2 Fundaments Chipp10

FUNDAMENTS INTERACTIONS WITH MATTER 2 - 1/31
2
INTERACTIONS OF RADIATION WITH MATTER
Fabio Sauli - CHIPP Winter School 2010

CHARGED PARTICLES INTERACTIONS WITH MATTER 2 - 2/31
PROBABILITY OF PRIMARY ELECTROMAGNETIC INTERACTION WITH MATTER
PROBABILITY
H 2O
Excitations Ionization due

due to distant to distant
collisions collisions
Ionization
due to close
collisions
ENERGY TRANSFER (keV)

DIFFERENTIAL ENERGY LOSS INTERACTIONS WITH MATTER 2 - 3/31
BETHE-BLOCH EXPRESSION
2 . '
dE 2 2 Z z 2me & 2v 2W MAX * 2 C1
" = 2#N a re me c $ 0ln) , " 2% " - " 2 3
dx A %2 / ( I2 + Z2
re : classic electron radius 2.817 10-13cm z: particle charge in units of e

me: electron mass : v/c of particle
! Na : Avogadro number 6.022 1023 mol-1 : 1/ ( 1-2)
I : average ionization potential : density correction
Z, A : atomic number and mass of target C: shell correction
: target density WMAX: maximum energy transfer in a collision
2
Relative ionization
plateau
1
Relativistic rise
"2
1
! minimum
1 10 100 1000


DIFFERENTIAL ENERGY LOSS INTERACTIONS WITH MATTER 2 - 4/31
z=1 particles
Reduced units:
dE 1 dE
= : density
d" # dx
" (g cm #2 ) = $ (g cm #3 ) l(cm)
!
In composite materials:
! dE dE
= " pi
dx dx i
pi: fraction of material i

!
Review of Particle Physics,

Physics Letters B667 (2008) 1
http://pdg.lbl.gov/

PRIMARY AND TOTAL IONIZATION INTERACTIONS WITH MATTER 2 - 5/31
CREATION OF ELECTRON-ION PAIRS
TOTAL IONIZATION ENERGY LOSS

-ray
Pairs
Cluster
Primary ionization probability:

nn k "n
P = e
k k: actual number
k! n: average
Total ionization probability (Landau expression):

!
1
1 = 2 ( " +e$ " )
f (" ) = e
2#
#E $ #E MP Z &
"= %=K x
% A '2
Average total ionization:
! G. Igo et al, Phys. Rev. 89(1953)879
"E ! E: energy loss
N=
Wi Wi: average energy per ion pair

!
SLOW ELECTRONS RANGE INTERACTIONS WITH MATTER 2 - 6/31
PATH IN MATERIALS OF DELTA ELECTRONS

Dispersed by multiple scattering PRACTICAL RANGE
INTEGRATED RANGE
PRACTICAL RANGE
H. Kanter, Phys. Rev. 121(1961)461

ENERGY LOSS INTERACTIONS WITH MATTER 2 - 7/31
ENERGY LOSS IN SEMICONDUCTORS (MINIMUM IONIZING PARTCLES)
MATERIAL Z (g cm-3) Wi (eV) dE/dx (MeV g-1 cm2) dE/dx (MeV cm-1)
Silicon 14 2.34 3.6 1.6 3.7
Germanium 32 5,32 2.96 1.4 7.5
Z : charge : density Wi average ionization energy
Average number of ion pairs: most probable

average
"E dE dx
n= = s
Wi Wi
For silicon, 300 m thick:

! n ~ 30,000 electron-hole pairs
or
"q = n #1.6 #10 $19 C = 4.8 fC

ENERGY LOSS INTERACTIONS WITH MATTER 2 - 8/31
DELTA ELECTRON PRODUCTION

PROBABILITY AND RANGE IN SILICON
POSITION ERROR AS A FUNCTION OF

THICKNESS IN SILICON DETECTORS
(PERPENDICULAR MIPS)
C. Damerell, RAL 86-77(1986)

