IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY, VOL. 25, NO.
3, JUNE 2015
Identification of Insulation Defects Based on Chaotic
Analysis of Partial Discharge in HVDC
Superconducting Cable
In-Jin Seo, Umer Amir Khan, Jae-Sang Hwang, Jong-Geon Lee, and Ja-Yoon Koo, Member, IEEE
Abstract—High-voltage direct current (HVDC) technology is
considered to have some important advantages over traditional
high-voltage alternating current, such as higher overall efficiency
and smaller power losses for long-distance transmission. In addi-
tion, applications of superconducting cables in dc electric power
networks may realize real zero impedance, and the economic and
technical advantages could be maximized. Therefore, many re-
search institutes have tried to develop advanced superconducting
cables for HVDC grids with higher reliability, by considering
insulation diagnosis in order to avoid unexpected failures. As one
of the plausible diagnostic methods for power cables applied to
the ac grid, the detection of partial discharges (PDs) taking place
inside the apparatus has been widely investigated. With regard
to the related PD pattern analysis, a phase resolved PD analysis
(PRPDA), which was first developed in the early 1970s, accounts
for the phase information of the applied ac voltage. In 2001, we also
proposed a method for pattern recognition, i.e., chaotic analysis of
PD (CAPD), that considers three normalized parameters obtained
from the values between two consecutive PD pulses: amplitude
difference (Pt ), occurring time difference (Tt ), and applied voltage
difference (Vt ). However, none of the proposed methods of pattern
analysis can be employed for PD under dc stress. Therefore, in
this paper, we propose a modified CAPD for the related pattern
recognition of possible defects inside a joint box and termination
of an HVDC superconducting cable. PDs are produced from four
artificial defects and are then detected by a self-designed and
fabricated sensor, for which the analysis was performed based on
our newly modified CAPD.
Index Terms—Chaotic analysis of partial discharge (CAPD),
HVDC, partial discharge (PD), superconducting cable.
I. I NTRODUCTION
T HE detection and recognition of Partial Discharges (PD)
are important for understanding and evaluating the insula-
tion state of power components under service within the power
grid [1]–[3]. It is generally accepted that an extremely rapid
Manuscript received August 12, 2014; accepted January 15, 2015. Date of
publication January 20, 2015; date of current version February 27, 2015. The
work of U. A. Khan was supported by the Higher Education Commission of
Pakistan.
I.-J. Seo, J.-S. Hwang, and J.-G. Lee are with the Department of Electronic
Systems Engineering, Hanyang University, Seoul 133-791, Korea.
U. A. Khan is with the National University of Sciences and Technology
Pakistan, Islamabad 74400, Pakistan, and also with the Department of Elec-
tronic Systems Engineering, Hanyang University, Seoul 133-791, Korea.
J.-Y. Koo is with the Department of Electronic System Engineering, Hanyang
University ERICA, Ansan 426-791, Korea (e-mail: koojy@hanyang.ac.kr).
Color versions of one or more of the figures in this paper are available online
at http://ieeexplore.ieee.org.
Digital Object Identifier 10.1109/TASC.2015.2394245
1051-8223 © 2015 IEEE. Personal use is permitted, but republication/redistribution requires IEEE permission.
See http://www.ieee.org/publications_standards/publications/rights/index.html for more information.
5402005
electric discharge may occur and produce a local accumulation
of space charge at a small weak region of insulation, causing
electrical overstress at the weak region where the local electric
field will be changed. As a consequence, it is likely that the
initiation and development of subsequent discharge pulses are
mutually influenced. For this reason, the mutual influences
between two consecutive pulses should be considered [4], [5].
Conventional methods such as Phase Resolved Partial Dis-
charge Analysis (PRPDA) have considered these pulses, which
are superimposed within finitely fixed phase windows of the ap-
plied AC voltage. Thus, it may be pointed out that information
regarding the influences of previous discharges cannot easily be
deduced. Moreover, it is not possible to identify the PD source
under DC by conventional methods and these methods cannot
be used to evaluate the insulation degradation of the cryogenic
dielectric material of a HVDC superconducting cable [6]–[8].
In this respect, the analysis of PD patterns under DC was
proposed based on our newly modified Chaotic Analysis of
Partial Discharge (CAPD). As chaotic analysis has been used
successfully to detect regular patterns in seemingly random
signals [9], therefore, our proposed method is expected to be
effective for determining the patterns of PD inside supercon-
ducting cable.
II. M ODIFIED CAPD U NDER DC
Modified CAPD employs the quantities obtained by the nor-
malization and differentiation of two fundamental parameters
related to the PD, the magnitude of the discharge pt and the
time interval between two consecutive PD pulses Δt . Their
normalized differenced quantities (NDQs) are obtained based
on the difference between the amplitude of consecutive nor-
malized PD pulses (Pt ) and the normalized difference between
the onset times of two consecutive pulses (Tt ) [10]. These
values are employed as the essential parameters of the modified
CAPD for investigating the correlation between two consecu-
tive PD pulses. Fig. 1 shows the fundamental parameters in
the CAPD method. Certain numbers of detected pulses are
chosen when their magnitude and time interval are sufficiently
large to analyze the PD pattern. Regarding the magnitude, pt ,
the variables ptmin and ptmax are the minimum and maximum
values, respectively, and Δtmax is the maximum value of the time
interval Δt .
In order to normalize the fundamental parameters, pt and Δt ,
between 0 and 1, (1) and 2 are used, by which consistent pt∗ and
5402005 IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY, VOL. 25, NO. 3, JUNE 2015

