Documenti di Didattica
Documenti di Professioni
Documenti di Cultura
pubs.acs.org/JPCC
© 2012 American Chemical Society 12946 dx.doi.org/10.1021/jp3031418 | J. Phys. Chem. C 2012, 116, 12946−12952
The Journal of Physical Chemistry C Article
of filler. Hence, the use of high aspect ITO nanostructures to grids by inserting the grid into the suspension of ITO and
obtain nanocomposites should be examined.18 PMMA in THF which was dried at room temperature.
The main goal of this work is to develop a method of To carry out electrical measurements of the nanowires, a
introducing different amounts of high aspect ratio ITO quartz substrate with interdigitated gold electrodes made by
nanostructures (nanowires) inside a polymeric matrix lithograph was used. A micromanipulator (Wentworth, model
(PMMA) followed by a study of its electrical, optical and MP1008) was then used to connect the substrate to a stabilized
morphological properties. Composites studied were charac- voltage source (Keithley, model 237). For the two and four
terized by UV−vis, dc (two and four probes) electrical probe electrical measurements in the composites, a resistivity
measurements and by scanning and transmission electron measurement system (Signatone, model Pro-4) and the
microscopy (SEM and TEM, respectively). Moreover, a Keithley stabilized source were used simultaneously.
computational simulation of 1D structures in a general matrix The optical characterization of the composite films (about 20
was performed to know, theoretically, what is percolation μm of thickness) was performed by UV−vis spectroscopy
threshold of nanowires. Finally, results were discussed in detail. (Varian, model Cary 50) in the range of 200 to 1000 nm. It
should be highlighted that the optical transmittance in the
2. EXPERIMENTAL SECTION visible range is an important parameter for the application of
2.1. Growth of ITO Nanostructures. The ITO nanowires these films.
were synthesized by a carbothermal reduction method using 2.4. Computational Simulation to Achieve Percola-
the coevaporation of oxides.18 In this work, the starting tion. To study, theoretically, the percolation threshold of fibers
materials used were SnO2 (Sigma-Aldrich, 99.9% of purity) and in a general matrix, we developed a Fortran program which
In2O3 (Sigma-Aldrich, 99.99% of purity) mixed in a molar calculates the intersection of random distributed fibers in a
proportion of 1:1 with the reducing agent, which in the present matrix. In this program it is possible to change the box size,
study was the carbon black (Union Carbide, > 99% of purity). which in this case is the matrix; and the number, size and
In a typical procedure both mixtures were placed in separate rotation angle of fibers. The program associates a number to
alumina boats which were then inserted side by side in the hot each fiber and has a subroutine to verify percolation,20,21 and
zone of a tube furnace (EDG, model FT-HI 40). The synthesis when different wires intersect they assume the same number,
was performed at 1150 °C for 1 h with the extremities of the which was chosen as the lower one. So, when two parallel sides
tube sealed with aluminum cover and PTHF o-rings. A N2 gas of the box have wires with the same number, percolation
flux of 80 sccm was kept throughout the synthesis to carry on occurred. In this study the box size was kept constant because
vapor to colder region of the tube. Details of the ITO all films done by tape casting have the same size, and we
nanostructures synthesis are given in refs 18 and 19. studied the percolation as a function of size and number of
2.2. Preparation of Nanocomposites. To prepare the fibers (the rotation angle of fibers was left between −180 to
nanocomposites, the material collected after the synthesis was +180 o for all simulations).
dispersed using an ultrasonic cleaner in an alcohol medium.
Then, the PMMA (Sigma-Aldrich, average molecular weight of 3. RESULTS AND DISCUSSION
12000 g/mol) was dissolved in Tetrahydrofuran (THF) and a
known amount of ITO nanowires was inserted into the solution 3.1. ITO Nanostructures. After the synthesis of the ITO
at 1, 2, 5, and 10 wt % in relation to the amount of PMMA. The structures, a wool-like material was collected inside the tube in
suspension was kept under stirring for 15 min and then a region between 450 and 500 °C. Figure 1 presents the XRD
deposited over a glass substrate using the tape casting process pattern of the collected material. All the peaks in the
at room temperature. After the removal of films from the glass, diffractogram can be indexed by the Al, In0,2Sn0,8 (JCPDS
no further processing was necessary to characterize the card #48-1547), and In2O3 (JCPDS card #6-416) phases. It is
nanocomposites.
2.3. Characterization of Nanowires and Nanocompo-
site. The wool-like material collected after the carbothermal
reduction synthesis was analyzed by X-ray diffraction
(Shimadzu, model XRD 6000) using the Cu Kα radiation in
the range of 20 to 60°.
