ESD Pulse Measurements Using Oscilloscopes - August 2017

EMC / ESD Pulse Measurements
Using Oscilloscopes – August 2017

Contents
• EMC Measurement Categories and Requirements

• ESD Pulse Test Requirements and Measurement Thresholds
• Sequenced Acquisition for EFT (Electrical Fast Transient) Debug
• Surge Testing
• MIL-STD-461G
• Voltage Testing Below Battery Level
• Sample Rate and V/div Effect on ESD Pulse Measurements
• Level-At-Pulse, Time-To-Value, and Parameter Limiters
• ESD RC Time Constant Measurement
• Radiated Immunity Testing
Quadrants of EMC/ESD Testing
Radiated Conducted  Oscilloscopes are used for:

Emissions Emissions  Radiated Immunity
Will the EUT create How much noise  Conducted Immunity
emissions that interfere
with the operation of
voltage is injected back
into the mains by the
 Conducted Immunity Pulsed EMI
other products? EUT? tests include:
 ESD (Electrostatic Discharge)
Radiated Conducted  EFT (Electrical Fast Transient)
 Surge Testing
Immunity Immunity
Will the EUT be Will the EUT be
susceptible to emissions susceptible to transients
from other devices, generated by switching
either through the air or of capacitive or
via cables? inductive components?
EUT = Equipment Under Test
ESD Pulse Test
Requirements
Conducted Immunity General Test Requirements
 Generate a Burst, Surge, or ESD pulse
 Verify the pulse shape from the generator using an oscilloscope,
verifying parameters such as:
 Rise Time
 Fall Time
 Pulse Width
 Frequency
 Pulse Repetition interval
 Burst Repetition interval
 Ensure that the DUT still operates correctly during test, for example:
 Automotive engine control unit still transmits proper messages
 Telecom board serial data messages are uncorrupted
 Consumer electronics item still functions
 ESD Standards examples:
 IEC 61000-4, EN 61000-4, ITU, UL, FCC, Telcordia, ANSI, Bellcore,
ISO10605:2001, ISO10605:2008, MIL-STD-461G, proprietary military,
proprietary automotive, etc.
 The majority of Immunity Testing follows the IEC 61000 (CE Mark)
Diagram of ESD calibration using scope
ESD Testing – Electrostatic Discharge
Measurement Steps
 Typical Pulse Characteristics

 Trise = 0.7 to 1.0 ns
 Tfall = 0.7 to 1.0 ns
 Measurement Needs
 Capture a Single Pulse
 Measure one pulse, verify rise time
for positive pulses, verify fall time for
negative pulses
 1 GHz, 2 GHz, or 4 GHz+ scope
depending on standard specification
How is risetime measured on this ESD pulse?

10%-90% risetime measurement first requires the
determination of 0% and 100% levels.
Pulse Measurement Definitions
IEEE Standard Pulse Definitions
How Oscilloscopes Measure Pulse Parameters
 Oscilloscopes determine pulse parameters from Top and Base values

IEEE Pulse Definitions
How Pulse Measurements Are Determined
 Pulse measurement definitions are defined by the

IEEE Std 181-2003 "IEEE standard on
transitions, pulses, and related waveforms"
 Oscilloscopes conform to the IEEE pulse

measurement definitions, and Top and Base are
determined statistically based on the two modes
of a voltage level histogram.
 Top and Base form the 100% and 0% reference

levels which are used for measurements such as
amplitude, risetime, falltime, period, frequency,
width, duty cycle, overshoot, and virtually every
timing measurement.
 Top and Base must first be calculated correctly in

order for timing and amplitude measurements to
produce the correct measurement result.
Clock Top and Base are correctly determined from a voltage histogram
Top
Two main
modes emerge
from the voltage
Clock pulses with clearly level histogram,
delineated Top and Base identifying the
steady state
values of Top
and Base
Base
Top and Base are not meaningful for ESD pulse measurements
What happens when

standard pulse parameters
are applied to an ESD
waveform?
Top
A voltage level histogram of this ESD pulse

