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2SK3116-ZJ TO-263
FEATURES
•Low gate charge
QG = 26 nC TYP. (ID = 7.5 A, VDD = 450 V, VGS = 10 V)
•Gate voltage rating ±30 V
•Low on-state resistance
RDS(on) = 1.2 Ω MAX. (VGS = 10 V, ID = 3.75 A)
•Avalanche capability ratings
The information in this document is subject to change without notice. Before using this document, please
confirm that this is the latest version.
Not all devices/types available in every country. Please check with local NEC representative for
availability and additional information.
Document No. D13339EJ2V0DS00 (2nd edition) The mark ★ shows major revised points. © 1998
Date Published May 2002 NS CP (K)
Printed in Japan
2SK3116
Zero Gate Voltage Drain Current IDSS VDS = 600 V, VGS = 0 V 100 µA
Gate Leakage Current IGSS VGS = ±30 V, VDS = 0 V ±100 nA
Fall Time tf RL = 50 Ω 15 ns
D.U.T.
IG = 2 mA RL
PG. 50 Ω VDD
Pulsed
25
100
Tch = 125˚C
VGS = 10 V
ID - Drain Current - A
20 75˚C
ID - Drain Current - A
8V 10
15
1.0 Tch = 25˚C
6V −25˚C
10
0.1
5
VDS = 10 V
Pulsed
0 10 20 30 40 0 5 10 15
VDS - Drain to Source Voltage - V VGS - Gate to Source Voltage - V
Tch = −25˚C
4.0 25˚C
75˚C
125˚C
3.0
1.0
2.0
1.0
VDS = 10 V
VDS = 10 V
ID = 1 mA Pulsed
0 0.1
−50 0 50 100 150 0.1 1.0 10
Tch - Channel Temperature - ˚C ID - Drain Current - A
3.0
Pulsed 3.0 Pulsed
2.0
2.0
ID = 4.0 A
7.5 A
VGS = 10 V
20 V
1.0
1.0
0
0 5 10 15 0 1.0 10 100
VGS - Gate to Source Voltage - V ID - Drain Current - A
4.0
3.0
10
ID = 7.5 A
2.0 4.0 A
1.0
VGS = 10 V 0V
1.0 0.1
VGS = 10 V
Pulsed Pulsed
0
−50 0 50 100 150 0 0.5 1.0 1.5
Tch - Channel Temperature - ˚C VSD - Source to Drain Voltage - V
10000
tf
Ciss 10 td(on)
1000
100 Coss tr
1
10
VDD = 150 V
VGS = 0 V Crss VGS = 10 V
f = 1 MHz RG = 10 Ω
1 0.1
1.0 10 100 1000 0.1 1 10
VDS - Drain to Source Voltage - V ID - Drain Current - A
14
VDD = 450 V
600 12
300 V
1000 150 V
VGS 10
400 8
6
100
200 4
VDS
2
10 0
0.1 1.0 10 100 0 8 12 20 32
ID - Drain Current - A QG - Gate Charge - nC
60 50
40
40 30
20
20
10
0
0 20 40 60 80 100 120 140 160 0 20 40 60 80 100 120 140 160
TC - Case Temperature - ˚C TC - Case Temperature - ˚C
100
ID(pulse)
PW
=
10
ID - Drain Current - A
d µs
ite 10
10 Lim
0
ID(DC) µs
)
on 1
S( m
RD s
Po 3
we 10 ms
3 m
r Di 10 0 m s
0 s
ss DC ms
ipa
1 tio
n
Lim
ite
d
TC = 25˚C
Single Pulse
0.1
1 10 100 1000
VDS - Drain to Source Voltage - V
10
Rth(ch-C) = 1.79˚C/W
1
0.1
0.01
10 µ 100 µ 1m 10 m 100 m 1 10 100 1000
PW - Pulse Width - s
RG = 25 Ω
100 VGS = 20 → 0 V
1.0 40
RG = 25 Ω
VDD = 150 V 20
VGS = 20 → 0 V
Starting Tch = 25˚C
0.1 0
10 µ 100 µ 1m 10 m 25 50 75 100 125 150
L - Inductive Load - H Starting Tch - Starting Channel Temperature - ˚C
4.8 MAX.
1.0±0.5
10.6 MAX. 4.8 MAX.
3.0±0.3
8.5±0.2
5.9 MIN.
15.5 MAX.
4
1 2 3
4
12.7 MIN.
1 2 3
1.3±0.2
6.0 MAX.
12.7 MIN.
1.3±0.2
0.75±0.3 0.5±0.2 2.8±0.2
2.54 TYP. 2.54 TYP.
0.75±0.1 0.5±0.2 2.8±0.2
1.Gate
2.54 TYP. 2.54 TYP. 2.Drain
1.Gate 3.Source
2.Drain 4.Fin (Drain)
3.Source
4.Fin (Drain)
3) TO-263 (MP-25ZJ)
8.5±0.2
Drain (D)
1 2 3
5.7±0.4
1.4±0.2 P.
TY Body
R P.
0.7±0.2 0.5 TY 0.5±0.2 Gate (G) Diode
R
2.54 TYP. 2.54 TYP. 0.8
1.Gate
2.Drain Source (S)
3.Source
2.8±0.2
4.Fin (Drain)
Remark Strong electric field, when exposed to this device, can cause destruction of the gate oxide and ultimately degrade
the device operation. Steps must be taken to stop generation of static electricity as much as possible, and quickly
dissipate it once, when it has occurred.
• The information in this document is current as of May, 2002. The information is subject to change
without notice. For actual design-in, refer to the latest publications of NEC's data sheets or data
books, etc., for the most up-to-date specifications of NEC semiconductor products. Not all products
and/or types are available in every country. Please check with an NEC sales representative for
availability and additional information.
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M8E 00. 4