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Divergence slit
Monochromator
Detectorslit 20000
Tube
18000
16000
14000
Intensity
Sample
12000
10000
8000
6000
4000
2000
0
20
25
30
35
Two Theta
40
45
50
Pixel size:
68 m x 68 m
136 m x 136 m
272 m x 272 m
5~30 cm in D8 DISCOVER enclosure
5
10
15
20
25
30
cm
cm
cm
cm
cm
cm
83
56
42
33
27
23
Stress/Texture/Microdiffraction
Horizontal th-2th, CEC
Vector approaches
Phase Identification:
Texture Analysis:
Stress Analysis:
15.12.2011
Bruker Confidential
10
Single Crystals
S0
Laue equation
a ( s s0 ) h
b ( s s0 ) k
c ( s s0 ) l
Bragg law
n 2d sin
Incident Beam
Sampl
e
cos 2 1
s s0 1
H
sin 2 sin g
sin 2 cos g
15.12.2011
Bruker Confidential
13
XRD2:
YL
ZL
S1
a11
a12
a13
S2
a21
a22
a23
S3
a31
a32
a33
space is:
cos sin
a
a
a
11
12
13
21
22
23
31
32
33
sin cos
cos sin
cos cos
sin
XRD2:
XRD:
h1 cos sin
h2 sin sin
h cos
3
h h
ij hi h j
(g , , , )
ij
&
1
2
S2 (1 ) / E
S1 / E
the fundamental
equation for stress measurement in XRD2:
S1 ( 11 22 33) 12 S2 ( 11h12 22h22 33h32
sin 0
2 12h1h2 2 13h1h3 2 23h2h3 ) ln
sin
62
38
33 26
23
With increasing data points, the new 2D method can measure stress
with higher accuracy than the conventional sin2 method for the
same amount of data collection
25
Bruker Confidential
15/12/2011
XRD2:
XRD2:
XRD2:
Parameter
setting
Results
reporting:
11= -1068
18 MPa
22= -1085
18 MPa
Evaluate
the data
quality
Principal
stress and
stress
ellipse
equibiaxial
and scans.
Cr-K radiation
Beam size: 0.8 mm
Aluminium (311) planes
Five frames, each 30
22
150
100
50
113
195
113
195
-50
-100
-150
-40
-30
-20
-10
10
20
30
40
Original material
Boundary
FSW weldment
XRD2:
Innovations to 2D method:
Stress Measurement from Multiple (hkl) Rings
Regression
Cu Film Stress vs. Loading
800
60
58
750
56
700
52
(331)
650
600
550
50
48
46
Linear
44
(331)+(420)
Std.err
(331) only std.err
500
450
(331)+(420) Stress
400
42
40
38
36
34
350
32
300
30
0
3
4
5
Loading Strain (X 0.001)
Stress (MPa)
(420)
54
XRD2:
Innovations to 2D method:
Intensity Weighted Least Squares Regression
i 1
i 1
S wi ri2 wi ( yi y i )2
wi
Ii
i2
XRD2:
Innovations to 2D method:
Pixel Direct Diffraction (PDD) Analysis
i 1
i 1
S I i ri2 I i ( yi y i )2
Texture:
The direction of
poles is defined by
and b angles in a
spherical
coordinates.
The pole densities
at all directions
are mapped on the
equatorial plane by
Stereographic
Projection.
The 2D map is
called pole figure
XRD
XRD2
XRD2:
sin h3 cos
1
b cos
h1
h12 h22
h h
2
1
2
2
b 0 if h2 0
b 0 if h2 0
Cu (311)
(220)
(200) (111)
3m Cu film on Si
substrate.
Si (311)
unstretched
bright spots caused by
large grains of filler
stretched
200% elongation, 10 hours
Data Collection
Strategy with
Multex Area
Transparent
Texture
Evaluation
Texture:
g-TiAl alloys
(1): Comparison of 2D Patterns
Large Grains
Fine Grains
Weak Texture
Sharp Texture
Texture:
g-TiAl alloys
(2): Comparison of Pole Figures
(110)
(111)
Fine Grains
Sharp Texture
Large Grains
Weak Texture
1. Introduction.
2. Geometry Conventions.
3. X-Ray Source and Optics.
4. X-Ray Detectors.
5. Goniometer and Sample Stages.
6. Data Treatment.
7. Phase Identification.
8. Texture Analysis.
9. Stress Measurement.
10. Small-Angle X-Ray Scattering.
11. Combinatorial Screening.
12. Quantitative Analysis.
13. Innovation and Future Development.
December
15.
Copyright
Dezember
2011 Corporation. All rights reserved
8,Bruker
2010
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