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ECE606: Solid State Devices
ECE606: Solid State Devices
Lecture 37: Nonideal Effects in MOSFET
Muhammad Ashraful Alam
alam@purdue.edu
Alam ECE‐606 S09 1
Topic Map
Equilibrium DC Small
Small Large
Large Circuits
signal Signal
Diode
Schottky
BJT/HBT
MOS
Alam ECE‐606 S09 2
Outline
1. Flat band voltage
2. Threshold voltage shift due to trapped charges
3. Physics of interface traps μ0 Cox
ID = (VG − Vth ) 2
Lch
4 Conclusion
4.
γ M QM QF QIT (φs )
Vth = Vth ,ideal + φMMSS − − −
Cox Cox Cox
REF Ch
REF. Chapter 18, SDF
18 SDF
Alam ECE‐606 S09 3
(1) Idealized MOS Capacitor
Vacuum level
χi
y Substrate (p)
χs
Φm
EC
Recall that
Recall that EF
EV
Qi = Cox (VG − Vth ,ideal )
QB
Vth , ideal =ψ s −
Cox metal insulator p semiconductor
p
ψ s = 2φF
Alam ECE‐606 S09 4
Potential, Field, Charges
V
χi
χs
x
Φm
E
x
Vbi=0 ρ
x
Alam ECE‐606 S09 5
Real MOS Capacitor with ΦM < ΦS
Note the difference
EVAC
Φ M = qφ m χS
qψ S > 0 EC
ΦS
EC
EF
EF
EV
EV
EC
EF VG = VFB < 0 EC
EV EF
EV
qVbi = ( χ s + Eg − Δ p ) − Φ M
Vacuum level
qVbi
= qVFB ≡ φMS
χs
Φm EC
Th f
Therefore, EF
EV
Qi = Cox (VG − Vth )
⎛ QB ⎞
Vth = ⎜ 2φF − ⎟ − VFB
⎝ Cox ⎠
Alam ECE‐606 S09 8
Measure of Flat‐band shift from C‐V Characteristics
C/Cox
Id l Vth
Ideal V
VG
Actual Vth
Alam ECE‐606 S09 9
Outline
1 Flat band voltage
1. Flat band voltage
2. VT‐shift due to trapped charges
3. Physics of interface traps
4. Conclusion
γ M QM QF QIT (φs )
Vth = Vth ,ideal + φMS − − −
Cox Cox Cox
Alam ECE‐606 S09 10
(2) Idealized MOS Capacitor
Vacuum level
χi
y Substrate (p)
χs
Φm
EC
Qox=0
EF
Recall that
EV
Qi = Cox (VG − Vth ,ideal )
QB
Vth , ideal = ψ s −
Cox ψ s = 2φF metal insulator p semiconductor
Alam ECE‐606 S09 11
Distributed Trapped charge in the Oxide
xO
XO
EC QM = ∫ρ
0
ox ( x)dx
EF x0
EV xM ∫ xρ ox ( x)dx
γM ≡ = 0
x0
x x0
0 x0 ∫ ρ ox ( x)dx
0
QF QM
Vthh = ψ S − −γM
Cox Cox
Alam ECE‐606 S09 12
An Intuitive View Reduced gate charge
Bulk charge
Ideal charge free oxide
Ideal charge‐free oxide
‐E
0
‐E
Interface charge
0
E
‐E
Alam ECE‐606 S09 13
Gate Voltage and Oxide Charge
VG = ΔVox + ψ s
E ( x0 )
ρox ( x ')dx '
x0
d Vox dE ox ρ ox ( x)
2
− = =
κ ox
∫ dE ox = ∫x κ oxε 0
ox ε 0
2
dx dx E ( x)
κ ρ ( x ')dx '
x0 x0
ΔVox = S x0E S ( x0 ) − ∫ dx ∫ ox ‐E
κ ox 0 x κ oxε 0
κ
x0
x ρ ( x)dx 0
= S x0E S ( x0 ) − ∫ ox
κ ox 0 κ oxε 0
Alam ECE‐606 S09 14
Gate Voltage and Oxide Charge
κS x ρ ox ( x)dx
x0
ΔVox = x0E S ( x0 ) − ∫
κo 0 ⎛ κ oxε 0 ⎞
⎜ ⎟ x0
⎝ x0 ⎠
κS
x0
1
=
κ ox
x0E S ( x0 ) − ∫
Cox x0 0
x ρ ox ( x)dx
x0
1
= Vth , ideal −
Cox x0 ∫ xρ
0
ox ( x)dx
QM
= Vth , ideal − γM
Cox
Alam ECE‐606 S09 15
Interpretation for Bulk Charge
C/Cox
x0
1
Vth = Vth ,ideal −
Co x0 ∫ xρ
0
ox ( x)δ ( x − x1 )dx
= Vth , ideal −
x1 QM ( x1 ) Ideal VT
x0 Co VG
New VT
Alam ECE‐606 S09 16
Interpretation for Interface Charge
C/Cox
x0
1
Vth = Vth* −
Co x0 ∫ xρ
0
ox ( x)δ ( x − xo )dx
Q
Ideal VT
= Vth* − F VG
Co New VT
Alam ECE‐606 S09 17
Time‐dependent shift of Trapped Charge
C/Cox
x0
1
Vth = Vth , ideal −
Cox x0 ∫ xQ
0
ox ( x) × δ ( x − x1 (t ))dx
x1 (t ) Qox ( x) Ideal VT
= Vth , ideal − ×
x0 Cox VG
ρion
x x
0.1xo 0.9xo
0 xo 0 xo
Alam ECE‐606 S09 19