar Transistor (IGBT) features http://onsemi.com
monolithic circuitry integrating ESD and Over–Voltage clamped
protection for use in inductive coil drivers applications. Primary uses 19 AMPERES
include Ignition, Direct Fuel Injection, or wherever high voltage and 350 VOLTS (Clamped)
high current switching is required.
VCE(on) @ 10 A = 1.8 V Max
• Ideal for IGBT–On–Coil or Distributorless Ignition System
Applications N–Channel
• High Pulsed Current Capability up to 50 A C
• Gate–Emitter ESD Protection
• Temperature Compensated Gate–Collector Voltage Clamp Limits
Stress Applied to Load G
• Integrated ESD Diode Protection RGE
• Low Threshold Voltage to Interface Power Loads to Logic or
Microprocessor Devices 4
• Low Saturation Voltage E
4
• Optional Gate Resistor (RG)
1 2
MAXIMUM RATINGS (–55°C ≤ TJ ≤ 175°C unless otherwise noted)
3
Rating Symbol Value Unit
TO–220AB D2PAK
Collector–Emitter Voltage VCES 380 VDC CASE 221A CASE 418B
STYLE 9 STYLE 4
Collector–Gate Voltage VCER 380 VDC 1
2
Gate–Emitter Voltage VGE 22 VDC 3 MARKING DIAGRAMS
& PIN ASSIGNMENTS
Collector Current – Continuous IC 19 ADC
@ TC = 25°C – Pulsed 50 AAC 4 4
Collector Collector
ESD (Human Body Model) ESD kV
R = 1500 Ω, C = 100 pF 8.0
ESD (Machine Model) R = 0 Ω, C = 200 pF ESD 800 V G19N35CL
YWW
Total Power Dissipation @ TC = 25°C PD 165 Watts
G19N35CL
Derate above 25°C 1.1 W/°C
YWW
Operating and Storage Temperature Range TJ, Tstg –55 to °C 1 3
175 Gate 2 Emitter
1 3
Gate Emitter Collector
UNCLAMPED COLLECTOR–TO–EMITTER AVALANCHE
CHARACTERISTICS (–55°C ≤ TJ ≤ 175°C) 2
G19N35CL = Device Code
Collector
Characteristic Symbol Value Unit Y = Year
WW = Work Week
Single Pulse Collector–to–Emitter Avalanche EAS mJ
Energy
ORDERING INFORMATION
VCC = 50 V, VGE = 5.0 V, Pk IL = 22.4 A, 500
L = 2.0 mH, Starting TJ = 25°C Device Package Shipping
VCC = 50 V, VGE = 5.0 V, Pk IL = 17.4 A, 300
L = 2.0 mH, Starting TJ = 150°C MGP19N35CL TO–220 50 Units/Rail
Reverse Avalanche Energy EAS(R) mJ MGB19N35CLT4 D2PAK 800 Tape & Reel
VCC = 100 V, VGE = 20 V, L = 3.0 mH, 1000
Pk IL = 25.8 A, Starting TJ = 25_C Preferred devices are recommended choices for future use
and best overall value.
THERMAL CHARACTERISTICS
Characteristic Symbol Value Unit
Thermal Resistance, Junction to Case RθJC 0.9 °C/W
Thermal Resistance, Junction to Ambient TO–220 RθJA 62.5
D2PAK (Note 1.) RθJA 50
Maximum Lead Temperature for Soldering Purposes, 1/8″ from case for 5 seconds TL 275 °C
ELECTRICAL CHARACTERISTICS
Characteristic Symbol Test Conditions Temperature Min Typ Max Unit
OFF CHARACTERISTICS
Collector–Emitter Clamp Voltage BVCES IC = 2.0 mA TJ = –40°C to 320 350 380 VDC
150°C
IC = 10 mA TJ = –40°C to 330 360 380
150°C
http://onsemi.com
310
MGP19N35CL, MGB19N35CL
http://onsemi.com
311
MGP19N35CL, MGB19N35CL
60 60
VGE = 4.5 V
IC, COLLECTOR CURRENT (AMPS)
VGE = 3.0 V
20 VGE = 3.0 V 20
VGE = 2.5 V
10 VGE = 2.5 V 10
0 0
0 1 2 3 4 5 6 7 8 0 1 2 3 4 5 6 7 8
VCE, COLLECTOR TO EMITTER VOLTAGE (VOLTS) VCE, COLLECTOR TO EMITTER VOLTAGE (VOLTS)
10000 2.5
Ciss IC = 1 mA
THRESHOLD VOLTAGE (VOLTS)
Mean + 4 σ
1000 2.0 Mean
C, CAPACITANCE (pF)
Coss
100 1.5
Mean – 4 σ
10 Crss 1.0
1 0.5
0 0.0
0 20 40 60 80 100 120 140 160 180 –50 –25 0 25 50 75 100 125 150
VCE, COLLECTOR TO EMITTER VOLTAGE (VOLTS) TEMPERATURE (°C)
http://onsemi.com
312
MGP19N35CL, MGB19N35CL
14 14
VCC = 300 V
12 VGE = 5.0 V 12 tf
RG = 1000 Ω
SWITCHING TIME (µS)
Figure 7. Switching Speed vs. Case Figure 8. Switching Speed vs. Collector
Temperature Current
30 30
VCC = 50 V
IL, LATCH CURRENT (AMPS)
15 15 L = 3.0 mH
T = 150°C
10 10 L = 6.0 mH
VCC = 50 V
5 5 VGE = 5.0 V
RG = 1000 Ω
0 0
0 2 4 6 8 10 –50 –25 0 25 50 75 100 125 150 175
INDUCTOR (mH) TEMPERATURE (°C)
Figure 9. Minimum Open Secondary Latch Figure 10. Minimum Open Secondary Latch
Current vs. Inductor Current vs. Temperature
30 30
VCC = 50 V L = 2.0 mH
IL, LATCH CURRENT (AMPS)
IL, LATCH CURRENT (AMPS)
L = 6.0 mH
15 T = 150°C 15
10 10
VCC = 50 V
5 5 VGE = 5.0 V
RG = 1000 Ω
0 0
0 1 2 3 4 5 6 7 8 9 10 –50 –25 0 25 50 75 100 125 150 175
INDUCTOR (mH) TEMPERATURE (°C)
Figure 11. Typical Open Secondary Latch vs. Figure 12. Typical Open Secondary Latch vs.
Inductor Temperature
http://onsemi.com
313
MGP19N35CL, MGB19N35CL
1 0.2
0.1
0.05
0.02
0.1 D CURVES APPLY FOR POWER
P(pk)
PULSE TRAIN SHOWN
0.01
t1 READ TIME AT T1
0.01
0.00001 0.0001 0.001 0.01 0.1 1 10 100 1000
t,TIME (S)
1.5″
4″
4″
0.125″
4″
http://onsemi.com
314
MGP19N35CL, MGB19N35CL
100 100
DC DC
100 µs
10 10 100 µs
1 ms
1 10 ms 1
1 ms
100 ms 10 ms
0.01 0.01
1 10 100 1000 1 10 100 1000
COLLECTOR–EMITTER VOLTAGE (VOLTS) COLLECTOR–EMITTER VOLTAGE (VOLTS)
Figure 15. Single Pulse Safe Operating Area Figure 16. Single Pulse Safe Operating Area
(Mounted on an Infinite Heatsink at TC = 255C) (Mounted on an Infinite Heatsink at TC = 1255C)
100 100
t1 = 1 ms
COLLECTOR CURRENT (AMPS)
COLLECTOR CURRENT (AMPS)
DC D = 0.05 DC
t1 = 1 ms
10 t1 = 2 ms 10 D = 0.05
D = 0.10
t1 = 3 ms t1 = 3 ms t1 = 2 ms
D = 0.30 D = 0.30 D = 0.10
1 1
P(pk) P(pk)
t1 t1
0.1 0.1
t2 t2
Figure 17. Pulse Train Safe Operating Area Figure 18. Pulse Train Safe Operating Area
(Mounted on an Infinite Heatsink at TC = 255C) (Mounted on an Infinite Heatsink at TC = 1255C)
http://onsemi.com
315
(
Preferred Device
#$%& '(
"
N–Channel SOT–23
These miniature surface mount MOSFETs low RDS(on) assure
minimal power loss and conserve energy, making these devices ideal
for use in space sensitive power management circuitry. Typical http://onsemi.com
applications are dc–dc converters and power management in portable
and battery–powered products such as computers, printers, PCMCIA 750 mAMPS
cards, cellular and cordless telephones. 20 VOLTS
• Low RDS(on) Provides Higher Efficiency and Extends Battery Life RDS(on) = 85 m
• Miniature SOT–23 Surface Mount Package Saves Board Space
N–Channel
MAXIMUM RATINGS (TJ = 25°C unless otherwise noted) 4
Rating Symbol Value Unit
Drain–to–Source Voltage VDSS 20 Vdc
Gate–to–Source Voltage – Continuous VGS ± 8.0 Vdc
Drain Current mA
– Continuous @ TA = 25°C ID 750
– Pulsed Drain Current (tp ≤ 10 µs) IDM 2000
Total Power Dissipation @ TA = 25°C PD 400 mW #
NE = Device Code
W = Work Week
PIN ASSIGNMENT
3
()%
1 2
)'1 ;(1
ORDERING INFORMATION
DYNAMIC CHARACTERISTICS
Input Capacitance (VDS = 5.0 Vdc, VGS = 0 Ciss – 160 – pF
V, f = 1.0 Mhz)
Output Capacitance (VDS = 5.0 Vdc, VGS = 0 Coss – 130 –
V, f = 1.0 Mhz)
Transfer Capacitance (VDG = 5.0 Vdc, VGS = 0 Crss – 60 –
V, f = 1.0 Mhz)
#
6
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http://onsemi.com
317
MGSF1N02ELT1
# 6
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6
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Figure 3. On–Resistance versus Drain Current Figure 4. On–Resistance versus Drain Current
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http://onsemi.com
318
MGSF1N02ELT1
4:
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4$
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8
SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • The soldering temperature and time shall not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within • When shifting from preheating to soldering, the
a short time could result in device failure. Therefore, the maximum temperature gradient shall be 5°C or less.
following items should always be observed in order to • After soldering has been completed, the device should
minimize the thermal stress to which the devices are be allowed to cool naturally for at least three minutes.
subjected. Gradual cooling should be used as the use of forced
• Always preheat the device. cooling will increase the temperature gradient and
• The delta temperature between the preheat and result in latent failure due to mechanical stress.
soldering should be 100°C or less.* • Mechanical stress or shock should not be applied
• When preheating and soldering, the temperature of the during cooling.
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When * Soldering a device without preheating can cause
using infrared heating with the reflow soldering excessive thermal shock and stress which can result in
method, the difference shall be a maximum of 10°C. damage to the device.
http://onsemi.com
319
(
Preferred Device
#$%& '(
"
N–Channel SOT–23
These miniature surface mount MOSFETs low RDS(on) assure
minimal power loss and conserve energy, making these devices ideal
for use in space sensitive power management circuitry. Typical http://onsemi.com
applications are dc–dc converters and power management in portable
and battery–powered products such as computers, printers, PCMCIA 750 mAMPS
cards, cellular and cordless telephones. 20 VOLTS
• Low RDS(on) Provides Higher Efficiency and Extends Battery Life RDS(on) = 90 m
• Miniature SOT–23 Surface Mount Package Saves Board Space
N–Channel
MAXIMUM RATINGS (TJ = 25°C unless otherwise noted) 4
Rating Symbol Value Unit
Drain–to–Source Voltage VDSS 20 Vdc
Gate–to–Source Voltage – Continuous VGS ± 20 Vdc
Drain Current
– Continuous @ TA = 25°C ID 750 mA
– Pulsed Drain Current (tp ≤ 10 µs) IDM 2000
Total Power Dissipation @ TA = 25°C PD 400 mW #
N2 = Device Code
W = Work Week
PIN ASSIGNMENT
3
()%
1 2
)'1 ;(1
ORDERING INFORMATION
DYNAMIC CHARACTERISTICS
Input Capacitance (VDS = 5.0 Vdc) Ciss – 125 – pF
Output Capacitance (VDS = 5.0 Vdc) Coss – 120 –
Transfer Capacitance (VDG = 5.0 Vdc) Crss – 45 –
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http://onsemi.com
321
MGSF1N02LT1
# 6
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Figure 3. On–Resistance versus Drain Current Figure 4. On–Resistance versus Drain Current
9
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http://onsemi.com
322
MGSF1N02LT1
4:
4: 7$
7$
:7
#
4$
7
4 %21!
8
SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • The soldering temperature and time shall not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within • When shifting from preheating to soldering, the
a short time could result in device failure. Therefore, the maximum temperature gradient shall be 5°C or less.
following items should always be observed in order to • After soldering has been completed, the device should
minimize the thermal stress to which the devices are be allowed to cool naturally for at least three minutes.
subjected. Gradual cooling should be used as the use of forced
• Always preheat the device. cooling will increase the temperature gradient and
• The delta temperature between the preheat and result in latent failure due to mechanical stress.
soldering should be 100°C or less.* • Mechanical stress or shock should not be applied
• When preheating and soldering, the temperature of the during cooling.
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When * Soldering a device without preheating can cause
using infrared heating with the reflow soldering excessive thermal shock and stress which can result in
method, the difference shall be a maximum of 10°C. damage to the device.
http://onsemi.com
323
(!
Preferred Device
#$%& '(
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N–Channel SOT–23
These miniature surface mount MOSFETs low RDS(on) assure
minimal power loss and conserve energy, making these devices ideal
for use in space sensitive power management circuitry. Typical http://onsemi.com
applications are dc–dc converters and power management in portable
and battery–powered products such as computers, printers, PCMCIA 750 mAMPS
cards, cellular and cordless telephones. 30 VOLTS
• Low RDS(on) Provides Higher Efficiency and Extends Battery Life RDS(on) = 100 m
• Miniature SOT–23 Surface Mount Package Saves Board Space
N–Channel
MAXIMUM RATINGS (TJ = 25°C unless otherwise noted) 4
Rating Symbol Value Unit
Drain–to–Source Voltage VDSS 30 Vdc
Gate–to–Source Voltage – Continuous VGS ± 20 Vdc
Drain Current mA
– Continuous @ TA = 25°C ID 750
– Pulsed Drain Current (tp ≤ 10 µs) IDM 2000
Total Power Dissipation @ TA = 25°C PD 400 mW #
N3 = Device Code
W = Work Week
PIN ASSIGNMENT
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ORDERING INFORMATION
DYNAMIC CHARACTERISTICS
Input Capacitance (VDS = 5.0 Vdc) Ciss – 140 – pF
Output Capacitance (VDS = 5.0 Vdc) Coss – 100 –
Transfer Capacitance (VDG = 5.0 Vdc) Crss – 40 –
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SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • The soldering temperature and time shall not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within • When shifting from preheating to soldering, the
a short time could result in device failure. Therefore, the maximum temperature gradient shall be 5°C or less.
following items should always be observed in order to • After soldering has been completed, the device should
minimize the thermal stress to which the devices are be allowed to cool naturally for at least three minutes.
subjected. Gradual cooling should be used as the use of forced
• Always preheat the device. cooling will increase the temperature gradient and
• The delta temperature between the preheat and result in latent failure due to mechanical stress.
soldering should be 100°C or less.* • Mechanical stress or shock should not be applied
• When preheating and soldering, the temperature of the during cooling.
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When * Soldering a device without preheating can cause
using infrared heating with the reflow soldering excessive thermal shock and stress which can result in
method, the difference shall be a maximum of 10°C. damage to the device.
http://onsemi.com
327
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P–Channel SOT–23
These miniature surface mount MOSFETs low RDS(on) assure
minimal power loss and conserve energy, making these devices ideal
for use in space sensitive power management circuitry. Typical http://onsemi.com
applications are dc–dc converters and power management in portable
and battery–powered products such as computers, printers, PCMCIA 750 mAMPS
cards, cellular and cordless telephones. 20 VOLTS
• Low RDS(on) Provides Higher Efficiency and Extends Battery Life RDS(on) = 260 m
• Miniature SOT–23 Surface Mount Package Saves Board Space
P–Channel
MAXIMUM RATINGS (TJ = 25°C unless otherwise noted) 4
Rating Symbol Value Unit
Drain–to–Source Voltage VDSS 20 Vdc
Gate–to–Source Voltage – Continuous VGS ± 8.0 Vdc
Drain Current mA
– Continuous @ TA = 25°C ID 750
– Pulsed Drain Current (tp ≤ 10 µs) IDM 2000
Total Power Dissipation @ TA = 25°C PD 400 mW #
PE = Device Code
W = Work Week
PIN ASSIGNMENT
3
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ORDERING INFORMATION
DYNAMIC CHARACTERISTICS
Input Capacitance (VDS = 5.0 Vdc) Ciss – 140 – pF
Output Capacitance (VDS = 5.0 Vdc) Coss – 130 –
Transfer Capacitance (VDG = 5.0 Vdc) Crss – 50 –
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SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • The soldering temperature and time shall not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within • When shifting from preheating to soldering, the
a short time could result in device failure. Therefore, the maximum temperature gradient shall be 5°C or less.
following items should always be observed in order to • After soldering has been completed, the device should
minimize the thermal stress to which the devices are be allowed to cool naturally for at least three minutes.
subjected. Gradual cooling should be used as the use of forced
• Always preheat the device. cooling will increase the temperature gradient and
• The delta temperature between the preheat and result in latent failure due to mechanical stress.
soldering should be 100°C or less.* • Mechanical stress or shock should not be applied
• When preheating and soldering, the temperature of the during cooling.
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When * Soldering a device without preheating can cause
using infrared heating with the reflow soldering excessive thermal shock and stress which can result in
method, the difference shall be a maximum of 10°C. damage to the device.
http://onsemi.com
331
(#
Preferred Device
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P–Channel SOT–23
These miniature surface mount MOSFETs low RDS(on) assure
minimal power loss and conserve energy, making these devices ideal
for use in space sensitive power management circuitry. Typical http://onsemi.com
applications are dc–dc converters and power management in portable
and battery–powered products such as computers, printers, PCMCIA 750 mAMPS
cards, cellular and cordless telephones. 20 VOLTS
• Low RDS(on) Provides Higher Efficiency and Extends Battery Life RDS(on) = 350 m
• Miniature SOT–23 Surface Mount Package Saves Board Space
P–Channel
MAXIMUM RATINGS (TJ = 25°C unless otherwise noted) 4
Rating Symbol Value Unit
Drain–to–Source Voltage VDSS 20 Vdc
Gate–to–Source Voltage – Continuous VGS ± 20 Vdc
Drain Current mA
– Continuous @ TA = 25°C ID 750
– Pulsed Drain Current (tp ≤ 10 µs) IDM 2000
Total Power Dissipation @ TA = 25°C PD 400 mW #
PC = Device Code
W = Work Week
PIN ASSIGNMENT
3
()%
1 2
)'1 ;(1
ORDERING INFORMATION
DYNAMIC CHARACTERISTICS
Input Capacitance (VDS = 5.0 Vdc) Ciss – 130 – pF
Output Capacitance (VDS = 5.0 Vdc) Coss – 120 –
Transfer Capacitance (VDG = 5.0 Vdc) Crss – 60 –
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SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • The soldering temperature and time shall not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within • When shifting from preheating to soldering, the
a short time could result in device failure. Therefore, the maximum temperature gradient shall be 5°C or less.
following items should always be observed in order to • After soldering has been completed, the device should
minimize the thermal stress to which the devices are be allowed to cool naturally for at least three minutes.
subjected. Gradual cooling should be used as the use of forced
• Always preheat the device. cooling will increase the temperature gradient and
• The delta temperature between the preheat and result in latent failure due to mechanical stress.
soldering should be 100°C or less.* • Mechanical stress or shock should not be applied
• When preheating and soldering, the temperature of the during cooling.
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When * Soldering a device without preheating can cause
using infrared heating with the reflow soldering excessive thermal shock and stress which can result in
method, the difference shall be a maximum of 10°C. damage to the device.
http://onsemi.com
335
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P–Channel TSOP–6
This device represents a series of Power MOSFETs which are http://onsemi.com
capable of withstanding high energy in the avalanche and
commutation modes and the drain–to–source diode has a very low 2 AMPERES
reverse recovery time. These devices are designed for use in low
20 VOLTS
voltage, high speed switching applications where power efficiency is
important. Typical applications are dc–dc converters, and power RDS(on) = 175 m
management in portable and battery powered products such as
computers, printers, cellular and cordless phones. They can also be P–Channel
used for low voltage motor controls in mass storage products such as
# $ 9
disk drives and tape drives. The avalanche energy is specified to
eliminate the guesswork in designs where inductive loads are switched
and offer additional safety margin against unexpected voltage
transients. 4
• Miniature TSOP–6 Surface Mount Package – Saves Board Space
• Low Profile for Thin Applications such as PCMCIA Cards
• Very Low RDS(on) Provides Higher Efficiency and Expands 6
Battery Life
• Logic Level Gate Drive – Can Be Driven by Logic ICs
MARKING
• Diode is Characterized for Use in Bridge Circuits DIAGRAM
• Diode Exhibits High Speed, with Soft Recovery
• IDSS Specified at Elevated Temperatures 3
2
• Avalanche Energy Specified
1 TSOP–6 3V
CASE 318G W
• Package Mounting Information Provided 4 STYLE 1
5
6
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W = Work Week
PIN ASSIGNMENT
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http://onsemi.com
337
MGSF2P02HD
ON CHARACTERISTICS
Gate Threshold Voltage VGS(th) Vdc
(VDS = VGS, ID = 0.25 mAdc) 0.7 0.95 1.4
Temperature Coefficient (Negative) – 2.2 – mV/°C
Drain–to–Source On–Voltage RDS(on) mW
(VGS = 4.5 Vdc, ID = 1.3 Adc) – 145 175
(VGS = 2.7 Vdc, ID = 0.8 Adc) – 220 280
Forward Transconductance gFS mhos
(VDS = 10 Vdc, ID = 0.6 Adc) 1.3 2.0 –
DYNAMIC CHARACTERISTICS
Input Capacitance Ciss – 225 – pF
Output Capacitance (VDS = 15 Vd
Vdc, VGS = 0 Vd
Vdc,
Coss – 150 –
f = 1.0 MHz)
Transfer Capacitance Crss – 60 –
SWITCHING CHARACTERISTICS
Turn–On Delay Time td(on) – 15 – nsec
Rise Time (VDS = 10 Vdc, ID = 1.2 Adc, tr – 27 –
VGS = 4
4.55 Vdc
Vdc,
Turn–Off Delay Time RG = 6.0 Ω) td(off) – 60 –
Fall Time tf – 72 –
Turn–On Delay Time td(on) – 20 –
Rise Time (VDD = 10 Vdc, ID = 0.6 Adc, tr – 94 –
VGS = 2
2.77 Vdc
Vdc,
Turn–Off Delay Time RG = 6.0 Ω) td(off) – 49 –
Fall Time tf – 76 –
Gate Charge QT – 5.3 7.5 nC
http://onsemi.com
338
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Switching behavior is most easily modeled and predicted The capacitance (Ciss) is read from the capacitance curve at
by recognizing that the power MOSFET is charge a voltage corresponding to the off–state condition when
controlled. The lengths of various switching intervals (∆t) calculating td(on) and is read at a voltage corresponding to the
are determined by how fast the FET input capacitance can on–state when calculating td(off).
be charged by current from the generator. At high switching speeds, parasitic circuit elements
The published capacitance data is difficult to use for complicate the analysis. The inductance of the MOSFET
calculating rise and fall because drain–gate capacitance source lead, inside the package and in the circuit wiring
varies greatly with applied voltage. Accordingly, gate which is common to both the drain and gate current paths,
charge data is used. In most cases, a satisfactory estimate of produces a voltage at the source which reduces the gate drive
average input current (IG(AV)) can be made from a current. The voltage is determined by Ldi/dt, but since di/dt
rudimentary analysis of the drive circuit so that is a function of drain current, the mathematical solution is
t = Q/IG(AV) complex. The MOSFET output capacitance also
complicates the mathematics. And finally, MOSFETs have
During the rise and fall time interval when switching a finite internal gate resistance which effectively adds to the
resistive load, VGS remains virtually constant at a level resistance of the driving source, but the internal resistance
known as the plateau voltage, VSGP. Therefore, rise and fall is difficult to measure and, consequently, is not specified.
times may be approximated by the following: The resistive switching time variation versus gate
tr = Q2 x RG/(VGG – VGSP) resistance (Figure 9) shows how typical switching
tf = Q2 x RG/VGSP performance is affected by the parasitic circuit elements. If
where the parasitics were not present, the slope of the curves would
maintain a value of unity regardless of the switching speed.
VGG = the gate drive voltage, which varies from zero to VGG
The circuit used to obtain the data is constructed to minimize
RG = the gate drive resistance
common inductance in the drain and gate circuit loops and
and Q2 and VGSP are read from the gate charge curve.
is believed readily achievable with board mounted
During the turn–on and turn–off delay times, gate current is components. Most power electronic loads are inductive; the
not constant. The simplest calculation uses appropriate data in the figure is taken with a resistive load, which
values from the capacitance curves in a standard equation for approximates an optimally snubbed inductive load. Power
voltage change in an RC network. The equations are: MOSFETs may be safely operated into an inductive load;
td(on) = RG Ciss In [VGG/(VGG – VGSP)] however, snubbing reduces switching losses.
td(off) = RG Ciss In (VGG/VGSP)
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The switching characteristics of a MOSFET body diode high di/dts. The diode’s negative di/dt during ta is directly
are very important in systems using it as a freewheeling or controlled by the device clearing the stored charge.
commutating diode. Of particular interest are the reverse However, the positive di/dt during tb is an uncontrollable
recovery characteristics which play a major role in diode characteristic and is usually the culprit that induces
determining switching losses, radiated noise, EMI and RFI. current ringing. Therefore, when comparing diodes, the
System switching losses are largely due to the nature of ratio of tb/ta serves as a good indicator of recovery
the body diode itself. The body diode is a minority carrier abruptness and thus gives a comparative estimate of
device, therefore it has a finite reverse recovery time, trr, due probable noise generated. A ratio of 1 is considered ideal and
to the storage of minority carrier charge, QRR, as shown in values less than 0.5 are considered snappy.
the typical reverse recovery wave form of Figure 11. It is this Compared to ON Semiconductor standard cell density
stored charge that, when cleared from the diode, passes low voltage MOSFETs, high cell density MOSFET diodes
through a potential and defines an energy loss. Obviously, are faster (shorter trr), have less stored charge and a softer
repeatedly forcing the diode through reverse recovery reverse recovery characteristic. The softness advantage of
further increases switching losses. Therefore, one would the high cell density diode means they can be forced through
like a diode with short trr and low QRR specifications to reverse recovery at a higher di/dt than a standard cell
minimize these losses. MOSFET diode without increasing the current ringing or the
The abruptness of diode reverse recovery effects the noise generated. In addition, power dissipation incurred
amount of radiated noise, voltage spikes, and current from switching the diode will be less due to the shorter
ringing. The mechanisms at work are finite irremovable recovery time and lower switching losses.
circuit parasitic inductances and capacitances acted upon by
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SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • The soldering temperature and time shall not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within • When shifting from preheating to soldering, the
a short time could result in device failure. Therefore, the maximum temperature gradient shall be 5°C or less.
following items should always be observed in order to • After soldering has been completed, the device should
minimize the thermal stress to which the devices are be allowed to cool naturally for at least three minutes.
subjected. Gradual cooling should be used as the use of forced
• Always preheat the device. cooling will increase the temperature gradient and
• The delta temperature between the preheat and result in latent failure due to mechanical stress.
soldering should be 100°C or less.* • Mechanical stress or shock should not be applied
• When preheating and soldering, the temperature of the during cooling.
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When * Soldering a device without preheating can cause
using infrared heating with the reflow soldering excessive thermal shock and stress which can result in
method, the difference shall be a maximum of 10°C. damage to the device.
http://onsemi.com
343
(!
Preferred Device
#$%& '(
N–Channel TSOP–6
These miniature surface mount MOSFETs low RDS(on) assure
minimal power loss and conserve energy, making these devices ideal
for use in small power management circuitry. Typical applications are http://onsemi.com
dc–dc converters, power management in portable and
battery–powered products such as computers, printers, PCMCIA 4 AMPERES
cards, cellular and cordless telephones. 20 VOLTS
• Low RDS(on) Provides Higher Efficiency and Extends Battery Life RDS(on) = 70 mΩ
• Miniature TSOP–6 Surface Mount Package Saves Board Space
N–Channel
MAXIMUM RATINGS (TJ = 25°C unless otherwise noted)
# $ 9
Rating Symbol Value Unit
Drain–to–Source Voltage VDSS 20 Vdc
Gate–to–Source Voltage – Continuous VGS ± 8.0 Vdc
Drain Current A 4
– Continuous @ TA = 25°C ID 4.0
– Pulsed Drain Current (tp ≤ 10 µs) IDM 20
Total Power Dissipation @ TA = 25°C PD 2.0 W 6
Mounted on FR4 t 5 sec
Operating and Storage Temperature TJ, Tstg – 55 to °C
MARKING
Range 150
DIAGRAM
Thermal Resistance – Junction–to–Ambient RθJA 62.5 °C/W
3
Maximum Lead Temperature for Soldering TL 260 °C 2
1 TSOP–6 442
Purposes, for 10 seconds
CASE 318G W
4 STYLE 1
5
6
PIN ASSIGNMENT
()% ()% ;(1
6 5 4
1 2 3
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ORDERING INFORMATION
DYNAMIC CHARACTERISTICS
Input Capacitance (VDS = 5.0 V) Ciss – 90 – pF
Output Capacitance (VDS = 5.0 V) Coss – 50 –
Transfer Capacitance (VDG = 5.0 V) Crss – 10 –
http://onsemi.com
345
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SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • The soldering temperature and time shall not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within • When shifting from preheating to soldering, the
a short time could result in device failure. Therefore, the maximum temperature gradient shall be 5°C or less.
following items should always be observed in order to • After soldering has been completed, the device should
minimize the thermal stress to which the devices are be allowed to cool naturally for at least three minutes.
subjected. Gradual cooling should be used as the use of forced
• Always preheat the device. cooling will increase the temperature gradient and
• The delta temperature between the preheat and result in latent failure due to mechanical stress.
soldering should be 100°C or less.* • Mechanical stress or shock should not be applied
• When preheating and soldering, the temperature of the during cooling.
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When * Soldering a device without preheating can cause
using infrared heating with the reflow soldering excessive thermal shock and stress which can result in
method, the difference shall be a maximum of 10°C. damage to the device.
http://onsemi.com
348
(!
Preferred Device
#$%& '(
!
N–Channel TSOP–6
These miniature surface mount MOSFETs low RDS(on) assure
minimal power loss and conserve energy, making these devices ideal
for use in small power management circuitry. Typical applications are http://onsemi.com
dc–dc converters, power management in portable and
battery–powered products such as computers, printers, PCMCIA 4 AMPERES
cards, cellular and cordless telephones. 30 VOLTS
• Low RDS(on) Provides Higher Efficiency and Extends Battery Life RDS(on) = 65 mΩ
• Miniature TSOP–6 Surface Mount Package Saves Board Space
N–Channel
MAXIMUM RATINGS (TJ = 25°C unless otherwise noted)
# $ 9
Rating Symbol Value Unit
Drain–to–Source Voltage VDSS 30 Vdc
Gate–to–Source Voltage – Continuous VGS ± 20 Vdc
Drain Current A 4
– Continuous @ TA = 25°C ID 4.2
– Pulsed Drain Current (tp ≤ 10 µs) IDM 20
Total Power Dissipation @ TA = 25°C PD 2.0 W 6
Mounted on FR4 t ≤ 5 sec
Operating and Storage Temperature TJ, Tstg – 55 to °C
MARKING
Range 150
DIAGRAM
Thermal Resistance – Junction–to–Ambient RθJA 62.5 °C/W
3
Maximum Lead Temperature for Soldering TL 260 °C 2
1 TSOP–6 3P
Purposes, for 10 seconds
CASE 318G W
4 STYLE 1
5
6
3P = Device Code
W = Work Week
PIN ASSIGNMENT
()% ()% ;(1
6 5 4
1 2 3
()% ()% )'1
ORDERING INFORMATION
DYNAMIC CHARACTERISTICS
Input Capacitance (VDS = 5.0 V) Ciss – 90 – pF
Output Capacitance (VDS = 5.0 V) Coss – 50 –
Transfer Capacitance (VDG = 5.0 V) Crss – 10 –
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SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • The soldering temperature and time shall not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within • When shifting from preheating to soldering, the
a short time could result in device failure. Therefore, the maximum temperature gradient shall be 5°C or less.
following items should always be observed in order to • After soldering has been completed, the device should
minimize the thermal stress to which the devices are be allowed to cool naturally for at least three minutes.
subjected. Gradual cooling should be used as the use of forced
• Always preheat the device. cooling will increase the temperature gradient and
• The delta temperature between the preheat and result in latent failure due to mechanical stress.
soldering should be 100°C or less.* • Mechanical stress or shock should not be applied
• When preheating and soldering, the temperature of the during cooling.
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When * Soldering a device without preheating can cause
using infrared heating with the reflow soldering excessive thermal shock and stress which can result in
method, the difference shall be a maximum of 10°C. damage to the device.
http://onsemi.com
353
Preferred Device
THERMAL CHARACTERISTICS
Thermal Resistance °C/W
– Junction to Case RθJC 3.12 1 2 3
– Junction to Ambient RθJA 100 Gate Drain Source
– Junction to Ambient (Note 1.) RθJA 71.4
ORDERING INFORMATION
Maximum Lead Temperature for TL 260 °C
Soldering Purposes, Device Package Shipping
1/8″ from case for 5 sec.
1. When surface mounted to an FR4 board using the minimum recommended MLD1N06CLT4 DPAK 2500 Tape & Reel
pad size.
Preferred devices are recommended choices for future use
and best overall value.
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FORWARD BIASED SAFE OPERATING AREA (1.8 A at 150°C) and not the RDS(on). The maximum voltage
The FBSOA curves define the maximum drain–to–source can be calculated by the following equation:
voltage and drain current that a device can safely handle (150 – TA)
when it is forward biased, or when it is on, or being turned Vsupply =
ID(lim) (RθJC + RθCA)
on. Because these curves include the limitations of
simultaneous high voltage and high current, up to the rating where the value of RθCA is determined by the heatsink that
of the device, they are especially useful to designers of linear is being used in the application.
systems. The curves are based on a case temperature of 25°C
and a maximum junction temperature of 150°C. Limitations DUTY CYCLE OPERATION
for repetitive pulses at various case temperatures can be When operating in the duty cycle mode, the maximum
determined by using the thermal response curves. ON drain voltage can be increased. The maximum operating
Semiconductor Application Note, AN569, “Transient temperature is related to the duty cycle (DC) by the
Thermal Resistance – General Data and Its Use” provides following equation:
detailed instructions. TC = (VDS x ID x DC x RθCA) + TA
MAXIMUM DC VOLTAGE CONSIDERATIONS The maximum value of VDS applied when operating in a
The maximum drain–to–source voltage that can be duty cycle mode can be approximated by:
continuously applied across the MLD1N06CL when it is in 150 – TC
current limit is a function of the power that must be VDS =
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current limit at maximum rated operating temperature
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MARKING DIAGRAM
MAXIMUM RATINGS (TC = 25°C unless otherwise noted) & PIN ASSIGNMENT
Rating Symbol Value Unit 4
4
Drain
Drain–to–Source Voltage VDSS Clamped Vdc
Drain–to–Gate Voltage VDGR Clamped Vdc
(RGS = 1.0 MΩ)
TO–220AB
Gate–to–Source Voltage – Continuous VGS ±10 Vdc CASE 221A
STYLE 5 L1N06CL
Drain Current – Continuous ID Self–limited Adc
Drain Current – Single Pulse IDM 1.8 LLYWW
1
Total Power Dissipation PD 40 Watts 2
3 1 3
Electrostatic Discharge Voltage ESD 2.0 kV Gate Source
(Human Body Model)
2
Operating and Storage Junction TJ, Tstg –50 to 150 °C Drain
Temperature Range
L1N06CL = Device Code
THERMAL CHARACTERISTICS
LL = Location Code
Thermal Resistance, Junction to Case
θ, 3.12 °C/W Y = Year
Thermal Resistance, Junction to
θ, 62.5 WW = Work Week
Ambient
ORDERING INFORMATION
Maximum Lead Temperature for TL 260 °C
Soldering Purposes, 1/8″ from case Device Package Shipping
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FORWARD BIASED SAFE OPERATING AREA (1.8 A at 150°C) and not the RDS(on). The maximum voltage
The FBSOA curves define the maximum drain–to–source can be calculated by the following equation:
voltage and drain current that a device can safely handle (150 – TA)
when it is forward biased, or when it is on, or being turned Vsupply =
ID(lim) (RθJC + RθCA)
on. Because these curves include the limitations of
simultaneous high voltage and high current, up to the rating where the value of RθCA is determined by the heatsink that
of the device, they are especially useful to designers of linear is being used in the application.
systems. The curves are based on a case temperature of 25°C
and a maximum junction temperature of 150°C. Limitations DUTY CYCLE OPERATION
for repetitive pulses at various case temperatures can be When operating in the duty cycle mode, the maximum
determined by using the thermal response curves. ON drain voltage can be increased. The maximum operating
Semiconductor Application Note, AN569, “Transient temperature is related to the duty cycle (DC) by the
Thermal Resistance – General Data and Its Use” provides following equation:
detailed instructions. TC = (VDS x ID x DC x RθCA) + TA
MAXIMUM DC VOLTAGE CONSIDERATIONS The maximum value of VDS applied when operating in a
The maximum drain–to–source voltage that can be duty cycle mode can be approximated by:
continuously applied across the MLP1N06CL when it is in 150 – TC
current limit is a function of the power that must be VDS =
ID(lim) x DC x RθJC
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current limit at maximum rated operating temperature
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FORWARD BIASED SAFE OPERATING AREA (1.8 A at 150°C) and not the RDS(on). The maximum voltage
The FBSOA curves define the maximum drain–to–source can be calculated by the following equation:
voltage and drain current that a device can safely handle (150 – TA)
when it is forward biased, or when it is on, or being turned Vsupply =
ID(lim) (RθJC + RθCA)
on. Because these curves include the limitations of
simultaneous high voltage and high current, up to the rating where the value of RθCA is determined by the heatsink that
of the device, they are especially useful to designers of linear is being used in the application.
systems. The curves are based on a case temperature of 25°C
and a maximum junction temperature of 150°C. Limitations DUTY CYCLE OPERATION
for repetitive pulses at various case temperatures can be When operating in the duty cycle mode, the maximum
determined by using the thermal response curves. ON drain voltage can be increased. The maximum operating
Semiconductor Application Note, AN569, “Transient temperature is related to the duty cycle (DC) by the
Thermal Resistance – General Data and Its Use” provides following equation:
detailed instructions. TC = (VDS x ID x DC x RθCA) + TA
MAXIMUM DC VOLTAGE CONSIDERATIONS The maximum value of VDS applied when operating in a
The maximum drain–to–source voltage that can be duty cycle mode can be approximated by:
continuously applied across the MLP2N06CL when it is in 150 – TC
current limit is a function of the power that must be VDS =
ID(lim) x DC x RθJC
dissipated. This power is determined by the maximum
current limit at maximum rated operating temperature
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N–Channel SOT–23
These miniature surface mount MOSFETs low RDS(on) assure
minimal power loss and conserve energy, making these devices ideal
for use in small power management circuitry. Typical applications are http://onsemi.com
dc–dc converters, power management in portable and
battery–powered products such as computers, printers, PCMCIA 300 mAMPS
cards, cellular and cordless telephones. 20 VOLTS
• Low RDS(on) Provides Higher Efficiency and Extends Battery Life RDS(on) = 1
• Miniature SOT–23 Surface Mount Package Saves Board Space
N–Channel
MAXIMUM RATINGS (TJ = 25°C unless otherwise noted) 4
Rating Symbol Value Unit
Drain–to–Source Voltage VDSS 20 Vdc
Gate–to–Source Voltage – Continuous VGS ± 20 Vdc
Drain Current mAdc
– Continuous @ TA = 25°C ID 300
– Continuous @ TA = 70°C ID 240
– Pulsed Drain Current (tp ≤ 10 µs) IDM 750 #
Total Power Dissipation @ TA = 25°C(1) PD 225 mW
MARKING
Operating and Storage Temperature TJ, Tstg – 55 to °C
Range 150
DIAGRAM
N1 = Device Code
W = Work Week
PIN ASSIGNMENT
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ORDERING INFORMATION
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SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • The soldering temperature and time should not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within • When shifting from preheating to soldering, the
a short time could result in device failure. Therefore, the maximum temperature gradient should be 5°C or less.
following items should always be observed in order to • After soldering has been completed, the device should
minimize the thermal stress to which the devices are be allowed to cool naturally for at least three minutes.
subjected. Gradual cooling should be used as the use of forced
• Always preheat the device. cooling will increase the temperature gradient and
• The delta temperature between the preheat and result in latent failure due to mechanical stress.
soldering should be 100°C or less.* • Mechanical stress or shock should not be applied
• When preheating and soldering, the temperature of the during cooling
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When * Soldering a device without preheating can cause
using infrared heating with the reflow soldering excessive thermal shock and stress which can result in
method, the difference should be a maximum of 10°C. damage to the device.
http://onsemi.com
376
( #
Preferred Device
#$%& '(
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P–Channel SOT–23
These miniature surface mount MOSFETs low RDS(on) assure
minimal power loss and conserve energy, making these devices ideal
for use in small power management circuitry. Typical applications are http://onsemi.com
dc–dc converters, power management in portable and
battery–powered products such as computers, printers, PCMCIA 300 mAMPS
cards, cellular and cordless telephones. 20 VOLTS
• Low RDS(on) Provides Higher Efficiency and Extends Battery Life RDS(on) = 1.4
• Miniature SOT–23 Surface Mount Package Saves Board Space
P–Channel
MAXIMUM RATINGS (TJ = 25°C unless otherwise noted) 4
Rating Symbol Value Unit
Drain–to–Source Voltage VDSS 20 Vdc
Gate–to–Source Voltage – Continuous VGS ± 20 Vdc
Drain Current mAdc
– Continuous @ TA = 25°C ID 300
– Continuous @ TA = 70°C ID 240
– Pulsed Drain Current (tp ≤ 10 µs) IDM 750 #
Total Power Dissipation @ TA = 25°C PD 225 mW
(Note 1.) MARKING
DIAGRAM
Operating and Storage Temperature TJ, Tstg – 55 to °C
Range 150
3
Thermal Resistance – Junction–to–Ambient RθJA 625 °C/W SOT–23 P3
Maximum Lead Temperature for Soldering TL 260 °C CASE 318 W
1 STYLE 21
Purposes, 1/8″ from case for 10
seconds 2
PIN ASSIGNMENT
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ORDERING INFORMATION
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SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • The soldering temperature and time should not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within • When shifting from preheating to soldering, the
a short time could result in device failure. Therefore, the maximum temperature gradient should be 5°C or less.
following items should always be observed in order to • After soldering has been completed, the device should
minimize the thermal stress to which the devices are be allowed to cool naturally for at least three minutes.
subjected. Gradual cooling should be used as the use of forced
• Always preheat the device. cooling will increase the temperature gradient and
• The delta temperature between the preheat and result in latent failure due to mechanical stress.
soldering should be 100°C or less.* • Mechanical stress or shock should not be applied
• When preheating and soldering, the temperature of the during cooling
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When * Soldering a device without preheating can cause
using infrared heating with the reflow soldering excessive thermal shock and stress which can result in
method, the difference should be a maximum of 10°C. damage to the device.
http://onsemi.com
381
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Preferred Device
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N–Channel SC–70/SOT–323
These miniature surface mount MOSFETs low RDS(on) assure
minimal power loss and conserve energy, making these devices ideal
for use in small power management circuitry. Typical applications are http://onsemi.com
dc–dc converters, power management in portable and
battery–powered products such as computers, printers, PCMCIA 50 mAMPS
cards, cellular and cordless telephones. 30 VOLTS
• Low RDS(on) Provides Higher Efficiency and Extends Battery Life RDS(on) = 50
• Miniature SC–70/SOT–323 Surface Mount Package Saves
Board Space N–Channel
MAXIMUM RATINGS (TJ = 25°C unless otherwise noted)
Rating Symbol Value Unit
Drain–to–Source Voltage VDS 20 Vdc
Gate–to–Source Voltage – Pulse VGS ± 20 Vdc
PIN ASSIGNMENT
3
Drain
Gate 1 2 Source
Top View
ORDERING INFORMATION
http://onsemi.com
383
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MAXIMUM RATINGS
http://onsemi.com
Rating Symbol Value Unit
Drain–Source Voltage VDSS 60 Vdc
500 mAMPS
Drain–Gate Voltage VDGS 60 Vdc
60 VOLTS
Gate–Source Voltage
– Continuous VGS ±20 Vdc
RDS(on) = 5
– Non–repetitive (tp ≤ 50 ms) VGSM ±40 Vpk
N–Channel
Drain Current – Continuous ID 0.5 Adc
– Pulsed IDM 0.8 4
THERMAL CHARACTERISTICS
Characteristic Symbol Max Unit
Total Device Dissipation FR–5 Board PD
(Note 1.) TA = 25°C 225 mW
Derate above 25°C 1.8 mW/°C
Thermal Resistance, Junction to Ambient RqJA 556 °C/W
#
Junction and Storage Temperature TJ, Tstg –55 to °C
+150
1. FR–5 = 1.0 0.75 0.062 in. MARKING
DIAGRAM
3
SOT–23 6Z
CASE 318 W
1 STYLE 21
2
6Z = Device Code
W = Work Week
PIN ASSIGNMENT
3
Drain
Gate 1 2 Source
ORDERING INFORMATION
OFF CHARACTERISTICS
Drain–Source Breakdown Voltage (VGS = 0, ID = 100 mA) V(BR)DSS 60 – Vdc
Gate–Body Leakage Current, Forward (VGSF = 15 Vdc, VDS = 0) IGSS – 10 nAdc
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SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • The soldering temperature and time shall not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within • When shifting from preheating to soldering, the
a short time could result in device failure. Therefore, the maximum temperature gradient shall be 5°C or less.
following items should always be observed in order to • After soldering has been completed, the device should
minimize the thermal stress to which the devices are be allowed to cool naturally for at least three minutes.
subjected. Gradual cooling should be used as the use of forced
• Always preheat the device. cooling will increase the temperature gradient and
• The delta temperature between the preheat and result in latent failure due to mechanical stress.
soldering should be 100°C or less.* • Mechanical stress or shock should not be applied
• When preheating and soldering, the temperature of the during cooling.
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When * Soldering a device without preheating can cause
using infrared heating with the reflow soldering excessive thermal shock and stress which can result in
method, the difference shall be a maximum of 10°C. damage to the device.
http://onsemi.com
387
(
Preferred Device
#$%& '(
!
N–Channel SC–70/SOT–323
These miniature surface mount MOSFETs low RDS(on) assure
minimal power loss and conserve energy, making these devices ideal
for use in small power management circuitry. Typical applications are http://onsemi.com
dc–dc converters, power management in portable and
battery–powered products such as computers, printers, PCMCIA 300 mAMPS
cards, cellular and cordless telephones. 20 VOLTS
• Low RDS(on) Provides Higher Efficiency and Extends Battery Life RDS(on) = 1
• Miniature SC–70/SOT–323 Surface Mount Package Saves
Board Space N–Channel
4
MAXIMUM RATINGS (TJ = 25°C unless otherwise noted)
Rating Symbol Value Unit
Drain–to–Source Voltage VDSS 20 Vdc
Gate–to–Source Voltage – Continuous VGS ± 20 Vdc
Gate 1 2 Source
Top View
ORDERING INFORMATION
TYPICAL CHARACTERISTICS
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SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • The soldering temperature and time should not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within • When shifting from preheating to soldering, the
a short time could result in device failure. Therefore, the maximum temperature gradient should be 5°C or less.
following items should always be observed in order to • After soldering has been completed, the device should
minimize the thermal stress to which the devices are be allowed to cool naturally for at least three minutes.
subjected. Gradual cooling should be used as the use of forced
• Always preheat the device. cooling will increase the temperature gradient and
• The delta temperature between the preheat and result in latent failure due to mechanical stress.
soldering should be 100°C or less.* • Mechanical stress or shock should not be applied
• When preheating and soldering, the temperature of the during cooling
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When * Soldering a device without preheating can cause
using infrared heating with the reflow soldering excessive thermal shock and stress which can result in
method, the difference should be a maximum of 10°C. damage to the device.
http://onsemi.com
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P–Channel SC–70/SOT–323
These miniature surface mount MOSFETs low RDS(on) assure
minimal power loss and conserve energy, making these devices ideal
for use in small power management circuitry. Typical applications are http://onsemi.com
dc–dc converters, power management in portable and
battery–powered products such as computers, printers, PCMCIA 300 mAMPS
cards, cellular and cordless telephones. 20 VOLTS
• Low RDS(on) Provides Higher Efficiency and Extends Battery Life RDS(on) = 2.2
• Miniature SC–70/SOT–323 Surface Mount Package Saves
Board Space P–Channel
4
MAXIMUM RATINGS (TJ = 25°C unless otherwise noted)
Rating Symbol Value Unit
Drain–to–Source Voltage VDSS 20 Vdc
Gate–to–Source Voltage – Continuous VGS ± 20 Vdc
Drain Current mAdc
– Continuous @ TA = 25°C ID 300
– Continuous @ TA = 70°C ID 240 #
– Pulsed Drain Current (tp ≤ 10 µs) IDM 750
MARKING
Total Power Dissipation @ TA = 25°C PD DIAGRAM
(Note 1.) 150 mW
Derate above 25°C 1.2 mW/°C
3
Operating and Storage Temperature TJ, Tstg – 55 to °C SC–70/SOT–323 P3
Range 150 CASE 419 W
STYLE 8
Thermal Resistance – Junction–to–Ambient RθJA 833 °C/W 1
2
Maximum Lead Temperature for Soldering TL 260 °C
Purposes, for 10 seconds P3 = Device Code
W = Work Week
1. Mounted on G10/FR4 glass epoxy board using minimum recommended
footprint.
PIN ASSIGNMENT
3 Drain
Gate 1 2 Source
Top View
ORDERING INFORMATION
TYPICAL CHARACTERISTICS
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SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • The soldering temperature and time should not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within • When shifting from preheating to soldering, the
a short time could result in device failure. Therefore, the maximum temperature gradient should be 5°C or less.
following items should always be observed in order to • After soldering has been completed, the device should
minimize the thermal stress to which the devices are be allowed to cool naturally for at least three minutes.
subjected. Gradual cooling should be used as the use of forced
• Always preheat the device. cooling will increase the temperature gradient and
• The delta temperature between the preheat and result in latent failure due to mechanical stress.
soldering should be 100°C or less.* • Mechanical stress or shock should not be applied
• When preheating and soldering, the temperature of the during cooling
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When * Soldering a device without preheating can cause
using infrared heating with the reflow soldering excessive thermal shock and stress which can result in
method, the difference should be a maximum of 10°C. damage to the device.
http://onsemi.com
395
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#$%& '(
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Complementary SO–8, Dual
These miniature surface mount MOSFETs feature ultra low RDS(on)
and true logic level performance. They are capable of withstanding http://onsemi.com
high energy in the avalanche and commutation modes and the
drain–to–source diode has a very low reverse recovery time. 3 AMPERES
MiniMOSt devices are designed for use in low voltage, high speed
25 VOLTS
switching applications where power efficiency is important. Typical
applications are dc–dc converters, and power management in portable RDS(on) = 100 mW (N–Channel)
and battery powered products such as computers, printers, cellular and RDS(on) = 210 mW (P–Channel)
cordless phones. They can also be used for low voltage motor controls
in mass storage products such as disk drives and tape drives. The N–Channel P–Channel
avalanche energy is specified to eliminate the guesswork in designs
D D
where inductive loads are switched and offer additional safety margin
against unexpected voltage transients.