The morphological characterization of the materials was then
performed using a field emission gun scanning electron
microscope (FEG-SEM; Jeol, models JSM 6330F and JSM
7500 F). The morphology, structure and chemical ratio of the
cations in the ITO nanowires were also analyzed by
transmission electron microscopy (TEM; Jeol JSM 3010
operated at 300 kV) equipped with energy dispersive X-ray
spectroscopy (EDS). The same technique (TEM, using a
Philips CM 200 microscope operated at 200 kV) was used to
study the percolation of wires inside the polymeric matrix. In
order to prepare the samples for SEM, some drops of a
suspension of ITO nanowires in an alcohol medium were
deposited on conductive and plane silicon substrate. For TEM
characterization of wires, one drop of the same suspension was
deposited on a carbon coated Cu grid, while for the composite
characterization, a composite film was produced on the Cu Figure 1. XRD pattern of the collected material after the synthesis.
Figure 2. FEG-SEM images of typical ITO nanowires with square cross section and the width distribution of wires.
worth to mention that peaks of In1.875Sn0.125O3 phase (JCPDS characterization of the material obtained after the synthesis. It is
card #89-4597) superpose the In2O3 ones and the only way to possible to observe that this material is composed of one-
distinguish these phases is using data refinement or chemical dimensional structures with well-defined edges; its size is
analysis or electrical measurements. In this work we used the homogeneous along their lengths and there are no apparent
last two characterizations. The Al peaks are related to the superficial defects. Figure 2c shows a SEM image from which it
aluminum sample holder used in the XRD measurements and is possible to observe that the synthesized structures have
have no correlation with the ITO sample. Moreover, the square cross section. This square cross section is expected for
relative intensities between the In2O3 and the In0,2Sn0,8 peaks the In2O3 phase, known to be cubic, if the growth occurs in
confirm that the former is present in greater amount. Regarding (h00) planes, and it is important to notice that the XRD result
the In2O3 phase, it is easy to recognize that the peak at 2θ =
showed preferential orientation for planes of this family.
35.5° is much higher than it should be for a nonoriented
Hereinafter, these square cross-section nanostructures will be
powder, meaning that the sample has a preferential orientation
for the (400) planes with an interplanar distance of 2.5 Å. It is called nanowires. The SEM images also illustrated that most
important to notice that no peak was observed for tin oxide nanowires have a metallic sphere at one extremity, thus
phases. In fact, following the phase diagram of In2O3 and suggesting that the growth mechanism of wires follows a self-
SnO2,22 up to about 15 mol % of tin atoms can be in the solid catalytic vapor−liquid−solid (VLS) process. Figure 2d presents
solution in the In2O3 matrix without any secondary phase. the width distribution of wires. This figure clearly depicts a
According to the literature23−25 the tin rich metallic phase single modal distribution and indicates that most of wires have
should be related to particles which control the growth width between 51 to 100 nm. These findings are in good
mechanism of structures. Figure 2 illustrates the FEG-SEM agreement with previous reports about ITO nanostructures.5
12948 dx.doi.org/10.1021/jp3031418 | J. Phys. Chem. C 2012, 116, 12946−12952
The Journal of Physical Chemistry C Article
Figure 3 presents TEM images of nanowires, confirming they obtained in the XRD metallic phase. The reason for obtaining
have a homogeneous width along their length. The high an Indium rich structure through a tin rich liquid sphere is
explained elsewhere.19
It is important to mention that these tin rich metallic spheres
must be in liquid phase at the wire formation temperature (450
°C), suggesting that the growth of nanowires follows a self-
catalytic VLS process.
Figure 5 presents the two probe electrical response for the
ITO nanowires. The electrical current is observed to vary
Figure 4. EDS spectra: (a) ITO nanowire and (b) metallic sphere presents at the ITO wire extremity.
transparent and conductive devices, which we will explored in observation should be related to the spheres at nanowires
detail in the next section. extremities since ITO does not have any absorption at this
3.2. Nanocomposites. Nanocomposites filled with ITO wavelength,28,29 and this effect is more noticeable for
nanowires were produced using the quantities of filler already composites with higher amounts of filler.
