10 October 2015

Investigation of Thermal Fluctuations of

Quartz Resonator
Ignasius Krisnanta Setiaputra
University of Western Australia
21482629@student.uwa.au

Abstract

With the help of a Fast Fourier Transform and Lock-in Amplifier, we measured and investigated the thermal
fluctuations in a Quartz Resonator. Assuming the Butterworth-Van Dyke model of a quartz resonator, we
theoretically and analytically modeled fits to our data to obtain parameters of the BVD model and Low Noise
Amplifiers. Using those fits we computed the quality factor and mode temperature of the quartz tuning fork.

I. Introduction

T
he Quartz Resonator (QR) is a very common
electrical component, can be found extremely
cheap and is used in many daily applications.
Being a piezoelectric material, the quartz can convert
mechanical energy to electrical energy and vice versa.
Due to this property, thermal fluctuations by its crys-
tal lattice, causes a quartz tuning fork to experience Figure 1: Butterworth-van Dyke Model of the QR (Ivanov
voltage fluctuations at its electrodes. It is expected n.d.)
that this fluctuation to occur within a 1Hz bandwidth
around its resonant frequency of 32.768kHz.
This experiment aimed to measure and investigate III. Experiment setup and procedure
these thermal fluctuations. We used several theoret-
To measure the parameters of the BVD model (Figure
ical models, primarily assuming the Butterworth-van
1), and fitting theoretical formulas onto our measured
Dyke (BVD) to model the QR, to find the values for
data, we used these set of equipment:
the inductance (L), capacitance (C), resistance (r) of
• HP89410A vector signal analyzer
the QR and the gain of the LNAs. Later using these
• Quartz Resonator
measurements, we found the quality factor and mode
• NTE458 LNA 1
temperature of the Quartz Resonator.
• OPA656 LNA 2
• SIM910 LNA 3
II. Theory • 1 MΩ Resistor
• 50Ω Termination
The electrical equivalent of the QR is modeled by the • Direct Digital Synthesiser
BVD model (Fig. 1). The complex impedance of the • Oscilloscope
BVD network given by: • NI USB-600
• Lock in Amplifier
zres ( f ) Firstly we needed to find the parameters of the
ZBVD ( f ) = (1)
1 + zres ( f )i2π f C0 LNAs used to amplify the thermal noise. To do that
and we used the transfer function.
Zamp ( f )
T( f ) = G (3)
1 Rs + Zamp ( f )
zres ( f ) = r + + i2π f Lres (2)
i2π f Cres where:
where: T( f ) = Complex transfer function
f = Frequency (Hz) G = Gain of LNA
C0 = A parameter of the BVD model Zamp ( f ) = Input impedance of LNA (See appendix)
r = A parameter of the BVD model Rs = Source Resistor (1MΩ)
Cres = A parameter of the BVD model The transfer function was measured as per figure 2
Lres = A parameter of the BVD model below. Without the resistor (Rs =0) attached we first
These parameters will later be found using data fits measured the gain. We then fitted equation 3 to the
and other formulas. measured T(f) to find the parameters of the LNA.

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 10 October 2015

Figure 2: Apparatus to measure transfer function T(f)
(Ivanov n.d.)
Having found the parameters, we replaced Rs in
Figure 2 with the QR. As before, we fitted the transfer
function to our data, but this time we replaced Rs with
ZBVD ( f ) from equation 1. Additionally we needed to
account for the intrinsic current and voltage noise of
the LNA for further analysis of the intrinsic thermal
fluctuations.
We attached a 50Ω termination to the input of the
LNA, to find the intrinsic voltage noise. Then, we re-
placed the 50Ω termination with the QR to measure the quartz tuning fork using the relationship:
the resulting Power Spectral Density (PSD) using the
FFT (Fig. 3). Using this data and Equation 4 below,
we can find the intrinsic current noise of the LNA.
G = Gain
Suout ( f ) = PSD of voltage fluctuations at LNA output
Zamp ( f ) = Input Impedance of LNA (See appendix)
Using equation 6 to manipulate our data (Suout ), we
then fitted equation 5 to our manipulated data. From
there we can obtain values for δi2max and ∆ f 0.5 .
Using our fitted value of δi2max , we can calculate
mode temperature of the QR by substituting it into
this equation:
r
Tmode = δI 2 (7)
4k B max
where:
r = Resistance parameter of BVD model
Tmode = Mode temperature of Quartz resonator
δImax
2 = PSD of current fluctuations at f peak
Knowing ∆ f 0.5 , we can find the Quality factor of
f res
∆ f 0.5 = (8)
2Q
The next part of experiment involved the use a lock-in
amplifier, apparatus setup as shown below (Fig. 4)

Figure 3: Noise measurement setup (Ivanov n.d.)

Figure 4: Lock-in Amp setup (Ivanov n.d.)

