Determination of the Thickness of Glass to Test Surface Flatness by

using Michelson Interferometer

R.M Tampus1, F. Ramirez2
Physics Department, University of San Carlos, Nasipit Talamban Cebu
1
rosemay_tampus@yahoo.com
2
flovramz@gmail.com

Abstract
Michelson interferometer is commonly employed to measure the wavelength of
an unknown light beam. In this laboratory experiment, the usage of Michelson
interferometer is expanded to test surface flatness by determining the optical
thickness of the glass sample. Constant thickness at any point on the sample
means the sample is flat; otherwise its surface is not flat. Two glass samples were
utilized: flat glass (slide) and irregular glass.

Keywords: Michelson interferometer, surface flatness, thickness, fringe

1. Introduction
Michelson interferometer measures small displacements, refractive index and wavelengths of light sources by
associating the path differences of light corresponding to interference patterns. The interference patterns are
analogous to contour lines on a topographical map, which may be used to determine the form of a surface whether
flat or non-uniform [1,2]. In this experiment, the interference fringes formed upon the introduction of sample, is
used to quantify its surface flatness by determining the thickness of the sample.

2. Theory
Interferometer is an instrument that uses interference in the measurement of wavelengths of light in terms of
standard length or in the measurement of distance in terms of known wavelengths of light. It is an amplitude
splitting interferometers that utilizes arrangements of mirrors and beam splitters as diagrammed in Fig. 1 [1,3].
The beam splitter A is half-silvered on its rear side. A beam of light from source falls on the beam splitter, where
it is divided into two beams: one is traveling to movable mirror M1 and is reflected, and the other is transmitted to
fixed mirror M2. Both beams return to beam splitter and proceed to the screen or detector. The two beams are united,
and interference is expected. Since the light traveling the path A to M1 and back, passes through plate A three times
while the other beam traverses it only once, a compensator plate B which is unsilvered plate is inserted in the arm
AM2. This makes each beam passes through equal thickness of glass at an angle 45 [1,3-6]. Without the
compensating plate B, fringes would still be produced by interference between the light beams that have traveled the
two paths provided that the light is monochromatic. With white light, no fringes will be seen if the difference
between two paths exceeds a few wavelengths. To obtain fringes, the mirrors M 1 and M2, are made exactly
perpendicular to each other by means of screws on M2 [1].

M1
M2
A B

Figure 1. The interference of light in the Michelson Interferometer. [7]

31st Physics Congress of the SamahangPisikangPilipinas
University of San Carlos, Cebu City, Philippines
23- 25 October 2013
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 If the optical path happens to be equal (that is distance AM 2 is equal to AM1), the beams will arrive at detector
in phase and produce a bright field by constructive interference. If the distance AM1 is increased by /4 by moving
M1, the optical path length of the ray that travels in this path will be lengthened to /2 and the destructive
interference of both rays at detector will give a dark field. This path difference of /2 means a phase difference of
radians [1,4-5].
Usually M1 and M2, are made nearly but not quite perpendicular to give a field caused by alternate bright and
dark fringes which maybe counted as they move past a reference mark as M 1 is moved. For each fringe that passes
the reference point, the optical path length has been changed by one wavelength; M 1 has moved /2. If m successive
dark fringes are counted as M1 is moved a distance d then, [1,4-5]
2d m (1)

3. Methodology
A monochromatic laser source was used in this experiment. The Michelson interferometer set-up in Fig.2 was
composed of a collimator placed after the laser, a plano-convex lens, a beam splitter that divides the light beam into
two beams propagating to each mirror, a compensator, and two adjustable plane mirrors (M1 and M2) for proper
alignment of the instrument.
The two images from each mirror were projected on the screen. These images were superimposed by adjusting
the screws of M2 creating an interference pattern with circular fringes. The fringes were shifted inward or outward
by moving M1 forward or backward through its adjusting knobs.
The wavelength of the light source was determined by plotting the displacement d of M1, against the fringe shift,
m, where the slope is merely half of the wavelength as shown in eq. (1).
The flatness of the two glass samples with irregular and flat surfaces was tested by determining their thicknesses
at different locations on the samples. Each sample was placed between the compensator and M2. As M1 was
displaced at a distance d to have a fringe shift, the optical path difference is

m 2 d t (ns na ) (2)
where m (0,1,2,) was the number of shifted fringes, ns is the index of refraction of the glass and na for air.
Rearranging eq.2 yields

d m t (ns na ) (3)
2
where the thickness of the sample, t, was determined from the y-intercept of the plot d against m. The measured
wavelength from eq. (1) can be verified from the slope of eq.(3) .

Adjusting
knob

M1
d image of M2

compensator M2
lens
laser Adjusting
screws
collimator
sample
Beam
splitter Rotating
knob
Figure 2. Top view of the path of light when a sample is already introduced between compensator and M 2.