does not result in the identification of two
ESD pulse
main modes. Standard pulse parameters
will not yield correct results in this case.
Base
ESD Top and Base are not meaningful for pulse measurements
With Top (100%) and Base (0%) identified in the

following locations, the 10%-90% risetime
measurement will only encompass a very small portion
of the total ESD pulse rising edge
Top
Base
ESD Pulse Rise Time Definitions Require 0% and Max
Different than IEEE pulse definitions, EMC pulse
definitions (for example the IEC 61000-4-2 standard)
use 0% and Max, instead of Top and Base to calculate
10%-90% risetime
An oscilloscope must use 0% and Max thresholds in

order to perform the EMC-specific measurement
EMC pulse measurements now require the use of

thresholds set to 0% and Max (where Max is the peak
voltage level of the waveform), instead of Top and
Base, to meet the measurement specification. Modern
oscilloscopes have begun to allow for EMC pulse
parameter measurements using threshold settings of
peak-to-peak, 0% to Max, and 0% to Min along with
the standard absolute or percent levels.
Risetime calculated using standard IEEE pulse parameter definitions
Risetime is incorrectly calculated as 494 picoseconds on this ESD

pulse. Note the risetime detailed marker location.
Risetime calculated using EMC thresholds
Max
0%
Risetime is correctly calculated as 854
picoseconds on this ESD pulse
Effect of thresholds on the Width
measurement of this ESD pulse
Effect of thresholds on the Width
measurement of this ESD pulse
Standard and EMC thresholds for ESD pulse width
The pulse width and risetime are measured, both with and without EMC
thresholds applied. In parameter 1 (P1), the thresholds are set to 0% - Max, and
the pulse width is measured correctly as 2.109 nanoseconds. In parameter 2
(P2), the thresholds are set to the standard scope threshold of 50% of Top and
Base. In this case, the measurement is incorrectly reported as 50.348
nanoseconds -- an error of 2287%. The width measurement was impacted so
significantly, that the 50% threshold between Top and Base actually produced a
width measurement on the wrong pulse shape. Parameter 3 (P3) is set to the
correct EMC threshold of 0% to Max, producing a correct electrostatic pulse
risetime measurement of 833 picoseconds. Notice that in parameter 4 (P4), the
standard risetime is incorrectly reported as 873 picoseconds. When using
standard pulse parameter measurements, erroneous values can be obtained.
Use of standard pulse thresholds produced a

2287% measurement error on this ESD pulse. Note
the threshold indicated in the width@level
parameter marker for each.
EMC Level-At-Pulse,
Time-To-Value,
Parameter Limiting
EMC Level-At-Pulse Parameter
EMC Time-To-Half Value Parameter
Parameter limiting technique for ESD width measurement
Because EMC pulses often have pulse perturbations on the falling edge of the pulse, these
can result in false measurement readings when using standard parameters. For example,
if the falling edge had ringing oscillations which repeatedly crossed the threshold, then
multiple false width readings would be possible. For this reason, a measurement filtering
capability which can limit the number of pulses the scope measures in an acquisition is
needed. This measurement filtering capability, now available on modern scopes, allows for
pulse-like perturbations on the falling edge of a pulse to be ignored and excluded from the
measurement results. Parameter statistics could be accumulated on the first pulse in
conjunction with parameter limiting subsequent perturbations.
A Parameter Limiter Is Needed To Avoid Measuring The Bounce Areas As Widths
Parameter Limiter Isolates Correct Width
ESD Verification
Test Setup Example
Verification Of The Output Characteristics Of The Test Pulse Generator
• 20 dB attenuator connects to
current shunt target output
• double shielded cable leads to
6 dB attenuators on input of
scope
current shunt
target
Teledyne LeCroy in cooperation with Hitachi Automotive Systems



Using 0% - Max Thresholds for ESD Rise Time Measurement

Calculating ESD Pulse Maximum (first peak current)