• Low RDS(on) Provides Higher Efficiency and Extends Battery Life
• Logic Level Gate Drive – Can be Driven by Logic ICs G G
• Miniature SO–8 Surface Mount Package – Saves Board Space
• Diode Exhibits High Speed, with Soft Recovery S S
http://onsemi.com
397
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(N) ta (N) – 18 –
(ID = 2.0 Adc, (P) – 13 –
VGS = 0 Vdc tb (N) – 5.0 –
dIS/dt = 100 A/µs) (P) – 7.0 –
Reverse Recovery Stored QRR (N) – 0.02 – µC
Charge (P) – 0.02 –
5. Negative signs for P–Channel device omitted for clarity.
6. Pulse Test: Pulse Width ≤ 300 µs, Duty Cycle ≤ 2%.
http://onsemi.com
398
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#$%& '(
N–Channel SO–8, Dual
These miniature surface mount MOSFETs feature ultra low RDS(on)
and true logic level performance. They are capable of withstanding
high energy in the avalanche and commutation modes and the http://onsemi.com
drain–to–source diode has a low reverse recovery time. MiniMOSt
devices are designed for use in low voltage, high speed switching 1 AMPERE
applications where power efficiency is important. Typical applications 50 VOLTS
are dc–dc converters, and power management in portable and battery
powered products such as computers, printers, cellular and cordless
RDS(on) = 300 m
phones. They can also be used for low voltage motor controls in mass
storage products such as disk drives and tape drives. The avalanche N–Channel
energy is specified to eliminate the guesswork in designs where
inductive loads are switched and offer additional safety margin against
unexpected voltage transients.
• Ultra Low RDS(on) Provides Higher Efficiency and Extends Battery
Life
1. Mounted on 2″ square FR4 board (1″ sq. 2 oz. Cu 0.06″ thick single sided) with Device Package Shipping
one die operating, 10 sec. max.
MMDF1N05ER2 SO–8 2500 Tape & Reel
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when it is forward biased, or when it is on, or being turned !
on. Because these curves include the limitations of
simultaneous high voltage and high current, up to the rating
of the device, they are especially useful to designers of linear
systems. The curves are based on a case temperature of 25°C
and a maximum junction temperature of 150°C. Limitations
for repetitive pulses at various case temperatures can be
determined by using the thermal response curves. ON
Semiconductor Application Note, AN569, “Transient
Thermal Resistance – General Data and Its Use” provides
detailed instructions. Figure 9. Maximum Rated Forward Biased
Safe Operating Area
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SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • The soldering temperature and time shall not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within • When shifting from preheating to soldering, the
a short time could result in device failure. Therefore, the maximum temperature gradient shall be 5°C or less.
following items should always be observed in order to • After soldering has been completed, the device should
minimize the thermal stress to which the devices are be allowed to cool naturally for at least three minutes.
subjected. Gradual cooling should be used as the use of forced
• Always preheat the device. cooling will increase the temperature gradient and
• The delta temperature between the preheat and result in latent failure due to mechanical stress.
soldering should be 100°C or less.* • Mechanical stress or shock should not be applied
• When preheating and soldering, the temperature of the during cooling
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When * Soldering a device without preheating can cause
using infrared heating with the reflow soldering excessive thermal shock and stress which can result in
method, the difference shall be a maximum of 10°C. damage to the device.
http://onsemi.com
403
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Preferred Device
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Complementary SO–8, Dual
These miniature surface mount MOSFETs feature ultra low RDS(on)
http://onsemi.com
and true logic level performance. They are capable of withstanding
high energy in the avalanche and commutation modes and the
2 AMPERES
drain–to–source diode has a very low reverse recovery time.
MiniMOSt devices are designed for use in low voltage, high speed 12 VOLTS
switching applications where power efficiency is important. Typical RDS(on) = 45 m (N–Channel)
applications are dc–dc converters, and power management in portable RDS(on) = 180 m (P–Channel)
and battery powered products such as computers, printers, cellular and
cordless phones. They can also be used for low voltage motor controls
in mass storage products such as disk drives and tape drives. N–Channel P–Channel
• Ultra Low RDS(on) Provides Higher Efficiency and Extends D D
Battery Life
• Logic Level Gate Drive – Can Be Driven by Logic ICs
• Miniature SO–8 Surface Mount Package – Saves Board Space
G
• Diode Is Characterized for Use In Bridge Circuits G
http://onsemi.com
405
MMDF2C01HD
ELECTRICAL CHARACTERISTICS – continued (TA = 25°C unless otherwise noted) (Note 6.)
Characteristic Symbol Polarity Min Typ Max Unit
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and Gate Voltage and Gate Voltage
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Switching behavior is most easily modeled and predicted The capacitance (Ciss) is read from the capacitance curve at
by recognizing that the power MOSFET is charge a voltage corresponding to the off–state condition when
controlled. The lengths of various switching intervals (∆t) calculating td(on) and is read at a voltage corresponding to the
are determined by how fast the FET input capacitance can on–state when calculating td(off).
be charged by current from the generator. At high switching speeds, parasitic circuit elements
The published capacitance data is difficult to use for complicate the analysis. The inductance of the MOSFET
calculating rise and fall because drain–gate capacitance source lead, inside the package and in the circuit wiring
varies greatly with applied voltage. Accordingly, gate which is common to both the drain and gate current paths,
charge data is used. In most cases, a satisfactory estimate of produces a voltage at the source which reduces the gate drive
average input current (IG(AV)) can be made from a current. The voltage is determined by Ldi/dt, but since di/dt
rudimentary analysis of the drive circuit so that is a function of drain current, the mathematical solution is
t = Q/IG(AV) complex. The MOSFET output capacitance also
complicates the mathematics. And finally, MOSFETs have
During the rise and fall time interval when switching a finite internal gate resistance which effectively adds to the
resistive load, VGS remains virtually constant at a level resistance of the driving source, but the internal resistance
known as the plateau voltage, VSGP. Therefore, rise and fall is difficult to measure and, consequently, is not specified.
times may be approximated by the following: The resistive switching time variation versus gate
tr = Q2 x RG/(VGG – VGSP) resistance (Figure 9) shows how typical switching
tf = Q2 x RG/VGSP performance is affected by the parasitic circuit elements. If
where the parasitics were not present, the slope of the curves would
maintain a value of unity regardless of the switching speed.
VGG = the gate drive voltage, which varies from zero to VGG
The circuit used to obtain the data is constructed to minimize
RG = the gate drive resistance
common inductance in the drain and gate circuit loops and
and Q2 and VGSP are read from the gate charge curve.
is believed readily achievable with board mounted
During the turn–on and turn–off delay times, gate current is components. Most power electronic loads are inductive; the
not constant. The simplest calculation uses appropriate data in the figure is taken with a resistive load, which
values from the capacitance curves in a standard equation for approximates an optimally snubbed inductive load. Power
voltage change in an RC network. The equations are: MOSFETs may be safely operated into an inductive load;
td(on) = RG Ciss In [VGG/(VGG – VGSP)] however, snubbing reduces switching losses.
td(off) = RG Ciss In (VGG/VGSP)
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The switching characteristics of a MOSFET body diode high di/dts. The diode’s negative di/dt during ta is directly
are very important in systems using it as a freewheeling or controlled by the device clearing the stored charge.
commutating diode. Of particular interest are the reverse However, the positive di/dt during tb is an uncontrollable
recovery characteristics which play a major role in diode characteristic and is usually the culprit that induces
determining switching losses, radiated noise, EMI and RFI. current ringing. Therefore, when comparing diodes, the
System switching losses are largely due to the nature of ratio of tb/ta serves as a good indicator of recovery
the body diode itself. The body diode is a minority carrier abruptness and thus gives a comparative estimate of
device, therefore it has a finite reverse recovery time, trr, due probable noise generated. A ratio of 1 is considered ideal and
to the storage of minority carrier charge, QRR, as shown in values less than 0.5 are considered snappy.
the typical reverse recovery wave form of Figure 14. It is this Compared to ON Semiconductor standard cell density
stored charge that, when cleared from the diode, passes low voltage MOSFETs, high cell density MOSFET diodes
through a potential and defines an energy loss. Obviously, are faster (shorter trr), have less stored charge and a softer
repeatedly forcing the diode through reverse recovery reverse recovery characteristic. The softness advantage of
further increases switching losses. Therefore, one would the high cell density diode means they can be forced through
like a diode with short trr and low QRR specifications to reverse recovery at a higher di/dt than a standard cell
minimize these losses. MOSFET diode without increasing the current ringing or the
The abruptness of diode reverse recovery effects the noise generated. In addition, power dissipation incurred
amount of radiated noise, voltage spikes, and current from switching the diode will be less due to the shorter
ringing. The mechanisms at work are finite irremovable recovery time and lower switching losses.
circuit parasitic inductances and capacitances acted upon by
N–Channel P–Channel
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The Forward Biased Safe Operating Area curves define total power averaged over a complete switching cycle must
the maximum simultaneous drain–to–source voltage and not exceed (TJ(MAX) – TC)/(RθJC).
drain current that a transistor can handle safely when it is A power MOSFET designated E–FET can be safely used
forward biased. Curves are based upon maximum peak in switching circuits with unclamped inductive loads. For
junction temperature and a case temperature (TC) of 25°C. reliable operation, the stored energy from circuit inductance
Peak repetitive pulsed power limits are determined by using dissipated in the transistor while in avalanche must be less
the thermal response data in conjunction with the procedures than the rated limit and must be adjusted for operating
discussed in AN569, “Transient Thermal Resistance – conditions differing from those specified. Although industry
General Data and Its Use.” practice is to rate in terms of energy, avalanche energy
Switching between the off–state and the on–state may capability is not a constant. The energy rating decreases
traverse any load line provided neither rated peak current non–linearly with an increase of peak current in avalanche
(IDM) nor rated voltage (VDSS) is exceeded, and that the and peak junction temperature.
transition time (tr, tf) does not exceed 10 µs. In addition the
N–Channel P–Channel
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SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • The soldering temperature and time shall not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within • When shifting from preheating to soldering, the
a short time could result in device failure. Therefore, the maximum temperature gradient shall be 5°C or less.
following items should always be observed in order to • After soldering has been completed, the device should
minimize the thermal stress to which the devices are be allowed to cool naturally for at least three minutes.
subjected. Gradual cooling should be used as the use of forced
• Always preheat the device. cooling will increase the temperature gradient and
• The delta temperature between the preheat and result in latent failure due to mechanical stress.
soldering should be 100°C or less.* • Mechanical stress or shock should not be applied
• When preheating and soldering, the temperature of the during cooling.
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When * Soldering a device without preheating can cause
using infrared heating with the reflow soldering excessive thermal shock and stress which can result in
method, the difference shall be a maximum of 10°C. damage to the device.
http://onsemi.com
414
MMDF2C01HD
150°C
SOLDER IS LIQUID FOR
40 TO 80 SECONDS
100°C 140°C (DEPENDING ON
MASS OF ASSEMBLY)
100°C
http://onsemi.com
415
(
#$%& '(
-
Complementary SO–8, Dual
These miniature surface mount MOSFETs feature ultra low RDS(on)
and true logic level performance. They are capable of withstanding http://onsemi.com
high energy in the avalanche and commutation modes and the
drain–to–source diode has a low reverse recovery time. MiniMOSt 2.5 AMPERES
devices are designed for use in low voltage, high speed switching 25 VOLTS
applications where power efficiency is important. Typical applications
are dc–dc converters, and power management in portable and battery
RDS(on) = 100 m (N–Channel)
powered products such as computers, printers, cellular and cordless RDS(on) = 250 m (P–Channel)
phones. They can also be used for low voltage motor controls in mass
storage products such as disk drives and tape drives. The avalanche N–Channel P–Channel
energy is specified to eliminate the guesswork in designs where
D D
inductive loads are switched and offer additional safety margin against
unexpected voltage transients.
• Ultra Low RDS(on) Provides Higher Efficiency and Extends Battery
Life G
G
• Logic Level Gate Drive – Can Be Driven by Logic ICs
• Miniature SO–8 Surface Mount Package – Saves Board Space S
S
• Diode Is Characterized for Use In Bridge Circuits
• Diode Exhibits High Speed, with Soft Recovery MARKING
• Avalanche Energy Specified DIAGRAM
• Mounting Information for SO–8 Package Provided
MAXIMUM RATINGS (TJ = 25°C unless otherwise noted) (Note 1.)
SO–8, Dual
Rating Symbol Value Unit F2C02
8 CASE 751
LYWW
Drain–to–Source Voltage VDSS 25 Vdc STYLE 14
Gate–to–Source Voltage VGS ± 20 Vdc 1
Drain Current – Continuous N–Channel ID 3.6 Adc
P–Channel 2.5 F2C02 = Device Code
– Pulsed N–Channel IDM 18 L = Location Code
P–Channel 13 Y = Year
WW = Work Week
Operating and Storage Temperature Range TJ and – 55 °C
Tstg to 150
Total Power Dissipation @ TA= 25°C (Note 2.) PD 2.0 Watts PIN ASSIGNMENT
Single Pulse Drain–to–Source Avalanche EAS mJ
N–Source 1 8 N–Drain
Energy – Starting TJ = 25°C
(VDD = 20 V, VGS = 10 V, Peak IL = 9.0 A, N–Gate 2 7 N–Drain
L = 6.0 mH, RG = 25 Ω) N–Channel 245 P–Source 3 6 P–Drain
(VDD = 20 V, VGS = 10 V, Peak IL = 7.0 A,
L = 10 mH, RG = 25 Ω) P–Channel 245 P–Gate 4 5 P–Drain
Thermal Resistance – Junction to Ambient RθJA 62.5 °C/W Top View
(Note 2.)
Maximum Lead Temperature for Soldering, TL 260 °C ORDERING INFORMATION
0.0625″ from case. Time in Solder Bath is
Device Package Shipping
10 seconds.
1. Negative signs for P–Channel device omitted for clarity. MMDF2C02ER2 SO–8 2500 Tape & Reel
2. Mounted on 2” square FR4 board (1” sq. 2 oz. Cu 0.06” thick single sided) with
one die operating, 10 sec. max.
This document contains information on a new product. Specifications and information
herein are subject to change without notice.
http://onsemi.com
417
MMDF2C02E
ELECTRICAL CHARACTERISTICS – continued (TA = 25°C unless otherwise noted) (Note 6.)
Characteristic Symbol Polarity Min Typ Max Unit
SWITCHING CHARACTERISTICS – continued (Note 8.)
Total Gate Charge QT (N) – 10.6 30 nC
(P) – 10 15
Gate–Source Charge Q1 (N) – 1.3 –
(VDS = 16 Vdc, ID = 2.0 Adc, (P) – 1.0 –
Gate–Drain Charge VGS = 10 Vdc) Q2 (N) – 2.9 –
(P) – 3.5 –
Q3 (N) – 2.7 –
(P) – 3.0 –
SOURCE–DRAIN DIODE CHARACTERISTICS (TC = 25°C)
Forward Voltage (Note 7.) (IS = 2.0 Adc, VGS = 0 Vdc) VSD (N) – 1.0 1.4 Vdc
(IS = 2.0 Adc, VGS = 0 Vdc) (P) – 1.5 2.0
Reverse Recovery Time trr (N) – 34 66 ns
see Figure 7 (P) – 32 64
ta (N) – 17 –
(IF = IS, (P) – 19 –
dIS/dt = 100 A/µs) tb (N) – 17 –
(P) – 12 –
QRR (N) – 0.025 – µC
(P) – 0.035 –
6. Negative signs for P–Channel device omitted for clarity.
7. Pulse Test: Pulse Width ≤ 300 µs, Duty Cycle ≤ 2%.
8. Pulse Test: Pulse Width ≤ 300 µs, Duty Cycle ≤ 2%.
http://onsemi.com
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Switching behavior is most easily modeled and predicted During the turn–on and turn–off delay times, gate current is
by recognizing that the power MOSFET is charge not constant. The simplest calculation uses appropriate
controlled. The lengths of various switching intervals (∆t) values from the capacitance curves in a standard equation for
are determined by how fast the FET input capacitance can voltage change in an RC network. The equations are:
be charged by current from the generator. td(on) = RG Ciss In [VGG/(VGG – VGSP)]
The published capacitance data is difficult to use for td(off) = RG Ciss In (VGG/VGSP)
calculating rise and fall because drain–gate capacitance
varies greatly with applied voltage. Accordingly, gate The capacitance (Ciss) is read from the capacitance curve at
charge data is used. In most cases, a satisfactory estimate of a voltage corresponding to the off–state condition when
average input current (IG(AV)) can be made from a calculating td(on) and is read at a voltage corresponding to the
rudimentary analysis of the drive circuit so that on–state when calculating td(off).
At high switching speeds, parasitic circuit elements
t = Q/IG(AV) complicate the analysis. The inductance of the MOSFET
During the rise and fall time interval when switching a source lead, inside the package and in the circuit wiring
resistive load, VGS remains virtually constant at a level which is common to both the drain and gate current paths,
known as the plateau voltage, VSGP. Therefore, rise and fall produces a voltage at the source which reduces the gate drive
times may be approximated by the following: current. The voltage is determined by Ldi/dt, but since di/dt
tr = Q2 x RG/(VGG – VGSP) is a function of drain current, the mathematical solution is
tf = Q2 x RG/VGSP complex. The MOSFET output capacitance also
complicates the mathematics. And finally, MOSFETs have
where finite internal gate resistance which effectively adds to the
VGG = the gate drive voltage, which varies from zero to VGG resistance of the driving source, but the internal resistance
RG = the gate drive resistance is difficult to measure and, consequently, is not specified.
and Q2 and VGSP are read from the gate charge curve.
http://onsemi.com
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The switching characteristics of a MOSFET body diode high di/dts. The diode’s negative di/dt during ta is directly
are very important in systems using it as a freewheeling or controlled by the device clearing the stored charge.
commutating diode. Of particular interest are the reverse However, the positive di/dt during tb is an uncontrollable
recovery characteristics which play a major role in diode characteristic and is usually the culprit that induces
determining switching losses, radiated noise, EMI and RFI. current ringing. Therefore, when comparing diodes, the
System switching losses are largely due to the nature of ratio of tb/ta serves as a good indicator of recovery
the body diode itself. The body diode is a minority carrier abruptness and thus gives a comparative estimate of
device, therefore it has a finite reverse recovery time, trr, due probable noise generated. A ratio of 1 is considered ideal and
to the storage of minority carrier charge, QRR, as shown in values less than 0.5 are considered snappy.
the typical reverse recovery wave form of Figure 11. It is this Compared to ON Semiconductor standard cell density
stored charge that, when cleared from the diode, passes low voltage MOSFETs, high cell density MOSFET diodes
through a potential and defines an energy loss. Obviously, are faster (shorter trr), have less stored charge and a softer
repeatedly forcing the diode through reverse recovery reverse recovery characteristic. The softness advantage of
further increases switching losses. Therefore, one would the high cell density diode means they can be forced through
like a diode with short trr and low QRR specifications to reverse recovery at a higher di/dt than a standard cell
minimize these losses. MOSFET diode without increasing the current ringing or the
The abruptness of diode reverse recovery effects the noise generated. In addition, power dissipation incurred
amount of radiated noise, voltage spikes, and current from switching the diode will be less due to the shorter
ringing. The mechanisms at work are finite irremovable recovery time and lower switching losses.
circuit parasitic inductances and capacitances acted upon by
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Figure 7. Reverse Recovery Time (trr)
http://onsemi.com
422
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The Forward Biased Safe Operating Area curves define reliable operation, the stored energy from circuit inductance
the maximum simultaneous drain–to–source voltage and dissipated in the transistor while in avalanche must be less
drain current that a transistor can handle safely when it is than the rated limit and must be adjusted for operating
forward biased. Curves are based upon maximum peak conditions differing from those specified. Although industry
junction temperature and a case temperature (TC) of 25°C. practice is to rate in terms of energy, avalanche energy
Peak repetitive pulsed power limits are determined by using capability is not a constant. The energy rating decreases
the thermal response data in conjunction with the procedures non–linearly with an increase of peak current in avalanche
discussed in AN569, “Transient Thermal Resistance – and peak junction temperature.
General Data and Its Use.” Although many E–FETs can withstand the stress of
Switching between the off–state and the on–state may drain–to–source avalanche at currents up to rated pulsed
traverse any load line provided neither rated peak current current (IDM), the energy rating is specified at rated
(IDM) nor rated voltage (VDSS) is exceeded, and that the continuous current (ID), in accordance with industry
transition time (tr, tf) does not exceed 10 µs. In addition the custom. The energy rating must be derated for temperature
total power averaged over a complete switching cycle must as shown in the accompanying graph (Figure 9). Maximum
not exceed (TJ(MAX) – TC)/(RθJC). energy at currents below rated continuous ID can safely be
A power MOSFET designated E–FET can be safely used assumed to equal the values indicated.
in switching circuits with unclamped inductive loads. For
N–Channel P–Channel
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SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • The soldering temperature and time shall not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within • When shifting from preheating to soldering, the
a short time could result in device failure. Therefore, the maximum temperature gradient shall be 5°C or less.
following items should always be observed in order to • After soldering has been completed, the device should
minimize the thermal stress to which the devices are be allowed to cool naturally for at least three minutes.
subjected. Gradual cooling should be used as the use of forced
• Always preheat the device. cooling will increase the temperature gradient and
• The delta temperature between the preheat and result in latent failure due to mechanical stress.
soldering should be 100°C or less.* • Mechanical stress or shock should not be applied
• When preheating and soldering, the temperature of the during cooling.
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When * Soldering a device without preheating can cause
using infrared heating with the reflow soldering excessive thermal shock and stress which can result in
method, the difference shall be a maximum of 10°C. damage to the device.
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425
MMDF2C02E
150°C
SOLDER IS LIQUID FOR
40 TO 80 SECONDS
100°C 140°C (DEPENDING ON
MASS OF ASSEMBLY)
100°C
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426
( .
Preferred Device
#$%& '(
Complementary SO–8, Dual
These miniature surface mount MOSFETs feature ultra low RDS(on)
and true logic level performance. They are capable of withstanding http://onsemi.com
high energy in the avalanche and commutation modes and the
drain–to–source diode has a very low reverse recovery time. 2 AMPERES
MiniMOSt devices are designed for use in low voltage, high speed 20 VOLTS
switching applications where power efficiency is important. Typical
applications are dc–dc converters, and power management in portable
RDS(on) = 90 m (N–Channel)
and battery powered products such as computers, printers, cellular and RDS(on) = 160 m (P–Channel)
cordless phones. They can also be used for low voltage motor controls
in mass storage products such as disk drives and tape drives. The N–Channel P–Channel
avalanche energy is specified to eliminate the guesswork in designs
where inductive loads are switched and offer additional safety margin D D
against unexpected voltage transients.
• Ultra Low RDS(on) Provides Higher Efficiency and Extends
Battery Life G
• Logic Level Gate Drive – Can Be Driven by Logic ICs G
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428
MMDF2C02HD
ELECTRICAL CHARACTERISTICS – continued (TA = 25°C unless otherwise noted) (Note 6.)
Characteristic Symbol Polarity Min Typ Max Unit
SWITCHING CHARACTERISTICS – continued (Note 8.)
Total Gate Charge QT (N) – 12.5 18 nC
(P) – 15 20
Gate–Source Charge (VDS = 16 Vdc, ID = 3.0 Adc, Q1 (N) – 1.3 –
VGS = 10 Vdc) (P) – 1.2 –
Gate–Drain Charge (VDS = 16 Vdc, ID = 2.0 Adc, Q2 (N) – 2.8 –
VGS = 10 Vdc) (P) – 5.0 –
Q3 (N) – 2.4 –
(P) – 4.0 –
SOURCE–DRAIN DIODE CHARACTERISTICS (TC = 25°C)
Forward Voltage (Note 7.) (IS = 3.0 Adc, VGS = 0 Vdc) VSD (N) – 0.79 1.3 Vdc
(IS = 2.0 Adc, VGS = 0 Vdc) (P) – 1.5 2.1
Reverse Recovery Time trr (N) – 23 – ns
(P) – 38 –
(IS = 3.0 Adc, VAS = 0 Vdc, ta (N) – 18 –
dIS/dt = 100 A/µs) (P) – 17 –
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Switching behavior is most easily modeled and predicted The capacitance (Ciss) is read from the capacitance curve at
by recognizing that the power MOSFET is charge a voltage corresponding to the off–state condition when
controlled. The lengths of various switching intervals (∆t) calculating td(on) and is read at a voltage corresponding to the
are determined by how fast the FET input capacitance can on–state when calculating td(off).
be charged by current from the generator. At high switching speeds, parasitic circuit elements
The published capacitance data is difficult to use for complicate the analysis. The inductance of the MOSFET
calculating rise and fall because drain–gate capacitance source lead, inside the package and in the circuit wiring
varies greatly with applied voltage. Accordingly, gate which is common to both the drain and gate current paths,
charge data is used. In most cases, a satisfactory estimate of produces a voltage at the source which reduces the gate drive
average input current (IG(AV)) can be made from a current. The voltage is determined by Ldi/dt, but since di/dt
rudimentary analysis of the drive circuit so that is a function of drain current, the mathematical solution is
t = Q/IG(AV) complex. The MOSFET output capacitance also
complicates the mathematics. And finally, MOSFETs have
During the rise and fall time interval when switching a finite internal gate resistance which effectively adds to the
resistive load, VGS remains virtually constant at a level resistance of the driving source, but the internal resistance
known as the plateau voltage, VSGP. Therefore, rise and fall is difficult to measure and, consequently, is not specified.
times may be approximated by the following: The resistive switching time variation versus gate
tr = Q2 x RG/(VGG – VGSP) resistance (Figure 9) shows how typical switching
tf = Q2 x RG/VGSP performance is affected by the parasitic circuit elements. If
where the parasitics were not present, the slope of the curves would
maintain a value of unity regardless of the switching speed.
VGG = the gate drive voltage, which varies from zero to VGG
The circuit used to obtain the data is constructed to minimize
RG = the gate drive resistance
common inductance in the drain and gate circuit loops and
and Q2 and VGSP are read from the gate charge curve.
is believed readily achievable with board mounted
During the turn–on and turn–off delay times, gate current is components. Most power electronic loads are inductive; the
not constant. The simplest calculation uses appropriate data in the figure is taken with a resistive load, which
values from the capacitance curves in a standard equation for approximates an optimally snubbed inductive load. Power
voltage change in an RC network. The equations are: MOSFETs may be safely operated into an inductive load;
td(on) = RG Ciss In [VGG/(VGG – VGSP)] however, snubbing reduces switching losses.
td(off) = RG Ciss In (VGG/VGSP)
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432
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The switching characteristics of a MOSFET body diode high di/dts. The diode’s negative di/dt during ta is directly
are very important in systems using it as a freewheeling or controlled by the device clearing the stored charge.
commutating diode. Of particular interest are the reverse However, the positive di/dt during tb is an uncontrollable
recovery characteristics which play a major role in diode characteristic and is usually the culprit that induces
determining switching losses, radiated noise, EMI and RFI. current ringing. Therefore, when comparing diodes, the
System switching losses are largely due to the nature of ratio of tb/ta serves as a good indicator of recovery
the body diode itself. The body diode is a minority carrier abruptness and thus gives a comparative estimate of
device, therefore it has a finite reverse recovery time, trr, due probable noise generated. A ratio of 1 is considered ideal and
to the storage of minority carrier charge, QRR, as shown in values less than 0.5 are considered snappy.
the typical reverse recovery wave form of Figure 15. It is this Compared to ON Semiconductor standard cell density
stored charge that, when cleared from the diode, passes low voltage MOSFETs, high cell density MOSFET diodes
through a potential and defines an energy loss. Obviously, are faster (shorter trr), have less stored charge and a softer
repeatedly forcing the diode through reverse recovery reverse recovery characteristic. The softness advantage of
further increases switching losses. Therefore, one would the high cell density diode means they can be forced through
like a diode with short trr and low QRR specifications to reverse recovery at a higher di/dt than a standard cell
minimize these losses. MOSFET diode without increasing the current ringing or the
The abruptness of diode reverse recovery effects the noise generated. In addition, power dissipation incurred
amount of radiated noise, voltage spikes, and current from switching the diode will be less due to the shorter
ringing. The mechanisms at work are finite irremovable recovery time and lower switching losses.
circuit parasitic inductances and capacitances acted upon by
N–Channel P–Channel
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Figure 11. Reverse Recovery Time (trr)
http://onsemi.com
434
MMDF2C02HD
The Forward Biased Safe Operating Area curves define reliable operation, the stored energy from circuit inductance
the maximum simultaneous drain–to–source voltage and dissipated in the transistor while in avalanche must be less
drain current that a transistor can handle safely when it is than the rated limit and must be adjusted for operating
forward biased. Curves are based upon maximum peak conditions differing from those specified. Although industry
junction temperature and a case temperature (TC) of 25°C. practice is to rate in terms of energy, avalanche energy
Peak repetitive pulsed power limits are determined by using capability is not a constant. The energy rating decreases
the thermal response data in conjunction with the procedures non–linearly with an increase of peak current in avalanche
discussed in AN569, “Transient Thermal Resistance – and peak junction temperature.
General Data and Its Use.” Although many E–FETs can withstand the stress of
Switching between the off–state and the on–state may drain–to–source avalanche at currents up to rated pulsed
traverse any load line provided neither rated peak current current (IDM), the energy rating is specified at rated
(IDM) nor rated voltage (VDSS) is exceeded, and that the continuous current (ID), in accordance with industry
transition time (tr, tf) does not exceed 10 µs. In addition the custom. The energy rating must be derated for temperature
total power averaged over a complete switching cycle must as shown in the accompanying graph (Figure 13). Maximum
not exceed (TJ(MAX) – TC)/(RθJC). energy at currents below rated continuous ID can safely be
A power MOSFET designated E–FET can be safely used assumed to equal the values indicated.
in switching circuits with unclamped inductive loads. For
N–Channel P–Channel
;'1 #″ !J .
6 +)( ″ !J # A ; 9″ " # ;'1 #″ !J .
6 +)( ″ !J # A ; 9″
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Figure 12. Maximum Rated Forward Biased Figure 12. Maximum Rated Forward Biased
Safe Operating Area Safe Operating Area
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Starting Junction Temperature Starting Junction Temperature
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SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • The soldering temperature and time shall not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within • When shifting from preheating to soldering, the
a short time could result in device failure. Therefore, the maximum temperature gradient shall be 5°C or less.
following items should always be observed in order to • After soldering has been completed, the device should
minimize the thermal stress to which the devices are be allowed to cool naturally for at least three minutes.
subjected. Gradual cooling should be used as the use of forced
• Always preheat the device. cooling will increase the temperature gradient and
• The delta temperature between the preheat and result in latent failure due to mechanical stress.
soldering should be 100°C or less.* • Mechanical stress or shock should not be applied
• When preheating and soldering, the temperature of the during cooling.
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When * Soldering a device without preheating can cause
using infrared heating with the reflow soldering excessive thermal shock and stress which can result in
method, the difference shall be a maximum of 10°C. damage to the device.
http://onsemi.com
437
MMDF2C02HD
150°C
SOLDER IS LIQUID FOR
40 TO 80 SECONDS
100°C 140°C (DEPENDING ON
MASS OF ASSEMBLY)
100°C
http://onsemi.com
438
( !.
Preferred Device
#$%& '(
!
Complementary SO–8, Dual
These miniature surface mount MOSFETs feature ultra low RDS(on)
and true logic level performance. They are capable of withstanding
high energy in the avalanche and commutation modes and the http://onsemi.com
drain-to-source diode has a very low reverse recovery time.
MiniMOSt devices are designed for use in low voltage, high speed 2 AMPERES
switching applications where power efficiency is important. Typical 30 VOLTS
applications are dc-dc converters, and power management in portable RDS(on) = 70 m (N-Channel)
and battery powered products such as computers, printers, cellular and
cordless phones. They can also be used for low voltage motor controls RDS(on) = 200 m (P-Channel)
in mass storage products such as disk drives and tape drives. The
avalanche energy is specified to eliminate the guesswork in designs N–Channel P–Channel
where inductive loads are switched and offer additional safety margin
against unexpected voltage transients.
• Ultra Low RDS(on) Provides Higher Efficiency and Extends
Battery Life
• Logic Level Gate Drive – Can Be Driven by Logic ICs
• Miniature SO-8 Surface Mount Package – Saves Board Space
• Diode Is Characterized for Use In Bridge Circuits
• Diode Exhibits High Speed, With Soft Recovery MARKING
• IDSS Specified at Elevated Temperature DIAGRAM
• Avalanche Energy Specified
• Mounting Information for SO-8 Package Provided SO–8, Dual
D2C03
8 CASE 751
LYWW
STYLE 14
MAXIMUM RATINGS (TJ = 25°C unless otherwise noted) (Note 1.)
1
Rating Symbol Value Unit
Drain–to–Source Voltage VDSS 30 Vdc D2C03 = Device Code
Gate–to–Source Voltage VGS ± 20 Vdc L = Location Code
Drain Current – Continuous N–Channel ID 4.1 A Y = Year
P–Channel 3.0 WW = Work Week
Drain Current – Pulsed N–Channel IDM 21
P–Channel 15
PIN ASSIGNMENT
Operating and Storage Temperature Range TJ, Tstg – 55 °C
to 150
N–Source 1 8 N–Drain
Total Power Dissipation @ TA= 25°C (Note 2.) PD 2.0 Watts
N–Gate 2 7 N–Drain
Thermal Resistance – Junction to Ambient RθJA 62.5 °C/W
P–Source 3 6 P–Drain
(Note 2.)
P–Gate 4 5 P–Drain
Single Pulse Drain–to–Source Avalanche EAS mJ
Energy – Starting TJ = 25°C Top View
(VDD = 30 V, VGS = 5.0 V, Peak IL = 9.0
Apk, L = 8.0 mH, RG = 25 Ω) N–Channel 324
(VDD = 30 V, VGS = 5.0 V, Peak IL = 6.0 ORDERING INFORMATION
Apk, L = 18 mH, RG = 25 Ω) P–Channel 324
Device Package Shipping
Maximum Lead Temperature for Soldering, TL 260 °C
0.0625″ from case. Time in Solder Bath is MMDF2C03HDR2 SO–8 2500 Tape & Reel
10 seconds.
1. Negative signs for P–Channel device omitted for clarity.
2. Mounted on 2” square FR4 board (1” sq. 2 oz. Cu 0.06” thick single sided) with Preferred devices are recommended choices for future use
one die operating, 10 sec. max. and best overall value.
http://onsemi.com
440
MMDF2C03HD
ELECTRICAL CHARACTERISTICS – continued (TA = 25°C unless otherwise noted) (Note 6.)
Characteristic Symbol Polarity Min Typ Max Unit
SWITCHING CHARACTERISTICS – continued (Note 8.)
Total Gate Charge QT (N) – 11.5 16 nC
(P) – 14.2 19
Gate–Source Charge (VDS = 10 Vdc, ID = 3.0 Adc, Q1 (N) – 1.5 –
VGS = 10 Vdc) (P) – 1.1 –
Gate–Drain Charge (VDS = 24 Vdc, ID = 2.0 Adc, Q2 (N) – 3.5 –
VGS = 10 Vdc) (P) – 4.5 –
Q3 (N) – 2.8 –
(P) – 3.5 –
SOURCE–DRAIN DIODE CHARACTERISTICS (TC = 25°C)
Forward Voltage (Note 7.) (IS = 3.0 Adc, VGS = 0 Vdc) VSD (N) – 0.82 1.2 Vdc
(IS = 2.0 Adc, VGS = 0 Vdc) (P) – 1.82 2.0
Reverse Recovery Time trr (N) – 24 – ns
(P) – 42 –
ta (N) – 17 –
(P) – 16 –
(IF = IS,
dIS/dt = 100 A/µs) tb (N) – 7.0 –
(P) – 26 –
Reverse Recovery Storage QRR (N) – 0.025 – µC
Charge (P) – 0.043 –
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Switching behavior is most easily modeled and predicted The capacitance (Ciss) is read from the capacitance curve at
by recognizing that the power MOSFET is charge a voltage corresponding to the off–state condition when
controlled. The lengths of various switching intervals (∆t) calculating td(on) and is read at a voltage corresponding to the
are determined by how fast the FET input capacitance can on–state when calculating td(off).
be charged by current from the generator. At high switching speeds, parasitic circuit elements
The published capacitance data is difficult to use for complicate the analysis. The inductance of the MOSFET
calculating rise and fall because drain–gate capacitance source lead, inside the package and in the circuit wiring
varies greatly with applied voltage. Accordingly, gate which is common to both the drain and gate current paths,
charge data is used. In most cases, a satisfactory estimate of produces a voltage at the source which reduces the gate drive
average input current (IG(AV)) can be made from a current. The voltage is determined by Ldi/dt, but since di/dt
rudimentary analysis of the drive circuit so that is a function of drain current, the mathematical solution is
t = Q/IG(AV) complex. The MOSFET output capacitance also
complicates the mathematics. And finally, MOSFETs have
During the rise and fall time interval when switching a finite internal gate resistance which effectively adds to the
resistive load, VGS remains virtually constant at a level resistance of the driving source, but the internal resistance
known as the plateau voltage, VSGP. Therefore, rise and fall is difficult to measure and, consequently, is not specified.
times may be approximated by the following: The resistive switching time variation versus gate
tr = Q2 x RG/(VGG – VGSP) resistance (Figure 9) shows how typical switching
tf = Q2 x RG/VGSP performance is affected by the parasitic circuit elements. If
where the parasitics were not present, the slope of the curves would
maintain a value of unity regardless of the switching speed.
VGG = the gate drive voltage, which varies from zero to VGG
The circuit used to obtain the data is constructed to minimize
RG = the gate drive resistance
common inductance in the drain and gate circuit loops and
and Q2 and VGSP are read from the gate charge curve.
is believed readily achievable with board mounted
During the turn–on and turn–off delay times, gate current is components. Most power electronic loads are inductive; the
not constant. The simplest calculation uses appropriate data in the figure is taken with a resistive load, which
values from the capacitance curves in a standard equation for approximates an optimally snubbed inductive load. Power
voltage change in an RC network. The equations are: MOSFETs may be safely operated into an inductive load;
td(on) = RG Ciss In [VGG/(VGG – VGSP)] however, snubbing reduces switching losses.
td(off) = RG Ciss In (VGG/VGSP)
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The switching characteristics of a MOSFET body diode high di/dts. The diode’s negative di/dt during ta is directly
are very important in systems using it as a freewheeling or controlled by the device clearing the stored charge.
commutating diode. Of particular interest are the reverse However, the positive di/dt during tb is an uncontrollable
recovery characteristics which play a major role in diode characteristic and is usually the culprit that induces
determining switching losses, radiated noise, EMI and RFI. current ringing. Therefore, when comparing diodes, the
System switching losses are largely due to the nature of ratio of tb/ta serves as a good indicator of recovery
the body diode itself. The body diode is a minority carrier abruptness and thus gives a comparative estimate of
device, therefore it has a finite reverse recovery time, trr, due probable noise generated. A ratio of 1 is considered ideal and
to the storage of minority carrier charge, QRR, as shown in values less than 0.5 are considered snappy.
the typical reverse recovery wave form of Figure 15. It is this Compared to ON Semiconductor standard cell density
stored charge that, when cleared from the diode, passes low voltage MOSFETs, high cell density MOSFET diodes
through a potential and defines an energy loss. Obviously, are faster (shorter trr), have less stored charge and a softer
repeatedly forcing the diode through reverse recovery reverse recovery characteristic. The softness advantage of
further increases switching losses. Therefore, one would the high cell density diode means they can be forced through
like a diode with short trr and low QRR specifications to reverse recovery at a higher di/dt than a standard cell
minimize these losses. MOSFET diode without increasing the current ringing or the
The abruptness of diode reverse recovery effects the noise generated. In addition, power dissipation incurred
amount of radiated noise, voltage spikes, and current from switching the diode will be less due to the shorter
ringing. The mechanisms at work are finite irremovable recovery time and lower switching losses.
circuit parasitic inductances and capacitances acted upon by
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The Forward Biased Safe Operating Area curves define reliable operation, the stored energy from circuit inductance
the maximum simultaneous drain–to–source voltage and dissipated in the transistor while in avalanche must be less
drain current that a transistor can handle safely when it is than the rated limit and must be adjusted for operating
forward biased. Curves are based upon maximum peak conditions differing from those specified. Although industry
junction temperature and a case temperature (TC) of 25°C. practice is to rate in terms of energy, avalanche energy
Peak repetitive pulsed power limits are determined by using capability is not a constant. The energy rating decreases
the thermal response data in conjunction with the procedures non–linearly with an increase of peak current in avalanche
discussed in AN569, “Transient Thermal Resistance – and peak junction temperature.
General Data and Its Use.” Although many E–FETs can withstand the stress of
Switching between the off–state and the on–state may drain–to–source avalanche at currents up to rated pulsed
traverse any load line provided neither rated peak current current (IDM), the energy rating is specified at rated
(IDM) nor rated voltage (VDSS) is exceeded, and that the continuous current (ID), in accordance with industry
transition time (tr, tf) does not exceed 10 µs. In addition the custom. The energy rating must be derated for temperature
total power averaged over a complete switching cycle must as shown in the accompanying graph (Figure 13). Maximum
not exceed (TJ(MAX) – TC)/(RθJC). energy at currents below rated continuous ID can safely be
A power MOSFET designated E–FET can be safely used assumed to equal the values indicated.
in switching circuits with unclamped inductive loads. For
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SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • The soldering temperature and time shall not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within • When shifting from preheating to soldering, the
a short time could result in device failure. Therefore, the maximum temperature gradient shall be 5°C or less.
following items should always be observed in order to • After soldering has been completed, the device should
minimize the thermal stress to which the devices are be allowed to cool naturally for at least three minutes.
subjected. Gradual cooling should be used as the use of forced
• Always preheat the device. cooling will increase the temperature gradient and
• The delta temperature between the preheat and result in latent failure due to mechanical stress.
soldering should be 100°C or less.* • Mechanical stress or shock should not be applied
• When preheating and soldering, the temperature of the during cooling.
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When * Soldering a device without preheating can cause
using infrared heating with the reflow soldering excessive thermal shock and stress which can result in
method, the difference shall be a maximum of 10°C. damage to the device.
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150°C
SOLDER IS LIQUID FOR
40 TO 80 SECONDS
100°C 140°C (DEPENDING ON
MASS OF ASSEMBLY)
100°C
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N–Channel SO–8, Dual
These miniature surface mount MOSFETs feature ultra low RDS(on)
and true logic level performance. They are capable of withstanding
high energy in the avalanche and commutation modes and the http://onsemi.com
drain–to–source diode has a low reverse recovery time. MiniMOSt
devices are designed for use in low voltage, high speed switching 2 AMPERES
applications where power efficiency is important. Typical applications 25 VOLTS
are dc–dc converters, and power management in portable and battery
powered products such as computers, printers, cellular and cordless RDS(on) = 100 m
phones. They can also be used for low voltage motor controls in mass
storage products such as disk drives and tape drives. The avalanche N–Channel
energy is specified to eliminate the guesswork in designs where
inductive loads are switched and offer additional safety margin against
unexpected voltage transients.
• Ultra Low RDS(on) Provides Higher Efficiency and Extends Battery
Life
• Logic Level Gate Drive – Can Be Driven by Logic ICs
• Miniature SO–8 Surface Mount Package – Saves Board Space
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Switching behavior is most easily modeled and predicted During the turn–on and turn–off delay times, gate current is
by recognizing that the power MOSFET is charge not constant. The simplest calculation uses appropriate
controlled. The lengths of various switching intervals (∆t) values from the capacitance curves in a standard equation for
are determined by how fast the FET input capacitance can voltage change in an RC network. The equations are:
be charged by current from the generator. td(on) = RG Ciss In [VGG/(VGG – VGSP)]
The published capacitance data is difficult to use for td(off) = RG Ciss In (VGG/VGSP)
calculating rise and fall because drain–gate capacitance
varies greatly with applied voltage. Accordingly, gate The capacitance (Ciss) is read from the capacitance curve at
charge data is used. In most cases, a satisfactory estimate of a voltage corresponding to the off–state condition when
average input current (IG(AV)) can be made from a calculating td(on) and is read at a voltage corresponding to the
rudimentary analysis of the drive circuit so that on–state when calculating td(off).
At high switching speeds, parasitic circuit elements
t = Q/IG(AV) complicate the analysis. The inductance of the MOSFET
During the rise and fall time interval when switching a source lead, inside the package and in the circuit wiring
resistive load, VGS remains virtually constant at a level which is common to both the drain and gate current paths,
known as the plateau voltage, VSGP. Therefore, rise and fall produces a voltage at the source which reduces the gate drive
times may be approximated by the following: current. The voltage is determined by Ldi/dt, but since di/dt
tr = Q2 x RG/(VGG – VGSP) is a function of drain current, the mathematical solution is
tf = Q2 x RG/VGSP complex. The MOSFET output capacitance also
complicates the mathematics. And finally, MOSFETs have
where finite internal gate resistance which effectively adds to the
VGG = the gate drive voltage, which varies from zero to VGG resistance of the driving source, but the internal resistance
RG = the gate drive resistance is difficult to measure and, consequently, is not specified.
and Q2 and VGSP are read from the gate charge curve.
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Figure 7. Capacitance Variation Drain–to–Source Voltage versus Total Charge
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The Forward Biased Safe Operating Area curves define reliable operation, the stored energy from circuit inductance
the maximum simultaneous drain–to–source voltage and dissipated in the transistor while in avalanche must be less
drain current that a transistor can handle safely when it is than the rated limit and must be adjusted for operating
forward biased. Curves are based upon maximum peak conditions differing from those specified. Although industry
junction temperature and a case temperature (TC) of 25°C. practice is to rate in terms of energy, avalanche energy
Peak repetitive pulsed power limits are determined by using capability is not a constant. The energy rating decreases
the thermal response data in conjunction with the procedures non–linearly with an increase of peak current in avalanche
discussed in AN569, “Transient Thermal Resistance – and peak junction temperature.
General Data and Its Use.” Although many E–FETs can withstand the stress of
Switching between the off–state and the on–state may drain–to–source avalanche at currents up to rated pulsed
traverse any load line provided neither rated peak current current (IDM), the energy rating is specified at rated
(IDM) nor rated voltage (VDSS) is exceeded, and that the continuous current (ID), in accordance with industry
transition time (tr, tf) does not exceed 10 µs. In addition the custom. The energy rating must be derated for temperature
total power averaged over a complete switching cycle must as shown in the accompanying graph (Figure 13). Maximum
not exceed (TJ(MAX) – TC)/(RθJC). energy at currents below rated continuous ID can safely be
A power MOSFET designated E–FET can be safely used assumed to equal the values indicated.
in switching circuits with unclamped inductive loads. For
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SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • The soldering temperature and time shall not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within a • When shifting from preheating to soldering, the
short time could result in device failure. Therefore, the maximum temperature gradient shall be 5°C or less.
following items should always be observed in order to
• After soldering has been completed, the device should
minimize the thermal stress to which the devices are
subjected.
be allowed to cool naturally for at least three minutes.
• Always preheat the device. Gradual cooling should be used as the use of forced
• The delta temperature between the preheat and cooling will increase the temperature gradient and
soldering should be 100°C or less.* result in latent failure due to mechanical stress.
• When preheating and soldering, the temperature of the • Mechanical stress or shock should not be applied
leads and the case must not exceed the maximum during cooling
temperature ratings as shown on the data sheet. When
using infrared heating with the reflow soldering * Soldering a device without preheating can cause
method, the difference shall be a maximum of 10°C. excessive thermal shock and stress which can result in
damage to the device.
http://onsemi.com
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MMDF2N02E
150°C
SOLDER IS LIQUID FOR
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100°C 140°C (DEPENDING ON
MASS OF ASSEMBLY)
100°C
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Preferred Device
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N–Channel SO–8, Dual
EZFETst are an advanced series of power MOSFETs which
contain monolithic back–to–back zener diodes. These zener diodes
provide protection against ESD and unexpected transients. These http://onsemi.com
miniature surface mount MOSFETs feature ultra low RDS(on) and true
logic level performance. They are capable of withstanding high energy 2 AMPERES
in the avalanche and commutation modes and the drain–to–source 50 VOLTS
diode has a very low reverse recovery time. EZFET devices are
designed for use in low voltage, high speed switching applications
RDS(on) = 300 m
where power efficiency is important. Typical applications are dc–dc
converters, and power management in portable and battery powered N–Channel
products such as computers, printers, cellular and cordless phones.
They can also be used for low voltage motor controls in mass storage
products such as disk drives and tape drives.
• Ultra Low RDS(on) Provides Higher Efficiency and Extends Battery
Life
• Logic Level Gate Drive – Can Be Driven by Logic ICs
• Miniature SO–8 Surface Mount Package – Saves Board Space
• Diode Is Characterized for Use In Bridge Circuits
• Diode Exhibits High Speed, With Soft Recovery
MARKING
DIAGRAM
• IDSS Specified at Elevated Temperature
• Mounting Information for SO–8 Package Provided
SO–8, Dual
F2N05Z
MAXIMUM RATINGS (TJ = 25°C unless otherwise noted) 8 CASE 751
LYWW
STYLE 11
Rating Symbol Value Unit
1
Drain–to–Source Voltage VDSS 50 Vdc
Drain–to–Gate Voltage (RGS = 1.0 MΩ) VDGR 50 Vdc F2N05Z = Device Code
Gate–to–Source Voltage – Continuous VGS ± 15 Vdc L = Location Code
Y = Year
Drain Current – Continuous @ TA = 25°C ID 2.0 Adc
WW = Work Week
Drain Current – Continuous @ TA = 70°C ID 1.7
Drain Current – Single Pulse (tp ≤ 10 µs) IDM 8.0 Apk
Total Power Dissipation @ TA = 25°C PD 2.0 Watts PIN ASSIGNMENT
(Note 1.)
Operating and Storage Temperature Range TJ, Tstg – 55 to °C Source–1 1 8 Drain–1
150 Gate–1 2 7 Drain–1
Thermal Resistance – Junction to Ambient RθJA 62.5 °C/W Source–2 3 6 Drain–2
Maximum Temperature for Soldering TL 260 °C
Gate–2 4 5 Drain–2
Purposes
Top View
1. When mounted on G10/FR–4 glass epoxy board using minimum
recommended footprint.
ORDERING INFORMATION
DYNAMIC CHARACTERISTICS
Input Capacitance Ciss – 104 – pF
Output Capacitance (VDS = 15 Vd
Vdc, VGS = 0 Vd
Vdc,
Coss – 58 –
f = 1.0 MHz)
Transfer Capacitance Crss – 16 –
SWITCHING CHARACTERISTICS (Note 3.)
