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University of Missan
Electrical Engineering Department
Electronic II
Second Year,2015-2016
Part II Lectures
1
University of Missan Field Effect Transistor(FET)
Electrical Engineering Department
Second Year, Electronic II,2015-2016
Basic Definitions:
The FET is a semiconductor device whose operation consists of
controlling the flow of current through a semiconductor channel by application
of an electric field (voltage)There are two categories of FETs: the junction
field-effect transistor (JFET) and the metal-oxide-semiconductor field-effect
transistor (MOSFET). The MOSFET category is further broken-down into:
depletion and enhancement types.
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University of Missan Field Effect Transistor(FET)
Electrical Engineering Department
Second Year, Electronic II,2015-2016
Fig. (1-1)
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University of Missan Field Effect Transistor(FET)
Electrical Engineering Department
Second Year, Electronic II,2015-2016
Fig. (1-2)
JFET Characteristics:
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University of Missan Field Effect Transistor(FET)
Electrical Engineering Department
Second Year, Electronic II,2015-2016
Fig. (1-3)
Fig. (1-4)
When VGS < 0 and VDS some positive value: The effect of the
applied negative-bias VGS is to establish depletion regions similar to
those obtained with VGS = 0 V but at lower levels of VDS. Therefore,
the result of applying a negative bias to the gate is to reach the saturation
level at lower level of VDS, as shown in Fig. 1-5.
Fig. (1-5)
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University of Missan Field Effect Transistor(FET)
Electrical Engineering Department
Second Year, Electronic II,2015-2016
Summary:
Fig. (1-6)
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University of Missan Field Effect Transistor(FET)
Electrical Engineering Department
Second Year, Electronic II,2015-2016
Fig.(1-7)
Shockley's Equation:
For the BJT the output current IC and input controlling current IB were
related by β, which was considered constant for the analysis to be
performed. In equation form:
Unfortunately, this linear relationship does not exist between the output
(ID) and input (VGS) quantities of a JFET. The relationship between
ID and VGS is defined by Shockley's equation:
[1.1]
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University of Missan Field Effect Transistor(FET)
Electrical Engineering Department
Second Year, Electronic II,2015-2016
Transfer Characteristics:
Fig.(1-8)
Table 1-1
Fig.(1-9)
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University of Missan Field Effect Transistor(FET)
Electrical Engineering Department
Second Year, Electronic II,2015-2016
Important Relationships:
Fig.(1-10)
Transconductance Factor:
The change in drain current that will result from a change in gate-to-
source voltage can be determined using the transconductance factor gm in
the following manner:
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University of Missan Field Effect Transistor(FET)
Electrical Engineering Department
Second Year, Electronic II,2015-2016
That is,
[1.2]
And
[1.3]
[1.4]
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University of Missan Field Effect Transistor(FET)
Electrical Engineering Department
Second Year, Electronic II,2015-2016
[1.5]
Fig.[1-12]
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University of Missan Field Effect Transistor(FET)
Electrical Engineering Department
Second Year, Electronic II,2015-2016
Fig.(1-13)
Exercises:
12
University of Missan Field Effect Transistor(FET)
Electrical Engineering Department
Second Year, Electronic II,2015-2016
1. Fixed-Bias Configuration:
Fig(2-1)
Fig.(2-2).
Fig.(2-2)
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University of Missan Field Effect Transistor(FET)
Electrical Engineering Department
Second Year, Electronic II,2015-2016
Example 2-1:
For the circuit of Fig. 2-1 with the following parameters: IDSS = 10 mA,
VP = − 8 V, VDD = + 16 V, VGG = 2 V, RG = 1 MΩ, and RD = 2
kΩ, determine the following: VGSQ, IDQ, VDS, VD, VG, and VS.
