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Electric field enhanced emission from non-Coulombic traps in
semiconductors
P. A. Martin, B. G. Streetman, and K. Hess
Coordinated Science Laboratory and Department ofElectrical Engineering. University ofIllinois at Urbana-
Champaign. Urbana, Illinois 61801
(Received 12 June 1981; accepted for publication 14 August 1981)
Electric field enhancement of emission from three non-Coulombic traps has been calculated: the
shielded Coulombic potential, the polarization potential, and the dipole potential. Both the Poole-
Frenkel effect and phonon-assisted tunneling have been included, and both were found to be
important. The field effect can be used to distinguish between these potentials on the basis of their
long range character. This effect is most important in interpreting the results of capacitance
transient studies of deep levels.
PACS numbers: 79.70. + q, 71.55.Fr, n.20.Jv
7409 J. Appl. Phys. 52(12), December 1981 0021-8979/81/127409-07$01.10 @ 1981 American Institute of PhYSics 7409
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expression for r max in the Coulombic case shows that the
(2)
Poole-Frenkel effect is significant for rmax of the order of 50-
100 A. It is precisely the long Coulombic tail of the potential
where q is the electronic charge and Er the relative dielectric
which makes this an important effect at low field strengths.
constant of the host crystal. For 0 < B < 1T12 there is a well-
To model this with a square well requires values of r0 which
defined potential minimum found by setting av lar = 0 at
are grossly unrealistic for modeling anything else, such as a
r=rmax :
capture cross section. As we show below, the square well
(3) gives a reasonable phonon-assisted tunneling rate compared
to other, more extended, potentials.
The change in potential barrier due to the presence of the
field is found by evaluating V (r) at r = rmax' B. Phonon-assisted tunneling
(i 2" i"/2
through the barrier at a higher energy where the probability
P is more favorable. The probability of this composite event
-1 dJ sin BdBexp [-/loEi(B)] is
41T 0 0
- Eth) [ (8m)1/2
+ f2" dJ f" sin B dB) . (6)
Pc = exp ( kB T exp - -fz-
Jo J"/2
Here the sUbscript 3 denotes a three-dimensional calcula-
tion. The hemisphere 1T12 < B < 1T presents a problem in that
xiX'( 41TrEoX
x,
- q2 _ qFx + Ei _ Eth)1I2 dX], (11)
we expect diminished emission in this direction (since here where we have substituted the Coulombic potential in (10).
the potential is raised by the field) but there is no well-defined Ei is again the ionization energy of the deep level and Eth is
increase in potential height analogous to Eq. (4). We have the thermal excitation energy or phonon energy. The total
followed Hartke in assuming that the electric field does not emission probability en is given by integrating (11) over all
change the emission rate in this hemisphere. s 10nscher as- energies Eth and adding to it the Poole-Frenkel emission rate
sumed no emission in this direction 9 and Hill tried to model a
enl
finite lowering of the emission rate here. 10 The difference
among these treatments is small and only arises at low fields. en = en! + _1_ fE, - DE, dEthP '
(12)
kBT Jo
c
Equation (6) can be evaluated to obtain
en3 1e no =(lIr)[e Y (y-l)+ 1] +~, (7) The factor 1IkB Tin front of the integral normalizes the
integral so that the emission probability approaches 1 as F
where approaches infinity. II In this limit the emission rate is limit-
y = (qF 11TErEO)!/2qlkB T. ed only by the matrix element e;: between the localized ener-
There is a considerable difference between the one- and gy gap state and the conduction band states; the factor
three-dimensional expressions (5) and (7). The one-dimen- exp( - EJk B T) is at high fields exactly cancelled by the
sional analysis of Frenkel overestimates the field effect by emission enhancement of the field.
