Metrology and Calibration of Mechatronic Systems

Metrology and Calibration of Mechatronic Systems – overview

 Mechatronics Training Curriculum
Workshop Mechatronics System Design
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On request
Advanced Advanced Passive Masterclass
Motion Feedforward Damping for Design
Control Control High Tech Principles
Systems
Advanced Mechatronic System Design
Advanced 5 days 3 days 2.5 days On request
6 days

Motion Dynamics and Design Basics & Design for Experimental Metrology & Actuation and Machine Thermal
Control Modelling Principles for Design for Additive Techniques in Calibration of Power Vision for Effects in
Standard Tuning Precision Eng. Ultra Clean Manufacturing Mechatronics Mechatronic Electronics Mechatronic Mechatronic
Vacuum Systems Systems Systems
6 days 3 days 5 days 4 days 3 days 3 days 3 days 3 days 2 days 3 days

Mechatronics System Design – part 2 Summer

5 days School Opto
Basic Mechatronics
Mechatronics System Design – part 1
5 days On request

Relevant partner trainings:

Applied Optics, Electronics for non-
Start electrical engineers, System Architecture,
Soft skills for technology professionals,
…

www.mechatronics-academy.nl

Metrology and Calibration of Mechatronic Systems – overview

 Mechatronics Academy
In the past, many trainings were developed within Philips to
train own staff, but the training center CTT stopped.
Mechatronics Academy B.V. has been setup to provide
continuity of the existing trainings and develop new
trainings in the field of precision mechatronics. It is founded
and run by:
Prof. Maarten Steinbuch
Prof. Jan van Eijk
Dr. Adrian Rankers
We cooperate in the High Tech Institute consortium that
provides sales, marketing and back office functions.

Metrology and Calibration of Mechatronic Systems – overview

Metrology and Calibration of Mechatronic Systems

Trainers
• Dr.ir. Rens Henselmans (Dutch United Instruments)
• Dr.ir. Stefan Bäumer (TNO)
• Dr.ir. René Klaver (IBS Precision Engineering)
• Ir. Jef Horijon (Kulicke & Soffa)
• Dr.ir. Adrian Rankers (Mechatronics Academy)

Course Director(s)
• Dr.ir. Rens Henselmans (Dutch United Instruments)
• Dr.ir. Adrian Rankers (Mechatronics Academy)

Metrology and Calibration of Mechatronic Systems – overview

 Global Program

Day Topic Presenter

1 Introduction / Definitions Rens Henselmans
Short Range Sensors Rens Henselmans
Interferometry Systems Stefan Bäumer
Encoder Systems René Klaver
2 Case Introduction Rens Henselmans
Mechatronic Context Adrian Rankers
Metrology on System Level Rens Henselmans
3 System Calibration Rens Henselmans
SMD component mounter case Jef Horijon
Wrap-Up & Closure Adrian Rankers

Metrology and Calibration of Mechatronic Systems – overview

Day 1 (morning)
Introduction & Metrology definitions
Short Range Sensors
Sensor terminology (range, resolution, sensitivity etc.)
Sensor types (capacitive, inductive, optical etc.)

Metrology and Calibration of Mechatronic Systems – overview

Day 1 (afternoon)
Displacement interferometry (principle, components, error sources etc.)

Encoders (theory, various types)

Metrology and Calibration of Mechatronic Systems – overview

Day 2 (morning)
Case introduction
Measurement machine for freeform optics
Analysis of existing solutions
Performance estimation

Mechatronic context
Control theory summary
Influence of sensor properties / placement

Metrology and Calibration of Mechatronic Systems – overview

Day 2 (afternoon)
Metrology on System Level
• Design for low uncertainty
• Error types
• Rules of Abbe and Bryan
• System loops
• Quantity of concern
• Error budgeting basics

Metrology and Calibration of Mechatronic Systems – overview

Day 3 (morning)
System Calibration
Basics
Calibration instruments & artefacts
Self-calibration
Calibration application examples
Use of calibration data

Metrology and Calibration of Mechatronic Systems – overview

Day 3 (afternoon)
• SMD Component Mounter Case
• Vision Metrology
• Calibration of Series Products

Metrology and Calibration of Mechatronic Systems – overview

Sign-up for this training

Via the website of our partner

High Tech Institute

Metrology and Calibration of Mechatronic Systems – overview