Dang Nguyen Chau Click to edit Master subtitle style Ho Chi Minh City University of Technology Email: chaudn@hcmut.edu.vn The periodic table
Dept. of Telecomm. Eng.
2 Electronic Circuit, 2013 Faculty of EEE Atomic Structure Atom: the smallest particle of an element that contains three basis particles Protons (positive charge) Neutrons (uncharged particles) Electrons (negative charge): orbit around the nucleus
Dept. of Telecomm. Eng.
3 Electronic Circuit, 2013 Faculty of EEE Semiconductors, Conductors, and Insulators Materials can be classified into 3 groups: Conductors: have one valence electron that loosely bound to the atom. This valence electron can easily break away from their atoms and become free electron. E.g.: copper, silver, aluminum, gold Insulators: material that does not conduct electrical current under normal conditions. The valence electrons are tightly bound to the atoms.
Dept. of Telecomm. Eng.
4 Electronic Circuit, 2013 Faculty of EEE Semiconductors, Conductors, and Insulators (1)
Semiconductors: material that is between conductors and
insulators in its ability to conduct electrical current. They are characterized by atoms with four valence electrons.
Dept. of Telecomm. Eng.
5 Electronic Circuit, 2013 Faculty of EEE Semiconductors, Conductors, and Insulators (2) Energy gap: amount of energy that a valence electron must have in order to jump from the valence band to the conduction band.
Dept. of Telecomm. Eng.
6 Electronic Circuit, 2013 Faculty of EEE Atomic Structure of Semiconductors
Dept. of Telecomm. Eng.
7 Electronic Circuit, 2013 Faculty of EEE Semiconductor Silicon (Si) Si: 4th column in periodic table 4 valence electrons shared through covalent bonds
Dept. of Telecomm. Eng.
8 Electronic Circuit, 2013 Faculty of EEE Intrinsic Semiconductor Silicon (Si) Free Electrons and Holes At low temperatures, all covalent bonds are intact and very few electrons are available to conduct electric current. At room temperature, some of the bonds are broken by thermal ionization and some electrons are freed. This creates a hole.
10 Electronic Circuit, 2013 Faculty of EEE Intrinsic Semiconductor Silicon (Si) Two current types Electron current: the movement of free electrons. Hole current: the movement of holes that move from one place to another in the crystal structure.
Dept. of Telecomm. Eng.
11 Electronic Circuit, 2013 Faculty of EEE Intrinsic Semiconductor Silicon (Si) Free Electrons and Holes Free electrons and holes move randomly across silicon crystal structure.
Electrons and Holes move in Si via drift and diffusion
Dept. of Telecomm. Eng.
13 Electronic Circuit, 2013 Faculty of EEE N type Doped Semiconductor
Dept. of Telecomm. Eng.
14 Electronic Circuit, 2013 Faculty of EEE P type Doped Semiconductor
Dept. of Telecomm. Eng.
15 Electronic Circuit, 2013 Faculty of EEE N type and P type Semiconductor N-type semiconductor P-type semiconductor Pentavalent impurity atom with Trivalent impurity atom with five valence electrons is added. three valence electrons is added. Each pentavalent atom forms Each trivalent atom forms covalent bonds with four adjacent covalent bonds with four adjacent silicon atoms => leave one extra silicon atoms => result one hole electron without bonds. since four electrons required. The pentavalent atom gives up The trivalent atom can take an an electron => donor atom. electron => acceptor atom. Majority carriers: electrons. Majority carriers: holes. Minority carriers: holes. Minority carriers: electrons.
Dept. of Telecomm. Eng.
16 Electronic Circuit, 2013 Faculty of EEE Band Diagrams
Dept. of Telecomm. Eng.
17 Electronic Circuit, 2013 Faculty of EEE P-N junction When N-type and P-type dopants are introduced side-by-side in a semiconductor, a PN junction is formed.
Dept. of Telecomm. Eng.
18 Electronic Circuit, 2013 Faculty of EEE P-N junction (1) In the n-region, free electrons near the junction begin to diffuse across the junction into p-region where they combine with holes near the junction => create a layer of positive charges.
In the p-region, as the electrons from n region move across the
junction, the holes in the p-region are lost => create a layer of negative charges.
Dept. of Telecomm. Eng.
19 Electronic Circuit, 2013 Faculty of EEE P-N junction (2) These two layers form the depletion region (min ngho).
Dept. of Telecomm. Eng.
20 Electronic Circuit, 2013 Faculty of EEE P-N junction (3) Many positive and negative charges on opposite sides of the p-n junction => form an electric field (in trng tip xc).
Two current types:
Majority-carrier diffusion current (dng khuych tn): caused by majority carriers diffusing into other region. Minority-carrier drift current (dng tri): caused by minority carriers sweeping across the junction due to the electric field.
Dept. of Telecomm. Eng.
21 Electronic Circuit, 2013 Faculty of EEE P-N junction (4) The potential difference of the electric field across the depletion region is called barrier potential (hng ro in th).
Dept. of Telecomm. Eng.
22 Electronic Circuit, 2013 Faculty of EEE Forward-bias (phn cc thun)
Dept. of Telecomm. Eng.
23 Electronic Circuit, 2013 Faculty of EEE Forward-bias (phn cc thun) (1) Forward bias: the condition that allows current through the p-n junction.
The negative side of VBIAS is connected to the n region.
The positive side of VBIAS is connected to the p region.
The bias voltage VBIAS must be greater than the barrier potential.
Dept. of Telecomm. Eng.
24 Electronic Circuit, 2013 Faculty of EEE Forward-bias (phn cc thun) (2)
Dept. of Telecomm. Eng.
25 Electronic Circuit, 2013 Faculty of EEE Forward-bias (phn cc thun) (3)
Dept. of Telecomm. Eng.
26 Electronic Circuit, 2013 Faculty of EEE Reverse Bias (phn cc ngc)
Dept. of Telecomm. Eng.
27 Electronic Circuit, 2013 Faculty of EEE Reverse Bias (phn cc ngc) (1) Reverse bias: the condition that essentially prevents current through the p-n junction.
The negative side of VBIAS is connected to the p region.
The positive side of VBIAS is connected to the n region.
The depletion region is much wider than in forward bias
Dept. of Telecomm. Eng.
28 Electronic Circuit, 2013 Faculty of EEE Voltage-Current Characteristics