C. Damerell, Nucl. Instr. and Meth. 226(1984)26

ENERGY LOSS IN GASES INTERACTIONS WITH MATTER 2 - 9/31
MAIN PARAMETERS:
C. Amsler et al,
Review of Particle Physics
Physics Letters B667 (2008) 1
PRIMARY IONIZATION:
Minimum ionizing particles in Argon NTP:

dE/dx: 2.4 keV/cm nP: 25 ion pairs/cm
Detection efficiency: " = 1# P0n = 1# e#n Thickness: s (mm) (%)

1 91.8
2 99.3
TOTAL IONIZATION: !
"E
Total number of ion pairs: nT =
Wi
E = 2.4 keV/cm wi = 26 eV nT 90 ip/cm
nT
"3
! nP

!
CLUSTERS INTERACTIONS WITH MATTER 2 - 10/31
PROGRAM HEED:
NUMBER OF PRIMARY INTERACTIONS
(CLUSTERS) IN GASES AT STP EXPERIMENTAL CLUSTER SIZE
PROBABILITY:
I. B. Smirnov, Nucl. Instr. and Meth. A554(2005)474
http://consult.cern.ch/writeup/heed/
H. Fischle et al, Nucl. Instr. and Meth. A301 (1991) 202

DELTA ELECTRONS INTERACTIONS WITH MATTER 2 - 11/31
APPROXIMATE EXPRESSIONS
Number of electrons with energy larger than E0: ELECTRON RANGE IN GASES AT STP:
(first term of Bethe-Block) 1
R " 10 E 1.7 R : range in cm
W
Z
K= 0.154 MeV cm2/g # E : electron energy in keV
N(E " E 0 ) #
E0 W =K
A
"x : density (g/cm3) : density in g cm-3
x: material thickness (cm)
! !
!
1 cm ARGON STP
" dE %
$ ' ( 2 keV
# dx & MP
! 5%
180 m
2 keV
2 keV
F. Sauli, Nucl. Instr. and Meth. 156 (1978) 147

DELTA ELECTRONS INTERACTIONS WITH MATTER 2 - 12/31
CONSEQUENCES OF DELTA ELECTRON STATISTICS POSITION ACCURACY

(CENTER OF GRAVITY) :
DIFFERENTIAL ENERGY LOSS RESOLUTION:
Counts
4 cm Ar-CH4 (95-5)
6000
5 bars
N = 460 i.p.
4000
FWHM~250 i.p.
or ~ 50%
2000
0
0 500 1000
N (i.p.)
I. Lehraus et al, Phys. Scripta 23(1981)727
G. Charpak et al, Nucl. Instr. and Meth. 167 (1979) 455

DETECTION OF PHOTONS INTERACTIONS WITH MATTER 2 - 13/31
PHOTON ABSORPTION x : material thickness (cm)

l : linear absorption length (cm)
x
I0
" " = x # : reduced thickness (g cm-2)
I I = I0 e l
= I 0 e" #
= 1 (l " ) : mass absorption coefficient (cm2 g-1)
1 : cross section (cm2)
l=
x N" ! N : molecules cm-3
! " N0= 6.0247 1023 molecules/gmole
N = N0 !
A A : atomic or molecular mass
! : density (g cm-3)
INTERACTION PROCESSES
!
EK- EL
PHOTOELECTRIC: Interaction with an electronic shell with Eg
emission of a photoelectron. The excited atom/molecule E g - EK
returns to ground state through fluorescence or radiation-less
(Auger) process. EC
Eg QC
COMPTON: Scattering of the photon by quasi-free
Qe
electrons; can be coherent or incoherent Ee
Eg e+
PAIR PRODUCTION: Conversion in a e+e-
pair in the
e-
field of the atom/molecule. Possible for Eg> 2 me = 1.022
MeV

