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November 2009
Package Symbol
COLLECTOR
JEDEC TO-263AB JEDEC TO-220AB JEDEC TO-262AA
D²-Pak EC
G EC
G R1
GATE
G
R2
E
EMITTER
COLLECTOR COLLECTOR
(FLANGE) (FLANGE)
©2009 Fairchild Semiconductor Corporation ISL9V5036S3S / ISl9V5036P3 / ISL9V5036S3 Rev. C4, November 2009
ISL9V5036S3S / ISL9V5036P3 / ISL9V5036S3
Package Marking and Ordering Information
Device Marking Device Package Reel Size Tape Width Quantity
V5036S ISL9V5036S3ST TO-263AB 330mm 24mm 800
V5036P ISL9V5036P3 TO-220AA Tube N/A 50
V5036S ISL9V5036S3 TO-262AA Tube N/A 50
V5036S ISL9V5036S3S TO-263AB Tube N/A 50
On State Characteristics
VCE(SAT) Collector to Emitter Saturation Voltage IC = 10A, TC = 25°C, - 1.17 1.60 V
VGE = 4.0V See Fig. 4
VCE(SAT) Collector to Emitter Saturation Voltage IC = 15A, TC = 150°C - 1.50 1.80 V
VGE = 4.5V
Dynamic Characteristics
QG(ON) Gate Charge IC = 10A, VCE = 12V, - 32 - nC
VGE = 5V, See Fig. 14
VGE(TH) Gate to Emitter Threshold Voltage IC = 1.0mA, TC = 25°C 1.3 - 2.2 V
VCE = VGE, TC = 150°C 0.75 - 1.8 V
See Fig. 10
VGEP Gate to Emitter Plateau Voltage IC = 10A, VCE = 12V - 3.0 - V
Switching Characteristics
td(ON)R Current Turn-On Delay Time-Resistive VCE = 14V, RL = 1Ω, - 0.7 4 µs
trR Current Rise Time-Resistive VGE = 5V, RG = 1KΩ - 2.1 7 µs
TJ = 25°C, See Fig. 12
td(OFF)L Current Turn-Off Delay Time-Inductive VCE = 300V, L = 2mH, - 10.8 15 µs
tfL Current Fall Time-Inductive VGE = 5V, RG = 1KΩ - 2.8 15 µs
TJ = 25°C, See Fig. 12
SCIS Self Clamped Inductive Switching TJ = 25°C, L = 670 µH, - - 500 mJ
RG = 1KΩ, VGE = 5V, See
Fig. 1 & 2
Thermal Characteristics
RθJC Thermal Resistance Junction-Case TO-263, TO-220, TO-262 - - 0.6 °C/W
©2009 Fairchild Semiconductor Corporation ISL9V5036S3S / ISL9V5036P3 / ISL9V5036S3 Rev. C4, November 2009
ISL9V5036S3S / ISL9V5036P3 / ISL9V5036S3
Typical Characteristics
45 45
ISCIS, INDUCTIVE SWITCHING CURRENT (A)
35 35
30 30
TJ = 25°C
25 25
20 20
TJ = 25°C
15 TJ = 150°C 15
TJ = 150°C
10 10
5 5
SCIS Curves valid for Vclamp Voltages of <390V SCIS Curves valid for Vclamp Voltages of <390V
0 0
0 50 100 150 200 250 300 350 0 2 4 6 8 10
Figure 1. Self Clamped Inductive Switching Figure 2. Self Clamped Inductive Switching
Current vs Time in Clamp Current vs Inductance
1.10 1.25
VCE, COLLECTOR TO EMITTER VOLTAGE (V)
1.05 1.20
VGE = 3.7V VGE = 4.0V
VGE = 3.7V
0.95 1.10
VGE = 4.5V
VGE = 4.5V
VGE = 5.0V VGE = 5.0V
0.90 VGE = 8.0V 1.05 VGE = 8.0V
0.85 1.00
-50 -25 0 25 50 75 100 125 150 175 -50 -25 0 25 50 75 100 125 150 175
Figure 3. Collector to Emitter On-State Voltage vs Figure 4.Collector to Emitter On-State Voltage vs
Junction Temperature Junction Temperature
50 50
ICE, COLLECTOR TO EMITTER CURRENT (A)
20 20
10 10
TJ = - 40°C TJ = 25°C
0 0
0 1.0 2.0 3.0 4.0 0 1.0 2.0 3.0 4.0
VCE, COLLECTOR TO EMITTER VOLTAGE (V) VCE, COLLECTOR TO EMITTER VOLTAGE (V)
Figure 5. Collector Current vs Collector to Emitter Figure 6. Collector Current vs Collector to Emitter
On-State Voltage On-State Voltage
©2009 Fairchild Semiconductor Corporation ISL9V5036S3S / ISL9V5036P3 / ISL9V5036S3 Rev. C4, November 2009