Fig.(2-3)
2. Self-Bias Configuration:
Fig.(2-4)
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University of Missan Field Effect Transistor(FET)
Electrical Engineering Department
Second Year, Electronic II,2015-2016
Fig.(2-5)
Example 2-2:
For the circuit of Fig. 2-4 with the following parameters: IDSS = 8 mA,
VP = − 6 V, VDD = + 20 V, RG = 1 MΩ, RS = 1kΩ, and RD = 3.3 kΩ,
determine the following:
Fig. (2-6)
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University of Missan Field Effect Transistor(FET)
Electrical Engineering Department
Second Year, Electronic II,2015-2016
Fig. (2-7)
Fig. (2-8)
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University of Missan Field Effect Transistor(FET)
Electrical Engineering Department
Second Year, Electronic II,2015-2016
For the circuit of Fig. 2-9, the levels of VDQ and IDQ are
specified. Determine the required values of RD and RS.
Fig. (2-9)
(2-10)
Fig. (2-10)
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University of Missan Field Effect Transistor(FET)
Electrical Engineering Department
Second Year, Electronic II,2015-2016
Fig. (2-11)
in Fig. (2-12).
Fig. (2-12)
Example 2-5:
For the circuit of Fig. 2-11 with the following parameters: IDSS = 8
mA, VP = − 4 V, VDD = + 16 V, R1 = 2.1 MΩ, R2 = 270 kΩ, RD = 2.4
kΩ, and RS = 1.5 kΩ, determine the following: VGSQ, IDQ, VD, VS,
VDS, and VDG.
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University of Missan Field Effect Transistor(FET)
Electrical Engineering Department
Second Year, Electronic II,2015-2016
Fig. (2-13)
Determine the following for the circuit of Fig. 2-14; VGSQ, IDQ, VDS, VD,
and VS.
Fig. (2-14)
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University of Missan Field Effect Transistor(FET)
Electrical Engineering Department
Second Year, Electronic II,2015-2016
Fig. (2-15)
Determine VGSQ, IDQ, and VDS for the p-channel JFET of Fig. 2-16.
Fig. (2-16)
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University of Missan Field Effect Transistor(FET)
Electrical Engineering Department
Second Year, Electronic II,2015-2016
Fig. (2-17)
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University of Missan Field Effect Transistor(FET)
Electrical Engineering Department
Second Year, Electronic II,2015-2016
Common-Source Configuration:
Fig. (3-1)
Fig. (3-2)
Fig. (3-2)
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University of Missan Field Effect Transistor(FET)
Electrical Engineering Department
Second Year, Electronic II,2015-2016
Fig.(3-3)
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University of Missan Field Effect Transistor(FET)
Electrical Engineering Department
Second Year, Electronic II,2015-2016
Fig. (3-4)
Fig. (3-5)
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University of Missan Field Effect Transistor(FET)
Electrical Engineering Department
Second Year, Electronic II,2015-2016
Common-Gate Configuration:
Fig. (3-6)
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University of Missan Field Effect Transistor(FET)
Electrical Engineering Department
Second Year, Electronic II,2015-2016
Fig. (3.7)
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University of Missan Field Effect Transistor(FET)
Electrical Engineering Department
Second Year, Electronic II,2015-2016
For the JFET amplifier circuit of Fig. 3-8 with parameter gm = 2.2 mS,
determine: Zi, Zo, Z o′ , Av = Vo/Vi, Ai = Io/Ii, Avs =Vo /Vs and Vo .
Assume rd >10RD .
Fig. (3-8)
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University of Missan Field Effect Transistor(FET)
Electrical Engineering Department
Second Year, Electronic II,2015-2016
Complete the design of the JFET amplifier circuit shown in Fig. 3-9 to
have a voltage gain =7.5, using a relatively high level of gm for this
device defined at VGSQ = VP/4. Assume rd >10RD
Fig. (3-9)
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University of Missan Field Effect Transistor(FET)
Electrical Engineering Department
Second Year, Electronic II,2015-2016
MOSFET
1. DEPLETION-TYPE MOSFET
There are two types of FETs: JFETs and MOSFETs. MOSFETs are
further broken down into depletion type and enhancement type. The
terms depletion and enhancement define their basic mode of operation,
while the label MOSFET stands for metal-oxide-semiconductor-field-
effect transistor. Since there are differences in the characteristics and
operation of each type of MOSFET, they are covered in separate sections.