PHOTON DETECTION INTERACTIONS WITH MATTER 2 - 14/31
PHOTON ABSORPTION CROSS SECTION FOR TUNGSTEN
A. Thompson et al, X-RAY DATA BOOKLET (2001)

http://xdb.lbl.gov/
Absorption tables for atoms and molecules: http://henke.lbl.gov/optical_constants/
http://physics.nist.gov/PhysRefData/FFast/html/form.html

PHOTON DETECTION: VISIBLE AND NEAR UV INTERACTIONS WITH MATTER 2 - 15/31
PHOTOELECTRIC EFFECT
WORK FUNCTION: ELECTRON EMISSION FROM
Minimum photon energy required to remove an electron PHOTOCATHODES (IN VACUUM)
from a solid (lower than the first ionization potential)
Element W (eV) I (eV)
Ag 4.52-4.74 7.57
SEMITRANSPARENT:
Au 5.1-5.47 9.22
Al 4.06-4.26 5.99
Fe 4.67-4.81 7.87
TMAX ~
Na 2.36 5.14
Li 2.93 5.39
Cs 2.14 3.89 REFLECTIVE:
PHOTOIONIZATION THRESHOLD AND

QUANTUM EFFICIENCY OF MULTIALKALI
Compound W (eV) Max QE (%)
SbCs 1.8 16
SbNaKCs 1.45 20
SbKCs 1.98 26

PHOTON DETECTION- VISIBLE AND NEAR UV INTERACTIONS WITH MATTER 2 - 16/31
BIALKALI PHOTOCATHODES (VISIBLE LIGHT)
QUANTUM EFFICIENCY OF Cs3Sb

UV PHOTONS
CAESIUM IODIDE QUANTUM EFFICIENCY
CHERENKOV RING IMAGING

W. E. Spicer, Phys. Rev. 112(1958)114

PHOTON ABSORPTION IN GASES INTERACTIONS WITH MATTER 2 - 17/31
MOLECULAR GASES:
ATOMIC GASES:
H. S. W. Massey, Electronic and Ionic impact

Phenomena (Oxford Press 1969)
G. Marr, Photoionization Processes in Gases

(Academic Press NY 1967)

PHOTOIONIZATION IN GASES TOTAL AND PHOTOIONIZATION CROSS SECTIONS:

For a photon energy E above the
photoionization threshold EI the absorption can
result in the emission of a photoelectron with
energy equal to the difference:
Ee = E - E I
The quantum efficiency (QE) is the ratio between

the probability of photoelectron emission and total
absorption.
EI (eV)
C6H6 9.3
TEA 7.45 TMAE
TMAE 5.6
TEA
TEA: Triethylamine (C2H5)3N
TMAE: Tetrakis-dimethylamino ethylene
[(CH3)2N]2C
CHERENKOV RING IMAGING

PHOTOIONIZATION CROSS SECTION IN XENON
UV SOFT X-RAYS HARD X-RAYS GAMMAS

ABSORPTION LENGTH FOR GASES AT NTP
For gases at STP (0C, 1 Atm):

N=2.687 1019 cm-3
Absorption length:
1
"(cm) =
26.87 # (MBarns)
The mass absorption coefficient
for molecules:
! N0
M =
M i
# ni" i
M: molecular weight
! ni, i : atoms, cross section type i

PHOTOELECTRIC FLUORESCENCE YIELD
An excited atom returns to the ground state with

a cascade of internal transitions that can be
radiative (with the emission of photons) or non-
radiative:
RADIATIVE: Xe
90%
NFL
NON-RADIATIVE (AUGER):
NNR Ar
10%
The fluorescence yield is the ratio of radiative to
total transitions, and increases with the atomic
number:
NFL Xe
FLUORESCENCE YIELD = 8%
NFL +NNR
M. O. Krause, J. Phys. Chem. Ref. Data 8 (1979) 307

