Documenti di Didattica
Documenti di Professioni
Documenti di Cultura
Y=1.9
4 8 12 16 20 24 28 32
Linear
3 7 11 15 19 23 27 31
1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 – 1 D linear 2 6 10 14 18 22 26 30
array 1 5 9 13 17 21 25 29
– 2 D m atrix
X=-7.9, Y=-8.0 --> X=7.9
Y=6.5
47 46
48 45
Y=4.4 30 29
49 44
31 28
16
15
• C ircular 50 32 18
17 16
15 27 43
14 8 7
13
12
11
6
7
8
9
10
– 1 D annular 51 33 19 9 3 2 6 14 26 42
5
4 1
1
2
3
array 52 34 20 10 4 5 13 25 41 61
11 12
– 2 D sectorial 53 35 21
22 23
24 40 60
36 39
annular 54
55
37 38
58
59
56 57
The calculator searchs the Snell point. It considers the center of the active aperture
(from elements2 to 7 in this example).
Then, the X, Z point of the focal point is determined
The wedge delay is calculated and the focal law is offset accordingly
Depth
Focal point(X,Z)
Angle
H ow Phased A rrays W ork
•For linear scans, arrays are multiplexed using the same Focal Law.
•For sectorial scans, the same elements are used, but the Focal Laws are
changed.
•For DDF, the receiver Focal Laws are changed in hardware.
Phased Array Beamforming
Delay
Excitation pulse
Crystal
Wedge
A B C
Material
A B C
Location
Wave front
Delay
Time
Focal law
Wave front
Element
A
e
p g
Beam Focusing
Thissection illustratestypicalscansthatcan be
perform ed using phased arrays:
– Electronic (linear)scans
– Sectorial(azim uthal)scans
– Transverse scans
– D ynam ic D epth Focusing
– Tim e-O f-FlightD iffraction
W ith the Tom oview software,operatorscan
custom -design theirown scan patterns,displays
and output.
Electronic or Linear Scanning
N
2......
1
Sectorial(A zim uthal) Scans
This illustration
shows a turbine blade
root being inspected
using S-scans
(sectorial scanning).
Turbine Welded Rotor Inspection
Phased-array inspection:
•Sectorial scan 30-60 SW
•Step of 1 degree
•Mechanical scan along the
circumferential axis
Phased-array probe:
5 MHz, 16 elements, 16 mm x
16 mm
mounted on a wedge
Calibration block:
EDM notches 2 mm x 0.5 mm
Electronic/SectorialScanning A nim ation
C om bined S-Scan and Linear Scan
thick
components in
a single pulse.
The beam is FOCUS DEPTH (PULSER)
re-focused
Beam displacement
electronically
DYNAMIC FOCUSING (RECEIVER)
on its return
c = velocity in material
D ynam ic D epth Focusing
Back-wall reflection
LW BW
QuickScan PA
Omniscan – Portable PA Unit
Function keys and knob interface for field used
Menu Cursors Data on RDTIFF exportable and compatible with
Tomoview
Multiview
remote console for easy operation with only one operator.
E-Z View™ for adequate viewing and control in operation
ACCEPT ESC
conditions
Start/ Store /
Stop Print
---> <--- Interfacesimilar to
1 2 3
conventional flaw
CONFIG
ABC
FILE
DEF
DISPLAY
GHI
detectors
4 5 6 –Panametrics
TOOLS Utilities AXIS
JKL MNO PQR
–Krautkramer
7 8 9
USER FREEZE CALIB
STU VWX YZ –Mouse and Keyboard
+/- 0 . compatible interface
CHANNEL CLEAR
_ %# .* CLR –SVGA output
Instrum entation N om enclature