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Article history: Single crystals of rhenium doped tungsten diselenide i.e. Rex W1−x Se2 (x = 0, 0.0005, 0.001, 0.05, 0.1) are
Received 24 May 2008 grown by vapour phase technique. The stoichiometry of grown single crystals is confirmed by energy
Received in revised form 11 May 2009 dispersive analysis of X-rays. X-ray powder diffractograms obtained of these compounds were used for
Accepted 28 May 2009
lattice parameter determination based on hexagonal system similar to that of host WSe2 .The crystallite
size for each sample for different reflection is calculated using Scherrer’s formula. Surface morphology as
PACS:
observed under optical microscope reflects that screw dislocation mechanism is responsible for growth
68.55.a
of crystals. Electrical properties viz. Hall effect at room temperature, resistivity measurements at low
68.55jk
81.10jt
temperature, and high pressure resistivity measurements indicates the semiconducting behaviour of
Rex W1−x Se2 (x = 0, 0.0005, 0.001, 0.05, 0.1) single crystals. Thermoelectric power measurements shows
Keywords: p-type nature of host WSe2 whereas n-type nature of rhenium doped WSe2 which matches with the
Semiconductors results of Hall effect.
Crystal growth © 2009 Elsevier B.V. All rights reserved.
Electrical properties
Microstructure
0254-0584/$ – see front matter © 2009 Elsevier B.V. All rights reserved.
doi:10.1016/j.matchemphys.2009.05.058
Author's personal copy
M.P. Deshpande et al. / Materials Chemistry and Physics 117 (2009) 350–354 351
Table 1
Values of Hall coefficient (RH ), carrier concentration, resistivity () and mobility () for Rex W1−x Se2 (x = 0, 0.0005, 0.001, 0.05, 0.1) single crystals.
Sample Hall coefficient RH (cm3 C−1 ) Carrier concentration (cm−3 ) Resistivity ( cm) Mobility (cm2 V−1 S−1 ) Type
ampoules evacuated to 10−5 torr respectively. The ampoule is kept technique. Fig. 2 shows a plot of resistivity versus reciprocal of
into a two-zone horizontal temperature gradient furnace in which temperature for all these samples. In all cases, it is observed that
higher temperature zone of the furnace is maintained at 1080 ◦ C resistivity decreases with increase in temperature and from the lin-
while the lower temperature zone is kept at 1060 ◦ C. The tempera- ear region in the plots the corresponding activation energies are
ture of the furnace is increased slowly at the rate of 50 ◦ C h−1 till it determined and displayed in Table 2.
attains the required temperature and is kept in the furnace for 10
days. The furnace is then allowed to cool down slowly to room tem- 2.6. Thermoelectric power measurement
perature resulting in growth of large number of crystals at the cooler
end of the ampoule. All these crystals are black, opaque and plate- Thermoelectric power measurements on Rex W1−x Se2 single
like. The same growth conditions are repeated for all composition crystals are carried out in the temperature range of 300–420 K. The
of Rex W1−x Se2 single crystals. Seebeck coefficient is found to be positive for WSe2 whereas neg-
ative in rhenium doped samples of WSe2 and supports our Hall
2.2. Structural characterization measurement results and also matches with [18].
Resistivity measurements are carried out on Rex W1−x Se2 sin- Fig. 1. (a) A pattern of a hexagonal spiral for WSe2 single crystal. (b) A pattern of a
gle crystals in the temperature range of 80–300 K by four probe hexagonal spiral for Re doped WSe2 single crystal.
Author's personal copy
352 M.P. Deshpande et al. / Materials Chemistry and Physics 117 (2009) 350–354
Fig. 2. Plot of conductivity versus reciprocal of temperature for Rex W1−x Se2 (x = 0,
0.0005, 0.001, 0.05, 0.1) single crystals.
Table 2
Values of activation energy (eV) determined for Rex W1 −x Se2 (x = 0,
0.0005, 0.001, 0.05, 0.1) single crystals.
WSe2 0.027
Re0.0005 W0.9995 Se2 0.031
Re0.001 W0.9990 Se2 0.032
Re0.05 W0.95 Se2 0.036
Re0.1 W0.9 Se2 0.047
Table 3
Values of constant (A) and scattering parameter (s) of Rex W1 −x Se2 (x = 0, 0.0005,
0.001, 0.05, 0.1) single crystals.
Sample A s = (5/2) − A
M.P. Deshpande et al. / Materials Chemistry and Physics 117 (2009) 350–354 353
whereas we have not added any transporting agent for the growth.