In this section we examine the depletion-type MOSFET, which happens
to have characteristics similar to those of a JFET between cutoff and
saturation at IDSS but then has the added feature of characteristics that
extend into the region of opposite polarity for VGS.
Basic Construction
Fig. (1-1)
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University of Missan Field Effect Transistor(FET)
Electrical Engineering Department
Second Year, Electronic II,2015-2016
In addition:
In Fig. 1-2 the gate-to-source voltage is set to zero volts by the direct
connection from one terminal to the other, and a voltage V DS is applied
across the drain-to-source terminals. The result is an attraction for the
positive potential at the drain by the free electrons of the n-channel and a
current similar to that established through the channel of the JFET. In
fact, the resulting current with VGS =0 V continues to be labeled IDSS, as
shown in Fig. 1-3.
Fig. (1-2)
Fig.(1-3)
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University of Missan Field Effect Transistor(FET)
Electrical Engineering Department
Second Year, Electronic II,2015-2016
In Fig. 1-4, VGS has been set at a negative voltage such as 1 V. The
negative potential at the gate will tend to pressure electrons toward the p-
type substrate and attract holes from the p-type substrate (opposite
charges attract) as shown in Fig. 1-4. Depending on the magnitude of the
negative bias established by VGS , a level of recombination between
electrons and holes will occur that will reduce the number of free
electrons in the n-channel available for conduction. The more negative
the bias, the higher the rate of recombination. The resulting level of drain
current is therefore reduced with increasing negative bias for VGS as
shown in Fig. 1-3 for VGS= 1 V, 2 V, and so on, to the pinch-off level of 6
V. The resulting levels of drain current and the plotting of the transfer
curve proceeds exactly as described for the JFET.
Fig.(1-4)
Example
Solution
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University of Missan Field Effect Transistor(FET)
Electrical Engineering Department
Second Year, Electronic II,2015-2016
all of which appear in Fig. 1-5.Before plotting the positive region of VGS
Fig.(1-5)
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University of Missan Field Effect Transistor(FET)
Electrical Engineering Department
Second Year, Electronic II,2015-2016
Fig. (1-6)
Fig. (1-7)
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University of Missan Field Effect Transistor(FET)
Electrical Engineering Department
Second Year, Electronic II,2015-2016
2. ENHANCEMENT-TYPE MOSFET
Although there are some similarities in construction and mode of
operation between depletion-type and enhancement-type MOSFETs, the
characteristics of the enhancement-type MOSFET are quite different from
anything obtained thus far. The transfer curve is not defined by
Shockley’s equation, and the drain current is now cut off until the gate-to-
source voltage reaches a specific magnitude. In particular, current control
in an n-channel device is now effected by a positive gate-to-source
voltage rather than the range of negative voltages encountered for n-
channel JFETs and n-channel depletion-type MOSFETs.
Basic Construction
The basic construction of the n-channel enhancement-type MOSFET
is provided in Fig. 2-1. A slab of p-type material is formed from a silicon
base and is again referred to as the substrate.
Fig. (2-1)
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University of Missan Field Effect Transistor(FET)
Electrical Engineering Department
Second Year, Electronic II,2015-2016
Fig. (2-2)
As VGS is increased beyond the threshold level, the density of free carriers
in the induced channel will increase, resulting in an increased level of
drain current. However, if we hold VGS constant and increase the level of
VDS , the drain current will eventually reach a saturation level as occurred
for the JFET and depletion-type MOSFET. The leveling off of IDDS is due
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University of Missan Field Effect Transistor(FET)
Electrical Engineering Department
Second Year, Electronic II,2015-2016
Fig. (2-3)
In fact, the saturation level for VDS is related to the level of applied VGS
by:
Obviously, therefore, for a fixed value of VT , then the higher the level of
VGS , the more the saturation level for VDS, as shown in Fig. 2-3 .
