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Abstract— Characterization of electronic devices is one of the BJT and MOSFET based on Arduino microcontroller is
main objectives in an electronics lab, where the data from lab developed. The voltages for dc analysis of a given device
measurements are compared with that of theoretical under test were generated using Arduino’s PWM outputs with
predictions. This can ensure detection of faulty electronic the help of external low pass filter circuits. Since the
devices before connecting them in a bigger circuitry. On the Arduino’s analog-to-digital converter has a dynamic range
other hand, manually taking repetitive measurements using from 0 to 5V, we have kept the dc analysis within these limits.
power supplies and multimeters at various operating points of a This dynamic range could also be extended by proper voltage
given device can be laborious, especially when many such scaling (amplifier/attenuators) at the interface between
devices has to be tested. In this paper we present a fully Arduino inputs/outputs and external circuitry. Apart from the
automated Arduino based system which does not use any low pass filters, the system also requires some amount of
external instruments other than power supplies. Once an supporting circuitry to measure currents through various
electronic device is positioned and appropriate modes are terminals of the device [9]. The data is collected into an Excel
chosen, the system will plot its required characteristics and
file as it is a much cheaper and popular option in comparison
extract parameters on an excel sheet in a serially interfaced PC.
with that of MATLAB. Microsoft Excel Commander 2.1 by
We have successfully carried out the fully automated V-I
R. Valgolio [10] is utilized to take care of the serial port
characterization of a diode, transfer and output characteristics
interface between Arduino and the PC. The data, as being
of a MOSFET and the input and output characteristics of a BJT.
obtained in a tabular form inside the Excel file, can easily be
The individual circuits and their associated scripts are combined
plotted using inbuilt commands in the software. Various
using device selection switches for better utilization of system
resources.
parameters like trans-conductance, current gain, dynamic
resistance... etc can be easily be extracted from these plots.
Keywords— V-I Characterization, Arduino, Automation, Data Accuracy of the plots can be changed by controlling the
acquisition, Low pass filter voltage steps in the dc analysis through modifications in the
programming. We have employed device selection switches
that can establish and isolate appropriate connections when a
I. INTRODUCTION particular device is needed to be tested. In addition to this,
To better understand the operation and/or test any electronic two digital inputs into the kit were appropriately set in order
device, it is essential to practically perform the V-I to choose the right subroutine inside the Arduino program.
characterization of an electronic device. Working with faulty Any faulty devices can be easily recognized by comparing the
devices in a big circuit is truly frustrating. On the other hand, obtained characteristics with that of the standard one.
manual characterization process is time-taking and laborious.
To speed up the characterization procedure an analog device II. METHODLOGY
tester is required. Automation of device characterization will
also reduce the human errors in the measurement processes.
A semi-automated system was proposed by S. Weis [1] in The block diagram of automated device characterization
which an Arduino microcontroller acted as a data acquisition system based on Arduino UNO board is shown in Fig. (1).
interface. Since the Arduino microcontroller kits [2] are now The Arduino takes digital inputs S0 and S1 to choose the right
cost effective, this is indeed an economic approach for small subroutine corresponding to the device selected for
laboratories. In recent years, there were many proposals to use characterization. Since there are no analog output ports
Arduino kits for engineering educational purposes [3-8]. In available with Arduino UNO, we have used the digital PWM
Weis’ system, the signals to the device under characterization outputs along with low pass filters to generate dc voltages
were given from an external function generator and the results corresponding to different operating points. These voltages
were plotted using MATLAB software in a PC. are then applied to the device through current limiting
In the work presented here, a fully automated V-I resistors which are part of the supporting circuitry.
characterization of electronic devices such as junction diode,
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978-1-5386-8189-3/19/$31.00 © 2019 IEEE
2019 Innovations in Power and Advanced Computing Technologies (i-PACT)
The Fig. (3) Shows the combined external circuit diagram for
automated characterization of the three devices viz. diode,
BJT and MOSFET. We have used the Arduino analog inputs
pins A0-A3 to read various voltages from the circuit. As can
Fig. 1. Block diagram of the system
be verified, the ground terminal is kept common for all the
devices.
