Documenti di Didattica
Documenti di Professioni
Documenti di Cultura
1. INTRODUCTION
215 - 1
Solutions for the testing of the individual components of the IEC 61850 based system, as well
as for the testing of distributed applications are described in detail.
2. DISTRIBUTED APPLICATIONS IN IEC 61850 BASED SAS
IEC 61850 defines functions of a substation automation system related to the protection,
control, monitoring and recording of the equipment in the substation. These functions can be
executed within a single physical device (for example a protection IED) or can be distributed
between multiple devices using a hard-wired or communications interface.
The functions in the substation can be distributed between IEDs on the same, or on different
levels of the substation functional hierarchy (Station, Bay/Unit or Process)
These levels and the logical interfaces that IEC 61850 focuses on are shown in Figure 1.
FCT. A FCT. B
9
STATION LEVEL
1,6 1,6
8
3 3
PROT. CONTR. CONTR. PROT.
PROCESS LEVEL
HV Equipment
Distributed applications in SAS are typically based on two of these interfaces defined as:
IF4: CT and VT instantaneous data exchange (samples) between process and bay level
IF8: direct data exchange between the bays especially for fast functions like interlocking
Functions in the substation can be divided into sub-functions and functional elements. The
functional elements (Logical Nodes) are the smallest parts of a function that can exchange
data. In the case when a function requires exchange of data between two or more logical
nodes located in different physical devices, it is called a "distributed function". It is clear that
when we test a SAS and its related components, we need to perform tests starting from the
Logical Nodes and going all the way up to the distributed applications hierarchy in order to
complete the distributed function testing.
The exchange of data is not only between functional elements, but also between different
levels of the substation functional hierarchy. It should be kept in mind that functions at
different levels of the functional hierarchy can be located in the same physical device, and at
the same time, different physical devices can be exchanging data at the same functional level.
As can be seen from Figure 2; a Logical Connection (LC) is the communications link
between functional elements - in this case Logical Nodes of the P and R groups. IEC 61850
also defines interfaces that may use dedicated or shared physical connections - the
communications link between the physical devices.
215 - 2
The allocation of functions between different physical devices defines the requirements for
the physical interfaces, and in some cases may be implemented into more than one physical
LAN.
Bay
computer P..
IF 8
LC2 R...
IF 8
Protection LC1
IED P...
R...
Protection
P... IED
Distributed
function
One of the key requirements for testing of IEC 61850 based devices and SAS is to ensure
interoperability and a seamless integration process. Interoperability is defined as the ability of
two or more IEDs from the same or different vendors to exchange information seamlessly
and use that information for correct internal/external operation. This is commonly referred to
as “plug-n-play” in the personal computer industry.
Before the functional testing of a device or distributed function is started, they need to pass
the conformance tests define in the standard. (Part 10 of IEC 61850 defines these
requirements.) For a device to be acceptable for integration in an IEC 61850 SAS it first has
to be properly type tested. This will ensure that it is compliant with the definitions of the
standard and will likely interoperate with other certified IEDs in the system. Since
conformance testing is not the subject of this paper, all devices described are considered
compliant.
Part 6 of the standard defines the Substation Configuration Language (SCL) and provides
some tools that can be very helpful in performing automatic functional testing. One difficulty
is to determine the functionality of the tested device and its configuration (which functional
elements are enabled and what are their settings). Help in automating this process will result
in significant timesavings. The SCL is basically a system specification of the substation
equipment connections in a single line diagram. It also documents the allocation of Logical
Nodes to devices and equipment of the single line to define functionality, access point
connections, and sub network access paths for all possible clients.
What is of specific interest for the automatic test configuration is the data exchange between
the system configuration tool, the tested IED configuration tools, and the test system
configuration tool shown in Figure 3.
The overall functionality of any IEC 61850 compliant device is available in a file that
describes its capabilities. This file has the extension “ICD” meaning IED Capability
Description. The system specification tool supplies to the system configuration tool
information such as the single line diagram of the substation and the required logical nodes.
The file extension for this file is “SSD” meaning System Specification Description.
215 - 3
The system configuration tool then provides information to the IED configuration tools
regarding all IEDs, communication configuration and substation description sections. This
information is in a file with the “SCD” extension meaning Substation Configuration
Description. This information also needs to be provided to the functional testing tools in
order to allow it to configure the set of tests to be performed.
IEC 61850
Standard IED
Configuration Tool Test Device
IEC 61850
Based
IED
The Standard IED configuration tool sends information to the IED upon its instantiation
within a SAS project. The communication section of the file contains the current address of
the IED. The substation section related to this IED may be present and then shall have name
values assigned according to the project specific names. This file has an extension of “CID”
meaning Configured IED Description. Currently there is ongoing work to expand the content
of this file to include all settings, thus providing the required configuration data for both the
IED itself, and also for the functional testing tool.
