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SE - Sensor Element subsystem LS - Logic Solver subsystem FE - Final Element subsystem Total PFD
Configuration 1oo2 Configuration 1oo1 Configuration 1oo2 Sensor Element subsystem 5.62E-03
Dangerous undetected failure rate 1 λDU,1 4.50E-06 /h Dangerous undetected failure rate 1 λDU,1 1.00E-09 /h Dangerous undetected failure rate 1 λDU,1 2.90E-06 /h Logic Solver subsystem 8.76E-06
+ Dangerous undetected failure rate 3 + Dangerous undetected failure rate 3 = Total PFD
Dangerous undetected failure rate 2 λDU,2 4.50E-06 /h Dangerous undetected failure rate 2 λDU,2 1.00E-08 /h Dangerous undetected failure rate 2 λDU,2 2.90E-06 /h Final Element subsystem 3.24E-03 +
Dangerous undetected failure rate 3 λDU,3 4.00E-06 /h λDU,3 1.00E-08 /h λDU,3 1.00E-06 /h 8.87E-03 à SIL-2
Common cause factor β 10 % Common cause factor β 10 % Common cause factor β 10 %
Test period T 2 years Test period T 2 years Test period T 2 years
Average PFD PFD 5.62E-03 Average PFD PFD 8.76E-06 Average PFD PFD 3.24E-03
SE - Sensor Element subsystem LS - Logic Solver subsystem FE - Final Element subsystem Total PFD
Configuration 1oo2 Configuration 2oo3 Configuration 1oo1 Sensor Element subsystem 4.01E-05
Dangerous undetected failure rate 1 λDU,1 6.00E-08 /h Dangerous undetected failure rate 1 λDU,1 1.00E-06 /h Dangerous undetected failure rate 1 λDU,1 1.00E-07 /h Logic Solver subsystem 1.69E-05
+ Dangerous undetected failure rate 3 + Dangerous undetected failure rate 3 = Total PFD
Dangerous undetected failure rate 2 λDU,2 7.00E-07 /h Dangerous undetected failure rate 2 λDU,2 1.00E-08 /h Dangerous undetected failure rate 2 λDU,2 /h Final Element subsystem 1.31E-03 +
Dangerous undetected failure rate 3 λDU,3 /h λDU,3 1.00E-08 /h λDU,3 /h 1.37E-03 à SIL-2
Common cause factor β 15 % Common cause factor β 10 % Common cause factor β 10 %
Test period T 52 weeks Test period T 36 months Test period T 3 years
Average PFD PFD 4.01E-05 Average PFD PFD 1.69E-05 Average PFD PFD 1.31E-03
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