Documenti di Didattica
Documenti di Professioni
Documenti di Cultura
Introduction Page
• 3070 History
Solder Electrical
AXI ICT
• Shorts
• Opens • Dead Part
• Insufficient
• Invisible • Wrong Part
• Poor wetting parts
• Bad Part
• Marginal Joints
• Missing • PCB Short/Open
• Voids
• Gross Shorts •
• Excess
•
Functionally Bad
•
Lifted Leads • Inverted
Excess
• Bent Leads
• Polarity
• Bridging
• Tombstone • Missing
• Misalignment
Socketed
Parts
• Orientation
AOI • Missing Non-Elec.
ICT: In-circuit Test
• Bypass Caps, L’s
AXI: Automated X-ray Inspection • Extra Parts Placement
AOI: Automated Optical Inspection • Mark Inspection
Where to Use In-Circuit Test?
Functional test Page
TEST SHIP
MFG
GOOD
PROCESS IMPROVEMENT
Advantages of In-Circuit Test
Automated Program Generation
Fault Identification
Part of a total process test solution
combined with intelligent test & structural
Page
A Brief History of In-Circuit Test Page
• GR 227x/228x; HP 3065; FF303; L200; Zehntel 8xx; Marconi 80 and many others
fight for market share
• Market drive towards “combinational test” leads to new breed of testers: Teradyne
L300; Zehntel 8000; GenRad 2750; S7xx and HP 3070
More History... Page
2000s – Today
• i3070 rises to become the most popular board ATE in the world today
Agilent Board Test Innovations
Solving the Toughest Test Problems For Over 20 Years
2000
Page
3070 History: Series I
Page
– Introduced 1989
– Original Configuration:
• Single Density (SD) Pin Cards (72 pins/ 8 channels), 2,592 pins
maximum
• ASRU “A”
• Control Card(10 MHz 68000 Processor)
• Series 300 Controller
- 68030/68040 25MHz processor (~ 5 VAX MIPS)
- 12 MB of RAM
- 608 MB Hard Disk
– Original Configuration:
• SD Pin Cards or Double Density (DD) Pin Cards (144 pins/ 16 channels), 5,184 pins
maximum.
• ASRU “B” version
• Control-Plus Card – LAN Based, 25 MHz 68030 processor, 25 -> 50% thru put
improvement
• Series 700 Controller
- 50 MHz PA-RISC Processor (~ 62 VAX MIPS)
- 64 MB of RAM
- 2 x 1GB Hard Disk drives
TestJet II
– Original Configuration:
• DD Pin Cards Supported
• Control XT( 50 MHz 68030 processor) – 2x improvement in test time
• B-Class Workstation Controller
- 180 MHz PA 7300 Processor (2.5 x faster than 725/50 for test development)
- 128 MB RAM
- 9 GB Hard drive
Flat-screen display
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What Is an ICT System? Page
• Systems that consist of ONLY the above components are usually referred to
as Manufacturing Defect Analyzers (MDA). In Asia they may be called “ICT”
systems.
Basic ICT/MDA Block Diagram
DUT/UUT/BUT Page
Simple to use
Low cost
Passive (no power) tests only
Test Fixture Very popular in Asia (1000s in use)
Limited capability, poor coverage for
Analog Stim/Measure complex PCBAs
Controller
Switching Sub-System
Advanced or “True” ICT Systems Page
• Advanced ICT systems, like the Agilent 3070 have capabilities beyond that of
the MDA systems.
• Programmable DUT Power Supplies – Provide power to the DUT for actual
performance tests
Test Fixture
Switching Sub-System
DUT P.S.
DUT P.S.
Controller
Digital Sim/Response
Analog Stim/Response
Page
2003 - 1149.6 (AC Extest) - Major drivers included Cisco & Agilent
Typical IC
Page
Test Challenges:
Boundary
Cells
Core
Logic
The device can be controlled
and tested through TDI, TCK,
TMS, & TDO
TEST ACCESS PORT
CONTROLLER
Test Data (TAP) Test Data
In (TDI) Out (TDO)
• Hardware:
• PC Controller – allows for 3rd party instruments, cards, etc.
• Performance Port – Integrates external access to UUT via fixture
• Serial, USB, GPIB ports – allows connection to external peripherals
• Software:
• External program calls
• Applications library for many applications
• Full feature BT-Basic language vs. spreadsheet only
For more product information on In-Circuit Test, visit
www.keysight.com/find/ict
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