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v ( t) v ( t)
q⋅ τ
µ = "Mobility" = velocity / electric field μ= τ = average interval between scattering
meff
Semiconductor_Devices_14.mcd 1 7/19/2010
From figure, mobilities are not constant!!!
This terribly misleading table gives "Typical mobility values" = values to left of curves above
Book's
Table 5.1 They are not "typical" (!$#!@$!)
They are the values you get if and only if the ion concentration (doping) is low!
Curves above identify NO dependence on electric field: µ is constant = v / ξ So expect v(ξ) always α ξ
Forever? Will velocity really continue to increase with ξ no matter how strong ξ becomes?
No: At very, very large ξ, carrier scattering gets larger and velocity begins to saturate
Why? Carriers become so energetic that their collisions transfer so much energy to crystal that its atoms
vibrate (dance around) more, getting in the way more => Increased scattering, decreased τ and µ
Eventual fall off in mobility (and related phenomena) called "Hot Carrier Effects"
Semiconductor_Devices_14.mcd 2 7/19/2010
b) Actual v(ξ) plot extending to high fields and hot carriers:
7
10
5
10 (Book Figure 5.7)
10
3 Low Field
⎛ volts ⎞
ξ⎜
1 10
2
10
4
10
6 ⎝ cm ⎠
- Velocity saturation (at high fields) is an issue only in newest, smallest, state-of-the-art devices
So we will continue to use following expressions for field driven DRIFT currents:
Jdrift_p = q ⋅ μp ⋅ p ⋅ ξ Jdrift_n = q ⋅ μn ⋅ n ⋅ ξ
Semiconductor_Devices_14.mcd 3 7/19/2010
2) Second type of current: DIFFUSION current due to spontaneous rearrangement of concentration gradients
n or p concentration
d
=> Flux = −D ⋅ Concentration ( x)
dx
x
2
L
D = "Diffusivity" or "diffusion constant" = L = average distance traveled between scattering
2⋅ τ
τ = average time interval between scattering
Multiply fluxes (numbers per area per time) by charge to get current densities (charge per area per time)
d d
Yields "diffusion current densities:" Jdiffusion_p = −q ⋅ Dp ⋅ p Jdiffusion_n = q ⋅ Dn ⋅ n
dx dx
Semiconductor_Devices_14.mcd 4 7/19/2010
4) "Einstein Relationship" between D and µ for a each carrier
Isolated bar of semiconductor w/ doping gradient: Inferred must have compensating drift & diffusion currents
D kB ⋅ T Dp kB ⋅ T Dn kB ⋅ T
Led to: = or more accurately: = and =
μ q μp q μn q
So these D's are not typical either (!$#!@$!) but are instead a special low doping case
Need one more critical piece of knowledge before can put it all together to explain devices!
Semiconductor_Devices_14.mcd 5 7/19/2010
Minority Carrier Thermal Generation and Recombination
Using heat energy, electrons continuously jump up from valence band to conduction band:
Conduction
Band
"Thermal Generation"
=>
creates a pair of n & p
Valence
Band
"Generation Rate" = Gi = Number created / volume / time "i" denotes this intrinsic case
+ function of light intensity (if light energy is larger than bandgap) + f (other energy sources)
NOT function of doping: Total electrons in valence band >> changes induced by doping
Semiconductor_Devices_14.mcd 6 7/19/2010
Reverse process is also continuous:
But recombination rate should be: i) Proportional to the number of electrons trying to recombine
Ri = αr ⋅ n ⋅ p
2
Ri = αr ⋅ ni "recombination rate" in intrinsic material αr to be determined or measured
BUT, in equilibrium generation and recombination rates must be equal (or concentrations would be changing!)
Semiconductor_Devices_14.mcd 7 7/19/2010
2
Gi = Ri = αr ⋅ ni (equation 1)
d
n ( t) = [ generation rate ] - [recombination rate ] = [ generation rate ] - αr ⋅ n ( t) ⋅ p ( t)
dt
Semiconductor_Devices_14.mcd 8 7/19/2010
However, generation rate (valence band to conduction band jumps) depends only on available thermal energy
SHOULD be same here (doped / non-intrinsic case) as was above (undoped / intrinsic case)
2
G = Gi = αr ⋅ ni (using equation 1 above)
So:
d 2
n ( t) = αr ⋅ ni − αr ⋅ n ( t) ⋅ p ( t) Sorta makes sense: change in n α deviation from intrinsic values
dt
d
dt
( no + δn ( t) ) = αr ⋅ ni − αr ⋅ ( no + δn ( t) ) ⋅ ( po + δp ( t) )
2
on left
d
dt
no = 0 plus some algebra:
δn ( t) = αr ⋅ ⎛ ni − no ⋅ po − po ⋅ δn ( t) − no ⋅ δp ( t) − δn ( t) ⋅ δp ( t) ⎞
d 2
dt ⎝ ⎠
At equilibrium, know that no x po = ni2 so 1st and 2nd terms on right will cancel:
d
dt
(
δn ( t) = −αr ⋅ po ⋅ δn ( t) − no ⋅ δp ( t) − δn ( t) ⋅ δp ( t) )
Semiconductor_Devices_14.mcd 9 7/19/2010
LOW LEVEL INJECTION = change in MAJORITY carrier is small compared to its equilibrium value
Assume in derivation above we are dealing with P-type material - so the n in the equations is MINORITY carrier
d
dt
(
δn ( t) = −αr ⋅ po ⋅ δn ( t) − no ⋅ δp ( t) − δn ( t) ⋅ δp ( t) )
FIRST term on right will be largest: - Changes δp and δn tend to be comparable
d
δn ( t) = −αr ⋅ po ⋅ δn ( t)
dt
Semiconductor_Devices_14.mcd 10 7/19/2010
−t
− αr ⋅ po ⋅ t τno 1
δn ( t) = δn ( 0) ⋅ e = δn ( 0) ⋅ e τno = "excess minority carrier lifetime"
αr ⋅ po
n ( t)
−t
τno
δn ( t) = δn ( 0) ⋅ e
δn ( 0)
no
t
Perturbation in minority carrier concentration (away from equilibrium) will die out exponentially
Semiconductor_Devices_14.mcd 11 7/19/2010
Can also loose minority carriers because they flow out of the volume we are considering (escape rather than die!)
