Documenti di Didattica
Documenti di Professioni
Documenti di Cultura
Q2 6 11 Q6
Package Options Include Plastic Q3 Q5
7 10
Small-Outline (D) Packages, Ceramic Chip GND Q4
8 9
Carriers (FK), and Standard Plastic (N) and
Ceramic (J) 300-mil DIPs
SN54ALS259 . . . FK PACKAGE
description (TOP VIEW)
CLR
VCC
These 8-bit addressable latches are designed for
NC
S1
S0
general-purpose storage applications in digital
systems. Specific uses include working registers, 3 2 1 20 19
serial-holding registers, and active-high decoders S2 4 18 G
or demultiplexers. They are multifunctional Q0 5 17 D
devices capable of storing single-line data in eight NC 6 16 NC
addressable latches and being a 1-of-8 decoder or Q1 7 15 Q7
demultiplexer with active-high outputs. Q2 8 14 Q6
9 10 11 12 13
Four distinct modes of operation are selectable by
Q3
Q4
Q5
NC
GND
controlling the clear (CLR) and enable (G) inputs
as shown in the function table. In the
addressable-latch mode, data at the data-in NC No internal connection
terminal is written into the addressed latch. The
addressed latch follows the data input with all unaddressed latches remaining in their previous states. In the
memory mode, all latches remain in their previous states and are unaffected by the data or address inputs. To
eliminate the possibility of entering erroneous data in the latches, G should be held high (inactive) while the
address lines are changing. In the 1-of-8 decoding or demultiplexing mode, the addressed output follows the
level of the D input with all other outputs low. In the clear mode, all outputs are low and unaffected by the address
and data inputs.
The SN54ALS259 is characterized for operation over the full military temperature range of 55C to 125C. The
SN74ALS259 is characterized for operation from 0C to 70C.
Function Tables
FUNCTION
INPUTS OUTPUT OF EACH
ADDRESSED OTHER FUNCTION
CLR G LATCH OUTPUT
H L D QiO Addressable latch
H H QiO QiO Memory
L L D L 8-line demultiplexer
L H L L Clear
D = the level at the data input.
QiO = the level of Qi (i = Q, 1, . . . 7 as appropriate) before the indicated
steady-state input conditions were established.
PRODUCTION DATA information is current as of publication date. Copyright 1994, Texas Instruments Incorporated
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
LATCH SELECTION
SELECT INPUTS LATCH
S2 S1 S0 ADDRESSED
L L L 0
L L H 1
L H L 2
L H H 3
H L L 4
H L H 5
H H L 6
H H H 7
logic symbol
1
S0 0
2 0
S1 8M
3 7
S2 2
14
G G8
13
D Z9
15
CLR Z10
9, 0D 4
Q0
10, 0R
9, 1D 5
Q1
10, 1R
9, 2D 6
Q2
10, 2R
9, 3D 7
Q3
10, 3R
9, 4D 9
Q4
10, 4R
9, 5D 10
Q5
10, 5R
9, 6D 11
Q6
10, 6R
9, 7D 12
Q7
10, 7R
This symbol is in accordance with ANSI/IEEE Std 91-1984 and IEC Publication 617-12.
Pin numbers shown are for the D, J, and N packages.
14 4
G Q0
13
D
5
Q1
1
S0
6
Q2
7
Q3
2
S1
9
Q4
10
Q5
3
S2
11
Q6
12
Q7
15
CLR
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)
Supply voltage, VCC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7 V
Input voltage, VI . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7 V
Operating free-air temperature range, TA: SN54ALS259 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 55C to 125C
SN74ALS259 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0C to 70C
Storage temperature range . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 65C to 150C
Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under recommended operating conditions is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
S1
RL
R1
From Output Test From Output Test From Output Test
Under Test Point Under Test Point Under Test Point
CL RL CL
CL R2
(see Note A) (see Note A)
(see Note A)
3.5 V
Output
Control 1.3 V 1.3 V
(low-level
enabling) 0.3 V 3.5 V
tPZL Input 1.3 V 1.3 V
tPLZ
[3.5 V 0.3 V
tPHL
Waveform 1 tPLH
S1 Closed 1.3 V
In-Phase VOH
(see Note B) 1.3 V 1.3 V
VOL Output
tPHZ 0.3 V VOL
tPZH tPLH
VOH tPHL
Waveform 2 VOH
Out-of-Phase
S1 Open 1.3 V 0.3 V 1.3 V 1.3 V
Output
(see Note B)
[0 V (see Note C) VOL
Texas Instruments and its subsidiaries (TI) reserve the right to make changes to their products or to discontinue
any product or service without notice, and advise customers to obtain the latest version of relevant information
to verify, before placing orders, that information being relied on is current and complete. All products are sold
subject to the terms and conditions of sale supplied at the time of order acknowledgement, including those
pertaining to warranty, patent infringement, and limitation of liability.
TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in
accordance with TIs standard warranty. Testing and other quality control techniques are utilized to the extent
TI deems necessary to support this warranty. Specific testing of all parameters of each device is not necessarily
performed, except those mandated by government requirements.
In order to minimize risks associated with the customers applications, adequate design and operating
safeguards must be provided by the customer to minimize inherent or procedural hazards.
TI assumes no liability for applications assistance or customer product design. TI does not warrant or represent
that any license, either express or implied, is granted under any patent right, copyright, mask work right, or other
intellectual property right of TI covering or relating to any combination, machine, or process in which such
semiconductor products or services might be or are used. TIs publication of information regarding any third
partys products or services does not constitute TIs approval, warranty or endorsement thereof.