FLUORESCENCE PHOTONS FATE

Fluorescence photons can convert far from the
primary interaction, or escape from the
sensitive volume (escape peak):
X-RAY ABSORPTION SPECTRUM
55Fe X-Rays (5.9 keV) in Argon:
5.9 keV
4 cm
2 cm
~ 3 keV
ESCAPE

COMPTON EFFECT
E1 1
Scattering of the photon on a quasi-free
electron of electronic shells E0
Ee=E0-E1 0
$1 1 ' Ee e
2
cos " = 1 # m e c & # )
% E1 E 0 ( DIFFERENTIAL CROSS SECTION FOR SCATTERING AT
# E0 & ) AN ANGLE FOR SEVERAL PHOTON ENERGIES:
cot " = %1 + 2 ( tan
$ mec ' 2
!
Arthur Holly Compton

Nobel Laureate in Physics 1927

COMPTON SCATTERING: ANGLE-ENERGY CORRELATIONS
R. D. Evans, Compton Effect

Handbuch der Physik 34 p. 218 (Springer Verlag 1958)

DOUBLE COMPTON SCATTERING

Measurement of recoil electrons energy and position in two cascades detectors allows to define a circle
of origin for the source; intersection of many events provides the source position:
$ m0c 2 m 0c 2 '
" = arcsin&1# + )
% E 2 E1 + E 2 (
! GAMMA SOURCE
e1
x1,y1,E1
DETECTOR 1
2
e2
x2,y2,E2 ASTROPHYSICS
DETECTOR 2 MEDICAL IMAGING

HIGH ENERGY: PAIR PRODUCTION
For E > 2 me the photon can create an electron-positron ABSORPTION COEFFICIENT:
pair; the cross section increases very fast with energy.
e+

E e-
ENERGY SHARING BETWEEN e+ and e-

(Photon energy in terms of electron rest energy 0.511 MeV)
C.M. Davisson and R.D. Evans,Rev. Modern Phys. 20(1948)305

ELECTROMAGNETIC SHOWERS
HOMOGENEOUS CALORIMETERS:
SAMPLING CALORIMETERS:

HARD X-RAYS: CONVERTERS AND DETECTION IN GASES
THICK FOIL:
HIGHER CONVERSION EFFICIENCY
LOWER PHOTOELECTRON EXTRACTION EFFICIENCY
1 cm
150 m
For 511 keV photons the 441 keV
photoelectron (511-70) has a Absorption length
range in Tungsten of 150 m. The
optimum thickness of the
converter is around 100 m, ~
1/100 of the absorption length, so 511 keV
the theoretical detections Photoelectron range
efficiency is ~ 1%.

DETECTION AND LOCALIZATION OF 511 keV PHOTONS
EFFICIENCY
MULTILAYER CONVERTERS-
GAS DETECTORS
THICKNESS (m)
GEANT4 Calculation by P. Fonte (Imaging 2006)

NEUTRON DETECTION INTERACTIONS WITH MATTER 2 - 30/31
DETECTION OF NEUTRONS WITH GAS DETECTORS

Neutrons are detected through the
products of their nuclear interaction NEUTRON CROSS SECTIONS`:
with matter. Interaction cross sections
depend on energy and material; possible
reaction products are: 3He
recoil nucleus
proton
n + nucleus --> alpha particle
triton 6Li
fission fragments
10B
TYPES OF DETECTORS:
With thin converter foil, exploiting
the reactions:
10 7
5 B + n" 3 Li + #
6 3
3 Li + n"1 H + #
With direct reaction on the gas (3He):
3
! 2 He + n"13 H + p
! G. Knoll, Radiation Detection and Measurements
The charged prongs are then detected
(Wiley, New York 2000)
by their ionization in the medium.
!