calculating it only at its maximum point, at B = O. This ac- We can divide both sides by the zero field emission rate
counts in part for the difficulty encountered in fitting the enO [Eq. (1)] to obtain the total relative field enhancement:
7410 J. Appl. Phys., Vol. 52, No. 12, December 1981 Martin, Streetman, and Hess 7410
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for z = (E; - Elh )Ik B T
~ = 1 + fE;lkT exp [z _ r/2( ~ (2m)I/2 (kB T)3/2 ) ]dZ. Yukawa Potential
Er =12.9, 3o.o.K
enO Jo 3 qfzF
c - - Coulombie
(14)
~ 10 2
Q)
-"'-"'- Ro = 2o.o.A
These are one-dimensional calculations for the phonon- u _.-._.- Ro = 5o.A
c
o ------- Ro = 20...0.
assisted tunneling. Thus we have used the one-dimensional .r:
c
W
Poole-Frenkel enhancement for a consistent picture, and for c
.2
a comparison of the two effects. We can expect the one-di- <f)
<f)
~=:~~;~~:;;;:::3c;~.:-:::?;:-;;::f
III. YUKAWA POTENTIAL
A. Physical basis
] .0:
The Yukawa, or shielded Coulombic, potential is a
modification of the Coulombic potential to include screen-
L;4;---.l.----'---L......L...J.....L..l....I.I~05;---..J.....-.J........J--L--'-J....U...JloG
2
ing of the charge by surrounding electrons. In the presence of 10-
2
V(r) = - q e- rIR - qFrcos e,
41Tror
Yukawa Potential ....
where Ro is the shielding length. We will treat Ro as an ad- Er =12.9, 3o.o.K .//
justable parameter. The point of maximum potential rmax is ro=2o.A, m*=mo / ....
c
the solution to Q)
E
........... Coulomb Potential, en/eno ....
- ... - ... - ... - en/eno
q_e- rIR [~
__ + _1_] =Fcos e, (15)
~102
o
.r:
--
-'-'-'-'-
enl/enO
en3/eno
/,'" //
../ /
r
. . .~.~~~~.~~. ~ : .~-.:.~. . . . . . . . . . . . .
c
~>~/
41Tr0 Ro W
-.--;:/"'~/.> /
.~
E
w
B. Poole-Frenkel effect
-_... -...........
//
7411 J. Appl. Phys., Vol. 52, No. 12, December 1981 Martin, Streetman, and Hess 7411
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Polarization Potential
- Yukawa ro =20A
- - - - - Coulomb ------ en1/eno
_10 3 - - en3 /e no
c -.-.-.- Square Well .,
c
_.-._.- e~3/ena
E106
Q)
Er=12.9, T=300K E
Q)
u
u c
c o
o
~l02
~ 104 w
W co
c o
o in
.~ 102 .!!!
E
E WlO
W
1O-2:,.-_.........._.L..-J.......J..........J....l.."-:.'-:;_ _L-....J.................J....l.....L...i...J-I 1 10
~ ~ ~ 1.649A"5 (qF)4t5. .
F (V/cm) Y= k8 T (dimensionless)
FIG. 4. Emission enhancement due to phonon-assisted tunneling en,/e nO FIG. S. Poole-Frenkel effect for the polarization potential in one- and three-
for Coulomb, Yukawa, and Dirac potentials; m* = O.07ma' dimensional models. e~3lenO includes a diminished emission rate in the re-
verse direction.
c. Phonon-assisted tunneling in the range 0 < 0 < 1T/2. The one-dimensional Poole-Fren-
The full field effect calculation is shown in Fig. 3 for two kel emission enhancement is given by
values of effective mass: m* = 0.07mo and m* = mo. In each
case the Coulombic result is shown for comparison. This
enlle no = exp r (20)
change in the effective mass changes the tunneling calcula- and the three-dimensional case by
tion quantitatively but does not affect the importance of
phonon-assisted tunneling, or offield effects in general. Fig- -e
nJ
= - 1 ( 1 + -5 Sol drr l 4
/ )
exprr,
e no 2 4 0
ure 4 shows the phonon-assisted tunneling rate enJe no com-
pared for the Coulomb, Yukawa, and Dirac wells. (The (21)
square well shows the same phonon-assisted tunneling rate r= 1.649A 1/5(qF)4/5IkB T.