Turn–On Delay Time td(on) – 24 48 ns
Rise Time (VDD = 30 Vdc, ID = 0.6 Adc, tr – 46 92
VGS = 10 Vdc
Vdc,
Turn–Off Delay Time RG = 25 Ω) td(off) – 130 260
Fall Time tf – 71 142
Gate Charge QT – 3.3 4.6 nC
(
(see fifigure 8)
(VDS = 25 Vdc, ID = 1.3 Adc, Q1 – 0.7 –
VGS = 10 Vdc) Q2 – 1.3 –
Q3 – 1.4 –
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Switching behavior is most easily modeled and predicted The capacitance (Ciss) is read from the capacitance curve at
by recognizing that the power MOSFET is charge a voltage corresponding to the off–state condition when
controlled. The lengths of various switching intervals (∆t) calculating td(on) and is read at a voltage corresponding to the
are determined by how fast the FET input capacitance can on–state when calculating td(off).
be charged by current from the generator. At high switching speeds, parasitic circuit elements
The published capacitance data is difficult to use for complicate the analysis. The inductance of the MOSFET
calculating rise and fall because drain–gate capacitance source lead, inside the package and in the circuit wiring
varies greatly with applied voltage. Accordingly, gate which is common to both the drain and gate current paths,
charge data is used. In most cases, a satisfactory estimate of produces a voltage at the source which reduces the gate drive
average input current (IG(AV)) can be made from a current. The voltage is determined by Ldi/dt, but since di/dt
rudimentary analysis of the drive circuit so that is a function of drain current, the mathematical solution is
t = Q/IG(AV) complex. The MOSFET output capacitance also
complicates the mathematics. And finally, MOSFETs have
During the rise and fall time interval when switching a finite internal gate resistance which effectively adds to the
resistive load, VGS remains virtually constant at a level resistance of the driving source, but the internal resistance
known as the plateau voltage, VSGP. Therefore, rise and fall is difficult to measure and, consequently, is not specified.
times may be approximated by the following: The resistive switching time variation versus gate
tr = Q2 x RG/(VGG – VGSP) resistance (Figure 9) shows how typical switching
tf = Q2 x RG/VGSP performance is affected by the parasitic circuit elements. If
where the parasitics were not present, the slope of the curves would
maintain a value of unity regardless of the switching speed.
VGG = the gate drive voltage, which varies from zero to VGG
The circuit used to obtain the data is constructed to minimize
RG = the gate drive resistance
common inductance in the drain and gate circuit loops and
and Q2 and VGSP are read from the gate charge curve.
is believed readily achievable with board mounted
During the turn–on and turn–off delay times, gate current is components. Most power electronic loads are inductive; the
not constant. The simplest calculation uses appropriate data in the figure is taken with a resistive load, which
values from the capacitance curves in a standard equation for approximates an optimally snubbed inductive load. Power
voltage change in an RC network. The equations are: MOSFETs may be safely operated into an inductive load;
td(on) = RG Ciss In [VGG/(VGG – VGSP)] however, snubbing reduces switching losses.
td(off) = RG Ciss In (VGG/VGSP)
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The switching characteristics of a MOSFET body diode high di/dts. The diode’s negative di/dt during ta is directly
are very important in systems using it as a freewheeling or controlled by the device clearing the stored charge.
commutating diode. Of particular interest are the reverse However, the positive di/dt during tb is an uncontrollable
recovery characteristics which play a major role in diode characteristic and is usually the culprit that induces
determining switching losses, radiated noise, EMI and RFI. current ringing. Therefore, when comparing diodes, the
System switching losses are largely due to the nature of ratio of tb/ta serves as a good indicator of recovery
the body diode itself. The body diode is a minority carrier abruptness and thus gives a comparative estimate of
device, therefore it has a finite reverse recovery time, trr, due probable noise generated. A ratio of 1 is considered ideal and
to the storage of minority carrier charge, QRR, as shown in values less than 0.5 are considered snappy.
the typical reverse recovery wave form of Figure 11. It is this Compared to ON Semiconductor standard cell density
stored charge that, when cleared from the diode, passes low voltage MOSFETs, high cell density MOSFET diodes
through a potential and defines an energy loss. Obviously, are faster (shorter trr), have less stored charge and a softer
repeatedly forcing the diode through reverse recovery reverse recovery characteristic. The softness advantage of
further increases switching losses. Therefore, one would the high cell density diode means they can be forced through
like a diode with short trr and low QRR specifications to reverse recovery at a higher di/dt than a standard cell
minimize these losses. MOSFET diode without increasing the current ringing or the
The abruptness of diode reverse recovery effects the noise generated. In addition, power dissipation incurred
amount of radiated noise, voltage spikes, and current from switching the diode will be less due to the shorter
ringing. The mechanisms at work are finite irremovable recovery time and lower switching losses.
circuit parasitic inductances and capacitances acted upon by
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the maximum simultaneous drain–to–source voltage and not exceed (TJ(MAX) – TC)/(RθJC).
drain current that a transistor can handle safely when it is A power MOSFET designated E–FET can be safely used
forward biased. Curves are based upon maximum peak in switching circuits with unclamped inductive loads. For
junction temperature and a case temperature (TC) of 25°C. reliable operation, the stored energy from circuit inductance
Peak repetitive pulsed power limits are determined by using dissipated in the transistor while in avalanche must be less
the thermal response data in conjunction with the procedures than the rated limit and must be adjusted for operating
discussed in AN569, “Transient Thermal Resistance – conditions differing from those specified. Although industry
General Data and Its Use.” practice is to rate in terms of energy, avalanche energy
Switching between the off–state and the on–state may capability is not a constant. The energy rating decreases
traverse any load line provided neither rated peak current non–linearly with an increase of peak current in avalanche
(IDM) nor rated voltage (VDSS) is exceeded, and that the and peak junction temperature.
transition time (tr, tf) does not exceed 10 µs. In addition the
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SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • The soldering temperature and time shall not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within • When shifting from preheating to soldering, the
a short time could result in device failure. Therefore, the maximum temperature gradient shall be 5°C or less.
following items should always be observed in order to • After soldering has been completed, the device should
minimize the thermal stress to which the devices are be allowed to cool naturally for at least three minutes.
subjected. Gradual cooling should be used as the use of forced
• Always preheat the device. cooling will increase the temperature gradient and
• The delta temperature between the preheat and result in latent failure due to mechanical stress.
soldering should be 100°C or less.* • Mechanical stress or shock should not be applied
• When preheating and soldering, the temperature of the during cooling.
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When * Soldering a device without preheating can cause
using infrared heating with the reflow soldering excessive thermal shock and stress which can result in
method, the difference shall be a maximum of 10°C. damage to the device.
http://onsemi.com
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150°C
SOLDER IS LIQUID FOR
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MASS OF ASSEMBLY)
100°C
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Preferred Device
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P–Channel SO–8, Dual
These miniature surface mount MOSFETs feature ultra low RDS(on)
and true logic level performance. They are capable of withstanding
high energy in the avalanche and commutation modes and the http://onsemi.com
drain–to–source diode has a very low reverse recovery time.
MiniMOSt devices are designed for use in low voltage, high speed 2 AMPERES
switching applications where power efficiency is important. Typical 12 VOLTS
applications are dc–dc converters, and power management in portable
and battery powered products such as computers, printers, cellular and RDS(on) = 180 m
cordless phones. They can also be used for low voltage motor controls
in mass storage products such as disk drives and tape drives. P–Channel
• Ultra Low RDS(on) Provides Higher Efficiency and Extends Battery
Life
• Logic Level Gate Drive – Can Be Driven by Logic ICs
• Miniature SO–8 Surface Mount Package – Saves Board Space
• Diode Is Characterized for Use In Bridge Circuits
• Diode Exhibits High Speed, With Soft Recovery
• IDSS Specified at Elevated Temperature
• Mounting Information for SO–8 Package Provided
MARKING
DIAGRAM
MAXIMUM RATINGS (TJ = 25°C unless otherwise noted) (Note 1.) SO–8, Dual
CASE 751 D2P01
Rating Symbol Value Unit
8 LYWW
STYLE 11
Drain–to–Source Voltage VDSS 12 Vdc
Drain–to–Gate Voltage (RGS = 1.0 MΩ) VDGR 12 Vdc 1
Gate–to–Source Voltage – Continuous VGS ± 8.0 Vdc
D2P01 = Device Code
Drain Current – Continuous @ TA = 25°C ID 3.4 Adc L = Location Code
Drain Current – Continuous @ TA = 100°C ID 2.1 Y = Year
Drain Current – Single Pulse (tp ≤ 10 µs) IDM 17 Apk WW = Work Week
Total Power Dissipation @ TA = 25°C PD 2.0 Watts
(Note 2.)
PIN ASSIGNMENT
Operating and Storage Temperature Range – 55 to 150 °C
Thermal Resistance – Junction to Ambient RθJA 62.5 °C/W Source–1 1 8 Drain–1
(Note 2.) Gate–1 2 7 Drain–1
Maximum Lead Temperature for Soldering TL 260 °C Source–2 3 6 Drain–2
Purposes, 1/8″ from case for 10 seconds
Gate–2 4 5 Drain–2
1. Negative sign for P–Channel device omitted for clarity.
Top View
2. Mounted on 2″ square FR4 board (1″ sq. 2 oz. Cu 0.06″ thick single sided) with
one die operating, 10 sec. max.
ORDERING INFORMATION
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Switching behavior is most easily modeled and predicted The capacitance (Ciss) is read from the capacitance curve at
by recognizing that the power MOSFET is charge a voltage corresponding to the off–state condition when
controlled. The lengths of various switching intervals (∆t) calculating td(on) and is read at a voltage corresponding to the
are determined by how fast the FET input capacitance can on–state when calculating td(off).
be charged by current from the generator. At high switching speeds, parasitic circuit elements
The published capacitance data is difficult to use for complicate the analysis. The inductance of the MOSFET
calculating rise and fall because drain–gate capacitance source lead, inside the package and in the circuit wiring
varies greatly with applied voltage. Accordingly, gate which is common to both the drain and gate current paths,
charge data is used. In most cases, a satisfactory estimate of produces a voltage at the source which reduces the gate drive
average input current (IG(AV)) can be made from a current. The voltage is determined by Ldi/dt, but since di/dt
rudimentary analysis of the drive circuit so that is a function of drain current, the mathematical solution is
t = Q/IG(AV) complex. The MOSFET output capacitance also
complicates the mathematics. And finally, MOSFETs have
During the rise and fall time interval when switching a finite internal gate resistance which effectively adds to the
resistive load, VGS remains virtually constant at a level resistance of the driving source, but the internal resistance
known as the plateau voltage, VSGP. Therefore, rise and fall is difficult to measure and, consequently, is not specified.
times may be approximated by the following: The resistive switching time variation versus gate
tr = Q2 x RG/(VGG – VGSP) resistance (Figure 9) shows how typical switching
tf = Q2 x RG/VGSP performance is affected by the parasitic circuit elements. If
where the parasitics were not present, the slope of the curves would
maintain a value of unity regardless of the switching speed.
VGG = the gate drive voltage, which varies from zero to VGG
The circuit used to obtain the data is constructed to minimize
RG = the gate drive resistance
common inductance in the drain and gate circuit loops and
and Q2 and VGSP are read from the gate charge curve.
is believed readily achievable with board mounted
During the turn–on and turn–off delay times, gate current is components. Most power electronic loads are inductive; the
not constant. The simplest calculation uses appropriate data in the figure is taken with a resistive load, which
values from the capacitance curves in a standard equation for approximates an optimally snubbed inductive load. Power
voltage change in an RC network. The equations are: MOSFETs may be safely operated into an inductive load;
td(on) = RG Ciss In [VGG/(VGG – VGSP)] however, snubbing reduces switching losses.
td(off) = RG Ciss In (VGG/VGSP)
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The switching characteristics of a MOSFET body diode high di/dts. The diode’s negative di/dt during ta is directly
are very important in systems using it as a freewheeling or controlled by the device clearing the stored charge.
commutating diode. Of particular interest are the reverse However, the positive di/dt during tb is an uncontrollable
recovery characteristics which play a major role in diode characteristic and is usually the culprit that induces
determining switching losses, radiated noise, EMI and RFI. current ringing. Therefore, when comparing diodes, the
System switching losses are largely due to the nature of ratio of tb/ta serves as a good indicator of recovery
the body diode itself. The body diode is a minority carrier abruptness and thus gives a comparative estimate of
device, therefore it has a finite reverse recovery time, trr, due probable noise generated. A ratio of 1 is considered ideal and
to the storage of minority carrier charge, QRR, as shown in values less than 0.5 are considered snappy.
the typical reverse recovery wave form of Figure 14. It is this Compared to ON Semiconductor standard cell density
stored charge that, when cleared from the diode, passes low voltage MOSFETs, high cell density MOSFET diodes
through a potential and defines an energy loss. Obviously, are faster (shorter trr), have less stored charge and a softer
repeatedly forcing the diode through reverse recovery reverse recovery characteristic. The softness advantage of
further increases switching losses. Therefore, one would the high cell density diode means they can be forced through
like a diode with short trr and low QRR specifications to reverse recovery at a higher di/dt than a standard cell
minimize these losses. MOSFET diode without increasing the current ringing or the
The abruptness of diode reverse recovery effects the noise generated. In addition, power dissipation incurred
amount of radiated noise, voltage spikes, and current from switching the diode will be less due to the shorter
ringing. The mechanisms at work are finite irremovable recovery time and lower switching losses.
circuit parasitic inductances and capacitances acted upon by
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The Forward Biased Safe Operating Area curves define total power averaged over a complete switching cycle must
the maximum simultaneous drain–to–source voltage and not exceed (TJ(MAX) – TC)/(RθJC).
drain current that a transistor can handle safely when it is A power MOSFET designated E–FET can be safely used
forward biased. Curves are based upon maximum peak in switching circuits with unclamped inductive loads. For
junction temperature and a case temperature (TC) of 25°C. reliable operation, the stored energy from circuit inductance
Peak repetitive pulsed power limits are determined by using dissipated in the transistor while in avalanche must be less
the thermal response data in conjunction with the procedures than the rated limit and must be adjusted for operating
discussed in AN569, “Transient Thermal Resistance – conditions differing from those specified. Although industry
General Data and Its Use.” practice is to rate in terms of energy, avalanche energy
Switching between the off–state and the on–state may capability is not a constant. The energy rating decreases
traverse any load line provided neither rated peak current non–linearly with an increase of peak current in avalanche
(IDM) nor rated voltage (VDSS) is exceeded, and that the and peak junction temperature.
transition time (tr, tf) does not exceed 10 µs. In addition the
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SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • The soldering temperature and time shall not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within • When shifting from preheating to soldering, the
a short time could result in device failure. Therefore, the maximum temperature gradient shall be 5°C or less.
following items should always be observed in order to • After soldering has been completed, the device should
minimize the thermal stress to which the devices are be allowed to cool naturally for at least three minutes.
subjected. Gradual cooling should be used as the use of forced
• Always preheat the device. cooling will increase the temperature gradient and
• The delta temperature between the preheat and result in latent failure due to mechanical stress.
soldering should be 100°C or less.* • Mechanical stress or shock should not be applied
• When preheating and soldering, the temperature of the during cooling.
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When * Soldering a device without preheating can cause
using infrared heating with the reflow soldering excessive thermal shock and stress which can result in
method, the difference shall be a maximum of 10°C. damage to the device.
http://onsemi.com
475
MMDF2P01HD
150°C
SOLDER IS LIQUID FOR
40 TO 80 SECONDS
100°C 140°C (DEPENDING ON
MASS OF ASSEMBLY)
100°C
http://onsemi.com
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#$%& '(
P–Channel SO–8, Dual
These miniature surface mount MOSFETs feature ultra low RDS(on)
and true logic level performance. They are capable of withstanding
high energy in the avalanche and commutation modes and the http://onsemi.com
drain–to–source diode has a low reverse recovery time. MiniMOSt
devices are designed for use in low voltage, high speed switching 2 AMPERES
applications where power efficiency is important. Typical applications 25 VOLTS
are dc–dc converters, and power management in portable and battery
powered products such as computers, printers, cellular and cordless RDS(on) = 250 m
phones. They can also be used for low voltage motor controls in mass
storage products such as disk drives and tape drives. The avalanche P–Channel
energy is specified to eliminate the guesswork in designs where
inductive loads are switched and offer additional safety margin against
unexpected voltage transients.
• Ultra Low RDS(on) Provides Higher Efficiency and Extends Battery
Life
• Logic Level Gate Drive – Can Be Driven by Logic ICs
• Miniature SO–8 Surface Mount Package – Saves Board Space
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Switching behavior is most easily modeled and predicted During the turn–on and turn–off delay times, gate current is
by recognizing that the power MOSFET is charge not constant. The simplest calculation uses appropriate
controlled. The lengths of various switching intervals (∆t) values from the capacitance curves in a standard equation for
are determined by how fast the FET input capacitance can voltage change in an RC network. The equations are:
be charged by current from the generator. td(on) = RG Ciss In [VGG/(VGG – VGSP)]
The published capacitance data is difficult to use for td(off) = RG Ciss In (VGG/VGSP)
calculating rise and fall because drain–gate capacitance
varies greatly with applied voltage. Accordingly, gate The capacitance (Ciss) is read from the capacitance curve at
charge data is used. In most cases, a satisfactory estimate of a voltage corresponding to the off–state condition when
average input current (IG(AV)) can be made from a calculating td(on) and is read at a voltage corresponding to the
rudimentary analysis of the drive circuit so that on–state when calculating td(off).
At high switching speeds, parasitic circuit elements
t = Q/IG(AV) complicate the analysis. The inductance of the MOSFET
During the rise and fall time interval when switching a source lead, inside the package and in the circuit wiring
resistive load, VGS remains virtually constant at a level which is common to both the drain and gate current paths,
known as the plateau voltage, VSGP. Therefore, rise and fall produces a voltage at the source which reduces the gate drive
times may be approximated by the following: current. The voltage is determined by Ldi/dt, but since di/dt
tr = Q2 x RG/(VGG – VGSP) is a function of drain current, the mathematical solution is
tf = Q2 x RG/VGSP complex. The MOSFET output capacitance also
complicates the mathematics. And finally, MOSFETs have
where finite internal gate resistance which effectively adds to the
VGG = the gate drive voltage, which varies from zero to VGG resistance of the driving source, but the internal resistance
RG = the gate drive resistance is difficult to measure and, consequently, is not specified.
and Q2 and VGSP are read from the gate charge curve.
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Figure 7. Capacitance Variation Drain–to–Source Voltage versus Total Charge
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The Forward Biased Safe Operating Area curves define reliable operation, the stored energy from circuit inductance
the maximum simultaneous drain–to–source voltage and dissipated in the transistor while in avalanche must be less
drain current that a transistor can handle safely when it is than the rated limit and must be adjusted for operating
forward biased. Curves are based upon maximum peak conditions differing from those specified. Although industry
junction temperature and a case temperature (TC) of 25°C. practice is to rate in terms of energy, avalanche energy
Peak repetitive pulsed power limits are determined by using capability is not a constant. The energy rating decreases
the thermal response data in conjunction with the procedures non–linearly with an increase of peak current in avalanche
discussed in AN569, “Transient Thermal Resistance – and peak junction temperature.
General Data and Its Use.” Although many E–FETs can withstand the stress of
Switching between the off–state and the on–state may drain–to–source avalanche at currents up to rated pulsed
traverse any load line provided neither rated peak current current (IDM), the energy rating is specified at rated
(IDM) nor rated voltage (VDSS) is exceeded, and that the continuous current (ID), in accordance with industry
transition time (tr, tf) does not exceed 10 µs. In addition the custom. The energy rating must be derated for temperature
total power averaged over a complete switching cycle must as shown in the accompanying graph (Figure 13). Maximum
not exceed (TJ(MAX) – TC)/(RθJC). energy at currents below rated continuous ID can safely be
A power MOSFET designated E–FET can be safely used assumed to equal the values indicated.
in switching circuits with unclamped inductive loads. For
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SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • The soldering temperature and time shall not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within • When shifting from preheating to soldering, the
a short time could result in device failure. Therefore, the maximum temperature gradient shall be 5°C or less.
following items should always be observed in order to • After soldering has been completed, the device should
minimize the thermal stress to which the devices are be allowed to cool naturally for at least three minutes.
subjected. Gradual cooling should be used as the use of forced
• Always preheat the device. cooling will increase the temperature gradient and
• The delta temperature between the preheat and result in latent failure due to mechanical stress.
soldering should be 100°C or less.* • Mechanical stress or shock should not be applied
• When preheating and soldering, the temperature of the during cooling.
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When * Soldering a device without preheating can cause
using infrared heating with the reflow soldering excessive thermal shock and stress which can result in
method, the difference shall be a maximum of 10°C. damage to the device.
http://onsemi.com
483
MMDF2P02E
150°C
SOLDER IS LIQUID FOR
40 TO 80 SECONDS
100°C 140°C (DEPENDING ON
MASS OF ASSEMBLY)
100°C
http://onsemi.com
484
( # .
Preferred Device
#$%& '(
P–Channel SO–8, Dual
These miniature surface mount MOSFETs feature ultra low RDS(on)
and true logic level performance. They are capable of withstanding
high energy in the avalanche and commutation modes and the http://onsemi.com
drain–to–source diode has a very low reverse recovery time.
MiniMOSt devices are designed for use in low voltage, high speed 2 AMPERES
switching applications where power efficiency is important. Typical 20 VOLTS
applications are dc–dc converters, and power management in portable
and battery powered products such as computers, printers, cellular and RDS(on) = 160 m
cordless phones. They can also be used for low voltage motor controls
in mass storage products such as disk drives and tape drives. The P–Channel
avalanche energy is specified to eliminate the guesswork in designs D
where inductive loads are switched and offer additional safety margin
against unexpected voltage transients.
• Ultra Low RDS(on) Provides Higher Efficiency and Extends Battery
Life G
• Logic Level Gate Drive – Can Be Driven by Logic ICs
• Miniature SO–8 Surface Mount Package – Saves Board Space S
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Switching behavior is most easily modeled and predicted The capacitance (Ciss) is read from the capacitance curve at
by recognizing that the power MOSFET is charge a voltage corresponding to the off–state condition when
controlled. The lengths of various switching intervals (∆t) calculating td(on) and is read at a voltage corresponding to the
are determined by how fast the FET input capacitance can on–state when calculating td(off).
be charged by current from the generator. At high switching speeds, parasitic circuit elements
The published capacitance data is difficult to use for complicate the analysis. The inductance of the MOSFET
calculating rise and fall because drain–gate capacitance source lead, inside the package and in the circuit wiring
varies greatly with applied voltage. Accordingly, gate which is common to both the drain and gate current paths,
charge data is used. In most cases, a satisfactory estimate of produces a voltage at the source which reduces the gate drive
average input current (IG(AV)) can be made from a current. The voltage is determined by Ldi/dt, but since di/dt
rudimentary analysis of the drive circuit so that is a function of drain current, the mathematical solution is
t = Q/IG(AV) complex. The MOSFET output capacitance also
complicates the mathematics. And finally, MOSFETs have
During the rise and fall time interval when switching a finite internal gate resistance which effectively adds to the
resistive load, VGS remains virtually constant at a level resistance of the driving source, but the internal resistance
known as the plateau voltage, VSGP. Therefore, rise and fall is difficult to measure and, consequently, is not specified.
times may be approximated by the following: The resistive switching time variation versus gate
tr = Q2 x RG/(VGG – VGSP) resistance (Figure 9) shows how typical switching
tf = Q2 x RG/VGSP performance is affected by the parasitic circuit elements. If
where the parasitics were not present, the slope of the curves would
maintain a value of unity regardless of the switching speed.
VGG = the gate drive voltage, which varies from zero to VGG
The circuit used to obtain the data is constructed to minimize
RG = the gate drive resistance
common inductance in the drain and gate circuit loops and
and Q2 and VGSP are read from the gate charge curve.
is believed readily achievable with board mounted
During the turn–on and turn–off delay times, gate current is components. Most power electronic loads are inductive; the
not constant. The simplest calculation uses appropriate data in the figure is taken with a resistive load, which
values from the capacitance curves in a standard equation for approximates an optimally snubbed inductive load. Power
voltage change in an RC network. The equations are: MOSFETs may be safely operated into an inductive load;
td(on) = RG Ciss In [VGG/(VGG – VGSP)] however, snubbing reduces switching losses.
td(off) = RG Ciss In (VGG/VGSP)
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are very important in systems using it as a freewheeling or controlled by the device clearing the stored charge.
commutating diode. Of particular interest are the reverse However, the positive di/dt during tb is an uncontrollable
recovery characteristics which play a major role in diode characteristic and is usually the culprit that induces
determining switching losses, radiated noise, EMI and RFI. current ringing. Therefore, when comparing diodes, the
System switching losses are largely due to the nature of ratio of tb/ta serves as a good indicator of recovery
the body diode itself. The body diode is a minority carrier abruptness and thus gives a comparative estimate of
device, therefore it has a finite reverse recovery time, trr, due probable noise generated. A ratio of 1 is considered ideal and
to the storage of minority carrier charge, QRR, as shown in values less than 0.5 are considered snappy.
the typical reverse recovery wave form of Figure 15. It is this Compared to ON Semiconductor standard cell density
stored charge that, when cleared from the diode, passes low voltage MOSFETs, high cell density MOSFET diodes
through a potential and defines an energy loss. Obviously, are faster (shorter trr), have less stored charge and a softer
repeatedly forcing the diode through reverse recovery reverse recovery characteristic. The softness advantage of
further increases switching losses. Therefore, one would the high cell density diode means they can be forced through
like a diode with short trr and low QRR specifications to reverse recovery at a higher di/dt than a standard cell
minimize these losses. MOSFET diode without increasing the current ringing or the
The abruptness of diode reverse recovery effects the noise generated. In addition, power dissipation incurred
amount of radiated noise, voltage spikes, and current from switching the diode will be less due to the shorter
ringing. The mechanisms at work are finite irremovable recovery time and lower switching losses.
circuit parasitic inductances and capacitances acted upon by
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the maximum simultaneous drain–to–source voltage and dissipated in the transistor while in avalanche must be less
drain current that a transistor can handle safely when it is than the rated limit and must be adjusted for operating
forward biased. Curves are based upon maximum peak conditions differing from those specified. Although industry
junction temperature and a case temperature (TC) of 25°C. practice is to rate in terms of energy, avalanche energy
Peak repetitive pulsed power limits are determined by using capability is not a constant. The energy rating decreases
the thermal response data in conjunction with the procedures non–linearly with an increase of peak current in avalanche
discussed in AN569, “Transient Thermal Resistance – and peak junction temperature.
General Data and Its Use.” Although many E–FETs can withstand the stress of
Switching between the off–state and the on–state may drain–to–source avalanche at currents up to rated pulsed
traverse any load line provided neither rated peak current current (IDM), the energy rating is specified at rated
(IDM) nor rated voltage (VDSS) is exceeded, and that the continuous current (ID), in accordance with industry
transition time (tr, tf) does not exceed 10 µs. In addition the custom. The energy rating must be derated for temperature
total power averaged over a complete switching cycle must as shown in the accompanying graph (Figure 13). Maximum
not exceed (TJ(MAX) – TC)/(RθJC). energy at currents below rated continuous ID can safely be
A power MOSFET designated E–FET can be safely used assumed to equal the values indicated.
in switching circuits with unclamped inductive loads. For
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The melting temperature of solder is higher than the rated • The soldering temperature and time shall not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within • When shifting from preheating to soldering, the
a short time could result in device failure. Therefore, the maximum temperature gradient shall be 5°C or less.
following items should always be observed in order to • After soldering has been completed, the device should
minimize the thermal stress to which the devices are be allowed to cool naturally for at least three minutes.
subjected. Gradual cooling should be used as the use of forced
• Always preheat the device. cooling will increase the temperature gradient and
• The delta temperature between the preheat and result in latent failure due to mechanical stress.
soldering should be 100°C or less.* • Mechanical stress or shock should not be applied
• When preheating and soldering, the temperature of the during cooling.
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When * Soldering a device without preheating can cause
using infrared heating with the reflow soldering excessive thermal shock and stress which can result in
method, the difference shall be a maximum of 10°C. damage to the device.
http://onsemi.com
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150°C
SOLDER IS LIQUID FOR
40 TO 80 SECONDS
100°C 140°C (DEPENDING ON
MASS OF ASSEMBLY)
100°C
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These miniature surface mount MOSFETs feature ultra low RDS(on)
and true logic level performance. They are capable of withstanding
high energy in the avalanche and commutation modes and the http://onsemi.com
drain–to–source diode has a very low reverse recovery time.
MiniMOSt devices are designed for use in low voltage, high speed 2 AMPERES
switching applications where power efficiency is important. Typical 30 VOLTS
applications are dc–dc converters, and power management in portable
and battery powered products such as computers, printers, cellular and RDS(on) = 200 m
cordless phones. They can also be used for low voltage motor controls
in mass storage products such as disk drives and tape drives. The P–Channel
avalanche energy is specified to eliminate the guesswork in designs D
where inductive loads are switched and offer additional safety margin
against unexpected voltage transients.
• Ultra Low RDS(on) Provides Higher Efficiency and Extends Battery
Life G
• Logic Level Gate Drive – Can Be Driven by Logic ICs
• Miniature SO–8 Surface Mount Package – Saves Board Space S
• Diode Is Characterized for Use In Bridge Circuits
• Diode Exhibits High Speed, With Soft Recovery MARKING
• IDSS Specified at Elevated Temperature DIAGRAM
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Switching behavior is most easily modeled and predicted The capacitance (Ciss) is read from the capacitance curve at
by recognizing that the power MOSFET is charge a voltage corresponding to the off–state condition when
controlled. The lengths of various switching intervals (∆t) calculating td(on) and is read at a voltage corresponding to the
are determined by how fast the FET input capacitance can on–state when calculating td(off).
be charged by current from the generator. At high switching speeds, parasitic circuit elements
The published capacitance data is difficult to use for complicate the analysis. The inductance of the MOSFET
calculating rise and fall because drain–gate capacitance source lead, inside the package and in the circuit wiring
varies greatly with applied voltage. Accordingly, gate which is common to both the drain and gate current paths,
charge data is used. In most cases, a satisfactory estimate of produces a voltage at the source which reduces the gate drive
average input current (IG(AV)) can be made from a current. The voltage is determined by Ldi/dt, but since di/dt
rudimentary analysis of the drive circuit so that is a function of drain current, the mathematical solution is
t = Q/IG(AV) complex. The MOSFET output capacitance also
complicates the mathematics. And finally, MOSFETs have
During the rise and fall time interval when switching a finite internal gate resistance which effectively adds to the
resistive load, VGS remains virtually constant at a level resistance of the driving source, but the internal resistance
known as the plateau voltage, VSGP. Therefore, rise and fall is difficult to measure and, consequently, is not specified.
times may be approximated by the following: The resistive switching time variation versus gate
tr = Q2 x RG/(VGG – VGSP) resistance (Figure 9) shows how typical switching
tf = Q2 x RG/VGSP performance is affected by the parasitic circuit elements. If
where the parasitics were not present, the slope of the curves would
maintain a value of unity regardless of the switching speed.
VGG = the gate drive voltage, which varies from zero to VGG
The circuit used to obtain the data is constructed to minimize
RG = the gate drive resistance
common inductance in the drain and gate circuit loops and
and Q2 and VGSP are read from the gate charge curve.
is believed readily achievable with board mounted
During the turn–on and turn–off delay times, gate current is components. Most power electronic loads are inductive; the
not constant. The simplest calculation uses appropriate data in the figure is taken with a resistive load, which
values from the capacitance curves in a standard equation for approximates an optimally snubbed inductive load. Power
voltage change in an RC network. The equations are: MOSFETs may be safely operated into an inductive load;
td(on) = RG Ciss In [VGG/(VGG – VGSP)] however, snubbing reduces switching losses.
td(off) = RG Ciss In (VGG/VGSP)
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are very important in systems using it as a freewheeling or controlled by the device clearing the stored charge.
commutating diode. Of particular interest are the reverse However, the positive di/dt during tb is an uncontrollable
recovery characteristics which play a major role in diode characteristic and is usually the culprit that induces
determining switching losses, radiated noise, EMI and RFI. current ringing. Therefore, when comparing diodes, the
System switching losses are largely due to the nature of ratio of tb/ta serves as a good indicator of recovery
the body diode itself. The body diode is a minority carrier abruptness and thus gives a comparative estimate of
device, therefore it has a finite reverse recovery time, trr, due probable noise generated. A ratio of 1 is considered ideal and
to the storage of minority carrier charge, QRR, as shown in values less than 0.5 are considered snappy.
the typical reverse recovery wave form of Figure 15. It is this Compared to ON Semiconductor standard cell density
stored charge that, when cleared from the diode, passes low voltage MOSFETs, high cell density MOSFET diodes
through a potential and defines an energy loss. Obviously, are faster (shorter trr), have less stored charge and a softer
repeatedly forcing the diode through reverse recovery reverse recovery characteristic. The softness advantage of
further increases switching losses. Therefore, one would the high cell density diode means they can be forced through
like a diode with short trr and low QRR specifications to reverse recovery at a higher di/dt than a standard cell
minimize these losses. MOSFET diode without increasing the current ringing or the
The abruptness of diode reverse recovery effects the noise generated. In addition, power dissipation incurred
amount of radiated noise, voltage spikes, and current from switching the diode will be less due to the shorter
ringing. The mechanisms at work are finite irremovable recovery time and lower switching losses.
circuit parasitic inductances and capacitances acted upon by
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The Forward Biased Safe Operating Area curves define reliable operation, the stored energy from circuit inductance
the maximum simultaneous drain–to–source voltage and dissipated in the transistor while in avalanche must be less
drain current that a transistor can handle safely when it is than the rated limit and must be adjusted for operating
forward biased. Curves are based upon maximum peak conditions differing from those specified. Although industry
junction temperature and a case temperature (TC) of 25°C. practice is to rate in terms of energy, avalanche energy
Peak repetitive pulsed power limits are determined by using capability is not a constant. The energy rating decreases
the thermal response data in conjunction with the procedures non–linearly with an increase of peak current in avalanche
discussed in AN569, “Transient Thermal Resistance – and peak junction temperature.
General Data and Its Use.” Although many E–FETs can withstand the stress of
Switching between the off–state and the on–state may drain–to–source avalanche at currents up to rated pulsed
traverse any load line provided neither rated peak current current (IDM), the energy rating is specified at rated
(IDM) nor rated voltage (VDSS) is exceeded, and that the continuous current (ID), in accordance with industry
transition time (tr, tf) does not exceed 10 µs. In addition the custom. The energy rating must be derated for temperature
total power averaged over a complete switching cycle must as shown in the accompanying graph (Figure 13). Maximum
not exceed (TJ(MAX) – TC)/(RθJC). energy at currents below rated continuous ID can safely be
A power MOSFET designated E–FET can be safely used assumed to equal the values indicated.
in switching circuits with unclamped inductive loads. For
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SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • The soldering temperature and time shall not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within • When shifting from preheating to soldering, the
a short time could result in device failure. Therefore, the maximum temperature gradient shall be 5°C or less.
following items should always be observed in order to • After soldering has been completed, the device should
minimize the thermal stress to which the devices are be allowed to cool naturally for at least three minutes.
subjected. Gradual cooling should be used as the use of forced
• Always preheat the device. cooling will increase the temperature gradient and
• The delta temperature between the preheat and result in latent failure due to mechanical stress.
soldering should be 100°C or less.* • Mechanical stress or shock should not be applied
• When preheating and soldering, the temperature of the during cooling.
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When * Soldering a device without preheating can cause
using infrared heating with the reflow soldering excessive thermal shock and stress which can result in
method, the difference shall be a maximum of 10°C. damage to the device.
http://onsemi.com
501
MMDF2P03HD
150°C
SOLDER IS LIQUID FOR
40 TO 80 SECONDS
100°C 140°C (DEPENDING ON
MASS OF ASSEMBLY)
100°C
http://onsemi.com
502
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Preferred Device
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N–Channel SO–8, Dual
These miniature surface mount MOSFETs feature ultra low RDS(on)
and true logic level performance. They are capable of withstanding
high energy in the avalanche and commutation modes and the http://onsemi.com
drain–to–source diode has a very low reverse recovery time.
MiniMOSt devices are designed for use in low voltage, high speed 3 AMPERES
switching applications where power efficiency is important. Typical 20 VOLTS
applications are dc–dc converters, and power management in portable
and battery powered products such as computers, printers, cellular and RDS(on) = 90 m
cordless phones. They can also be used for low voltage motor controls
in mass storage products such as disk drives and tape drives. The N–Channel
avalanche energy is specified to eliminate the guesswork in designs
where inductive loads are switched and offer additional safety margin
against unexpected voltage transients.
• Ultra Low RDS(on) Provides Higher Efficiency and Extends Battery
Life
• Logic Level Gate Drive – Can Be Driven by Logic ICs
• Miniature SO–8 Surface Mount Package – Saves Board Space
http://onsemi.com
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Switching behavior is most easily modeled and predicted The capacitance (Ciss) is read from the capacitance curve at
by recognizing that the power MOSFET is charge a voltage corresponding to the off–state condition when
controlled. The lengths of various switching intervals (∆t) calculating td(on) and is read at a voltage corresponding to the
are determined by how fast the FET input capacitance can on–state when calculating td(off).
be charged by current from the generator. At high switching speeds, parasitic circuit elements
The published capacitance data is difficult to use for complicate the analysis. The inductance of the MOSFET
calculating rise and fall because drain–gate capacitance source lead, inside the package and in the circuit wiring
varies greatly with applied voltage. Accordingly, gate which is common to both the drain and gate current paths,
charge data is used. In most cases, a satisfactory estimate of produces a voltage at the source which reduces the gate drive
average input current (IG(AV)) can be made from a current. The voltage is determined by Ldi/dt, but since di/dt
rudimentary analysis of the drive circuit so that is a function of drain current, the mathematical solution is
t = Q/IG(AV) complex. The MOSFET output capacitance also
complicates the mathematics. And finally, MOSFETs have
During the rise and fall time interval when switching a finite internal gate resistance which effectively adds to the
resistive load, VGS remains virtually constant at a level resistance of the driving source, but the internal resistance
known as the plateau voltage, VSGP. Therefore, rise and fall is difficult to measure and, consequently, is not specified.
times may be approximated by the following: The resistive switching time variation versus gate
tr = Q2 x RG/(VGG – VGSP) resistance (Figure 9) shows how typical switching
tf = Q2 x RG/VGSP performance is affected by the parasitic circuit elements. If
where the parasitics were not present, the slope of the curves would
maintain a value of unity regardless of the switching speed.
VGG = the gate drive voltage, which varies from zero to VGG
The circuit used to obtain the data is constructed to minimize
RG = the gate drive resistance
common inductance in the drain and gate circuit loops and
and Q2 and VGSP are read from the gate charge curve.
is believed readily achievable with board mounted
During the turn–on and turn–off delay times, gate current is components. Most power electronic loads are inductive; the
not constant. The simplest calculation uses appropriate data in the figure is taken with a resistive load, which
values from the capacitance curves in a standard equation for approximates an optimally snubbed inductive load. Power
voltage change in an RC network. The equations are: MOSFETs may be safely operated into an inductive load;
td(on) = RG Ciss In [VGG/(VGG – VGSP)] however, snubbing reduces switching losses.
td(off) = RG Ciss In (VGG/VGSP)
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The switching characteristics of a MOSFET body diode high di/dts. The diode’s negative di/dt during ta is directly
are very important in systems using it as a freewheeling or controlled by the device clearing the stored charge.
commutating diode. Of particular interest are the reverse However, the positive di/dt during tb is an uncontrollable
recovery characteristics which play a major role in diode characteristic and is usually the culprit that induces
determining switching losses, radiated noise, EMI and RFI. current ringing. Therefore, when comparing diodes, the
System switching losses are largely due to the nature of ratio of tb/ta serves as a good indicator of recovery
the body diode itself. The body diode is a minority carrier abruptness and thus gives a comparative estimate of
device, therefore it has a finite reverse recovery time, trr, due probable noise generated. A ratio of 1 is considered ideal and
to the storage of minority carrier charge, QRR, as shown in values less than 0.5 are considered snappy.
the typical reverse recovery wave form of Figure 15. It is this Compared to ON Semiconductor standard cell density
stored charge that, when cleared from the diode, passes low voltage MOSFETs, high cell density MOSFET diodes
through a potential and defines an energy loss. Obviously, are faster (shorter trr), have less stored charge and a softer
repeatedly forcing the diode through reverse recovery reverse recovery characteristic. The softness advantage of
further increases switching losses. Therefore, one would the high cell density diode means they can be forced through
like a diode with short trr and low QRR specifications to reverse recovery at a higher di/dt than a standard cell
minimize these losses. MOSFET diode without increasing the current ringing or the
The abruptness of diode reverse recovery effects the noise generated. In addition, power dissipation incurred
amount of radiated noise, voltage spikes, and current from switching the diode will be less due to the shorter
ringing. The mechanisms at work are finite irremovable recovery time and lower switching losses.
circuit parasitic inductances and capacitances acted upon by
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The Forward Biased Safe Operating Area curves define reliable operation, the stored energy from circuit inductance
the maximum simultaneous drain–to–source voltage and dissipated in the transistor while in avalanche must be less
drain current that a transistor can handle safely when it is than the rated limit and must be adjusted for operating
forward biased. Curves are based upon maximum peak conditions differing from those specified. Although industry
junction temperature and a case temperature (TC) of 25°C. practice is to rate in terms of energy, avalanche energy
Peak repetitive pulsed power limits are determined by using capability is not a constant. The energy rating decreases
the thermal response data in conjunction with the procedures non–linearly with an increase of peak current in avalanche
discussed in AN569, “Transient Thermal Resistance – and peak junction temperature.
General Data and Its Use.” Although many E–FETs can withstand the stress of
Switching between the off–state and the on–state may drain–to–source avalanche at currents up to rated pulsed
traverse any load line provided neither rated peak current current (IDM), the energy rating is specified at rated
(IDM) nor rated voltage (VDSS) is exceeded, and that the continuous current (ID), in accordance with industry
transition time (tr, tf) does not exceed 10 µs. In addition the custom. The energy rating must be derated for temperature
total power averaged over a complete switching cycle must as shown in the accompanying graph (Figure 13). Maximum
not exceed (TJ(MAX) – TC)/(RθJC). energy at currents below rated continuous ID can safely be
A power MOSFET designated E–FET can be safely used assumed to equal the values indicated.
in switching circuits with unclamped inductive loads. For
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Safe Operating Area Starting Junction Temperature
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SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • The soldering temperature and time shall not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within • When shifting from preheating to soldering, the
a short time could result in device failure. Therefore, the maximum temperature gradient shall be 5°C or less.
following items should always be observed in order to • After soldering has been completed, the device should
minimize the thermal stress to which the devices are be allowed to cool naturally for at least three minutes.
subjected. Gradual cooling should be used as the use of forced
• Always preheat the device. cooling will increase the temperature gradient and
• The delta temperature between the preheat and result in latent failure due to mechanical stress.
soldering should be 100°C or less.* • Mechanical stress or shock should not be applied
• When preheating and soldering, the temperature of the during cooling.
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When * Soldering a device without preheating can cause
using infrared heating with the reflow soldering excessive thermal shock and stress which can result in
method, the difference shall be a maximum of 10°C. damage to the device.
http://onsemi.com
510
MMDF3N02HD
150°C
SOLDER IS LIQUID FOR
40 TO 80 SECONDS
100°C 140°C (DEPENDING ON
MASS OF ASSEMBLY)
100°C
http://onsemi.com
511
(!!.
Preferred Device
#$%& '(
! !
N–Channel SO–8, Dual
These miniature surface mount MOSFETs feature ultra low RDS(on)
and true logic level performance. They are capable of withstanding
high energy in the avalanche and commutation modes and the http://onsemi.com
drain–to–source diode has a very low reverse recovery time.
MiniMOSt devices are designed for use in low voltage, high speed 3 AMPERES
switching applications where power efficiency is important. Typical 30 VOLTS
applications are dc–dc converters, and power management in portable
and battery powered products such as computers, printers, cellular and RDS(on) = 70 m
cordless phones. They can also be used for low voltage motor controls
in mass storage products such as disk drives and tape drives. The N–Channel
avalanche energy is specified to eliminate the guesswork in designs
where inductive loads are switched and offer additional safety margin
against unexpected voltage transients.
• Ultra Low RDS(on) Provides Higher Efficiency and Extends Battery
Life
• Logic Level Gate Drive – Can Be Driven by Logic ICs
• Miniature SO–8 Surface Mount Package – Saves Board Space
• Diode Is Characterized for Use In Bridge Circuits
• Diode Exhibits High Speed, With Soft Recovery MARKING
• IDSS Specified at Elevated Temperature DIAGRAM
DYNAMIC CHARACTERISTICS
Input Capacitance Ciss – 450 630 pF
Output Capacitance (VDS = 24 Vd
Vdc, VGS = 0 Vd
Vdc,
Coss – 160 225
f = 1.0 MHz)
Transfer Capacitance Crss – 35 70
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Switching behavior is most easily modeled and predicted During the turn–on and turn–off delay times, gate current is
by recognizing that the power MOSFET is charge not constant. The simplest calculation uses appropriate
controlled. The lengths of various switching intervals (∆t) values from the capacitance curves in a standard equation for
are determined by how fast the FET input capacitance can voltage change in an RC network. The equations are:
be charged by current from the generator. td(on) = RG Ciss In [VGG/(VGG – VGSP)]
The published capacitance data is difficult to use for td(off) = RG Ciss In (VGG/VGSP)
calculating rise and fall because drain–gate capacitance
varies greatly with applied voltage. Accordingly, gate The capacitance (Ciss) is read from the capacitance curve at
charge data is used. In most cases, a satisfactory estimate of a voltage corresponding to the off–state condition when
average input current (IG(AV)) can be made from a calculating td(on) and is read at a voltage corresponding to the
rudimentary analysis of the drive circuit so that on–state when calculating td(off).
At high switching speeds, parasitic circuit elements
t = Q/IG(AV) complicate the analysis. The inductance of the MOSFET
During the rise and fall time interval when switching a source lead, inside the package and in the circuit wiring
resistive load, VGS remains virtually constant at a level which is common to both the drain and gate current paths,
known as the plateau voltage, VSGP. Therefore, rise and fall produces a voltage at the source which reduces the gate drive
times may be approximated by the following: current. The voltage is determined by Ldi/dt, but since di/dt
tr = Q2 x RG/(VGG – VGSP) is a function of drain current, the mathematical solution is
tf = Q2 x RG/VGSP complex. The MOSFET output capacitance also
complicates the mathematics. And finally, MOSFETs have
where finite internal gate resistance which effectively adds to the
VGG = the gate drive voltage, which varies from zero to VGG resistance of the driving source, but the internal resistance
RG = the gate drive resistance is difficult to measure and, consequently, is not specified.
and Q2 and VGSP are read from the gate charge curve.
The switching characteristics of a MOSFET body diode high di/dts. The diode’s negative di/dt during ta is directly
are very important in systems using it as a freewheeling or controlled by the device clearing the stored charge.
commutating diode. Of particular interest are the reverse However, the positive di/dt during tb is an uncontrollable
recovery characteristics which play a major role in diode characteristic and is usually the culprit that induces
determining switching losses, radiated noise, EMI and RFI. current ringing. Therefore, when comparing diodes, the
System switching losses are largely due to the nature of ratio of tb/ta serves as a good indicator of recovery
the body diode itself. The body diode is a minority carrier abruptness and thus gives a comparative estimate of
device, therefore it has a finite reverse recovery time, trr, due probable noise generated. A ratio of 1 is considered ideal and
to the storage of minority carrier charge, QRR, as shown in values less than 0.5 are considered snappy.
the typical reverse recovery wave form of Figure 11. It is this Compared to ON Semiconductor standard cell density
stored charge that, when cleared from the diode, passes low voltage MOSFETs, high cell density MOSFET diodes
through a potential and defines an energy loss. Obviously, are faster (shorter trr), have less stored charge and a softer
repeatedly forcing the diode through reverse recovery reverse recovery characteristic. The softness advantage of
further increases switching losses. Therefore, one would the high cell density diode means they can be forced through
like a diode with short trr and low QRR specifications to reverse recovery at a higher di/dt than a standard cell
minimize these losses. MOSFET diode without increasing the current ringing or the
The abruptness of diode reverse recovery effects the noise generated. In addition, power dissipation incurred
amount of radiated noise, voltage spikes, and current from switching the diode will be less due to the shorter
ringing. The mechanisms at work are finite irremovable recovery time and lower switching losses.
circuit parasitic inductances and capacitances acted upon by
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Figure 7. Reverse Recovery Time (trr)
The Forward Biased Safe Operating Area curves define reliable operation, the stored energy from circuit inductance
the maximum simultaneous drain–to–source voltage and dissipated in the transistor while in avalanche must be less
drain current that a transistor can handle safely when it is than the rated limit and must be adjusted for operating
forward biased. Curves are based upon maximum peak conditions differing from those specified. Although industry
junction temperature and a case temperature (TC) of 25°C. practice is to rate in terms of energy, avalanche energy
Peak repetitive pulsed power limits are determined by using capability is not a constant. The energy rating decreases
the thermal response data in conjunction with the procedures non–linearly with an increase of peak current in avalanche
discussed in AN569, “Transient Thermal Resistance – and peak junction temperature.
General Data and Its Use.” Although many E–FETs can withstand the stress of
Switching between the off–state and the on–state may drain–to–source avalanche at currents up to rated pulsed
traverse any load line provided neither rated peak current current (IDM), the energy rating is specified at rated
(IDM) nor rated voltage (VDSS) is exceeded, and that the continuous current (ID), in accordance with industry
transition time (tr, tf) does not exceed 10 µs. In addition the custom. The energy rating must be derated for temperature
total power averaged over a complete switching cycle must as shown in the accompanying graph (Figure 9). Maximum
not exceed (TJ(MAX) – TC)/(RθJC). energy at currents below rated continuous ID can safely be
A power MOSFET designated E–FET can be safely used assumed to equal the values indicated.
in switching circuits with unclamped inductive loads. For
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SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • The soldering temperature and time shall not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within • When shifting from preheating to soldering, the
a short time could result in device failure. Therefore, the maximum temperature gradient shall be 5°C or less.
following items should always be observed in order to • After soldering has been completed, the device should
minimize the thermal stress to which the devices are be allowed to cool naturally for at least three minutes.
subjected. Gradual cooling should be used as the use of forced
• Always preheat the device. cooling will increase the temperature gradient and
• The delta temperature between the preheat and result in latent failure due to mechanical stress.
soldering should be 100°C or less.* • Mechanical stress or shock should not be applied
• When preheating and soldering, the temperature of the during cooling.
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When * Soldering a device without preheating can cause
using infrared heating with the reflow soldering excessive thermal shock and stress which can result in
method, the difference shall be a maximum of 10°C. damage to the device.