Voltage level calculation at 400 ns delay after 50% incident pulse level
(current at t1)

Voltage level calculation at 800 ns delay after 50% incident pulse level
(current at t2)

ESD pulse parameters of rise time, first peak current, and currents at t1 and t2
First peak current
Rise time
Current at t1 Current at t2

Sample Rate's Impact On Rise Time
For ESD Pulse Measurements
Effect of Sample Rate On ESD Rise Time Measurements
ESD pulse sampled

at 40 GS/s Approximately 50 sample
points on rising edge
ESD pulse sampled Approximately 5 - 6 sample

at 4 GS/s points on rising edge
ESD pulse sampled Not enough sample

at 2 GS/s points to correctly
characterize rising edge
ESD pulse sampled Not enough sample

at 1 GS/s points to correctly
characterize rising edge
Effect of Sample Rate On ESD Rise Time Measurements
ESD pulse sampled

at 40 GS/s Measured rise time:
839 ps
ESD pulse sampled Measured rise time: (3% measurement error)

at 4 GS/s 865 ps
ESD pulse sampled Measured rise time:

at 2 GS/s 1.070 ns
ESD pulse sampled Measured rise time < 1.54 ns,

at 1 GS/s and measurement warning is
reported
Sample Rate Goal for ESD Pulses:
Rule Of Thumb: Acquire At Least 10 Sample Points On The Rising Edge
50 sample pts on
rising edge
Measured risetime
10 sample pts on result is within one
rising edge half of one percent
(measurement result is
within 0.5% of 839 ps)
Measurement Method Background:
Sparse Math Operator Was Used To Isolate Sample Rate Effect On Same Input Waveform
Dynamic Range and Signal Integrity
For ESD Pulse Measurements
Dynamic Range and Signal Integrity For ESD Pulse Measurements
This Concept Holds True for All Digitizing Real Time Scopes
8 vertical bits (256 ADC levels)

available at full scale
or 12 vertical bits (4096 ADC levels)

available at full scale

available at half scale

available at half scale

available at quarter scale

available at quarter scale
Scope Block Diagram Shows Why Maximizing Waveforms In Grid Maximizes Measurement Accuracy
Surge Testing
Surge Testing General Test Requirements
 Pulse Characteristics
 Trise = typically 1.2 to 10 ms
 Tfall = typically 20 to 10,000ms
 Rise time
 Pulse Width
 Maximum
 Area
 Charge
A Surge pulse also does not have a clearly-defined Top and Base
The pulse characteristics of a surge pulse also do not conform to the

IEEE pulse parameter definitions, because the surge does not have high
and low steady-state values. After a fast linear rise to a sharp peak, the
waveform then exponentially decays toward, but does not quickly reach,
an asymptote. With no steady-state values, the surge will produce
indeterminate Top and Base values. Because Top and Base must be
determined in order to calculate the thresholds used for risetime,
falltime, and pulse width, the measurements therefore become invalid
when using traditional oscilloscope clock pulse parameters.
Hardware Configuration for Surge Verification

Hardware Configuration for Surge Verification

Surge Verification Measurements Including
Rise Time, Pulse Width, Maximum, Area, and Charge

Application example:
The ISO10605:2008 standard requires
the measurement of 10 consecutive parameter values
ISO10605:2008 pulse measurement statistics
of 10 consecutive acquisitions

Histogram statistical distribution of 10 consecutive acquisitions

The ISO10605:2001(E) standard (pg 13) requires the
measurement of the RC time constant value of the
decay of an air discharge ESD pulse.
A location is referenced at a stable point on the waveform,

then a second point is located at 37% voltage level of the
first value. The time difference between the two points
is calculated to determine the RC time constant
of the decay time.
Hardware setup for automated RC time constant measurement
978-1-5090-1416-3/16/$31.00 ©2016 IEEE

ISO10605:2001(E) automated RC time constant measurement
978-1-5090-1416-3/16/$31.00 ©2016 IEEE