described in the Experimental Section. Figure 6 shows typical Table 1 presents the two-probe electrical results for
nanowires and composites. The values clearly show that the
photograph of composite films. It is easy to observe that films insertion of 1 and 2 wt % of filler does not alter the electrical
present a good transparency although, as expected, the pure resistance of pure PMMA. However, an abrupt fall in the
PMMA film is found to be the most transparent one. As the resistance is observed for 5 wt % of filler thus indicating the
amount of filler increases, the transparency is found to decrease, start of percolation. On increasing the filler amount to 10 wt %
which is a characteristic behavior of composites. the electrical resistance of the composite was found to be only 1
The transmittance of films was measured quantitatively using order of magnitude greater than the nanowire one, and at this
a UV−vis spectrometer and the resulting plot is given in Figure point good percolation was reached for the composite. Figure 8
7. The figure confirms that pure PMMA film transmits about
Figure 7. UV−vis spectra for pure PMMA and for nanocomposites; Figure 8. Plots of the transmittance at 550 nm and the electrical
the inset shows a zoom in the visible spectrum. resistance of composites as function of the amount of nanowires.
95% visible light and has a characteristic absorption at 275 nm, summarizes these findings and also shows the UV−vis average
attributed to carbonyl groups in the polymer macromolecule.27 transmittance at 550 nm. While the UV−vis data presents an
For a wavelength below 257 nm, the transmittance is observed almost linear decreasing of transmittance as the amount of
to drop abruptly. This absorption is known as the optical nanowires increased, the electrical response has an abrupt drop
window of the PMMA, where the light energy is high enough at 5 wt % of filler. So, Figure 8 shows that the effect of
to excite electrons. Three changes are noticed in the UV−vis nanowires insertion is more pronounced in the electrical
results when ITO nanowires are inserted in the composite. response than in the optical one, and this is a good result in
First, the absorption at 275 was found to increase as the order to obtain transparent and conductive materials.
amount of nanowires was increased. This was attributed to the For those samples that presented percolation, it was possible
interaction effect of the polymer with the wires; second, as to measure the electrical resistance using the four probe
already observed qualitatively in Figure 6, the transmittance of approach which represents a more accurate method. Values
visible light was found to decrease as the amount of nanowires obtained from this method are given in Table 2. From the four
in the composite increases, with the minimum transmittance probe method results, it was observed that the composite with
reaching about 55%, which is considered a good value for 10 wt % of filler has about the same electrical resistance of
several practical applications. Finally, composite samples were nanowires, confirming the occurrence of good percolation. The
found to present a small absorption band at 780 nm. This electrical resistance corrected by the geometric parameters
12950 dx.doi.org/10.1021/jp3031418 | J. Phys. Chem. C 2012, 116, 12946−12952
The Journal of Physical Chemistry C Article
Figure 9. (a) Plot of average number of wires to achieve percolation as function of the wire length and (b) typical simulation of wires with horizontal
percolation.
applications, and practical tests can be performed with this (15) Hoshi, Y; Kato, H; Funatsu, K. Thin Solid Films 2003, 445 (2),
system in order to examine its technological viability. 245−250.
(16) Manifacier, J. C. Thin Solid Films 1982, 90 (3), 297−308.
4. CONCLUSION (17) Ginley, D. S.; Bright, C. MRS Bull. 2000, 25 (8), 15−18.
(18) Orlandi, M. O.; Aguiar, R; Lanfredi, A. J. C.; Longo, E; Varela, J.
ITO nanowires were successfully synthesized by a carbothermal A.; Leite, E. R. Appl. Phys. A: Mater. Sci. Process. 2005, 80 (1), 23−25.
reduction process with the coevaporation of oxides, and these (19) Orlandi, M. O., Lanfredi, A. J. C., Longo, E. In Microscopy:
wires were used as filler in PMMA polymer. The electrical Science, Technology, Applications and Education, Microscopy Book
response showed that ITO wires have a high conductivity (106 Series Vol. 4; Méndes-Vilas, A, Dias, J., Ed.; Formatex: Spain, 2011; pp
S/m), but incorporation of filler up to 2% does not change the 1667−1673.
composite electrical resistance, and percolation began at 5 wt % (20) Balberg, I; Binenbaum, N. Phys. Rev. B 1983, 28 (7), 3799−
3812.
of filler. The optical response of the composite showed that the (21) Balberg, I; Binenbaum, N.; Anderson, C. H. Phys. Rev. Lett.
transmittance decreases as the amount of filler increases, but 1983, 51 (18), 1605−1608.
this effect is almost linear. It means that the filler insertion has a (22) Enoki, H; Echigoya, J; Suto, H. J. Mater. Sci. 1991, 26 (15),
greater influence on the electrical than on the optical response 4110−4115.
of the composite. The TEM analysis supported the electrical (23) Wagner, R. S.; Ellis, W. C. Appl. Phys. Lett. 1964, 4 (5), 89.
results showing that the beginning of percolation occurs for 5 (24) Xia, Y; Yang, P; Sun, Y; Wu, Y; Mayers, B; Gates, B; Yin, Y;
wt % of filler and increasing the filler amount to 10 wt % does Kim, F; Yan, H. Adv. Mater. 2003, 15 (5), 353−389.
not significantly alter the morphology of the composite. The (25) Mohammad, S. N. Nano Lett. 2008, 8 (5), 1532−1538.
results presented here show that the insertion of a low (26) Chiu, S. P.; Chung, H. F.; Lin, Y. H.; Kai, J. J.; Chen, F. R.; Lin,
concentration of ITO nanowires in PMMA polymer enables J. J. Nanotechnology 2009, 20, 105203.
