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HomeELECTRONICSVLSI/VHDL/VerilogCoreProjectsSkewedLoadTestCubesBasedonFunctionalBroadsideTestsforaLowPowerTestSet2014

SKEWED LOAD TEST CUBES BASED ON FUNCTIONAL BROADSIDE TESTS FOR A LOW POWER

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CoreProjects February2,2017

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SkewedLoadTestCubesBasedonFunctionalBroadsideTestsforaLowPower
TestSet2014
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Abstract:
Subject
A lowpower test generation procedure that was developed earlier merges
broadsidetestcubesthatarederivedfromfunctionalbroadsidetestsinorderto Re: Skewed Load Test Cubes Based on Functional Broadside Tests for a Low Power T
generate a lowpower broadside test set. This has several advantages, most
Message
importantly, that test cubes, which are derived from functional broadside tests,
createfunctionaloperationconditionsinsubcircuitsaroundthesitesofdetected
faults.Theseconditionsarepreservedwhenatestcubeismergedwithothertest
cubes.Thisbriefappliesasimilarapproachtothegenerationofalowpowerskewedloadtestset.Themainchallengethatthispaper
addresses is the derivation of skewedload test cubes from functional broadside tests. The paper also considers the percentages of
valuesthatshouldbeunspecifiedintheskewedloadtestcubesinordertobalancetheneedtocreatefunctionaloperationconditions
withtheneedfortestcompaction.

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