as the Dirac well.) As expected, those potentials with greater Using Hill's technique for dealing with the raising of the
spatial extent show a greater field dependence. The emission barrier in the reverse direction,lo we assign an increase in
enhancement among these potentials varies by, at most, an barrier height for 1T12 < 0 < 1T equal to the corresponding
order of magnitude. lowering of the barrier = e' e
+ 1T. This results in
IV. POLARIZATION POTENTIAL
A. Physical basis
e' = - 5
~
eno 4
1 0
1
dr rl/4 cosh(rr). (22)
Lax used a polarization potential to model capture of While these integrals cannot be solved analytically,
electrons and holes by neutral impurities. 12 Tasch and Sah their numerical evaluation results in universal curves as
used this potential to model the observed field dependence of functions of r which give the Poole-Frenkel effect for any
Au in Si. 2 The potential is of the form combination of parameters. These curves are shown in
Fig. 5.
VIr) = -A Ir4
(16)
A = q2a/81ToC;,
where a is the polarizability of the neutral impurity atom
and , the relative dielectric constant of the host crystal. Lax Polarization Potential
estimated A = 2x 10- 31 eV cm 4 for Si:Au. A =2 xlO- 31 eV-cm 4, T =300K
m*=O.26mo, Ej =O.54eV
- ... - . - en/ena
B. Poole-Frenkel effect - - em/eno
-.-.-.- en3/e no
With an electric field in the - z direction, the total ----- en! lena
potential is c
.2
VIr) = ( - A Ir4) - qFr cos 0, (17) '"
.~
E
giving a maximum in potential barrier height at w 1
= - 1.649A 1/5(qF cos 0 )4/5 (19) FIG. 6. FulI field effect for the polarization potential.
7412 J. Appl. Phys., Vol. 52, No. 12, December 1981 Martin, Streetman, and Hess 7412
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Polarization Potential ,
A =2x lO-31 eV-cm 4 I
/
c
Q)
m* =O.07mo, T =300K
I
/
----- E; =O.8eV E'
~ 109 --E;=O.6eV
u
c I FIG. 8. Orientation of the dipole
-.---.- E; = OAeV I
o I potential with dipole moment P
~ 106 I
I in an electric field F.
W I
c
o ~---!-~}- y ...
::l103 ! //
E
W
I
I'
,
-------------~~-j/
define the 0 = plane to be that containing F and z. The
orientation of the field and dipole moment is shown in Fig. 8.
FIG. 7. Emission enhancement due to phonon-assisted tunneling e.,/e.o
for the polarization potential, parametrized by ionization energy E;. The complete potential then becomes
V( r ) = - q P cos
..2 0 -
F . 0 . 0
qr sm F sm cos <jJ
C. Phonon-assisted tunneling 41T,or
The emission enhancement due to phonon-assisted tun- - qrF cos OF cos O. (26)
neling is shown in Fig. 6 with the complete field effect. This
calculation represents the Au level in silicon at 0.54 eV be- In the hemisphere cos 0 < 0, this potential forms an infi-
low the conduction band edge. We use the estimate of Lax nite repulsive barrier to the emission of electrons. Quantum
for A = 2x 10- 31 eV cm 4 for this system. mechanically, we can expect some emission in this direction,
The ionization energy is not a critical parameter for the but such a process lies beyond the limiting assumptions of
phonon assisted tunneling enhancement except at very high the Poole-Frenkel emission mechanism. For the present cal-
field strengths. This is demonstrated in Fig. 7, which shows culation we assume no emission takes place, with or without
the phonon-assisted tunneling enhancement for three values field, into this hemisphere. We also assume, as usual, that the
of E;. At low field strengths the tunneling which predomi- emission rate is unchanged in the region in which the field
nates is through a region near the top of the potential well, raises the potential barrier.