Fig. 3. Structure of the chip sensor.

Fig. 1. Two fundamental parameters in the proposed CAPD method: mag-
nitude of the discharge pulse (pt ); time interval between two consecutive PD
pulses (Δt ).

Fig. 2. Block diagram of advanced CAPD.

Δt∗ values can be obtained, even under different experimental

Fig. 4. Return loss (S11) of the network analyzer and simulation.
conditions.
pt − pmin
pt∗ = (0 ≤ pt∗ ≤ 1) (1) Main characteristics: The main characteristics of the sen-
ptmax − ptmin sor, including the return loss, directivity, and gain, have been
Δt investigated. The first one is represented in terms of the
Δt∗ = (0 ≤ Δt∗ ≤ 1) . (2) S-parameters, specifically S11, which is the ratio of the reflec-
Δtmax
tive wave to the incident wave and is the most important factor
The NDQs of pt∗ and Δt∗ are obtained using (3) and (4) and [12]–[14]. This factor has been measured in the frequency
the differences between the nth and (n-1)th selected pulses. The ranges from 0.1 GHz to 3.0 GHz using a network analyzer (HP
correlation analysis is then conducted by embedding the NDQs 8720 C, 50 MHz-20 GHz). The evolution of the dBm power as
into the two-dimensional attractors [11]. a function of frequency has been obtained by measurement as
well as by simulation and is displayed in Fig. 4. This shows the
Pt = p∗n − p∗n−1 (−1 ≤ Pt ≤ 1) (3) difference between the values within the observed frequency
Δt range. In addition, three resonances are observed at 0.83 GHz,
Tt (= Δt∗ ) = (0 ≤ Tt ≤ 1). (4) 1.72 GHz, and 2.48 GHz. When the return loss is cut off at -
Δtmax
5 dBm, the sensor has two different bandwidths of 200 MHz
Regarding (4) for CAPD under AC, Δtmax is fixed at 16.7 ms; and 600 MHz. The last two factors of gain and directivity are
however, for modified CAPD under DC, Δtmax becomes a calculated by a simulator and are represented in terms of the
variant parameter since the phase information of the applied Antenna Gain Pattern (AGP) and Antenna Directivity Pattern
voltage is not taken into account. Therefore, pattern analysis (ADP), respectively, and the results are presented in Fig. 5 [15].
using the modified CAPD is possible for the PDs produced Below 1 GHz, the directivity of the sensor is limited; however,
under DC stress. The block diagram shown in Fig. 2 summa- it becomes wider as the frequency is increased. These results
rizes the procedure for normalization and differentiation of the enable us to determine the position of the sensor to be fixed in
fundamental parameters. the forward direction facing the inner side of the cryostat.

