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1. ETCHING
In this type of etching, electrical contact is made on both sides of the wafer and the
wafer is immersed slowly into the solution while a constant current flows between the
positively charged silicon electrode and the negative platinum electrode.
The etchants used are HF and H2O solutions. Since H2O is not as strong an Oxidizing
agent as HNO3, very little silicon etching occurs when the current flow is zero.
Oxidation happens when a positive voltage is applied to the silicon which generates
holes in the silicon at the Si interface resulting in an accumulation of OH- in the solution
at the interface. Oxidation occurs on the surface very rapidly when the oxide is
dissolved by the HF. Holes, which are transported to the negative platinum cathode as
H+ ions release as hydrogen gas bubbles. Excess hole-electron pairs can be created at
the silicon surface by optical excitation to increase the etch rate.
It can be used for metals that cannot be etched using chemical etching. This process has
low tooling cost and has high repeatability for burr-free complex parts and thin foils
without distortion. Wafers of thickness from 0.0003” to 0.063” can be etched without
affecting their mechanical properties. These properties make it suitable for applications
like metal grids, magnetic recording heads, high density electrical connectors and jigs
for ceramic capacitors.
3. EPITAXIAL PROCESS
4. THERMOMIGRATION