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University of Missan Field Effect Transistor(FET)
Electrical Engineering Department
Second Year, Electronic II,2015-2016
Fig.(2-4)
For values of VGS less than the threshold level, the drain current
of an enhancement-type MOSFET is 0 mA.
Figure 2-4 clearly reveals that as the level of VGS increased from VT to
8 V, the resulting saturation level for ID also increased from a level of 0 to
10 mA. In addition, it is quite noticeable that the spacing between the
levels of VGS increased as the magnitude of VGS increased, resulting in
ever-increasing increments in drain current. For levels of VGS>V , the
drain current is related to the applied gate-to-source voltage by the
following nonlinear relationship:
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University of Missan Field Effect Transistor(FET)
Electrical Engineering Department
Second Year, Electronic II,2015-2016
Fig.(2-5)
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University of Missan Field Effect Transistor(FET)
Electrical Engineering Department
Second Year, Electronic II,2015-2016
MOSFET Biasing
1- DEPLETION-TYPE MOSFETs
EXAMPLE :1
(b) VDS.
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University of Missan Field Effect Transistor(FET)
Electrical Engineering Department
Second Year, Electronic II,2015-2016
Solution
(a) For the transfer characteristics, a plot point is defined by ID= IDSS/4 _
6mA/4 _1.5 mA and VGS=VP/2 =3 V/2 =1.5 V. Considering the level of
VP and the fact that Shockley’s equation defines a curve that rises more
rapidly as VGS becomes more positive, a plot point will be defined at
VGS=+1 V. Substituting into Shockley’s equation yields.
Fig.(1-1)
The plot points and resulting bias line appear in Fig.(1-1), the resulting
operating points:
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University of Missan Field Effect Transistor(FET)
Electrical Engineering Department
Second Year, Electronic II,2015-2016
Example:2
Solution:
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University of Missan Field Effect Transistor(FET)
Electrical Engineering Department
Second Year, Electronic II,2015-2016
H.W2: Determine
following network.
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University of Missan Field Effect Transistor(FET)
Electrical Engineering Department
Second Year, Electronic II,2015-2016
2- ENHANCEMENT-TYPE MOSFETs
The transfer characteristics of the enhancement-type MOSFET are quite
different from those encountered for the JFET and depletion-type
MOSFETs, resulting in a graphical solution quite different from the
preceding sections. First and foremost, recall that for the n-channel
enhancement-type MOSFET, the drain current is zero for levels of gate-
to-source voltage less than the threshold level VGS(Th) , as shown in Fig. 2-
1. For levels of VGS greater than VGS(Th), the drain current is defined by
Fig.(2-1)
And:
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University of Missan Field Effect Transistor(FET)
Electrical Engineering Department
Second Year, Electronic II,2015-2016
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University of Missan Field Effect Transistor(FET)
Electrical Engineering Department
Second Year, Electronic II,2015-2016
Solution:
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University of Missan Field Effect Transistor(FET)
Electrical Engineering Department
Second Year, Electronic II,2015-2016
46
University of Missan Field Effect Transistor(FET)
Electrical Engineering Department
Second Year, Electronic II,2015-2016
Solution:
When VGS=0v
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University of Missan Field Effect Transistor(FET)
Electrical Engineering Department
Second Year, Electronic II,2015-2016
COMBINATION NETWORKS
Now that the dc analysis of a variety of BJT and FET configurations is
established, the opportunity to analyze networks with both types of
devices presents itself. Fundamentally, the analysis simply requires that
we first approach the device that will provide a terminal voltage or
current level. The door is then usually open to calculate other quantities
and concentrate on the remaining unknowns. These are usually
particularly interesting problems due to the challenge of finding the
opening and then using the results of the past few sections to find the
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University of Missan Field Effect Transistor(FET)
Electrical Engineering Department
Second Year, Electronic II,2015-2016
important quantities for each device. The equations and relationships used
are simply those we have now employed on more than one occasion—no
need to develop any new methods of analysis.