All the information on the substation, SAS, and IEDs configuration is required to properly
configure the test procedures for the functional elements and local/distributed functions.
However, even this is not sufficient for automating the process. Another important
requirement is to provide test cases on how each of the functional elements or
local/distributed functions should be tested and what is the expected behavior of the test
object under defined test conditions. Based on this information and the system/IED
configuration data a functional testing tool can generate and execute the necessary test
sequences. Unfortunately, such formal definition of the test cases for the functional elements
and other complex functions is not part of the standard today. Making functional test case
definitions part of the standard will require a significant effort, but will allow the
development of new tools for automatic functional testing of IEC 61850 based IEDs and
SASs.
The testing of conventional functions in substation protection and control systems has some
similarities and some differences with the IEC 61850 communications based solutions. In the
case of the conventional testing, the test device has to simulate the substation process using a
hard-wired interface between the analog and binary outputs of the test device and the analog
and binary inputs of the test object. A typical test process requires the test device to output a
215 - 4
simulation or event that will trigger a measurable response from the test object. Timing of the
test objects I/O change of state events for defined test cases determines proper operation.
By comparison, communications based distributed functions utilize the IEC 61850 GSSE or
GOOSE messages replacing the hard-wired connections. In the case of Fig. 4, all devices
with communications interface have to be connected to the substation network switch to
exchange data.
The expected communications based performance should be similar to the conventional hard-
wired interface; it is a good idea to include a test case that compares the operation of a wired
relay output and a GSSE message driven by the same functional element in the IED logic.
Ethernet Laptop
Switch Computer
GOOSE
or GSSE
Ethernet
IEC 61850
GOOSE
Based IED
or GSSE
Trip
V I
IEC 61850
Ethernet Based Test
Device
Another difference between the conventional testing and the IEC 61850 GSSE based
functional testing is the requirement for the change-of-state process simulation using GSSE
messages from the test device to the test object. An example is to indicate the opening of the
auxiliary contact 52a of the circuit breaker monitored by the IED under test.
Laptop
Computer
Ethernet
Switch
GOOSE
or GSSE
V I Trip
Distributed applications based on IEC 61850 Merging Units that send sampled values over
the substation LAN will need a test setup similar to the configuration shown in Fig. 5.
In this case the analog signals from the test device will be wired to the Merging Unit. The
distributed function will be performed by the IEC 61850 based IED that will send a GSSE
215 - 5
message to an IEC 61850 Input/Output Unit (IOU) that will operate a physical relay output to
trip the circuit breaker. The test device will subscribe and capture this message and also
detect the operation of the binary output of the IOU. It monitors different elements of the
distributed function and can analyze their performance, as well as the system’s overall
operating time.
If the tested 61850 based IED also has a binary output, the test device can monitor it as well.
This can provide valuable information in the overall evaluation of process performance.
The binary output of the interface unit (IOU) will give the total distributed function operating
time for the case of a complete IEC 61850 communications based solution.
5. CONCLUSIONS
The development and implementation of IEC 61850 based devices and Substation
Automation Systems require a new generation of specialized test devices and methods to test
them. The use of the different configuration files defined in Part 6 of the standard and the
addition of the complete IED configuration information will allow the development of new
tools for complete automatic functional testing.
Simulation of the substation process and monitoring of the operation of the tested devices or
distributed control and protection functions is quite different from conventional testing. The
testing of IEC 61850 based applications require partial hard wiring between the test device
and the test object, and in some cases (with MUs) may be completely communications based.
Different testing configurations are analyzed and show that state-of-the-art test systems can
be successfully implemented for the functional testing of IEC 61850 based control and
protection functions with different levels of communications implemented.
The development and implementation of IEC 61850 based devices and substation automation
systems requires a new generation of specialized test devices and methods for functional
testing of different components of the system.
The paper discusses the requirements for functional testing of complex substation automation
systems. Two typical types of IEC 61850 based Substation Automation Systems (SAS) are
considered:
• A system with Substation Bus (IEC 61850-8-1) only
• A system with Process Bus (IEC 61850-9-2) and Substation Bus (IEC 61850-8-1)
The use of the different configuration files defined in part 6 of the standard and the addition
of the complete IED configuration information will allow the development of systems for
complete automatic functional testing.
Simulation of the substation process and monitoring of the operation of the tested devices or
distributed control and protection functions is quite different from conventional testing. The
testing of IEC 61850 based applications requires partial hard wiring between the test device
and the test object, and in some cases (with MU) may be completely communications based.
Different testing configurations are analyzed and show that state-of-the-art test systems can
be successfully implemented for the functional testing of IEC 61850 based control and
protection functions with different levels of communications implemented.
215 - 6