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1
Simulating Phase
Locked Loops Using
ADS
Baseband
Baseband envelope
envelope
VCO
envelope
Reference Q1
Input Output
"1" D Q
Flip Flop "UP" To
Q Charge
Clear Pump
Divided Source
VCO
Input To
"1" D Q Q2 Charge
Flip Flop "DOWN" Output Pump
Q Sink
Clear
+ Current
1 timestep
-
Ideally, charge pump current pulse time
width is equal to time difference Ideal current Current pulse,
between PFD input signals. But in pulse (cant 1 timestep
simulation, this width must be a be simulated) wide, amplitude
multiple of the timestep. reduced to give
Envelope uses interpolation to get same area
finer resolution than the timestep. as ideal pulse
Sawtooth waves are easiest to
interpolate.
EEsof/Simulating PLLs with ADS
10
August 25, 2006
Phase/Frequency Detector Dead zone
Mean charge pump current versus phase
difference between two input signals
High and low currents may
be set to different values,
giving different sensitivities
outside dead zone
_v1 is the
tuning voltage
VCO output is a
time-varying phasor
VCO frequency is
F0+VCO_Freq
Tuning voltage
output from Divided output is
lowpass filter saw tooth wave
representing the
Divided VCO output divided signal
frequency is phase in radians
(F0+VCO_Freq)/(N0+dN)
EEsof/Simulating PLLs with ADS
12
August 25, 2006
VCO/Divide-By-N Behavioral Model
PFD
Charge Pump
EEsof/Simulating PLLs with ADS
14
August 25, 2006
Computing average sensitivity using markers
Used in behavioral
PFD on next slide
Sensitivity is
on current /360
in Amps/degree
Running the
simulation once
Gives closed-loop
phase noise, including
all noise sources
Have to sum in VCO phase
noise as a modulation
signal at the vtune node.
Accumulator
Quantization
Fraction to noise introduced
Accumulator Core by coarse, 1-bit
be summed
quantizer
Y ( z ) = .F ( z ) + (1 z ) Eq ( z )
1
for small)
if .F(z) is sufficiently random.
But the fraction is constant, so the quantization
noise varies periodically, generating spurs.
Accumulator
Differentiator
Output
B
Output = A(1-z-1) + B
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Agilent
Agilent Technologies,
Technologies, Inc.
Inc. 2008
2010
Printed in USA, August 19, 2010
Printed in USA, August 25, 2006
5989-9471EN
5989-9471EN
45