Example:
Determine the level of VC and VD for the following network:
Solution:
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University of Missan Field Effect Transistor(FET)
Electrical Engineering Department
Second Year, Electronic II,2015-2016
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University of Missan Field Effect Transistor(FET)
Electrical Engineering Department
Second Year, Electronic II,2015-2016
Example :(Design)
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University of Missan Field Effect Transistor(FET)
Electrical Engineering Department
Second Year, Electronic II,2015-2016
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University of Missan Field Effect Transistor(FET)
Electrical Engineering Department
Second Year, Electronic II,2015-2016
1. DEPLETION-TYPE MOSFETs
The fact that Shockley’s equation is also applicable to depletion-type
MOSFETs results in the same equation for gm. In fact, the ac equivalent
model for D-MOSFETs is exactly the same as that employed for JFETs
as shown in Fig. 1-1.The only difference offered by D-MOSFETs is that
VGSQ can be positive for n-channel devices and negative for p-channel
units. The result is that gm can be greater than gm0 as demonstrated by the
example to follow. The range of rd is very similar to that encountered for
JFETs.
Fig.(1-1)
Example:
The network of 1-2 was analyzed as (first H.W), resulting in VGSQ= 0.35V
and IDQ= 7.6 mA.
(a) Determine gm and compare to g m0.
(b) Find rd.
(c) Sketch the ac equivalent network for
Fig. 1-2.
(d) Find Zi.
(e) Calculate Zo.
(f ) Find Av. Fig. (1-2)
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University of Missan Field Effect Transistor(FET)
Electrical Engineering Department
Second Year, Electronic II,2015-2016
Solution:
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University of Missan Field Effect Transistor(FET)
Electrical Engineering Department
Second Year, Electronic II,2015-2016
2. Enhancement-TYPE MOSFETs:
Fig.(2-1)
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University of Missan Field Effect Transistor(FET)
Electrical Engineering Department
Second Year, Electronic II,2015-2016
Fig.(2-2)
Zi: Applying Kirchhoff's current law to the output circuit (at node D in
Fig.2-2) results in:
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University of Missan Field Effect Transistor(FET)
Electrical Engineering Department
Second Year, Electronic II,2015-2016
Zo: Substituting Vi=0 V will result in Vgs= 0 V and gmVgs=0, with a short
circuit path from gate to ground as shown in Fig. 2-3. RF, rd and , RD are
then in parallel.
Zo=RFrdRD
Normally, RF is so much larger than rdRD that
Zo rdRD
And with rd≥10RD
ZoRD RF>> rdRD, rd≥10RD
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University of Missan Field Effect Transistor(FET)
Electrical Engineering Department
Second Year, Electronic II,2015-2016
Example: The E-MOSFET of Fig 2-4 was analyzed in Example **, with
the result that k =0.24 x 10-3A/V2, VGSQ= 6.4 V, and IDQ= 2.75 mA.
(a) Determine gm.
(b) Find rd.
(c) Calculate Zi with and without rd. Compare results.
(d) Find Zo with and without rd. Compare results.
(e) Find Av with and without rd. Compare results.
Fig.(2-4)
Solution:
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University of Missan Field Effect Transistor(FET)
Electrical Engineering Department
Second Year, Electronic II,2015-2016
59
University of Missan Field Effect Transistor(FET)
Electrical Engineering Department
Second Year, Electronic II,2015-2016
Fig.(2-5)
Fig.(2-6)
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University of Missan Field Effect Transistor(FET)
Electrical Engineering Department
Second Year, Electronic II,2015-2016
Solution:
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University of Missan Field Effect Transistor(FET)
Electrical Engineering Department
Second Year, Electronic II,2015-2016
H.W: Choose the values of RD and Rs for the network bellow that
will result in a gain of 8 using a relatively high level of gm for this
device defined at VGSQ=1/4-VP.
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