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signal integrity (SI) and EMI/EMC the upper right of the small plane, as
targets. Although SIwave is predomi- circled. This could be problematic Network Analysis Solution
nantly used for post-layout extraction, because it is occurring at the source The network analysis solution
its drawing and clipping capabilities of the switching field-effect transistor option for passive devices uses a
can be used to perform Simulation (FET) that converts the input power to combination of computational
Driven Product Development for dc. Identifying this resonance using electromagnetic solutions in
pre-layout simulation on partial cavity analysis provides the location conjunction with several modeling
designs. SIwave technology supports where the network analysis should be techniques to create accurate
multiple PCB layout databases. performed so the SI designer can solutions. Passive devices can be
S I w a v e s o f t w a re ’s d y n a m i c understand the ac impedance profile. modeled in three forms: simple
architecture allows it to fit seamlessly A two-dimensional network analysis (frequency independent), algorithmic
into most design processes while simulation was performed to view (equation-based frequency
significantly reducing nonrecurring the impedance characteristics of the dependent), and measured data (in the
engineering costs. Designing a power Vinput plane. A port was added to form of Touchstone® network param-
distribution system (PDS) relies on the surface of the board at the output eters). The original design (Figure 5A)
several analysis types: resonant of the FET. This connection was made shows that the higher frequencies
cavity analysis, network analysis and between the Vinput and the ground indicate a significant change in the
dc power loss analysis. The resonant pins of the device (Figure 3). impedance profile. The impedance
Figure 2: SIwave resonance analysis depicts the voltage differences between nets Vinput and ground (smaller plane) and nets
Vcc and ground (larger plane). Resonant cavity analysis before (left) and after (right) addition of the decoupling capacitors
240 pF capacitor
2 nF capacitor Port 1
Figure 4: Cutout view of the Vinput (green) and ground (gold) shows the physical location of Port 1, 240 pF capacitor and 2 nF capacitor.
60.00
40.00
20.00
B 0.00
1.00E+006 1.00E+007 1.00E+008 1.00E+009
Freq [Hz]
60.00
40.00
20.00
C 0.00
1.00E+006 1.00E+007 1.00E+008 1.00E+009
Freq [Hz]
Figure 5: A) The original board design without any additional decoupling capacitors; B) analysis number two in which a 240 pF
capacitor was added across the Vinput and ground pins of the FET device; C) analysis number three in which an additional
2 nF capacitor was added in the upper left corner of the Vinput plane
to show problematic areas that do not with signal architectures can be combination with Ansoft Designer
meet the specifications set forth by analyzed, including, but not limited to, software, buffer models (analog and
the designer. This can help to detect common clocking, source synchro- digital) can be used to automatically
poor layout designs in which too few nous clocking, forwarded clocking, create the frequency domain power
vias were used to connect power rails embedded clocking, including single- spectrum to be used with the near-
on different layers within the PCB, ended and differential (including planar and far-field analyses.
which may compromise reliability and and broadside coupling) transmission SIwave software’s versatility allows
lead to system failure. line topologies. Signal crosstalk it to seamlessly fit into almost any
With a properly designed power (coupling), insertion, and return loss existing design flow for power
distribution system, EMI and signal can be analyzed, while Touchstone distribution design, signal analysis and
quality issues are greatly reduced. and Full-Wave SPICE (FWS) files can reduction of radiated fields. SIwave
A designer can change the focus from be exported for usage in time domain has the unique ability to bring three
plane discontinuities to proper layout circuit simulations. Near- and far-field disciplines together (power integrity,
of signal traces that minimize coupling, simulations can be analyzed within SI and EMI/EMC design) in a single
reflections and insertion loss. A SIwave software. These solutions environment. This enables design
designer can adjust the frequency accommodate frequency-independent engineers to make critical tradeoffs
sweep, similar to the two-dimensional and frequency-dependent voltage and with a high degree of confidence prior
network analysis from power delivery, current sources. The latter enables the to fabrication, minimizing time to
to study signal conditioning concerns designer to accurately quantify market and design cost while ensuring
over a broad frequency range. Many the power and frequency spectrum of robust designs that achieve first-pass
types of clocking architectures along switching devices. When used in system success. n
Figure 6: Dc analyses between the voltage regulator module (VRM) and the two microprocessors in the middle of the board show voltage drop
across the plane (left), current flowing through the vias near the VRM (center), and current path from the VRM to the two microprocessors (right).