Similar kind of observations with different dopants in tungsten
diselenide has been reported [21–24]. As reported in [15] that
besides changing the material from p-type to n-type the values
of carrier concentration increases whereas the mobility decreases
with substitutional doping or intercalation. Thus our results have a
close resemblance with the above-observed results. The decrease
in mobility may be attributed due to the presence of more defects
in rhenium doped tungsten diselenide and increase in carrier con-
centration may be due to the donation of more electrons to the host
material.
As shown in Fig. 2 it appears that conductivity for all samples
increases with increase in temperature showing the typical semi-
conducting behaviour and from the region of straight lines the
slopes are being determined which gives the activation energy.
The values of activation energies as determined for all the sam-
ples are listed in Table 2 respectively. For n-type Rex W1−x Se2 the
donor levels lies between 0.031 and 0.047 eV below the conduc-
tion band which means that the electron from a donor atom can
be transferred to the conduction band by simply ionizing the donor
atom at the expense of only 31–47 meV which is very small and
also indicates that the conductivity of n-type semiconductor is
several orders higher than the intrinsic materials whereas for p-
type WSe2 the acceptor levels lies 0.027 eV above the valence band
edge and is again very small as compared to the size of Eg (band
gap).
The variation of Seebeck coefficient as a function of temperature
as shown in Figs. 3 and 4 shows the semiconducting behaviour of
these material and henceforth also supports the results of Hall effect
and resistivity measurements. From the respective plots shown in
Figs. 3 and 4 the values of constant A and scattering parameter ‘s’
are obtained and listed in Table 3.
As seen from Table 3, the constant A determined has values
below 4 for three samples, i.e. WSe2 , Re0.0005 WSe2 and Re0.001 WSe2
indicating that charge impurity scattering is dominant whereas
for Re0.05 WSe2 and Re0.1 WSe2 the values of A obtained are nearly
equivalent to 9 which are higher values then the other three sam-
Fig. 5. Plot of log R vs. log P for Rex W1−x Se2 (x = 0, 0.0005, 0.001, 0.05, 0.1) single
ples.
crystals. High pressure measurements on Rex W1−x Se2 single crystals
reveals that the resistance decreases monotonously with increase
in pressure for all the samples. When a graph of log R vs. log P is
plotted as shown in Fig. 5, it shows a straight line with slope vary-
3. Discussion ing from 0.5 to 1.67 as shown in Fig. 5 and their values are shown
in Table 4.
Energy dispersive analysis of X-rays confirms the stoichiome- From Table 4, it appears that with increasing concentration of
try of rhenium doped tungsten diselenide crystals. X-ray powder rhenium in WSe2 the slope also increases. In the case of high con-
diffractograms of compounds were analyzed to determine lattice centration of impurity, impurity band is likely to be formed in the
parameters ‘a’ and ‘c’. Due to low concentration of rhenium signif- place of stabilized impurity level only. The density of electronic
icant amount of changes in lattice parameters are not observed in states follows the density of states of phonons when there is strong
the present work. electron phonon coupling. The phonon density of states is given
Fig. 1 shows a hexagonal spiral seen on the as-grown face of these by
samples, which originates from a single screw dislocation having
nearly regular spacing between successive arms. Since the mor- D(ω) = Aω2 (2)
phology of the spirals follows the symmetry of the face, basal plane
of a hexagonal crystal should show hexagonal spiral as is being
observed in our case of Rex W1−x Se2 single crystals. From this, it
may be inferred that these crystals grown by us exhibit 2H poly- Table 4
type. Further, etching can be conducted on the as-grown crystals to Values of slopes obtained from the graph of log R vs.
reveal the formation of etch pits indicating that these crystals are log P for Rex W1−x Se2 (x = 0, 0.0005, 0.001, 0.05, 0.1)
single crystals.
nucleated at the sites of screw dislocation.
Hall effect measurements shown in Table 1 indicate that tung- Sample Slope
sten diselenide is p-type in nature while addition of rhenium in WSe2 0.494
it converts the material to n-type. But as reported in [9] undoped Re0.0005 W0.9995 Se2 0.643
WSe2 and rhenium doped WSe2 both are n-type in nature which Re0.001 W0.9990 Se2 1.142
differs from our result. The reason for this might be that [9] have Re0.05 W0.95 Se2 1.657
Re0.1 W0.9 Se2 1.670
used Br2 as transporting agent for the growth of these samples
Author's personal copy
354 M.P. Deshpande et al. / Materials Chemistry and Physics 117 (2009) 350–354