31st Physics Congress of the SamahangPisikangPilipinas

University of San Carlos, Cebu City, Philippines
23- 25 October 2013
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4. Results and Discussion
The wavelength has been experimentally obtained from the slope of the linear plot, d against m as seen in Fig.3.
The calculated wavelength is (7.460.08)10-8m. Most of the data points lie on the line of best fit implying precise
measurements. This experimental wavelength is further verified from slopes of the linear plots in Fig.4.a and b. The
average wavelength from the graphs in a and b is (6.90.2)10 -8m with a percent difference of 8% from the
wavelength obtained in Fig.3.
1.20E-06

1.00E-06
M1 displacement, d (m)
8.00E-07

6.00E-07

4.00E-07

2.00E-07 y = 3.73E-08x - 2.91E-10

0.00E+00
0 5 10 15 20 25 30
fringe shift, m
Figure 3. Plotting displacement of M1, d, against the fringe shift, m in finding the wavelength of the light source

The flatness of the surface can be qualitatively determined by looking at the formed fringes. A sample that has
irregular surface generates fringes that are neither non-circular nor linear. The fringes have irregular shape and are
converging towards the non-uniform region of the glass surface. To quantify the flatness of the surface, relate this to
its thickness. Fig. 4.a shows the linear plot of d against m at different positions on the flat sample: the triangular-
shaped points correspond to data gathered at a location of 0.9-1.2cm along the sample (note that the diameter of the
beam is 3mm), square points to 1.2-1.5cm, and the diamond points to of 1.5-1.8cm. The points at each plot are
overlapping indicating that the thickness measured at each position is almost the same. For 0.9-1.2cm position, the
thickness measured is (53)10-8m, (42)10-8m for 1.2-1.5cm position, and (51)10-8m for 1.5-1.8cm. Their
percent difference is 20%, indicating that the sample is relatively flat.
Fig.4.b shows the linear plot of d against m at two different ranges of positions on the irregular sample: the
diamond shaped points is for 1.2-1.5cm and squares for 1.3-1.6cm. For 1.2-1.4cm position, the thickness is
(3.10.3)10-7m and (1.60.2)10-7m for 1.3-1.6cm position with percent difference of 48%. Apparently in the
graph, the data points are not coinciding implying a different thickness at different surface locations. If the sample
has same thickness at its different locations, the sample is said to be flat. But if the thickness varies at different
locations in the sample, then the sample has irregular surface.

6.00E-07 1.00E-06
9.00E-07
5.00E-07 8.00E-07
M1 displacement (m)
M1 displacement (m)

7.00E-07
4.00E-07
6.00E-07
3.00E-07 5.00E-07
4.00E-07
2.00E-07 3.00E-07
at 0.9 to 1.2cm
1.00E-07 2.00E-07
1.00E-07 at 1.2 to 1.4cm
at 1.2 to 1.5cm
0.00E+00 0.00E+00
0 5 10 15 20 0 5 10 15 20 25
fringe shift, m fringe shift, m

Figure 4. Plotting displacement of M1, d, against the fringe shift, m in finding the thickness of (a) the flat sample
and (b) of the irregular sample at different positions on the surface.

31st Physics Congress of the SamahangPisikangPilipinas

University of San Carlos, Cebu City, Philippines
23- 25 October 2013
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4. Conclusion
The determined thickness of the sample via Michael interferometer at different location on the surface can test
the surface flatness. For a glass slide sample, the thicknesses at three different locations on the surface are found to
be most likely equal implying that the sample has a flat surface. On the other hand, the thicknesses of irregular glass
sample at different surface locations are deviating significantly, entailing a non-flat surface.

References
[1] E. Hecht. Optics, 4th ed., Pearson Education Inc., 2002, chapter 9.
[2] J. Valasek. Introduction of Theoretical and Experimental Optics, John Wiley and Sons, Inc. New York. 1949,
pp. 353-355, 129-130,370-371.
[3] F. Jenkins and H. White, Fundamentals of Optics, 4 th ed., McGraw-Hill Inc., 1976, chapter 13.
[4] H. Margengu, et.al. Physics Principles and Applications, 2 nd ed., New York McGraw- Hill Company Inc.,
1953, chapter 46.
[5] E. Weber, et. al.,College Physics, 5th ed., McGraw-Hill Book Co., 1997, chapter 30.
[6] T.B Brown, et al., The Lloyd William Taylor Manual of Advanced Undergraduate Experiments in Physics,
USA, Addison- Wesley Publishing Co. Inc., 1959 p. 227-228.
[7] http://hyperphysics.phy-astr.gsu.edu/hbase/phyopt/michel.html#c1.

31st Physics Congress of the SamahangPisikangPilipinas

University of San Carlos, Cebu City, Philippines
23- 25 October 2013
SPP
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