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Journal of Crystal Growth 246 (2002) 320324

Band structure effects on the transient electron transport in


wurtzite InN
T.F. de Vasconcelosa, F.F. Maia Jr.a, E.W.S. Caetanoa, V.N. Freirea,*,
J.A.P. da Costab, E.F. da Silva Jr.c
a
Departamento de F!sica, Universidade Federal do Ceara! Campus do Pici, Caixa Postal 6030, 60455-900 Fortaleza, Ceara,
! Brazil
b
!
Departamento de F!sica Teorica e Experimental, Universidade Federal do Rio Grande do Norte 59072-970 Natal,
Rio Grande do Norte, Brazil
c
!
Departamento de F!sica, Universidade Federal de Pernambuco Cidade Universitaria, 50670-901 Recife, Pernambuco, Brazil

Abstract

The transient regime of electron transport in wurtzite InN subjected to applied electric elds in the GA and GM
directions is calculated. The strength of the electron drift velocity overshoot effect is shown to be substantially
dependent on the eld direction, being stronger in the latter than in the former. This behavior is explained on the basis
of the energy dependence of the band structure attening, which is weaker in the GA than in the GM direction, and
gives rise to a heavier average effective mass.
r 2002 Elsevier Science B.V. All rights reserved.

PACS: 72.20.Ht; 72.60.Dp; 72.90.+y; 71.70.Di

Keywords: A1. Band anisotropy; A1. Carrier; A1. Effective mass; A1. Overshoot effect; B1. Wurtzite InN; B2. Semiconducting IIIV
materials

1. Introduction material for power eld effect devices, high-


performance and high-frequency transistors, since
Considerable interest has been devoted to it has the best steady-state velocityeld charac-
indium nitride (InN) during the last few years teristics among the III-nitrides. At a doping
due to its technological applications like in concentration of 1:0  1017 cm3 ; InN presents
quantum-well-based blue light emission devices, the highest electron drift velocity peak of 4:3 
where In(Ga)N has a key role as the carrier 107 cm=s at a eld of 67 kV/cm, and saturation
connement material [1]. For electronic device value in the steady-state of 2:5  107 cm=s [2].
applications, InN is the most promising nitride Focusing on the performance of sub-micron
devices, the ultrafast electron transport properties
of InN (principally the characteristics of the
*Corresponding author. Tel.: +55-85-2889937; fax: +55-85-
electron drift velocity overshoot), which occurs in
2874138. a time scale shorter than 0.5 ps, are more suitable
E-mail address: valder@sica.ufc.br (V.N. Freire). than those of GaN and AlN for the implementation
0022-0248/02/$ - see front matter r 2002 Elsevier Science B.V. All rights reserved.
PII: S 0 0 2 2 - 0 2 4 8 ( 0 2 ) 0 1 7 5 7 - 8
T.F. de Vasconcelos et al. / Journal of Crystal Growth 246 (2002) 320324 321