ISO10605:2001(E) automated RC time constant measurement CustomDSO
978-1-5090-1416-3/16/$31.00 ©2016 IEEE

ISO10605:2001(E) RC time constant measurement script code
978-1-5090-1416-3/16/$31.00 ©2016 IEEE

Trend Plot Shows Data Log of RC Time Constant Values
978-1-5090-1416-3/16/$31.00 ©2016 IEEE

Oscilloscope Measurement Processing Flow
978-1-5090-1416-3/16/$31.00 ©2016 IEEE

Script processing flow for ESD RC Time Constant Measurement
978-1-5090-1416-3/16/$31.00 ©2016 IEEE

Voltages Referenced Below Battery Level
Battery Voltage Signal From Generator

Method 1 to characterize voltage level:
Runt Trigger on individual pulses

Runt Trigger on individual pulses

Gated Mean Measurement




Dropout and Interrupt Testing
Method 1 Runt / Glitch Triggering Can Also Be Used To Capture Dropouts and Interrupts
 Monitor AC or DC voltage
line with oscilloscope during
EMC testing
 Verify that dropout or
interrupt occurred, and that
device under test was
unaffected
Electrical Fast Transient (EFT)
Testing
Transient Testing
 Capacitive load dump
 Inductive kickback/spike (back EMF
from motor turn off)
 Capture Time – longer the better:
 Relay bounce (ms to ms)
 Transient time
 ms (motor)
 ns (FET switch)
 Measure 50-100 MHz transient
 10s capture = 2Mpts at 100
MHz Sample Rate
EFT Testing – Electrical Fast Transient
Measurement Steps
 Trise = 5ns
 Tfall = 50ns
 Burst of many 5x50 pulses
 Capture 2ms of burst
 Measure one pulse, verify shape (rise, fall,
width)
 Measure burst frequency (10-100 kHz)
 Measure Capture time of burst packet (2ms)
 Measure burst packet rate (300ms)
Measurement Statistics
All-instance measurements characterizes all

76 rise times and pulse widths in this EFT
burst. EFT bursts can be batch processed to
determine EFT pulse characteristics, burst
frequency, and packet rate (shown next).
Maximizing Acquisition Memory for Events
Event occupies 1%
of acquisition time
Empty space Empty space
100 ns/div
Acquisition time
optimized for event
1 ns/div
Mosaic of events is acquired while optimizing

acquisition memory, and displayed without
empty spaces between events
Mosaic of events is acquired while optimizing

acquisition memory, and displayed without
empty spaces between events
Individual timestamps for each event listed with segment

acquisition time and intersegment time. This will
automatically measure the EFT burst packet rate.
Sequence Mode and Octal Grid
Sequenced acquisition Zoom of EFT

of 5 EFT bursts pulses
Zoom of one Zoom of EFT

EFT burst pulses
Zoom of one Zoom of one

EFT pulse EFT pulse
Zoom of one FFT

EFT pulse
Individual EFT Pulses

One EFT Burst - Acquired at 2.5 GS/s - note linear top of burst

One EFT Burst - Acquired at 125 MS/s - note amplitude distortion at top of burst

Comparison of one EFT burst captured at 1.25 GS/s and 125 MS/s
125 MS/s 2.5 GS/s

Effect of Sample Rate on EFT Pulse Capture
Sampled at 100 MS/s vs. 1.25 GS/s
100 MS/s 2.5 GS/s

Frequency measurement parameter measures only values in the range between 9kHz and 11kHz

Negative width parameter calculates gap time with values in range

EFT Rise Time With 0-Max Thresholds

Note the difference between P2 Width (gap time) and P4 Width (EFT pulse width)

EFT Max, Area, and Energy Calculations

Electrical Fast Transient (EFT)
Debugging Techniques
Using Segmented Memory
20 EFT Bursts Captured Using Segmented Memory

Inter-burst EFT Timestamps

Inter-pulse EFT Timestamps:
Individual EFT pulses in segmented memory

Overlay And Waterfall Of EFT Pulses Verifies Correct EFT Pulse Shape Characteristics