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150°C
SOLDER IS LIQUID FOR
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100°C 140°C (DEPENDING ON
MASS OF ASSEMBLY)
100°C
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N–Channel SO–8, Dual
These miniature surface mount MOSFETs feature ultra low RDS(on) and
true logic level performance. They are capable of withstanding high energy
in the avalanche and commutation modes and the drain–to–source diode http://onsemi.com
has a very low reverse recovery time. MiniMOSt devices are designed
for use in low voltage, high speed switching applications where power 3 AMPERES
efficiency is important. Typical applications are dc–dc converters, and 40 VOLTS
power management in portable and battery powered products such as
computers, printers, cellular and cordless phones. They can also be used for
RDS(on) = 80 m
low voltage motor controls in mass storage products such as disk drives
and tape drives. The avalanche energy is specified to eliminate the N–Channel
guesswork in designs where inductive loads are switched and offer
additional safety margin against unexpected voltage transients.
• Ultra Low RDS(on) Provides Higher Efficiency and Extends Battery
Life
• Logic Level Gate Drive – Can Be Driven by Logic ICs
• Miniature SO–8 Surface Mount Package – Saves Board Space
• Diode Is Characterized for Use In Bridge Circuits
• Diode Exhibits High Speed, With Soft Recovery
• IDSS Specified at Elevated Temperature MARKING
DIAGRAM
• Mounting Information for SO–8 Package Provided
• Avalanche Energy Specified
SO–8, Dual
D3N04H
8 CASE 751
LYWW
STYLE 14
1
L = Location Code
Y = Year
WW = Work Week
PIN ASSIGNMENT
N–Source 1 8 N–Drain
N–Gate 2 7 N–Drain
P–Source 3 6 P–Drain
P–Gate 4 5 P–Drain
Top View
ORDERING INFORMATION
THERMAL RESISTANCE
Rating Symbol Typ. Max. Unit
Thermal Resistance – Junction to Ambient, PCB Mount (Note 1.) RθJA – 62.5 °C/W
– Junction to Ambient, PCB Mount (Note 2.) RθJA – 90
1. When mounted on 1″ square FR–4 or G–10 board (VGS = 10 V, @ 10 Seconds)
2. When mounted on minimum recommended FR–4 or G–10 board (VGS = 10 V, @ Steady State)
3. Repetitive rating; pulse width limited by maximum junction temperature.
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Switching behavior is most easily modeled and predicted The capacitance (Ciss) is read from the capacitance curve at
by recognizing that the power MOSFET is charge a voltage corresponding to the off–state condition when
controlled. The lengths of various switching intervals (∆t) calculating td(on) and is read at a voltage corresponding to the
are determined by how fast the FET input capacitance can on–state when calculating td(off).
be charged by current from the generator. At high switching speeds, parasitic circuit elements
The published capacitance data is difficult to use for complicate the analysis. The inductance of the MOSFET
calculating rise and fall because drain–gate capacitance source lead, inside the package and in the circuit wiring
varies greatly with applied voltage. Accordingly, gate which is common to both the drain and gate current paths,
charge data is used. In most cases, a satisfactory estimate of produces a voltage at the source which reduces the gate drive
average input current (IG(AV)) can be made from a current. The voltage is determined by Ldi/dt, but since di/dt
rudimentary analysis of the drive circuit so that is a function of drain current, the mathematical solution is
t = Q/IG(AV) complex. The MOSFET output capacitance also
complicates the mathematics. And finally, MOSFETs have
During the rise and fall time interval when switching a finite internal gate resistance which effectively adds to the
resistive load, VGS remains virtually constant at a level resistance of the driving source, but the internal resistance
known as the plateau voltage, VSGP. Therefore, rise and fall is difficult to measure and, consequently, is not specified.
times may be approximated by the following: The resistive switching time variation versus gate
tr = Q2 x RG/(VGG – VGSP) resistance (Figure 9) shows how typical switching
tf = Q2 x RG/VGSP performance is affected by the parasitic circuit elements. If
where the parasitics were not present, the slope of the curves would
maintain a value of unity regardless of the switching speed.
VGG = the gate drive voltage, which varies from zero to VGG
The circuit used to obtain the data is constructed to minimize
RG = the gate drive resistance
common inductance in the drain and gate circuit loops and
and Q2 and VGSP are read from the gate charge curve.
is believed readily achievable with board mounted
During the turn–on and turn–off delay times, gate current is components. Most power electronic loads are inductive; the
not constant. The simplest calculation uses appropriate data in the figure is taken with a resistive load, which
values from the capacitance curves in a standard equation for approximates an optimally snubbed inductive load. Power
voltage change in an RC network. The equations are: MOSFETs may be safely operated into an inductive load;
td(on) = RG Ciss In [VGG/(VGG – VGSP)] however, snubbing reduces switching losses.
td(off) = RG Ciss In (VGG/VGSP)
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The switching characteristics of a MOSFET body diode high di/dts. The diode’s negative di/dt during ta is directly
are very important in systems using it as a freewheeling or controlled by the device clearing the stored charge.
commutating diode. Of particular interest are the reverse However, the positive di/dt during tb is an uncontrollable
recovery characteristics which play a major role in diode characteristic and is usually the culprit that induces
determining switching losses, radiated noise, EMI and RFI. current ringing. Therefore, when comparing diodes, the
System switching losses are largely due to the nature of ratio of tb/ta serves as a good indicator of recovery
the body diode itself. The body diode is a minority carrier abruptness and thus gives a comparative estimate of
device, therefore it has a finite reverse recovery time, trr, due probable noise generated. A ratio of 1 is considered ideal and
to the storage of minority carrier charge, QRR, as shown in values less than 0.5 are considered snappy.
the typical reverse recovery wave form of Figure 12. It is this Compared to ON Semiconductor standard cell density
stored charge that, when cleared from the diode, passes low voltage MOSFETs, high cell density MOSFET diodes
through a potential and defines an energy loss. Obviously, are faster (shorter trr), have less stored charge and a softer
repeatedly forcing the diode through reverse recovery reverse recovery characteristic. The softness advantage of
further increases switching losses. Therefore, one would the high cell density diode means they can be forced through
like a diode with short trr and low QRR specifications to reverse recovery at a higher di/dt than a standard cell
minimize these losses. MOSFET diode without increasing the current ringing or the
The abruptness of diode reverse recovery effects the noise generated. In addition, power dissipation incurred
amount of radiated noise, voltage spikes, and current from switching the diode will be less due to the shorter
ringing. The mechanisms at work are finite irremovable recovery time and lower switching losses.
circuit parasitic inductances and capacitances acted upon by
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The Forward Biased Safe Operating Area curves define reliable operation, the stored energy from circuit inductance
the maximum simultaneous drain–to–source voltage and dissipated in the transistor while in avalanche must be less
drain current that a transistor can handle safely when it is than the rated limit and must be adjusted for operating
forward biased. Curves are based upon maximum peak conditions differing from those specified. Although industry
junction temperature and a case temperature (TC) of 25°C. practice is to rate in terms of energy, avalanche energy
Peak repetitive pulsed power limits are determined by using capability is not a constant. The energy rating decreases
the thermal response data in conjunction with the procedures non–linearly with an increase of peak current in avalanche
discussed in AN569, “Transient Thermal Resistance – and peak junction temperature.
General Data and Its Use.” Although many E–FETs can withstand the stress of
Switching between the off–state and the on–state may drain–to–source avalanche at currents up to rated pulsed
traverse any load line provided neither rated peak current current (IDM), the energy rating is specified at rated
(IDM) nor rated voltage (VDSS) is exceeded, and that the continuous current (ID), in accordance with industry
transition time (tr, tf) does not exceed 10 µs. In addition the custom. The energy rating must be derated for temperature
total power averaged over a complete switching cycle must as shown in the accompanying graph (Figure 13). Maximum
not exceed (TJ(MAX) – TC)/(RθJC). energy at currents below rated continuous ID can safely be
A power MOSFET designated E–FET can be safely used assumed to equal the values indicated.
in switching circuits with unclamped inductive loads. For
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SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • The soldering temperature and time shall not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within • When shifting from preheating to soldering, the
a short time could result in device failure. Therefore, the maximum temperature gradient shall be 5°C or less.
following items should always be observed in order to • After soldering has been completed, the device should
minimize the thermal stress to which the devices are be allowed to cool naturally for at least three minutes.
subjected. Gradual cooling should be used as the use of forced
• Always preheat the device. cooling will increase the temperature gradient and
• The delta temperature between the preheat and result in latent failure due to mechanical stress.
soldering should be 100°C or less.* • Mechanical stress or shock should not be applied
• When preheating and soldering, the temperature of the during cooling.
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When * Soldering a device without preheating can cause
using infrared heating with the reflow soldering excessive thermal shock and stress which can result in
method, the difference shall be a maximum of 10°C. damage to the device.
http://onsemi.com
529
MMDF3N04HD
150°C
SOLDER IS LIQUID FOR
40 TO 80 SECONDS
100°C 140°C (DEPENDING ON
MASS OF ASSEMBLY)
100°C
http://onsemi.com
530
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Preferred Device
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N–Channel SO–8, Dual
These miniature surface mount MOSFETs feature low RDS(on) and http://onsemi.com
true logic level performance. Dual MOSFET devices are designed for
use in low voltage, high speed switching applications where power 3 AMPERES
efficiency is important. Typical applications are dc–dc converters, and
power management in portable and battery powered products such as 60 VOLTS
computers, printers, cellular and cordless phones. They can also be RDS(on) = 100 mW
used for low voltage motor controls in mass storage products such as
disk drives and tape drives. N–Channel
• Low RDS(on) Provides Higher Efficiency and Extends Battery Life
• Logic Level Gate Drive – Can Be Driven by Logic ICs
• Miniature SO–8 Surface Mount Package – Saves Board Space
• Diode Is Characterized for Use In Bridge Circuits
• Diode Exhibits High Speed, With Soft Recovery
• IDSS Specified at Elevated Temperature
• Mounting Information for SO–8 Package Provided
ORDERING INFORMATION
DYNAMIC CHARACTERISTICS
Input Capacitance Ciss – 442 618 pF
Output Capacitance (VDS = 25 Vd
Vdc, VGS = 0 Vd
Vdc,
Coss – 97.6 137
f = 1.0 MHz)
Transfer Capacitance Crss – 24.4 34.2
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Switching behavior is most easily modeled and predicted During the turn–on and turn–off delay times, gate current is
by recognizing that the power MOSFET is charge not constant. The simplest calculation uses appropriate
controlled. The lengths of various switching intervals (∆t) values from the capacitance curves in a standard equation for
are determined by how fast the FET input capacitance can voltage change in an RC network. The equations are:
be charged by current from the generator. td(on) = RG Ciss In [VGG/(VGG – VGSP)]
The published capacitance data is difficult to use for td(off) = RG Ciss In (VGG/VGSP)
calculating rise and fall because drain–gate capacitance
varies greatly with applied voltage. Accordingly, gate The capacitance (Ciss) is read from the capacitance curve at
charge data is used. In most cases, a satisfactory estimate of a voltage corresponding to the off–state condition when
average input current (IG(AV)) can be made from a calculating td(on) and is read at a voltage corresponding to the
rudimentary analysis of the drive circuit so that on–state when calculating td(off).
At high switching speeds, parasitic circuit elements
t = Q/IG(AV) complicate the analysis. The inductance of the MOSFET
During the rise and fall time interval when switching a source lead, inside the package and in the circuit wiring
resistive load, VGS remains virtually constant at a level which is common to both the drain and gate current paths,
known as the plateau voltage, VSGP. Therefore, rise and fall produces a voltage at the source which reduces the gate drive
times may be approximated by the following: current. The voltage is determined by Ldi/dt, but since di/dt
tr = Q2 x RG/(VGG – VGSP) is a function of drain current, the mathematical solution is
tf = Q2 x RG/VGSP complex. The MOSFET output capacitance also
complicates the mathematics. And finally, MOSFETs have
where finite internal gate resistance which effectively adds to the
VGG = the gate drive voltage, which varies from zero to VGG resistance of the driving source, but the internal resistance
RG = the gate drive resistance is difficult to measure and, consequently, is not specified.
and Q2 and VGSP are read from the gate charge curve.
The switching characteristics of a MOSFET body diode high di/dts. The diode’s negative di/dt during ta is directly
are very important in systems using it as a freewheeling or controlled by the device clearing the stored charge.
commutating diode. Of particular interest are the reverse However, the positive di/dt during tb is an uncontrollable
recovery characteristics which play a major role in diode characteristic and is usually the culprit that induces
determining switching losses, radiated noise, EMI and RFI. current ringing. Therefore, when comparing diodes, the
System switching losses are largely due to the nature of ratio of tb/ta serves as a good indicator of recovery
the body diode itself. The body diode is a minority carrier abruptness and thus gives a comparative estimate of
device, therefore it has a finite reverse recovery time, trr, due probable noise generated. A ratio of 1 is considered ideal and
to the storage of minority carrier charge, QRR, as shown in values less than 0.5 are considered snappy.
the typical reverse recovery wave form of Figure 11. It is this Compared to ON Semiconductor standard cell density
stored charge that, when cleared from the diode, passes low voltage MOSFETs, high cell density MOSFET diodes
through a potential and defines an energy loss. Obviously, are faster (shorter trr), have less stored charge and a softer
repeatedly forcing the diode through reverse recovery reverse recovery characteristic. The softness advantage of
further increases switching losses. Therefore, one would the high cell density diode means they can be forced through
like a diode with short trr and low QRR specifications to reverse recovery at a higher di/dt than a standard cell
minimize these losses. MOSFET diode without increasing the current ringing or the
The abruptness of diode reverse recovery effects the noise generated. In addition, power dissipation incurred
amount of radiated noise, voltage spikes, and current from switching the diode will be less due to the shorter
ringing. The mechanisms at work are finite irremovable recovery time and lower switching losses.
circuit parasitic inductances and capacitances acted upon by
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Figure 7. Reverse Recovery Time (trr)
The Forward Biased Safe Operating Area curves define reliable operation, the stored energy from circuit inductance
the maximum simultaneous drain–to–source voltage and dissipated in the transistor while in avalanche must be less
drain current that a transistor can handle safely when it is than the rated limit and must be adjusted for operating
forward biased. Curves are based upon maximum peak conditions differing from those specified. Although industry
junction temperature and a case temperature (TC) of 25°C. practice is to rate in terms of energy, avalanche energy
Peak repetitive pulsed power limits are determined by using capability is not a constant. The energy rating decreases
the thermal response data in conjunction with the procedures non–linearly with an increase of peak current in avalanche
discussed in AN569, “Transient Thermal Resistance – and peak junction temperature.
General Data and Its Use.” Although many E–FETs can withstand the stress of
Switching between the off–state and the on–state may drain–to–source avalanche at currents up to rated pulsed
traverse any load line provided neither rated peak current current (IDM), the energy rating is specified at rated
(IDM) nor rated voltage (VDSS) is exceeded, and that the continuous current (ID), in accordance with industry
transition time (tr, tf) does not exceed 10 µs. In addition the custom. The energy rating must be derated for temperature
total power averaged over a complete switching cycle must as shown in the accompanying graph (Figure 9). Maximum
not exceed (TJ(MAX) – TC)/(RθJC). energy at currents below rated continuous ID can safely be
A power MOSFET designated E–FET can be safely used assumed to equal the values indicated.
in switching circuits with unclamped inductive loads. For
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The melting temperature of solder is higher than the rated • The soldering temperature and time shall not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within • When shifting from preheating to soldering, the
a short time could result in device failure. Therefore, the maximum temperature gradient shall be 5°C or less.
following items should always be observed in order to • After soldering has been completed, the device should
minimize the thermal stress to which the devices are be allowed to cool naturally for at least three minutes.
subjected. Gradual cooling should be used as the use of forced
• Always preheat the device. cooling will increase the temperature gradient and
• The delta temperature between the preheat and result in latent failure due to mechanical stress.
soldering should be 100°C or less.* • Mechanical stress or shock should not be applied
• When preheating and soldering, the temperature of the during cooling.
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When * Soldering a device without preheating can cause
using infrared heating with the reflow soldering excessive thermal shock and stress which can result in
method, the difference shall be a maximum of 10°C. damage to the device.
http://onsemi.com
538
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150°C
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Designed for low voltage, high speed switching applications in http://onsemi.com
power supplies, converters and power motor controls, these devices
are particularly well suited for bridge circuits where diode speed and 3 AMPERES
commutating safe operating areas are critical and offer additional
safety margin against unexpected voltage transients.
60 VOLTS
• On–resistance Area Product about One–half that of Standard RDS(on) = 130 mΩ
MOSFETs with New Low Voltage, Low RDS(on) Technology
• Faster Switching than E–FETt Predecessors N–Channel
• Avalanche Energy Specified
ORDERING INFORMATION
http://onsemi.com
541
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These miniature surface mount MOSFETs feature ultra low RDS(on)
and true logic level performance. They are capable of withstanding http://onsemi.com
high energy in the avalanche and commutation modes and the
drain–to–source diode has a very low reverse recovery time.
MiniMOSt devices are designed for use in low voltage, high speed
4 AMPERES
switching applications where power efficiency is important. Typical 20 VOLTS
applications are dc–dc converters, and power management in portable RDS(on) = 45 m
and battery powered products such as computers, printers, cellular and
cordless phones. They can also be used for low voltage motor controls
N–Channel
in mass storage products such as disk drives and tape drives.
• Ultra Low RDS(on) Provides Higher Efficiency and Extends Battery
Life
• Logic Level Gate Drive – Can Be Driven by Logic ICs
• Miniature SO–8 Surface Mount Package – Saves Board Space
• Diode Is Characterized for Use In Bridge Circuits
• Diode Exhibits High Speed, With Soft Recovery
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Switching behavior is most easily modeled and predicted The capacitance (Ciss) is read from the capacitance curve at
by recognizing that the power MOSFET is charge a voltage corresponding to the off–state condition when
controlled. The lengths of various switching intervals (∆t) calculating td(on) and is read at a voltage corresponding to the
are determined by how fast the FET input capacitance can on–state when calculating td(off).
be charged by current from the generator. At high switching speeds, parasitic circuit elements
The published capacitance data is difficult to use for complicate the analysis. The inductance of the MOSFET
calculating rise and fall because drain–gate capacitance source lead, inside the package and in the circuit wiring
varies greatly with applied voltage. Accordingly, gate which is common to both the drain and gate current paths,
charge data is used. In most cases, a satisfactory estimate of produces a voltage at the source which reduces the gate drive
average input current (IG(AV)) can be made from a current. The voltage is determined by Ldi/dt, but since di/dt
rudimentary analysis of the drive circuit so that is a function of drain current, the mathematical solution is
t = Q/IG(AV) complex. The MOSFET output capacitance also
complicates the mathematics. And finally, MOSFETs have
During the rise and fall time interval when switching a finite internal gate resistance which effectively adds to the
resistive load, VGS remains virtually constant at a level resistance of the driving source, but the internal resistance
known as the plateau voltage, VSGP. Therefore, rise and fall is difficult to measure and, consequently, is not specified.
times may be approximated by the following: The resistive switching time variation versus gate
tr = Q2 x RG/(VGG – VGSP) resistance (Figure 9) shows how typical switching
tf = Q2 x RG/VGSP performance is affected by the parasitic circuit elements. If
where the parasitics were not present, the slope of the curves would
maintain a value of unity regardless of the switching speed.
VGG = the gate drive voltage, which varies from zero to VGG
The circuit used to obtain the data is constructed to minimize
RG = the gate drive resistance
common inductance in the drain and gate circuit loops and
and Q2 and VGSP are read from the gate charge curve.
is believed readily achievable with board mounted
During the turn–on and turn–off delay times, gate current is components. Most power electronic loads are inductive; the
not constant. The simplest calculation uses appropriate data in the figure is taken with a resistive load, which
values from the capacitance curves in a standard equation for approximates an optimally snubbed inductive load. Power
voltage change in an RC network. The equations are: MOSFETs may be safely operated into an inductive load;
td(on) = RG Ciss In [VGG/(VGG – VGSP)] however, snubbing reduces switching losses.
td(off) = RG Ciss In (VGG/VGSP)
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are very important in systems using it as a freewheeling or controlled by the device clearing the stored charge.
commutating diode. Of particular interest are the reverse However, the positive di/dt during tb is an uncontrollable
recovery characteristics which play a major role in diode characteristic and is usually the culprit that induces
determining switching losses, radiated noise, EMI and RFI. current ringing. Therefore, when comparing diodes, the
System switching losses are largely due to the nature of ratio of tb/ta serves as a good indicator of recovery
the body diode itself. The body diode is a minority carrier abruptness and thus gives a comparative estimate of
device, therefore it has a finite reverse recovery time, trr, due probable noise generated. A ratio of 1 is considered ideal and
to the storage of minority carrier charge, QRR, as shown in values less than 0.5 are considered snappy.
the typical reverse recovery wave form of Figure 14. It is this Compared to ON Semiconductor standard cell density
stored charge that, when cleared from the diode, passes low voltage MOSFETs, high cell density MOSFET diodes
through a potential and defines an energy loss. Obviously, are faster (shorter trr), have less stored charge and a softer
repeatedly forcing the diode through reverse recovery reverse recovery characteristic. The softness advantage of
further increases switching losses. Therefore, one would the high cell density diode means they can be forced through
like a diode with short trr and low QRR specifications to reverse recovery at a higher di/dt than a standard cell
minimize these losses. MOSFET diode without increasing the current ringing or the
The abruptness of diode reverse recovery effects the noise generated. In addition, power dissipation incurred
amount of radiated noise, voltage spikes, and current from switching the diode will be less due to the shorter
ringing. The mechanisms at work are finite irremovable recovery time and lower switching losses.
circuit parasitic inductances and capacitances acted upon by
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The Forward Biased Safe Operating Area curves define total power averaged over a complete switching cycle must
the maximum simultaneous drain–to–source voltage and not exceed (TJ(MAX) – TC)/(RθJC).
drain current that a transistor can handle safely when it is A power MOSFET designated E–FET can be safely used
forward biased. Curves are based upon maximum peak in switching circuits with unclamped inductive loads. For
junction temperature and a case temperature (TC) of 25°C. reliable operation, the stored energy from circuit inductance
Peak repetitive pulsed power limits are determined by using dissipated in the transistor while in avalanche must be less
the thermal response data in conjunction with the procedures than the rated limit and must be adjusted for operating
discussed in AN569, “Transient Thermal Resistance – conditions differing from those specified. Although industry
General Data and Its Use.” practice is to rate in terms of energy, avalanche energy
Switching between the off–state and the on–state may capability is not a constant. The energy rating decreases
traverse any load line provided neither rated peak current non–linearly with an increase of peak current in avalanche
(IDM) nor rated voltage (VDSS) is exceeded, and that the and peak junction temperature.
transition time (tr, tf) does not exceed 10 µs. In addition the
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SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • The soldering temperature and time shall not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within • When shifting from preheating to soldering, the
a short time could result in device failure. Therefore, the maximum temperature gradient shall be 5°C or less.
following items should always be observed in order to • After soldering has been completed, the device should
minimize the thermal stress to which the devices are be allowed to cool naturally for at least three minutes.
subjected. Gradual cooling should be used as the use of forced
• Always preheat the device. cooling will increase the temperature gradient and
• The delta temperature between the preheat and result in latent failure due to mechanical stress.
soldering should be 100°C or less.* • Mechanical stress or shock should not be applied
• When preheating and soldering, the temperature of the during cooling.
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When * Soldering a device without preheating can cause
using infrared heating with the reflow soldering excessive thermal shock and stress which can result in
method, the difference shall be a maximum of 10°C. damage to the device.
http://onsemi.com
549
MMDF4N01HD
150°C
SOLDER IS LIQUID FOR
40 TO 80 SECONDS
100°C 140°C (DEPENDING ON
MASS OF ASSEMBLY)
100°C
http://onsemi.com
550
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N–Channel SO–8, Dual
EZFETst are an advanced series of Power MOSFETs which
http://onsemi.com
contain monolithic back–to–back zener diodes. These zener diodes
provide protection against ESD and unexpected transients. These
miniature surface mount MOSFETs feature low RDS(on) and true logic 5 AMPERES
level performance. They are capable of withstanding high energy in 20 VOLTS
the avalanche and commutation modes and the drain–to–source diode RDS(on) = 40 mΩ
has a very low reverse recovery time. EZFET devices are designed for
use in low voltage, high speed switching applications where power N–Channel
efficiency is important. D
• Zener Protected Gates Provide Electrostatic Discharge Protection
• Low RDS(on) Provides Higher Efficiency and Extends Battery Life
• Logic Level Gate Drive – Can Be Driven by Logic ICs
G
• Miniature SO–8 Surface Mount Package – Saves Board Space
• Diode Exhibits High Speed, With Soft Recovery
• IDSS Specified at Elevated Temperature S
• Mounting Information for SO–8 Package Provided
MARKING
MAXIMUM RATINGS (TJ = 25°C unless otherwise noted) DIAGRAM
Rating Symbol Value Unit
Drain–to–Source Voltage VDSS 20 Vdc SO–8, Dual
CASE 751 5N02Z
Drain–to–Gate Voltage (RGS = 1.0 MΩ) VDGR 20 Vdc 8
STYLE 11 LYWW
Gate–to–Source Voltage – Continuous VGS ± 12 Vdc
Drain Current – Continuous @ TA = 25°C ID 5.0 Adc 1
Drain Current – Continuous @ TA = 70°C ID 4.5
Drain Current – Single Pulse (tp ≤ 10 µs) IDM 40 Apk 5N02Z = Device Code
L = Location Code
Total Power Dissipation @ TA = 25°C (Note 1.) PD 2.0 Watts
Y = Year
Operating and Storage Temperature Range TJ, Tstg – 55 °C WW = Work Week
to 150
Thermal Resistance – Junction to RθJA 62.5 °C/W
Ambient PIN ASSIGNMENT
Maximum Temperature for Soldering TL 260 °C
Source–1 1 8 Drain–1
1. When mounted on 1 inch square FR–4 or G–10 board
(VGS = 4.5 V, @ 10 Seconds). Gate–1 2 7 Drain–1
Source–2 3 6 Drain–2
Gate–2 4 5 Drain–2
Top View
ORDERING INFORMATION
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Switching behavior is most easily modeled and predicted The capacitance (Ciss) is read from the capacitance curve at
by recognizing that the power MOSFET is charge a voltage corresponding to the off–state condition when
controlled. The lengths of various switching intervals (∆t) calculating td(on) and is read at a voltage corresponding to the
are determined by how fast the FET input capacitance can on–state when calculating td(off).
be charged by current from the generator. At high switching speeds, parasitic circuit elements
The published capacitance data is difficult to use for complicate the analysis. The inductance of the MOSFET
calculating rise and fall because drain–gate capacitance source lead, inside the package and in the circuit wiring
varies greatly with applied voltage. Accordingly, gate which is common to both the drain and gate current paths,
charge data is used. In most cases, a satisfactory estimate of produces a voltage at the source which reduces the gate drive
average input current (IG(AV)) can be made from a current. The voltage is determined by Ldi/dt, but since di/dt
rudimentary analysis of the drive circuit so that is a function of drain current, the mathematical solution is
t = Q/IG(AV) complex. The MOSFET output capacitance also
complicates the mathematics. And finally, MOSFETs have
During the rise and fall time interval when switching a finite internal gate resistance which effectively adds to the
resistive load, VGS remains virtually constant at a level resistance of the driving source, but the internal resistance
known as the plateau voltage, VSGP. Therefore, rise and fall is difficult to measure and, consequently, is not specified.
times may be approximated by the following: The resistive switching time variation versus gate
tr = Q2 x RG/(VGG – VGSP) resistance (Figure 9) shows how typical switching
tf = Q2 x RG/VGSP performance is affected by the parasitic circuit elements. If
where the parasitics were not present, the slope of the curves would
maintain a value of unity regardless of the switching speed.
VGG = the gate drive voltage, which varies from zero to VGG
The circuit used to obtain the data is constructed to minimize
RG = the gate drive resistance
common inductance in the drain and gate circuit loops and
and Q2 and VGSP are read from the gate charge curve.
is believed readily achievable with board mounted
During the turn–on and turn–off delay times, gate current is components. Most power electronic loads are inductive; the
not constant. The simplest calculation uses appropriate data in the figure is taken with a resistive load, which
values from the capacitance curves in a standard equation for approximates an optimally snubbed inductive load. Power
voltage change in an RC network. The equations are: MOSFETs may be safely operated into an inductive load;
td(on) = RG Ciss In [VGG/(VGG – VGSP)] however, snubbing reduces switching losses.
td(off) = RG Ciss In (VGG/VGSP)
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The switching characteristics of a MOSFET body diode high di/dts. The diode’s negative di/dt during ta is directly
are very important in systems using it as a freewheeling or controlled by the device clearing the stored charge.
commutating diode. Of particular interest are the reverse However, the positive di/dt during tb is an uncontrollable
recovery characteristics which play a major role in diode characteristic and is usually the culprit that induces
determining switching losses, radiated noise, EMI and RFI. current ringing. Therefore, when comparing diodes, the
System switching losses are largely due to the nature of ratio of tb/ta serves as a good indicator of recovery
the body diode itself. The body diode is a minority carrier abruptness and thus gives a comparative estimate of
device, therefore it has a finite reverse recovery time, trr, due probable noise generated. A ratio of 1 is considered ideal and
to the storage of minority carrier charge, QRR, as shown in values less than 0.5 are considered snappy.
the typical reverse recovery wave form of Figure 11. It is this Compared to ON Semiconductor standard cell density
stored charge that, when cleared from the diode, passes low voltage MOSFETs, high cell density MOSFET diodes
through a potential and defines an energy loss. Obviously, are faster (shorter trr), have less stored charge and a softer
repeatedly forcing the diode through reverse recovery reverse recovery characteristic. The softness advantage of
further increases switching losses. Therefore, one would the high cell density diode means they can be forced through
like a diode with short trr and low QRR specifications to reverse recovery at a higher di/dt than a standard cell
minimize these losses. MOSFET diode without increasing the current ringing or the
The abruptness of diode reverse recovery effects the noise generated. In addition, power dissipation incurred
amount of radiated noise, voltage spikes, and current from switching the diode will be less due to the shorter
ringing. The mechanisms at work are finite irremovable recovery time and lower switching losses.
circuit parasitic inductances and capacitances acted upon by
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The Forward Biased Safe Operating Area curves the total power averaged over a complete switching cycle
define the maximum simultaneous drain–to–source must not exceed (T J(MAX) – T C )/(RθJC ).
voltage and drain current that a transistor can handle A power MOSFET designated E–FET can be safely
safely when it is forward biased. Curves are based upon used in switching circuits with unclamped inductive
maximum peak junction temperature and a case loads. For reliable operation, the stored energy from
temperature (T C ) of 25°C. Peak repetitive pulsed power circuit inductance dissipated in the transistor while in
limits are determined by using the thermal response data avalanche must be less than the rated limit and must be
in conjunction with the procedures discussed in AN569, adjusted for operating conditions differing from those
“Transient Thermal Resistance – General Data and Its specified. Although industry practice is to rate in terms
Use.” of energy, avalanche energy capability is not a constant.
Switching between the off–state and the on–state may The energy rating decreases non–linearly with an
traverse any load line provided neither rated peak current increase of peak current in avalanche and peak junction
(I DM ) nor rated voltage (V DSS ) is exceeded, and that the temperature.
transition time (t r, tf ) does not exceed 10 µs. In addition
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SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • The soldering temperature and time shall not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within • When shifting from preheating to soldering, the
a short time could result in device failure. Therefore, the maximum temperature gradient shall be 5°C or less.
following items should always be observed in order to • After soldering has been completed, the device should
minimize the thermal stress to which the devices are be allowed to cool naturally for at least three minutes.
subjected. Gradual cooling should be used as the use of forced
• Always preheat the device. cooling will increase the temperature gradient and
• The delta temperature between the preheat and result in latent failure due to mechanical stress.
soldering should be 100°C or less.* • Mechanical stress or shock should not be applied
• When preheating and soldering, the temperature of the during cooling.
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When * Soldering a device without preheating can cause
using infrared heating with the reflow soldering excessive thermal shock and stress which can result in
method, the difference shall be a maximum of 10°C. damage to the device.
http://onsemi.com
558
MMDF5N02Z
150°C
SOLDER IS LIQUID FOR
40 TO 80 SECONDS
100°C 140°C (DEPENDING ON
MASS OF ASSEMBLY)
100°C
http://onsemi.com
559
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Preferred Device
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N–Channel SO–8, Dual
These miniature surface mount MOSFETs feature low RDS(on) and
true logic level performance. Dual MOSFET devices are designed for
use in low voltage, high speed switching applications where power http://onsemi.com
efficiency is important. Typical applications are dc–dc converters, and
power management in portable and battery powered products such as 6 AMPERES
computers, printers, cellular and cordless phones. They can also be 30 VOLTS
used for low voltage motor controls in mass storage products such as
disk drives and tape drives. RDS(on) = 35 mW
• Low RDS(on) Provides Higher Efficiency and Extends Battery Life
• Logic Level Gate Drive – Can Be Driven by Logic ICs N–Channel
ORDERING INFORMATION
http://onsemi.com
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Switching behavior is most easily modeled and predicted The capacitance (Ciss) is read from the capacitance curve at
by recognizing that the power MOSFET is charge a voltage corresponding to the off–state condition when
controlled. The lengths of various switching intervals (∆t) calculating td(on) and is read at a voltage corresponding to the
are determined by how fast the FET input capacitance can on–state when calculating td(off).
be charged by current from the generator. At high switching speeds, parasitic circuit elements
The published capacitance data is difficult to use for complicate the analysis. The inductance of the MOSFET
calculating rise and fall because drain–gate capacitance source lead, inside the package and in the circuit wiring
varies greatly with applied voltage. Accordingly, gate which is common to both the drain and gate current paths,
charge data is used. In most cases, a satisfactory estimate of produces a voltage at the source which reduces the gate drive
average input current (IG(AV)) can be made from a current. The voltage is determined by Ldi/dt, but since di/dt
rudimentary analysis of the drive circuit so that is a function of drain current, the mathematical solution is
t = Q/IG(AV) complex. The MOSFET output capacitance also
complicates the mathematics. And finally, MOSFETs have
During the rise and fall time interval when switching a finite internal gate resistance which effectively adds to the
resistive load, VGS remains virtually constant at a level resistance of the driving source, but the internal resistance
known as the plateau voltage, VSGP. Therefore, rise and fall is difficult to measure and, consequently, is not specified.
times may be approximated by the following: The resistive switching time variation versus gate
tr = Q2 x RG/(VGG – VGSP) resistance (Figure 9) shows how typical switching
tf = Q2 x RG/VGSP performance is affected by the parasitic circuit elements. If
where the parasitics were not present, the slope of the curves would
maintain a value of unity regardless of the switching speed.
VGG = the gate drive voltage, which varies from zero to VGG
The circuit used to obtain the data is constructed to minimize
RG = the gate drive resistance
common inductance in the drain and gate circuit loops and
and Q2 and VGSP are read from the gate charge curve.
is believed readily achievable with board mounted
During the turn–on and turn–off delay times, gate current is components. Most power electronic loads are inductive; the
not constant. The simplest calculation uses appropriate data in the figure is taken with a resistive load, which
values from the capacitance curves in a standard equation for approximates an optimally snubbed inductive load. Power
voltage change in an RC network. The equations are: MOSFETs may be safely operated into an inductive load;
td(on) = RG Ciss In [VGG/(VGG – VGSP)] however, snubbing reduces switching losses.
td(off) = RG Ciss In (VGG/VGSP)
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are very important in systems using it as a freewheeling or controlled by the device clearing the stored charge.
commutating diode. Of particular interest are the reverse However, the positive di/dt during tb is an uncontrollable
recovery characteristics which play a major role in diode characteristic and is usually the culprit that induces
determining switching losses, radiated noise, EMI and RFI. current ringing. Therefore, when comparing diodes, the
System switching losses are largely due to the nature of ratio of tb/ta serves as a good indicator of recovery
the body diode itself. The body diode is a minority carrier abruptness and thus gives a comparative estimate of
device, therefore it has a finite reverse recovery time, trr, due probable noise generated. A ratio of 1 is considered ideal and
to the storage of minority carrier charge, QRR, as shown in values less than 0.5 are considered snappy.
the typical reverse recovery wave form of Figure 15. It is this Compared to ON Semiconductor standard cell density
stored charge that, when cleared from the diode, passes low voltage MOSFETs, high cell density MOSFET diodes
through a potential and defines an energy loss. Obviously, are faster (shorter trr), have less stored charge and a softer
repeatedly forcing the diode through reverse recovery reverse recovery characteristic. The softness advantage of
further increases switching losses. Therefore, one would the high cell density diode means they can be forced through
like a diode with short trr and low QRR specifications to reverse recovery at a higher di/dt than a standard cell
minimize these losses. MOSFET diode without increasing the current ringing or the
The abruptness of diode reverse recovery effects the noise generated. In addition, power dissipation incurred
amount of radiated noise, voltage spikes, and current from switching the diode will be less due to the shorter
ringing. The mechanisms at work are finite irremovable recovery time and lower switching losses.
circuit parasitic inductances and capacitances acted upon by
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the maximum simultaneous drain–to–source voltage and not exceed (TJ(MAX) – TC)/(RθJC).
drain current that a transistor can handle safely when it is A power MOSFET designated E–FET can be safely used
forward biased. Curves are based upon maximum peak in switching circuits with unclamped inductive loads. For
junction temperature and a case temperature (TC) of 25°C. reliable operation, the stored energy from circuit inductance
Peak repetitive pulsed power limits are determined by using dissipated in the transistor while in avalanche must be less
the thermal response data in conjunction with the procedures than the rated limit and must be adjusted for operating
discussed in AN569, “Transient Thermal Resistance – conditions differing from those specified. Although industry
General Data and Its Use.” practice is to rate in terms of energy, avalanche energy
Switching between the off–state and the on–state may capability is not a constant. The energy rating decreases
traverse any load line provided neither rated peak current non–linearly with an increase of peak current in avalanche
(IDM) nor rated voltage (VDSS) is exceeded, and that the and peak junction temperature.
transition time (tr, tf) does not exceed 10 µs. In addition the
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SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • The soldering temperature and time shall not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within • When shifting from preheating to soldering, the
a short time could result in device failure. Therefore, the maximum temperature gradient shall be 5°C or less.
following items should always be observed in order to • After soldering has been completed, the device should
minimize the thermal stress to which the devices are be allowed to cool naturally for at least three minutes.
subjected. Gradual cooling should be used as the use of forced
• Always preheat the device. cooling will increase the temperature gradient and
• The delta temperature between the preheat and result in latent failure due to mechanical stress.
soldering should be 100°C or less.* • Mechanical stress or shock should not be applied
• When preheating and soldering, the temperature of the during cooling.
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When * Soldering a device without preheating can cause
using infrared heating with the reflow soldering excessive thermal shock and stress which can result in
method, the difference shall be a maximum of 10°C. damage to the device.
http://onsemi.com
567
MMDF6N03HD
150°C
SOLDER IS LIQUID FOR
40 TO 80 SECONDS
100°C 140°C (DEPENDING ON
MASS OF ASSEMBLY)
100°C
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568
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N–Channel SO–8, Dual
EZFETst are an advanced series of Power MOSFETs which
contain monolithic back–to–back zener diodes. These zener diodes http://onsemi.com
provide protection against ESD and unexpected transients. These
miniature surface mount MOSFETs feature ultra low RDS(on) and true 7 AMPERES
logic level performance. They are capable of withstanding high energy
20 VOLTS
in the avalanche and commutation modes and the drain–to–source
diode has a very low reverse recovery time. EZFET devices are RDS(on) = 27 mΩ
designed for use in low voltage, high speed switching applications
where power efficiency is important. Typical applications are dc–dc N–Channel
converters, and power management in portable and battery powered D
products such as computers, printers, cellular and cordless phones.
They can also be used for low voltage motor controls in mass storage
products such as disk drives and tape drives.
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• Zener Protected Gates Provide Electrostatic Discharge Protection
• Designed to Withstand 200 V Machine Model and 2000 V Human
Body Model S
• Ultra Low RDS(on) Provides Higher Efficiency and Extends Battery
Life MARKING
DIAGRAM
• Logic Level Gate Drive – Can be Driven by Logic ICs
• Miniature SO–8 Surface Mount Package – Saves Board Space
• Diode is Characterized for use in Bridge Circuits SO–8, Dual
7N02Z
• Diode Exhibits High Speed, with Soft Recovery 8 CASE 751
STYLE 11
LYWW
• IDSS Specified at Elevated Temperature 1
• Mounting Information for SO–8 Package Provided
7N02Z = Device Code
L = Location Code
Y = Year
WW = Work Week
PIN ASSIGNMENT
Source–1 1 8 Drain–1
Gate–1 2 7 Drain–1
Source–2 3 6 Drain–2
Gate–2 4 5 Drain–2
Top View
ORDERING INFORMATION
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Switching behavior is most easily modeled and predicted The capacitance (Ciss) is read from the capacitance curve at
by recognizing that the power MOSFET is charge a voltage corresponding to the off–state condition when
controlled. The lengths of various switching intervals (∆t) calculating td(on) and is read at a voltage corresponding to the
are determined by how fast the FET input capacitance can on–state when calculating td(off).
be charged by current from the generator. At high switching speeds, parasitic circuit elements
The published capacitance data is difficult to use for complicate the analysis. The inductance of the MOSFET
calculating rise and fall because drain–gate capacitance source lead, inside the package and in the circuit wiring
varies greatly with applied voltage. Accordingly, gate which is common to both the drain and gate current paths,
charge data is used. In most cases, a satisfactory estimate of produces a voltage at the source which reduces the gate drive
average input current (IG(AV)) can be made from a current. The voltage is determined by Ldi/dt, but since di/dt
rudimentary analysis of the drive circuit so that is a function of drain current, the mathematical solution is
t = Q/IG(AV) complex. The MOSFET output capacitance also
complicates the mathematics. And finally, MOSFETs have
During the rise and fall time interval when switching a finite internal gate resistance which effectively adds to the
resistive load, VGS remains virtually constant at a level resistance of the driving source, but the internal resistance
known as the plateau voltage, VSGP. Therefore, rise and fall is difficult to measure and, consequently, is not specified.
times may be approximated by the following: The resistive switching time variation versus gate
tr = Q2 x RG/(VGG – VGSP) resistance (Figure 9) shows how typical switching
tf = Q2 x RG/VGSP performance is affected by the parasitic circuit elements. If
where the parasitics were not present, the slope of the curves would
maintain a value of unity regardless of the switching speed.
VGG = the gate drive voltage, which varies from zero to VGG
The circuit used to obtain the data is constructed to minimize
RG = the gate drive resistance
common inductance in the drain and gate circuit loops and
and Q2 and VGSP are read from the gate charge curve.
is believed readily achievable with board mounted
During the turn–on and turn–off delay times, gate current is components. Most power electronic loads are inductive; the
not constant. The simplest calculation uses appropriate data in the figure is taken with a resistive load, which
values from the capacitance curves in a standard equation for approximates an optimally snubbed inductive load. Power
voltage change in an RC network. The equations are: MOSFETs may be safely operated into an inductive load;
td(on) = RG Ciss In [VGG/(VGG – VGSP)] however, snubbing reduces switching losses.
td(off) = RG Ciss In (VGG/VGSP)
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The switching characteristics of a MOSFET body diode high di/dts. The diode’s negative di/dt during ta is directly
are very important in systems using it as a freewheeling or controlled by the device clearing the stored charge.
commutating diode. Of particular interest are the reverse However, the positive di/dt during tb is an uncontrollable
recovery characteristics which play a major role in diode characteristic and is usually the culprit that induces
determining switching losses, radiated noise, EMI and RFI. current ringing. Therefore, when comparing diodes, the
System switching losses are largely due to the nature of ratio of tb/ta serves as a good indicator of recovery
the body diode itself. The body diode is a minority carrier abruptness and thus gives a comparative estimate of
device, therefore it has a finite reverse recovery time, trr, due probable noise generated. A ratio of 1 is considered ideal and
to the storage of minority carrier charge, QRR, as shown in values less than 0.5 are considered snappy.
the typical reverse recovery wave form of Figure 15. It is this Compared to ON Semiconductor standard cell density
stored charge that, when cleared from the diode, passes low voltage MOSFETs, high cell density MOSFET diodes
through a potential and defines an energy loss. Obviously, are faster (shorter trr), have less stored charge and a softer
repeatedly forcing the diode through reverse recovery reverse recovery characteristic. The softness advantage of
further increases switching losses. Therefore, one would the high cell density diode means they can be forced through
like a diode with short trr and low QRR specifications to reverse recovery at a higher di/dt than a standard cell
minimize these losses. MOSFET diode without increasing the current ringing or the
The abruptness of diode reverse recovery effects the noise generated. In addition, power dissipation incurred
amount of radiated noise, voltage spikes, and current from switching the diode will be less due to the shorter
ringing. The mechanisms at work are finite irremovable recovery time and lower switching losses.
circuit parasitic inductances and capacitances acted upon by
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The Forward Biased Safe Operating Area curves define total power averaged over a complete switching cycle must
the maximum simultaneous drain–to–source voltage and not exceed (TJ(MAX) – TC)/(RθJC).
drain current that a transistor can handle safely when it is A power MOSFET designated E–FET can be safely used
forward biased. Curves are based upon maximum peak in switching circuits with unclamped inductive loads. For
junction temperature and a case temperature (TC) of 25°C. reliable operation, the stored energy from circuit inductance
Peak repetitive pulsed power limits are determined by using dissipated in the transistor while in avalanche must be less
the thermal response data in conjunction with the procedures than the rated limit and must be adjusted for operating
discussed in AN569, “Transient Thermal Resistance – conditions differing from those specified. Although industry
General Data and Its Use.” practice is to rate in terms of energy, avalanche energy
Switching between the off–state and the on–state may capability is not a constant. The energy rating decreases
traverse any load line provided neither rated peak current non–linearly with an increase of peak current in avalanche
(IDM) nor rated voltage (VDSS) is exceeded, and that the and peak junction temperature.
transition time (tr, tf) does not exceed 10 µs. In addition the
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SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • The soldering temperature and time shall not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within • When shifting from preheating to soldering, the
a short time could result in device failure. Therefore, the maximum temperature gradient shall be 5°C or less.
following items should always be observed in order to • After soldering has been completed, the device should
minimize the thermal stress to which the devices are be allowed to cool naturally for at least three minutes.
subjected. Gradual cooling should be used as the use of forced
• Always preheat the device. cooling will increase the temperature gradient and
• The delta temperature between the preheat and result in latent failure due to mechanical stress.
soldering should be 100°C or less.* • Mechanical stress or shock should not be applied
• When preheating and soldering, the temperature of the during cooling.
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When * Soldering a device without preheating can cause
using infrared heating with the reflow soldering excessive thermal shock and stress which can result in
method, the difference shall be a maximum of 10°C. damage to the device.
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P–Channel SO–8, FETKYt
The FETKY product family incorporates low RDS(on), true logic
level MOSFETs packaged with industry leading, low forward drop, http://onsemi.com
low leakage Schottky Barrier rectifiers to offer high efficiency
components in a space saving configuration. Independent pinouts for 2 AMPERES
MOSFET and Schottky die allow the flexibility to use a single
component for switching and rectification functions in a wide variety
20 VOLTS
of applications such as Buck Converter, Buck–Boost, Synchronous RDS(on) = 160 mW
Rectification, Low Voltage Motor Control, and Load Management in VF = 0.39 Volts
Battery Packs, Chargers, Cell Phones and other Portable Products.
• Power MOSFET with Low VF, Low IR Schottky Rectifier P–Channel
• Lower Component Placement and Inventory Costs along with
D
Board Space Savings
• Logic Level Gate Drive – Can be Driven by Logic ICs
• Mounting Information for SO–8 Package Provided
• IDSS Specified at Elevated Temperature G
• Applications Information Provided
S
MOSFET MAXIMUM RATINGS (TJ = 25°C unless otherwise noted)
(Note 1.)
MARKING
Rating Symbol Value Unit DIAGRAM
Drain–to–Source Voltage VDSS 20 Vdc
Drain–to–Gate Voltage (RGS = 1.0 MW) VDGR 20 Vdc SO–8
2P102
Gate–to–Source Voltage – Continuous VGS "20 Vdc 8 CASE 751
LYWW
STYLE 18
Drain Current (Note 3.)
– Continuous @ TA = 25°C ID 3.3 Adc 1
– Continuous @ TA = 100°C ID 2.1
– Single Pulse (tp v 10 ms) IDM 20 Apk L = Location Code
Y = Year
Total Power Dissipation @ TA = 25°C PD 2.0 Watts WW = Work Week
(Note 2.)
ORDERING INFORMATION
Average Forward Current (Note 4.) (Rated VR) TA = 100°C IO 1.0 Amps
Peak Repetitive Forward Current (Note 3.) (Rated VR, Square Wave, 20 kHz) TA = 105°C Ifrm 2.0 Amps
Non–Repetitive Peak Surge Current Ifsm 20 Amps
(Surge applied at rated load conditions, halfwave, single phase, 60 Hz)
http://onsemi.com
580
MMDFS2P102
MOSFET ELECTRICAL CHARACTERISTICS (TJ = 25°C unless otherwise noted) (Note 7.)
Characteristic Symbol Min Typ Max Unit
OFF CHARACTERISTICS
Drain–Source Voltage V(BR)DSS
(VGS = 0 Vdc, ID = 0.25 mA) 20 – – Vdc
Temperature Coefficient (Positive) – 25 – mV/°C
Zero Gate Drain Current IDSS µAdc
(VDS = 30 Vdc, VGS = 0 Vdc) – – 1.0
(VDS = 20 Vdc, VGS = 0 Vdc, TJ = 125°C) – – 10
Gate Body Leakage Current (VGS = ± 20 Vdc, VDS = 0) IGSS – – 100 nAdc
ON CHARACTERISTICS (Note 8.)
Gate Threshold Voltage VGS(th) Vdc
(VDS = VGS, ID = 0.25 mA) 1.0 1.5 2.0
Temperature Coefficient (Negative) – 4.0 – mV/°C
Static Drain–Source Resistance RDS(on) Ohms
(VGS = 10 Vdc, ID = 2.0 Adc) – 0.118 0.160
(VGS = 4.5 Vdc, ID = 2.5 Adc) – 0.152 0.180
Forward Transconductance (VDS = 3.0 Vdc, ID = 1.0 Adc) gFS 2.0 3.0 – mhos
DYNAMIC CHARACTERISTICS
Input Capacitance Ciss – 420 588 pF
Output Capacitance (VDS = 16 Vd
Vdc, VGS = 0 Vd
Vdc,
Coss – 290 406
f = 1.0 MHz)
Reverse Transfer Capacitance Crss – 116 232
http://onsemi.com
581
MMDFS2P102
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Drain–To–Source Voltage versus Total Charge
Figure 7. Capacitance Variation
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N–Channel SO–8, FETKYt
http://onsemi.com
The FETKY product family incorporates low RDS(on), true logic
level MOSFETs packaged with industry leading, low forward drop,
6 AMPERES
low leakage Schottky Barrier rectifiers to offer high efficiency
components in a space saving configuration. Independent pinouts for 30 VOLTS
MOSFET and Schottky die allow the flexibility to use a single RDS(on) = 35 mW
component for switching and rectification functions in a wide variety VF = 0.42 Volts
of applications such as Buck Converter, Buck–Boost, Synchronous
Rectification, Low Voltage Motor Control, and Load Management in
N–Channel
Battery Packs, Chargers, Cell Phones and other Portable Products.