NEUTRON DETECTION INTERACTIONS WITH MATTER 2 - 31/31
OPTICAL IMAGING CHAMBER FOR NEUTRON DETECTION
Proton and Triton tracks

by neutrons in 3He
F.A.F. Fraga et al, Nucl. Instr. and Meth. A478 (2002) 357

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FUNDAMENTS INTERACTIONS WITH MATTER 2 - 1/31

Fabio Sauli - CHIPP Winter School 2010

PROBABILITY OF PRIMARY ELECTROMAGNETIC INTERACTION WITH MATTER

Excitations Ionization due

ENERGY TRANSFER (keV)

Fabio Sauli - CHIPP Winter School 2010

re : classic electron radius 2.817 10-13cm z: particle charge in units of e

Fabio Sauli - CHIPP Winter School 2010

pi: fraction of material i

Review of Particle Physics,

Fabio Sauli - CHIPP Winter School 2010

CREATION OF ELECTRON-ION PAIRS

TOTAL IONIZATION ENERGY LOSS

Primary ionization probability:

Total ionization probability (Landau expression):

Fabio Sauli - CHIPP Winter School 2010

PATH IN MATERIALS OF DELTA ELECTRONS

H. Kanter, Phys. Rev. 121(1961)461

Fabio Sauli - CHIPP Winter School 2010

ENERGY LOSS IN SEMICONDUCTORS (MINIMUM IONIZING PARTCLES)

Z : charge : density Wi average ionization energy

Average number of ion pairs: most probable

For silicon, 300 m thick:

Fabio Sauli - CHIPP Winter School 2010

DELTA ELECTRON PRODUCTION

POSITION ERROR AS A FUNCTION OF

C. Damerell, RAL 86-77(1986)

Fabio Sauli - CHIPP Winter School 2010

Minimum ionizing particles in Argon NTP:

Detection efficiency: " = 1# P0n = 1# e#n Thickness: s (mm) (%)

Fabio Sauli - CHIPP Winter School 2010

I. B. Smirnov, Nucl. Instr. and Meth. A554(2005)474

Fabio Sauli - CHIPP Winter School 2010

Fabio Sauli - CHIPP Winter School 2010

CONSEQUENCES OF DELTA ELECTRON STATISTICS POSITION ACCURACY

I. Lehraus et al, Phys. Scripta 23(1981)727

G. Charpak et al, Nucl. Instr. and Meth. 167 (1979) 455

Fabio Sauli - CHIPP Winter School 2010

PHOTON ABSORPTION x : material thickness (cm)

Fabio Sauli - CHIPP Winter School 2010

PHOTON ABSORPTION CROSS SECTION FOR TUNGSTEN

A. Thompson et al, X-RAY DATA BOOKLET (2001)

Fabio Sauli - CHIPP Winter School 2010

PHOTOIONIZATION THRESHOLD AND

Compound W (eV) Max QE (%)

Fabio Sauli - CHIPP Winter School 2010

BIALKALI PHOTOCATHODES (VISIBLE LIGHT)

QUANTUM EFFICIENCY OF Cs3Sb

CHERENKOV RING IMAGING

Fabio Sauli - CHIPP Winter School 2010

H. S. W. Massey, Electronic and Ionic impact

G. Marr, Photoionization Processes in Gases

Fabio Sauli - CHIPP Winter School 2010

PHOTOIONIZATION IN GASES TOTAL AND PHOTOIONIZATION CROSS SECTIONS:

The quantum efficiency (QE) is the ratio between

CHERENKOV RING IMAGING

Fabio Sauli - CHIPP Winter School 2010

PHOTOIONIZATION CROSS SECTION IN XENON

UV SOFT X-RAYS HARD X-RAYS GAMMAS

Fabio Sauli - CHIPP Winter School 2010

ABSORPTION LENGTH FOR GASES AT NTP

For gases at STP (0C, 1 Atm):

Fabio Sauli - CHIPP Winter School 2010

PHOTOELECTRIC FLUORESCENCE YIELD