Segmented Overlay And Waterfall Of EFT Pulses Highlights Anomalies
Reveals Possible Bad Contact Within The Transient Simulator

EMC - Radiated Immunity Testing
Radiated Immunity Testing - Real Time Functional Performance Evaluation
Deviation detection of a device under test (DUT) during exposure to a disturbance
Functional state of the

DUT is output through
non-conductive fiber Mechanical mode
optic cables tuner
Devices under test

are exposed to
Transmit and receive
electric fields high
antennas generate a
enough to effect
controlled electric field
operation of non-
shielded equipment.
RF-hardened fiber optic transmitters

Outside the reverberant chamber, oscilloscope masks test for acceptance criteria
Optical receiver
and O/E converter
16 channels performing mask test criteria such as

signal high level, signal low level, frequency, duty
cycle, and other criteria fit within tolerance limits
described in the test plan

Views from inside and outside of the reverberant chamber

Simulated ECU (Electronic Control Unit) outputs:
Two PWM outputs, a driver actuator signal, and a CAN split signal

Mask testing ECU outputs: example with passing results

Mask testing ECU outputs exceeding the tolerance mask criteria

High Voltage Fiber Optically-isolated Probe?
Amplifier/Modulating Transmitter Attenuating Tip Accessories
A frequency modulating optical transmitter is Available in a variety of voltage ranges,
used for signal and data transmission across e.g., +/-1V, +/-5V, +/-20V and +/-40V with
a fiber optic cable. a simplified pin socket termination
Fiber Optic Cable

A standard 1m length
cable is provided, but
longer ones may be
purchased for use.
De-modulating Receiver
The optical signal is received
and de-modulated to an electrical
output to the oscilloscope with
correct voltage scaling.
High Voltage Active Single-ended (Fiber Optic) Probes
Parameter Value
Bandwidth 60 MHz
Voltage Range (SE) 2 to 80V
Voltage Range (CM) Virtually Unlimited
Loading 1-10MΩ || 34-22pF
ZIN=50kΩ@100 kHz
Attenuation 2x to 80x
CMRR >140 dB
 A new topology specifically for

measuring small signals floating on
a HV DC bus
RTCA/DO-160G
Radio Technical Commission for Aeronautics
Test Procedures for Airborne Equipment
Momentary Power Interruption
Specified measurement requirements
Trigger on the interrupt by using the negative-polarity Width trigger
(or Dropout trigger, etc)
Set Parameter P1 to be Time@level, Negative slope, 99% level
to locate the exact time where the voltage transitions from the 100% level
Drag P1 to P2, and change the percent level to 30% level (or percentage specified for Vmin)
Drag P2 to P3, and change the slope to Positive
Drag P3 to P4, and change the percent level to 99%
Using P5, subtract P2-P1. This is Tf.
Using P6, subtract P3-P2. This is Ti.
Using P7, subtract P4-P3. This is Tr.
Parameter Aliases used to accurately label Tf, Ti, Tr
Statistical analysis finds anomalies of Tf, Ti, Tr
Trends can logging Tf, Ti, Tr
MIL-STD-461G
Department of Defense
Requirements for the Control of Electromagnetic Interference
Characteristics of Subsystems and Equipment
MIL-STD-461G
• CS117 and CS118 are new with the G version of
the standard specification
• Applicable to a wide variety of DoD systems
• CS117: Lightning strike testing
• CS118: ESD testing
“This requirement is applicable to all aircraft safety-critical equipment

interconnecting cables, including complete power cables, and
individual high side power leads. It is also applicable to non-safety
critical equipment with interconnecting cables/electrical interfaces that
are part of or connected to equipment performing safety critical
functions. It may be applicable to aircraft equipment performing non-
safety critical functions when specified by the procuring activity. This
requirement applies to surface ship equipment which is located above
deck or has interconnecting cables which are routed above deck.”
MIL-STD-461G CS116 damped sinusoid measurement
MIL-STD-461G EMC level-at-pulse and half life measurements
MIL-STD-461G multiple stroke and multiple burst lightning strike test
Surge Test example computing Rise Time, Pulse Width, Maximum, Area, and Charge
Special Thanks To:
Special thanks to Hitachi Automotive
Systems (an ISO accredited lab) for
providing access to EMC test setups,
equipment, expertise and insight.

