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Step (i)Step
- Grow p-implantation
(h):
gate Etch
n-implantation
oxide Polysilicon
through for
thermal
source & drain (self-
oxidation
Step (j)alignment)
- Deposit Doped Polysilicon
- Grow phosphorus glass
- Etch glass to form contact cut
- Evaporating
(7~8um) alumni
青玉 or SiO2 (二氧化矽)
Anisotropic Etch
Form p-island
(for n-device)
Form n-island
(for p-device)
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3.3 CMOS Process Enhancement (Interconnection)
3.3.1 Metal Interconnect
* CMOS circuit = CMOS logic process + Signal/Power/Clock-
routing layers
- Second-layer of metal (VIA1=M1 to M2)
- Note: M1 must be involved in any contact to underlying areas
1. Etch
Isolation
layer
2. Form a
VIA
Contact
(polysilicon, diffusion)
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3.3.1.3 Local Interconnection
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3.3.2 Circuit elements
1. Resistor
- Polysilicon (undoped) – in static memory cell
- Resistive metal (Nichrome) to produce high-value, high-
quality resistors – in mixed-mode CMOS circuits
2. Capacitors
- Polysilicon capacitor
- Memory capacitor (3-dimensional to increase cap/area)
- Example:
1. Trench capacitor (Fig3.18 (a))
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3.4 Layout Design Rules
- Function: obtain a circuit with optimum yield in an area as well
as possible
- Performance ←→ yield
* Conservative design rules → Functional circuit
→ Good yield
* Aggressive design rules → Bad yield
→ Compact circuit/layout for
low cost and high speed
(A) Line width/spacing
Small → open circuit
Close → short circuit
(B) Spacing between two independent layers
- In process:
(a) Geometric features for mask-making and lithographical
(b) Interactions between different layers (e.g., poly + diffussion)
- Rules:
a. Micro(μ)-based rules – Industry (submicron)
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Contact Rules: There are several generally available contacts:
- Metal to p-active (p-diffusion)
- Metal to n-active (n-diffusion)
- Metal to Polysilicon
- VDD and VSS substrate contacts
- Split (Substrate contacts)
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3.4.5 Layer assignment (Table3.4)
- CIF: Caltech Intermediate Form
- GDSII Format
3.5 Latchup
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- Latchup : Shorting of VDD and Vss lines → Chip breakdown
- Latchup Equivalent Circuit:
Vertical : pnp
- p = source/drain of p device (Emitter)
- n = n-well (Base)
- p = p-substrate (Collector)
Lateral : npn
- n = source/drain of n device (Emitter)
- p= p-substrate (Base)
- n= n-well (Collector)
Rsubstrate, Rwell
- Parasitic devices and resistors
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Latchup triggering: Transient/Impulse current in start-up
A. Lateral triggering: current flows in the emitter of the lateral
npn-transistor
Vpnp-on
→Trigger point : In,trigger = αnpn ˙Rwell
- Vpnp,on = 0.7V
(βnpn+1)
βnpn˙βpnp > 1 +
(IR,sub+IR,wellβpnp)
VBE,,npn (IDD-IR,sub)
Rsub
Where IR,sub =
VBE,,npn
IR,well = Rsub
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Observation to prevent latchup:
1. Reduce the resistor values
2. Reduce the gain of the parasitic devices
- Approach:
1.Latchup-resistant CMOS process
2. Layout techniques (see section 3.5.4,3.5.5)
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