of high-speed devices with gate length smaller than magnetic eld effects on the ultrafast transport
0:3 mm [3]. However, the electron velocity over- transient of hot electrons in InSb [10,11], for
shoot onset in III-nitrides is a controversial matter example.
yet [3,4]. Concerning transient transport investigations in
Recently, a full-band Monte Carlo simulation of bulk III-nitrides, the energy-momentum approach
the electron steady-state transport in wurtzite InN was used recently: (i) to study the ultrafast
has evidenced a noticeable anisotropy of the transient behavior of the electron drift velocity
velocityeld curve with respect to the applied and mean energy in zincblende and wurtzite GaN,
eld direction. Bellotti et al. [5] showed that the where the velocity transient was shown to present
electric eld applied along the GA direction is less an overshoot effect for electric eld strengths
efcient in heating the carriers than when applied stronger than 20 and 50 kV/cm in the case of
in the GM direction, which is due to the heavier zincblende and wurtzite GaN, respectively [12]; (ii)
average effective mass along the former. The to calculate the transient electron transport in
electron drift velocity presented a maximum wurtzite GaN, InN, and AlN for an electric eld
around 65 kV/cm in both the cases, but is applied in the GA direction, obtaining a quiet
considerably smaller when averaged in the GA reasonable overall agreement with the results
rather than in the GM direction. These results calculated through Monte Carlo simulation [3].
indicate that the band structure anisotropy of However, they have overlooked how the aniso-
wurtzite InN should also be taken into account tropy of the III-nitride band structures may affect
when a better description of the transient transport the transient transport properties.
characteristics is sought. The eld dependent In our calculations polar-optical, acoustic pho-
onset of a possible overshoot on the electron drift non, ionized impurity, and piezoelectric scattering
velocity, as well as the rate of energy transfer from mechanisms as well as nonparabolicity effects are
the eld to the carriers should be highly dependent considered to obtain the relaxation times for
on the applied eld direction. The purpose of this momentum and energy in the GA and GM
work is to investigate how the anisotropy of the directions. In addition, we take into account the
band structure changes the transient transport details of the conduction bands of the wurtzite
properties of wurtzite InN. InN. The electron effective mass in wurtzite InN in
the GA and GM directions is taken as 0:12 m0
and 0:11 m0 ; respectively, where m0 is the electron
2. Model and numerical approach mass in the vacuum, and the nonparabolicity
constant a 0:419 eV1 [5]. The electric eld
The theoretical calculations are performed intensity is restricted to values less than 100 kV/
solving numerically coupled Boltzmann-like cm to avoid population of secondary valleys in
transport equations within the approximation wurtzite InN since their energies are not well
of relaxation times for momentum and energy in known yet [3], restricting the energymomentum
a given applied electric eld direction [4]. The approach used here to a single nonparabolic
results take full advantage of the stationary state energy band. According to the results of Bellotti
data for the electric eld dependence of the mean et al. [3], the higher average electron effective mass
electron velocity and energy in the GA and GM along the GA direction rather than in the GM
directions resulting from the ensemble Monte direction is responsible for a higher electron
Carlo simulation of Bellotti et al. [5]. Originally steady-state drift velocity and mean energy in the
proposed by Shur [6], this scheme for the calcula- former than in the latter direction. These differ-
tion of the time evolution of the electron drift ences give rise to an anisotropy of the relaxation
velocity and energy towards the steady state has times of momentum and energy, and consequently
been adopted by several authors to study hot the transient transport properties of electrons in
carriers in GaAs [7,8], high-eld transport tran- InN turn to be dependent on the applied electric
sient of minority carriers in p-GaAs [9], and high eld direction.
322 T.F. de Vasconcelos et al. / Journal of Crystal Growth 246 (2002) 320324

3. Field direction anisotropy of electron velocity M


and energy 8
20 kV/cm
60 kV/cm

Velocity (10 cm/s)


Figs. 1 and 2 (top graphs) depict the eld- 6
direction related anisotropy of the electron drift 100 kV/cm

7
velocity in wurtzite InN for electric elds applied
4
in the GA and GM directions, respectively. For
small electric elds B10 kV/cm, the effect of the
anisotropy can be disregarded since the evolution 2
of the electron drift velocity toward the steady
state is very similar in both the GA and GM 0
0.0 0.2 0.4 0.6 0.8 1.0
directions. However, as the eld intensity is raised
from 0 to 50 kV/cm we observe that the onset of 1.0
overshoot on the electron drift velocity happens

Average Energy (eV)


slightly earlier in the GM than in the GA 0.8
direction. This behavior is associated to the fact
0.6
that the average electron effective mass in the GA
direction is heavier than in the GM direction. At
0.4

0.2

A 0.0
8 0.0 0.2 0.4 0.6 0.8 1.0
20 kV/cm Time (ps)
Velocity (10 cm/s)

60 kV/cm
6 Fig. 2. Time evolution of the electron drift velocity (top graph)
100 kV/cm
and electron energy (bottom graph) in wurtzite InN for electric
7

elds applied in the GM direction: eld intensities are 20 kV/


4
cm (   ), 60 kV/cm (- - - -) and 100 kV/cm () respectively.