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EMC / ESD Pulse Measurements

Using Oscilloscopes – August 2017

• EMC Measurement Categories and Requirements

Radiated Conducted  Oscilloscopes are used for:

 Typical Pulse Characteristics

How is risetime measured on this ESD pulse?

 Oscilloscopes determine pulse parameters from Top and Base values

 Pulse measurement definitions are defined by the

 Oscilloscopes conform to the IEEE pulse

 Top and Base form the 100% and 0% reference

 Top and Base must first be calculated correctly in

What happens when

A voltage level histogram of this ESD pulse

With Top (100%) and Base (0%) identified in the

An oscilloscope must use 0% and Max thresholds in

EMC pulse measurements now require the use of

Risetime is incorrectly calculated as 494 picoseconds on this ESD

Use of standard pulse thresholds produced a

Teledyne LeCroy in cooperation with Hitachi Automotive Systems

Teledyne LeCroy in cooperation with Hitachi Automotive Systems

Teledyne LeCroy in cooperation with Hitachi Automotive Systems

Teledyne LeCroy in cooperation with Hitachi Automotive Systems

Teledyne LeCroy in cooperation with Hitachi Automotive Systems

Teledyne LeCroy in cooperation with Hitachi Automotive Systems

Teledyne LeCroy in cooperation with Hitachi Automotive Systems

First peak current

Teledyne LeCroy in cooperation with Hitachi Automotive Systems

ESD pulse sampled

ESD pulse sampled Approximately 5 - 6 sample

ESD pulse sampled Not enough sample

ESD pulse sampled Not enough sample

ESD pulse sampled

ESD pulse sampled Measured rise time: (3% measurement error)

ESD pulse sampled Measured rise time:

ESD pulse sampled Measured rise time < 1.54 ns,

8 vertical bits (256 ADC levels)

or 12 vertical bits (4096 ADC levels)

7 vertical bits (128 ADC levels)

or 11 vertical bits (2048 ADC levels)

6 vertical bits (64 ADC levels)

or 10 vertical bits (1024 ADC levels)

The pulse characteristics of a surge pulse also do not conform to the

Teledyne LeCroy in cooperation with Hitachi Automotive Systems

Teledyne LeCroy in cooperation with Hitachi Automotive Systems

Teledyne LeCroy in cooperation with Hitachi Automotive Systems

Teledyne LeCroy in cooperation with Hitachi Automotive Systems

Teledyne LeCroy in cooperation with Hitachi Automotive Systems

A location is referenced at a stable point on the waveform,

978-1-5090-1416-3/16/$31.00 ©2016 IEEE

978-1-5090-1416-3/16/$31.00 ©2016 IEEE

978-1-5090-1416-3/16/$31.00 ©2016 IEEE

978-1-5090-1416-3/16/$31.00 ©2016 IEEE

978-1-5090-1416-3/16/$31.00 ©2016 IEEE

978-1-5090-1416-3/16/$31.00 ©2016 IEEE

978-1-5090-1416-3/16/$31.00 ©2016 IEEE

Teledyne LeCroy in cooperation with Hitachi Automotive Systems

Teledyne LeCroy in cooperation with Hitachi Automotive Systems

Teledyne LeCroy in cooperation with Hitachi Automotive Systems

Teledyne LeCroy in cooperation with Hitachi Automotive Systems

Teledyne LeCroy in cooperation with Hitachi Automotive Systems

Teledyne LeCroy in cooperation with Hitachi Automotive Systems

Teledyne LeCroy in cooperation with Hitachi Automotive Systems

All-instance measurements characterizes all

Empty space Empty space