III. L ABORATORY T EST FOR D ETECTING PD S
A. Self-Designed UHF sensor
A UHF sensor was designed and fabricated for detecting PDs
under DC.
Structure: A helical type sensor is chosen, as shown in
Fig. 3. Such an internal coupler is the active sensing part
and consists of a helical antenna, metallic ground, insulator,
substrate, and a connector.
B. PD detection
Fig. 6 shows the block diagram of the test facilities for the
PD measurement. The PD caused by artificial defects under
DC stress is obtained through our rectifier (1.5% ripple with no
load) from the AC output of the transformer (Haefley 400 kV,
1 A). The voltage across the test cell was measured using a
resistive voltage divider and a DC voltmeter. The magnitude
of the PD was measured by a coupling capacitor according to
IEC60270 [16].
SEO et al.: IDENTIFICATION OF INSULATION DEFECTS BASED ON CAPD IN HVDC SUPERCONDUCTING CABLE 5402005

Fig. 7. Four kinds of artificial defects: (a) protrusion, (b) creepage discharge,
(c) floating particle, and (d) void.

laminated-paper (PPLP), and an OKURA needle (r = 100 µm)

is used to create a protrusion. A floating electrode near the
high voltage region and a void inside the extruded plastics
are used to produce the latter two defects [18]. The applied
voltages in cryogenic environment are 56 kV for the creepage
discharge defect, 68 kV for the floating particle, 54 kV for the
protrusion, and 18 kV for the void. PDs are produced and are
then detected by a self-designed UHF sensor for PD analysis.
The background noise was evaluated to be less than 2 pC at an
applied voltage in the absence of insulation defects.