60 kV/cm, we start to observe clearly the onset of


0
0.0 0.2 0.4 0.6 0.8 1.0 an overshoot in the electron drift velocity for both
directions. It is clear from our results that the
1.0
anisotropy of the relaxation times cannot preclude
the existence of the overshoot effect in the electron
Average Energy (eV)

0.8
drift velocity for higher electric elds in the
0.6 directions we have investigated. The peak of the
electron drift velocity continues to be highly
0.4 dependent on the eld direction related anisotropy
as the eld is further increased. As a matter of fact,
0.2 the peak in the electron drift velocity in the GM
direction is B30% higher than in the GA
0.0
0.0 0.2 0.4 0.6 0.8 1.0 direction. Despite the changes on the character-
Time (ps) istics of the electron drift velocity related to the
applied electric eld direction in wurtzite InN, the
Fig. 1. Time evolution of the electron drift velocity (top graph)
and electron energy (bottom graph) in wurtzite InN for electric anisotropy of the relaxation times does not change
elds applied in the GA direction: eld intensities are 20 kV/cm the time needed for the electron drift velocity to
(   ), 60 kV/cm (- - - -) and 100 kV/cm (), respectively. arrive at the steady state, which is similar for the
T.F. de Vasconcelos et al. / Journal of Crystal Growth 246 (2002) 320324 323

directions investigated here, e.g. always smaller transport parameters is also strongly dependent on
than 0.5 ps. the direction in which the electric eld is applied.
The evolution of the carrier energy towards the In both situations an improved description of the
steady state is depicted in the bottom parts of electric eld direction related anisotropy effects
Figs. 1 and 2 for the applied eld directions GA will be possible only when better III-nitrides
and GM; respectively. It is shown that the time samples allow band structure measurements to
necessary for the carriers energy to arrive at the conrm or not several details of the band structure
steady state is approximately the same in both calculations already published. However, even
directions. However, the rate of growth of the nowadays the physical parameters of the III-
carriers energy is smaller in the former than in nitrides semiconductors are not well known. As a
the latter direction. This is due to the stronger matter of fact, recent absorption and emission
electron scattering mechanisms in the GA direc- experiments are evidencing the possibility of a
tion, which can be explained on the basis of the 0:9 meV energy gap for hexagonal InN [14]. This
energy dependence of the band attening, weaker state of the art points to the limitation of this
in the GA rather than in the GM direction, work, since its results are strongly dependent on
giving rise to a heavier average effective mass the band structure calculations that have to be
in the former direction. Rodrigues et al. [13] have conrmed by measurements, which will not give
demonstrated the possibility of an overshoot conclusive results due to the quality of the actual
existing on the carriers mean energy in InN samples.
for electric eld intensities smaller than 40 kV/
cm, a feature which is not present in this work. As
in the case of the results of Foutz et al. [3], the Acknowledgements
absence of a mean electron energy overshoot can
be associated mainly to the warm LO-phonon The authors would like to acknowledge the
effect, e.g. the increase of few degrees Kelvin in the nancial support received from the Science Fund-
LO-phonon system temperature when it is con- ing Agency of the Ceara! (FUNCAP) state in
sidered as a nonintensive thermodynamic variable Brazil, the Brazilian National Research Council
within the nonequilibrium statistical ensemble (CNPq) under contract NanoSemiMat/CNPq #
formalism in the description of the high-eld 550.015/01-9, and the Ministry of Planning
carrier transient transport properties in III-nitride (FINEP) under contract CTPETRO/FINEP #
systems [13]. 65.00.02.80.00.

4. Concluding remarks
References
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