which is common to wells of any depth. The dependence on Solving for the point of maximum potential as before,
E; begins only at higher fields where the enhancement factor we have
approaches its limiting value of exp(E;lkB T). Vincenti 1 (P 121T,o) cos 0 )1/3
showed this to be true for the Coulombic potential; we have rmax = ( FsinOFsinOcos<jJ + Fcos OF cosO '
found it true for all of our model potentials. These comments
(27)
are, of course, limited to field enhancement (en,le nO ); the
emission rate itself (e nt ) will be more strongly dependent on and the change in barrier height is given by
E;. P
DE; = - (3X2- 2/3 ) ( - - c o s 0
)1/3
41T,O
V. DIPOLE POTENTIAL
A. Physical basis X(Fsin OF sin 0 cos <jJ + Fcos OF cos 0 )2/3.
(28)
A complex of two oppositely charged centers, each with
charge magnitude of Zq, is represented by a dipole potential
B. Poole-Frenkel effect
We now consider the potential in an externally applied FIG. 9. Poole-Frenkel effect e.] lena for the dipole potential for four orien-
electric field. We let F form an angle ()F with the z axis and tations of electric field.
7413 J. Appl. Phys., Vol. 52, No. 12, December 1981 Martin, Streetman, and Hess 7413
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Unlike the other potentials studied in this work, the dipole The barrier is lowered for
potential experiences a barrier lowering which is -depen-
- 1T/2 < <.1T/2
dent. The three-dimensional Poole-Frenkel effect is thus giv-
en by a double integral which in general has no analytic solu- and for
tion. Because of the problem of fixing the limits of 1T/2 < < 31T/2,
integration, the integral falls into two cases.
Case 1: O<OF<'! 1T. 0< 0 < tan-I( - cot OF/COS ),
I J71"/2 L7T12
- d sinOdOexp[ -P8EdO,)]
21T
+ -
- 7T12
I 137T/2
21T 1/"12
d
0
c
Er =12.9, R=5A, T=300K
m*=O.07ma, 8 F =0
8E; = - 1.9 (_P __ )1/3
41rc,co
F2/3 cos 8, (31)
Q)
_ ... _ ... - en lena
E
Q)
--em/ena and the Poole-Frenkel emission enhancement is given by
~104
o -.-._.- en3 /e na
.c
c ------ ent lena
W (32)
~l02
V>
.'!:' where
E
w
r = 1.9 (-_P-)
41Tc cor
1I3F2/3/kB T.
10 - ~L,-04::----'-------L----L----'--.L..L---'--':-lO:!:-'5---'-------'---.l-----L....l-l~106 The three-dimensional result is shown for several field orien-
(a) F (V/cm) tations in Fig. 9.
c. Phonon-assisted tunneling
Dipole Potential
/ The one-dimensional analysis necessary for tunneling is
c (l)
Er=12.9, R=5A, T=300K
m*= O.07ma ,8F =60
- ... - ... - en lena i
/ also complicated by the reduced symmetry of the dipole po-
tential. For all other potentials studied here, the one-dimen-
E
(l) - - enl /e na
i
./ sional analysis was done at 8 = 0, where the Poole-Frenkel
~l04
o
-._.-.- en3 /e na barrier lowering was greatest. For the dipole potential, how-
.c ------ ent lena ..././ ever, the maximum barrier lowering occurs at some Om such
c
W
910 2
./ that < Om < OF' and at = 0, as determined from Eq. (28) .
,," Differentiating the expression for BE; with respect to 0 at
w
E
.,-:=-""':=:::.--:-.::::=:;;.;;:.:;;:.:::~:.-.-.
= and setting the result equal to zero we find a solution
---------------- for 8m :
(8+Cos28.)1/2-3cose.)
o = tan-I
(
f l - .
m 2sineF
The phonon assisted tunneling and one-dimensional
FIG. 10. Full field effect for the dipole potential for two orientations of Poole-Frenkel effect are calculated at this value of e. The
electric field: (a) OF = 0; (bl OF = 60. results are shown in Fig. 10.