Fig. 5. UHF Sensor characteristics: (a) directivity pattern and (b) gain at IV. R ESULT AND D ISCUSSION
0.83 GHz.
The pattern of PD related to each defect is identified us-
ing modified CAPD based on the clustering displayed on a
2-dimensional plane where the parameters are dependent on the
purpose of the display:
(a) The pattern of Tt − Tt+Δt represents the correlation of
the onset time interval of the consecutive pulses. After
each axis is divided into 100 different districts, the first
value is mapped on the Tt axis, while the second value
is mapped on the Tt+Δt axis between the values of two
consecutive Tt values. In the case of repetitive mapping
in the same district, the color of the district will be
changed.
(b) In a similar way, the pattern of Pt − Pt+Δt represents the
correlation of the amplitude differences of the consecu-
tive pulses.
(c) The pattern of Pt − Tt represents the correlation between
the magnitude difference and the onset time interval
of the consecutive pulses.
Fig. 6. Photograph and block diagram of the test facilities for PD
measurement.
A. Protrusion
Four artificial defects, the creepage discharge defect, pro-
trusion, floating particles, and voids, are created as shown in (a) The Tt and Tt+Δt axes have maximum values of 1, which
Fig. 7, and all of them are applied to the cryostat filled with correspond to 17 ms in this case. The clustering shows a
liquid nitrogen and N2 gas. The first two defects are realized right-angled triangular shape in Fig. 8(a).
during the manufacturing process [17]. The creepage discharge (b) The pattern of Pt from this defect is shown in Fig. 8(b)
defect which represents a possible defect inside the insulation by the related clustering displayed on the 2-dimensional
of the superconducting cable is created using polypropylene- plane: the maximum magnitude is measured as 150 pC,
5402005
Fig. 8. CAPD pattern of protrusion defects: (a) embedding of Tt , (b) embed-
ding of Pt , and (c) correlation between Tt and Pt .
Fig. 9. CAPD pattern of creepage discharge defects: (a) embedding of Tt ,
(b) embedding of Pt , and (c) correlation between Tt and Pt .
which corresponds to 1 in this case. The clustering shows
a noticeable triangular shape around (0.5, 0.5).
(c) Fig. 8(c) shows the correlation between Pt and Tt . The
points are concentrated in the area defined by Tt < 0.3
and the entire Pt axis.
B. Creepage Discharge Defect
(a) The Tt and Tt+Δt axes have maximum values of 1, which
correspond to 17 ms in this case. The clustering is non-
uniformly distributed in the plane in Fig. 9(a).
(b) The pattern of Pt is shown in Fig. 9(b) by the re-
lated clustering displayed on the 2-dimensional plane:
the maximum magnitude is measured as 84 pC, which
corresponds to 1 in this case. The clustering shows a
pentagonal shape in the middle of the plane heading from
(0, 1) to (1, 0).
(c) Fig. 9(c) shows the correlation between Pt and Tt . The
main parts of the clusters are observed in three relatively
small zones in the plane as a half ellipse around the ends
and an ellipse near (0.5, 0.5).
C. Floating Particle Defect
(a) The Tt and Tt+Δt axes have maximum values of 1, which
correspond to 16 ms in this case. Most of the points are
concentrated along the axis in the narrow region defined
by Tt < 0.01 and T t+Δt < 0.1. This result indicates that
repeats a cycle of increase and decrease.
IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY, VOL. 25, NO. 3, JUNE 2015
Fig. 10. CAPD pattern of floating particle defects: (a) embedding of Tt ,
(b) embedding of Pt , and (c) correlation between Tt and Pt .
Fig. 11. CAPD pattern of void defects: (a) embedding of Tt , (b) embedding
of Pt , and (c) correlation between Tt and Pt .
(b) The pattern of Pt from this defect is shown in Fig. 10(b)
by the related clustering displayed on the 2-dimensional
plane: the maximum magnitude is measured as 81 pC,
which corresponds to 1 in this case. The main part of
the clustered zone is observed along the line given by
Pt+Δt = −Pt .
(c) Fig. 10(c) shows the correlation between Pt and Tt . The
main part of the clustered points is displayed as a pattern,
where most of the clustered areas are around the Pt axis
near 0 and 1.
D. Void
(a) The Tt and Tt+Δt axes have maximum values of 1, which
correspond to 17 ms in this case. The clustering shows
a right-angled triangular shape in Fig. 11(a). This result
shows that the Tt values are relatively regular compared
with those for discharges caused by the other defects.
(b) The pattern of Pt from this defect is shown in Fig. 11(b)
by the related clustering displayed on the 2-dimensional
plane: the maximum magnitude is 270 pC, which corre-
sponding to 1 in this case. The clustering shows a long
triangular shape around (0.5, 0.5).
(c) Fig. 11(c) shows the correlation between Pt and Tt . The
main part of the cluster shows a noticeably narrow band
connecting (0.5, 0) to (0.5, 1) in parallel with the Tt axis.
V. C ONCLUSION
The PD pattern of insulation defects under DC poses a con-
siderable risk to the proper functioning of HVDC components.
SEO et al.: IDENTIFICATION OF INSULATION DEFECTS BASED ON CAPD IN HVDC SUPERCONDUCTING CABLE
This study modeled insulation defects in order to diagnose the
status of the insulation in an HVDC superconducting cable. The
PD patterns for different insulation defects were analyzed using
a modified CAPD analysis method.
• Pattern classification of the PD that originated from the
four different types of artificial defects is possible by
using the modified CAPD method under DC at cryogenic
environment.
• Although the proposed method is easily influenced by
noise, it will be very useful for diagnosing the insulation
status of an HVDC superconducting cable if the noise
problem can be solved.
A novel diagnostic method that can diagnose the insulation
status of HVDC superconducting cable is proposed in this
study. These findings illuminate the importance of research
to construct a more comprehensive database by considering
various on-site conditions and for developing a more reliable
diagnosis system.
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