• Power MOSFET with Low VF D
• Lower Component Placement and Inventory Costs along with
Board Space Savings
• Logic Level Gate Drive — Can be Driven by Logic ICs G
• Mounting Information for SO–8 Package Provided
• Applications Information Provided S
• R2 Suffix for Tape and Reel (2500 units/13″ reel)
• Marking: 6N303 MARKING
DIAGRAM
MOSFET MAXIMUM RATINGS (TJ = 25°C unless otherwise noted)
(Note 1.)
SO–8
Rating Symbol Value Unit 6N303
8 CASE 751
Drain–to–Source Voltage VDSS 30 Vdc LYWW
STYLE 18
Drain–to–Gate Voltage (RGS = 1.0 MW) VDGR 30 Vdc 1
Gate–to–Source Voltage — Continuous VGS "20 Vdc
6N303 = Device Code
Drain Current (Note 2.) L = Location Code
– Continuous @ TA = 25°C ID 6.0 Adc Y = Year
– Single Pulse (tp v 10 ms) IDM 30 Apk WW = Work Week
Total Power Dissipation @ TA = 25°C PD 2.0 Watts
(Note 2.) PIN ASSIGNMENT
Single Pulse Drain–to–Source Avalanche EAS 325 mJ
Energy — Startin TJ = 25°C Anode 1 8 Cathode
VDD = 30 Vdc, VGS = 5.0 Vdc, VDS = 20 Anode 2 7 Cathode
Vdc, IL = 9.0 Apk, L = 10 mH, RG = 25 W
Source 3 6 Drain
1. Pulse Test: Pulse Width ≤ 250 µs, Duty Cycle ≤ 2.0%.
2. Mounted on 2″ square FR4 board (1″ sq. 2 oz. Cu 0.06″ thick single sided), Gate 4 5 Drain
10 sec. max. Top View
ORDERING INFORMATION
MOSFET ELECTRICAL CHARACTERISTICS (TC = 25°C unless otherwise noted) (Note 6.)
Characteristic Symbol Min Typ Max Unit
OFF CHARACTERISTICS
Drain–Source Voltage V(BR)DSS
(VGS = 0 Vdc, ID = 0.25 mA) 30 — — Vdc
Temperature Coefficient (Positive) — — — mV/°C
Zero Gate Drain Current IDSS µAdc
(VDS = 24 Vdc, VGS = 0 Vdc) — — 1.0
(VDS = 24 Vdc, VGS = 0 Vdc, TJ = 125°C) — — 20
Gate Body Leakage Current (VGS = ± 20 Vdc, VDS = 0) IGSS — — 100 nAdc
ON CHARACTERISTICS (Note 6.)
Gate Threshold Voltage VGS(th) Vdc
(VDS = VGS, ID = 0.25 mA) 1.0 — —
Temperature Coefficient (Negative) — — —
Static Drain–Source Resistance RDS(on) mW
(VGS = 10 Vdc, ID = 5.0 Adc) — 28 35
(VGS = 4.5 Vdc, ID = 3.9 Adc) — 42 50
Forward Transconductance (VDS = 15 Vdc, ID = 5.0 Adc) gFS — 9.0 — mhos
DYNAMIC CHARACTERISTICS
Input Capacitance Ciss — 430 600 pF
Output Capacitance (VDS = 24 Vd
Vdc, VGS = 0 Vd
Vdc,
Coss — 217 300
f = 1.0 MHz)
Reverse Transfer Capacitance Crss — 67.5 135
3. Mounted on 2″ square FR4 board (1″ sq. 2 oz. Cu 0.06″ thick single sided), 10 sec. max.
4. Mounted with minimum recommended pad size, PC Board FR4.
5. Mounted on 2″ square FR4 board (1″ sq. 2 oz. Cu 0.06″ thick single sided), Steady State.
6. Pulse Test: Pulse Width ≤ 300 µs, Duty Cycle ≤ 2.0%.
http://onsemi.com
590
MMDFS6N303
MOSFET ELECTRICAL CHARACTERISTICS – continued (TC = 25°C unless otherwise noted) (Note 7.)
Characteristic Symbol Min Typ Max Unit
SWITCHING CHARACTERISTICS (Note 8.)
Turn–On Delay Time td(on) — 8.2 16.5 ns
Rise Time (VDD = 15 Vdc, ID = 1.0 Adc, tr — 8.5 17
VGS = 10 Vdc
Vdc,
Turn–Off Delay Time RG = 6.0 Ω) td(off) — 89.6 179
Fall Time tf — 61.1 122
Gate Charge QT — 15.7 31.4 nC
http://onsemi.com
591
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598
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Preferred Device
#$%& '(
N–Channel SOT–223
This Power MOSFET is designed for high speed, low loss power
switching applications such as switching regulators, dc–dc converters,
solenoid and relay drivers. The device is housed in the SOT–223 http://onsemi.com
package which is designed for medium power surface mount
applications.
250 mA
• Silicon Gate for Fast Switching Speeds 200 VOLTS
• Low Drive Requirement RDS(on) = 14
• The SOT–223 Package can be soldered using wave or reflow.
N–Channel
The formed leads absorb thermal stress during soldering
eliminating the possibility of damage to the die.
1 2 3
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ORDERING INFORMATION
OFF CHARACTERISTICS
Drain–to–Source Breakdown Voltage V(BR)DSS 200 – – Vdc
(VGS = 0, ID = 10 µA)
DYNAMIC CHARACTERISTICS
Input Capacitance Ciss – 60 – pF
(VDS = 25 VV, VGS = 0
0,
Output Capacitance Coss – 30 –
f = 1.0 MHz)
Transfer Capacitance Crss – 6.0 –
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Another alternative would be to use a ceramic substrate board, the power dissipation can be doubled using the same
or an aluminum core board such as Thermal Cladt. Using footprint.
a board material such as Thermal Clad, an aluminum core
SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • The soldering temperature and time should not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within • When shifting from preheating to soldering, the
a short time could result in device failure. Therefore, the maximum temperature gradient should be 5°C or less.
following items should always be observed in order to • After soldering has been completed, the device should
minimize the thermal stress to which the devices are be allowed to cool naturally for at least three minutes.
subjected. Gradual cooling should be used as the use of forced
• Always preheat the device. cooling will increase the temperature gradient and
• The delta temperature between the preheat and result in latent failure due to mechanical stress.
soldering should be 100°C or less.* • Mechanical stress or shock should not be applied
• When preheating and soldering, the temperature of the during cooling
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When * Soldering a device without preheating can cause
using infrared heating with the reflow soldering excessive thermal shock and stress which can result in
method, the difference should be a maximum of 10°C. damage to the device.
http://onsemi.com
603
MMFT107T1
150°C
SOLDER IS LIQUID FOR
40 TO 80 SECONDS
100°C 140°C (DEPENDING ON
MASS OF ASSEMBLY)
100°C
http://onsemi.com
604
(
Preferred Device
#$%& '(
"
N–Channel SOT–223
This Power MOSFET is designed for high speed, low loss power
switching applications such as switching regulators, converters,
solenoid and relay drivers. The device is housed in the SOT–223 http://onsemi.com
package which is designed for medium power surface mount
applications.
700 mA
• Silicon Gate for Fast Switching Speeds 240 VOLTS
• High Voltage – 240 Vdc RDS(on) = 6.0
• Low Drive Requirement
N–Channel
• The SOT–223 Package can be soldered using wave or reflow.
The formed leads absorb thermal stress during soldering,
eliminating the possibility of damage to the die.
1 2 3
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ORDERING INFORMATION
OFF CHARACTERISTICS
Drain–to–Source Breakdown Voltage V(BR)DSS 240 – Vdc
(VGS = 0, ID = 100 µA)
DYNAMIC CHARACTERISTICS
Input Capacitance Ciss – 125 pF
(VDS = 25 VV, VGS = 0,
0
Output Capacitance Coss – 50
f = 1.0 MHz)
Transfer Capacitance Crss – 20
2. Pulse Test: Pulse Width ≤ 300 µs, Duty Cycle ≤ 2.0%.
http://onsemi.com
606
MMFT2406T1
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a board material such as Thermal Clad, an aluminum core
SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • The soldering temperature and time should not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within • When shifting from preheating to soldering, the
a short time could result in device failure. Therefore, the maximum temperature gradient should be 5°C or less.
following items should always be observed in order to • After soldering has been completed, the device should
minimize the thermal stress to which the devices are be allowed to cool naturally for at least three minutes.
subjected. Gradual cooling should be used as the use of forced
• Always preheat the device. cooling will increase the temperature gradient and
• The delta temperature between the preheat and result in latent failure due to mechanical stress.
soldering should be 100°C or less.* • Mechanical stress or shock should not be applied
• When preheating and soldering, the temperature of the during cooling
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When * Soldering a device without preheating can cause
using infrared heating with the reflow soldering excessive thermal shock and stress which can result in
method, the difference should be a maximum of 10°C. damage to the device.
http://onsemi.com
608
MMFT2406T1
150°C
SOLDER IS LIQUID FOR
40 TO 80 SECONDS
100°C 140°C (DEPENDING ON
MASS OF ASSEMBLY)
100°C
http://onsemi.com
609
( )
Preferred Device
#$%& '(
P–Channel SOT–223
This Power MOSFET is designed to withstand high energy in the
avalanche and commutation modes. This new energy efficient device
also offers a drain–to–source diode with a fast recovery time. http://onsemi.com
Designed for low voltage, high speed switching applications in power
supplies, converters and PWM motor controls, these devices are
1 AMPERE
particularly well suited for bridge circuits where diode speed and 60 VOLTS
commutating safe operating areas are critical and offer additional RDS(on) = 300 m
safety margin against unexpected voltage transients. The device is
housed in the SOT–223 package which is designed for medium power P–Channel
surface mount applications.
• Silicon Gate for Fast Switching Speeds
• The SOT–223 Package can be Soldered Using Wave or Reflow. The
Formed Leads Absorb Thermal Stress During Soldering, Eliminating
the Possibility of Damage to the Die
ORDERING INFORMATION
ON CHARACTERISTICS
Gate Threshold Voltage, (VDS = VGS, ID = 1 mA) VGS(th) 2.0 – 4.5 Vdc
Static Drain–to–Source On–Resistance, (VGS = 10 V, ID = 0.6 A) RDS(on) – – 0.3 Ohms
Drain–to–Source On–Voltage, (VGS = 10 V, ID = 1.2 A) VDS(on) – – 0.48 Vdc
Forward Transconductance, (VDS = 15 V, ID = 0.6 A) gFS – 7.5 – mhos
DYNAMIC CHARACTERISTICS
Input Capacitance Ciss – 460 –
(VDS = 20 V,
Output Capacitance VGS = 0, Coss – 210 – pF
f = 1 MH
MHz))
Reverse Transfer Capacitance Crss – 84 –
http://onsemi.com
611
MMFT2955E
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simultaneous high voltage and high current, up to the rating !
of the device, they are especially useful to designers of linear
systems. The curves are based on a ambient temperature of $ !
25°C and a maximum junction temperature of 150°C. !
Limitations for repetitive pulses at various ambient
temperatures can be determined by using the thermal
response curves. ON Semiconductor Application Note,
AN569, “Transient Thermal Resistance–General Data and
Its Use” provides detailed instructions.
SWITCHING SAFE OPERATING AREA
The switching safe operating area (SOA) is the boundary
that the load line may traverse without incurring damage to Figure 7. Maximum Rated Forward Biased
the MOSFET. The fundamental limits are the peak current, Safe Operating Area
IDM and the breakdown voltage, BVDSS. The switching
SOA is applicable for both turn–on and turn–off of the
devices for switching times less than one microsecond.
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The Commutating Safe Operating Area (CSOA) of Figure 10 defines the limits of safe operation for commutated
source–drain current versus re–applied drain voltage when the source–drain diode has undergone forward bias. The curve shows
the limitations of IFM and peak VDS for a given rate of change of source current. It is applicable when waveforms similar to
those of Figure 9 are present. Full or half–bridge PWM DC motor controllers are common applications requiring CSOA data.
Device stresses increase with increasing rate of change of source current so dIS/dt is specified with a maximum value. Higher
values of dIS/dt require an appropriate derating of IFM, peak VDS or both. Ultimately dIS/dt is limited primarily by device,
package, and circuit impedances. Maximum device stress occurs during trr as the diode goes from conduction to reverse
blocking.
VDS(pk) is the peak drain–to–source voltage that the device must sustain during commutation; IFM is the maximum forward
source–drain diode current just prior to the onset of commutation.
VR is specified at 80% rated BVDSS to ensure that the CSOA stress is maximized as IS decays from IRM to zero.
RGS should be minimized during commutation. TJ has only a second order effect on CSOA.
Stray inductances in ON Semiconductor’s test circuit are assumed to be practical minimums. dV DS /dt in excess of 10 V/ns
was attained with dI S /dt of 400 A/µs.
http://onsemi.com
613
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http://onsemi.com
614
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Another alternative would be to use a ceramic substrate board, the power dissipation can be doubled using the same
or an aluminum core board such as Thermal Cladt. Using footprint.
a board material such as Thermal Clad, an aluminum core
SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • The soldering temperature and time shall not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within • When shifting from preheating to soldering, the
a short time could result in device failure. Therefore, the maximum temperature gradient shall be 5°C or less.
following items should always be observed in order to • After soldering has been completed, the device should
minimize the thermal stress to which the devices are be allowed to cool naturally for at least three minutes.
subjected. Gradual cooling should be used as the use of forced
• Always preheat the device. cooling will increase the temperature gradient and
• The delta temperature between the preheat and result in latent failure due to mechanical stress.
soldering should be 100°C or less.* • Mechanical stress or shock should not be applied
• When preheating and soldering, the temperature of the during cooling
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When * Soldering a device without preheating can cause
using infrared heating with the reflow soldering excessive thermal shock and stress which can result in
method, the difference shall be a maximum of 10°C. damage to the device.
http://onsemi.com
617
MMFT2955E
150°C
SOLDER IS LIQUID FOR
40 TO 80 SECONDS
100°C 140°C (DEPENDING ON
MASS OF ASSEMBLY)
100°C
http://onsemi.com
618
(
Preferred Device
#$%& '(
N–Channel SOT–223
This Power MOSFET is designed to withstand high energy in the
avalanche and commutation modes. This device is also designed with
a low threshold voltage so it is fully enhanced with 5 Volts. This new http://onsemi.com
energy efficient device also offers a drain–to–source diode with a fast
recovery time. Designed for low voltage, high speed switching
2 AMPERES
applications in power supplies, dc–dc converters and PWM motor 20 VOLTS
controls, these devices are particularly well suited for bridge circuits RDS(on) = 150 m
where diode speed and commutating safe operating areas are critical
and offer additional safety margin against unexpected voltage N–Channel
transients. The device is housed in the SOT–223 package which is
designed for medium power surface mount applications.
• Silicon Gate for Fast Switching Speeds
• Low Drive Requirement to Interface Power Loads to Logic Level
ICs, VGS(th) = 2 Volts Max
• The SOT–223 Package can be Soldered Using Wave or Reflow. The
Formed Leads Absorb Thermal Stress During Soldering, Eliminating
the Possibility of Damage to the Die
MARKING
MAXIMUM RATINGS (TA = 25°C unless otherwise noted) DIAGRAM
Rating Symbol Value Unit
Drain–to–Source Voltage VDS 20 4
TO–261AA
Vdc 2N02L
Gate–to–Source Voltage – Continuous VGS ±15 CASE 318E LWW
1 STYLE 3
Drain Current – Continuous ID 1.6 Adc 2
3
Drain Current – Pulsed IDM 6.4
Total Power Dissipation @ TA = 25°C PD 0.8 Watts L = Location Code
Derate above 25°C (Note 1.) 6.4 mW/°C WW = Work Week
Operating and Storage Temperature TJ, Tstg –65 to °C
Range 150
PIN ASSIGNMENT
Single Pulse Drain–to–Source Avalanche EAS 66 mJ
4 ()%
Energy – Starting TJ = 25°C
(VDD = 10 V, VGS = 5 V, Peak
IL= 2 A, L = 0.2 mH, RG = 25 Ω)
THERMAL CHARACTERISTICS
Thermal Resistance – RθJA 156 °C/W
Junction–to–Ambient (surface mounted)
1 2 3
Maximum Temperature for Soldering 260 °C )'1 ()% ;(1
Purposes, TL
Time in Solder Bath 10 Sec ORDERING INFORMATION
1. Power rating when mounted on FR–4 glass epoxy printed circuit board using
recommended footprint. Device Package Shipping
SWITCHING CHARACTERISTICS
Turn–On Delay Time td(on) – 16 –
Rise Time (VDD = 15 V, ID = 1.6 A tr – 73 –
VGS = 5 V
V, RG = 50 ohms,
ohms ns
Turn–Off Delay Time RGS = 25 ohms) td(off) – 77 –
Fall Time tf – 107 –
Total Gate Charge Qg – 20 –
(VDS = 16 V, ID = 1.6 A,
Gate–Source Charge VGS = 5 Vdc) Qgs – 1.7 – nC
S Figures
See Fi 15 andd 16
Gate–Drain Charge Qgd – 6 –
SOURCE DRAIN DIODE CHARACTERISTICS (Note 2.)
Forward On–Voltage IS = 1.6 A, VGS = 0 VSD – 0.9 – Vdc
Forward Turn–On Time IS = 1.6 A, VGS = 0, ton Limited by stray inductance
dlS/dt = 400 A/µs,
A/µs
Reverse Recovery Time VR = 16 V trr – 55 – ns
2. Pulse Test: Pulse Width ≤ 300 µs, Duty Cycle ≤ 2%
http://onsemi.com
620
MMFT2N02EL
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simultaneous high voltage and high current, up to the rating
of the device, they are especially useful to designers of linear #F !
systems. The curves are based on an ambient temperature of
!
25°C and a maximum junction temperature of 150°C.
!
Limitations for repetitive pulses at various ambient
temperatures can be determined by using the thermal
response curves. ON Semiconductor Application Note, $F !
AN569, “Transient Thermal Resistance–General Data and
Its Use” provides detailed instructions.
SWITCHING SAFE OPERATING AREA
The switching safe operating area (SOA) is the boundary
that the load line may traverse without incurring damage to Figure 7. Maximum Rated Forward Biased
the MOSFET. The fundamental limits are the peak current, Safe Operating Area
IDM and the breakdown voltage, BVDSS. The switching SOA
is applicable for both turn–on and turn–off of the devices for
switching times less than one microsecond.
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The Commutating Safe Operating Area (CSOA) of Figure 10 defines the limits of safe operation for commutated
source–drain current versus re–applied drain voltage when the source–drain diode has undergone forward bias. The curve shows
the limitations of IFM and peak VDS for a given rate of change of source current. It is applicable when waveforms similar to
those of Figure 9 are present. Full or half–bridge PWM DC motor controllers are common applications requiring CSOA data.
Device stresses increase with increasing rate of change of source current so dIS/dt is specified with a maximum value. Higher
values of dIS/dt require an appropriate derating of IFM, peak VDS or both. Ultimately dIS/dt is limited primarily by device,
package, and circuit impedances. Maximum device stress occurs during trr as the diode goes from conduction to reverse
blocking.
VDS(pk) is the peak drain–to–source voltage that the device must sustain during commutation; IFM is the maximum forward
source–drain diode current just prior to the onset of commutation.
VR is specified at 80% rated BVDSS to ensure that the CSOA stress is maximized as IS decays from IRM to zero.
RGS should be minimized during commutation. TJ has only a second order effect on CSOA.
Stray inductances in ON Semiconductor’s test circuit are assumed to be practical minimums. dVDS/dt in excess of 10 V/ns
was attained with dI S /dt of 400 A/µs.
http://onsemi.com
622
MMFT2N02EL
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or an aluminum core board such as Thermal Cladt. Using footprint.
a board material such as Thermal Clad, an aluminum core
SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • The soldering temperature and time shall not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within • When shifting from preheating to soldering, the
a short time could result in device failure. Therefore, the maximum temperature gradient shall be 5°C or less.
following items should always be observed in order to • After soldering has been completed, the device should
minimize the thermal stress to which the devices are be allowed to cool naturally for at least three minutes.
subjected. Gradual cooling should be used as the use of forced
• Always preheat the device. cooling will increase the temperature gradient and
• The delta temperature between the preheat and result in latent failure due to mechanical stress.
soldering should be 100°C or less.* • Mechanical stress or shock should not be applied
• When preheating and soldering, the temperature of the during cooling
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When * Soldering a device without preheating can cause
using infrared heating with the reflow soldering excessive thermal shock and stress which can result in
method, the difference shall be a maximum of 10°C. damage to the device.
http://onsemi.com
626
MMFT2N02EL
150°C
SOLDER IS LIQUID FOR
40 TO 80 SECONDS
100°C 140°C (DEPENDING ON
MASS OF ASSEMBLY)
100°C
http://onsemi.com
627
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N–Channel SOT–223
These Power MOSFETs are designed for low voltage, high speed
switching applications in power supplies, converters and power motor
controls, these devices are particularly well suited for bridge circuits http://onsemi.com
where diode speed and commutating safe operating areas are critical
and offer additional safety margin against unexpected voltage
1 AMPERE
transients. 60 VOLTS
• Avalanche Energy Specified RDS(on) = 130 m
• IDSS and VDS(on) Specified at Elevated Temperature
N–Channel
MAXIMUM RATINGS (TC = 25°C unless otherwise noted)
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Switching behavior is most easily modeled and predicted The capacitance (Ciss) is read from the capacitance curve at
by recognizing that the power MOSFET is charge a voltage corresponding to the off–state condition when
controlled. The lengths of various switching intervals (∆t) calculating td(on) and is read at a voltage corresponding to the
are determined by how fast the FET input capacitance can on–state when calculating td(off).
be charged by current from the generator. At high switching speeds, parasitic circuit elements
The published capacitance data is difficult to use for complicate the analysis. The inductance of the MOSFET
calculating rise and fall because drain–gate capacitance source lead, inside the package and in the circuit wiring
varies greatly with applied voltage. Accordingly, gate which is common to both the drain and gate current paths,
charge data is used. In most cases, a satisfactory estimate of produces a voltage at the source which reduces the gate drive
average input current (IG(AV)) can be made from a current. The voltage is determined by Ldi/dt, but since di/dt
rudimentary analysis of the drive circuit so that is a function of drain current, the mathematical solution is
t = Q/IG(AV) complex. The MOSFET output capacitance also
complicates the mathematics. And finally, MOSFETs have
During the rise and fall time interval when switching a finite internal gate resistance which effectively adds to the
resistive load, VGS remains virtually constant at a level resistance of the driving source, but the internal resistance
known as the plateau voltage, VSGP. Therefore, rise and fall is difficult to measure and, consequently, is not specified.
times may be approximated by the following: The resistive switching time variation versus gate
tr = Q2 x RG/(VGG – VGSP) resistance (Figure 9) shows how typical switching
tf = Q2 x RG/VGSP performance is affected by the parasitic circuit elements. If
where the parasitics were not present, the slope of the curves would
maintain a value of unity regardless of the switching speed.
VGG = the gate drive voltage, which varies from zero to VGG
The circuit used to obtain the data is constructed to minimize
RG = the gate drive resistance
common inductance in the drain and gate circuit loops and
and Q2 and VGSP are read from the gate charge curve.
is believed readily achievable with board mounted
During the turn–on and turn–off delay times, gate current is components. Most power electronic loads are inductive; the
not constant. The simplest calculation uses appropriate data in the figure is taken with a resistive load, which
values from the capacitance curves in a standard equation for approximates an optimally snubbed inductive load. Power
voltage change in an RC network. The equations are: MOSFETs may be safely operated into an inductive load;
td(on) = RG Ciss In [VGG/(VGG – VGSP)] however, snubbing reduces switching losses.
td(off) = RG Ciss In (VGG/VGSP)
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the maximum simultaneous drain–to–source voltage and dissipated in the transistor while in avalanche must be less
drain current that a transistor can handle safely when it is than the rated limit and adjusted for operating conditions
forward biased. Curves are based upon maximum peak differing from those specified. Although industry practice is
junction temperature and a case temperature (TC) of 25°C. to rate in terms of energy, avalanche energy capability is not
Peak repetitive pulsed power limits are determined by using a constant. The energy rating decreases non–linearly with an
the thermal response data in conjunction with the procedures increase of peak current in avalanche and peak junction
discussed in AN569, “Transient Thermal temperature.
Resistance–General Data and Its Use.” Although many E–FETs can withstand the stress of
Switching between the off–state and the on–state may drain–to–source avalanche at currents up to rated pulsed
traverse any load line provided neither rated peak current current (IDM), the energy rating is specified at rated
(IDM) nor rated voltage (VDSS) is exceeded and the continuous current (ID), in accordance with industry
transition time (tr,tf) do not exceed 10 µs. In addition the total custom. The energy rating must be derated for temperature
power averaged over a complete switching cycle must not as shown in the accompanying graph (Figure 13). Maximum
exceed (TJ(MAX) – TC)/(RθJC). energy at currents below rated continuous ID can safely be
A Power MOSFET designated E–FET can be safely used assumed to equal the values indicated.
in switching circuits with unclamped inductive loads. For
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or an aluminum core board such as Thermal Cladt. Using footprint.
a board material such as Thermal Clad, an aluminum core
SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • The soldering temperature and time shall not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within • When shifting from preheating to soldering, the
a short time could result in device failure. Therefore, the maximum temperature gradient shall be 5°C or less.
following items should always be observed in order to • After soldering has been completed, the device should
minimize the thermal stress to which the devices are be allowed to cool naturally for at least three minutes.
subjected. Gradual cooling should be used as the use of forced
• Always preheat the device. cooling will increase the temperature gradient and
• The delta temperature between the preheat and result in latent failure due to mechanical stress.
soldering should be 100°C or less.* • Mechanical stress or shock should not be applied
• When preheating and soldering, the temperature of the during cooling
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When * Soldering a device without preheating can cause
using infrared heating with the reflow soldering excessive thermal shock and stress which can result in
method, the difference shall be a maximum of 10°C. damage to the device.
http://onsemi.com
635
MMFT3055V
150°C
SOLDER IS LIQUID FOR
40 TO 80 SECONDS
100°C 140°C (DEPENDING ON
MASS OF ASSEMBLY)
100°C
http://onsemi.com
636
(!
#$%& '(
N–Channel SOT–223
These Power MOSFETs are designed for low voltage, high speed
switching applications in power supplies, converters and power motor
controls, these devices are particularly well suited for bridge circuits http://onsemi.com
where diode speed and commutating safe operating areas are critical
and offer additional safety margin against unexpected voltage
1 AMPERE
transients. 60 VOLTS
• Avalanche Energy Specified RDS(on) = 140 m
• IDSS and VDS(on) Specified at Elevated Temperature
N–Channel
MAXIMUM RATINGS (TC = 25°C unless otherwise noted)
http://onsemi.com
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Switching behavior is most easily modeled and predicted The capacitance (Ciss) is read from the capacitance curve at
by recognizing that the power MOSFET is charge a voltage corresponding to the off–state condition when
controlled. The lengths of various switching intervals (∆t) calculating td(on) and is read at a voltage corresponding to the
are determined by how fast the FET input capacitance can on–state when calculating td(off).
be charged by current from the generator. At high switching speeds, parasitic circuit elements
The published capacitance data is difficult to use for complicate the analysis. The inductance of the MOSFET
calculating rise and fall because drain–gate capacitance source lead, inside the package and in the circuit wiring
varies greatly with applied voltage. Accordingly, gate which is common to both the drain and gate current paths,
charge data is used. In most cases, a satisfactory estimate of produces a voltage at the source which reduces the gate drive
average input current (IG(AV)) can be made from a current. The voltage is determined by Ldi/dt, but since di/dt
rudimentary analysis of the drive circuit so that is a function of drain current, the mathematical solution is
t = Q/IG(AV) complex. The MOSFET output capacitance also
complicates the mathematics. And finally, MOSFETs have
During the rise and fall time interval when switching a finite internal gate resistance which effectively adds to the
resistive load, VGS remains virtually constant at a level resistance of the driving source, but the internal resistance
known as the plateau voltage, VSGP. Therefore, rise and fall is difficult to measure and, consequently, is not specified.
times may be approximated by the following: The resistive switching time variation versus gate
tr = Q2 x RG/(VGG – VGSP) resistance (Figure 9) shows how typical switching
tf = Q2 x RG/VGSP performance is affected by the parasitic circuit elements. If
where the parasitics were not present, the slope of the curves would
maintain a value of unity regardless of the switching speed.
VGG = the gate drive voltage, which varies from zero to VGG
The circuit used to obtain the data is constructed to minimize
RG = the gate drive resistance
common inductance in the drain and gate circuit loops and
and Q2 and VGSP are read from the gate charge curve.
is believed readily achievable with board mounted
During the turn–on and turn–off delay times, gate current is components. Most power electronic loads are inductive; the
not constant. The simplest calculation uses appropriate data in the figure is taken with a resistive load, which
values from the capacitance curves in a standard equation for approximates an optimally snubbed inductive load. Power
voltage change in an RC network. The equations are: MOSFETs may be safely operated into an inductive load;
td(on) = RG Ciss In [VGG/(VGG – VGSP)] however, snubbing reduces switching losses.
td(off) = RG Ciss In (VGG/VGSP)
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The Forward Biased Safe Operating Area curves define reliable operation, the stored energy from circuit inductance
the maximum simultaneous drain–to–source voltage and dissipated in the transistor while in avalanche must be less
drain current that a transistor can handle safely when it is than the rated limit and adjusted for operating conditions
forward biased. Curves are based upon maximum peak differing from those specified. Although industry practice is
junction temperature and a case temperature (TC) of 25°C. to rate in terms of energy, avalanche energy capability is not
Peak repetitive pulsed power limits are determined by using a constant. The energy rating decreases non–linearly with an
the thermal response data in conjunction with the procedures increase of peak current in avalanche and peak junction
discussed in AN569, “Transient Thermal temperature.
Resistance–General Data and Its Use.” Although many E–FETs can withstand the stress of
Switching between the off–state and the on–state may drain–to–source avalanche at currents up to rated pulsed
traverse any load line provided neither rated peak current current (IDM), the energy rating is specified at rated
(IDM) nor rated voltage (VDSS) is exceeded and the continuous current (ID), in accordance with industry
transition time (tr,tf) do not exceed 10 µs. In addition the total custom. The energy rating must be derated for temperature
power averaged over a complete switching cycle must not as shown in the accompanying graph (Figure 13). Maximum
exceed (TJ(MAX) – TC)/(RθJC). energy at currents below rated continuous ID can safely be
A Power MOSFET designated E–FET can be safely used assumed to equal the values indicated.
in switching circuits with unclamped inductive loads. For
http://onsemi.com
641
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Another alternative would be to use a ceramic substrate board, the power dissipation can be doubled using the same
or an aluminum core board such as Thermal Cladt. Using footprint.
a board material such as Thermal Clad, an aluminum core
SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • The soldering temperature and time shall not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within • When shifting from preheating to soldering, the
a short time could result in device failure. Therefore, the maximum temperature gradient shall be 5°C or less.
following items should always be observed in order to • After soldering has been completed, the device should
minimize the thermal stress to which the devices are be allowed to cool naturally for at least three minutes.
subjected. Gradual cooling should be used as the use of forced
• Always preheat the device. cooling will increase the temperature gradient and
• The delta temperature between the preheat and result in latent failure due to mechanical stress.
soldering should be 100°C or less.* • Mechanical stress or shock should not be applied
• When preheating and soldering, the temperature of the during cooling
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When * Soldering a device without preheating can cause
using infrared heating with the reflow soldering excessive thermal shock and stress which can result in
method, the difference shall be a maximum of 10°C. damage to the device.
http://onsemi.com
644
MMFT3055VL
150°C
SOLDER IS LIQUID FOR
40 TO 80 SECONDS
100°C 140°C (DEPENDING ON
MASS OF ASSEMBLY)
100°C
http://onsemi.com
645
(#!.
Preferred Device
#$%& '(
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P–Channel SOT–223
This miniature surface mount MOSFET features ultra low RDS(on)
and true logic level performance. It is capable of withstanding high
energy in the avalanche and commutation modes and the http://onsemi.com
drain–to–source diode has a very low reverse recovery time.
MMFT5P03HD devices are designed for use in low voltage, high
5 AMPERES
speed switching applications where power efficiency is important. 30 VOLTS
Typical applications are dc–dc converters, and power management in RDS(on) = 100 mΩ
portable and battery powered products such as computers, printers,
cellular and cordless phones. They can also be used for low voltage P–Channel
motor controls in mass storage products such as disk drives and tape
drives. The avalanche energy is specified to eliminate the guesswork
in designs where inductive loads are switched and offer additional
safety margin against unexpected voltage transients.
• Ultra Low RDS(on) Provides Higher Efficiency and Extends Battery
Life
• Logic Level Gate Drive – Can Be Driven by Logic ICs
• Miniature SOT–223 Surface Mount Package – Saves Board Space
• Diode Is Characterized for Use In Bridge Circuits MARKING
• Diode Exhibits High Speed, With Soft Recovery DIAGRAM
• IDSS Specified at Elevated Temperature
• Avalanche Energy Specified 4
TO–261AA 5P03H
CASE 318E LWW
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PIN ASSIGNMENT
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http://onsemi.com
647
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649
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Switching behavior is most easily modeled and predicted The capacitance (Ciss) is read from the capacitance curve at
by recognizing that the power MOSFET is charge a voltage corresponding to the off–state condition when
controlled. The lengths of various switching intervals (∆t) calculating td(on) and is read at a voltage corresponding to the
are determined by how fast the FET input capacitance can on–state when calculating td(off).
be charged by current from the generator. At high switching speeds, parasitic circuit elements
The published capacitance data is difficult to use for complicate the analysis. The inductance of the MOSFET
calculating rise and fall because drain–gate capacitance source lead, inside the package and in the circuit wiring
varies greatly with applied voltage. Accordingly, gate which is common to both the drain and gate current paths,
charge data is used. In most cases, a satisfactory estimate of produces a voltage at the source which reduces the gate drive
average input current (IG(AV)) can be made from a current. The voltage is determined by Ldi/dt, but since di/dt
rudimentary analysis of the drive circuit so that is a function of drain current, the mathematical solution is
t = Q/IG(AV) complex. The MOSFET output capacitance also
complicates the mathematics. And finally, MOSFETs have
During the rise and fall time interval when switching a finite internal gate resistance which effectively adds to the
resistive load, VGS remains virtually constant at a level resistance of the driving source, but the internal resistance
known as the plateau voltage, VSGP. Therefore, rise and fall is difficult to measure and, consequently, is not specified.
times may be approximated by the following: The resistive switching time variation versus gate
tr = Q2 x RG/(VGG – VGSP) resistance (Figure 9) shows how typical switching
tf = Q2 x RG/VGSP performance is affected by the parasitic circuit elements. If
where the parasitics were not present, the slope of the curves would
maintain a value of unity regardless of the switching speed.
VGG = the gate drive voltage, which varies from zero to VGG
The circuit used to obtain the data is constructed to minimize
RG = the gate drive resistance
common inductance in the drain and gate circuit loops and
and Q2 and VGSP are read from the gate charge curve.
is believed readily achievable with board mounted
During the turn–on and turn–off delay times, gate current is components. Most power electronic loads are inductive; the
not constant. The simplest calculation uses appropriate data in the figure is taken with a resistive load, which
values from the capacitance curves in a standard equation for approximates an optimally snubbed inductive load. Power
voltage change in an RC network. The equations are: MOSFETs may be safely operated into an inductive load;
td(on) = RG Ciss In [VGG/(VGG – VGSP)] however, snubbing reduces switching losses.
td(off) = RG Ciss In (VGG/VGSP)
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are very important in systems using it as a freewheeling or controlled by the device clearing the stored charge.
commutating diode. Of particular interest are the reverse However, the positive di/dt during tb is an uncontrollable
recovery characteristics which play a major role in diode characteristic and is usually the culprit that induces
determining switching losses, radiated noise, EMI and RFI. current ringing. Therefore, when comparing diodes, the
System switching losses are largely due to the nature of ratio of tb/ta serves as a good indicator of recovery
the body diode itself. The body diode is a minority carrier abruptness and thus gives a comparative estimate of
device, therefore it has a finite reverse recovery time, trr, due probable noise generated. A ratio of 1 is considered ideal and
to the storage of minority carrier charge, QRR, as shown in values less than 0.5 are considered snappy.
the typical reverse recovery wave form of Figure 11. It is this Compared to ON Semiconductor standard cell density
stored charge that, when cleared from the diode, passes low voltage MOSFETs, high cell density MOSFET diodes
through a potential and defines an energy loss. Obviously, are faster (shorter trr), have less stored charge and a softer
repeatedly forcing the diode through reverse recovery reverse recovery characteristic. The softness advantage of
further increases switching losses. Therefore, one would the high cell density diode means they can be forced through
like a diode with short trr and low QRR specifications to reverse recovery at a higher di/dt than a standard cell
minimize these losses. MOSFET diode without increasing the current ringing or the
The abruptness of diode reverse recovery effects the noise generated. In addition, power dissipation incurred
amount of radiated noise, voltage spikes, and current from switching the diode will be less due to the shorter
ringing. The mechanisms at work are finite irremovable recovery time and lower switching losses.
circuit parasitic inductances and capacitances acted upon by
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http://onsemi.com
651
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The Forward Biased Safe Operating Area curves define total power averaged over a complete switching cycle must
the maximum simultaneous drain–to–source voltage and not exceed (TJ(MAX) – TC)/(RθJC).
drain current that a transistor can handle safely when it is A power MOSFET designated E–FET can be safely used
forward biased. Curves are based upon maximum peak in switching circuits with unclamped inductive loads. For
junction temperature and a case temperature (TC) of 25°C. reliable operation, the stored energy from circuit inductance
Peak repetitive pulsed power limits are determined by using dissipated in the transistor while in avalanche must be less
the thermal response data in conjunction with the procedures than the rated limit and must be adjusted for operating
discussed in AN569, “Transient Thermal Resistance – conditions differing from those specified. Although industry
General Data and Its Use.” practice is to rate in terms of energy, avalanche energy
Switching between the off–state and the on–state may capability is not a constant. The energy rating decreases
traverse any load line provided neither rated peak current non–linearly with an increase of peak current in avalanche
(IDM) nor rated voltage (VDSS) is exceeded, and that the and peak junction temperature.
transition time (tr, tf) does not exceed 10 µs. In addition the
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This Power MOSFET is designed for high speed, low loss power
switching applications such as switching regulators, dc–dc converters,
solenoid and relay drivers. The device is housed in the SOT–223 http://onsemi.com
package which is designed for medium power surface mount
applications.
300 mA
• Silicon Gate for Fast Switching Speeds 60 VOLTS
• Low Drive Requirement RDS(on) = 1.7
• The SOT–223 Package can be soldered using wave or reflow.
N–Channel
The formed leads absorb thermal stress during soldering
eliminating the possibility of damage to the die.
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ORDERING INFORMATION
OFF CHARACTERISTICS
Drain–to–Source Breakdown Voltage V(BR)DSS 60 – – Vdc
(VGS = 0, ID = 10 µA)
DYNAMIC CHARACTERISTICS
Input Capacitance Ciss – 65 – pF
(VDS = 25 VV, VGS = 0
0,
Output Capacitance Coss – 33 –
f = 1.0 MHz)
Transfer Capacitance Crss – 7.0 –
Total Gate Charge Qg – 3.2 – nC
(VGS = 10 V
V, ID = 1.0
1 0 A,
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Gate–Source Charge Qgs – 1.2 –
VDS = 48 V)
Gate–Drain Charge Qgd – 2.0 –
2. Pulse Test: Pulse Width ≤ 300 µs, Duty Cycle ≤ 2.0%.
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Another alternative would be to use a ceramic substrate board, the power dissipation can be doubled using the same
or an aluminum core board such as Thermal Cladt. Using footprint.
a board material such as Thermal Clad, an aluminum core
SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • The soldering temperature and time should not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within • When shifting from preheating to soldering, the
a short time could result in device failure. Therefore, the maximum temperature gradient should be 5°C or less.
following items should always be observed in order to • After soldering has been completed, the device should
minimize the thermal stress to which the devices are be allowed to cool naturally for at least three minutes.
subjected. Gradual cooling should be used as the use of forced
• Always preheat the device. cooling will increase the temperature gradient and
• The delta temperature between the preheat and result in latent failure due to mechanical stress.
soldering should be 100°C or less.* • Mechanical stress or shock should not be applied
• When preheating and soldering, the temperature of the during cooling
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When * Soldering a device without preheating can cause
using infrared heating with the reflow soldering excessive thermal shock and stress which can result in
method, the difference should be a maximum of 10°C. damage to the device.
http://onsemi.com
660
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150°C
SOLDER IS LIQUID FOR
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100°C 140°C (DEPENDING ON
MASS OF ASSEMBLY)
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Preferred Device
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N–Channel SO–8
EZFETst are an advanced series of Power MOSFETs which
contain monolithic back–to–back zener diodes. These zener diodes
provide protection against ESD and unexpected transients. These http://onsemi.com
miniature surface mount MOSFETs feature low RDS(on) and true logic
level performance. They are capable of withstanding high energy in 10 AMPERES
the avalanche and commutation modes and the drain–to–source diode 20 VOLTS
has a very low reverse recovery time. EZFET devices are designed for
use in low voltage, high speed switching applications where power RDS(on) = 15 m
efficiency is important.
• Zener Protected Gates Provide Electrostatic Discharge Protection N–Channel
ORDERING INFORMATION
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Switching behavior is most easily modeled and predicted The capacitance (Ciss) is read from the capacitance curve at
by recognizing that the power MOSFET is charge a voltage corresponding to the off–state condition when
controlled. The lengths of various switching intervals (∆t) calculating td(on) and is read at a voltage corresponding to the
are determined by how fast the FET input capacitance can on–state when calculating td(off).
be charged by current from the generator. At high switching speeds, parasitic circuit elements
The published capacitance data is difficult to use for complicate the analysis. The inductance of the MOSFET
calculating rise and fall because drain–gate capacitance source lead, inside the package and in the circuit wiring
varies greatly with applied voltage. Accordingly, gate which is common to both the drain and gate current paths,
charge data is used. In most cases, a satisfactory estimate of produces a voltage at the source which reduces the gate drive
average input current (IG(AV)) can be made from a current. The voltage is determined by Ldi/dt, but since di/dt
rudimentary analysis of the drive circuit so that is a function of drain current, the mathematical solution is
t = Q/IG(AV) complex. The MOSFET output capacitance also
complicates the mathematics. And finally, MOSFETs have
During the rise and fall time interval when switching a finite internal gate resistance which effectively adds to the
resistive load, VGS remains virtually constant at a level resistance of the driving source, but the internal resistance
known as the plateau voltage, VSGP. Therefore, rise and fall is difficult to measure and, consequently, is not specified.
times may be approximated by the following: The resistive switching time variation versus gate
tr = Q2 x RG/(VGG – VGSP) resistance (Figure 9) shows how typical switching
tf = Q2 x RG/VGSP performance is affected by the parasitic circuit elements. If
where the parasitics were not present, the slope of the curves would
maintain a value of unity regardless of the switching speed.
VGG = the gate drive voltage, which varies from zero to VGG
The circuit used to obtain the data is constructed to minimize
RG = the gate drive resistance
common inductance in the drain and gate circuit loops and
and Q2 and VGSP are read from the gate charge curve.
is believed readily achievable with board mounted
During the turn–on and turn–off delay times, gate current is components. Most power electronic loads are inductive; the
not constant. The simplest calculation uses appropriate data in the figure is taken with a resistive load, which
values from the capacitance curves in a standard equation for approximates an optimally snubbed inductive load. Power
voltage change in an RC network. The equations are: MOSFETs may be safely operated into an inductive load;
td(on) = RG Ciss In [VGG/(VGG – VGSP)] however, snubbing reduces switching losses.
td(off) = RG Ciss In (VGG/VGSP)
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are very important in systems using it as a freewheeling or controlled by the device clearing the stored charge.
commutating diode. Of particular interest are the reverse However, the positive di/dt during tb is an uncontrollable
recovery characteristics which play a major role in diode characteristic and is usually the culprit that induces
determining switching losses, radiated noise, EMI and RFI. current ringing. Therefore, when comparing diodes, the
System switching losses are largely due to the nature of ratio of tb/ta serves as a good indicator of recovery
the body diode itself. The body diode is a minority carrier abruptness and thus gives a comparative estimate of
device, therefore it has a finite reverse recovery time, trr, due probable noise generated. A ratio of 1 is considered ideal and
to the storage of minority carrier charge, QRR, as shown in values less than 0.5 are considered snappy.
the typical reverse recovery wave form of Figure 11. It is this Compared to ON Semiconductor standard cell density
stored charge that, when cleared from the diode, passes low voltage MOSFETs, high cell density MOSFET diodes
through a potential and defines an energy loss. Obviously, are faster (shorter trr), have less stored charge and a softer
repeatedly forcing the diode through reverse recovery reverse recovery characteristic. The softness advantage of
further increases switching losses. Therefore, one would the high cell density diode means they can be forced through
like a diode with short trr and low QRR specifications to reverse recovery at a higher di/dt than a standard cell
minimize these losses. MOSFET diode without increasing the current ringing or the
The abruptness of diode reverse recovery effects the noise generated. In addition, power dissipation incurred
amount of radiated noise, voltage spikes, and current from switching the diode will be less due to the shorter
ringing. The mechanisms at work are finite irremovable recovery time and lower switching losses.
circuit parasitic inductances and capacitances acted upon by
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The Forward Biased Safe Operating Area curves the total power averaged over a complete switching cycle
define the maximum simultaneous drain–to–source must not exceed (T J(MAX) – T C )/(RθJC ).
voltage and drain current that a transistor can handle A power MOSFET designated E–FET can be safely
safely when it is forward biased. Curves are based upon used in switching circuits with unclamped inductive
maximum peak junction temperature and a case loads. For reliable operation, the stored energy from
temperature (T C ) of 25°C. Peak repetitive pulsed power circuit inductance dissipated in the transistor while in
limits are determined by using the thermal response data avalanche must be less than the rated limit and must be
in conjunction with the procedures discussed in AN569, adjusted for operating conditions differing from those
“Transient Thermal Resistance – General Data and Its specified. Although industry practice is to rate in terms
Use.” of energy, avalanche energy capability is not a constant.
Switching between the off–state and the on–state may The energy rating decreases non–linearly with an
traverse any load line provided neither rated peak current increase of peak current in avalanche and peak junction
(I DM ) nor rated voltage (V DSS ) is exceeded, and that the temperature.
transition time (t r, tf ) does not exceed 10 µs. In addition
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SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • The soldering temperature and time shall not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within • When shifting from preheating to soldering, the
a short time could result in device failure. Therefore, the maximum temperature gradient shall be 5°C or less.
following items should always be observed in order to • After soldering has been completed, the device should
minimize the thermal stress to which the devices are be allowed to cool naturally for at least three minutes.
subjected. Gradual cooling should be used as the use of forced
• Always preheat the device. cooling will increase the temperature gradient and
• The delta temperature between the preheat and result in latent failure due to mechanical stress.
soldering should be 100°C or less.* • Mechanical stress or shock should not be applied
• When preheating and soldering, the temperature of the during cooling.
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When * Soldering a device without preheating can cause
using infrared heating with the reflow soldering excessive thermal shock and stress which can result in
method, the difference shall be a maximum of 10°C. damage to the device.
http://onsemi.com
669
MMSF10N02Z
150°C
SOLDER IS LIQUID FOR
40 TO 80 SECONDS
100°C 140°C (DEPENDING ON
MASS OF ASSEMBLY)
100°C
http://onsemi.com
670
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Preferred Device
#$%& '(
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N–Channel SO–8
EZFETst are an advanced series of Power MOSFETs contain http://onsemi.com
monolithic back–to–back zener diodes. These zener diodes provide
protection against ESD and unexpected transients. These miniature 10 AMPERES
surface mount MOSFETs feature ultra low RDS(on) and true logic level
performance. They are capable of withstanding high energy in the 30 VOLTS
avalanche and commutation modes and the drain–to–source diode has RDS(on) = 13 mW
a very low reverse recovery time. EZFET devices are designed for use
in low voltage, high speed switching applications where power N–Channel
efficiency is important. Typical applications are dc–dc converters, and
power management in portable and battery powered products such as
computers, printers, cellular and cordless phones. They can also be
used for low voltage motor controls in mass storage products such as
disk drives and tape drives.
• Zener Protected Gates Provide Electrostatic Discharge Protection
• Designed to Withstand 200 V Machine Model and 2000 V Human
Body Model
• Ultra Low RDS(on) Provides Higher Efficiency and Extends Battery
Life MARKING
• Logic Level Gate Drive – Can Be Driven by Logic ICs DIAGRAM
• Miniature SO–8 Surface Mount Package – Saves Board Space
• Diode Is Characterized for Use In Bridge Circuits SO–8
• Diode Exhibits High Speed, With Soft Recovery 8 CASE 751
10N03Z
LYWW
• IDSS Specified at Elevated Temperature STYLE 12
L = Location Code
Y = Year
WW = Work Week
PIN ASSIGNMENT
Source 1 8 Drain
Source 2 7 Drain
Source 3 6 Drain
Gate 4 5 Drain
Top View
ORDERING INFORMATION
This document contains information on a new product. Specifications and information Preferred devices are recommended choices for future use
herein are subject to change without notice. and best overall value.
THERMAL RESISTANCE
Parameter Symbol Typ Max Unit
Junction–to–Ambient (Note 1.) RqJA – 50 °C/W
Junction–to–Ambient (Note 2.) – 80
1. When mounted on 1″ square FR4 or G–10 board (VGS = 10 V, @ 10 seconds).
2. When mounted on minimum recommended FR4 or G–10 board (VGS = 10 V, @ Steady State).
3. Repetitive rating; pulse width limited by maximum junction temperature.
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Switching behavior is most easily modeled and predicted The capacitance (Ciss) is read from the capacitance curve at
by recognizing that the power MOSFET is charge a voltage corresponding to the off–state condition when
controlled. The lengths of various switching intervals (∆t) calculating td(on) and is read at a voltage corresponding to the
are determined by how fast the FET input capacitance can on–state when calculating td(off).
be charged by current from the generator. At high switching speeds, parasitic circuit elements
The published capacitance data is difficult to use for complicate the analysis. The inductance of the MOSFET
calculating rise and fall because drain–gate capacitance source lead, inside the package and in the circuit wiring
varies greatly with applied voltage. Accordingly, gate which is common to both the drain and gate current paths,
charge data is used. In most cases, a satisfactory estimate of produces a voltage at the source which reduces the gate drive
average input current (IG(AV)) can be made from a current. The voltage is determined by Ldi/dt, but since di/dt
rudimentary analysis of the drive circuit so that is a function of drain current, the mathematical solution is
t = Q/IG(AV) complex. The MOSFET output capacitance also
complicates the mathematics. And finally, MOSFETs have
During the rise and fall time interval when switching a finite internal gate resistance which effectively adds to the
resistive load, VGS remains virtually constant at a level resistance of the driving source, but the internal resistance
known as the plateau voltage, VSGP. Therefore, rise and fall is difficult to measure and, consequently, is not specified.
times may be approximated by the following: The resistive switching time variation versus gate
tr = Q2 x RG/(VGG – VGSP) resistance (Figure 9) shows how typical switching
tf = Q2 x RG/VGSP performance is affected by the parasitic circuit elements. If
where the parasitics were not present, the slope of the curves would
maintain a value of unity regardless of the switching speed.