7414 J. Appl. Phys., Vol. 52, No. 12, December 1981 Martin, Streetman, and Hess 7414
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VI. DISCUSSION low dopant field," high fields exist in alloys due to composi-
The starting point of the work described in this paper tional disorder and/or cluster formation. IS
was the idea that the field dependence of the emission rates The actual value of this "alloy field" depends on details
might be useful to identify deep traps. Indeed we saw that the such as cluster size, etc., which are hard to estimate. Fur-
various potentials exhibit quite different field dependences. thermore, in many instances the approximation of the alloy
However, the field dependence is always dominated by the effect on the deep level by a microscopic fluctuating field will
behavior of the potential far from the central cell. A power- be poor.
ful clarification of deep levels can therefore hardly be It seems to be a fact, however, that the field dependence
achieved with this method. One should be able, however, to of emission rates is much stronger in ternary alloys than in
distinguish roughly between Coulombic, short range, dipole, binary compounds or elemental semiconductors. This in
and polarization potentials. turn indicates that the field dependence itself is easier to
In the case of a few deep levels in GaAs, the field depen- study in the alloy where the external fields can be rather low.
dence of the emission rates has been successfully modeled by
ACKNOWLEDGMENTS
available theories. 4.13 Such efforts were not successful, how-
ever, for the EL2level in GaAs,4 where a strongly anisotro- This work was supported by the Office of Naval Re-
pic field effect was later observed. 14 While the interpretation search. We are grateful for fruitful discussions with 1. D.
of the observed anisotropy is still far from clear,15 it is most Dow, A. Bhattacharyya, and 1. Blaisdell, and to G. Vincent
likely due to a similar anisotropy in the defect potential. The for providing a copy of his thesis. We also acknowledge the
dipole potential is one candidate which deserves consider- help of the MACSYMA computer system- a product of the
ation, although other, similarly anisotropic potentials are Mathlab group of the Laboratory for Computer Science at
equally likely at this point. A rigorous determination must MIT. The work of the Mathlab group is supported in part by
await more detailed experiments. Field dependence mea- the United States Energy Research and Development Ad-
surements of other levels are not yet available. ministration and by the National Aeronautics and Space
The major relevance offield dependent emission rates is Administration.
therefore the evaluation of transient capacitance methods. 1D, v, Lang. J. App\. Phys, 45. 3023 (1974),
2A, F. Tasch, Jr. and C. T. Sah. Phys. Rev, B 1. 800 (1970).
In the light of the above formulas, this evaluation is only
'D. V. Lang. J. App\. Phys. 45, 3014 (1974).
straightforward if the continuum approximation of the p-n 4G. Vincent. A. Chantre, and D. Bois, J. App\. Phys. 50, 5484 (1979).
junction (or Schottkey barrier) built-in field is appropriate. 'D. Pons and S. Makram-Ebeid. 1. Phys, Theor. App\. 40.1161 (1979),
In view of the highly nonlinear character of the formulas "E. N. Korol, Sov. Phys. Solid State 19, 1327 (1977).
presented above, it is highly unlikely that such a case exists. 'I. Frenkel, Phys. Rev. 54, 64711938).
"I. L. Hartke, I. App\. Phys. 39, 4871 (1968).
The distance of the deep level to the next shallow doping 9 A. K. Ionscher, Thin Solid Films 1, 213 (1967).
impurity will enter the emission behavior, and pairing, etc., lOR. M. Hill, Phi1os. Mag. 23. 5911971).
can be of utmost importance. It is clear that under such cir- "G. Vincent, thesis, Lyon 1978.
12M, Lax, Phys. Rev. 119. 150211960).
cumstances the continuum approximation of the built in
13S, Makram-Ebeid, App\. Phys. Lett, 37, 46411980).
field is poor and an accurate determination of the energy of a 14A, Mircea and A. Mitonneau. J. Phys. Theor, App\. 40. L31 11979).
deep level using the above formulas can be expected only if "S. MakramEbeid, Proc. Mater. Res. Soc, Symp., 1980. Vo\. 2. Dejects in
the field dependence is weak. Semiconductors. edited by J. Narayan and T. Y. Tan INorth Holland,
This makes the study of deep levels in alloys using tran- New York, 1980), p, 495.
"'N. Holonyak. Jr .. W. D. Laidig, B. A. Vojak, K. Hess, I. J. Coleman. P. D.
sient capacitance methods difficult. In addition to the "shal- Dapkus, and J. Bardeen, Phys. Rev, Lett. 45, 1703 11980).
7415 J. Appl. Phys., Vol. 52, No. 12, December 1981 Martin, Streetman, and Hess 7415