√ In that setup, we took several sets of data through

δi2amp + δi2R
the NI USB-600, from the amplifier, to the computer.
δuout = G (4)
|YΣ ( f )| We took several data sets for both the X and Y , and
where: R and Φ settings as per the manual (Ivanov n.d.). We
δuout = Broadband Voltage noise at LNA output then plotted Probability Distributions for the X val-
G = Gain of LNA ues and R values using these Gaussian and Rayleigh
δi amp = LNA intrinsic current fluctuations Distribution models respectively.
δi R = Thermal noise current 1 − x2 2R −R2
PDF ( x ) = √ e 2σ2 and PDF ( R) = 2 e σ2 (9)
YΣ ( f ) = Input Conductance of LNA (See appendix) 2πσ σ
In order to compute mode temperature of the QR,
we took a Lorentzian fit of our data using the formulas: IV. Results
δi2max For the gain of the 3 LNAs, we obtained these results:
SiLCR ( f ) = f − f peak 2
(5)
1+( NTE458Gain = 32.5± 0.5dB
∆ f 0.5 )
OPA656Gain = 20.7± 0.1dB
and:
SI M910Gain = 25.8± 0.3dB
Suout ( f ) 1
SiLCR ( f ) = (6) When we attached the 1MΩ resistor and fitted our
G 2 | Zamp ( f )|2
data, we obtained the following results for the param-
where: eters of each LNAs. Note that we allowed for Gain to
SiLCR = Spectral density of current fluctuations also be a parameter to allow for a better fit.
δi2max = PSD of current fluctuations at f peak
f = Frequency LNA R amp (Ω) Camp (F) Gain(dB)
f peak = Frequency of peak δi OPA656 2x107 6.9x10−12 21.25
∆ f 0.5 = Half-bandwidth frequency NTE458 2x107 1.2x10−11 33.4
SIM910 2x107 2.07X10−11 26.8

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When we replaced the resistor with the quartz tun- to our value, within experimental error. Additionally,
ing fork and did the graph fit, we obtained these values, we suspect the NTE458 LNA to have aged and did
again allowing gain to be a variable to allow for a better not behave as it should be, as sometimes the data we
fit: acquired was not accurate. Fitting equation 5 to our
data manipulated by equation 6 for OPA656, we found
Parameter OPA656 NTE458 values for δ Imax
2 and ∆ f 0.5 :
Lres ( H ) 7863 7863
δImax
2 = 4.007x10−13
C0 ( F ) 1.44x10−12 1.39x10−12
∆ f 0.5 = 0.3733
r(Ω) 20 000 20 000
Cres ( F ) 3x10−15 3x10−15 Again calculating the quality factor we get a value
Gain(dB) 20 23.6 of 53 585, which is about half of the expected 100 000,
and when calculating Tmode we get 61K, which is very
When we attached the 50Ω termination to the LNA far from room temperature, and so there is either a
to measure intrinsic voltage noise, we got the following very large error in the data, or we have made a mistake
values for δ eamp : somewhere. Then we took the data from the lock-in
amplifier, and found PDF(x) and PDF(R), then fitted
OPA656 = -161.7±1.1dB
them using equation 9 to find σ, the standard deviation.
NTE458 = -169± 2dB
This came out to be σ=1.1566.
SI M910 = -168.8± 1.3dB
After we replaced the 50Ω with the quartz res-
onator, taking the data from the FFT, we were
able to calculate δi amp for each of the LNA us-
ing equation 4, as well as the equations√ from Ap-
pendix. NTE458 δi amp =7.25x10 − 14 A/ Hz OPA656
√
δi amp =4.841x10−14 A/ Hz
Then, using equations from Appendix, we calcu-
lated the thermal voltage noise spectra at the LNA
output and compared it to the thermal voltage noise
spectra we recorded in our data:

Figure 6: Probability Density Function of R and X (UWA

2014)

V. Discussion

I. Graph fit values

Figure 5: Thermal voltage noise (UWA 2014)
Fitting equation 5 to our data manipulated by equa-
tion 6 for NTE458, we found values for δ Imax 2 and ∆
f 0.5 to be:
δImax
2 = 6.033x10−13
∆ f 0.5 = 0.2682
And then, using this value of ∆ f 0.5 we calculated
the quality factor to be 61 000, which is not as close to
100 000 as expected. We suspected that this is due to a
bump against the table, or if not there was a very large
error in our calculations. Using our value of δImax
2 and
Equation 7, we calculated Tmode to be 131K, which is
obviously not correct. However, the value for δImax2 we
would expect would be around 9x10 − 13 which is close
The gain values we first measured for all the LNAs
were very close to the expected values, apart from the
NTE458. For the NTE458 we measured a gain of
32.5dB whilst it was labeled for 28.5dB. Initially we
thought we had made an error, however, we repeated
our measurement several times, using the same method
to find the other 2 gain measurements, we still got the
value of 32.5dB. The LNA could have possibly aged
and so the labeled gain is no longer relevant, or its
proper gain is actually 32.5, not 28.5.
When fitting to find the parameters of the compo-
nent of the LNA, our LNA graphs had very good fits
apart from, again, the NTE458. We did the best fit
possible and noted the parameters, even though were
in the expected range, it was a poor fit that could have
given inaccurate parameter values.

