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characteristics in phase-locked loops FETs. The current mismatch of the charge pump in the PLLs gen-
erates a phase offset which increases spurs in the RLL output sig-
nals. Also, the phase offset reduces the locking range in the wide
Jae-Shin Lee, Min-Sun Keel, Shin-I1 Lim a n d Suki Kim range PLL with the dual loop scheme frequency locking loop and
Conventional CMOS charge pump circuits have some current phase locking loop, especially. When the current rnismatch occurs
mismatching characteristics. The current mismatch of the charge in the charge pump, the amount of the phase offset is given by
pump in the PLLs generates a phase offset, which increases spurs
in the PLL output signals. In particular, it reduces the locking
range in wide range PLLs with a dual loop scheme. A new charge
pump circuit with perfect current matching characteristics is where @E, Aton, Tre3repand A; are the phase offset, the turn-on
proposed. By using an error amplifier and reference current time of the PED, the reference clock period, the charge pump cur-
sources, one can acheve a charge pump with good current rent and the current mismatch of the charge pump, respectively.
matching characteristics.It shows nearly perfect current matching
characteristics over the whole VCO input range, and the amount The amount of reference spur, P,,in the third order PLL is given
of the reference spur is < -75dBc in the PLL output signal. The approximately by
charge pump circuit is implemented in a 0 . 2 5 CMOS
~ process.
p
J
Fig. 1 Proposed charge pump circuit
1.2, r
proposed
charge pump
-751 f , , , , , ,
-80
0 2 4 6 8 10 12 14 16 18 20
current mismatch, %
1010/31
Fig. 3 Reference spur against current mismatch
charge pump output voltage, V charge pump output voltage, V
a b Conditions: I, = l O O p A , f , - SMHz, Aton = 50ns, K ~ C =
O 200MHd
1010/21 V,&, = 16.5kfIz, R = 1.5k6-
Fig. 2 Charge pump current matching characteristic
sinking Fig. 2 shows the current variations against the output voltage
_ - - sourcing variations of the charge pump circuit. For the conventional charge
a Conventional charge pump pump, perfect current matching occurs only when the output volt-
b Proposed charge pump
age of the charge pump, that is the input voltage of the VCO, is
near the centre of the supply voltage. If the output voltage is near
Charge pwnp design: CMOS charge pumps usually have UP and the supply voltage or the ground, the sourcinghking current dif-
DOWN switches implemented with a PMOS FET and an NMOS ference is relatively large. For the proposed charge pump, the
FET, respectively. The conventional CMOS charge pump circuits sourcingkinking current matching is nearly perfect. For the same
have some current mismatching characteristics due to the differ- size of the transistors used in the circuit, the maThum difference
ELECTRONICS LETTERS 9th November 2000 Vol. 36 No. 23 1907
of the sourcing/sinkingcurrent in the conventional charge pump is ing PWM is shown in Fig. 1. Because of the s;nilarity of the
> 13%, but the proposed charge pump has < 1% of that. Fig. 3 modulator waveforms between peak and average current mode
shows the amount of the reference spur against the variations of controls, the approach presented in 131 can be applied in discrete
the current mismatch. While the conventional charge pump has a time small signal modelling of average current mode control. The
maximum reference spur of -52dBc, the proposed charge pump has effect of a compensation network, however, should be considered.
a reference spur < -75dBc. Using the practical sampler model approach, the small signal
model structure of an average current mode control can be drawn
Conclusion: In this Letter we present a new charge pump with as in Fig. 2a. The different sampling instant of the two ideal sam-
nearly perfect current matching characteristics in phase-locked pler presented in this Figure can be unified with some manipula-
loops. The current mismatch in the charge pump generates the tions including modification of compensation network. Fig. 2b
phase offset which increases the spur in the PLL output signal and shows the resultant small signal model structure.
reduces the locking range in the wide range PLL. By using an
error amplifier and a reference current source, we can achieve a
charge pump which has nearly perfect current matching character-
istics and the reference spur < -75dBc. It is implemented in a
0 . 2 5 ~CMOS process and occupies an active area of 200 x
I I =
200pn.
136-701)
E-mail: jaeri@ulsil .korea.ac.kr lul
1245/11
Ts
Shin-I1 Lim (Department of Computer Engineering, Seokyeong
University, Jungleung-Dong, Sungbuk-Gu, Seoul, Korea, 136-704) Fig. 1 Circuit diagram of buck converter employing average current
mode control
References
1 R H E E , ~ . :‘Design of high performance CMOS charge pumps in
phase locked loop’. Proc. IEEE Int. Symp. Circuits and Systems,
1999, Vol. 1, pp. 545-548
2 LEE, WON-HYO, CHO, JUN-DONG, and LEE, SUNG-DAE: ‘A high speed
and low power phase-frequency detector and charge pump. ,Proc. a
ASP-DAC ’99 Asia and South Pacific Design Automation Conf.,
1999, Vol. 1, pp. 269-212
3 VAN PAEMEL, M.: ‘Analysis of a charge pump PLL: New model’,
IEEE Trans. Commun., 1994, 427, pp. 2490-2498
4 HOWARD, P.A., and JONES, A.E.: ‘Improved charge pump phase
detector for digital phase-locked loop’. IEEE Colloquium
Analogue Signal Processing, 1994, pp. 2/1-2/8
I ’ I I.
Basic structure of proposed model: The circuit diagram of an aver- Discrete time small signal model: From the small signal model
age current mode controlled buck converter which is composed of structure shown in Fig. 2b, the discrete time model can be
a power stage, a compensation network and a modulator employ- obtained. As an example, the buck converter is considered as a
1908 ELECTRONICS LETTERS 9th November 2000 Vol. 36 No. 23