VGG = the gate drive voltage, which varies from zero to VGG
The circuit used to obtain the data is constructed to minimize
RG = the gate drive resistance
common inductance in the drain and gate circuit loops and
and Q2 and VGSP are read from the gate charge curve.
is believed readily achievable with board mounted
During the turn–on and turn–off delay times, gate current is components. Most power electronic loads are inductive; the
not constant. The simplest calculation uses appropriate data in the figure is taken with a resistive load, which
values from the capacitance curves in a standard equation for approximates an optimally snubbed inductive load. Power
voltage change in an RC network. The equations are: MOSFETs may be safely operated into an inductive load;
td(on) = RG Ciss In [VGG/(VGG – VGSP)] however, snubbing reduces switching losses.
td(off) = RG Ciss In (VGG/VGSP)
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The switching characteristics of a MOSFET body diode high di/dts. The diode’s negative di/dt during ta is directly
are very important in systems using it as a freewheeling or controlled by the device clearing the stored charge.
commutating diode. Of particular interest are the reverse However, the positive di/dt during tb is an uncontrollable
recovery characteristics which play a major role in diode characteristic and is usually the culprit that induces
determining switching losses, radiated noise, EMI and RFI. current ringing. Therefore, when comparing diodes, the
System switching losses are largely due to the nature of ratio of tb/ta serves as a good indicator of recovery
the body diode itself. The body diode is a minority carrier abruptness and thus gives a comparative estimate of
device, therefore it has a finite reverse recovery time, trr, due probable noise generated. A ratio of 1 is considered ideal and
to the storage of minority carrier charge, QRR, as shown in values less than 0.5 are considered snappy.
the typical reverse recovery wave form of Figure 15. It is this Compared to ON Semiconductor standard cell density
stored charge that, when cleared from the diode, passes low voltage MOSFETs, high cell density MOSFET diodes
through a potential and defines an energy loss. Obviously, are faster (shorter trr), have less stored charge and a softer
repeatedly forcing the diode through reverse recovery reverse recovery characteristic. The softness advantage of
further increases switching losses. Therefore, one would the high cell density diode means they can be forced through
like a diode with short trr and low QRR specifications to reverse recovery at a higher di/dt than a standard cell
minimize these losses. MOSFET diode without increasing the current ringing or the
The abruptness of diode reverse recovery effects the noise generated. In addition, power dissipation incurred
amount of radiated noise, voltage spikes, and current from switching the diode will be less due to the shorter
ringing. The mechanisms at work are finite irremovable recovery time and lower switching losses.
circuit parasitic inductances and capacitances acted upon by
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The Forward Biased Safe Operating Area curves define total power averaged over a complete switching cycle must
the maximum simultaneous drain–to–source voltage and not exceed (TJ(MAX) – TC)/(RθJC).
drain current that a transistor can handle safely when it is A power MOSFET designated E–FET can be safely used
forward biased. Curves are based upon maximum peak in switching circuits with unclamped inductive loads. For
junction temperature and a case temperature (TC) of 25°C. reliable operation, the stored energy from circuit inductance
Peak repetitive pulsed power limits are determined by using dissipated in the transistor while in avalanche must be less
the thermal response data in conjunction with the procedures than the rated limit and must be adjusted for operating
discussed in AN569, “Transient Thermal Resistance – conditions differing from those specified. Although industry
General Data and Its Use.” practice is to rate in terms of energy, avalanche energy
Switching between the off–state and the on–state may capability is not a constant. The energy rating decreases
traverse any load line provided neither rated peak current non–linearly with an increase of peak current in avalanche
(IDM) nor rated voltage (VDSS) is exceeded, and that the and peak junction temperature.
transition time (tr, tf) does not exceed 10 µs. In addition the
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SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • The soldering temperature and time shall not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within • When shifting from preheating to soldering, the
a short time could result in device failure. Therefore, the maximum temperature gradient shall be 5°C or less.
following items should always be observed in order to • After soldering has been completed, the device should
minimize the thermal stress to which the devices are be allowed to cool naturally for at least three minutes.
subjected. Gradual cooling should be used as the use of forced
• Always preheat the device. cooling will increase the temperature gradient and
• The delta temperature between the preheat and result in latent failure due to mechanical stress.
soldering should be 100°C or less.* • Mechanical stress or shock should not be applied
• When preheating and soldering, the temperature of the during cooling.
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When * Soldering a device without preheating can cause
using infrared heating with the reflow soldering excessive thermal shock and stress which can result in
method, the difference shall be a maximum of 10°C. damage to the device.
http://onsemi.com
679
MMSF10N03Z
150°C
SOLDER IS LIQUID FOR
40 TO 80 SECONDS
100°C 140°C (DEPENDING ON
MASS OF ASSEMBLY)
100°C
http://onsemi.com
680
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Preferred Device
#$%& '(
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N–Channel SO–8
These miniature surface mount MOSFETs feature ultra low RDS(on)
and true logic level performance. They are capable of withstanding high http://onsemi.com
energy in the avalanche and commutation modes and the drain–to–source
diode has a very low reverse recovery time. MiniMOSt devices are
designed for use in low voltage, high speed switching applications where
7 AMPERES
power efficiency is important. Typical applications are dc–dc converters, 30 VOLTS
and power management in portable and battery powered products such as RDS(on) = 30 mW
computers, printers, cellular and cordless phones. They can also be used
for low voltage motor controls in mass storage products such as disk
drives and tape drives. The avalanche energy is specified to eliminate the N–Channel
guesswork in designs where inductive loads are switched and offer
additional safety margin against unexpected voltage transients.
• Low RDS(on) Provides Higher Efficiency and Extends Battery Life
• High Speed Switching Provides High Efficiency for DC/DC
Converter
• Miniature SO–8 Surface Mount Package – Saves Board Space
• Diode Exhibits High Speed, With Soft Recovery
MARKING
MAXIMUM RATINGS (TJ = 25°C unless otherwise noted)
DIAGRAM
Parameter Symbol Max Unit
Drain–to–Source Voltage VDSS 30 Vdc
Drain–to–Gate Voltage (RGS = 1.0 MΩ) VDGR 30 Vdc SO–8
S1308
Gate–to–Source Voltage – Continuous VGS ± 20 Vdc 8 CASE 751
LYWW
STYLE 12
Continuous Drain Current @ TA = 25°C ID 7.0 Adc
(Note 1.) 1
Pulsed Drain Current (Note 2.) IDM 50
Total Power Dissipation @ TA = 25°C PD 2.5 W L = Location Code
(Note 1.) Y = Year
WW = Work Week
Operating and Storage Temperature Range TJ, Tstg – 55 to °C
150
PIN ASSIGNMENT
THERMAL RESISTANCE
Source 1 8 Drain
Junction–to–Ambient (Note 1.) RθJA 50 °C/W
Source 2 7 Drain
1. When mounted on 1″ square FR–4 or G–10 board
(VGS = 10 V, @ 10 Seconds) Source 3 6 Drain
2. Repetitive rating; pulse width limited by maximum junction temperature. Gate 4 5 Drain
Top View
ORDERING INFORMATION
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Switching behavior is most easily modeled and predicted The capacitance (Ciss) is read from the capacitance curve at
by recognizing that the power MOSFET is charge a voltage corresponding to the off–state condition when
controlled. The lengths of various switching intervals (∆t) calculating td(on) and is read at a voltage corresponding to the
are determined by how fast the FET input capacitance can on–state when calculating td(off).
be charged by current from the generator. At high switching speeds, parasitic circuit elements
The published capacitance data is difficult to use for complicate the analysis. The inductance of the MOSFET
calculating rise and fall because drain–gate capacitance source lead, inside the package and in the circuit wiring
varies greatly with applied voltage. Accordingly, gate which is common to both the drain and gate current paths,
charge data is used. In most cases, a satisfactory estimate of produces a voltage at the source which reduces the gate drive
average input current (IG(AV)) can be made from a current. The voltage is determined by Ldi/dt, but since di/dt
rudimentary analysis of the drive circuit so that is a function of drain current, the mathematical solution is
t = Q/IG(AV) complex. The MOSFET output capacitance also
complicates the mathematics. And finally, MOSFETs have
During the rise and fall time interval when switching a finite internal gate resistance which effectively adds to the
resistive load, VGS remains virtually constant at a level resistance of the driving source, but the internal resistance
known as the plateau voltage, VSGP. Therefore, rise and fall is difficult to measure and, consequently, is not specified.
times may be approximated by the following: The resistive switching time variation versus gate
tr = Q2 x RG/(VGG – VGSP) resistance (Figure 8) shows how typical switching
tf = Q2 x RG/VGSP performance is affected by the parasitic circuit elements. If
where the parasitics were not present, the slope of the curves would
maintain a value of unity regardless of the switching speed.
VGG = the gate drive voltage, which varies from zero to VGG
The circuit used to obtain the data is constructed to minimize
RG = the gate drive resistance
common inductance in the drain and gate circuit loops and
and Q2 and VGSP are read from the gate charge curve.
is believed readily achievable with board mounted
During the turn–on and turn–off delay times, gate current is components. Most power electronic loads are inductive; the
not constant. The simplest calculation uses appropriate data in the figure is taken with a resistive load, which
values from the capacitance curves in a standard equation for approximates an optimally snubbed inductive load. Power
voltage change in an RC network. The equations are: MOSFETs may be safely operated into an inductive load;
td(on) = RG Ciss In [VGG/(VGG – VGSP)] however, snubbing reduces switching losses.
td(off) = RG Ciss In (VGG/VGSP)
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The switching characteristics of a MOSFET body diode high di/dts. The diode’s negative di/dt during ta is directly
are very important in systems using it as a freewheeling or controlled by the device clearing the stored charge.
commutating diode. Of particular interest are the reverse However, the positive di/dt during tb is an uncontrollable
recovery characteristics which play a major role in diode characteristic and is usually the culprit that induces
determining switching losses, radiated noise, EMI and RFI. current ringing. Therefore, when comparing diodes, the
System switching losses are largely due to the nature of ratio of tb/ta serves as a good indicator of recovery
the body diode itself. The body diode is a minority carrier abruptness and thus gives a comparative estimate of
device, therefore it has a finite reverse recovery time, trr, due probable noise generated. A ratio of 1 is considered ideal and
to the storage of minority carrier charge, QRR, as shown in values less than 0.5 are considered snappy.
the typical reverse recovery wave form of Figure 10. It is this Compared to ON Semiconductor standard cell density
stored charge that, when cleared from the diode, passes low voltage MOSFETs, high cell density MOSFET diodes
through a potential and defines an energy loss. Obviously, are faster (shorter trr), have less stored charge and a softer
repeatedly forcing the diode through reverse recovery reverse recovery characteristic. The softness advantage of
further increases switching losses. Therefore, one would the high cell density diode means they can be forced through
like a diode with short trr and low QRR specifications to reverse recovery at a higher di/dt than a standard cell
minimize these losses. MOSFET diode without increasing the current ringing or the
The abruptness of diode reverse recovery effects the noise generated. In addition, power dissipation incurred
amount of radiated noise, voltage spikes, and current from switching the diode will be less due to the shorter
ringing. The mechanisms at work are finite irremovable recovery time and lower switching losses.
circuit parasitic inductances and capacitances acted upon by
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The Forward Biased Safe Operating Area curves define total power averaged over a complete switching cycle must
the maximum simultaneous drain–to–source voltage and not exceed (TJ(MAX) – TC)/(RθJC).
drain current that a transistor can handle safely when it is A power MOSFET designated E–FET can be safely used
forward biased. Curves are based upon maximum peak in switching circuits with unclamped inductive loads. For
junction temperature and a case temperature (TC) of 25°C. reliable operation, the stored energy from circuit inductance
Peak repetitive pulsed power limits are determined by using dissipated in the transistor while in avalanche must be less
the thermal response data in conjunction with the procedures than the rated limit and must be adjusted for operating
discussed in AN569, “Transient Thermal Resistance – conditions differing from those specified. Although industry
General Data and Its Use.” practice is to rate in terms of energy, avalanche energy
Switching between the off–state and the on–state may capability is not a constant. The energy rating decreases
traverse any load line provided neither rated peak current non–linearly with an increase of peak current in avalanche
(IDM) nor rated voltage (VDSS) is exceeded, and that the and peak junction temperature.
transition time (tr, tf) does not exceed 10 µs. In addition the
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SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • The soldering temperature and time shall not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within • When shifting from preheating to soldering, the
a short time could result in device failure. Therefore, the maximum temperature gradient shall be 5°C or less.
following items should always be observed in order to • After soldering has been completed, the device should
minimize the thermal stress to which the devices are be allowed to cool naturally for at least three minutes.
subjected. Gradual cooling should be used as the use of forced
• Always preheat the device. cooling will increase the temperature gradient and
• The delta temperature between the preheat and result in latent failure due to mechanical stress.
soldering should be 100°C or less.* • Mechanical stress or shock should not be applied
• When preheating and soldering, the temperature of the during cooling.
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When * Soldering a device without preheating can cause
using infrared heating with the reflow soldering excessive thermal shock and stress which can result in
method, the difference shall be a maximum of 10°C. damage to the device.
http://onsemi.com
687
MMSF1308
150°C
SOLDER IS LIQUID FOR
40 TO 80 SECONDS
100°C 140°C (DEPENDING ON
MASS OF ASSEMBLY)
100°C
http://onsemi.com
688
(!
Preferred Device
#$%& '(
!
N–Channel SO–8
These miniature surface mount MOSFETs feature ultra low RDS(on)
and true logic level performance. They are capable of withstanding high http://onsemi.com
energy in the avalanche and commutation modes and the drain–to–source
diode has a very low reverse recovery time. MiniMOSt devices are
designed for use in low voltage, high speed switching applications where
10 AMPERES
power efficiency is important. Typical applications are dc–dc converters, 30 VOLTS
and power management in portable and battery powered products such as RDS(on) = 15 mW
computers, printers, cellular and cordless phones. They can also be used
for low voltage motor controls in mass storage products such as disk
drives and tape drives. The avalanche energy is specified to eliminate the N–Channel
guesswork in designs where inductive loads are switched and offer
additional safety margin against unexpected voltage transients.
• Low RDS(on) Provides Higher Efficiency and Extends Battery Life
• High Speed Switching Provides High Efficiency for DC/DC
Converter
• Miniature SO–8 Surface Mount Package – Saves Board Space
• Diode Exhibits High Speed, With Soft Recovery
MARKING
MAXIMUM RATINGS (TJ = 25°C unless otherwise noted)
DIAGRAM
Parameter Symbol Max Unit
Drain–to–Source Voltage VDSS 30 Vdc
Drain–to–Gate Voltage (RGS = 1.0 MΩ) VDGR 30 Vdc SO–8
S1310
Gate–to–Source Voltage – Continuous VGS ± 20 Vdc 8 CASE 751
LYWW
STYLE 12
Continuous Drain Current @ TA = 25°C ID 10 Adc
(Note 1.) 1
Pulsed Drain Current (Note 2.) IDM 50
Total Power Dissipation @ TA = 25°C PD 2.5 W L = Location Code
(Note 1.) Y = Year
WW = Work Week
Operating and Storage Temperature Range TJ, Tstg – 55 to °C
150
PIN ASSIGNMENT
THERMAL RESISTANCE
Source 1 8 Drain
Junction–to–Ambient (Note 1.) RθJA 50 °C/W
1. When mounted on 1″ square FR–4 or G–10 board Source 2 7 Drain
(VGS = 10 V, @ 10 Seconds) Source 3 6 Drain
2. Repetitive rating; pulse width limited by maximum junction temperature. Gate 4 5 Drain
Top View
ORDERING INFORMATION
http://onsemi.com
690
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Switching behavior is most easily modeled and predicted The capacitance (Ciss) is read from the capacitance curve at
by recognizing that the power MOSFET is charge a voltage corresponding to the off–state condition when
controlled. The lengths of various switching intervals (∆t) calculating td(on) and is read at a voltage corresponding to the
are determined by how fast the FET input capacitance can on–state when calculating td(off).
be charged by current from the generator. At high switching speeds, parasitic circuit elements
The published capacitance data is difficult to use for complicate the analysis. The inductance of the MOSFET
calculating rise and fall because drain–gate capacitance source lead, inside the package and in the circuit wiring
varies greatly with applied voltage. Accordingly, gate which is common to both the drain and gate current paths,
charge data is used. In most cases, a satisfactory estimate of produces a voltage at the source which reduces the gate drive
average input current (IG(AV)) can be made from a current. The voltage is determined by Ldi/dt, but since di/dt
rudimentary analysis of the drive circuit so that is a function of drain current, the mathematical solution is
t = Q/IG(AV) complex. The MOSFET output capacitance also
complicates the mathematics. And finally, MOSFETs have
During the rise and fall time interval when switching a finite internal gate resistance which effectively adds to the
resistive load, VGS remains virtually constant at a level resistance of the driving source, but the internal resistance
known as the plateau voltage, VSGP. Therefore, rise and fall is difficult to measure and, consequently, is not specified.
times may be approximated by the following: The resistive switching time variation versus gate resistance
tr = Q2 x RG/(VGG – VGSP) (Figure 8) shows how typical switching performance is
tf = Q2 x RG/VGSP affected by the parasitic circuit elements. If the parasitics
where were not present, the slope of the curves would maintain a
value of unity regardless of the switching speed. The circuit
VGG = the gate drive voltage, which varies from zero to VGG
used to obtain the data is constructed to minimize common
RG = the gate drive resistance
inductance in the drain and gate circuit loops and is believed
and Q2 and VGSP are read from the gate charge curve.
readily achievable with board mounted components. Most
During the turn–on and turn–off delay times, gate current is power electronic loads are inductive; the data in the figure
not constant. The simplest calculation uses appropriate is taken with a resistive load, which approximates an
values from the capacitance curves in a standard equation for optimally snubbed inductive load. Power MOSFETs may be
voltage change in an RC network. The equations are: safely operated into an inductive load; however, snubbing
td(on) = RG Ciss In [VGG/(VGG – VGSP)] reduces switching losses.
td(off) = RG Ciss In (VGG/VGSP)
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The switching characteristics of a MOSFET body diode high di/dts. The diode’s negative di/dt during ta is directly
are very important in systems using it as a freewheeling or controlled by the device clearing the stored charge.
commutating diode. Of particular interest are the reverse However, the positive di/dt during tb is an uncontrollable
recovery characteristics which play a major role in diode characteristic and is usually the culprit that induces
determining switching losses, radiated noise, EMI and RFI. current ringing. Therefore, when comparing diodes, the
System switching losses are largely due to the nature of ratio of tb/ta serves as a good indicator of recovery
the body diode itself. The body diode is a minority carrier abruptness and thus gives a comparative estimate of
device, therefore it has a finite reverse recovery time, trr, due probable noise generated. A ratio of 1 is considered ideal and
to the storage of minority carrier charge, QRR, as shown in values less than 0.5 are considered snappy.
the typical reverse recovery wave form of Figure 10. It is this Compared to ON Semiconductor standard cell density
stored charge that, when cleared from the diode, passes low voltage MOSFETs, high cell density MOSFET diodes
through a potential and defines an energy loss. Obviously, are faster (shorter trr), have less stored charge and a softer
repeatedly forcing the diode through reverse recovery reverse recovery characteristic. The softness advantage of
further increases switching losses. Therefore, one would the high cell density diode means they can be forced through
like a diode with short trr and low QRR specifications to reverse recovery at a higher di/dt than a standard cell
minimize these losses. MOSFET diode without increasing the current ringing or the
The abruptness of diode reverse recovery effects the noise generated. In addition, power dissipation incurred
amount of radiated noise, voltage spikes, and current from switching the diode will be less due to the shorter
ringing. The mechanisms at work are finite irremovable recovery time and lower switching losses.
circuit parasitic inductances and capacitances acted upon by
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http://onsemi.com
693
MMSF1310
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The Forward Biased Safe Operating Area curves define total power averaged over a complete switching cycle must
the maximum simultaneous drain–to–source voltage and not exceed (TJ(MAX) – TC)/(RθJC).
drain current that a transistor can handle safely when it is A power MOSFET designated E–FET can be safely used
forward biased. Curves are based upon maximum peak in switching circuits with unclamped inductive loads. For
junction temperature and a case temperature (TC) of 25°C. reliable operation, the stored energy from circuit inductance
Peak repetitive pulsed power limits are determined by using dissipated in the transistor while in avalanche must be less
the thermal response data in conjunction with the procedures than the rated limit and must be adjusted for operating
discussed in AN569, “Transient Thermal Resistance – conditions differing from those specified. Although industry
General Data and Its Use.” practice is to rate in terms of energy, avalanche energy
Switching between the off–state and the on–state may capability is not a constant. The energy rating decreases
traverse any load line provided neither rated peak current non–linearly with an increase of peak current in avalanche
(IDM) nor rated voltage (VDSS) is exceeded, and that the and peak junction temperature.
transition time (tr, tf) does not exceed 10 µs. In addition the
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http://onsemi.com
694
MMSF1310
#:$ $$
: 6
#6 $
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inches
mm
SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • The soldering temperature and time shall not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within • When shifting from preheating to soldering, the
a short time could result in device failure. Therefore, the maximum temperature gradient shall be 5°C or less.
following items should always be observed in order to • After soldering has been completed, the device should
minimize the thermal stress to which the devices are be allowed to cool naturally for at least three minutes.
subjected. Gradual cooling should be used as the use of forced
• Always preheat the device. cooling will increase the temperature gradient and
• The delta temperature between the preheat and result in latent failure due to mechanical stress.
soldering should be 100°C or less.* • Mechanical stress or shock should not be applied
• When preheating and soldering, the temperature of the during cooling.
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When * Soldering a device without preheating can cause
using infrared heating with the reflow soldering excessive thermal shock and stress which can result in
method, the difference shall be a maximum of 10°C. damage to the device.
http://onsemi.com
695
MMSF1310
150°C
SOLDER IS LIQUID FOR
40 TO 80 SECONDS
100°C 140°C (DEPENDING ON
MASS OF ASSEMBLY)
100°C
http://onsemi.com
696
( #
Preferred Device
#$%& '(
P–Channel SO–8
These miniature surface mount MOSFETs feature ultra low RDS(on)
and true logic level performance. They are capable of withstanding
high energy in the avalanche and commutation modes and the http://onsemi.com
drain–to–source diode has a low reverse recovery time. MiniMOSt
devices are designed for use in low voltage, high speed switching 2 AMPERES
applications where power efficiency is important. Typical applications 20 VOLTS
are dc–dc converters, and power management in portable and battery
powered products such as computers, printers, cellular and cordless RDS(on) = 250 m
phones. They can also be used for low voltage motor controls in mass
storage products such as disk drives and tape drives. The avalanche P–Channel
energy is specified to eliminate the guesswork in designs where
inductive loads are switched and offer additional safety margin against
unexpected voltage transients.
• Ultra Low RDS(on) Provides Higher Efficiency and Extends Battery
Life
http://onsemi.com
698
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Switching behavior is most easily modeled and predicted During the turn–on and turn–off delay times, gate current is
by recognizing that the power MOSFET is charge not constant. The simplest calculation uses appropriate
controlled. The lengths of various switching intervals (∆t) values from the capacitance curves in a standard equation for
are determined by how fast the FET input capacitance can voltage change in an RC network. The equations are:
be charged by current from the generator. td(on) = RG Ciss In [VGG/(VGG – VGSP)]
The published capacitance data is difficult to use for td(off) = RG Ciss In (VGG/VGSP)
calculating rise and fall because drain–gate capacitance
varies greatly with applied voltage. Accordingly, gate The capacitance (Ciss) is read from the capacitance curve at
charge data is used. In most cases, a satisfactory estimate of a voltage corresponding to the off–state condition when
average input current (IG(AV)) can be made from a calculating td(on) and is read at a voltage corresponding to the
rudimentary analysis of the drive circuit so that on–state when calculating td(off).
At high switching speeds, parasitic circuit elements
t = Q/IG(AV) complicate the analysis. The inductance of the MOSFET
During the rise and fall time interval when switching a source lead, inside the package and in the circuit wiring
resistive load, VGS remains virtually constant at a level which is common to both the drain and gate current paths,
known as the plateau voltage, VSGP. Therefore, rise and fall produces a voltage at the source which reduces the gate drive
times may be approximated by the following: current. The voltage is determined by Ldi/dt, but since di/dt
tr = Q2 x RG/(VGG – VGSP) is a function of drain current, the mathematical solution is
tf = Q2 x RG/VGSP complex. The MOSFET output capacitance also
complicates the mathematics. And finally, MOSFETs have
where finite internal gate resistance which effectively adds to the
VGG = the gate drive voltage, which varies from zero to VGG resistance of the driving source, but the internal resistance
RG = the gate drive resistance is difficult to measure and, consequently, is not specified.
and Q2 and VGSP are read from the gate charge curve.
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Figure 7. Capacitance Variation Drain–to–Source Voltage versus Total Charge
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Although many E–FETs can withstand the stress of custom. The energy rating must be derated for temperature
drain–to–source avalanche at currents up to rated pulsed as shown in the accompanying graph (Figure 13). Maximum
current (IDM), the energy rating is specified at rated energy at currents below rated continuous ID can safely be
continuous current (ID), in accordance with industry assumed to equal the values indicated.
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SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • The soldering temperature and time shall not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within • When shifting from preheating to soldering, the
a short time could result in device failure. Therefore, the maximum temperature gradient shall be 5°C or less.
following items should always be observed in order to • After soldering has been completed, the device should
minimize the thermal stress to which the devices are be allowed to cool naturally for at least three minutes.
subjected. Gradual cooling should be used as the use of forced
• Always preheat the device. cooling will increase the temperature gradient and
• The delta temperature between the preheat and result in latent failure due to mechanical stress.
soldering should be 100°C or less.* • Mechanical stress or shock should not be applied
• When preheating and soldering, the temperature of the during cooling.
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When * Soldering a device without preheating can cause
using infrared heating with the reflow soldering excessive thermal shock and stress which can result in
method, the difference shall be a maximum of 10°C. damage to the device.
http://onsemi.com
703
MMSF2P02E
150°C
SOLDER IS LIQUID FOR
40 TO 80 SECONDS
100°C 140°C (DEPENDING ON
MASS OF ASSEMBLY)
100°C
http://onsemi.com
704
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N–Channel SO–8
These Power MOSFETs are capable of withstanding high energy in the http://onsemi.com
avalanche and commutation modes and the drain–to–source diode has a
very low reverse recovery time. WaveFETt devices are designed for use 11.5 AMPERES
in low voltage, high speed switching applications where power efficiency
is important. Typical applications are dc–dc converters, and power 30 VOLTS
management in portable and battery powered products such as computers, RDS(on) = 12.5 mW
printers, cellular and cordless phones. They can also be used for low
voltage motor controls in mass storage products such as disk drives and N–Channel
tape drives. The avalanche energy is specified to eliminate the guesswork
in designs where inductive loads are switched and offer additional safety
margin against unexpected voltage transients.
• Characterized Over a Wide Range of Power Ratings
• Ultralow RDS(on) Provides Higher Efficiency and Extends Battery
ORDERING INFORMATION
http://onsemi.com
706
MMSF3300
OFF CHARACTERISTICS
Drain–to–Source Breakdown Voltage V(BR)DSS Vdc
(VGS = 0 Vdc, ID = 250 mAdc) 30 – –
Temperature Coefficient (Positive) – 24 – mV/°C
Zero Gate Voltage Drain Current IDSS µAdc
(VDS = 30 Vdc, VGS = 0 Vdc) – 0.004 1.0
(VDS = 30 Vdc, VGS = 0 Vdc, TJ = 125°C) – 0.5 10
Gate–Body Leakage Current (VGS = ± 20 Vdc, VDS = 0 Vdc) IGSS – – 100 nAdc
DYNAMIC CHARACTERISTICS
Input Capacitance Ciss – 1700 – pF
Output Capacitance (VDS = 24 Vd
Vdc, VGS = 0 Vd
Vdc,
Coss – 600 –
f = 1.0 MHz)
Transfer Capacitance Crss – 200 –
http://onsemi.com
707
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by recognizing that the power MOSFET is charge a voltage corresponding to the off–state condition when
controlled. The lengths of various switching intervals (∆t) calculating td(on) and is read at a voltage corresponding to the
are determined by how fast the FET input capacitance can on–state when calculating td(off).
be charged by current from the generator. At high switching speeds, parasitic circuit elements
The published capacitance data is difficult to use for complicate the analysis. The inductance of the MOSFET
calculating rise and fall because drain–gate capacitance source lead, inside the package and in the circuit wiring
varies greatly with applied voltage. Accordingly, gate which is common to both the drain and gate current paths,
charge data is used. In most cases, a satisfactory estimate of produces a voltage at the source which reduces the gate drive
average input current (IG(AV)) can be made from a current. The voltage is determined by Ldi/dt, but since di/dt
rudimentary analysis of the drive circuit so that is a function of drain current, the mathematical solution is
t = Q/IG(AV) complex. The MOSFET output capacitance also
complicates the mathematics. And finally, MOSFETs have
During the rise and fall time interval when switching a finite internal gate resistance which effectively adds to the
resistive load, VGS remains virtually constant at a level resistance of the driving source, but the internal resistance
known as the plateau voltage, VSGP. Therefore, rise and fall is difficult to measure and, consequently, is not specified.
times may be approximated by the following: The resistive switching time variation versus gate
tr = Q2 x RG/(VGG – VGSP) resistance (Figure 9) shows how typical switching
tf = Q2 x RG/VGSP performance is affected by the parasitic circuit elements. If
where the parasitics were not present, the slope of the curves would
maintain a value of unity regardless of the switching speed.
VGG = the gate drive voltage, which varies from zero to VGG
The circuit used to obtain the data is constructed to minimize
RG = the gate drive resistance
common inductance in the drain and gate circuit loops and
and Q2 and VGSP are read from the gate charge curve.
is believed readily achievable with board mounted
During the turn–on and turn–off delay times, gate current is components. Most power electronic loads are inductive; the
not constant. The simplest calculation uses appropriate data in the figure is taken with a resistive load, which
values from the capacitance curves in a standard equation for approximates an optimally snubbed inductive load. Power
voltage change in an RC network. The equations are: MOSFETs may be safely operated into an inductive load;
td(on) = RG Ciss In [VGG/(VGG – VGSP)] however, snubbing reduces switching losses.
td(off) = RG Ciss In (VGG/VGSP)
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very important in systems using it as a freewheeling or controlled by the device clearing the stored charge. However,
commutating diode. Of particular interest are the reverse the positive di/dt during tb is an uncontrollable diode
recovery characteristics which play a major role in characteristic and is usually the culprit that induces current
determining switching losses, radiated noise, EMI and RFI. ringing. Therefore, when comparing diodes, the ratio of tb/ta
System switching losses are largely due to the nature of the serves as a good indicator of recovery abruptness and thus
body diode itself. The body diode is a minority carrier device, gives a comparative estimate of probable noise generated. A
therefore it has a finite reverse recovery time, trr, due to the ratio of 1 is considered ideal and values less than 0.5 are
storage of minority carrier charge, QRR, as shown in the considered snappy.
typical reverse recovery wave form of Figure 16. It is this Compared to ON Semiconductor standard cell density low
stored charge that, when cleared from the diode, passes voltage MOSFETs, high cell density MOSFET diodes are
through a potential and defines an energy loss. Obviously, faster (shorter trr), have less stored charge and a softer reverse
repeatedly forcing the diode through reverse recovery further recovery characteristic. The softness advantage of the high
increases switching losses. Therefore, one would like a diode cell density diode means they can be forced through reverse
with short trr and low QRR specifications to minimize these recovery at a higher di/dt than a standard cell MOSFET diode
losses. without increasing the current ringing or the noise generated.
The abruptness of diode reverse recovery effects the In addition, power dissipation incurred from switching the
amount of radiated noise, voltage spikes, and current ringing. diode will be less due to the shorter recovery time and lower
The mechanisms at work are finite irremovable circuit switching losses.
parasitic inductances and capacitances acted upon by high
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the maximum simultaneous drain–to–source voltage and not exceed (TJ(MAX) – TC)/(RθJC).
drain current that a transistor can handle safely when it is A power MOSFET designated E–FET can be safely used
forward biased. Curves are based upon maximum peak in switching circuits with unclamped inductive loads. For
junction temperature and a case temperature (TC) of 25°C. reliable operation, the stored energy from circuit inductance
Peak repetitive pulsed power limits are determined by using dissipated in the transistor while in avalanche must be less
the thermal response data in conjunction with the procedures than the rated limit and must be adjusted for operating
discussed in AN569, “Transient Thermal Resistance – conditions differing from those specified. Although industry
General Data and Its Use.” practice is to rate in terms of energy, avalanche energy
Switching between the off–state and the on–state may capability is not a constant. The energy rating decreases
traverse any load line provided neither rated peak current non–linearly with an increase of peak current in avalanche
(IDM) nor rated voltage (VDSS) is exceeded, and that the and peak junction temperature.
transition time (tr, tf) does not exceed 10 µs. In addition the
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SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • The soldering temperature and time shall not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within • When shifting from preheating to soldering, the
a short time could result in device failure. Therefore, the maximum temperature gradient shall be 5°C or less.
following items should always be observed in order to • After soldering has been completed, the device should
minimize the thermal stress to which the devices are be allowed to cool naturally for at least three minutes.
subjected. Gradual cooling should be used as the use of forced
• Always preheat the device. cooling will increase the temperature gradient and
• The delta temperature between the preheat and result in latent failure due to mechanical stress.
soldering should be 100°C or less.* • Mechanical stress or shock should not be applied
• When preheating and soldering, the temperature of the during cooling.
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When *Soldering a device without preheating can cause excessive
using infrared heating with the reflow soldering thermal shock and stress which can result in damage to the
method, the difference shall be a maximum of 10°C. device.
http://onsemi.com
713
MMSF3300
150°C
SOLDER IS LIQUID FOR
40 TO 80 SECONDS
100°C 140°C (DEPENDING ON
MASS OF ASSEMBLY)
100°C
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P–Channel SO–8
These miniature surface mount MOSFETs feature ultra low RDS(on)
and true logic level performance. They are capable of withstanding
high energy in the avalanche and commutation modes and the http://onsemi.com
drain–to–source diode has a very low reverse recovery time.
MiniMOSt devices are designed for use in low voltage, high speed 3 AMPERES
switching applications where power efficiency is important. Typical 20 VOLTS
applications are dc–dc converters, and power management in portable
and battery powered products such as computers, printers, cellular and RDS(on) = 75 m
cordless phones. They can also be used for low voltage motor controls
in mass storage products such as disk drives and tape drives. The P–Channel
avalanche energy is specified to eliminate the guesswork in designs
where inductive loads are switched and offer additional safety margin
against unexpected voltage transients.
• Ultra Low RDS(on) Provides Higher Efficiency and Extends Battery
Life
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Switching behavior is most easily modeled and predicted The capacitance (Ciss) is read from the capacitance curve at
by recognizing that the power MOSFET is charge a voltage corresponding to the off–state condition when
controlled. The lengths of various switching intervals (∆t) calculating td(on) and is read at a voltage corresponding to the
are determined by how fast the FET input capacitance can on–state when calculating td(off).
be charged by current from the generator. At high switching speeds, parasitic circuit elements
The published capacitance data is difficult to use for complicate the analysis. The inductance of the MOSFET
calculating rise and fall because drain–gate capacitance source lead, inside the package and in the circuit wiring
varies greatly with applied voltage. Accordingly, gate which is common to both the drain and gate current paths,
charge data is used. In most cases, a satisfactory estimate of produces a voltage at the source which reduces the gate drive
average input current (IG(AV)) can be made from a current. The voltage is determined by Ldi/dt, but since di/dt
rudimentary analysis of the drive circuit so that is a function of drain current, the mathematical solution is
t = Q/IG(AV) complex. The MOSFET output capacitance also
complicates the mathematics. And finally, MOSFETs have
During the rise and fall time interval when switching a finite internal gate resistance which effectively adds to the
resistive load, VGS remains virtually constant at a level resistance of the driving source, but the internal resistance
known as the plateau voltage, VSGP. Therefore, rise and fall is difficult to measure and, consequently, is not specified.
times may be approximated by the following: The resistive switching time variation versus gate
tr = Q2 x RG/(VGG – VGSP) resistance (Figure 9) shows how typical switching
tf = Q2 x RG/VGSP performance is affected by the parasitic circuit elements. If
where the parasitics were not present, the slope of the curves would
maintain a value of unity regardless of the switching speed.
VGG = the gate drive voltage, which varies from zero to VGG
The circuit used to obtain the data is constructed to minimize
RG = the gate drive resistance
common inductance in the drain and gate circuit loops and
and Q2 and VGSP are read from the gate charge curve.
is believed readily achievable with board mounted
During the turn–on and turn–off delay times, gate current is components. Most power electronic loads are inductive; the
not constant. The simplest calculation uses appropriate data in the figure is taken with a resistive load, which
values from the capacitance curves in a standard equation for approximates an optimally snubbed inductive load. Power
voltage change in an RC network. The equations are: MOSFETs may be safely operated into an inductive load;
td(on) = RG Ciss In [VGG/(VGG – VGSP)] however, snubbing reduces switching losses.
td(off) = RG Ciss In (VGG/VGSP)
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The switching characteristics of a MOSFET body diode high di/dts. The diode’s negative di/dt during ta is directly
are very important in systems using it as a freewheeling or controlled by the device clearing the stored charge.
commutating diode. Of particular interest are the reverse However, the positive di/dt during tb is an uncontrollable
recovery characteristics which play a major role in diode characteristic and is usually the culprit that induces
determining switching losses, radiated noise, EMI and RFI. current ringing. Therefore, when comparing diodes, the
System switching losses are largely due to the nature of ratio of tb/ta serves as a good indicator of recovery
the body diode itself. The body diode is a minority carrier abruptness and thus gives a comparative estimate of
device, therefore it has a finite reverse recovery time, trr, due probable noise generated. A ratio of 1 is considered ideal and
to the storage of minority carrier charge, QRR, as shown in values less than 0.5 are considered snappy.
the typical reverse recovery wave form of Figure 15. It is this Compared to ON Semiconductor standard cell density
stored charge that, when cleared from the diode, passes low voltage MOSFETs, high cell density MOSFET diodes
through a potential and defines an energy loss. Obviously, are faster (shorter trr), have less stored charge and a softer
repeatedly forcing the diode through reverse recovery reverse recovery characteristic. The softness advantage of
further increases switching losses. Therefore, one would the high cell density diode means they can be forced through
like a diode with short trr and low QRR specifications to reverse recovery at a higher di/dt than a standard cell
minimize these losses. MOSFET diode without increasing the current ringing or the
The abruptness of diode reverse recovery effects the noise generated. In addition, power dissipation incurred
amount of radiated noise, voltage spikes, and current from switching the diode will be less due to the shorter
ringing. The mechanisms at work are finite irremovable recovery time and lower switching losses.
circuit parasitic inductances and capacitances acted upon by
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The Forward Biased Safe Operating Area curves define reliable operation, the stored energy from circuit inductance
the maximum simultaneous drain–to–source voltage and dissipated in the transistor while in avalanche must be less
drain current that a transistor can handle safely when it is than the rated limit and must be adjusted for operating
forward biased. Curves are based upon maximum peak conditions differing from those specified. Although industry
junction temperature and a case temperature (TC) of 25°C. practice is to rate in terms of energy, avalanche energy
Peak repetitive pulsed power limits are determined by using capability is not a constant. The energy rating decreases
the thermal response data in conjunction with the procedures non–linearly with an increase of peak current in avalanche
discussed in AN569, “Transient Thermal Resistance – and peak junction temperature.
General Data and Its Use.” Although many E–FETs can withstand the stress of
Switching between the off–state and the on–state may drain–to–source avalanche at currents up to rated pulsed
traverse any load line provided neither rated peak current current (IDM), the energy rating is specified at rated
(IDM) nor rated voltage (VDSS) is exceeded, and that the continuous current (ID), in accordance with industry
transition time (tr, tf) does not exceed 10 µs. In addition the custom. The energy rating must be derated for temperature
total power averaged over a complete switching cycle must as shown in the accompanying graph (Figure 13). Maximum
not exceed (TJ(MAX) – TC)/(RθJC). energy at currents below rated continuous ID can safely be
A power MOSFET designated E–FET can be safely used assumed to equal the values indicated.
in switching circuits with unclamped inductive loads. For
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SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • The soldering temperature and time shall not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within • When shifting from preheating to soldering, the
a short time could result in device failure. Therefore, the maximum temperature gradient shall be 5°C or less.
following items should always be observed in order to • After soldering has been completed, the device should
minimize the thermal stress to which the devices are be allowed to cool naturally for at least three minutes.
subjected. Gradual cooling should be used as the use of forced
• Always preheat the device. cooling will increase the temperature gradient and
• The delta temperature between the preheat and result in latent failure due to mechanical stress.
soldering should be 100°C or less.* • Mechanical stress or shock should not be applied
• When preheating and soldering, the temperature of the during cooling.
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When * Soldering a device without preheating can cause
using infrared heating with the reflow soldering excessive thermal shock and stress which can result in
method, the difference shall be a maximum of 10°C. damage to the device.
http://onsemi.com
722
MMSF3P02HD
150°C
SOLDER IS LIQUID FOR
40 TO 80 SECONDS
100°C 140°C (DEPENDING ON
MASS OF ASSEMBLY)
100°C
http://onsemi.com
723
( .
Preferred Device
#$%& '(
N–Channel SO–8
These miniature surface mount MOSFETs feature ultra low RDS(on)
and true logic level performance. They are capable of withstanding
high energy in the avalanche and commutation modes and the http://onsemi.com
drain–to–source diode has a very low reverse recovery time.
MiniMOSt devices are designed for use in low voltage, high speed 5 AMPERES
switching applications where power efficiency is important. Typical 20 VOLTS
applications are dc–dc converters, and power management in portable
and battery powered products such as computers, printers, cellular and RDS(on) = 25 m
cordless phones. They can also be used for low voltage motor controls
in mass storage products such as disk drives and tape drives. The N–Channel
avalanche energy is specified to eliminate the guesswork in designs
where inductive loads are switched and offer additional safety margin
against unexpected voltage transients.
• Ultra Low RDS(on) Provides Higher Efficiency and Extends Battery
Life
http://onsemi.com
725
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Switching behavior is most easily modeled and predicted The capacitance (Ciss) is read from the capacitance curve at
by recognizing that the power MOSFET is charge a voltage corresponding to the off–state condition when
controlled. The lengths of various switching intervals (∆t) calculating td(on) and is read at a voltage corresponding to the
are determined by how fast the FET input capacitance can on–state when calculating td(off).
be charged by current from the generator. At high switching speeds, parasitic circuit elements
The published capacitance data is difficult to use for complicate the analysis. The inductance of the MOSFET
calculating rise and fall because drain–gate capacitance source lead, inside the package and in the circuit wiring
varies greatly with applied voltage. Accordingly, gate which is common to both the drain and gate current paths,
charge data is used. In most cases, a satisfactory estimate of produces a voltage at the source which reduces the gate drive
average input current (IG(AV)) can be made from a current. The voltage is determined by Ldi/dt, but since di/dt
rudimentary analysis of the drive circuit so that is a function of drain current, the mathematical solution is
t = Q/IG(AV) complex. The MOSFET output capacitance also
complicates the mathematics. And finally, MOSFETs have
During the rise and fall time interval when switching a finite internal gate resistance which effectively adds to the
resistive load, VGS remains virtually constant at a level resistance of the driving source, but the internal resistance
known as the plateau voltage, VSGP. Therefore, rise and fall is difficult to measure and, consequently, is not specified.
times may be approximated by the following: The resistive switching time variation versus gate
tr = Q2 x RG/(VGG – VGSP) resistance (Figure 9) shows how typical switching
tf = Q2 x RG/VGSP performance is affected by the parasitic circuit elements. If
where the parasitics were not present, the slope of the curves would
maintain a value of unity regardless of the switching speed.
VGG = the gate drive voltage, which varies from zero to VGG
The circuit used to obtain the data is constructed to minimize
RG = the gate drive resistance
common inductance in the drain and gate circuit loops and
and Q2 and VGSP are read from the gate charge curve.
is believed readily achievable with board mounted
During the turn–on and turn–off delay times, gate current is components. Most power electronic loads are inductive; the
not constant. The simplest calculation uses appropriate data in the figure is taken with a resistive load, which
values from the capacitance curves in a standard equation for approximates an optimally snubbed inductive load. Power
voltage change in an RC network. The equations are: MOSFETs may be safely operated into an inductive load;
td(on) = RG Ciss In [VGG/(VGG – VGSP)] however, snubbing reduces switching losses.
td(off) = RG Ciss In (VGG/VGSP)
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are very important in systems using it as a freewheeling or controlled by the device clearing the stored charge.
commutating diode. Of particular interest are the reverse However, the positive di/dt during tb is an uncontrollable
recovery characteristics which play a major role in diode characteristic and is usually the culprit that induces
determining switching losses, radiated noise, EMI and RFI. current ringing. Therefore, when comparing diodes, the
System switching losses are largely due to the nature of ratio of tb/ta serves as a good indicator of recovery
the body diode itself. The body diode is a minority carrier abruptness and thus gives a comparative estimate of
device, therefore it has a finite reverse recovery time, trr, due probable noise generated. A ratio of 1 is considered ideal and
to the storage of minority carrier charge, QRR, as shown in values less than 0.5 are considered snappy.
the typical reverse recovery wave form of Figure 15. It is this Compared to ON Semiconductor standard cell density
stored charge that, when cleared from the diode, passes low voltage MOSFETs, high cell density MOSFET diodes
through a potential and defines an energy loss. Obviously, are faster (shorter trr), have less stored charge and a softer
repeatedly forcing the diode through reverse recovery reverse recovery characteristic. The softness advantage of
further increases switching losses. Therefore, one would the high cell density diode means they can be forced through
like a diode with short trr and low QRR specifications to reverse recovery at a higher di/dt than a standard cell
minimize these losses. MOSFET diode without increasing the current ringing or the
The abruptness of diode reverse recovery effects the noise generated. In addition, power dissipation incurred
amount of radiated noise, voltage spikes, and current from switching the diode will be less due to the shorter
ringing. The mechanisms at work are finite irremovable recovery time and lower switching losses.
circuit parasitic inductances and capacitances acted upon by
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The Forward Biased Safe Operating Area curves define reliable operation, the stored energy from circuit inductance
the maximum simultaneous drain–to–source voltage and dissipated in the transistor while in avalanche must be less
drain current that a transistor can handle safely when it is than the rated limit and must be adjusted for operating
forward biased. Curves are based upon maximum peak conditions differing from those specified. Although industry
junction temperature and a case temperature (TC) of 25°C. practice is to rate in terms of energy, avalanche energy
Peak repetitive pulsed power limits are determined by using capability is not a constant. The energy rating decreases
the thermal response data in conjunction with the procedures non–linearly with an increase of peak current in avalanche
discussed in AN569, “Transient Thermal Resistance – and peak junction temperature.
General Data and Its Use.” Although many E–FETs can withstand the stress of
Switching between the off–state and the on–state may drain–to–source avalanche at currents up to rated pulsed
traverse any load line provided neither rated peak current current (IDM), the energy rating is specified at rated
(IDM) nor rated voltage (VDSS) is exceeded, and that the continuous current (ID), in accordance with industry
transition time (tr, tf) does not exceed 10 µs. In addition the custom. The energy rating must be derated for temperature
total power averaged over a complete switching cycle must as shown in the accompanying graph (Figure 13). Maximum
not exceed (TJ(MAX) – TC)/(RθJC). energy at currents below rated continuous ID can safely be
A power MOSFET designated E–FET can be safely used assumed to equal the values indicated.
in switching circuits with unclamped inductive loads. For
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Safe Operating Area Starting Junction Temperature
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http://onsemi.com
730
MMSF5N02HD
#:$ $$
: 6
#6 $
9 #:
inches
mm
SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • The soldering temperature and time shall not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within • When shifting from preheating to soldering, the
a short time could result in device failure. Therefore, the maximum temperature gradient shall be 5°C or less.
following items should always be observed in order to • After soldering has been completed, the device should
minimize the thermal stress to which the devices are be allowed to cool naturally for at least three minutes.
subjected. Gradual cooling should be used as the use of forced
• Always preheat the device. cooling will increase the temperature gradient and
• The delta temperature between the preheat and result in latent failure due to mechanical stress.
soldering should be 100°C or less.* • Mechanical stress or shock should not be applied
• When preheating and soldering, the temperature of the during cooling.
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When * Soldering a device without preheating can cause
using infrared heating with the reflow soldering excessive thermal shock and stress which can result in
method, the difference shall be a maximum of 10°C. damage to the device.
http://onsemi.com
731
MMSF5N02HD
150°C
SOLDER IS LIQUID FOR
40 TO 80 SECONDS
100°C 140°C (DEPENDING ON
MASS OF ASSEMBLY)
100°C
http://onsemi.com
732
(!.
Preferred Device
#$%& '(
!
N–Channel SO–8
These miniature surface mount MOSFETs feature ultra low RDS(on)
and true logic level performance. They are capable of withstanding
high energy in the avalanche and commutation modes and the http://onsemi.com
drain–to–source diode has a very low reverse recovery time.
MiniMOSt devices are designed for use in low voltage, high speed 5 AMPERES
switching applications where power efficiency is important. Typical 30 VOLTS
applications are dc–dc converters, and power management in portable
and battery powered products such as computers, printers, cellular and
RDS(on) = 40 m
cordless phones. They can also be used for low voltage motor controls
in mass storage products such as disk drives and tape drives. The N–Channel
avalanche energy is specified to eliminate the guesswork in designs
where inductive loads are switched and offer additional safety margin
against unexpected voltage transients.
• Ultra Low RDS(on) Provides Higher Efficiency and Extends Battery
Life
http://onsemi.com
734
MMSF5N03HD
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735
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Switching behavior is most easily modeled and predicted The capacitance (Ciss) is read from the capacitance curve at
by recognizing that the power MOSFET is charge a voltage corresponding to the off–state condition when
controlled. The lengths of various switching intervals (∆t) calculating td(on) and is read at a voltage corresponding to the
are determined by how fast the FET input capacitance can on–state when calculating td(off).
be charged by current from the generator. At high switching speeds, parasitic circuit elements
The published capacitance data is difficult to use for complicate the analysis. The inductance of the MOSFET
calculating rise and fall because drain–gate capacitance source lead, inside the package and in the circuit wiring
varies greatly with applied voltage. Accordingly, gate which is common to both the drain and gate current paths,
charge data is used. In most cases, a satisfactory estimate of produces a voltage at the source which reduces the gate drive
average input current (IG(AV)) can be made from a current. The voltage is determined by Ldi/dt, but since di/dt
rudimentary analysis of the drive circuit so that is a function of drain current, the mathematical solution is
t = Q/IG(AV) complex. The MOSFET output capacitance also
complicates the mathematics. And finally, MOSFETs have
During the rise and fall time interval when switching a finite internal gate resistance which effectively adds to the
resistive load, VGS remains virtually constant at a level resistance of the driving source, but the internal resistance
known as the plateau voltage, VSGP. Therefore, rise and fall is difficult to measure and, consequently, is not specified.
times may be approximated by the following: The resistive switching time variation versus gate
tr = Q2 x RG/(VGG – VGSP) resistance (Figure 9) shows how typical switching
tf = Q2 x RG/VGSP performance is affected by the parasitic circuit elements. If
where the parasitics were not present, the slope of the curves would
maintain a value of unity regardless of the switching speed.