ISL9V5036S3S / ISL9V5036P3 / ISL9V5036S3
Typical Characteristics (Continued)
50 50
40 VGE = 4.5V 40
VGE = 4.0V
VGE = 3.7V
30 30
TJ = 175°C
20 20
TJ = 25°C
10 10
TJ = 175°C TJ = -40°C
0
0
0 1.0 2.0 3.0 4.0 1.0 1.5 2.0 2.5 3.0 3.5 4.0 4.5
VCE, COLLECTOR TO EMITTER VOLTAGE (V) VGE, GATE TO EMITTER VOLTAGE (V)
50
VCE = VGE
VGE = 4.0V 2.0
ICE = 1mA
ICE, DC COLLECTOR CURRENT (A)
40
1.8
30
1.6
20
1.4
10
1.2
0 1.0
25 50 75 100 125 150 175
-50 -25 0 25 50 75 100 125 150 175
10000 20
ICE = 6.5A, VGE = 5V, RG = 1KΩ Resistive tOFF
VECS = 24V 18
1000 16
LEAKAGE CURRENT (µA)
14
100 Inductive tOFF
VCES = 300V 12
10
10
8
VCES = 250V
1 6
Resistive tON
4
0.1 2
-50 -25 0 25 50 75 100 125 150 175 25 50 75 100 125 150 175
Figure 11. Leakage Current vs Junction Figure 12. Switching Time vs Junction
Temperature Temperature
©2009 Fairchild Semiconductor Corporation ISL9V5036S3S / ISL9V5036P3 / ISL9V5036S3 Rev. C4, November 2009
ISL9V5036S3S / ISL9V5036P3 / ISL9V5036S3
Typical Characteristics (Continued)
3000 8
IG(REF) = 1mA, RL = 0.6Ω, TJ = 25°C
FREQUENCY = 1 MHz
6
C, CAPACITANCE (pF)
2000
5
CIES
VCE = 12V
1500
4
1000 3
CRES
2
500
COES
1 VCE = 6V
0
0 5 10 15 20 25 0
0 10 20 30 40 50
VCE, COLLECTOR TO EMITTER VOLTAGE (V)
QG, GATE CHARGE (nC)
360
ICER = 10mA TJ = - 40°C
358
BVCER, BREAKDOWN VOLTAGE (V)
356
354
TJ = 175°C
352
TJ = 25°C
350
348
346
344
342
340
10 100 1000 2000 3000
100 0.5
0.2
0.1
10-1 0.05
0.02 t1
0.01 PD
10-2
t2
10-4
10-6 10-5 10-4 10-3 10-2 10-1
©2009 Fairchild Semiconductor Corporation ISL9V5036S3S / ISL9V5036P3 / ISL9V5036S3 Rev. C4, November 2009
ISL9V5036S3S / ISL9V5036P3 / ISL9V5036S3
Test Circuits and Waveforms
L
VCE R
or LOAD
L
C
C
RG
PULSE RG = 1KΩ
DUT G +
GEN DUT VCE
G
5V -
E
Figure 17. Inductive Switching Test Circuit Figure 18. tON and tOFF Switching Test Circuit
VCE BVCES
tP
VCE
L
IAS
VARY tP TO OBTAIN VDD
+
REQUIRED PEAK IAS RG
VDD
VGS -
DUT
tP
0V IAS 0
0.01Ω
tAV
©2009 Fairchild Semiconductor Corporation ISL9V5036S3S / ISL9V5036P3 / ISL9V5036S3 Rev. C4, November 2009
ISL9V5036S3S / ISL9V5036P3 / ISL9V5036S3
SPICE Thermal Model JUNCTION
th
REV 1 May 2002
CTHERM1 th 6 4.0e2
CTHERM2 6 5 3.6e-3
CTHERM3 5 4 4.9e-2 RTHERM1 CTHERM1
CTHERM4 4 3 3.2e-1
CTHERM5 3 2 3.0e-1
CTHERM6 2 tl 1.6e-2
6
RTHERM1 th 6 1.0e-2
RTHERM2 6 5 1.4e-1
RTHERM3 5 4 1.0e-1
RTHERM2 CTHERM2
RTHERM4 4 3 9.0e-2
RTHERM5 3 2 9.4e-2
RTHERM6 2 tl 1.9e-2
5
SABER Thermal Model
SABER thermal model
ISL9V5036S3S / ISL9V5036P3 / ISL9V5036S3 RTHERM3 CTHERM3
template thermal_model th tl
thermal_c th, tl
{
4
ctherm.ctherm1 th 6 = 4.0e2
ctherm.ctherm2 6 5 = 3.6e-3
ctherm.ctherm3 5 4 = 4.9e-2
ctherm.ctherm4 4 3 = 3.2e-1 RTHERM4 CTHERM4
ctherm.ctherm5 3 2 = 3.0e-1
ctherm.ctherm6 2 tl = 1.6e-2
rtherm.rtherm1 th 6 = 1.0e-2 3
rtherm.rtherm2 6 5 = 1.4e-1
rtherm.rtherm3 5 4 = 1.0e-1
rtherm.rtherm4 4 3 = 9.0e-2
RTHERM5 CTHERM5
rtherm.rtherm5 3 2 = 9.4e-2
rtherm.rtherm6 2 tl = 1.9e-2
}
2
RTHERM6 CTHERM6
tl CASE
©2009 Fairchild Semiconductor Corporation ISL9V5036S3S / ISL9V5036P3 / ISL9V5036S3 Rev. C4, November 2009
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