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 10 October 2015

The values we obtained for the parameters of the fittings in Mathematica as well as piecing up bits from
QR were in expected range. When fitting for both here and there to get the assignments done. For future
LNAs we got almost identical values for the parame- students doing this experiment, it is absolutely essen-
ter, with an exception of the value of C0 , differing only tial that they understand what is going on when they
by 0.05x10−12 . begin the experiment, for being uncertain with this lab
The values we obtained for the intrinsic voltage and in particular will waste a lot of time taking down wrong
current noise for the LNAs were very low, as expected. data. That said, the manual could use some updates
The calculated thermal voltage noise spectra at the on especially labeling many of the symbols with what
output of the LNAs was close to the measured data. they represents
Hence we believe that our values for the parameters of Nevertheless, I believe the assignments and goal of
the LNA and QR to be reasonably accurate this experiment to be very good. The equipment was
For the Probability Distribution Functions, we had easy to use and data was easy to obtain. As said before
really nice data from the lock-in amplifier measure- the most difficult part was the data manipulation and
ments, very much close to expected, that allowed us knowing what to do with it.
to take a good fit of our data. If I can suggest anything, I would like to get the
LNAs, especially NTE458, be checked for any damage,
II. Sources of errors internally primarily, and to re verify the gain, and up-
date the label if needed. Depending on the test result,
We believe that the largest source of error in this ex- we think the NTE458 should be replaced any another
periment to possibly be some physical disturbance of LNA.
the devices used. The QR is very sensitive to any ex-
ternal vibration. Even though and the experiment was
carried out on top of a stable desk, it is possible that VII. Conclusion
we accidentally nudged the desk, which could possibly
affect the QR and our data. That said, we also think In this experiment we have somewhat successfully in-
this is unlikely as we would see more obvious distur- vestigated the thermal fluctuation of the QR. We had
bances in our spectral density plots, and the data we some good fits and results, within experimental error,
obtained has no such obvious abnormalities. However, such as our PDFs and the values for our LNA and
it is definitely possible that the slightest touch to the quartz resonator parameters. We did also get some
device under test could create very small changes in unusual results, such as our Tmode and quality factor.
our data, which could accumulate large errors for the We believe the experiment was effective and ex-
following calculations. periment that deepened our understanding of signals
Another possible source of error could be the and noise. We did realise, some things that we would
NTE458 LNA itself. As mentioned, we had some diffi- change if we were to do it again. For example using mul-
culties and irregularities in the experiment data using tiple methods to find the definite Gain of the NTE458
the NTE458 LNA. It gave a gain different to what was LNA, or perhaps just replace it with another LNA. We
labeled, and also did not give us a good graph fit when would also be more careful during the time data are col-
finding the parameters. This could be that there is lected, to minimise the error from bumping the table,
something wrong physically inside the LNA that makes introducing uncertainties and error in the data.
it behave uncharacteristically. That said, it gave us
very different values to expected for the first 2 parts of References
the equipment only, so perhaps we have accidentally
moved the LNA whilst it was taking data. [SRS n.d] Stanford Research Systems nd.,
About Lock-In Amplifiers. Available from:
VI. Suggested improvements or http://www.thinksrs.com/downloads/PDFs/Appl
icationNotes/AboutLIAs.pdf [14 Oct. 2015]
contributions to equipment,
procedure, or documentation [Agilent Technologies n.d] Agilent Technologies n.d.,
Available from: http://www.ece.uprm.edu/ et-
All in all, the experiment showed and proved the ther- clab/resources/equipment/agilent89410a/ [14 Oct.
mal fluctuations of a QR tuning fork effectively. It 2015]
was very heavily dependent on the fact that someone
is familiar with signals and noise. It took us longer [Ivanov n.d.] Ivanov, E, UWA n.d., Study of ther-
than expected to follow the experiment, but, once we mal Fluctuations in Mechanical Quartz Resonator,
began to do so, we realised that it was quite a simple Available from: University of Western Australia
experiment with the most difficult part being the curve [14 Oct. 2015]

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Appendices
A. Extra Formulas

R amp
Zamp ( f ) = (10)
1 + i2π f R amp Camp

YΣ ( f ) = i2π f (C0 + Camp ) (11)

B. Extra Plots and Fits

I. Transfer Functions

Figure 7: T(f) of NTE458 Figure 8: T(f) of OPA656

Figure 9: T(f) of SIM910

II. Amplitude Transfer Functions

Figure 10: ATF(f) of NTE458 Figure 11: ATF(f) of OPA656