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Background
Automation in Industry Process
Complexity of industry System as well as their product day by day
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Contd….
Reliability
The probability that a failure may not occur in the given time interval
If the T is the time till failure of the unit ( a random variable ) occurs , then
the probability that it will not fail in a given time t is
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Quality and Reliability
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Failure and Failure Modes
Failure
Random failure -Failure after initial failure generally occurs after long period
of time – Difficult to determine their causes – they may occur due to changes
in working condition / stress
Over long period the system / unit begin to deteriorate and this region is
called wear out region
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Causes of failure and unreliability
Poor Design
Use of low rating components
Manufacturing techniques
Complexity of equipment
Density of the component increases
Human error
Lack of understanding of equipment/ system , carelessness , poor judgment
skills
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Maintainability and Availability
Maintainability
Availability
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Design for Reliability
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Reliability analysis tools and aids
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Component reliability and hazard rate
From the basic failure rates & working stresses using stress
Model.
Form the part failure data obtained either from life tests or
failure reports of customer.
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Contd…
Suppose no identical components are subject to a design
operating condition test. During time interval of time (t-Δt, t)
we observed nf(t) failed components & ns(t) are surviving
components then
Surviving component
Failed component
Identical component
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Plots of fe(t) &he(t)
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Plots of Re(t) &Fe(t)
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Reliability function
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Contd…
Hence failure per unit time occurs can be calculated as no
failure occur prior to t1
n
Thus hazard f is defined as the limit of failure rate on ∆t
approaches zero
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Mean time to failure
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Problem
A manufacturer of light bulb is interested in estimating the
mean life of the bulbs . 200 bulbs are subject to reliability test.
The bulbs are observed & the failure in 1000 hour intervals
are
Timerecorded.
Failure in
interval interval - Plot failure density function
0-1000
estimated 100 fe(t)
1001-2000 40 - The hazard rate function
2001-3000 20 estimated he(t)
3001-4000 15 - The cumulative probability
estimated function Fe(t)
4001-5000 10
- Reliability function Re(t)
5001-6000 8
6001-7000 7
200
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&
For time interval 0-1000 hrs
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Time interval 1001-2001 hrs
Unreliability
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The above example shows the hazard rate function is constant
for a period of time then linearly increases with time
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Hazard function
The hazard function or hazard rate h(t) is the conditional
probability of failure in the interval t to (t+dt) given there was
no failure at ‘t’ is expressed as
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Consider a population of identical component N & place it in
operation at time T=0.
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At the end of early failure rate region, the failure rate
eventually reach to constant value.
The third & final region of failure rate curve is the wear
out region which start at T2 . The beginning of the wear
out region starts when the failure rate starts to increase
significantly
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Hazard rate is also referred to as the instantaneous failure rate
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Constant hazard
Many electronic components such as transistors, capacitors,
resistors, integrated circuits exhibit constant failure rate during
their lifetime.
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The constant hazard rate function is expressed as
h(t)= λ
Where λ is constant.
Time of failure distribution is exponential with parameter λ
then the probability density function f(t) can be obtained as
f(t)= λ e-t
& F(t) cumulative failure probability fn
F(t)= 1- e-λt
The reliability function R(t) = 1 - F(t) = e-λt
Also
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problem:-
A manufacture performers are operating life test (OLT)
on ceramic capacitors & find that they exhibits constant failure
rate ( used interchangeably with hazard rate) with a value of
3×10-8 failure per hour.
what is the reliability of a capacitor after one year(104Hrs)
& in order to accept a large shipment of these capacitors, the
user decided to run a test for 5000 hours on a sample of 2000
capacitors. How many capacitors are expected to fail during
test?
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Soln.
h(t) = 3×10-8 failure per hour
h(t) = λ
-λt -(3×10 -8) t
R(t) = e = e
-8
R(104) = e-3×10 t = 0.99970
n0 = no. of capacitors under test
ns = expected number of failed capacitors during test
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Linearly Increasing Hazard
&
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The reliability function R(t) is
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System Reliability Model
IN 1 2 n OUT
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• Xi = the ith unit in operator
• Xi = failure of the ith unit
• P(Xi) = probability that ith unit is operational
• P(Xi) = probability that ith unit is not operational (failed)
• R is reliability of the system
• Pf is unreliability of the system Pf = 1 - R
• Reliability of the system can be expressed as
R = P (x1, x2, x3…..xn)
Or
R = P(x1) P (x2/x1) P (x3/ x1x2) …. P(xn / x1x2x3…xn-1) …. 1
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• The conditional probability in eqn. (1) represents the failure
mechanism of a component affects other components failure
rates. Typical example is heat dessipation from the failing
component.
• If the component failure are independent then we can say that
R = P(x1) P (x2) P (x3) …. P(xn)
or
…. 2
…..5
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• Consider the series system that consists of three components &
the probabilities of that components 1, 2, 3 being operational
are 0.9, 0.8, 0.75 resp. Estimate the reliability of the system.
Alternatively
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• R=1- Pf
= 1- 0.46
= 0.54
Parallel system
In parallel system if one path fails the still it allows the
remaining paths to perform properly.
Thus the reliability of a parallel system is the probability that
any one path is operational.
unit1
n
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• R = P (x1 +x2 + x3 +…. +xn)
Where ‘+’ is union of events
Or
Alternatively
Or 1
Again if the components are independent then eq 1 becomes
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• If the components are identical then the reliability of the
system
R= 1- (1-P)n
Where P is probability that component is operational
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• Problem.
• Consider a system that consists of 3 components in parallel.
The probability of the 3 components being operational are 0.9,
0.8, 0.75. Determine the reliability of a system
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• Parallel series
1
1 2 i n
path1
2
1 2 i n
m
1 2 i n
Path m
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m parallel path each path has n units connected in series.
Let P(xij) be the reliability of component j (j= 1, 2, 3 …n) in
path i(i=1, 2, 3…m)&
Xij be an indicator that component j in path i is operational
The reliability of path I is
i = 1, 2, …m
j = 1, 2, …n
The reliability of path i is Pi` & the reliability of the system is
Or
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If all the components are identical and the reliability of
single unit is p then the reliability of system become,
R=1-(1-pn)m
Series-Parallel:
A series parallel system consist of n subsystem in series
with m units in parallel,
1 1 1 1
2 2 2
2
i i i i
m m m m
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Where i= 1,2,3………n
j= 1,2,3……..m
& P(xij) is probability that component j in subsystem I is
operational.
Where all components are identical & reliability of single
component is p then reliability of series-parallel system
become,
R= [1-(1-p)m]n
In general series-parallel have higher reliability than parallel
series when both are equal number of system .
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• Given six identical unit each having a reliability of 0.85,
determine the reliability of three system resulting from the
arrangements of unit in parallel-series, series-parallel, & mixed
parallel configuration
Soln.
1. Parallel-series
R=1-(1-Pn)m where m=2, n=3
= 1-(1-0.853)2 =0.8511
2. Series-parallel
R = 1-(1-0.852)3 = 0.934007
3. Mixed parallel
R = 1-(1-(0.85)2)2 [1-(1-0.85)2]
= 0.924726
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Redundancy
Redundancy is defined as the use of additional
components or units beyond the number actually required for
satisfactory operation of a system for the purpose of improving
the reliability.
For series system has no redundancy since failure of
component causes failure of entire system.
Two types of redundancy
1. Active
2. Inactive
In active redundancy all redundancy components are in
operation & are sharing the load with main unit.
Under non active standby, the redundancy components do not
share any amount of load with the main components & they
are operating only one or more component fails.
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