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to coordinate
metrology
Table of Contents
Projections ............................................................. 16
Using Effective Probe Techniques ........................ 18
Museum
Oa
k
tn ut
es
Ch
Restaurant
Sy E
cam
ple ore
Ma
D
5
ch
4 Bir C
Elm
3
B
2
Train Station
1 A
Figure 1
YA
s
xi
xis
A
X
s
xi
A
X
YA
xis
Z Axis
Origin or Datum
Figure 2
Z Axis
Y Axis
X Axis
Figure 3
YA is
xis Ax
X
Figure 4
What is Alignment?
With today's CMM software, the CMM measures the
workpiece's datums (from the part print), establishes
the Part Coordinate System, and mathematically
relates it to the Machine Coordinate System.
Z Axis
Z Axis Y Axis
Y Axis
X Axis
X Axis
Z Axis
YA is
xis Ax
X
Figure 5
Museum (Datum)
Oa
k
t
tnu
es
Ch
Sy Restaurant (Datum)
cam
E
ple ore
Ma
D
5
ch
4 Bir C
Elm
3
B
2
Train Station (Datum)
1 A
Figure 6
Datum Surface
Datum Circle
Datum Point
Datum Line
Figure 7
Translated Origin
First Origin
Figure 8
Museum
4 3 2 1 Oa
0 0 k
Restaurant 1
t
tnu
es
Ch 2
3 E
ple 4
Ma Sy
cam
ore D 0
5 1
ch
4 Bir C 2
Elm
3
3
B 4
2
Train Station
1 A
Figure 9
Origin
°
5
4
Figure 10
Measured Circles
Constructed Circle
Measured Circles
Figure 11
Measured Features
Measured Features
Figure 12
Magnetic North
True North
3
Figure 13
Probe Compensation
CMMs generally gather their data by touching the
workpiece with a probe (either a solid probe or an
electronic touch trigger probe) attached the machine's
measuring axis. Although the tip of the probe is very
accurate, once the probe is attached to the CMM, the
location of the tip to the machine's coordinate system
must be determined prior to measuring. Since it's the
tip's circumference that touches the part, the probe's
center and radius are determined by measuring a very
accurate sphere (requalification sphere).
Probe Tip
Probe Offset
Figure 14
Figure 15
P1 P2
P3
P5
P4
P1
P2
P5 P3
P4
Y
Figure 16
PAR
T SU
RFA
CE
PointPOtoINTbeTOprobed
BE P
ROB
APP ED
Approach
R of the probe
SHO OACH O
should F TH ±20° of
ULD within Note that probe approach
OF T be B E PR
HE E WIT OB vectors are perpendicular
PRO O M PERPE HINto
theTperpendicular ±80 E Note that probe
ProbeBpath
E PA INIM
IZE NDICUL ° to the surface of the sphere
TH SKID error
minimize skidding A
DIN R
G ER
ROR
approach vectors
are perpendicular
Figure 17 to the surface of
the sphere.
Highest Repeatability
Perpendicular to the Probe
Body Highest Repeatability
Perpendicular to the Probe Body
Parallel
Paralleltoto the Probe
the Probe BodyBody
(Alongaxis
(Along axis ofof
stylus)
stylus)
Figure 18
Shanking
Figure 20
Ball/Stem Clearance
Figure 21
Figure 22
Perpendicularity—The condition of a
surface or axis at a right angle to a
datum plane or axis. Perpendicularity
tolerance specifies one of the following:
a zone defined by two planes perpen-
dicular to a datum plane or axis, or a
zone defined by two parallel planes
perpendicular to the datum axis.
Parallelism—The condition of a
surface or axis equidistant at all points
from a datum plane or axis. Parallelism
tolerance specifies one of the following:
a zone defined by two planes or lines
parallel to a datum plane or axis, or a
cylindrical tolerance zone whose axis is
parallel to a datum axis.