The supporting circuitry also provides us with the ability to
measure currents by measuring the voltages across various
resistors. These voltages are measured using the analog input
pins A0 to A3. The manual switch array shown in the block
diagram is used to disconnect or connect the required pins of
the different electronic devices. Only the device that is to be
tested should be connected and the rest should be
disconnected at the same time. For the characterization of
these devices viz. diode, BJT and MOSFET, only a maximum
of two filters are needed at any given time. Therefore these
filter outputs are multiplexed using supporting circuitry and
device selection switch array in order to efficiently use the
resources. The output of the Arduino is connected to a PC
using the serial port and the data is written into an Excel sheet Fig. 3. Circuit diagram for V-I
in tabular format using Microsoft Excel Commander 2.1. Characterization of electronic devices
S0 S1 Functionality
To do diode characterization, we manually connect switch D1
0 0 Halt and open circuit B1, B2, M1 and M2. This will isolate any
current flow into other devices. If BJT has to be characterized,
0 1 Diode Subroutine
the switches B1 and B2 alone will be connected and all others
1 0 BJT Subroutine will be disconnected. Similarly, M1 and M2 alone is
connected for the characterization of MOSFET. The working
1 1 MOSFET Subroutine of the external circuit is individually explained in the
following sections.
Table. 1
The Arduino programming flowchart is shown in Fig. (2).
After initialization of the various input and output pins, the
I. Low Pass Filter Design
program continues to run in loops. Each time when it enters
the loop, status of digital inputs S0 and S1 are first read and
The circuit diagram of an OpAmp based 2nd order low pass
then corresponding subroutine is chosen accordingly as
shown in Table 1. With two device selection inputs, three Butterworth filter is shown in Fig. (4). It’s cut-off frequency,
devices could be characterized. In general, with N such
inputs, we can select 2N -1 devices as one of the combination fc= (1)
√
(here S0S1=00) is used for halt operation.
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2019 Innovations in Power and Advanced Computing Technologies (i-PACT)
The duty cycle of the PWM output can be controlled in Since the value of BJTs are very large (around 150), we use
the Arduino program using the analogWrite(x)command. a large current limiting cum measuring resistance (R=660kΩ)
This will result in, percentage duty-cycle = (x/255)×100. at the input and small current limiting cum measuring
resistance at the output (R=300Ω). The value of current is
Therefore, to get 75% duty cycle, we should take x =191.
calculated by the formula: IB = ‘(VB-VBE)/R’, where R= 660
kΩ and IC = (VCC-VCE)/R mA where R=300 Ω.
For the automated characterization of diode, one low pass The characterization of MOSFET is similar to that of BJT
filter is enough. This is because diode is a two terminal device with only difference is that it’s input dc current is always zero
and to plot its forward characteristics we need to measure due to the oxide capacitance. Therefore we can achieve
only the voltage across the diode and the current passing MOSFET characteristics using only three analog input
through it. terminals.
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2019 Innovations in Power and Advanced Computing Technologies (i-PACT)
. . )
= )
=11.02 kΩ (When = 4.7 )
. .
. . )
ie. β = )
=74.38
. .
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2019 Innovations in Power and Advanced Computing Technologies (i-PACT)
y-axis represents ID in milli-amperes. Transfer characteristics clarity of the plot. The data points are acquired sequentially
for four different values of VDS is shown in Fig. (12). by allowing the device under test to operate at different Q-
points and then measuring the device voltages and current.
The analog voltages required for this purpose is generated
with the help of Arduino’s PWM signal output whose duty
cycle is controlled via programming. A second order
Butterworth filter is used to convert the PWM signal to dc
voltage which then has a dynamic range of 0 to 5 volts. The
current into a terminal is measured with the help of additional
circuitry which would convert the currents into voltages
across series resistors. Microsoft Excel Commander is used
to acquire the data points from the Arduino into an excel sheet
on PC. The graphs are easily plotted in real-time using the x-
y plot commands in Excel software. Various parameters like
Fig. 12. Transfer characteristics of MOSFET input and output resistances, current gain, trans-conductance
etc. of these devices are then extracted from these
An important parameter to be determined from transfer characteristic plots.
characteristics of FET is transconductance (gm). It is defined
The automation of electronic device characterization is a
as,
∆ ,
quick way of testing the device in an electronics lab. Manual
gm = (5) characterization of electronic devices is laborious and can be
∆
frustrating if it has to be repeated for many devices. The
. . ) analog device tester we have developed is based on Arduino
gm =
)
= 0.516 mS (When = 4.7 )
. . UNO kit which is readily available and inexpensive. To
increase the speed further, we could use faster microcontroller
kits than the basic version of it. The dynamic range of
characteristics could be increased by scaling up the voltages
using proper amplifiers at the filter output stage. We can
extend the concept presented in this paper to characterize
other electronic devices also. But increasing the number of
devices may result in needing more and more number of input
and output pins in the microcontroller kit.
REFERENCES
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2019 Innovations in Power and Advanced Computing Technologies (i-PACT)