VGG = the gate drive voltage, which varies from zero to VGG
The circuit used to obtain the data is constructed to minimize
RG = the gate drive resistance
common inductance in the drain and gate circuit loops and
and Q2 and VGSP are read from the gate charge curve.
is believed readily achievable with board mounted
During the turn–on and turn–off delay times, gate current is components. Most power electronic loads are inductive; the
not constant. The simplest calculation uses appropriate data in the figure is taken with a resistive load, which
values from the capacitance curves in a standard equation for approximates an optimally snubbed inductive load. Power
voltage change in an RC network. The equations are: MOSFETs may be safely operated into an inductive load;
td(on) = RG Ciss In [VGG/(VGG – VGSP)] however, snubbing reduces switching losses.
td(off) = RG Ciss In (VGG/VGSP)
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The switching characteristics of a MOSFET body diode high di/dts. The diode’s negative di/dt during ta is directly
are very important in systems using it as a freewheeling or controlled by the device clearing the stored charge.
commutating diode. Of particular interest are the reverse However, the positive di/dt during tb is an uncontrollable
recovery characteristics which play a major role in diode characteristic and is usually the culprit that induces
determining switching losses, radiated noise, EMI and RFI. current ringing. Therefore, when comparing diodes, the
System switching losses are largely due to the nature of ratio of tb/ta serves as a good indicator of recovery
the body diode itself. The body diode is a minority carrier abruptness and thus gives a comparative estimate of
device, therefore it has a finite reverse recovery time, trr, due probable noise generated. A ratio of 1 is considered ideal and
to the storage of minority carrier charge, QRR, as shown in values less than 0.5 are considered snappy.
the typical reverse recovery wave form of Figure 15. It is this Compared to ON Semiconductor standard cell density
stored charge that, when cleared from the diode, passes low voltage MOSFETs, high cell density MOSFET diodes
through a potential and defines an energy loss. Obviously, are faster (shorter trr), have less stored charge and a softer
repeatedly forcing the diode through reverse recovery reverse recovery characteristic. The softness advantage of
further increases switching losses. Therefore, one would the high cell density diode means they can be forced through
like a diode with short trr and low QRR specifications to reverse recovery at a higher di/dt than a standard cell
minimize these losses. MOSFET diode without increasing the current ringing or the
The abruptness of diode reverse recovery effects the noise generated. In addition, power dissipation incurred
amount of radiated noise, voltage spikes, and current from switching the diode will be less due to the shorter
ringing. The mechanisms at work are finite irremovable recovery time and lower switching losses.
circuit parasitic inductances and capacitances acted upon by
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737
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The Forward Biased Safe Operating Area curves define reliable operation, the stored energy from circuit inductance
the maximum simultaneous drain–to–source voltage and dissipated in the transistor while in avalanche must be less
drain current that a transistor can handle safely when it is than the rated limit and must be adjusted for operating
forward biased. Curves are based upon maximum peak conditions differing from those specified. Although industry
junction temperature and a case temperature (TC) of 25°C. practice is to rate in terms of energy, avalanche energy
Peak repetitive pulsed power limits are determined by using capability is not a constant. The energy rating decreases
the thermal response data in conjunction with the procedures non–linearly with an increase of peak current in avalanche
discussed in AN569, “Transient Thermal Resistance – and peak junction temperature.
General Data and Its Use.” Although many E–FETs can withstand the stress of
Switching between the off–state and the on–state may drain–to–source avalanche at currents up to rated pulsed
traverse any load line provided neither rated peak current current (IDM), the energy rating is specified at rated
(IDM) nor rated voltage (VDSS) is exceeded, and that the continuous current (ID), in accordance with industry
transition time (tr, tf) does not exceed 10 µs. In addition the custom. The energy rating must be derated for temperature
total power averaged over a complete switching cycle must as shown in the accompanying graph (Figure 13). Maximum
not exceed (TJ(MAX) – TC)/(RθJC). energy at currents below rated continuous ID can safely be
A power MOSFET designated E–FET can be safely used assumed to equal the values indicated.
in switching circuits with unclamped inductive loads. For
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Safe Operating Area Starting Junction Temperature
http://onsemi.com
738
MMSF5N03HD
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http://onsemi.com
739
MMSF5N03HD
#:$ $$
: 6
#6 $
9 #:
inches
mm
SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • The soldering temperature and time shall not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within • When shifting from preheating to soldering, the
a short time could result in device failure. Therefore, the maximum temperature gradient shall be 5°C or less.
following items should always be observed in order to • After soldering has been completed, the device should
minimize the thermal stress to which the devices are be allowed to cool naturally for at least three minutes.
subjected. Gradual cooling should be used as the use of forced
• Always preheat the device. cooling will increase the temperature gradient and
• The delta temperature between the preheat and result in latent failure due to mechanical stress.
soldering should be 100°C or less.* • Mechanical stress or shock should not be applied
• When preheating and soldering, the temperature of the during cooling.
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When * Soldering a device without preheating can cause
using infrared heating with the reflow soldering excessive thermal shock and stress which can result in
method, the difference shall be a maximum of 10°C. damage to the device.
http://onsemi.com
740
MMSF5N03HD
150°C
SOLDER IS LIQUID FOR
40 TO 80 SECONDS
100°C 140°C (DEPENDING ON
MASS OF ASSEMBLY)
100°C
http://onsemi.com
741
("!.
Preferred Device
#$%& '(
" !
N–Channel SO–8
These miniature surface mount MOSFETs feature ultra low RDS(on)
and true logic level performance. They are capable of withstanding
high energy in the avalanche and commutation modes and the http://onsemi.com
drain–to–source diode has a very low reverse recovery time.
MiniMOSt devices are designed for use in low voltage, high speed 7 AMPERES
switching applications where power efficiency is important. Typical 30 VOLTS
applications are dc–dc converters, and power management in portable
and battery powered products such as computers, printers, cellular and
RDS(on) = 28 m
cordless phones. They can also be used for low voltage motor controls
in mass storage products such as disk drives and tape drives. The N–Channel
avalanche energy is specified to eliminate the guesswork in designs
where inductive loads are switched and offer additional safety margin
against unexpected voltage transients.
• Ultra Low RDS(on) Provides Higher Efficiency and Extends Battery
Life
http://onsemi.com
743
MMSF7N03HD
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744
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Switching behavior is most easily modeled and predicted The capacitance (Ciss) is read from the capacitance curve at
by recognizing that the power MOSFET is charge a voltage corresponding to the off–state condition when
controlled. The lengths of various switching intervals (∆t) calculating td(on) and is read at a voltage corresponding to the
are determined by how fast the FET input capacitance can on–state when calculating td(off).
be charged by current from the generator. At high switching speeds, parasitic circuit elements
The published capacitance data is difficult to use for complicate the analysis. The inductance of the MOSFET
calculating rise and fall because drain–gate capacitance source lead, inside the package and in the circuit wiring
varies greatly with applied voltage. Accordingly, gate which is common to both the drain and gate current paths,
charge data is used. In most cases, a satisfactory estimate of produces a voltage at the source which reduces the gate drive
average input current (IG(AV)) can be made from a current. The voltage is determined by Ldi/dt, but since di/dt
rudimentary analysis of the drive circuit so that is a function of drain current, the mathematical solution is
t = Q/IG(AV) complex. The MOSFET output capacitance also
complicates the mathematics. And finally, MOSFETs have
During the rise and fall time interval when switching a finite internal gate resistance which effectively adds to the
resistive load, VGS remains virtually constant at a level resistance of the driving source, but the internal resistance
known as the plateau voltage, VSGP. Therefore, rise and fall is difficult to measure and, consequently, is not specified.
times may be approximated by the following: The resistive switching time variation versus gate
tr = Q2 x RG/(VGG – VGSP) resistance (Figure 9) shows how typical switching
tf = Q2 x RG/VGSP performance is affected by the parasitic circuit elements. If
where the parasitics were not present, the slope of the curves would
maintain a value of unity regardless of the switching speed.
VGG = the gate drive voltage, which varies from zero to VGG
The circuit used to obtain the data is constructed to minimize
RG = the gate drive resistance
common inductance in the drain and gate circuit loops and
and Q2 and VGSP are read from the gate charge curve.
is believed readily achievable with board mounted
During the turn–on and turn–off delay times, gate current is components. Most power electronic loads are inductive; the
not constant. The simplest calculation uses appropriate data in the figure is taken with a resistive load, which
values from the capacitance curves in a standard equation for approximates an optimally snubbed inductive load. Power
voltage change in an RC network. The equations are: MOSFETs may be safely operated into an inductive load;
td(on) = RG Ciss In [VGG/(VGG – VGSP)] however, snubbing reduces switching losses.
td(off) = RG Ciss In (VGG/VGSP)
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The switching characteristics of a MOSFET body diode high di/dts. The diode’s negative di/dt during ta is directly
are very important in systems using it as a freewheeling or controlled by the device clearing the stored charge.
commutating diode. Of particular interest are the reverse However, the positive di/dt during tb is an uncontrollable
recovery characteristics which play a major role in diode characteristic and is usually the culprit that induces
determining switching losses, radiated noise, EMI and RFI. current ringing. Therefore, when comparing diodes, the
System switching losses are largely due to the nature of ratio of tb/ta serves as a good indicator of recovery
the body diode itself. The body diode is a minority carrier abruptness and thus gives a comparative estimate of
device, therefore it has a finite reverse recovery time, trr, due probable noise generated. A ratio of 1 is considered ideal and
to the storage of minority carrier charge, QRR, as shown in values less than 0.5 are considered snappy.
the typical reverse recovery wave form of Figure 15. It is this Compared to ON Semiconductor standard cell density
stored charge that, when cleared from the diode, passes low voltage MOSFETs, high cell density MOSFET diodes
through a potential and defines an energy loss. Obviously, are faster (shorter trr), have less stored charge and a softer
repeatedly forcing the diode through reverse recovery reverse recovery characteristic. The softness advantage of
further increases switching losses. Therefore, one would the high cell density diode means they can be forced through
like a diode with short trr and low QRR specifications to reverse recovery at a higher di/dt than a standard cell
minimize these losses. MOSFET diode without increasing the current ringing or the
The abruptness of diode reverse recovery effects the noise generated. In addition, power dissipation incurred
amount of radiated noise, voltage spikes, and current from switching the diode will be less due to the shorter
ringing. The mechanisms at work are finite irremovable recovery time and lower switching losses.
circuit parasitic inductances and capacitances acted upon by
8
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http://onsemi.com
746
MMSF7N03HD
'((
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The Forward Biased Safe Operating Area curves define reliable operation, the stored energy from circuit inductance
the maximum simultaneous drain–to–source voltage and dissipated in the transistor while in avalanche must be less
drain current that a transistor can handle safely when it is than the rated limit and must be adjusted for operating
forward biased. Curves are based upon maximum peak conditions differing from those specified. Although industry
junction temperature and a case temperature (TC) of 25°C. practice is to rate in terms of energy, avalanche energy
Peak repetitive pulsed power limits are determined by using capability is not a constant. The energy rating decreases
the thermal response data in conjunction with the procedures non–linearly with an increase of peak current in avalanche
discussed in AN569, “Transient Thermal Resistance – and peak junction temperature.
General Data and Its Use.” Although many E–FETs can withstand the stress of
Switching between the off–state and the on–state may drain–to–source avalanche at currents up to rated pulsed
traverse any load line provided neither rated peak current current (IDM), the energy rating is specified at rated
(IDM) nor rated voltage (VDSS) is exceeded, and that the continuous current (ID), in accordance with industry
transition time (tr, tf) does not exceed 10 µs. In addition the custom. The energy rating must be derated for temperature
total power averaged over a complete switching cycle must as shown in the accompanying graph (Figure 13). Maximum
not exceed (TJ(MAX) – TC)/(RθJC). energy at currents below rated continuous ID can safely be
A power MOSFET designated E–FET can be safely used assumed to equal the values indicated.
in switching circuits with unclamped inductive loads. For
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Figure 12. Maximum Rated Forward Biased Figure 13. Maximum Avalanche Energy versus
Safe Operating Area Starting Junction Temperature
http://onsemi.com
747
MMSF7N03HD
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Figure 14. Thermal Response
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http://onsemi.com
748
MMSF7N03HD
#:$ $$
: 6
#6 $
9 #:
inches
mm
SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • The soldering temperature and time shall not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within a • When shifting from preheating to soldering, the
short time could result in device failure. Therefore, the maximum temperature gradient shall be 5°C or less.
following items should always be observed in order to
• After soldering has been completed, the device should
minimize the thermal stress to which the devices are
subjected.
be allowed to cool naturally for at least three minutes.
• Always preheat the device. Gradual cooling should be used as the use of forced
• The delta temperature between the preheat and cooling will increase the temperature gradient and
soldering should be 100°C or less.* result in latent failure due to mechanical stress.
• When preheating and soldering, the temperature of the • Mechanical stress or shock should not be applied
leads and the case must not exceed the maximum during cooling.
temperature ratings as shown on the data sheet. When
using infrared heating with the reflow soldering * Soldering a device without preheating can cause
method, the difference shall be a maximum of 10°C. excessive thermal shock and stress which can result in
damage to the device.
http://onsemi.com
749
MMSF7N03HD
150°C
SOLDER IS LIQUID FOR
40 TO 80 SECONDS
100°C 140°C (DEPENDING ON
MASS OF ASSEMBLY)
100°C
http://onsemi.com
750
("!8
#$%& '(
" !
N–Channel SO–8
EZFETst are an advanced series of Power MOSFETs which contain
monolithic back–to–back zener diodes. These zener diodes provide http://onsemi.com
protection against ESD and unexpected transients. These miniature
surface mount MOSFETs feature ultra low RDS(on) and true logic level 7 AMPERES
performance. They are capable of withstanding high energy in the
30 VOLTS
avalanche and commutation modes and the drain–to–source diode has a
very low reverse recovery time. EZFET devices are designed for use in RDS(on) = 30 mW
low voltage, high speed switching applications where power efficiency is
important. Typical applications are dc–dc converters, and power N–Channel
management in portable and battery powered products such as
computers, printers, cellular and cordless phones. They can also be used
for low voltage motor controls in mass storage products such as disk
drives and tape drives.
• Zener Protected Gates Provide Electrostatic Discharge Protection
• Ultra Low RDS(on) Provides Higher Efficiency and Extends Battery
Life
• Designed to withstand 200V Machine Model and 2000V Human
Body Model MARKING
• Logic Level Gate Drive – Can Be Driven by Logic ICs DIAGRAM
• Miniature SO–8 Surface Mount Package – Saves Board Space
• Diode Is Characterized for Use In Bridge Circuits SO–8
• Diode Exhibits High Speed, With Soft Recovery 8 CASE 751 7N03Z
LYWW
• IDSS Specified at Elevated Temperature
STYLE 12
PIN ASSIGNMENT
Source 1 8 Drain
Source 2 7 Drain
Source 3 6 Drain
Gate 4 5 Drain
Top View
ORDERING INFORMATION
http://onsemi.com
752
MMSF7N03Z
http://onsemi.com
753
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Switching behavior is most easily modeled and predicted The capacitance (Ciss) is read from the capacitance curve at
by recognizing that the power MOSFET is charge a voltage corresponding to the off–state condition when
controlled. The lengths of various switching intervals (∆t) calculating td(on) and is read at a voltage corresponding to the
are determined by how fast the FET input capacitance can on–state when calculating td(off).
be charged by current from the generator. At high switching speeds, parasitic circuit elements
The published capacitance data is difficult to use for complicate the analysis. The inductance of the MOSFET
calculating rise and fall because drain–gate capacitance source lead, inside the package and in the circuit wiring
varies greatly with applied voltage. Accordingly, gate which is common to both the drain and gate current paths,
charge data is used. In most cases, a satisfactory estimate of produces a voltage at the source which reduces the gate drive
average input current (IG(AV)) can be made from a current. The voltage is determined by Ldi/dt, but since di/dt
rudimentary analysis of the drive circuit so that is a function of drain current, the mathematical solution is
t = Q/IG(AV) complex. The MOSFET output capacitance also
complicates the mathematics. And finally, MOSFETs have
During the rise and fall time interval when switching a finite internal gate resistance which effectively adds to the
resistive load, VGS remains virtually constant at a level resistance of the driving source, but the internal resistance
known as the plateau voltage, VSGP. Therefore, rise and fall is difficult to measure and, consequently, is not specified.
times may be approximated by the following: The resistive switching time variation versus gate
tr = Q2 x RG/(VGG – VGSP) resistance (Figure 9) shows how typical switching
tf = Q2 x RG/VGSP performance is affected by the parasitic circuit elements. If
where the parasitics were not present, the slope of the curves would
maintain a value of unity regardless of the switching speed.
VGG = the gate drive voltage, which varies from zero to VGG
The circuit used to obtain the data is constructed to minimize
RG = the gate drive resistance
common inductance in the drain and gate circuit loops and
and Q2 and VGSP are read from the gate charge curve.
is believed readily achievable with board mounted
During the turn–on and turn–off delay times, gate current is components. Most power electronic loads are inductive; the
not constant. The simplest calculation uses appropriate data in the figure is taken with a resistive load, which
values from the capacitance curves in a standard equation for approximates an optimally snubbed inductive load. Power
voltage change in an RC network. The equations are: MOSFETs may be safely operated into an inductive load;
td(on) = RG Ciss In [VGG/(VGG – VGSP)] however, snubbing reduces switching losses.
td(off) = RG Ciss In (VGG/VGSP)
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The switching characteristics of a MOSFET body diode high di/dts. The diode’s negative di/dt during ta is directly
are very important in systems using it as a freewheeling or controlled by the device clearing the stored charge.
commutating diode. Of particular interest are the reverse However, the positive di/dt during tb is an uncontrollable
recovery characteristics which play a major role in diode characteristic and is usually the culprit that induces
determining switching losses, radiated noise, EMI and RFI. current ringing. Therefore, when comparing diodes, the
System switching losses are largely due to the nature of ratio of tb/ta serves as a good indicator of recovery
the body diode itself. The body diode is a minority carrier abruptness and thus gives a comparative estimate of
device, therefore it has a finite reverse recovery time, trr, due probable noise generated. A ratio of 1 is considered ideal and
to the storage of minority carrier charge, QRR, as shown in values less than 0.5 are considered snappy.
the typical reverse recovery wave form of Figure 11. It is this Compared to ON Semiconductor standard cell density
stored charge that, when cleared from the diode, passes low voltage MOSFETs, high cell density MOSFET diodes
through a potential and defines an energy loss. Obviously, are faster (shorter trr), have less stored charge and a softer
repeatedly forcing the diode through reverse recovery reverse recovery characteristic. The softness advantage of
further increases switching losses. Therefore, one would the high cell density diode means they can be forced through
like a diode with short trr and low QRR specifications to reverse recovery at a higher di/dt than a standard cell
minimize these losses. MOSFET diode without increasing the current ringing or the
The abruptness of diode reverse recovery effects the noise generated. In addition, power dissipation incurred
amount of radiated noise, voltage spikes, and current from switching the diode will be less due to the shorter
ringing. The mechanisms at work are finite irremovable recovery time and lower switching losses.
circuit parasitic inductances and capacitances acted upon by
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drain current that a transistor can handle safely when it is than the rated limit and must be adjusted for operating
forward biased. Curves are based upon maximum peak conditions differing from those specified. Although industry
junction temperature and a case temperature (TC) of 25°C. practice is to rate in terms of energy, avalanche energy
Peak repetitive pulsed power limits are determined by using capability is not a constant. The energy rating decreases
the thermal response data in conjunction with the procedures non–linearly with an increase of peak current in avalanche
discussed in AN569, “Transient Thermal Resistance – and peak junction temperature.
General Data and Its Use.” Although many E–FETs can withstand the stress of
Switching between the off–state and the on–state may drain–to–source avalanche at currents up to rated pulsed
traverse any load line provided neither rated peak current current (IDM), the energy rating is specified at rated
(IDM) nor rated voltage (VDSS) is exceeded, and that the continuous current (ID), in accordance with industry
transition time (tr, tf) does not exceed 10 µs. In addition the custom. The energy rating must be derated for temperature
total power averaged over a complete switching cycle must as shown in the accompanying graph (Figure 13). Maximum
not exceed (TJ(MAX) – TC)/(RθJC). energy at currents below rated continuous ID can safely be
A power MOSFET designated E–FET can be safely used assumed to equal the values indicated.
in switching circuits with unclamped inductive loads. For
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SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • The soldering temperature and time shall not exceed
temperature of the device. When the entire device is heated 260°C for more than 10 seconds.
to a high temperature, failure to complete soldering within • When shifting from preheating to soldering, the
a short time could result in device failure. Therefore, the maximum temperature gradient shall be 5°C or less.
following items should always be observed in order to • After soldering has been completed, the device should
minimize the thermal stress to which the devices are be allowed to cool naturally for at least three minutes.
subjected. Gradual cooling should be used as the use of forced
• Always preheat the device. cooling will increase the temperature gradient and
• The delta temperature between the preheat and result in latent failure due to mechanical stress.
soldering should be 100°C or less.* • Mechanical stress or shock should not be applied
• When preheating and soldering, the temperature of the during cooling.
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When * Soldering a device without preheating can cause
using infrared heating with the reflow soldering excessive thermal shock and stress which can result in
method, the difference shall be a maximum of 10°C. damage to the device.
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150°C
SOLDER IS LIQUID FOR
40 TO 80 SECONDS
100°C 140°C (DEPENDING ON
MASS OF ASSEMBLY)
100°C
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MPF930
YWW
1 3
Source Drain
2
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Y = Year
WW = Work Week
ORDERING INFORMATION
See detailed ordering and shipping information in the package
dimensions section on page 763 of this data sheet.
OFF CHARACTERISTICS
Drain–Source Breakdown Voltage V(BR)DSX Vdc
(VGS = 0, ID = 10 µAdc) MPF930 35 – –
MPF960 60 – –
MPF990 90 – –
Gate Reverse Current (VGS = 15 Vdc, VDS = 0) IGSS – – 50 nAdc
SMALL–SIGNAL CHARACTERISTICS
Input Capacitance Ciss – 70 – pF
(VDS = 25 Vdc, VGS = 0, f = 1.0 MHz)
Reverse Transfer Capacitance Crss – 20 – pF
(VDS = 25 Vdc, VGS = 0, f = 1.0 MHz)
Output Capacitance Coss – 49 – pF
(VDS = 25 Vdc, VGS = 0, f = 1.0 MHz)
Forward Transconductance gfs 200 380 – mmhos
(VDS = 25 Vdc, ID = 0.5 Adc)
SWITCHING CHARACTERISTICS
Turn–On Time ton – 7.0 15 ns
Turn–Off Time toff – 7.0 15 ns
3. Pulse Test: Pulse Width v 300 µs, Duty Cycle v 2.0%.
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This Power MOSFET is designed to withstand high energy in the
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low voltage, high speed switching applications in power supplies,
converters and PWM motor controls, these devices are particularly 75 AMPERES
well suited for bridge circuits where diode speed and commutating 30 VOLTS
safe operating areas are critical and offer additional safety margin
RDS(on) = 6.5 mΩ
against unexpected voltage transients.
• Avalanche Energy Specified
• Source–to–Drain Diode Recovery Time Comparable to a Discrete N–Channel
Fast Recovery Diode D
• Diode is Characterized for Use in Bridge Circuits
• IDSS and VDS(on) Specified at Elevated Temperature
• Short Heatsink Tab Manufactured – Not Sheared G
• Specially Designed Leadframe for Maximum Power Dissipation
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MAXIMUM RATINGS (TC = 25°C unless otherwise noted)
Rating Symbol Value Unit 4
Drain–to–Source Voltage VDSS 30 Vdc
D2PAK
Drain–to–Gate Voltage (RGS = 1.0 MΩ) VDGR 30 Vdc CASE 418B
1 2
STYLE 2
Gate–to–Source Voltage 3
– Continuous VGS ±20 Vdc
– Non–Repetitive (tp ≤ 10 ms) VGSM ±20 Vpk MARKING DIAGRAM
Drain Current & PIN ASSIGNMENT
– Continuous ID 75 Adc 4
– Continuous @ 100°C ID 59 Drain
– Single Pulse (tp ≤ 10 µs) IDM 225 Apk
Total Power Dissipation PD 150 Watts
Derate above 25°C 1.2 W/°C
MTB1306
Total Power Dissipation @ TA = 25°C 2.5 Watts
YWW
(Note 1.)
Operating and Storage Temperature TJ, Tstg –55 to °C
Range 150
1 2 3
Single Pulse Drain–to–Source Avalanche EAS mJ Gate Drain Source
Energy – Starting TJ = 25°C 280
(VDD = 25 Vdc, VGS = 10 Vdc, Peak MTB1306 = Device Code
IL = 75 Apk, L = 0.1 mH, RG = 25 Ω) Y = Year
WW = Work Week
Thermal Resistance °C/W
– Junction–to–Case RθJC 0.8
– Junction–to–Ambient RθJA 62.5
ORDERING INFORMATION
– Junction–to–Ambient (Note 1.) RθJA 50
Device Package Shipping
Maximum Lead Temperature for Soldering TL 260 °C
Purposes, 1/8″ from Case for 5.0 MTB1306 D2PAK 50 Units/Rail
seconds
MTB1306T4 D2PAK 800/Tape & Reel
1. When surface mounted to an FR4 board using the minimum recommended
pad size.
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Switching behavior is most easily modeled and predicted The capacitance (Ciss) is read from the capacitance curve at
by recognizing that the power MOSFET is charge a voltage corresponding to the off–state condition when
controlled. The lengths of various switching intervals (∆t) calculating td(on) and is read at a voltage corresponding to the
are determined by how fast the FET input capacitance can on–state when calculating td(off).
be charged by current from the generator. At high switching speeds, parasitic circuit elements
The published capacitance data is difficult to use for complicate the analysis. The inductance of the MOSFET
calculating rise and fall because drain–gate capacitance source lead, inside the package and in the circuit wiring
varies greatly with applied voltage. Accordingly, gate which is common to both the drain and gate current paths,
charge data is used. In most cases, a satisfactory estimate of produces a voltage at the source which reduces the gate drive
average input current (IG(AV)) can be made from a current. The voltage is determined by Ldi/dt, but since di/dt
rudimentary analysis of the drive circuit so that is a function of drain current, the mathematical solution is
t = Q/IG(AV) complex. The MOSFET output capacitance also
complicates the mathematics. And finally, MOSFETs have
During the rise and fall time interval when switching a finite internal gate resistance which effectively adds to the
resistive load, VGS remains virtually constant at a level resistance of the driving source, but the internal resistance
known as the plateau voltage, VSGP. Therefore, rise and fall is difficult to measure and, consequently, is not specified.
times may be approximated by the following: The resistive switching time variation versus gate
tr = Q2 x RG/(VGG – VGSP) resistance (Figure 9) shows how typical switching
tf = Q2 x RG/VGSP performance is affected by the parasitic circuit elements. If
where the parasitics were not present, the slope of the curves would
maintain a value of unity regardless of the switching speed.
VGG = the gate drive voltage, which varies from zero to VGG
The circuit used to obtain the data is constructed to minimize
RG = the gate drive resistance
common inductance in the drain and gate circuit loops and
and Q2 and VGSP are read from the gate charge curve.
is believed readily achievable with board mounted
During the turn–on and turn–off delay times, gate current is components. Most power electronic loads are inductive; the
not constant. The simplest calculation uses appropriate data in the figure is taken with a resistive load, which
values from the capacitance curves in a standard equation for approximates an optimally snubbed inductive load. Power
voltage change in an RC network. The equations are: MOSFETs may be safely operated into an inductive load;
td(on) = RG Ciss In [VGG/(VGG – VGSP)] however, snubbing reduces switching losses.
td(off) = RG Ciss In (VGG/VGSP)
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are very important in systems using it as a freewheeling or controlled by the device clearing the stored charge.
commutating diode. Of particular interest are the reverse However, the positive di/dt during tb is an uncontrollable
recovery characteristics which play a major role in diode characteristic and is usually the culprit that induces
determining switching losses, radiated noise, EMI and RFI. current ringing. Therefore, when comparing diodes, the
System switching losses are largely due to the nature of ratio of tb/ta serves as a good indicator of recovery
the body diode itself. The body diode is a minority carrier abruptness and thus gives a comparative estimate of
device, therefore it has a finite reverse recovery time, trr, due probable noise generated. A ratio of 1 is considered ideal and
to the storage of minority carrier charge, QRR, as shown in values less than 0.5 are considered snappy.
the typical reverse recovery wave form of Figure 15. It is this Compared to ON Semiconductor standard cell density
stored charge that, when cleared from the diode, passes low voltage MOSFETs, high cell density MOSFET diodes
through a potential and defines an energy loss. Obviously, are faster (shorter trr), have less stored charge and a softer
repeatedly forcing the diode through reverse recovery reverse recovery characteristic. The softness advantage of
further increases switching losses. Therefore, one would the high cell density diode means they can be forced through
like a diode with short trr and low QRR specifications to reverse recovery at a higher di/dt than a standard cell
minimize these losses. MOSFET diode without increasing the current ringing or the
The abruptness of diode reverse recovery effects the noise generated. In addition, power dissipation incurred
amount of radiated noise, voltage spikes, and current from switching the diode will be less due to the shorter
ringing. The mechanisms at work are finite irremovable recovery time and lower switching losses.
circuit parasitic inductances and capacitances acted upon by
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The Forward Biased Safe Operating Area curves define reliable operation, the stored energy from circuit inductance
the maximum simultaneous drain–to–source voltage and dissipated in the transistor while in avalanche must be less
drain current that a transistor can handle safely when it is than the rated limit and adjusted for operating conditions
forward biased. Curves are based upon maximum peak differing from those specified. Although industry practice is
junction temperature and a case temperature (TC) of 25°C. to rate in terms of energy, avalanche energy capability is not
Peak repetitive pulsed power limits are determined by using a constant. The energy rating decreases non–linearly with an
the thermal response data in conjunction with the procedures increase of peak current in avalanche and peak junction
discussed in AN569, “Transient Thermal temperature.
Resistance–General Data and Its Use.” Although many E–FETs can withstand the stress of
Switching between the off–state and the on–state may drain–to–source avalanche at currents up to rated pulsed
traverse any load line provided neither rated peak current current (IDM), the energy rating is specified at rated
(IDM) nor rated voltage (VDSS) is exceeded and the continuous current (ID), in accordance with industry
transition time (tr,tf) do not exceed 10 µs. In addition the total custom. The energy rating must be derated for temperature
power averaged over a complete switching cycle must not as shown in the accompanying graph (Figure 12). Maximum
exceed (TJ(MAX) – TC)/(RθJC). energy at currents below rated continuous ID can safely be
A Power MOSFET designated E–FET can be safely used assumed to equal the values indicated.
in switching circuits with unclamped inductive loads. For
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avalanche and commutation modes. The energy efficient design also
offers a drain–to–source diode with a fast recovery time. Designed for http://onsemi.com
low voltage, high speed switching applications in power supplies,
converters and PWM motor controls, these devices are particularly 20 AMPERES
well suited for bridge circuits where diode speed and commutating 200 VOLTS
safe operating areas are critical and offer additional safety margin
against unexpected voltage transients.
RDS(on) = 160 mΩ
• Avalanche Energy Specified
• Source–to–Drain Diode Recovery Time Comparable to a N–Channel
Discrete Fast Recovery Diode D
• Diode is Characterized for Use in Bridge Circuits
• IDSS and VDS(on) Specified at Elevated Temperature
• Short Heatsink Tab Manufactured – Not Sheared G
• Specially Designed Leadframe for Maximum Power Dissipation
S
MAXIMUM RATINGS (TC = 25°C unless otherwise noted)
Rating Symbol Value Unit
4
Drain–Source Voltage VDSS 200 Vdc
Drain–Gate Voltage (RGS = 1.0 MΩ) VDGR 200 Vdc D2PAK
CASE 418B
Gate–Source Voltage 1 2
STYLE 2
– Continuous VGS ± 20 Vdc 3
– Non–Repetitive (tp ≤ 10 ms) VGSM ± 40 Vpk
Drain Current – Continuous ID 20 Adc MARKING DIAGRAM
Drain Current – Continuous @ 100°C ID 12 & PIN ASSIGNMENT
Drain Current – Single Pulse (tp ≤ 10 µs) IDM 60 Apk 4
Total Power Dissipation PD 125 Watts Drain
Derate above 25°C 1.0 W/°C
Total Power Dissipation @ TA = 25°C, 2.5 Watts
when mounted with the minimum
T20N20E
recommended pad size
YWW
Operating and Storage Temperature TJ, Tstg – 55 to °C
Range 150
1 2 3
Single Pulse Drain–to–Source Avalanche EAS 600 mJ
Gate Drain Source
Energy – Starting TJ = 25°C
(VDD = 25 Vdc, VGS = 10 Vdc,
T20N20E = Device Code
IL = 20 Apk, L = 3.0 mH, RG = 25 Ω)
Y = Year
Thermal Resistance °C/W WW = Work Week
– Junction to Case RθJC 1.0
– Junction to Ambient RθJA 62.5
ORDERING INFORMATION
– Junction to Ambient, when mounted RθJA 50
with the minimum recommended pad size Device Package Shipping
Maximum Lead Temperature for Soldering TL 260 °C
Purposes, 1/8″ from case for 10 MTB20N20E D2PAK 50 Units/Rail
seconds
MTB20N20ET4 D2PAK 800/Tape & Reel
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Figure 3. On–Resistance versus Drain Current Figure 4. On–Resistance versus Drain Current
and Temperature and Gate Voltage
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Switching behavior is most easily modeled and predicted The capacitance (Ciss) is read from the capacitance curve at
by recognizing that the power MOSFET is charge a voltage corresponding to the off–state condition when
controlled. The lengths of various switching intervals (∆t) calculating td(on) and is read at a voltage corresponding to the
are determined by how fast the FET input capacitance can on–state when calculating td(off).
be charged by current from the generator. At high switching speeds, parasitic circuit elements
The published capacitance data is difficult to use for complicate the analysis. The inductance of the MOSFET
calculating rise and fall because drain–gate capacitance source lead, inside the package and in the circuit wiring
varies greatly with applied voltage. Accordingly, gate which is common to both the drain and gate current paths,
charge data is used. In most cases, a satisfactory estimate of produces a voltage at the source which reduces the gate drive
average input current (IG(AV)) can be made from a current. The voltage is determined by Ldi/dt, but since di/dt
rudimentary analysis of the drive circuit so that is a function of drain current, the mathematical solution is
t = Q/IG(AV) complex. The MOSFET output capacitance also
complicates the mathematics. And finally, MOSFETs have
During the rise and fall time interval when switching a finite internal gate resistance which effectively adds to the
resistive load, VGS remains virtually constant at a level resistance of the driving source, but the internal resistance
known as the plateau voltage, VSGP. Therefore, rise and fall is difficult to measure and, consequently, is not specified.
times may be approximated by the following: The resistive switching time variation versus gate resistance
tr = Q2 x RG/(VGG – VGSP) (Figure 9) shows how typical switching performance is
tf = Q2 x RG/VGSP affected by the parasitic circuit elements. If the parasitics
where were not present, the slope of the curves would maintain a
value of unity regardless of the switching speed. The circuit
VGG = the gate drive voltage, which varies from zero to VGG
used to obtain the data is constructed to minimize common
RG = the gate drive resistance
inductance in the drain and gate circuit loops and is believed
and Q2 and VGSP are read from the gate charge curve.
readily achievable with board mounted components. Most
During the turn–on and turn–off delay times, gate current is power electronic loads are inductive; the data in the figure
not constant. The simplest calculation uses appropriate is taken with a resistive load, which approximates an
values from the capacitance curves in a standard equation for optimally snubbed inductive load. Power MOSFETs may be
voltage change in an RC network. The equations are: safely operated into an inductive load; however, snubbing
td(on) = RG Ciss In [VGG/(VGG – VGSP)] reduces switching losses.
td(off) = RG Ciss In (VGG/VGSP)
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The Forward Biased Safe Operating Area curves define reliable operation, the stored energy from circuit inductance
the maximum simultaneous drain–to–source voltage and dissipated in the transistor while in avalanche must be less
drain current that a transistor can handle safely when it is than the rated limit and adjusted for operating conditions
forward biased. Curves are based upon maximum peak differing from those specified. Although industry practice is
junction temperature and a case temperature (TC) of 25°C. to rate in terms of energy, avalanche energy capability is not
Peak repetitive pulsed power limits are determined by using a constant. The energy rating decreases non–linearly with an
the thermal response data in conjunction with the procedures increase of peak current in avalanche and peak junction
discussed in AN569, “Transient Thermal temperature.
Resistance–General Data and Its Use.” Although many E–FETs can withstand the stress of
Switching between the off–state and the on–state may drain–to–source avalanche at currents up to rated pulsed
traverse any load line provided neither rated peak current current (IDM), the energy rating is specified at rated
(IDM) nor rated voltage (VDSS) is exceeded and the continuous current (ID), in accordance with industry
transition time (tr,tf) do not exceed 10 µs. In addition the total custom. The energy rating must be derated for temperature
power averaged over a complete switching cycle must not as shown in the accompanying graph (Figure 12). Maximum
exceed (TJ(MAX) – TC)/(RθJC). energy at currents below rated continuous ID can safely be
A Power MOSFET designated E–FET can be safely used assumed to equal the values indicated.
in switching circuits with unclamped inductive loads. For
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Another alternative would be to use a ceramic substrate board, the power dissipation can be doubled using the same
or an aluminum core board such as Thermal Cladt. Using footprint.
a board material such as Thermal Clad, an aluminum core
ÇÇ ÇÇÇ ÇÇ
packages, the stencil opening should be the same as the pad
size or a 1:1 registration. This is not the case with the DPAK
and D2PAK packages. If one uses a 1:1 opening to screen
solder onto the drain pad, misalignment and/or
“tombstoning” may occur due to an excess of solder. For
ÇÇ
ÇÇ ÇÇÇÇÇÇ
ÇÇÇÇÇÇ
these two packages, the opening in the stencil for the paste
should be approximately 50% of the tab area. The opening Figure 17. Typical Stencil for DPAK and
for the leads is still a 1:1 registration. Figure 17 shows a D2PAK Packages
typical stencil for the DPAK and D2PAK packages. The
SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • When shifting from preheating to soldering, the
temperature of the device. When the entire device is heated maximum temperature gradient shall be 5°C or less.
to a high temperature, failure to complete soldering within • After soldering has been completed, the device should
a short time could result in device failure. Therefore, the be allowed to cool naturally for at least three minutes.
following items should always be observed in order to Gradual cooling should be used as the use of forced
minimize the thermal stress to which the devices are cooling will increase the temperature gradient and
subjected. result in latent failure due to mechanical stress.
• Always preheat the device. • Mechanical stress or shock should not be applied
• The delta temperature between the preheat and during cooling.
soldering should be 100°C or less.*
• When preheating and soldering, the temperature of the * Soldering a device without preheating can cause
leads and the case must not exceed the maximum excessive thermal shock and stress which can result in
temperature ratings as shown on the data sheet. When damage to the device.
using infrared heating with the reflow soldering
method, the difference shall be a maximum of 10°C. * Due to shadowing and the inability to set the wave height
• The soldering temperature and time shall not exceed to incorporate other surface mount components, the D2PAK
260°C for more than 10 seconds. is not recommended for wave soldering.
http://onsemi.com
779
MTB20N20E
150°C
SOLDER IS LIQUID FOR
40 TO 80 SECONDS
100°C 140°C (DEPENDING ON
MASS OF ASSEMBLY)
100°C
http://onsemi.com
780
!#
Preferred Device
#$%& '(
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P–Channel D2PAK
This Power MOSFET is designed to withstand high energy in the
avalanche and commutation modes. Designed for low voltage, high
http://onsemi.com
speed switching applications in power supplies, converters and power
motor controls, these devices are particularly well suited for bridge
circuits where diode speed and commutating safe operating areas are 23 AMPERES
critical and offer additional safety margin against unexpected voltage 60 VOLTS
transients.
RDS(on) = 120 mΩ
• Avalanche Energy Specified
• IDSS and VDS(on) Specified at Elevated Temperature
P–Channel
MAXIMUM RATINGS (TC = 25°C unless otherwise noted)
ORDERING INFORMATION
DYNAMIC CHARACTERISTICS
Input Capacitance Ciss – 1160 1620 pF
Output Capacitance (VDS = 25 Vd
Vdc, VGS = 0 Vd
Vdc,
Coss – 380 530
f = 1.0 MHz)
Transfer Capacitance Crss – 105 210
SWITCHING CHARACTERISTICS (Note 3.)
Turn–On Delay Time td(on) – 13.8 30 ns
Rise Time (VDD = 30 Vdc, ID = 23 Adc, tr – 98.3 200
VGS = 10 Vdc
Vdc,
Turn–Off Delay Time RG = 9.1 Ω) td(off) – 41 80
Fall Time tf – 62 120
Gate Charge QT – 38 50 nC
(S Figure
(See Fi 8)
(VDS = 48 Vdc, ID = 23 Adc, Q1 – 7.0 –
VGS = 10 Vdc) Q2 – 18 –
Q3 – 14 –
http://onsemi.com
782
MTB23P06V
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and Temperature and Gate Voltage
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Switching behavior is most easily modeled and predicted The capacitance (Ciss) is read from the capacitance curve at
by recognizing that the power MOSFET is charge a voltage corresponding to the off–state condition when
controlled. The lengths of various switching intervals (∆t) calculating td(on) and is read at a voltage corresponding to the
are determined by how fast the FET input capacitance can on–state when calculating td(off).
be charged by current from the generator. At high switching speeds, parasitic circuit elements
The published capacitance data is difficult to use for complicate the analysis. The inductance of the MOSFET
calculating rise and fall because drain–gate capacitance source lead, inside the package and in the circuit wiring
varies greatly with applied voltage. Accordingly, gate which is common to both the drain and gate current paths,
charge data is used. In most cases, a satisfactory estimate of produces a voltage at the source which reduces the gate drive
average input current (IG(AV)) can be made from a current. The voltage is determined by Ldi/dt, but since di/dt
rudimentary analysis of the drive circuit so that is a function of drain current, the mathematical solution is
t = Q/IG(AV) complex. The MOSFET output capacitance also
complicates the mathematics. And finally, MOSFETs have
During the rise and fall time interval when switching a finite internal gate resistance which effectively adds to the
resistive load, VGS remains virtually constant at a level resistance of the driving source, but the internal resistance
known as the plateau voltage, VSGP. Therefore, rise and fall is difficult to measure and, consequently, is not specified.
times may be approximated by the following: The resistive switching time variation versus gate
tr = Q2 x RG/(VGG – VGSP) resistance (Figure 9) shows how typical switching
tf = Q2 x RG/VGSP performance is affected by the parasitic circuit elements. If
where the parasitics were not present, the slope of the curves would
maintain a value of unity regardless of the switching speed.
VGG = the gate drive voltage, which varies from zero to VGG
The circuit used to obtain the data is constructed to minimize
RG = the gate drive resistance
common inductance in the drain and gate circuit loops and
and Q2 and VGSP are read from the gate charge curve.
is believed readily achievable with board mounted
During the turn–on and turn–off delay times, gate current is components. Most power electronic loads are inductive; the
not constant. The simplest calculation uses appropriate data in the figure is taken with a resistive load, which
values from the capacitance curves in a standard equation for approximates an optimally snubbed inductive load. Power
voltage change in an RC network. The equations are: MOSFETs may be safely operated into an inductive load;
td(on) = RG Ciss In [VGG/(VGG – VGSP)] however, snubbing reduces switching losses.
td(off) = RG Ciss In (VGG/VGSP)
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The Forward Biased Safe Operating Area curves define reliable operation, the stored energy from circuit inductance
the maximum simultaneous drain–to–source voltage and dissipated in the transistor while in avalanche must be less
drain current that a transistor can handle safely when it is than the rated limit and adjusted for operating conditions
forward biased. Curves are based upon maximum peak differing from those specified. Although industry practice is
junction temperature and a case temperature (TC) of 25°C. to rate in terms of energy, avalanche energy capability is not
Peak repetitive pulsed power limits are determined by using a constant. The energy rating decreases non–linearly with an
the thermal response data in conjunction with the procedures increase of peak current in avalanche and peak junction
discussed in AN569, “Transient Thermal temperature.
Resistance–General Data and Its Use.” Although many E–FETs can withstand the stress of
Switching between the off–state and the on–state may drain–to–source avalanche at currents up to rated pulsed
traverse any load line provided neither rated peak current current (IDM), the energy rating is specified at rated
(IDM) nor rated voltage (VDSS) is exceeded and the continuous current (ID), in accordance with industry
transition time (tr,tf) do not exceed 10 µs. In addition the total custom. The energy rating must be derated for temperature
power averaged over a complete switching cycle must not as shown in the accompanying graph (Figure 12). Maximum
exceed (TJ(MAX) – TC)/(RθJC). energy at currents below rated continuous ID can safely be
A Power MOSFET designated E–FET can be safely used assumed to equal the values indicated.
in switching circuits with unclamped inductive loads. For
http://onsemi.com
785
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Safe Operating Area Starting Junction Temperature
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Figure 14. Diode Reverse Recovery Waveform Figure 15. D2PAK Power Derating Curve
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Figure 16. Thermal Resistance versus Drain Pad
Area for the D2PAK Package (Typical)
http://onsemi.com
787
MTB23P06V
Another alternative would be to use a ceramic substrate board, the power dissipation can be doubled using the same
or an aluminum core board such as Thermal Cladt. Using footprint.
a board material such as Thermal Clad, an aluminum core
ÇÇ ÇÇÇ
packages, the stencil opening should be the same as the pad
size or a 1:1 registration. This is not the case with the DPAK
and D2PAK packages. If one uses a 1:1 opening to screen
solder onto the drain pad, misalignment and/or
“tombstoning” may occur due to an excess of solder. For
ÇÇ
ÇÇ ÇÇÇ
ÇÇÇÇÇÇ
these two packages, the opening in the stencil for the paste
should be approximately 50% of the tab area. The opening Figure 17. Typical Stencil for DPAK and
for the leads is still a 1:1 registration. Figure 17 shows a D2PAK Packages
typical stencil for the DPAK and D2PAK packages. The
SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • When shifting from preheating to soldering, the
temperature of the device. When the entire device is heated maximum temperature gradient shall be 5°C or less.
to a high temperature, failure to complete soldering within • After soldering has been completed, the device should
a short time could result in device failure. Therefore, the be allowed to cool naturally for at least three minutes.
following items should always be observed in order to Gradual cooling should be used as the use of forced
minimize the thermal stress to which the devices are cooling will increase the temperature gradient and
subjected. result in latent failure due to mechanical stress.
• Always preheat the device. • Mechanical stress or shock should not be applied
• The delta temperature between the preheat and during cooling.
soldering should be 100°C or less.*
• When preheating and soldering, the temperature of the * Soldering a device without preheating can cause
leads and the case must not exceed the maximum excessive thermal shock and stress which can result in
temperature ratings as shown on the data sheet. When damage to the device.
using infrared heating with the reflow soldering
method, the difference shall be a maximum of 10°C. * Due to shadowing and the inability to set the wave height
• The soldering temperature and time shall not exceed to incorporate other surface mount components, the D2PAK
260°C for more than 10 seconds. is not recommended for wave soldering.
http://onsemi.com
788
MTB23P06V
150°C
SOLDER IS LIQUID FOR
40 TO 80 SECONDS
100°C 140°C (DEPENDING ON
MASS OF ASSEMBLY)
100°C
http://onsemi.com
789
)
Preferred Device
#$%& '(
)
N–Channel D2PAK
This Power MOSFET is designed to withstand high energy in the
avalanche and commutation modes. The energy efficient design also
offers a drain–to–source diode with a fast recovery time. Designed for http://onsemi.com
low voltage, high speed switching applications in power supplies,
converters and PWM motor controls. These devices are particularly 29 AMPERES
well suited for bridge circuits where diode speed and commutating 150 VOLTS
safe operating areas are critical and offer additional safety margin
against unexpected voltage transients.
RDS(on) = 70 mΩ
• Avalanche Energy Specified
• Source–to–Drain Diode Recovery Time Comparable to a N–Channel
Discrete Fast Recovery Diode D
• Diode is Characterized for Use in Bridge Circuits
• IDSS and VDS(on) Specified at Elevated Temperature
G
MAXIMUM RATINGS (TC = 25°C unless otherwise noted)
Rating Symbol Value Unit
S
Drain–to–Source Voltage VDSS 150 Vdc
Drain–to–Gate Voltage (RGS = 1.0 MΩ) VDGR 150 Vdc
Gate–to–Source Voltage 4
– Continuous VGS ± 20 Vdc
D2PAK
– Non–Repetitive (tp ≤ 10 ms) VGSM ± 40 Vpk
CASE 418B
1 2
Drain Current – Continuous ID 29 Adc STYLE 2
Drain Current – Continuous @ 100°C ID 19 3
Drain Current – Single Pulse (tp ≤ 10 µs) IDM 102 Apk
MARKING DIAGRAM
Total Power Dissipation PD 125 Watts
Derate above 25°C 1.0 W/°C & PIN ASSIGNMENT
Total Power Dissipation @ TA = 25°C 2.5 Watts 4
(Note 1.) Drain
http://onsemi.com
791
MTB29N15E
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Switching behavior is most easily modeled and predicted The capacitance (Ciss) is read from the capacitance curve at
by recognizing that the power MOSFET is charge a voltage corresponding to the off–state condition when
controlled. The lengths of various switching intervals (∆t) calculating td(on) and is read at a voltage corresponding to the
are determined by how fast the FET input capacitance can on–state when calculating td(off).
be charged by current from the generator. At high switching speeds, parasitic circuit elements
The published capacitance data is difficult to use for complicate the analysis. The inductance of the MOSFET
calculating rise and fall because drain–gate capacitance source lead, inside the package and in the circuit wiring
varies greatly with applied voltage. Accordingly, gate which is common to both the drain and gate current paths,
charge data is used. In most cases, a satisfactory estimate of produces a voltage at the source which reduces the gate drive
average input current (IG(AV)) can be made from a current. The voltage is determined by Ldi/dt, but since di/dt
rudimentary analysis of the drive circuit so that is a function of drain current, the mathematical solution is
t = Q/IG(AV) complex. The MOSFET output capacitance also
complicates the mathematics. And finally, MOSFETs have
During the rise and fall time interval when switching a finite internal gate resistance which effectively adds to the
resistive load, VGS remains virtually constant at a level resistance of the driving source, but the internal resistance
known as the plateau voltage, VSGP. Therefore, rise and fall is difficult to measure and, consequently, is not specified.
times may be approximated by the following: The resistive switching time variation versus gate
tr = Q2 x RG/(VGG – VGSP) resistance (Figure 9) shows how typical switching
tf = Q2 x RG/VGSP performance is affected by the parasitic circuit elements. If
where the parasitics were not present, the slope of the curves would
maintain a value of unity regardless of the switching speed.