(27) Zidan, H. M.; Elnader, M. A. Phys. B 2005, 355 (1−4), 308−
obtaining transparent and conductive composites.
■
317.
(28) Alam, M. J.; Cameron, D. C. Surf. Coat. Technol. 2001, 142
AUTHOR INFORMATION (144), 776−780.
Corresponding Author (29) Lee, J. Y.; Yang, J. W.; Chae, J. H.; Park, J. H.; Choi, J. I.; Park,
*E-mail: orlandi@iq.unesp.br. H. J.; Kim, D. Opt. Commun. 2009, 282 (12), 2362−2366.
(30) Taya, M. Electronic Composites: Modeling, Characterization,
Notes Processing and MEMS Applications; Cambridge University Press: New
The authors declare no competing financial interest. York, 2008.
■
(31) Yeh, J. M.; Chang, K. C.; Peng, C. W.; Lai, M. C.; Hung, C. B.;
ACKNOWLEDGMENTS Hsu, S. C.; Hwang, S. S.; Lin, H. R. Mater. Chem. Phys. 2009, 115 (2−
3), 744−750.
We would like to thank the financial support of Brazilian
funding agencies FAPESP and CNPq. TEM facilities were by
LME-LNLS and IQ-UNESP. SEM facilities were provided by
LMA-IQ-UNESP.
■ REFERENCES
(1) Burda, C; Chen, X; Radha, N; El-Sayed, A. Chem. Rev. 2005, 105
(4), 1025−1102.
(2) Johnson, M. C.; Aloni, S; Mccready, D. E.; Bourret-Courchesne,
E. D. Cryst. Growth. Des. 2006, 6 (8), 1936−1946.
(3) Yan, Y; Zhou, L; Zhang, J; Zeng, H; Zhang, Y; Zhang, L. J. Phys.
Chem. C 2008, 112 (28), 10412−10417.
(4) Peng, X. S.; Wang, Y. W.; Zhang, J; Wang, X. F.; Zhao, L. X.;
Meng, G. W.; Zhang, L. D. Appl. Phys. A: Mater. Sci. Process. 2002, 74
(3), 437−439.
(5) Chen, Y. Q.; Jiang, J; Wang, B; Hou, J. G. J. Phys. D Appl. Phys.
2004, 37 (23), 3319−3322.
(6) Wan, Q; Dattoli, E. N.; Fung, W. Y.; Guo, W; Chen, Y; Pan, X;
Lu, W. Nano Lett. 2006, 6 (12), 2909−2915.
(7) Yan, Y; Zhou, L. Appl. Phys. A: Mater. Sci. Process. 2008, 92 (2),
401−405.
(8) Carotenuto, G; Valente, M; Sciume, G; Valente, T; Pepe, G;
Ruotolo, A; Nicolais, L. J. Mater. Sci. 2006, 41 (17), 5587−5592.
(9) Winey, K. I.; Vaia, R. A. MRS Bull. 2007, 32 (4), 314−321.
(10) Tans, S. J.; Devoret, M. H.; Dai, H; Thess, A; Smalley, R. E.;
Geerligs, L. J.; Dekker, C. Nature 1997, 386 (6624), 474−477.
(11) Mintmire, J. W.; Dunlap, B. I.; White, C. T. Phys. Rev. Lett. 1992,
68 (5), 631−634.
(12) Nozaki, T; Karatsu, T; Ohnishi, K; Okazaki, K. Carbon N. Y.
2010, 48 (1), 232−238.
(13) Kim, D. O.; Lee, M. H.; Lee, J. H.; Lee, T. W.; Kim, K. J.; Lee, Y.
K.; Kim, T; Choi, H. R.; Koo, J. C.; Nam, J. D. Org. Electron. 2008, 9
(1), 1−13.
(14) Shanthi, E; Dutta, V; Banerjee, A; Chopra, K. L. J. Appl. Phys.
1980, 51 (12), 6243−6251.