x x + ∆x
d
n = Net flux into volume + Net generation rate - Net recombination rate (equation 2)
dt
First term: Net flux into volume = (flow in from left - flow out from right) / ∆x or
Fn ( x) − Fn ( x + ∆x)
d
= − Fn ( x) where Fn(x) is flux (flow) of electrons at x
∆x dx
Semiconductor_Devices_14.mcd 12 7/19/2010
Equation 2 then becomes (now expressing both x and t dependences):
d d n ( x , t)
n ( x , t) = − Fn ( x , t) + Gn −
dt dx τ
Jn ( x , t)
But flux (# / area / time) is just current density (charge / area / time) divided by charge: Fn ( x , t) =
−q
d
Given that Jn = q ⋅ μn ⋅ n ⋅ ξ + q ⋅ Dn ⋅ n get by plugging in above
dx
d d ⎛ d ⎞ n ( x , t)
n ( x , t) = − ⎜ −μn ⋅ n ( x , t) ⋅ ξ ( x , t) − Dn ⋅ n ( x , t) + Gn −
dt dx ⎝ dx ⎠ τ
⎛ d d ⎞ d2 n ( x , t)
= μn ⋅ ⎜ ξ ( x , t) ⋅ n ( x , t) + n ( x , t) ⋅ ξ ( x , t) + Dn n ( x , t) + Gn −
2
⎝ dx dx ⎠ dx τ
In regions where the electric field is ~ constant, this simplifies to (dropping explicit arguments)
d d d2 n
n = μn ⋅ ξ ⋅ n + Dn ⋅ n + Gn − Substitute in n = no + δn remembering that no is a constant
dt dx 2 τ
dx
Semiconductor_Devices_14.mcd 13 7/19/2010
no δn
d d d2
δn = μn ⋅ ξ ⋅ δn + Dn ⋅ δn + Gn − −
dt dx 2 τ τ
dx
Gn, the total generation rate, can be divided into two parts
But the thermal generation rate = equilibrium generation rate = equilibrium recombination rate
Gthermal = Ro = no / τ
So Gthermal - no / τ = 0
d d d2 δn
δn = μn ⋅ ξ ⋅ δn + Dn ⋅ δn + Gnon_thermal −
dt dx 2 τ
dx
Can go through same arguments to count minority holes in N-type material. Then get pair of equations
Semiconductor_Devices_14.mcd 14 7/19/2010
(equation 3)
d d d2
δn
δn = μn ⋅ ξ ⋅ δn + Dn ⋅ δn − + Gnon_thermal
dt dx 2 τ
dx n
"Minority Carrier Continuity Equations"
d d d2 δp
δp = −μp ⋅ ξ ⋅ δp + Dp ⋅ δp − + Gnon_thermal
dt dx 2 τp
dx (equation 4)
Left = Total rate at which the "excess" minority carrier concentration will change with time
Term 4 = Generation due to things other than heat: absorbing light, gamma rays . . .
ASSUMPTIONS:
Semiconductor_Devices_14.mcd 15 7/19/2010
APPLIES ONLY TO MINORITY CARRIERS:
When we are dealing with P-type material, can use electron equation # 3
When we are dealing with N-type material, can use hole equation # 4
But will never use those more complicated equations - so stick with my versions!!
d d
δminority_carrier = +/- μ⋅ ξ⋅ δminority_carrier Drift
dt dx
d2
+ D⋅ δminority_carrier Diffusion
2
dx
δminority_carrier
- Net Recombination
τminority_carrier
Semiconductor_Devices_14.mcd 16 7/19/2010
The important part, understanding what these terms really mean:
d
Drift term requires: δminority_carrier
dx
If no gradient in carrier concentraion, as many drift out of box at right as drifted in at left => no change
d2
Diffusion term requires: D⋅ δminority_carrier
2
dx
So to get more diffusion in to box than out of box must have a gradient of a gradient (a 2nd derivative)
Equations deal only with offsets from equilibrium ("excess carrier" populations)
"DC" components (no and po) were all knocked out by the derivatives!
Semiconductor_Devices_14.mcd 17 7/19/2010
And the very good news:
We will virtually never have to deal with full equations. Instead will treat special cases of:
AND/OR:
AND/OR:
Next Time!
Semiconductor_Devices_14.mcd 18 7/19/2010
Semiconductor_Devices_14.mcd 19 7/19/2010