Documenti di Didattica
Documenti di Professioni
Documenti di Cultura
ID , 1.7 A S
HAL
Gallium Nitride is grown on Silicon Wafers and processed using standard CMOS equipment
leveraging the infrastructure that has been developed over the last 60 years. GaN’s exceptionally
high electron mobility and low temperature coefficient allows very low RDS(on), while its lateral
device structure and majority carrier diode provide exceptionally low QG and zero QRR. The end
result is a device that can handle tasks where very high switching frequency, and low on-time are
beneficial as well as those where on-state losses dominate. EPC2036 eGaN® FETs are supplied only in
passivated die form with solder bumps
Die Size: 0.9 mm x 0.9 mm
Maximum Ratings
Applications
Drain-to-Source Voltage (Continuous) 100
VDS V • High Speed DC-DC conversion
Drain-to-Source Voltage (up to 10,000 5ms pulses at 150˚C) 120 • Wireless Power Transfer
• High Frequency Hard-Switching and
Continuous (TA = 25˚C, R θJA= 340˚C/W) 1.7 Soft-Switching Circuits
ID A
Pulsed (25˚C, TPULSE = 300 µs) 18 • LiDAR/Pulsed Power Applications
• Class-D Audio
Gate-to-Source Voltage 6
VGS V Benefits
Gate-to-Source Voltage -4 • Ultra High Efficiency
TJ Operating Temperature -40 to 150
• Ultra Low RDS(on)
˚C • Ultra low QG
TSTG Storage Temperature -40 to 150 • Ultra small footprint
www.epc-co.com/epc/Products/eGaNFETs/EPC2036.aspx
Thermal Characteristics
TYP UNIT
RθJC Thermal Resistance, Junction to Case 6.5 ˚C/W
RθJB Thermal Resistance, Junction to Board 65 ˚C/W
RθJA Thermal Resistance, Junction to Ambient (Note 1) 100 ˚C/W
Note 1: RθJA is determined with the device mounted on one square inch of copper pad, single layer 2 oz copper on FR4 board.
See http://epc-co.com/epc/documents/product-training/Appnote_Thermal_Performance_of_eGaN_FETs.pdf for details.
12 12
25˚C
9 9 125˚C
VGS = 5 V VDS = 3 V
VGS = 4 V
6 6
VGS = 3 V
VGS = 2 V
3 3
0 0
0 0.5 1.0 1.5 2.0 2.5 3.0 0.5 1.0 1.5 2.0 2.5 3.0 3.5 4.0 4.5 5.0
VDS – Drain-to-Source Voltage (V) VGS – Gate-to-Source Voltage (V)
Figure 3: RDS(on) vs. VGS for Various Drain Currents Figure 4: RDS(on) vs. VGS for Various Temperatures
250 250
ID = 0.5 A
RDS(on) – Drain-to-Source Resistance (mΩ)
RDS(on) – Drain-to-Source Resistance (mΩ)
ID = 1.0 A 25˚C
200 200
ID = 1.5 A 125˚C
ID = 2.0 A
ID = 1 A
150 150
100 100
50 50
0 0
2.0 2.5 3.0 3.5 4.0 4.5 5.0 2.0 2.5 3.0 3.5 4.0 4.5 5.0
VGS – Gate-to-Source Voltage (V) VGS – Gate-to-Source Voltage (V)
Figure 5a: Capacitance (Linear Scale) Figure 5b: Capacitance (Log Scale)
140
100
120 COSS = CGD + CSD
CISS = CGD + CGS
100 CRSS = CGD
Capacitance (pF)
Capacitance (pF)
10
80
COSS = CGD + CSD
CISS = CGD + CGS
60 CRSS = CGD
40 1
20
0 0.1
0 20 40 60 80 100 0 20 40 60 80 100
VDS – Drain-to-Source Voltage (V) VDS – Drain-to-Source Voltage (V)
ID = 1 A 15
4 25˚C
VDS = 50 V
VGS – Gate-to-Source Voltage (V)
2
6
1
3
0 0
0 0.2 0.4 0.6 0.8 0 0.5 1.0 1.5 2.0 2.5 3.0 3.5 4.0 4.5 5.0
QG – Gate Charge (nC) VSD – Source-to-Drain Voltage (V)
Figure 8: Normalized On Resistance vs. Temperature Figure 9: Normalized Threshold Voltage vs. Temperature
2.0 1.40
ID = 1 A 1.30 ID = 0.6 mA
Normalized On-State Resistance RDS(on)
1.8 VGS = 5 V
Normalized Threshold Voltage
1.20
1.6
1.10
1.4 1.00
0.90
1.2
0.80
1.0
0.70
0.8 0.60
0 25 50 75 100 125 150 0 25 50 75 100 125 150
TJ – Junction Temperature (°C) TJ – Junction Temperature (°C)
2.5
25˚C
125˚C
1.5
1.0
0.5
0
0 1 2 3 4 5 6
VGS – Gate-to-Source Voltage (V)
Junction-to-Board
1 Duty Cycle:
ZθJB, Normalized Thermal Impedance
0.5
0.1
0.1
0.05
0.02
PDM
0.01
0.01
t1
t2
0.001
Notes:
Single Pulse Duty Factor: D = t1/t2
Peak TJ = PDM x ZθJB x RθJB + TB
0.0001
10-5 10-4 10-3 10-2 10-1 1 10+1
tp, Rectangular Pulse Duration, seconds
Junction-to-Case
1 Duty Cycle:
ZθJB, Normalized Thermal Impedance
0.5
0.2
0.1
0.1
0.05
0.02
PDM
0.01
0.01
t1
t2
0.001
Single Pulse Notes:
Duty Factor: D = t1/t2
Peak TJ = PDM x ZθJC x RθJC + TC
0.0001
10-6 10-5 10-4 10-3 10-2 10-1 1
tp, Rectangular Pulse Duration, seconds
10
7” reel Die
b orientation
YYY dot
c AB Gate
a solder bar is
under this
corner
DIE MARKINGS
AB Laser Markings
Die orientation dot Part
YYY Number Part # Lot_Date Code
Gate Pad bump is Marking Line 1 Marking line 2
under this corner EPC2036 AB YYY
d
Pads 1 is Gate; f 210 225 240
Pad 3 is Drain; g 187 208 229
Pads 2, 4 are Source
1 3
e c
f
Side View
(625)
815 Max
165+/- 17
SEATING PLANE
242
2 4
225
225 450
* minimum 190
RECOMMENDED 900 Recommended stencil should be 4mil (100 µm) thick, must
STENCIL DRAWING 250 be laser cut, openings per drawing.
(measurements in µm)
0
metals content.
900
450
225 450
Efficient Power Conversion Corporation (EPC) reserves the right to make changes without further notice to any products herein to
improve reliability, function or design. EPC does not assume any liability arising out of the application or use of any product or circuit Information subject to change
described herein; neither does it convey any license under its patent rights, nor the rights of others. without notice.
eGaN® is a registered trademark of Efficient Power Conversion Corporation. Revised May, 2018
EPC Patent Listing: epc-co.com/epc/AboutEPC/Patents.aspx