VGG = the gate drive voltage, which varies from zero to VGG
The circuit used to obtain the data is constructed to minimize
RG = the gate drive resistance
common inductance in the drain and gate circuit loops and
and Q2 and VGSP are read from the gate charge curve.
is believed readily achievable with board mounted
During the turn–on and turn–off delay times, gate current is components. Most power electronic loads are inductive; the
not constant. The simplest calculation uses appropriate data in the figure is taken with a resistive load, which
values from the capacitance curves in a standard equation for approximates an optimally snubbed inductive load. Power
voltage change in an RC network. The equations are: MOSFETs may be safely operated into an inductive load;
td(on) = RG Ciss In [VGG/(VGG – VGSP)] however, snubbing reduces switching losses.
td(off) = RG Ciss In (VGG/VGSP)
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The switching characteristics of a MOSFET body diode high di/dts. The diode’s negative di/dt during ta is directly
are very important in systems using it as a freewheeling or controlled by the device clearing the stored charge.
commutating diode. Of particular interest are the reverse However, the positive di/dt during tb is an uncontrollable
recovery characteristics which play a major role in diode characteristic and is usually the culprit that induces
determining switching losses, radiated noise, EMI and RFI. current ringing. Therefore, when comparing diodes, the
System switching losses are largely due to the nature of ratio of tb/ta serves as a good indicator of recovery
the body diode itself. The body diode is a minority carrier abruptness and thus gives a comparative estimate of
device, therefore it has a finite reverse recovery time, trr, due probable noise generated. A ratio of 1 is considered ideal and
to the storage of minority carrier charge, QRR, as shown in values less than 0.5 are considered snappy.
the typical reverse recovery wave form of Figure 15. It is this Compared to ON Semiconductor standard cell density
stored charge that, when cleared from the diode, passes low voltage MOSFETs, high cell density MOSFET diodes
through a potential and defines an energy loss. Obviously, are faster (shorter trr), have less stored charge and a softer
repeatedly forcing the diode through reverse recovery reverse recovery characteristic. The softness advantage of
further increases switching losses. Therefore, one would the high cell density diode means they can be forced through
like a diode with short trr and low QRR specifications to reverse recovery at a higher di/dt than a standard cell
minimize these losses. MOSFET diode without increasing the current ringing or the
The abruptness of diode reverse recovery effects the noise generated. In addition, power dissipation incurred
amount of radiated noise, voltage spikes, and current from switching the diode will be less due to the shorter
ringing. The mechanisms at work are finite irremovable recovery time and lower switching losses.
circuit parasitic inductances and capacitances acted upon by
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794
MTB29N15E
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The Forward Biased Safe Operating Area curves define total power averaged over a complete switching cycle must
the maximum simultaneous drain–to–source voltage and not exceed (TJ(MAX) – TC)/(RθJC).
drain current that a transistor can handle safely when it is A power MOSFET designated E–FET can be safely used
forward biased. Curves are based upon maximum peak in switching circuits with unclamped inductive loads. For
junction temperature and a case temperature (TC) of 25°C. reliable operation, the stored energy from circuit inductance
Peak repetitive pulsed power limits are determined by using dissipated in the transistor while in avalanche must be less
the thermal response data in conjunction with the procedures than the rated limit and must be adjusted for operating
discussed in AN569, “Transient Thermal Resistance – conditions differing from those specified. Although industry
General Data and Its Use.” practice is to rate in terms of energy, avalanche energy
Switching between the off–state and the on–state may capability is not a constant. The energy rating decreases
traverse any load line provided neither rated peak current non–linearly with an increase of peak current in avalanche
(IDM) nor rated voltage (VDSS) is exceeded, and that the and peak junction temperature.
transition time (tr, tf) does not exceed 10 µs. In addition the
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MTB29N15E
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SOLDER IS LIQUID FOR
40 TO 80 SECONDS
100°C 140°C (DEPENDING ON
MASS OF ASSEMBLY)
100°C
http://onsemi.com
797
!
Preferred Device
#$%& '(
!
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N–Channel D2PAK
This Power MOSFET is designed to withstand high energy in the
avalanche and commutation modes. Designed for low voltage, high
speed switching applications in power supplies, converters and power http://onsemi.com
motor controls, these devices are particularly well suited for bridge
circuits where diode speed and commutating safe operating areas are 30 AMPERES
critical and offer additional safety margin against unexpected voltage 60 VOLTS
transients.
RDS(on) = 50 mΩ
• Avalanche Energy Specified
• IDSS and VDS(on) Specified at Elevated Temperature
N–Channel
MAXIMUM RATINGS (TC = 25°C unless otherwise noted) D
ORDERING INFORMATION
http://onsemi.com
799
MTB30N06VL
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Figure 3. On–Resistance versus Drain Current Figure 4. On–Resistance versus Drain Current
and Temperature and Gate Voltage
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Switching behavior is most easily modeled and predicted The capacitance (Ciss) is read from the capacitance curve at
by recognizing that the power MOSFET is charge a voltage corresponding to the off–state condition when
controlled. The lengths of various switching intervals (∆t) calculating td(on) and is read at a voltage corresponding to the
are determined by how fast the FET input capacitance can on–state when calculating td(off).
be charged by current from the generator. At high switching speeds, parasitic circuit elements
The published capacitance data is difficult to use for complicate the analysis. The inductance of the MOSFET
calculating rise and fall because drain–gate capacitance source lead, inside the package and in the circuit wiring
varies greatly with applied voltage. Accordingly, gate which is common to both the drain and gate current paths,
charge data is used. In most cases, a satisfactory estimate of produces a voltage at the source which reduces the gate drive
average input current (IG(AV)) can be made from a current. The voltage is determined by Ldi/dt, but since di/dt
rudimentary analysis of the drive circuit so that is a function of drain current, the mathematical solution is
t = Q/IG(AV) complex. The MOSFET output capacitance also
complicates the mathematics. And finally, MOSFETs have
During the rise and fall time interval when switching a finite internal gate resistance which effectively adds to the
resistive load, VGS remains virtually constant at a level resistance of the driving source, but the internal resistance
known as the plateau voltage, VSGP. Therefore, rise and fall is difficult to measure and, consequently, is not specified.
times may be approximated by the following: The resistive switching time variation versus gate
tr = Q2 x RG/(VGG – VGSP) resistance (Figure 9) shows how typical switching
tf = Q2 x RG/VGSP performance is affected by the parasitic circuit elements. If
where the parasitics were not present, the slope of the curves would
maintain a value of unity regardless of the switching speed.
VGG = the gate drive voltage, which varies from zero to VGG
The circuit used to obtain the data is constructed to minimize
RG = the gate drive resistance
common inductance in the drain and gate circuit loops and
and Q2 and VGSP are read from the gate charge curve.
is believed readily achievable with board mounted
During the turn–on and turn–off delay times, gate current is components. Most power electronic loads are inductive; the
not constant. The simplest calculation uses appropriate data in the figure is taken with a resistive load, which
values from the capacitance curves in a standard equation for approximates an optimally snubbed inductive load. Power
voltage change in an RC network. The equations are: MOSFETs may be safely operated into an inductive load;
td(on) = RG Ciss In [VGG/(VGG – VGSP)] however, snubbing reduces switching losses.
td(off) = RG Ciss In (VGG/VGSP)
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The Forward Biased Safe Operating Area curves define reliable operation, the stored energy from circuit inductance
the maximum simultaneous drain–to–source voltage and dissipated in the transistor while in avalanche must be less
drain current that a transistor can handle safely when it is than the rated limit and adjusted for operating conditions
forward biased. Curves are based upon maximum peak differing from those specified. Although industry practice is
junction temperature and a case temperature (TC) of 25°C. to rate in terms of energy, avalanche energy capability is not
Peak repetitive pulsed power limits are determined by using a constant. The energy rating decreases non–linearly with an
the thermal response data in conjunction with the procedures increase of peak current in avalanche and peak junction
discussed in AN569, “Transient Thermal temperature.
Resistance–General Data and Its Use.” Although many E–FETs can withstand the stress of
Switching between the off–state and the on–state may drain–to–source avalanche at currents up to rated pulsed
traverse any load line provided neither rated peak current current (IDM), the energy rating is specified at rated
(IDM) nor rated voltage (VDSS) is exceeded and the continuous current (ID), in accordance with industry
transition time (tr,tf) do not exceed 10 µs. In addition the total custom. The energy rating must be derated for temperature
power averaged over a complete switching cycle must not as shown in the accompanying graph (Figure 12). Maximum
exceed (TJ(MAX) – TC)/(RθJC). energy at currents below rated continuous ID can safely be
A Power MOSFET designated E–FET can be safely used assumed to equal the values indicated.
in switching circuits with unclamped inductive loads. For
http://onsemi.com
802
MTB30N06VL
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Area for the D2PAK Package (Typical)
http://onsemi.com
804
MTB30N06VL
Another alternative would be to use a ceramic substrate board, the power dissipation can be doubled using the same
or an aluminum core board such as Thermal Cladt. Using footprint.
a board material such as Thermal Clad, an aluminum core
ÇÇ ÇÇÇÇÇÇ
packages, the stencil opening should be the same as the pad
size or a 1:1 registration. This is not the case with the DPAK
and D2PAK packages. If one uses a 1:1 opening to screen
solder onto the drain pad, misalignment and/or
“tombstoning” may occur due to an excess of solder. For
ÇÇ ÇÇÇÇÇÇ
these two packages, the opening in the stencil for the paste
Figure 17. Typical Stencil for DPAK and
should be approximately 50% of the tab area. The opening D2PAK Packages
for the leads is still a 1:1 registration. Figure 17 shows a
typical stencil for the DPAK and D2PAK packages. The
SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • When shifting from preheating to soldering, the
temperature of the device. When the entire device is heated maximum temperature gradient shall be 5°C or less.
to a high temperature, failure to complete soldering within • After soldering has been completed, the device should
a short time could result in device failure. Therefore, the be allowed to cool naturally for at least three minutes.
following items should always be observed in order to Gradual cooling should be used as the use of forced
minimize the thermal stress to which the devices are cooling will increase the temperature gradient and
subjected. result in latent failure due to mechanical stress.
• Always preheat the device. • Mechanical stress or shock should not be applied
• The delta temperature between the preheat and during cooling.
soldering should be 100°C or less.*
• When preheating and soldering, the temperature of the * Soldering a device without preheating can cause
leads and the case must not exceed the maximum excessive thermal shock and stress which can result in
temperature ratings as shown on the data sheet. When damage to the device.
using infrared heating with the reflow soldering
method, the difference shall be a maximum of 10°C. * Due to shadowing and the inability to set the wave height
• The soldering temperature and time shall not exceed to incorporate other surface mount components, the D2PAK
260°C for more than 10 seconds. is not recommended for wave soldering.
http://onsemi.com
805
MTB30N06VL
150°C
SOLDER IS LIQUID FOR
40 TO 80 SECONDS
100°C 140°C (DEPENDING ON
MASS OF ASSEMBLY)
100°C
http://onsemi.com
806
!#
Preferred Device
#$%& '(
!
P–Channel D2PAK
This Power MOSFET is designed to withstand high energy in the
avalanche and commutation modes. Designed for low voltage, high
http://onsemi.com
speed switching applications in power supplies, converters and power
motor controls, these devices are particularly well suited for bridge
circuits where diode speed and commutating safe operating areas are 30 AMPERES
critical and offer additional safety margin against unexpected voltage 60 VOLTS
transients.
RDS(on) = 80 mΩ
• Avalanche Energy Specified
• IDSS and VDS(on) Specified at Elevated Temperature
P–Channel
MAXIMUM RATINGS (TC = 25°C unless otherwise noted)
ORDERING INFORMATION
DYNAMIC CHARACTERISTICS
Input Capacitance Ciss – 1562 2190 pF
Output Capacitance (VDS = 25 Vd
Vdc, VGS = 0 Vd
Vdc,
Coss – 524 730
f = 1.0 MHz)
Transfer Capacitance Crss – 154 310
SWITCHING CHARACTERISTICS (Note 3.)
Turn–On Delay Time td(on) – 14.7 30 ns
Rise Time (VDD = 30 Vdc, ID = 30 Adc, tr – 25.9 50
VGS = 10 Vdc
Vdc,
Turn–Off Delay Time RG = 9.1 Ω) td(off) – 98 200
Fall Time tf – 52.4 100
Gate Charge QT – 54 80 nC
(S Figure
(See Fi 8)
(VDS = 48 Vdc, ID = 30 Adc, Q1 – 9.0 –
VGS = 10 Vdc) Q2 – 26 –
Q3 – 20 –
http://onsemi.com
808
MTB30P06V
9 9
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Switching behavior is most easily modeled and predicted The capacitance (Ciss) is read from the capacitance curve at
by recognizing that the power MOSFET is charge a voltage corresponding to the off–state condition when
controlled. The lengths of various switching intervals (∆t) calculating td(on) and is read at a voltage corresponding to the
are determined by how fast the FET input capacitance can on–state when calculating td(off).
be charged by current from the generator. At high switching speeds, parasitic circuit elements
The published capacitance data is difficult to use for complicate the analysis. The inductance of the MOSFET
calculating rise and fall because drain–gate capacitance source lead, inside the package and in the circuit wiring
varies greatly with applied voltage. Accordingly, gate which is common to both the drain and gate current paths,
charge data is used. In most cases, a satisfactory estimate of produces a voltage at the source which reduces the gate drive
average input current (IG(AV)) can be made from a current. The voltage is determined by Ldi/dt, but since di/dt
rudimentary analysis of the drive circuit so that is a function of drain current, the mathematical solution is
t = Q/IG(AV) complex. The MOSFET output capacitance also
complicates the mathematics. And finally, MOSFETs have
During the rise and fall time interval when switching a finite internal gate resistance which effectively adds to the
resistive load, VGS remains virtually constant at a level resistance of the driving source, but the internal resistance
known as the plateau voltage, VSGP. Therefore, rise and fall is difficult to measure and, consequently, is not specified.
times may be approximated by the following: The resistive switching time variation versus gate
tr = Q2 x RG/(VGG – VGSP) resistance (Figure 9) shows how typical switching
tf = Q2 x RG/VGSP performance is affected by the parasitic circuit elements. If
where the parasitics were not present, the slope of the curves would
maintain a value of unity regardless of the switching speed.
VGG = the gate drive voltage, which varies from zero to VGG
The circuit used to obtain the data is constructed to minimize
RG = the gate drive resistance
common inductance in the drain and gate circuit loops and
and Q2 and VGSP are read from the gate charge curve.
is believed readily achievable with board mounted
During the turn–on and turn–off delay times, gate current is components. Most power electronic loads are inductive; the
not constant. The simplest calculation uses appropriate data in the figure is taken with a resistive load, which
values from the capacitance curves in a standard equation for approximates an optimally snubbed inductive load. Power
voltage change in an RC network. The equations are: MOSFETs may be safely operated into an inductive load;
td(on) = RG Ciss In [VGG/(VGG – VGSP)] however, snubbing reduces switching losses.
td(off) = RG Ciss In (VGG/VGSP)
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The Forward Biased Safe Operating Area curves define reliable operation, the stored energy from circuit inductance
the maximum simultaneous drain–to–source voltage and dissipated in the transistor while in avalanche must be less
drain current that a transistor can handle safely when it is than the rated limit and adjusted for operating conditions
forward biased. Curves are based upon maximum peak differing from those specified. Although industry practice is
junction temperature and a case temperature (TC) of 25°C. to rate in terms of energy, avalanche energy capability is not
Peak repetitive pulsed power limits are determined by using a constant. The energy rating decreases non–linearly with an
the thermal response data in conjunction with the procedures increase of peak current in avalanche and peak junction
discussed in AN569, “Transient Thermal temperature.
Resistance–General Data and Its Use.” Although many E–FETs can withstand the stress of
Switching between the off–state and the on–state may drain–to–source avalanche at currents up to rated pulsed
traverse any load line provided neither rated peak current current (IDM), the energy rating is specified at rated
(IDM) nor rated voltage (VDSS) is exceeded and the continuous current (ID), in accordance with industry
transition time (tr,tf) do not exceed 10 µs. In addition the total custom. The energy rating must be derated for temperature
power averaged over a complete switching cycle must not as shown in the accompanying graph (Figure 12). Maximum
exceed (TJ(MAX) – TC)/(RθJC). energy at currents below rated continuous ID can safely be
A Power MOSFET designated E–FET can be safely used assumed to equal the values indicated.
in switching circuits with unclamped inductive loads. For
http://onsemi.com
811
MTB30P06V
6$
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6
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4$
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Figure 11. Maximum Rated Forward Biased Figure 12. Maximum Avalanche Energy versus
Safe Operating Area Starting Junction Temperature
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'* #$
#$ $ :$ #$ $ :$
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Figure 14. Diode Reverse Recovery Waveform Figure 15. D2PAK Power Derating Curve
http://onsemi.com
812
MTB30P06V
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8
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6# #6
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Figure 16. Thermal Resistance versus Drain Pad
Area for the D2PAK Package (Typical)
http://onsemi.com
813
MTB30P06V
Another alternative would be to use a ceramic substrate board, the power dissipation can be doubled using the same
or an aluminum core board such as Thermal Cladt. Using footprint.
a board material such as Thermal Clad, an aluminum core
ÇÇ ÇÇÇ ÇÇ
packages, the stencil opening should be the same as the pad
size or a 1:1 registration. This is not the case with the DPAK
and D2PAK packages. If one uses a 1:1 opening to screen
solder onto the drain pad, misalignment and/or
“tombstoning” may occur due to an excess of solder. For
ÇÇ
ÇÇ ÇÇÇ
ÇÇÇÇÇÇ
these two packages, the opening in the stencil for the paste
should be approximately 50% of the tab area. The opening Figure 17. Typical Stencil for DPAK and
for the leads is still a 1:1 registration. Figure 17 shows a D2PAK Packages
typical stencil for the DPAK and D2PAK packages. The
SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • When shifting from preheating to soldering, the
temperature of the device. When the entire device is heated maximum temperature gradient shall be 5°C or less.
to a high temperature, failure to complete soldering within • After soldering has been completed, the device should
a short time could result in device failure. Therefore, the be allowed to cool naturally for at least three minutes.
following items should always be observed in order to Gradual cooling should be used as the use of forced
minimize the thermal stress to which the devices are cooling will increase the temperature gradient and
subjected. result in latent failure due to mechanical stress.
• Always preheat the device. • Mechanical stress or shock should not be applied
• The delta temperature between the preheat and during cooling.
soldering should be 100°C or less.*
• When preheating and soldering, the temperature of the * Soldering a device without preheating can cause
leads and the case must not exceed the maximum excessive thermal shock and stress which can result in
temperature ratings as shown on the data sheet. When damage to the device.
using infrared heating with the reflow soldering
method, the difference shall be a maximum of 10°C. * Due to shadowing and the inability to set the wave height
• The soldering temperature and time shall not exceed to incorporate other surface mount components, the D2PAK
260°C for more than 10 seconds. is not recommended for wave soldering.
http://onsemi.com
814
MTB30P06V
150°C
SOLDER IS LIQUID FOR
40 TO 80 SECONDS
100°C 140°C (DEPENDING ON
MASS OF ASSEMBLY)
100°C
http://onsemi.com
815
!
Preferred Device
#$%& '(
!
N–Channel D2PAK
This Power MOSFET is designed to withstand high energy in the
avalanche and commutation modes. Designed for low voltage, high
speed switching applications in power supplies, converters and power http://onsemi.com
motor controls, these devices are particularly well suited for bridge
circuits where diode speed and commutating safe operating areas are 32 AMPERES
critical and offer additional safety margin against unexpected voltage 60 VOLTS
transients.
RDS(on) = 40 mΩ
• Avalanche Energy Specified
• IDSS and VDS(on) Specified at Elevated Temperature
N–Channel
MAXIMUM RATINGS (TC = 25°C unless otherwise noted) D
ORDERING INFORMATION
http://onsemi.com
817
MTB36N06V
:# :#
" , " °C
, " #$°C ≥
:
7 #$°C
$6 $6
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Figure 3. On–Resistance versus Drain Current Figure 4. On–Resistance versus Drain Current
and Temperature and Gate Voltage
8
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°C
#
25°C
8
9
F$ F#$ #$ $ :$ #$ $ :$ # 4 6 $ 9
, ,
°
http://onsemi.com
818
MTB36N06V
Switching behavior is most easily modeled and predicted The capacitance (Ciss) is read from the capacitance curve at
by recognizing that the power MOSFET is charge a voltage corresponding to the off–state condition when
controlled. The lengths of various switching intervals (∆t) calculating td(on) and is read at a voltage corresponding to the
are determined by how fast the FET input capacitance can on–state when calculating td(off).
be charged by current from the generator. At high switching speeds, parasitic circuit elements
The published capacitance data is difficult to use for complicate the analysis. The inductance of the MOSFET
calculating rise and fall because drain–gate capacitance source lead, inside the package and in the circuit wiring
varies greatly with applied voltage. Accordingly, gate which is common to both the drain and gate current paths,
charge data is used. In most cases, a satisfactory estimate of produces a voltage at the source which reduces the gate drive
average input current (IG(AV)) can be made from a current. The voltage is determined by Ldi/dt, but since di/dt
rudimentary analysis of the drive circuit so that is a function of drain current, the mathematical solution is
t = Q/IG(AV) complex. The MOSFET output capacitance also
complicates the mathematics. And finally, MOSFETs have
During the rise and fall time interval when switching a finite internal gate resistance which effectively adds to the
resistive load, VGS remains virtually constant at a level resistance of the driving source, but the internal resistance
known as the plateau voltage, VSGP. Therefore, rise and fall is difficult to measure and, consequently, is not specified.
times may be approximated by the following: The resistive switching time variation versus gate
tr = Q2 x RG/(VGG – VGSP) resistance (Figure 9) shows how typical switching
tf = Q2 x RG/VGSP performance is affected by the parasitic circuit elements. If
where the parasitics were not present, the slope of the curves would
maintain a value of unity regardless of the switching speed.
VGG = the gate drive voltage, which varies from zero to VGG
The circuit used to obtain the data is constructed to minimize
RG = the gate drive resistance
common inductance in the drain and gate circuit loops and
and Q2 and VGSP are read from the gate charge curve.
is believed readily achievable with board mounted
During the turn–on and turn–off delay times, gate current is components. Most power electronic loads are inductive; the
not constant. The simplest calculation uses appropriate data in the figure is taken with a resistive load, which
values from the capacitance curves in a standard equation for approximates an optimally snubbed inductive load. Power
voltage change in an RC network. The equations are: MOSFETs may be safely operated into an inductive load;
td(on) = RG Ciss In [VGG/(VGG – VGSP)] however, snubbing reduces switching losses.
td(off) = RG Ciss In (VGG/VGSP)
6
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819
MTB36N06V
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The Forward Biased Safe Operating Area curves define reliable operation, the stored energy from circuit inductance
the maximum simultaneous drain–to–source voltage and dissipated in the transistor while in avalanche must be less
drain current that a transistor can handle safely when it is than the rated limit and adjusted for operating conditions
forward biased. Curves are based upon maximum peak differing from those specified. Although industry practice is
junction temperature and a case temperature (TC) of 25°C. to rate in terms of energy, avalanche energy capability is not
Peak repetitive pulsed power limits are determined by using a constant. The energy rating decreases non–linearly with an
the thermal response data in conjunction with the procedures increase of peak current in avalanche and peak junction
discussed in AN569, “Transient Thermal temperature.
Resistance–General Data and Its Use.” Although many E–FETs can withstand the stress of
Switching between the off–state and the on–state may drain–to–source avalanche at currents up to rated pulsed
traverse any load line provided neither rated peak current current (IDM), the energy rating is specified at rated
(IDM) nor rated voltage (VDSS) is exceeded and the continuous current (ID), in accordance with industry
transition time (tr,tf) do not exceed 10 µs. In addition the total custom. The energy rating must be derated for temperature
power averaged over a complete switching cycle must not as shown in the accompanying graph (Figure 12). Maximum
exceed (TJ(MAX) – TC)/(RθJC). energy at currents below rated continuous ID can safely be
A Power MOSFET designated E–FET can be safely used assumed to equal the values indicated.
in switching circuits with unclamped inductive loads. For
http://onsemi.com
820
MTB36N06V
##$
" #
" 4#
#
" #$°
:$
- ,
$
µ! #$
µ! :$
! $
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#$
#$ $ :$ #$ $ :$
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,
°
Figure 11. Maximum Rated Forward Biased Figure 12. Maximum Avalanche Energy versus
Safe Operating Area Starting Junction Temperature
" $
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#
/
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'
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θ,'
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Figure 14. Diode Reverse Recovery Waveform Figure 15. D2PAK Power Derating Curve
http://onsemi.com
821
MTB36N06V
44
848
8
#4#
6# #6
99 979
6
9
#
4$
94 inches
:# mm
:
θ,
,
$
4$ /)''!
6
$ /)''!
4
#
# 6 9 8 # 6 9
@
Figure 16. Thermal Resistance versus Drain Pad
Area for the D2PAK Package (Typical)
http://onsemi.com
822
MTB36N06V
Another alternative would be to use a ceramic substrate board, the power dissipation can be doubled using the same
or an aluminum core board such as Thermal Cladt. Using footprint.
a board material such as Thermal Clad, an aluminum core
ÇÇ ÇÇÇ ÇÇ
packages, the stencil opening should be the same as the pad
size or a 1:1 registration. This is not the case with the DPAK
and D2PAK packages. If one uses a 1:1 opening to screen
solder onto the drain pad, misalignment and/or
“tombstoning” may occur due to an excess of solder. For
ÇÇ
ÇÇ ÇÇÇ
ÇÇÇÇÇÇ
these two packages, the opening in the stencil for the paste
should be approximately 50% of the tab area. The opening Figure 17. Typical Stencil for DPAK and
for the leads is still a 1:1 registration. Figure 17 shows a D2PAK Packages
typical stencil for the DPAK and D2PAK packages. The
SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • When shifting from preheating to soldering, the
temperature of the device. When the entire device is heated maximum temperature gradient shall be 5°C or less.
to a high temperature, failure to complete soldering within • After soldering has been completed, the device should
a short time could result in device failure. Therefore, the be allowed to cool naturally for at least three minutes.
following items should always be observed in order to Gradual cooling should be used as the use of forced
minimize the thermal stress to which the devices are cooling will increase the temperature gradient and
subjected. result in latent failure due to mechanical stress.
• Always preheat the device. • Mechanical stress or shock should not be applied
• The delta temperature between the preheat and during cooling.
soldering should be 100°C or less.*
• When preheating and soldering, the temperature of the * Soldering a device without preheating can cause
leads and the case must not exceed the maximum excessive thermal shock and stress which can result in
temperature ratings as shown on the data sheet. When damage to the device.
using infrared heating with the reflow soldering
method, the difference shall be a maximum of 10°C. * Due to shadowing and the inability to set the wave height
• The soldering temperature and time shall not exceed to incorporate other surface mount components, the D2PAK
260°C for more than 10 seconds. is not recommended for wave soldering.
http://onsemi.com
823
MTB36N06V
150°C
SOLDER IS LIQUID FOR
40 TO 80 SECONDS
100°C 140°C (DEPENDING ON
MASS OF ASSEMBLY)
100°C
http://onsemi.com
824
Preferred Device
#$%& '(
N–Channel D2PAK
This Power MOSFET is designed to withstand high energy in the
avalanche and commutation modes. The energy efficient design also
offers a drain–to–source diode with a fast recovery time. Designed for http://onsemi.com
low voltage, high speed switching applications in power supplies,
converters and PWM motor controls, these devices are particularly 40 AMPERES
well suited for bridge circuits where diode speed and commutating 100 VOLTS
safe operating areas are critical and offer additional safety margin
against unexpected voltage transients.
RDS(on) = 40 mΩ
• Avalanche Energy Specified
• Source–to–Drain Diode Recovery Time Comparable to a N–Channel
Discrete Fast Recovery Diode D
• Diode is Characterized for Use in Bridge Circuits
• IDSS and VDS(on) Specified at Elevated Temperature
G
MAXIMUM RATINGS (TC = 25°C unless otherwise noted)
Rating Symbol Value Unit
S
Drain–to–Source Voltage VDSS 100 Vdc
Drain–to–Gate Voltage (RGS = 1.0 MΩ) VDGR 100 Vdc
Gate–to–Source Voltage 4
– Continuous VGS ± 20 Vdc
D2PAK
– Non–Repetitive (tp ≤ 10 ms) VGSM ± 40 Vpk
CASE 418B
1 2
Drain Current – Continuous ID 40 Adc STYLE 2
Drain Current – Continuous @ 100°C ID 29 3
Drain Current – Single Pulse (tp ≤ 10 µs) IDM 140 Apk
MARKING DIAGRAM
Total Power Dissipation PD 169 Watts
Derate above 25°C 1.35 W/°C & PIN ASSIGNMENT
Total Power Dissipation @ TA = 25°C 2.5 Watts 4
(Note 1.) Drain
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Temperature Current versus Voltage
http://onsemi.com
827
MTB40N10E
Switching behavior is most easily modeled and predicted The capacitance (Ciss) is read from the capacitance curve at
by recognizing that the power MOSFET is charge a voltage corresponding to the off–state condition when
controlled. The lengths of various switching intervals (∆t) calculating td(on) and is read at a voltage corresponding to the
are determined by how fast the FET input capacitance can on–state when calculating td(off).
be charged by current from the generator. At high switching speeds, parasitic circuit elements
The published capacitance data is difficult to use for complicate the analysis. The inductance of the MOSFET
calculating rise and fall because drain–gate capacitance source lead, inside the package and in the circuit wiring
varies greatly with applied voltage. Accordingly, gate which is common to both the drain and gate current paths,
charge data is used. In most cases, a satisfactory estimate of produces a voltage at the source which reduces the gate drive
average input current (IG(AV)) can be made from a current. The voltage is determined by Ldi/dt, but since di/dt
rudimentary analysis of the drive circuit so that is a function of drain current, the mathematical solution is
t = Q/IG(AV) complex. The MOSFET output capacitance also
complicates the mathematics. And finally, MOSFETs have
During the rise and fall time interval when switching a finite internal gate resistance which effectively adds to the
resistive load, VGS remains virtually constant at a level resistance of the driving source, but the internal resistance
known as the plateau voltage, VSGP. Therefore, rise and fall is difficult to measure and, consequently, is not specified.
times may be approximated by the following: The resistive switching time variation versus gate
tr = Q2 x RG/(VGG – VGSP) resistance (Figure 9) shows how typical switching
tf = Q2 x RG/VGSP performance is affected by the parasitic circuit elements. If
where the parasitics were not present, the slope of the curves would
maintain a value of unity regardless of the switching speed.
VGG = the gate drive voltage, which varies from zero to VGG
The circuit used to obtain the data is constructed to minimize
RG = the gate drive resistance
common inductance in the drain and gate circuit loops and
and Q2 and VGSP are read from the gate charge curve.
is believed readily achievable with board mounted
During the turn–on and turn–off delay times, gate current is components. Most power electronic loads are inductive; the
not constant. The simplest calculation uses appropriate data in the figure is taken with a resistive load, which
values from the capacitance curves in a standard equation for approximates an optimally snubbed inductive load. Power
voltage change in an RC network. The equations are: MOSFETs may be safely operated into an inductive load;
td(on) = RG Ciss In [VGG/(VGG – VGSP)] however, snubbing reduces switching losses.
td(off) = RG Ciss In (VGG/VGSP)
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The Forward Biased Safe Operating Area curves define reliable operation, the stored energy from circuit inductance
the maximum simultaneous drain–to–source voltage and dissipated in the transistor while in avalanche must be less
drain current that a transistor can handle safely when it is than the rated limit and adjusted for operating conditions
forward biased. Curves are based upon maximum peak differing from those specified. Although industry practice is
junction temperature and a case temperature (TC) of 25°C. to rate in terms of energy, avalanche energy capability is not
Peak repetitive pulsed power limits are determined by using a constant. The energy rating decreases non–linearly with an
the thermal response data in conjunction with the procedures increase of peak current in avalanche and peak junction
discussed in AN569, “Transient Thermal temperature.
Resistance–General Data and Its Use.” Although many E–FETs can withstand the stress of
Switching between the off–state and the on–state may drain–to–source avalanche at currents up to rated pulsed
traverse any load line provided neither rated peak current current (IDM), the energy rating is specified at rated
(IDM) nor rated voltage (VDSS) is exceeded and the continuous current (ID), in accordance with industry
transition time (tr,tf) do not exceed 10 µs. In addition the total custom. The energy rating must be derated for temperature
power averaged over a complete switching cycle must not as shown in the accompanying graph (Figure 12). Maximum
exceed (TJ(MAX) – TC)/(RθJC). energy at currents below rated continuous ID can safely be
A Power MOSFET designated E–FET can be safely used assumed to equal the values indicated.
in switching circuits with unclamped inductive loads. For
http://onsemi.com
829
MTB40N10E
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http://onsemi.com
830
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Figure 16. Thermal Resistance versus Drain Pad
Area for the D2PAK Package (Typical)
http://onsemi.com
831
MTB40N10E
Another alternative would be to use a ceramic substrate board, the power dissipation can be doubled using the same
or an aluminum core board such as Thermal Cladt. Using footprint.
a board material such as Thermal Clad, an aluminum core
ÇÇ ÇÇÇÇÇÇ
packages, the stencil opening should be the same as the pad
size or a 1:1 registration. This is not the case with the DPAK
and D2PAK packages. If one uses a 1:1 opening to screen
solder onto the drain pad, misalignment and/or
“tombstoning” may occur due to an excess of solder. For
ÇÇ ÇÇÇÇÇÇ
these two packages, the opening in the stencil for the paste
Figure 17. Typical Stencil for DPAK and
should be approximately 50% of the tab area. The opening D2PAK Packages
for the leads is still a 1:1 registration. Figure 17 shows a
typical stencil for the DPAK and D2PAK packages. The
SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • When shifting from preheating to soldering, the
temperature of the device. When the entire device is heated maximum temperature gradient shall be 5°C or less.
to a high temperature, failure to complete soldering within • After soldering has been completed, the device should
a short time could result in device failure. Therefore, the be allowed to cool naturally for at least three minutes.
following items should always be observed in order to Gradual cooling should be used as the use of forced
minimize the thermal stress to which the devices are cooling will increase the temperature gradient and
subjected. result in latent failure due to mechanical stress.
• Always preheat the device. • Mechanical stress or shock should not be applied
• The delta temperature between the preheat and during cooling.
soldering should be 100°C or less.*
• When preheating and soldering, the temperature of the * Soldering a device without preheating can cause
leads and the case must not exceed the maximum excessive thermal shock and stress which can result in
temperature ratings as shown on the data sheet. When damage to the device.
using infrared heating with the reflow soldering
method, the difference shall be a maximum of 10°C. * Due to shadowing and the inability to set the wave height
• The soldering temperature and time shall not exceed to incorporate other surface mount components, the D2PAK
260°C for more than 10 seconds. is not recommended for wave soldering.
http://onsemi.com
832
MTB40N10E
150°C
SOLDER IS LIQUID FOR
40 TO 80 SECONDS
100°C 140°C (DEPENDING ON
MASS OF ASSEMBLY)
100°C
http://onsemi.com
833
Preferred Device
#$%& '(
N–Channel D2PAK
This Power MOSFET is designed to withstand high energy in the
avalanche and commutation modes. Designed for low voltage, high
speed switching applications in power supplies, converters and power http://onsemi.com
motor controls, these devices are particularly well suited for bridge
circuits where diode speed and commutating safe operating areas are 42 AMPERES
critical and offer additional safety margin against unexpected voltage 60 VOLTS
transients.
RDS(on) = 28 mΩ
• Avalanche Energy Specified
• IDSS and VDS(on) Specified at Elevated Temperature
N–Channel
MAXIMUM RATINGS (TC = 25°C unless otherwise noted) D
ORDERING INFORMATION
http://onsemi.com
835
MTB50N06V
, " #$° " 7 ≥
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http://onsemi.com
836
MTB50N06V
Switching behavior is most easily modeled and predicted The capacitance (Ciss) is read from the capacitance curve at
by recognizing that the power MOSFET is charge a voltage corresponding to the off–state condition when
controlled. The lengths of various switching intervals (∆t) calculating td(on) and is read at a voltage corresponding to the
are determined by how fast the FET input capacitance can on–state when calculating td(off).
be charged by current from the generator. At high switching speeds, parasitic circuit elements
The published capacitance data is difficult to use for complicate the analysis. The inductance of the MOSFET
calculating rise and fall because drain–gate capacitance source lead, inside the package and in the circuit wiring
varies greatly with applied voltage. Accordingly, gate which is common to both the drain and gate current paths,
charge data is used. In most cases, a satisfactory estimate of produces a voltage at the source which reduces the gate drive
average input current (IG(AV)) can be made from a current. The voltage is determined by Ldi/dt, but since di/dt
rudimentary analysis of the drive circuit so that is a function of drain current, the mathematical solution is
t = Q/IG(AV) complex. The MOSFET output capacitance also
complicates the mathematics. And finally, MOSFETs have
During the rise and fall time interval when switching a finite internal gate resistance which effectively adds to the
resistive load, VGS remains virtually constant at a level resistance of the driving source, but the internal resistance
known as the plateau voltage, VSGP. Therefore, rise and fall is difficult to measure and, consequently, is not specified.
times may be approximated by the following: The resistive switching time variation versus gate
tr = Q2 x RG/(VGG – VGSP) resistance (Figure 9) shows how typical switching
tf = Q2 x RG/VGSP performance is affected by the parasitic circuit elements. If
where the parasitics were not present, the slope of the curves would
maintain a value of unity regardless of the switching speed.
VGG = the gate drive voltage, which varies from zero to VGG
The circuit used to obtain the data is constructed to minimize
RG = the gate drive resistance
common inductance in the drain and gate circuit loops and
and Q2 and VGSP are read from the gate charge curve.
is believed readily achievable with board mounted
During the turn–on and turn–off delay times, gate current is components. Most power electronic loads are inductive; the
not constant. The simplest calculation uses appropriate data in the figure is taken with a resistive load, which
values from the capacitance curves in a standard equation for approximates an optimally snubbed inductive load. Power
voltage change in an RC network. The equations are: MOSFETs may be safely operated into an inductive load;
td(on) = RG Ciss In [VGG/(VGG – VGSP)] however, snubbing reduces switching losses.
td(off) = RG Ciss In (VGG/VGSP)
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The Forward Biased Safe Operating Area curves define reliable operation, the stored energy from circuit inductance
the maximum simultaneous drain–to–source voltage and dissipated in the transistor while in avalanche must be less
drain current that a transistor can handle safely when it is than the rated limit and adjusted for operating conditions
forward biased. Curves are based upon maximum peak differing from those specified. Although industry practice is
junction temperature and a case temperature (TC) of 25°C. to rate in terms of energy, avalanche energy capability is not
Peak repetitive pulsed power limits are determined by using a constant. The energy rating decreases non–linearly with an
the thermal response data in conjunction with the procedures increase of peak current in avalanche and peak junction
discussed in AN569, “Transient Thermal temperature.
Resistance–General Data and Its Use.” Although many E–FETs can withstand the stress of
Switching between the off–state and the on–state may drain–to–source avalanche at currents up to rated pulsed
traverse any load line provided neither rated peak current current (IDM), the energy rating is specified at rated
(IDM) nor rated voltage (VDSS) is exceeded and the continuous current (ID), in accordance with industry
transition time (tr,tf) do not exceed 10 µs. In addition the total custom. The energy rating must be derated for temperature
power averaged over a complete switching cycle must not as shown in the accompanying graph (Figure 12). Maximum
exceed (TJ(MAX) – TC)/(RθJC). energy at currents below rated continuous ID can safely be
A Power MOSFET designated E–FET can be safely used assumed to equal the values indicated.
in switching circuits with unclamped inductive loads. For
http://onsemi.com
838
MTB50N06V
6
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" 6#
4#
" #$°
- ,
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Figure 11. Maximum Rated Forward Biased Figure 12. Maximum Avalanche Energy versus
Safe Operating Area Starting Junction Temperature
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Figure 14. Diode Reverse Recovery Waveform Figure 15. D2PAK Power Derating Curve
http://onsemi.com
839
MTB50N06V
44
848
8
#4#
6# #6
99 979
6
9
#
4$
94 inches
:# mm
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Figure 16. Thermal Resistance versus Drain Pad
Area for the D2PAK Package (Typical)
http://onsemi.com
840
MTB50N06V
Another alternative would be to use a ceramic substrate board, the power dissipation can be doubled using the same
or an aluminum core board such as Thermal Cladt. Using footprint.
a board material such as Thermal Clad, an aluminum core
ÇÇ ÇÇÇÇÇÇ
packages, the stencil opening should be the same as the pad
size or a 1:1 registration. This is not the case with the DPAK
and D2PAK packages. If one uses a 1:1 opening to screen
solder onto the drain pad, misalignment and/or
“tombstoning” may occur due to an excess of solder. For
ÇÇ ÇÇÇÇÇÇ
these two packages, the opening in the stencil for the paste
Figure 17. Typical Stencil for DPAK and
should be approximately 50% of the tab area. The opening D2PAK Packages
for the leads is still a 1:1 registration. Figure 17 shows a
typical stencil for the DPAK and D2PAK packages. The
SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • When shifting from preheating to soldering, the
temperature of the device. When the entire device is heated maximum temperature gradient shall be 5°C or less.
to a high temperature, failure to complete soldering within • After soldering has been completed, the device should
a short time could result in device failure. Therefore, the be allowed to cool naturally for at least three minutes.
following items should always be observed in order to Gradual cooling should be used as the use of forced
minimize the thermal stress to which the devices are cooling will increase the temperature gradient and
subjected. result in latent failure due to mechanical stress.
• Always preheat the device. • Mechanical stress or shock should not be applied
• The delta temperature between the preheat and during cooling.
soldering should be 100°C or less.*
• When preheating and soldering, the temperature of the * Soldering a device without preheating can cause
leads and the case must not exceed the maximum excessive thermal shock and stress which can result in
temperature ratings as shown on the data sheet. When damage to the device.
using infrared heating with the reflow soldering
method, the difference shall be a maximum of 10°C. * Due to shadowing and the inability to set the wave height
• The soldering temperature and time shall not exceed to incorporate other surface mount components, the D2PAK
260°C for more than 10 seconds. is not recommended for wave soldering.
http://onsemi.com
841
MTB50N06V
150°C
SOLDER IS LIQUID FOR
40 TO 80 SECONDS
100°C 140°C (DEPENDING ON
MASS OF ASSEMBLY)
100°C
http://onsemi.com
842
Preferred Device
#$%& '(
* %+%
N–Channel D2PAK
This Power MOSFET is designed to withstand high energy in the
avalanche and commutation modes. Designed for low voltage, high
speed switching applications in power supplies, converters and power http://onsemi.com
motor controls, these devices are particularly well suited for bridge
circuits where diode speed and commutating safe operating areas are 42 AMPERES
critical and offer additional safety margin against unexpected voltage 60 VOLTS
transients.
RDS(on) = 32 mΩ
• Avalanche Energy Specified
• IDSS and VDS(on) Specified at Elevated Temperature
N–Channel
MAXIMUM RATINGS (TC = 25°C unless otherwise noted) D
ORDERING INFORMATION
http://onsemi.com
844
MTB50N06VL
7 7
, " #$°C $
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Figure 3. On–Resistance versus Drain Current Figure 4. On–Resistance versus Drain Current
and Temperature and Gate Voltage
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http://onsemi.com
845
MTB50N06VL
Switching behavior is most easily modeled and predicted The capacitance (Ciss) is read from the capacitance curve at
by recognizing that the power MOSFET is charge a voltage corresponding to the off–state condition when
controlled. The lengths of various switching intervals (∆t) calculating td(on) and is read at a voltage corresponding to the
are determined by how fast the FET input capacitance can on–state when calculating td(off).
be charged by current from the generator. At high switching speeds, parasitic circuit elements
The published capacitance data is difficult to use for complicate the analysis. The inductance of the MOSFET
calculating rise and fall because drain–gate capacitance source lead, inside the package and in the circuit wiring
varies greatly with applied voltage. Accordingly, gate which is common to both the drain and gate current paths,
charge data is used. In most cases, a satisfactory estimate of produces a voltage at the source which reduces the gate drive
average input current (IG(AV)) can be made from a current. The voltage is determined by Ldi/dt, but since di/dt
rudimentary analysis of the drive circuit so that is a function of drain current, the mathematical solution is
t = Q/IG(AV) complex. The MOSFET output capacitance also
complicates the mathematics. And finally, MOSFETs have
During the rise and fall time interval when switching a finite internal gate resistance which effectively adds to the
resistive load, VGS remains virtually constant at a level resistance of the driving source, but the internal resistance
known as the plateau voltage, VSGP. Therefore, rise and fall is difficult to measure and, consequently, is not specified.
times may be approximated by the following: The resistive switching time variation versus gate
tr = Q2 x RG/(VGG – VGSP) resistance (Figure 9) shows how typical switching
tf = Q2 x RG/VGSP performance is affected by the parasitic circuit elements. If
where the parasitics were not present, the slope of the curves would
maintain a value of unity regardless of the switching speed.
VGG = the gate drive voltage, which varies from zero to VGG
The circuit used to obtain the data is constructed to minimize
RG = the gate drive resistance
common inductance in the drain and gate circuit loops and
and Q2 and VGSP are read from the gate charge curve.
is believed readily achievable with board mounted
During the turn–on and turn–off delay times, gate current is components. Most power electronic loads are inductive; the
not constant. The simplest calculation uses appropriate data in the figure is taken with a resistive load, which
values from the capacitance curves in a standard equation for approximates an optimally snubbed inductive load. Power
voltage change in an RC network. The equations are: MOSFETs may be safely operated into an inductive load;
td(on) = RG Ciss In [VGG/(VGG – VGSP)] however, snubbing reduces switching losses.
td(off) = RG Ciss In (VGG/VGSP)
9
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http://onsemi.com
846
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The Forward Biased Safe Operating Area curves define reliable operation, the stored energy from circuit inductance
the maximum simultaneous drain–to–source voltage and dissipated in the transistor while in avalanche must be less
drain current that a transistor can handle safely when it is than the rated limit and adjusted for operating conditions
forward biased. Curves are based upon maximum peak differing from those specified. Although industry practice is
junction temperature and a case temperature (TC) of 25°C. to rate in terms of energy, avalanche energy capability is not
Peak repetitive pulsed power limits are determined by using a constant. The energy rating decreases non–linearly with an
the thermal response data in conjunction with the procedures increase of peak current in avalanche and peak junction
discussed in AN569, “Transient Thermal temperature.
Resistance–General Data and Its Use.” Although many E–FETs can withstand the stress of
Switching between the off–state and the on–state may drain–to–source avalanche at currents up to rated pulsed
traverse any load line provided neither rated peak current current (IDM), the energy rating is specified at rated
(IDM) nor rated voltage (VDSS) is exceeded and the continuous current (ID), in accordance with industry
transition time (tr,tf) do not exceed 10 µs. In addition the total custom. The energy rating must be derated for temperature
power averaged over a complete switching cycle must not as shown in the accompanying graph (Figure 12). Maximum
exceed (TJ(MAX) – TC)/(RθJC). energy at currents below rated continuous ID can safely be
A Power MOSFET designated E–FET can be safely used assumed to equal the values indicated.
in switching circuits with unclamped inductive loads. For
http://onsemi.com
847
MTB50N06VL
4
" #
" 6#
" #$° #$
- ,
µ! #
$
µ!
!
!
$
#$ $ :$ #$ $ :$
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,
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Figure 11. Maximum Rated Forward Biased Figure 12. Maximum Avalanche Energy versus
Safe Operating Area Starting Junction Temperature
" $
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#
/
'
'
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θ,'
- - " '&'#
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' !
Figure 13. Thermal Response
4
RθJA = 50°C/W
Board material = 0.065 mil FR–4
#$ Mounted on the minimum recommended footprint
/
/
#
%&'
$
'((
') '+
$
'* #$
#$ $ :$ #$ $ :$
=
°
Figure 14. Diode Reverse Recovery Waveform Figure 15. D2PAK Power Derating Curve
http://onsemi.com
848
MTB50N06VL
44
848
8
#4#
6# #6
99 979
6
9
#
4$
94 inches
:# mm
:
θ,
,
$
4$ /)''!
6
$ /)''!
4
#
# 6 9 8 # 6 9
@
Figure 16. Thermal Resistance versus Drain Pad
Area for the D2PAK Package (Typical)
http://onsemi.com
849
MTB50N06VL
Another alternative would be to use a ceramic substrate board, the power dissipation can be doubled using the same
or an aluminum core board such as Thermal Cladt. Using footprint.
a board material such as Thermal Clad, an aluminum core
ÇÇ ÇÇÇÇÇÇ
packages, the stencil opening should be the same as the pad
size or a 1:1 registration. This is not the case with the DPAK
and D2PAK packages. If one uses a 1:1 opening to screen
solder onto the drain pad, misalignment and/or
“tombstoning” may occur due to an excess of solder. For
ÇÇ ÇÇÇÇÇÇ
these two packages, the opening in the stencil for the paste
Figure 17. Typical Stencil for DPAK and
should be approximately 50% of the tab area. The opening D2PAK Packages
for the leads is still a 1:1 registration. Figure 17 shows a
typical stencil for the DPAK and D2PAK packages. The
SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated • When shifting from preheating to soldering, the
temperature of the device. When the entire device is heated maximum temperature gradient shall be 5°C or less.
to a high temperature, failure to complete soldering within • After soldering has been completed, the device should
a short time could result in device failure. Therefore, the be allowed to cool naturally for at least three minutes.
following items should always be observed in order to Gradual cooling should be used as the use of forced
minimize the thermal stress to which the devices are cooling will increase the temperature gradient and
subjected. result in latent failure due to mechanical stress.
• Always preheat the device. • Mechanical stress or shock should not be applied
• The delta temperature between the preheat and during cooling.
soldering should be 100°C or less.*
• When preheating and soldering, the temperature of the * Soldering a device without preheating can cause
leads and the case must not exceed the maximum excessive thermal shock and stress which can result in
temperature ratings as shown on the data sheet. When damage to the device.
using infrared heating with the reflow soldering
method, the difference shall be a maximum of 10°C. * Due to shadowing and the inability to set the wave height
• The soldering temperature and time shall not exceed to incorporate other surface mount components, the D2PAK
260°C for more than 10 seconds. is not recommended for wave soldering.
http://onsemi.com
850
MTB50N06VL
150°C
SOLDER IS LIQUID FOR
40 TO 80 SECONDS
100°C 140°C (DEPENDING ON
MASS OF ASSEMBLY)
100°C
http://onsemi.com
851
#!.
Preferred Device
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!
* %+%
P–Channel D2PAK
This Power MOSFET is designed to withstand high energy in the
avalanche and commutation modes. The energy efficient design also
offers a drain–to–source diode with a fast recovery time. Designed for http://onsemi.com
low voltage, high speed switching applications in power supplies,
converters and PWM motor controls, these devices are particularly 50 AMPERES
well suited for bridge circuits where diode speed and commutating 30 VOLTS
safe operating areas are critical and offer additional safety margin
against unexpected voltage transients. RDS(on) = 25 mΩ
• Avalanche Energy Specified
• Source–to–Drain Diode Recovery Time Comparable to a P–Channel
Discrete Fast Recovery Diode
• Diode is Characterized for Use in Bridge Circuits
• IDSS and VDS(on) Specified at Elevated Temperature
• Short Heatsink Tab Manufactured – Not Sheared
• Specially Designed Leadframe for Maximum Power Dissipation
MAXIMUM RATINGS (TC = 25°C unless otherwise noted)
Rating Symbol Value Unit 4
Drain–Source Voltage VDSS 30 Vdc D2PAK
Drain–Gate Voltage (RGS = 1.0 MΩ) VDGR 30 Vdc CASE 418B
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